TWI339012B - Level-shifting circuit - Google Patents
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1339012 路 比較器、一邏輯電路、一第一加速電路、以及一第 二加速電路。上述正回授電路接收一第一訊號以及一第二 訊號以產生一第三訊號以及一第四訊號,其中上述第一和 第二訊號互為反相訊號。上述比較器包括一第一輸入端接 收上述第三訊號、一第二輸入端接收上述第四訊號、以及 一輸出端根據上述第三和第四訊號產生一輸出訊號,其中 上述輸出訊號具有一第一位準,以及低於上述第一位準之 一第二位準。上述邏輯電路包括複數邏輯閘,用以接收上 述第一訊號以產生一第一脈衝與一第二脈衝。上述第一加 速電路耦接至上述第一輸入端,用以接收上述第一脈衝, 並在上述第一脈衝之一脈寬期間加速上述比較器產生上述 輸出訊號。上述第二加速電路耦接至上述第二輸入端,用 以接收上述第二脈衝,並在上述第二脈衝之一脈寬期間加 速上述比較器產生上述輸出訊號。 本發明亦提供一種電壓位準偏移電路,包括一比較 斋、一邏輯電路、以及一加速電路。上述比較器包括一輸 入端以及一輸出端,用以於上述輸入端接收一輸入訊號, 並偏移上述輸入訊號以於上述輸出端產生一輪出訊號。上 述邏輯電路包括複數邏輯閉’用以接收上述輸入訊號以產 生一脈衝。上述加速電路耦接至上述比較器,用以接收上 述脈衝並在上述脈衝之一脈寬期間加速上述比較器產生上 述輸出訊號。 【實施方式】 。電壓位準偏移電路200 第2圖為本發明之一實施例1339012 A comparator, a logic circuit, a first acceleration circuit, and a second acceleration circuit. The positive feedback circuit receives a first signal and a second signal to generate a third signal and a fourth signal, wherein the first and second signals are mutually inverted signals. The comparator includes a first input receiving the third signal, a second input receiving the fourth signal, and an output generating an output signal according to the third and fourth signals, wherein the output signal has a first A standard, and a second level lower than the first level above. The logic circuit includes a complex logic gate for receiving the first signal to generate a first pulse and a second pulse. The first accelerating circuit is coupled to the first input terminal for receiving the first pulse, and accelerating the comparator to generate the output signal during a pulse width of the first pulse. The second accelerating circuit is coupled to the second input terminal for receiving the second pulse, and accelerating the comparator to generate the output signal during a pulse width of the second pulse. The present invention also provides a voltage level shifting circuit comprising a compare circuit, a logic circuit, and an acceleration circuit. The comparator includes an input end and an output end for receiving an input signal at the input end and offsetting the input signal to generate a round-out signal at the output end. The logic circuit includes a plurality of logic blocks </ RTI> for receiving the input signal to generate a pulse. The accelerating circuit is coupled to the comparator for receiving the pulse and accelerating the comparator to generate the output signal during a pulse width of the pulse. [Embodiment] Voltage level shift circuit 200 FIG. 2 is an embodiment of the present invention
Client’s Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 1339012 包括正回授電路202、比較器204、邏輯電路206、加速電 路208、以及加速電路210。正回授電路202接收第一訊號 VI以及第二訊號V2以產生第三訊號V3以及第四訊號 V4。第一訊號VI和第二訊號V2互為反相訊號,亦即當第 一訊號VI為高位準時第二訊號為低位準,反之亦然。比 較器204包括一第一輸入端接收第三訊號V3、一第二輸入 端接收第四訊號V4、以及一輸出端根據第三訊號V3和第 四訊號V4產生一輸出訊號OUT。輸出訊號OUT具有與第 一訊號VI和第二訊號V2不同之高低位準,其中輸出訊號 OUT的高位準為電壓BOOT,低位準為電壓PHASE。邏輯 電路206包括複數個邏輯閘,用以接收第一訊號VI以產 生第一脈衝P1與第二脈衝P2。加速電路208耦接至比較 器204的第一輸入端,用以接收第一脈衝P卜並在第一脈 衝P1之脈寬期間加速比較器204產生輸出訊號OUT。加 速電路210耦接至比較器204的第二輸入端,用以接收第 二脈衝P2,並在第二脈衝P2之脈寬期間加速比較器204 產生輸出訊號OUT。 第3圖為第2圖之電路結構。正回授電路202可包括 電晶體 Ml、M2、M3、M4、M9、M10、Mil 和 M12。比 較器204可包括電晶體M5、M6、M7和M8,以及電阻IU、 R2。邏輯電路206可包括反相器INV1、INV2、INV3和 INV4,以及反或閘NR1和反及閘NA1。加速電路208可 包括電晶體M13、M14、M15、M16。加速電路210可包 括電晶體1^17、1\/[18、]^19、]^20。