TWI394949B - Dynamic test apparatus and method - Google Patents

Description

Dynamic test device and method

The present invention relates to dynamic testing, and more particularly to a board level dynamic testing apparatus and method suitable for use in a motion sensor.

A motion sensor (or dynamic sensor) is an element that converts a motion state (such as a tilt angle) into a corresponding electronic signal, which is gradually used in modern electronic or electromechanical devices, such as games. Controllers, mobile phones, digital music players (MP3s), cameras, personal digital assistants (PDAs), can implement a variety of sports (such as flip, acceleration, rotation, etc.) related applications to promote the authenticity or convenience of use .

Today's motion sensors are generally fabricated as semiconductor circuits using semiconductor process technology coupled with electromechanical techniques such as micro-electro-mechanical system technology. As with the general integrated circuit, a final test is required for the packaged motion sensor to ensure its correct function. In addition to testing the function and electrical parameters, it is also necessary to test the correctness of its motion state (such as the tilt angle).

However, traditional test systems typically only test the motion sensor in a static state (eg, tilt angle), as for other dynamic motion tests, such as linear acceleration or centripetal acceleration (also commonly referred to as g A force (g-force) or g-valued acceleration, which represents the magnitude of an object's acceleration relative to gravitational acceleration, a unit g force equal to approximately 9.8 m/s squared, and the conventional test system cannot be dynamically tested by real time. In view of this, there is a need for a dynamic test apparatus and method that can dynamically and instantly test the motion state (especially acceleration) of a motion sensor.

One of the objects of the present invention is to provide a dynamic test apparatus and method for instantly testing the dynamic motion state of a motion sensor (eg, linear acceleration or centripetal acceleration, etc.).

According to an embodiment of the invention, the dynamic testing device comprises a component interface panel (DIB) on which the receiving device and the controller are disposed. The accommodating device is for temporarily accommodating the device under test, and the controller is for dynamically testing the motion state of the device under test. In the test, the controller is first activated by the controller to move the device under test. Then, the controller waits until a trigger signal is received, indicating that the motion performed by the drive device has stabilized. After receiving the trigger signal, the controller begins to capture the output signal of the device under test, and obtains a dynamic motion state, such as a g-value acceleration, according to the extracted output signal.

The system block diagram of the first figure shows the dynamic test system 1 of the embodiment of the present invention for dynamically testing the motion state of a packaged motion sensor (or dynamic sensor). In particular, by the dynamic test system 1, the motion sensor's acceleration value (such as linear acceleration or centripetal acceleration) or g-force (g-force, also known as g-value acceleration) can be obtained by real time test. . In this specification, the term "dynamic" or "dynamic test" refers to a motion sensor that is tested during a motion to obtain an associated motion state, such as a linear/central acceleration. This is relative to the traditional "static" or "static test", which refers to the motion state of the motion sensor after the completion of the motion process, or during the pause during the motion, such as the flip angle.

The dynamic test system 1 mainly includes a motion test module 10, a sorting classifier 12, and a tester 14. The motion test module 10 mainly includes a device interface board (DIB) 103 (also generally referred to as a DUT board, a performance board, or a load board). One or more receiving devices 100 (eg, slots) are provided for temporarily accommodating one or more device under test (DUT). The signal of the device under test is transmitted to the rest of the motion test module 10 by the electrical interface provided by the component interface panel (DIB) 103. Also disposed on the component interface panel (DIB) 103 is a controller 110, such as a micro controller (Micro-C), for dynamically testing the motion state of the device under test, particularly linear acceleration or Centripetal acceleration (also commonly referred to as g-force or g-value acceleration). In addition, the component interface panel (DIB) 103 may further include an analog to digital converter (ADC) 111 for converting the analog output signal of the device under test into a corresponding digital signal for receiving and processing by the controller 110. . Of course, such a ratio to the digital converter 111 can be omitted if the device under test itself can output a digital signal. The motion test module 10 further includes a motion mechanism 101 for performing various movements on the device under test. For the type and details of the sports organization, please refer to the patent application filed by the applicant at the same time (titled "Flip Test Module and Test System"), which discloses a flip motion mechanism; patent application (titled "straight line" Reciprocating test module and test system thereof), which discloses a linear reciprocating mechanism; and a patent application (titled "Rotary Test Module and Test System"), which discloses a rotary motion mechanism, the details of which are detailed The content is not described here.

In the dynamic test system 1 shown in the first figure, the sorting machine 12 is mainly used for picking up and placing the device under test to the motion test module 10 for testing, and retrieving the device under test after the test is completed. The tested components are classified according to the test results. The test machine 14 mainly includes test related circuits such as a test head, and is used to respectively control the above motion test module 10 and the sorting machine 12 via the transmission lines 16, 18. For the description of the operation between the motion test module 10, the sorting machine 12 and the test machine 14, reference may be made to other patent applications filed by the applicant in the foregoing, the details of which are not described herein.

The system block diagram of the second A diagram shows the dynamic testing device 2 of the embodiment of the present invention. Since it is attached to the component interface panel (DIB) 103, it is also referred to as a board level dynamic testing device. 2A is a side view showing a receiving device 100 (eg, a slot), a controller (such as a microprocessor (Micro-C)) 110, and analog to digital conversion fixed on a component interface panel (DIB) 103. (ADC) 111.

The flowchart of the third figure shows the dynamic test method of the embodiment of the present invention. The following description is based on the example of linear acceleration motion sensing (for example, the applicant of the present application disclosed in another patent application, entitled "Linear Reciprocating Test Module and Test System"), however, the flow of the third figure may also be Suitable for other sports tests. First, in step 30, the controller 110 sets drive parameters of a drive device (eg, a stepper motor), such as the rotational speed of the motor. This parameter can be a preset or it can be adjusted at any time depending on the application. Next, at step 31, the controller 110 notifies (or controls) to start the motor for starting the motion of the driving motion mechanism 101 (linear reciprocating motion in this embodiment). Since the motion mechanism 101 itself has object inertia, the output signal (or its corresponding digital signal) obtained from the device under test (for example, the motion sensor) 19 has not yet reached a stable motion state at the beginning. Therefore, the controller 110 needs to wait for a period of time (step 32). In this embodiment, when the motor reaches a certain angle, the motion mechanism 101 is expected to reach a stable motion state (hereinafter referred to as a trigger point), and the motor returns a related trigger signal to the controller 110. (Step 33). In a preferred embodiment, the motor can be a servo motor or a stepping motor, and the servo motor or the stepping motor can be coupled with a built-in encoder or detector to return a specific angle of the motor. The associated trigger signal is sent to the controller 110. After receiving the trigger signal, the controller 110 proceeds to step 34 to start capturing the output signal of the device under test (otherwise, the controller 110 needs to continue to wait for the rotation speed to stabilize). In this embodiment, the analog analog output signal is further converted into a corresponding digital signal by an analog to digital converter (ADC) 111. Based on the extracted output signal (or its corresponding digital signal), the controller 110 can test (or calculate) the acceleration value (or g-value acceleration) (step 35). The above steps 30-35 can be repeatedly performed to obtain different or the same motion state by dynamic test. The fourth graph illustrates the relationship between the captured signal value (or g-value acceleration) and the motor angle. In the figure, the period t2 at which the trigger point TP starts is a period of stable motion state, so the signal is captured and tested during this period; the period t1 and the period t3 are periods of unstable motion, and therefore are not performed during these periods. Signal acquisition and testing.

The embodiments described above can be used to instantly test the dynamic motion state of the motion sensor (such as linear acceleration or centripetal acceleration, etc.) to complement the shortcomings of the traditional sensing system that can only statically test the motion state, in order to cope with the current motion sensing. Functional diversity of the device.

The above description is only the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention; all other equivalent changes or modifications which are not departing from the spirit of the invention should be included in the following Within the scope of the patent application.

1. . . Dynamic test system

10. . . Motion test module

100. . . Storing device (slot)

101. . . Motion mechanism

103. . . Component Interface Panel (DIB)

110. . . Controller (Micro-C)

111. . . Analog to digital converter (ADC)

12. . . Check sorting machine (handler)

14. . . Test machine

16. . . Transmission line

18. . . Transmission line

19. . . Device under test (motion sensor)

2. . . Dynamic test device

30-35. . . Dynamic test method steps

The system block diagram of the first diagram shows a dynamic test system in accordance with an embodiment of the present invention.

The system block diagram of Figure 2A shows a dynamic test apparatus in accordance with an embodiment of the present invention.

A side view of the second B diagram shows a dynamic test apparatus in accordance with an embodiment of the present invention.

The flowchart of the third figure shows the dynamic test method of the embodiment of the present invention.

The fourth graph illustrates the relationship between the captured signal value (or g-value acceleration) and the motor angle.

2. . . Dynamic test device

100. . . Storing device (slot)

101. . . Motion mechanism

103. . . Component Interface Panel (DIB)

110. . . Controller (Micro-C)

111. . . Analog to digital converter (ADC)

14. . . Test machine

19. . . Device under test (motion sensor)

Claims (15)

A dynamic testing device comprising: a component dielectric panel (DIB); at least one receiving device disposed on the component media panel for temporarily accommodating at least one device under test; a controller disposed on the component mediation panel And extracting an output signal of the device under test after receiving a trigger signal indicating that the motion of the device under test has stabilized, for dynamically testing the device under test to include linear reciprocating, flipping, and rotating Obtaining a motion state of the measured component including linear acceleration and centripetal acceleration; and an analog to digital converter (ADC) disposed between the device under test and the controller for using the device under test The output signal is converted from an analog form to a digital form to facilitate reception and processing by the controller. The dynamic testing device of claim 1, wherein the receiving device comprises a slot. The dynamic testing device of claim 1, wherein the device under test is a motion sensor. The dynamic testing device of claim 1, wherein the controller comprises a micro controller. The dynamic testing device of claim 1, further comprising a moving mechanism for performing various movements on the device under test. The dynamic testing device of claim 5, wherein the moving mechanism comprises a motor. The dynamic testing device of claim 1, further comprising a sorting sorting machine for picking up and placing the tested component to the receiving device for testing, and after the testing is completed Retrieve the device under test. The dynamic testing device of claim 1, further comprising a tester that controls the controller via a transmission line. A dynamic testing method includes: starting a driving device with a controller for moving a device under test; the controller waits until a trigger signal is received, indicating that the motion performed by the driving device has stabilized; After receiving the trigger signal, the controller captures an output signal of the device under test; Converting the output signal of the device under test into an analog form by analogy to a digital converter to facilitate reception and processing of the controller; and the controller dynamically tests the output signal according to the captured output signal The device under test includes linear reciprocating, flipping, and rotating motions to obtain a dynamic motion state including linear acceleration and centripetal acceleration. The dynamic test method of claim 9, wherein the controller is disposed on a component interface panel (DIB). The dynamic test method of claim 9, wherein the driving device comprises a motor. The dynamic test method according to claim 9 is characterized in that before the starting of the driving device, the driving parameter of the driving device is set by the controller. The dynamic test method of claim 9, wherein the controller comprises a micro controller. The dynamic test method of claim 9, wherein the trigger signal is sent by the driving device. The dynamic test method of claim 9, wherein the device under test is a motion sensor.