TWI398646B - Method of testing and verification - Google Patents
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- TWI398646B TWI398646B TW98127510A TW98127510A TWI398646B TW I398646 B TWI398646 B TW I398646B TW 98127510 A TW98127510 A TW 98127510A TW 98127510 A TW98127510 A TW 98127510A TW I398646 B TWI398646 B TW I398646B
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Description
本發明是有關於一種測試驗證之方法,特別是有關於一種測試驗證之方法。 The present invention relates to a method of test verification, and more particularly to a method of test verification.
目前,在測試產品的過程中,隨著產品的測試方式變更及測試方式問題的出現,在相對應的測試標準、測試項目及測試順序等等的測試過程中,其所相對應的偵錯程式也會做相應的做調整。但是,因為偵錯程式與燒機測試程式是整合在一起執行的,而測試的偵錯程式驗證時間需要耗費半天到一天的時間,然後再驗證燒錄的測試程式,而驗證燒錄的測試程式的時間為二十四小時,所以驗證的時間會變的很長,並增加測試產品的測試流程及延長測試的時間。假如在驗證的過程中出現問題,就需要將產品重新進行驗證。如此一來,對產品的開發、測試產品及產品的量產時間點都有一定的影響。 At present, in the process of testing the product, as the test method of the product changes and the test mode occurs, the corresponding debug program in the corresponding test standard, test project and test sequence, etc. Will also do the corresponding adjustments. However, because the debugger and the burn-in test program are integrated, the test debugger verification time takes half a day to one day, and then the burned test program is verified, and the burned test program is verified. The time is twenty-four hours, so the verification time will be very long, and the test process of the test product will be increased and the test time will be extended. If there is a problem during the verification process, the product needs to be re-verified. As a result, there are certain impacts on product development, test products, and mass production time points.
請同時參照第1圖及第2圖所示,舊有的作業方式因為只有一個測試程式,所以測試的時候先進行步驟S11安裝自動化偵錯軟體,接著步驟S12進行偵錯程式。測試通過之後再進行步驟S13的燒機測試流程,這樣的測試流程就會把測試時間 延長(如第1圖所示之步驟流程)。而在第2圖中,進行偵錯程式的部分就包含了步驟S21到步驟S26的這些步驟,等這些步驟進行完畢後再執行步驟S27的燒機測試程式。進一步來說,這樣一個接著一個的執行測試程式,對於整個的測試時間來說,必需耗費相當多的時間,對於產品的成本效益來說,確有不良之影響。 Please refer to FIG. 1 and FIG. 2 at the same time. Since there is only one test program in the old operation mode, the test is performed in step S11 to install the automatic debug software, and then the step S12 is to perform the debug program. After the test is passed, the burn-in test process of step S13 is performed, and the test process will take the test time. Extend (as in the step flow shown in Figure 1). In the second figure, the part for performing the debug program includes the steps from step S21 to step S26, and after the steps are completed, the burn-in test program of step S27 is executed. Further, such execution test programs one after another, it takes a considerable amount of time for the entire test time, and it has a bad influence on the cost-effectiveness of the product.
鑑於習知技藝之問題,為了能夠兼顧解決之,本發明人基於多年研究開發與諸多實務經驗,提出一種測試驗證之方法,以作為改善上述缺點之實現方式與依據。 In view of the problems of the prior art, the inventors have proposed a method of test verification based on years of research and development and many practical experiences, as an implementation and basis for improving the above disadvantages.
有鑑於上述習知技藝之問題,本發明之其中一目的就是在提供一種測試驗證之方法,以解決一般生產線上,測試時間過長的問題。 In view of the above-mentioned problems of the prior art, one of the objects of the present invention is to provide a method for test verification to solve the problem that the test time is too long on a general production line.
緣是,為達上述目的,依本發明之測試驗證之方法,其主要步驟流程如下。首先,利用一應用程式將一測試程式分割為一偵錯程式及一燒機測試程式,接著,在測試環境中設定燒機測試程式之一控制參數,最後,同步執行並驗證偵錯程式及燒機測試程式,以取得一測試結果。 Therefore, in order to achieve the above object, according to the method of test verification of the present invention, the main steps are as follows. First, an application is used to divide a test program into a debug program and a burn test program. Then, in the test environment, one of the control parameters of the burn test program is set, and finally, the debug program is executed and verified automatically. Machine test program to get a test result.
承上所述,依本發明之測試驗證之方法,其可具有一或多個下述優點: As described above, in accordance with the method of test verification of the present invention, it may have one or more of the following advantages:
(1)此驗證方法可藉由同步執行偵錯程式及燒機測試程式,藉此可提高驗證方法驗證產品之便利性。 (1) This verification method can improve the convenience of the verification method verification product by synchronously executing the debug program and the burn-in test program.
(2)此驗證方法可藉由同步執行偵錯程式及燒機測試程式 ,藉此可解決舊有之驗證方法因無法同時執行而耗費過多時間的問題。 (2) This verification method can be performed by synchronously executing the debug program and the burn test program. This solves the problem that the old verification method takes too much time because it cannot be executed at the same time.
