1344644 九、發明說明： 【發明所屬之技術領域】 本發明係有關於光學儲存農置之寫入策略微調（write strategy tuning)，特別係關於利用資料對時脈邊緣偏差（data_t〇_d〇ckedge deviation)來微調（tune)寫入策略參數之方法及系統。 【先前技術】 由於多媒體應用持續發展，儲存大量數位資料之需求亦快速地 成長。因此，儲存容量高且體積小巧之光學儲存媒體，例如：光 碟片（Compact Disc, CD )或數位多樣化光碟（Digital 乂㈣伽Disc， DVD) ’就非常流行，且光學儲存裴置，例如：光碟機（CDdrive) 或數位多樣化光碟機（DVD drive)，已成為個人電腦之標準配備， 用來進行上述之多媒體應用。 以上述之光碟機為例，當光碟機被控制以將資料寫入可記錄式 光碟片（CD-Recordable disc，CD-R disc)時，光碟機中之雷射二 極體之寫入功率（writingpower)通常係被設為特定值’且對應於 貧料之寫入脈衝（write pulse)被用於在可記錄式光碟片之溝槽 (groove)上將資料§己錄成複數個凹坑（)與平面（hnd )。寫 入功率之特錄可通過最佳功雜正（Gptimal OPC)程序來取得。另一方面’通過寫入策略微調（諸伽吨y 5 1344644 * ' 咖叩）各序’亦稱為燒錄策略微調（recording strategy tuning)程 --序改憂用來控制寫入脈衝的寬度之寫入策略參數，可增加可記 錄式光碟片上所形成之凹坑與平面的長度之精確度。請參考可記 錄式光碟片規格之侧文件，例如：橘皮書第__部（加喂B〇〇k Parti)，以取得更多資訊。 依據相關技術’特定裝置（例如示波器）可被用於寫入策略微 •調程序。通常，在預先之試誤性寫入程序之後，依據示波器上所 ‘、、頁示之複數個重建波形（reproduced wavef_ )的眼圖（哪p象^ ) 來控制寫入脈衝的寬度之新的一組寫入策略參數通常係由工程師 或研究員基於經驗來決定。然而，因為同樣的程序必須針對各種 可應用的媒體以及不同的記錄速度而重複地進行，重複進行的程 序至少包括寫人測試資料、檢視示波紅賴示之重建波形的眼 圖、以及藉由經驗依據眼圖來決定新的一組寫入策略參數，因此 鑄使用=方法會耗費工程師或研究員許多時間。由於藉由檢視眼圖 來决定些寫入策略參數並非自動的運作因此上述之寫入策略 微調程細當耗時。另外’由於藉由經驗依據該關來決定新的 :組寫入策略參數並不是定4的，因此上述之寫人策略微調程序 、是列顧（indefinite)。在某錄況下，含_清騎圖會干擾 • 寫入策略微調程序甚至會使寫入策略微調裎序失效。 特定儀！，例如：時間間距分析儀（time interyal咖㈣TIA) 或抖動計量器（jitter meter)，可能有助於取得用來決定新的一组 6 1344644 寫入策略參數的資訊。然而’仍然需要進行 若時間間距分析儀或抖動計量器係僅簡單地被丁旦^且 而科置的控制㈣，料動微触序所目== 然存在。糾，自_____ 許多時間 (impJidt)，因此，需要耗費經驗豐富駐程師或研究員_、 【發明内容】 為解決以上技術問題，本發明接供 置之寫入策略參數之方法及料t 來賴光學儲存裝 Λ 本發明提供了 來微調光學儲存裝置之寫人策略參數之 方法’包3 .制複數錄度，每—長度對應於光學儲存裝置所 存取之光學儲存媒體上之—凹坑（⑻或—平面Ο—;進行對 應於複數個資料集_ (_ Μ咖）之計算，以及產生分別對 應於資料集類型之複數個資料對時脈邊緣偏差（杨剔心物 d—其中資料集類型包含至少一凹坑平面凹坑(pit iand_⑻ 貧料集類型歧少—平面凹坑伟（landpit_land)龍集類型。 以及使用資料對時脈邊緣偏差以微調寫人策略參數，其中寫入策 略參數分別對應於資料集類型。 本發明另提供了 —來微調光學儲純置之寫人策略參數 之系統，。包含偵測器、計算模組、與控制器，其中計算模組係輕 接至制S ’控制11係減至計算模組。侧H制複數個長度， 7 1344644 ==於=儲存裝置所存取之光學儲存媒體上之- ^ #驗進仃對應各種資料集類型之計算，以及 產生为別對應於這些資料隼類型& 料集類型包含至少對時脈邊緣偏差，其中資 平面資_ 料集類型或至少—平面凹坑 +面貝㈣_。控彻這些#料 別對應於這些資料集類型之寫入策略參數。賴差以微咖 夕古生發μ提供了—種料微調光學儲存裝置之寫人策略參數 #晉包含]貞測複數個長度，每—長度對應於藉由光學儲存 數個次=之光學儲雜體上之—凹坑或一平面；行對應於複 次粗貝;，、麵之計算以及產生分顺應於資料集_之複數個 貝厂:對時脈邊緣偏差。進行對應於資__之計算職產生分 別對應於資料集_之資料鱗脈邊緣偏差之步驟更包含：取得 (Ve) >料對時脈邊緣偏差大於第-門播值（thresh〇id)之資 料集類型；於資料對時脈邊緣偏差大於第-門櫪值之資料集類型 中’取得資料集發生次數多於第二門檻值所指示之次數之資料集 ，里’以及&丨算對應於資料集發生次數多於第二門檻值所指示之 -人數之資料集類型之寫人策略參數的調整量。以及棚調整量以 微調寫入策略參數。 本發明&供之用來微調光學儲存裝置之寫入策略參數之方法 及其系統，藉由依據資料對時脈邊緣偏差來微調寫入策略參數， 而不需要特定外部裝置的協助’亦不需要耗f：L程師或研究員過 8 1344644 • ·多時間，即可微調光學儲存裝置之寫入策略參數。 * . 【實施方式】 本發明提侧來微調（tune)光學儲純置之寫人策略參數 (writestrategyparameter)之系統。這些系統係用來微調寫入策略 參數之電路’該電路係置於該光學儲存裝置中。這些系統的一些 實施例也可以在實質上（substantially)為該光學儲存裝置本身。 . 為了簡明起見’在以下的說明中係採用將該系統實施於一電路 中。然而，其他實施方式亦可應用於這些詳細的實施例。 請參考第1圖，第1圖為依據本發明第一實施例之用來微調光 學儲存裝置100之寫入策略參數之系統1〇〇c的方塊圖，其中系統 100C係為置於光學儲存裝置励中之電路。光學儲存裝置謂可 對光學儲存媒體102進行資料存取。為了簡明起見，本實施例採 .用可5己錄式光碟片（CD-Recordable disc，CD-R disc)作為光學儲 存媒體ι〇2 ’並採用光碟機（CDdrive)作為光學儲存震置励來 進行說明。熟悉此項技藝者應可理解，其它種類之光學儲存媒體， 例如：DVD-R 規格、DVD_RW 規格、DVD+R 規格、dvd rw 規格、或DVD.RAM祕之錄化光碟，以及謂應之光學 儲存裝置，例如：數位多用途光碟機（DVD D，皆可應用本 發明達到類似功效。 " 如第1圖所示，於光學儲存裝置動之讀取模式中，光學儲存 9 1344644 裝置10〇之光學讀取頭（optical pickup) 110自光學儲存媒體102 ^ °買取資料’以產生原始射頻訊號（raw radi〇 fl*eqUenCy signai，raw rf signal) ill 〇光學儲存裝置IQ。之波形等化器（wavef〇rm equaiizer) 112 4化原始射頻訊號lu以產生重建訊號（哪⑽耶以signai)， 於本實施例中重建訊號係為射頻訊號113。另外，光學儲存裝置 1〇〇之分切器（slicer) 114分切（Slice)射頻訊號113以產生分切 訊號115。因為光學讀取頭11〇、波形等化器112、以及分切器114 • 之運作原理均為熟悉此項技藝者所知悉，故不在此贅述其細節。 於第1圖所示之光學儲存裝置1〇〇中，調變器16〇、寫入脈衝 (write pulse )產生器 162、與發射源驅動器（radiati〇n s〇urce driver) I64會依據寫人策略參數共同驅動光學讀取頭η〇 ;依據分切減 115 ’系統l〇〇c通過控制訊號⑸來微調寫入策略參數。調變器 160係搞接於光學儲存裝置丨⑻之編碼器（未顯示），絲調變編 碼ϋ所輸出之編碼資料以產生調變訊號161，調變訊號ι6ι載有 (carry)八轉十四調變(eight_t〇 f〇urteen⑽加⑽⑽，efm)資訊。 寫入脈衝產生器162依據上述寫入策略參數，產生對應於調變訊 號⑹所載的八轉十四調變資訊之寫入脈衝’並輸^由寫入脈衝 訊號163所载之寫入脈衝。另外，發射源驅動器164依據寫入脈 •衝訊號163來產生驅動峨165以驅動光學讀取頭ιι〇。調變器 ^議、寫入脈衝產生器162、與發射源驅動器164之運作原理均為 熟悉此項技藝者所知悉，故不在此贅述其細節。 1344644 .. 依據本實施例，系統10〇C包含：鎖相迴路（phase-l〇cked loop， ..PLL) 120、彳貞測H (例如：第丨圖所示之人轉十四調變長度侧 器130)、計算模'组140、以及控制器（例如：第i圖所示之寫入 脈衝控制ϋ 15G)。計算做ho包含型樣依附分顧（pattem dependency classifier) 142與資料對時脈邊緣偏差計算器 (data-to-clock edge deviation calculator) 144。鎖相迴路 120 依據 分切訊號115藉由鎖定分切訊號115之通道位元率（1/T)(channel • blt rate)來產生一個八轉十四調變資料日寺脈（EFM data clock) CLK，其中八轉十四調變資料時脈CLK之週期係被視為ιτ。八 轉十四調變長度細Ij n 130依據八轉十四調變資料時脈CLK來操 取分切訊號115所載之八轉十四調變資訊，並偵測複數個長度， 其中每一長度對應於記錄在光學儲存媒體1〇2上之一凹坑（pi〇 或-平面（land)。典型的分切訊號115係為方波，其上升邊緣⑽哗 edge)與下降邊緣㈤㈣edge)之間的間距（intervai)以及下降 鲁邊緣與上升邊緣之間的間距均可有各種不同長度。於本實施例 中’八轉十四調變長度偵測器130量測分切訊號m之上升邊緣 與下降邊緣之間關距及分切職m之下降邊緣與上升邊緣之 間的間距，來作為上述之長度，其中每—間距係對應於一凹坑或 • _平面。因此’長度包含對應於複數個凹坑之複數個凹坑長度p， 以及對應於複數個平面之複數個平面長度L。每個凹坑長度p代 表沿著光學儲存媒體1〇2上之溝槽（groove)所記錄之一凹坑，每 個平面長度L代表沿著溝槽所記錄之—平面^需要注意的是，本 發明之另-實施例的分切訊號115可载有加強型八轉十四調變 11 1344644 (efmpius，efm+)資訊（例如：應用DVD R規格之實施例）或 其匕相谷於八轉十四調變/加強型八轉十四調變的變化規格之資 訊。 依據第-實施例，於可記錄式辆片之理想狀況τ，由分切訊 唬115中擷取的凹坑長度與平面長度均為時脈週期τ之倍數，且 这些凹坑長度與平面長度的分佈範圍係從3Τ至UT。也就是說， 凹坑之長度Ρ或平面之長度L可為3Τ、4Τ、...、或11τ。所以， 用來量測這些凹坑長度鮮面長度之參考碱（例如··上述之八1344644 IX. Description of the Invention: [Technical Field of the Invention] The present invention relates to write strategy tuning for optical storage farms, in particular to the use of data for clock edge deviation (data_t〇_d〇ckedge) Deviation) to tune the method and system for writing policy parameters. [Prior Art] As multimedia applications continue to grow, the need to store large amounts of digital data has grown rapidly. Therefore, an optical storage medium having a high storage capacity and a small size, such as a compact disc (Compact Disc, CD) or a digitally diverse optical disc (Digital Dis (4) gamma Disc, DVD) is very popular, and optical storage devices, such as: A CD drive or a DVD drive has become standard on personal computers for multimedia applications as described above. Taking the above-mentioned optical disk drive as an example, when the optical disk drive is controlled to write data into a CD-Recordable Disc (CD-R disc), the write power of the laser diode in the optical disk drive ( The writing power) is usually set to a specific value 'and the write pulse corresponding to the lean material is used to record the data § into a plurality of pits on the groove of the recordable optical disc ( ) and plane (hnd). The special write power can be obtained by the Gptimal OPC program. On the other hand 'fine tuning through the write strategy (Gigaton y 5 1344644 * 'Curry) each order' is also known as the recording strategy tuning process - the order change is used to control the width of the write pulse The write strategy parameter increases the accuracy of the length of the pits and planes formed on the recordable optical disc. Please refer to the side file of the recordable disc specification, for example: Orange Book __ (Add B〇〇k Parti) for more information. According to the related art, a specific device (e.g., an oscilloscope) can be used to write a strategy micro-tuning program. Usually, after the pre-trial trial and error writing process, the width of the write pulse is controlled according to the eye diagram of the plurality of reconstructed waveforms (reproduced wavef_) on the oscilloscope. A set of write strategy parameters is usually determined by an engineer or researcher based on experience. However, because the same procedure must be repeated for various applicable media and different recording speeds, the repeated procedures include at least writing human test data, viewing an eye diagram of the reconstructed waveform of the oscillating red display, and Experience relies on eye diagrams to determine a new set of write strategy parameters, so casting a = method can cost an engineer or researcher a lot of time. Since it is not automatically operated to determine the write strategy parameters by viewing the eye diagram, the above-mentioned write strategy fine-tuning is time-consuming. In addition, since the new decision is made based on the experience: the group write strategy parameter is not fixed, so the above-mentioned writer strategy fine-tuning program is indefinite. In a certain recording condition, the inclusion of the qingqi diagram will interfere with the • write strategy fine-tuning program and even invalidate the write strategy fine-tuning sequence. Specific instrument! For example, a time interyal (TI) or jitter meter may help to obtain information that is used to determine a new set of 6 1344644 write strategy parameters. However, it still needs to be carried out. If the time-spacing analyzer or the jitter meter is simply controlled by Ding Dan and Kee (4), the material of the micro-touch is ==. Correction, since _____ many times (impJidt), therefore, it requires an experienced resident or researcher_, [Summary of the Invention] In order to solve the above technical problems, the present invention provides a method for writing strategy parameters and materials t赖 optical storage device The present invention provides a method for fine-tuning the writing strategy parameters of an optical storage device, which comprises a plurality of recordings, each of which corresponds to a pit on an optical storage medium accessed by the optical storage device. ((8) or - plane Ο-; performing calculations corresponding to a plurality of data sets _ (_ Μ ) ,), and generating a plurality of data corresponding to the type of the data set to the clock edge deviation (Yang discards d - the data therein) The set type contains at least one pit plane pit (pit iand_(8) poor material type type less - land pit_land dragon set type) and the use of data on the clock edge deviation to fine tune the write strategy parameters, where the write strategy The parameters respectively correspond to the data set type. The present invention further provides a system for fine-tuning the write strategy parameters of the optical storage, including the detector, the calculation module, and the control. The calculation module is lightly connected to the system S' control 11 system reduced to the calculation module. The side H system has a plurality of lengths, 7 1344644 == on the optical storage medium accessed by the storage device - ^ #验进仃 Correspond to the calculation of various dataset types, and the generation corresponding to these data 隼 type & the collection type contains at least the clock edge deviation, where the resource plane type or at least - plane pit + face (four) _ Controlling these #Materials corresponds to the write strategy parameters of these dataset types. The Lay is provided by the micro-cafe ancient μμμ--the material tune optical storage device writer strategy parameter #晋包含]贞测复数The length, each length corresponds to a pit or a plane on the optical storage body by optical number of times =; the row corresponds to the multiple bucks; the calculation of the face and the generation of the score are in accordance with the data set _ of a plurality of shell factories: for the edge deviation of the clock. The step of calculating the edge deviation of the data corresponding to the data set _ corresponding to the calculation of the __ includes: obtaining (Ve) > The edge deviation is greater than the first-doorcast value (thresh〇 Id) data set type; in the data set of the data set type with the clock edge deviation greater than the first threshold value, 'get the data set more than the number of times indicated by the second threshold value, ' and & The calculation corresponds to the adjustment amount of the writer strategy parameter of the data set type of the data set type indicated by the number of data sets more than the second threshold value, and the shed adjustment amount is fine-tuned to write the strategy parameter. The present invention & A method and system for fine-tuning the write strategy parameters of an optical storage device, by fine-tuning the write strategy parameters according to the data edge offset, without the assistance of a specific external device, and also does not need to consume: Or the researcher has passed 8 1344644 • For more time, the write strategy parameters of the optical storage device can be fine-tuned. [Embodiment] The present invention provides a system for fine-tuning the write strategy parameter (writestrategyparameter) of optical storage. These systems are used to fine tune the circuit of the write strategy parameters. The circuit is placed in the optical storage device. Some embodiments of these systems may also be substantially the optical storage device itself. For the sake of brevity, the system is implemented in a circuit in the following description. However, other embodiments are also applicable to these detailed embodiments. Please refer to FIG. 1. FIG. 1 is a block diagram of a system 1C for fine-tuning a write strategy parameter of an optical storage device 100 according to a first embodiment of the present invention, wherein the system 100C is placed in an optical storage device. The circuit of Lizhong. The optical storage device allows data access to the optical storage medium 102. For the sake of brevity, the present embodiment uses a CD-Recordable Disc (CD-R disc) as an optical storage medium ι〇2' and uses an optical disc drive (CDdrive) as an optical storage shock absorber. To explain. Those skilled in the art should understand that other types of optical storage media, such as DVD-R specifications, DVD_RW specifications, DVD+R specifications, dvd rw specifications, or DVD.RAM secret recording discs, and opticals Storage devices, such as digital multi-purpose optical drives (DVD D, can be applied to achieve similar effects. " As shown in Figure 1, optical storage 9 1344644 devices in the optical storage device reading mode An optical pickup 110 purchases data from the optical storage medium 102^ to generate a raw radio frequency signal (raw radi〇fl*eqUenCy signai, raw rf signal) ill 〇 optical storage device IQ. (wavef〇rm equaiizer) 112 4 original RF signal to generate a reconstruction signal (which (10) yeah signai), in this embodiment, the reconstructed signal is the RF signal 113. In addition, the optical storage device 1 分 divider (slicer) 114 slices the RF signal 113 to generate the divisor signal 115. Since the optical pickup 11 波形, the waveform equalizer 112, and the divider 114 are all operating the same skill Known, the details are not described here. In the optical storage device 1 shown in Fig. 1, the modulator 16〇, the write pulse generator 162, and the source driver (radiati〇ns) 〇urce driver) I64 will drive the optical read head η〇 according to the write strategy parameters; according to the cutoff minus 115 'system l〇〇c through the control signal (5) to fine-tune the write strategy parameters. The modulator 160 is connected to The encoder (not shown) of the optical storage device 8 (8), the coded data outputted by the modulating code is used to generate the modulation signal 161, and the modulation signal ι6ι carries (carry) eight to fourteen modulations (eight_t〇f〇 Urteen (10) plus (10) (10), efm) information. The write pulse generator 162 generates a write pulse 'corresponding to the eight-to-fourteen-modulation information contained in the modulation signal (6) according to the above-mentioned write strategy parameter and inputs the write pulse. The write pulse is contained in the signal 163. In addition, the source driver 164 generates a drive port 165 to drive the optical read head ι according to the write pulse rush signal 163. The modulator, the write pulse generator 162, Operating with the source driver 164 It is known to those skilled in the art, so the details are not described herein. 1344644 .. According to the embodiment, the system 10〇C includes: a phase-locked loop (..PLL) 120, 彳贞The H is measured (for example, the person shown in Fig. 14 is turned to the fourteenth variable length side device 130), the calculation mode group 140, and the controller (for example, the write pulse control ϋ 15G shown in Fig. i). The calculation includes a pattem dependency classifier 142 and a data-to-clock edge deviation calculator 144. The phase-locked loop 120 generates an eight-to-fourteen-modulation data (EFM data clock) according to the channeling bit rate (1/T) (channel • blt rate) of the switching signal 115 according to the switching signal 115. CLK, in which the period of eight to fourteen modulated data clock CLK is regarded as ιτ. Eight to fourteen modulation length fine Ij n 130 according to the eight-to-fourteen modulation data clock CLK to operate the eight-to-fourteen modulation information contained in the divert signal 115, and detect a plurality of lengths, each of which The length corresponds to a pit (pi〇 or -land) recorded on the optical storage medium 1〇2. The typical slitting signal 115 is a square wave, its rising edge (10) edge and the falling edge (5) (four) edge) The inter-interval (intervai) and the spacing between the descending lug edge and the rising edge can be of various lengths. In the embodiment, the 'eight-turn fourteen-modulation length detector 130 measures the distance between the rising edge and the falling edge of the switching signal m and the distance between the falling edge and the rising edge of the cutting edge m. As the above length, each of the intervals corresponds to a pit or a _ plane. Thus the 'length includes a plurality of pit lengths p corresponding to a plurality of pits, and a plurality of plane lengths L corresponding to the plurality of planes. Each pit length p represents a pit recorded along a groove on the optical storage medium 1 〇 2, and each plane length L represents a plane recorded along the groove - it is noted that The slitting signal 115 of another embodiment of the present invention may carry the enhanced eight-to-fourteen modulation 11 1344644 (efmpius, efm+) information (for example, an embodiment applying the DVD R specification) or its Information on the variation specifications of the fourteen modulation/enhancement eight-to-fourteen modulation. According to the first embodiment, in the ideal condition τ of the recordable piece, the pit length and the plane length extracted by the slitting switch 115 are multiples of the clock period τ, and the pit length and the plane length are The distribution range is from 3Τ to UT. That is, the length 凹 of the pit or the length L of the plane may be 3 Τ, 4 Τ, ..., or 11τ. Therefore, the reference base used to measure the length of these pit lengths (for example, the above eight)
轉十四調變資料時脈CLK)的合理週期應小於或等於τ。依據本 實施例，輸人至人轉切霞長度_器13G之參考訊號係為八 轉十四調贿料日植CLK，_參考訊制係為了。於可記 錄式光碟片之實際狀況下，“轉十四調變長度彳貞測器之輸 出訊號131所載的長度L與ρ通常並非為τ的整數倍。計算模植 140可分別對複數個資料集類型set type)作計算，並產生分 別對應於這些資料集_之㈣對時脈邊緣偏差（細⑽ο* edgedevia^n) ’其中這錄料_恤邊緣偏差係由資料對時脈邊 緣偏差计异器144之輸出峨145所载，資料細型至少包含一 凹坑平面啊（pit_land_pit) 或至少包含—平面凹 面（land-p+land) #料集_。每—資料集類型係對應於一 特定目標凹坑長度（例如：3T、4 定目 長度（例如：3T、4T、..[、特疋目標平面 3丁、4丁、...、叫之电人^另—特定目標凹坑長度（例如： 之、、且合，或至少一特定目標平面長度與至少一 12 1344644 -·特定目標凹坑長度與另一特定目標平面長度之組合。 « 型樣依附分類器H2將複數個資料集分類為各資料集類型。於 本實施例中’每—㈣集，即(P1，L，P2)或(Li，p，L2)，包含有兩個 長度，其中資料集(P1，L，P2)係指對應於-平面之長度與兩個分別 與其相鄰的（adjacent)凹坑之長度，而資料集(L1，p，L2)係指對應 於一凹坑之長度與兩個分別與其相鄰的平面之長度。在此，如(Pm # LmT’P1T)或(LnT，PmT，LiT)之標示法係用來表示上述資料集類型，其中 nT、mT或1T係以時脈職τ為單位來表示長度；於本實施例 中，n = 3、4、."、或 u，m二3、4、、或11，且1=3 4、、 或11 '貝料集類型(LnT,PmT，L1T)中之每一者，例如：n = n〇、m = m〇、 且1丨0之^料集類型(Ln〇*T，Pm0*T，L10*T)，係被用於對應於目標平 面長度為nG*T之平面、與緊隨解面之後且目標凹坑長度為 mO*T之凹坑、以及緊隨該凹坑之後且目標平面長度為1〇*丁之平The reasonable period of the clock signal CLK) of the fourteen modulation data should be less than or equal to τ. According to the embodiment, the reference signal of the input to the person to the length of the _ 13G is eight to fourteen bribes, and the reference signal system is _. In the actual condition of the recordable optical disc, the lengths L and ρ carried by the output signal 131 of the fourteen-modulation length detector are generally not integer multiples of τ. The calculation implant 140 can be respectively used for a plurality of The data set type set type) is calculated and generated corresponding to these data sets _ (4) for the clock edge deviation (fine (10) ο * edgedevia ^ n) 'where the material _ shirt edge deviation is the data edge offset The output of the counter 144 is carried by the output 峨 145, and the data fineness includes at least a pit plane (pit_land_pit) or at least a plane concave surface (land-p+land) #料集_. Each data set type corresponds to one Specific target pit length (for example: 3T, 4 target length (for example: 3T, 4T, .. [, special target plane 3 D, 4 D, ..., called electric man ^ another - specific target pit Length (for example: , , and, or at least one specific target plane length and at least one 12 1344644 - a combination of a specific target pit length and another specific target plane length. « Pattern dependent classifier H2 will be a plurality of data The set is classified into each data set type. In this implementation In the example, the 'per-(four) set, ie (P1, L, P2) or (Li, p, L2), contains two lengths, where the data set (P1, L, P2) refers to the length corresponding to the - plane The length of two adjacent recesses, and the data set (L1, p, L2) refers to the length corresponding to the length of one pit and the plane adjacent to each other. Here, The labeling method of (Pm #LmT'P1T) or (LnT, PmT, LiT) is used to indicate the above data set type, wherein nT, mT or 1T is expressed in units of clockwork τ; in this embodiment , n = 3, 4, .", or u, m two, 3, 4, or 11, and 1 = 3 4,, or 11 'bestset type (LnT, PmT, L1T) For example, n = n〇, m = m〇, and 1丨0 of the material set type (Ln〇*T, Pm0*T, L10*T) are used to correspond to the target plane length of nG*T The plane, the pit immediately after the solution surface and the target pit length is mO*T, and the target plane length after the pit is 1〇*丁平
# 面之複數個資料集(L1，p，L2)進行分類。相似地，資料集類型(Ρητ， LmT，PiT)中之每一者’例如:n = n〇、m = m〇、且!，之資料集類 型(Pn0叮，Lm0*T，PwT)，係被用於分類對應於目標凹坑長度為 之凹坑、與緊_凹坑之後且目標平面長度為祕Τ之平面、以 及緊隨該平面之後且目標凹坑長度為1G*T的複數师料集⑻L • P2)。需要注意的是，複數個資料集類型(LnT，PmT,LlT)中之每—者，’ • 例如：資料集類型(。丁，Pm0*T，L許），係對應於特定目標平面長度 n〇*T、特定目標凹坑長度m〇*T、與特定目標平面長度阶了之= 合(nO*T，m〇*T，1〇*丁）。複數個資料集類型(Ρητ，中之每一 13 1344644 者，例如：資料集類型(Pn0*T，Lm〇叮,Ρι〇*τ)，係辦應 長度ηΟ*Τ、特定目標平面長度m〇*T、與特定目桿凹凹杬 之組辦T，濟，啊)。_ n、m與丨各有 到11)，所以對讀集類紙山^言有㈣”肺且人， 而對資料集類抓T，LmT，PlT)而言也有(9 * 9 * 9)個組合因此^料 集類型之總數係為(9 * 9 * 9 * 2) = 1458。 於實作上可以選擇某些組合；寫入策略參數可依據這些所選擇 的組合來調整，而非依據所有可能的組合來調整。 另外’右貝料集(Ll，P，L2)中長度U、P、與a滿足下列條件， 咖樣依附分類ϋ⑷可將這㈣料雜“⑶分臟資料集類 ^(Ln〇*T，Pm0*T，Li〇*T): (πΟ - 0.5) * T <L1 <(n0 + 0.5) * T ； (mO ~~ 0.5) * τ ^(m0 + 0.5) * T ;且 (10 - 0.5) * T 江2 却0 + 0.5) * T。 相似地，若資料集(P1，L，P2)中的長度ρι、L與p2滿足下列條件， 則型樣依附分類器142可將這些資料集(p1，l，p2)*類進資料集類 型(卩!1〇叮，[111〇*丁，？1〇*丁）： (nO - 0.5) * T <P1 <(n〇 + 0.5) * T ； 1344644 \ (m0 —〇·5)*τ 义 4m〇 + a5)*T ;且 (10 - 0.5) * T 您却〇 + 〇·5) * T。 資料對時脈邊緣偏差計算器144可如下列說明來計算分別董 應於資料集類型(LnT，PmT，LiT)卿必Lt»之資料對時脈邊緣偏 .差。資料對時脈邊緣偏差計算器144計算複數個資料料脈邊緣 長度（data如clockedgelength)，其中每一個資料對時脈邊緣長度 ''為it之參考訊號（於本實施例中即八轉十四 料 叫之上升邊緣或下降邊緣以及分切訊號115 ytransitKm edge)之間的間距。料，資料對時脈邊緣偏差計算 器H4片算複數個差值，以產生分別對應於各個資料集類型 PmT，L1T)與(PnT，LmT，PiT)之資料對時脈邊緣偏差。上述差值中的每： 個係為1料對時脈邊緣長度與—目標資料對時脈邊緣長度之間 的差值’其中目標資料對時脈邊緣長度係為對應於狀資料集類 型(L，，P_T，L1()*T)或(IVt，L⑽*t IW)之預定值。 所示之情況為例來進一步說明。第2圖為依據第一實 ''用Μ料對時脈邊緣偏絲進行長賴償的示意圖，其中 應於目標長度^ (即凹坑之目標長度為们。如第⑽ 晉 丁丨^分別表示用來控制凹坑的開始位置與結束位 PT 略參數。於第2圖所示之情況令，凹坑A被視為凹坑 位晉二，置於此情况中並不完美；換言之，於凹坑PT之結束 測篁到邊緣偏差。位於凹坑pT之前的先前平面（previous 15 1344644 ..land) PL有目標長度L4T (即平面之目標長度為4T)’位於先前平 面PL之前的先前凹坑（previous pit) ΡΡ有目標長度Ρ3Τ。另外， 位於凹坑FT之後的後續平面（following land)FL有目標長度l5t， 位於後續平面FL之後的後續凹坑（following pit) FP有目標長度 Ρπ。在此，型樣（PP,PL，PT)與（PT，FL，FP)對應於上述之至少 一凹坑平面凹坑資料集類型，以及型樣(PL，PT，FL)對應於上述之 至少一平面凹坑平面資料集類型。 參 依據計算模組140所進行、且分別對應於型樣(pp，PL，P1^pL， PT，FL)、與(PT，FL，FP)的資料集類型之計算（尤其為統計方面的 計算）’統計結果可被擷取以指出型樣(pp，PL，PT)、（PL，ρτ，、 與(PT，FL，FP)中之-者主導著（d〇minate)凹坑ρτ的不完美結束 之現象，例如，型樣(PT，FL，FP)主導著凹坑ρτ的不完美結束之 現象，則相對應之寫入策略參數心咖⑷）（其代表用來控制對 φ 應於資料集類型(PnT，LmT，P1T)之凹坑的結束位置之寫入策略參數） 應被微調’以調整凹坑Ρτ之不完美的結束，其中依據第2圖所示 之情況 ’（n，m，1) = (4, 5, 4)。 B«邊❹二评惟麟料計算11 144可計算資料 、义，Ά卜於本實施财，資料料脈邊緣長度^ 之下降邊緣的時間點D (即對 束: 叹續十脈啦.帽後之上2 '日·間點d)之間的間距。請注意’時間點D實質上係 16 1344644 射頻喊m之值跨越（_)某—取值（例如 準之值）時的同—時間點。轉對時崎賴差 時門點D ΠΓ_分切訊號115的位準由高至低之轉變來偵測 時間.，，占同樣的方法可以被應用於計算對應資料集類 ^的十雜對雜邊緣長度。此外，資料對時脈魏偏差ΐ算;I’ 偏差二2個差似產生對胁#料集_之資料對時脈邊緣 Γ 中，資料對時脈邊緣偏差計算器⑷藉由统 打析夕個對應於特定㈣集類型之差值，來產 型之資料對時脈邊緣偏差。統計分析可為對這些差值=== 請出這些差值之眾數(mostfreq— 可Γ係—#料鱗脈邊緣長度與目標資料對時脈邊緣長度 (例如·第2圖所示之情況中為α5τ)之間的 凹坑Α的結束位置之時間點在理想狀況下應顺 ^於細類邮―料對時脈邊緣長度^ 以第3圖所不之情況為例來進—步說明。第3圖為 ㈣對時脈邊緣偏差來進行長度補償的示音 圖、中凹坑Β亦對應於目標長度ρ4τ。於第3圖所示 : 凹坑，凹坑ρτ_錄置於崎 換言之，於喊打之_健上可騎顺賴差。凡美， 相似地，依據計算模組_所進行、且分別對應於型樣㈣PL， 17 1344644 ΡΤ)、（PL，PT，FL)、與(PT，FL，FP)的資料集類型之計算，統計結 果可被擷取以指出型樣(PP，PL，FT)、（PL，PT，FL)、與(PT，FL，FP) 中之一者主導著凹坑PT的不完美開始之現象，例如，型樣(pp，_pL， PT)主導著· PT的不完美開始之現象，獅對應之寫入策略參 數Ttopr(n，m，1)(其代表用來控制對應於資料集類型 之凹坑的開始位置之寫入策略參數）應被微調，以調整凹坑朽之 不完美開始’其中依據第3圖所示之情況，（n，m，丨)=(3, 4, 4)。 需要注意的是，資料對時脈邊緣偏差計算器144計算資料對時 脈邊緣長度d2。於本實施例中，f㈣時脈邊緣長度犯係為分切 訊號115之上升邊緣的時間點E (即對應於凹坑B的開始位置之 時間點）以及n十四調變資料雜CLK ^ ^ 如：時間點_说之__。料意，咖 係為射頻訊號113之值跨顧定值（例如：對應於分切器114的 分切位準之值）時的同-時間點。f料對時脈邊緣偏差計算器Μ 藉由偵測分切訊號115的位準由低至高之轉變_測時間點E。同 ^的方法可以被於計算對應於#_貞型心山L p叮)的資 4對時脈邊緣長度。另外，資料對時脈邊緣偏差計算器144計算 =數個差值以產生對應於資料集類型之資料對時脈邊緣偏差，其 對日#=值中的母轉為—f料對時脈邊緣長度與—目標資料 於、螬緣長度之間的差值。於第3圖所示之情況中，因為對應 :B娜位置之時間‘_狀況下應該是_^ 以對應於__3T，L4T，Ρ4τ)的目標:_時脈邊緣長度係 18 1344644 被決定為0.5丁 寫：:是::=::，計算_傳輸至 八㈣m “ 仏若有需要，型樣依附 Γ44被傳j 訊可通過㈣科脈邊緣偏差計算器 =傳_麵依附分類 Ξ此緣偏差計算器144之訊號是數位的， 可、甬:型二二轉十四調變長度偵測器130所產生之偵測結果 可通過型樣依附分類器14 144。減-細f 辦脈邊緣偏差計算器 接，—i #之舰财，寫人脈衝㈣11 150可通過直 接連接而_至賴依·鋪142，且轉 謂也侧峨接犧 〜於第-魏敗—變化射，觀料算差值岐生對應 料對時脈邊緣長度，可以是對應於特定 目“ ==:脈邊緣長度之平均值。：二 异差值以產生對應於特定實料集類型％㈣ 時脈邊緣偏差之目標資料對時脈邊緣長度，可以’:二貝：對 料集類Γ 疋對應於特定資 / β H 的複數個資料對時脈邊緣長度 值。於第-實施例之另一變化例中’ 於特定資料集類雖_，Ρ·山T)或(p 值乂產賴應 時脈邊緣偏差之目標資料對時脈邊緣 τ:ϋ)的貝料對 J以疋對應於特定資 ^44644 ••㈣_(Ln(W，Ρ*τ，賴數师料料脈邊緣長度以及對 ' ^於特^^㈣類卿_ L，t，Ρι〇*τ)的複數個資料對時脈邊緣 長度之平均值。 ’ 需要注意的是’上述寫入策略參數，例如：Tt〇帅，％ D與 Tlast(n，m，丨），皆可以被自動地微調，這是由於本發明不再需要二 些特定裝置（例如：上述之示綠）。另外，在沒有外部I置的協 *助下’寫入脈衝控制$⑽可依據計算模組140所產生之資料對 時脈邊緣偏絲微調寫人策略參數，所雜據本發明，寫入策略 參數可於系統或晶片上被自動地微調。通過依據資料對時脈邊緣 偏差來微調寫人策略參數，促使對應於被寫到光學儲 上的最新龍（其侧时収新㈣4略錄㈣上的）之 凹坑長度或平面長度可接近或達到τ的目標倍數。 _ ★第4圖為依據本發明—實施例料微調光學儲存裝置的寫入 策略參數之方法910的流程圖。方法91〇於步驟91〇s開始並可通 過第1圖所示之系統l〇〇C來實施。 於步驟912巾’在光學儲存裝置1〇〇中之微處理單元 (micro-processingunit，MPU)所執行之韌體碼的控制下，光學儲 存《置1〇〇利用對應於光學儲存灯刚之特定轉速之寫入策略 參數的初始值，將資料寫到光學儲存媒體1〇2上。 20 j344644 • 於步驟914巾，光學儲存裝置100讀取被寫到光學儲存媒體 102上之資料以產生分切訊號115。 於步驟916中，系統1〇〇(：之八轉十四調變長度债測器13〇藉 由量測分切訊號115來偵測凹坑之長度p與平面之長度L。 於步驟918中，計算模組14〇計算對應於資料集類型υτ， # U)與⑻，U PlT)之資料對時脈邊緣偏差，其資料集類型如前面 所述’包含至少—凹坑平面凹坑資料細型或至少—平面凹坑平 面資料集類型，其中於本實施例中，η = 3、4、…、5iui，m = 3、 4、…、或11 ’且1 = 3、4、…、或η。 於步驟920中，執行韋刃體碼之微處理單元決定是否需要微調寫 入策略參數。若任-資料對時脈邊緣偏差大於—特定門插值，則 執油體碼之微處理單元決定需要微調寫入策略參數，步驟922 將被執灯，酬，進人步驟刪。在某些情況下如果寫入策略 參數之初始讎確信為係不完_，職輕單元可妓直接進 入v驟922而不進行步驟92〇之檢查。雖然如步驟卿與奶中 所描述之寫人策略參料複數個寫人策略錄，且簡化如第2圖 所7Γ U非為本發明之限定。如果僅需賴—個寫入策略灸 數’則步驟猶與922可被描述為利用-個寫入策略參數終 _的選擇-個或複數個寫人策略參數型式的實 明將不再贅述。 21 1344644 若執行韌體碼之微處理單元決定進入步驟922，，/ 如前面所述，_料對時脈邊_來微調寫人== 於步驟924中，於執行韋刃體碼之微處理單元的控制下 存裝置咖利用微調後的寫入策略參數值（即執行步驟922 :储 寫入策略參數值）’將資料寫到光學儲存媒體ι〇2上。 1之 請注意，依據本發明應用於上述數位多樣化光碟（例如 規格或D職規格之數位錢化絲）之另—實施例巾， 類型(U PmT’ Ln·)與(pnT，LnT，PlT)之總數量可通過下式取得:〜、 10 *10 * 1〇 木 2 = 2000 ; 這是由於對DVD_R規格或職R規格之數位多樣化光碟而 ° η ~ 3.......U、或 14，m = 3、4.....U、或 14，且 1 = 3、4、…、1卜或14。 且卜 . 相似地，於實作上可以選些組合；以便寫人策略參數可 依據所選擇的組合來調整，而不是依據所有可能的組合來調整。 第5圖為_本發明不同的實補藉由糊長度偏差統計來 分別微調寫人策略參數的示意圖，其中第5圖所示之寫入策略參 22 1344644 •，數可應用於寫入DVD-R規格之光碟片，且於第5圖中’用於多脈 . 衝之寫入戚略的寫入策略參數與用於單一脈衝之一寫入策略的寫 入策略參數係分別以理想串列數位訊號（ideai seriai digital 31笆阳1)來表示。寫入策略參數丁1：〇1)卜丁1：〇1)2、1«1狀1：1、(1'1351:2、 Ttopr、T〇df、Todr與Tlast分別對應於某些邊緣延遲（或邊緣位 移），且寫入策略參數Tmp則對應於某一脈衝寬度。另外，寫入策 略 > 數例如第5圖所示之過驅動功率（〇ver(|rive p〇wer， • _Γ)、寫入功率(write Ρ_)、以及偏壓功率（bias power)係 分別對應於某些功率位準。 第6圖為職本發明不同的實關藉由長度偏差統計來 分別微調寫人策略參數的示朗，其中第6圖所示之寫入策略參 數可應用於寫入DVD-RW規格光碟片，且用於第一寫入策略（即第6 圖中所不之寫入策略Γ )的寫入策略參數與用於第二寫入策 •略(即第6财所示之，，寫入策略2”）的寫入策略參數係分別以 理想串舰健縣示於第6财。寫人策略參數⑽、τ細2、 Tlast2、與Tcool分別對應於某些邊緣延遲（或邊緣位 寫人策略參數Tmp則對應於某—脈衝寬度。另外，寫入 •鱼㈣6騎㈣增、祕辨(_—、 與偏塵功率分別對應於某些功率位準。 23 200 1344644 .例相似’其差魏明如下。於第二實施例中，輸人至轉十四調 …㉝長錄聰13Q之參考崎係為雜i 22G所纽之參考時脈 CLK2 >考時脈GlK2的頻率並不需要與八轉十四調變資料 CLK的頻率相等。 第8圖為依據本發明之第三實施例之用來微調光學儲存裝置 300之寫入策略參數之系統3qqc的示意圖。本實施例與第一實施 ❿例相似，其差魏明如下。系統霞包含取樣電路（sampling circuit) ’麵接於波形等化器112以接收重建訊號（例如：射頻 訊號113)。取樣電路係被用於取樣重建訊號以產生數位訊號；於 本實施例中’數位訊號係為數位射頻訊號315。如第8圖所示，取 樣電路包含類比數位轉換器（職⑽奮叫制贿咐％ ADC)314與鎖相迴路320。類比數位轉換器314依據參考時脈㈣ 對射頻訊號113進行類比數位轉換，以產生數位射頻訊號315，且 • 鎖相迴路320依據數位射頻訊號315來產生參考時脈ακ3。 系統300C更包含八轉十四調變長度偵測器33〇、計算模組 340與寫入脈衝控制器35〇，其中計算模組⑽包含型樣依附分 .類器342與貝料對時料緣偏差計算器344。在此，被使用於偵測 長度的訊號係為數位射頻訊號315，而非分切訊號115。八轉十四 調變長度侧器咖藉由觀測（〇bserve)數位射頻訊號315之值 來偵測時間點之間的間距’並產生間距的長度，其中每一間距係 對應於-個凹坑或-個平面^這些間距的邊界可藉由預定值來決 24 1344644 定；預定值可以是數位射頻訊號315所載之最大值與最小值之間 的中間值，例如：最大值與最小值之平均值。中間值相當於前面 各實施例所述之分切訊號。 第9圖為於重建訊號（例如：射頻訊號113)之複數個取樣點 (八係以㊉」的§己號來標示）的示意圖，其中特定取樣點的值 與預定值（例如：上述中間值）之間的差值d3可作為用來指出資 料對時脈邊緣偏差d4的指標α—η)β依據第9圖所示之 射頻訊號的波形’大部分跨越預定值之取樣點巾都會完美地對準 八轉十四機㈣日械的下降邊緣，朗大部分資料對時脈邊緣 偏差的值轉。上述特絲樣關值是指於特絲_間被取樣 =數值，而該數值係由數位射頻訊號315所载。取樣點的值與預 ^值之間的差值（例如：上述差值d3)可表示資料對時脈邊緣偏 (例如：上述資料_脈邊賴差⑷，且取得對應的長度與資 枓對時脈邊緣偏差。計算· _可勤計算歡值（例如：上 逑之中間值）以及當數位射頻訊號315之值跨越預定值的時間點 =位射頻訊號315的值之間的差值，來估算出資料對時脈 而八轉十四調變長雜則器咖則可輸出由輪出訊號3 實^長ΐ L與P，其中輸出訊號331係與輸出訊號13丨相似。 ◎之貝科對時脈邊緣偏差計算器344藉由使用上述之接此 25 U44644 直線的關係，來計算資料對時脈邊緣偏差 器具有與寫入脈衝控制器15〇 :二二制 則可輸出由輸出訊號345所載之資料對時脈 訊號345係與輪出訊號145相似。 猶偏差，其令輪出 用了^ = 變_示意圖’其中使 S lnterP〇lat〇r) 416，祕於類比數位轉換器314與 •，貞迴路320之間。鎖相迴路娜依據内插H彻所產生之内插 ，號（interP〇lated signal) 417來產生參考訊號ακ4，而内插 器416則依據數位射頻訊號315與參考訊號ακ4來進行内插運算 (interpolat謂operation)。於本變化例中，八轉十四調變長 度_器330之輸入可被内插訊號417所替換。内插器416之運 作原理係為熟悉此技藝者所知悉，故不在此贅述其細節。 φ 第11圖為依據本發明一實施例之統計計算之詳細實施的方法 930的流程圖’其中第η圖所示之詳細實施的方法開始於步驟 930S’並可被應用於第4圖所示之實施例’尤其是步驟gig、920、 與 922。 於步驟932中’進行對應於型樣(PP，PL，PT)、（PL，pT，FL)、 及/或（PT，FL，FP)的複數個資料集類型之統計計算，並取得資 料對時脈邊緣偏差大於門檻值Th_A(例如：Th_A = 0. 3T)之資料集 類型。 26 丄^44644 於步驟934中，於貝料對時脈邊緣偏差大於門植值Th)之資 ;斗集類型當中，輪貝料集發生次數多於(即門檻值此』 斤才曰天之次數）之資料集類型，其中門檻值Th—B係為正整數，例 如：Th』=256。 於步驟936中’計算對應於資料集發生次數多於Th—B之資料 集類型之寫入策略參數的調整量。並於步驟謂E中結束。 需要注意的是’依據本發明之某些實施例，可進行統計計算以 决疋對應長度L及/il P的分佈曲線。分佈曲線之某些特徵的資 訊’例如：分佈曲線的形狀、半高寬⑽f height width)、及 被門捏值Th—A與Th_B所域之區域，可祕蚊是錄調寫入 滚略參數以及決定寫入策略參數之調整量。 第12圖與第13 ®為依據本發明之—實施例之分別於微調寫入 策略參數之前與之後的取樣數（sa_e⑽nt)相對於資料對時 脈邊緣長度之曲線示意圖。如第12圖所示，關於對應於(pT，FL) = (4T，5T)之組合「PT(4T) + FL(5T)」，其曲線以某一值為中心（例 •如：零）。另外，對應於(PL，PT，FL) = (3T，4T，5T)之組合「PL(3T) ，+ PT(4T) + FL(5T)」之曲線係以該某一值減掉S2為中心，而對 應於(PL, PT，FL) = (4T，4T，5T)之組合「PL(4T) + ρτ(4Τ) + FL(5T)」之曲線係以該某一值加上Si為中心，且對應於(孔ρτ 27 1344644 FL) = (5T，4T，5T)之組合「pL(5T) + ρτ(4Τ) + FL(5T)」之曲 線亦以某一值為中心。因此’依據本實施例，微調寫入策略參數， 當如第12圖所示之三個較低曲線被集中於一處以使它們以同一值 或彼此相近的值為中心，則可窄化（narr〇w)如第12圖所示之較 高曲線。因此，如第13圖所示差距51與兕被縮小了。 需要注意的是，本發明可藉由使用具有多個元件組合而成的硬 體、或藉由使用執行軟體或軔體程式之電腦來實施。另外，於申 請專利範圍或上述說明中所揭露的系統元件當中，有些元件可藉 由使用同一硬體或軟體裝置來實現。 以上所述僅為本發明德佳實補，凡依本發明申請專利範 圍所做之均等變化與修飾，皆應屬本發明之涵蓋範圍。 【圖式簡單說明】 第1圖# Multiple data sets (L1, p, L2) are classified. Similarly, each of the data set types (Ρητ, LmT, PiT) 'for example: n = n〇, m = m〇, and !, the data set type (Pn0叮, Lm0*T, PwT), is It is used to classify a plurality of materials corresponding to the pits of the target pit length, the plane after the compact_pit and the length of the target plane, and the target pit length of 1G*T immediately after the plane Set (8)L • P2). It should be noted that each of the multiple dataset types (LnT, PmT, LlT), ' • For example: dataset type (. D, Pm0*T, L), corresponds to a specific target plane length n 〇*T, the specific target pit length m〇*T, and the specific target plane length step = (nO*T, m〇*T, 1〇*丁). Multiple dataset types (Ρητ, each of 13 1344644, for example: dataset type (Pn0*T, Lm〇叮, Ρι〇*τ), system length ηΟ*Τ, specific target plane length m〇 *T, with a specific eye stick concave group, T, Ji, ah). _ n, m and 丨 each have 11), so there are (4) lungs and people in the reading set, and there are also (9 * 9 * 9) for the data collection class T, LmT, PlT) The total number of combinations is therefore (9 * 9 * 9 * 2) = 1458. Some combinations can be selected on the implementation; the write strategy parameters can be adjusted according to the selected combinations, not the basis In addition, the lengths U, P, and a of the 'right shell material set (Ll, P, L2) satisfy the following conditions, and the coffee sample depends on the classification ϋ (4), which can be mixed with the (4) dirty data set class. ^(Ln〇*T, Pm0*T, Li〇*T): (πΟ - 0.5) * T <L1 <(n0 + 0.5) * T ; (mO ~~ 0.5) * τ ^(m0 + 0.5 ) * T ; and (10 - 0.5) * T Jiang 2 but 0 + 0.5) * T. Similarly, if the lengths ρι, L, and p2 in the data set (P1, L, P2) satisfy the following conditions, the pattern dependent classifier 142 can classify these data sets (p1, l, p2)* into the data set type. (卩!1〇叮,[111〇*丁,?1〇*丁): (nO - 0.5) * T <P1 <(n〇+ 0.5) * T ; 1344644 \ (m0 —〇·5) *τ Meaning 4m〇+ a5)*T; and (10 - 0.5) * T You are 〇+ 〇·5) * T. The data-to-clock edge deviation calculator 144 can calculate the skew of the clock edge for the data set type (LnT, PmT, LiT), respectively, as described below. The data-to-clock edge deviation calculator 144 calculates a plurality of data material edge lengths (data such as clockedgelength), wherein each of the data pairs the clock edge length '' is a reference signal of it (in this embodiment, eight to fourteen The spacing between the rising edge or the falling edge and the slitting signal 115 ytransitKm edge). Material, data for the clock edge deviation calculator H4 to calculate a plurality of differences to generate data corresponding to the respective data set types PmT, L1T) and (PnT, LmT, PiT) to the clock edge deviation. Each of the above differences: the difference between the length of the clock edge and the length of the target data versus the edge of the clock edge, where the target data versus the length of the clock edge corresponds to the type of data set (L , P_T, L1()*T) or (IVt, L(10)*t IW) is a predetermined value. The situation shown is further illustrated by way of example. Figure 2 is a schematic diagram of the long-term compensation of the edge edge of the clock edge according to the first real '', which should be at the target length ^ (ie the target length of the pit is as follows. For example, (10) Jin Ding丨^ respectively Indicates the starting position and the ending bit PT for controlling the pit. In the case shown in Fig. 2, the pit A is regarded as the pit position, which is not perfect in this case; in other words, The edge of the pit PT is measured to the edge deviation. The previous plane (previous 15 1344644 ..land) PL located before the pit pT has the target length L4T (ie the target length of the plane is 4T) 'the previous concave before the previous plane PL The previous pit has a target length of Τ 3. In addition, the following land FL after the pit FT has a target length l5t, and the subsequent pit FP after the subsequent plane FL has a target length Ρπ. Here, the patterns (PP, PL, PT) and (PT, FL, FP) correspond to at least one pit planar pit data set type described above, and the patterns (PL, PT, FL) correspond to at least the above A planar pit planar dataset type. 140 calculations corresponding to the type of data set (pp, PL, P1^pL, PT, FL) and (PT, FL, FP) (especially for statistical calculations) It is captured to indicate that the pattern (pp, PL, PT), (PL, ρτ, , and (PT, FL, FP) dominates (d〇minate) the imperfect end of the pit ρτ, For example, the pattern (PT, FL, FP) dominates the imperfect end of the pit ρτ, then the corresponding strategy parameter is written (4)) (the representative is used to control the pair φ should be in the dataset type (PnT) , LmT, P1T) The writing strategy parameter of the end position of the pit) should be fine-tuned to adjust the imperfect end of the pit Ρτ, which is based on the case shown in Fig. 2 (n, m, 1) = (4, 5, 4). B«Bianyi II evaluation only calculations 11 144 can calculate the data, meaning, and the time point D of the falling edge of the material edge length ^ (ie, the bundle: Sighs the ten veins. The distance between the 2' day and the middle point d). Please note that the 'time point D is essentially 16 1344644. The value of the RF call m crosses (_) some - value (for example The same time-time point when the value is changed. When the time is changed, the threshold D ΠΓ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Calculate the length of the miscellaneous edge of the corresponding dataset class ^. In addition, the data is calculated for the clock Wei deviation; I' the deviation of the two 2 differences is similar to the data generated by the threat #料集_ for the clock edge ,, data For the clock edge deviation calculator (4), the data of the production type is related to the clock edge deviation by synthesizing the difference corresponding to the specific (four) set type. Statistical analysis can be for these differences === Please out of the majority of these differences (mostfreq - can be — - # 鳞 脉 边缘 边缘 # # # # # # 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘 边缘In the ideal situation, the time point of the end position of the pit Α between α5τ) should be smoothed down by the fine-grained material to the edge length of the clock. For example, the situation in the third figure is taken as an example. Fig. 3 is a (4) sound map for length compensation of the edge deviation of the clock, and the pit is also corresponding to the target length ρ4τ. As shown in Fig. 3: the pit, the pit ρτ_ is recorded in the exchange of words In the yelling of the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ (PT, FL, FP) calculation of the data set type, the statistical results can be extracted to indicate the type (PP, PL, FT), (PL, PT, FL), and (PT, FL, FP) One dominates the imperfect beginning of the pit PT, for example, the pattern (pp, _pL, PT) dominates the phenomenon of imperfect start of the PT, and the lion corresponds to the write strategy parameters. Ttopr(n,m,1), which represents the write strategy parameter used to control the start position of the pit corresponding to the dataset type, should be fine-tuned to adjust the imperfection of the pit to begin. In the case shown, (n, m, 丨) = (3, 4, 4). It should be noted that the data versus clock edge deviation calculator 144 calculates the data versus clock edge length d2. In this embodiment, the f(four) clock edge length is the time point E of the rising edge of the switching signal 115 (ie, the time point corresponding to the start position of the pit B) and the n fourteen modulation data miscellaneous CLK ^ ^ Such as: time point _ said __. It is intended that the glyph is the same-time point when the value of the RF signal 113 crosses a fixed value (e.g., the value corresponding to the slitting level of the divider 114). F-to-clock edge deviation calculator 藉 By detecting the level of the switching signal 115 from low to high _ measuring time point E. The same method can be used to calculate the length of the clock edge corresponding to the #_贞型心山L p叮). In addition, the data is calculated by the clock edge deviation calculator 144 = a number of differences to generate a data corresponding to the data set type to the clock edge deviation, which is converted to a f-to-clock edge of the day #= value Length and the difference between the target data and the length of the edge. In the case shown in Fig. 3, because the corresponding time: B Na position time '_ situation should be _^ to correspond to __3T, L4T, Ρ 4τ) target: _ clock edge length system 18 1344644 is determined as 0.5 Ding write::Yes::=::,calculate _transfer to eight (four)m “ 仏If necessary, the type depends on Γ44 is transmitted j news can pass (4) coma edge deviation calculator=pass _ face dependent classification Ξ this edge The signal of the deviation calculator 144 is digital, and the detection result generated by the type: two-two-fourteen-modulation length detector 130 can be attached to the classifier 14 144 by the pattern. Deviation calculator pick-up, -i #之舰财,写人脉冲(四)11 150 can be directly connected to _ to Laiyi shop 142, and the transfer is also side-by-side sacred ~ in the first - Wei defeat - change shot, observation The difference value produces the corresponding material pair clock edge length, which may be the average value corresponding to the specific order "==: pulse edge length. : Two different values to generate the target data corresponding to the specific material set type % (four) clock edge deviation to the clock edge length, can be ': two shells: the pair set Γ 疋 corresponds to the specific capital / β H complex Data on the value of the clock edge length. In another variation of the first embodiment, 'in the specific data set class _, Ρ·山 T) or (p value 乂 production depends on the clock edge deviation of the target data on the clock edge τ: ϋ) The material pair J is corresponding to the specific resource ^44644 ••(4)_(Ln(W,Ρ*τ, the length of the edge of the material and the pair of '^特特^^(四))__, Ρι〇* τ) The average of the data on the edge length of the clock. 'It should be noted that the above write strategy parameters, such as: Tt handsome, % D and Tlast (n, m, 丨), can be automatically Fine-tuning, because the present invention no longer requires two specific devices (for example, the above-mentioned green). In addition, the write pulse control $(10) can be generated according to the calculation module 140 without the support of the external I. The data is used to fine-tune the write strategy parameters of the clock edge, and the write strategy parameters can be automatically fine-tuned on the system or the wafer. By manually adjusting the write strategy parameters according to the data edge offset, Promote the pit length corresponding to the latest dragon that is written to the optical storage (the side is renewed (4) 4 (4)) Or the plane length may be close to or reach a target multiple of τ. _ ★ Figure 4 is a flow diagram of a method 910 of fine-tuning a write strategy parameter of an optical storage device in accordance with the present invention. The method 91 begins at step 91 〇s And can be implemented by the system l〇〇C shown in Fig. 1. In step 912, under the control of the firmware code executed by the micro-processing unit (MPU) in the optical storage device 1 Optical storage "Settings" The data is written to the optical storage medium 1〇2 using an initial value corresponding to the writing strategy parameter of the specific rotational speed of the optical storage lamp. 20 j344644 • In step 914, the optical storage device 100 reads the data written on the optical storage medium 102 to generate the slitting signal 115. In step 916, the system 1〇〇: the eight-to-fourteen-modulation length debt detector 13 is cut by measurement The signal 115 detects the length p of the pit and the length L of the plane. In step 918, the calculation module 14 calculates the data edge offset corresponding to the data set types υτ, #U) and (8), U PlT). , whose data set type is as described above At least - pit planar pit data fine or at least - planar pit planar data set type, wherein in the present embodiment, η = 3, 4, ..., 5iui, m = 3, 4, ..., or 11 'and 1 = 3, 4, ..., or η. In step 920, the microprocessing unit executing the WeChat body code determines whether the write strategy parameter needs to be fine-tuned. If the data-to-clock edge deviation is greater than the specific gate interpolation value, the micro-processing unit of the oil body code determines that the write strategy parameter needs to be fine-tuned, and step 922 will be executed, and the reward step is deleted. In some cases, if the initial state of the write strategy parameter is convinced that the system is not complete, the job light unit may proceed directly to step 922 without performing the check of step 92. Although a plurality of written strategies are written as described in Steps and Milk, and simplified as shown in Fig. 2, U is not a limitation of the present invention. If only one write strategy moxibustion number is required, then the steps 922 can be described as using the write-being strategy parameter _-- or the number of write strategy parameter types will not be described again. 21 1344644 If the micro-processing unit executing the firmware code decides to proceed to step 922, / as described above, the data-to-clock edge _ to fine-tune the write person == in step 924, to perform the micro-processing of the Wei-face code The control unit of the unit writes the data to the optical storage medium ι〇2 by using the fine-tuned write strategy parameter value (ie, executing step 922: storing the write strategy parameter value). 