TWI387738B - Measurement board and apparatus with the same for measuring modulation transfer function value - Google Patents

Measurement board and apparatus with the same for measuring modulation transfer function value Download PDF

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TWI387738B
TWI387738B TW95142681A TW95142681A TWI387738B TW I387738 B TWI387738 B TW I387738B TW 95142681 A TW95142681 A TW 95142681A TW 95142681 A TW95142681 A TW 95142681A TW I387738 B TWI387738 B TW I387738B
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transfer function
function value
modulation transfer
magnetic
image sensor
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TW95142681A
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TW200823444A (en
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Kun I Yuan
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Hon Hai Prec Ind Co Ltd
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Description

調制傳遞函數值量測板及使用該量測板之測量裝置 Modulation transfer function value measuring plate and measuring device using the measuring plate

本發明涉及一種調制傳遞函數值量測板及使用該量測板之測量裝置,尤其涉及一種鏡頭調制傳遞函數值之測量裝置。 The invention relates to a modulation transfer function value measuring board and a measuring device using the measuring board, in particular to a measuring device for a lens modulation transfer function value.

調制傳遞函數(Modulation Transfer Function,簡稱MTF)值係對鏡頭之銳度,反差及解析度進行綜合評價之參數。於光學產業而言,經常需要對鏡頭之MTF值進行測量。 Modulation Transfer Function (MTF) value is a parameter for comprehensive evaluation of the sharpness, contrast and resolution of the lens. For the optical industry, it is often necessary to measure the MTF value of the lens.

鏡頭調制傳遞函數值測量裝置通常包括一測試板,一固定有圖像感測器之調制傳遞函數值量測板,以及一驅動單元。所述測試板上具有測試圖案。所述圖像感測器用於感測該測試板上的測試圖案經由所述待測鏡頭於該圖像感測器上的成像。所述驅動單元用於驅動所述待測鏡頭於測試板與調制傳遞函數值量測板之間沿該待測鏡頭之光軸方向移動,以使該測試板上的測試圖案於所述圖像感測器上形成最佳成像。測量時,一般是於所述圖像感測器上獲得最佳成像之後,由圖像感測器之畫素所感測之測試圖案成像亮度之強度值計算出待測鏡頭之調制傳遞函數值。 The lens modulation transfer function value measuring device generally includes a test board, a modulation transfer function value measuring plate to which an image sensor is fixed, and a driving unit. The test board has a test pattern. The image sensor is configured to sense imaging of the test pattern on the test board via the lens to be tested on the image sensor. The driving unit is configured to drive the lens to be tested to move along the optical axis direction of the lens to be tested between the test board and the modulation transfer function value measuring plate, so that the test pattern on the test board is in the image The best imaging is formed on the sensor. In the measurement, generally after obtaining the optimal imaging on the image sensor, the modulation transfer function value of the test lens to be tested is calculated from the intensity value of the test pattern imaging brightness sensed by the pixel of the image sensor.

然,由於在測量過程中圖像感測器與待測鏡頭之間的距離通常很小,尤其是在測量手機或數位相機等小型電子產品中的鏡頭時,常常會有鏡頭撞擊到圖像感測器的現象,若發生撞擊之後驅動單元沒有立即停止,則會造成 圖像感測器、鏡頭,以及驅動單元等的嚴重損壞。 However, since the distance between the image sensor and the lens to be tested is usually small during the measurement process, especially when measuring a lens in a small electronic product such as a mobile phone or a digital camera, the lens often hits the image. The phenomenon of the detector, if the drive unit does not stop immediately after the impact, it will cause Serious damage to image sensors, lenses, and drive units.

有鑒於此,有必要提供一種可偵測撞擊之調制傳遞函數值量測板,以及使用該量測板之調制傳遞函數值測量裝置,以免於測量過程中產生撞擊造成測量裝置及待測鏡頭的損壞。 In view of the above, it is necessary to provide a modulation transfer function value measuring plate capable of detecting an impact, and a modulation transfer function value measuring device using the measuring plate, so as to avoid the impact of the measuring device and the lens to be tested. damage.

下面將以具體實施例說明一種可偵測撞擊的調制傳遞函數值量測板,以及使用該量測板之調制傳遞函數值測量裝置。 A modulation transfer function value measuring plate capable of detecting an impact and a modulation transfer function value measuring device using the measuring plate will be described below by way of specific embodiments.

一種調制傳遞函數值量測板,其包括一基板,一固定於該基板上的圖像感測器,以及一裝設於該基板上的震動感測器,該震動感測器用於感測該基板的震動。 A modulation transfer function value measuring board includes a substrate, an image sensor fixed on the substrate, and a vibration sensor mounted on the substrate, the vibration sensor is configured to sense the The vibration of the substrate.

以及,一種調制傳遞函數值測量裝置,用於測量待測鏡頭之調制傳遞函數值,其包括一測試板,一調制傳遞函數值量測板,及一驅動單元。所述測試板上具有測試圖案。所述調制傳遞函數值量測板包括一基板,一固定於該基板上的圖像感測器,以及一裝設於該基板上的震動感測器,所述圖像感測器用於感測所述測試板上的測試圖案經由所述待測鏡頭於該圖像感測器上的成像,所述震動感測器用於感測該基板的震動。所述驅動單元用以使所述待測鏡頭與調制傳遞函數值量測板沿該待測鏡頭之光軸方向產生相對移動,當該待測鏡頭與圖像感測器發生碰撞時,所述震動感測器能夠感測該基板的震動並產生一控制訊號以使驅動單元停止工作。 And a modulation transfer function value measuring device for measuring a modulation transfer function value of the lens to be tested, comprising a test board, a modulation transfer function value measuring board, and a driving unit. The test board has a test pattern. The modulation transfer function value measuring board includes a substrate, an image sensor fixed on the substrate, and a vibration sensor mounted on the substrate, the image sensor is used for sensing The test pattern on the test board is imaged on the image sensor via the lens to be tested, and the vibration sensor is used to sense the vibration of the substrate. The driving unit is configured to cause a relative movement between the lens to be tested and the modulation transfer function value measuring plate along the optical axis direction of the lens to be tested, when the lens to be tested collides with the image sensor, The shock sensor is capable of sensing the vibration of the substrate and generating a control signal to stop the drive unit from operating.

相較於先前技術,所述調制傳遞函數值量測板包括一裝設於所述基板上的震動感測器,其可感測該基板的震動,由於所述圖像感測器固定於該基板上,因而該震動感測器可同時感測該圖像感測器的震動。所述使用該量測板的調制傳遞函數值測量裝置,其於測量待測鏡頭之調制傳遞函數值時,所述驅動單元於使該待測鏡頭與調制傳遞函數值量測板沿該待測鏡頭之光軸方向產生相對移動,以使該測試板上的測試圖案於所述圖像感測器上獲得最佳成像之過程中,當該待測鏡頭與圖像感測器發生碰撞時,所述震動感測器可感測到該圖像感測器及調制傳遞函數值量測板基板之震動,此時該震動感測器可產生一控制訊號,以使驅動單元立即停止工作,從而可避免造成測量裝置及待測鏡頭的嚴重損壞。 Compared with the prior art, the modulation transfer function value measuring board includes a vibration sensor mounted on the substrate, which can sense the vibration of the substrate, because the image sensor is fixed to the image sensor On the substrate, the vibration sensor can simultaneously sense the vibration of the image sensor. The modulation transfer function value measuring device using the measuring plate, wherein when the modulation transfer function value of the lens to be tested is measured, the driving unit causes the measuring lens and the modulation transfer function value measuring plate to be along the to-be-tested Relatively moving the optical axis direction of the lens, so that the test pattern on the test board is optimally imaged on the image sensor, when the lens to be tested collides with the image sensor, The vibration sensor can sense the vibration of the image sensor and the modulation transfer function value measuring board substrate, and the vibration sensor can generate a control signal to stop the driving unit immediately, thereby Serious damage to the measuring device and the lens to be tested can be avoided.

下面將結合附圖對本發明實施例作進一步詳細說明。 The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

參見圖1,本發明第一實施例所提供之調制傳遞函數值量測板100,其包括一基板110,一固定於該基板110上的圖像感測器120,以及一裝設於該基板110上的震動感測器130。 Referring to FIG. 1, a modulation transfer function value measuring plate 100 according to a first embodiment of the present invention includes a substrate 110, an image sensor 120 fixed on the substrate 110, and a substrate mounted on the substrate. Vibration sensor 130 on 110.

所述圖像感測器120可為電荷耦合圖像感測器或互補金屬氧化物半導體圖像感測器。 The image sensor 120 can be a charge coupled image sensor or a complementary metal oxide semiconductor image sensor.

