1363941 九、發明說明： 【發明所屬之技術領域】 本發明是有關於一種測試裝置，且特別是有關於一種能同 時測試多個待測板（Unit Under Test，UUT )的測試裝f。 【先前技術】 圖1是習知一種測試裝置的方塊圖。請參照圖丨，習知測 試裝置100包括一主機電腦（HostPC) 110、一測試板12〇以 及現％ 即 ％ 資訊系統（Shop Fi00r informati〇n SyStem，sfis ) 130。主機電腦no是電性連接至測試板12〇與現場即時資訊 系統130，而測試板12〇用以電性連接至一待測板5〇。 習知技術的測試步驟是透過主機電腦11〇啟動測試流 程，並藉由測試板120對待測板5〇進行測試。螂試完成後， 主機電腦no會將測試結果傳送至現場即時資訊系統13〇，而 現場即時資訊系統130會儲存測試結果。 習知技術中，每一測試板12〇是用以測試特定的待測板 50，所以在測試不同待測板5〇時需更換測試板 120。此外，1363941 IX. Description of the Invention: [Technical Field] The present invention relates to a test apparatus, and more particularly to a test set capable of simultaneously testing a plurality of Unit Under Test (UUT). [Prior Art] FIG. 1 is a block diagram of a conventional test apparatus. Referring to the figure, the conventional testing device 100 includes a host computer (HostPC) 110, a test board 12, and a current information system (Shop Fihr informati〇n SyStem, sfis) 130. The host computer no is electrically connected to the test board 12 and the live instant information system 130, and the test board 12 is electrically connected to a board to be tested. The test procedure of the prior art is to start the test process through the host computer 11 and test the test board 5 by the test board 120. After the test is completed, the host computer no will transmit the test results to the live instant messaging system 13 and the live instant messaging system 130 will store the test results. In the prior art, each test board 12 is used to test a specific board to be tested 50, so the test board 120 needs to be replaced when testing different boards to be tested. In addition,
由於每-制板5G包料轉測部分，所以若制板5〇有升 級時，通常需研發新的延伸卡、在測試板12〇上新增元件或是 重新设計測試板12G，以完整測試待測板％的每—待測部分。 特別是’若制板50具有主動元件（如區域網路（LQcaiSince the 5G package transfer part of each board is used, if the board 5 is upgraded, it is usually necessary to develop a new extension card, add components on the test board 12〇 or redesign the test board 12G to complete Test each part of the board to be tested. In particular, if the board 50 has active components (such as regional network (LQcai)
Netw_LAN)晶片）時’往往需要更換另—測試板或是新增 由於習知技術需研發許多測試板12〇，所以較耗費成本。 此外’在測試不同待測才反5〇時，需更換測試板12〇，所以較 為費時。另外，在習知技術中’主機電腦i i Q躲同時測試多 個待測板50，導致測試時間過長。 5 1363941 級排(Wireless Universal Serial Bus，Wireless USB ) 〇 在本發明之一實施例中’上述之可編程測試板具有多個連 接介面。 . 在本發明之一實施例中，上述之測試裝置更包括至少一輸 入單元，連接可編程測試板。 在本發明之一實施例中，上述之輸入單元包括一鍵盤及/ 或條碼掃描器（Barcode Scanner)。 在本發明之一實施例中，上述之主控電腦包括一主機電腦 • (HostpC)或一伺服器（Server)。 本發明之測試裝置中，主控電腦可控制至少一可編程測試 板以同時對多個待測板進行測試，所以能節省測試時間。此 外，。由於可編程測試板具有可編程系統晶片，所以可透過軟體 ，輯的方式，使可編程測試板能測試多種待測板，如此可以節 省研發測試板的成本。因此，本發明之測試裝置能降低測試成 本及測試時間。 “為讓本發明之上述和其他目的、特徵和優點能更明顯易 φ 懂，下文特舉較佳實施例，並配合所附圖式，作詳細說明如下。 【實施方式】 圖+2是本發明一實施例之測試裝置的示意圖。請參照圖 2，本實施例之測試裝置200適於測試多個待測板（如6〇a、 -6〇b、6〇C)。此測試裝置200包括一遠端連接單元21〇、多個 可編程測試板（如220a、220b、220c)以及一主控電腦23〇。 可編程測試板220a、220b、220c分別連接至遠端連接單元 210，而主控電腦230是連接至遠端連接單元21〇。每一可編 程測試板220a、220b、220c具有一可編程系統晶片222。每一 待測板60a、60b、60c適於連接至可編程測試板22〇a、22此、 7 1363941 220c其中之一。更詳細地說，待測板6〇a是連接至可編程測試 板220a ’待測板60b是連接至可編程測試板220b，而待測板 60c是連接至可編程測試板220c。 此外，主控電腦230内存有預設的多個測試流程，且主控 龟腦230適於根據待測板6〇a、60b、60c的種類來選取對鹿待 測板60a、60b、60c的測試流程，並控制可編程測試板22〇a、 220b、220c對待測板60a、60b、60c進行測試。換言之，主控 電腦230可選取用於測試待測板6〇a的測試流程，並控制可編 鲁程測试板220a，以對待測板60a進行測試。同樣地，主控電腦 230可選取用於測試待測板6〇b的測試流程，並控制可編程測 試板220b，以對待測板60b進行測試。主控電腦23〇可選取 用於測試待測板6〇c的測試流程，並控制可編程測試板22此， 以對待測板60c進行測試。 上述之測試裝置200中’每一可編程系統晶片222例如是 一現場可程式邏輯閘陣列晶片。域電腦230可為-主機電腦 或-飼服器。此外’主控電腦23〇及可編程測試板施、2施、 • 22〇c可透過傳輸線而與遠端連接單元21()連接，其中傳輸線 可為網路線。亦即，遠端連接單元21〇可為一集線器或一存取 點。另外’傳輸線並不限定於網路線，舉例來說，傳輸線還可 .以是通用序舰流排（Universal Sedal Bus, USB )。 • 土承上述主技包腦230還可透過一無線傳輸方式而連接至 =連接單元210 ’其中無線傳輸方式可以是-無線網路、-監牙、-紅外線或是—無線通用序列匯流排。此外，每一可編 =測試板22Ga、22%、2施具衫個連接介面224。這些連接 ^面224包括通用序列匯流排埠、通用型輸入/輸出璋（⑽― pose I/O Port) ~合測試工作組埠（加加了咖Acti〇nWhen Netw_LAN) is used, it is often necessary to replace another test board or to add a new test board 12 由于 because of the conventional technology, so it is costly. In addition, when the test is different, it is necessary to replace the test board 12〇, so it is time consuming. In addition, in the prior art, the host computer i i Q hides multiple test boards 50 at the same time, resulting in a test time that is too long. 5 1363941 Wireless Universal Serial Bus (Wireless USB) 〇 In one embodiment of the invention, the programmable test board described above has a plurality of connection interfaces. In an embodiment of the invention, the test apparatus further includes at least one input unit connected to the programmable test board. In an embodiment of the invention, the input unit comprises a keyboard and/or a Barcode Scanner. In an embodiment of the invention, the host computer includes a host computer (HostpC) or a server (Server). In the test apparatus of the present invention, the main control computer can control at least one programmable test board to simultaneously test a plurality of boards to be tested, thereby saving test time. In addition,. Since the programmable test board has a programmable system chip, the programmable test board can test a variety of boards to be tested through software and serials, which can save the cost of developing the test board. Therefore, the test apparatus of the present invention can reduce the test cost and test time. The above and other objects, features, and advantages of the present invention will become more apparent and appreciated. A schematic diagram of a test apparatus according to an embodiment of the invention. Referring to Figure 2, the test apparatus 200 of the present embodiment is adapted to test a plurality of boards to be tested (e.g., 6〇a, -6〇b, 6〇C). The utility model comprises a remote connection unit 21, a plurality of programmable test boards (such as 220a, 220b, 220c) and a main control computer 23. The programmable test boards 220a, 220b, 220c are respectively connected to the remote connection unit 210, and The main control computer 230 is connected to the remote connection unit 21. Each programmable test board 220a, 220b, 220c has a programmable system chip 222. Each of the test boards 60a, 60b, 60c is adapted to be connected to a programmable test One of the boards 22A, 22, and 7 1363941 220c. In more detail, the board to be tested 6A is connected to the programmable test board 220a 'The board to be tested 60b is connected to the programmable test board 220b, and is to be The test board 60c is connected to the programmable test board 220c. In addition, the main control computer There are a plurality of preset test flows in the memory, and the master turtle brain 230 is adapted to select a test flow for the deer test panels 60a, 60b, 60c according to the types of the boards 6a, 60b, 60c to be tested, and control The programmable test boards 22a, 220b, 220c are tested on the test boards 60a, 60b, 60c. In other words, the main control computer 230 can select a test flow for testing the test board 6a, and control the programmable test The test board 220a is tested by the test board 60a. Similarly, the main control computer 230 can select a test flow for testing the test board 6〇b, and control the programmable test board 220b to test the test board 60b. The main control computer 23 〇 can select a test flow for testing the test board 6 〇 c, and control the programmable test board 22 to test the test board 60 c. The above test device 200 'each programmable system chip 222 is, for example, a field programmable logic gate array chip. The domain computer 230 can be a host computer or a feeding device. In addition, the 'master computer 23' and the programmable test board, 2, 22, c can pass through the transmission line. And connected to the remote connection unit 21 (), wherein the transmission line It can be a network route. That is, the remote connection unit 21 can be a hub or an access point. In addition, the transmission line is not limited to the network route. For example, the transmission line can also be a general-purpose ship flow ( Universal Sedal Bus, USB). • The above-mentioned main technology package brain 230 can also be connected to the connection unit 210 through a wireless transmission method. The wireless transmission method can be - wireless network, - monitor, infrared or - Wireless universal sequence bus. In addition, each of the testable boards 22Ga, 22%, 2 is provided with a connection interface 224. These connections 224 include general-purpose serial bus 埠, general-purpose input/output 璋 ((10) ― pose I/O Port) ~ combined test work group 加 (plus plus coffee Acti〇n
