TWI293014B - - Google Patents
Download PDFInfo
- Publication number
- TWI293014B TWI293014B TW94138167A TW94138167A TWI293014B TW I293014 B TWI293014 B TW I293014B TW 94138167 A TW94138167 A TW 94138167A TW 94138167 A TW94138167 A TW 94138167A TW I293014 B TWI293014 B TW I293014B
- Authority
- TW
- Taiwan
- Prior art keywords
- electronic
- seat
- scope
- probe card
- electrical
- Prior art date
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Description
1293014 九、發明說明: 【發明所屬之技術領域】 種便於更換電 子 本發明係與探針卡有關,特別是指 零件之探針卡。 曰 51293014 IX. Description of the invention: [Technical field to which the invention pertains] A convenient replacement of the invention The present invention relates to a probe card, and in particular to a probe card for a part.曰 5
15 【先前技術】 習用探針卡上之電子零件如電阻 (passive)元件,係轉接方式將其導 等破動 固設於電路板上,容易因銲接或金屬引腳 到高溫的影響,因而改變元中其他元件受 探針卡的電性偏移,使探 準確性及可靠度(reHability)。 “失去應有的 耗而探針卡於長相使⑽也相為電路中的敎、、肖 ;而使溫度升高’因此經過多次量測使用後難免以: 同;,針卡用以電性量測時失去: ϊί 般^探針卡量測電子元件時, —皿度條件下的電測操作,往往 电几件於咼、低溫或高電壓、電流 至 也運作於惡劣的測試條件下,大幅縮減 Ρ亥二電子零件之耐用壽命(lifetime),因此探針卡上之 :零件需時常更新以維持制應有的準確性;然更換電】 =之方式除了重新置換整健針卡之外,則將鮮接於探 十Ϊ上之?子零件先解銲再重新銲上新的零件,不但同樣 面上述南溫鲜接的缺點,且重銲的作業費時又不具可靠 20 1293014 性。 【發明内容】 树明之主要目的乃在於提供 玉子令件之探針卡,不^逮更換15 [Prior Art] The electronic components on the probe card, such as the passive components, are connected to the circuit board by the transfer method, which is easy to be affected by soldering or metal pins to high temperature. The other components in the change element are electrically offset by the probe card to make the accuracy and reliability (reHability). "The loss of the proper consumption and the probe stuck in the phase makes (10) also the 敎, 肖 in the circuit; and the temperature rises. Therefore, after multiple measurements, it is inevitable to: Loss during sex measurement: ϊί When the probe card is used to measure electronic components, the electrical measurement operation under the condition of the dish is often operated in a few test conditions under low temperature or high voltage and current. , greatly reducing the durability of the electronic components of the Ρ海二, so the probe card: the parts need to be updated frequently to maintain the accuracy of the system; then replace the electricity = = way in addition to re-displace the whole needle card In addition, the sub-parts that are freshly attached to the scorpion are first desoldered and re-welded to new parts, not only the shortcomings of the above-mentioned south-temperature fresh joints, but also the re-welding operations are time-consuming and unreliable 20 1293014. [Summary of the Invention] The main purpose of Shuming is to provide a probe card for the jade piece, which is not to be replaced.
