TWI268363B - Light source for flat display panel tester - Google Patents
Light source for flat display panel testerInfo
- Publication number
- TWI268363B TWI268363B TW094104867A TW94104867A TWI268363B TW I268363 B TWI268363 B TW I268363B TW 094104867 A TW094104867 A TW 094104867A TW 94104867 A TW94104867 A TW 94104867A TW I268363 B TWI268363 B TW I268363B
- Authority
- TW
- Taiwan
- Prior art keywords
- light
- light source
- adjustor
- hole
- display panel
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040098729A KR100673793B1 (ko) | 2004-11-29 | 2004-11-29 | 평판 표시패널 검사장치용 광원유닛 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200617426A TW200617426A (en) | 2006-06-01 |
TWI268363B true TWI268363B (en) | 2006-12-11 |
Family
ID=36773111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094104867A TWI268363B (en) | 2004-11-29 | 2005-02-18 | Light source for flat display panel tester |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100673793B1 (ko) |
CN (1) | CN100420915C (ko) |
TW (1) | TWI268363B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108072952A (zh) * | 2016-11-18 | 2018-05-25 | 海信集团有限公司 | 光导管调节装置 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100934764B1 (ko) * | 2005-12-08 | 2009-12-30 | 주식회사 에이디피엔지니어링 | 기판 검사용 조명 장치 |
CN109724011A (zh) * | 2019-02-20 | 2019-05-07 | 深圳市升宇智能科技有限公司 | 一种多通道高均匀性柱形光源 |
CN110031191A (zh) * | 2019-04-29 | 2019-07-19 | 深圳市华星光电半导体显示技术有限公司 | 显示面板的光路测试装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3375265B2 (ja) * | 1997-03-21 | 2003-02-10 | シャープ株式会社 | 光透過型表示パネルの欠陥修正方法および欠陥修正装置 |
US6123429A (en) * | 1997-05-17 | 2000-09-26 | Tokyo Electron Limited | Light source device |
US6538813B1 (en) * | 2000-09-19 | 2003-03-25 | Honeywell International Inc. | Display screen with metallized tapered waveguides |
KR100789138B1 (ko) * | 2001-09-05 | 2007-12-27 | 삼성전자주식회사 | 조명장치 및 이를 적용한 반사형 액정표시장치 |
CN1639620A (zh) * | 2002-03-06 | 2005-07-13 | 皇家飞利浦电子股份有限公司 | 效率提高的投影设备 |
CN2593228Y (zh) * | 2002-12-19 | 2003-12-17 | 姚志图 | 平面上置光源 |
US7245802B2 (en) * | 2003-08-04 | 2007-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Beam homogenizer, laser irradiation apparatus and method for manufacturing semiconductor device |
-
2004
- 2004-11-29 KR KR1020040098729A patent/KR100673793B1/ko not_active IP Right Cessation
-
2005
- 2005-02-18 TW TW094104867A patent/TWI268363B/zh not_active IP Right Cessation
- 2005-02-28 CN CNB2005100511135A patent/CN100420915C/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108072952A (zh) * | 2016-11-18 | 2018-05-25 | 海信集团有限公司 | 光导管调节装置 |
CN108072952B (zh) * | 2016-11-18 | 2020-01-31 | 海信集团有限公司 | 光导管调节装置 |
Also Published As
Publication number | Publication date |
---|---|
KR100673793B1 (ko) | 2007-01-24 |
CN100420915C (zh) | 2008-09-24 |
TW200617426A (en) | 2006-06-01 |
KR20060059600A (ko) | 2006-06-02 |
CN1782660A (zh) | 2006-06-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |