TWI232946B - Measuring method of the driving circuit - Google Patents

Abstract

A measuring method of the driving circuit is provided. The driving circuit can drive the display and comprises a scan line circuit and a data line circuit. Wherein, the start terminal of every scan line is coupled to the scan line circuit. In the measuring method, every scan line is coupled to the first testing pad and every data line is coupled to the second testing pad. And then, a first testing signal is transmitted to a input of the scan line circuit and a second testing signal is transmitted to a input of the data line circuit. Afterward, we can understand that all of the device of the scan line circuit and the data line circuit are good or bad after measured the first testing pad and the second testing pad.

Description

1232946 V. Description of the invention (1) Field of the invention The present invention relates to a measurement method for a driving circuit, and more particularly to a measurement for a driving circuit that can measure whether all components in the driving circuit are good or not. method. Prior art The earliest moving images that humans can see are documentary-type movies. Later, the invention of the cathode ray tube (Cat h o d e Ra y T ube, abbreviated as C R T) succeeded in deriving a commercial television and becoming an essential household appliance for every household. With the development of science and technology, the application of CRTs has been extended to desktop monitors in the computer industry, which has made CRT landscapes for decades. However, all types of displays made by CRTs face the problem of radiation, and because of the internal electronic grab structure, the display is bulky and takes up space, which is not conducive to thinness and lightness. Because of the above problems, researchers have started to develop so-called flat panel displays (F 1 a t P a n e 1 D i s p 1 a y). This field includes liquid crystal displays (Liquid Crysta 1 D isp 1 ay, LCD for short), Field Emission Display (FED), Organic Light Emitting Diode (OLED), and plasma Display Panel (Plasma Display Panel, PDP for short). Among them, the liquid crystal display is the most eye-catching and has the characteristics of thinness, light weight, small, medium and large, and it is in line with modern and future generations of portable wireless communication and network technology. For Thin Film Transistor (TFT) LCD, it can be further divided into amorphous silicon LCD and polycrystalline silicon according to materials.

10504TWF.PTD Page 6 1232946 V. Description of the invention (2) Shixi LCD two categories. In recent years, low temperature polycrystalline silicon (LTPS) LCDs have been successfully developed. For the current LTps-LCj), since the driving circuit is located outside the daylight, how to measure whether all the components in the driving circuit are good or not becomes an important issue in measurement. Please refer to FIG. 1 for a description of a daylight element array (a r r a y) and a driving circuit using a conventional driving circuit ^ f measurement method. It can be seen from the first figure that the driving circuit includes a scanning line driving circuit 10 and a data line horse, and a moving circuit 104, and the day element array 106 includes several scanning lines 〇〇8, several = H 良11 〇, and pre-charge circuit 1 1 2. The scanning line driving circuit 102 includes a shift register (114, 116), a gate 118, and a buffer circuit (not shown). The data line driving circuit 104 includes a shift register (122, 122'124), and a phase arrangement circuit (phase arrangement).

Circuit (referred to as PAC) 126, gate 1 28, and horizontal switch 130. Next, the measurement method of the conventional driving circuit will be described with reference to FIG. For the scanning line driving circuit 1 02, a pulse signal is transmitted to the input terminal of the scanning line driving circuit 1 02 (that is, the input terminal of the shift register 丨 4). Measurement of the output end of the driving circuit 1 〇2 (ie, the output end of the shift register 1 16). If the output signal is measured at the output end of the shift register 丨 6, it means that the scanning line is driven The circuit 2 is good, and if no output signal is measured at the output end of the shift register 116, it indicates that the scanning f driving circuit 102 is damaged. Similarly, for the data line drive circuit 104, the pulse signal is transmitted to the input end of the data line drive circuit 104 (that is, the input of the shift register 120), and then the data line drive circuit 1 〇4 output terminal measurement (ie the output of the shift register 1 2 4), if the shift register

10504TWF.PTD Page 7 1232946 V. Description of the invention (3) When the output signal of the memory 1 2 4 is measured, it indicates that the data line drive circuit 1 0 4 is good, and if the shift register 1 2 4 If no output signal is measured at the output end, it means that the data line drive circuit 104 is damaged. It can be known from the above that the conventional measurement method of the driving circuit has at least the following disadvantages: (1) When the test results of the scanning line driving circuit 102 and the data line driving circuit 104 are good, it only indicates the scanning line The shift register (114-116'120-124) in the drive circuit 1 〇2 and the data line drive circuit 104 is good, but the scan line drive circuit 1 〇2 and the data line drive circuit 104 cannot be guaranteed. Other circuit components are good. (2) When the test results of the scanning line driving circuit 102 and the data line driving circuit 104 are damaged, it is not possible to know what is in the scanning line driving circuit 1 02 and the data line driving circuit 104. Damaged circuit components. (3) Because the conventional measurement method of the driving circuit does not measure all the circuit components in the driving circuit, there will be many unknown line defects or point defects during the daytime test. SUMMARY In view of this, the present invention provides a method for measuring a driving circuit. The present invention couples each scan line and each data line to a first test pad and a second test pad, respectively. Then, the first test signal and the second test signal are respectively transmitted to the input terminal of the scanning line driving circuit and the input terminal of the lean line driving circuit. After that, measurement is performed on the first test pad and the second test pad, and it can be known whether all the circuit elements in the scanning line driving circuit and the data line driving circuit are good. To achieve the above and other objectives, the present invention provides a driving circuit

10504TWF.PTD Page 8 1232946 V. Description of the invention (4) Measurement method. The driving circuit includes a scanning line driving circuit and a data line driving circuit for driving the display. The display includes several scanning lines and several data lines. The start end of each scan line is coupled to the scan line drive circuit, and the start end of each data line is coupled to the data line drive circuit. In this measurement method, each scan line and each data line are first coupled to a first test pad and a second test pad, respectively. Then, the first test signal and the second test signal are sent to the input end of the scan line drive circuit and the input end of the data line drive circuit, respectively. The first test signal is transmitted through the scan line drive circuit and each scan line. The signal is transmitted to the first test pad, and the second test signal is transmitted to the second test pad through the lean line driving circuit and the mother-lean line. After that, make measurements on the first test pad and the second test pad. In the embodiment of the present invention, when each scan line is not coupled to a circuit, there is a diode, and the two-pole system is located between each scan line and the first test pad. The anode of the diode is coupled to each scan line, and the anode of the diode is coupled to the first test pad. In a preferred embodiment of the present invention, when each scan line is coupled to a circuit, one end of the circuit is coupled to the first test pad. In the embodiment of the present invention, when each data line is not coupled to a circuit, there is a diode, and the two-pole system is located between each data line and the second test pad. The anode of the diode is coupled to each data line, and the anode of the diode is coupled to the second test pad. In a preferred embodiment of the present invention, when each data line is coupled to a circuit, one end of the circuit is coupled to the second test pad.

10504TWF.PTD Page 9 1232946 V. Description of the Invention (5) In the preferred embodiment of the present invention, when the current on the first test pad and the second test pad is to be measured, the current is measured using an ammeter. When you want to measure the voltage on the first test pad and the second test pad, use a voltmeter to measure. In a preferred embodiment of the present invention, the first test signal and the second test signal are a pulse signal, a voltage signal, or a current signal. In a preferred embodiment of the invention, the display is a liquid crystal display. In summary, the present invention provides a measurement method for a driving circuit. The present invention couples each scanning line and each data line to the first test pad and the second test pad, respectively. Then, the first test signal and the second test signal are respectively transmitted to the input terminal of the scanning line driving circuit and the input terminal of the data line driving circuit. After that, measurement is performed on the first test pad and the second test pad, and it can be known whether all circuit elements in the scanning line driving circuit and the data line driving circuit are good. In order to make the above and other objects, features, and advantages of the present invention more comprehensible, the following describes the preferred embodiment in detail with the accompanying drawings, and the detailed description is as follows: Please refer to FIG. 2 for the actual fe method. It is a schematic diagram of a pixel array and a driving circuit using a measuring method of a driving circuit according to a preferred embodiment of the present invention. It can be seen from FIG. 2 that the driving circuit includes a scanning line driving circuit 202 and a data line driving circuit 204 for driving a display (such as a liquid crystal display). And in the display, there is a daylight array 206, a daylight array 206 package

10504TWF.PTD Page 10 1232946 V. Description of the invention (6) Includes several scanning lines 2 0 8, several data lines 2 1 0, and pre-charging circuit 2 1 2. The scanning line driving circuit 202 includes a shift register (2 1 4, 2 1 6), a gate 2 8 and a buffer circuit (not shown). The data line driving circuit 2 0 4 includes a shift register (2 2 0, 2 2 2, 2 2 4), a phase configuration circuit 2 2 6, a gate 2 2 8, and a horizontal switch 2 3 0. In addition, the start end of each scan line 208 is coupled to the scan line drive circuit 202, and the start end of each data line 2 10 is coupled to the data line drive circuit 204. Next, the measurement method of the driving circuit of the present invention will be described with reference to FIG. 2. In this measurement method, each scan line and each data line are first coupled to a first test pad and a second test pad, respectively. For the scanning lines, when each scanning line is not coupled to a circuit, there is a diode. The two-pole system is located between each scanning line and the first test pad. The positive electrode is coupled to each scan line, and the negative electrode of the diode is coupled to the first test pad. When each scan line is coupled to a circuit, one end of the circuit is coupled to the first test pad. A test pad. For the data lines, when each data line is not coupled to a circuit, there is a diode. This diode system is located between each data line and the second test pad, and the anode system of the diode is Is coupled to each data line, and the anode of the diode is coupled to the second test pad; and when each data line is coupled to a circuit, one end of the circuit is coupled to the second test pad pad. In the second figure, because each scan line 2 0 8 is not connected to a circuit, the female scan line 2 0 8 is coupled to the test pad 2 3 4 through the diode 2 3 2. Furthermore, since each scanning line 2 1 0 is coupled to the pre-charging circuit 2 1 2, the drain terminal of the pre-charging circuit 2 1 2 is coupled to the test pad 2 3 6 through the horizontal switch 2 3 0. In addition, for cooked

10504TWF.PTD Page 11 1232946 V. Description of the invention (7) For those skilled in the art, it should be known that Figure 2 is only an example of the scanning line and data line, and is an example of the connection method to the test pad. To limit the present invention, it can be done without departing from the scope of the patent application of the present invention. Next, the test signal 2 3 8 and the test signal 2 40 are transmitted to the input end of the scanning line driving circuit 202 (that is, the input end of the shift register 2 1 4) and the input end of the data line driving circuit. (Ie the input of the shift register 2 2 0). Among them, the test signal 2 3 8 is transmitted to the test pad 2 3 4 through the scan line driving circuit 202 and each scan line 208. The test signal 2 40 is transmitted to the test pad 2 3 6 through the data line driving circuit 204 and each data line 2 10. In addition, the test signal 2 38 and the test signal 2 40 may be a pulse signal, a voltage signal, or a current signal. After that, make measurements on the test pads 2 34 and 2 3 6 respectively. You can know the output signals measured on the test pads 2 3 4 and 2 3 6 Check whether all the components in the scanning line driving circuit 202 and the data line driving circuit 204 are in good condition. In addition, if you want to measure the current on test pad 2 3 4 and test pad 2 3 6, you can use an ammeter to measure it. If you want to measure the voltage of test pad 2 3 4 and test pad 2 3 8, you can use a voltmeter to measure. In summary, the advantages of the present invention are briefly described as follows: (1) It can be detected whether all the circuit elements in the cat line driving circuit and the lean line driving circuit are good. (2) When the test results of the scanning line driving circuit and the data line driving circuit are 4 Ω bad, it is possible to know the

10504TWF.PTD Page 12 1232946 V. Description of the invention (8) What kind of circuit element is damaged, so it can provide more analysis information and repair information. (3) Since the present invention can measure whether all the circuit elements in the driving circuit are good or not, during the day test, the line defect or the point defect can be known. Although the present invention has been disclosed above with a preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and retouches without departing from the spirit and scope of the present invention. The scope of protection of the invention shall be determined by the scope of the attached patent application.

10504TWF.PTD Page 13 1232946 Brief Description of Drawings Figure 1 shows a schematic diagram of a pixel array and a driving circuit using a conventional driving circuit measurement method; and Figure 2 shows the use of a driving circuit according to the present invention. A schematic diagram of a pixel array and a driving circuit of a measuring method of a driving circuit in a preferred embodiment. Schematic description: 1 02, 202 Sweeping Miao line horse circuit circuit 1 04, 204 data line drive circuit 1 06, 206 day element array 1 08, 208 scan line 110, 21 0 data line 112, 212 precharge Circuit 114 > 116, 120, 122, 124, 214, 216, 220, 222, 224 · Shift register 1 1 8, 1 2 8, 2 1 8, 2 2 8: Gate 1 2 6 2 2 6: Phase configuration circuit 1 3 0, 2 3 0: Horizontal switch 2 3 2: Diode 2 3 4, 2 3 6: Test pad 2 3 8, 2 4 0: Test signal

10504TWF.PTD Page 14

Claims (1)

1232946 6. Scope of patent application 1. A measuring method of a driving circuit, the driving circuit includes a scanning line driving circuit and a data line driving circuit for driving a display, the display includes a plurality of scanning lines and a plurality of data The starting end of each scanning line is connected to the scanning line driving circuit, and the starting end of each data line is connected to the data line driving circuit. The measuring method includes the following steps: Connect each of the scanning seedling lines and the mother-of-a-kind material lines to a younger test pad and a second test pad, respectively; send a first test signal and a second test signal to the The input terminal of the scanning line driving circuit and the input terminal of the data line driving circuit, wherein the test signal of the younger is transmitted to the first test welding via the scanning line driving circuit and the female and the hidden lines. Pad, and the second test signal is transmitted to the second test pad via the data line driving circuit and each of the data lines; and is performed on the first test pad and the second test pad, respectively. the amount Measurement. 2. The measurement method of the driving circuit as described in item 1 of the scope of patent application, wherein when each of these scanning lines is not coupled to a circuit, there is a diode, and the diode system is located at each of Between the scan lines and the first test pad. 3. The measuring method of the driving circuit as described in item 2 of the scope of patent application, wherein the anode of the diode is coupled to each of the scanning lines, and the anode of the diode is coupled to the First test pad. 4. The measuring method of the driving circuit as described in the first item of the patent application, wherein when each of the scanning lines is coupled to a circuit, one of the circuits is 10504TWF.PTD Page 15 1232946 6. Scope of patent application The end system is coupled to the first test pad. 5. The measurement method of the driving circuit as described in item 1 of the scope of the patent application, wherein when each circuit is not connected to a circuit, there is a diode, and the diode system is located at each Between the data lines and the second test pad. 6. The measuring method of the driving circuit as described in item 5 of the scope of patent application, wherein the anode of the diode is coupled to each of the data lines, and the anode of the diode is coupled to the first Two test pads. 7. The method for measuring a driving circuit as described in item 1 of the scope of patent application, wherein when each of the data lines is coupled to a circuit, one end of the circuit is coupled to the second test pad. 8. The measurement method of the driving circuit according to item 1 of the scope of patent application, wherein when the current on the first test pad and the second test pad is to be measured, a current meter is used for measurement. 9. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein when the voltages on the first test pad and the second test pad are to be measured, a voltmeter is used for measurement. 10. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein the first test signal and the second test signal are pulse signals. 11. The measuring method of the driving circuit according to item 1 of the scope of patent application, wherein the first test signal and the second test signal are a voltage signal. 12. Measurement method of driving circuit as described in item 1 of the scope of patent application 10504TWF.PTD Page 16 1232946 6. Patent application method, where the first test signal and the second test signal are a current signal. 13. The measuring method of the driving circuit as described in item 1 of the scope of the patent application, wherein the display is a liquid crystal display. 10504TWF.PTD Page 17