所述震動感測器130可為水銀電阻式震動感測器。該水銀電阻式震動感測器可根據其電阻值之變化來感測所述基板110是否有震動。當然,該震動感測器130亦可為滾珠震動開關或磁簧開關。 The vibration sensor 130 can be a mercury resistive vibration sensor. The mercury resistive vibration sensor can sense whether the substrate 110 is vibrated according to a change in its resistance value. Of course, the vibration sensor 130 can also be a ball vibration switch or a reed switch.

所述調制傳遞函數值量測板100進一步包括一支撐裝置140,用於支撐所述基板110。該支撐裝置140包括一基座142,一主體144,一與該基座142滑動連接的第一磁性套環141,一第二磁性套環143及一第三磁性套環145。該第二、第三磁性套環143、145與所述基座142固定連接且分設於所述第一磁性套環141之相對兩側。所述主體144依次穿過第二、第一及第三磁性套環143、141及145,並與該第一磁性套環141固定連接。該主體144之一端1442為自由端,相對的另一端1444與所述調制傳遞函數值量測板100之基板110固定連接。該主體144於所述第一、第二及第三磁性套環141、143及145之間的磁力作用下維持於一平衡位置。 The modulation transfer function value measuring plate 100 further includes a supporting device 140 for supporting the substrate 110. The support device 140 includes a base 142, a main body 144, a first magnetic collar 141 slidably coupled to the base 142, a second magnetic collar 143 and a third magnetic collar 145. The second and third magnetic collars 143 and 145 are fixedly connected to the base 142 and are disposed on opposite sides of the first magnetic collar 141. The main body 144 passes through the second, first and third magnetic collars 143, 141 and 145 in sequence and is fixedly connected to the first magnetic collar 141. One end 1442 of the main body 144 is a free end, and the other end 1444 is fixedly connected to the substrate 110 of the modulation transfer function value measuring board 100. The body 144 is maintained in an equilibrium position by the magnetic force between the first, second and third magnetic collars 141, 143 and 145.

所述基座142大體相對於第一磁性套環141之位置設有一導軌1422。優選的,該第一磁性套環141藉由一連接臂1412與所述導軌1422活動連接。該連接臂1412能夠帶著該第一磁性套環141沿該導軌1422滑動。優選的,所述第二、第三磁性套環143、145分別藉由一連接臂1432、1452與所述基座142固定連接。 The base 142 is generally provided with a guide rail 1422 at a position relative to the first magnetic collar 141. Preferably, the first magnetic collar 141 is movably connected to the guide rail 1422 by a connecting arm 1412. The connecting arm 1412 can slide along the guide rail 1422 with the first magnetic collar 141. Preferably, the second and third magnetic collars 143 and 145 are fixedly connected to the base 142 by a connecting arm 1432 and 1452, respectively.

參見圖2,本發明第二實施例所提供之使用上述調制傳遞函數值量測板100之調制傳遞函數值測量裝置200,其包括一測試板210,一調制傳遞函數值量測板100,以及一驅動單元220。該調制傳遞函數值測量裝置200用於測量鏡頭300之調制傳遞函數值。 Referring to FIG. 2, a modulation transfer function value measuring apparatus 200 using the above-described modulation transfer function value measuring board 100 according to a second embodiment of the present invention includes a test board 210, a modulation transfer function value measuring board 100, and A drive unit 220. The modulation transfer function value measuring device 200 is for measuring the modulation transfer function value of the lens 300.

所述測試板210上具有測試圖案,如黑白相間之條紋。 The test board 210 has a test pattern, such as black and white stripes.