15 換新’且減少高溫鮮接對上=件之汰舊 之電測品質。 如十卡之以,進而維持探針卡 件之之λ—^的乃在於提供—種可快速更換電子零 熱桃功率^而可延長電子零件之咖壽命。電路的 為達成前揭目的’本發_提供—種可快速更換 :置iH’包括有—電路板、複數健針以及複數個 ^置座’该電路板佈設有電子電路並具有複數細以連接被 。70件之躲節點;該些探針為電性連接於該電子電路,該 探針卡藉由該些探針對制元件做電性制;各該容置座= 有-具導電性之固接件,分職於上述之電性節點上,各該 谷置座开>成有一谷置部與至少一開口,該容置部可用以容置上 述之被動元件,使各該被動元件與所對應之二該固接件為電性 導通,透過該開口可換置各該被動元件。 【實施方式】 以下,茲配合圖示列舉若干較佳實施例,用以對本 發明之結構與功效作詳細說明,其中所用圖示之簡要說 明如下: 5 20 1293014 請參閱第一圖所示本發明所提供之第一較佳實施例, 為一探針卡1之裝置示意圖,具有一電路板1〇、多數個探 針20、多數個容置座30以及各該容置座3〇中所設置之各 5 電子零件40,其中: ° 該電路板10係佈設有電子電路11,該電子電路π之 ,局(layout)有多個電性節點110,用以電性連接電阻、電 各或電感等任一被動元件。 合琢棟針20係包括有一座體21以及一針頭22,該電 10子電路11透過各座體21電氣連接於針頭22,使該探^卡 ^可將各該針頭22與待測元件(圖中未示)接觸,並藉由該 电,电路11與量測用機台(圖中未示)相電氣連接,因此 對該待測元件做電性量測。 15 各該谷置座30為對應設置於相鄰二該電性節點 ί門:=相1之二固接件3卜一底座32、-上蓋33以及 抵成之一谷置部34,第二圖參照,且該上蓋33為可 Ρ^之結構,使_容置部34±方具有—開σ 3 並较無,錢電子零 八懸欠1 件,具有用以傳導電性的二接點41, :座3'0 接觸以作電性連接,以下係針對該容 ^ 、·、〇功月b結構做更進一步之描述: 作為連接該:::==金屬材料’並以該底座32 20 1293014 31由下而上分別設有一連接部31〇、一箝制部312以及一卡 各該連接部310用以銲接於上述之各該電性節點110,15 Renewed' and reduced the quality of the high-temperature fresh joints. For example, if the ten-card is used, the λ-^ of the probe card is maintained to provide a quick replacement of the electronic zero-peach power and to extend the life of the electronic component. The circuit is provided for the purpose of the present invention. The present invention provides a quick replacement: the iH' includes a circuit board, a plurality of pins, and a plurality of sockets. The circuit board is provided with an electronic circuit and has a plurality of fine connections. Be. 70 pieces of occlusion nodes; the probes are electrically connected to the electronic circuit, and the probe card is electrically made by the probes; each of the accommodating seats has a conductive connection a part of the electrical node, each of the valleys is opened and has a valley portion and at least one opening, the receiving portion can be used to accommodate the passive components, so that the passive components Correspondingly, the fixing member is electrically conductive, and each of the passive components can be replaced through the opening. [Embodiment] Hereinafter, a number of preferred embodiments will be described in conjunction with the drawings for a detailed description of the structure and function of the present invention, wherein the brief description of the drawings is as follows: 5 20 1293014 Please refer to the invention shown in the first figure. The first preferred embodiment is a schematic diagram of a probe card 1 having a circuit board 1 , a plurality of probes 20 , a plurality of receptacles 30 , and a plurality of receptacles 3 . Each of the five electronic components 40, wherein: the circuit board 10 is provided with an electronic circuit 11, the electronic circuit π, the layout has a plurality of electrical nodes 110 for electrically connecting the resistors, the electric or the inductors Wait for any passive component. The joint pin 20 includes a body 21 and a needle 22, and the electric sub-circuit 11 is electrically connected to the needle 22 through the respective bases 21, so that the probe 22 can connect each of the needles 22 with the component to be tested ( The contact is not shown in the figure, and by the electric power, the circuit 11 is electrically connected to the measuring machine (not shown), so that the component to be tested is electrically measured. 15 each of the valleys 30 is correspondingly disposed on the adjacent two of the electrical nodes ί: = phase 1 two fixed members 3 a base 32, - upper cover 33 and a valley portion 34, second Referring to the figure, and the upper cover 33 is of a structure, the _ accommodating portion 34± has an open σ 3 and is relatively absent, and the money electron is suspended by one, and has two contacts for conducting electrical properties. 41, : seat 3'0 contact for electrical connection, the following is a further description of the structure of the capacity ^, ·, 〇功月 b: as the connection:::==metal material 'and the base 32 20 1293014 31 is provided with a connecting portion 31 〇, a clamping portion 312 and a card connecting portion 310 for soldering to each of the electrical nodes 110 described above.
15 ίΐΙΓ 31ί為以_狀之結構相對設置,可用以箝制各該 】;40 ’该上盍33並有二套孔331可分別對應於各該卡 而相套^,使該二固接件31相對固定而避免因金屬受 力辟發生形㈣致f子料4G觀,該上蓋幻同樣 而/、不使该二固接件31相互電性短路之特性。 因,將各_接件31之連接部銲接於電子電路u =性亂點110,使各該容置座3〇固設於電_ 1〇上,再將 之:令件4G置人容置部34 ’則可藉由二111接件31 =屬=特性’使該電子零件4G與該電子電路u為電性 料卡1電性制之拥;由於各電子零件 、.工直鱗接的轉影響,可雜其電性 31 w性之連接方式,較之謂 導線路連接’具有更大的電性傳導面積可降低電流傳 功ί 生電性阻抗,耻減少整體電路板1G的熱消耗 使用狀能士1用大面積範圍的金屬散熱作用,可輔助電路板10 而當該ΐΐϊ散熱,、進崎長各該電子零件4G之耐用壽命; 卜^衣· 1經過長時間使用或做過高溫高壓等衝擊性 =t欲更換部分之該電子零件40時,則將容置座30之 反^31,料_件31❸轉311触細近稍微施以 部34之空間,因此可輕易自開口 子零件40,_、電子零件40,重新置入電性穩定正常之電 " ,同樣不須經過銲接的高溫影響,以使該探針卡1 20 1293014 維持準確之電性量測。 如第二圖係本發明第二較佳實施例所示之容置座50,其 異於第-較佳實施例巾容置座3〇之各·件Μ以連接部 310直接銲接於電性節點11〇之設計,先將一插座%銲接於 電性節點110,各固接件31改採為以一插接部313插設於一 插座36上,由於該插座36同為具導電性之金屬材料,故 亦可使電子零件40與電性節點11〇為電性導通,如此不但電 子零件40可方便替換,因此本實施例除了插座%外其餘 令件亦可替換更新’使更能有效達成本發明之目的。 15 如第四圖係本發明第三較佳實施例所示之容置座51,其 中原先各固接件31係改為—彈片314,該彈片314侧邊同 樣有凹凸狀之箝制結構可使固定電子零件4〇,且藉由彈片 3M可伸縮之雜使容置部34之^間隨電子零件4g大小變 7而能有效固定電子零件40以避免鬆脫,£能有效達成本 毛明之目的,如第五圖係本發明第四較佳實施例,其不同於 j實施例為該容置座亦可_上述插座36之應用結構: 本貫施例除了插座36外其餘零件亦可替換更新。 改採圖ΐί發明第五較佳實施例所示之容置座52,係 座=、===接件37’各觸件37具有一連接 37i及底座32之門开 有螺絲L372,其中二連接座370、二鎖片 二連· 37〇 ^ 谷置部糾,將電子零件40置於 再以二鎖片奶抵制電子零件40,並鎖入二 螺絲3 7 2 ’則可籍七恶兩 ^ 口丈置電子零件4〇,連接座370及鎖片 同為具導電性之今屬料封 “ ;4,因此將連接座鮮接於電性節 9 1293014 點110上可使電子零件40與電子電路u為電性導1 ·,、 換電子零件4〇日核需將二賴372 向上撐開即可由容置部341兩側所形成之開口 351 ^ 入電子零件4G,更能有效達成本發明之目的; 本發明第六較佳實施例,其抑於上述實施例為#然該= ^可利用上述插座36之應躲構簡樣具有可替換之功15 ΐΙΓ ΐΙΓ 31 ί 为 ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί ί Relatively fixed, it avoids the fact that the metal is forced to form (4), and the upper cover is the same, and the two fixed members 31 are not electrically short-circuited with each other. Therefore, the connection portion of each of the splicing members 31 is soldered to the electronic circuit u = the disordered point 110, so that the accommodating seats 3 〇 are fixed on the electric _ 1 ,, and then the accommodating member 4G is placed The portion 34' can electrically make the electronic component 4G and the electronic circuit u electrically charged by the two-111 connector 31=genus=characteristics; The effect of the transfer can be mixed with the electrical connection of 31 W. Compared with the conductive line connection, it has a larger electrical conduction area, which can reduce the current transmission. The electrical impedance is reduced, and the heat consumption of the whole circuit board 1G is reduced. The use of the shape energy 1 uses a large area of metal heat dissipation to assist the circuit board 10, and when the heat is dissipated, the durability life of the electronic component 4G is entered into the skin; the cloth 1 has been used or used for a long time. Impact resistance such as high temperature and high pressure = t When the electronic component 40 of the portion is to be replaced, the reverse of the accommodating seat 30, the material _ member 31 ❸ 311 is slightly closer to the space of the portion 34, so that it can be easily opened from the opening The part 40, _, the electronic part 40, re-inserted into the electric stable and normal electric ", also does not need to pass the high temperature of welding The effect is to maintain the accurate electrical measurement of the probe card 1 20 1293014. The second embodiment is a housing 50 shown in the second preferred embodiment of the present invention, which is different from the components of the first embodiment of the present invention. The node 11 is designed to solder a socket to the electrical node 110, and each of the connectors 31 is inserted into a socket 36 by a plug portion 313, since the socket 36 is electrically conductive. The metal material can also electrically connect the electronic component 40 and the electrical node 11 so that the electronic component 40 can be easily replaced. Therefore, in addition to the socket %, the other components can be replaced with the update 'to make it more effective. The object of the invention is achieved. The fourth embodiment is a housing 51 shown in the third preferred embodiment of the present invention. The original fastening member 31 is changed to a spring piece 314. The side of the elastic piece 314 also has a concave-convex clamping structure. The electronic component is fixed, and the electronic component 4g can be effectively fixed to avoid the looseness by the size of the electronic component 4g by the retractable portion of the elastic piece 3M, so as to effectively achieve the purpose of the present invention. The fifth embodiment is a fourth preferred embodiment of the present invention, which is different from the embodiment of the j. The accommodating seat can also be used. The application structure of the socket 36 can be replaced by the remaining components except the socket 36. . The accommodating seat 52 shown in the fifth preferred embodiment of the invention is shown in the fifth preferred embodiment. The base member=,=== connector 37' has a connection 37i and a base 32 with a screw L372, two of which are The connection seat 370, the two lock pieces, the second connection, the 37〇^ valley portion correction, the electronic component 40 is placed and the electronic component 40 is resisted by the two locking pieces, and the two screws 3 7 2 ' can be locked into the two evils. ^ The mouthpiece is equipped with electronic components 4〇, the connection seat 370 and the lock piece are the same as the current conductive material seal; 4, so the connection seat is freshly connected to the electrical section 9 1293014 point 110 to make the electronic component 40 and The electronic circuit u is an electrical conductor 1 ·, and the electronic component is required to be extended by the second core 372. The opening 351 formed on both sides of the accommodating portion 341 can be electrically connected to the electronic component 4G. OBJECT OF THE INVENTION The sixth preferred embodiment of the present invention, which is in the above embodiment, can be replaced by the above-mentioned socket 36.
月tl G 請參閱第八圖係本發明第七較佳實施例所示 60 ’包含H緣座體61及-上蓋62形成之賴空間^ 10有沿絕緣座體61側邊所佈設之二固接件63, 可,子零件40之一容置部64,且由於該上蓋62二 卸式之結構,使於該容置部64上方具有1 口 65,因 透過開口 65容置各該電子零件40並方便替換,該 =同樣為具導電性之金屬材料,以—連接部63G銲接於^ 15即點11G ’亚以延伸至容置部64底層之—導電部631與 零件40電性接觸’各導電部631並無相互接觸 路;因此當電子零件㈣置於該容置座6〇時,則不易i 到其他雜物的污染,能保持電子零件40的元件品質,更;: 有效達成本發明之目的;如第九圖係本發明第八較佳^ 2〇例’其不暖上述實施例為該容置座亦可上述插座^ 之應用結構而服具村替換之魏;如第十_本發 九較佳實施例之容置座7G,其不同於上述實施例,係以更佳 金屬散熱功能之考量時,而具有_絕緣座體71 ,其僅於〜 側設有側壁’且-第一固接件72係直接橫向凸伸置設於絶 1293014 座體71 ’ -第一固接件73係攀沿該絕緣座體w之側壁 =設於絕緣麵71内,且該第二固接件73則將金屬材 貝厚度增加;如第卜_本發明第惰佳實_,其不同 於上逑貫施例為該容置座亦可利用上述插座%之應用結構 而同樣具有可替換之功能。 睛苓閱第十 7尽呶明第十一較佳實施例之容置 ί二ί有—絕緣座體81及—上蓋81G所形成之封閉空間, =閉空間為可放置電子零件4G之—容置部82,且由於該 孤810為可開啟或關閉之結構’使於該容置部a上方具 二Γ:”因此細開口83容置各該電子零件40並; 二A呈=s 8G亚有—第—及—第二固接件84、85, 之金屬材料,該第―固接件84以一連接部 0=於電性節點11G,並以—導電部841穿人該絕緣 15 該箱卩82底料設置哪二_牛85以 :=850鋅接於電性節點110,並沿著該絕緣座體 ==二Τ851延伸至該上蓋810之底層;因此 二^座8G時爾各顧接件84、 毕,因此導通’並不易受到其他雜物的污 目的=零件4°㈣ 同於上、丨—圖係本發明第十二較佳實施例,其不 ^構^ ^例為當然該容置座亦可利用上述插座36之應 二二杈佳貫施例之容置座9G,其不_ =二 83之位置方向亦可變更而不限定由上方置入電子^ 40 11 20 1293014 之方式,係將原本以上方 開口之結構·,再如第十五該容置座8G結構改為橫向 置座,料同於以實吨时施例之容 -之應用結構而同樣具有二=亦可利用上述插座 % 唯,以上所述者,僅為本發明土 故舉凡應帛本糾朗書及巾ϋ付關而已, 變化,理應包含在本發明之專中==圍所為之等效結構 12 1293014Please refer to FIG. 8 for the seventh embodiment of the present invention. The 60' includes a H-edge body 61 and an upper cover 62. The space formed by the upper cover 62 has two solids disposed along the side of the insulating base 61. The connector 63 can be a receiving portion 64 of the sub-assembly 40. Because of the structure of the upper cover 62, the upper portion of the receiving portion 64 has a port 65. The electronic component is accommodated through the opening 65. 40 and convenient replacement, the = is also a conductive metal material, the connection portion 63G is soldered to the ^ 15 point 11G 'to extend to the bottom of the receiving portion 64 - the conductive portion 631 is in electrical contact with the part 40 ' The conductive portions 631 do not contact each other; therefore, when the electronic component (4) is placed in the housing 6〇, it is not easy to contaminate other impurities, and the component quality of the electronic component 40 can be maintained. The ninth embodiment of the present invention is the eighth preferred embodiment of the present invention, which is not warm. The above embodiment is that the housing can also be replaced by the application structure of the socket ^; The housing 7G of the preferred embodiment of the present invention is different from the above embodiment in that the metal heat dissipation work is better. In the case of consideration, there is an _insulating base 71 which is provided with a side wall only on the side of the ~ and the first fixing member 72 is directly laterally protruded and disposed on the seat body 71' of the 1293014 - the first fastening member 73 The sidewall of the insulating seat w is disposed in the insulating surface 71, and the second fixing member 73 increases the thickness of the metal shell; as in the first invention, the present invention is different from the above In the case of the embodiment, the receptacle can also utilize the above-mentioned socket % application structure and also has a replaceable function. The eleventh preferred embodiment of the eleventh preferred embodiment of the present invention is an enclosed space formed by the insulating base 81 and the upper cover 81G, and the closed space is a space for the electronic component 4G. The portion 82, and because the orphan 810 is a structure that can be opened or closed, the upper portion of the receiving portion a has two turns: "The thin opening 83 accommodates each of the electronic components 40; and the second A is = s 8G a metal material of the first and second fixing members 84, 85, the first fixing member 84 is connected to the electrical node 11G by a connecting portion 0, and the insulating portion 15 is pierced by the conductive portion 841. The bottom of the box 82 is set to be _ _ 85 to: = 850 zinc is connected to the electrical node 110, and extends along the insulating seat == Τ 851 to the bottom of the upper cover 810; therefore, the two blocks 8G The connector 84 is completed, so it is turned on and is not susceptible to contamination by other debris. The part 4° (4) is the same as the upper, the 丨-picture. The twelfth preferred embodiment of the present invention is not Of course, the accommodating seat can also utilize the accommodating seat 9G of the above-mentioned socket 36, and the position of the position of the y=2 can also be changed without limiting the electronic device 40 from above. 11 20 1293014 is the same as the structure of the opening above, and the structure of the 8G of the accommodating seat is changed to the horizontal seat, which is the same as the application structure of the actual ton application. Having two = can also use the above-mentioned sockets. Only the above-mentioned ones are only for the sake of the invention, and the changes should be included in the specialization of the present invention. Equivalent structure 12 1293014
