TWI397350B - Atmosphere pressure plasma generation device for mass production - Google Patents

Atmosphere pressure plasma generation device for mass production Download PDF

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TWI397350B
TWI397350B TW098102521A TW98102521A TWI397350B TW I397350 B TWI397350 B TW I397350B TW 098102521 A TW098102521 A TW 098102521A TW 98102521 A TW98102521 A TW 98102521A TW I397350 B TWI397350 B TW I397350B
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gas
frame
temperature
mass production
atmospheric piezoelectric
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TW200939905A (en
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Sang Ro Lee
Seong Sil Im
Yun Hwan Kim
Woo Cheol Choi
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Se Plasma Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32522Temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32467Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32733Means for moving the material to be treated

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning In General (AREA)
  • Drying Of Semiconductors (AREA)

Description

用於量產之大氣壓電漿產生裝置Atmospheric piezoelectric slurry generating device for mass production

本發明涉及一種用於量產之大氣壓電漿產生裝置,該大氣壓電漿產生裝置在產生裝置上設置氣體恆溫調節裝置並使流入到電漿產生裝置內部的氣體維持一定溫度,並在初期強制提供在經過一定的電漿產生時間後的熱狀態變化因素,從而能夠使初期狀態的處理特性和飽和狀態後的處理特性均勻。The present invention relates to an atmospheric piezoelectric slurry generating apparatus for mass production, which is provided with a gas thermostat adjusting device on a generating device and maintains a gas flowing into the plasma generating device at a certain temperature, and is forcibly supplied at an initial stage. The thermal state change factor after a certain plasma generation time elapses, so that the processing characteristics in the initial state and the processing characteristics after the saturation state can be made uniform.

一般,在生產薄膜電晶體液晶顯示器TFT LCD(Thin Film Transistor Liquid Crystal Display)、電漿顯示器PDP(Plasma Display Panel)、有機發光二極體OLED(Organic Light Emitting Diode)等平面顯示器FPD(Flat Panel Display)以及半導體襯底等的過程中必然經過襯底清洗步驟。In general, flat panel display FPD (Flat Panel Display) such as Thin Film Transistor Liquid Crystal Display, Plasma Display Panel (PDP), Organic Light Emitting Diode (OLED) In the process of semiconductor substrate or the like, the substrate cleaning step is inevitably passed.

在現有的襯底清洗步驟中使用了濕式步驟,但是近年來普遍使用作為乾式洗滌技術的電漿技術。作為這樣的電漿技術之一,有利用低溫低壓狀態的電漿的方法。Wet steps are used in existing substrate cleaning steps, but plasma technology as a dry scrubbing technique is commonly used in recent years. As one of such plasma technologies, there is a method of using plasma in a low temperature and low pressure state.

利用低溫電漿的襯底清洗方法是使在低壓的真空槽內由於產生電漿而產生的離子或活性氣體與襯底表面接觸,從而除去襯底表面的不純物或污染物質。The substrate cleaning method using low-temperature plasma is to remove ions or active gases generated in the low-pressure vacuum chamber due to the generation of plasma to the surface of the substrate, thereby removing impurities or contaminants on the surface of the substrate.

這樣的利用低壓狀態的電漿的襯底清洗方法雖然其清洗效果良好,但是並不普遍使用,這是因為,為了產生低壓電漿,需要真空裝置,而且並不適用於在大氣壓狀態下進行的連續步驟。Such a substrate cleaning method using a low-pressure plasma has a good cleaning effect, but is not commonly used because a vacuum device is required for generating low-pressure plasma, and is not suitable for use under atmospheric pressure. Continuous steps.

因此,正在研究在大氣壓狀態下產生電漿並用於襯底表面清洗的大氣壓電漿技術,而大氣壓電漿清洗裝置不同於已有的由於燈泡(lamp)更換而需要持續的維持費用的“UV(UltraViolet)清洗器”,在提供設備後不需要追加費用,因此作為未來的代替UV清洗器的設備而引人注目。Therefore, atmospheric piezoelectric slurry technology which produces plasma under atmospheric pressure and is used for substrate surface cleaning is being studied, and atmospheric piezoelectric slurry cleaning apparatus is different from existing "UV (which requires continuous maintenance cost due to lamp replacement). The UltraViolet) does not require additional costs after the equipment is supplied, so it is attracting attention as a future replacement for UV cleaners.

圖1是利用一般的大氣壓電漿源(130)的電漿產生裝置(100)的剖面圖。1 is a cross-sectional view of a plasma generating apparatus (100) utilizing a general atmospheric piezoelectric slurry source (130).