所述調制傳遞函數值量測板100包括一基板110,一固定於該基板110上的圖像感測器120,以及一裝設於該基板110上的震動感測器130。所述圖像感測器120可為電荷耦合圖像感測器或互補金屬氧化物半導體圖像感測器,其用於感測所述測試板210上的測試圖案經由所述待測鏡頭300於該圖像感測器120上的成像。所述震動感測器130可為水銀電阻式震動感測器,該水銀電阻式震動感測器可根據其電阻值之變化來感測所述基板110是否有震動,例如,測量過程中待測鏡頭300一接觸到圖像感測器120,該水銀電阻式震動感測器130之電阻值會立即產生變化,則表明所述基板110有震動,當然,該電阻值之變化還可以反應出該基板110相對於其初始位置之傾斜角度,進而可根據該傾斜角度使該基板110恢復至初始位置等。 The modulation transfer function value measuring board 100 includes a substrate 110, an image sensor 120 fixed on the substrate 110, and a vibration sensor 130 mounted on the substrate 110. The image sensor 120 may be a charge coupled image sensor or a complementary metal oxide semiconductor image sensor for sensing a test pattern on the test board 210 via the test lens 300 Imaging on the image sensor 120. The vibration sensor 130 can be a mercury resistance type vibration sensor, and the mercury resistance type vibration sensor can sense whether the substrate 110 has vibration according to a change in the resistance value thereof, for example, the measurement process is to be tested. As soon as the lens 300 contacts the image sensor 120, the resistance value of the mercury resistive vibration sensor 130 changes immediately, indicating that the substrate 110 has vibration. Of course, the change in the resistance value can also reflect the The inclination angle of the substrate 110 with respect to its initial position, and further, the substrate 110 can be restored to the initial position or the like according to the inclination angle.

所述調制傳遞函數值量測板100進一步包括一支撐裝置140,用於支撐所述基板110。該支撐裝置140包括一基座142,一主體144,一與該基座142滑動連接之第一磁性套環141,一第二磁性套環143及一第三磁性套環145。該第二、第三磁性套環143、145與所述基座142固定連接且分設於所述第一磁性套環141之相對兩側。所述主體144依次穿過第二、第一及第三磁性套環143、141及145,並與該第一磁性套環141固定連接。該主體144之一端1442為自由端,相對的另一端1444與所述調制傳遞函數值量測板100之基板110固定連接。該主體144於所述第一、第二及第三磁性套環141、143及145之間的磁 力作用下維持於一平衡位置。 The modulation transfer function value measuring plate 100 further includes a supporting device 140 for supporting the substrate 110. The support device 140 includes a base 142, a main body 144, a first magnetic collar 141 slidably coupled to the base 142, a second magnetic collar 143 and a third magnetic collar 145. The second and third magnetic collars 143 and 145 are fixedly connected to the base 142 and are disposed on opposite sides of the first magnetic collar 141. The main body 144 passes through the second, first and third magnetic collars 143, 141 and 145 in sequence and is fixedly connected to the first magnetic collar 141. One end 1442 of the main body 144 is a free end, and the other end 1444 is fixedly connected to the substrate 110 of the modulation transfer function value measuring board 100. The magnetic body of the main body 144 between the first, second and third magnetic collars 141, 143 and 145 Maintained in an equilibrium position under the action of force.

所述基座142大體相對於第一磁性套環141之位置設有一導軌1422。優選的,該第一磁性套環141藉由一連接臂1412與所述導軌1422活動連接。該連接臂1412能夠帶著該第一磁性套環141沿該導軌1422滑動。優選的,所述第二、第三磁性套環143、145分別藉由一連接臂1432、1452與所述基座142固定連接。 The base 142 is generally provided with a guide rail 1422 at a position relative to the first magnetic collar 141. Preferably, the first magnetic collar 141 is movably connected to the guide rail 1422 by a connecting arm 1412. The connecting arm 1412 can slide along the guide rail 1422 with the first magnetic collar 141. Preferably, the second and third magnetic collars 143 and 145 are fixedly connected to the base 142 by a connecting arm 1432 and 1452, respectively.

可以理解,所述第二、第一及第三磁性套環143、141及145可以為電磁鐵,且磁極及磁場強度可以調節,其磁極可以以S-N、N-S、S-N或N-S、S-N、N-S之順序排列,亦可以以N-S、N-S、N-S、或者S-N、S-N、S-N之順序排列,只要於第一、第二及第三磁性套環141、143及145之間能產生力平衡即可。 It can be understood that the second, first and third magnetic collars 143, 141 and 145 can be electromagnets, and the magnetic poles and the magnetic field strength can be adjusted, and the magnetic poles can be SN, NS, SN or NS, SN, NS. The order may be arranged in the order of NS, NS, NS, or SN, SN, and SN, as long as a force balance can be generated between the first, second, and third magnetic collars 141, 143, and 145.

所述驅動單元220可為一電機,用於驅動所述待測鏡頭300或調制傳遞函數值量測板100,使該待測鏡頭300與調制傳遞函數值量測板100沿該待測鏡頭300之光軸方向產生相對移動,以使所述測試板210上的測試圖案於所述圖像感測器120上獲得最佳成像。本實施例中,該驅動單元220用於驅動所述待測鏡頭300於所述調制傳遞函數值量測板100與測試板210之間沿該待測鏡頭300之光軸方向移動。 The driving unit 220 can be a motor for driving the to-be-measured lens 300 or the modulation transfer function value measuring board 100, and the measuring lens 300 and the modulation transfer function value measuring board 100 along the to-be-tested lens 300. The direction of the optical axis produces relative movement to achieve optimal imaging of the test pattern on the test panel 210 on the image sensor 120. In this embodiment, the driving unit 220 is configured to drive the to-be-detected lens 300 to move along the optical axis direction of the to-be-detected lens 300 between the modulation transfer function value measuring board 100 and the test board 210.

於使用本實施例所提供之調制傳遞函數值測量裝置200對待測鏡頭300進行測量時,當該待測鏡頭300於驅動單元220之驅動下,於所述測試板210與調制傳遞函數值量測 板100之間沿該待測鏡頭300之光軸方向移動,以使該測試板210上的測試圖案於所述圖像感測器120上獲得最佳成像之過程中,當該待測鏡頭300與圖像感測器120發生碰撞時,所述震動感測器130即可感測到該調制傳遞函數值量測板100之基板110及圖像感測器120之震動,此時該震動感測器130可產生一控制訊號,如控制報警器報警之訊號或控制水銀電阻值變化之反饋訊號,進而可自動或手動使驅動單元220立即停止工作,而且,若待測鏡頭300與圖像感測器120之間撞擊力較大時,所述第一、第二及第三磁性套環141、143及145之間的力平衡會被破壞,此時,該第一磁性套環141之連接臂1412會帶動該第一磁性套環141於所述基座142之導軌1422內滑動,進而帶動所述支撐裝置140之主體144及調制傳遞函數值量測板100一起滑動,對待測鏡頭300與圖像感測器120之間的撞擊力形成一緩衝,從而可避免造成整個測量裝置200及待測鏡頭300之嚴重損壞。 When the measurement of the to-be-measured lens 300 is performed by using the modulation transfer function value measuring apparatus 200 provided in this embodiment, when the to-be-tested lens 300 is driven by the driving unit 220, the test board 210 and the modulation transfer function value are measured. The plates 100 are moved along the optical axis direction of the lens to be tested 300 so that the test pattern on the test board 210 is optimally imaged on the image sensor 120, when the lens 300 to be tested When the image sensor 120 collides with the image sensor 120, the vibration sensor 130 can sense the vibration of the substrate 110 and the image sensor 120 of the modulation transfer function value measuring board 100. The detector 130 can generate a control signal, such as a signal for controlling the alarm of the alarm or a feedback signal for controlling the change of the resistance value of the mercury, thereby automatically or manually stopping the driving unit 220, and if the lens 300 to be tested and the image sense When the impact force between the detectors 120 is large, the force balance between the first, second, and third magnetic collars 141, 143, and 145 may be broken. At this time, the connection of the first magnetic collar 141 is broken. The arm 1412 can drive the first magnetic collar 141 to slide in the guide rail 1422 of the base 142, thereby driving the main body 144 of the supporting device 140 and the modulation transfer function value measuring plate 100 to slide together, and the lens to be tested 300 and The impact force between the image sensors 120 forms a buffer, Can avoid the entire measuring apparatus 200 and the lens 300 under test serious damage.

當然,可以理解,所述震動感測器130亦可為其他可偵測震動之裝置,如滾珠震動開關或磁簧開關等,只要當待測鏡頭300與圖像感測器120發生碰撞時,其能夠感測該圖像感測器120及所述基板110之震動,並能產生一控制訊號以使驅動單元220停止工作即可。 Of course, it can be understood that the vibration sensor 130 can also be other devices that can detect vibration, such as a ball vibration switch or a reed switch, etc., as long as the lens to be tested 300 collides with the image sensor 120, It can sense the vibration of the image sensor 120 and the substrate 110, and can generate a control signal to stop the driving unit 220 from operating.

綜上所述,本發明確已符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施例,舉凡熟悉本案技藝之人士,於爰依本案發明精神所作之等效修飾或變化,皆應包含於以下之申請專利範圍之內 。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only the preferred embodiment of the present invention, and those skilled in the art will be able to include the equivalent modifications or variations of the present invention in the spirit of the invention. .

100‧‧‧調制傳遞函數值量測板 100‧‧‧Modulation transfer function value measuring board

110‧‧‧基板 110‧‧‧Substrate

120‧‧‧圖像感測器 120‧‧‧Image sensor

130‧‧‧震動感測器 130‧‧‧Vibration sensor

140‧‧‧支撐裝置 140‧‧‧Support device

141‧‧‧第一磁性套環 141‧‧‧First magnetic collar

1412、1432、1452‧‧‧連接臂 1412, 1432, 1452‧‧‧ connecting arms

142‧‧‧基座 142‧‧‧Base

1422‧‧‧導軌 1422‧‧‧rail

143‧‧‧第二磁性套環 143‧‧‧Second magnetic collar

144‧‧‧主體 144‧‧‧ Subject

1442‧‧‧主體之一端 1442‧‧‧One of the main bodies

1444‧‧‧主體之另一端 1444‧‧‧The other end of the subject

145‧‧‧第三磁性套環 145‧‧‧ Third magnetic collar

200‧‧‧調制傳遞函數值測量裝置 200‧‧‧Modulation transfer function value measuring device

210‧‧‧測試板 210‧‧‧ test board

220‧‧‧驅動單元 220‧‧‧ drive unit

300‧‧‧特測鏡頭 300‧‧‧Special lens

圖1係本發明第一實施例所提供之量測板之結構示意圖。 1 is a schematic structural view of a measuring plate provided by a first embodiment of the present invention.

圖2係本發明第二實施例所提供之調制傳遞函數值測量裝置使用狀態示意圖。 2 is a schematic diagram showing a state of use of a modulation transfer function value measuring apparatus according to a second embodiment of the present invention.

100‧‧‧調制傳遞函數值量測板 100‧‧‧Modulation transfer function value measuring board

110‧‧‧基板 110‧‧‧Substrate

120‧‧‧圖像感測器 120‧‧‧Image sensor

130‧‧‧震動感測器 130‧‧‧Vibration sensor

140‧‧‧支撐裝置 140‧‧‧Support device

141‧‧‧第一磁性套環 141‧‧‧First magnetic collar

1412、1432、1452‧‧‧連接臂 1412, 1432, 1452‧‧‧ connecting arms

142‧‧‧基座 142‧‧‧Base

1422‧‧‧導軌 1422‧‧‧rail

143‧‧‧第二磁性套環 143‧‧‧Second magnetic collar

144‧‧‧主體 144‧‧‧ Subject

1442‧‧‧主體之一端 1442‧‧‧One of the main bodies

1444‧‧‧主體之另一端 1444‧‧‧The other end of the subject

145‧‧‧第三磁性套環 145‧‧‧ Third magnetic collar

Claims (8)