55
【主要元件符號說明】 1探針卡 10電路板 110電性節點 21座體 30、50、51、52、60、70、 10 15[Main component symbol description] 1 probe card 10 circuit board 110 electrical node 21 seat body 30, 50, 51, 52, 60, 70, 10 15
31、37、63固接件 311卡榫 313、630插接部 32底座 331套孔 35、35卜 65、83 開口 370連接座 372螺絲 41接點 631、841、851 導電部 72、84第一固接件 11電子電路 20探針 22針頭 80、90容置座 310、630、840、850 連接部 312箝制部 314彈片 33、 62、810 上蓋 34、 341、64、82 容置部 36插座 371鎖片 40電子零件 61、81絕緣座體 71絕緣底座 73、85第二固接件 1431, 37, 63 fixing member 311 latch 313, 630 plug portion 32 base 331 set hole 35, 35 cloth 65, 83 opening 370 connecting seat 372 screw 41 contact 631, 841, 851 conductive portion 72, 84 first固定 11 electronic circuit 20 probe 22 needle 80, 90 accommodating seat 310, 630, 840, 850 connecting portion 312 clamping portion 314 elastic piece 33, 62, 810 upper cover 34, 341, 64, 82 accommodating portion 36 socket 371 Locking piece 40 electronic parts 61, 81 insulating seat body 71 insulating base 73, 85 second fixing member 14
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094138167A TW200718296A (en) | 2005-10-31 | 2005-10-31 | Probe card whose electronic component can be quickly exchanged |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094138167A TW200718296A (en) | 2005-10-31 | 2005-10-31 | Probe card whose electronic component can be quickly exchanged |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200718296A TW200718296A (en) | 2007-05-01 |
TWI293014B true TWI293014B (en) | 2008-01-21 |
Family
ID=45067698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094138167A TW200718296A (en) | 2005-10-31 | 2005-10-31 | Probe card whose electronic component can be quickly exchanged |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200718296A (en) |
-
2005
- 2005-10-31 TW TW094138167A patent/TW200718296A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW200718296A (en) | 2007-05-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW201722002A (en) | Plug connector and adapter | |
JP5687736B2 (en) | Sample measuring device | |
CN101713790B (en) | Inspection fixture, electrode of the fixture, method of making the electrode | |
DK1830437T3 (en) | Electrical contact | |
KR101445397B1 (en) | Socket adaptor apparatus | |
US7456642B2 (en) | Handheld electronic test probe assembly | |
US20170212150A1 (en) | Shunt resistor and shunt resistor assembly | |
JP2005321305A (en) | Electronic component measurement jig | |
JPH10282139A (en) | Electronic device | |
CN210604724U (en) | High current test probe and probe assembly | |
TWI293014B (en) | ||
US20170222282A1 (en) | Battery diagnostic sensor unit | |
CN1963531B (en) | Probe card capable of replacing electronic accessory rapidly | |
JP2002048821A (en) | Resistor for detecting current | |
JP6567117B2 (en) | Electrical connector | |
TWI745477B (en) | Magnetically coupled ground reference probe | |
JP2004212233A (en) | Contact pin pair for four-probe measurement, and contact apparatus | |
JP2011082119A (en) | Check terminal protective cover | |
KR101426031B1 (en) | Apparatus of probe for kelvin test | |
JP3095221B1 (en) | Terminal block | |
JP5207828B2 (en) | Adapter for measuring device | |
TWM384318U (en) | Probe and probe device | |
JP2016161383A (en) | Terminal unit and resistance device | |
JP2007288833A (en) | Electrical connection appliance for test used for maintenance of apparatus, removable cover and electrical test method | |
CN212658733U (en) | Test fixture and test equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |