TWI258587B - Multi-functional printed circuit board testing apparatus, method thereof and circuit board to be tested capable of using bed of nails to conduct functional test - Google Patents

Multi-functional printed circuit board testing apparatus, method thereof and circuit board to be tested capable of using bed of nails to conduct functional test Download PDF

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TWI258587B
TWI258587B TW93131693A TW93131693A TWI258587B TW I258587 B TWI258587 B TW I258587B TW 93131693 A TW93131693 A TW 93131693A TW 93131693 A TW93131693 A TW 93131693A TW I258587 B TWI258587 B TW I258587B
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Taiwan
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circuit board
test
tested
printed circuit
memory
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TW93131693A
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Chinese (zh)
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TW200613749A (en
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Mei-Hui Chen
Chao-Hung Chou
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Inventec Appliances Corp
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Abstract

A circuit board to be tested capable of using bed of nails to conduct functional test includes a processing center, a memory and a plurality of test keys, in which the memory is written at least a set of diagnostic codes therein, the processing center executes a diagnostic code in accordance with a test electrical signal inputted through the plural test keys and outputs the execution result to the bed of nails through the test keys, so as to determine if the circuit board to be tested functions normally.

Description

1258587 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種印刷電路板測試裝置,尤其 利用電腦控制針床運作以進行測試之印刷電路板测試I 置。 【先前技術】 知:’電子產品功此測试有其盛哀之歷史,在β〇年代後 期,它是第一種自動化之測試方法,因此廣泛受到矚目1 但是二隨著7G年代後織上職技術n功能測試似 乎注定要被淘汰。然而如今潮流又變了,線上測試目 臨到“探測方式”之問題。依據美國國家電子製造組二 (麵)的分析’隨著電路板製作技術的變革,電路板上 可用以探測之節點數量將趨近於零,而如果無法進行 测,線上測試幾乎就沒有用武之地。 j奴電子產品測雜射,魏戦正廣泛地應 e ;線後之工序中,甚至也用於製程中段之測試。但 嫩,與以前之功 求下,僂^ h王 在高元件密度與高測試速度之要 之的,’曰ϋ上以人工進行功能測試已經不敷使用。取而代 、疋肖針床連接電路板上之測試點,以進行功能測 !258587 試0 請參照第-圖所示,係-典型測試針床架構之示意 圖。如圖中所示,此測試針床100架構包括一治具12^、 —控制電路板140與一電腦裝置160。其中,户°^'12〇上 嵌有複數個可上下雜之騎122,分騎^測試電路 板200上之測試點(請參考第一 a圖)。電腦裝置⑽係透 過控制電路板14〇浦各探針讀置,⑽稍欲測試之 測試點位置。控制電路板14〇除了測試之結果回傳至電腦 裝置,同時,也提供制試電路板2〇〇進行測試所需要之 電源…般而言,透過測試針床架構所得到之測試.資料係 屬,據資料,而此資料往往僅能代表線路之短/開路或是不 良荨情形。 隨著電子產品的功能愈趨複雜,電路板之測試,有時 候也無法僅以數據資料就可以清楚判斷。因此,有時候必 須以-個假信號’例如—測試圖像’輸人此待測電路板, 再^檢測此待測電路板之輸出信號,以判斷此電路板之 功成是否正常。然而’此測試方法除了必須耗費數以倍計 的時間成本與裝置成本,同時,其所能測試之功能也受限 於假信號之設計,而往往不能完備。 八夕爰是,如何提升既有測試針床架構之功能,以符合現 今多功能電路板之需求,藉以驗祕板_所需耗費之 時間’係屬1子產品功能測試之料巾,最為人矚目之焦 【發明内容】 1258587 本發明之主要目的係提供一種可用於功能測試之印刷 電路板測試裝置’以因應現今多功能電路板之需求。 本發明所提供之多功能印刷電路板測試裝置,係包括 一治具、一控制電路、一電腦裝置與一診斷碼。其中,治 具係包括複數個可上下移動之探針,分別對準一待測電路 板上之測試鍵。控制電路係電連接治具以控制探針之移 ,。電腦裝置係透過排線電連接至控綱路,以輸入控制 信號控制探針之移動,並透過探針輸入一測試電訊號至待 測電路板。在待測電路板進行功能測試前,診斷碼係預先 寫入待測電路板内之記憶體中。而當進行功能測試時,待 測電路板係依據上述測試電訊號以執行記憶體内之診斷 碼▲,並將執行結果輸註電腦錢,關斷制電路板之 功能是否正常。 依據本發明峨供之多魏物電路板峨裝置,本 =月之功能測試的方法係包括下列步驟··寫入診斷碼 一 gnostic Code)於待測電路板之記憶體内;移動至少 之探針使接觸印刷電路板上之測試點;通入一測試 行測ί路板’路板餘制試電訊號執 針^取种生具有功能描述特性之測試結果;透過探 貝〜、丨^結果,以判斷待測電路板之功能是否正常。 所附^彳=之優點與精神可以藉由以下的發明詳述及 所附圖式侍到進—步的瞭解。 【實施方式】 凊參照第二圖所+# 路板測試裝置—較^實棘务明所提供之多功能印刷電 實知例之方塊示意圖。此多功能印刷 !258587 电路板測„樣置係包括一治具320、—控制電路與— 電腦裝置360。其中,治具320係包括複數個可上下移動 之探針’分別對準-待測電路板2〇〇上之測試鍵。控制電 路係電連接治具啸繼狀轉。電職置係透過排線 電連接至控制電路340,以輸入控制信號控制探針之移 動,並透過探針輸入一測試電訊號至待測電路板2〇〇。 般而5,文限於探針輸入之方式,此測試電訊號盔 ,提供相對複雜之測試指令,所以,單單由探針輸入之^ 式電碱對待測電路板2〇〇進行控制,是難以對待測電路 板200進行功能測試的。因此,一診斷碼係在測試開始前, ,先寫入待測電路板2〇〇内之記憶體中。而在進行功能測 域時’待測電路板2〇〇之處理中心22〇係依據來自探針之 測試電訊號’存取錄行魄體2㈣之麟碼,並將執 行結果輸出轉腦裝置,以供判斷制板之功能是否 正常。 就一待測之掃描器的控制電路板進行說明。傳統上, 知之=4圖像輸出至電腦,以峨此控㈣路板之功能是 ^常。而就本發明之多舰印刷電路板測試裝置而言, 若疋將衫像桔作為診斷碼儲存於記憶體中,並且,由探 針通知控路板輸航影像魅賴裝置以供判讀,即 可達到功能測試之目的。 省略簡化來自探針之測試電訊號係此影像槽在記憶體 内之位址與-讀取之指令,此測試電訊號係通之電路板並 且’將此診斷碼傳送至―預設對絲此記齡址之週邊元 12585871258587 IX. Description of the Invention: [Technical Field] The present invention relates to a printed circuit board test apparatus, particularly a printed circuit board test I which is operated by a computer controlled needle bed for testing. [Prior Art] Know: 'The test of electronic products has its history of sorrow. In the late stage of the β 〇, it was the first automated test method, so it was widely praised but it was woven with the 7G era. The technical skills test seems to be destined to be eliminated. However, today's trend has changed, and online testing is on the issue of “detection methods”. According to the analysis of the National Electronics Manufacturing Group II (face), with the change of circuit board manufacturing technology, the number of nodes available for detection on the circuit board will approach zero, and if the measurement cannot be performed, the online test is almost useless. Ground. j slave electronic products to measure miscellaneous, Wei Weizheng should be widely used in the process of the line; even in the middle of the process test. However, the tenderness, and the previous merits, the high component density and high test speed of the 偻^h king, the functional test by hand is not enough. Replace the test points on the board with the needle bed for function measurement! 258587 Test 0 Refer to the figure - diagram of the typical test needle bed structure. As shown in the figure, the test needle bed 100 structure includes a jig 12, a control circuit board 140 and a computer device 160. Among them, the household °^'12〇 is embedded with a plurality of rides up and down, and the test points on the circuit board 200 are tested (please refer to the first figure a). The computer device (10) is read through the control circuit board 14 and the (10) test point position to be tested. The control circuit board 14 transmits the test result back to the computer device, and also provides the power supply required for the test circuit board 2 to perform the test. Generally, the test obtained through the test needle bed structure is data. According to the information, this information can only represent the short/open circuit or bad situation of the line. As the functions of electronic products become more complex, the testing of circuit boards can sometimes be judged clearly only by data. Therefore, sometimes it is necessary to input the circuit board to be tested with a false signal 'for example, test image', and then detect the output signal of the circuit board to be tested to determine whether the function of the circuit board is normal. However, this test method has to cost several times the time cost and device cost. At the same time, the functions it can test are limited by the design of the false signal, and often cannot be completed. Baxi Yu is how to improve the function of the existing test needle bed structure to meet the needs of today's multi-function circuit boards, so that the time required for the secret board _ is a sub-product functional test towel, the most human OBJECT OF THE INVENTION [1] The main object of the present invention is to provide a printed circuit board test apparatus that can be used for functional testing to meet the needs of today's multifunctional circuit boards. The multifunctional printed circuit board testing device provided by the invention comprises a fixture, a control circuit, a computer device and a diagnostic code. The fixture includes a plurality of probes that can be moved up and down, and are respectively aligned with test buttons on a circuit board to be tested. The control circuit is electrically connected to the fixture to control the movement of the probe. The computer device is electrically connected to the control circuit through the cable, and the input control signal controls the movement of the probe, and a test signal is input through the probe to the circuit board to be tested. The diagnostic code is pre-written in the memory in the board to be tested before the function test of the board to be tested. When the function test is performed, the circuit board to be tested is based on the above test signal to execute the diagnostic code ▲ in the memory, and the execution result is infused into the computer money, and the function of the shutdown circuit board is normal. According to the present invention, the method for functional testing of the multi-wei apparatus circuit board includes the following steps: • writing a diagnostic code to the memory of the circuit board to be tested; The needle makes contact with the test point on the printed circuit board; the test line is connected to a test line, and the test board of the road board is used to test the test result of the functional description characteristic; the result of the probe is ~, 丨^ To determine whether the function of the board to be tested is normal. The advantages and spirit of the attached ^ 彳 = can be understood by the following detailed description of the invention and the drawings. [Embodiment] 凊 Refer to the second figure of the +# road board test device - a block diagram of the multi-function printing electrical example provided by the actual solution. This multi-function printing! 258587 circuit board measurement „sample system includes a fixture 320, a control circuit and a computer device 360. Among them, the fixture 320 includes a plurality of probes that can move up and down 'aligned separately - to be tested The test button on the circuit board 2. The control circuit is electrically connected to the control tool. The electric service system is electrically connected to the control circuit 340 through the cable, and controls the movement of the probe through the input control signal, and transmits the probe through the probe. Input a test signal to the board to be tested 2〇〇. Generally, the text is limited to the way of the probe input. This test telecommunications helmet provides relatively complicated test instructions, so the input is only by the probe. It is difficult to control the circuit board 200 to be tested. Therefore, a diagnostic code is written into the memory of the circuit board 2 to be tested before the test starts. When performing the function domain measurement, the processing center 22 of the circuit board to be tested is based on the test signal from the probe to access the column code of the recording body 2 (4), and the execution result is output to the brain device. For the judgement of the board Whether it can be normal. Explain the control circuit board of the scanner to be tested. Traditionally, it is known that the image is output to the computer, so that the function of the control board is normal. In the case of a printed circuit board test device, if the sputum is stored in the memory as a diagnostic code, and the probe is notified to the control panel to transmit the image charm device for interpretation, the purpose of the function test can be achieved. The simplification of the test signal from the probe is the address and read command of the image slot in the memory. The test signal is passed to the circuit board and the diagnostic code is transmitted to the preset Around the age of the site 1258587

Llf時’透過探觸耻匯輯之減,若是可以制 :斷碼,即表不讀、位址麵邊元件之對應關係正確無 凊賴帛三騎示,係本發騎提供可彻針床進行 2測叙制電路板—錄實補之方塊示意圖。 ,測電路板係包括—處理中心22G、—記憶體2 2測試鍵(圖中未示)。其中,處理中心22Q係分別電連 接至測試鍵與記憶體24G。並且,在記㈣内部係預先寫 入有至少一組診斷碼。處理令心220係依據由測試鍵所輸 入之測試魏號’娜錄行僻於記㈣24G内之診斷 碼。並將執彳τ絲透·im鍵触域針,織再傳遞至 ,腦裝置(财未示),以供蘭待測電路板之功 常。- 請參照第四圖所示’係透過第二圖之多功能印刷電路 板測試裝置,執行功制試的方法—較雜施例之流程 圖。首先,如步驟10,係預先寫人診斷碼(Diag_icC〇de) 於待測電路板之記顏内。隨後,如步驟… 板至於治具上,並且,透過電子元件控制至少一予^ 之探針移動,使探針與印刷電路板上之測試鍵相接觸。然 後,如步驟14 ’通入-測試電訊號至待測電路板,而待測 電路板係依獅彳試電喊執行魏碼,以敍具有功能描 述特性之職結果。最後,電職置係透過探針讀取上 測試結果(步驟16),以供判斷待測f路板之功能是否正 常。 相較於傳統之印刷電路板測試裝置,本發明所提供之 1258587 測試裝置具有下列優點: 一、祿於傳統之測試針床架構,僅能偵测電路 線路之短/開路或是不良等情形。本發明所提供之 置還可輯制電路板進行較域雜之功齡m。、^ _ 一、傳統之印刷電路板測試裝置所進行之功能測 忒’必須使用複雜的假信號。經由待測電路板處理 裝置檢測其輸出結果。此外,此種功能測 忒係涉及整個板之運作,往往必須耗費較長之運 ,晉tr月所提供之測試裝置並不需要使用特別的檢測 #1、硬雜的假信號,只需在測試前载入適當的診斷 記憶體内。因此,本發.了可崎低繼成本,同時,、 也可以減少功能測試所需之時間。 以上所述係利用較佳實施例詳細說明本發明,而 制2明之範圍,而且熟知此類技藝人士皆能明瞭,適當 而作i微的改變及碰’仍料失本㈣之要義所在,亦 不脫離本發明之精神和範圍。 【圖式簡單說明】 第-圖係-典型測試針床架構之示意圖。 第-A圖係-典型測試針床之治具部分結構示意圖。 署-係本發明所提供之多功能印刷電路板測試裝 置較佳實施例之方塊示意圖。 本發明所提供τ利用針床進行功能測試之 待測電路板-較佳實施例之方塊示意圖。 第四圖係透過第一圖之多功能印刷電路板測試裝 1258587 置,執行功能測試的方法一較佳實施例之流程圖。 【主要元件符號說明】 測試針床100 治具 120, 220 控制電路板140, 340 電腦裝置160 待測電路板200 探針122 處理中心220 記憶體240 電子元件260When Llf is 'reduced by the sorrowful recollection, if it can be made: break code, that is, the table does not read, the correspondence between the components of the address surface is correct, and there is no 凊 帛 帛 , , , , , , , , , , Perform a 2-sampling circuit board—the block diagram of the recording and replenishment. The test circuit board includes a processing center 22G and a memory 2 2 test key (not shown). The processing center 22Q is electrically connected to the test button and the memory 24G, respectively. Further, at least one set of diagnostic codes is written in advance in the note (4). The processing command 220 is based on the diagnostic code entered in the 24G by the test Wei number of the test key. And the 彳 丝 丝 · im im im im im im im im im im im im im im im im im im im im im im im im im im im im im im im im im - Please refer to the figure shown in Figure 4 for the method of performing the power test through the multi-function printed circuit board test device of the second figure - the flow chart of the more complicated example. First, as in step 10, a human diagnostic code (Diag_icC〇de) is pre-written in the face of the circuit board to be tested. Subsequently, the steps are as follows: the plate is on the jig, and at least one of the probes is moved by the electronic component to bring the probe into contact with the test key on the printed circuit board. Then, as in step 14 'pass-test the signal to the board to be tested, and the board to be tested is to perform the Wei code according to the lion's test, to describe the function with the function description characteristics. Finally, the electric job system reads the test result (step 16) through the probe to judge whether the function of the f-board to be tested is normal. Compared with the conventional printed circuit board test device, the 1258587 test device provided by the present invention has the following advantages: 1. The conventional test needle bed structure can only detect short/open circuit or poor circuit of the circuit line. The device provided by the present invention can also be used to make a circuit board to perform a relatively poor power m. , ^ _ First, the function of the traditional printed circuit board test device 忒 ' must use complex false signals. The output result is detected via the board processing device to be tested. In addition, this type of function measurement involves the operation of the entire board, and often requires a long time of operation. The test equipment provided by Jin true does not need to use special detection #1, hard and false signals, only in the test Load the appropriate diagnostic memory before. Therefore, this issue can reduce the cost of the product, and at the same time, it can also reduce the time required for functional testing. The above description of the present invention will be described in detail by the preferred embodiments, and the scope of the invention is well known, and those skilled in the art will be able to clarify the appropriateness of the i micro change and the meaning of the "remaining loss" (4). Without departing from the spirit and scope of the invention. [Simple diagram of the diagram] The first diagram is a schematic diagram of a typical test needle bed architecture. Figure-A is a schematic view of the structure of a typical test needle bed. The present invention is a block diagram of a preferred embodiment of a multifunctional printed circuit board test apparatus provided by the present invention. The present invention provides a block diagram of a circuit board to be tested for functional testing using a needle bed. The fourth figure is a flow chart of a preferred embodiment of the method for performing functional testing through the multi-function printed circuit board test device 1258587 of the first figure. [Main component symbol description] Test needle bed 100 Fixture 120, 220 Control circuit board 140, 340 Computer device 160 Circuit board to be tested 200 Probe 122 Processing center 220 Memory 240 Electronic component 260

Claims (1)

!258587 、申請專利範圍: 該 待測力,測電路板。 鍵,該記憶體内部寫入至少=憶體與複數個測試 碑,並將執行絲剌_=^^行該診斷 該待測電路板之功能是否正常。出至销床,以供酬 2. 如申請專利範圍第^之待測 沴斷碼包括一應用程式。 低具中,该 3. 如申請專利範圍第4之待測電路板,㈠ 杉斷碼包括一影像檔案。 ^中4 4. 如申請專利範圍第i項之待測電路板,其中,該 0斷碼包括一數據資料。 / 5. 如申請專利範圍第0之待測電路板 憶體係一快閃記憶體。、己 6·如申請專利範圍第丨項之待測電路板,其中該記 憶體係一同步動態記憶體(SDRAM)。 7· 種夕功此印刷電路板測試裝置,用以測★式一拉 測電路板是否正常,包括·· # ^ 一治具,包括複數個可上下移動之探針,分別對準該 待測電路板上之測試點; / 一控制電路,電連接該治具以控制該探針之移動,· 一電腦裝置,透過排線電連接至該控制電路,以輸入 控制信號控制該探針之移動,並透過該探針輸入一測試電 12 1258587 矾號至該待測電路板; -診斷碼’寫人該制電路板之記憶體内,當進行測 4% ’,亥待測電路板係依據該測試電訊號以執行該吟斷 ,,並將執行結果輸出至該電腦裝置,以顯 測 板之功能是否正堂。 丁』电& 获番8. 中睛專利範圍第7項之多功能印刷電路板測試 裝置’其中該控魏路可透職探針提供該待測電路板執 行该診斷碼所需要之電源。!258587, the scope of application for patent: The force to be measured, the circuit board. The key, the memory internally writes at least = memory and a plurality of test monuments, and will execute the wire _=^^ line to diagnose whether the function of the circuit board to be tested is normal. To the sales bed for payment 2. If the patent application scope is to be tested, the code includes an application. In the case of low-end, the 3. For the circuit board to be tested according to the fourth patent application, (1) the slash code includes an image file. ^中4 4. For the circuit board to be tested according to item i of the patent application, wherein the 0 code includes a data material. / 5. If the circuit board of the patent scope is 0, the system is a flash memory. 6. The circuit board to be tested according to the scope of the patent application, wherein the memory system is a synchronous dynamic memory (SDRAM). 7· This kind of printed circuit board test device is used to measure whether the test circuit board is normal, including ··· #^一治具, including a plurality of probes that can move up and down, respectively, to be aligned a test point on the circuit board; / a control circuit electrically connected to the fixture to control the movement of the probe, a computer device electrically connected to the control circuit through the cable, and controlling the movement of the probe by inputting a control signal And input a test electric 12 1258587 nickname to the circuit board to be tested through the probe; - the diagnostic code 'writes the memory of the circuit board of the circuit board, when measuring 4% ', the board to be tested is based on The test signal is used to perform the break, and the execution result is output to the computer device to check whether the function of the board is correct. Ding's electric & obtained the multi-function printed circuit board test device of the seventh item of the patent scope. The control device provides the power supply required for the circuit board to be tested to execute the diagnostic code. 9.如申請專利範圍第7項之多功能印刷電路板測試 我置,其中該電腦裝置包括: —中央處理器; -顯示器’電連接該中央處理器以顯示該測試數據; —圯憶體,儲存該控制信號與該測試信號;及9. The multifunctional printed circuit board test according to claim 7 of the patent application, wherein the computer device comprises: - a central processing unit; - the display 'electrically connects the central processing unit to display the test data; Storing the control signal and the test signal; and 過輸出入埠(I/〇P〇rt),電連接該中央處理器,並 雷^電連接至該㈣電路,以輸出該控號與該測 '巩號,並取得該待測電路板之測試結果。 蜜10·如申請專利範圍第7項之多功能印刷電路板測i 戒置,其中該診斷碼包括一應用程式。 11·如申凊專利範圍第7項之多功能印刷電路板測^ 又置,其中該診斷碼包括一影像檔案。 12.如申請專利範圍第7項之多功能印刷電路板測^ x置,其中該診斷碼包括一數據資料。 13·如申請專利範圍第7項之多功能印刷電路板測, 13 1258587 裝置,其中該記憶體係一快閃記憶體。 丨4·如申請專利範圍第7項之多功能印刷電路板測試 、置其中该記憶體係一同步動態記憶體⑽画)。 15· —種印刷電路板之測試方法,利用一測試針床架 、執行功能測試,該測試方法至少包括下列步驟: 寫入診斷碼(DiagnosticCode)於該待測電路板之記 憶體内; 移動至少一預設之探針使接觸該印刷電路板上之測試參 通入一測试電訊號至該待測電路板,該待測電路板係 依據該測試電訊號執行該診斷碼,以產生具有功能描述特 性之測試結果;以及 透過遠探針讀取該測試結果,以判斷該待測電路板之 功能是否正常。 16·如申請專利範圍第μ項之測試印刷電路板之方 法,其中該診斷碼係被寫入一快閃記憶體。 · Π·如申請專利範圍第15之測試印刷電路板之方法, 其中該診斷碼係被寫入一同步動態記憶體(SDRAM)内。 18·如申請專利範圍第15項之測試印刷電路板之方 法,其中該診斷碼係可根據所需進行之功能測試的種類而 變更。 、 14The input/output port (I/〇P〇rt) is electrically connected to the central processing unit, and is electrically connected to the (four) circuit to output the control number and the measurement 'scoring number, and obtain the circuit board to be tested. Test Results. Honey 10 · The multi-function printed circuit board of the patent application scope 7 is tested, wherein the diagnostic code includes an application. 11. The multifunctional printed circuit board of claim 7 of the claim patent scope is further disposed, wherein the diagnostic code includes an image file. 12. The multi-function printed circuit board according to claim 7 of the patent application, wherein the diagnostic code comprises a data material. 13. A multi-function printed circuit board test according to item 7 of the patent application, 13 1258587 device, wherein the memory system is a flash memory.丨4· For example, the multifunctional printed circuit board test of the seventh application patent scope is set, and the memory system is a synchronous dynamic memory (10). A test method for a printed circuit board, using a test needle bed frame, performing a functional test, the test method comprising at least the following steps: writing a diagnostic code (DiagnosticCode) in the memory of the circuit board to be tested; moving at least a preset probe causes a test contact on the printed circuit board to pass a test signal to the circuit board to be tested, and the circuit board to be tested performs the diagnostic code according to the test signal to generate a function Describe the test result of the characteristic; and read the test result through the far probe to determine whether the function of the circuit board to be tested is normal. 16. A method of testing a printed circuit board according to the scope of the patent application, wherein the diagnostic code is written to a flash memory. A method of testing a printed circuit board according to the fifteenth patent application, wherein the diagnostic code is written into a synchronous dynamic memory (SDRAM). 18. A method of testing a printed circuit board according to claim 15 wherein the diagnostic code is changeable depending on the type of functional test to be performed. , 14
TW93131693A 2004-10-19 2004-10-19 Multi-functional printed circuit board testing apparatus, method thereof and circuit board to be tested capable of using bed of nails to conduct functional test TWI258587B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102338814A (en) * 2011-06-17 2012-02-01 杭州炬华科技股份有限公司 Automatic needle bed

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102338814A (en) * 2011-06-17 2012-02-01 杭州炬华科技股份有限公司 Automatic needle bed

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