TWI237167B - Electronic load apparatus - Google Patents

Abstract

The present invention is provided to improve the frequency response characteristics of the load current for the tested power device of an electronic load apparatus. In the invention, impedance L1 is connected in series and attached to the source of transistor Q1 for load current control. In addition to improving the frequency response characteristic of the electronic load control loop and the electronic load transient response characteristics at the starting of the power supply to be tested, a better load current control characteristic is obtained in a wide load current range by providing a circuit device of a non-linear element between the input and output of an operational amplifier for the driving transistor of the controlling circuit.

Description

1237167 * V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to electricity used as a load (cannot be reused after discharge), a secondary lightning 5 wide-band power supply device, or a secondary battery battery; (Re-use), the power supply under test whose fuel current changes at high speed, especially-a kind of test load [prior art] 4 electronic load device for characteristics. ί: The electronic load device of the known technology and the electronic of the tested power supply are connected to the electronic load through a connection to the electronic load 3, and the voltage Ein of the constant load current IL is set to the current setting control voltage νι, which is calculated by the calculation. The amplifier A1 compares the voltage of the output setting control voltage n with the load current detection shunt resistor ^, and drives the gate of the load transistor Q1 by the output voltage of the operational amplifier M. The load current generated is as shown in Equation 1. . [Number 1] IL = Ein / Rl ............ •• Formula 1

When the dynamic load dynamic test of the power supply under test is performed, the control voltage for current setting will not be a DC voltage but will alternately repeat a rectangular wave or voltage wave-shaped voltage equivalent to the control voltage output of the binary load voltage value, or any arbitrary voltage. The waveform is relative to the desired load current waveform of the power supply under test. When testing the characteristics of the power supply under test for the high-speed change of the load current, because the electronic load device requires a high through rate, the frequency characteristics of the load current control loop composed of the operational amplifier A1 and the load transistor Q1 , It is necessary to use a wide area as much as possible to achieve control response characteristics

1237167

South speed. To reach! The load current flows toward the speed, and the impedance of the connection cable 3 connecting the power supply 2 to be tested and the electronic load device 1 must be sufficiently low. Although if the connection cable 3 uses an electron microscope with a larger load current, I and I to ignore this effect, the increase in the cable resistance component due to the cable length ratio will cause various changes in the control response speed. Impact.

Figure ^ 'For dynamic load dynamic test, the load current control voltage V3' can generate a rectangular wave voltage at a certain time interval, and the load current is detected using the parallel resistor R1 to meet the load current voltage f. ' And using an operational amplifier ", output the voltage difference from the aforementioned load current control voltage V3 to the gate of the increased load transistor Q1, and perform a dynamic load dynamic test of the power source 2 to be tested through the connection cable 3. The measured f Power supply 2 is composed of voltage V2 and internal resistance R2. Take the equivalent impedance of the single-sided wire of connection cable 3 as L31 and L32, make the pair of cables parallel or twisted, and make their magnetic beams cross each other. When this mutual impedance is regarded as M, the impedance component generated by the connection cable existing between the power supply 2 under test and the electronic load device 丨 can be regarded as the equivalent impedance equivalent to L in Equation 2. [Equation 2]

L = L31 + L32-2M ............ • Equation 2 The equivalent impedance L of the connecting cable 3 will show the through rate as shown in Equation 3 when the dynamic load current increases. S, and the relationship between the voltage drop e of the connection cable 3 as shown in Equation 4, when the voltage drop e approaches the DC output voltage of the power supply under test, the voltage between the drain and source of the load transistor Q1

V. Explanation of the invention (3) It will reach saturation. From the relation shown in formula 5, it shows almost the through rate of formula 6. [Equation 3] S = di / dt ···· Equation 3 [Equation 4] e = LXS = L x di / dt… Equation 4 [Equation 5] LX di / dt = E ··· Equation 5 [Equation 6] S = di / dt = E / L… Equation 6 Here, the output voltage of the tested power supply is regarded as E, the drain of the load transistor Q1, and the saturation time of the source-to-source voltage is regarded as T, as shown in Equation 7. During the voltage saturation time, the load current may generate a current value that is not the original value or an unintentional current waveform. In order to prevent such effects, a convenient and convenient method is to shorten the connection cable, reduce the connection cable, etc. The effective impedance L makes a high load current waveform to the target through rate. [Number 7]

TLXE / I ... Equation 7 To change the point of view, whether it is the static load of the power supply under test :, the use of the current waveform of the transition *, let's try to see the behavior when the === effective impedance is large; Level 2 and so on: The phenomenon will happen in a short time, and then it will fall steadily to a certain level, so there will be a voltage saturation time in time, and most of the current will continue. However, the electronic load of the conventional technology is full from the electric house :: = kind 1237167

V. Explanation of the invention (4) 'It is extremely difficult to prevent the over current (0ver shunt) problem that exceeds the set current value, and it is necessary to adopt an expedient load setting such as a gentle through-rate load setting in which the range of voltage saturation will not occur. Device. 》 One of the other problems is that the equivalent impedance L of the connecting cable has a great influence on the characteristics of the electronic load control circuit. If the frequency range of the control loop is widened in response to the pursuit of high-speed response, as the impedance L of the connecting cable increases, the amplitude margin and phase margin of the loop characteristics will decrease, resulting in over-current characteristics and electronic load. The problem of continuous oscillation. In the conventional technology, in order to prevent the impedance of the connection cable from oscillating even if the impedance is increased to a certain level, the operational amplifier of the second figure is used to "reduce the frequency region by using the frequency filtering device of the capacitor C10 and the resistor R10, and The response speed is greatly sacrificed. Therefore, the electronic load for high-speed response is a great obstacle.

The following describes another characteristic required by the electronic load. Considering that during the power-on test of the power supply under test, for electronic loads, most of the time when the power of the power supply under test is turned off, the load current value or load impedance value after startup is preset. At this time, the electronic load can set the load current even when the output power of the tested power source f is not applied. Therefore, the load transistor Q1 will be at the maximum gate voltage that should flow the load current. In this large state, when the power of the power supply to be tested is turned on, a short-circuit current that greatly exceeds the transient setting load current sometimes occurs. This will vary depending on the response speed of the load setting control circuit of the electronic load and the start-up time of the output voltage of the tested power supply. However, the electronic load of the conventional technology and the power supply under test will be a big problem. Electron negative

Page 8 1237167 V. Description of the invention (5) When the terminal voltage is below the pick-up voltage, the gate drive of the transistor will be cut off at a certain threshold value (<=). The invisible negative causes the load current control circuit to move, and the test power source's operation start time when the electrical value exceeds the critical value = device. Adding this circuit will cause the load current to be interrupted frequently; P will be caused by Levin ’s P when the value of m is below the level of electrical waste. See Patent Document 1 and Patent [Patent Document 1] JP 06-1 1 3450 (Item 4_9, [Patent Document 2] Figure) JP 200 1 -1 34326 (item 14 and Figure 2) [Summary of the Invention] The technical problem to be solved by the present invention is Ii ϊ ϋ Provided is a circuit method and a device for an electronic load device having a sharp load current variation and a wide range of response characteristics, which can ^ the problem of the conventional electronic load device as described above, and reduce the electronic load in the case of a severe load current variation. Response characteristics of the characteristics of the device control loop, the impedance effect of the electronic load device and the cable connected to the power supply under test, and the overcurrent that delays the recovery time from the voltage saturation state. The present invention includes a page 9 which operates as a load of the power supply 2 under test 1237167

Transistor Q1 is configured with the negative electron source of the control circuit. Re-form the control circuit

According to the present invention, the load device corresponding to the current setting value is controlled, and the impedance L1 is used in the present invention. The current feedback from the two-pole operational amplifier flows into the transistor. The non-linear element inserted in the body of the load transistor is inserted into the circuit. The present invention contrasts the effectiveness of the prior art. The electronic load device of the present invention has a wider range of load currents in the frequency range and is less susceptible to being affected than conventional techniques. The parasitic impedance of the connection cable of the test power source is 0 # = # 1 f. During the severe load dynamic test and start-up of the test power source ^ _ 5 level test, it is difficult to change the electronic load device of the conventional technology ^ 本The electronic load device of the invention can perform such a high-speed load response characteristic test. [Embodiment] Embodiments of the present invention will be described below with reference to the drawings. In order to avoid that the description of the embodiment of this application is too complicated, only the case of a load transistor will be described, but of course, the circuit of the load current control circuit and the load current control circuit can be included according to the required load current and load power. A plurality of blocks (b 1 ock) are connected in parallel to achieve the required electronic load Φ. An embodiment described in item 1 of the scope of patent application. The basic circuit configuration of the electronic load device of the conventional technology is shown in the third figure. The voltage difference output of the load current control voltage V3 will pass through the resistor Ri0 and the offset

1237167 V. Description of the invention (7) (Offset) Adjustment voltage V4 is connected to the load current-carrying electric RU and capacitor C10 of the operational amplifier Al to form a negative feedback control loop to drive transistor Q1 to perform electronic Load test. The simulation of its characteristics is performed as shown in the third figure. The general circuit responds to the frequency characteristics, so the operational amplifier does not compare the characteristics, and it is simulated here. 'The voltage output through resistor R4 is connected to the side input, and the shunt resistor output for load current detection will be connected to the single-sided input of the operational amplifier A1 through the resistor at the balancing resistor, and connected by the voltage output of the operational amplifier Ai. The circuit of the electronic load device of the known technology of the power supply 2 connected to the cable 3 is a feedback evaluation of inserting C10 into the operational amplifier, because it is difficult to achieve the original high-speed response. There are many cases in which such a wide area is used. The same wide-area operational amplifier of the present invention is shown in the fourth embodiment of one of the items described in item 1 of the patent application scope of the present invention, but the impedance L1 is inserted in series to the source of the field effect transistor Q. In order to make use of the features of the present invention, an operational amplifier with a wider frequency range and a higher pass-through rate of output voltage than the field effect transistor Q1's admittance is used to connect the cable and the output voltage of the tested power supply Or load current setting, etc., are simulated and compared under the same conditions. The frequency characteristics and feedback of each part of the conventional technique of the circuit diagram in the third figure are shown in the fifth figure. The setting conditions are that the input voltage V2 of the power supply under test is set to 5 [V], the load current is set to about 5 [A], and the impedances of the single-sided wires of the connection cable L31 and L32 are set to 1 [H], l 〇 [to H], 1〇〇 [// Η], when the coupling coefficient K3 = 0.9.

Page 11 1237167 V. Description of the invention (8) The fifth D graph and the fifth £ graph indicate negative feedback. The fifth D graph is the amplitude characteristic and the fifth E graph is m. Among them, the impedances 3 and 32 of 3 reduce the amplitude. In the case of the frequency characteristics of the connected electron microscope circuit, the marginal frequency characteristics are expected to be very high; ^, in terms of the frequency characteristics of the latch-back circuit, the frequency characteristics of the drain voltage of the input field effect voltage, such as in Q1. The impedance L31, L32 of the gate gauge 3, the frequency close to the first five, by connecting the power ^ f .¾ ^ Q1 ^, ^ ^ r / t

: With high ♦. At the frequency where the voltage increase becomes higher, the circuit J ί ΐϊ ΐϊ i? Is generally greatly affected, which is unstable and causes continuous prosperity. In order to avoid this phenomenon, at a frequency lower than the resonance frequency of the connected electrical L31, L32, A ,, several 1 # 4 · β M tr frequency characteristics below the output voltage of the operational amplifier A1 of the input shunt resistor R1 is shown , Which falls in the frequency region. In addition, the capacitor C30 and resistor R30 in the third and fourth pictures are the loss of resonance between the impedance of the cable and the field effect transistor, and the parasitic capacity between the source and drain, increasing the feedback loop The stability will take the impedance that does not affect the load current waveform range. The circuit of one of the embodiments of the patent application scope shown in the fourth figure is also simulated, and the result is shown in the sixth figure. The frequency characteristic of the voltage increase amplitude of each part is the frequency characteristic of the voltage increase amplitude below the output of the operational amplifier A1 as the voltage across the wheel-in shunt resistor (R1 &amp; R2). As shown in Figure 6A, compared to the operational amplifier Increase in A1 with almost no feedback • ---- Increase in 1237167 on page 12. The increase of the gate voltage of the wheel-in field-effect transistor Q 丨 will be inserted into the source of the field-effect transistor Q1 depending on the equivalent reactance 11 connected to the power source 3, as shown in the sixth β diagram. It has almost flat frequency characteristics. The value of the impedance L1 of the source of its special crystal Q1 is different. This change, but as shown in Figure 6D, the load current & And phase margin, and the frequency of the circuit characteristic of the frequency of the output voltage of the shunt resistor R 1 which is the most appropriate current can be selected, and the impedance L2 is inserted. The inherent resistance of the resistor is enough, and it is not necessary. 5. Invention description (9) and the power is very high. In order to block the peak of the feedback, the field-effect electrical field will have the gain range of the loop. The load electric compensation needs to be shunted, which has a wide range of pole voltage. The poles are determined by the impedance, but because of the impedance, the current domain will not have any severe characteristics. Although the overall characteristics of the insertion amplitude and frequency current control loops have sufficient values to achieve a wide area, at this time, for the characteristics, the impedance L2 may only be applied in order to be effective. And the frequency characteristic of the impedance L2, when the time constant is taken as the r shunt resistance R1 1, [Equation 8] r 1 = L2 / R1 ... Equation 8 is Equation 8, and the operating frequency is taken as "[Equation 9] U / il ' x Γΐ) = L2 / (2 π X R1) · 'Formula 9 Amplitude characteristics, phase frequency is the highest rate ^ preparation = bound, with high-domain frequency + 6dB / oct2 stability frequency compensation = effective fruit, phase

1237167 V. Description of the invention (10) Today's special, business shortage, private 7 Thunder μ plant 1 = + shunt + knife element of load 1¾ detected by shunt resistance and impedance L2, it will also produce no load current π ^ ^. That is, the frequency characteristic of the feedback circuit of the current control feedback loop becomes uneven. Α Magic U 峪 电 峪 之 户 雪 踗 s A female slave-To prevent this phenomenon, the method is to return the frequency up to the load current ^ τ U. ^ ^ ^ aff. The input characteristics of the shake-negative flat-load earth current f are fixed and the early characteristics of tef are kept flat, achieving a load current waveform that is equivalent to the load current. At this time = a number 'H resistance RU0 is inserted in parallel with the capacitor cu〇, in order to improve the frequency characteristics of the frequency higher than the frequency of M A 3 I 1 1 ^ I i choose a resistance sufficiently smaller than the resistance R1 Q R11 G fixed value. This -rn η I 3 acts as a Ϊ differential input signal, and will insert the resistor RU and capacitor C111 with the same number as the resistor R10 and the valley Clio. 2. The following will contribute to the effect of the safety of the feedback loop characteristics. Oral band ^ B. Relative to the frequency characteristics of the drain current of the gate input voltage of the field-effect transistor as a load transistor, the characteristics of yfs are admissible. In general power MOSFET transistors, the boundary is about 10 [MHz]. Gradually decreases. Considering the source current of the electrostatic capacitance that is parasitic inside the field effect transistor, in addition to the non-polar current that is determined by the characteristics of the admittance yfs, the gate current of the inter-source-to-source capacity is also related to the source. overlapping. In order to faithfully detect the load current other than the gate current, the method of Figure 8 will be considered. Although the shunt resistor will correctly detect the ^ f current including the gate current, the forward admittance will become zero as the frequency increases, with a large phase delay, which will adversely affect the circuit characteristics.

Page 14 1237167

.丄: Secondly, the circuit of the present invention as shown in the seventh figure, because the load current is not detected / can also be detected including η, so the phase delay at high frequencies can be suppressed: contention, load current, load current Disadvantages, but because it is more than the load to detect the current negative Bagu from now on, the frequency range necessary for the current is 10: the frequency of 冋, the load current is very low, so the effect is very low. Pure, but has a very high effect on the stability of high-frequency oscillations, etc. The conventional technology of the frequency region above 0 and the characteristics of the present invention have been described in comparison with the above. From the frequency when the loop gain is 1, the present invention can almost achieve With a wide area of 100 times, the amplitude margin and phase margin are better for the change in the impedance of the connection cable. Next, the characteristics of the time domain are compared with the conventional technology and the present invention by simulation. Regarding the response characteristics of the load current, the circuit diagram of the conventional technology is shown in the third diagram, and the circuit diagram of the present invention is shown in the fourth diagram. The setting conditions are to set the output voltage V2 of the power supply to be tested to 5 [v], and the load current. Set the waveform start time of the signal V3 to 1 [// S], set the load current to 0 ~ 5 [A], the impedance of the single-sided line of the connection cable L31, L32, and set the single-sided line to 1 [&quot; η], 10 [// Η], 100 [// Η], coupling coefficient KK3 = 0 · 9, to simulate the load_current waveform. The ninth picture is the conventional technology, the tenth picture is the result of the present invention, the ninth picture A and the tenth picture A are the waveforms of the load current setting signal V3; the ninth picture B and the tenth picture B are field effect transistors Q1 Voltage between the drain and source of the drain;

Page 15 1237167 V. Description of the invention (12) Figure 10C is the load current waveform. Under the conventional technology, even if the impedance of the connection cable 3 is small, the start-up time will be slow because the frequency range of the control system is not sufficient because the non-polar source voltage is not saturated. When the impedance of the connection cable 3 is increased, During the process from saturation to recovery, an over-current condition in which the set current is greatly exceeded will occur. Secondly, regarding the response characteristics of the tested power supply during the start-up test, the circuit diagram of the conventional technology is illustrated in Fig. 11 and the circuit diagram of the present invention is illustrated in Fig. 12. Both set the load current setting voltage VI to the load current ^ 5, [A] in advance, simulating the output voltage waveform from the start of the power supply under test to starting from the fixed output voltage and replacing it with a table wave generator. " When the startup time is set to 1 [// S], the output voltage is 5 [V], the impedance of the single-sided line connected to ° Telescope 3 is L 31, L 3 2, and the single-sided line is set to 1 [# η], 1 〇 [# Η], 1 00 [// Η], coupling coefficient κ3 = 0.9, and the load current waveform is obtained by simulation., The thirteenth figure is the conventional technology, and the fourteenth figure is the result of the present invention. Figures 13A and 14A are output waveforms corresponding to the power supply 2 under test; Figures 13B and 14B are load currents. In the conventional technology, the settings are set before the power supply under test is started. The field effect that the load current should flow = the body Qk gate voltage will be driven to the maximum, so that the tested power supply &gt; &amp; so, once the result of a large load current flow, even the current As the frequency compensation of the control system, insert the capacitor 11 of the feedback circuit. Making the operational amplifier's output performance π Ϊ through rate will become extremely slow, and the time to return to the set current value will also be long,…, κ. Because this will depend on the frequency compensation circuit, it will be operated on page 16 1237167 V. Explanation of the invention (13) The wider regionalization of different amplifiers cannot be solved. This is fatal to the electronic load for the start-up test of the tested power supply, and an expedient countermeasure is that a load current blocking circuit must be provided as described above. According to the present invention, the load current waveform diagram shown in FIG. 14B can achieve that the load current overcurrent rarely occurs regardless of the impedance of the connection cable 3. The fifteenth figure is Connect the impedance L1 to the source of the load transistor, and connect the shunt resistor for load current detection through the source L1. Figure 16 shows the shunt resistor R1 for load current detection to the source of the load transistor Q1. The shunt resistor M is connected to the impedance I through the load current detection. The present invention uses a differential detection load current at both ends of the shunt resistor R1 for feedback control. Therefore, the impedance L The order of 1 and the shunt resistor R1 is connected to the source of the load sun-body Q1 'without impairing the effect of the present invention.

For example, its wheel-to-load device can be changed in more detail by inserting a suitable crystal. The principle is based on the description of the high-speed response of the load on the input side, which represents the negative operation. The final stage is negative feedback. Lee applied for the seventeenth son, and he was able to respond to the problem with electricity. The operational circuit of the current-carrying amplifier is shown in Fig. 18 and Fig. 18 of the invention as described in the second item. Slave operation By inserting non-linear elements, such as diodes, a small current to a large current, a fixed action. The following figure and the seventeenth and eighteenth figures are based on the control circuit's amplifier, but it can also be used to drive the load control transistor amplifier, which can correspond to the field by increasing the diode and the like. The effect transistor is enlarged, and the electric range fan intends to close a ϋ field non-straight gate.

1237167 V. Description of the invention (14) Specific examples of non-linear components Fig. 19 Figure 19 shows the case of non-linear components mounted with 2 terminals.-2nd ~ D (n) configuration 'as shown in Figure 19c, The body shown in the nineteenth stage =) The structure of a Zener diode ZD (1). In the case of a non-linear component of the 21st terminal, the twentieth A picture is a two-pole, &quot;〗 / 3 nano-diode ZD (1) and an example of the composition of the resistor RD13; Example of the configuration of the resistor RD12; the figure is an example of the additional electricity: the electrode body Dn-a or even _, and the connection point Bm is the example of a diode milk or a body; The configuration examples of the resistor RD11 and the resistor core 12 have the same effect. In addition to using capacitors for frequency compensation in combination, in order to optimize non-linear characteristics, it is also possible to use a combination of resistance and bias. In addition, this embodiment is described with an N-channel transistor. However, when using a p-channel transistor, it is of course possible to change the connection polarity of the non-linear elements shown in Figure 19 and Figure 20. Get the same effect. The twenty-first figure is an embodiment of the present invention. Regarding the frequency characteristics of each part of the circuit diagram and the entire load control circuit, the load current is from j 0 [m A] to 10 [A]. As shown in the twenty-second figure. Regarding the characteristics of the field-effect transistor Q1 for load control, the sink current y f S also changes due to the drain current, that is, the magnitude of the load current. In particular, when the non-polar current is set to be very small, the gate voltage will approach the pinch voltage and the forward admittance y f S will be extremely small.

Page 1237167 1. Description of the invention (15) ~~ ~ ^-Figure 22C shows the characteristics of the drain current relative to the gate voltage of the field-effect transistor Q1 'for changes in load current at low frequency Next, with an increase of about 50 [dB], the frequency region also changes. The conventional technology that has this characteristic to form a load current control feedback loop, even if frequency compensation is performed so that the entire range of the load current can be stable, but at a small load current, the load current is greatly insufficient because of the negative feedback amount. There will be a large error in the set current value of the target, and the frequency region and response characteristics will also be reduced. "With the present invention, an element composed of a diode with non-linear characteristics can be used to compensate for the change in the negative feedback amount of the field-effect transistor Q1. Figure 22B shows the insertion of a non-linear characteristic element in the middle In the case of an operational amplifier, the frequency characteristic of the non-linear gain section under the change of load current from 10 [111 magic to 10 [magic] can be changed by about 40 [dB] in the low-domain frequency, which can be compensated. Variation of the field effect transistor. In addition, inserting the capacitor C11 into the feedback circuit of the non-linear amplifier section can also compensate the variation of the frequency region of the field effect transistor section and the sum of the circuit characteristics of the load current holding circuit. The amplitude characteristic shown by the twenty-second ㈣ = characteristic, the twenty-second F figure: You can know the phase characteristics of Jinbu, in addition to ensuring sufficient negative feedback amount and frequency region, you can also ensure feedback The amplitude and phase margins of the loop.

I237l67

Simple illustration of the diagram C Simple description of the diagram ίIf is a circuit configuration diagram of the electronic load device of the conventional technology. The second cabinet is a circuit configuration diagram of a conventional technique that considers the influence of connecting cables. A picture is a circuit configuration diagram of the conventional technology. According to the description in item 1 of the scope of the present invention, the figures: f A to F5 of the embodiment are characteristic diagrams of the circuit structure of the third figure. ', A to sixth E diagrams are characteristic diagrams of the circuit structure of the fourth diagram. ί = is an explanatory diagram of the interrogator current measurement described in item 1 of the scope of patent application of the present invention. Figure 8 shows an example of a method for measuring the gate current. Figures 9A to 9C are response characteristic diagrams of conventional techniques.乂 乂 Figure 20 and Figure 10 are response characteristics of the embodiment described in item 1 of the patent application scope of the present invention. Tenth: The diagram is a circuit configuration diagram considering the starting characteristics of the conventional technology. The twelfth figure is a consideration of the patent application scope of the present invention. Figure 13A through 13th B are startup characteristic diagrams of conventional technologies. Figures 14A to 14B show Tairi Kuili · ^ Shen γ ^ π π to Figure 1 is a startup characteristic diagram of an embodiment described in item 1 of the scope of this month's patent application. The fifteenth figure is a circuit configuration diagram of the patent application park of the present invention. The embodiment described in item 1 of the scope of the present invention-the sixteenth figure is an example of an example of conventional technology. The seventeenth figure is a schematic diagram of a patent application for the present invention. Example of target item 2

Page 20 1237167 Block diagram of the circuit structure for simple illustration f. Figure 18. The scope of patent application for this invention? Block diagram of the circuit construction. One of the embodiments described in two items Figures 19A to 19D are examples of non-linear elements of the honey. Document ^ described in item 2 of the scope of patent application ^ = Figures A through Twenty-D are examples of non-linear elements described in item 2 of the scope of patent application of the present invention. The diagram is the circuit structure described in the twenty-first diagram. The eleventh diagram is a circuit structure diagram of an embodiment described in item 2 of the patent application scope of the present invention. Explanation of the symbols of each component of the figure: 1 Electronic load device 2 Power supply to be tested 3 Connection cable V1-V10 Power supply A1-A10 Amplifier Q1 Transistor R1-R213 Resistor RD1-RD13 Resistor CIO ~ C101 Capacitor U ~ L32 Impedance M Connection cable Mutual impedance

1237167 Brief description of drawings K3 Dl, D (l) ~ D (n) ZD1, ZD (1) B1 B2 BJ1 ~ BJ3

XI Coupling coefficient of connecting cable Diode Zener Diode Load current detection device Non-linear additional device Connection point of non-linear additional device Switching device

Page 22

Claims (1)

1237167, the scope of the application for an electronic load device, the current shunt used for the detection of the current of the first load ^ resistance = two, the system is a load that is driven by the load of the inductor and the negative source ^ 2 as the tested alternating current #Current Control Transistor Xi 、、 塔 H # | The wheel of the AC power source to be tested 丨 f ^ ",,-" f- 佘: a moving circuit to output the gate drive current that meets the threshold of the specific load motor To the transistor. 2. —An electronic load device 'characterized in that the input and output voltages of its amplifiers are used to drive the gate of the load transistor that constitutes the current control circuit of the electronic load device described in item 1 of the patent application. Sexual circuit device.