TWI270215B - Optoelectronic semiconductor component and housing base-body for such a component - Google Patents

Optoelectronic semiconductor component and housing base-body for such a component Download PDF

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Publication number
TWI270215B
TWI270215B TW94117613A TW94117613A TWI270215B TW I270215 B TWI270215 B TW I270215B TW 94117613 A TW94117613 A TW 94117613A TW 94117613 A TW94117613 A TW 94117613A TW I270215 B TWI270215 B TW I270215B
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Taiwan
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semiconductor wafer
semiconductor
outer casing
partial area
semiconductor component
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TW94117613A
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Chinese (zh)
Inventor
Karlheinz Arndt
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Osram Opto Semiconductors Gmbh
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Abstract

An optoelectronic semiconductor component has at least one radiation (11) emitting semiconductor chip (1), which is arranged in the recess (2) of the housing base-body (3), said recess (2) is on the side adjacent to a wall (31) surrounding the semiconductor chip (1) and at least one part of the recess (2) is filled with a sealing material (4), which covers the semiconductor chip (1) and is well transmissive for the electromagnetic radiation emitted from the semiconductor chip (1). The inner side (32), which is adjacent to the recess (2), of the wall (31) is formed, so that the ring-shaped partial area (33), which fully surrounds the semiconductor component, of the inner side (32) is formed in the top-view when viewed from the front side of the semiconductor component, said area (33) is located in a shadow area when viewed from the radiation-emitting semiconductor chip (1) and at least partially is covered by the sealing material (4) when the semiconductor chip (1) is fully surrounded. In addition, this invention also provides the housing base-body for said semiconductor component.

Description

1270215 ^ 九、發明說明: 【發明所屬之技術領域】 本發明涉及一種申請專利範圍第1項前言所述之光電半 導體組件(特別是發出電磁輻射用的半導體組件)以及一種 申請專利範圍第1 9項前言所述之外殼基體。 本發明特別是涉及一種可表面安裝的光電組件,其特別 是以導線架爲主,其中半導體晶片配置在外殻基體的凹口 中且固定在該處。在半導體晶片安裝在凹口中之前,較佳 β是預製該外殼基體。 . 【先前技術】 上述之半導體組件例如由Siemens Component 29 (1991)BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optoelectronic semiconductor component (particularly a semiconductor component for emitting electromagnetic radiation) as described in the preamble of claim 1, and a patent application scope. The outer casing base described in the preface. More particularly, the present invention relates to a surface mountable optoelectronic component, particularly a leadframe, wherein the semiconductor wafer is disposed in a recess in the housing base and secured thereto. Preferably, the beta is prefabricated prior to mounting the semiconductor wafer in the recess. [Prior Art] The above semiconductor component is, for example, by Siemens Component 29 (1991)

Heft 4,第147至149頁中已爲人所知。傳統上例如使用以 環氧樹脂爲主之澆注材料作爲封罩材料。但此種封罩材料 對紫外線而言通常是無抵抗力的,其在紫外線的影響下會 較快地變黃且因此使該組件的發光效益下降。Heft 4, pages 147 to 149, is known. Conventionally, for example, an epoxy-based casting material has been used as the covering material. However, such an encapsulating material is generally non-resistant to ultraviolet light, which will turn yellow faster under the influence of ultraviolet light and thus degrade the luminous efficacy of the assembly.

爲了使發出輻射的光電半導體組件之紫外線-耐久性獲得 改良’可使用以矽樹脂爲主之封罩材料或使用由矽樹脂所 構成的封罩材料。這些封罩材料在短波長之輻射的影響下 不會變黃或變黃時的速率足夠慢。 但上述的封罩材料會有以下的困難點:其在一系列的應 用中特別是曝露在紫外線中時會由於外殻—基體傳統上所 用的材料(例如’以聚苯二胺爲主之熱塑性材料)而造成老化 穩定度不夠之結合,就像其採用環氧樹脂時的情況一樣。 因此’使用此種封罩材料於傳統的外殼構造形式中時,就 1270215 像其在 Siemens Component 29 (1991) Heft 4’ 第 147 至 149 頁中所述者一樣,會造成一種”在外殼-基體和封罩材料之 間產生脫層(delamination)”之高危險性。此種脫層現象開始 於凹口的上部邊緣且繼續向凹口中延伸。此外,在最壞之 情況下會使晶片封罩由外殻-基體完全剝離。 【發明內容】In order to improve the ultraviolet-durability of the radiation-emitting optoelectronic semiconductor component, a capping resin-based capping material or an encapsulating material composed of a terpene resin may be used. These encapsulating materials are slow enough to not turn yellow or yellow under the influence of short-wavelength radiation. However, the above-mentioned encapsulating material has the following difficulties: in a series of applications, especially when exposed to ultraviolet light, it is due to the material used in the outer casing-matrix (for example, 'polyphenylene diamine-based thermoplastics The combination of material) results in insufficient aging stability, as is the case with epoxy. Therefore, when using such an enclosure material in a conventional housing construction, 1270215, like its one described in Siemens Component 29 (1991) Heft 4', pages 147 to 149, creates a "shell-matrix" High risk of delamination between the material and the enclosure material. This delamination begins at the upper edge of the recess and continues to extend into the recess. In addition, in the worst case, the wafer envelope is completely peeled off from the outer casing-substrate. [Summary of the Invention]

本發明的目的是提供一種上述形式的半導體組件或外 殼-基體,特別是提供一種上述形式的可表面安裝的半導 體組件或可表面安裝的外殼-基體,其中脫層的危險性可 減小,特別是外殻-基體和封罩材料之間完全脫層之危險 性可減小。本發明特別是提供一種外殼-基體,其適用於 極微小化的光電外殼造形中,特別適用於極微小化的發光 二極體-和光二極體造形中。 上述目的以具有申請專利範圍第1項特徵的半導體組件 或以具有申請專利範圍第1 9項特徵的外殼-基體來達成。 半導體組件或外殼-基體之有利的實施形式和其它形式 描述在申請專利範圍第2至1 8項和第2 0至3 0項中。 本發明中所謂半導體組件或外殼-基體之前側通常是 指:由其發射方向觀看時該半導體組件之俯視圖中的一種 外部表面。因此,由此前側可使凹口更深入至外殼-基體 中且半導體晶片所產生的電磁輻射可經由前側而發出。 在本發明的半導體組件中,須形成一種鄰接於該凹口之 壁,以便在半導體組件之前側上之俯視圖中在半導體晶片 上 1270215 i) 形成多個配置在半導體晶片周圍之陰影部份面積或 ii) 至少形成一個至少一部份(較佳是全部)圍繞該半導體 晶片之陰影部份面積。 本發明中所謂陰影特別是指:由發出輻射之半導體晶片 之發出輻射之區域之每一點觀看時相關的部份面積係位於 陰影區中且相關的部份面積至少一部份是由封罩材料所覆 蓋且封罩材料由此相關的部份面積向半導體晶片延伸且覆 蓋半導體晶片。SUMMARY OF THE INVENTION It is an object of the present invention to provide a semiconductor component or housing-substrate of the above type, and in particular to provide a surface mountable semiconductor component or a surface mountable housing-substrate of the above type, wherein the risk of delamination can be reduced, in particular The risk of complete delamination between the outer casing-base and the enclosure material can be reduced. In particular, the present invention provides a housing-substrate that is suitable for use in extremely miniaturized photovoltaic housing construction, particularly for use in extremely miniaturized LED- and photodiode formations. The above object is achieved by a semiconductor component having the features of claim 1 or a casing-matrix having the features of claim 19 of the patent application. Advantageous embodiments and other forms of the semiconductor component or the housing-substrate are described in claims 2 to 18 and 20 to 30. The front side of the semiconductor component or the casing-substrate in the present invention generally means an outer surface in a plan view of the semiconductor component as viewed in its emission direction. Thus, the front side thus allows the recess to penetrate deeper into the outer casing-substrate and the electromagnetic radiation generated by the semiconductor wafer can be emitted via the front side. In the semiconductor device of the present invention, a wall adjacent to the recess is formed to form a plurality of shaded portions disposed on the semiconductor wafer 1270215 i) on the semiconductor wafer in a top view on the front side of the semiconductor device or Ii) forming at least one, preferably all, of the area of the shadow portion surrounding the semiconductor wafer. The term "shadow" as used in the present invention means, in particular, that the portion of the area associated with each of the regions of the radiation-emitting semiconductor wafer that is exposed to radiation is in the shadow region and that at least a portion of the associated portion of the area is covered by the enclosure material. The covered and encapsulating material extends from the associated partial area to the semiconductor wafer and covers the semiconductor wafer.

在本發明之特別有利的半導體組件或特別有利的外殼-基體中,須形成一種鄰接於凹口之壁,以便在半導體組件 之前側上的俯視圖中在半導體晶片上形成一種完全圍繞半 導體晶片之環形陰影部份面積,其特別是由發出輻射之半 導體晶片之發出輻射之區域之每一點觀看時係位於陰影區 中且完全圍繞半導體晶片以及至少一部份是由封罩材料所 覆蓋,封罩材料由此環形陰影部份面積向半導體晶片延伸 且覆蓋半導體晶片。 上述之陰影部份面積特別有利的是由組件之前側而在半 導體晶片之方向中完全以漏斗形方式延伸,其中此陰影部 份面積使凹口在朝向半導體晶片之方向中逐漸變小。 特別有利的是將該陰影部份面積配置在該壁的上部邊 緣,使空氣/封罩材料/外殼-基體之三相-邊界線完全在該 陰影部份面積上延伸且因此使一種來自半導體晶片之位於 封罩材料之前側上的不期望之輻射不會施加至陰影部份面 積上或只以足夠小的程度(例如,由於在封罩材料之前側上 1270215 的反射所造成)施加至陰影部份面積上。 較佳是使至少一陰影部份面積形成在向著外殻-基體之 SU側的此凹口之邊緣上,特別是形成在該壁的前側之正面 上’或此陰影部份面積本身就是該壁的前側之正面。這樣 可以有利之方式特別地節省該陰影部份面積之空間,因此 可節省整個組件之空間,且在與無紫外線問題和無環氧化 物封罩之傳統組件比較時該反射用之凹口不必縮小。In a particularly advantageous semiconductor component or particularly advantageous outer casing-substrate of the invention, a wall adjoining the recess is formed in order to form a ring on the semiconductor wafer which completely surrounds the semiconductor wafer in a top view on the front side of the semiconductor component. The shaded portion area, particularly in view of each point of the radiation-emitting region of the radiation-emitting semiconductor wafer, is located in the shadow region and completely surrounds the semiconductor wafer and at least a portion is covered by the enclosure material, the enclosure material The annular shadow portion area thus extends toward the semiconductor wafer and covers the semiconductor wafer. The above-mentioned shaded portion area is particularly advantageous in that it extends completely in a funnel-shaped manner from the front side of the assembly in the direction of the semiconductor wafer, wherein the shaded portion area causes the recess to taper in the direction toward the semiconductor wafer. It is particularly advantageous to arrange the shaded partial area on the upper edge of the wall such that the three-phase boundary of the air/enclosure material/case-substrate extends completely over the area of the shadow portion and thus one from the semiconductor wafer Undesired radiation on the front side of the enclosure material is not applied to the shaded area or only to a small extent (eg, due to reflection of 1270215 on the front side of the enclosure material) applied to the shadow Area. Preferably, at least one shaded portion area is formed on the edge of the notch toward the SU side of the outer casing-substrate, particularly on the front side of the front side of the wall' or the area of the shadow portion itself is the wall The front side of the front side. This advantageously saves space in the area of the shadow portion, thus saving space for the entire assembly, and the recess for reflection does not have to be reduced when compared to conventional components without UV and epoxy-free enclosures. .

至少一陰影部份面積可有利地在技術上特別簡單地藉由 至少一斜邊(情況需要時爲了節省空間較佳是藉由唯一的斜 邊)而形成在該壁的前側之邊緣上,該壁朝向凹口而傾斜。 凹口之前側邊緣因此是以漏斗形式朝向半導體晶片而形 成。在一種有利的實施形式中,該壁的正側之至少一部份 是以漏斗形式形成在其整個寬度上且因此至少一部份被視 爲該凹口之成份。 一種完整的漏斗形之陰影部份面積可藉由本發明之外 殼-基體來達成且其特殊的優點是:此漏斗形之陰影部份 面積可良好地以封罩材料來塡充,且相較於構造形式相同 之傳統組件而言由於本發明之凹口的幾何形式而使此凹口 之作爲反射器用的區域不會縮小。 在另一有利的形式中,該陰影部份面積藉由該壁之至少 一(情況需要時爲了節省空間較佳是藉由唯一)在橫切面中 之凹形斜面而形成在該壁之前側邊緣上。藉由此種形式, 則亦可在具有大凹口之外殼-基體中以入射至該壁上的平 面式輻射來達成一種陰影部份面積。 1270215 本發明的外殻-基體可特別有利地用在設有半導體晶片 的半導體組件中,其中此半導體晶片至少一部份會發出紫 外線輻射,其例如可爲一種發出藍光或紫外線輻射之以氮 化物-化合物半導體材料爲主之發光二極體晶片,如文件 WO 〇l/39282 A2中所述者,此處因此不再詳述。The at least one shaded portion area can advantageously be formed in a particularly simple manner on the edge of the front side of the wall by means of at least one bevel (in case of space saving, preferably by a single bevel), which is particularly simple. The wall is inclined towards the recess. The front side edge of the recess is thus formed in the form of a funnel toward the semiconductor wafer. In an advantageous embodiment, at least a portion of the positive side of the wall is formed in the form of a funnel over its entire width and thus at least a portion is considered to be a component of the recess. A complete funnel-shaped shaded portion area can be achieved by the outer casing-matrix of the present invention and has the particular advantage that the shaded portion of the funnel shape can be well filled with the enclosure material as compared to The conventional components of the same construction form do not shrink the area of the recess as a reflector due to the geometry of the recess of the present invention. In another advantageous form, the shaded portion area is formed on the front side edge of the wall by at least one of the walls (which is preferably only space-saving by space) by a concave bevel in the cross-section. on. By this form, it is also possible to achieve a shaded partial area in the outer casing-matrix having a large recess with planar radiation incident on the wall. 1270215 The outer casing-substrate of the present invention can be used particularly advantageously in a semiconductor component provided with a semiconductor wafer, wherein at least a portion of the semiconductor wafer emits ultraviolet radiation, which can be, for example, a nitride that emits blue or ultraviolet radiation. - A light-emitting diode wafer based on a compound semiconductor material, as described in the document WO 〇l/39282 A2, which is hereby no longer described in detail.

所謂”以氮化物-化合物半導體材料爲主,,就本發明而言是 指·發出輕射的嘉晶層序列或其至少一部份包含一種氮化 物- III-V-化合物半導體材料,較佳是AlnGamIni_n_mN,其中 1,OSmS 1且n + ms 1。因此,此種材料未必具有一 種上述形式之公式所示的數學上正確的成份。反之,其可 具有一種或多種摻雜物質以及其它成份,這些成份基本上 未改變AlnGamlnmN材料之特定的物理性質。但爲了簡 單之故,上述公式只包含晶體柵格(Al,Ga,In,N)之主要成 份’當這些成份之一部份可由少量的其它材料來取代時。 該封罩材料較佳是以矽材料爲主而製成,且該封罩材料 特別是可爲一種矽樹脂。此外,封罩材料之凝膠形式的強 固性可促使脫層之危險性下降。 就脫層之危險性之進一步下降而言,多個形成在內側之 陰影部份面積上的固定元件是有利的,這些固定元件由該 陰影部份面積開始或由凹口之其餘之內側開始而伸入至封 罩材料中。這些固定元件較佳是均勻地分佈在陰影部份面 積上’即,以相同的間距而互相配置在陰影部份面積上。 由該陰影部份面積上凸出的固定鼻,粒結或肋條適合用 作固定元件。各固定元件特別有利的方式是完全由該封罩 1270215 " 材料所覆蓋(即,跨越)。因此,該封罩材料之塡充狀態在凹 口內部中特別高,使該封罩材料完全覆蓋各固定元件。這 樣又可對抗上述之脫層現象且亦可藉由傳統的 Pick-and-Place裝置使該組件之再處理更容易。 又,上述之固定兀件能以有利的方式對下述現象提供助 益:一種在流體狀態中塡入該凹口中的封罩材料(例如,矽 樹脂)由於此封罩材料之毛細現象所造成的力而在各固定元 件上形成高拉延現象。這樣對陰影部份面積-及凹口之上部 Φ邊緣之沾濕現象有促進作用。 上述目的特別是藉由一種半導體組件來達成,其中在外 殼-基體之凹口之外部邊緣上該封罩材料在至少一陰影部 份面積(其至少一主要部份是由半導體晶片所發出的輻射所 遮蔽)上形成一種密封條,其因此可對晶片之輻射形成一種 很廣泛的遮蔽作用。特別有利的是使封罩材料在一種完全 圍繞半導體晶片之環形陰影部份面積上形成一般性之陰影 密封環。The so-called "nitride-compound semiconductor material is preferred, and in the context of the present invention, the light-emitting Jiajing layer sequence or at least a portion thereof comprises a nitride-III-V-compound semiconductor material, preferably Is AlnGamIni_n_mN, where 1, OSmS 1 and n + ms 1. Therefore, such a material does not necessarily have a mathematically correct composition as shown by the formula of the above form. Conversely, it may have one or more dopants and other components, These components do not substantially alter the specific physical properties of the AlnGamlnmN material. However, for the sake of simplicity, the above formula only contains the main components of the crystal grid (Al, Ga, In, N) 'When a part of these components can be small When other materials are substituted, the encapsulating material is preferably made of a bismuth material, and the encapsulating material may especially be an enamel resin. In addition, the gel form of the encapsulating material may promote the detachment. The risk of the layer is reduced. In terms of further degradation of the risk of delamination, it is advantageous to have a plurality of fixing elements formed on the inner shadow portion of the area. The area of the shadow portion begins or extends into the enclosure material starting from the inner side of the recess. These fixing elements are preferably evenly distributed over the area of the shadow portion 'ie, they are arranged in the shadow at the same pitch. Part of the area. A fixed nose, a knot or a rib protruding from the area of the shadow portion is suitable for use as a fixing element. A particularly advantageous way of securing each fixing element is to completely cover the material of the enclosure 1270215 " Therefore, the state of the encapsulation material is particularly high in the interior of the recess, so that the encapsulating material completely covers the fixing elements. This can counteract the above-mentioned delamination and can also be overcome by the conventional Pick- The and-Place device facilitates reprocessing of the assembly. Further, the fixed member described above can advantageously provide an advantage to the following phenomenon: an enclosure material that breaks into the recess in a fluid state (eg,矽 resin) due to the force caused by the capillary phenomenon of the capping material, a high drawing phenomenon is formed on each of the fixing members, so that the area of the shadow portion and the edge of the Φ portion of the notch are wetted. The above object is achieved in particular by a semiconductor component in which the encapsulation material is at least one shaded area on the outer edge of the recess of the outer casing-substrate (at least a major portion of which is comprised by the semiconductor wafer Formed by the emitted radiation, a sealing strip is formed which can form a broad shielding effect on the radiation of the wafer. It is particularly advantageous to form the encapsulating material in a region of the annular shadow portion that completely surrounds the semiconductor wafer. Shadow seal ring.

凹口之其餘部份較佳是形成該半導體晶片所發出的輻射 用之反射器。 在一特別有利的實施形式中,該外殼基體形成在一種由 塑膠-成型材料所構成的金屬導線架上,這特別是藉由濺鍍 法及/或壓製(Press)法來達成。 發光材料可混合在封罩材料中,該發光材料可吸收半導 體晶片所發出的輻射之一部份且發出一種波長與所吸收的 輻射不同的輻射。同樣,該半導體晶片可設有一種含有一 -10- 1270215 ^ 發光材料的外罩層。因此能以簡單的方式製成各發光二極 體組件,其可發出混合彩色之光或發出彩色已調整的光。 適當的發光材料例如已描述在 WO 97/50 1 32 和 WO_9 8/1 27 57 A1中,其已揭示的內容收納於此以作爲參考 凹口-或陰影部份面積之上部邊緣之最外側之邊緣儘可能 成平滑狀態,即,其不具備各種溝,凹口,縮孔或類似物。 這樣在對凹口進行塡充時可有利地使封罩材料外溢之危險 ^ 性下降。各固定元件較佳是未到達凹口之外部邊緣,以確 . 保形成一種平滑的邊緣。 上述有關本發明的組件之描述可類似地適用於本發明的 外殼-基體中。The remainder of the recess is preferably a reflector for forming radiation from the semiconductor wafer. In a particularly advantageous embodiment, the housing base is formed on a metal lead frame made of a plastic-forming material, in particular by sputtering and/or pressing. The luminescent material can be mixed in an encapsulating material that absorbs a portion of the radiation emitted by the semiconductor wafer and emits a radiation having a wavelength different from the absorbed radiation. Similarly, the semiconductor wafer can be provided with an outer cover layer comprising a -10- 1270215 ^ luminescent material. Thus, each of the light-emitting diode assemblies can be made in a simple manner, which can emit mixed color light or emit color-adjusted light. Suitable luminescent materials are described, for example, in WO 97/50 1 32 and WO_9 8/1 27 57 A1, the disclosure of which is incorporated herein by reference to the outermost side of the reference notch - or the upper edge of the shadow portion area The edges are as smooth as possible, i.e., they do not have various grooves, notches, craters or the like. This advantageously reduces the risk of spillage of the enclosure material when the recess is filled. Preferably, each of the retaining elements does not reach the outer edge of the recess to ensure a smooth edge. The above description of the components of the present invention can be similarly applied to the outer casing-matrix of the present invention.

本發明中一種組件外殼(外殼-基體+封罩材料)不只可有 利地用在發出輻射的組件(其半導體晶片特別是至少一部份 可發出紫外線)中,而且亦可有利地(例如,較高的耐熱性) 用在輻射偵側用的組件(例如,光二極體-或光電晶體組件) 依據本發明所形成的組件-外殻(外殻-基體+封罩材料) 可達成一種尺寸很小之構造形式,此乃因該凹口只在該外 殻-基體之前側之末端上(即,直接在由凹口之內壁至外 殼-基體之外部的前側之過渡區上)具有該位於陰影區中的 部份面積。 其匕知*殊的優點是·外威-基體/封罩材料/空氣(或周圍 其它之大氣)之”三相,,-邊界線不會接受到半導體晶片之輻 -11- 1270215 射或只會接受到小很多的輻射。 本發明之半導體組件或外殻-基體之其它優點和有利的 形式以下將參照第1至6圖中所示的實施例來說明。 【實施方式】 各實施例中各圖式之相同-或作用相同的組件分別以相同 的參考符號來表示。各圖式基本上未依據本發明之真實元 件之比例大小來繪製。反之,各實施例之各別的組件在各 圖式中爲了清楚之故可以放大方式來顯示或未依據實際之 ¥大小比例來顯示。 各圖式中所示的組件或外殻-基體分別是一種可表面安 裝的所謂側視(Sidelooker)發光二極體組件或此種發光二極 體組件用的一種所謂可表面安裝的外殼-基體3,此組件具In the present invention, a component housing (housing-substrate+encapsulation material) can be advantageously used not only in radiation-emitting components (particularly semiconductor wafers, in particular at least a portion of which emit ultraviolet light), but also advantageously (for example, High heat resistance) A component for radiation detection (for example, a photodiode or a phototransistor). The component-case (housing-substrate+encapsulation material) formed according to the invention can achieve a very large size. Small configuration, because the recess has only the end on the front side of the outer casing-base (ie, directly on the transition from the inner wall of the recess to the front side of the outer shell-base) Part of the area in the shaded area. Its advantages are: the three-phase, the outer layer - the base / the cover material / the air (or the surrounding atmosphere), - the boundary line will not receive the radiation of the semiconductor wafer - 1170215 A much smaller radiation will be received. Other advantages and advantageous forms of the semiconductor component or the housing-substrate of the present invention will be described below with reference to the embodiments shown in Figures 1 to 6. [Embodiment] In each embodiment The same or equivalent components of the various figures are denoted by the same reference symbols, respectively, and the drawings are not substantially drawn according to the scale of the real elements of the invention. Conversely, the various components of the various embodiments are For clarity, the drawings may be displayed in an enlarged manner or not according to the actual ¥ size ratio. The components or housing-substrate shown in each figure are a surface mountable so-called sidelooker illumination. a so-called surface mountable casing-base 3 for a diode assembly or such a light-emitting diode assembly, the assembly

有一種情況需要時可另外發出紫外線之發光二極體晶片 1,其例如可爲一種以In GaN爲主之發出可見之藍光之發光 二極體晶片,其可設計成有意或無意地另外發出紫外線輻 射。此種發光二極體晶片例如已描述在WO 0 1/39282 A2 中,此處因此不再詳述。 上述之組件外殼和外殼-基體基本上亦適用於其它形式 之發光二極體晶片中,同樣亦適用於特別是爲高溫應用而 設計的發出紅外線的組件中。 發光二極體晶片1在外殼-基體3之一種晶片區(以第1 至4圖中虛線所圍繞的區域2 1來表示)中安裝在金屬導線架 6之導電性晶片終端件上且經由一種連結線5而與導線架6 之電性上與晶片終端件62相隔開之導電性線終端件6 1相 -12- 1270215 連接。 其它形式之接觸式發光二極體晶片(例如,以覆晶 (Flip-Chip)方式安裝的發光二極體晶片)中陽極-和陰極接 觸區配置在晶片的一側上且面向導線架,此種發光二極體 晶片同樣可用在本發明中。只有安裝技術須調整。There is a case in which an ultraviolet light emitting diode chip 1 can be additionally emitted, which can be, for example, a light emitting diode chip which emits visible blue light mainly in In GaN, which can be designed to emit ultraviolet light intentionally or unintentionally. radiation. Such a light-emitting diode wafer has been described, for example, in WO 0 1/39282 A2, and therefore will not be described in detail here. The above-described component housing and housing-substrate are also basically suitable for use in other forms of light-emitting diode wafers, as well as in infrared-emitting components designed especially for high temperature applications. The light-emitting diode wafer 1 is mounted on a conductive wafer termination member of the metal lead frame 6 in a wafer region of the outer casing-substrate 3 (represented by a region 2 1 surrounded by a broken line in FIGS. 1 to 4) via a The connecting wire 5 is connected to the conductive wire end piece 6 1-12-1270215 which is electrically separated from the wafer end piece 62 by the lead frame 6. Other forms of contact LED chips (eg, Flip-Chip mounted light emitting diode wafers) have anode- and cathode contact regions disposed on one side of the wafer and facing the leadframe. A light-emitting diode wafer can also be used in the present invention. Only the installation technology needs to be adjusted.

導線架6上存在著一種例如由熱塑性塑料(例如,一種以 氧化鈦或氧化矽及/或玻璃纖維來塡充之以聚苯二胺爲主之 壓製材料)藉由濺鍍澆注或濺鍍壓製而製成之外殻—基體 3,其具有凹口 2。凹口 2中存在著發光二極體晶片1,其 例如藉由一種導電性黏合劑而導電性地固定在晶片終端件 62上。 凹口 2在側面上與一種圍繞半導體晶片1之壁3 1相鄰接 且凹口中至少一部份以一種以矽樹脂爲主之封罩材料4來 塡入,該封罩材料4覆蓋半導體晶片1且可良好地使半導 體晶片1中所發出的電磁輻射透過。 該封罩材料4例如包含一種可透過輻射的例如透明之凝 膠形式之以聚矽氧爲主之澆注材料。一種發光材料粉7 (例 如,以YAG:Ce,TbAG:Ce或TbYAG:Ce爲主之發光材料粉) 混合至該澆注材料中。此種發光材料例如由W Ο 9 8 / 1 2 7 5 7 和WO 0 1 /0 8 45 2中已爲人所知,其已揭示的內容收納於此 以作爲參考。 在只應發出該發光二極體晶片1之原來輻射所用的組件 中’該封罩材料4可以是一種以聚砂氧爲主之透明之凝膠 形式的澆注材料。另一方式是該封罩材料4可設有擴散微 -13- 1270215 粒且因此變成較陰暗。On the lead frame 6, there is a pressing material such as a thermoplastic (for example, a polyphenylene diamine-based pressing material which is filled with titanium oxide or cerium oxide and/or glass fiber) by sputtering or sputtering. The resulting outer casing, the base body 3, has a recess 2. In the recess 2, a light-emitting diode wafer 1 is present, which is electrically fixed to the wafer termination member 62, for example, by a conductive adhesive. The recess 2 is laterally adjacent to a wall 31 surrounding the semiconductor wafer 1 and at least a portion of the recess is interposed with a capping resin material 4, which covers the semiconductor wafer. 1 and the electromagnetic radiation emitted from the semiconductor wafer 1 can be well transmitted. The encapsulating material 4 comprises, for example, a radiopaque, in the form of a transparent gel, a polysilicon-based casting material. A luminescent material powder 7 (for example, a luminescent material powder mainly composed of YAG:Ce, TbAG:Ce or TbYAG:Ce) is mixed into the casting material. Such luminescent materials are known, for example, from W Ο 9 8 / 1 2 7 5 7 and WO 0 1 /0 8 45 2 , the disclosure of which is incorporated herein by reference. In the assembly for which only the original radiation of the LED chip 1 should be emitted, the encapsulating material 4 may be a casting material in the form of a transparent gel mainly composed of polyoxalate. Alternatively, the encapsulating material 4 can be provided with diffusing micro- 13-1270215 particles and thus becomes darker.

一種鄰接於凹口 2之內側3 2在該壁3 1之前側的未端上 具有一種朝向該凹口 2之內部(即,朝向半導體晶片1)而向 下傾斜-且完全圍繞此凹口之斜邊3 3 1。此斜邊3 3 1產生一 種在半導體組件之前側上觀看的俯視圖中完全圍繞此半導 體晶片1之環形陰影部份面積3 3,其由半導體晶片1之前 側之全部之點來觀看時完全位於陰影區中且其在完全圍繞 此半導體晶片1時至少一部份是由封罩材料4所覆蓋。凹 口之前側邊緣形成漏斗形。該陰影之部份面積同時亦是該 壁3 1之前側之正面。 第2至4圖之第二實施例不同於上述第一實施例之處特 別是:內側3 2之環形之陰影部份面積3 3藉由該壁3 1之前 側的正面之在橫切面中是凹形之陰影區3 3 2所形成。 第2至6圖之第三實施例不同於上述第一實施例之處特 別是:在環形之陰影部份面積3 3上以均勻地圍繞該凹口 2 之方式而形成多個固定元件24,其在此處是一種固定粒結 之形式。這些固定粒結由陰影部份面積3 3開始而伸入至封 罩材料4中,但未穿過該封罩材料4,即,各固定粒結完全 由封罩材料4所覆蓋。由半導體晶片1來觀看時,此封罩 材料在陰影部份面積3 3上在各固定元件2 4之後連續地圍 繞著。 就上述之全部實施例而言,外殻—基體3與各固定元件 24較佳是以單件方式而一起形成且較佳是在唯一之濺鍍繞 注-或濺鍍壓製過程中製成。 -14- 1270215 ' 對應於各實施例之外殼基體和封罩材料亦可用於接收輻 射用的半導體晶片(例如,光二極體晶片)中。一種光二極體 晶片可設在發光二極體晶片1之位置上。本發明的構造形 式同樣適用在雷射二極體組件,偵側組件和高溫應用中。 本發明依據各實施例所作的技術上的說明當然不是對本 發明的一種限制。反之,全部之組件和外殻-基體(其具有 一種凹口以容納半導體晶片以及一種在凹口之前側邊緣上 之環形之斜邊或類似物件)都可使用本發明的技術,其中該 Φ 斜邊是由半導體晶片之輻射所遮蔽。 _ 【圖式簡單說明】 第1圖 本發明的組件之第一實施例之切面圖。 第2圖 本發明的組件之第二實施例之切面圖。 第3圖 本發明的組件之第三實施例之切面圖。 第4圖 係第二實施例之另一切面圖。 第5圖 係第一實施例之外殼-基體之透視之俯視圖。 第6圖 係第三實施例之外殼-基體之透視之俯視圖。 0【元件符號說明】 1 發出輻射的半導體晶片 11 輻射 2 凹口 2 1 晶片區 2 4 固定元件 3 外殼-基體 3 1 壁 -15- 1270215 32 之內側 33 內側32之部份面積 331 環形之相位 3 32 凹形之斜面 4 封罩材料 5 連結線 6 導線架 6 1 線終端件An inner side 32 adjacent to the recess 2 has a front end on the front side of the wall 3 1 having a shape that faces downwardly toward the inside of the recess 2 (i.e., toward the semiconductor wafer 1) - and completely surrounds the recess Beveled edge 3 3 1. The beveled edge 3 3 1 produces an annular shadowed portion area 3 3 which completely surrounds the semiconductor wafer 1 in a top view viewed on the front side of the semiconductor component, which is completely shadowed when viewed from the entire point on the front side of the semiconductor wafer 1. At least a portion of the region and which is completely surrounded by the semiconductor wafer 1 is covered by the encapsulation material 4. The front side edge of the recess forms a funnel shape. The partial area of the shadow is also the front side of the front side of the wall 31. The second embodiment of Figs. 2 to 4 differs from the first embodiment described above in particular in that the shadow portion area 3 3 of the inner side of the inner ring 3 is in the cross section by the front side of the front side of the wall 3 1 A concave shadow zone 3 3 2 is formed. The third embodiment of FIGS. 2 to 6 differs from the first embodiment described above in particular in that a plurality of fixing members 24 are formed in a manner of uniformly surrounding the notch 2 on the area 3 3 of the shadow portion of the ring, It is here a form of fixed grain. These fixed pellets extend from the shaded portion area 3 3 into the encapsulating material 4 but do not pass through the encapsulating material 4, i.e., each of the fixed pellets is completely covered by the encapsulating material 4. When viewed from the semiconductor wafer 1, the encapsulating material is continuously surrounded by the respective fixing members 24 on the shaded portion area 3 3 . For all of the above embodiments, the outer casing-base 3 and the respective fixing members 24 are preferably formed together in a single piece and are preferably formed during the sole sputtering or sputtering process. -14-1270215' The housing base and encapsulant material corresponding to the various embodiments can also be used to receive radiation semiconductor wafers (e.g., photodiode wafers). A photodiode wafer can be disposed at the position of the light emitting diode chip 1. The configuration of the present invention is equally applicable to laser diode assemblies, side detection components, and high temperature applications. The technical description of the invention in accordance with the various embodiments is of course not a limitation of the invention. Conversely, all of the components and the housing-base (which has a recess to accommodate the semiconductor wafer and a ring-shaped bevel or the like on the front edge of the recess) can use the techniques of the present invention, wherein the Φ is oblique The edges are obscured by the radiation of the semiconductor wafer. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing a first embodiment of the assembly of the present invention. Figure 2 is a cross-sectional view of a second embodiment of the assembly of the present invention. Figure 3 is a cross-sectional view of a third embodiment of the assembly of the present invention. Figure 4 is another cross-sectional view of the second embodiment. Fig. 5 is a plan view showing the perspective of the outer casing-base of the first embodiment. Fig. 6 is a plan view showing the perspective of the outer casing-base of the third embodiment. 0 [Description of component symbols] 1 Radiation-emitting semiconductor wafer 11 Radiation 2 Notch 2 1 Wafer area 2 4 Fixing element 3 Housing - Base 3 1 Wall -15 - 1270215 32 Inner side 33 Part of inner side 32 Area 331 Ring phase 3 32 concave bevel 4 cover material 5 connecting line 6 lead frame 6 1 wire end piece

62 晶片終端件62 wafer terminal parts

-16--16-

Claims (1)

1270215 修捷)正替換頁 wr—I I I a~i »πι I . 第94 1 1 76 1 3號「光電半導體組件及其所用之外殻基體」專 利案 (2006年9月修正) 十、申請專利範圍: 1. 一種光電半導體組件,其具有至少一發出輻射(11)之半導 體晶片(1),此半導體晶片(1)配置在外殼-基體(3)之凹口 (2)中,此凹口(2)在側面上鄰接於一種環繞半導體晶片(1) 之壁(31)之內側(32)且此凹口(2)中至少一部份以封罩材料 φ (4)塡入,此封罩材料(4)覆蓋半導體晶片(1)且可良好地透 過一種由半導體晶片(1)所發出的電磁輻射,其特徵爲: 形成此壁(31)之內側(32),使此內側(3 2)在半導體組件之前 側上觀看時的俯視圖中具有至少一種部份面積(33),其由 發出輻射用的半導體晶片(1)觀看時位於陰影區中且其至 少一部份是由封罩材料(4)所覆蓋,該封罩材料(4)由該部 份面積(33)向著半導體晶片(1)而延伸且覆盖該半導體晶 片⑴。 ® 2.如申請專利範圍第1項之半導體組件,其中形成此壁(3 1) 之內側(32),使此內側(3 2)在半導體組件之前側上觀看時 的俯視圖中係圍繞半導體晶片而配置著且具有多個部份 面積(3 3),其由發出輻射用的半導體晶片(1)觀看時位於陰 影區中且其至少一部份是由封罩材料(4)所覆蓋’該封罩材 料(4)由該部份面積(33)向著半導體晶片(1)而延伸且覆蓋 該半導體晶片(1) ° 3 .如申請專利範圍第1項之半導體組件’其中形成此壁(3 1) 1270215 β 之內側(32),使此內側(32)在半導體組件之前側上觀看時 的俯視圖中具有一種完全圍繞半導體晶片(1)之環形之部 份面積(33),其由發出輻射用的半導體晶片(1)觀看時位於 陰影區中且其在完全圍繞半導體晶片(1)之情況下至少一 部份是由該封罩材料(4)所覆蓋。 4 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 內側(32)之至少一種部份面積(3 3)形成在其面向外殻-基 體(3)之前側之邊緣上。 # 5 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 內側(32)之至少一種部份面積(3 3)是該外殼_基體(3)之前 側。 6 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 內側(3 2)之至少一種部份面積(3 3)是藉由至少一斜邊(331) 而形成在該壁(3 1)之前側之邊緣上。 7 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 內側(32)之至少一種部份面積(3 3)藉由該壁(31)之至少一 ^ 在橫切面中是凹形的斜面(3 32)而形成在其前側之邊緣上。 8 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 半導體晶片(1)具有一種材料,其適合用來以至少一部份來 發出紫外線輻射。 9 ·如申請專利範圍第1至3項中任一項之半導體組件,其中 該封罩材料(4)包含一種以矽爲主之材料,特別是包含一種 矽樹脂。 1 〇.如申請專利範圍第1至3項中任一項之半導體組件,其中 1270215 • 該封罩材料(4)具有一種凝膠形式之強固性。 Π ·如申請專利範圍第1至3項中任一項之半導體組件,其中 在內側(32)之至少一種部份面積(3 3)上形成至少一固定元 件(24),其伸入至該封罩材料(4)中。 12.如申請專利範圍第11項之半導體組件,其中在內側(32) 之至少一種部份面積(3 3)上分佈著(特別是均勻地圍繞該 凹口(2)而分佈著)多個固定元件(24),其由該部份面積(33) 開始而伸入至該封罩材料(4)中。 41 1 3 ·如申請專利範圍第1 2項之半導體組件,其中固定元件形 ^ 成一種由該內側(3 2)之至少一種部份面積(3 3 )而凸出的固 定鼻,固定粒結或固定肋條且該封罩材料(4)跨越各固定元 件。 1 4.如申請專利範圍第1至3項中任一項之半導體組件,其中 該封罩材料(4)在該內側(32)之至少一種部份面積(33)上圍 繞該凹口( 2)而形成一種一般性的密封環。 1 5 ·如申目靑專利車Ε圍第丨至3項中任〜項之半導體組件,宜中 ® 該凹口(2)形成半導體晶片所發出的輻射用的反射器。 1 6 ·如申請專利範圍第1至3項中任一項之半導體組件,宜中 該外殻-基體(3)在金屬性的導線架(6)上以單件形式特別 是藉由濺鑛或壓製而由塑膠-成型材料預製而成。 17·如申請專利範圍第1至3項中任一項之半導體組件,其中 該封罩材料(4)包含至少一發光材料’其適合用來吸收半導 體晶片所發出的輻射之一部份且可發出一種波長相對於 所吸收之輻射而言已改變的輻射。 1270215 -1 8 .如申請專利範圍第1至3項中任一項之半導體組件,其中 半導體晶片具有至少一種發光材料,其其適合用來吸收半 導體晶片所發出的輻射之一部份且可發出一種波長相對 於所吸收之輻射而言已改變的轄射。 1 9 · 一種用於至少一半導體晶片(1)之外殼-基體,其特別是可 用於一種發出輻射之半導體組件中,此半導體組件具有至 少一發出輻射(1 1)之半導體晶片(1)且具有一凹口(2)以容 納半導體晶片(1),凹口(2)中存在一種晶片區(21)且凹口(2) # 在側面上鄰接於一圍繞該晶片區(21)之壁(31)之內側(32) ,其特徵爲: 形成此壁(31)之內側(32),使此內側(3 2)在外殼-基體之 前側上觀看時的俯視圖中具有至少一種部份面積(3 3 ),其 由晶片區(21)觀看時位於陰影區中,且該部份面積(33)能 以一種對該半導體晶片(1)形成至少一部份包封所用的封 罩材料來塡入,使該封罩材料(4)由該部份面積(3 3)向著半 導體晶片(1)而延伸且覆蓋該半導體晶片(1)。 • 20.如申請專利範圍第19項之外殻-基體,其中形成此壁(31) 之內側(32),使此內側(32)在外殼-基體之前側上觀看時 的俯視圖中係圍繞晶片區(2 1)而配置著且具有多個部份面 積(3 3 ),其由晶片區(2 1)觀看時位於陰影區中且該部份面 積(3 3)能以一種對該半導體晶片(1)形成至少一部份包封 所用的封罩材料來塡入’使該封罩材料(4)由該部份面積 " (33)向著半導體晶片(1)而延伸且覆蓋該半導體晶片。 * 2 1.如申請專利範圍第1 9項之外殻—基體,其中形成此壁(3 1) 1270215 、· · , • 之內側(32),使此內側(32)在外殼-基體之前側上觀看時 的俯視圖中具有一種完全圍繞晶片區(21)之環形之部份面 積(3 3) ’其由晶片區(21)觀看時位於陰影區中,且該部份 面積(33)能以一種對該半導體晶片(1)形成至少一部份包 封所用的封罩材料來塡入,使該封罩材料(4)由該部份面積 (3 3)向著半導體晶片(1)而延伸且覆蓋該半導體晶片。 2 2 ·如申請專利範圍第1 9至2 1項中任一項之外殼-基體,其 中內側(3 2)之至少一種部份面積(3 3)形成在其面向外殻- (I 基體(3)之前側之邊緣上。 .23 ·如申請專利範圍第1 9至2 1項中任一項之外殼-基體,其 中內側(32)之至少一種部份面積(3 3)是該外殻-基體(3)之 前側。 24 ·如申請專利範圍第1 9至2 1項中任一項之外殻-基體,其 中內側(3 2)之至少一種部份面積(33)是藉由至少一斜邊 (33 1)而形成在該壁(31)之前側之末端上。 25.如申g靑專利軔圍弟19至21項中任一項之外殼-基體,其 _ 中內側(3 2)之至少一種部份面積(3 3)藉由該壁(3 1)之至少 一在橫切面中是凹形的斜面(3 3 2)而形成在其前側之未端 上。 26·如申請專利範圍第19至21項中任一項之外殼-基體,其 中在內側(3 2)之至少一種部份面積(3 3)上形成該封罩材料 (4)用之至少一固定元件(24)。 27.如申請專利範圍第26項之外殼-基體,其中在內側(32) 之至少一種部份面積(3 3)上分佈著(特別是均勻地圍繞該 1270215 * 4 . 凹口(2)而为佈者)該封罩材料㈠)用之多個固定元件4)。 28·如申請專利範圓第27項之外殼—基體,$中形成該凹口 (2),使該封罩材料(4)在該內側(32)之至少一種部份面積 (3 3)上由內部觀看時在各固定元件(24)之外部可形成圍繞 該凹口(2)之一般性的密封環。 2 9 ·如申請專利範圍第丨9至2 1項中任一項之外殼-基體,其 中該凹口(2)形成一種反射器。 30·如申請專利範圍第19至21項中任一項之外殼-基體,其 中外殼-基體(3)藉由濺鍍或壓製而預製在金屬性的導線 架(6)上。1270215 修)) Replacement page wr—III a~i »πι I . No. 94 1 1 76 1 3 “Optoelectronic semiconductor components and the shell substrate used” Patent (amended in September 2006) X. Patent application Scope: 1. An optoelectronic semiconductor component having at least one semiconductor wafer (1) that emits radiation (11), the semiconductor wafer (1) being disposed in a recess (2) of the outer casing-base (3), the recess (2) adjacent to an inner side (32) of a wall (31) surrounding the semiconductor wafer (1) on the side surface and at least a portion of the recess (2) is interposed with the cover material φ (4). The cover material (4) covers the semiconductor wafer (1) and is well permeable to electromagnetic radiation emitted by the semiconductor wafer (1), characterized by: forming the inner side (32) of the wall (31) to make the inner side (3) 2) having at least one partial area (33) in a top view when viewed on the front side of the semiconductor component, which is located in the shaded area when viewed by the semiconductor wafer (1) for radiation and at least part of which is covered by the enclosure Covered by material (4), the enclosure material (4) is directed toward the semiconductor by the area (33) Wafer (1) extending and covering the semiconductor wafer ⑴. 2. The semiconductor component of claim 1, wherein the inner side (32) of the wall (31) is formed such that the inner side (32) surrounds the semiconductor wafer in a top view when viewed on the front side of the semiconductor component. And configured to have a plurality of partial areas (3 3) which are located in the shaded area when viewed by the semiconductor wafer (1) for emitting radiation and at least a portion of which is covered by the encapsulating material (4) The cover material (4) extends from the partial area (33) toward the semiconductor wafer (1) and covers the semiconductor wafer (1) ° 3 . The semiconductor component of claim 1 is formed therein. 1) The inner side (32) of 1270215 β, such that the inner side (32) has a ring-shaped partial area (33) completely surrounding the semiconductor wafer (1) when viewed from the front side of the semiconductor component, which emits radiation The semiconductor wafer (1) used is located in the shaded area when viewed and at least partially covered by the encapsulation material (4) in the case of completely surrounding the semiconductor wafer (1). The semiconductor component according to any one of claims 1 to 3, wherein at least one partial area (3 3) of the inner side (32) is formed on the edge of the front side facing the outer casing-base (3) . The semiconductor component according to any one of claims 1 to 3, wherein at least one partial area (3 3) of the inner side (32) is the front side of the outer casing_base (3). The semiconductor component according to any one of claims 1 to 3, wherein at least one partial area (3 3) of the inner side (32) is formed on the wall by at least one oblique side (331) (3 1) On the edge of the front side. The semiconductor component according to any one of claims 1 to 3, wherein at least one partial area (3 3) of the inner side (32) is in the cross section by at least one of the walls (31) A concave bevel (3 32) is formed on the edge of the front side thereof. The semiconductor component of any one of claims 1 to 3, wherein the semiconductor wafer (1) has a material suitable for emitting ultraviolet radiation in at least a portion. The semiconductor component according to any one of claims 1 to 3, wherein the encapsulating material (4) comprises a bismuth-based material, in particular, a bismuth resin. The semiconductor component of any one of claims 1 to 3, wherein 1270215 • the enclosure material (4) has a gel form of strength. The semiconductor component of any one of claims 1 to 3, wherein at least one of the partial areas (3 3) of the inner side (32) forms at least one fixing member (24) extending into the In the enclosure material (4). 12. The semiconductor component of claim 11, wherein the at least one partial area (3 3) of the inner side (32) is distributed (particularly uniformly distributed around the recess (2)) A fixing element (24) that extends from the partial area (33) into the enclosure material (4). 41 1 3 The semiconductor component of claim 12, wherein the fixing member is formed by a fixed nose protruding from at least one partial area (3 3 ) of the inner side (32), and the fixed particle is fixed. Or the ribs are fixed and the enclosure material (4) spans the respective fixing elements. The semiconductor component of any one of claims 1 to 3, wherein the enclosure material (4) surrounds the recess (23) on at least one partial area (33) of the inner side (32) (2) ) to form a general sealing ring. 1 5 · The semiconductor component of the Ε 靑 靑 靑 靑 靑 丨 丨 丨 。 。 , , , 宜 宜 宜 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该1 6 . The semiconductor component according to any one of claims 1 to 3, wherein the outer casing-substrate (3) is in a single piece on a metallic lead frame (6), in particular by sputtering Or pressed and prefabricated from plastic-forming materials. The semiconductor component of any one of claims 1 to 3, wherein the encapsulating material (4) comprises at least one luminescent material 'which is adapted to absorb a portion of the radiation emitted by the semiconductor wafer and A radiation having a wavelength that has changed relative to the absorbed radiation is emitted. The semiconductor component of any one of claims 1 to 3, wherein the semiconductor wafer has at least one luminescent material adapted to absorb a portion of the radiation emitted by the semiconductor wafer and can be emitted A ray that has changed in wavelength relative to the absorbed radiation. 1 9 · A housing-substrate for at least one semiconductor wafer (1), in particular for use in a radiation-emitting semiconductor component having at least one semiconductor wafer (1) that emits radiation (11) and Having a recess (2) for accommodating a semiconductor wafer (1), a wafer region (21) is present in the recess (2) and the recess (2) # is laterally adjacent to a wall surrounding the wafer region (21) The inner side (32) of (31) is characterized in that: the inner side (32) of the wall (31) is formed such that the inner side (32) has at least one partial area in a plan view when viewed on the front side of the outer casing-base body. (3 3 ), which is located in the shaded area when viewed by the wafer area (21), and the partial area (33) can be formed by an encapsulation material for forming at least a portion of the encapsulation of the semiconductor wafer (1). The encapsulation material (4) extends from the partial area (3 3) toward the semiconductor wafer (1) and covers the semiconductor wafer (1). • 20. The outer casing-substrate of claim 19, wherein the inner side (32) of the wall (31) is formed such that the inner side (32) surrounds the wafer in a top view when viewed on the front side of the outer casing-substrate The region (21) is disposed and has a plurality of partial regions (3 3 ) which are located in the shadow region when viewed by the wafer region (21) and which can be used as a semiconductor wafer (1) forming at least a portion of the encapsulating material used for encapsulation to break into the 'covering material (4) from the portion of the area " (33) toward the semiconductor wafer (1) and covering the semiconductor wafer . * 2 1. The outer casing-base of claim 19, wherein the inner side (32) of the wall (3 1) 1270215, ··, • is formed such that the inner side (32) is on the front side of the outer casing-substrate The top view when viewed from above has a portion of the annular portion (3 3) that completely surrounds the wafer region (21). It is located in the shadow region when viewed from the wafer region (21), and the portion (33) can be An encapsulating material for forming at least a portion of the encapsulation of the semiconductor wafer (1) to be inserted, such that the encapsulation material (4) extends from the portion of the area (3 3) toward the semiconductor wafer (1) The semiconductor wafer is covered. A casing-matrix according to any one of the claims 1-9 to 2, wherein at least one partial area (3 3) of the inner side (3 2) is formed in the outer casing - (I matrix) 3) The outer casing-matrix of any one of claims 1 to 2, wherein at least one partial area (3 3) of the inner side (32) is the outer casing - The outer side of the substrate (3). The outer casing-substrate of any one of the items (1) to (2), wherein at least one partial area (33) of the inner side (3 2) is at least A beveled edge (33 1) is formed on the end of the front side of the wall (31). 25. The outer casing-matrix of any one of the items 19 to 21 of the patent application, the inner side (3) 2) at least one partial area (3 3) is formed on the front end of the front side by at least one of the walls (31) having a concave bevel (3 3 2) in the transverse plane. The outer casing-substrate of any one of clauses 19 to 21, wherein at least one fixing element for the covering material (4) is formed on at least one partial area (3 3) of the inner side (32) ( 24). 27. The outer casing-substrate of claim 26, wherein at least one partial area (3 3) of the inner side (32) is distributed (particularly uniformly surrounding the 1270215 * 4 . notch (2) as a cloth The cover material (a)) is provided with a plurality of fixing elements 4). 28. If the outer casing-base of claim 27 is applied, the notch (2) is formed in $, so that the covering material (4) is on at least one partial area (3 3) of the inner side (32) A general sealing ring surrounding the recess (2) can be formed on the exterior of each of the fixing elements (24) when viewed from the inside. A casing-matrix according to any one of claims 9 to 21, wherein the notch (2) forms a reflector. The outer casing-substrate of any one of claims 19 to 21, wherein the outer casing-substrate (3) is prefabricated on the metallic lead frame (6) by sputtering or pressing.
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