TWI235821B - Test method of display quality for electronic display by using the variance of brightness distribution - Google Patents

Test method of display quality for electronic display by using the variance of brightness distribution Download PDF

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TWI235821B
TWI235821B TW92109494A TW92109494A TWI235821B TW I235821 B TWI235821 B TW I235821B TW 92109494 A TW92109494 A TW 92109494A TW 92109494 A TW92109494 A TW 92109494A TW I235821 B TWI235821 B TW I235821B
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image
area
display
electronic display
test method
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TW92109494A
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TW200422592A (en
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Chih-Heng Fang
Shun-Lin Yang
Yu-Ching Wu
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Utechzone Co Ltd
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Abstract

A test method of display quality for electronic display by using the variance of brightness distribution is disclosed, wherein the imaging unit (such as CCD electronic microscope camera or CMOS digital camera) captures the displayed image of electronic display under test in moving or static way. After the image of various modes is obtained by the imaging unit, it is transmitted to the variance detection unit through the digitizing unit of image (such as a video capture card), so as to obtain the characteristic value of variance from all digital data of image captured by the computer by a formula to analyze the variance, and it is counted statistically and analyzed, the region exceeding the tolerant range of standard deviation is marked, thereby displaying the abnormal quality of the electronic display tested. The test method of the present invention can replace the visual inspection way in the prior art, so as to achieve the objective of automatic inspection.

Description

1235821 玖、發明說明 【發明所屬之技術領域】 本發明係指一種以亮度分佈的紛亂程度做爲電子式 顯示器之顯示品質測試方法,其主要係針對以往以人工目 5視檢查電子式顯示器之顯示品質的方法而加以改進,提供 一種可自動化檢測的檢測方法。 【先前技術】 按,目前之電子式顯示器例如LCD液晶顯示器,其 顯示品質的測試通常係以人工目視檢查方式來判斷,而隨 1〇著檢測者檢測當時之眼睛疲勞程度、辨色能力就可能造成 檢測結果不穩定而造成大量誤判(OVER KILL or SKIP)。 是以,本發明者乃有鑑於此而加以硏究改良,而提供 --種以亮度分佈的紛亂程度做爲電子式顯不器之顯不品質 測試方法,除了可達到自動化檢測之目的,且可避免人工 15目視檢測結果的不穩定,並可有效的避免電子式顯示器本 身亮度分佈不均勻對一般檢驗邏輯所造成的大量誤判 (OVER KILL or SKIP)。 【內容】 本發明一'種以売度分佈的紛亂程度做爲電子式威不益 2〇之顯示品質測試方法,係藉由取像單元取得欲檢測之電子 式顯示器的影像模式,透過影像數位化單元將之數位化並 傳輸至紛亂程度檢測單元中依下列程序處理前述取得的影 1235821 a. 將影像之全部或部份區分成N個處理區域; b. 於每一個處理區域中,將每一個畫素⑦lxel)之灰階(既吵 level)讀出; c. 於每一個處理區域中,將所有的畫素灰階帶入以下分析 5 亂度之公式: 其中 1=0 〜Κ ;Κ :於該區域中,所有灰階(既狀level)之範圍 10 ; 1 :某個灰階(gray level) ;Ρ(ι):於該區域中,灰階(gray leveD爲1之機率 ;E :.該區域之、、紛亂特性値〃 ;J :該處理區域之代號 d. 求得所有N個區域之「紛亂特性値」E(l)〜E(N); 15 e.於所有的紛亂特性値取得後,算出其統計分布、標準差、 變異數値; f.將所有E(j)其値於所有統計分佈中距整體平均値超過某特 定標準差數量者特別挑出,其相對的區域即爲有瑕疵之 缺陷區域而被認定爲有顯示品質異常者; 2〇 g.將數個相鄰的異常缺陷區域連結成一個完整區域即可準 確的指出顯示品質異常處者。 茲配合圖式詳加說明如后。 【實施方式】 請配合參考圖一所示,本發明一種以亮度分佈的紛亂 1235821 程度做爲電子式顯示器之顯示品質測試方法’其中: 被檢測之電子式顯示器⑴:本實施例爲LCD液晶電子式 顯示器,在其製作的過程中或因品質控管因素’使其畫 面所顯示不同型態時(如各種不同的色彩、灰階等),在 5 部份或全部區域呈現瑕疵如亮點、暗點或水波紋(MURA) 等; 取像單元⑵,如CCD電子顯微攝影機或CMOS數位攝影 機,可供攝取被檢測之電子式顯示器(1)各個區域、各個 不同的影像模式(image pattern),作爲資料分析的來源, ίο 其攝取之影像如圖三所示; 移動取像輔助單元(3),爲一 XY平台(XY stage)及移動控制 (motion control)的裝置,當被檢測之電子式顯示器⑴的 面積大於取像單元⑵所攝取的區域面積時,可使用本單 元將取像單元(2)移動至不同的位置攝取影像; is影像數位化單元⑷,由取像單元⑵所取得的影像經由本單 元的影像擷取卡:將影像數位化(數位化影像如圖四所 示)後,傳輸至紛亂程度檢測單元(5); 紛亂程度檢測單元⑸,以電腦將數位化影像以本方法所特 .有的紛亂度公式加以運算,得出紛亂特性値,並做統計 2〇 分析。 茲就本發明之測試方法說明如下: <測試方法> 1.將取像單兀(2)裝置於移動取像輔助單元(3)上,以移動或 靜止方式取得被檢測電子式顯示器(1)之顯示影像。 1235821 2. 被檢測之電子式顯示器⑴可針對需檢出的缺陷特性,顯 示不同的影像模式(如各種不同的色彩、灰階等)。 3. 將取像單元⑵取得的影像’透過影像數位化單元⑷將之 數位化並傳輸至紛亂程度檢測單元(5)中,並依以下程序 處理取得的影像(如圖二所示): a.將影像之全部或部份區分成N個處理區域(51)(如圖五 所示) b.於每一個處理區域(51)中,將每一個畫素(Pixel)之灰階 (gray level)讀出 ίο c.於每一個處理區域(51)中,將所有的畫素灰階帶入以下 分析亂度之公式: Σ ))*! = E① 其中1235821 发明 Description of the invention [Technical field to which the invention belongs] The present invention refers to a display quality test method of electronic display using the degree of disorder of the brightness distribution, which is mainly aimed at inspecting the display of electronic displays by manual visual inspection in the past. Quality methods are improved to provide a detection method that can be automated. [Previous technology] According to the current electronic display, such as LCD, the display quality test is usually judged by manual visual inspection, and it is possible to detect the degree of eye fatigue and color discrimination with the tester at that time. Causes unstable test results and causes a large number of false judgments (OVER KILL or SKIP). Therefore, the present inventor has researched and improved in view of this, and provided a display quality test method that uses the degree of disorder of the brightness distribution as an electronic display, in addition to the purpose of automatic detection, It can avoid the instability of the artificial 15 visual inspection results, and can effectively avoid a large number of misjudgments (OVER KILL or SKIP) caused by the uneven brightness distribution of the electronic display itself to the general inspection logic. [Content] The present invention is a display quality test method that uses the degree of disorder of the degree distribution as the electronic Weibuyi 20, which uses the image acquisition unit to obtain the image mode of the electronic display to be detected. The digitizing unit digitizes and transmits it to the chaos level detection unit to process the previously obtained image 1235821 a. Dividing all or part of the image into N processing areas; b. In each processing area, each A pixel (lxel) gray level (both noisy level) read out; c. In each processing area, bring all the pixel gray levels into the following analysis of the 5 disorder formula: where 1 = 0 ~ KK; Κ : In this area, the range of all gray levels (existing levels) is 10; 1: A certain gray level (gray level); P (ι): In this area, the probability of gray levels (gray leveD is 1; E :. The chaotic characteristics of the area 値 〃; J: The code of the processing area d. Find the "chaotic characteristics" of all N areas E (l) ~ E (N); 15 e. In all the chaos After the characteristic 値 is obtained, calculate its statistical distribution, standard deviation, and variation number 値; f. Put all E (j) In the statistical distribution, those who are more than a certain standard deviation from the overall average are specifically selected. The relative area is the defective area and is deemed to have abnormal display quality; 20 g. Several adjacent abnormalities The defect areas are linked into a complete area to accurately indicate the abnormal display quality. The details are described below in conjunction with the drawings. [Embodiment] Please refer to FIG. 1 to show the degree of chaos in the brightness distribution by 1235821. As the display quality test method of the electronic display 'Among them: the tested electronic display ⑴: This embodiment is an LCD liquid crystal electronic display. During its production or due to quality control factors, its screen display is different In the type (such as various colors, gray levels, etc.), defects such as bright points, dark points, or water ripples (MURA) are displayed in 5 or part of the area; the imaging unit 如, such as a CCD electron micro camera or CMOS Digital camera for capturing various areas and different image patterns of the electronic display (1) being tested as a source of data analysis ίο The captured image is shown in Figure 3. The moving imaging auxiliary unit (3) is an XY stage and motion control device. When the area of the detected electronic display is larger than When the area of the area captured by the imaging unit ⑵, you can use this unit to move the imaging unit (2) to a different position to capture images; is the image digitization unit ⑷, the image obtained by the imaging unit 经由 passes the image of this unit Capture card: After digitizing the image (as shown in Figure 4), the image is transmitted to the chaos level detection unit (5); the chaos level detection unit ⑸ uses a computer to digitize the digital image with a method specific to this method. The chaos degree formula is calculated to obtain chaos characteristics 値, and a statistical analysis is performed. The test method of the present invention is described as follows: < Test method > 1. The imaging unit (2) is mounted on the mobile imaging auxiliary unit (3), and the detected electronic display is obtained in a mobile or stationary manner ( 1) Display image. 1235821 2. The inspected electronic display can display different image modes (such as different colors, gray levels, etc.) according to the characteristics of the defects to be detected. 3. The image acquired by the image acquisition unit 'is digitized and transmitted to the disorder detection unit (5) through the image digitization unit 并, and the acquired image is processed according to the following procedure (as shown in Figure 2): a Divide all or part of the image into N processing areas (51) (as shown in Figure 5) b. In each processing area (51), the gray level of each pixel (Pixel) ) Read ίο c. In each processing area (51), bring all the pixel gray levels into the following formula for analyzing disorder: Σ)) *! = E① where

i=0〜K 15 ; Κ :於該區或(51)中,所有灰階(gray level)之範圍 ;1 ••某個灰階(gray level) ;Ρ(ι):於該區域(51)中,灰階(gray level)爲1之機率 ;E :該區ί:或(51)之 ''紛亂特性値〃 ;J :該處理區域(51)之代號 2〇 d.求得所有Ν個區域(51)之「紛筒L特性値」E(l)〜Ε(Ν) e. 於所有的紛亂特性値取得後,算出其統計分布、標準 差、變異數値 f. 將所有E(j)其値於所有統計分佈中距整體平均値超過某 特定標準差數量或其它統計方式之近似範圍之外者挑 1235821 出(如圖六所框出),其相對的缺陷區域(510)即被認定爲 有顯不品質異常者(如圖八所示) g·將數個相鄰的異常缺陷區域(510)連結成一個完整區域 即可準確的指出顯示品質異常處 5 4·將缺陷區域(510)顯示於電腦螢幕上或以網路傳輸出去, 顯示或傳輸內容如下: a.影像與分區網格以及每一網格之「紛亂特性値」(參考 圖五) b·缺陷區域(510)之缺陷影像(如圖八所示) ίο c.各區域紛亂特性値統計圖(如圖九所示) d·其他檢測人員所需之分析資料(圖未示) 綜上所述,以本方法檢測電子式顯示器之品質可產生 以下效益: 1.可達到自動化測試之目的。 l; 2.此方式模擬人眼對顯示品質的真實反應,因人並非單純 依靠灰階/亮度作顯示品質的反應亦與其於目視檢測當時 之狀況(如辨色能力、眼睛疲勞程度等)有關,可能造成 檢測結果的不穩定,而本方法可有效的避免顯示器本身 亮度分佈不均勻對一般檢驗邏輯所造成的大量誤判 2〇 (OVER KILL or SKIP)。 是以,本發明之測試方法乃確具其產業上之利用價値 而符合新發明專利之要件,爲此乃依法提出發明專利申請 之,懇請鈞局予以詳查並賜准專利’至感德便。 【圖式簡單說明】 10 1235821 ο 圖一係本發明實施例之硬體測試架構示意圖 圖二係本發明實施例以分析亂度之公式演算的流程圖。 圖三係本發明實施例被檢測之電子式顯示器螢幕外觀。 圖四係本發明實施例被檢測之電子式顯示器螢幕數位化後 5 的影像。 圖五係本發明實施例被檢測之電子式顯示器影像分區的紛 亂特性値顯示圖。 圖六係圖五之部份放大圖。 6]七係本發明貫施例超過可谷忍標準差範圍的區域標示圖。 1〇圖八係圖七之部份放大圖。 圖九係本發明實施例之各區域紛亂特性値統計圖。 圖號說明: • (1)·電子式顯示器⑵取像單元⑶移動取像輔助單元⑷影 像數位化單元(5)紛亂程度檢測單元(μ)處理區域(510)缺 15陷區域i = 0 ~ K 15; KK: the range of all gray levels in this area or (51); 1 •• a certain gray level; P (ι): in this area (51 ), The probability that the gray level is 1; E: the area ί: or (51) the `` chaotic characteristics ''; J: the processing area (51) code 20d. Find all N E (l) ~ E (N) of the "different tube L characteristics" of each area (51) e. After obtaining all the chaotic characteristics, calculate its statistical distribution, standard deviation, and number of variations 値 f. j) It is selected from all statistical distributions that are outside the approximate range of the number of standard deviations or other statistical methods outside the approximate range of a certain standard deviation, and is selected by 1235821 (framed in Figure 6). Its relative defect area (510) is Those who are identified as having abnormal quality (as shown in Figure 8). G · Several adjacent abnormal defect areas (510) can be combined into a complete area to accurately indicate the abnormal quality of the display. 5 4 · Defective areas (510) It is displayed on the computer screen or transmitted over the network. The displayed or transmitted content is as follows: a. The image and partition grids and the “chaotic characteristics” of each grid (refer to Figure 5) b. Defective image of defect area (510) (as shown in Figure 8) ίο c. Disturbance characteristics of each area 値 Statistical chart (as shown in Figure 9) d. Analysis data required by other inspectors (not shown in the figure) As mentioned, testing the quality of the electronic display with this method can produce the following benefits: 1. The purpose of automated testing can be achieved. l; 2. This method simulates the real response of the human eye to the display quality, because the person does not simply rely on the grayscale / brightness to respond to the display quality. It is also related to the situation at the time of visual inspection (such as color discrimination, eye fatigue, etc.) This may cause the instability of the detection result, and this method can effectively avoid a large number of misjudgments caused by the uneven brightness distribution of the display itself to the general inspection logic 2 (OVER KILL or SKIP). Therefore, the test method of the present invention does have its industrial utilization price and meets the requirements for a new invention patent. To this end, an application for an invention patent is filed in accordance with the law. . [Schematic description] 10 1235821 ο Figure 1 is a schematic diagram of the hardware test structure of the embodiment of the present invention. Figure 2 is a flowchart of the calculation of the embodiment of the present invention by analyzing the disorder formula. FIG. 3 is a screen appearance of an electronic display screen tested according to an embodiment of the present invention. FIG. 4 is an image of a digital screen of an electronic display screen detected according to an embodiment of the present invention. FIG. 5 is a diagram showing the chaotic characteristics and display of the image partition of the electronic display detected in the embodiment of the present invention. Figure 6 is an enlarged view of part of Figure 5. 6] Seven series of area maps of the embodiments of the present invention that exceed the tolerance range of the valley tolerance. Fig. 10 is an enlarged view of part of Fig. 7. FIG. 9 is a statistical chart of chaotic characteristics of various regions according to an embodiment of the present invention. Explanation of drawing numbers: • (1) · Electronic display⑵Acquisition unit ⑶Mobile acquisition auxiliary unit⑷Image digitization unit (5) Disturbance detection unit (μ) Processing area (510)

Claims (1)

1235821 申請專利範圍 1. 一種以亮度分佈的紛亂程度做爲電子式顯示器之顯示品 質測試方法,係藉由取像單元取得欲檢測之電子式顯示 器的影像模式,透過影像數位化單元將之數位化並傳輸 5 至紛亂程度檢測單元中依下列程序處理前述取得的影像: a. 將影像之全部或部份區分成N個處理區域; b. 於每一個處理區域中,將每一個畫素(puel)之灰階(gray level)讀出; c. 於每一個處理區域中,將所有的畫素灰階帶入以下分 ίο 析亂度之公式: Σ_)*ι = Ε(〇 其中 1=0 〜Κ ;Κ :於該區域中,所有灰階(gray level)之範圍 15 ; i :某個灰階(gray level) ;Ρ(ι):於該區域中,灰階(gray levels i之機率 ;E :該區域之紛亂特性値〃 ;J :該處理區域之代號 d. 求得所有N個區域之「紛亂特性値」E(l)〜E(N); 2〇 e.於所有的紛亂特性値取得後,算出其統計分布、標準 差、變異數値; f.將所有E①其値於所有統計分佈中距整體平均値超過某 特定標準差數量或其它統計方式之近似範圍之外者特 別挑出,其相對的區域即爲有瑕疵之缺陷區域而被認 12 1235821 定爲有顯示品質異常者; g.將數個相鄰的異常缺陷區域連結成一個完整區域即可 準確的指出顯示品質異常處者。 1如申請專利範圍第1項所述之以亮度分佈的紛亂程度做爲 5 電子式顯示器之顯示品質測試方法,其中該取像單元係 可爲電子顯微攝影機(CCD)以攝取電子式顯示器各個區 域、各個不同的影像模式(image pattern)作爲資料分析的 來源者。 3.如申請專利範圍第1項所述之以亮度分佈的紛亂程度做爲 參 10 電子式顯示器之顯示品質測試方法,其中該其中該取像 早兀係可爲數位攝影機(CMOS)以攝取電子式顯示器各個 區域、各個不同的影像模式(image pattern)作爲資料分析 · 的來源者。 4·如申請專利範圍第1項所述之以亮度分佈的紛亂程度做爲 15 電子式顯不器之顯不品質測試方法,其中該影像數位化 單元係包括有一影像擷取卡可將由取像單元所取得之影 φ 像數位化後傳輸至紛亂程度檢測單元 5.如申請專利範圍第1項所述之以亮度分佈的紛亂程度做爲 電子式顯示器之顯不品質測試方法,其中該紛亂程度檢 2〇 測單元係可爲由電腦以預定之電腦軟體來操作處理。 、 6·如申請專利範圍第1項所述之以亮度分佈的紛簡L程度做爲 ·. 電子式顯示器之顯不品質測試方法,其中當該欲檢測之 · 電子式顯示器的面積大於取像單元所攝取的區域面積 時,可利用一移動取像輔助單元將取像單元移動至不同 13 1235821 的位置攝取影像,該移動取像輔助單元則係可爲一 XY平 台(XY stage)及移動控制(motion control)的裝置者。 7. 如申請專利範圍第1項所述之以亮度分佈的紛亂程度做爲 電子式顯示器之顯示品質測試方法,其中該被檢測之電 5 子式顯示器係可視所欲檢出的缺陷品質不良須求而顯示 不同的色彩、灰階之亮點、暗點或水波紋(MURA)等部份 或全部區域瑕疵的影像模式者。 8. 如申請專利範圍第1項所述之以亮度分佈的紛亂程度做 爲電子式顯示器之顯示品質測試方法,其中該紛亂程度 ίο 檢測單元所取得之缺陷區域的影像可顯示於電腦螢幕 上,其顯示內容係可爲影像與分區網格以及每一網格之 1 分亂特性値」、缺陷區域之缺陷影像、經電腦處理分析 之各區域紛亂特性値統計圖與其他檢測人員所需之分析 資料者。 15 9.如申請專利範圍第1項所述之以亮度分佈的紛亂程度做 爲電子式顯示器之顯示品質測試方法,其中該紛亂程度 檢測單元所取得之缺陷區域的影像亦可藉網路傳輸出 去,其傳輸內容可爲影像與分區網格以及每一網格之「紛 亂特性値」、缺陷區域之缺陷影像、經電腦分析後之各區 20域紛亂特性値統計圖與其他檢測人員所需之分析資料 者。1235821 Patent application scope 1. A display quality test method that uses the degree of disorder of the brightness distribution as an electronic display. The image mode of the electronic display to be detected is obtained by the image acquisition unit and digitized by the image digitization unit. And transmit 5 to the chaos level detection unit to process the aforementioned images according to the following procedures: a. Divide all or part of the image into N processing areas; b. In each processing area, divide each pixel (puel ) Gray level reading; c. In each processing area, bring all the pixel gray levels into the following analysis formula: Σ _) * ι = Ε (〇where 1 = 0 ~ K; K: in this area, the range of all gray levels (gray level) 15; i: a certain gray level (gray level); P (ι): in this area, the probability of gray levels (gray levels i) ; E: chaotic characteristics of the area 値 〃; J: code of the processing area d. Find the "chaotic characteristics" of all N areas E (l) ~ E (N); 2〇e. In all chaos After the characteristic 値 is obtained, calculate its statistical distribution, standard deviation, and variation number 値; f. Specially select all E① whose average distance from the overall distribution in all statistical distributions exceeds a certain standard deviation or an approximate range of other statistical methods, and the relative area is recognized as a defective area with defects. 12 1235821 is determined to have abnormal display quality; g. Several adjacent abnormal defect areas are connected to form a complete area to accurately indicate the abnormal display quality. 1 According to the scope of the patent application, the brightness is described in item 1. The degree of disorder of the distribution is used as the display quality test method of 5 electronic displays. The imaging unit can be an electronic micro-camera (CCD) to capture various areas of the electronic display and different image patterns as data. The source of the analysis. 3. As described in item 1 of the scope of the patent application, the turbulence of the brightness distribution is used as a reference to the display quality test method of the electronic display, wherein the image capturing system can be a digital camera ( CMOS) takes various areas of the electronic display and different image patterns as the source of data analysis. 4. As described in item 1 of the scope of the patent application, the disorder quality of the brightness distribution is used as the display quality test method of the 15 electronic display, wherein the image digitizing unit includes an image capture card, The shadow φ image obtained by the unit is digitized and transmitted to the chaos level detection unit. 5. The chaos level of the brightness distribution is used as a method for measuring the quality of the display of an electronic display, as described in item 1 of the scope of the patent application, where the chaos level The testing 20 testing unit can be operated by a computer with predetermined computer software. 6, 6. As described in item 1 of the scope of the patent application, the degree of brightness distribution of the electronic display is used as the test method for the display quality of the electronic display, wherein when the area of the electronic display to be detected is larger than the image taken When the area of the area captured by the unit, a moving imaging auxiliary unit can be used to move the imaging unit to a different position of 13 1235821 to capture the image. The moving imaging auxiliary unit can be an XY stage and movement control. (motion control). 7. As described in item 1 of the scope of the patent application, the disorder degree of the brightness distribution is used as the display quality test method of the electronic display, in which the detected electronic 5 sub-display is defective and must be detected according to the quality of the defect. Those who want to display different colors, grayscale bright points, dark points, or water ripples (MURA), such as some or all areas of the image mode defects. 8. As described in item 1 of the scope of the patent application, the degree of disorder of the brightness distribution is used as the display quality test method of the electronic display, wherein the degree of disorder ο The image of the defect area obtained by the detection unit can be displayed on a computer screen. Its display content can be the image and partition grids and the 1 chaos characteristic of each grid 値 '', the defect image of the defective area, the chaotic characteristics of each area after computer processing and analysis, the statistical map and the analysis required by other inspectors Profiler. 15 9. As described in Item 1 of the scope of the patent application, the disorder of the brightness distribution is used as the display quality test method of the electronic display, wherein the image of the defect area obtained by the disorder detection unit can also be transmitted through the network. , Its transmission content can be the image and partition grids and the "disorder characteristics" of each grid, the defect image of the defect area, the 20-region chaos characteristics of each area after computer analysis, statistical maps and other inspection personnel required Analyst.
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