TWI285498B - Customizable ASIC and method, with substantially non-customizable portion that supplies pixel data to a mask-programmable portion in multiple color space formats - Google Patents

Customizable ASIC and method, with substantially non-customizable portion that supplies pixel data to a mask-programmable portion in multiple color space formats Download PDF

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TWI285498B
TWI285498B TW94131468A TW94131468A TWI285498B TW I285498 B TWI285498 B TW I285498B TW 94131468 A TW94131468 A TW 94131468A TW 94131468 A TW94131468 A TW 94131468A TW I285498 B TWI285498 B TW I285498B
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Taiwan
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integrated circuit
color space
mask
substantially non
pixel data
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TW94131468A
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Chinese (zh)
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TW200623848A (en
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Clyde H Nagakura
Po-Weng Chiu
Qinggang Zhou
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Wallace Darien K
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Publication of TWI285498B publication Critical patent/TWI285498B/en

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Abstract

An integrated circuit has a substantially non-customizable hardware portion and a mask-programmable logic portion. An image processing function common to many different makes and models of a type of electronic consumer device (for example, an image display device) is performed by the substantially non-customizable hardware portion. The substantially non-customizable hardware portion also outputs pixel data in both a first color space format and a second color space format. The mask-programmable logic portion can be mask-programmed for an individual manufacturer of electronic consumer devices such that the mask-programmable logic portion performs an additional special function specific to the electronic consumer devices of the individual manufacturer. Certain functions are better or more easily performed on pixel data in one color space format than another. Pixel data is therefore supplied to the mask-programmable hardware portion in multiple different color space formats, or in a selectable one of multiple different color space formats.

Description

1285498 造積體電路時,通常可以較小單位成本製造構成電視電子 工程之積體電路。因此,有時預期不同製造商之電視是由 共同電子零組件所製成,使得能以較大量製成電子零件且 俾能降低電子零件之每單位成本。 假如電視要由共同電子零件製成,則如何提供各製造商 供應其本身特殊增進功能性能力之問題仍在。一製造商要 提供一項特殊增進特性,但另一製造商可要提供一項不同 特殊之增進特性。電視製造商通常考慮增進特性之專屬性 ,因包含這些增進特性在消費者眼中可助於使一製造商之 電子消費裝置區隔市場上之所有其它電子消費裝置。 一項可能的解決方案在可以共同積體電路形式提供共同 功能性。由於跨越多重不同款式及型式之電子消費裝置, 使用共同積體電路,可降低提供共同功能性之每單位成本 。另一方面,藉由使一場可程式閘陣列(FPGA )包含在要 具備一特殊增進特性之各電子消費裝置內,會提供製訂之 功能性。FPGA會相當貴,但根據各個別製造商之特殊需求 ,它爲可程式化。不只使各別FPGA積體電路間之相互通信 需大量輸入/輸出端(I / 0端),因此更增加系統成本。所 預期的是一種較佳解決方案。 另一可能的解決方案可爲整合實施共同功能性與可程式 邏輯部數量之電路。可程式邏輯部可使各個別製造商實現 該製造商之特殊增進特性。該整合會降低與提供共通功能 性零件和可程式邏輯零件間相互通信有關之成本’但用以 實現可程式邏輯部之積體電路面積量將會非常大。例如’ -6- 1285498 如以抗熔合爲準之FPGA技術實現可程式邏輯部,則由於具 有大量程式化電晶體,供應在抗熔合爲準FPGA中要程式化 抗熔合所需之程式化電流。由於大程式化電晶體之存在, 不只可程式邏輯部會不預期地大,而且因製造抗熔合爲準 之FPGA常需特殊製程,故不預期會有抗熔合爲準之FPGA 解決方案。具有由一半導體製造設施所實施特殊製程之需 求常造成擔負更多之半導體製造設施加以製造積體電路。 另一方面,如此一 SRAM爲準之FPGA技術實現可程式邏 B 輯部,則由於需提供大量記億結構,該電路將會不預期地 大。在以SRAM爲準之FPGA技術中需要大量記億結構加以 儲存建置資料。知道的有雷射可程式閘陣列技術,但使用 這些技術所製成之裝置昂貴而生產緩慢且可能有良率和其 它問題。雷射程式化比其高度生產之意實在更適於原型樣 機之意。因此,一場可程式閘陣列技術會允許一個別製造 商製訂其本身積體電路之可程式部,實現其本身之特殊增 _ 進特性,但所形成之積體電路可能會較大,且因此經濟可 能性比大量電子消費裝置之情況更貴。 【發明內容】 一種新穎之積體電路包含一實質上非製訂硬體部及一可 程式之閘陣列部。實質上非製訂硬體部包含實施一共同功 能之電路。該共同功能存在於橫跨一種類型電子消費裝置 之許多款式及型式。可程式之閘陣列部爲一積體電路部, 將其加以製訂,實現-電子消費裝置一特定製造商所預期 之特殊增進特性。依此方式,電子消費裝置之一第一特定 -7- 1285498 I f 製造商可製造積體電路俾能以爲第一製造商所製積體電路 之可程式之閘陣列部實現一第一增進特性。電子消費裝置 之一第二特定製造商可製造積體電路俾能以爲第二製造商 所製積體電路之可程式之閘陣列部實現一第二增進特性。 利用與以較大量製造積體電路有關之經濟規模,而同時提 供電子消費裝置之個別製造商供應其本身特殊增進特性之 能力。 可程式之閘陣列部由工廠遮罩可程式之閘陣列架構製成 B 。可程式之閘陣列部因此非常高密度且小。其相互連接與 抗熔合之程式化無關。因此不含一抗熔合爲準FPGA之大可 程式電晶體。其相互連接非以SRAM爲準且其巨胞非以LUT 爲準。因此不含大量記憶胞加以儲存建置資料。 以一遮罩可程式技術試著提供一種增進功能可被認爲不 預期且過度昂貴。在開發一電子消費裝置期間,似乎必須 以一特殊遮罩完成積體電路晶圓之運行,使得能使積體電 路之可程式部加以程式化,在開發系統中實施其預期功能 B 。在一實例中,可程式部必須連同積體電路之剩餘部及開 發中系統,以硬體操作速度運作。因此無法常使用軟體模 擬工具,接收前往可程式部之訊號並由此產生要被供應回 到積體電路剩餘部之輸出訊號。似乎必須完成積體電路之 多重運行,然後確認系統可適當地作用前先在系統中測試 ,無法使用軟體模擬工具及在系統開發期間加速測試一真 實系統之需求顯然仗實現一種遮罩可程式之閘陣列架構中 之增進特性變成不實際的昂貴且麻煩。1285498 When building a circuit, it is usually possible to manufacture an integrated circuit that constitutes a television electronic project at a small unit cost. Therefore, it is sometimes expected that televisions of different manufacturers are made of common electronic components, enabling electronic parts to be made in larger quantities and reducing the cost per unit of electronic parts. If televisions are to be made of common electronic components, the question of how to provide each manufacturer with its own special enhanced functional capabilities remains. A manufacturer must provide a special enhancement feature, but another manufacturer may offer a different special enhancement feature. Television manufacturers typically consider the specific nature of the enhancements that, in the consumer's eyes, can help a consumer's electronic consumer device to be separated from all other electronic consumer devices on the market. A possible solution provides common functionality in the form of a common integrated circuit. By using a common integrated circuit across multiple different styles and types of electronic consumer devices, the cost per unit of providing common functionality can be reduced. On the other hand, the functionality provided is provided by including a programmable gate array (FPGA) in each of the electronic consumer devices that have a particular enhanced feature. FPGAs can be quite expensive, but they are programmable based on the specific needs of each manufacturer. Not only does the mutual communication between the individual FPGA integrated circuits require a large number of input/output terminals (I/0 terminals), thus increasing system cost. What is expected is a better solution. Another possible solution would be to integrate circuits that implement a common functional and programmable logic portion. The programmable logic enables individual manufacturers to implement the special enhancements of the manufacturer. This integration reduces the cost associated with providing communication between the common functional parts and the programmable logic parts', but the amount of integrated circuit area used to implement the programmable logic will be very large. For example, -6- 1285498 implements programmable logic in an anti-fuse-based FPGA technology. Due to the large number of programmed transistors, the stylized current required to be programmed for anti-fusion in a fusion-resistant FPGA is supplied. Due to the existence of large stylized transistors, not only can the programmable logic part be unpredictably large, but FPGAs that are resistant to fusion often require special processes, so it is not expected to have an anti-fusion-compliant FPGA solution. The need for a special process implemented by a semiconductor manufacturing facility often results in more semiconductor manufacturing facilities to manufacture integrated circuits. On the other hand, if such an SRAM-based FPGA technology implements a programmable logic, the circuit will be unexpectedly large due to the large number of structures required to be provided. In the FPGA technology based on SRAM, a large amount of structure is needed to store and build data. Laser-assisted gate array technology is known, but devices made using these techniques are expensive and slow to produce and may have yield and other problems. Laser stylization is more suitable for prototypes than its high production. Therefore, a programmable gate array technology will allow a manufacturer to develop a programmable portion of its own integrated circuit to achieve its own special enhancement characteristics, but the resulting integrated circuit may be larger and therefore economical. The possibilities are more expensive than in the case of a large number of electronic consumer devices. SUMMARY OF THE INVENTION A novel integrated circuit includes a substantially non-developed hardware portion and a programmable gate array portion. Substantially non-developed hardware includes circuits that implement a common function. This common function exists in many styles and styles across a type of electronic consumer device. The programmable gate array is an integrated circuit portion that is developed to achieve the special enhancement characteristics expected by a particular manufacturer of electronic consumer devices. In this way, the first specific manufacturer of the electronic consumer device, the first specific manufacturer, can manufacture the integrated circuit to achieve a first enhancement characteristic for the programmable gate array of the integrated circuit made by the first manufacturer. . One of the electronic consumer devices, the second specific manufacturer, can manufacture the integrated circuit to achieve a second enhancement characteristic for the programmable gate array portion of the integrated circuit made by the second manufacturer. The ability to supply its own special enhancements to individual manufacturers of electronic consumer devices is exploited by the economies of scale associated with the manufacture of integrated circuits in larger quantities. The programmable gate array is made of a factory mask programmable gate array structure B. The programmable gate array is therefore very dense and small. The interconnection is independent of the stylization of anti-fusion. Therefore, it does not contain a large programmable transistor that is fused to a quasi-FPGA. The interconnection is not based on the SRAM and the giant cells are not based on the LUT. Therefore, there is not a large amount of memory cells to store and build data. Trying to provide an enhanced function with a maskable program can be considered unpredictable and overly expensive. During the development of an electronic consumer device, it appears that the operation of the integrated circuit wafer must be completed with a special mask, so that the programmable portion of the integrated circuit can be programmed to implement its intended function in the development system. In one example, the programmable portion must operate at a hardware operating speed along with the remainder of the integrated circuit and the development system. Therefore, it is not always possible to use the software simulation tool to receive the signal to the programmable portion and thereby generate an output signal to be supplied back to the remaining portion of the integrated circuit. It seems that it is necessary to complete the multiple operations of the integrated circuit, and then confirm that the system can be tested in the system before it can function properly. The software simulation tool cannot be used and the need to accelerate the test of a real system during system development obviously realizes a mask programmable. The enhanced nature of the gate array architecture becomes impractical, expensive and cumbersome.

•8- 1285498 根據一第一新穎觀點,與遮罩可程式之閘陣列部和實質 上非製訂硬體部一起在積體電路上設置介面電路。在系統 開發期間,使積體電路置於測試模式。在測試模式中’介 面電路自另在正常操作中會被供應至積體電路之可程式之 閘陣列部內之非製訂硬體部接收訊號。介面電路將那些訊 號輸出在積體電路封裝之第一端點上面。積體電路外部之 一場遮罩可程式之閘陣列(FPGA )接收自第一端點之訊號 。外部FPGA之作用取代積體電路之可程式之閘陣列部。外 部FPGA接收自第一端點之訊號,並由此產生輸出訊號。將 輸出訊號供應回積體電路封裝之第二端點上面。介面電路 接收自第二端點之輸出訊號並將那些輸出訊號供應至實質 上非製訂硬體部,取代在正常操作中會另從可程式之閘陣 列部輸出之輸出訊號。測試模式中之操作因此允一外接商 用FPGA實施內嵌在積體電路內遮罩可程式之閘陣列部之功 能。因外部FPGA實現硬體功能,在開發中之現實世界系統 中FPGA之作業適宜地快速實施遮罩可程式之閘陣列部之操 作。因商用FPGA爲量產,故不需大花費即能採購及使用。 類似地,供程式化商用及大量生產FPGA之開發工具以及技 術支援和先前有經驗使用FPGA型式之大量工程師是隨即可 用的。 可得自外部FPGA之FPGA製造商之開發工具因此在系統 開發期間可用於程式化或建置外部FPGA。在一實例中,針 對FPGA開發系統指是啓始設計。例如,啓始設計可含要在 積體電路之遮罩可程式之閘陣列部中加以實現之電路示意 1285498 1 t 圖。啓始設計可以如Verilog或VHDL之硬體描述語言另外 加以描述。不管如何指定啓始設計,皆技術性將啓始設計 映射至所使用特定外部FPGA之硬體。安排並遞送設計,且 ' 產生建置資訊,其可用於以使FPGA程式化之平常方式使 FPGA程式化。在外部FPGA爲一抗熔合爲準FPGA之情況, 使用建置資訊使FPGA之各種抗熔合程式化,實現啓始設計 之功能性。多重抗熔合爲準之FPGA可以這種方式加以程式 化,並在開發系統中一個接一個加以嘗試,直到系統如預 ® 期加以運作。在外部FPGA爲以SRAM爲準FPGA之情況下, 相同FPGA被反覆載入建置資料。在系統中測試FPGA且然 後反覆重新建置並重測,直到系統如預期加以運作。當以 外部FPGA實施遮罩可程式之閘陣列部功能性,在系統中之 積體電路運作令人滿意後,使用開發工具,輸出可用以塑 造一遮罩之資訊,俾能完成遮罩可程式之閘陣列部加以實 現由外,部FPGA所實施之相同功能。啓始設計是以技術性映 射至遮罩可程式之閘陣列部是硬體。安排該設計並加以遞 ^ 送。然後開發工具輸出可用以製成遮罩之資訊。在一實施 例中,該資訊之形式爲一 GDS檔。 遮罩決定將在積體電路之一單一層中將導電穿孔佈置或 不佈置在何處。這些導電穿孔存在或不存在之處決定如何 相互連接製訂部之邏輯電路。使用自開發系統所輸出之資 訊製成遮罩,並使用該遮罩製成積體電路,使得積體電路 之遮罩可程式之閘陣列部在系統中以積體電路未與外部 FPGA連接之相同方式加以實施。因爲了完成製訂版本之積 -10- 1285498 ^ * 體電路只必須完成一新遮罩’故降低與提供製訂積體電路 給一*特定製造商有關之生產成本。 由於介面電路之設置,爲了開發具有一特殊增進特性之 電子消費裝置,一電子消費裝置之製造商未必製造多重版 本之積體電路。電子消費裝置之一第一製造商可使積體電 路具製訂之遮罩可程式之閘陣列部,實現第一製造商之特 殊增進特性,且電子消費裝置之一第二製造商可使積體電 路具製訂之遮罩可程式之閘陣列部,實現第二製造商之特 ® 殊增進特性。對於各製造商,只需製造一版本之積體電路 (及一製訂遮罩)加以開發至生產積體電路爲一部分之整 體系統。由於介面電路耦接至一外部FPGA,積體電路可以 正常操作速度在一開發系統中運作。 在某些實施例中,在測試和開發期間設在積體電路封裝 上作爲外部FPGA介面用之第一和第二輸入/輸出端點(I/O 端)稍後在所形成系統中爲其它用途於正常積體電路操作 期間是有用的。例如,I / 0端點可用於存取積體電路之遮罩 ® 可程式之閘陣列部,使得遮罩可程式之閘陣列部電路實施 另一電路板位準功能並經由I / 0端點與積體電路外部之電 路通信。這些I / 0端點和遮罩可程式之閘陣列部提供一種 方式加以解決電子消費裝置系統板上之錯誤。 在某些實施例中,積體電路具輸入/輸出胞(介面胞) 及相關輸入/輸出墊(介面墊)供耦接至封裝之第一和第 二I/O端點。積體電路爲將這些輸入/輸出胞(介面胞) 及墊(介面墊)向外接合至封裝〗/ 〇端點之一種封裝。然 'S) -11- 1285498 I 1 後在系統開發期間使用封裝之積體電路。如上述。使用I / 〇 端點耦接至外部FPGA。然後當稍後大量生產系統時,以不 同方式封裝積體電路之生產版本俾能不使輸入/輸出胞和 墊向外接合至I /0端點。這降低封裝積體電路生版本上之 I/O端點數。因此降低電子消費裝置生產版本之製造成本。 根據第二新穎觀點,一製訂△31(:含一實質上非製訂硬體 部及一遮罩可程式之閘陣列部。遮罩可程式之閘陣列部以 多重色彩空間格式(例如,以YCbC 1*4 : 4 : 4色彩空間格式及 B 以RGB色彩空間格式)自實質上非製訂硬體部接收像素資 料。以多重色彩空間格式提供像素資料至遮罩製訂之閘陣 列部。使遮罩可程式之閘陣列部更多樣化,其中,針對一 色彩空間格式之像素資料更輕易實施某些增進功能,但針 對另一色彩空間格式之像素資料更輕易實施其它增進功能 〇 以下詳述其它實施例及優點。本槪要說明未聲稱是要界 定本發明。本發明是由申請專利範圍之請求項目加以界定 【實施方式】 第1圖爲根據一實施例之簡化高階圖。一電子消費裝置 系統1正由電子消費裝置之一第一製造商開發。系統1含 一遮罩製訂之特殊應用積體電路(AS IC) 2。積體電路2在 系統1中實施一明顯之資料處理功能,在由其它製造商所 製成之其它電子消費裝置系統中亦實施該資料處理功能。 在電子消費裝置爲電視之一實例中,共同功能可含一非交 -12- 1285498 錯功能,一訊降低功能,一定標器功能’一伽瑪修正功能 ,一數位轉類比之轉換器功能’及一銀幕顯示功能。共同 功能由一束質上非製訂硬體部3所實施。實質上非製訂部3 從系統接收輸入並產生輸出至系統。在一實例中’使用標 準胞製造技術,實現實質上非製訂部3。 積體電路2更含一工廠遮罩可程式之閘陣列部4。非由標 準胞所實施,將遮罩可程式之閘陣列部4佈置成完全製訂 電路。遮罩可程式之閘陣列部4可接收來自實質上非製訂 B 硬體部3之輸入訊號,使用那些輸入訊號可實施一預期功 能,並能產生輸出訊號。將該輸出訊號供應回到實質上非 製訂硬體部3,在圖解中,箭尾5表示作爲輸入至遮罩可程 式之閘陣列部4訊號之輸入訊號源。在圖解中,箭頭6表 示將由遮罩可程式之閘陣列部4所產生之輸出訊號供應回 到實質上非製訂硬體部處之目的地。雖然訊源和目的地各 解說爲重點1實際上,訊源含取自實質上非製訂硬體部3 中許多地方之訊號且目的地含噴射入實質上非製訂硬體部 1 3中許多不地方之訊號。 除實質上非製訂硬體部和遮罩可程式之閘陣列部4外, 積體電路2更含介面電路。在此圖解中,介面電路爲積體 電路2之電路剩餘部,其非爲實質上非製訂硬體部3或遮 罩可程式之閘陣列部4。 積體電路2可在一測試模式和一正常單操作模式中運作 。爲開發系統1,將積體電路2置於系統1中。此時,尙未 使積體電路2爲遮罩程式化加以在該系統中實施一特殊增 -13- 1285498 進功能。使介面電路爲測試模式。在本實施例中,藉由使 一場可程式之閘陣列(FPGA )開發系統7經由一串列匯流 排與介面電路之一串列介面8通信加以完成的。串列介面8 經由介面電路之輸入/輸出端(I / 0端)對9和1 0接收來 自FPGA開發系統7。I /0端9爲一資料端DATA。I /0端10 爲一時脈端CLK。串列介面8接收通信並將一位元設定在一 配置暫存器(未示出)中。將這配置暫存器位元之數位內容 經由線路1 1供應至介面電路之多工器1 2和1 3。將多工器 ® 1 2控制成使得經由線路1 4 (部位3之輸出接腳),透過多 工器1 2,線路1 5將非製訂硬體部3內源自訊源5之輸入訊 號供應至介面電路第一 I/O端16。將線路15上與資訊內容 同步之一時脈訊號供應至第一 I / 0端1 6之一時脈輸出端 CLK21。藉由連接至外部FPGA17I / 0端之外部連結點依序供 應第一 I / 0端上之輸至訊號。在本實例中,外部FPGA1 7爲 一被廣泛使用且其運作爲許多工程師所了解之商用FPGA。 廣泛可得到並了解用以使FPGA17程式化之開發工具。由於 ® 介面電路之操作,在測試模式中將於積體電路2之正常操 作模式中被供應至遮罩可程式之閘陣列部4之輸入訊號供 應至外部FPGA 1 7。在測試模式中,亦控制多工器1 3使得經 由外部連結點將自FPGA 17所供應之輸出訊號傳導至第二 I / 0端1 8,透過線路1 9,透過多工器1 3及透過線路2 0 ( 部位3之輸入接腳)傳導至實質上非製訂硬體部3內之目 的地6。因此,介面電路將FPGA17耦接至積體電路2使得 FPGA 1 7內部之電路(在測試模式期間,在功能上)可取代 -14- 1285498 遮罩可程式之閘陣列部4 ’因稍後將使之程式化供正常操作 模式期間加以運作。因此’介面電路構成一裝置將一外部 FPGA耦接至積體電路,使得當另外實質上相同積體電路之 遮罩可程式之閘陣列部爲遮罩程式化並在一真實系統中運 作時,FPGA實施一種由另外實質上相同積體電路之遮罩可 程式之閘陣列部所實施之功能。 使用FPGA開發系統7提出說明稍後在遮罩可程式之閘陣 列部中加以實現之電路設計。可以如Ve r i 1 og或VHDL :硬 • 體描述語言形式提出說明。利用FPGA開發系統7,技術性 地將電路設計映射至FPGA 1 7之硬體。將它加以安置及遞送 。實施時序確認。然後將建置資訊從FPGA開發系統7加以 輸出並供應至外部FPGA1 7俾能將FPGA1 7加以廸置或程式 化,實現預期電路。FPGA17可爲任何適當FPGA技術之FPGA ,該FPGA技術含例如,一以抗熔合爲準技術,一以SRAM 爲準技術,或一以EEPR0M爲準技術,或一以FLASH爲準技 術。 ® 一旦建構後,外部FPGA17即連同開發系統1中積體電路 2之實質上非製訂硬體部3加以運作。因FPGA17實施硬體 之電路設計’系統1可以系統之完全操作速度加以操作。 如想要的話,藉由改變FPGA開發工具7上之電路設計,技 術映射’安置,遞送且然後重新程式化或重新建置FPGA 17 可變更FPGA 17之功能。實質上非製訂硬體部3實施系統1 中之一功能’該功能亦供通於由其它製造商所開發之其它 類似系統。另一方面,FpGA17實施一由正開發系統1之特 1285498 定製造商預期之特殊增進功能。 一旦FPGA 1 7和積體電路2在系統1中正確操作時,則使 用FPGA開發工具7產生可用以完成半導體製造遮罩(或網 線,如在製造積體電路中要使用一步進及反覆投射系統的 話)之資訊。該資訊可例如爲一典型之GDS檔。在積體電 路2製程期間可使用遮罩或網線俾能製遮罩可程式之閘陣 列部4,實施由外部FPG A 1 7在測試模式中所實施之相同功 能。在一實施例中,只製訂一層導電穿孔並只完成一新遮 罩。導電穿孔層之製訂形成實施由外部FPG A 1 7在測試模式 中所實施相同功能之遮罩可程式之閘陣列部4,遮罩可程式 之閘陣列部4非常高密度且因此小且不昂貴地設置在積體 電路2上。遮罩可程式之閘陣列部4非爲一以抗熔合爲準 之FPGA且因此不含在抗熔合程式化期間供應程式化電流至 抗熔合絲所需之大程式化電晶體。遮罩可程式之閘陣列部4 非爲一以SRAM爲準之FPGA且因此不含在一以SRAM爲準 FPGA架構中所需,加以儲存建置資料之許多記憶胞。因只 有一層積體電路2需加製訂,故降低有關提供一製訂積體 電路2至系統1製造商之非反覆性工程成本。因遮罩可程 式之閘陣列部4爲高密度故製造製訂之積體電路2之單位 成本亦低。 在完全生產版本之系統1中,未提供FPGA17。製訂可程 式之閘陣列部4提供在測試模式中由FPGA 1 7先前所供之功 能性。介面電路以其正常操作模式(非測試模式)開啓並 在系統1之正常操作期間維持在正常操作模式。藉利用使 -16- 1285498 I t 程式化成FPGA17之電路設計中之同步設計技術及建置成遮 罩可程式之閘陣列部4之電路有助於將設計可轉移性從 FPGA 1 7移至遮罩可程式之閘陣列部4。在一實施例中,被 程式化成FPGA17之電路及被建置成遮罩可程式之閘陣列部 4以時脈端CLK2 1上所存在之相同時脈訊號加以計時。 在正常操作模式之操作期間,不需第一和第二組I/O端 1 6和1 8加以接合至外部FPGA 1 7。因此,在某些實施例中 ,於正常操作模式期間可使用第一和第二組I / 〇端1 6和1 8 t 提供至和自遮罩可程式之閘陣列部4之存取,使得遮罩可 程式之閘陣列部4能實施另一電路板位階之功能。遮罩可 程式之閘陣列部4之電路部經由I / 〇端與積體電路外部之 電路通信。因此,I / 0端1 6和1 8提供一種方式供系統1之 製造商加以解決系統1系統電路板上之毛病及錯誤。亦可 使用I / 0端1 6和1 8在系統1之系統電路板上提供一額外 功能。 如在最終系統1中不需由遮罩可程式之閘陣列部4所供 t 給加以解決毛病並提供額外功能之功能性,則可將積體電 路2封裝在一不含I/O端16和18之其完全生產版本封裝 中。未將設置加以耦接至第一及第二I / 0端1 6及1 8之積 體電路2上之輸入/輸出胞及相關輸入/輸出墊向外銲接 至完全生產封裝中之封裝I/O端。這隆低生產版本之封裝 積體電路上之封裝I/O端數量,因此,降低生產版本積體 電路2之製造成本。 以相同方式,一第一製造商能使用一 FPGA開發系統加以 -17-• 8- 1285498 According to a first novel aspect, an interface circuit is provided on the integrated circuit together with the mask programmable gate array portion and the substantially non-developed hardware portion. The integrated circuit is placed in test mode during system development. In the test mode, the interface circuit is supplied to the non-developed hardware receiving signal in the programmable gate array portion of the integrated circuit from another normal operation. The interface circuit outputs those signals above the first terminal of the integrated circuit package. A masked programmable gate array (FPGA) external to the integrated circuit receives the signal from the first endpoint. The role of the external FPGA replaces the programmable gate array of the integrated circuit. The external FPGA receives the signal from the first endpoint and thereby produces an output signal. The output signal is supplied back to the second end of the integrated circuit package. The interface circuit receives the output signals from the second terminal and supplies those output signals to the substantially undefined hardware, instead of outputting the output signals from the programmable gate array during normal operation. The operation in the test mode thus allows an external manufacturer to implement the function of embedding the programmable gate array portion in the integrated circuit with the FPGA. Due to the hardware function of the external FPGA, the operation of the FPGA in the real-world system under development is suitable for quickly implementing the operation of the maskable gate array. Because commercial FPGAs are mass-produced, they can be purchased and used without cost. Similarly, development tools for stylized commercial and mass-produced FPGAs, as well as technical support and a large number of engineers who have previously used FPGA models, are readily available. Development tools from FPGA manufacturers that can be derived from external FPGAs can therefore be used to program or build external FPGAs during system development. In one example, the FPGA development system is the initial design. For example, the initial design may include a circuit diagram 1285498 1 t to be implemented in a maskable gate array portion of an integrated circuit. The initial design can be described in a hardware description language such as Verilog or VHDL. Regardless of how the start-up design is specified, the technology is initially mapped to the hardware of the particular external FPGA being used. Arrange and deliver the design, and 'generate build information that can be used to program the FPGA in the usual way to program the FPGA. In the case where the external FPGA is a fusion-resistance to the quasi-FPGA, the built-in information is used to program the various anti-fusion configurations of the FPGA to realize the functionality of the initial design. Multiple anti-fuse FPGAs can be programmed in this way and tried one after the other in the development system until the system is operational. In the case where the external FPGA is an SRAM-based FPGA, the same FPGA is repeatedly loaded with the build data. The FPGA is tested in the system and then re-established and retested until the system is operating as expected. When the function of the maskable gate array is implemented by an external FPGA, after the integrated circuit in the system works satisfactorily, the development tool is used, and the output can be used to shape a mask information, and the mask can be completed. The gate array unit implements the same functions implemented by the external FPGA. The start-up design is a hardware that is technically mapped to the maskable gate array. Arrange the design and send it by hand. The development tool output can then be used to make information about the mask. In one embodiment, the information is in the form of a GDS file. The mask determines where the conductive vias will or will not be placed in a single layer of the integrated circuit. The presence or absence of these conductive vias determines how the logic circuits of the development are interconnected. Using the information outputted by the self-developed system to form a mask, and using the mask to form an integrated circuit, so that the programmable circuit gate array portion of the integrated circuit is not connected to the external FPGA in the system. Implemented in the same way. Because the product version of the completed version is -10- 1285498 ^ * The body circuit only has to complete a new mask', thus reducing the production cost associated with providing a built-in circuit to a specific manufacturer. Due to the arrangement of the interface circuits, in order to develop an electronic consumer device having a special enhancement characteristic, a manufacturer of an electronic consumer device does not necessarily manufacture a multi-version integrated circuit. The first manufacturer of an electronic consumer device can make the integrated circuit have a maskable programmable gate array to achieve the special enhancement characteristics of the first manufacturer, and the second manufacturer of the electronic consumer device can make the integrated body The circuit has a maskable programmable gate array that achieves the second manufacturer's special enhancements. For each manufacturer, it is only necessary to manufacture a version of the integrated circuit (and a mask) to develop an integrated system that is part of the production integrated circuit. Since the interface circuit is coupled to an external FPGA, the integrated circuit can operate in a development system at normal operating speeds. In some embodiments, the first and second input/output terminals (I/O terminals) used as external FPGA interfaces on the integrated circuit package during testing and development are later in the formed system for other Use is useful during normal integrated circuit operation. For example, the I / 0 endpoint can be used to access the mask of the integrated circuit ® programmable gate array, so that the mask programmable gate array circuit implements another board level function and passes the I / 0 endpoint Communicates with circuitry external to the integrated circuit. These I/O endpoints and mask programmable gate arrays provide a way to address errors on the electronic consumer device system board. In some embodiments, the integrated circuit has input/output cells (interface cells) and associated input/output pads (interface pads) for coupling to the first and second I/O terminals of the package. The integrated circuit is a package that bonds these input/output cells (interface cells) and pads (interfacing pads) to the package/end terminals. However, 'S) -11- 1285498 I 1 uses the packaged integrated circuit during system development. As above. Use an I / 端点 endpoint to couple to an external FPGA. Then, when the system is mass-produced later, the production version of the integrated circuit is packaged in a different manner so that the input/output cells and pads are not externally bonded to the I / 0 terminal. This reduces the number of I/O endpoints on the raw version of the packaged integrated circuit. Therefore, the manufacturing cost of the production version of the electronic consumer device is reduced. According to the second novel point of view, one formulates Δ31 (: includes a substantially non-developed hardware portion and a mask programmable gate array portion. The maskable gate array portion is in a multiple color space format (for example, YCbC) 1*4: 4: 4 color space format and B in RGB color space format) Receive pixel data from virtually non-developed hardware. Provide pixel data in multiple color space format to the gate array of the mask. The programmable gate array is more diverse, in which it is easier to implement some enhancement functions for pixel data in a color space format, but it is easier to implement other enhancement functions for pixel data of another color space format. The present invention is not intended to define the present invention. The present invention is defined by the claims of the scope of the patent application. [Embodiment] FIG. 1 is a simplified high-order diagram according to an embodiment. System 1 is being developed by the first manufacturer of one of the consumer electronics devices. System 1 includes a masked special application integrated circuit (AS IC) 2. Integrated circuit 2 is in the system 1 implements an obvious data processing function, and implements the data processing function in other electronic consumer device systems made by other manufacturers. In an example where the electronic consumer device is a television, the common function may include a non-crossing -12- 1285498 Incorrect function, one function lowering function, certain standard function 'one gamma correction function, one digit to analog converter function' and one screen display function. Common function consists of a bundle of qualitative non-developed hardware parts 3. The non-developing part 3 receives input from the system and generates an output to the system. In an example, 'the standard cell manufacturing technology is used to realize the substantially non-developing part 3. The integrated circuit 2 further includes a factory mask. The gate array portion 4 of the program is not implemented by the standard cell, and the maskable gate array portion 4 is arranged to completely formulate the circuit. The mask programmable gate array portion 4 can receive the substantially non-developed B hardware portion. 3 input signals, using those input signals to implement an intended function, and can generate an output signal. The output signal is supplied back to the substantially non-developed hardware portion 3, in the diagram, the arrow 5 denotes an input signal source as a signal input to the maskable gate array portion 4. In the illustration, arrow 6 indicates that the output signal generated by the mask programmable gate array portion 4 is supplied back to substantially non-hardened output. The destination of the body. Although the source and destination are explained as the focus 1 In fact, the source contains the signal from many places in the non-developed hardware department 3 and the destination contains the injection into the non-developed hard A plurality of signals in the body 13 are not in place. The integrated circuit 2 further includes an interface circuit except for the substantially non-developed hardware portion and the maskable gate array portion 4. In this illustration, the interface circuit is an integrated body. The remaining portion of the circuit of the circuit 2 is not a substantially non-developed hardware portion 3 or a maskable gate array portion 4. The integrated circuit 2 can operate in a test mode and a normal single operation mode. 1. The integrated circuit 2 is placed in the system 1. At this time, 积 does not program the integrated circuit 2 as a mask to implement a special increase in the system -13 - 1285498. Make the interface circuit in test mode. In this embodiment, this is accomplished by having a programmable gate array (FPGA) development system 7 communicate with a serial interface 8 of the interface circuit via a series of busses. The serial interface 8 is received from the FPGA development system 7 via the input/output terminals (I/0 terminals) of the interface circuit for pairs 9 and 10. I / 0 terminal 9 is a data terminal DATA. I / 0 terminal 10 is a clock terminal CLK. The serial interface 8 receives the communication and sets a bit in a configuration register (not shown). The digital content of this configuration register bit is supplied via line 1 1 to the multiplexers 1 2 and 13 of the interface circuit. The multiplexer® 1 2 is controlled such that the input signal from the source 5 in the non-developed hardware unit 3 is transmitted through the multiplexer 1 2 via the line 14 (the output pin of the part 3). To the first I/O terminal 16 of the interface circuit. A clock signal on line 15 synchronized with the information content is supplied to one of the first I/O terminals 16 clock output terminal CLK21. The input signal on the first I/O terminal is sequentially supplied by an external connection point connected to the external FPGA 17I / 0 terminal. In this example, the external FPGA 17 is a commercially available FPGA that is widely used and operates as understood by many engineers. Development tools to program FPGA 17 are widely available and understood. Due to the operation of the ® interface circuit, the input signal supplied to the mask programmable gate array section 4 in the normal operation mode of the integrated circuit 2 is supplied to the external FPGA 1 in the test mode. In the test mode, the multiplexer 13 is also controlled such that the output signal supplied from the FPGA 17 is transmitted to the second I/O terminal 18 via the external connection point, through the line 197, through the multiplexer 13 and through the line 2 0 (the input pin of the portion 3) is conducted to the destination 6 which is substantially undefined in the hardware portion 3. Therefore, the interface circuit couples the FPGA 17 to the integrated circuit 2 so that the circuit inside the FPGA 17 (functionally during the test mode) can replace the -14-285498 mask programmable gate array portion 4' Stylize it to operate during normal operating mode. Thus, the 'interface circuit constituting a device couples an external FPGA to the integrated circuit such that when the maskable gate array portion of the substantially identical integrated circuit is stylized and operated in a real system, The FPGA implements a function implemented by a mask programmable gate array portion of another substantially identical integrated circuit. The FPGA development system 7 is used to illustrate the circuit design that is later implemented in the mask programmable gate array. Instructions can be given in the form of Ve r i 1 og or VHDL: hard description language. The FPGA development system 7 is used to technically map the circuit design to the hardware of the FPGA 17. Place it and deliver it. Implement timing confirmation. The build information is then output from the FPGA development system 7 and supplied to the external FPGA. The FPGA can be placed or programmed to implement the desired circuit. The FPGA 17 can be an FPGA of any suitable FPGA technology, for example, one based on anti-fusion technology, one based on SRAM technology, or one based on EEPR0M, or one based on FLASH. Once constructed, the external FPGA 17 operates in conjunction with the substantially non-developed hardware 3 of the integrated circuit 2 in the development system 1. Since the FPGA 17 implements a hardware circuit design, the system 1 can operate at the full operating speed of the system. If desired, the functionality of the FPGA 17 can be changed by changing the circuit design on the FPGA development tool 7, by mapping, placing, and then reprogramming or re-architecting the FPGA. In essence, the hardware unit 3 is not implemented in one of the functions of the system 1. This function is also available for other similar systems developed by other manufacturers. On the other hand, FpGA17 implements a special enhancement function as expected by the manufacturer of the development system 1 1285498. Once the FPGA 1 7 and the integrated circuit 2 are operating correctly in System 1, the FPGA Development Tool 7 is used to generate a semiconductor fabrication mask (or network cable, such as a step and repeat projection in the fabrication of the integrated circuit). Information about the system). This information can be, for example, a typical GDS file. During the integrated circuit 2 process, a mask or network cable can be used to form the maskable gate array 4, and the same function implemented by the external FPG A 17 in the test mode is implemented. In one embodiment, only one layer of conductive perforations is made and only a new mask is completed. The development of the conductive via layer forms a mask programmable gate array 4 that implements the same function performed by the external FPG A 17 in the test mode. The maskable gate array portion 4 is very dense and therefore small and inexpensive. The ground is disposed on the integrated circuit 2. The maskable gate array portion 4 is not an anti-fusion-compliant FPGA and therefore does not contain the large stylized transistors required to supply the stabilizing current to the anti-fuse wire during anti-fusion stylization. The maskable gate array portion 4 is not an SRAM-based FPGA and therefore does not contain a memory cell that is required to store the data in an SRAM-based FPGA architecture. Since only one layer of integrated circuit 2 needs to be developed, the cost of providing non-recurring engineering for providing a manufacturer 2 to system 1 manufacturer is reduced. Since the mask-type gate array portion 4 is of high density, the unit cost of the integrated circuit 2 is also low. In the fully production version of System 1, FPGA 17 is not provided. The programmable gate array section 4 provides the functionality previously provided by the FPGA 17 in the test mode. The interface circuit is turned on in its normal mode of operation (non-test mode) and maintained in the normal mode of operation during normal operation of system 1. The use of the synchronous design technique in the circuit design of the 16- 1285498 I t into the FPGA 17 and the circuit built into the maskable gate array section 4 help to shift the design transferability from the FPGA 1 7 to the cover. The cover can be programmed with the gate array unit 4. In one embodiment, the circuitry that is programmed into the FPGA 17 and the gate array portion 4 that is configured to be masked is clocked by the same clock signal present on the clock terminal CLK2. During operation of the normal mode of operation, the first and second sets of I/O terminals 16 and 18 are not required to be coupled to the external FPGA 17. Thus, in some embodiments, the first and second sets of I/terminals 16 and 18t can be used to provide access to and from the mask programmable gate array 4 during normal operation mode, such that The mask programmable gate array section 4 can implement another board level function. The circuit portion of the mask gate array unit 4 communicates with the circuit outside the integrated circuit via the I/〇 terminal. Therefore, the I/O terminals 16 and 18 provide a means for the manufacturer of the system 1 to resolve the faults and errors on the system 1 system board. An additional function can be provided on the system board of System 1 using I/O terminals 16 and 18. If the functionality of the maskable gate array 4 is not required in the final system 1 to solve the problem and provide additional functionality, the integrated circuit 2 can be packaged in an I/O-free terminal 16 And 18 in its fully production version of the package. The input/output cells and associated input/output pads on the integrated circuit 2 of the first and second I / 0 terminals 16 and 18 are not soldered to the package I/ in the fully manufactured package. O end. This is a low production version of the package I/O terminal on the integrated circuit, thus reducing the manufacturing cost of the production version of the integrated circuit 2. In the same way, a first manufacturer can use an FPGA development system to -17-

1285498 開發一第一電子消費裝置系統且然後完成一單一遮罩 網線)使得嶄新積體電路2在該系統中用以實施共同 以及一第一特殊增進功能,一第二製造商亦能使用一 開發系統加以開發一第二電子消費裝置且然後完成一 遮罩使得嶄新積體電路2在該系統中用以實施共同功 及一第二特殊增進功能。雖然以上說明與電視之系統 關之第1圖方法,在多個其它不同型式系統之開發中 用該方法。在開發成本敏感,大量之電子消費裝置中 見該方法有用,其中,一積體電路在實施共通於許多 與款式之電子消費裝置之功能以及在實施只存在於某 式及1或款式之一特定增進功能。只改變積體電路 可程式之閘陣列部內之單一層細節,完成積體電路之 化。爲了生產製訂版本之積體電路,不需重新完成 體電路之佈置設計工作。一旦已設計一種版本之積 ,與生產不同製訂版本積體電路有關之額外成本爲 此,利用吸引類似電子消費裝置之大量不同製造商 電路設計。 一特定實例 第2圖爲根據一特定實例之一視訊顯示系統1 0 1電 置之簡化系統位階圖。例如從一天線1 02,一同軸纜糸 ,或另一視訊源1 04接收一進來訊號到視訊顯示系統 訊號通過積體電路109內之一調諧器105, 一 IF解調秦 ,一類比轉數位轉換器1 07,並行進至一顯示處理器 顯示處理器108實施解交錯及定比。顯示處理器108 (或 功能 FPGA 單一 能以 1有 可使 可想 型式 ^ Μ .遮罩 製訂 數積 :電路 丨,因 ,積體 (子裝 I 103 :。該 蓉106 108 ° 是混 -18· 12854981285498 develops a first electronic consumer device system and then completes a single mask network cable) such that the new integrated circuit 2 is used in the system to implement a common and a first special enhancement function, and a second manufacturer can also use one The development system develops a second electronic consumer device and then completes a mask such that the new integrated circuit 2 is used in the system to implement a common function and a second special enhancement function. Although the above illustrates the method of Figure 1 relating to the television system, this method is used in the development of a number of other different types of systems. This method is useful in developing cost-sensitive, high-volume electronic consumer devices in which an integrated circuit is implemented in a number of different styles of electronic consumer devices and is implemented in only one of a certain type and 1 or style. Improve functionality. Only the single layer details in the programmable gate array can be changed to complete the integrated circuit. In order to produce a version of the integrated circuit, there is no need to re-design the layout of the body circuit. Once a version of the version has been designed, the additional cost associated with producing a different version of the integrated circuit is utilized by a large number of different manufacturer circuit designs that appeal to similar electronic consumer devices. A Specific Example FIG. 2 is a simplified system level diagram of a video display system 1 0 1 according to a specific example. For example, an antenna 106, a coaxial cable, or another video source 104 receives an incoming signal to the video display system signal through a tuner 105 in the integrated circuit 109, an IF demodulation Qin, an analog to digital digit The converter 107 travels to a display processor display processor 108 to perform deinterlacing and scaling. The display processor 108 (or the function FPGA can be a single can make the conceivable type ^ Μ. The mask is developed by the number of products: circuit 丨, because, the integrated body (sub-package I 103:. The 106 106 ° is mixed -18 · 1285498

ι I 合標準胞和全製訂電路加以製造的。不管是否無關或與顯 示處理器108之零件一致,積體電路109之遮罩可程式之 閘陣列部1 1 0表現一或更多增進功能。自積體電路1 09將 形成之解交錯視訊輸出至驅動器11 1及一顯示裝置。顯示 裝置可例如爲一陰極射線管(CRT) 1 12,一液晶顯示器(LCD )銀幕1 1 3,一電漿顯示器1 1 4或可用於收看視訊之其它顯 示裝置。視訊資訊框是儲存在一外部RAM 1 1 5中。一微控制 器116是耦接至積體電路109。微控制器116能控制積體電 ® 路109所表現之特性及1或增進功能。這些特性及1或增 進功能可例如包含子母畫面(PIP),分割畫面(POP),劇院1 ,劇院2,格式轉換,顯片檢視,全景定比,初始混色及重 疊,VBI/閉路字幕,銀幕顯示(0SD),及亮度調整。音 訊通過音訊電路1 1 7且至喇叭1 1 8。 第3圖爲第2圖積體電路109之更詳細圖。積體電路109 實際上其兩數位視訊輸入埠1 1 9和1 20。接收到數位視訊埠 1 1 9上之一數位視訊號通過一格式檢測器 1 2 1,通過一 ® FIF0122並至一記憶體控制區塊123。如果一數位視訊號存 在於數位視訊埠1 20上,則這第二數位視訊號通過一第二 格式檢測器124,通過一第二FIF01 25並至記憶體控制區塊 1 23。在第1圖實例中,只使用其中一數位視訊埠1 1 9。連 續視訊框通過數位視訊輸入埠1 1 9,通過格式檢測器1 2 1, 通過FIF0122,通過記憶體控制區塊123並將其儲存在DDR 、SDRAM (雙倍資料率同步動態隨機存取記憶體)1 1 5。 在一實例中,各視訊框爲含480條像素掃瞄線之NTSC視 -19- 1285498 訊框,其中,各列含7 2 0像素。(一條像素有時稱一列像 素)。在這實例中,一像素含兩數値·· 1 )八位元亮度値, 及2 )八位元色訊値。各畫框由兩場域組成。第一場域含奇 數之畫框掃猫線。第二場域含偶數之畫框掃瞄線。第一場 域含由第二場域像素所表示之影像剩餘部前時之視訊影像 像素。在第3圖硬體實例中,一場域接一場域地接收連續 場域畫框之連續場域並將其儲存在R Α Μ 1 1 5內。 預期以”解交錯”視訊供應某些視訊顯示裝置,其中,各 像素場域之像素數値爲雙倍。對於供應給積體電路9之各 240條線χ720像素場域,該積體電路要輸出之畫框爲480 條線X 7 2 0像素。爲了將一2 4 0條線X 7 2 0像素場域(稱爲” 關注場域”)轉換成一 4 8 0條線X 7 2 0像框,從RAM 1 1 5取出 相當於三個連續場域之記憶區。第一場域含第一像框之奇 數線條(線條1,3,5等)而第二場域含第一像框之偶數 線條(線條2,4,6等)。第三場域爲含一下像框奇數線 條(線條1,3,5等)之第一場域。中間場域爲關注場域 。特別像素是爲其產生之第二區爲來自這關注場域之記憶 區。該記憶區內像素之條數爲雙倍。第一區與第二區相同 像框之位置之記憶區,只有第一區來自緊接關注場域前之 場域。第三區與第二區相同像框之位置之記憶區,只有第 三區來自緊接關注場域後之場域。製程區塊丨26之動作檢 測區塊1 88 (見第3圖)使用第一和第三區塊加以決定第二 區塊中是否有動作。例如,如果在碰巧於爲一區塊所界定 圖片區內之影片中一物體要從一場域移動至下一場域時則 1285498 可能檢測到動作。 如果在由第二區塊所界定之圖片區來檢測到動作 用暫時內插法在第二區像素列之間內產生像素。在 塊含七條線之實例中,暫時內插法在奇數列產生新 使得第二區塊中之像素數爲雙倍。這些新像素在充 線條間相互線條之間隙。看著第一和第三區塊中之 素決定這些新像素。稱這爲”暫時"內插法是因爲使 場域時間外之像素資訊(第二區塊是來自關注場域 內插並決定新像素。 另一方面,如在第二區塊內檢測到動作,則使用 插法加以內插並充塡第二區塊中之奇數線條。空間 使用與第二區塊相同場域之像素加以決定近新像素 方式,以關注場域中像素之線條數從2 4 0偶數條線 4 8 0奇數和偶數條線之這種方式充塡關注場域中之 接一區塊。藉製程區塊126之解交錯區塊189 (見第 實施內插法及新像素之產生。 上述程序中所使用之像素區塊是取出自多線條區 中之RAM1 15。多線條區塊像素爲六條7 20像素線。 器1 2 7和1 2 9爲各儲存六列像素之緩衝器。緩衝器 小。它儲存五列像素。以其本身之1 2 8位元寬滙流 緩衝器127,128和129耦接至程序區126。 因處理所感興趣之區域,而將所內插之新像 FIF0130。以一 128位元寬之匯流排將FIF0130耦接 器區塊126。以另一 128位元寬之匯流排將FIF01 30 ,則使 第二區 像素, 塡偶數 對應像 用關注 )加以 空間內 內插法 。依此 增加至 一*區塊 3圖) 塊像素 各緩衝 128較 排將各 秦寫入 至處理 耦接至 -21- 1285498 I » 記憶體控制區塊1 23。由製程區塊1 26之雜訊減低區1 90輸 出雜訊減低結果並經由F I FO 1 7 3將其供應至記憶體控制區 塊 123。 一旦完成關注場域中區塊之內插法,則以記憶體控制區 塊123新內插像素之緩衝器130儲存在RAM1 15中。當要輸 出所形成”解交錯’’影片場域時則結合新內插像素區塊與原 始區塊至將所形成之”解交錯”區輸出在輸出匯流排1 3 1上 面,至F I FO 1 3 2。各像素由1 6位元表示並同時將八像素( B 所有像素,在記憶體段行中之原始和內插像素)輸出在匯 流排1 3 1上面。輸出匯流排1 3 1爲1 2 8位元寬。F I FO 1 3 2含 960個這種128位元寬之字元。 視訊之解交錯線通過F I FO 1 3 2並至定標器區塊1 3 3。定標 器區塊133並列以16位元輸出各像素。藉由定標器區塊133 輸出像素並經由多工器134將其供應至增進區塊135。作爲 由增進區塊135所實施增進之一實例者爲亮度調整。各 _ YCbCr4: 4: 4像素爲24位元寬,且像素出自一 24位元寬 匯流排136上一像素接一像素之增進區塊135。在OUTCLK 之各上升線上,三個8位元像素數値(一 8位元Y像素値 ’一 8位元Cb像素値,及一 8位元C r像素値)可出現在 匯流排1 3 6上。該像素通過多工器1 3 7至色彩空間轉換區 1 38。在本實施例中,色彩空間轉換區塊138實施YCbCr4 : 4 : 4 至RGB之轉換。經由一 2 6位元寬:匯流排1 3 9從色彩空間 轉換區塊1 38輸出像素至混色多工器1 40。在OUTCLK之各 上升線上,三個8位元像素數値(一 8位元R像素値,一 8 •22· 1285498 位元G像素値,及一 8位元B像素値)可出現在24位元之 匯流排1 3 9上。混色多工器1 40提供銀幕上顯示重疊資訊 之多工處理能力。從混色多工器1 40輸出像素至一伽瑪修 正及抖色區塊1 4 1。所形成像素被輸出至多工器1 42。如果 預期的是類比視訊輸出訊號,則像素串流通過一數位轉類 比轉換器(DAC)區塊143以類比形式自積體電路109加以 輸出。如果預期的是高解析度之數位電視訊號,則像素串 流通過使自積體電路109同時輸出之位元數從24位元變成 B 48位元雙倍之雙像素區塊144。這亦形成降低將資訊輸出 在訊號端145和146上處之速率。銀幕上顯示之功能性由 區塊147提供。從串列介面區塊148供應顯示在銀幕上之 字母至區塊1 47。如果預期想要更多銀幕上顯示特性,色彩 和字體則提供一外接OSD (銀幕上顯示)之積體電路149作 爲選項。微控制器1 1 6經由一資料線1 5 0和一時脈線1 5 1 ,藉傳送一串列通訊至積體電路109之串列介面148控制 | 各種積體電路109區塊。串列介面148對適當之一配置暫 存器1 5 2依序實施寫入。供應各種建置暫存器中之數位位 元內容作爲對於要控制各種其它區塊之控制訊號。藉設定 一建置暫存器中之位元因此可控制或相當小程度地製訂其 它區塊,但區塊內之細粒狀通用低階巨胞邏輯部並非以藉 決定一可程式之相互連結結構如何相互連接那些巨胞之不 同方式爲可自由地相互連接。這些其它區塊之電路因此說 是爲實質上非可製訂。 積體電路1 09含一第一鎖相廻路電路1 5 3及一第二鎖相 •23- 1285498 廻路電路1 5 4。兩者使用一外部晶石1 5 5作爲計時基礎。第 一鎖相廻路電路153產生一 INCLK訊號(IX)與一 DDRCLK 訊號(2X )。利用這些訊號對第3圖左側之各種區塊加以 計時。INCLK走向區塊126,139和140。第二鎖相廻路電 路1 5 4產生一用以對遮罩可程式之閘陣列部1 1 0計時和對 第3圖右邊之各種區塊計時之輸出時脈OUTCLK。在測試模 式中,這時脈訊號OUTCLK亦被驅動脫離晶片,對外部FPGA 內之同步邏輯部提供時脈。 • 使遮罩可程式之閘陣列部1 1 〇耦接加以接收來自積體電 路1 09剩餘部內各種訊源之輸入訊號。亦耦接遮罩可程式 之閘陣列部1 1 〇,供應輸出訊號至積體電路1 09剩餘部內之 各種目的地。第3圖中解說使遮罩可程式之閘陣列部1 1 〇 耦接至這些訊源和目的地之相互連結。 遮罩可程式之閘陣列部1 1 0藉接收經由匯流排1 5 6,1 5 7 和158通過到程序區塊126內之訊號可在序區塊126處, 例如實施製訂增進動作檢測,解交錯,及1或雜訊減低功 ® 能。遮罩可程式之閘陣列部1 1 〇可在程序區塊1 2 6另外所 輸出之結果處供應其輸出。遮罩可程式之閘陣列部1 1 0分 別經由匯流排1 5 9和1 6 0以及多工器1 6 1和1 6 2供應其輸 出至 FIFO 130 和 141。 遮罩可程式之閘陣列部1 1 〇藉接收經由匯流排1 63通過 到定標器區塊1 3 3內之訊號可例如實施製訂增進定標器功 能。匯流排164和多工器134可用在由定標器區塊133另 外所供應輸出處供應輸出。 -24- 1285498 i ί 遮罩可程式之閘陣列部1 1 0在增進區塊1 3 5處可例如實 施製訂增進功能。爲進行這個,遮罩可程式之閘陣列部11 〇 接收會由增進區塊1 3 5另外所使用之資訊。它以並列方式 經由FIF0165 —次三像素接收這資訊。首先,FIF0165輸出 延伸在垂直方向之像素線1,2和3之三像素。接著,FIF01 6 5 輸出延伸在垂直方向之像素線2,3和4之三像素。這供應 三像素至遮罩可程式之閘陣列部1 1 0程序繼續由上而下, 且由在至右橫跨像素框。在增進區塊135輸出處供應由遮 Β 罩可程式之閘陣列部1 1 0所實施之增進功能結果。經由匯 流排1 6 6和多工器1 3 7將增進功能之輸出供應至色彩空間 轉換區塊138。 遮罩可程式之閘陣列部1 1 0在色彩空間轉換區塊1 3 8及 /或伽瑪修正及抖色區塊1 4 1處可例如,實施製訂增進功 能,遮罩可程式之閘陣列部1 1 0不同於由色彩空間轉換區 塊1 3 8所實施之標準色彩空間轉換,可例如,實施一色彩 空間轉換。爲了提供這種增進功能或替代性之色彩空間轉 Β 換,將輸入至色彩空間轉換區塊1 3 8之輸入經由匯流排ί 6 7 供應至遮罩可程式之閘陣列部1 1 0。增進區塊1 3 5供應一 DCTINA主動訊號至遮罩可程式之閘陣列部丨10,表示有效 之像素資料何時存在於2 4位元寬之匯流排ί 6 7上。在伽瑪 修正及抖色區塊1 4 1之輸出處供應遮罩可程式之鬧陣列部 1 10輸出。這是使用24位元寬之匯流排168和多工器142 加以實施的。遮罩可程式之閘陣列部1 1 〇輸出一主動訊號 (未示出)和像素資料’表示何時有效之像素資料何時存 -25- 1285498 在於2 4位元寬之匯流排1 6 8上。 從一訊源區塊橫跨一匯流排供應像素資料至遮罩可程式 之閘陣列部1 1 0處’訊源區塊亦供應一對應之主動訊號, 表示有效之像素資料何時存在於匯流排上。DCTINA和 GMAINA爲兩個這種主動訊號。類似地,在從遮罩可程式之 聞陣列部1 1 0橫跨一匯流排供應像素資料至一目的地區塊 處,遮罩可程式之閘陣列部1 1 0亦供應一對應主動訊號, 表示有效像素資料何時存在於匯流排上,訊號SMXOA(未示 ® 出)爲一從遮罩可程式之閘陣列部1 1 0被供應至增進區塊 135之這種主動訊號。訊號DCTMXA (未示出)爲一從遮罩 可程式之閘陣列部1 1 0被供應至色彩空間轉換區塊1 3 8之 這種主動訊號。訊號GMXOA (未示出)爲一從遮罩可程式之 閘陣列部1 1 0被供應至雙像素區塊1 44之這種主動訊號。 以一時脈訊號同步轉移像素資料。接數區塊藉計算所收到 之像素可決定線條結束處及像框結束處。另外,可從訊源 區塊提供額外訊號加以表示線條結束’像框結束和其它狀 ®態條件。 最好對一色彩空間中之像素資料實施某些操作,但是最 好對另一色彩空間中之像素資料實施其它操作。根據一嶄 新觀點,耦接遮罩可程式之閘陣列部110以兩相異色彩空 間格式(例如,YCbCr格式和RGB格式)接收像素資料。在 YCbC r色彩空間中通常更易實施白色位階增進’黑色位階增 進,顏色直方圖延伸,膚色增進’水平DLTI’峯値過濾, 顯示控制及DCTI (數位色訊瞬態校正)。在RGB色彩空間 -26· 1285498ι I is manufactured with standard cells and fully developed circuits. The maskable programmable array portion 110 exhibits one or more enhancement functions, whether or not irrelevant or consistent with the components of the display processor 108. The self-integrated circuit 109 outputs the formed deinterlaced video to the driver 11 1 and a display device. The display device can be, for example, a cathode ray tube (CRT) 1 12, a liquid crystal display (LCD) screen 113, a plasma display 1 14 or other display device that can be used for viewing video. The video information frame is stored in an external RAM 115. A micro controller 116 is coupled to the integrated circuit 109. The microcontroller 116 can control the characteristics and/or enhancements exhibited by the integrated circuit 109. These features and 1 or enhancements may include, for example, picture-in-picture (PIP), split-picture (POP), theater 1, theater 2, format conversion, video view, panorama ratio, initial color mixing and overlay, VBI/closed captioning, Screen display (0SD), and brightness adjustment. The audio passes through the audio circuit 1 1 7 and to the speaker 1 1 8 . Fig. 3 is a more detailed view of the integrated circuit 109 of Fig. 2. The integrated circuit 109 actually inputs its two-bit video signals 埠1 1 9 and 1 20 . Receiving a digital video signal 119 A digital video signal passes through a format detector 1 2 1, through a ® FIF0122 and to a memory control block 123. If a digital video signal is stored on the digital video camera 120, the second digital video signal passes through a second format detector 124 through a second FIF01 25 to the memory control block 132. In the example of Figure 1, only one of the digital video frames 埠1 1 9 is used. The continuous video frame passes through the digital video input 埠1, 9 through the format detector 1 2 1, through the FIF0122, through the memory control block 123 and stores it in DDR, SDRAM (double data rate synchronous dynamic random access memory) ) 1 1 5. In one example, each video frame is an NTSC -19- 1285498 frame with 480 pixel scan lines, where each column contains 720 pixels. (A pixel is sometimes called a column of pixels). In this example, one pixel contains two numbers 値·· 1 ) octave luminance 値, and 2) octet color 値. Each frame consists of two fields. The first field contains an odd frame to sweep the cat line. The second field contains an even frame scan line. The first field contains the video image pixels in front of the remaining portion of the image represented by the pixels of the second field. In the hardware example of Figure 3, a field receives a continuous field of a continuous field frame and stores it in R Α Μ 1 15 . It is expected that some video display devices will be provided by "deinterlacing" video, in which the number of pixels in each pixel field is doubled. For each of the 240 lines 720 pixel field fields supplied to the integrated circuit 9, the frame to be output by the integrated circuit is 480 lines X 7 2 0 pixels. In order to convert a 240 line X 7 2 0 pixel field (referred to as "the field of interest") into a 480 line X 7 2 0 picture frame, the equivalent of three consecutive fields is taken from the RAM 1 1 5 Memory area. The first field contains the odd lines of the first frame (lines 1, 3, 5, etc.) and the second field contains the even lines of the first frame (lines 2, 4, 6, etc.). The third field is the first field containing the odd-numbered lines (lines 1, 3, 5, etc.). The intermediate field is the field of interest. The special area for which the special pixel is generated is the memory area from this field of interest. The number of pixels in the memory area is doubled. The first area is the same as the second area, and only the first area comes from the field immediately before the field of interest. The memory area of the same area of the third area and the second area, only the third area comes from the field immediately after the field of interest. The operation block 1 of the process block 丨 26 (see Fig. 3) uses the first and third blocks to determine whether there is an action in the second block. For example, if an object in a movie in the picture area defined by a block is to be moved from one field to the next, then 1285498 may detect an action. If a motion is detected in the picture area defined by the second block, a temporary interpolation method is used to generate pixels between the pixel columns of the second area. In the example where the block contains seven lines, the temporary interpolation method creates a new number in the odd column such that the number of pixels in the second block is doubled. These new pixels fill the gaps between the lines. Look at the elements in the first and third blocks to determine these new pixels. Call this "temporary" interpolation because it makes pixel information outside the field time (the second block is from the field of interest interpolation and determines the new pixel. On the other hand, as detected in the second block The action is interpolated and filled with odd lines in the second block. The space uses the pixels in the same field as the second block to determine the near-new pixel mode to focus on the number of lines in the field. 2 4 0 even lines 4 8 0 odd and even lines in this way are full of attention to the block in the field. By the deblocking block 189 of the process block 126 (see the implementation of interpolation and new The generation of pixels. The pixel block used in the above program is taken out from the RAM1 15 in the multi-line area. The multi-line block pixel is six 7 20 pixel lines. The devices 1 2 7 and 1 2 9 are stored in six columns. A buffer of pixels. The buffer is small. It stores five columns of pixels. It is coupled to the program area 126 by its own 128-bit wide buffers 127, 128 and 129. Insert a new image like FIF0130. Connect the FIF0130 to a 128-bit wide bus. Block 126. The FIF01 30 is arranged in another bus with a width of 128 bits, and the second region pixel, the even-numbered corresponding image is interpolated by space. Accordingly, it is increased to a *block 3 map) Each of the blocks of the buffers 128 is written to the processing and coupled to the -21 - 1285498 I » memory control block 1 23. The noise reduction result is output from the noise reduction area 1 90 of the processing block 1 26 and It is supplied to the memory control block 123 via the FI FO 137. Once the interpolation of the block in the field of interest is completed, the buffer 130 for newly interpolating pixels in the memory control block 123 is stored in the RAM1 15 When outputting the formed "deinterlaced" film field, the new interpolated pixel block and the original block are combined to output the "deinterlaced" area on the output bus 1 1 1 to FI. FO 1 3 2. Each pixel is represented by 16 bits and simultaneously outputs eight pixels (B all pixels, original and interpolated pixels in the memory segment row) on the bus 1 1 1 . The output bus 1 1 1 is 1 2 8 bits wide. F I FO 1 3 2 contains 960 such 128-bit wide characters. The video interleaved line passes through F I FO 1 3 2 and goes to the scaler block 1 3 3 . The scaler block 133 outputs the pixels in parallel with 16 bits. The pixels are output by the scaler block 133 and supplied to the enhancement block 135 via the multiplexer 134. The brightness adjustment is one of the examples of enhancements implemented by the enhancement block 135. Each of the _YCbCr4:4:4 pixels is 24 bits wide, and the pixels are from a boost block 135 of a pixel-by-pixel wide header 136. On each rising line of OUTCLK, three 8-bit pixel numbers (one 8-bit Y-pixel 値 '- 8-bit Cb pixel 値, and one 8-bit C r pixel 値) can appear in the busbar 1 3 6 on. The pixel passes through the multiplexer 1 37 to the color space conversion area 1 38. In the present embodiment, the color space conversion block 138 performs YCbCr4: 4:4 to RGB conversion. The pixels are output from the color space conversion block 1 38 to the color mixing multiplexer 1 40 via a 26-bit width: bus bar 1 3 9 . On each rising line of OUTCLK, three 8-bit pixel numbers (one 8-bit R pixel 一, one 8 • 22· 1285498 bit G pixel 値, and one 8-bit B pixel 値) can appear in 24 bits. The convergence of the yuan is on the 1 3 9 line. The color mixing multiplexer 1 40 provides multiplex processing capability for displaying overlapping information on the screen. The pixels are output from the color mixing multiplexer 1 40 to a gamma correction and dither block 1 4 1 . The formed pixels are output to the multiplexer 1 42. If an analog video output signal is expected, the pixel stream is output analogously from the integrated circuit 109 through a digital to analog converter (DAC) block 143. If a high resolution digital television signal is expected, the pixel stream is changed to a double pixel block 144 which is doubled by B 48 bits by the number of bits simultaneously output from the integrated circuit 109. This also results in a reduction in the rate at which information is output at signal terminals 145 and 146. The functionality displayed on the screen is provided by block 147. The letters displayed on the screen are supplied from the serial interface block 148 to the block 1 47. If you want to see more on-screen display features, the colors and fonts provide an external OSD (on-screen display) integrated circuit 149 as an option. The microcontroller 1 16 controls the various integrated circuit 109 blocks by transmitting a serial communication to the serial interface 148 of the integrated circuit 109 via a data line 150 and a clock line 1 5 1 . The serial interface 148 performs sequential writes to the appropriate one of the configuration registers 1 5 2 . The contents of the digits in the various built-in registers are supplied as control signals for controlling various other blocks. By setting a bit in the built-in register, the other blocks can be controlled or relatively small, but the fine-grained general low-order giant cell logic in the block is not linked by a program. The different ways in which structures connect to each other are freely interconnected. The circuits of these other blocks are therefore said to be substantially non-definable. The integrated circuit 1 09 includes a first phase-locked loop circuit 1 5 3 and a second phase lock circuit. 23 - 1285498 circuit circuit 1 5 4. Both use an external spar 155 as the basis for timing. The first phase locked loop circuit 153 generates an INCLK signal (IX) and a DDRCLK signal (2X). Use these signals to time the various blocks on the left side of Figure 3. INCLK goes to blocks 126, 139 and 140. The second phase locked loop circuit 154 generates an output clock OUTCLK for timing the mask programmable gate array 1 1 0 and timing the various blocks to the right of the third graph. In the test mode, the clock signal OUTCLK is also driven out of the chip to provide a clock to the synchronous logic in the external FPGA. • The mask programmable gate array 1 1 〇 is coupled to receive input signals from various sources in the remainder of the integrated circuit 109. Also coupled to the mask programmable gate array 1 1 〇, the output signals are supplied to various destinations in the remainder of the integrated circuit 109. In Fig. 3, the mask programmable gate array 1 1 〇 is coupled to the mutual connection of the sources and destinations. The mask programmable gate array unit 1 1 receives the signal passing through the bus bars 1 5 6, 1 5 7 and 158 into the program block 126 at the sequence block 126, for example, implementing a modified motion detection, solution Interlaced, and 1 or noise reduction power. The maskable gate array unit 1 1 供应 can supply its output at the output of the program block 1 2 6 . The maskable gate array portion 1 1 0 supplies its output to the FIFOs 130 and 141 via the bus bars 1 5 9 and 1 60 and the multiplexers 1 6 1 and 1 6 2, respectively. The maskable gate array portion 1 1 can be used to implement the enhanced scaler function, for example, by receiving signals through the bus bar 1 63 through the scaler block 1 3 3 . Bus 164 and multiplexer 134 may be used to supply output at an output provided by scaler block 133. -24- 1285498 i ί Masking the programmable gate array 1 1 0 The enhancement function can be implemented, for example, at the enhancement block 135. To do this, the maskable gate array portion 11 receives information that would otherwise be used by the enhancement block 135. It receives this information in parallel by FIF0165 - the third three pixels. First, the FIF0165 outputs three pixels of pixels 1, 2, and 3 extending in the vertical direction. Next, the FIF01 6 5 outputs three pixels of the pixel lines 2, 3, and 4 extending in the vertical direction. This supplies a three-pixel to mask programmable gate array 1 1 0 program that continues from top to bottom and spans the pixel frame to the right. The enhanced function results implemented by the mask modular gate array 1 1 0 are supplied at the output of the enhancement block 135. The output of the enhancement function is supplied to the color space conversion block 138 via the bus 166 and the multiplexer 137. The maskable gate array portion 1 1 0 can be implemented in the color space conversion block 1 38 and/or the gamma correction and dither block 1 1 1 , for example, to implement a development enhancement function, mask the programmable gate array The portion 1 1 0 is different from the standard color space conversion implemented by the color space conversion block 138, and for example, a color space conversion can be implemented. In order to provide such an enhanced function or an alternative color space conversion, the input to the color space conversion block 138 is supplied to the mask programmable gate array unit 1 1 0 via the bus ί 6 7 . The enhancement block 1 3 5 supplies a DCTINA active signal to the maskable gate array unit 10, indicating when valid pixel data is present on the 24 bit wide bus ί 6 7 . A mask programmable array portion 1 10 output is supplied at the output of the gamma correction and dithering block 141. This is implemented using a 24-bit wide bus 168 and multiplexer 142. The mask programmable gate array 1 1 〇 outputs an active signal (not shown) and the pixel data ' indicates when the valid pixel data is stored. -25 - 1285498 lies on the busbar 1 6 8 of 2 4 bits wide. Supplying pixel data from a source block across a bus to a maskable gate array 1 1 0 'Source block also supplies a corresponding active signal, indicating when valid pixel data exists in the bus on. DCTINA and GMAINA are two such active signals. Similarly, when the pixel data is supplied from the mask programmable array unit 1 1 0 across a bus to a destination block, the maskable gate array unit 1 1 0 also supplies a corresponding active signal, indicating When the effective pixel data is present on the bus, the signal SMXOA (not shown) is an active signal that is supplied from the mask programmable gate array 1 1 0 to the enhancement block 135. The signal DCTMXA (not shown) is an active signal that is supplied from the mask programmable gate array portion 110 to the color space conversion block 138. The signal GMXOA (not shown) is an active signal that is supplied from the mask programmable gate array portion 110 to the two-pixel block 1 44. Synchronously transfer pixel data with a clock signal. The pixel received by the calculation block determines the end of the line and the end of the picture frame. In addition, additional signals can be provided from the source block to indicate the end of the line, the end of the frame, and other conditions. It is preferable to perform some operations on the pixel data in a color space, but it is preferable to perform other operations on the pixel material in another color space. According to a new perspective, the coupled mask programmable gate array portion 110 receives pixel data in two distinct color space formats (e.g., YCbCr format and RGB format). White level enhancements, black level enhancement, color histogram extension, skin tone enhancement, horizontal DLTI' peak filtering, display control, and DCTI (digital color transient correction) are generally easier to implement in the YCbCr color space. In RGB color space -26· 1285498

i I 中通常更易實施伽瑪修正和抖色。除爾(YCbC i*和RGB)色 彩空間輸入外,回想起遮罩可程式之閘陣列部1 1 0連接 F I F0 1 6 5,如上述一次接收多條不同連續線條像素之像素資 料。供應至遮罩可程式之閘陣列部1 1 0之像素可爲來自爾 先前線條之像素以及來自當前線條之像素。接收來自一像 框像素之三條這種連續線之像素資料有助於在遮罩可程式 之閘陣列部1 1 〇實施特殊之內插增進功能。接收來自三連 續條線像素之像素資料亦有助於在遮罩可程式之閘陣列部 110實施2D雜訊減低及垂直DLTI (垂直數位亮度瞬態校正 )° 積體電路109含I/O端169。這些I/O端含一外接時脈輸 入端EXTCLK170,16輸出端OUT171及16輸入端IN172。在 系統開發期間可使用這些I / 〇端將一外接FPGA (未示出) 耦接至積體電路109。介面電路未顯示在第3圖中。如一實 施例之詳情請見第1圖。第1圖中之輸入訊號源5等於被 供應至第3圖中遮罩可程式之閘陣列部1 1 〇之各種訊號源 。第1圖中之輸出訊號目的地等於在第3圖中從遮罩可程 式之閘陣列部1 1 0被供應至積體電路1 0 9其它零件之各種 訊號目的地。第1圖中之端點21和1 6等於第3圖中之端 點1 7 1。第1圖中之端點1 8等於第3圖中之端點1 7 2和1 7 0 〇 第4 - 1 7圖說明遮罩可程式之閘陣列部1 1 〇之一特定實例 。第4-17圖之實例只不過是一實例。可使用任何其它適當 之遮罩可程式之邏輯架構。 (s) -27- 128,5498 第4圖爲第3圖中遮罩可程式之閘陣列部1 1 〇之由上往 下之平面圖。部位110佈置成多數磚格,主要組成垂直延 伸列。圖中標示爲1至5之磚格稱爲”超級包”。在各超級胞 列中由上而下進行,有五個超級胞及一含水平延伸SRAM存 取與控制線之區域。水平延伸存取和控制線是配置在積體 電路金屬化之水平延伸最上層。雖然第4圖中未說明,有 一往下延伸至各對超級胞列中心之垂直延伸SRAM區塊。WD 標示表示一寫入資料線。RD標示表示一讀取資料線。RA標 示表示一讀取位址線。WR標示表示一寫入閃控線。WA標示 表示一寫入位址線。 超級胞組成一二維矩陣。如圖解,在這實例中有56列之 超級胞。因此,有28個垂直延伸SRAM區塊。環繞該二維 矩陣超級胞的是一環形輸入/輸出胞。 第5圖爲第4圖超級胞結構之一更詳細之由上而下圖。 由左至右橫跨二維矩陣,連續超級胞之佈置實質上爲彼此 互爲鏡像。注意到;5中最在超級胞含在左側組成一列之四 個邏輯巨胞(標示爲” LOG 1C”)。在上兩巨胞和下兩巨胞之 間有一緩衝器與時脈胞(標示爲”BC”)。除巨胞及緩衝器與 時脈胞出現在右側下一超級胞外,該組態在右側下一超級 胞中重覆。然而,在第5圖左側之兩超級胞彼此非正爲鏡 像。注意到最右側之超級胞對在其右緣含一組水平穿孔符 號。各水平穿孔符號代表可配置一水平導電穿孔之位置或 由於製訂穿孔遮罩之故而不存在該水平導電穿孔之位置。 亦注意到亦有在超級胞對底部所圖解之垂直穿孔符號。再Gamma correction and dithering are usually easier to implement in i I. In addition to the YCbC i* and RGB color space input, it is recalled that the mask programmable gate array 1 1 0 is connected to F I F0 1 6 5, and the pixel data of a plurality of different continuous line pixels is received as described above. The pixels supplied to the mask programmable gate array 1 1 0 may be pixels from the previous line and pixels from the current line. Receiving pixel data from three such continuous lines of pixels of a frame helps to implement a special interpolation enhancement function in the mask programmable gate array 1 1 . Receiving pixel data from three consecutive line pixels also facilitates 2D noise reduction and vertical DLTI (vertical digital brightness transient correction) in the mask programmable gate array portion 110. The integrated circuit 109 includes an I/O terminal. 169. These I/O terminals include an external clock input terminal EXTCLK 170, 16 output terminals OUT171 and 16 input terminals IN172. An external FPGA (not shown) can be coupled to the integrated circuit 109 during system development using these I/C ports. The interface circuit is not shown in Figure 3. See Figure 1 for details of an embodiment. The input signal source 5 in Fig. 1 is equal to the various signal sources supplied to the maskable gate array portion 1 in Fig. 3. The output signal destination in Fig. 1 is equal to the various signal destinations supplied from the mask programmable gate array portion 1 1 0 to the other components of the integrated circuit 1 0 9 in Fig. 3. End points 21 and 16 in Fig. 1 are equal to the end points 1 7 1 in Fig. 3. The endpoint 1 8 in Figure 1 is equal to the endpoint 1 7 2 and 1 7 0 in Figure 3. Figure 4 - 7 illustrates a specific example of a maskable gate array 1 1 . The examples in Figures 4-17 are merely an example. Any other suitable masked logic architecture can be used. (s) -27-128,5498 Fig. 4 is a plan view of the maskable gate array 1 1 第 from the top to the bottom in Fig. 3. The portion 110 is arranged in a plurality of bricks, mainly constituting a vertical extension row. The bricks labeled 1 to 5 in the figure are called "super packs". From top to bottom in each super cell, there are five super cells and an area containing horizontally extended SRAM access and control lines. The horizontal extension access and control lines are placed on top of the horizontal extension of the metallization of the integrated circuit. Although not illustrated in Fig. 4, there is a vertically extending SRAM block extending down to the center of each pair of supercells. The WD mark indicates a write data line. The RD mark indicates a read data line. The RA flag indicates a read address line. The WR flag indicates a write to the flash control line. The WA flag indicates a write address line. Super cells form a two-dimensional matrix. As shown in the figure, there are 56 super cells in this example. Therefore, there are 28 vertically extending SRAM blocks. Surrounding the two-dimensional matrix supercell is a circular input/output cell. Figure 5 is a top-down diagram of one of the supercellular structures of Figure 4. Across the two-dimensional matrix from left to right, the arrangement of consecutive supercells is essentially mirror images of each other. Note that the top five super-cells contain four logical giant cells (labeled "LOG 1C") on the left side. There is a buffer between the upper two giant cells and the next two giant cells (labeled "BC"). Except for the giant cell and the buffer and the clock cell appearing on the right next super cell, the configuration is repeated in the next super cell on the right. However, the two super cells on the left side of Figure 5 are not mirror images of each other. Note that the rightmost supercell pair contains a set of horizontal perforation symbols on its right edge. Each horizontal perforation symbol represents the location at which a horizontal conductive perforation can be configured or the location of the horizontal electrically conductive perforation is absent due to the development of the perforated mask. It is also noted that there are also vertical perforation symbols illustrated at the bottom of the supercell. again

-28- 1285498 來,各個這些符號代表可配置一垂直穿孔之位置或由於製 訂穿孔遮罩之故而不存在該垂直穿孔之位置。延伸垂直次 元之導線標示爲CLK ’ EXP和QUAD。CLK之標示表示可用以 傳輸一時脈訊號之導線。EXP標示表示一快速導線。一快速 導線實質上延伸整體垂直長度之遮罩可程式之閘陣列部 1 1 0。QUAD標示表示其終結在垂直穿孔位置前延伸四巨胞距 離之一訊號導線。 在積體電路之金屬層4 ( M4 )上實現相互連結結構之水平 ® 導線。在積體電路之金屬層(M5 )上實現相互連結結構之 垂直導線。如圖解說明,實質上Μ 5層之整體平面覆蓋垂直 延伸之導線,對於使用中之半導體製程,儘可能將該導線 配成並列靠近在一起。以類似方式’實質上Μ4層之整體平 面覆蓋水平延伸之導線,對於使用中之半導體製程,儘可 能將該導線配置成並列靠近在一起。該架構這些層膜中之 這些垂直和水平導線密度允許干擾層中最大數量之潛在交 叉連結之導電穿孔位置。藉由使這些潛在交叉連結導電穿 ^ 孔位置數量達最大,爲了完成積體電路109之製訂版本, 只需製訂一導電穿孔層且只需完成一新遮罩。使用0.18微 米製程遮罩可程式之閘陣列部之對等閘密度大槪爲每 mm2 2 5 K個可用閘,但是使用0.18微米製程之QuickLogic pASIC FPGA架構之大槪對等閘密度爲每nim22.5K個可用閛 ,且使用0.18微米製程之Xilinx Virtex Π FPGA架構之 大槪對等閘密度爲每mm21 . 2K個可用閘。 除第6圖表示如何將SRAM區塊配置在巨胞金屬導體底下 128549,8 外,第6圖類似第5圖。含半導體基底中所製造電 巨胞之邏輯部,在左巨胞對之情況下是配置在巨胞 或在右巨胞對之情形下是配置在巨胞右側。由於巨 之結果,在當中未配置巨胞邏輯之左右巨胞之間形 域。只有M4和M5巨胞之相互連結是配置在這些區 因SRAM區塊含會與M4和M5巨胞相互連結接合之相 之較高階相互連結,故SRAM邏輯(及需要相互連接組 邏輯之電晶體之較低階相互連結)是配置在左巨胞 位和右巨胞左部位底下之區域中。可用以連結到下〕 區塊之相互連結被提到第4圖中所示位置之水平延 (M4層)之最大層。可將SRAM區塊耦接至或(藉適 導電穿孔)非耦接在第4圖中所示位置。 第7圖爲一垂直導電穿孔之簡化側視圖。金屬頂 體電路之金屬層5(以M5表示)。金屬底層爲積體 金屬層4 (以M4表示)。將M5和M4連接至左側之 孔(一導電插頭)爲一永久性導電穿孔,不管如何 訂遮罩,它都存在。將M5和M4連接至右側之導電 表一潛在導電穿孔位置。可將一導電穿孔配置在這 不依如何形成製訂遮罩而定。 第8圖爲一水平導電穿孔之簡化側視圖。金屬頂 體電路之金屬層5(以M5表示)。金屬底層爲積體 金屬層4 (以M4表示)。將M5和M4連接至左側之 孔爲一永久性穿孔,不管如何形成製訂遮罩,它都 將Μ5和M4連接至右側之導電穿孔代表一潛在導電 晶體之 左側, 胞鏡射 成一區 域中。 當小量 成 SRAM 最右部 SRAM 伸導體 當安置 層爲積 電路之 導電穿 形成製 穿孔代 位置或 層爲積 電路之 導電穿 存在。 穿孔位 -30- 128.5498 置。可將一導電穿孔配置在這位置或不依如何形成製訂遮 罩而定。 第9圖爲一 SRAM區塊一胞之簡化圖。第10圖爲一說明 其中一 SRAM區塊之讀取檢測器結構。第9圖中之各虛線方 塊表示第9圖SRAM胞結構之一實例。各SRAM區塊含16份 第1 0圖結構之拷貝。因此,各SRAM區塊一次輸出16位元 〇 第1 1圖爲一說明一巨胞結構,一位在其左側之輸入/輸 出胞(I / 0胞),及一位在其上方之I / 0胞之更詳細圖。巨 胞之特定邏輯部在巨胞之左側緣加以說明。這邏輯部包含 兩AND閘,多工器結構及一正反器。I/O胞提供要使遮罩可 程式之閘陣列部1 1 0鏈結至第3圖中各種訊號源和目的地 所需之輸入和輸出緩衝作用。圖例中,導電穿孔符號代表 如想要的話,一導電穿孔所在位置。 在遮罩可程式之閘陣列部1 1 〇之I / 〇胞數量小於要將遮 罩可程式之閘陣列部1 1 〇耦接處之訊源及/或目的地之數 量時,可提供額外之多工及/或解多工處理功能。可提供 一額外多工器將所選定之多個訊源之一耦接至一 I / 0胞( 使用該I / 0胞將訊號接收到遮罩可程式之閘陣列部1 1 0上 )。利用一或更多配置暫存器位元之內容可控制這種額外 之多工器。類似地,可提供一額外之解多工器將一 I / 0胞 (使用該I / 0胞輸出來自遮罩可程式之閘陣列部1 1 0之訊 號)耦接至多個目的地中所選定之一。利用一或更多配置 暫存器位元之內容可控制這種額外;解多工器。不使用一-28- 1285498, each of these symbols represents a position at which a vertical perforation can be configured or because the perforated mask is not present. The wires that extend the vertical dimension are labeled CLK 'EX and QUAD. The CLK flag indicates the wire that can be used to transmit a clock signal. The EXP mark indicates a fast wire. A fast wire extends substantially the entire vertical length of the maskable gate array portion 110. The QUAD designation indicates that one of the four signal lines extends from the front of the vertical perforation position. The horizontal ® wire of the interconnected structure is realized on the metal layer 4 ( M4 ) of the integrated circuit. The vertical wires of the interconnected structure are realized on the metal layer (M5) of the integrated circuit. As illustrated, the entire planar plane of the Μ5 layer covers the vertically extending wires. For the semiconductor process in use, the wires are arranged side by side as close as possible. In a similar manner 'substantially 4 layers of the entire surface cover the horizontally extending wires, as far as possible in the semiconductor process in use, the wires are configured to be juxtaposed close together. These vertical and horizontal wire densities in these layers of the structure allow for interference with the largest number of potentially cross-linked conductive perforation locations in the layer. By maximizing the number of potential cross-connected conductive via locations, in order to complete the development of the integrated circuit 109, only one conductive via layer is required and only a new mask is needed. The equivalent gate density of the programmable gate array using 0.18 micron process mask is greater than 2 5 K available gates per mm2, but the large gated gate density of the QuickLogic pASIC FPGA architecture using the 0.18 micron process is 22 per nanometer. 5K available 閛, and the Xilinx Virtex Π FPGA architecture using the 0.18 micron process has a large equivalent gate density of 21. 2K available gates per mm. Except Figure 6 shows how the SRAM block is placed under the giant cell metal conductors 128549,8, and Figure 6 is similar to Figure 5. The logic portion of the electric giant cell produced in the semiconductor substrate is disposed on the right side of the giant cell in the case of the left giant cell pair or in the case of the right giant cell pair. As a result of the huge, there is no configuration between the giant cells of the giant cell logic. Only the M4 and M5 giant cells are interconnected in these areas because the SRAM block contains higher-order interconnections with the M4 and M5 giant cells. Therefore, the SRAM logic (and the transistors that need to interconnect the group logic) The lower order interconnections are arranged in the area under the left giant cell and the left giant cell. The maximum number of horizontal extensions (M4 layers) that can be used to link to the lower block is referred to the position shown in Figure 4. The SRAM block can be coupled to or (by a suitable conductive via) uncoupled to the position shown in FIG. Figure 7 is a simplified side view of a vertical conductive perforation. The metal layer 5 of the metal top circuit (indicated by M5). The metal underlayer is an integrated metal layer 4 (indicated by M4). Connect M5 and M4 to the hole on the left (a conductive plug) as a permanent conductive hole, which is present regardless of the mask. Connect M5 and M4 to the conductive vias on the right side of the potential conductive perforation location. A conductive via can be placed in this way depending on how the mask is formed. Figure 8 is a simplified side view of a horizontal conductive perforation. The metal layer 5 of the metal top circuit (indicated by M5). The metal underlayer is an integrated metal layer 4 (indicated by M4). The M5 and M4 are connected to the hole on the left side as a permanent perforation. Regardless of how the mask is formed, it connects Μ5 and M4 to the right side of the conductive perforation to represent the left side of a potential conductive crystal, and the fluoroscope is projected into a region. When a small amount of SRAM is the rightmost SRAM extension conductor, the placement layer is electrically conductive through the formation of the perforation position or the layer is the conductive wear of the product. Punch position -30- 128.5498 set. A conductive via can be placed at this location or not depending on how the mask is formed. Figure 9 is a simplified diagram of a SRAM block. Figure 10 is a diagram showing the structure of a read detector of one of the SRAM blocks. Each of the dashed square blocks in Fig. 9 represents an example of the SRAM cell structure of Fig. 9. Each SRAM block contains 16 copies of the structure of Figure 10. Therefore, each SRAM block outputs 16 bits at a time. Figure 11 shows a giant cell structure, one input/output cell on the left side (I / 0 cell), and one I / I above it. A more detailed picture of the 0 cell. The specific logic of the giant cell is illustrated on the left edge of the giant cell. This logic contains two AND gates, a multiplexer structure and a flip-flop. The I/O cells provide the input and output buffering required to link the maskable gate array 1 1 0 to the various signal sources and destinations in Figure 3. In the illustration, the conductive perforation symbol represents the location of a conductive via as desired. Additional is provided when the number of I/cells in the maskable gate array 1 1 is less than the number of sources and/or destinations at which the maskable gate array 1 1 〇 is to be coupled Multiplex and/or multiplex processing functions. An additional multiplexer can be provided to couple one of the selected plurality of sources to an I / 0 cell (using the I / 0 cell to receive the signal to the maskable gate array 1 1 0). This additional multiplexer can be controlled by the contents of one or more configuration register bits. Similarly, an additional demultiplexer can be provided to couple an I / 0 cell (using the I / 0 cell output signal from the maskable gate array 1 1 0) to a plurality of destinations selected one. This extra; multiplexer can be controlled by the contents of one or more configuration scratchpad bits. Do not use one

-31- 1285498 解多工器,各目的地可具一註冊過之輸入,俾能供應一訊 號至所有輸入但只對所選定之一註冊過輸入予以計時。利 用一或更多建置暫存器位元內容可例如控制對那一註冊之 輸入加以計時。擴充遮罩可程式之閘陣列部110耦接處之 訊源及目的地數量之其它方式亦有可能。 第1 2圖爲巨胞結構之詳細圖,其中,巨胞邏輯是配置在 巨胞之右緣。 第1 3圖爲第5圖緩衝器與時脈胞(BC )之詳細圖。第1 2 圖和第1 3圖中所說明之共享訊號導體/ SET,CLK和/ RST 以未斷訊方式垂直延伸五個超級胞之整體長度。表示導體 之”1”與”0”亦以未斷訊方式垂直延伸五個超級胞之整個長 度,這些導體做得更寬且因此比所說明之其它垂直延伸導 體更具導電性。標示” 1 ”之導體永久性耦接至VCC (電源電 壓)。標示之導體永久性耦接至地電位。 第1 4圖爲一表示遮罩可程式之閘陣列部1 1 0平衡時脈樹 狀結構之由下往下簡圖。在積體電路中將這結構複製兩次 。第一時脈樹之支葉以CLKTR1 (時脈樹一)表示。第二時 脈樹之支葉以CLKTR2 (時脈樹二)表示。第13圖中之垂直 延伸時脈樹支葉導體CLKTR1和CLKTR0如第14圖中所示加 以延伸。平衡時脈樹之時脈樹驅動器是配置在SRAM區塊之 輸入與輸出導體所在之水平間隙中。如第1 4圖中所示,有 三個這種間隙。 第15圖和第16圖說明可藉不同方式建置第12圖之巨胞 加以實現之各種邏輯閘和正反器。 1285498 第1 7圖表示一種掃瞄測試相互連結結構之簡圖’該結構 將遮罩可程式之閘陣列部1 1 0所有巨胞之所有正反器一起 鏈結至一長掃瞄測試位移暫存器鏈之中。在一測試模式中 將一掃瞄測試時脈訊號供應至SCAN CLOCK時脈線上面。反 覆對該掃瞄測試時脈訊號計時造成正反器內容以串列方式 移出遮罩可程式之閘陣列部Π 〇。有關正反器符號,/ S I 表示一掃瞄測試輸入接腳,/ SO表示一掃瞄測試輸出接腳 ,而SCAN表示一掃瞄時脈輸入接腳。 > 第1 8圖根據另一持定實施例說明介面電路和一遮罩可程 式之閘陣列部1 1 0。所說明之I / 0端爲積體電路1 0 9之I / 0 端。標示A,B,C,D,E,F,G,L,M和N之小區塊爲一 建置暫存器之配置暫存器位元。如上述,建置暫存器可經 由串列介面148(見第3圖)寫入。控制訊號CONTROL [40:0] 含以下輸入:s b u f a , resetn, gmaina, dctina, hsync, vsync, vx—ctrll3[7:0], vx—ctrll4[7:0];以及以下輸出 :s m x o a , gmxo a , d c t i mx a , vx_ctrll5[7:0] 及 B vx_ctrll6[7:0]。在系統開發期間將在系統電路板之積體 電路封裝上;以下 I/O端耦接至外部之FPGA:SI[15:0], S0[15:0],SO[47: 16],EXTCLK,延伸輸出或輸入 K, D0[ 23 : 0 ] , DI [ 23 : 0 ] , OUTCLK OUTPUT , OSD CLOCK , OSD OUTPUT 及 OSD INPUTS ° 雖然以指導性爲目的,本發明就有關某些特定實施例加 以說明,但本發明並不侷限於此。例如,利用一;i TAG分接 頭控制器可實現將積體電路置於測試模式之串列介面之功 128549.8 能。除一遮罩可程式部外’設置用以實現製造商特定::功 能之可製訂ASIC之可製訂部4可含一特定製造商可使用之 其它電路,例如爲一小處理器’一記憶區’小段之類比電 路,I / 0電路,匯流排介面電路,及可看到使用在不同型式 電子消費裝置製造商之實質系統子集中之其它小段之特殊 電路(例如,完全製訂或標準胞電路)。可將這些小段電 路修補在一起並由遮罩可程式之閘陣列部4之可程式相互 連結結構之適當程式化加以使用。可程式相互連結結構可 例如藉只變更一層導電穿孔加以程式化,其中,如上述, 該層導電穿孔爲製訂一遮罩可程式之閘陣列部之相同導電 穿孔層。介面電路不需包含一組輸出端及一組輸入端。介 面電路可例如含橫跨一匯流排或其它鏈結之可製訂AS I C與 外部FPGA間之雙向通信。介面電路之控制不需從一外部控 制源橫跨一串列介面。介面電路可以任何適當方式加以控 制,例如,經由I / 0端,可製訂AS I C可跨該I / 0端與外部 FPGA通信。藉由將一特定組態安置在可製訂ASIC之一或更 多I / 0端上面可將介面電路置於其測試模式。遮罩可程式 之閘陣列部1 1 0在某些實施例中亦可直接和記憶體控制區 塊1 2 3通信,使得遮罩可程式之閘陣列部1 1 〇可造成記憶 體控制區塊123從SDRM1 15擷取某資訊並將資訊轉送至一 指定點,如遮罩可程式之閘陣列部1 1 〇。類似地,遮罩可程 式之閘陣列部1 1 〇可與記憶體控制區塊1 2 3直接通信,使 記憶體控制區塊將某資訊(例如從遮罩可程式之閘陣列部 所擷取之資訊)儲存在SDRAM1 15內。當一區塊之實質上非 1285498 製訂硬體部用以回應命令寺’遮罩可程式之閘陣列部可發 出這種命令至該區塊。在一實例中’記憶體控制區塊1 2 3 含一 DMA引擎,其執行它從一 DMA命令疗列所收到之DMA 命令。遮罩可程式之閘陣列部1 1 0可將一命推向在DMA引 擎之DMA命令佇列上面,使得DMA引擎稍後接收命令自DMA 命令丨宁列並執行DMA命令。DMA命令可含所要移動資訊之訊 源標示和目的地標示。在一實例中’在生產版本系統中可 將遮罩可程式之閘陣列部1 1 〇直接耦接至生產版本系統之 一額外外部記憶體積體電路。與視訊處理功目纟相反的是’ 實質上非製訂硬體部可實施靜態影像處理功能’且與視訊 增進功能相反的是,遮罩可程式之閘陣列部可實施靜態影 像增進功能。因此,可實施所說明實施例各種特性之各種 修飾,調整與組合而不致偏離以下請求項目中所說明之本 發明範圍。 【圖式簡單說明】 第1圖爲根據一實施例之一方法及新穎積體電路之簡化 圖。 第2圖爲根據第1圖之方法及積體電路所開發一系統之 簡化方塊圖。 第3圖爲第2圖積體電路之更詳細方塊圖。實質上非製 訂硬體部比遮罩可程式之閘陣列部實質上佔用更多積體電 路面積。在第3圖中所說明積體電路之一特定實施例中, 實質上非製訂硬體部大槪佔用4 0mm2之積體電路面積,但是 遮罩可程式之閘陣列部大槪儲用3mm2。 -35- 1285498 第4 - 1 7圖說明第3圖積體電路之遮罩可程式之閘陣列部 之一特定實例。 第1 8圖說明根據另一特定實施例之介面電路。 主要部分之代表符號說明-31- 1285498 Demultiplexer, each destination can have a registered input, and can supply a signal to all inputs but only count the selected ones. Using one or more of the register bit contents can, for example, control the timing of which registration is entered. Other ways of expanding the number of sources and destinations at which the maskable gate array unit 110 is coupled may also be possible. Figure 12 is a detailed diagram of the giant cell structure, in which the giant cell logic is placed on the right edge of the giant cell. Figure 13 is a detailed view of the buffer and time pulse (BC) of Figure 5. The shared signal conductors / SET, CLK and / RST illustrated in Figures 1 2 and 13 are vertically extending the overall length of the five super cells in an uninterrupted manner. The conductors "1" and "0" indicate that the entire length of the five supercells extends vertically in an uninterrupted manner. These conductors are made wider and therefore more conductive than the other vertically extending conductors described. The conductor marked "1" is permanently coupled to VCC (supply voltage). The marked conductor is permanently coupled to ground potential. Fig. 14 is a schematic diagram showing the bottom-down diagram of the balanced clock-like structure of the mask programmable gate array 1 1 0 0. This structure is duplicated twice in the integrated circuit. The leaf of the first clock tree is represented by CLKTR1 (clock tree one). The leaf of the second clock tree is represented by CLKTR2 (clock tree II). The vertically extending clock tree leaflet conductors CLKTR1 and CLKTR0 in Fig. 13 are extended as shown in Fig. 14. The clock tree driver that balances the clock tree is placed in the horizontal gap between the input and output conductors of the SRAM block. As shown in Figure 14, there are three such gaps. Fig. 15 and Fig. 16 illustrate various logic gates and flip-flops which can be realized by constructing the giant cells of Fig. 12 in different ways. 1285498 Figure 1 7 shows a schematic diagram of a scan test interconnection structure. This structure links all the flip-flops of all the giant cells of the programmable gate array 1 1 0 to a long scan test displacement. In the chain of the register. In a test mode, a scan test clock signal is supplied to the SCAN CLOCK pulse line. Repeating the timing of the scan test clock signal causes the contents of the flip-flop to be removed in series from the maskable gate array unit. For the flip-flop symbol, /S I represents a scan test input pin, / SO represents a scan test output pin, and SCAN represents a scan clock input pin. > Figure 18 illustrates an interface circuit and a maskable gate array portion 110 in accordance with another embodiment. The illustrated I / 0 terminal is the I / 0 terminal of the integrated circuit 1 0 9 . The cell blocks labeled A, B, C, D, E, F, G, L, M and N are the configuration register bits of the built-in register. As noted above, the build register can be written via serial interface 148 (see Figure 3). The control signal CONTROL [40:0] contains the following inputs: sbufa, resetn, gmaina, dctina, hsync, vsync, vx-ctrll3[7:0], vx-ctrll4[7:0]; and the following output: smxoa, gmxo a , dcti mx a , vx_ctrll5[7:0] and B vx_ctrll6[7:0]. During system development, it will be packaged on the integrated circuit board of the system board; the following I/O terminals are coupled to the external FPGA: SI[15:0], S0[15:0], SO[47: 16], EXTCLK Extended output or input K, D0[23:0], DI[23:0], OUTCLK OUTPUT, OSD CLOCK, OSD OUTPUT and OSD INPUTS ° Although for the purpose of instruction, the present invention relates to certain specific embodiments. Note, but the invention is not limited thereto. For example, an i TAG tap head controller can be used to place the integrated circuit in the test mode serial interface function 128549.8. In addition to a maskable program, the ASIC can be developed to implement a manufacturer-specific:: functionality. The programmable unit 4 can include other circuits that can be used by a particular manufacturer, such as a small processor's memory area. 'Small segment analog circuits, I / 0 circuits, bus interface circuits, and special circuits that can be seen in other small segments of the actual system subset of different types of consumer electronics manufacturers (for example, fully developed or standard cell circuits) . These small sections of circuitry can be patched together and suitably programmed by the programmable inter-connected structure of the maskable gate array section 4. The programmable interconnect structure can be programmed, for example, by changing only one layer of conductive vias, wherein, as described above, the conductive vias are the same conductive via layers that define a maskable gate array. The interface circuit does not need to include a set of outputs and a set of inputs. The interface circuitry can, for example, include bidirectional communication between the AS I C and the external FPGA across a bus or other link. The control of the interface circuit does not need to span a serial interface from an external control source. The interface circuitry can be controlled in any suitable manner, for example, via the I/O terminal, the AS I C can be programmed to communicate with the external FPGA across the I/O terminal. The interface circuit can be placed in its test mode by placing a particular configuration on one or more I/O terminals of the ASIC. The maskable gate array portion 110 can also directly communicate with the memory control block 1 2 3 in some embodiments, so that the mask programmable gate array portion 1 1 can cause a memory control block 123 retrieves a piece of information from SDRM1 15 and forwards the information to a designated point, such as a maskable gate array 1 1 〇. Similarly, the maskable gate array portion 1 1 can communicate directly with the memory control block 1 2 3 to cause the memory control block to capture certain information (eg, from the mask programmable gate array portion). The information is stored in SDRAM1 15. When a block is not substantially 1285498, the hardware part is used to respond to the command temple's masked programmable gate array to issue such a command to the block. In one example, the 'memory control block 1 2 3' contains a DMA engine that executes the DMA commands it receives from a DMA command line. The maskable gate array 1 1 0 can push a life onto the DMA command queue of the DMA engine so that the DMA engine later receives the command from the DMA command and executes the DMA command. The DMA command can contain the source and destination indications of the information to be moved. In an example, the mask programmable gate array 1 1 〇 can be directly coupled to an additional external memory volume circuit of the production version system in a production version system. Contrary to the video processing power, the "substantially non-developed hardware can implement the still image processing function" and contrary to the video enhancement function, the mask programmable gate array can implement the static image enhancement function. Therefore, various modifications, adaptations and combinations of the various features of the described embodiments can be made without departing from the scope of the invention as set forth in the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a simplified diagram of a method and a novel integrated circuit according to an embodiment. Figure 2 is a simplified block diagram of a system developed in accordance with the method of Figure 1 and the integrated circuit. Figure 3 is a more detailed block diagram of the integrated circuit of Figure 2. The substantially non-customized hardware portion occupies substantially more integrated circuit area than the maskable gate array portion. In a specific embodiment of the integrated circuit illustrated in Fig. 3, substantially no hardware portion is occupied, and an integrated circuit area of 40 mm 2 is occupied, but the maskable gate array portion is stored at 3 mm 2 . -35- 1285498 Figure 4 - 1 7 illustrates a specific example of the maskable gate array of the integrated circuit of Figure 3. Figure 18 illustrates an interface circuit in accordance with another particular embodiment. Representative symbolic description of the main part

9,10,16,18,169 11,14,15 12,13,1 34,1 37,142,1 6 1 17 101 102 103 電子消費裝置系統 特殊應用積體電路 非製訂硬體部 金屬層 遮罩可程式之閘陣列部 箭尾 訊號源 金屬層 箭頭 目的地 輸出訊號目的地 FPGA開發系統 串列介面 I /〇端 線路 162 多工器 外部FPGA 視訊顯示系統 天線 同軸纜線 -36- 1285498 104 105 106 107 108 109,149 111 112 _ 113 114 115 1 16 117 1189,10,16,18,169 11,14,15 12,13,1 34,1 37,142,1 6 1 17 101 102 103 Electronic consumer device system special application integrated circuit non-developed hardware metal layer mask Program gate array arrow tail signal source metal layer arrow destination output signal destination FPGA development system serial interface I / terminal line 162 multiplexer external FPGA video display system antenna coaxial cable -36- 1285498 104 105 106 107 108 109,149 111 112 _ 113 114 115 1 16 117 118

119,120 121,124 1 22,1 25,1 30,1 73,1 32,1 41,1 65 123 127-129 13 1 133 135 1 3 6 , 1 3 9 , 1 5 6 - 1 60,1 63,1 66 - 1 68 138 視訊源 調諧器 I F解調器 類比轉數位轉換器 顯示處理器 積體電路 驅動器 陰極射線管 液晶顯示器銀幕 電漿顯示器 隨機存取記憶體 微控制器 音訊電路 喇叭 數位視訊輸入埠 格式檢測器 先進先出 記憶體控制區塊 緩衝器 輸出匯流排 定標器 增進區塊 匯流排 色彩空間轉換區塊 -37- 1285498 4 <119,120 121,124 1 22,1 25,1 30,1 73,1 32,1 41,1 65 123 127-129 13 1 133 135 1 3 6 , 1 3 9 , 1 5 6 - 1 60,1 63, 1 66 - 1 68 138 Video source tuner IF demodulator analog to digital converter display processor integrated circuit driver cathode ray tube liquid crystal display screen plasma display random access memory microcontroller audio circuit speaker digital video input 埠Format Detector FIFO Memory Control Block Buffer Output Bus Alignment Scaler Enhancement Block Busbar Color Space Conversion Block -37- 1285498 4 <

140 混色多工器 141 伽瑪修正及抖色區塊 143 數位轉類比轉換器 144 雙像素區塊 145,146 訊號端 150 資料線 15 1 時脈線 152 建置暫存器 153,154 鎖相廻路電路 155 晶石 190 雜訊減低區塊 38-140 color mixing multiplexer 141 gamma correction and dithering block 143 digital to analog converter 144 dual pixel block 145, 146 signal terminal 150 data line 15 1 clock line 152 built register 153, 154 phase locked loop circuit 155 crystal Stone 190 Noise Reduction Block 38-

Claims (1)

1285498 ^ r 第94 1 3 1 468號「具有本質上非製訂部分以多重色彩空間格式 提供像素資料至遮罩可程式部之可製訂特殊應用積體電路及 方法」專利案 (2 0 0 6年1 1月修正) 十、申請專利範圍: 1· 一種可製訂特殊應用之積體電路,包含: -實質上非製訂硬體部;以及 -遮罩可程式邏輯部,其耦接該遮罩可程式邏輯部,以 一第一色彩,空間格式從實質上非製訂硬體都接收第一像 素資料至以一第二色彩空間格式從實質上非製訂硬體部 接收第二像素資料。 2. 如申請專利範圍第丨項之積體電路,其中,該實質上非製 訂硬體部包含一色彩空間轉換電路。 3. 如申請專利範圍第1項之積體電路,其中,該實質上非製 訂硬體部實施一視訊處理功能,且其中,使該遮罩可程式 邏輯部爲遮罩程式化加以實施一增進功能。 4 ·如申請專利範圍第1項之積體電路,其中,耦接該遮罩可 程式邏輯部,經由一第一並列匯流排以第一色彩空間格式 從實質上非製訂硬體部接收第一像素資料,該遮罩可程式 邏輯部更從表示第一並列匯流排上是否存在有效像素資 料之實質上非製訂硬體部接收一訊號。 5.如申請專利範圍第4項之積體電路,其中,耦接該遮罩可 程式邏輯部,經由一第二並列匯流排以第一色彩空間格式 將第三像素資料輸出至實質上非製訂硬體部,該遮罩可程1285498 ^ r No. 94 1 3 1 468 "There are essentially non-developed parts that provide pixel applications to the maskable part of the multi-color space format to develop special application integrated circuits and methods" patent case (2006) 1 January revision) X. Patent application scope: 1. An integrated circuit that can be used for special applications, including: - substantially non-developed hardware; and - mask programmable logic, coupled to the mask The program logic unit receives the first pixel data from the substantially non-developed hardware in a first color, spatial format, and receives the second pixel data from the substantially non-developed hardware portion in a second color space format. 2. The integrated circuit of claim </ RTI> wherein the substantially non-customized hardware portion comprises a color space conversion circuit. 3. The integrated circuit of claim 1, wherein the substantially non-developed hardware portion implements a video processing function, and wherein the mask programmable logic portion is implemented by masking the program Features. 4. The integrated circuit of claim 1, wherein the mask programmable logic unit is coupled to receive the first non-developed hardware portion in a first color space format via a first parallel bus. The pixel data, the mask programmable logic unit further receives a signal from a substantially non-developed hardware portion indicating whether there is valid pixel data on the first parallel bus. 5. The integrated circuit of claim 4, wherein the mask programmable logic unit is coupled to output the third pixel data in a first color space format to a substantially non-developed manner via a second parallel bus. Hardware part, the mask can be 1285498 式邏輯部輸出一訊號至表示第二並列匯流排上是否存在 有效像素資料之實質上非製訂硬體部。 6. 如申請專利範圍第1項之積體電路,其中,使該遮罩可程 式邏輯部爲遮罩程式化,對第一像素資料實施一增進功能 ,該增進功能來自下列所構成之族群:白色位階增進,黑 色位階增進,色彩直方圖延伸,膚色增進,水平DLTI, 峯値過濾,顯示控制及DCTI (數位色訊瞬態校正),且 其中,第一色彩空間格式爲YCbCr色彩空間。 7. 如申請專利範圍第1項之積體電路,其中,使該遮罩可程 式邏輯部爲遮罩程式化,對第一像素資料實施一增進功能 ,該增進功能來自以下所構成之族群:伽瑪修正及抖色, 其中,第一色彩空間格式爲RGB色彩空間。 8. 如申請專利範圍第1項之積體電路,其中,實質上非製訂 硬體部比遮罩可程式邏輯部實質上佔用更多之積體電路 裸晶區。 9. 如申請專利範圍第1項之積體電路,其中,該積體電路位 在一視訊顯示裝置中。 ! 〇 .如申請專利範圍第1項之積體電路,其中,該實質上非製 訂硬體部包含一配置暫存器’且其中’該實質上非製訂硬 體部可藉由將配置資訊寫入配置暫存器內加以建置。 i !.如申請專利範圍第1項之積體電路,其中,至少以部分標 準胞實現該實質上非製訂硬體部。 1 2.如申請專利範圍第1 1項之積體電路’更包含: 將一外部FPG A接合至該積體電路之介面電路。 -2- 1285498 I___ι________ ί 修A)正替換頁 1 3 · —種可製訂特殊應用之積體電路,包含: -實質上非製訂硬體部;以及 -遮罩可程式邏輯部,耦接該遮罩可程式邏輯部,以一 第一色彩空間格式或一第二色彩空間格式中可選定之一 格式從實質上非製訂硬體部接收像素資料。 1 4 ·如申請專利範圍第1 3項之積體電路,其中,該積體電路 包含: -多工器,該多工器可選定以第一色彩空間格式將像素 資料供應至遮罩可程式邏輯部或以第二色彩空間格式將 像素資料供應至遮罩可程式邏輯部。 1 5 ·如申請專利範圍第1 4項之積體電路,其中,該多工器爲 遮罩可程式邏輯部之一部分。 16·如申請專利範圍第14項之積體電路,其中,該多工器爲 實質上非製訂硬體部之一部分。 1 7 ·如申請專利範圍第1 3項之積體電路,更包含: 將一外部FPG A接合至該積體電路之介面電路。 18·—種可製訂特殊應用積體電路之方法,包含: 在一積體電路之一實質上非製訂硬體部中實施一視訊 處理功能,該實質上非製訂硬體部以一第一色彩空間格式 及一第二色彩空間格式輸出像素資料; 接收在第一色彩空間格式之像素資料至該積體電路之 一遮罩可程式邏輯部上面;以及 接收在第二色彩空間格式之像素資料至該積體電路之 遮罩可程式邏輯部上面。 1285498 年月日修(¾正替換頁 **- ' % .t:U -----------------,,-..一’ 1 9 ·如申請專利範圍第1 8項之方法,其中,該第一色彩空間 格式爲一 YCbCr色彩空間格式,且其中,該第二色彩空間 格式爲一 RGB色彩空間格式。 20·—種可製訂特殊應用之積體電路,包含: -實施一視訊處理功能之實質上非製訂硬體部;以及 裝置,從實質上非製訂硬體部接收用於在一第一色彩空 間格式之像素資料,及從實質上非製訂硬體部接收在一第 二色彩空間格式像素資料,其中,該裝置爲可遮罩程式化。 21·如申請專利範圍第20項之積體電路,其中,該裝置含一 個數量之遮罩可程式邏輯,且其中,使該裝置爲遮罩程式 化以實施一視訊增進功能。 22.如申請專利範圍第21項之積體電路,其中,該實質上非 製訂硬體部包含一色彩空間轉換電路。The 1285498 logic outputs a signal to a substantially non-developed hardware portion representing whether there is valid pixel data on the second parallel bus. 6. The integrated circuit of claim 1, wherein the mask programmable logic is programmed to perform a promotional function on the first pixel data, the enhancement function being from the following group: White level enhancement, black level enhancement, color histogram extension, skin color enhancement, horizontal DLTI, peak filtering, display control, and DCTI (digital color transient correction), and wherein the first color space format is the YCbCr color space. 7. The integrated circuit of claim 1, wherein the mask programmable logic portion is programmed to perform a enhancement function on the first pixel data, the enhancement function being from the following group: Gamma correction and dithering, wherein the first color space format is an RGB color space. 8. The integrated circuit of claim 1, wherein the substantially non-developed hardware portion substantially occupies more of the integrated circuit die area than the mask programmable logic portion. 9. The integrated circuit of claim 1, wherein the integrated circuit is located in a video display device.如. The integrated circuit of claim 1, wherein the substantially non-developed hardware includes a configuration register and wherein the substantially non-developed hardware can be written by configuring information Into the configuration register to be built. i. The integrated circuit of claim 1, wherein the substantially non-developed hardware portion is implemented by at least a part of the standard cells. 1 2. The integrated circuit as claimed in claim 11 further includes: an external FPG A bonded to the interface circuit of the integrated circuit. -2- 1285498 I___ι________ ί Repair A) Replacement Page 1 3 · An integrated circuit that can be used for special applications, including: - Substantially non-developed hardware; and - Mask programmable logic, coupled to the mask The mask programmable logic receives the pixel data from the substantially non-developed hardware in a selectable one of a first color space format or a second color space format. 1 4 . The integrated circuit of claim 13 wherein the integrated circuit comprises: - a multiplexer, the multiplexer being operative to supply pixel data to the mask in a first color space format The logic supplies the pixel data to the mask programmable logic in a second color space format. 1 5 . The integrated circuit of claim 14 wherein the multiplexer is part of a maskable logic portion. 16. The integrated circuit of claim 14, wherein the multiplexer is substantially non-developed as part of the hardware portion. 1 7 · The integrated circuit of claim 13 of the patent scope further includes: bonding an external FPG A to the interface circuit of the integrated circuit. 18. A method for formulating a special application integrated circuit, comprising: implementing a video processing function in a substantially non-developed hardware portion of an integrated circuit, the substantially non-developed hardware portion having a first color a spatial format and a second color space format output pixel data; receiving pixel data in a first color space format onto a maskable logic portion of the integrated circuit; and receiving pixel data in a second color space format to The mask of the integrated circuit is above the programmable logic. Repair of the month of 1285498 (3⁄4 is replacing the page **- ' % .t:U -----------------,,-..一' 1 9 ·If the patent application scope The method of item 18, wherein the first color space format is a YCbCr color space format, and wherein the second color space format is an RGB color space format. 20 - an integrated circuit capable of formulating a special application Included: - a substantially non-developed hardware portion that implements a video processing function; and a device that receives pixel data for use in a first color space format from a substantially non-developed hardware portion, and The body receives pixel data in a second color space format, wherein the device is maskable. 21. The integrated circuit of claim 20, wherein the device includes a number of masks Logic, and wherein the device is programmed as a mask to implement a video enhancement function. 22. The integrated circuit of claim 21, wherein the substantially non-developed hardware portion comprises a color space conversion circuit .
TW94131468A 2004-09-17 2005-09-13 Customizable ASIC and method, with substantially non-customizable portion that supplies pixel data to a mask-programmable portion in multiple color space formats TWI285498B (en)

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