1242637 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種亮度量測裝置，特別係關於一種不需 使用模擬太陽光源之亮度量測裝置。 【先前技術】 發光元件（light-emitting device，LED)已經廣泛地應用於 戶外之大型看板與交通號誌燈。特而言之，由於LED具備 壽命長與省電的特性，傳統應用於交通號誌燈的白熾燈泡 已逐漸被LED取代。基於安全考量，在號誌燈檢測項目中 包含一項測試號諸燈表面在太陽光照射時和無太陽光照射 時之亮度比，其目的是為確保即使在強烈太陽光照射下， 號諸燈的明暗與色彩仍足以讓道路使用人清楚辨識。然 而，當物體以不同光譜或不同照度之光源照射時，其表面 亮度與色度會有所不同。 因此一般規1242637 IX. Description of the invention: [Technical field to which the invention belongs] The present invention relates to a brightness measurement device, and particularly to a brightness measurement device that does not require the use of an analog solar light source. [Previous Technology] Light-emitting devices (LEDs) have been widely used in large outdoor signages and traffic lights. In particular, due to the long life and power saving characteristics of LEDs, incandescent light bulbs traditionally used in traffic lights have been gradually replaced by LEDs. Based on safety considerations, the test signal of the signal lamp includes a test of the brightness ratio of the surface of the signal lamp when it is exposed to sunlight and when it is not exposed to sunlight. The purpose is to ensure that the signal lights are illuminated even under strong sunlight. The light and dark colors are still enough for road users to clearly identify. However, when an object is illuminated by a light source with a different spectrum or different illuminance, its surface brightness and chromaticity will be different. Therefore general rules
的相似程度的影響。 党度比與陽光照射在號誌燈上的照度有關， 範均會註明進行該亮度比測試時之照度值。然 候與雲層變化的影響，太陽光到達地面的照 PD0080.doc 1242637 習知技藝中相關於交通號諸燈之專利文獻大多偏重在設 計與防護技術，例如 US 20020027510、US 20020113561、 US 20030095052、US 20040022057、WO 03058577A1 等專 利文獻揭示之技術係關於led號諸燈設計，US 20020059894揭示之技術教示如何減少太陽光中之紫外線 對號誌燈的損害以延長號誌燈壽命，US 20020021573揭示 之技術則是教示如何增加號諸燈亮度。相關於檢測技術的 專利為 US 20040105091、US 5,185，637、EP 0025388B1。 圖1例示複數種光源之分光光譜圖’其中曲線10係鎢絲燈 之分光光譜，曲線20係氙燈之分光光譜’曲線30係標準太 陽光譜，而曲線40則為投影燈之分光光譜。習知測試太陽 光對號誌燈亮度影響係利用光譜近似太陽光或與太陽光譜 同色溫的光源來模擬太陽光照射號誌燈。最常用來模擬高 照度太陽光的人造光源為氙（Xe)燈。雖然氙燈的光譜近似 太陽光，但兩者之間仍有差異存在。換言之’即使用昂貴 的氙燈來模擬太陽光，量測結果仍可能會有3·5%之誤差 【發明内容】 本發明之主要目的係提供一種不需使用模擬太陽光源之 亮度量測裝置。 為達成上述目的，本發明揭示一種不需使用模擬太陽光 源之亮度量測裝置。該亮度量測裝置包含一載台、一設置 於該載台上之待測元件、一設置於該載台上之標準反射 板、一設置於該載台上之照度計、一可發出一光束至該待 測元件之第一光源以及一玎偵測該光束經該待測元件反射 PD0080.doc 1242637 後之焭度的亮度計。 較佳地，該亮度量測裝置另包含—雷射光源， 用以對準該待測元件、 又 μ軚準反射板及該照度計之雷射光 束。該第一光源可為一鶴絲燈，其發出之光束在可見光波 段呈-連續光譜。該待測元件可為一發光元件，例如一號 达燈。«台可為-滑軌1以將該待測元件、該標準反 射板及該照度計移動至該光束之光路上。 相較於習知技藝，本發明係以該待測元件之表面反射 率、照度/亮度轉換參數以及國際照明委員會公佈的太陽光 平均光譜來推算已知照度之太陽光對該待測元件之亮度或 色度的影響。本發明進行量測時並不需用到昂貴模擬光 源’因此可以大幅地節省成本。再者，本發明直接利用國 際照明委員會公佈之平均太陽光譜，因此可解決模擬光源 與太陽光譜之間的差異所引起的誤差，使量測結果更接近 戶外實際狀況。 【實施方式】 圖2例示本發明之亮度量測裝置1〇〇。如圖2所示，該亮度 量測裝置100包含一載台102、一設置於該載台1〇2上之待測 元件110、一設置於該載台102上之標準反射板1〇4、一設置 於該載台102上之照度計1〇6、一可發出一光束122至該待測 兀件110之第一光源120以及一可偵測該光束122經該待測 元件110反射後之亮度的亮度計130。 較佳地，該亮度量測裝置1 〇〇另包含一雷射光源丨4〇，可 發出一用以對準該待測元件110、該標準反射板1〇4及該照 PD0080.doc 1242637 度計106之雷射光束142。該第一光源12〇可為一鎢絲燈，其 發出之光束122在可見光波段呈一連續光譜。該待測元件 110可為一發光元件，例如一號誌燈。該載台1〇2可為一滑 軌，用以將該待測元件110、該標準反射板1〇4及該照度計 106移動至該光束122之光路上。 下文將詳述該亮度量測裝置1 〇〇量測該待測元件n〇在一 特定光源（例如太陽光源）照射時之亮度。首先，調整第一光 源120的發散角與入射至待測元件11〇的入射角度使其符合 待測元件11〇的測試條件。接著，量測該待測元件11〇及該 標準反射板104在該第一光源120照射時之分光輕射亮度 值’並根據下列公式（1 )什异该待測元件1 1 〇之分光反射率· ρ{λ)=Ύ§)ρλλ) ⑴ 其中’ Α⑷係該標準反射板104之分光反射率，々⑷係今 標準反射板104之分光輻射亮度值，/⑷係該待測元件 之分光輻射亮度值。 之後，量測該待測元件110在該第一光源i 2〇照射時之 亮度（，並根據下列公式（2)計算該待測元件11 〇之照产 /亮度轉換參數：The degree of similarity. The party intensity ratio is related to the illuminance of the sunlight on the signal lamp. Fan Jun will indicate the illuminance value when the brightness ratio test is performed. However, due to the influence of changes in the clouds, the photos of sunlight reaching the ground PD0080.doc 1242637 In the conventional art, the patent documents related to traffic lights are mostly focused on design and protection technologies, such as US 20020027510, US 20020113561, US 20030095052, US The technologies disclosed in patent documents such as 20040022057, WO 03058577A1 are about the design of LED lights. The technology disclosed in US 20020059894 teaches how to reduce the damage to the signal lights by ultraviolet rays in sunlight to extend the life of the signal lights. The technology disclosed in US 20020021573 It teaches how to increase the brightness of the lights. Patents related to detection technology are US 20040105091, US 5,185,637, EP 0025388B1. Fig. 1 illustrates the spectroscopic spectra of a plurality of light sources, wherein curve 10 is the spectroscopic spectrum of a tungsten filament lamp, curve 20 is the spectroscopic spectrum of a xenon lamp, curve 30 is a standard sunlight spectrum, and curve 40 is a spectroscopic spectrum of a projection lamp. The conventional test of the influence of sunlight on the brightness of signal lights is to use a light source with a spectrum approximating sunlight or the same color temperature as the solar spectrum to simulate sunlight shining on the signal lights. The most commonly used artificial light source to simulate high-illumination sunlight is xenon (Xe) lamps. Although the spectrum of xenon lamps is similar to sunlight, there are still differences between the two. In other words, even if an expensive xenon lamp is used to simulate sunlight, the measurement result may still have an error of 3.5%. [Summary] The main object of the present invention is to provide a brightness measurement device that does not require the use of a simulated solar light source. To achieve the above object, the present invention discloses a brightness measuring device which does not need to use a simulated solar light source. The brightness measuring device includes a carrier, a component to be measured disposed on the carrier, a standard reflecting plate disposed on the carrier, an illuminance meter disposed on the carrier, and a light beam A first light source to the device under test and a brightness meter to detect the degree of the beam after the light reflected by the device under test is PD0080.doc 1242637. Preferably, the brightness measuring device further includes a laser light source for aligning the laser beam of the device under test, a quasi-reflective plate, and the light meter. The first light source may be a crane light, and the light beam emitted by the first light source has a continuous spectrum in the visible light band. The device under test may be a light emitting device, such as a No. 1 lamp. «The table can be-slide rail 1 to move the device under test, the standard reflector and the light meter to the light path of the beam. Compared with the conventional technique, the present invention estimates the brightness of the sunlight to the device under test based on the surface reflectance of the device under test, the illuminance / brightness conversion parameter and the average sunlight spectrum published by the International Commission on Illumination. Or chroma. The present invention does not require an expensive analog light source when performing measurement, and thus can greatly save costs. Furthermore, the present invention directly uses the average solar spectrum published by the International Illumination Commission, so it can solve the error caused by the difference between the simulated light source and the solar spectrum, and make the measurement result closer to the actual outdoor conditions. [Embodiment] FIG. 2 illustrates a brightness measurement device 100 of the present invention. As shown in FIG. 2, the brightness measurement device 100 includes a carrier 102, a device under test 110 disposed on the carrier 102, a standard reflecting plate 104 disposed on the carrier 102, An illuminance meter 106 arranged on the stage 102, a first light source 120 capable of emitting a light beam 122 to the element under test 110, and a light source 122 capable of detecting the light beam 122 reflected by the element under test 110 Brightness meter 130. Preferably, the brightness measuring device 100 further includes a laser light source 4o, which can emit a light source for aligning the device under test 110, the standard reflecting plate 104, and the photo PD0080.doc 1242637 degrees.计 106 的 LAS beam 142. The first light source 120 can be a tungsten filament lamp, and the light beam 122 emitted by the first light source 120 has a continuous spectrum in the visible light band. The device under test 110 may be a light emitting device, such as a signal lamp. The stage 102 can be a slide rail for moving the device under test 110, the standard reflecting plate 104, and the light meter 106 to the light path of the light beam 122. Hereinafter, the brightness measuring device 100 measures the brightness of the device under test n0 when it is illuminated by a specific light source (such as a solar light source). First, the divergence angle of the first light source 120 and the incident angle incident on the device under test 110 are adjusted to meet the test conditions of the device under test 110. Next, measure the spectroscopic light brightness value of the device under test 11 and the standard reflection plate 104 when the first light source 120 is irradiated, and according to the following formula (1), the spectral reflectance of the device under test 1 1 〇 is different. Ρ (λ) = Ύ§) ρλλ) ⑴ where 'Α⑷ is the spectral reflectance of the standard reflective plate 104, 々⑷ is the spectral radiance value of the standard reflective plate 104, and / ⑷ is the spectroscopic light of the component under test Radiance value. After that, measure the brightness of the device under test 110 when it is irradiated by the first light source i 20, and calculate the light production / brightness conversion parameter of the device under test 11 according to the following formula (2):
F— LSA\SA{X)-V{X\dX 一 以相 (2) 其中，晃係該第一光源120之照度值，&⑷係該第—光 源120之相對光譜，F(2)係人眼視效函數。該第一光源 之照度值可由該照度計106測得。 該待測元件110在太陽光照射時之亮度係根據下列公式 PD0080.doc (3) (3)1242637 (3)計算： L ρ(λ)Ύ(λ\άλ \^Β{λ\ν{λ\άλ 八中’ Α係太陽光之照度值，&⑷係太陽光之相對光譜。 由此可知，本發明僅需取得一特定光源之照度值及相對光 4與待測元件在測試幾何條件下的照度/亮度轉換參數即 可求得該待測元件丨10在該特定光源照射下之亮度值，而不 而貝際地建構該特定光源。特而言之，本發明並不需要實 際地在戶外太陽光照射下量測該待測元件110之亮度，因而 可以避免太陽光之照度值變化所造成之量測誤差。 下表為本發明可行性之驗證。首先以鎢絲燈為該第一光 源I20量測該待測元件1丨〇之分光反射率及該待測元件i 10 在名第一光源120照射時之亮度（矣J之後，再分別將氙燈與 投影燈光譜代入公式（3)以計算該待測元件丨1〇在太陽光照 射時之亮度（L!與L、）。如果以氙燈直接照射該待測元件 110，並以該亮度計130直接量測該待測元件i 1〇在氙燈照射 下之儿度（1>2)，其與冗度（]^)之誤差為1 · 1 %。如果以投影燈 直接照射該待測元件丨10，並以該亮度計13〇直接量測該待 測元件110在投影燈照射下之亮度（L3)，其與亮度（1/1)之誤 差為2.5%。氙燈誤差優於投影燈的原因主要在於進行該實 驗時氙燈的幾何條件比投影燈的幾何條件接近第一光源 120，因為物表反射率與量測幾何有關，故量測條件愈一致 則量測誤差愈小。由此可知以本發明進行待測元件亮度量 測時，第一光源120的幾何條件應符合量測規範以減少量測 pD0080.doc 1242637 誤差。 __光源 誤差 氤燈 ---- 1.1% 投影燈 —'—-- 2.5% 此外，本發明亦可進一步應用於量測該待測元件110之色 度。假設該待測元件110本身的三刺激值分別為為χΐ、γΐ、 ，一特定光源（例如太陽光）照射於該待測元件11〇時之三 刺激值分別為X2、Y2、Z2，則混合色的三刺激值分別為 Χ(1+2) Υ(1+2)、Ζ(ι+2)即為 Xi+X2、Yi+Y]、Zi+Z2。其中 χ2、 Υ2、ζ2如下列公式所示。 y (^) ρ(λ) · χ(Λ) · άλ 2 一 γ .Τ ^ ^ Ρ^Β{^ρ{λ)Ύ(λ)·άλ 2—15 ~ 7 _ Eb-F^Sb(X)·ρ(Χ)·ζ{λ)·άλ 因此’該待測元件11 ο原先之色度座標為：F— LSA \ SA {X) -V {X \ dX (1) Phase (2), where the illuminance is the illuminance value of the first light source 120, and amp is the relative spectrum of the first-light source 120, F (2) Human eye visual effects function. The illuminance value of the first light source can be measured by the illuminance meter 106. The brightness of the DUT 110 under sunlight is calculated according to the following formula PD0080.doc (3) (3) 1242637 (3): L ρ (λ) Ύ (λ \ άλ \ ^ Β {λ \ ν {λ \ άλ 中 中 'Α is the illuminance value of sunlight, and ⑷ is the relative spectrum of sunlight. It can be seen that the present invention only needs to obtain the illuminance value of a specific light source and the relative light 4 and the geometrical conditions of the test component under test. The illuminance / brightness conversion parameter can be used to obtain the brightness value of the device under test under the illumination of the specific light source, instead of constructing the specific light source. In particular, the present invention does not need to actually The brightness of the DUT 110 is measured under outdoor sunlight, so measurement errors caused by changes in the illuminance value of sunlight can be avoided. The following table is a verification of the feasibility of the present invention. First, a tungsten filament lamp is used as the first A light source I20 measures the spectral reflectance of the device under test 1 and the brightness of the device under test i 10 when it is illuminated by the first light source 120 (矣 J, and then the xenon lamp and the projection lamp spectrum are substituted into the formula (3 ) To calculate the brightness (L! And L ). If a xenon lamp is directly irradiated to the device under test 110, and a luminance meter 130 is used to directly measure the degree of the device under test i 1 10 under xenon lamp irradiation (1 > 2), which is the same as the redundancy (] ^) The error is 1.1%. If a projection lamp is directly irradiated to the device under test 丨 10, and the brightness meter 13 is used to directly measure the brightness (L3) of the device under test 110 under the projection lamp, which is related to the brightness The error of (1/1) is 2.5%. The reason why the error of xenon lamp is better than that of projection lamp is that the geometric condition of xenon lamp is closer to the first light source 120 than that of projection lamp when performing this experiment, because the reflectance of the surface and the measurement geometry Related, so the more consistent the measurement conditions, the smaller the measurement error. Therefore, it can be known that when the brightness measurement of the device under test according to the present invention, the geometric conditions of the first light source 120 should meet the measurement specifications to reduce the measurement pD0080.doc 1242637 Error. __Light source error 氤 lamp ---- 1.1% projection lamp-'--- 2.5% In addition, the present invention can be further applied to measure the chromaticity of the device under test 110. Assume that the device under test 110 itself The three stimulus values are χΐ, γΐ,, and a specific light source For example, the three stimulus values at 11 o'clock when the device under test is X2, Y2, Z2, and the tristimulus values of the mixed color are X (1 + 2) Υ (1 + 2), Z (ι +2) is Xi + X2, Yi + Y], Zi + Z2, where χ2, Υ2, ζ2 are as shown in the following formula: y (^) ρ (λ) · χ (Λ) · άλ 2-γ .Τ ^ ^ Ρ ^ Β {^ ρ (λ) Ύ (λ) · άλ 2—15 ~ 7 _ Eb-F ^ Sb (X) · ρ (Χ) · ζ (λ) · άλ Therefore 'The device to be tested 11 ο The original chromaticity coordinates are:
x^Xi/CX^Yi+ZO y^Yl/CXl+Yl+Zi) 相對地，在太陽光照射下，其色座標改變為： X(l+2 厂 X(1+2)/(X(1+2) + Y(1+2) + Z(1+2)) y(l+2)==Y(l+2)/(X(l+2) + Y(l+2) + Z(1+2)) 其中；⑷及z(；l)為CIE 1931標準觀測者光譜三刺激值。 簡言之，本發明係以待測號誌燈表面反射率、照度/亮度 轉換參數以及國際照明委員會（CIE)公佈的太陽光平均光 PD0080.doc -10- 1242637 "來推算已知照度的太陽光對號誌燈亮度或色度的影響。 毛月因進行置測時並不需用到昂貴模擬光源，因此可以 =中田地砟省成本。再者，本發明直接利用cie公佈之平均太 陽光μ，因此可解決模擬光源與太陽光譜之間的差異所引 起的誤差，使量測結果更接近戶外實際狀況。此外，本發 亦了適用於各種光源對不同被照面亮度色度影響的量 測。 本發明之技術内容及技術特點已揭示如上，然而熟悉本 項技術之人士仍可能基於本發明之教示及揭示而作種種不 月離本智明精神之替換及修飾。因此，本發明之保護範圍 應不限於實施例所揭示者’而應包括各種不背離本發明之 替換及修飾，並為以下之申請專利範圍所涵蓋。 【圖式簡單說明】 圖1例示複數種光源之分光光譜圖；以及 圖2例示本發明之亮度量測裝置。 【主要元件符號說明】 10 曲線 20 曲線 30 曲線 40 曲線 100 亮度量測裝置 102 載台 104 標準反射板 106 照度計 110 待測元件 120 第一光源 122 光束 130 亮度計 140 雷射光源 142 雷射光束 PD0080.doc -11 -x ^ Xi / CX ^ Yi + ZO y ^ Yl / CXl + Yl + Zi) In contrast, under sunlight, its color coordinates change to: X (l + 2 Factory X (1 + 2) / (X ( 1 + 2) + Y (1 + 2) + Z (1 + 2)) y (l + 2) == Y (l + 2) / (X (l + 2) + Y (l + 2) + Z (1 + 2)) where; ⑷ and z (; l) are the tristimulus values of the observer's spectrum of the CIE 1931 standard. In short, the present invention uses the surface reflectance, illumination / brightness conversion parameters and international The sunlight average light PD0080.doc -10- 1242637 " published by the Commission for Illumination (CIE) is used to estimate the effect of sunlight with known illuminance on the brightness or chromaticity of the traffic light. Mao Yue does not need to use it for measurement. To the expensive analog light source, you can save costs in Nakata. Furthermore, the present invention directly uses the average sunlight μ published by cie, so it can solve the error caused by the difference between the analog light source and the solar spectrum, and make the measurement result It is closer to the actual outdoor conditions. In addition, the present invention also applies to the measurement of the influence of various light sources on the brightness and chromaticity of different illuminated surfaces. The technical content and technical characteristics of the present invention have been disclosed above, but those familiar with this technology may still be based on Teachings of the invention And disclosed and made various replacements and modifications of the spirit of the present wisdom. Therefore, the protection scope of the present invention should not be limited to those disclosed in the embodiments, but should include various replacements and modifications that do not depart from the present invention, and are the following applications The scope of patent is covered. [Brief description of the figure] Figure 1 illustrates the spectroscopic spectra of a plurality of light sources; and Figure 2 illustrates the brightness measurement device of the present invention. [Description of the main component symbols] 10 curve 20 curve 30 curve 40 curve 100 brightness Measuring device 102 Stage 104 Standard reflector 106 Luminometer 110 DUT 120 First light source 122 Light beam 130 Luminance meter 140 Laser light source 142 Laser beam PD0080.doc -11-