Group 8 1363941Group 8 1363941
Port, JTAG Port)、乙太網埠（Ethernet Port)、無線網路介面、 音效埠、低電麗差動訊號（L〇w-Voltage Differential Signaling, LVDS)介面、列印終端埠（Line Print Terminal Port，LPT Port)、序列埠（COM Port)、PS/2埠以及視頻圖像陣列埠（Video Graphics Array Port，VGA Port)之至少其中之一。另外，使用 者可透過聯合測試工作組埠對可編程系統晶片222做編程跟 寫入的動作。 在本實施例中’測試裝置200可更包括多個輸入單元 • 240 ’而這些輸入單元240是分別連接可編程測試板220a、 220b、220c。此外，每一輸入單元240可包括一鍵盤及/或一 條碼掃描器。 以下將以測試待測板60a為例來說明本實施例之測試裝 置200的測試方法。此外，關於待測板6〇b、6〇c的測試方法 與待測板60a的測試方法相同，故在下文中將不詳細說明。 本员％例之測§式裝置200的測試方法如下：首先，由測試 人員透過連接至可編程測試板220a的輸入單元240輪入待測 % 板60a的種類至可編程測試板220a，且可編程測試板220a會 將待測板60a的資訊傳送至主控電腦23〇。更詳細地說，測二 人員可用鍵盤輸入待測板6〇a的種類（如輸入待測板6〇a的序 ' 旒）。此外，若待測板60a具有條碼62，則測試人員可透過 條碼掃描器掃描待測板60a的條碼62，以輸入待測板6〇a的種 類。 接者，主控電腦230可根據待測板6〇a的種類來選取用於 ，試待測板6Ga的測試流程’並將此測試流程傳送至可編程測 忒板220a，之後主控電腦230會控制可編程測試板22〇a，以 對待測板6Ga進行測試。在測試過程巾，可編程測試板如 9 1363941 係將測試狀態回報至主控電腦230，使得測試人員可透過主控 電腦230 了解測試狀態。 測試完成後，可編程測試板220a會將測試結果傳送至主 控電腦230。若待測板60a通過測試，則主控電腦230可直接 儲存測試結果。若待測板60a未通過測試，則測試人員可決定 疋否要重新測試’而若測試人員選擇不重新測試，則主控電腦 230會儲存測試結果。Port, JTAG Port), Ethernet Port, Wireless Network Interface, Audio 埠, L〇w-Voltage Differential Signaling (LVDS) Interface, Print Terminal 埠 (Line Print Terminal) Port, LPT Port), COM Port, PS/2埠, and at least one of a Video Graphics Array Port (VGA Port). In addition, the user can program and write the programmable system chip 222 through the joint test working group. In the present embodiment, the test apparatus 200 may further include a plurality of input units • 240 ′ and the input units 240 are connected to the programmable test boards 220a, 220b, and 220c, respectively. Additionally, each input unit 240 can include a keyboard and/or a barcode scanner. The test method of the test apparatus 200 of the present embodiment will be described below by taking the test board 60a as an example. Further, the test method regarding the boards to be tested 6〇b, 6〇c is the same as the test method of the board to be tested 60a, and therefore will not be described in detail below. The test method of the §-type device 200 of the present example is as follows: First, the tester rotates the type of the % board 60a to be tested to the programmable test board 220a through the input unit 240 connected to the programmable test board 220a, and can The programming test board 220a transmits the information of the board to be tested 60a to the host computer 23A. In more detail, the second person can input the type of the board to be tested 6〇a by using the keyboard (for example, inputting the order ' '' of the board to be tested 6〇a). Further, if the board to be tested 60a has the bar code 62, the tester can scan the bar code 62 of the board to be tested 60a through the bar code scanner to input the type of the board 6a to be tested. Alternatively, the main control computer 230 can select a test flow for testing the test board 6Ga according to the type of the test board 6〇a and transmit the test flow to the programmable test strip 220a, and then the main control computer 230 The programmable test board 22〇a is controlled to be tested with the test board 6Ga. In the test process, the programmable test board, such as 9 1363941, returns the test status to the host computer 230 so that the tester can know the test status through the host computer 230. After the test is completed, the programmable test board 220a transmits the test results to the host computer 230. If the board to be tested 60a passes the test, the main control computer 230 can directly store the test results. If the test board 60a fails the test, the tester can decide whether or not to retest. If the tester chooses not to retest, the main control computer 230 will store the test result.
在本實施例中，測試裴置200可更包括一現場即時資訊系 統250。此現場即時資訊系統250是連接至主控電腦230，而 主控電腦230可依需求決定是否將測試結果傳送至現場即時 資訊系統250。 在本貫施例之測試裂置200中，由於主控電腦230可控制 可編程測試板220a、220b、220c，以同時測試待測板60a、60b、 6〇c ’所以可節省測試時間。此外，可編程測試板m㈣匕、 220c^r具有多種連接介面224，以與多種待測板連接。而且， 由於每-可編程測試板22Ga、通、22Ge具有可編程系統晶 =222 ’所以可透—過主控電腦23()寫入測試程式於可編程系統 晶片222巾’使每—可編程測試板2施、2勘、歷能測試 多種待測板，如此能節省研發測試板的成本。另外，若待測板 有變更或升級’只需要更新主控電腦⑽中的峨流程並透過 主，電腦230新增或修改可編程系統晶片222的測試程式就可 Ϊ罟t關ΪΓ式。所以’相較於習知技術，本實施例之測試 " 不高製作多種測試板，所以能節省測試板的成本以及 更換測試板的時間。拖 換§之，本貫施例之測試裝置200可以降 低測S式成本及測試時間。 而〆主思的疋雖然在圖2 _是以三個可編程測試板220a、 1363941 220b、220c為例，但在本發明中，可編程測試板的數量可為 一個或多個。 雖然可編程測試板220a、220b、220c分別具有多個連接 介面224，但若這些連接介面224與待測板的連接介面不同 4，可透過擴充單元來連接待測板。此外，若可編程測試板 • 220a、220b、220c無法直接與待測板傳輸訊號時，亦可透過擴 充單元來與待測板傳輸訊號。以下將配合圖式說明具有擴充單 元之測試裝置的實施例。 • 圖3是本發明另一實施例之測試裝置的示意圖。請參照圖 3，相較於測試裝置200，測試裝置200,更包括多個擴充單元 260a、260b、260c。擴充單元260a是連接於可編程測試板22〇a 與待測板60d之間’擴充單元260b是連接於可編程測試板22〇1) - 與待測板60e之間，而擴充單元260c是連接於可編程測試板 220c與待測板60f之間。換言之，可編程測試板22〇a是透過 擴充單元260a而與待測板60d連接並傳輸訊號，可編程測試 板220b是透過擴充單元260b而與待測板60e連接並傳輸訊 ❿ 號’可編程測試板220c是透過擴充單元260c而與待測板6〇f 連接並傳輸訊號。 綜上所述’本發明之測試裝置至少具有下列優.黑占： 1.由於主控電細可控制至少一可編程測試板，以同時測試 多個待測板，所以能節省測試時間。 2.由於可編程測试板具有可編程系統晶片，所以可透過軟 體編輯的方式，使每一可編程測試板能測試多種待測板，如此 能節省研發測試板的成本。 3·若待測板有變更或升級’只需要更新主控電腦中的測試 々IL私並修改可編程系統晶片的程式就可以支援相關的測試。所 11 1363941 以，相較於習知技術，本發明之測試裝置可節省研發許多測試 板的成本。 ° 雖然本發明已以較佳實施例揭露如上，然其並非用以限定 本發明，所屬技術領域中具有通常知識者，在不脫離本發明之 精神和範圍内，當可作些許之更動與潤飾，因此本發明之保護 範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 圖1是習知一種測試裝置的方塊圖。 圖2是本發明一實施例之測試裝置的示意圖。 圖3是本發明另一實施例之測試裝置的示意圖。 【主要元件符號說明】 50、60a ' 60b、60c、60d、60e、60f :待測板 62 :條碼 100、200、200’ ：測試裝置 110 :主機電腦 120 :測試板 130、250 :現場即時資訊系統 210 :遠端連接單元 220a、220b、220c :可編程測試板 222 :可編程系統晶片 224 :連接介面 230 :主控電腦 240 :輸入單元 250 :現場即時資訊系統 260a、260b、260c :擴充單元 12In the present embodiment, the test device 200 can further include a live instant information system 250. The live instant messaging system 250 is coupled to the host computer 230, and the host computer 230 can determine whether to transmit test results to the live instant messaging system 250 as desired. In the test split 200 of the present embodiment, since the main control computer 230 can control the programmable test boards 220a, 220b, 220c to simultaneously test the boards to be tested 60a, 60b, 6〇c', the test time can be saved. In addition, the programmable test boards m(4), 220c^r have a plurality of connection interfaces 224 for connection with a plurality of boards to be tested. Moreover, since each programmable test board 22Ga, pass, 22Ge has a programmable system crystal = 222 ' so can pass through the main control computer 23 () write test program on the programmable system chip 222 towel 'make each - programmable Test board 2, 2 survey, calendar can test a variety of boards to be tested, which can save the cost of research and development test boards. In addition, if the board to be tested is changed or upgraded, it is only necessary to update the process in the host computer (10) and add or modify the test program of the programmable system chip 222 through the main computer 230. Therefore, the test of the present embodiment is not high in producing a plurality of test boards, so that the cost of the test board and the time for replacing the test board can be saved. By dragging §, the test apparatus 200 of the present embodiment can reduce the S-type cost and test time. However, although FIG. 2 is an example of three programmable test boards 220a, 1363941 220b, and 220c, in the present invention, the number of programmable test boards may be one or more. Although the programmable test boards 220a, 220b, and 220c respectively have a plurality of connection interfaces 224, if the connection interfaces 224 are different from the connection interface of the board to be tested, the expansion unit can be connected to the board to be tested. In addition, if the programmable test board • 220a, 220b, and 220c cannot directly transmit signals to the board to be tested, the signal can be transmitted to the board to be tested through the expansion unit. An embodiment of a test apparatus having an expansion unit will be described below in conjunction with the drawings. Figure 3 is a schematic illustration of a test apparatus in accordance with another embodiment of the present invention. Referring to FIG. 3, the test apparatus 200 further includes a plurality of expansion units 260a, 260b, and 260c as compared with the test apparatus 200. The expansion unit 260a is connected between the programmable test board 22a and the board to be tested 60d. 'The expansion unit 260b is connected to the programmable test board 22〇1) - and the board to be tested 60e, and the expansion unit 260c is connected. Between the programmable test board 220c and the board to be tested 60f. In other words, the programmable test board 22A is connected to the board to be tested 60d through the expansion unit 260a and transmits signals. The programmable test board 220b is connected to the board 60e through the expansion unit 260b and transmits the signal 'programmable. The test board 220c is connected to the board to be tested 6〇f through the expansion unit 260c and transmits signals. In summary, the test apparatus of the present invention has at least the following advantages: 1. Since the main control unit can control at least one programmable test board to simultaneously test a plurality of boards to be tested, the test time can be saved. 2. Since the programmable test board has a programmable system chip, each programmable test board can test a plurality of test boards by means of software editing, which can save the cost of developing test boards. 3. If the board to be tested has been changed or upgraded, it is only necessary to update the test in the main control computer, and the program of the programmable system chip can be modified to support the relevant test. 11 1363941 Thus, the test apparatus of the present invention can save the cost of developing many test boards compared to conventional techniques. While the invention has been described above by way of a preferred embodiment, it is not intended to limit the invention, and it is to be understood by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a block diagram of a conventional test apparatus. 2 is a schematic diagram of a test apparatus according to an embodiment of the present invention. Figure 3 is a schematic illustration of a test apparatus in accordance with another embodiment of the present invention. [Main component symbol description] 50, 60a '60b, 60c, 60d, 60e, 60f: board to be tested 62: barcode 100, 200, 200': test device 110: host computer 120: test board 130, 250: live instant information System 210: remote connection unit 220a, 220b, 220c: programmable test board 222: programmable system chip 224: connection interface 230: main control computer 240: input unit 250: live instant information system 260a, 260b, 260c: expansion unit 12