TWI346790B - Calibration equipment, calibration method, and testing device - Google Patents

Calibration equipment, calibration method, and testing device

Info

Publication number
TWI346790B
TWI346790B TW096138489A TW96138489A TWI346790B TW I346790 B TWI346790 B TW I346790B TW 096138489 A TW096138489 A TW 096138489A TW 96138489 A TW96138489 A TW 96138489A TW I346790 B TWI346790 B TW I346790B
Authority
TW
Taiwan
Prior art keywords
calibration
testing device
equipment
calibration method
calibration equipment
Prior art date
Application number
TW096138489A
Other languages
English (en)
Other versions
TW200821611A (en
Inventor
Masahiro Ishida
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200821611A publication Critical patent/TW200821611A/zh
Application granted granted Critical
Publication of TWI346790B publication Critical patent/TWI346790B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
TW096138489A 2006-10-17 2007-10-15 Calibration equipment, calibration method, and testing device TWI346790B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/582,142 US7352190B1 (en) 2006-10-17 2006-10-17 Calibration apparatus, calibration method, and testing apparatus

Publications (2)

Publication Number Publication Date
TW200821611A TW200821611A (en) 2008-05-16
TWI346790B true TWI346790B (en) 2011-08-11

Family

ID=39227289

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096138489A TWI346790B (en) 2006-10-17 2007-10-15 Calibration equipment, calibration method, and testing device

Country Status (4)

Country Link
US (1) US7352190B1 (zh)
JP (1) JP5202324B2 (zh)
TW (1) TWI346790B (zh)
WO (1) WO2008047683A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2189816B1 (en) * 2008-11-24 2016-03-16 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Charge pulse detecting circuit
CN102313876B (zh) * 2010-07-05 2013-07-10 河南省电力公司电力科学研究院 一种全自动高压介质损耗测试仪检定装置
US20130120010A1 (en) * 2011-11-10 2013-05-16 Qualcomm Incorporated Power Measurement System for Battery Powered Microelectronic Chipsets
KR101970273B1 (ko) * 2017-05-24 2019-04-18 포스필 주식회사 충방전 수단을 구비한 전류 계측 장치 및 이를 이용하는 전류 계측 방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62148882A (ja) * 1985-12-23 1987-07-02 Yokogawa Electric Corp 時間計測装置
GB9313020D0 (en) * 1993-06-24 1993-08-11 Madge Networks Ltd Jitter monitoring
US6671652B2 (en) * 2001-12-26 2003-12-30 Hewlett-Packard Devlopment Company, L.P. Clock skew measurement circuit on a microprocessor die
US6788045B2 (en) * 2002-05-17 2004-09-07 Sun Microsystems, Inc. Method and apparatus for calibrating a delay locked loop charge pump current
US20040062301A1 (en) * 2002-09-30 2004-04-01 Takahiro Yamaguchi Jitter measurement apparatus and jitter measurement method
GB2393794B (en) * 2002-10-01 2004-11-24 Motorola Inc Module, system and method for testing a phase locked loop
US7236555B2 (en) * 2004-01-23 2007-06-26 Sunrise Telecom Incorporated Method and apparatus for measuring jitter
US7024324B2 (en) * 2004-05-27 2006-04-04 Intel Corporation Delay element calibration
DE102006007617A1 (de) * 2005-02-14 2006-08-24 Advantest Corp. Jittermessvorrichtung, Jittermessverfahren, Prüfvorrichtung und Elektronische Vorrichtung
US7684533B2 (en) * 2005-05-26 2010-03-23 International Business Machines Corporation Phase lock loop jitter measurement
US7554332B2 (en) * 2006-03-10 2009-06-30 Advantest Corporation Calibration apparatus, calibration method, testing apparatus, and testing method

Also Published As

Publication number Publication date
US20080088319A1 (en) 2008-04-17
WO2008047683A1 (fr) 2008-04-24
US7352190B1 (en) 2008-04-01
JPWO2008047683A1 (ja) 2010-02-25
JP5202324B2 (ja) 2013-06-05
TW200821611A (en) 2008-05-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees