1337261 九、發明說明： 【發明所屬之技術領域】 本發明有關於距離量測系統，特別有關一種距離量測 系統，其使用間接頻率進行距離量測並且具有較高的測 精度。 【先前技術】 隨著電子技術和半導體雷射器的發展，掌上型雷射相 位測距儀已經商品化’且廣泛地應用在建築、交通、地形 ，測與室内裝料方面。—般而言，測距儀係配備有發射 器用以發出雷射光束’並且於掌上型雷射相位測距儀中， 係主要用於可視光tt巾之光束，以便㈣對準量測點 物）。測距㈣建之接收H #由相較於發射 =接收到之光束間之時間差，即可求出與被測物= 虚量:會使用多個測尺’以便兼顧量測距離 ”里確度，然而這將會使系統變得 測距儀之小型化與低成本。 ⑬才准不利於 【發明内容】 本發明係提供_種距離量測系統 元，用以於-第—週期時，產生一 合成早 二調製信號，並於-第二週期時，產生；號以及一第 及-第四調製信號；—驅動單元一：二調製信號以 第-調製信號驅動—光發射 —罘週期時’根據 光束，並於第二週期時，^ 目軚物發出一第一 根據G㈣錢，_光發射1337261 IX. Description of the Invention: [Technical Field] The present invention relates to a distance measuring system, and more particularly to a distance measuring system that uses an indirect frequency for distance measurement and has a high measurement accuracy. [Prior Art] With the development of electronic technology and semiconductor lasers, handheld laser range finder has been commercialized and widely used in construction, transportation, terrain, measurement and interior charging. In general, the range finder is equipped with a transmitter for emitting a laser beam' and in a handheld laser phase range finder, it is mainly used for the beam of visible light tt towel, in order to (4) align the measuring point ). Ranging (4) The receiving H # is determined by the time difference between the transmitted and received beams, and the measured object = imaginary quantity: multiple measuring tapes are used to take into account the measurement distance. However, this will make the system become miniaturized and low-cost of the range finder. 13 is not conducive to the [invention] The present invention provides a distance measuring system element for generating a first-period Synthesizing the early two modulated signals, and generating a; and a first and fourth modulated signals in the second period; - driving unit one: the two modulated signals are driven by the first modulated signal - the light is emitted - the period is 'based on Beam, and in the second cycle, ^ 目 軚 emit a first according to G (four) money, _ light emission
07S7-A22085TWF(N2);£0106350；DENNIS 6 1337261 單凡’朝目標物發出一第二光束； 第一週期時，根據第制 “頻早7L ’用以於 m乐一 5周裂仏唬以及第一 物所反射之光束，產斗自1及#先束知、射到目標 ^ ^ ^ 屋生一弟一光混頻信號，並於第-调地 時，根據第四調製信號以及第 週期 之光束，產生—望_止0jt 尤束…射到目“物所反射 在-第一模十下：號；以及-處理單元，用以 在弟_式下根據一參考信號與第 計算出一第一相办¥# 乐九扎頻k唬， 二叶V 值且根據參考信號與第二光晃頻 i值之間：差相位差值’再根據第-、該第二相位 元，用以於系統’包括-頻率合成單 二調製信號，並於-第二週期時，產生—第弟 及一第四調製信號，其中第__、第二 —^衣^虎以 號分別具有-第—頻率、 :、第四調製信 第四頻率，並且第—、第4;弟三頻率以及一 三'第四調製信號之頻率差，而且第—、^差:專於弟 頻率差係相等於第二、第弟二调‘信號之 元’用以第-週期時，根據第一調製：^:驅動= 兀’朝-目標物發出一第一光束 第二，射： 第三調製信號，驅動光㈣+—,、弟一週期時，根據 束;-ί混頻單元’用以於第-週期時，根據:二= :及：「先束照射到目標物所反射之光束，產生一ί二 光混頻信號’並於第二週期時， 二弁走昭射&丨曰神仏 尿弟四5周製信號以及第 -先束』到目知物所反射之光束，產生―第二光混頻信 〇757-A22085TWF(N2)；E0106350：DENN!S η 1337261 宽以及一處理單元，用以根據一參考信號與第一光混頻 ，计异出一第一相位差值，並且根據參考信號與第二 湧彳°號，计异出一第二相位差值，再根據第一、第二 』位差值之間的差值，求出目標物與距離量測系統間之距 ::其中參考信號係由第一、第二調製信號混合而成，或 由第二、第四調製信號混合而成。 明站^讓本發明之上述和其他目的、特徵、和優點能更 >、/’’、丨重，下文特舉一較佳實施例，並配合所附圖示，作 詳細說明如下： 【實施方式】 一般而言，在相位式測距儀（距離量測 =率方式所決定之_鮮會直㈣應於敎 式子（1)所示。 λ 2/ :中，u為測尺長度，c為光速，f為調 ：) 而λ為對應測尺頻率之波長。 貝早 子(2)得出 再者，目標物與距離量測系統間之距離 )得出。 竹' J根據式 d-t … 其令，c為光速，f為調製頻率， f) 往返的飛行時間，而時間對應的相位變Γ離時 由此可知，調製（測尺)頻率f侖小，測 但量測精細度）就會比較大，也就愈長」 乂 反言07S7-A22085TWF(N2); £0106350; DENNIS 6 1337261 Single Fan ' emits a second beam toward the target; in the first cycle, according to the first system "frequency early 7L" for m-a 5-week split and The light beam reflected by the first object, the production of the bucket from the first and the first to know, shoot to the target ^ ^ ^ house to a younger brother - an optical mixing signal, and in the first - to adjust the ground, according to the fourth modulation signal and the first cycle The beam of light, produced - hope _ stop 0jt especially beam ... shot to the object "object reflected in - first die ten: number; and - processing unit, used in the brother _ based on a reference signal and the first calculated The first phase office ¥# 乐九扎频k唬, the two-leaf V value and according to the reference signal and the second light sway frequency i value: the difference phase difference ' is further used according to the first and second phase elements The system includes a frequency-synthesis single-modulation signal, and in the second period, generates a -different and a fourth modulation signal, wherein the __, the second-^^^^^^^^^^^^ Frequency, :, the fourth frequency of the fourth modulation signal, and the frequency difference between the first, fourth, third, and third 'fourth modulated signals, and -, ^ difference: special for the brother frequency difference is equal to the second, the second brother of the 'signal element' used in the first cycle, according to the first modulation: ^: drive = 兀 ' toward the target to issue a A beam second, shot: the third modulation signal, driving light (4) + -, when the first cycle, according to the beam; - ί mixing unit 'for the first cycle, according to: two = : and: "first The beam illuminates the beam reflected by the target, producing a λ2 light mixing signal' and in the second cycle, the second 弁 昭 射 & & & & & & & 四 四 四 四 四 四 四 四 四 四 到 到The light beam reflected by the object generates a "second optical mixing signal 757-A22085TWF (N2); E0106350: DENN!S η 1337261 width and a processing unit for mixing with the first light according to a reference signal, Calculating a first phase difference value, and calculating a second phase difference value according to the reference signal and the second surge 彳° number, and then calculating a difference between the first and second erroneous differences The distance between the target and the distance measuring system: wherein the reference signal is mixed by the first and second modulated signals, or by the second and fourth The above-mentioned and other objects, features, and advantages of the present invention are made more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> </ RTI> <RTIgt; The details are as follows: [Embodiment] In general, the phase range finder (distance measurement = rate method determines the _ fresh will straight (four) should be shown in the formula (1). λ 2 / : u is the length of the ruler, c is the speed of light, f is the tone:) and λ is the wavelength corresponding to the frequency of the ruler. Behrianzi (2) gives the distance between the target and the distance measurement system) Bamboo 'J according to the formula dt ... which makes c, the speed of light, f is the modulation frequency, f) the flight time of the round-trip, and the phase corresponding to the time is changed, so that the modulation (meter) frequency f is small, The measured but the fineness of the measurement will be relatively large, and the longer it will be.
〇757-A22085TWF(N2)；E〇1〇6350；DENN!S 1337261 ΐ 製（測尺)解f愈大，量測精度（刻度）就會比較‘ 仁測尺長度U就愈短，即所能量測的距離較短。 、 假設分別使用兩個調製頻率fl肖f2量測 可以彳于到相應之相位差々與。 X /, X £) ’、〇757-A22085TWF(N2);E〇1〇6350;DENN!S 1337261 愈(Measurement) The larger the solution f, the higher the measurement accuracy (scale). The shorter the length of the metric ruler, the lower the The distance measured by the energy is short. It is assumed that the two modulation frequencies fl xiao f2 can be used to measure the phase difference 々. X /, X £) ’,
D φ\ c φι :4πχ/2Χ£» c c fs M/I-/2) 饭设調製頻率&與&之差頻為一 並w—ϋ則式子⑹可改寫為: η — C ώ\ — /h、 Λ 上一 =—--Φ^-ψΐ ^(/'-/s) 2π 2f/^ = Usx^ + ^) (3) (4) (5) (6) 間接調製（測尺）頻率 其中，us可視為一間接測尺長度，n () 的週期數，而為間接、;^ # # S '、彳尺長度 度^ —週期的部分。 由此可知，對同一段距離而言， f2分別測得的相位差之差值知 们调衣頻率fi與 與f2之差頻fS所測得之相位差^ Ή個調製頻率fl 行距提供—種㈣量㈣統，其❹間接頻率進 仃距離1翁且具有較高_量精度。 阳貝丰進 第】圖係為本發明之距離量挪 所示，距離量測系統】〇〇A包括 7例:：圖 成單元2〇、一驅動單元3〇、光 早^、一頻率合 元、渡波單元_〜BPF2以及f 、，混頻單 電阻R1與R2係作為限電流之用。】〜R2。舉例而言，D φ\ c φι :4πχ/2Χ£» cc fs M/I-/2) The modulation frequency of the rice setting & and the difference frequency of & is w-ϋ The equation (6) can be rewritten as: η — C ώ \ — /h, 上 Previous=—--Φ^-ψΐ ^(/'-/s) 2π 2f/^ = Usx^ + ^) (3) (4) (5) (6) Indirect modulation (measurement In the frequency), us can be regarded as an indirect scale length, the number of cycles of n (), and indirect, ; ^ # # S ', length of the ruler ^ - part of the cycle. It can be seen that for the same distance, the difference of the phase difference measured by f2 is known as the phase difference between the frequency of the dressing fi and the difference frequency fS of f2. (4) The quantity (four) system, the indirect frequency of the indirect frequency is 1 ton and has a high _ quantity accuracy. Yangbei Fengjin's diagram is the distance measurement of the invention. The distance measurement system】〇〇A includes 7 cases:: picture unit 2〇, one drive unit 3〇, light early ^, one frequency combination The element, the wave unit _~BPF2 and f, and the mixed single resistors R1 and R2 are used as current limiting. 】~R2. For example,
0757-A22085TWF(N2)；E0106350；〇ENNIS '1337261 頻率合成單元20係耦接處理單元1 〇，用以根據來自 處理單元10之控制信號SC，於第一週期時，產生調製信 號SM1與SL1，並且於第二週期時’產生調製信號SM2 與 SL2 〇 於此實施例，調製信號SMI、SL1、SM2與SL2之頻 率係分別為 99.995MHz、100MHz、94.995MHz 與 95MHz， 調製信號SM1與SL1之頻率差會等於調製信號SM2與SL2 之頻率差（100M-99.995M=95M-94.995M=5KHz)。再者，調 製信號SMI、SM2之頻率差亦會等於調製信號SL1、SL2 之頻率差（100M-95M=99.995M-94.995M=5MHz)。舉例而 言’頻率合成單元20係可由一個或多個時脈產生器及/或 相位鎖回路(PLL)所構成，但不限定於此。 除此之外，頻率合成單元20於第一週期時，將調製信 號SM1與SL1進行混頻，作為一參考信號SR，並且於第 二週期時，將調製信號SM2與SL2進行混頻，作為該參考 信號SR，其中參考信號SR的頻率係為調製信號SM1與 SL1之頻率差和調製信號SM2與SL2之頻率差（即5KHz)， 但不限定於此。舉例而言，調製信號SMI、SL1、SM2與 SL2的頻率通常係設置於100MHz〜400MHz，而參考信號 SR的頻率則根據測量距離的要求而設置，並且與系統的解 析度（鑑相能力）有關，通常為調製信號SMI、SL1、SM2 與SL2之頻率的幾十分之一。 驅動單元30用以根據頻率合成單元20產生之調製信 號，驅動光發射單元40朝向目標物200發出光束。於本實 0757-A22085TWF(N2):E0106350；DENNIS 10 1337261 施例中，光發射單元40係為一雷射二極體（laser diode)具 有一陽極耦接驅動單元30以及一陰極藉由電阻R1耦接至 一接地端。 舉例而言，於第一週期時，驅動單元30根據調製信號 SM卜驅動光發射單元40朝目標物200發出具有調製信號 SM1之頻率的光束S1，而光束S1照射到目標物200所產 生之反射光束S1”輸入至光混頻單元50。於第二週期時， 驅動單元30根據調製信號SM2，驅動光發射單元40朝目 ® 標物200發出具有調製信號SM2之頻率的光束S2，而光 束S2照射到目標物200所產生之反射光束S2”輸入至光混 頻單元50。 光混頻單元50，用以接收目標物200所反射之光束與 一調製信號，用以產生對應之光混頻信號。舉例而言，於 第一週期時，光混頻單元50係接收目標物200所反射之光 束S1”與調製信號SL1，用以產生一光混頻信號S3。於第 二週期時，光混頻單元50係接收目標物200所反射之光束 S2”與調製信號SL2，用以產生一光混頻信號S4。 舉例而言，光混頻單元50係為一崩潰光電二極體 (APD)，但不限定於此。於此實施例中，光混頻單元50係 耦接於反向偏壓VB與濾波單元BPF2之間，並具有一陽極 耦接濾波單元BPF2以及一陰極耦接電阻R2與耦合單元 60。耦合單元60係用以分別於第一、第二週期時，將頻率 合成單元20所產生之調製信號SL1、SL2耦合至光混頻單 元50之陰極。舉例而言，耦合單元60係可由電容電路所0 。 。 。 。 。 。 。 。 。 。 。 。 And generating the modulated signals SM2 and SL2 in the second period. In this embodiment, the frequency of the modulated signals SMI, SL1, SM2, and SL2 are 99.995 MHz, 100 MHz, 94.995 MHz, and 95 MHz, respectively, and the frequencies of the modulated signals SM1 and SL1. The difference is equal to the frequency difference between the modulation signals SM2 and SL2 (100M-99.995M=95M-94.995M=5KHz). Furthermore, the frequency difference between the modulation signals SMI and SM2 is also equal to the frequency difference of the modulation signals SL1, SL2 (100M - 95M = 99.995 M - 94.995 M = 5 MHz). For example, the frequency synthesizing unit 20 may be constituted by one or more clock generators and/or phase lock loops (PLLs), but is not limited thereto. In addition, the frequency synthesizing unit 20 mixes the modulated signals SM1 and SL1 as a reference signal SR in the first period, and mixes the modulated signals SM2 and SL2 in the second period as the The reference signal SR, wherein the frequency of the reference signal SR is the frequency difference between the modulation signals SM1 and SL1 and the frequency difference between the modulation signals SM2 and SL2 (ie, 5 KHz), is not limited thereto. For example, the frequencies of the modulation signals SMI, SL1, SM2, and SL2 are usually set at 100 MHz to 400 MHz, and the frequency of the reference signal SR is set according to the requirements of the measurement distance, and is related to the resolution (phase discrimination capability) of the system. It is usually a fraction of the frequency of the modulation signals SMI, SL1, SM2 and SL2. The driving unit 30 is configured to drive the light emitting unit 40 to emit a light beam toward the object 200 according to the modulation signal generated by the frequency synthesizing unit 20. In the embodiment of the present invention, the light emitting unit 40 is a laser diode having an anode coupling driving unit 30 and a cathode through a resistor R1. Coupling to a ground terminal. For example, in the first cycle, the driving unit 30 drives the light emitting unit 40 to emit the light beam S1 having the frequency of the modulation signal SM1 toward the target 200 according to the modulation signal SM, and the light beam S1 is irradiated to the reflection generated by the target 200. The light beam S1" is input to the optical mixing unit 50. During the second period, the driving unit 30 drives the light emitting unit 40 to emit a light beam S2 having a frequency of the modulation signal SM2 toward the target object 200 according to the modulation signal SM2, and the light beam S2 The reflected light beam S2" generated by the irradiation of the object 200 is input to the optical mixing unit 50. The optical mixing unit 50 is configured to receive the light beam reflected by the target object 200 and a modulated signal for generating a corresponding optical mixing signal. For example, in the first cycle, the optical mixing unit 50 receives the light beam S1" reflected by the target 200 and the modulation signal SL1 for generating an optical mixing signal S3. In the second cycle, the optical mixing The unit 50 receives the light beam S2" reflected by the target 200 and the modulation signal SL2 for generating an optical mixing signal S4. For example, the optical mixing unit 50 is a crash photodiode (APD), but is not limited thereto. In this embodiment, the optical mixing unit 50 is coupled between the reverse bias voltage VB and the filtering unit BPF2, and has an anode coupling filter unit BPF2 and a cathode coupling resistor R2 and a coupling unit 60. The coupling unit 60 is operative to couple the modulation signals SL1, SL2 generated by the frequency synthesizing unit 20 to the cathode of the optical mixing unit 50 during the first and second periods, respectively. For example, the coupling unit 60 can be configured by a capacitor circuit.
〇757-A22085TWF(N2)：E0106350；DENNIS 1337261 構成’但不限定於此。 濾波單元BPF1係耗接於頻率合成單元2〇食處理… 之間，用以滤除參考錢SR令之雜訊，並 = 认”’而濾波單元BPF2 _接光混頻單元％ = 光混頻信號S3與84中之雜訊，並輸出錢心 例而言，濾波單元BPF2係用以γ ψ目女4 / 、 牛 S3”盘S4”，並m — 1 乂传出具有相位訊息之信號 :理二】f 、卿2係可為帶通據波器。 ::70 〇’用以根據信號S3，，與S4，，進行相 异’以求出距離量測系統100與目標物間之距離j 例而言，用以在-第-模式下時，處理單元 二 SR’’’與錢S3”，計算出―第-相位差值，並且根據該= w S4” ’計算出—第二相位差值，再根據第一、 弟-目位差值之間的差值，求出目標物200與距離量測系 統100間之距離。在某些實施例中，處理單元1〇係於一第 二模式下，«㈣-純差值或第二相位差值:、直接求 出目標物200與距離量測系統1〇〇間之距離。 ,再者’處理單tl 10係、可為一數位信號處理器（出幽 signal prow，DSP) ’並且處理單幻q與遽波單元BpF】 與，BPF2之間係可設置類比數位轉換單元，用以將來自濾 波單兀BPF1與BPF2之信號S3”與S4”，轉換成數位信號 以便處理單元K)進行相位差計算，以求出距離量測系統 100與目標物200間之距離估算值。 第2圖係為本發明之距離量測系統之一實施例。如圖 所示’距離量測系統】_係與第】圖中所示者相似，除 0757-A22085TWF(N2)；E〇1〇6350；OENNIS 12 1337261 了電混頻單元70A用以於第一週期時，對調製信號SMI 與SL1進行混頻，以便產生參考信號SR，並且於第二週期 時，對調製信號SM2、SL2進行混頻，以便產生參考信號 SR。舉例而言，電混頻單元70A係為一混波器，但不限定 於此，濾波單元BPF1係耦接於電混頻單元70A與處理單 元10之間，用以濾除參考信號SR中之雜訊，並輸出信號 SR”。處理單元10、頻率合成單元20、驅動單元30、光發 射單元40、光混頻單元50、濾波單元BPF2以及電阻RJ〜R2 ® 之動作與連接關係與第1圖所示之距離量測系統100A相 似，於此不再累述。 第3圖係為本發明之距離量測系統之一實施例。如圖 • 所示，距離量測系統100C係與第1圖中所示者相似，除 . 了電混頻單元70B耦接於濾波單元BPF2與調製信號 SL1、SMI、SM2與SL2之間。於此實施例中，電混頻單 元70B具有一第一輸入端藉由電容C1與電阻R4耦接至光 ▲ 發射單元40之陰極、一第二輸入端藉由電容C2、C3與電 阻R3耦接至光混頻單元50之陰極，以及一輸出端耦接濾 波單元BPF2。電混頻單元70B用以於第一週期時，對調 製信號SM1與SL1進行混頻，以便產生參考信號SR，並 且於第二週期時，對調製信號SM2、SL2進行混頻，以便 產生參考信號SR。 於某些實施例中，電混頻單元70B之第一輸入端亦可 藉由電容C1與電阻R4耦接至光發射單元40之陽極。舉 例而言，電混頻單元70係為一混波器，但不限定於此。處〇 757-A22085TWF(N2): E0106350; DENNIS 1337261 constitutes 'but is not limited thereto. The filtering unit BPF1 is consumed between the frequency synthesizing unit 2 foraging processing... to filter out the noise of the reference money SR, and = "" and the filtering unit BPF2 _ light mixing unit % = optical mixing For the noise in signals S3 and 84, and for the output of the money, for example, the filtering unit BPF2 is used for the gamma female 4 / , the cow S3 "disk S4", and m - 1 乂 transmits a signal with a phase message: 2, f, Qing 2 can be a bandpass. ::70 〇' is used to determine the distance between the distance measurement system 100 and the target based on the signal S3, and S4. For example, in the case of the -first mode, the processing unit two SR''' and the money S3" calculate the "first-phase difference value, and calculate the second phase according to the = w S4" ' The difference, and then the distance between the target object 200 and the distance measuring system 100 is obtained according to the difference between the first and second-directed position differences. In some embodiments, the processing unit 1 is tied to the first In the second mode, «(4)-pure difference or second phase difference: directly find the distance between the target 200 and the distance measuring system 1 ,, and then 'process single tl 1 0 system, can be a digital signal processor (signal prow, DSP) 'and handle single magic q and chopping unit BpF】 and BPF2 can be set analog to digital conversion unit, used to be from the filter unit The signals S3" and S4" of BPF1 and BPF2 are converted into digital signals for processing unit K) to perform phase difference calculation to obtain an estimated distance between distance measuring system 100 and target 200. Fig. 2 is a view of the present invention An example of the distance measuring system. As shown in the figure, the 'distance measuring system _ is similar to the one shown in the figure, except 0757-A22085TWF(N2); E〇1〇6350; OENNIS 12 1337261 The electric mixing unit 70A is configured to mix the modulated signals SMI and SL1 to generate the reference signal SR in the first cycle, and mix the modulated signals SM2 and SL2 in the second cycle to generate the reference signal. For example, the electric mixing unit 70A is a mixer, but is not limited thereto. The filtering unit BPF1 is coupled between the electric mixing unit 70A and the processing unit 10 to filter the reference signal SR. The noise in the middle, and the output signal SR". The operation and connection relationship between the processing unit 10, the frequency synthesizing unit 20, the driving unit 30, the light emitting unit 40, the optical mixing unit 50, the filtering unit BPF2, and the resistors RJ to R2 ® and the distance measuring system 100A shown in Fig. 1 Similar, no longer described here. Figure 3 is an embodiment of the distance measuring system of the present invention. As shown in Fig., the distance measuring system 100C is similar to that shown in Fig. 1, except that the electric mixing unit 70B is coupled between the filtering unit BPF2 and the modulation signals SL1, SMI, SM2 and SL2. In this embodiment, the electric mixing unit 70B has a first input coupled to the cathode of the light emitting unit 40 via a capacitor C1 and a resistor R4, and a second input coupled to the resistor R3 via capacitors C2 and C3. Connected to the cathode of the optical mixing unit 50, and an output coupled to the filtering unit BPF2. The electric mixing unit 70B is configured to mix the modulated signals SM1 and SL1 to generate the reference signal SR in the first cycle, and to mix the modulated signals SM2 and SL2 in the second cycle to generate the reference signal. SR. In some embodiments, the first input of the electric mixing unit 70B can also be coupled to the anode of the light emitting unit 40 by a capacitor C1 and a resistor R4. For example, the electric mixing unit 70 is a mixer, but is not limited thereto. At
0757-A22085TWF(N2)；E0106350；DENNIS 1337261 理單7010 L頻率合成單元20、驅動單元30、光發射單元 40、光混頻早元50、渡波單元BpF卜BpF2以及電阻幻 之動作與連接關係與第]圖所示之距離量測系統]〇 似’於此不再累述。 仰 由於調製信號SL1、SM卜SL2與SM2具有相近的頻 率，所以不需要像習知直接頻率源那樣設計不同之耗合雷 路來配σ夕個測尺，因此大幅地簡化系統架構。再者 使用的兩組調製信號SL1與湖以及似與§Μ2之頻率 相差不多’遽波單元咖與聊2之頻寬可設計地更窄， 以便降低信號的衰減與信號雜訊，使得系統的信號雜訊比 與糸統的精度都會因而提高。 本發明亦揭露—種距離量測方法，其動作可參考第i 圖說明如下。 。首先’於第-週期時，頻率合成單元2〇係產生調製信 说SM1與SL1。接著’驅動單元3〇根據調製信號卜 ·，動光發射單元40 ’朝目標物200發出光束S1，而光混頻 單元50係根據调製^虎su以及該光束^經由該目標物 2。。00所反射之光束Sl”，產生一第一光混頻信號幻。淚波 早兀BPF1係渡除—參考信號SR中之雜訊，並輸出信號 犯，，並且處理單元1G係根據一信號SR，，與第—光混頻信 唬S3彳介出一第—相位差值。舉例而言，調製信號挪 與SU之頻率係分別為99.995MHz與100MHz。 於第二，期時’頻率合成料如係產生調製信號SM2 ^ SL2接著’驅動單元30根據調製信號SM2，驅動光發0757-A22085TWF(N2); E0106350; DENNIS 1337261 Bill 7010 L frequency synthesizing unit 20, driving unit 30, light emitting unit 40, optical mixing early 50, wave unit BpF b BpF2 and resistance phantom action and connection relationship The distance measurement system shown in the figure] is similar to this. Since the modulation signals SL1, SMb, and SL2 have similar frequencies, it is not necessary to design different consumables like the conventional direct frequency source to match the scales, thereby greatly simplifying the system architecture. In addition, the two sets of modulation signals SL1 and the lake are similar to the frequency of § Μ 2, and the bandwidth of the chopper unit can be designed to be narrower, so as to reduce signal attenuation and signal noise, so that the system The signal noise ratio and the accuracy of the system are thus improved. The invention also discloses a distance measuring method, and the action thereof can be explained as follows with reference to the i-th figure. . First, at the first cycle, the frequency synthesizing unit 2 generates modulation signals SM1 and SL1. Then, the driving unit 3 发出 emits the light beam S1 toward the object 200 according to the modulation signal, and the optical mixing unit 50 passes the object 2 according to the modulation and the light beam. . The light beam S1" reflected by 00 generates a first light mixing signal illusion. The tear wave is early as the BPF1 system removes the noise in the reference signal SR, and outputs a signal, and the processing unit 1G is based on a signal SR. And, the first-phase difference value is compared with the first-light mixing signal S3. For example, the frequency of the modulation signal and the SU are 99.995 MHz and 100 MHz, respectively. If the modulation signal SM2 ^ SL2 is generated, then the 'drive unit 30 drives the light according to the modulation signal SM2.
0757-A22085TWF(N2)：E0106350；DENNlS 1-337261 射單元40，朝目標物200發出光束S2，而光混頻單元50 係根據調製信號SL2以及該光束S2經由該目標物200所 反射之光束S2”，產生一第二光混頻信號S4。然後，處理 單元10係根據信號SR”與第二光混頻信號S4，計算出一 第二相位差值。舉例而言，調製信號SM2與SL2之頻率係 分別為 94.995MHz 與 95MHz。 調製信號SM1與SL]之頻率差會等於調製信號SM2 與 SL2 之頻率差（100M-99.995M=95M-94.995M=5KHz)，並 • 且調製信號SM1與SM2之頻率差亦會等於調製信號SL1 與 SM2 之頻率差（100M-95M=99.995M-94.995M=5MHz)。 此外，調製信號SMI、SL1、SM2與SL2的頻率通常係設 置於100MHz〜400MHz ’而參考信號SR的頻率則根據測量 距離的要求而設置’並且與系統的解析度（鑑相能力）有 關，通常為調製信號SMI、SL1、SM2與SL2之頻率的幾 十分之一。 俸 除此之外，頻率合成單元20更於第一週期時，將調製 t號SM1與SL1進行混頻，作為參考信號sr，並且於第 二週期時，將調製信號SM2與SL2進行混頻，作為參考信 號SR ’其中參考#號SR的頻率係為調製信號smi與SL1 之頻率差和調製信號SM2與SL2之頻率差（即5KHz)，但 不限定於此。舉例而言，參考信號SR亦可藉由一電混頻 單元，於第一週期時將調製信號SM1與su號進行混頻而 求得，且將於第二週期時，將調製信號SM2與SL2進行混 頻而求得。 0757-A22085TWF(N2)；E01〇6350；DENNIS 15 1337261 之後，處理單元10係根據第一週期與第二週期中所得 出之第一、第二相位差值之間的差值，求出目標物200與 距離量測系統100A/100B/100C間之距離。於某些實施例 中，處理單元10亦可直接根據第一相位差值或第二相位差 值直接求出目標物200與距離量測系統100A/100B/100C 間之距離。 或者是說，可先經由濾波單元BPF2濾除光混頻信號 S3與S4中之雜訊，並輸出信號S3”與S4”，再經由類比數 ^ 位轉換器（ADC)轉換成數位信號，以便處理單元10進行相 位差計算。換言之，處理單元10係根據信號SR”與信號 S3”與S4”，計算出第一、第二相位差值。 雖然本發明已以較佳實施例揭露如上，然其並非用以 限定本發明，任何熟知技藝者，在不脫離本發明之精神和 範圍内，當可作些許更動與潤飾，因此本發明之保護範圍 當視後附之申請專利範圍所界定者為準。 0757-A22085TWF(N2)：E0106350；DENNIS 16 1-337261 【圖式簡單說明】 第1圖係為本發明中距離量測系統之一實施例。 第2圖係為本發明中距離量測系統之另一實施例。 第3圖係為本發明中距離量測系統之另一實施例。 【主要元件符號說明】 10 :處理單元； 20 :頻率合成單元； 30 :驅動單元； 40 :光發射單元； 50 :光混頻單元； 60 :耦合單元； 70A、70B :電混頻單元； 100A〜100C :距離量測系統； 200 :目標物； BPF1〜BPF3 :濾波單元； R1〜R4 :電阻； C1〜C3 :電容； SL1、SL2、SMI、SM2 :調製信號； SI、S2、SI，，、S2，，：光束； S3、S4 :光混頻信號； SR :參考信號； CS :控制信號； S3”、S4”、SR” ：信號； VB :反向偏壓。0757-A22085TWF(N2): E0106350; DENNlS 1-337261 firing unit 40 emits a light beam S2 toward the object 200, and the optical mixing unit 50 is based on the modulated signal SL2 and the light beam S2 reflected by the target 200 through the target 200. A second optical mixing signal S4 is generated. Then, the processing unit 10 calculates a second phase difference value based on the signal SR" and the second optical mixing signal S4. For example, the frequency of the modulation signals SM2 and SL2 are 94.995 MHz and 95 MHz, respectively. The frequency difference between the modulation signals SM1 and SL] is equal to the frequency difference between the modulation signals SM2 and SL2 (100M-99.995M=95M-94.995M=5KHz), and the frequency difference between the modulation signals SM1 and SM2 is also equal