TWI236708B - Method and apparatus for filtering out metal chips from lift-off - Google Patents
Method and apparatus for filtering out metal chips from lift-off Download PDFInfo
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1236708 五、發明說明(1) --一· 1 ·本發明所屬之技術領域 本發明係有關於一種半導體製程之設備及方法,特別 是有關於利用撕去(1 if t-of f)法剝除金屬圖案後除去溶劑 中之金屬碎片之設備及方法。 2 ·先前技術 撕去法技術係半導體製程中形成圖案在晶圓上之方 法,與蝕刻法不同。主要係利用光阻形成與所要圖案相反馨 之圖形’再鍍上圖案所需之金屬膜在光阻圖案上所謂鏤空 層(Stenci 1 layer)及晶圓上無光阻之處,然後將晶圓浸 入溶解液光阻之溶液中將鏤空層上之金屬撕去,餘下晶圓 無光阻之處之金屬圖案。 此法較蝕刻法簡單,勿需蝕刻製程,省時省工。撕下 之金屬碎片隨溶劑排出,易污染環境。一般為回收再利用 溶劑,多用過濾法過濾金屬以循環利用溶劑。傳統除去光 阻及金屬碎片之裝置1〇〇如第1圖之先前技術所示,於光阻 撕去處理槽1 〇 2浸泡之晶圓撕下之光阻及金屬碎片經過濾 钃^ 器1 〇 8過濾後再送回處理槽1 0 2,開關1 〇 6可於浸泡時關 閉,處理完再打開開關1 0 6,使溶劑經由管路1 0 4藉泵浦 11 〇將溶液抽送經過濾器1 0 8過濾,但過濾器1 0 8易為金屬 碎片堵住,需經常更換,又細微之金屬碎片仍可通過過濾1236708 V. Description of the invention (1)-1 · 1 · FIELD OF THE INVENTION The present invention relates to a device and method for a semiconductor process, and particularly to stripping using a 1 if t-of f method Apparatus and method for removing metal fragments in solvent after removing metal pattern. 2 · Prior art The tearing method is a method of forming a pattern on a wafer in a semiconductor process, which is different from an etching method. The main purpose is to use photoresist to form a pattern that is opposite to the desired pattern. The metal film required for the pattern is then plated. The so-called hollow layer (Stenci 1 layer) on the photoresist pattern and no photoresist on the wafer. Immersed in the solution of the photoresist of the dissolving solution to tear off the metal on the hollow layer, and the remaining metal patterns on the wafer where there is no photoresist. This method is simpler than the etching method, eliminating the need for an etching process and saving time and labor. The removed metal fragments are discharged with the solvent, which is easy to pollute the environment. Generally, the solvent is recovered and reused, and the metal is usually filtered by filtration to recycle the solvent. Conventional device for removing photoresist and metal fragments 100 As shown in the prior art of FIG. 1, the photoresist and metal fragments removed from the wafer soaked in the photoresist tearing processing tank 10 are filtered through the filter 1 〇8 After filtering, return it to the processing tank 102. Switch 1 〇6 can be closed during immersion. After processing, turn on the switch 106 to allow the solvent to be pumped through the pipeline 1 0 4 to the filter 1 0 8 filter, but the filter 1 0 8 is easy to be blocked by metal fragments and needs to be replaced frequently, and the fine metal fragments can still pass the filter.
1236708 五、發明說明(2) 器108而磨損泵浦。又如本案申請人於91年1〇月4曰申請之, 中華民國專利申請案第 號案,名為「光阻去除丨裝1236708 V. Description of the invention (2) The device 108 wears the pump. Another example is the application filed by the applicant of this case on October 4, 91. The Republic of China Patent Application No.
置及方法」即係利用濾網濾除光阻微粒之方法,但對於撕 去法產生帶有金屬微粒之光阻則濾網易為金屬碎片阻塞, 若未完全濾除,又易使泵浦磨損而減少使用壽命。 在污水處理技術中除去金屬之方法中有利用磁埸吸住 磁性金屬之方法,使通過磁埸之污水中之金屬被吸住,僅 排放水及溶劑,除去磁性金屬。但未有用於半導體製程之 設備者。 在撕去法製程中’所用金屬如鉻(Cr)、金/鉻(au/cr) 、Al/Cr複合層,Al/Cu合金/Cr等,其中部分為鐵磁性金 屬’祗要複合層金屬中有一層為磁性金屬即可用磁極吸 住。而完全為非磁性金屬之碎片,亦可由傳統之過濾網予 因此需求一種裝置,能移除撕去法產生之磁性及非磁 性金屬碎片之裝置,以減少濾網之阻塞及增加泵浦之使用 壽命。 3.發明内容 本發明之一目的為提供一種金屬圖案撕去設備除去金"Placement and method" refers to the method of using a filter to remove photoresist particles. However, for the photoresist with metal particles generated by the tearing method, the filter is easily blocked by metal fragments. If it is not completely removed, the pump is likely to wear And reduce service life. Among the methods for removing metals in sewage treatment technology are methods of using magnetic maggots to attract magnetic metals, so that the metal in the sewage passing through magnetic maggots is absorbed, and only water and solvents are discharged to remove magnetic metals. However, there is no equipment for semiconductor manufacturing. In the tearing process, 'metals such as chromium (Cr), gold / chromium (au / cr), Al / Cr composite layers, Al / Cu alloys / Cr, etc., some of which are ferromagnetic metals', require composite layer metals One layer is made of magnetic metal and can be held by magnetic poles. And the completely non-magnetic metal fragments can also be provided by the traditional filter screen. Therefore, a device that can remove the magnetic and non-magnetic metal fragments generated by the tearing method can be used to reduce the blocking of the filter screen and increase the use of the pump. life. 3. Summary of the Invention An object of the present invention is to provide a metal pattern tearing device for removing gold.
1236708 〜 — 五、發明說明(3) 屬碎片之裝置’以避免金屬碎片流入廢水處理池中形成污 染。 本發明之次一目的為提供一種金屬圖案撕去設備除去 金屬碎片之裝置,以避免金屬碎片阻塞濾網,以增加濾網 之使用壽命。 本發明之另一目的為提供一種金屬圖案撕去設備除去 金屬碎片之裝置,以避免金屬碎片進入泵浦,以增加 之使用壽命。 •丨 本發明之再一目的為提供一種金屬圖案撕去設備除去 金屬碎片之裝置,以回收貴重金屬。 為達成上述目的及其他目的,本發明之一較佳實施例 係提供一種金屬圖案撕去(lift-off )設備除去金屬碎片之 至少包3 · —金屬圖案撕去處理槽’以溶劑溶解光 阻以撕去金屬圖案之鏤空層(stencil layer); 一磁性金 屬去除槽,以磁埸吸住磁性金屬碎屑;一金屬碎片收集 槽,收集金屬碎片;一過濾器,過濾剝下之光阻及非磁性鲁 金屬碎片;一泵浦,將處理液泵至過濾器以回收處理液; 一純水供應源,供應純水已沖洗磁性金屬去除槽内之磁性 金屬;一廢液池,儲存已無效用之處理液;一新處理液儲 槽’用以補充新處理液;一複數個開關,以控制處理液之1236708 ~ — V. Description of the Invention (3) Fragmented Device 'to prevent metal fragments from flowing into the wastewater treatment tank to form pollution. A second object of the present invention is to provide a device for removing metal fragments by a metal pattern tearing device, so as to prevent the metal fragments from blocking the filter screen, thereby increasing the service life of the filter screen. Another object of the present invention is to provide a device for removing metal fragments from a metal pattern tearing device to prevent metal fragments from entering the pump to increase the service life. • 丨 Another object of the present invention is to provide a device for removing metal fragments from a metal pattern tearing device to recover precious metals. In order to achieve the above and other objects, a preferred embodiment of the present invention is to provide a metal pattern lift-off device to remove at least a package of metal fragments. 