茲為使貴審查委員對本發明之技術特徵及所達到之功效有更進一步之瞭解與認識,謹佐以較佳之實施例及配合詳細之說明如後。 For a better understanding and understanding of the technical features and the efficacies of the present invention, the preferred embodiments and the detailed description are as follows.
S11~S13‧‧‧步驟流程 S11~S13‧‧‧Step process
S21~S27‧‧‧步驟流程 S21~S27‧‧‧Step process
S31~S34‧‧‧步驟流程 S31~S34‧‧‧Step procedure
S41~S44‧‧‧步驟流程 S41~S44‧‧‧Step procedure
S431~S435‧‧‧步驟流程 S431~S435‧‧‧Step process
第1圖係為習知之驗證流程圖一;第2圖係為習知之驗證流程圖二;第3圖係為本發明之測試驗證之方法之步驟流程圖;以及第4圖係為本發明之測試驗證之方法之實施例步驟流程圖。 1 is a conventional verification flow chart 1; FIG. 2 is a conventional verification flow chart 2; FIG. 3 is a flow chart of a method for testing verification of the present invention; and FIG. 4 is a view of the present invention. A flow chart of the steps of an embodiment of the method of test verification.
以下將參照相關圖式,說明依本發明較佳實施例之測試驗證之方法,為使便於理解,下述實施例中之相同元件係以相同之符號標示來說明。 The method of test verification according to the preferred embodiment of the present invention will be described with reference to the accompanying drawings. For the sake of understanding, the same components in the following embodiments are denoted by the same reference numerals.
請參閱第3圖,其係為本發明之測試驗證之方法之步驟流程圖,其步驟如下。首先,提供一偵錯程式及一燒機測試程式(步驟S31),接著,在測試環境中設定燒機測試程式之一控制參數(步驟S32)。最後,同時執行燒機測試程式及偵錯程式並驗證(步驟S33),以取得一測試結果(步驟S34)。 Please refer to FIG. 3, which is a flow chart of the steps of the method for test verification of the present invention, and the steps are as follows. First, a debug program and a burn test program are provided (step S31), and then one of the burn test program control parameters is set in the test environment (step S32). Finally, the burn-in test program and the debug program are simultaneously executed and verified (step S33) to obtain a test result (step S34).
由於,燒機測試程式只需要在測試之前設定好條件,然後將燒機測試程式於特定的操作環境裡進行測試,不需人員確認即可執行。因此,驗證時只要先設定好燒機測試部分的控制參數,就可以直接執行並驗證燒機測試程式,同時也可以執 行並驗證偵錯程式的部分。藉此,在測試產品的時候,可同步驗證此階段燒機測試程式及偵錯程式的執行結果,並有效地縮短燒機測試程式及偵錯程式的驗證時間。 Since the burn-in test program only needs to set the conditions before the test, the test program can be tested in a specific operating environment and can be executed without human confirmation. Therefore, as long as the control parameters of the burning test part are set first, the burning test program can be executed and verified directly. Line and verify the part of the debugger. In this way, when testing the product, the execution results of the burning test program and the debug program can be verified simultaneously, and the verification time of the burning test program and the debug program can be effectively shortened.
此外,藉由本發明之測試驗證之方法,將一般的測試過程,分為下列二種測試方式同步進行:第一種為偵錯測試的部分,其更可進一步分為一功能測試(Function Test)及一射頻測試(RF Test)。在功能測試(Function Test)中,主要包含的測試內容有記憶體測試、音訊模組測試、電流模組測試及通話模組測試等等的組件測試。而在射頻測試(RF Test)的部分則主要是針對網路模組做測試,測試的內容包含有無線射頻測試(WiFi Test)、整體封包無線電服務測試(General Packet Radio Service Test,GPRS Test)及天線測試(Antenna Test)。 In addition, by the method of test verification of the present invention, the general test process is divided into the following two test modes: the first one is the part of the debug test, which can be further divided into a function test (Function Test). And an RF test. In the Function Test, the main test items include component testing of memory test, audio module test, current module test and call module test. In the part of the RF test, the test is mainly for the network module. The test includes the wireless test (WiFi Test) and the General Packet Radio Service Test (GPRS Test). Antenna Test.
第二種則為燒機測試(Burn Test),其主要是針對像是記憶體(Memory)、震盪器(Vibrator)、攝像機(Camera)等程式,做燒機測試,係將產品熱機,即在產品加負載做實際運轉,以避免產品有瑕疵。 The second type is the Burn Test. It is mainly used for programs such as memory, Vibrator, and camera. It is used to test the burning machine and heat the product. The product is loaded with the actual operation to avoid product defects.
在上述的測試過程中,係利用本發明之測試驗證之方法分為偵錯測試的部分及燒機測試的部分來執行,藉此,可有效的節省產品測試的時間,以增加產能。此外,上述所提及之測試流程中之測試項目,可依據實際測試項目作調整。 In the above test process, the test verification method of the present invention is divided into the part of the debug test and the part of the burn test, thereby effectively saving the time of product testing to increase the production capacity. In addition, the test items in the above mentioned test procedures can be adjusted according to the actual test items.
請參閱第4圖,其係為本發明之測試驗證之方法之實施例示意圖。圖中,係繪示採用整合測試程式之驗證流程中,首先,先安裝燒機測試程式及偵錯程式(步驟S41),接著設定好測試的項目及燒機測試的時間(步驟S42)。 Please refer to FIG. 4, which is a schematic diagram of an embodiment of the method for test verification of the present invention. In the figure, in the verification process using the integrated test program, first, the burn-in test program and the debug program are installed (step S41), and then the test item and the burn-in test time are set (step S42).
然後,取用一試驗體進行此自動化偵錯流程(步驟S43)。在自動化偵錯的流程中,試驗體必須經過測試記憶體,確認記憶體的品質(步驟S431),測試音訊模組,確認聲音模組是否有故障(步驟S432)。測試通話模組(步驟S433)、測試電流模組(步驟S434)及測試網路模組,確認網路模組的介面是否有故障(步驟S435)等等步驟。而在此試驗體在進行自動化偵錯的過程(步驟S43)時,可同步執行燒機測試程式(步驟S44)。 Then, a test body is taken for this automated debugging process (step S43). In the automated debugging process, the test body must pass through the test memory to confirm the quality of the memory (step S431), test the audio module, and confirm whether the sound module is faulty (step S432). The test call module (step S433), the test current module (step S434), and the test network module, confirm whether the interface of the network module is faulty (step S435) and the like. When the test body performs the process of automatic debugging (step S43), the burn-in test program can be executed in synchronization (step S44).
比對舊有方式,如第2圖所示的流程,必須先執行偵錯的流程後,再去做燒機測試的動作。然而,因為燒機測試的時間遠比自動化偵錯的時間久。因此,為了改善這個缺失,比對在第2圖及第4圖中的流程,在本發明中,請參照第4圖,係表達出同時進行偵錯及燒機測試的流程。因此,當試驗體進行自動化偵錯時,亦同時啟動燒機測試程式,待燒機測試程式執行完成後,自動化偵錯也已完成。 To compare the old methods, such as the process shown in Figure 2, you must first perform the debugging process and then do the burning machine test. However, because the burn-in test time is much longer than the automated debug time. Therefore, in order to improve this deficiency, the flow in FIGS. 2 and 4 is compared. In the present invention, referring to FIG. 4, the flow of simultaneous debugging and burn-in testing is expressed. Therefore, when the test body is automatically debugged, the burn-in test program is also started. After the execution of the test program is completed, the automatic debugging is completed.
如此,可以節約自動化偵錯的時間,減少整個測試產品的時間。如此一來,可以把驗證碼驗證的時間控制縮短在二十四小時之內,因為自動化偵錯程式的測試時間確定能夠在二十四小時之內完成(除非該驗證碼本身就有問題),否則在整 個偵錯的過程中,可藉由本發明提出之方式,有效的縮短時程。 In this way, the time for automated debugging can be saved and the time for the entire test product can be reduced. In this way, the time control for verification code verification can be shortened within 24 hours, because the test time of the automated debug program can be determined within 24 hours (unless the verification code itself has a problem), Otherwise in the whole In the process of debugging, the time course can be effectively shortened by the method proposed by the present invention.
此外,於第4圖中所列舉之測試項目可依據實際測試項目作調整,非為限定之測試項目。 In addition, the test items listed in Figure 4 can be adjusted according to the actual test items, not the limited test items.
以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。 The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.
S31~S34‧‧‧步驟流程 S31~S34‧‧‧Step procedure
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Citations (4)
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TW451067B (en) * | 1998-12-21 | 2001-08-21 | Kaitech Engineering Inc | Testing electronic devices |
US6407567B1 (en) * | 2000-06-29 | 2002-06-18 | Advanced Micro Devices | IC Device burn-in method and apparatus |
US6980016B2 (en) * | 2001-07-02 | 2005-12-27 | Intel Corporation | Integrated circuit burn-in systems |
TW200925983A (en) * | 2007-12-14 | 2009-06-16 | Chroma Ate Inc | Method of burning the rolling code to IC and system thereof |
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Publication number | Priority date | Publication date | Assignee | Title |
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TW451067B (en) * | 1998-12-21 | 2001-08-21 | Kaitech Engineering Inc | Testing electronic devices |
US6407567B1 (en) * | 2000-06-29 | 2002-06-18 | Advanced Micro Devices | IC Device burn-in method and apparatus |
US6980016B2 (en) * | 2001-07-02 | 2005-12-27 | Intel Corporation | Integrated circuit burn-in systems |
TW200925983A (en) * | 2007-12-14 | 2009-06-16 | Chroma Ate Inc | Method of burning the rolling code to IC and system thereof |
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