一種調制傳遞函數值量測板,其包括:一基板;一固定於該基板上的圖像感測器;一裝設於該基板上的震動感測器,用於感測該基板的震動;以及一支撐裝置,該支撐裝置包括一基座,一主體,一與基座滑動連接的第一磁性套環,一第二磁性套環及一第三磁性套環,該第二、三磁性套環與基座固定連接且分設於所述第一磁性套環之相對兩側,該主體依次穿過第二、第一及第三磁性套環並與第一磁性套環固定連接,其一端為自由端,相對的另一端與基板固定連接,該主體於第一、第二及第三磁性套環之間的磁力作用下維持於一平衡位置。 A modulation transfer function value measuring plate comprising: a substrate; an image sensor fixed on the substrate; and a vibration sensor mounted on the substrate for sensing the vibration of the substrate; And a support device, the support device includes a base, a main body, a first magnetic collar slidably coupled to the base, a second magnetic collar and a third magnetic collar, the second and third magnetic sleeves The ring is fixedly connected to the base and disposed on opposite sides of the first magnetic collar. The body passes through the second, first and third magnetic collars in sequence and is fixedly connected with the first magnetic collar. The free end, the opposite end is fixedly connected to the substrate, and the main body is maintained in an equilibrium position by the magnetic force between the first, second and third magnetic collars. 如申請專利範圍第1項所述之調制傳遞函數值量測板,其中,所述圖像感測器為電荷耦合圖像感測器或互補金屬氧化物半導體圖像感測器。 The modulation transfer function value measuring plate according to claim 1, wherein the image sensor is a charge coupled image sensor or a complementary metal oxide semiconductor image sensor. 如申請專利範圍第1項所述之調制傳遞函數值量測板,其中,所述震動感測器為水銀電阻式震動感測器、滾珠震動開關或磁簧開關。 The modulation transfer function value measuring board according to claim 1, wherein the vibration sensor is a mercury resistance type vibration sensor, a ball vibration switch or a reed switch. 一種調制傳遞函數值測量裝置,用於測量待測鏡頭之調制傳遞函數值,其包括:一測試板,該測試板上具有測試圖案;一調制傳遞函數值量測板,該量測板包括一基板及一固定於該基板上的圖像感測器,該圖像感測器用於感測所述測試板上的測試圖案經由所述待測鏡頭於該圖像感測器上的 成像;以及一驅動單元,用以使該待測鏡頭與調制傳遞函數值量測板沿該待測鏡頭之光軸方向產生相對移動;其中,所述調制傳遞函數值量測板還包括一裝設於所述基板上的震動感測器以及一支撐裝置,當待測鏡頭與圖像感測器發生碰撞時,該震動感測器能夠感測該基板之震動並產生一控制訊號以使驅動單元停止工作;該支撐裝置包括一基座,一主體,一與基座滑動連接的第一磁性套環,一第二磁性套環及一第三磁性套環,該第二、三磁性套環與基座固定連接且分設於所述第一磁性套環之相對兩側,該主體依次穿過第二、第一及第三磁性套環並與第一磁性套環固定連接,其一端為自由端,相對的另一端與基板固定連接,該主體於第一、第二及第三磁性套環之間的磁力作用下維持於一平衡位置。 A modulation transfer function value measuring device for measuring a modulation transfer function value of a lens to be tested, comprising: a test board having a test pattern; a modulation transfer function value measuring plate, the measuring plate comprising a a substrate and an image sensor fixed on the substrate, the image sensor is configured to sense a test pattern on the test board via the lens to be tested on the image sensor And a driving unit for causing the lens to be tested and the modulation transfer function value measuring plate to move relative to each other along an optical axis direction of the lens to be tested; wherein the modulation transfer function value measuring plate further comprises a loading a vibration sensor disposed on the substrate and a supporting device, when the lens to be tested collides with the image sensor, the vibration sensor can sense the vibration of the substrate and generate a control signal to drive The unit stops working; the supporting device includes a base, a main body, a first magnetic collar slidably coupled to the base, a second magnetic collar and a third magnetic collar, the second and third magnetic collars Fixedly connected to the base and disposed on opposite sides of the first magnetic collar, the body sequentially passes through the second, first and third magnetic collars and is fixedly connected with the first magnetic collar, one end of which is The free end and the opposite end are fixedly connected to the substrate, and the main body is maintained in an equilibrium position by the magnetic force between the first, second and third magnetic collars. 如申請專利範圍第4項所述之調制傳遞函數值測量裝置,其中,所述圖像感測器為電荷耦合圖像感測器或互補金屬氧化物半導體圖像感測器。 The modulation transfer function value measuring device according to claim 4, wherein the image sensor is a charge coupled image sensor or a complementary metal oxide semiconductor image sensor. 如申請專利範圍第4或5項所述之調制傳遞函數值測量裝置,其中,所述震動感測器為水銀電阻式震動感測器,當待測鏡頭與圖像感測器發生碰撞時,該水銀電阻式震動感測器能夠感測該基板相對於其一初始位置之傾斜角度。 The modulation transfer function value measuring device according to the fourth or fifth aspect of the invention, wherein the vibration sensor is a mercury resistance type vibration sensor, when the lens to be tested collides with the image sensor, The mercury resistive vibration sensor is capable of sensing an angle of inclination of the substrate relative to an initial position thereof. 如申請專利範圍第4項所述之調制傳遞函數值測量裝置,其中,所述測試圖案為黑白相間的條紋。 The modulation transfer function value measuring device according to claim 4, wherein the test pattern is black and white stripes. 如申請專利範圍第4項所述之調制傳遞函數值測量裝置,其中,所述驅動單元為電機。 The modulation transfer function value measuring device according to claim 4, wherein the driving unit is a motor.
TW95142681A 2006-11-17 2006-11-17 Measurement board and apparatus with the same for measuring modulation transfer function value TWI387738B (en)

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