3-The metal pattern tear off processing tank is used to dissolve the photoresist. A stencil layer with a metal pattern torn off; a magnetic metal removal slot to attract magnetic metal debris with a magnetic reed; a metal debris collection slot to collect metal debris; a filter to filter the peeled photoresist and Non-magnetic Lu metal fragments; a pump that pumps the treatment fluid to a filter to recover the treatment fluid; a pure water supply source that supplies pure water that has been rinsed out of the magnetic metal to remove the magnetic metal in the tank; a waste liquid pool that has been invalidated for storage Used processing liquid; a new processing liquid storage tank 'for replenishing new processing liquid; a plurality of switches to control the processing liquid
第8頁 1256708 五、發明說明(4) — —- 流向;一控制器,控制整個裝置之運作。 本發明之另一較佳實施例係提供一種金屬圖案撕去設 備除去金屬碎片之方法,至少包含下列步驟··( a )以處理 液溶解光阻以撕去金屬之鏤空層;(b)驅動泵浦使處理液 流經磁性金屬去除槽以磁埸吸住磁性金屬;(c )處理液經 由栗产驅動持續循環直至磁性金屬完全被反應去除為止; (d )停止循環後,切斷磁性金屬去除槽的磁力,並提供一 組純水(DI water)沖洗去除槽中被磁附之金屬物質至今 碎片收集槽回收處理;(e)若處理液仍有效,則繼續 ί神ίΐΐϊ已無㉛’則將之排入廢液池,而自新處理液 儲槽補充處理液。 狀 上述本發明之其他目的、特徵及優點經由下述說 所附圖 < 對照之詳細說明將使本發明更為冑楚易於 4·實施方式 去依裝據置本二施 盛裝溶劑以剝除光阻之批次濕蝕阻:理槽1=:般之 ^ ^ , , 202, 2 1 4, ^ , 2]4 需更換溶料打開4在單U旋轉㈣處理裝置開元始成剝Page 8 1256708 V. Description of the invention (4) — — — Flow direction; a controller that controls the operation of the entire device. Another preferred embodiment of the present invention provides a method for removing metal fragments by a metal pattern tearing device, which includes at least the following steps: (a) dissolving a photoresist with a treatment liquid to remove a metal hollow layer; (b) driving The pump causes the treatment liquid to flow through the magnetic metal removal tank to attract the magnetic metal by magnetic convection; (c) The treatment liquid is continuously circulated through the chestnut drive until the magnetic metal is completely removed by the reaction; (d) After the circulation is stopped, the magnetic metal is cut off Remove the magnetic force of the tank, and provide a set of pure water (DI water) to rinse and remove the magnetically attached metal material in the tank. The debris collection tank has been recovered and processed so far; (e) If the treatment solution is still effective, continue to continue. Then drain it into the waste liquid tank, and replenish the processing liquid from the new processing liquid storage tank. The other objects, features, and advantages of the present invention described above will make the present invention more comprehensible through the detailed description of the drawings < comparative illustrations. Resistance batch wet erosion resistance: slot 1 =: general ^ ^,, 202, 2 1 4, ^, 2)
I2367〇r 五、發明說明(5) 除光阻及金屬時打開,使磁性金屬碎片在磁性金屬去除槽 2 0 4中為磁埸吸住。磁性金屬去除槽2 0 4之磁埸亦由控制器 22 0控制,應經常保持,僅於除去金屬碎片時才關閉。除 去磁性金屬之溶液經由泵浦Π 〇的驅動,保持循環的狀 態,同時使仍有非磁性金屬及光阻之溶液通過過濾器丨〇 8 以除去非磁性金屬及光阻。溶液則送回光阻撕去處理槽 1 0 2以循環利用。金屬去除製程時間到達後,關閉磁埸之 電源,並打開開關2 0 5、2 0 8,使純水沖洗磁性金屬去除槽 2 0 4中的磁性金屬物質至收集槽2 〇 6中。清除完畢後,磁性 金屬處理液繼續保持循環,等待下一批貨處理。若處理液參 已用過一段時間或已處理一定晶圓,應予更換新處理液, 則過渡後之溶液不能再使用,此時可關閉開關2丨4,停止 泵浦動作’打開開關2 0 2、2 1 2,已重力方式,將廢液引入 廢液池2 1 8中。再自新處理液儲槽1 〇丨補充處理液,過濾器 1 08可為一般濾網,亦可為例如本案申請人申請之中華民 國專利申請案第0 9 1 1 2 2 93 9號案之可抽換之多層濾網。控 制器2 2 0控制整個褒置之運作。 第3圖(A)係依據本發明之一實施例之磁性金屬去除槽 204之頂視圖。第3圖(B)係自(A)圖之N極至滿之斷面剖示籲 圖。槽體302係能耐處理液之侵蝕材料製成,可為圓柱 形、方形或其他形狀’使磁極3〇4之形成容易為宜。磁極 由線圈30 6激磁。槽體之上部有一金屬處理液之進入口 310槽内之上邓有一斜坡狀之液體分散器Μ?,可將落下I2367〇r V. Description of the invention (5) Open when removing the photoresist and metal, so that magnetic metal fragments are held in the magnetic metal removal groove 204 by the magnetic maggot. The magnetic coil of the magnetic metal removal slot 2 04 is also controlled by the controller 22 0 and should be kept constantly and closed only when metal fragments are removed. The solution for removing the magnetic metal is driven by the pump Π 〇 to keep the circulation state, and at the same time, the solution still having the non-magnetic metal and the photoresist is passed through the filter 8 to remove the non-magnetic metal and the photoresist. The solution is sent back to the photoresist tear-off processing tank 102 for recycling. After the metal removal process time is reached, turn off the power of the magnetic coil, and turn on the switches 205 and 208, so that pure water flushes the magnetic metal substance in the magnetic metal removal tank 204 to the collection tank 206. After the removal is completed, the magnetic metal treatment liquid will continue to circulate and wait for the next batch of goods to be processed. If the processing fluid has been used for a period of time or a certain wafer has been processed, it should be replaced with a new processing fluid. The solution after the transition can no longer be used. At this time, you can turn off the switch 2 丨 4 and stop the pumping action. Turn on the switch 2 0 2. 2 1 2 The waste liquid has been introduced into the waste liquid tank 2 1 8 by gravity. The processing liquid storage tank 1 is replenished with a new processing liquid, and the filter 1 08 may be a general filter screen, or may be, for example, the Republic of China Patent Application No. 0 9 1 1 2 2 93 9 filed by the applicant of this case. Replaceable multilayer filter. The controller 2 2 0 controls the operation of the entire device. FIG. 3 (A) is a top view of the magnetic metal removing groove 204 according to an embodiment of the present invention. Figure 3 (B) is a sectional view taken from the N pole to the full in Figure (A). The tank 302 is made of a material resistant to the erosion of the treatment liquid, and may be cylindrical, square, or other shapes' to facilitate the formation of the magnetic pole 304. The magnetic pole is excited by the coil 30 6. The upper part of the tank has an inlet for the metal treatment liquid. The upper part of the tank has a slope-shaped liquid disperser M?
第10頁 1236708 五、發明說明(6) ^ 之處理液310導引至槽體之四週,使金屬碎片30 9確實為n 極及S極磁極3 0 4吸住。但此並非必需,若磁埸3 0 8夠強, 亦可省略此液體分散器3 1 2。經由金屬分離去除後之處理 液再由排出口 3 1 8循環使用。有關吸附後之金屬物質去除 部分’由純水供應源2 1 9將純水由進入口 3 1 4流入,利用純 水之壓力,將被吸附之金屬物質沖刷而下,再經由排放口 3 1 9排放到金屬碎片收集槽收回處理。 第4圖係依據本發明之一實施例去除金屬碎片裝置之 操作方法之流程圖。去除碎片之方法開始於步驟4 0 2,打 纖 開循環開關2 0 2、2 1 4及泵浦1 1 0,製程條件完成設定,於 步驟4 0 4,將晶圓置入處理槽1 〇 2中,此槽可為批次式或單 片式處理槽。以處理液浸泡晶圓以撕去光阻及金屬,若為 單片式,則注入處理液慢慢旋轉以撕去光阻及金屬。於步 驟4 0 6,提供磁性金屬去除槽電極電源以除去磁性金屬。 於步驟4 0 8,以過濾器過濾非磁性金屬及光阻。於步驟 41 0,判斷製程時間是否已到,若否,回到步驟4 〇 6,繼續 除去磁性金屬,過濾非磁性金屬及光阻。若是,進入步驟 4 1 2,取出晶圓。於步驟4 1 4關閉循環開關及泵浦。於步驟 41 6,切斷磁性金屬去除槽之電極電源。於步驟4丨8,打開 開關2 0 8、2 0 5,以純水供應源2 1 9之純水沖洗磁性金屬去 除槽2 0 4將金屬碎片排放到收集槽2 〇 6。於步驟4 2 0,判斷 是否沖洗時間已到,若否,回到步驟4丨8,繼續以純水沖 洗磁性金屬去除槽204將金屬碎片排放到收集槽2〇6。若Page 10 1236708 V. Description of the invention (6) ^ The treatment liquid 310 is guided to the periphery of the tank, so that the metal fragments 30 9 are indeed sucked by the n-pole and S-pole magnetic poles 3 0 4. However, this is not necessary. If the magnetic field 3 0 8 is strong enough, the liquid disperser 3 1 2 may be omitted. The treated liquid which has been separated and removed by the metal is recycled through the discharge port 3 1 8. The part of the removed metal substance after the adsorption is from the pure water supply source 2 1 9 The pure water flows into the inlet 3 1 4 and the pressure of the pure water is used to flush the adsorbed metal material down and then through the discharge port 3 1 9 Discharge to metal debris collection tank for recovery. FIG. 4 is a flowchart of an operation method of a metal debris removing device according to an embodiment of the present invention. The method of removing debris starts at step 402, the fiber is turned on and the cycle switch 2 0 2, 2 1 4 and the pump 1 10 are set. The process conditions are set. At step 404, the wafer is placed in the processing tank 1 〇 In 2, this tank can be a batch or single-chip processing tank. Immerse the wafer with the treatment solution to remove the photoresist and metal. If it is a single piece, inject the treatment solution and slowly rotate to remove the photoresist and metal. In step 406, a magnetic metal removal tank electrode power is provided to remove the magnetic metal. In step 408, filter the non-magnetic metal and photoresist with a filter. At step 4100, determine whether the process time has arrived. If not, return to step 4 06, continue to remove magnetic metals, filter non-magnetic metals and photoresist. If yes, go to step 4 1 2 and take out the wafer. Turn off the cycle switch and pump in step 4 1 4. At step 416, cut off the electrode power to the magnetic metal removal tank. In step 4 and 8, turn on the switches 2 0 8 and 2 5 and rinse the magnetic metal removing tank 2 0 4 with pure water from the pure water supply source 2 1 9 to discharge the metal fragments to the collecting tank 2 06. At step 4 2 0, it is judged whether the flushing time is up. If not, return to step 4 8 and continue to rinse the magnetic metal removal tank 204 with pure water to discharge metal fragments to the collection tank 206. If
1236708 — — 五、發明說明(7) 是,判斷處理液使用時間或處理批貨量已到,若否,回到 步驟4 0 2,繼續操作另一晶圓。若是,則於步驟4 2 4,關閉 循環開關2 0 2、2 1 4及泵浦將廢液排放至廢液池2 1 8,於步 驟4 2 6,自新處理液儲槽1 0 1提供新處理液,回到步驟 4 0 2,繼續操作另一晶圓。 雖然本發明以特定之實施例已予揭露,熟知此技術之 人士將瞭解可對此特定實施例之形式及細節稍作改變,在 不脫離本發明之精神及理念所作之修飾及變更皆為本發明 之範圍,本發明以上所敘述之實施例僅作例示之目的,而 一 不是用以限定所附之申請專利範圍。1236708 — V. Description of the invention (7) Yes, judge whether the processing liquid usage time or the processing batch has arrived. If not, go back to step 402 and continue to operate another wafer. If yes, then in step 4 2 4 turn off the cycle switch 2 0 2, 2 1 4 and the pump to discharge the waste liquid to the waste liquid tank 2 1 8 and in step 4 2 6 from the new treatment liquid storage tank 1 0 1 New processing liquid, return to step 402, and continue to operate another wafer. Although the present invention has been disclosed in specific embodiments, those skilled in the art will understand that the form and details of this specific embodiment may be slightly changed, and modifications and changes made without departing from the spirit and concept of the present invention are The scope of the invention, the embodiments of the invention described above are for illustrative purposes only, and one is not intended to limit the scope of the attached patent application.
第12頁 1236708 圖式簡單說明 5.圖式簡單說明 第1圖(先前技術)傳統除去光阻及金屬碎片之裝置。 第2圖係依據本發明之一實施例之金屬圖案撕去法除去金 屬碎片之裝置之方塊圖。 第3圖(A )係依據本發明之一實施例之磁性金屬去除槽之頂 視圖。 第3圖(B)係自(A)圖之N極至S極之斷面剖示圖。 第4圖係依據本發明之一實施例去除金屬碎片裝置之操作 方法之流程圖。 符號說明 100 除去光阻及金屬碎片 102 光阻撕去處理槽 106 開關 110 泵浦 200 金屬圖案撕去法除去 2 0 2, 2 0 5, 2 0 8, 2 1 2, 2 1 4 2 04 磁性金屬去除槽 2 1 8 廢液池 2 2 0 控制器 3 04 磁極 3 0 8 磁場 之裝置 104 管路 1 0 8 過濾器 金屬碎片之裝置 關 2 0 6 金屬碎片收集槽 219 純水供應源 3 0 2 槽體 3 0 6 線圈 310 處理液Page 12 1236708 Brief description of the drawings 5. Brief description of the drawings Figure 1 (prior art) Conventional device for removing photoresist and metal fragments. Fig. 2 is a block diagram of a device for removing metal fragments by a metal pattern tearing method according to an embodiment of the present invention. FIG. 3 (A) is a top view of a magnetic metal removing groove according to an embodiment of the present invention. FIG. 3 (B) is a sectional view taken from the N-pole to the S-pole in (A). FIG. 4 is a flowchart of an operation method of a metal debris removing device according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 100 Removal of photoresist and metal fragments 102 Photoresist tearing processing tank 106 Switch 110 Pump 200 Metal pattern removal method 2 2 2, 2 0 5, 2 0 8, 2 1 2, 2 1 4 2 04 Magnetic Metal removal tank 2 1 8 Waste liquid tank 2 2 0 Controller 3 04 Magnetic pole 3 0 8 Magnetic field device 104 Pipe 1 0 8 Filter metal debris device off 2 0 6 Metal debris collection tank 219 Pure water supply source 3 0 2 tank body 3 0 6 coil 310 processing fluid
123^708 圖式簡單說明 312 液體 分 散器 314 排 液 蓋 315 排金 屬 蓋 316 控 制 器 317 控制 器 318 排 液 V 319 金屬 排 出口 40 2- 426 步 驟123 ^ 708 Brief description of the diagram 312 Liquid disperser 314 Discharge cover 315 Discharge metal cover 316 Controller 317 Controller 318 Discharge V 319 Metal discharge port 40 2- 426 Steps
❿ 第14頁❿ Page 14
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