如圖1所示,利用大氣壓電漿源(130)的電漿產生裝置(100)由以下單元構成:大氣壓電漿源(130),其向清洗對象的LCD玻璃(150)的表面噴射在電漿反應中產生的氧氣自由基(O radical);電源供給裝置(140),其對上述大氣壓電漿源(130)施加交流電壓;氣體供給裝置(120),其透過與上述大氣壓電漿源(130)連接的氣體配管提供氮氣、氧氣、空氣等氣體;以及傳送裝置(160),其在大氣壓電漿源(130)實施電漿大氣壓放電的期間以一定的速度向一個方向傳送LCD玻璃(150)。As shown in Fig. 1, a plasma generating device (100) using an atmospheric piezoelectric slurry source (130) is composed of an atmospheric piezoelectric slurry source (130) which is ejected to the surface of an LCD glass (150) to be cleaned. An oxygen radical generated in the slurry reaction; a power supply device (140) that applies an alternating voltage to the atmospheric piezoelectric slurry source (130); and a gas supply device (120) that transmits the above-mentioned atmospheric piezoelectric slurry source ( 130) The connected gas piping supplies a gas such as nitrogen, oxygen, air, and the like, and a conveying device (160) that conveys the LCD glass in one direction at a certain speed during the atmospheric pressure discharge of the atmospheric piezoelectric slurry source (130). ).

在這樣的電漿產生裝置(100)中的清洗過程中,在LCD玻璃(150)的下端形成的傳送裝置(160)以一定的速度向一個方向傳送清洗物件的LCD玻璃(150),此時形成在上端的大氣壓電漿源(130)向LCD玻璃(150)實施電漿大氣壓放電,從而實現清洗。In the cleaning process in such a plasma generating device (100), the conveying device (160) formed at the lower end of the LCD glass (150) conveys the LCD glass (150) of the cleaning object in one direction at a certain speed. The atmospheric piezoelectric slurry source (130) formed at the upper end is subjected to plasma atmospheric pressure discharge to the LCD glass (150) to effect cleaning.

另一方面,在大氣壓狀態下產生電漿的大氣壓電漿清洗方法利用電漿內的氧氣自由基(radical)除去有機物、切斷襯底時的水分、製造電路時產生的殘留聚合物等污染物質,從而具有保護環境、清洗效率高的優點。On the other hand, an atmospheric piezoelectric slurry cleaning method in which a plasma is generated under an atmospheric pressure state uses an oxygen radical in a plasma to remove an organic substance, a moisture in a substrate, and a residual polymer such as a residual polymer generated when a circuit is manufactured. Therefore, it has the advantages of protecting the environment and high cleaning efficiency.

圖2a以及圖2b是表示現有的大氣壓電漿源(200)的剖面圖。2a and 2b are cross-sectional views showing a conventional atmospheric piezoelectric slurry source (200).

如圖2a所示,現有的大氣壓電漿源(200)是透過兩側的氣體供給裝置等,將來自外部的氣體由氣體供給埠(200a至200h)流入而填充到大氣壓電漿源(200)的本體,由此使大氣壓電漿源(200)內部的氣體流體分佈均勻,進而電漿的產生也變得有所均勻。As shown in Fig. 2a, the conventional atmospheric piezoelectric slurry source (200) is a gas supply device or the like on both sides, and the gas from the outside is supplied from the gas supply port (200a to 200h) to be filled into the atmospheric piezoelectric slurry source (200). The body thus distributes the gas fluid inside the atmospheric piezoelectric slurry source (200) evenly, and the generation of the plasma becomes uniform.

圖2b是圖2a所示的大氣壓電漿源(200)的側剖面圖。Figure 2b is a side cross-sectional view of the atmospheric piezoelectric slurry source (200) of Figure 2a.

如圖2b所示,大氣壓電漿源(200)表示電介質放電(DBD:Dielectric Barrier Discharge)電漿裝置。As shown in Fig. 2b, the atmospheric piezoelectric slurry source (200) represents a dielectric discharge (DBD: Dielectric Barrier Discharge) plasma device.

如上述之圖所示,相互分離並面對面地設置一對電極,在上述電極的相互面對的面上相向地設置厚度為25μm至10mm的電介質,並在相互面對的電極之間每隔0.1mm至0.5mm形成放電間隔。As shown in the above figures, a pair of electrodes are disposed apart from each other and face to face, and dielectrics having a thickness of 25 μm to 10 mm are disposed facing each other on the mutually facing faces of the electrodes, and are 0.1 between the electrodes facing each other. A discharge interval is formed from mm to 0.5 mm.

如上述之圖所示,在上端配置使透過氣體供給埠而供給的氣體均勻分佈到電漿源內部的氣體分配器(gas distributor)(210)。上述氣體分配器(210)是為了實現流入到電介質空間(260)的氣體的均勻程度從而實現電漿產生的均勻程度而配置。As shown in the above figure, a gas distributor (210) for uniformly distributing the gas supplied through the gas supply port to the inside of the plasma source is disposed at the upper end. The gas distributor (210) is disposed in order to achieve a uniform degree of gas flow into the dielectric space (260) to achieve uniformity of plasma generation.

即,透過現有技術的均勻性是以實現具有如下功能的電漿均勻性為目的,即,在清洗前後進行表面改良時使氣體供給以及電介質厚度、電極之間間隔等均勻,從而均勻地產生電漿,從而在光阻灰化製程(PR ashing)或蝕刻(Etching)製程中與被處理物的位置無關地具有相同的處理能力。但是,在大氣壓電漿的其他應用領域中對隨著時間的處理效果的均勻性的要求也非常高,在上述PR ashing或Etching製程中,隨著時間的處理效果的變化成為非常重要的問題。That is, the uniformity of the prior art is aimed at achieving uniformity of plasma having the following functions, that is, uniformizing the gas supply, the thickness of the dielectric, and the interval between the electrodes when the surface is improved before and after the cleaning, thereby uniformly generating electricity. The slurry has the same processing capability regardless of the position of the object to be processed in the PR ashing or etching process. However, in other fields of application of atmospheric piezoelectric pastes, the uniformity of processing effects over time is also very high. In the above PR ashing or Etching processes, changes in processing effects over time become very important issues.

即,現有的電漿產生裝置中,由氣體的均勻供給等引起的電漿的均勻產生以及被處理物的均勻的處理是熱門的物件,但是未能解決產生電漿後處理能力隨著時間存在差異的問題。That is, in the conventional plasma generating apparatus, uniform generation of plasma due to uniform supply of gas or the like and uniform processing of the processed object are popular items, but failure to solve the problem of generating plasma post-processing ability exists over time. The problem of difference.

另一方面,自產生電漿至達到飽和狀態為止需要很長時間,因此存在量產時需要很長時間的問題。On the other hand, it takes a long time from the generation of the plasma to the saturation state, so there is a problem that it takes a long time in mass production.

本發明是為了解決這樣的問題而做成的,其目的在於,提供一種電漿產生裝置,該電漿產生裝置具備能夠使流入到電漿產生裝置內部的氣體溫度一定的氣體恆溫調節裝置以及具備能夠控制框架(frame)內部的氣體介質的溫度的氣體介質溫度控制裝置,從而即使時間流逝亦能夠產生均勻的電漿。The present invention has been made to solve such a problem, and an object of the invention is to provide a plasma generating device including a gas thermostat capable of constant temperature of a gas flowing into a plasma generating device and A gas medium temperature control device capable of controlling the temperature of a gaseous medium inside a frame, thereby producing uniform plasma even over time.

為了達到上述目的,本發明提供一種用於量產的大氣壓電漿產生裝置,其包含:與直流脈衝或交流電源連接的電源電極;與所述電源電極分離設置並形成有電漿氣體可通過的噴射通孔的接地電極;容納以及固定所述電源電極和接地電極的框架;向上述框架的電源電極和接地電極之間供給氣體的氣體供給部;以及將從所述氣體供給部透過配管流入到框架內部的氣體溫度調節為恆溫的氣體恆溫調節裝置。In order to achieve the above object, the present invention provides an atmospheric piezoelectric slurry generating apparatus for mass production, comprising: a power supply electrode connected to a direct current pulse or an alternating current power source; and being separated from the power supply electrode and formed with a plasma gas. a ground electrode for ejecting a through hole; a frame for accommodating and fixing the power supply electrode and the ground electrode; a gas supply portion for supplying a gas between the power supply electrode and the ground electrode of the frame; and flowing from the gas supply portion through the pipe The gas temperature inside the frame is adjusted to a constant temperature gas thermostat.

在上述框架內還可以具有對所述框架供給熱量的熱供給單元,上述熱供給單元為熱射線。Further, in the above frame, there may be a heat supply unit that supplies heat to the frame, and the heat supply unit is a heat ray.

另外,在所述框架的側面可附著有包含所述氣體供給部以及熱供給單元並形成為一體的鋁材質的第二框架。Further, a second frame made of aluminum and including the gas supply portion and the heat supply unit and integrally formed may be attached to the side surface of the frame.

所述氣體恆溫調節裝置較佳包含用於提高氣體溫度的加熱器、用於測量流入到框架內部的氣體的溫度的氣體溫度感測器以及用於與所述氣體供給部連接的配管。The gas thermostat apparatus preferably includes a heater for increasing the temperature of the gas, a gas temperature sensor for measuring the temperature of the gas flowing into the inside of the frame, and a pipe for connecting to the gas supply portion.

另外,所述用於量產的大氣壓電漿產生裝置還可包含氣體介質溫度控制裝置,該氣體介質溫度控制裝置包含能夠對所述熱供給單元提供熱源的加熱器。另外,在所述用於量產的大氣壓電漿產生裝置的下端還可包含傳送裝置,該傳送裝置具有能夠傳送被處理物的傳送單元。Further, the atmospheric piezoelectric slurry generating apparatus for mass production may further include a gas medium temperature control device including a heater capable of supplying a heat source to the heat supply unit. Further, the lower end of the atmospheric piezoelectric slurry generating apparatus for mass production may further include a conveying device having a conveying unit capable of conveying the processed object.

根據上述發明,可以提供一種電漿產生裝置,其在電漿產生裝置的初期就可以使上述電漿產生裝置的溫度上升為量產時需要的一定溫度以上,因此在初期階段就可以量產。According to the above invention, it is possible to provide a plasma generating apparatus which can increase the temperature of the plasma generating apparatus to a certain temperature or higher required for mass production at the initial stage of the plasma generating apparatus, and therefore can be mass-produced at an initial stage.

另外,可以提供一種透過控制所述電漿產生裝置內部的溫度來維持恆溫的電漿產生裝置。Further, it is possible to provide a plasma generating device that maintains a constant temperature by controlling the temperature inside the plasma generating device.

以下將參照附圖詳細說明本發明的較佳實施例。Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

圖3表示本發明一個實施例的用於量產之大氣壓電漿產生裝置的立體圖;圖4表示本發明一個實施例的用於量產之大氣壓電漿產生裝置的剖面圖;圖5表示本發明另一實施例的用於量產之大氣壓電漿產生裝置的剖面圖。Figure 3 is a perspective view showing an atmospheric piezoelectric slurry generating apparatus for mass production according to an embodiment of the present invention; Figure 4 is a cross-sectional view showing an atmospheric piezoelectric slurry generating apparatus for mass production according to an embodiment of the present invention; A cross-sectional view of another embodiment of an atmospheric piezoelectric slurry generating apparatus for mass production.

如該圖所示,用於量產的大氣壓電漿產生裝置(10)具備:與直流脈衝(pulse)或交流電源連接的電源電極(20);與上述電源電極(20)分離設置並形成有與上述電源電極(20)進行反應而產生的電漿氣體可通過的噴射通孔(31)的接地電極(30);形成有容納以及固定上述電源電極(20)和接地電極(30)的內部空間部(41),與上述接地電極(30)的噴射通孔(31)連接、從而形成敞開部件的框架(40);包含在上述框架(40),從而在上述電源電極(20)和接地電極(30)之間供給氣體的氣體供給部(50);以及將從上述氣體供給部(50)透過配管(63)流入到框架(40)內部的氣體調節為恆溫的氣體恆溫調節裝置(60)。As shown in the figure, the atmospheric piezoelectric slurry generating apparatus (10) for mass production includes: a power supply electrode (20) connected to a direct current pulse or an alternating current power source; and the power supply electrode (20) is separately provided and formed a ground electrode (30) of the ejection via (31) through which the plasma gas generated by the reaction with the power supply electrode (20) is passed; and an internal portion for housing and fixing the power supply electrode (20) and the ground electrode (30) a space portion (41) connected to the ejection through hole (31) of the ground electrode (30) to form a frame (40) of the open member; included in the frame (40), thereby being connected to the power electrode (20) and the ground a gas supply unit (50) for supplying a gas between the electrodes (30); and a gas thermostat (60) for adjusting a gas flowing from the gas supply unit (50) through the pipe (63) into the frame (40) to a constant temperature ).

上述電源電極(20)具有一定的面積並連接到直流脈衝或交流電源,接地電極(30)被設置為與上述電源電極(20)之間間隔一定距離,使得透過上述氣體供給部(50)向上述電源電極(20)和接地電極(30)之間供給的氣體在上述電源電極(20)和接地電極(30)之間以一定的壓力以及產生率轉換為電漿狀態。The power electrode (20) has a certain area and is connected to a DC pulse or an AC power source, and the ground electrode (30) is disposed at a distance from the power electrode (20) so as to pass through the gas supply portion (50). The gas supplied between the power supply electrode (20) and the ground electrode (30) is converted into a plasma state between the power supply electrode (20) and the ground electrode (30) with a constant pressure and a generation rate.

上述框架(40)具有內部空間部(41),以使能夠容納以及固定上述電源電極(20)和接地電極(30),該框架(40)被設置在能夠傳送被覆物等清洗物件的傳送裝置(80)的上端,在上述接地電極(30)上形成有在與上述電源電極(20)之間產生的電漿氣體能夠透過的敞開部件。透過上述噴射通孔(31)以及敞開部件向具有上述傳送單元(81)的傳送裝置(80)側噴射電漿氣體。The frame (40) has an internal space portion (41) for accommodating and fixing the power supply electrode (20) and the ground electrode (30), and the frame (40) is provided on a conveying device capable of conveying a cleaning object such as a covering At the upper end of (80), an open member through which the plasma gas generated between the power supply electrode (20) and the power supply electrode (20) is permeable is formed on the ground electrode (30). The plasma gas is sprayed toward the side of the conveying device (80) having the above-described conveying unit (81) through the above-described injection through hole (31) and the open member.

氣體供給部(50)是在框架兩側形成有孔(hole)而能夠向上述孔注入氣體的裝置。上述氣體供給部(50)可以從框架外部透過配管而連接,也可以設置在一體形成氣體供給部(50)的第二框架(42)的內部並透過配管而連接。The gas supply unit (50) is a device in which holes are formed on both sides of the frame to allow gas to be injected into the holes. The gas supply unit (50) may be connected through a pipe from the outside of the frame, or may be provided inside the second frame (42) in which the gas supply unit (50) is integrally formed and connected through a pipe.

清洗物件等被覆物暴露在從上述電漿產生裝置(10)噴射的電漿氣體中,並透過傳送單元(81)傳送到一側,上述傳送是以一定速度進行,從而相互間保持指定的距離,從而被覆物全表面占一定程度。The covering such as the cleaning article is exposed to the plasma gas ejected from the plasma generating device (10), and is transported to one side through the transport unit (81), and the transfer is performed at a constant speed to maintain a predetermined distance from each other. Therefore, the entire surface of the covering material is occupied to a certain extent.

一般,電漿產生裝置(10)透過外加電源而在電源電極(20)形成電性連接,從而產生電漿,可使用的電源是直流脈衝或交流電壓,上述電漿產生是在達到一定溫度以上時才能實現。Generally, the plasma generating device (10) is electrically connected to the power electrode (20) through an external power source to generate a plasma. The usable power source is a DC pulse or an AC voltage, and the plasma is generated above a certain temperature. Time can be achieved.

即,自電漿產生初期經過一定時間後,經過處理效果上升的階段後出現飽和現象,而上述期間越長,在系列型(line型)生產體系中產品的生產收穫率越低。That is, after a certain period of time from the initial stage of plasma generation, saturation occurs after the treatment effect is increased, and the longer the above period, the lower the production yield of the product in the series type production system.

進而,在初期強制性地提供這樣的熱狀態變化因素,從而能夠使初期狀態的處理特性和飽和狀態後的處理特性均勻,而這是為實現將供給的氣體溫度控制為恆溫。Further, such a thermal state change factor is forcibly provided in the initial stage, so that the processing characteristics in the initial state and the processing characteristics in the saturated state can be made uniform, and this is to control the temperature of the supplied gas to a constant temperature.

上述供給的氣體的溫度根據需要可以加熱到適宜溫度的狀態下供給,這是透過氣體恆溫調節裝置(60)來實現。The temperature of the gas supplied as described above can be supplied to a suitable temperature as needed, which is achieved by a gas thermostat (60).

上述氣體恆溫調節裝置(60)透過配管(63)連接到設置在框架(40)的側面的氣體供給部(50),在上述氣體恆溫調節裝置(60)中包含能夠對上述氣體進行加熱的加熱器(62)以及能夠確認加熱後的氣體溫度的氣體溫度感測器(61)。上述氣體溫度感測器(61)較佳設置在氣體恆溫調節裝置(60)和配管(63)的連接部。The gas thermostat (60) is connected to a gas supply unit (50) provided on a side surface of the frame (40) through a pipe (63), and the gas thermostat (60) includes heating capable of heating the gas. The device (62) and a gas temperature sensor (61) capable of confirming the temperature of the heated gas. The gas temperature sensor (61) is preferably disposed at a connection portion between the gas thermostat (60) and the piping (63).

另外,上述氣體恆溫調節裝置(60)也可以包含在從氣體溫度感測器(61)傳送來的溫度為一定溫度以上時中止熱源的供給、在一定溫度以下時供給熱源的控制部(圖中未示)。Further, the gas thermostat (60) may include a control unit that stops the supply of the heat source when the temperature transmitted from the gas temperature sensor (61) is equal to or higher than a certain temperature, and supplies the heat source when the temperature is equal to or lower than a certain temperature (in the figure) Not shown).

另外,即使繼續向框架(40)內部供給加熱到一定程度的氣體,也會向傳送裝置(80)傳送以及氣體會透過噴射通孔(31)排到外部,因此框架(40)內部的溫度會下降到初期加熱到一定程度的氣體的溫度以下。Further, even if the gas heated to a certain extent is continuously supplied to the inside of the frame (40), it is sent to the conveying device (80) and the gas is discharged to the outside through the ejection through hole (31), so that the temperature inside the frame (40) is It is lowered to the temperature of the gas which is heated to a certain extent in the initial stage.

即,為了防止框架(40)內部的溫度下降到供給的氣體溫度以下而設置氣體介質溫度控制裝置(70)。That is, the gas medium temperature control device (70) is provided in order to prevent the temperature inside the frame (40) from dropping below the temperature of the supplied gas.

上述氣體介質溫度控制裝置(70)在框架(40)周圍配置熱供給單元,其目的為透過上述框架(40)的溫度上升而提高框架(40)內部的氣體介質溫度,上述熱供給單元為熱射線(71),上述熱射線(71)最好在框架(40)的外部與框架(40)接觸。The gas medium temperature control device (70) is provided with a heat supply unit around the frame (40) for the purpose of increasing the temperature of the gas medium inside the frame (40) by the temperature rise of the frame (40), and the heat supply unit is hot. The ray (71), preferably the heat ray (71) is in contact with the frame (40) outside the frame (40).

另外,氣體供給部(50)和熱射線(71)被設置在一體形成的第二框架(42)的內部,上述第二框架(42)可以設置在框架(40)的一側或兩側。上述框架(40)較佳為鋁材料,以能夠使熱射線(71)的熱正確地向框架(40)方向移動。Further, the gas supply portion (50) and the heat ray (71) are disposed inside the integrally formed second frame (42), and the second frame (42) may be disposed on one side or both sides of the frame (40). The frame (40) is preferably made of an aluminum material so that the heat of the heat ray (71) can be correctly moved in the direction of the frame (40).

在上述氣體介質溫度控制裝置(70)中包含用於測量上述框架(40)內部的溫度的框架內部溫度感測器(圖中未示),透過從上述框架內部溫度感測器傳達的信號來決定是否調整向熱射線(71)的熱源供給。The gas medium temperature control device (70) includes a frame internal temperature sensor (not shown) for measuring the temperature inside the frame (40), and transmits a signal transmitted from the temperature sensor inside the frame. Decide whether to adjust the heat source supply to the heat ray (71).

即使流入到框架(40)內部的氣體的溫度因上述熱射線(71)的工作而有所下降,也具有能夠使框架(40)內部的氣體介質溫度維持在一定溫度的效果。Even if the temperature of the gas flowing into the inside of the frame (40) is lowered by the operation of the heat ray (71), the temperature of the gas medium inside the frame (40) can be maintained at a constant temperature.

上述氣體介質溫度控制裝置(70)也可以進一步具有能夠在從框架內部溫度感測器(圖中未示)傳送來的溫度為一定溫度以上時中止熱源的供給、在一定溫度以下時供給熱源的控制部(圖中未示)。The gas medium temperature control device (70) may further have a supply that can stop the supply of the heat source when the temperature transmitted from the temperature sensor (not shown) inside the frame is equal to or higher than a certain temperature, and supply the heat source when the temperature is lower than a certain temperature. Control unit (not shown).

下面,簡單說明上述用於量產的大氣壓電漿產生裝置(10)的工作程序。Next, the operation procedure of the above-described atmospheric piezoelectric slurry generating apparatus (10) for mass production will be briefly described.

首先,在用於量產的大氣壓電漿產生裝置上形成電性連接,並在電源電極(20)和接地電極(30)之間形成氣體供給時,逐漸產生電漿,當上述產生的電漿達到飽和狀態時透過傳送單元(81)進行傳送裝置(80)的傳送,從而實現設置在上述傳送裝置(80)上端的LCD面板(panel)等的清洗。這是因為,在接地電極(30)上具有噴射通孔(31),從而電漿氣體能夠透過上述噴射通孔(31)傳送到傳送裝置(80)側。First, an electrical connection is formed on the atmospheric piezoelectric slurry generating apparatus for mass production, and when a gas supply is formed between the power supply electrode (20) and the ground electrode (30), plasma is gradually generated, and the plasma generated as described above is generated. When the saturation state is reached, the transfer device (81) transfers the transfer device (80) to realize cleaning of an LCD panel or the like provided at the upper end of the transfer device (80). This is because the grounding electrode (30) has the ejection through hole (31) so that the plasma gas can be transmitted to the side of the conveying device (80) through the above-described ejection through hole (31).

此時,若作為向電漿產生裝置(10)供給的氣體而供給加熱到一定溫度的氣體,則以更快的速度實現電漿產生,並達到飽和狀態。為此,應供給在氣體恆溫調節裝置(60)將透過框架(40)的氣體供給部(50)的氣體的溫度加熱到一定溫度的氣體。當上述加熱的氣體被供給到電漿產生裝置(10)時迅速達到飽和狀態,從而具有在系列型步驟中能夠迅速轉換到量產體制的優點。為了上述供給的氣體的加熱而需要加熱器(62),而上述加熱器(62)可以使用電裝置,或可以使用其他對氣體進行加熱的各種裝置。At this time, when a gas heated to a constant temperature is supplied as a gas supplied to the plasma generating device (10), plasma generation is achieved at a faster rate and reaches a saturated state. To this end, a gas that is heated by the gas thermostat (60) to the temperature of the gas passing through the gas supply unit (50) of the frame (40) to a certain temperature is supplied. When the heated gas is supplied to the plasma generating device (10), it quickly reaches a saturated state, thereby having the advantage of being able to quickly switch to the mass production system in a series of steps. A heater (62) is required for heating the gas supplied above, and the heater (62) may use an electric device, or other devices that heat the gas may be used.

