TWI257483B - Automatic testing system for electronic devices and its method - Google Patents

Abstract

The present invention provides an automatic testing system for electronic devices and its method. The system comprises at least one upright motherboard cabinet, two access devices, a storing area, a transmission device and a control host. The major test includes: a step of implanting electronic devices, in which one access device accesses electronic devices for being mounted on a motherboard under test in the motherboard cabinet; a step of testing, in which the motherboard under test and the electronic devices are operated together to perform a test for actual operation; a step of host controlling, in which test data and the like are transmitted to the control host so that the control host compares the qualities and effects of the electronic devices; a step of taking out electronic devices, in which the control host controls the other access device to take out the electronic devices for being classified and stored based on the test result, thereby achieving the benefits of increasing the test speed and reducing the quality control cost.

Description

1257483 V. INSTRUCTIONS (1) [The invention belongs to the law of the invention" especially refers to the automatic operation of the test [previous technology] Press, before the factory, will insure the quality of its products for correction, wafer packaging or During the solid period, or even before the rigorous trial work, the effect is confirmed, so as to reduce the number of well-known test panels for the board, so that the manpower will be used after the wafers In the action, the shadow can reduce the cost of manufacturing and quality control in the future.] About the ~Ji Lei; _ An automatic test system for the insertion of jade pieces and its services, I I is suitable for the completed transistor Comprehensive test system and its method. Ding Wang surface test: electricity: 7L parts and electronic products, etc., #制仃一糸列列列列列列篇名 Inspection and testing products, such as the control of the field, and the outside of the field, and can be found in the process of the test, in addition to the improvement or #,俾 Improve the quality of its products. 】 :: ‘ :: _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The mouth tube control, especially in the factory, will often carry out eight problems. Each wafer on the market has a good product surface _ low its subsequent quality control cost.贝 及 and function The actual test method of the chip is to use the cabinet of most motherboards. The internal security of the cabinet is different from the wafer bottling test, so one person can only! The number of test labor costs increased; secondly, the known test = dry host planted in the § Hai trial motherboard, after one: the operating force to remove the transistor, visible, it wastes Xu Xizhen test action chip) and follow-up The operation (I, the time of the eve of the time, the speed of the pipe, etc., does not leave the cost of returning to the factory for maintenance during the period of the enemy, but it is produced, so that for the consumer, it is ultimately the product of the product.

Him Page 5 1257483 V. INSTRUCTIONS (2) In view of the above-mentioned problems and deficiencies derived from the above-mentioned electronic component testing operations, the creators of this case are particularly concerned with the quality control testing of electronic components such as wafers. After improving and innovating, and after years of painstaking research, the company successfully developed the automated test system and method for the electronic component of the present invention. [Summary of the Invention]

The main object of the present invention is to provide an automated test system for electronic components and a method thereof, but by adopting the design of an electronic component automated test system architecture and a special automated test procedure, the electronic component test rate is improved and the quality control is reduced. Cost, suitable for a large number of test quality control work and other benefits.

According to the above objective, the automatic test system for electronic components of the present invention comprises at least one mainboard cabinet, two sets of picking devices, a storage area, a conveying device and a control host, wherein The main board is a vertical cabinet, and a device for testing a plurality of test main boards is arranged therein, and is connected with the control main body, and an electronic component temporary storage area is arranged under the cabinet for placing The electronic component; the capturing device of the two sets of electronic components is a device that can automatically perform operations such as taking, placing, and inserting electronic components, and is connected with the control host; the storage zone is divided into the measured zone. And the untested area for centrally placing electronic components; the conveying device is for conveying the untested electronic components of the storage area to the motherboard of the main board, and outputting the measured electronic components to the storage area; the control host is a command Take the device to generate specific actions, connect to the test motherboard to monitor the quality of the electronic component test, and compare and distinguish the quality of the electronic components.

Page 6 1257483 V. Description of invention (3) Apparatus for testing, comparing and other information. The automatic tree test method of the scoop ΐί::: component, the test steps mainly include the embedded electronic components, the main component of the control device is taken, and the electronic component is f-plugged in the main 嫱^5撷取,测4. Test by the test board and the electronic element per year of the board test # '· Host control: will test: the second: the use of:: etc; take out the electronic ": to control. The two electronic components 'and the electronic components are classified according to the test results 撷: the soil test rate is increased, and the quality control is reduced. 9 i bei mode] The embodiment of the drawing illustrates the manufacturing method, the step features and the use of the invention The purpose of the detailed description is as follows: From the first to third figures of the second test, the present invention is "electronic components to the test system and its method", 2 automated test system includes, one, the board cabinet 1 and two The electronic component capturing device 2, 2, and the transparent device, and the control device are connected to each other to form an automatic device for the electronic component. , provides the pass-through of the multi-test motherboard layout Vertical cabinet or grid for two sides (can also be used for two sides of the test. She has a plurality of test boards 11 at the selected place in the cabinet. The person's action thin board 11 series can be a general table. Computer, notebook computer, 曰 (PDA), other microcomputer mainframe, large computer host 1257483 V. Invention description (4) Or electrical appliances, electricity under the setting - grid area 1 2 1 and a sub-component 1 0; A pick-up head for inserting and placing the mechanical arm device, etc. 2 1 The electronic component can be placed on the main board and can be taken and stored by the trial main commander, with at least the elbow of the untested and unchecked automation. This type of machine can be used to transport the 蕲# 设备 设备 主机 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺 寺"1 2 2 in each district, for the placement of measured and untested electricity 2 2^ 2 ' can automatically carry out the electronic components of the electronic components, which can be a kind of rail $ 夂 ^ robot arm Or other available automation commands, 2^ picking devices 2, 2, and having at least one electric The sub-component cabinet 1 and the hunting/b\-order two pick-up devices 2 and 2 are respectively arranged in the test field, and the pick-up device 2 can be used to carry out the action of the tilting plate 1 1 and the other取取装9, =11 take out the electronic components and place them in the storage area 3; 2 can be used to implant and take out the electronic component action area 3, which is used to centrally distinguish the electronic components and can be placed on the main board for a storage cabinet. The cabinet has a measured area 31 and an untested area 32, and the electronic component 10 is divided into two parts; the storage area 3 is arranged and the device 33 is arranged, and the finishing device 33 can be an arm or other available automatic command to control the measurement area 3 2 The electronic component 10 is placed in the send and set 4, and the tested electronic component is collected. The centralized set of the device can be selectively selected. The mechanical machine of the obsolete machine is placed in the following transport body.

I set 4, will be the above-mentioned storage area 3 untested electronic components

1257483 V. INSTRUCTIONS (5) The main board is equipped with the cabinet 1 and outputs the transport device of the electronic board 10 to the receiving area 3, which can be an equivalent device such as a conveyor belt or a conveyor wheel. Provided between the two picking devices 2, 2' and the finishing device 3 of the storage area 3, and is provided with an input portion 4 1 and an output portion 4 2, respectively, for performing the transport operation of the electronic component 10; The host 5, the system monitors the quality test effect of the electronic components, performs the comparison and difference of the quality of the electronic components, can store the test, the comparison and the like, and can command the capture device to generate a specific action after the computer host; , distinguishing and storing test materials and software and hardware devices required to generate specific instructions; thereby, each test board 11 of the motherboard 1 is separately or uniformly controlled by a wired or wireless signal connection 6 The host 5 is connected, and each group of picking devices 2, 2' is connected with the control host 5, and if so, constitutes an automated test system for the electronic component of the present invention; and the control host 5 can also be Storage area 3, The finishing device 3 3 and the conveying device 4 are connected to each other, so that the entire automatic testing system can be used together to make the testing process smoother and more harmonious. As described above, the motherboard panel 1 of the present invention can be provided with a plurality of upright parallel rows (as shown in the first and second figures), and are respectively disposed on both sides of each motherboard panel 1 The device 2, 2' is taken, and the conveying device 4 is disposed between the capturing device 2, 2' and the finishing device 3 of the storage area 3, thereby forming a test group of electronic components, thereby improving test efficiency. The automated test methods and steps of the present invention are shown in the first to fourth figures, and include the following:

Page 9 1257483 V. INSTRUCTION DESCRIPTION (6) (A) Input electronic component: The electronic component 1 is taken out from the unmeasured area 3 2 by the arranging device 33 of the storage area 3 and placed on the input portion 4 of the transport device 4! , the electronic component 10 is transported to each of the motherboard mounting cabinets 1, and the operating device 2 or 2' is taken into the unmeasured area 1 2 2 of the mainboard cabinet 1 or temporarily entered into the following ( B) flow; (B) implanted electronic components: can be controlled by the control host 5 by signal _ group or groups of picking devices 2, so that the picking device 2 is unified or separately from the motherboard 1 Zone 1 2 2 or conveyor 4 for picking up electronic components

1 (for example, a wafer, etc.) operates, and the electronic component is implanted in the test motherboard 11 of the motherboard 1 to make the electronic components and the test motherboard 11 connected to each other in a practical state; (C) Test: The test main board of the main board 1 is matched with the electronic component 10 (for example, a wafer, etc.) for the actual use test operation, wherein each test board 1 i is installed with a test Other necessary soft and hardware, etc.; (D) Host control: Pass the data of the test board test data of the motherboard board i to the control host 5, and the control host

Set the soft and hard body to compare, distinguish the quality of each electronic component, make the Z rate and effect, etc., and immediately display the test results on the display, and the ratio =

^ Distinguish the tribute and other storage on the disk drive, tape drive or other recordable harder than the device; up to (E) take out the electronic components' · with the control host 5 according to the comparison results, through the command signal system - or respectively Control the motherboard panel setter another group of 2' to remove the electronic components, and let the picking device 2, according to the test results

1257483 V. Description of invention (7) 'One" '1 (for example, divided into defective products, low-power, high-quality, etc.) to store the electronic = piece in the tested area of the main board 1) 2, or directly Placed in the output portion 4 2 of the garment set 4, thereby automatically completing the test operation of the electronic component, and (F) outputting the electronic component: the pick-up device 2 or 2 from the motherboard 1 is tested Grid 21 or test motherboard} 丨Received the tested electronic component 10 placed on the output portion 42 of the transport device 4, the tested electronic component 1 〇 = late to the storage area 3, and then the finishing device 3 3 Placed in the measured area 3 1 concentration, for the subsequent process, such as printing, packaging, etc.

By using the automatic test system of the present invention and the method design thereof, since the # ^ 枢 卜 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二 二2 into the electronic components, (C) test, (D) host control, and electronic:: In / etc.: This can be completely controlled by the control host 5 - 疋仃 electronic 70, only 2:5, therefore, can significantly reduce the quality of the person: cost, depending on the control host second, the present invention can control the camp through the control 2, 2, storage area 3, finishing device 3, 5 Pick up

: Electronic yuan. Before and after the test, each garment type is set to 3, "planning, shortening the test work before; = the rate of proper overall test operation, so as to improve 'and improve the quality control cost. m冤子凡Parts and other products are shipped from the factory only need to specify 'the automated test system of the invention and its method, its control

Page 11 1257483 V. Description of invention (8)

The picking devices 2, 2', the storage area 3, the sorting device 3 3, and the transporting device 4 generate the actor, and may also be carried out by other computer host devices, or the control host 5 may be the test host and the control host portion, respectively. In addition, the present invention is not limited to the test operation of the electronic component products before leaving the factory, and may be installed in a specific production line to randomly or comprehensively take the electronic components in the process (such as wafers in the packaging process, etc.). And performing the above test operation, monitoring the quality of the electronic components at any time, and by using the comparison data stored by the control host 5, as a basis for improving the electronic component process equipment or repairing, replacing, etc.; The automatic test system and the method thereof of the present invention, which are implemented in the process of electronic product manufacturing or before leaving the factory, are all included in the scope of the patents disclosed in the present invention, and are specified. In summary, the "automatic test system and method for electronic components" of the present invention has been practical and creative, and the use of the means is also novel and unambiguous, and the efficacy and design purpose are in line with the fact that it has been reasonably improved to Ming, for this reason, the invention patent application was filed according to law, but the bureau was requested to give a detailed examination, and the patent was granted as a prayer.

Page 12 1257483 Brief description of the diagram [Simple description of the diagram] The first diagram is a top view of the architecture of the automated test system of the present invention. The second figure is a side view of the motherboard of the invention. The third figure is another side view of the main board of the present invention. The fourth figure is a schematic diagram of the test procedure of the automated test system of the present invention [main component symbol description] main board pivot 1 test main board 11 temporary storage area 12 measured area 121 unmeasured area 122 2, 21, picking device 2 Pickup head 21 Storage area 3 Measured area 31 Untested area 32 Finishing device 33 Conveying device 4 Input part 41 Output part 42 Control unit 5 Wired or wireless signal connection 6 Input electronic components (A) Implanted electronic components ( B)

Page 13 1257483

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Claims (1)

1257483 VI. Application for Patent Scope 1. An automated test system for electronic components, comprising at least: a main board, which is a vertical cabinet, and a plurality of test main boards are provided at selected places in the cabinet; The automatic mechanical device for taking, arranging and placing the electronic components is respectively disposed on both sides of the motherboard of the main board; a storage area is divided into the measured area and the unmeasured area for centrally placing electronic components, and There is a finishing device at the selected place; a conveying device for transporting electronic components to a motherboard of a motherboard, and outputting the electronic components of the motherboard to the storage area of the storage unit, which are disposed between the two picking devices and the finishing device of the storage area; The control host is configured to connect the test board of the motherboard to the control host through the signal connection to form an automated test system for the electronic components. 2. The automatic test system for an electronic component according to claim 1, wherein the motherboard has a temporary storage area, and the temporary storage area is divided into a measured area and an unmeasured area. , for the temporary placement of measured and untested electronic components. 3. The automatic test system for electronic components according to claim 1 or 2, wherein the main board cabinet comprises a plurality of formed upright side-by-side, and each of the main board cabinets is provided with two sides. Take the device. 4. An automated test system for an electronic component according to the first aspect of the patent application, wherein the picking device and the finishing device are included as a road-ending machine. Page 15 1257483 VI. Scope of application The arm or elbow arm, or one of the other mechanical devices that can be controlled by automated commands. 5. The automated test system for electronic components of claim 1, wherein the transport device includes an input portion and an output portion for respectively transporting the electronic components. 6. The automated test system for electronic components of claim 1, wherein the picking device, the storage area, the sorting device, and the transporting device comprise a signalable connection to the control host. 7. An automated test method for an electronic component, comprising: a motherboard with a plurality of test motherboards, a second pick-up device disposed at a selected portion of the motherboard, a storage area for a centralized electronic component, and a The conveying device between the main board and the storage area, and a control host, and the following steps: The electronic component is implanted: the electronic component is taken by a picking device, and the test board is placed on the motherboard. , test: the test motherboard of the motherboard is tested with the electronic component; Host control: Pass the test data data to the control host; Take out the electronic components: The electronic components that have been tested are taken out by another pick-up device and stored according to the test results. 8. The automated test method for an electronic component according to claim 7, wherein the step of implanting the electronic component comprises the step of inputting an electronic component; the step of inputting the electronic component by means of the transport device The components are transported to the main board cabinet for the pick-up Page 16 1257483 Patent Application Scope Test. The method of claim 7, wherein the step of removing the electronic component comprises the step of outputting an electronic component; the step of outputting the electronic component is to transport the electronic component to the storage area by the conveying device Centralized storage. Page 17