TWI248184B - High frequency semiconductor device, method for fabricating the same and lead frame thereof - Google Patents

High frequency semiconductor device, method for fabricating the same and lead frame thereof Download PDF

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Publication number
TWI248184B
TWI248184B TW093100867A TW93100867A TWI248184B TW I248184 B TWI248184 B TW I248184B TW 093100867 A TW093100867 A TW 093100867A TW 93100867 A TW93100867 A TW 93100867A TW I248184 B TWI248184 B TW I248184B
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Taiwan
Prior art keywords
wafer holder
frequency
frequency electrical
electrical connection
semiconductor package
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Application number
TW093100867A
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Chinese (zh)
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TW200524118A (en
Inventor
Yu-Po Wang
Cheng-Hsu Hsiao
Chih-Ming Huang
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Siliconware Precision Industries Co Ltd
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Priority to TW093100867A priority Critical patent/TWI248184B/en
Publication of TW200524118A publication Critical patent/TW200524118A/en
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Publication of TWI248184B publication Critical patent/TWI248184B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49109Connecting at different heights outside the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

A high frequency semiconductor device, a method for fabricating the same and a lead frame thereof are proposed, in which the lead frame having a die pad and a plurality of leads is provided, wherein a plurality of high frequency electrically connected portions electrically isolated with the die pad is formed to surround the die pad. A chip having a plurality of high frequency I/O pads and non-high frequency I/O pads is attached on the die pad. Then, a plurality of wires is provided to electrically connect the high frequency I/O pads and the high frequency electrically connected portions, and to electrically connect the non-high frequency I/O pads and the leads, respectively. Finally, an encapsulant is formed to encapsulate the chip, the wires, the high frequency electrically portions, and the leads so as to expose the bottom surfaces of the die pad and the high frequency electrically connected portions, thereby improving the transfer quality of high frequency signals.

Description

1248184 五、發明說明(1) 【發明所屬之技術領域】 本發明係關於一種高頻半導體封裝件及其製法與其導 線架,尤指一種可進行高頻輸入/輸出的高頻半導體封裝 件及其製法與其導線架 【先前技術】 隨著電子工業的進步與數位時代的來臨,消費者對於 電子產品之功能要求亦日漸增多,因此,如何突破半導體 製造與積體電路設計之技術,以製成功能更為強大之高頻 晶片,顯然已成為今日研究上的重要課題,對半導體封裝 技術而言,所面臨之挑戰即在於該類高頻晶片之訊號傳送 設計,以避免晶片封裝完成後,受限於封裝技術而致使其 高頻訊號的傳輸效能大為降低,特別係對以導線架 (Leadframe)為晶片承載件之半導體封裝件而言,更可能 因其導線架設計而影響高頻產品之效能,成為導線架封裝 技術的一大瓶頸。 傳統以導線架為晶片承載件之半導體封裝件,例如四 方扁平式半導體封裝件(Quad Flat Package, QFP)、四方 扁平無導腳式(Quad Flat Non-leaded, QFN)或小外型封 裝件(SOP,Small Outline Package)等半導體封裝件,其 製作方式均係如第3圖所示,在一具有晶片座6 1 ( D i e β P a d )及多數導腳6 2 ( L e a d )之導線架6 0上黏置一半導體晶 ,片63,復藉多數銲線64 (Wire)電性連接該晶片63表面上 之銲墊6 5 ( P a d )與其對應之多數導腳6 2,而以一封裝膠體 6 6包覆該晶片6 3及銲線6 4而形成一半導體封裝件,同時,BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high frequency semiconductor package and a method of fabricating the same, and a lead frame thereof, and more particularly to a high frequency semiconductor package capable of high frequency input/output and Method and its lead frame [Prior Art] With the advancement of the electronics industry and the advent of the digital age, consumers are increasingly demanding functional requirements for electronic products. Therefore, how to break through the technology of semiconductor manufacturing and integrated circuit design to make functions More powerful high-frequency chips have become an important issue in today's research. The challenge for semiconductor packaging technology is the signal transmission design of such high-frequency chips to avoid the limitation of chip packaging. Due to the packaging technology, the transmission performance of high-frequency signals is greatly reduced. Especially for semiconductor packages with leadframes as wafer carriers, it is more likely to affect the performance of high-frequency products due to their lead frame design. Become a major bottleneck in leadframe packaging technology. A semiconductor package in which a lead frame is a wafer carrier, such as a quad flat package (QFP), a quad flat non-leaded (QFN), or a small package ( Semiconductor package such as SOP (Small Outline Package), which is produced in the same manner as shown in FIG. 3, in a lead frame having a wafer holder 6 1 (D ie β P ad ) and a plurality of lead pins 6 2 (L ead ) A semiconductor crystal, a sheet 63 is adhered to the 60, and a plurality of bonding wires 64 (Wire) are electrically connected to the bonding pads 65 (P ad ) on the surface of the wafer 63 and a plurality of corresponding guiding pins 6 2 thereof. The encapsulant 66 covers the wafer 63 and the bonding wire 64 to form a semiconductor package, and