為了測量上述加熱的氣體的溫度而設置氣體溫度感測器(61),而該氣體溫度感測器(61)一般設置在配管(63)的與氣體恆溫調節裝置(60)連接的一側的開端,從而確認向框架(40)內部供給的溫度。A gas temperature sensor (61) is provided for measuring the temperature of the heated gas, and the gas temperature sensor (61) is generally disposed on a side of the pipe (63) connected to the gas thermostat (60). The start is made to confirm the temperature supplied to the inside of the frame (40).

在進行上述量產的期間也有可能發生框架(40)內部的溫度下降的情況,這是因為,在供給氣體的過程中氣體介質溫度有可能因外部的各種因素而下降,為了將如上述的氣體介質溫度保持在一定溫度,需要氣體介質溫度控制裝置(70)。上述氣體介質溫度控制裝置(70)與框架(40)相接觸或貫通第二框架(42)的內部具備熱射線(71),在框架(40)內部空間部具有框架內部溫度感測器(圖中未示),從而當從框架內部溫度感測器接收的溫度為一定溫度以下時透過熱射線(71)的工作來控制氣體介質溫度,當一定溫度以上時熱射線(71)不工作。The temperature drop inside the frame (40) may also occur during the above-mentioned mass production because the temperature of the gas medium may be lowered by various external factors during the supply of the gas, in order to use the gas as described above. The medium temperature is maintained at a certain temperature and a gas medium temperature control device (70) is required. The gas medium temperature control device (70) is in contact with the frame (40) or has a heat ray (71) inside the second frame (42), and has a frame internal temperature sensor in the inner space of the frame (40) (Fig. Not shown), so that the temperature of the gas medium is controlled by the operation of the heat ray (71) when the temperature received from the temperature sensor inside the frame is below a certain temperature, and the heat ray (71) does not operate when the temperature is above a certain temperature.

前文係針對本發明之較佳實施例為本發明之技術特徵進行具體之說明,但本發明並不限於該等實施例,應理解為,單純組合上述實施例和已有的公知技術的實施例、以及熟悉此項技術之人士當可在不脫離本發明之精神與原則下對本發明進行變更與修改,而該等變更與修改,皆應涵蓋於如下申請專利範圍所界定之範疇中。The foregoing description of the preferred embodiments of the present invention has been specifically described as the technical features of the present invention, but the present invention is not limited to the embodiments, and it should be understood that the embodiments of the above-described embodiments and the prior art are simply combined. And those skilled in the art can change and modify the present invention without departing from the spirit and scope of the invention, and such changes and modifications are to be included in the scope defined by the following claims.

10...大氣壓電漿產生裝置10. . . Atmospheric piezoelectric slurry generator

20...電源電極20. . . Power electrode

30...接地電極30. . . Ground electrode

31...噴射通孔31. . . Jet through hole

40...框架40. . . frame

41...內部空間部41. . . Interior space department

42...第二框架42. . . Second frame

50...氣體供給部50. . . Gas supply department

60...氣體恆溫調節裝置60. . . Gas thermostat

61...氣體溫度感測器61. . . Gas temperature sensor

62...加熱器62. . . Heater

63...配管63. . . Piping

70...氣體介質溫度控制裝置70. . . Gas medium temperature control device

71...熱射線71. . . Heat ray

80...傳送裝置80. . . Conveyor

81...傳送單元81. . . Transfer unit

100...電漿產生裝置100. . . Plasma generating device

120...氣體供給裝置120. . . Gas supply device

130...大氣壓電漿源130. . . Atmospheric piezoelectric pulp source

140...電源供給裝置140. . . Power supply device

150...LCD玻璃150. . . LCD glass

160...傳送裝置160. . . Conveyor

200...大氣壓電漿源200. . . Atmospheric piezoelectric pulp source

200a...氣體供給埠200a. . . Gas supply埠

200b...氣體供給埠200b. . . Gas supply埠

200c...氣體供給埠200c. . . Gas supply埠

200d...氣體供給埠200d. . . Gas supply埠

200e...氣體供給埠200e. . . Gas supply埠

200f...氣體供給埠200f. . . Gas supply埠

200g...氣體供給埠200g. . . Gas supply埠

200h...氣體供給埠200h. . . Gas supply埠

210...氣體分配器210. . . Gas distributor

260...電介質空間260. . . Dielectric space

圖1是利用一般大氣壓電漿的電漿產生裝置的剖面圖;Figure 1 is a cross-sectional view of a plasma generating apparatus using a general atmospheric piezoelectric slurry;

圖2a以及圖2b是表示現有的大氣壓電漿的剖面圖;2a and 2b are cross-sectional views showing a conventional atmospheric piezoelectric slurry;

