1282900 九、發明說明： 【發明所屬之技術領域】 本發明係涉及-種光學系統，尤其是—種4縮短光程之 光學系統。 【先前技術】 請參閱「第1圖」，所示為習用之鏡頭成像品質檢測光 學系統架構® ’對於透鏡的雜品質，最常用雜測方式即 是利用標準化樣板·作為觀看之物，且此樣板⑽透過待 測透鏡110而成像於-影像感測元件120，因此，在量測步 驟上’必須將此樣板100設置於相距此待測透鏡11〇不同距 ， 離之位置，予以量測，但是量測條件是：不管樣板100距離 ' 待測透鏡110多遠，每一個樣板⑽透過待測透鏡110所成 像之大小皆需相同，因此’為了滿足此條件，隨著樣板100 鲁 ，位置距離待測透鏡110之距離越遠時，樣板⑽的尺寸也 就必須變得更大’如此方可符合上述的量測條件，如「第i ®」巾的應、麵、三讎板⑽的尺寸隨著距離待 測透鏡110越遠，樣板100的尺寸越來越大，如此，相當不 具經濟效益，而且量測所需的空間、更換樣板⑽所需的時 間與人力皆造成量測的不便，以及設備空間的魔大。相關技 術如中華民國專利公報公告號第M253795與M253796號專 利，揭露-種執道式對紐測酿—種用於相機鏡頭之對焦 1282900 此結 自為更換樣板之結構，與調整樣板結構為主，〜巧 t疋只能驗短距離_】方式，_彳距離需達幾公尺 長犄，此結構將變得非常龐大。 【發明内容】 一上的問題’本發明的主要目的在於提供-種縮短 先程之光學系統’藉以縮小整料、統賴的長度，且可用以 模擬大於幾倍以上此_紐的量測範圍。 因此，為達上述目的’本發明所揭露之—種縮短光程之 光子系統，包含有—成像透鏡，於此成像透鏡之-侧設有一 物’此物係具有·件鱗效物件，且此職件與成像透鏡 之距離定為原物距，因此’具有原物件之物透過成像透鏡可 產，原衫像’另外於物與成像透鏡之間置入一等效透鏡，並 轉效透鏡相距具有等效物件之物為次物距，同樣地，此具 2效物件之物便透過成像透鏡鮮效透鏡產生次影像，此次 影像與原影像大小相同，因此，經由輕透鏡的設置可使等 效物件取代原物件’且使原物件所在之原物距亦可縮短為等 文物件所在之次物距，因此，本發明之縮短絲之光學系統 可減少原本所需長距離的系統架構。 不僅如此，等效透鏡與成像透鏡係間隔一物距，在運用 相同的物與紐透鏡之條件τ，當我們改變物距，可用以模 擬某-位置之物’即改變原物距與原物件，代表著等效物件 1282900 與-人物距可等效於改變位置後之原物距與原物件。 而且原物距與次物距之關係可經由等效透鏡之焦距與 成像透鏡之:t距與等效透鏡與絲麵之間距所求得，其關 係式為： 丄-丄^ s“' — Tij; 其中·· S2為原物距，1282900 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to an optical system, and more particularly to an optical system that shortens the optical path. [Prior Art] Please refer to "Figure 1", which shows the conventional lens imaging quality inspection optical system architecture. 'For the miscellaneous quality of the lens, the most common method of miscellaneous measurement is to use the standard model as the viewing object, and this The template (10) is imaged on the image sensing component 120 through the lens 110 to be tested. Therefore, in the measuring step, the template 100 must be placed at a different distance from the lens 11 to be tested, and the position is measured. However, the measurement condition is: no matter how far the template 100 is from the lens 110 to be tested, the size of each template (10) to be imaged through the lens to be tested 110 needs to be the same, so 'to meet this condition, along with the template 100, the position distance The farther the distance of the lens 110 to be tested is, the larger the size of the template (10) must be. This is in order to meet the above measurement conditions, such as the size of the "i-th" towel, the surface, and the size of the three-plate (10). As the distance from the lens 110 to be tested is further, the size of the template 100 is getting larger and larger, so that it is not economically advantageous, and the space required for measurement, the time required for changing the template (10), and the manpower are measured. Inconvenience, and a large magic equipment space. Related technologies, such as the Republic of China Patent Gazette No. M253795 and M253796 patents, disclose a kind of obsolete type of contrast-type brewing - the focus used for camera lens 1282900. This is the structure of the replacement template, and the adjustment of the model structure , ~ Qiao t疋 can only test the short distance _] way, _ 彳 distance needs to reach a few meters long, this structure will become very large. SUMMARY OF THE INVENTION The problem of the present invention is to provide a short-cut optical system to reduce the length of the monolith and the associated length, and can be used to simulate a measurement range greater than several times. Therefore, in order to achieve the above object, the optical path subsystem for shortening the optical path disclosed in the present invention includes an imaging lens, and the object side of the imaging lens is provided with a material that has a squash object, and this The distance between the job and the imaging lens is determined as the original distance. Therefore, the object with the original object can be produced through the imaging lens. The original shirt is like 'an equivalent lens is placed between the object and the imaging lens, and the lens is separated by the effect lens. The object with the equivalent object is the secondary object distance. Similarly, the object with the two-effect object generates the secondary image through the fresh lens of the imaging lens. The image is the same size as the original image, so the setting of the light lens can be made. The equivalent object replaces the original object' and the original object distance of the original object can also be shortened to the secondary object distance where the object is located. Therefore, the optical system of the shortened wire of the present invention can reduce the system architecture originally required for a long distance. Moreover, the equivalent lens is spaced apart from the imaging lens by an object distance. When the same object and the lens are used, the condition τ, when we change the object distance, can be used to simulate a certain position - that is, change the original distance and the original object. , representing the equivalent object 1282900 and the character distance can be equivalent to the original object distance and the original object after changing the position. Moreover, the relationship between the original object distance and the secondary object distance can be obtained by the focal length of the equivalent lens and the distance between the imaging lens and the distance between the equivalent lens and the silk surface, and the relationship is: 丄-丄^ s"' Tij; where ··· S2 is the original distance,
Sl為次物距， f2為等效透鏡之焦距， 為成像透鏡之焦距， d為等效透鏡與成像透鏡之間距。 因此，本發明之縮短光程之光學系統可運用於許多的場 合中，我們可將此縮短光程之光學系統運用於一鏡頭成像品 質之檢測系統中，此鏡頭成像品質之檢測系統中包含一檢測 板、一影像感測元件、一待測透鏡與一影像處理裝置，此檢 測板透過待測透鏡而成像於影像感測元件，此感測元件產生 一影像訊號，傳輸至影像處理裝置，而此影像處裝置再加以 分析此影像訊號，而評估此鏡頭之優劣，並且我們再加入一 等效透鏡予檢測板與待測透鏡之間，如此只需一個檢測板即 可用以等效不同的檢測位置所需不同的檢測板尺寸。 本發明之縮短光程之光學系統，可使原本需有很長的系 統長度，透過等效透鏡予以縮短。 1282900 並且本發明之縮短光程之光學系統只需增加一等效透 鏡”固疋之物且移動此等效透鏡，即可等效不同位置之 物，使得此等效透鏡與此固定之物，經過成像透鏡所成之像， 可模擬位於不同位置之物，經過祕透鏡所成之像，如此， 便可模擬不同位置的物，且不管位置如何改變，其像的大小 與位置皆必須相同。 *因此’本發明之光學系統中可利用既有的尺寸大小，可 模擬成A尺長的1測距離，所以，本發日狀光料統具有小 尺寸而可類某-制距離，具有量峨雜輕間成本考 量。 有關本备明的特徵與貫作，茲配合圖示作最佳實施例詳 細說明如下。 【實施方式】 请芩閱「第2圖」，所示為本發明之縮短光程之光學系 統架構圖，本發縣為_種縮短絲之光學系統，係藉由加 入一等效透鏡330，以縮短光程，如此便可使整個光學系統 體積縮小。 本發明之縮短光程之光學系統包含一成像透鏡300，且 有一物310置於成像透鏡3〇〇之一側，此物31〇係包含有原 物件311與等效物件313,並且此原物件311與成像透鏡3〇〇 係間隔一原物距&，因此，此原物件31ι可透過成像透鏡3〇〇 9 1282900 於成像面350產生一原影像（圖未顯示）。 物310與成像透鏡3〇〇之間再加入等效透鏡33〇，此等 效透鏡330與等效物件313間隔一次物距Si，且等效物件313 亦透過成像透鏡3GG與等效透鏡，於成像面亦產生 次影像（圖未顯示），而且此次影像與原影像大小相同，因此， 經由加入-等效透鏡330使等效物件313可取代原物件 311，並且使原物距&縮短為次物距Si。 因此，本發明之縮短光程之光學系統，可使原本需距離 頗長之糸統架構，予以大幅縮短。 另外，等效透鏡330與成像透鏡3〇〇間隔一間距d，經 由使成像透鏡300不動，並移動等效透鏡33〇，進而調整間 距d與次物距&，來使本發明之縮短光程之光學系統，可等 效於與成像透鏡3〇〇距離某一原物距&之某一原物件之 大小。 接下來便來說明縮短光短之光學系統之原理，原物件 311距離成像透鏡300為一原物距&，且像距為&，而此成 像透鏡300之焦距為fl，代入幾何光學之成像公式可得： 1 1 1 m (ι) 現於成像透鏡300與物310之原物件311之間插入一等 效透鏡330，此等效透鏡330的焦距為l，且此等效透鏡33〇 與成像透鏡300的間隔為間距d，而等效透鏡330與物31〇 10 1282900 之等效物件313之間隔為次物距&，代入幾何光學之合成焦 距公式可得合成焦距f為： 另外’加入等效透鏡330後，物310之等效物件313亦 代入幾何光學之成像公式中，且其所成之像距Si與未加入等 效透鏡330之像距Si須相同，因此，可得：Sl is the secondary object distance, f2 is the focal length of the equivalent lens, is the focal length of the imaging lens, and d is the distance between the equivalent lens and the imaging lens. Therefore, the optical system for shortening the optical path of the present invention can be applied to many occasions, and the optical system for shortening the optical path can be applied to a detection system for image quality of a lens, and the detection system for image quality of the lens includes one. a detection board, an image sensing component, a lens to be tested, and an image processing device. The detection panel is imaged by the lens to be tested on the image sensing component, and the sensing component generates an image signal and transmits the image signal to the image processing device. The image device then analyzes the image signal to evaluate the advantages and disadvantages of the lens, and we add an equivalent lens between the detection plate and the lens to be tested, so that only one detection plate can be used for equivalent detection. The different test board sizes required for the location. The optical system for shortening the optical path of the present invention allows a long system length to be shortened by an equivalent lens. 1282900 and the optical system for shortening the optical path of the present invention only needs to add an equivalent lens to the solid object and move the equivalent lens to be equivalent to different positions, so that the equivalent lens and the fixed object, Through the image formed by the imaging lens, it can simulate the objects located at different positions and through the image formed by the secret lens. Thus, the objects at different positions can be simulated, and the size and position of the image must be the same regardless of the position. * Therefore, the optical system of the present invention can utilize the existing size and can be simulated as a measuring distance of A-length. Therefore, the hair-lighting material of the present invention has a small size and can be a certain distance. The following is a detailed description of the features and implementations of the present invention. The following is a detailed description of the preferred embodiment. [Embodiment] Please refer to "Figure 2" for the shortening of the present invention. The optical system architecture diagram of the optical path, Benfa County is an optical system for shortening the wire, by adding an equivalent lens 330 to shorten the optical path, so that the entire optical system can be reduced in size. The optical path for shortening the optical path of the present invention comprises an imaging lens 300, and an object 310 is placed on one side of the imaging lens 3, and the object 31 includes the original object 311 and the equivalent object 313, and the original object The 311 is spaced apart from the imaging lens 3 by an original distance & therefore, the original object 31 ι can generate an original image (not shown) on the imaging surface 350 through the imaging lens 3 〇〇 9 1282900. An equivalent lens 33A is further added between the object 310 and the imaging lens 3〇〇. The equivalent lens 330 is spaced from the equivalent object 313 by a distance Si, and the equivalent object 313 is also transmitted through the imaging lens 3GG and the equivalent lens. The imaging surface also produces a secondary image (not shown), and the image is the same size as the original image. Therefore, the equivalent object 313 can be replaced by the original-object 311 via the addition-equivalent lens 330, and the original distance & For the secondary object distance Si. Therefore, the optical system for shortening the optical path of the present invention can greatly shorten the structure of the conventional system which requires a long distance. In addition, the equivalent lens 330 is spaced apart from the imaging lens 3 by a distance d, and the optical lens of the present invention is shortened by moving the imaging lens 300 and moving the equivalent lens 33A, thereby adjusting the pitch d and the secondary object distance & The optical system of Cheng can be equivalent to the size of an original object from an original object distance & Next, the principle of shortening the optical system of short light will be described. The original object 311 is an original object distance from the imaging lens 300, and the image distance is & and the focal length of the imaging lens 300 is fl, which is substituted into geometric optics. The imaging formula can be obtained as follows: 1 1 1 m (ι) An equivalent lens 330 is inserted between the imaging lens 300 and the original object 311 of the object 310. The focal length of the equivalent lens 330 is 1, and the equivalent lens 33〇 The spacing from the imaging lens 300 is the distance d, and the interval between the equivalent lens 330 and the equivalent object 313 of the object 31〇10 1282900 is the secondary object distance & the synthetic focal length formula substituted into the geometrical optics can be obtained as the composite focal length f: 'After the addition of the equivalent lens 330, the equivalent object 313 of the object 310 is also substituted into the geometrical optical imaging formula, and the image distance Si is the same as the image distance Si of the equivalent lens 330. Therefore, it is available. :
由第（1)式減去第（3)式可得： 由上式中可知原物距&與次物距Si的關係可由成像透 鏡300的焦距h與等效透鏡33〇的焦距h，以及間距d可求 出0Subtracting the equation (3) from the equation (1), it can be seen from the above equation that the relationship between the original object distance & and the secondary object distance Si can be obtained by the focal length h of the imaging lens 300 and the focal length h of the equivalent lens 33〇, And the spacing d can be found 0
若我們欲將位於原物距&為2公尺的物310之原物件 311原本只經由成像透鏡300而成像於成像面350上，現在 我們加入等效透鏡330後，使物310之等效物件313位於次 物距&位於1公尺，且此物31〇之等效物件313經由等效透 鏡330與成像透鏡3〇〇而成像於成像面350上，若此成像透 鏡300的焦距fi為6 mm，且間距d亦設定為12麵時，將上 述數值代入第（4)式，則此等效透鏡330之焦距h經由計 异而得焦距5為-2000 mm，此負號代表等效透鏡330為一凹 11If we want to image the original object 311 of the object 310 at the original distance & 2 meters, which is originally imaged on the imaging surface 350 via the imaging lens 300, now we add the equivalent lens 330 to make the equivalent of the object 310. The object 313 is located at a distance of 1 meter and the equivalent object 313 of the object 31 is imaged on the imaging surface 350 via the equivalent lens 330 and the imaging lens 3, if the focal length of the imaging lens 300 is fi When the distance is set to 12, and the above value is substituted into the formula (4), the focal length h of the equivalent lens 330 is calculated by the difference of the focal length 5 to be -2000 mm, and the negative sign represents Effect lens 330 is a concave 11