]76]]矽品.ptd 第7頁 1248184 五、發明說明(2) 亦可設計使該晶片座6 1之一表面外露於該封裝膠體6 6外, 而成為一晶片座外露式(Exposed Pad)封裝件,以藉該晶 片座6 1加速散逸該晶片6 3上之熱量。 然而,此類封裝件之訊號傳遞路徑係如圖示經晶片 6 3、銲線6 4、導腳6 2而傳遞至例如印刷電路板等外部電子 裝置上,其訊號傳遞路徑顯然過長,且由於該晶片6 3與印 刷電路板並非位於同一平面上,亦使得該些導腳6 2勢必得 形成一彎折設計,更無縮短長度之設計空間,故而,對於 ‘2G Hz以上之高頻產品而言,此類習知封裝方法即難符其 f 號傳輸需求’而成為南頻晶片封裝上的一大障礙。 因此,高頻晶片之封裝只得使用例如球柵陣列(BG A ) 或覆晶式球栅陣列(FCBGA)等高階封裝技術,而藉此些技 術所使用之基板(S u b s t r a t e ),由其上、下表面之線路佈 局進行快速的訊號傳輸,以符高頻晶片的低傳導路徑之需 求;然而,基板之單價遠較導線架為高,且於基板表面上 進行精密線路佈局亦遠不若導線架上的打線作業來得容 易,故而若相較於導線架之封裝方法,採用此類封裝技術 顯然將大幅提升其整體封裝成本(基板單價往往佔整體成 本之一半以上)與製程複雜度,對原本設計/製造成本即較 ^的高頻晶片而言,更形成量產上的一大問題,亦使得整 體供應鏈中的成本難以降低。 Λ 因此,習知上亦發展出改變導線架設計以縮短訊號傳 輸路徑之方法,試圖解決此一高頻產品問題,其係如美國 專利第6, 3 4 8, 7 2 6號案所示,提出一種如第4Α圖之上視圖]]]] product. ptd page 7 1248184 V. Description of the invention (2) It is also possible to design a surface of the wafer holder 61 to be exposed outside the encapsulant 66 to become a wafer holder (Exposed Pad). a package for accelerating the dissipation of heat from the wafer 63 by the wafer holder 61. However, the signal transmission path of such a package is transmitted to an external electronic device such as a printed circuit board via the chip 63, the bonding wire 64, and the lead pin 62, and the signal transmission path is obviously too long, and Since the wafers 63 and the printed circuit board are not on the same plane, the guide pins 6 2 are bound to form a bent design, and there is no design space for shortening the length. Therefore, for the high frequency products above 2G Hz. In fact, such conventional packaging methods are difficult to meet the transmission requirements of the 'f number' and become a major obstacle in the south frequency chip package. Therefore, the high-frequency chip package has to use a high-order packaging technology such as a ball grid array (BG A ) or a flip-chip ball grid array (FCBGA), and the substrate (S ubstrate ) used by these technologies is The line layout on the lower surface performs fast signal transmission to meet the low conduction path of the high frequency chip; however, the unit price of the substrate is much higher than that of the lead frame, and the precise circuit layout on the surface of the substrate is far from the lead frame. The above-mentioned wire bonding operation is easy, so if compared with the lead frame packaging method, the use of such a packaging technology will obviously greatly increase the overall packaging cost (the substrate unit price often accounts for more than one-half of the overall cost) and the process complexity, the original design / Manufacturing costs, that is, higher frequency wafers, constitute a major problem in mass production, and the cost in the overall supply chain is difficult to reduce. Λ Therefore, it has been developed to change the design of the lead frame to shorten the signal transmission path, in an attempt to solve the problem of this high frequency product, as shown in the case of U.S. Patent No. 6, 3 4 8, 7 2 6 Propose a view as shown in Figure 4

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fill ·· ? 176]]矽品· ptd 第8頁 1248184 五、發明說明(3) 所示的無導腳式導線架70 (Leadless Leadframe),包括 一晶片座7 ;L、多數環設於該晶片座7 1周圍的導電墊7 2、以 及用以連接該導電墊的繫條73 (Tie Bar),且該導線架70 之角緣位置係形成有將該導電墊7 2連接至框架7 4上的支撐 條7 5 ( S u ρ ρ 〇 r t B a r ),因此,此一導線架7 0即可如第4 B圖 之半導體封裝件8 0所示,而將高頻晶片8 1黏置於該晶片座 7 1上,並以銲線8 2電性連接至所對應之導電墊7 2,進而以 一封裝膠體8 3包覆該晶片8 1、銲線8 2、與部分導線架7 0, 而令各導電墊7 2之底面外露出該封裝膠體8 3外,再切除用 以連接各導電墊7 2之繫條7 3令其彼此電性分離,即可藉由 該導電墊7 2之設計,令高頻訊號經晶片8卜銲線8 2、導電 墊7 2而傳至外界印刷電路板,大幅縮短其訊號傳導路徑, 解決習知導線架導腳過長之問題。 然而,此一封裝結構雖可解決訊號傳輸之困擾,然卻 也衍生了其他的製程問題,因此類導線架7 0僅係藉由其四 角緣位置的支撐條7 5與框架7 4連接,加以導線架7 0之厚度 甚薄,故而極易影響其平面度,而令外緣導電墊7 2與内部 導電墊7 2呈現不共面之情況,導致打線(W i r e Β ο n d i n g )作 業難以精確進行,並令外緣導電墊7 2與銲線8 2間的連接品 質大幅降低,造成如第5圖所示的斷線缺失c,因此,此一 '設計雖可縮短訊號傳輸路徑,然若導電墊7 2與銲線8 2間出 現斷線現象,則同樣難以進行高頻訊號之傳輸;再者,相 較於習知導線架,此類特製導線架7 0亦有製程複雜與成本 高昂之問題,形成量產上的限制,顯然難符高階產品大量Fill ·· ? 176]]矽品· ptd Page 8 1248184 V. Invention Description (3) The leadless lead frame 70 (Leadless Leadframe) shown includes a wafer holder 7; L, a majority of the ring is located in the a conductive pad 7.2 around the wafer holder 71, and a tie bar 73 (Tie Bar) for connecting the conductive pad, and the corner edge of the lead frame 70 is formed to connect the conductive pad 72 to the frame 724. The upper support strip 7 5 (S u ρ ρ 〇 rt B ar ), therefore, the lead frame 70 can be as shown in the semiconductor package 80 of FIG. 4B, and the high frequency wafer 8 1 is adhered. The wafer holder 7 is electrically connected to the corresponding conductive pad 7 2 by a bonding wire 8 2 , and the wafer 8 1 , the bonding wire 8 2 , and the partial lead frame 7 are covered with an encapsulant 8 3 . 0, and the bottom surface of each of the conductive pads 7 2 is exposed outside the encapsulant 8 3 , and then the strips 7 3 for connecting the conductive pads 7 2 are electrically separated from each other, and the conductive pads 7 can be separated by the conductive pads 7 The design of 2 enables the high-frequency signal to be transmitted to the external printed circuit board via the wafer 8 and the conductive pad 8 2, which greatly shortens the signal transmission path and solves the problem of the conventional lead frame. Long question. However, although the package structure can solve the problem of signal transmission, but other process problems are also derived, the lead frame 70 is connected to the frame 7 4 only by the support bar 75 of its four-corner position. The thickness of the lead frame 70 is very thin, so that the flatness of the lead frame 70 is easily affected, and the outer conductive pad 7 2 and the inner conductive pad 7 2 are not coplanar, which makes the operation of the wire (W ire Β ο nding) difficult to be precise. The connection quality between the outer conductive pad 7 2 and the bonding wire 8 2 is greatly reduced, resulting in a missing line c as shown in Fig. 5. Therefore, this design can shorten the signal transmission path. The disconnection between the conductive pad 7 2 and the bonding wire 8 2 makes it difficult to transmit high-frequency signals. Moreover, compared with the conventional lead frame, such a special lead frame 70 has complicated process and high cost. The problem, the formation of mass production restrictions, it is obviously difficult to match the high-end products

]76]]矽品.ptd 第9頁 1248184 五 、發明說明 (4) 製 造 之 需 求 〇 综 上 所 述 即 知 如 何 開 發 出 一 種 尚 頻 半 導 體 封 裝 件 及 其 製 法 與 其 導 線 架 以 縮 短 南 頻 訊 號 之 傳 Ψμ 路 徑 同 時 復 解 決 成 本 與 電 性 連 接 品 質 等 習 知 問 題 , 確 已 為 此 類 研 發 領 域 所 需 迫 切 解 決 之 課 題 〇 [ 發 明 内 容 ] 因 此 本 發 明 之 一 § 的 即 在 於 提 供 — 種 可 縮 短 南 頻 訊 號 傳 m 路 徑 的 南 頻 半 導 體 封 裝 件 及 其 製 法 與 其 導 線 架 〇 - 本 發 明 之 復 一 § 的 在 於 提 供 一 種 低 成 本 的 高 頻 半 導 體 > 裝 件 及 其 製 法 與 其 導 線 架 〇 本 發 明 之 另 一 § 的 在 於 提 供 — 種 導 線 架 不 致 產 生 翹 曲 的 高 頻 半 導 體 封 裝 件 及 其 製 法 與 其 導 線 架 〇 本 發 明 之 又 一 § 的 在 於 提 供 一 種 具 有 銲 線 連 接 品 質 的 南 頻 半 導 體 封 裝 件 及 其 製 法 與 其 導 線 架 〇 本 發 明 之 再 一 0 的 在 於 提 供 一 種 製 程 簡 易 的 頻 半 導 體 封 裝 件 及 其 製 法 與 其 導 線 架 〇 為 達 前 述 及 其 他 S 的 , 本 發 明 所 提 供 之 南 頻 半 導 體 封 裝 件 , 係 包 括 ; 具 有 一 晶 片 座 與 多 數 之 導 腳 的 導 線 架 多 數 南 頻 電 性 連 接 部 係 形 成 於 該 晶 片 座 之 周 圍 而 與 該 晶 片 性 分 離 ; 具 有 一 作 用 表 面 與 一 非 作 用 表 面 的 晶 片 並 以 其 非 作 用 表 面 接 置 於 該 晶 片 座 上 5 且 該 作 用 表 面 上 係 分 “別 具 有 頻 m 入 /輸出端與非高頻輸入丨 m 出 端 ; 多 數 銲 線 5 係 用 以 電 性 連 接 該 晶 片 之 非 南 頻 毕刖 入 /輸出端與該導 腳 , 並 用 以 電 性 連 接 該 曰 BB 片 之 頻 m 入 /輸出端與該高頻]]]]矽品.ptd Page 9 1248184 V. Description of invention (4) Requirements for manufacturing In summary, how to develop a still-frequency semiconductor package and its manufacturing method and its lead frame to shorten the south frequency signal It is a problem that needs to be solved urgently in such research and development fields, and it is indeed a problem that needs to be solved urgently in such research and development fields. [The present invention] The south frequency semiconductor package of the frequency transmission m path and its manufacturing method and its lead frame 〇 - the present invention is to provide a low-cost high-frequency semiconductor > assembly and its manufacturing method and its lead frame One is to provide a high-frequency semiconductor package that does not cause warpage of the lead frame and its system Another § of the present invention is to provide a south-frequency semiconductor package having a bonding wire connection quality, a method for fabricating the same, and a lead frame thereof. The present invention further provides a simple semiconductor semiconductor package and The manufacturing method and the lead frame of the present invention are the same as the other S. The south frequency semiconductor package provided by the present invention includes: a lead frame having a wafer holder and a plurality of guide legs; and most south frequency electrical connection portions are formed on The wafer holder is separated from the wafer by a wafer; a wafer having an active surface and an inactive surface is attached to the wafer holder 5 with its non-active surface and the surface is divided into "frequency" /Output and non-high frequency input 丨m output; Most wire 5 is used to electrically connect the non-Southern frequency of the chip / Output end and the guide pin, and electrically connected with the frequency m of said sheet into a BB / output of the frequency

]76]]石夕品· ptd 第]0頁 1248184 五、發明說明(5) 電性連接部;以及一封裝膠體,係包覆該晶片、銲線、部 份南頻電性連接部與部份導線架,以令该晶片座上未接置 晶片之表面與該高頻電性連接部上未接置銲線之表面均外 露出該封裝膠體外。 本發明所提出之高頻半導體封裝件製法,其步驟則係 包括:製備一導線架,係具有一晶片座與多數之導腳,且 該晶片座周圍係延伸有多數高頻電性連接部;以一絕緣件 連接該高頻電性連接部與晶片座;部份移除該高頻電性連 接部,以令該高頻電性連接部與該晶片座電性分離;於該 晶片座上接置一晶片,且該晶片之作用表面上係分別具有 高頻輸入/輸出端與非高頻輸入/輸出端;以多數銲線電性 連接該晶片之非高頻輸入/輸出端與該導腳,並電性連接 該晶片之高頻輸入/輸出端與該高頻電性連接部;以及進 行模壓製程以填充一封裝膠體,而使該封裝膠體包覆該晶 片、銲線、絕緣件、部份高頻電性連接部與部份導線架, 並令該晶片座上未接置晶片之表面與該高頻電性連接部上 未接置銲線之表面均外露出該封裝膠體外。 同時,本發明所提出之導線架,係包括:一晶片座; 多數導腳,係形成於該晶片座之周圍;以及多數高頻電性 連接部,係形成於該晶片座與該導腳之間而與該晶片座電 性分離。 前述之高頻電性連接部係均藉絕緣件而與該晶片座連 接,使其不與該晶片座直接接觸且電性分離,而該絕緣件 則可使用一非導電膠片(Tape);其作法係先將該高頻電性]76]]石夕品·ptd第第0页1248184 V. Invention description (5) Electrical connection; and a package of colloid, covering the wafer, bonding wire, part of the south frequency electrical connection and part The lead frame is arranged such that the surface of the wafer holder on which the wafer is not connected and the surface of the high-frequency electrical connection portion that are not connected to the bonding wire are exposed outside the package. The method for manufacturing a high-frequency semiconductor package according to the present invention includes the steps of: preparing a lead frame having a wafer holder and a plurality of lead pins, and extending a plurality of high-frequency electrical connecting portions around the wafer holder; Connecting the high-frequency electrical connection portion and the wafer holder with an insulating member; partially removing the high-frequency electrical connection portion to electrically separate the high-frequency electrical connection portion from the wafer holder; on the wafer holder A wafer is attached, and the active surface of the wafer has a high frequency input/output terminal and a non-high frequency input/output terminal respectively; the non-high frequency input/output terminal and the guide are electrically connected to the wafer by a plurality of bonding wires a foot, and electrically connecting the high frequency input/output end of the chip and the high frequency electrical connection portion; and performing a molding process to fill an encapsulant, so that the encapsulant covers the wafer, the bonding wire, the insulating member, The high-frequency electrical connection portion and the partial lead frame are disposed, and the surface of the wafer holder on which the unattached wafer is attached and the surface of the high-frequency electrical connection portion not connected to the bonding wire are exposed outside the package. Meanwhile, the lead frame of the present invention comprises: a wafer holder; a plurality of lead legs are formed around the wafer holder; and a plurality of high frequency electrical connection portions are formed on the wafer holder and the guide pin It is electrically separated from the wafer holder. The high-frequency electrical connection portion is connected to the wafer holder by an insulating member so as not to be in direct contact with the wafer holder and electrically separated, and the insulating member can use a non-conductive film (Tape); The method is to first apply the high frequency electrical property.