圖3是本發明一個實施例之用於量產的大氣壓電漿產生裝置的立體圖;Figure 3 is a perspective view of an atmospheric piezoelectric slurry generating apparatus for mass production according to an embodiment of the present invention;

圖4是本發明一個實施例之用於量產的大氣壓電漿產生裝置的剖面圖;以及Figure 4 is a cross-sectional view showing an atmospheric piezoelectric slurry generating apparatus for mass production according to an embodiment of the present invention;

圖5是本發明另一實施例之用於量產的大氣壓電漿產生裝置的剖面圖。Figure 5 is a cross-sectional view showing an atmospheric piezoelectric slurry generating apparatus for mass production according to another embodiment of the present invention.

10...大氣壓電漿產生裝置10. . . Atmospheric piezoelectric slurry generator

40...框架40. . . frame

50...氣體供給部50. . . Gas supply department

60...氣體恆溫調節裝置60. . . Gas thermostat

61...氣體溫度感測器61. . . Gas temperature sensor

62...加熱器62. . . Heater

63...配管63. . . Piping

70...氣體介質溫度控制裝置70. . . Gas medium temperature control device

71...熱射線71. . . Heat ray

80...傳送裝置80. . . Conveyor

81...傳送單元81. . . Transfer unit

Claims (6)

一種用於量產之大氣壓電漿產生裝置,包含:一與直流脈衝或交流電源連接的電源電極;一與該電源電極分離設置並形成有電漿氣體可透過的噴射通孔的接地電極;一容納以及固定該電源電極和該接地電極的框架;一在該框架外部向該電源電極和該接地電極之間供給氣體的氣體供給部;一對從該氣體供給部透過配管流入到該框架內部的氣體溫度進行調節的氣體恆溫調節裝置;以及一對該框架供給熱量的熱供給單元,其中該熱供給單元為熱射線。An atmospheric piezoelectric slurry generating device for mass production, comprising: a power electrode connected to a direct current pulse or an alternating current power source; a ground electrode separated from the power supply electrode and formed with a jet gas permeable through hole; a frame for accommodating and fixing the power electrode and the ground electrode; a gas supply portion for supplying a gas between the power supply electrode and the ground electrode outside the frame; and a pair of gas flowing from the gas supply portion into the frame through the pipe a gas thermostat that regulates gas temperature; and a pair of heat supply units that supply heat to the frame, wherein the heat supply unit is a heat ray. 根據申請專利範圍第1項所述之用於量產之大氣壓電漿產生裝置,其中,在該框架的側面附著有一第二框架,該第二框架包含該氣體供給部以及該熱供給單元並形成為一體。The atmospheric piezoelectric slurry generating apparatus for mass production according to claim 1, wherein a second frame is attached to a side of the frame, the second frame including the gas supply portion and the heat supply unit and forming As one. 根據申請專利範圍第2項所述之用於量產之大氣壓電漿產生裝置,其中該第二框架由鋁材質組成。The atmospheric piezoelectric slurry generating apparatus for mass production according to claim 2, wherein the second frame is made of an aluminum material. 根據申請專利範圍第1項所述之用於量產之大氣壓電漿產生裝置,其中該氣體恆溫調節裝置包含一用於提高氣體溫度的加熱器、一用於測量流入到框架內部的氣體的溫度的氣體溫度感測器以及一用於與所述氣體供給部連接的配管。The atmospheric piezoelectric slurry generating apparatus for mass production according to claim 1, wherein the gas thermostat adjusting device comprises a heater for increasing the temperature of the gas, and a temperature for measuring the gas flowing into the interior of the frame. A gas temperature sensor and a pipe for connecting to the gas supply unit. 根據申請專利範圍第1項所述之用於量產之大氣壓電漿產生裝置,其中該大氣壓電漿產生裝置還包含一氣體介質溫度控制裝置,該氣體介質溫度控制裝置包含一能夠對所述熱供給單元提供熱源的加熱器以及一用於測量框架內部的溫度的框架內部溫度感測器。The atmospheric piezoelectric slurry generating apparatus for mass production according to claim 1, wherein the atmospheric piezoelectric slurry generating apparatus further comprises a gas medium temperature control device, wherein the gas medium temperature control device comprises a heat capable of The supply unit provides a heater for the heat source and a frame internal temperature sensor for measuring the temperature inside the frame. 根據申請專利範圍第1項所述之用於量產之大氣壓電漿產生裝置,其 中該大氣壓電漿產生裝置的下端還包含一傳送裝置,該傳送裝置具有能夠傳送被處理物的複數個傳送單元。An atmospheric piezoelectric slurry generating apparatus for mass production according to claim 1 of the patent application scope, The lower end of the atmospheric piezoelectric slurry generating device further includes a conveying device having a plurality of conveying units capable of conveying the processed object.
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