1282900 透鏡，其焦距為-2公尺，因此，加入了等效透鏡330後，使 原本物310之原物件311位於原物距&，可縮短為之次物距 &，且物310由等效物件313取代，以縮小系統的長度與物 310之尺寸。 接下來我們將成像透鏡300的焦距h與等效透鏡330的 焦距f2代入合成焦距公式，可得合成焦距f為·· 丄=丄；」 12 二1 1—丄 / 6 ^2000 (6Χ-2000)"6 Γ〇〇〇^6 所以合成焦距f與成像透鏡300之焦距6相當接近，因 此，對於加入等效透鏡330搭配位於次物距&之物31〇之等 效物件313，同樣具有與原物距&之原物件311相同的成像 位置與大小。 另外，本發明之縮小光程之光學系統，經由調整間距d 情況下，可等效於位在不同原物距&的物31〇，同樣可由第 (4)式中求得，第⑷式中我們已知成像透鏡3〇〇的焦距 h與等效透鏡330的焦距f,，且次物距Sl皆已知，所以只剩 下原物距S2與間距d為餐數，將上述值代入第（4)式中， 可得： 52 1000 —2000 經由整理後可得 ⑸ 12 l2829〇〇 當我們欲等效的原物距S2為已知時，透過第（5)式即 可求出間距d ’因此’欲等效某一原物距S2代入第（5)式中， 即可知調整間距d為計算之數值時，便是等效某一原物距& . 的值。 • 請參閱「第3圖」所示為本發明之一種縮短光程之鏡頭 成像品質檢測糸統架構圖’係運用先前所描述之縮短光程之 光學系統，以量測一待測透鏡500之成像品質，首先位於待 鲁 測透鏡500之一側設有一檢測板510，此檢測板510設有一 原檢檢測板511與一等效檢檢測板513,且此原檢檢測板5Π 與待測透鏡500相距一原物距&，且於待測透鏡500另一側 • 設有一影像感測元件550，且此影像感測元件550與待測透 ， 鏡500間隔一像距S,，因此，原檢檢測板511透過待測透鏡 500成像於影像感測元件550,使影像感測元件550產生一影 像訊號，並且藉由影像處理裝置570予以接收此影像訊號， • 經由影像處理裝置570分析此影像訊號，用以評量此待測透 鏡500之成像品質。 — 另外，再利用一等效透鏡590設置於檢測板510與待測 - 透鏡500之間’使得我們可利用固定尺寸的檢測板510 (即 等效檢測板513)用以等效某一距離之檢測板510 (即原檢測 板511)之尺寸，以取代不同的檢測板510位置，為滿足檢 測板510位於不同位置時，經由待測透鏡500皆產生相同大 13 1282900 小且位置不變之影像，使得檢測板510位於不同位置時，所 需檢測板510之尺寸亦有變化，而本發明之縮小光程之鏡頭 成像品質檢測系統只利用一固定尺寸的檢測板51〇 (即等效 檢測板513)與等效透鏡590可模擬各種不同位置且不同尺 寸之檢測板510，如此可大大地減小所需檢測板51〇的使用 量，並且，也不必隨著檢測板510位置距離待測透鏡5〇〇越 遠，所需的檢測板510尺寸必須越大。 一般標準的鏡頭成像品質之檢測板51()，皆是利用美國 空軍於1951年開發出來，軍用代號為MIL一STD—15〇A的型式， 主要適用於偵照設備的檢測，後來變為民用鏡頭與顯微鏡的 測試標準，如第4圖，藉著USAF1951透鏡檢測圖（USAF 1951 Lens Test Chart)可用以測視此透鏡的成像品質。 待測透鏡500為一數位相機取像鏡頭，亦可為不同的取 像鏡頭或其它成像鏡頭。 其中系統的影像感測元件550最常為電荷藕合元件 (CCD)或是互補金屬氧化半導體影像感測器（CM〇s sensor )，此電荷藕合元件或互補金屬氧化半導體影像感測器 接受光線會產生電流，且依不同波長感測出不同的電流，因 此可呈現彩色效果，所以當檢測板51〇透過等效透鏡59〇與 待測透鏡500而成像於影像感測元件55〇時，進而產生影像 訊號。 14 1282900 —口此’經由本發明之縮短絲之鏡頭成像品質檢測系統 面、用單-檢測板（g卩等效檢測板沿）即可等效位於 ^種不同位置娜職（即細職5U )，故本發明之縮短 望知之鏡頭成像品質檢測系統除了只用單—檢測板外，藉由 透鏡肋縮短光程，以_等效不同位置的檢測板，另 方面，當我們移動等效透鏡時，便可用來調整所須模擬的 某-位置之檢測板，其調整關係式為前文所說明的第⑷式。 雖然本發_前述之較佳實施_露如上，然其並非用 以限定本發明，任何熟習赠者，在视離本發明之精 神和範_，當可作些許之更動與潤飾，因此本發明之專利 保護範_視本制書_之申料鋪騎界定者為準。 【圖式簡單說明】 「第1圖」係顯示習用鏡頭成像品質檢測架構圖。 「第2圖」係顯示本發明之縮短光程之光學系統架構圖。 「第3圖」係顯示本發明之縮短光程之鏡頭成像品質檢測架 構圖。 「第4圖」係顯示本發明之檢顺示意圖。 【主要元件符號說明】 100、l〇〇a、l〇〇b、100c 樣板 110待測透鏡 120影像感測元件 15 1282900 300成像透鏡 310物 311原物件 313等效物件 330等效透鏡 350成像面 500待測透鏡 510檢測板 511原檢測板 513等效檢測板 550影像感測元件 570影像處理裝置 590等效透鏡 S2原物距 Si次物距 Si像距 fl成像透鏡之焦距 f2等效透鏡之焦距 f合成焦距 d間距 161282900 lens, the focal length is -2 meters, therefore, after the equivalent lens 330 is added, the original object 311 of the original object 310 is located at the original object distance &, can be shortened to the second object distance & Equivalent object 313 is substituted to reduce the length of the system and the size of object 310. Next, we substitute the focal length h of the imaging lens 300 and the focal length f2 of the equivalent lens 330 into the synthetic focal length formula, and obtain the resultant focal length f as ·· 丄=丄;” 12 2 1 1—丄/ 6 ^2000 (6Χ-2000 ) "6 Γ〇〇〇^6 Therefore, the resultant focal length f is quite close to the focal length 6 of the imaging lens 300, and therefore, for the equivalent lens 313 which is added to the equivalent lens 330 and the object of the second object distance & It has the same imaging position and size as the original object 311 of the original object & Further, the optical system for reducing the optical path of the present invention can be equivalent to the object 31 位 at a different original object distance by adjusting the pitch d, and can also be obtained by the formula (4), the formula (4) We know the focal length h of the imaging lens 3〇〇 and the focal length f of the equivalent lens 330, and the secondary object distance S1 is known, so only the original distance S2 and the spacing d are the number of meals, and the above values are substituted. In the formula (4), you can get: 52 1000 — 2000 After finishing, you can get (5) 12 l2829. When we want the equivalent original distance S2 to be known, we can find the spacing through the formula (5). d ' Therefore 'to be equivalent to an original from S2 into equation (5), it can be known that the adjustment interval d is the calculated value, which is equivalent to the value of a certain original distance & • Please refer to “Figure 3” for a lens image quality inspection system for shortening the optical path of the present invention. The optical system for shortening the optical path described above is used to measure a lens to be tested 500. The image quality is firstly disposed on one side of the lens to be tested 500. The detecting board 510 is provided with an original detecting board 511 and an equivalent detecting board 513, and the original detecting board 5Π and the lens to be tested are provided. 500 is separated from an original object distance & and on the other side of the lens to be tested 500. An image sensing element 550 is disposed, and the image sensing element 550 is spaced apart from the mirror 500 by an image distance S, and therefore, The image detecting device 550 is imaged by the image sensing device 550, and the image sensing device 550 generates an image signal, and the image processing device 570 receives the image signal. The image processing device 570 analyzes the image signal. The image signal is used to measure the imaging quality of the lens to be tested 500. - In addition, an equivalent lens 590 is disposed between the detecting plate 510 and the lens-to-measurement 500 so that we can utilize a fixed-size detecting plate 510 (ie, the equivalent detecting plate 513) for equivalent distance. The size of the detecting board 510 (ie, the original detecting board 511) is substituted for the position of the different detecting board 510. When the detecting board 510 is located at different positions, the same large 13 1282900 small and constant position image is generated via the lens to be tested 500. When the detecting board 510 is located at different positions, the size of the required detecting board 510 also changes, and the lens optical quality detecting system of the reduced optical path of the present invention uses only a fixed size detecting board 51 (ie, an equivalent detecting board). 513) and the equivalent lens 590 can simulate the detection plate 510 of various different positions and different sizes, so that the usage amount of the required detection plate 51A can be greatly reduced, and it is not necessary to follow the position of the detection plate 510 to the lens to be tested. The farther away, the larger the required detection plate 510 must be. The general standard lens imaging quality detection board 51() is developed by the US Air Force in 1951. The military code is MIL-STD-15〇A. It is mainly used for the detection of surveillance equipment and later became civilian. The lens and microscope test standards, as shown in Figure 4, can be used to measure the image quality of this lens by means of the USAF 1951 Lens Test Chart. The lens to be tested 500 is a digital camera taking lens, and may be a different taking lens or other imaging lens. The image sensing component 550 of the system is most often a charge coupled component (CCD) or a complementary metal oxide semiconductor image sensor (CM〇s sensor), and the charge matching component or the complementary metal oxide semiconductor image sensor accepts The light generates a current and senses different currents according to different wavelengths, so that a color effect can be exhibited. Therefore, when the detecting plate 51 is imaged by the equivalent lens 59 and the lens 500 to be tested and imaged on the image sensing element 55, In turn, an image signal is generated. 14 1282900 - mouth this 'through the shortened wire lens imaging quality inspection system surface of the present invention, with a single-test plate (g卩 equivalent detection plate edge) can be equivalently located in different positions of Na Na (ie, fine 5U Therefore, the lens imaging quality detection system of the present invention shortens the optical path by the lens rib except that the single-detection plate is used, and the detection plate of different positions is equivalent to _, when we move the equivalent lens At this time, it can be used to adjust the detection plate of a certain position to be simulated, and the adjustment relationship is the formula (4) described above. Although the present invention has been described above, it is not intended to limit the present invention, and any person skilled in the art, while departing from the spirit and scope of the present invention, may make some modifications and retouching, and thus the present invention The patent protection model is based on the definition of the book. [Simple description of the drawing] "1st picture" shows the architecture image quality inspection architecture of the conventional lens. Fig. 2 is a view showing the structure of the optical system for shortening the optical path of the present invention. Fig. 3 is a view showing the composition of the lens imaging quality detecting frame for shortening the optical path of the present invention. Fig. 4 is a schematic view showing the inspection of the present invention. [Main component symbol description] 100, l〇〇a, l〇〇b, 100c template 110 to be tested lens 120 image sensing element 15 1282900 300 imaging lens 310 object 311 original article 313 equivalent object 330 equivalent lens 350 imaging surface 500 to be tested lens 510 detection plate 511 original detection plate 513 equivalent detection plate 550 image sensing element 570 image processing device 590 equivalent lens S2 original distance Si secondary object distance Si image distance f imaging lens focal length f2 equivalent lens Focal length f synthetic focal length d spacing 16