]761 ]石夕品.ptd 第]1頁 1248184 五、發明說明(6) 連接部上分別定義成銲線接置段、絕緣件黏接段與待移除 段,且令該晶片座之周圍延伸有多數凸出部,而可藉該絕 緣件黏接於該絕緣件黏接段與該凸出部上,以連接該高頻 電性連接部與晶片座,進而移除該待移除段,俾使該電性 連接部與該晶片座電性分離。 此外,該高頻電性連接部係分別形成於該晶片座周圍 各邊且與該晶片座共平面,而該多數高頻電性連接部係與 鄰近之多數導腳呈間隔排列,至於該高頻電性連接部之設 •計位置、數量、形狀與尺寸,則視封裝件與晶片之種類或 「求而定,並無一定限制。 綜上所述,本發明之特徵即係於導線架上形成與其晶 片座共平面的高頻電性連接部,以藉絕緣件之黏接與移除 步驟,令該高頻電性連接部與該晶片座電性分離且外露出 封裝膠體,從而可藉該高頻電性連接部縮短高頻訊號的傳 輸路徑,解決習知上無法以導線架進行高頻晶片封裝之問 題。 【實施方式】 以下係藉由特定的具體實例說明本發明之實施方式, 熟悉此技藝之人士可由本說明書所揭示之内容輕易地暸解 十發明之其他優點與功效。本發明亦可籍由其他不同的具 體實例加以施行或應用,本說明書中的各項細節亦可基於 ,同觀點與應用,在不悖離本發明之精神下進行各種修飾 與變更。 第1 Α至1 Ε圖即為本發明所提出之高頻半導體封裝件的]761]石夕品.ptd第1页1248184 V. Description of the invention (6) The connection portion is defined as a wire bonding segment, an insulating member bonding segment and a segment to be removed, and the periphery of the wafer holder Extending a plurality of protrusions, and the insulating member is adhered to the insulating member bonding portion and the protruding portion to connect the high-frequency electrical connecting portion and the wafer holder, thereby removing the to-be-removed portion And electrically disconnecting the electrical connection portion from the wafer holder. In addition, the high-frequency electrical connection portions are respectively formed on each side of the wafer holder and are coplanar with the wafer holder, and the plurality of high-frequency electrical connection portions are arranged at intervals from a plurality of adjacent guide pins, and the height is high. The position, number, shape, and size of the frequency-electrical connection portion are not limited as long as the type of the package and the wafer is "determined." In summary, the present invention is characterized by being attached to the lead frame. Forming a high-frequency electrical connection portion coplanar with the wafer holder to electrically separate the high-frequency electrical connection portion from the wafer holder and expose the encapsulation colloid by the step of bonding and removing the insulating member, thereby The high-frequency electrical connection portion shortens the transmission path of the high-frequency signal, and solves the problem that the high-frequency chip package cannot be performed by the lead frame by the conventional method. [Embodiment] Hereinafter, embodiments of the present invention will be described by way of specific specific examples. Other persons skilled in the art can easily understand other advantages and effects of the ten inventions by the contents disclosed in the present specification. The present invention can also be implemented or applied by other different specific examples. The details of the book may also be based on the same concepts and applications, and various changes and modifications without departing from the spirit of the invention. 1 Α first to FIG. 1 Ε is the high-frequency semiconductor package proposed by the present invention

]76Π石夕品.ptd 第12頁 1248184 五、發明說明(7) 較佳貫施例製法,首先,如第丨A圖所示製備— 、 10,係具有一晶片座11與多數之導腳1 2,且复:二導線架 知導線架相同,惟該方型晶片座Η之周圍四逆!:係與習 伸有多數與該晶片幻i共平面的高頻電性連接;二分別延 部30,其中,該高頻電性連接部2〇與凸出部—,凸出 列,且該高頻電性連接部2〇上係分別區分成銲、纟、隔排 ,2 0 a、膠片黏接段2 〇 b與待移除段2 〇 c,而該高 #又 部2〇之長度係較該凸出部3〇為長,以令該凸連接 •僅及於該高頻電性連接部2〇之膠片黏接段2〇b ^長度 $出部3 0之位置係對應於鄰接之多數導腳丨2位置,: 高頻電性連接部2 0亦與該導腳丨2呈間隔棑列;接著,^二 1 B圖,以四絕緣膠片3 5分別黏貼於該晶片座i }四邊緣之= 圍位置,而使同一邊上的各高頻電性連接部2 〇與凸出部3 〇 相互連接’且έ亥修片3 5係如圖所示,黏貼於該高頻電性連 接部2 0之膠片黏接段2 〇 b與該凸出部3 0之前端3 0 a上,而使 。亥膠片3 5仍與该晶片座1 1之邊緣相隔一距離(該距離即該 南頻笔性連接部2 0之待移除段2 0 c的長度),同時,該膠片 3 5亦可使用其他可黏貼之絕緣件代替之;再如第1 [圖,以 刀具移除切斷每一高頻電性連接部2 〇上的待移除段2 〇 c, 而使每一高頻電性連接部2 〇均僅餘下該銲線接置段2 〇 a與 ^片黏接段2 0 b,此時,該高頻電性連接部2 0將不再與該 f片座1 1直接接觸,而僅藉由該膠片3 5間接連接至該凸出 部=與晶片座1 1,且由於該膠片3 5係為一絕緣材料,故而 & % #亥多數高頻電性連接部2 0將與該晶片座1 1呈電性分離] 76Π石夕品.ptd Page 12 1248184 V. Description of the invention (7) A preferred embodiment of the method, first, as shown in Figure A, -10, has a wafer holder 11 and a majority of the lead 1 2, and complex: the two lead frames know the same lead frame, but the square wafer holder is surrounded by four reverse! : a plurality of high-frequency electrical connections with the singularity of the singularity of the singularity; and a second extension 30, wherein the high-frequency electrical connection 2 〇 and the protrusion - the convex column, and the The high-frequency electrical connection portion 2 is divided into a welding, a boring, a spacer, a 20 a, a film bonding section 2 〇 b and a to-be-removed section 2 〇 c, and the height is further a length of 2 〇 The protrusion is longer than the protrusion 3〇 so that the convex connection only corresponds to the position of the film bonding section 2〇b^length$out part 30 of the high-frequency electrical connection part 2 The position of the majority of the pedals 2 is: the high-frequency electrical connection portion 20 is also spaced apart from the guide pin 2; then, the image is attached to the wafer holder i by four insulating films 35, respectively. } The four edges = the surrounding position, and the high-frequency electrical connecting portions 2 〇 and the protruding portions 3 同一 on the same side are connected to each other' and the έ海修片3 5 is attached to the high frequency as shown in the figure. The film bonding section 2 〇b of the electrical connecting portion 20 and the front end 3 0 a of the protruding portion 30 are formed. The film 35 is still separated from the edge of the wafer holder 11 by a distance (the distance is the length of the segment 20 0 c of the south-frequency pen connection 20), and the film 35 can also be used. Replace the other adhesive parts; as in the first figure [Fig., cut off the segments 2 〇c on each high-frequency electrical connection 2 以 with the cutter removal, so that each high-frequency electrical property The connecting portion 2 仅 only leaves the bonding wire connecting portion 2 〇a and the bonding portion 2 0 b. At this time, the high-frequency electrical connecting portion 20 will no longer be in direct contact with the f-seat 1 1 . And only by the film 35 indirectly connected to the protrusion = with the wafer holder 1 1, and since the film 35 is an insulating material, & % #hai most of the high-frequency electrical connection 20 Will be electrically separated from the wafer holder 1 1

]76]]矽品.ptd 第]3頁 1248184 五、發明說明(8) " ---- 之狀態二此即完成本發明所揭示之特製導線架1 〇。 接著如第1 D圖所示,將一高頻晶片4 〇以其非作用表 面40b黏接於前述特製導線架1〇的晶片座u上,/且該晶片 =用表面4 0 &上係分別具有高頻輸入/輸出(I / 〇)端4 1 片、1二:Ϊ人/輸出端42,該輸人/輪出端41、42亦即該晶 作用表面40a上之銲墊(Pad),以依其 .出端4 1與A對庳之古相币連接5亥曰日片4 0之尚頻輸入/ 20a,俾使該、曰H 頻笔性連接部20的銲線接置段 導腳12舆夕卜界阳印刷電上^非高^訊號藉該銲線43傳輸至該 至該高頻電性冰:南頻訊號則藉該銲線43傳輸 高頻電性連㈣2〇m ”印刷電路板’此時’由於該 之傳輪路徑不若導胳爽彳異具 . 幅提升高頻訊號傳輸至外Π2來:長二而可大 以填充一封裝膠體50, j率,取後進订模壓製程 封裝膠體50包覆該曰月4 ° 0弟1£圖之剖視圖所示,令該 性連接部20與部份;:銲線'43:膠片35、部份高頻電 片4 0之下表面i } a、嗲古而使"亥晶片座1 1上未接置晶 ,表面2〇〇a、盘今導胳;笔性連接部20之銲線接置段 膠體50外,進;導腳段1綱露出該封裝 12外導腳段12a連接曰至:于尺£ /段2〇a下表面2〇〇a與導腳 ^ ^;ί ; : ; ; " - ^ 晶“。之熱量,提升封裝;=表面⑴散逸該 1248184 五、發明說明(9) 因此,藉由本發明所提出之特製導線架1 0與其高頻電 性連接部2 0設計,即可令該晶月4 0上之高頻訊號自晶片4 0 經銲線4 3、高頻電性連接部2 0之銲線接置段2 0 a而快速傳 遞至外界,其傳輸路徑遠較經由導腳1 2傳送的非高頻訊號 來得短,而不再有習知上難以適用於高頻產品(大於2 G Η z )封裝的問題;同時,藉由此一設計,即可採用導線架 進行高頻晶片之封裝,而無需使用高成本且製造複雜的基 板封裝技術,更符業界之量產需求,亦不致如其他習知技 術般,出現導線架翹曲或銲線斷裂等習知問題,大幅提升 了現有產品的品質可靠性。 此外,本發明所揭示之導線架1 0中,該高頻電性連接 部2 0之設計亦非僅限於前述實施例之設計,其形成位置、 數量與尺寸端視晶片之種類與線路佈局而定,若晶片之設 計較為複雜且具有較多之高頻輸入/輸出端,則可設計較 多的高頻電性連接部2 0,反之,亦可如第2圖所示之第二 實施例,而僅於晶片座1 1之兩相對側邊上分別形成一高頻 電性連接部2 1 0,以適用於高頻輸入/輸出端較少之高頻晶 片4 1 0,更可減省導線架1 0之製造與加工成本。 綜上所述,本發明之特徵即係於習知導線架上形成與 其晶片座共平面的高頻電性連接部,以藉絕緣件之黏接與 移除步驟,令該高頻電性連接部與該晶片座電性分離且外 露出封裝膠體,從而可籍該高頻電性連接部縮短高頻訊號 的傳輸路徑,解決習知之問題,至於該高頻電性連接部之 設計位置、數量、形狀與尺寸,則均視封裝件與晶片之種]]]]矽品.ptd第第3页 1248184 V. Invention Description (8) " ---- State 2 This completes the special lead frame 1 disclosed in the present invention. Next, as shown in FIG. 1D, a high-frequency wafer 4 is bonded to the wafer holder u of the special lead frame 1 by its non-active surface 40b, and the wafer = surface 40 & Each has a high frequency input/output (I / 〇) end 4 1 piece, 1 2: Ϊ person / output end 42, the input / wheel end 41, 42 is also the pad on the crystal action surface 40a (Pad ), according to the end of the 4 1 and A pair of 古 古 古 古 古 古 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 20 20 20 20 20 20 接 接 接 接 接 接 接 接 接 接 接 接The segment guide pin 12 舆 卜 界 界 印刷 印刷 印刷 印刷 印刷 印刷 ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ m "Printed circuit board" at this time 'Because the path of the transmission wheel is not as good as the guiding light. The amplitude of the high-frequency signal is transmitted to the outer cymbal 2: the second long can be filled with a package colloid 50, j rate, Taking the post-cutting die-cutting package encapsulation 50 to cover the cross-sectional view of the month of the month, the joint portion 20 and the portion; the bonding wire '43: film 35, part of the high-frequency film 4 0 below the surface i } a, ancient and "Hai wafer holder 1 1 is not connected to the crystal, the surface 2〇〇a, the disk guide; the pen-shaped connection portion 20 of the bonding wire is connected to the colloid 50, the lead; the guide leg 1 reveals the package 12 The outer leg portion 12a is connected to the ridge to the bottom surface 2 〇〇 a and the guide pin ^ ^; ί ; : ; ; " - ^ crystal ". Heat, lifting the package; = surface (1) dissipating the 1248184 V. Description of the invention (9) Therefore, the special lead frame 10 proposed by the present invention and its high-frequency electrical connection portion 20 are designed to make the crystal moon 4 The high-frequency signal on 0 is transmitted from the wafer 40 to the outside through the bonding wire 4 3 and the bonding wire connection portion 20 of the high-frequency electrical connection portion 20, and the transmission path is transmitted farther than the pin 12 The non-high frequency signal is short, and there is no longer a problem that is difficult to apply to high frequency products (greater than 2 G Η z). At the same time, with this design, the lead frame can be used for high frequency chips. Packaging, without the need for high-cost and complex substrate packaging technology, is more in line with the mass production needs of the industry, and does not cause conventional problems such as wire frame warpage or wire breakage, as other conventional technologies, greatly improving the existing Product quality and reliability. In addition, in the lead frame 10 disclosed in the present invention, the design of the high-frequency electrical connection portion 20 is not limited to the design of the foregoing embodiment, and the position, the number and the size of the lead frame are different depending on the type and layout of the wafer. If the design of the chip is complicated and there are many high-frequency input/output terminals, more high-frequency electrical connection portions 20 can be designed. Conversely, the second embodiment can also be as shown in FIG. And a high-frequency electrical connection portion 2 1 0 is formed on only two opposite sides of the wafer holder 11 to be applied to the high-frequency wafer 4 1 0 with low frequency input/output terminals, and the reduction is further reduced. Manufacturing and processing costs for leadframe 10. In summary, the present invention is characterized in that a high-frequency electrical connection portion coplanar with a wafer holder is formed on a conventional lead frame, so that the high-frequency electrical connection is made by the bonding and removing steps of the insulating member. The portion is electrically separated from the wafer holder and the encapsulant is exposed, so that the high-frequency electrical connection portion can shorten the transmission path of the high-frequency signal, and the conventional problem can be solved. As for the design position and the number of the high-frequency electrical connection portion , shape and size, depending on the type of package and wafer

___ Π6]]石夕品.ptd 第15頁 1248184 五、發明說明(ίο) 類或需求而定,非屬本發明之限制。 上述實例僅為例示性說明本發明之原理及其功效,而 非用於限制本發明。任何熟習此項技藝之人士均可在不違 背本發明之精神及範疇下,對上述實施例進行修飾與變 化。因此,本發明之權利保護範圍,應如後述之申請專利 範圍所列。___ Π6]]石夕品.ptd Page 15 1248184 V. Description of the invention (ίο) Depending on the class or requirement, it is not a limitation of the invention. The above examples are merely illustrative of the principles of the invention and its effects, and are not intended to limit the invention. Modifications and variations of the above-described embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the scope of the patent application to be described later.

]76]]矽品.ptd 第16頁 1248184 圖式簡單說明 【圖式簡單說明】 第1 A至1 E圖係本發明之高頻半導體封裝件的較佳實施 例製法流程圖,其中,第1 C圖係本發明所提出之導線架的 上視圖,而第1 E圖係本發明所提出之高頻半導體封裝件的 剖視圖; 第2圖係本發明所提出之導線架第二實施例之上視 圖; 第3圖係習知晶片座外露式封裝件之剖視圖; 第4 A圖係美國專利第6,3 4 8,7 2 6號案所揭示之導線架 上視圖, 第4 B圖係美國專利第6,3 4 8,7 2 6號案所揭示之半導體 封裝件剖視圖;以及 第5圖係第4 B圖之半導體封裝件發生翹曲與銲線斷裂 之示意圖。 10 導 線 架 11 晶 片 座 1 la 晶 片 座 下 表 面 12 導 腳 12a 外 導 腳 段 20 頻 電 性 連接部 20a 銲 線 接 置 段 20b 膠 片 黏 接 段 20c 待 移 除 段 2 0 0 a 銲 線 接 置 段下表面 ^21 0 高 頻 電 性 連 接部 30 凸 出 部 、30a 凸 出 部 前 端 35 膠 片 40 晶 片 40a 作 用 表 面 40b 非 作 用 表 面 41 頻 m 入 /輸出端]]]]] product] ptd page 16 1248184 BRIEF DESCRIPTION OF THE DRAWINGS [Brief Description] FIG. 1A to FIG. 1E are flowcharts showing a preferred embodiment of a high frequency semiconductor package of the present invention, wherein 1 C is a top view of the lead frame proposed by the present invention, and FIG. 1E is a cross-sectional view of the high frequency semiconductor package proposed by the present invention; FIG. 2 is a second embodiment of the lead frame proposed by the present invention. Figure 3 is a cross-sectional view of a conventional wafer holder exposed package; Figure 4A is a top view of the lead frame disclosed in U.S. Patent No. 6,3,8,7,6, and Figure 4B A cross-sectional view of a semiconductor package disclosed in U.S. Patent No. 6, 394, 716; and a schematic view of warpage and wire breakage of the semiconductor package of Fig. 4B. 10 lead frame 11 wafer holder 1 la wafer holder lower surface 12 lead 12a outer guide leg 20 frequency electrical connection 20a wire bonding segment 20b film bonding segment 20c to be removed segment 2 0 0 a wire bonding Segment lower surface ^ 21 0 high frequency electrical connection portion 30 projection portion, 30a projection front end 35 film 40 wafer 40a active surface 40b non-active surface 41 frequency m in / out

Π6 ]]石夕品.ptd 第17頁 1248184Π6]]Shi Xipin.ptd Page 17 1248184

圖式簡單說明 410 晶 片 42 非 頻 輸入/輸出端 43 銲 線 50 封 裝 膠 體 60 導 線 架 61 晶 片 座 62 導 腳 63 晶 片 64 銲 線 65 銲 墊 66 封 裝 膠 體 70 導 線 架 71 晶 片 座 72 導 電 墊 73 繫 條 74 框 架 75 支 撐 條 80 封 裝 件 1 晶 片 82 銲 線 83 封 裝 膠 體 C 銲 線 斷 裂 ]761]石夕品.ptd 第]8頁Brief description of the system 410 wafer 42 non-frequency input/output terminal 43 bonding wire 50 encapsulant 60 lead frame 61 wafer holder 62 lead 63 wafer 64 bonding wire 65 pad 66 encapsulant 70 lead frame 71 wafer holder 72 conductive pad 73 Article 74 Frame 75 Support strip 80 Package 1 Wafer 82 Bond wire 83 Package colloid C Wire bond break] 761] Shi Xipin.ptd Page]

Claims (1)

1248184 六、申請專利範圍 1 . 一種南頻半導體封裝件’係包括· 導線架,係具有一晶片座與多數導腳; 多數高頻電性連接部,係形成於該晶片座之周圍 而與該晶片座電性分離; 晶片,係具有一作用表面與一非作用表面,並以 其非作用表面接置於該晶片座上,且該作用表面上係 分別具有高頻輸入/輸出端與非高頻輸入/輸出端; 多數銲線,係用以電性連接該晶片之非高頻輸入/ 輸出端與該導腳,並用以電性連接該晶片之高頻輸入/ 輸出端與該高頻電性連接部;以及 封裝膠體,係包覆該晶片、銲線、部份高頻電性 連接部與部份導線架,以令該晶片座上未接置晶片之 表面與該高頻電性連接部上未接置銲線之表面均外露 出該封裝膠體外。 2. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 晶片座之周圍各邊係均分別形成有多數個與該晶片座 電性分離的高頻電性連接部。 3. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 高頻電性連接部係藉一絕緣件與該晶片座連接,而不 與該晶片座直接接觸。 4. 如申請專利範圍第3項之高頻半導體封裝件,其中,該 絕緣件係為·一^非導電膠片(T a p e )。 5. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 多數高頻電性連接部係與鄰近之多數導腳呈間隔排1248184 VI. Patent Application No. 1. A south-frequency semiconductor package includes a lead frame having a wafer holder and a plurality of lead pins; and a plurality of high-frequency electrical connecting portions are formed around the wafer holder and The wafer holder is electrically separated; the wafer has an active surface and an inactive surface, and is attached to the wafer holder with its non-active surface, and the active surface has a high frequency input/output terminal and a non-high Frequency input/output terminal; a plurality of bonding wires are electrically connected to the non-high frequency input/output terminal of the chip and the guiding pin, and are electrically connected to the high frequency input/output terminal of the chip and the high frequency power And a package colloid covering the wafer, the bonding wire, the part of the high-frequency electrical connection portion and the partial lead frame, so that the surface of the wafer holder not connected to the wafer is electrically connected to the high frequency The surface of the portion of the soldering wire that is not connected to the portion is exposed outside the package. 2. The high-frequency semiconductor package of claim 1, wherein each of the sides of the wafer holder is formed with a plurality of high-frequency electrical connections electrically separated from the wafer holder. 3. The high frequency semiconductor package of claim 1, wherein the high frequency electrical connection is connected to the wafer holder by an insulating member and is not in direct contact with the wafer holder. 4. The high frequency semiconductor package of claim 3, wherein the insulating member is a non-conductive film (T a p e ). 5. The high frequency semiconductor package of claim 1, wherein the plurality of high frequency electrical connections are spaced apart from a plurality of adjacent leads J ]76]]石夕品.ptd 第19頁 1248184 六、申請專利範圍 列。 6. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 高頻電性連接部上係分別區分成銲線接置段與絕緣件 黏接段。 7. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 晶片座之周圍係延伸有多數凸出部。 8. 如申請專利範圍第3項之高頻半導體封裝件,其中,該 高頻電性連接部上係分別區分成銲線接置段與絕緣件 黏接段,該晶片座之周圍係延伸有多數凸出部,且該 絕緣件係分別黏接於該高頻電性連接部上之絕緣件黏 接段與該晶片座上之凸出部,以連接該高頻電性連接 部與晶片座。 9. 如申請專利範圍第1項之高頻半導體封裝件,其中,該 高頻電性連接部上未接置銲線之表面係電性連接至外 部印刷電路板。 1 0 .如申請專利範圍第1項之高頻半導體封裝件,其中,該 高頻半導體封裝件係為一晶片座外露式(E X ρ 〇 s e d P a d ) 封裝件。 1 1 . 一種高頻半導體封裝件之製法,其步驟係包括: 製備一導線架,係具有一晶片座與多數導腳,且 該晶片座周圍係延伸有多數高頻電性連接部; 以一絕緣件連接該高頻電性連接部與晶片座; 部份移除該高頻電性連接部,以令該高頻電性連 接部與該晶片座電性分離;J]76]] Shi Xipin.ptd Page 19 1248184 VI. Application for patent scope Column. 6. The high-frequency semiconductor package of claim 1, wherein the high-frequency electrical connection portion is respectively divided into a bonding wire connection portion and an insulating member bonding portion. 7. The high frequency semiconductor package of claim 1, wherein a plurality of protrusions extend around the wafer holder. 8. The high-frequency semiconductor package of claim 3, wherein the high-frequency electrical connection portion is respectively divided into a bonding wire connection portion and an insulating member bonding portion, and the periphery of the wafer holder is extended a plurality of protruding portions, and the insulating members are respectively adhered to the insulating member bonding portion on the high-frequency electrical connecting portion and the protruding portion on the wafer holder to connect the high-frequency electrical connecting portion and the wafer holder . 9. The high frequency semiconductor package of claim 1, wherein the surface of the high frequency electrical connection portion to which the bonding wire is not connected is electrically connected to the external printed circuit board. The high frequency semiconductor package of claim 1, wherein the high frequency semiconductor package is a wafer holder exposed (E X ρ s s e d P a d ) package. 1 1. A method for manufacturing a high-frequency semiconductor package, the method comprising: preparing a lead frame having a wafer holder and a plurality of lead pins, and extending a plurality of high-frequency electrical connecting portions around the wafer holder; The high-frequency electrical connection portion and the wafer holder are connected to the insulating member, and the high-frequency electrical connection portion is partially removed to electrically separate the high-frequency electrical connection portion from the wafer holder; ]761 ]石夕品.ptd 第20頁 1248184 六、申請專利範圍 於該晶片座上接置一晶片,且該晶片之作用表面 上係分別具有南頻輸入/輸出端與非南頻輸入/輸出 端; 以多數銲線電性連接該晶片之非高頻輸入/輸出端 與該導腳,並電性連接該晶片之高頻輸入/輸出端與該 高頻電性連接部;以及 進行模壓製程以填充一封裝膠體,而使該封裝膠 體包覆該晶片、銲線、絕緣件、部份高頻電性連接部 與部份導線架,並令該晶片座上未接置晶片之表面與 該高頻電性連接部上未接置銲線之表面均外露出該封 裝膠體外。 1 2.如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該晶片座之周圍各邊係均分別延伸有多數個高 頻電性連接部。 1 3 .如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該高頻電性連接部與該晶片座電性分離後,係 僅藉該絕緣件而與該晶X座連接。 1 4.如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該絕緣件係為一非導電膠片(T a p e )。 1 5.如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該多數高頻電性連接部係與鄰近之多數導腳呈 間隔排列。 1 6 .如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該高頻電性連接部上係分別區分成銲線接置]761 ]石夕品.ptd Page 20 1248184 VI. The patent application scope is to connect a wafer on the wafer holder, and the surface of the wafer has a south frequency input/output terminal and a non-span frequency input/output respectively. The plurality of bonding wires are electrically connected to the non-high frequency input/output terminal of the chip and the guiding pin, and are electrically connected to the high frequency input/output terminal of the chip and the high frequency electrical connection portion; and performing a molding process Filling a package colloid, so that the encapsulant covers the wafer, the bonding wire, the insulating member, the part of the high-frequency electrical connection portion and the partial lead frame, and the surface of the wafer holder on which the wafer is not connected The surface of the high-frequency electrical connection portion on which the bonding wire is not connected is exposed outside the package rubber. 1 2. The method of manufacturing a high frequency semiconductor package according to claim 1 , wherein a plurality of high frequency electrical connections are respectively extended around each side of the wafer holder. The method for manufacturing a high-frequency semiconductor package according to the first aspect of the invention, wherein the high-frequency electrical connection portion is electrically separated from the wafer holder, and the insulating member is used only with the crystal X seat. connection. 1 . The method of manufacturing a high frequency semiconductor package according to claim 1 , wherein the insulating member is a non-conductive film (T a p e ). 1 . The method of claim 1 , wherein the plurality of high frequency electrical connections are spaced apart from a plurality of adjacent guide legs. 1 6 . The method for manufacturing a high-frequency semiconductor package according to claim 1 , wherein the high-frequency electrical connection portion is respectively divided into wire bonding 176]]矽品· ptd 第21頁 1248184_ 六、申請專利範圍 段、絕緣件黏接段與待移除段,並以該待移除段與該 晶片座直接連接。 1 7 .如申請專利範圍第11項之高頻半導體封裝件之製法, 其中,該晶片座之周圍係另延伸有多數凸出部。 1 8.如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該高頻電性連接部上係分別區分成銲線接置 段、絕緣件黏接段與待移除段,該晶片座之周圍係另 延伸有多數凸出部,而該絕緣件係分別黏接於該高頻 電性連接部上之絕緣件黏接段與該晶片座上之凸出 部,以連接該高頻電性連接部與晶片座。 1 9 .如申請專利範圍第1 6項之高頻半導體封裝件之製法, 其中,部份移除該高頻電性連接部時係移除掉該高頻 電性連接部上的待移除段。 2 〇 ·如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中,該高頻電性連接部上未接置銲線之表面係電性 連接至外部印刷電路板。 2 1 .如申請專利範圍第1 1項之高頻半導體封裝件之製法, 其中’該南頻半導體封裝件係為一晶片座外露式 (Exposed Pad)封裝件。 j . 一種導線架,係包括: 晶片座; 多數導腳,係形成於該晶片座之周圍;以及 多數高頻電性連接部,係形成於該晶片座與該導 腳之間而與該晶片座電性分離。176]]矽品· ptd Page 21 1248184_ VI. Patent application section, the insulating part bonding section and the to-be-removed section, and directly connected to the wafer holder with the to-be-removed section. The method of manufacturing the high-frequency semiconductor package of claim 11, wherein a plurality of protrusions are further extended around the wafer holder. 1 . The method for manufacturing a high-frequency semiconductor package according to claim 1 , wherein the high-frequency electrical connection portion is respectively divided into a wire bonding section, an insulating component bonding section and a to-be-removed section. a plurality of protrusions extending from the periphery of the wafer holder, and the insulating members are respectively adhered to the insulating member bonding portion on the high-frequency electrical connection portion and the protruding portion on the wafer holder to be connected The high frequency electrical connection portion and the wafer holder. 1 9 . The method for manufacturing a high-frequency semiconductor package according to claim 16 , wherein a part of the high-frequency electrical connection is removed, and the high-frequency electrical connection is removed. segment. The method of manufacturing the high-frequency semiconductor package according to the first aspect of the invention, wherein the surface of the high-frequency electrical connection portion to which the bonding wire is not connected is electrically connected to the external printed circuit board. 2 1. The method of claim 1, wherein the south frequency semiconductor package is an exposed pad package. A lead frame comprising: a wafer holder; a plurality of lead pins formed around the wafer holder; and a plurality of high frequency electrical connections formed between the wafer holder and the lead and the wafer The seat is electrically separated. ]76]]石夕品· ptd 第22頁 1248184 六、申請專利範圍 2 3 .如申請專利範圍第2 2項之導線架,其中,該晶片座之 周圍各邊係均分別形成有多數個與該晶片座電性分離 的高頻電性連接部。 2 4 .如申請專利範圍第2 2項之導線架,其中,該高頻電性 連接部係藉一絕緣件與該晶片座連接,而不與該晶片 座直接接觸。 2 5 .如申請專利範圍第2 4項之導線架,其中,該絕緣件係 為一非導電膠片(Tape)。 2 6 .如申請專利範圍第2 2項之導線架,其中,該多數高頻 電性連接部係與鄰近之多數導腳呈間隔排列。 2 7 .如申請專利範圍第2 2項之導線架,其中,該高頻電性 連接部上係分別區分成銲線接置段與絕緣件黏接段。 2 8 .如申請專利範圍第2 2項之導線架,其中,該晶片座之 周圍係另延伸有多數凸出部。 2 9 .如申請專利範圍第2 4項之導線架,其中,該高頻電性 連接部上係分別區分成銲線接置段與絕緣件黏接段, 該晶片座之周圍係另延伸有多數凸出部,而該絕緣件 係分別黏接於該高頻電性連接部上之絕緣件黏接段與 該晶片座上之凸出部,以連接該高頻電性連接部與晶 片座。]76]] Shi Xipin· ptd Page 22 1248184 VI. Application for patent scope 2 3. For the lead frame of claim 2, wherein each side of the wafer holder is formed with a plurality of The wafer holder is electrically separated from the high frequency electrical connection portion. The lead frame of claim 2, wherein the high-frequency electrical connection is connected to the wafer holder by an insulating member without directly contacting the wafer holder. 2 5. The lead frame of claim 24, wherein the insulating member is a non-conductive film (Tape). 2 6. The lead frame of claim 2, wherein the plurality of high frequency electrical connections are spaced apart from a plurality of adjacent guide legs. 2 7. The lead frame of claim 22, wherein the high-frequency electrical connection portion is respectively divided into a bonding line connecting portion and an insulating member bonding portion. 2 8. The lead frame of claim 22, wherein a plurality of projections extend around the wafer holder. 2 9. The lead frame of claim 24, wherein the high-frequency electrical connection portion is respectively divided into a wire bonding portion and an insulating member bonding portion, and the periphery of the wafer holder is further extended a plurality of protruding portions, wherein the insulating members are respectively adhered to the insulating member bonding portion on the high-frequency electrical connecting portion and the protruding portion on the wafer holder to connect the high-frequency electrical connecting portion and the wafer holder . Π61 ]石夕品.ptd 第23頁Π61]Shi Xipin.ptd第23页
TW093100867A 2004-01-14 2004-01-14 High frequency semiconductor device, method for fabricating the same and lead frame thereof TWI248184B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8350380B2 (en) 2006-12-27 2013-01-08 Mediatek Inc. Method for manufacturing leadframe, packaging method for using the leadframe and semiconductor package product
TWI385774B (en) * 2007-12-26 2013-02-11 Mediatek Inc Leadframe package and leadframe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8350380B2 (en) 2006-12-27 2013-01-08 Mediatek Inc. Method for manufacturing leadframe, packaging method for using the leadframe and semiconductor package product
TWI385774B (en) * 2007-12-26 2013-02-11 Mediatek Inc Leadframe package and leadframe

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