to the modulation signal SL1. The frequency difference from SM2 (100M-95M=99.995M-94.995M=5MHz). In addition, the frequencies of the modulation signals SMI, SL1, SM2, and SL2 are usually set at 100 MHz to 400 MHz' and the frequency of the reference signal SR is set according to the requirements of the measurement distance' and is related to the resolution (phase discrimination capability) of the system, usually It is one-tenth of the frequency of the modulation signals SMI, SL1, SM2 and SL2. In addition, the frequency synthesizing unit 20 mixes the modulation t number SM1 and SL1 as the reference signal sr in the first period, and mixes the modulation signals SM2 and SL2 in the second period. The frequency of the reference signal SR' where the reference #SR is the frequency difference between the modulation signals smi and SL1 and the frequency difference between the modulation signals SM2 and SL2 (i.e., 5 kHz) is not limited thereto. For example, the reference signal SR can also be obtained by mixing the modulation signal SM1 and the su number in the first period by an electric mixing unit, and the modulation signals SM2 and SL2 will be used in the second period. Calculated by mixing. 0757-A22085TWF(N2); E01〇6350; DENNIS 15 1337261, the processing unit 10 obtains the target according to the difference between the first period and the second phase difference obtained in the first period and the second period. The distance between 200 and the distance measuring system 100A/100B/100C. In some embodiments, processing unit 10 may also directly determine the distance between target 200 and distance measurement system 100A/100B/100C based directly on the first phase difference value or the second phase difference value. In other words, the noise in the optical mixing signals S3 and S4 can be filtered out through the filtering unit BPF2, and the signals S3" and S4" are outputted, and then converted into digital signals by an analog-to-digital converter (ADC), so that The processing unit 10 performs phase difference calculation. In other words, the processing unit 10 calculates the first and second phase difference values according to the signal SR" and the signals S3" and S4". Although the invention has been disclosed above in the preferred embodiment, it is not intended to limit the invention. The scope of protection of the present invention is defined by the scope of the appended claims, and the scope of the invention is defined by the scope of the appended claims. :E0106350; DENNIS 16 1-337261 [Simplified Schematic Description] Fig. 1 is an embodiment of the distance measuring system of the present invention. Fig. 2 is another embodiment of the distance measuring system of the present invention. 3 is another embodiment of the distance measuring system of the present invention. [Description of main component symbols] 10: processing unit; 20: frequency synthesizing unit; 30: driving unit; 40: light emitting unit; 50: optical mixing Unit 60; coupling unit; 70A, 70B: electric mixing unit; 100A~100C: distance measuring system; 200: target; BPF1~BPF3: filtering unit; R1~R4: resistance; C1~C3: capacitance; SL1 , SL2, SMI, SM2: Modulation No.; SI, S2, SI,,, S2,,: beam; S3, S4: optical mixing signal; SR: reference signal; CS: control signal; S3", S4", SR": signal; VB: reverse bias.
〇757-A22085TWF(N2)；E0106350；DENNIS〇757-A22085TWF(N2);E0106350;DENNIS