1 Please note that the invention is applied to the above-mentioned digitally diversified optical discs (for example, digital or chemical specifications of the D-specific specifications) according to the present invention, and the types (U PmT' Ln·) and (pnT, LnT, PlT) The total number can be obtained by: ~, 10 * 10 * 1 〇 wood 2 = 2000; This is due to the DVD-R specification or the R specification of the digital diversified discs ° η ~ 3....... U, or 14, m = 3, 4.....U, or 14, and 1 = 3, 4, ..., 1 or 14. And similarly, some combinations can be selected in practice; so that the person strategy parameters can be adjusted according to the selected combination, rather than adjusting according to all possible combinations. Figure 5 is a schematic diagram of different implementations of the present invention by fine-tuning the write strategy parameters by paste length deviation statistics, wherein the write strategy shown in Figure 5 refers to 22 1344644 •, the number can be applied to write DVD- R-specific discs, and in Figure 5, the write strategy parameters for multi-pulse writes and the write strategy parameters for one-pass write strategy are ideally listed. Digital signal (ideai seriai digital 31 笆阳1) to express. Write strategy parameters D1: 〇1) Buding 1: 〇1)2, 1«1 1:1, (1'1351:2, Ttopr, T〇df, Todr and Tlast correspond to some edge delays respectively (or edge shift), and the write strategy parameter Tmp corresponds to a certain pulse width. In addition, the write strategy > number, for example, the overdrive power shown in Figure 5 (〇ver(|rive p〇wer, • _Γ ), write power (write Ρ_), and bias power correspond to certain power levels, respectively. Figure 6 shows the different implementations of the present invention. The parameter of the parameter, wherein the write strategy parameter shown in Figure 6 can be applied to write a DVD-RW specification disc, and is used for the first write strategy (ie, the write strategy 第 in Figure 6). The write strategy parameters and the write strategy parameters for the second write policy (ie, shown in the sixth fiscal, write strategy 2) are respectively shown in the sixth place. The human strategy parameters (10), τ fine 2, Tlast2, and Tcool correspond to some edge delays respectively (or the edge bit write strategy parameter Tmp corresponds to a certain pulse width) In addition, write • fish (four) 6 ride (four) increase, secret (_-, and dust power correspond to some power levels respectively. 23 200 1344644. Example similar 'the difference Wei Ming as follows. In the second embodiment , input to turn to fourteen adjustments... 33 long recorded Cong 13Q reference is the reference clock of the hybrid i 22G key reference CLK2 > test clock GlK2 frequency does not need to with eight turns fourteen modulation information CLK The frequency is equal. Figure 8 is a schematic diagram of a system 3qqc for fine-tuning the write strategy parameters of the optical storage device 300 according to the third embodiment of the present invention. This embodiment is similar to the first embodiment, and the difference is as follows: The system includes a sampling circuit 'faced to the waveform equalizer 112 to receive the reconstructed signal (eg, the RF signal 113). The sampling circuit is used to sample the reconstructed signal to generate a digital signal; in this embodiment The 'digital signal is a digital RF signal 315. As shown in Fig. 8, the sampling circuit includes an analog digital converter (operational (10) bidding 咐% ADC) 314 and a phase locked loop 320. The analog digital converter 314 is based on reference Pulse (4) into the RF signal 113 Analog digital conversion to generate digital RF signal 315, and • Phase-locked loop 320 generates reference clock ακ3 according to digital RF signal 315. System 300C further includes eight-to-fourteen modulation length detector 33〇, calculation module 340 And the write pulse controller 35, wherein the calculation module (10) includes a pattern dependency class 342 and a bedding material edge deviation calculator 344. Here, the signal used for detecting the length is a digital RF Signal 315, instead of the split signal 115. The eight-to-fourteen-modulation length side coffee maker detects the spacing between the time points by observing (〇bserve) the value of the digital RF signal 315 and generates the length of the spacing, wherein Each spacing corresponds to a pit or a plane. The boundaries of the spacings may be determined by a predetermined value. The predetermined value may be intermediate between the maximum and minimum values carried by the digital RF signal 315. Value, for example: the average of the maximum and minimum values. The intermediate value is equivalent to the switching signal described in the previous embodiments. Figure 9 is a schematic diagram of a plurality of sampling points (indicated by the § number of the eight lines in ten) of the reconstruction signal (for example, the radio frequency signal 113), wherein the value of the specific sampling point is a predetermined value (for example, the above intermediate value) The difference d3 between can be used as the index α-η) for indicating the edge deviation d4 of the data. According to the waveform of the RF signal shown in Fig. 9, most of the sampling points that span a predetermined value will be perfectly Aligning the falling edge of the eight-four-four machine (four) Japanese machine, most of the data is converted to the value of the edge deviation of the clock. The above-mentioned special-like closing value means that the value is sampled = value, and the value is carried by the digital RF signal 315. The difference between the value of the sampling point and the pre-value (for example, the difference d3 above) may indicate that the data is offset from the edge of the clock (for example, the above data _ pulse edge lag (4), and the corresponding length and resource pair are obtained. Clock edge deviation. Calculate · _ can calculate the joy value (for example: the middle value of the upper )) and the difference between the value of the digital RF signal 315 when the value of the digital signal 315 crosses the predetermined value = the value of the bit RF signal 315 Estimate the data for the clock and the eight to fourteen variable lengths of the miscellaneous coffee can be output by the turn signal 3 real ^ long ΐ L and P, where the output signal 331 is similar to the output signal 13 。. The clock edge deviation calculator 344 calculates the data for the clock edge deviation device with the write pulse controller 15 by using the above-mentioned relationship of the 25 U44644 straight line. The second and second codes can be output by the output signal 345. The information contained in the clock signal 345 is similar to the round signal 145. The heel bias, which makes the round use ^ = change _ schematic 'where makes lnterP〇lat〇r) 416, secret analog analog converter 314 Between the • and 贞 loops 320. The phase-locked loop Na generates the reference signal ακ4 according to the interpolated signal generated by the interpolation H, and the interpolator 416 performs the interpolation operation according to the digital RF signal 315 and the reference signal ακ4 ( Interpolat means operation). In the present variation, the input of the eight-to-fourteen-modulation length _330 can be replaced by the interpolated signal 417. The operation of the interpolator 416 is known to those skilled in the art and the details thereof are not described herein. φ Figure 11 is a flow diagram of a method 930 of a detailed implementation of statistical calculations in accordance with an embodiment of the present invention. The method of the detailed implementation shown in Figure η begins at step 930S' and can be applied to Figure 4 Embodiments 'in particular, steps gig, 920, and 922. In step 932, 'calculate the plurality of dataset types corresponding to the patterns (PP, PL, PT), (PL, pT, FL), and/or (PT, FL, FP), and obtain data pairs. The data edge type of the clock edge deviation is greater than the threshold value Th_A (for example: Th_A = 0. 3T). 26 丄^44644 In step 934, the margin of the clock edge is greater than the threshold value of the threshold. In the bucket type, the number of rounds and shells is more than the number of occurrences (ie, the threshold value). The number of data sets of the number of times, where the threshold value Th-B is a positive integer, for example: Th 』=256. In step 936, the amount of adjustment of the write strategy parameter corresponding to the data set type of the data set occurrence number more than Th-B is calculated. And it ends in step E. It should be noted that in accordance with certain embodiments of the present invention, statistical calculations may be performed to determine the distribution curves for the corresponding lengths L and /il P. The information of some characteristics of the distribution curve 'for example: the shape of the distribution curve, the height and width (10) f height width), and the area of the threshold value Th-A and Th_B, the secret mosquito is the recording and writing parameters. And the amount of adjustment that determines the write strategy parameters. Fig. 12 and Fig. 13 are graphs showing the number of samples (sa_e(10) nt) before and after the fine-tuning of the write strategy parameters, respectively, versus the data versus clock edge length, in accordance with an embodiment of the present invention. As shown in Fig. 12, regarding the combination "PT(4T) + FL(5T)" corresponding to (pT, FL) = (4T, 5T), the curve is centered on a certain value (example: eg zero) . In addition, the curve corresponding to the combination of (PL, PT, FL) = (3T, 4T, 5T) "PL(3T), + PT(4T) + FL(5T)" is obtained by subtracting S2 from the value Center, and the curve corresponding to (PL, PT, FL) = (4T, 4T, 5T) "PL(4T) + ρτ(4Τ) + FL(5T)" is based on the value plus Si The center, and the curve corresponding to (hole ρτ 27 1344644 FL) = (5T, 4T, 5T), the combination of "pL(5T) + ρτ(4Τ) + FL(5T)" is also centered on a certain value. Therefore, according to the present embodiment, the write strategy parameters are fine-tuned, and the three lower curves as shown in Fig. 12 are concentrated in one place so that they are centered at the same value or close to each other, and can be narrowed (narr 〇w) The higher curve as shown in Figure 12. Therefore, as shown in Fig. 13, the gap 51 and 兕 are reduced. It should be noted that the present invention can be implemented by using a hardware having a combination of a plurality of elements, or by using a computer executing a software or a program. In addition, some of the system components disclosed in the scope of the claims or the above description may be implemented by using the same hardware or software device. The above description is only for the present invention, and the equivalent changes and modifications made by the invention in the scope of the present invention are all covered by the present invention. [Simple diagram of the diagram] Figure 1
第4圖為依據本發明一 實施例之顧資料對時脈邊緣偏差來進行 實施例之用來微調物儲存裝置的寫入笛 寫入策 28 略參數之方法的流程圖。 第5別1 為依據本發明不同的實施例之藉由利用長度偏差統計來分 片丨微凋寫入策略參數的示意圖。 第6 =依縣發科_實_之藉由_長度偏差統計來分 1微調寫入策略參數的示意圖。 第7圖為鱗本㈣-實椒狀絲_絲齡綠之寫入策 略參數之系統的示意圖。 第8圖為依據本發明—實施例之絲微調絲儲存裝置之寫入策 略參數之系統的示意圖。 第圖為於重建訊號上之複數個取樣點的示意圖。 f 1〇圖為第8圖所示之實施例之-變化例的示意圖。 〃圖為依據本發明—實施例之統計計算之詳細實施的流程圖。 第12圖為依縣發明—實_之於微調寫人策略參數之前的取樣 數相對於資料對時脈邊緣長度之曲線的示意圖。 第13圖為依據本發明—實施例之於微調寫人策略錄之後的取樣 數相對於㈣對時脈邊緣長度之曲線的示意圖。 【主要元件符號說明】 100,200,30^400 - ιυυυ, zuuc, 30〇c, 400C 系統 1U2 - no . ~~--- 光學儲存媒體 --~— ~~~—~~~_ 光學讀取頭 29 1344644Figure 4 is a flow diagram of a method for performing a write-to-spin algorithm for a fine-tuned storage device in accordance with an embodiment of the present invention. Section 5 is a schematic diagram of fragmentation strategy parameters by using length deviation statistics in accordance with various embodiments of the present invention. The sixth = according to the county _ _ real _ by _ length deviation statistics to 1 fine-tuned write strategy parameters. Fig. 7 is a schematic diagram of a system in which a scale parameter (four)-solid pepper-like silk _ silk age green is written. Figure 8 is a schematic illustration of a system for writing strategy parameters for a silk micro-wire storage device in accordance with an embodiment of the present invention. The figure is a schematic diagram of a plurality of sampling points on the reconstructed signal. The f 1 diagram is a schematic view of a variation of the embodiment shown in Fig. 8. The diagram is a flow chart of a detailed implementation of statistical calculations in accordance with the present invention. Figure 12 is a diagram showing the curve of the number of samples before the fine-tuning of the strategy parameters of the county-invented-real-phase data. Figure 13 is a graph showing the relationship between the number of samples after fine-tuning the writer's strategy record and (4) versus the length of the clock edge in accordance with the present invention. [Main component symbol description] 100,200,30^400 - ιυυυ, zuuc, 30〇c, 400C system 1U2 - no . ~~--- Optical storage media --~~ ~~~—~~~_ Optical read head 29 1344644
112 波形等化器 114 分切器 120, 320 鎖相迴路 130,330 八轉十四調變長度偵測器 140, 340 計算模~ ' 142, 342 型樣依附分類器 144, 344 貝料對時脈邊緣偏差計算器 150, 350 寫入脈衝控制器 160 調變 '一- 162 寫入脈衝產生器 164 發射源驅動器 220 振 H --- 314 類比數位轉換器 416 内才一—- 111, 113, 115, 131, 143, 145, ' --- 151, 161, 163,165,315, 331, 343,345,351 CLK, CLK2, CLK3, CLK4 ^^-- d, e, D, E, Do, Eo 時 ρΐΐί〜^—--- dl,d2 —— d3 d4 對時脈物⑽ -- 30 1344644112 Waveform equalizer 114 Divider 120, 320 Phase-locked loop 130, 330 Eight-to-fourteen-modulation length detector 140, 340 Computational mode ~ ' 142, 342-type dependent classifier 144, 344 Shell-to-clock edge Deviation calculator 150, 350 write pulse controller 160 modulation 'one-162 write pulse generator 164 transmit source driver 220 vibration H --- 314 analog digital converter 416 only one -- 111, 113, 115, 131, 143, 145, ' --- 151, 161, 163, 165, 315, 331, 343,345,351 CLK, CLK2, CLK3, CLK4 ^^-- d, e, D, E, Do, Eo ρΐΐί~^—--- dl , d2 —— d3 d4 to the clock (10) -- 30 1344644
Ttopr, Tlast, Todr, Todf, Ttopl, Ttop2, Tlastl, Tlast2, Tcool, Tmp 寫入策略參數 S1,S2 分佈曲線的中心值之間的差 距 910, 930 方法 910S,910E，912〜924,930S， 930E，932 〜936 步驟 31Ttopr, Tlast, Todr, Todf, Ttopl, Ttop2, Tlastl, Tlast2, Tcool, Tmp Write the difference between the center values of the strategy parameters S1, S2 distribution curve 910, 930 methods 910S, 910E, 912~924, 930S, 930E, 932 ~ 936 Step 31