Client's Docket No.: TT's Docket No: 0975-A41244-TW/Final/LukeLee 1339012 includes a positive feedback circuit 202, a comparator 204, a logic circuit 206, an acceleration circuit 208, and an acceleration circuit 210. The positive feedback circuit 202 receives the first signal VI and the second signal V2 to generate the third signal V3 and the fourth signal V4. The first signal VI and the second signal V2 are mutually inverted signals, that is, when the first signal VI is high, the second signal is low, and vice versa. The comparator 204 includes a first input receiving the third signal V3, a second input receiving the fourth signal V4, and an output generating an output signal OUT according to the third signal V3 and the fourth signal V4. The output signal OUT has a different level from the first signal VI and the second signal V2, wherein the high level of the output signal OUT is the voltage BOOT, and the low level is the voltage PHASE. The logic circuit 206 includes a plurality of logic gates for receiving the first signal VI to generate the first pulse P1 and the second pulse P2. The accelerating circuit 208 is coupled to the first input of the comparator 204 for receiving the first pulse P and accelerating the comparator 204 to generate the output signal OUT during the pulse width of the first pulse P1. The accelerating circuit 210 is coupled to the second input of the comparator 204 for receiving the second pulse P2 and accelerating the comparator 204 to generate the output signal OUT during the pulse width of the second pulse P2. Figure 3 is the circuit structure of Figure 2. The positive feedback circuit 202 can include transistors M1, M2, M3, M4, M9, M10, Mil, and M12. Comparator 204 can include transistors M5, M6, M7, and M8, and resistors IU, R2. The logic circuit 206 can include inverters INV1, INV2, INV3, and INV4, and a reverse OR gate NR1 and an inverse gate NA1. The acceleration circuit 208 can include transistors M13, M14, M15, M16. The acceleration circuit 210 may include transistors 1^17, 1\/[18,]^19, ]^20.
Client's Docket No.: TT’s Docket No:0975-A41244-TW/Final/LukeLee 7 1339012 在正回授電路202中,電晶體Ml可為N型金氧半場 效電晶體,其源極耦接於電壓GND,閘極接收第一訊號 VI,並根據第一訊號VI之電壓位準而決定電晶體Ml是 否導通。電晶體M2可為N型金氧半場效電晶體,其源極 耦接於電壓GND,閘極接收第二訊號V2,並根據第二訊 號V2之電壓位準而決定電晶體M2是否導通。電晶體M3 可為P型金氧半場效電晶體,其源極耦接至電壓BOOT, 閘極耦接至電晶體M6的閘極(亦即比較器204的第二輸入 端),汲極耦接至電晶體M5的閘極(亦即比較器204的第一 輸入端)。電晶體M4可為P型金氧半場效電晶體,其源極 耦接至電壓BOOT,閘極耦接至電晶體M5的閘極(亦即比 較器204的第一輸入端),汲極柄接至電晶體M6的閘極(亦 即比較器204的第二輸入端)。電晶體M9和M10可為N 型金氧半場效電晶體,構成一保護電路(Shielding Device),可避免高壓破壞正回授電路202。此外,在電晶 體Ml或電晶體M2的導通期間,電晶體M9、M10、Mil、 和M12可視為電阻看待。 當第一訊號VI為高位準且第二訊號V2為低位準時, 電晶體Ml導通而電晶體M2不導通,因此將第三訊號V3 拉往電壓GND,使電晶體M4導通。電晶體M4導通會使 第四訊號V4拉往電壓BOOT,並使電晶體M3不導通。因 此,第三訊號V3與第四訊號V4便會被分別鎖定在電壓 GND與電壓BOOT,進而分別輸入至電晶體M5與M6的 閘極。反之,當第一訊號VI為低位準且第二訊號V2為高Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 7 1339012 In the positive feedback circuit 202, the transistor M1 may be an N-type MOS field-effect transistor, the source of which is coupled to the voltage GND. The gate receives the first signal VI and determines whether the transistor M1 is turned on according to the voltage level of the first signal VI. The transistor M2 can be an N-type MOSFET, the source of which is coupled to the voltage GND, the gate receiving the second signal V2, and determining whether the transistor M2 is turned on according to the voltage level of the second signal V2. The transistor M3 can be a P-type MOS field-effect transistor, the source of which is coupled to the voltage BOOT, the gate is coupled to the gate of the transistor M6 (ie, the second input of the comparator 204), and the gate is coupled. Connected to the gate of transistor M5 (ie, the first input of comparator 204). The transistor M4 can be a P-type MOS field-effect transistor, the source of which is coupled to the voltage BOOT, the gate is coupled to the gate of the transistor M5 (ie, the first input of the comparator 204), and the drain handle Connected to the gate of transistor M6 (ie, the second input of comparator 204). The transistors M9 and M10 can be N-type MOS half-field transistors, forming a Shielding Device, which can avoid high voltage damage to the positive feedback circuit 202. Further, during the conduction of the electric crystal M1 or the transistor M2, the transistors M9, M10, Mil, and M12 can be regarded as resistance. When the first signal VI is at a high level and the second signal V2 is at a low level, the transistor M1 is turned on and the transistor M2 is not turned on, so the third signal V3 is pulled to the voltage GND to turn on the transistor M4. The transistor M4 is turned on to pull the fourth signal V4 to the voltage BOOT and to make the transistor M3 non-conductive. Therefore, the third signal V3 and the fourth signal V4 are respectively locked to the voltage GND and the voltage BOOT, and are respectively input to the gates of the transistors M5 and M6. Conversely, when the first signal VI is low and the second signal V2 is high
Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 1339012 位準時,電晶體Ml不導通而電晶體M2導通,因此第四 訊號V4被拉往電壓GND,使電晶體M3導通。電晶體M3 導通會使第三訊號V3拉往電壓BOOT,使電晶體M4不導 通。因此,第三訊號V3與第四訊號V4便會被分別鎖定在 電壓BOOT與電壓GND,進而分別輸入至電晶體M5與 M6的閘極。 在比較器204中,電晶體M5可為P型金氧半場效電 晶體,其源極耦接至電壓BOOT,閘極為比較器204的第 一輸入端,汲極耦接至輸出端。電晶體M6可為P型金氧 半場效電晶體,其源極耦接至電壓BOOT,閘極為比較器 204的第二輸入端。電晶體M7可為N型金氧半場效電晶 體,其汲極耦接至輸出端,閘極耦接至電晶體M6之汲極, 源極耦接至電壓PHASE。電晶體M8可為N型金氧半場效 電晶體,其汲極耦接至電晶體M6之汲極,閘極耦接至輸 出端,源極耦接至電壓PHASE。電阻R1耦接於電壓BOOT 和輸出端之間。電阻R2耦接於電壓PHASE和電晶體M6 之没極之間。 輸出訊號OUT於比較器204的位準轉換流程如下。當 第三訊號V3為電壓GND且第四訊號V4為電壓BOOT 時,電晶體M5為導通而電晶體M6為不導通。電晶體M5 導通會使電晶體M8之閘極電壓提高而導通,而使電晶體 M7之閘極電壓下降而不導通。因此,輸出端的輸出訊號 OUT為電壓BOOT。反之,當第三訊號V3為電壓BOOT 且第四訊號V4為電壓GND時,電晶體M5為不導通而電Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 1339012 When the bit is on, the transistor M1 is not turned on and the transistor M2 is turned on, so the fourth signal V4 is pulled to the voltage GND, and the transistor M3 is turned on. The transistor M3 is turned on to pull the third signal V3 to the voltage BOOT, so that the transistor M4 is not turned on. Therefore, the third signal V3 and the fourth signal V4 are respectively locked to the voltage BOOT and the voltage GND, and are respectively input to the gates of the transistors M5 and M6. In the comparator 204, the transistor M5 can be a P-type MOS field-effect transistor, the source of which is coupled to the voltage BOOT, the gate is the first input of the comparator 204, and the drain is coupled to the output. The transistor M6 can be a P-type MOSFET, the source of which is coupled to the voltage BOOT, and the gate is substantially at the second input of the comparator 204. The transistor M7 can be an N-type MOS field-effect transistor, the drain of which is coupled to the output terminal, the gate is coupled to the drain of the transistor M6, and the source is coupled to the voltage PHASE. The transistor M8 can be an N-type MOS field-effect transistor, the drain of which is coupled to the drain of the transistor M6, the gate is coupled to the output terminal, and the source is coupled to the voltage PHASE. The resistor R1 is coupled between the voltage BOOT and the output terminal. The resistor R2 is coupled between the voltage PHASE and the pole of the transistor M6. The level conversion process of the output signal OUT to the comparator 204 is as follows. When the third signal V3 is the voltage GND and the fourth signal V4 is the voltage BOOT, the transistor M5 is turned on and the transistor M6 is turned off. The transistor M5 is turned on to increase the gate voltage of the transistor M8 and turn on, and the gate voltage of the transistor M7 is lowered without being turned on. Therefore, the output signal OUT of the output is the voltage BOOT. Conversely, when the third signal V3 is the voltage BOOT and the fourth signal V4 is the voltage GND, the transistor M5 is non-conductive and electrically
Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 1339012 晶體M6為導通。電晶體M6導通會使電晶體M7之閘極電 壓提高而導通,而使電晶體M8之閘極電壓下降而不導通。 因此,輸出端的輸出訊號OUT為電壓PHASE。 在邏輯電路206中,反相器INV1、INV2、以及INV3 可以串接方式耦接,用以接收第一訊號VI。反或閘NR1 接收反相器INV3之輸出以及第一訊號VI而產生第一脈衝 P1。反及閘NA1接收反相器INV3之輸出以及第一訊號 VI。反相器INV4接收反及閘NA1之輸出後產生第二脈衝 P2。第4圖為電壓位準偏移電路200的訊號波形示意圖。 第一訊號VI與第二訊號V2互為反相訊號,輸出訊號OUT 與第一訊號VI為同相訊號但彼此電壓位準不同。邏輯電 路206可在第一訊號VI之下降邊緣產生第一脈衝P1,並 於第一訊號VI之上升邊緣產生第二脈衝P2。第一脈衝P1 和第二脈衝P2的脈衝寬度可由反相器INV1、INV2、和 INV3的傳遞延遲總和而決定。 在加速電路208中,電晶體M16可為N型金氧半場效 電晶體,其閘極用以接收第一脈衝P1而導通,源極耦接至 電壓GND。電晶體M13和M14共同組成一電流鏡,皆可 為P型金氧半場效電晶體,當電晶體M16接收到第一脈衝 P1而導通時,電晶體M14可施加電壓BOOT至比較器204 的第一輸入端。電晶體M15可為N型金氧半場效電晶體, 為一保護電路,耦接於電晶體M16和電流鏡之間,可避免 高電壓破壞加速電路208。 在加速電路210中,其電路結構與加速電路208相同。Client's Docket No.: TT's Docket No: 0975-A41244-TW/Final/LukeLee 1339012 Crystal M6 is conductive. Turning on the transistor M6 causes the gate voltage of the transistor M7 to increase and conduct, and causes the gate voltage of the transistor M8 to drop without being turned on. Therefore, the output signal OUT at the output is the voltage PHASE. In the logic circuit 206, the inverters INV1, INV2, and INV3 may be coupled in series to receive the first signal VI. The inverse OR gate NR1 receives the output of the inverter INV3 and the first signal VI to generate the first pulse P1. The gate NA1 receives the output of the inverter INV3 and the first signal VI. The inverter INV4 receives the output of the inverse gate NA1 to generate a second pulse P2. FIG. 4 is a schematic diagram of signal waveforms of the voltage level shift circuit 200. The first signal VI and the second signal V2 are mutually inverted signals, and the output signal OUT and the first signal VI are in phase signals but different voltage levels. Logic circuit 206 can generate a first pulse P1 at the falling edge of the first signal VI and a second pulse P2 at the rising edge of the first signal VI. The pulse widths of the first pulse P1 and the second pulse P2 can be determined by the sum of the transfer delays of the inverters INV1, INV2, and INV3. In the accelerating circuit 208, the transistor M16 can be an N-type MOS field-effect transistor, the gate of which is used to receive the first pulse P1 and the source is coupled to the voltage GND. The transistors M13 and M14 together form a current mirror, which can be a P-type MOS field-effect transistor. When the transistor M16 receives the first pulse P1 and is turned on, the transistor M14 can apply the voltage BOOT to the comparator 204. An input. The transistor M15 can be an N-type metal oxide half field effect transistor, which is a protection circuit coupled between the transistor M16 and the current mirror to avoid the high voltage destruction acceleration circuit 208. In the acceleration circuit 210, its circuit configuration is the same as that of the acceleration circuit 208.
Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 10 1339012 電晶體M20可為N型金氧半場效電晶體,其閘極用以接收 第二脈衝P2而導通,源極耦接至電壓GND。電晶體M17 和Μ18共同組成一電流鏡,皆可為P型金氧半場效電晶 體,當電晶體Μ20接收到第二脈衝Ρ2而導通時,電晶體 Ml 7可施加電壓BOOT至比較器204的第二輸入端。電晶 體M19可為N型金氧半場效電晶體,為一保護電路,耦接 於電晶體M20和電流鏡之間,可避免高電壓破壞加速電路 210。 第5圖為本發明之另一實施例。電壓位準偏移電路500 包括比較器502、邏輯電路504、以及加速電路506。比較 器502包括一輸入端接收輸入訊號IN,並且偏移上述輸入 訊號IN的電壓位準後,於一輸出端產生輸出訊號OUT。 邏輯電路504可包括複數邏輯閘,用以接收輸入訊號IN以 產生脈衝訊號P。加速電路506耦接至比較器502,用以接 收脈衝訊號P,並可在脈衝訊號P的脈寬期間加速比較器 502產生輸出訊號OUT。 第6圖為第5圖的電路結構。比較器502可包括電晶 體Ml、M2、M3、M4、和M5,以及電阻R1。邏輯電路 504可包括反相器INV1、INV2、INV3、以及反或閘NR1。 加速電路506可包括電晶體M6、M7、M8、和M9。 在比較器502中,電晶體Ml可為N型金氧半場效電 晶體,其閘極接收輸入訊號IN並根據輸入訊號IN決定電 晶體Ml導通或不導通,源極耦接至電壓GND。電晶體 M2可為P型金氧半場效電晶體,其源極耦接至電壓Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 10 1339012 The transistor M20 can be an N-type MOSFET, the gate is used to receive the second pulse P2, and the source is coupled. Connect to voltage GND. The transistors M17 and Μ18 together form a current mirror, which can be a P-type MOS half-field effect transistor. When the transistor Μ20 receives the second pulse Ρ2 and is turned on, the transistor M17 can apply a voltage BOOT to the comparator 204. The second input. The electric crystal M19 can be an N-type gold-oxygen half field effect transistor, which is a protection circuit coupled between the transistor M20 and the current mirror to avoid the high voltage destruction acceleration circuit 210. Figure 5 is another embodiment of the present invention. The voltage level shift circuit 500 includes a comparator 502, a logic circuit 504, and an acceleration circuit 506. The comparator 502 includes an input terminal receiving the input signal IN and offsetting the voltage level of the input signal IN to generate an output signal OUT at an output. The logic circuit 504 can include a complex logic gate for receiving the input signal IN to generate the pulse signal P. The accelerating circuit 506 is coupled to the comparator 502 for receiving the pulse signal P and accelerating the comparator 502 to generate the output signal OUT during the pulse width of the pulse signal P. Figure 6 is a circuit diagram of Figure 5. The comparator 502 may include electromorphs M1, M2, M3, M4, and M5, and a resistor R1. Logic circuit 504 can include inverters INV1, INV2, INV3, and inverse OR gate NR1. The acceleration circuit 506 can include transistors M6, M7, M8, and M9. In the comparator 502, the transistor M1 can be an N-type MOS field-effect transistor, and the gate receives the input signal IN and determines whether the transistor M1 is turned on or off according to the input signal IN, and the source is coupled to the voltage GND. The transistor M2 can be a P-type MOS field-effect transistor, the source of which is coupled to the voltage
Client's Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 1339012 BOOT,汲極耦接至比較器502的輸出端。電晶體M3可為 N型金氧半場效電晶體,其汲極耦接至比較器502的輸出 端,閘極耦接至電晶體M2的閘極,以及源極耦接至電壓 PHASE。電阻R1耦接於電壓BOOT以及電晶體M2的閘 極之間。電晶體M4可為N型金氧半場效電晶體,構成一 保護電路,可避免高壓破壞比較器502。此外,在電晶體 Ml的導通期間,電晶體M4和M5可視為電阻看待。 在邏輯電路504中,反相器INV卜INV2、和INV3可 以串接方式連接,用以接收輸入訊號IN。反或閘NR1則 接收反相器INV3之輸出以及輸入訊號IN以產生脈衝訊號 P。第7圖為電壓位準偏移電路500的訊號波形示意圖,邏 輯電路504於輸入訊號IN之下降邊緣產生脈衝訊號P。脈 衝訊號P的脈衝寬度可由反相器INV1、INV2、和INV3 的傳遞延遲總和而決定。由第7圖可知,輸出訊號OUT與 輸入訊號IN為同相訊號但彼此位準不同。 在加速電路506中,電晶體M6可為N型金氧半場效 電晶體,其閘極用以接收脈衝訊號P而導通,源極耦接至 電壓GND。電晶體M8和M9共同組成一電流鏡,皆可為 P型金氧半場效電晶體,當電晶體M6接收到脈衝訊號P 而導通時,電晶體M9可施加電壓BOOT至電晶體M3的 閘極。電晶體M7可為N型金氧半場效電晶體,為一保護 電路,耦接於電晶體M6和電流鏡之間,可避免高電壓破 壞加速電路506。Client's Docket No.: TT's Docket No: 0975-A41244-TW/Final/LukeLee 1339012 BOOT, the drain is coupled to the output of the comparator 502. The transistor M3 can be an N-type MOS field-effect transistor, the drain of which is coupled to the output of the comparator 502, the gate coupled to the gate of the transistor M2, and the source coupled to the voltage PHASE. The resistor R1 is coupled between the voltage BOOT and the gate of the transistor M2. The transistor M4 can be an N-type gold-oxygen half-field effect transistor, constituting a protection circuit to prevent the high voltage from damaging the comparator 502. Further, during the turn-on of the transistor M1, the transistors M4 and M5 can be regarded as resistance. In the logic circuit 504, the inverters INV INV2 and INV3 can be connected in series to receive the input signal IN. The inverse gate NR1 receives the output of the inverter INV3 and the input signal IN to generate the pulse signal P. Figure 7 is a schematic diagram of the signal waveform of the voltage level shifting circuit 500. The logic circuit 504 generates a pulse signal P at the falling edge of the input signal IN. The pulse width of the pulse signal P can be determined by the sum of the transfer delays of the inverters INV1, INV2, and INV3. As can be seen from Fig. 7, the output signal OUT and the input signal IN are in phase signals but different from each other. In the accelerating circuit 506, the transistor M6 can be an N-type MOS field-effect transistor, the gate of which is used to receive the pulse signal P and is turned on, and the source is coupled to the voltage GND. The transistors M8 and M9 together form a current mirror, which can be a P-type MOS half-field effect transistor. When the transistor M6 receives the pulse signal P and is turned on, the transistor M9 can apply the voltage BOOT to the gate of the transistor M3. . The transistor M7 can be an N-type metal oxide half field effect transistor, which is a protection circuit coupled between the transistor M6 and the current mirror to avoid the high voltage breaking acceleration circuit 506.
輸出電壓OUT的位準轉換流程如下。當輸入電壓INThe level conversion process of the output voltage OUT is as follows. When the input voltage IN
Client’s Docket No.: TT's Docket No:0975-A41244-TW/FinaI/LukeLee 12 1339012 由低位準變成高位準時,電晶體Ml為導通,使電晶體M2 的閘極電壓拉往電壓GND,因而讓電晶體M2導通以及電 晶體M3不導通,使輸出訊號OUT為電壓BOOT。反之, 當輸入電壓IN由高位準變成低位準時,電晶體Ml為不導 通,電壓BOOT可經由電阻R1到電晶體M3的閘極使其 導通並使電晶體M2不導通,因此輸出訊號OUT為電壓 PHASE。 雖然本發明已以數個實施例揭露如上,然其並非用 以限定本發明,任何熟悉此項技藝者,在不脫離本發明 之精神和範圍内,當可做些許更動與潤飾,因此本發明 之保護範圍當視後附之申請專利範圍所界定者為準。 【圖式簡單說明】 第1A圖表示電壓位準偏移電路可用於連接兩電壓位 準不同之電路; 第1B圖為電壓位準轉換示意圖; 第2圖為本發明之一實施例,包括一電壓位準偏移電 路 200 ; 第3圖為第2圖之電路構造; 第4圖為第2圖之訊號波形示意圖; 第5圖為本發明之另一實施例,包括電壓位準偏移電 路 500 ; 第6圖為第5圖之電路構造;以及 第7圖為第5圖之訊號波形示意圖。Client's Docket No.: TT's Docket No:0975-A41244-TW/FinaI/LukeLee 12 1339012 From low level to high level on time, transistor Ml is turned on, pulling the gate voltage of transistor M2 to voltage GND, thus letting the transistor M2 is turned on and the transistor M3 is not turned on, so that the output signal OUT is the voltage BOOT. Conversely, when the input voltage IN changes from a high level to a low level, the transistor M1 is non-conducting, and the voltage BOOT can be turned on via the resistor R1 to the gate of the transistor M3 to make the transistor M2 non-conducting, so the output signal OUT is a voltage. PHASE. While the present invention has been described above in terms of several embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1A shows a voltage level shifting circuit which can be used to connect two circuits having different voltage levels; FIG. 1B is a schematic diagram of voltage level conversion; FIG. 2 is an embodiment of the present invention, including a The voltage level shift circuit 200; Fig. 3 is a circuit configuration of Fig. 2; Fig. 4 is a signal waveform diagram of Fig. 2; Fig. 5 is another embodiment of the present invention, including a voltage level shift circuit 500; Fig. 6 is a circuit diagram of Fig. 5; and Fig. 7 is a schematic diagram of a signal waveform of Fig. 5.
Client's Docket No.: TT’s Docket No:0975-A41244-TW/Final/LukeLee 1339012 【主要元件符號說明】 102〜前級電路 106〜後級電路 104、200、500〜電壓位準偏移電路 202〜正回授電路 204、502〜比較器 206、504〜邏輯電路 208、210、506〜加速電路 M1-M20〜電晶體 INV1-INV4〜反相器 NR】〜反或閘 NA1〜反及閘Client's Docket No.: TT's Docket No: 0975-A41244-TW/Final/LukeLee 1339012 [Description of main component symbols] 102 to pre-stage circuit 106 to post-stage circuit 104, 200, 500 to voltage level shift circuit 202 to positive Feedback circuits 204, 502 to comparators 206, 504 to logic circuits 208, 210, 506 to acceleration circuits M1-M20 to transistors INV1 - INV4 to inverter NR] - reverse or gate NA1 - reverse gate
Rl、R2〜電阻Rl, R2 ~ resistance
Client^ Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 14Client^ Docket No.: TT's Docket No:0975-A41244-TW/Final/LukeLee 14
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TWI497915B (en) * | 2013-04-25 | 2015-08-21 | Ind Tech Res Inst | Level shifter circuit and operation method thereof |
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