TWI227079B - Batch testing system and method for wireless communication devices - Google Patents

Batch testing system and method for wireless communication devices Download PDF

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TWI227079B
TWI227079B TW92131905A TW92131905A TWI227079B TW I227079 B TWI227079 B TW I227079B TW 92131905 A TW92131905 A TW 92131905A TW 92131905 A TW92131905 A TW 92131905A TW I227079 B TWI227079 B TW I227079B
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test
signal
item
batch
wireless communication
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TW92131905A
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TW200516892A (en
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Yi-Ru Liou
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Accton Technology Corp
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Abstract

The present invention provides a batch testing system and method that applies a single shielded anechoic chamber to simultaneously test multiple wireless communication devices. The shielded anechoic chamber can avoid external electromagnetic interference, reduce the strength of reflected signal significantly and provide stable channel environment, thereby testing the signal transceiving of the wireless communication devices more precisely. The present invention also provides an advantageous design for the batch container and loading mechanism within the chamber to upgrade the testing efficiency.

Description

1227079 五、發明說明(1) 【發明所屬之技術領域】 本發明係有關於一種用於無線通訊裝置之批次測試系 統及方法,尤指一種於電波暗室(shielded anechoic chamber)内同時測試多個無線通訊裝置的測試系統及方 法0 【先前技術】 ,行動電話 local area 線通訊裝置, (access 暗室中測試產 放置一個裝置 則整個測試過 上(包括電波 正在測試的裝 非常缺乏效 時測試多個裝 此舉又會增加 成本。因此, 成本測試的廠 模式(cable 裝置進行批次 近年來’隨著無線通訊技術的突飛猛進 (mobile phone)與無線區域網路(wireless network ; WLAN)的應用也日益普遍。對於無 如行動電活、無線網路介面卡、無線橋接器 Point)等等的製造廠商而言,一般常在電波 品的訊號收發。不過,其測試方式是一次只 ::波暗室内,如果有許多產品等待測試? 二室J九花費許多時間在待測裝置的安裝 測裝置的接線等),且除了 ί若=待測裝置就處於閒置狀態,如此 右心進仃批次測試(batch tes ,則需要增設多個電波 : 測試成本,包含設借至才此達成,但 :於需要對大量無線通訊::二操作人力的 商而j,前述的測試方式是:==、低 ⑽進一行種常第=次測試… 第1圖係以電欖模式對無線通訊 βιιιβ, 12270791227079 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a batch test system and method for wireless communication devices, particularly a method for testing multiple devices in a shielded anechoic chamber at the same time. Wireless communication device testing system and method 0 [Prior art], mobile phone local area line communication device, (access test room in a dark room, put a device, then the entire test (including the installation being tested by radio waves is very lack of time to test multiple Installing this will increase costs. Therefore, the cost-tested factory mode (cable devices have been batched in recent years' with the rapid advancement of wireless communication technology (mobile phone) and wireless network (wireless network; WLAN) applications have also been increasing Generally. For manufacturers that do not have mobile power, wireless network interface card, wireless bridge Point, etc., they usually send and receive signals on radio products. However, the test method is only one time :: wave dark room If there are many products waiting to be tested? The second room J9 spends a lot of time in the installation test of the device under test. Installation, etc.), and if ί = the device under test is in an idle state, so right heart is used for batch testing (batch tes, you need to add multiple radio waves: the test cost, including the installation until the loan is reached, but : For the need for a large number of wireless communications :: two operators of manual labor, the aforementioned test method is: ==, low-level advancement of a line of tests = the first test ... Figure 1 shows the wireless communication in electric mode βιιιβ, 1227079

測試的 導訊號 接到切 哪個裝 產生裝 經由切 裝置14 並監測 藉以測 備進行 發,排 供完整 方塊圖。 的傳遞。 換器1 3及 置1 4來接 置11及一 換器1 3將 ,以測試 控制單元 試待測裝 批次測試 除了待測 且可靠的 圖中,係利用一個二對N的切換器丨3來引 圖中亦包含有N個待測裝置丨4,i :控制單元15。控制單元15是用來控制由 收/發射訊號。另外,圖中還包含一訊號 訊:虎監測裝置12,前者可產生測試訊號, 測試訊號傳送至控制單元丨5所選取的待測 裝置的接收功能;後者則從切換器丨3接收 1 5選取的待測裝置丨4所發射之測試訊號, 置的發射功能。此種方式雖能以同一套設 ,但由於採取電纜模式來模擬訊號的收 無線通訊裝置之天線,因而難以為產品提 測試報告。 有鑑於此,本發明即提出一種批次測試系統及方法, 不但可避免前述以電纜模式進行批次測試的缺陷,又能以 較低成本同時進行多個無線通訊設備的測試,以提昇測試 效率。 【發明内容】 本發明係藉由單一電波暗室來進行批次測試,電波暗 室除了可避免外界的電磁干擾(electromagnetic interference ; EMI)外,因其内壁係由特殊材質製成,訊 號傳至内壁,大部分的能量均被吸收,所以反射訊號的強 度可降至最低,可避免多重路徑效應造成傳播訊號之不穩 定,如此可較精確地測試無線通訊裝置之訊號收發。本發The pilot signal of the test is received, which device is generated, the device is passed, and the device 14 is monitored, and the monitoring device is used to send the test device. A complete block diagram is provided. Of delivery. Switch 1 3 and 1 4 are used to connect 11 and 1 switch 1 3. The test control unit is used to test the test batch. In addition to the test and reliable diagram, a two-to-N switch is used. Reference number 3 also includes N devices under test 丨 4, i: control unit 15. The control unit 15 is used to control the signals transmitted / received. In addition, the picture also contains a signal: Tiger monitoring device 12, the former can generate a test signal, and the test signal is transmitted to the receiving function of the device under test selected by the control unit 5; the latter is received from the switch 3 and selected by 15 The test signal transmitted by the device under test 4 is set to transmit function. Although this method can be set in the same set, it is difficult to provide a test report for the product because the cable mode is used to simulate the antenna of the signal receiving wireless communication device. In view of this, the present invention proposes a batch testing system and method, which can not only avoid the aforementioned defects of performing batch testing in a cable mode, but also can simultaneously test multiple wireless communication devices at a lower cost to improve testing efficiency. . [Summary of the Invention] The present invention uses a single anechoic chamber for batch testing. In addition to avoiding electromagnetic interference (EMI) from the outside, the anechoic chamber is made of a special material and the signal is transmitted to the inner wall. Most of the energy is absorbed, so the strength of the reflected signal can be minimized, which can avoid the instability of the propagation signal caused by the multi-path effect, so that the signal transmission and reception of the wireless communication device can be tested more accurately. The hair

1227079 五、發明說明(3) ' 明亦運用電波暗室内之批次容器及其安裝機構的特殊設 計,以利於多個無線通訊裝置的批次測試,提昇測含式岐 率。 因此,本發明之主要目的,係提供一種用於無線通訊 裝置之批次測試系統’其包含:用以產生第一測試訊號之 一訊號產生裝置;一收發單元,設置於一電波暗室 A (shielded anechoic chamber),並麵接至訊號產生裝 置,用以發射第一測試訊號;以及複數個待測無線通訊裝 置,設置於該電波暗室中’用以接收收發單元發射之第一 測試訊號,並發射複數個第二測試訊號至收發單元。此批 次測試系統還包含一訊號監測裝置,耦接至收發單元,用 以監測收發單元所接收之第二測試訊號。電波暗室内設有 一批*次容器(batch container),以承載這些待測通訊裝 置,並利用一窗型或抽屜型機構置入該電波暗室。 本發明之次一目的’係提供一種用於無線通訊裝置之 批次測試方法,其包含:將複數個無線通訊裝置置於一電 波暗室中;產生第一測試訊號;使一收發單元發射第一測 试訊號;使該些無線通訊裝置接收第一測試訊號;分析該 些無線通訊裝置所接收之第一測試訊號;使該些無線通訊 裝置發射複數個第二測試訊號;使收發單元接收該些第二 測試訊號;以及監測收發單元所接收之該些第二測試訊 號。 本發明還提供另一種批次測試方法,其包含:將複數 個無線通訊裝置置於一電波暗室中;從該些無線通訊裝置1227079 V. Description of the invention (3) The Ming also uses the special design of the batch container and its installation mechanism in the anechoic chamber to facilitate the batch test of multiple wireless communication devices and improve the inclusive rate. Therefore, the main object of the present invention is to provide a batch test system for a wireless communication device, which includes: a signal generating device for generating a first test signal; a transceiver unit, which is disposed in an anechoic chamber A (shielded anechoic chamber), and is connected to the signal generating device to transmit the first test signal; and a plurality of wireless communication devices to be tested are arranged in the anechoic chamber to receive the first test signal transmitted by the transceiver unit and transmit The plurality of second test signals are sent to the transceiver unit. The batch test system also includes a signal monitoring device coupled to the transceiver unit to monitor the second test signal received by the transceiver unit. A batch container is set in the anechoic chamber to carry the communication devices under test, and a window-type or drawer-type mechanism is used to place the anechoic chamber. A second objective of the present invention is to provide a batch test method for wireless communication devices, which includes: placing a plurality of wireless communication devices in an anechoic chamber; generating a first test signal; and causing a transceiver unit to transmit a first Test signals; enable the wireless communication devices to receive the first test signal; analyze the first test signals received by the wireless communication devices; cause the wireless communication devices to transmit a plurality of second test signals; and enable the transceiver unit to receive the A second test signal; and monitoring the second test signals received by the transceiver unit. The present invention also provides another batch testing method, which includes: placing a plurality of wireless communication devices in an anechoic chamber; and from the wireless communication devices

第8頁 1227079 五、發明說明^ -----------_____ 中選取一發射組與一 無線通訊裝置發射筏收組之無線通讯裝置;使發射組之 裝置接收該测試气〇少一測試訊號;使接收組之無線通訊 接收之測試訊|虎^ ;以及分析接收組之無線通訊裝置所 為使 責審杳春《 認同,茲配貝對於本發明能有更進一步的了解與 己口圖式詳述本發明的實施方式如后。 【實施方式】 本節將以具體皆 統及方法的每广方I轭例,詳細說明本發明之批次測試系 較佳實施例I:圖式。第2圖係本發明之批次測試系統的 數個無線通訊^ ^巾’批次測試系·係用以測試複 線電話箄。^ Γ 如無線網路介面卡、無線橋接器、無 =第;,,ί:測試系統20包含-訊號產生裝置21,用以 置£1可Θ ^ ί ^唬。為獲致較佳的測試效果,訊號產生裝 ί* _通訊裝置之-精選樣场心 & ’m、特性尚度符合待測裝置所應遵循之技術標準 而產生的訊號品質較佳且合乎測試需求。此 外,亦可使用一向量訊號產生1(vect〇r signal = nerator),或更搭配一功率放大器(p〇wer ampiifier) 作為訊號產生裝置21,可因應需要產生更精確、更多樣 巧成號。 批次測試系統20還包含一電波暗室24,可隔絕外部之 礤干擾,並降低訊號於其内部傳播時之反射效應。電波 β室24内部設置一收發單元241,其包含一天線或天線陣 1227079 五、發明說明(5) 列’輕接至訊號產生裝置21,以用於發射第一測試訊號。 待測的無線通訊裝置則接收收發單元241所發射之第一測 試訊號,並發射複數個第二測試訊號至收發單元241。在 第2圖之實施例中,電波暗室24係為角錐形(pyramidal), 而收發單元241則置於角椎體之頂端,如此可比一般立方 體形(cubical)的電波暗室具有更大的靜音區(quiet z^ne)。靜音區係因電波暗室24本身的特性而產生,在此 區域内’由收發單元241發射的訊號,除了從收發單元241 至待測裝置之直接路徑(即未經反射的直接路徑)所傳輸的 部分外,其餘間接路徑的反射訊號皆會降至最低。將待測 裝置放置於此靜音區内,可獲得較佳的測試效果。 電波暗至24内還具有一批次容器(batch container) 2 4 2以承載待測裝置。在第2圖之實施例中,批次容器 242係一方形容器,具有方形格狀隔間,以放置待測無線 通訊裝置。收發單元241之天線的軸心(b〇resight),”則保 持對準此方形之批次容器242的正中央。在另一實施例 中’批次容器為一環形容器,具有扇形的隔間,用以放置 待測無線通訊裝置,如第3圖所示。此時,收發單元241之 ^線軸心係保持對準環形批次容器之圓心,或對準一扇形 隔間,例如此扇形隔間之形心,待此隔間内之裝置測試完 畢,再旋轉此環形批次容器,以將天線軸心對準下一隔 間’依此方式來進行測試。 批次測試系統2〇更提供待測裝置之安裝機構的設計, 如第4A與4B圖所示。第4A圖係批次容器242利用一窗型機Page 8 1227079 V. Description of the invention ^ -----------_____ Select a wireless communication device of a transmitting group and a wireless communication device to transmit the raft receiving group; make the device of the transmitting group receive the test gas 〇 Less than one test signal; Test message for wireless communication received by the receiving group | Tiger ^; and analysis of the wireless communication device of the receiving group for reviewing Hunchun's "I agree, hereby have a better understanding of the present invention and Embodiments of the present invention are described in detail in the following drawings. [Embodiment] This section will detail the batch test system of the present invention with a detailed example of each system and method. Example I: Schematic. FIG. 2 is a view of a plurality of wireless communication devices of the batch test system of the present invention. The batch test system is used to test a multi-line telephone. ^ Γ such as wireless network interface card, wireless bridge, none =,;,: The test system 20 includes a -signal generating device 21, which is used to set £ 1 to Θ ^ ί ^^. In order to obtain better test results, the signal generator is equipped with a __communication device-selected sample field center & 'm, the characteristics are still in line with the technical standards that the device under test should produce. The signal quality is better and meets the test. demand. In addition, a vector signal can be used to generate 1 (vect〇r signal = nerator), or a power amplifier (pοwer ampiifier) can be used as the signal generating device 21, which can generate more accurate and more clever signals as required. . The batch test system 20 also includes an anechoic chamber 24, which can isolate external radon interference and reduce the reflection effect of the signal when it propagates inside. A transmitting / receiving unit 241 is provided inside the radio wave β chamber 24, which includes an antenna or an antenna array 1227079 V. Description of the invention (5) Column 'is lightly connected to the signal generating device 21 for transmitting a first test signal. The wireless communication device to be tested receives the first test signal transmitted from the transceiver unit 241, and transmits a plurality of second test signals to the transceiver unit 241. In the embodiment shown in FIG. 2, the anechoic chamber 24 is pyramidal, and the transceiver unit 241 is placed on the top of the vertebral body, so that it can have a larger silent area than a general anechoic chamber. (Quiet z ^ ne). The mute area is generated by the characteristics of the anechoic chamber 24. In this area, the signals transmitted by the transceiver unit 241 are transmitted in addition to the direct path from the transceiver unit 241 to the device under test (that is, the direct path without reflection). Except for some, the reflection signals of other indirect paths will be minimized. Placing the device under test in this quiet zone can achieve better test results. The radio wave has a batch container 2 4 2 within 24 to carry the device under test. In the embodiment of Fig. 2, the batch container 242 is a square container with a square grid-shaped compartment for placing the wireless communication device to be tested. The axis of the antenna of the transceiver unit 241 (boresight) is kept aligned with the center of the square batch container 242. In another embodiment, the 'batch container is a ring container with a fan-shaped compartment. , Used to place the wireless communication device under test, as shown in Figure 3. At this time, the center of the spool of the transceiver unit 241 is kept aligned with the center of the circular batch container or aligned with a sector, such as this sector The centroid of the compartment, after the testing of the devices in this compartment is completed, then rotate the circular batch container to align the antenna axis with the next compartment 'to perform the test in this way. Batch test system 20 more Provide the design of the installation mechanism of the device under test, as shown in Figures 4A and 4B. Figure 4A shows the batch container 242 using a window type machine

1227079 五、發明說明(6) -- 構置入電波暗室24之示意圖。第4B圖則為批次容哭242利 用一抽屜型機構置入電波暗室24之示意圖。利用^述兩種 安裝機構,可方便快速地一次安裝多個待測裝置,以 測試時間。 第2圖中’批次測試系統2 〇還具有一訊號監測裝置 22,耦接至收發單元241,用以分析收發單元241所接收之 第二測試訊號。因應不同測試項目的需求,訊號監測裝置 22可採用不同的儀器設備,如向量訊號分析儀 signal analyzer)&功率計,或是頻譜分析儀(spectrum analyzer)等。此外,亦可使用待測通訊裝置之精選樣本 (Gold Sample),作為訊號監測裝置22。 批次測試系統22利用一控制單元25,如個人電腦或工 作站(work station),將其耦接至訊號產生裝置21、訊號 監測裝置2 2及待測裝置,以分別控制第一測試訊號的產 生、第二測試訊號的監測及發射。控制單元25亦可執行相 關的分析軟體,以進行測試訊號的分析。在前述使用環形 ,^容器之實施例中,控制單元25更可耦接至此環形批二^ 容器,以控制其旋轉幅度。批次測試系統25還運用一多工 =2 3,耦接至控制單元2 5,且訊號產生裝置2丨與訊號監测 裝置22 ^分別經由多工器23耦接至收發單元241,如第2圖 所不。藉此,多工器23可在控制單元25的控制下,於訊號 產生裝置21與訊號監測裝置22間做切換,或於訊號產生裝u 置2 1内不同的訊號產生單元間做切換,或於訊號監測裝置 2 2内不同的訊號監測單元間做切換。1227079 V. Description of the invention (6)-Schematic diagram of constructing the anechoic chamber 24. FIG. 4B is a schematic view of the batch of crying 242 being placed in the anechoic chamber 24 using a drawer-type mechanism. Using the two mounting mechanisms described above, you can quickly and easily install multiple devices under test at one time to test time. The 'batch test system 20' in FIG. 2 also has a signal monitoring device 22 coupled to the transceiver unit 241 for analyzing the second test signal received by the transceiver unit 241. According to the requirements of different test items, the signal monitoring device 22 may use different instruments and equipment, such as a vector signal analyzer & power meter, or a spectrum analyzer. In addition, a Gold Sample of the communication device to be tested can also be used as the signal monitoring device 22. The batch test system 22 uses a control unit 25, such as a personal computer or a work station, to couple it to the signal generating device 21, the signal monitoring device 22, and the device under test to control the generation of the first test signal, respectively. 2. Monitoring and emission of the second test signal. The control unit 25 may also execute related analysis software to analyze the test signals. In the foregoing embodiment using a ring-shaped container, the control unit 25 may be further coupled to the ring-shaped container 2 to control its rotation amplitude. The batch test system 25 also uses a multiplex = 23, which is coupled to the control unit 25, and the signal generating device 2 丨 and the signal monitoring device 22 are respectively coupled to the transceiver unit 241 via the multiplexer 23, as in the first Figure 2 does not. In this way, the multiplexer 23 can switch between the signal generating device 21 and the signal monitoring device 22 under the control of the control unit 25, or switch between different signal generating units in the signal generating device 21, or Switch between different signal monitoring units in the signal monitoring device 22.

^m~\ 第11頁 1227079^ m ~ \ p. 11 1227079

五、發明說明(7) 接者,要說明如何利用前述之測試系統2〇,來實施本 ,明之批次測試方法。第5圖係本發明之批次測試方法之 較佳實施例的動作流程圖。如第5圖所示,此方法包含以 501 將複數個待測無線通訊裝置置於電波暗4 容器242中; 502 將多工器2 3切換至訊號產生裝置2 j ; 503 使訊號產生裝置21產生第一測試訊號; 504 藉由收發單元241發射第一測試訊號; 505 藉用該些待測裝置接收第一測試訊號; 5 0 6 :利用控制單元25分析待測裝置所接收之第—測試訊 號; 507 將多工器2 3切換至訊號監測裝置2 2 ; 508 f由該些待測裝置發射複數個第二測試訊號; 509 藉由收發單元24 1接收該些第二測試訊號;以及 510 利用汛唬監測裝置2 2監測收發單元2 4 1所接收之第二 測試訊號。 步驟501中 安裝待測裝置, 的靜音區内。 ,可以利用第4A或4B圖所示之安裝機構來 且較佳地使批次容器242位於電波暗室24 步驟502至506是用來測試待測裝置的接收機 (receiver)。在這些步驟中,將多工器23切換 裝置21,使訊號產生裝置21所產生之第一測試訊號^可於 電波暗室24内藉由收發單元241發射,並由待測裝&置之接V. Description of the invention (7) The receiver shall explain how to use the aforementioned test system 20 to implement this and the batch test method. Fig. 5 is an operation flowchart of the preferred embodiment of the batch test method of the present invention. As shown in FIG. 5, this method includes placing a plurality of wireless communication devices under test in the radio wave dark container 242 with 501; 502 switching the multiplexer 2 3 to the signal generating device 2 j; 503 enabling the signal generating device 21 Generate the first test signal; 504 transmit the first test signal through the transceiver unit 241; 505 borrow the devices under test to receive the first test signal; 5 06: use the control unit 25 to analyze the first test received by the device under test— Signal; 507 switches the multiplexer 2 3 to the signal monitoring device 2 2; 508 f transmits a plurality of second test signals from the devices under test; 509 receives the second test signals through the transceiver unit 24 1; and 510 The flood monitoring device 22 is used to monitor the second test signal received by the transceiver unit 2 41. In step 501, the device under test is installed in a quiet zone. The installation mechanism shown in FIG. 4A or 4B can be used to better locate the batch container 242 in the anechoic chamber 24. Steps 502 to 506 are used to test the receiver of the device under test. In these steps, the multiplexer 23 is switched to the device 21 so that the first test signal generated by the signal generating device 21 can be transmitted in the anechoic chamber 24 through the transceiver unit 241, and connected by the device to be tested &

1227079 五、發明說明(8) ' -- 收機接收’以進行後續之訊號分析。如前所述,此處訊號 產生裝置2 1可為向量訊號產生器,或是待測裝置之精選樣 本。 , 在第5圖之較佳實施例中,步驟5〇5係同時利用所有 測無線通訊裝置,於一預先選定之頻道接收該第一測試訊 號]接著於步驟50 6中,則由控制單元25以適當方法,例 =·執行訊號品質(signal dual ity)分析軟體,個別分枒 每待,裝置所接收之第一測試訊號,以測得在該預定頻 道中母一待測裝置的最小輸入功率及封包錯誤率 (packet error rate,pER),例如:待測裝置之接收機 輸入功率及封包錯誤率。在另一較佳實施例中,步驟 糸依序利用每一待測裝置於一預定頻道接收第一測試 =。接著於步驟5〇6中,%由控制單元25依序分析每一 待測裝置所接收之第一測試訊號,例如執行鍵結品質 分析軟體,以測得在該預定頻道中,每— 1,·、’二置之下鏈資料吞吐量(downl ink throughPut),例 σ ·待測裝置之接收機的下鏈資料呑吐量。 步驟50 7至510是用來測試無線通訊裝置的發射機 。在這些步驟中,係將多工器23切換至訊 ^皿二f置使待測裝置之發射機所發射的第二測試訊 電波暗室24内藉由收發單元241之天線接收後,/ 訊號監測裝置22進行後續之訊號分析。如前所述, 測:J的1則ί項s,訊號監測裝置22會有所不同。若是 * 一 it汛、置發射機的最大輸出功率及誤差向量大小1227079 V. Description of Invention (8) '-Receiver Receiver' for subsequent signal analysis. As mentioned earlier, the signal generating device 21 here can be a vector signal generator or a selected sample of the device under test. In the preferred embodiment of FIG. 5, step 505 uses all the wireless communication devices at the same time to receive the first test signal on a preselected channel.] Then in step 506, the control unit 25 In a suitable method, for example, the signal dual ity analysis software is executed, and the first test signal received by the device is individually analyzed to measure the minimum input power of the mother-to-be-tested device in the predetermined channel. And packet error rate (pER), such as the receiver input power of the device under test and the packet error rate. In another preferred embodiment, step 接收 sequentially uses each device under test to receive the first test in a predetermined channel. Then in step 506, the control unit 25 sequentially analyzes the first test signal received by each device under test, for example, executes a bond quality analysis software to measure that in the predetermined channel, every -1, · 'Downlink ink throughput, eg σ · The throughput of the downlink data of the receiver of the device under test. Steps 50 to 510 are used to test the transmitter of the wireless communication device. In these steps, the multiplexer 23 is switched to the second position, so that the second test signal anechoic chamber 24 transmitted by the transmitter of the device under test is received by the antenna of the transceiver unit 241, and the signal is monitored. The device 22 performs subsequent signal analysis. As mentioned before, if one of the items J is measured, the signal monitoring device 22 will be different. If it is * the maximum output power and error vector size of the transmitter

1227079 五、發明說明(9) (error vector magnitude,EVM),則訊號監測装置22 採 用待測裝置之一精選樣本,或是向量訊號分析儀搭配一功 率計。而步驟5 08中,係由每一待測裝置於一預定頻道依 序發射第二測試訊號。接著於步驟5丨〇中,利用前述所採 用之訊號監測裝置22,監測收發單元241所接收之第二測 試訊號,以依序測得在該預定頻道中,每一待測裝置發射 機的最大輸出功率及誤差向量大小。此外,由步驟5 1 〇亦 y測得每一待測裝置發射機於該預定頻道之上鏈資料吞吐 里(uplink throughput ) ° …另一種情形是,若要測試無線通訊裝置發射機的中心 頻率(center frequency)及功率遮罩(power mask),則訊 號監/則裝置22採用頻譜分析儀(Spectrum anaiyzer)。而 步驟508中,係選取複數個待測裝置,以在複數個彼此不 相重疊之預定頻道同時發射第二測試訊號。例如,以WUN 規格的產品而言,可選取其中兩個待測裝置,例如:分設 =第1及8頻道(或第2及9頻道…依此類推)發射測試訊號。 乂些頻道因為其頻率相距夠遠,所以在頻譜上比較不會產 生f疊、干擾的現象,而可同時進行測試,以提高效率。 接著於步驟510中,則利用頻譜分析儀,分析收發單元241 所接收之第二測試訊號,以同時測得在這些不重疊的預定 f道中,所選取之待測裝置發射機的中心頻率及功率遮 個令因此,藉由此種批次測試的方式,我們能快速測得多 个測裝置之訊號收發的相關數據,可大幅提高測試效1227079 V. Description of the invention (9) (error vector magnitude, EVM), the signal monitoring device 22 uses a selected sample of the device under test, or a vector signal analyzer with a power meter. In step 508, each device under test sequentially transmits a second test signal on a predetermined channel. Then, in step 5, the second test signal received by the transceiver unit 241 is monitored by using the previously used signal monitoring device 22 to sequentially measure the maximum value of the transmitter of each device under test in the predetermined channel. Output power and error vector size. In addition, the uplink data throughput of each transmitter of the device under test on the predetermined channel is measured in step 5 1 〇 y. Another situation is that if the center frequency of the transmitter of the wireless communication device is to be tested (Center frequency) and power mask, the signal monitoring / regulating device 22 uses a spectrum analyzer (Spectrum anaiyzer). In step 508, a plurality of devices under test are selected to simultaneously transmit a second test signal on a plurality of predetermined channels which do not overlap each other. For example, for products with WUN specifications, two of the devices under test can be selected, such as: setting = channels 1 and 8 (or channels 2 and 9 ... and so on) to transmit test signals. Some channels are far away from each other, so f-stacking and interference will not occur in the frequency spectrum, and they can be tested at the same time to improve efficiency. Then in step 510, the spectrum analyzer is used to analyze the second test signal received by the transceiver unit 241 to simultaneously measure the center frequency and power of the selected device transmitter in these non-overlapping predetermined f channels. Therefore, with this batch test method, we can quickly measure the relevant data of the signal transmission and reception of multiple test devices, which can greatly improve the test efficiency.

第14頁 1227079 五、發明說明(ίο) 率。進一步,對規格中其他未測試的頻道重複進行步驟 5 02至510,就可得知待測無線通訊裝置在規袼所界定的敫 個頻譜内,其訊號收發的品質及能力。 i 對於無線通訊裝置之上/下鏈資料吞吐量的測試,本 發明還提供另一個批次測試方法的較佳實施例,其動作、、宁 程如第6圖所示。在此實施例中,係採取待測裝置互相收 發訊號的測試方式,因此只需利用第2圖之架構的一^份 即可運作,原本測試系統2〇内之訊號產生裝置21、气° ^ :裝置22、多工器23及收發單元241皆不需使用。此心監 包含以下步驟: ^ 601 :將複數個待測無線通訊裝置置於電波暗室Μ中· M2 :藉由控制單元25從待測裝置中選取_ ^射组盥^ 603 604 605 收組之待測裝置; 、一 使發射組之待測裝置發射至少一測試1號· 使接收組之待測裝置接收該測試訊號:=及 制單元25分析接收組之待測裝置所接收之測 步驟603中,係由發射組之各 重疊的預定頻道發射該測試訊號;個而 =置同時在不目 收組之各個待測裝置同時在這 =604中,則由接 該測試訊號。步驟605中,由控—不相重童的預定頻道接收 :裝置所接收之測試訊號,例如早二分析接收組之待 體,,以測得在這些不相重疊的結品質分析乾 置的下鏈資料吞吐量以及發 =接收組之待1裝 之待測裝置的上鏈資料吞Page 14 1227079 5. Description of the invention (ίο) rate. Further, by repeating steps 5 02 to 510 for other untested channels in the specification, we can know the quality and capability of the signal transmission and reception of the wireless communication device under test within the frequency spectrum defined by the regulations. i For the test of the throughput of the uplink / downlink data of the wireless communication device, the present invention also provides another preferred embodiment of the batch test method. The operations and processes are shown in FIG. 6. In this embodiment, a test method is adopted in which the devices under test send and receive signals to each other, so only one ^ portion of the structure shown in Figure 2 can be used to operate. The signal generating device 21 in the original test system 20, gas ° ^ : The device 22, the multiplexer 23, and the transceiver unit 241 do not need to be used. This cardiac monitor includes the following steps: ^ 601: Place a plurality of wireless communication devices under test in the anechoic chamber M. M2: Select from the devices under test by the control unit 25. ^ 射 组 洗 ^ 603 604 605 Device under test; 1. Make the device under test in the transmitting group transmit at least one test number 1. Make the device under test in the receiving group receive the test signal: = and the control unit 25 analyzes the test step received by the device under test in the receiving group 603 The test signal is transmitted from each of the overlapping predetermined channels of the transmission group; if each test device that is set in the non-receiving group at the same time is in 604, the test signal is received. In step 605, the signal is received by a predetermined channel that is controlled by the same child: the test signal received by the device, such as the analysis of the receivers of the receiving group in the early two days, to measure the results of the non-overlapping knot quality analysis. Chain data throughput and sending = data upload of the device under test in the receiving group

第15頁 1227079 五、發明說明(11) 吐量。 再以WLAN規格的產品 為發射組,另外兩個待測 於不相互重疊之頻道,例 …依此類推),以發射/接 1及8頻道中,接收組裝置 的上鏈資料呑吐量。針對 得待測裝置於整個規格所 以上所述係利用較佳 制本發明之範圍。任何熟 般修飾,皆不脫如附申請 述,本發明實施之具體性 明專利要件,謹請責審 禱0 為例,可選取其中兩個待測裝置 裝置為接收組,各組裝置皆分設 如:第1及8頻道(或第2及9頻道 收測試訊號。如此即可測得於第 的下鏈資料呑吐量及發射組裝置 其他頻道重複進行測試,則可測 定頻域的上/下鏈資料吞吐量。 實施例詳細說明本發明,而非限 悉此技藝之人士任施匠思而為諸 專利範圍所欲保護者。綜上所 ,誠已符合專利法中所規定之發 查委員惠予審視,並賜准專利為Page 15 1227079 V. Description of the invention (11) The throughput. Then take the WLAN product as the transmission group, and the other two channels to be measured do not overlap with each other, for example, and so on), to transmit / receive the uplink data throughput of the receiving group devices in channels 1 and 8. Aiming to obtain the device under test in the entire specification, the above description is made to better use the scope of the present invention. Any familiar modification can not be separated from the attached application description. The specifics of the implementation of the present invention clearly describe the patent requirements. Please scrutinize 0 as an example. Two of the devices under test can be selected as the receiving group, and each group of devices is divided. Suppose: Channels 1 and 8 (or channels 2 and 9 receive test signals. In this way, you can measure the throughput of the downlink data and the other channels of the transmission group device and repeat the test. Downlink data throughput. The examples illustrate the present invention in detail, but are not limited to those skilled in the art who want to protect the scope of patents. In summary, we have already met the requirements of the Patent Law. Members benefited from scrutiny and granted a patent as

12270791227079

【圖式簡單說明】 置進行批次測試的 第1圖係以電纜模式對無線通訊裝 方塊圖。[Brief description of the diagram] The first diagram of the batch test setup is a block diagram of wireless communication in cable mode.

第2圖係本發明之批次測試系 、統的較佳實施例立體 二圖圖H皮暗室之環形批次容器的操作示意圖。 意圖第4A圖係抵次容器利用一窗型機構置入電波暗室之示 示意圖 流程 圖係抵次容器利用一抽屜型機構置入電波暗室之 第5圖係本發 施例的動作 測a式方法之另一較佳實施例的 圖。 之批次測試方法之較佳實 動作流程圖 第6圖係本發明 ^ . 相^次 圖式之圖號說明: 11 -訊號產生裝置 1 3 -切換器 1 2 —訊號監測裝置 15-控制單元 待測裝置 2〇~批次測試系统 22-訊號監測裝置 21—訊號產生裝置 24-電波暗室 23-多工器 242-批次容器 241-收發單元 501〜510-本發明之 25-控制單元 批久測試方法之較佳實施例的動作流 1227079 圖式簡單說明 程 6 0 1〜6 0 5 - 本發明之批次測試方法之另一較佳實施例的動 作流程 11^1 第18頁Figure 2 is a three-dimensional view of the preferred embodiment of the batch test system and system of the present invention. Figure 4A is a schematic diagram showing the use of a window-type mechanism to place the anechoic container into the anechoic chamber using a drawer-type mechanism. Fig. 5A shows the action measurement method of the embodiment of the present invention. Figure of another preferred embodiment. The flow chart of the preferred actual operation of the batch test method is shown in Figure 6. The figure of the present invention ^. Phase ^ diagrams: 11-Signal generating device 1 3-Switcher 1 2-Signal monitoring device 15-Control unit Device under test 20 ~ Batch test system 22-Signal monitoring device 21-Signal generating device 24-Anechoic chamber 23-Multiplexer 242-Batch container 241-Transceiver unit 501-510- 25-Control unit batch of the present invention Action flow of the preferred embodiment of the long-term test method 1227079 The diagram briefly illustrates the process 6 0 1 ~ 6 0 5-The action flow of another preferred embodiment of the batch test method of the present invention 11 ^ 1 page 18

Claims (1)

1227079 六、申請專利範圍 1 · 一種用於無線通訊裝置之批次測試系統,至少包含: 一訊號產生裝置,用以產生一第一測試訊號; 一收發單元,設置於一電波暗室中,並耦接至該訊 號產生裝置,用以發射該第一測試訊號; 複數個待測無線通訊裝置,設置於該電波暗室中, 用以接收該收發單元發射之該第一測試訊號,並發射複 數個第二測試訊號至該收發單元;以及 一訊號監測裴置,耦接至該收發單元,用以監測該 收發單元所接收之該些第二測試訊號。 2 ·如申清專利範圍第1項所述之批次測试糸統,更包含: 一控制單元,搞接至該訊號產生裝置、該訊號監測 裝置及該些待測無線通訊裝置,用以控制該第一測試訊 號的產生,以及該些第二測試訊號的監測與發射。 3 ·如申請專利範圍第2項所述之批次測試系統,更包含: 一多工器,耦接奚該控制單元、該訊號產生裝置與 該訊號監測裝置,用以切換於該訊號產生裝置與該訊號 監測裝置之間。 4 ·如申請專利範圍第3項戶斤述之批次測試系統’其中該訊 號產生裝置包含複數個訊號產生單元’且該多工器可切 換於該些訊號產生單元之間。 5 ·如申請專利範圍第3項户斤述之批次測试系統’其中4 &凡 號監測裝置包含複數個訊號監測單元,且該多工器可切 換於該些訊號監測單元之間。 6 ·如申請專利範圍第丨項所述之批次測試系統,更包含:1227079 VI. Scope of patent application 1 · A batch test system for wireless communication devices, at least: a signal generating device for generating a first test signal; a transceiver unit, which is arranged in an anechoic chamber and is coupled Connected to the signal generating device to transmit the first test signal; a plurality of wireless communication devices to be tested are arranged in the anechoic chamber to receive the first test signal transmitted by the transceiver unit and transmit a plurality of first Two test signals are sent to the transceiver unit; and a signal monitoring unit is coupled to the transceiver unit to monitor the second test signals received by the transceiver unit. 2 · The batch test system as described in item 1 of the patent scope, further including: a control unit connected to the signal generating device, the signal monitoring device and the wireless communication devices to be tested, for Control the generation of the first test signal, and the monitoring and emission of the second test signals. 3 · The batch test system as described in item 2 of the scope of patent application, further comprising: a multiplexer coupled to the control unit, the signal generating device and the signal monitoring device for switching to the signal generating device And the signal monitoring device. 4. The batch test system according to item 3 of the patent application scope, wherein the signal generating device includes a plurality of signal generating units, and the multiplexer can be switched between the signal generating units. 5 · For the batch test system described in item 3 of the patent application, 4 & fan monitoring device includes a plurality of signal monitoring units, and the multiplexer can be switched between the signal monitoring units. 6 · The batch test system described in item 丨 of the scope of patent application, further including: Ϊ227079 六、申請專利範圍 用以承載該些無 其中該批 其中該批 並由該控制 其中該批 ,其中該批 D 其中該電 其中該電 其中該收 其中該些 一批次容器(batch container 線通訊裝置。 ry •如申請專利範圍第6項所述之批次測試系統 -欠谷器為一方形容器。 •如申明專利範圍第6項所述之批次測試系統 -人各器為一環形容器,麵接至一控制單元 單元控制其旋轉幅度。 9·如申請專利範圍第6項所述之批次測試系統, 大谷器係利用一窗型機構置入該電波暗室。 1 〇 ·如申請專利範圍第6項所述之批次測試系統 次容器係利用一抽屜裂機構置入該電波暗室 1 1 ·如申請專利範圍第1項所述之批次測試系統 波暗室係為角錐形(pyraIDidal )。 1 2 ·如申請專利範圍第1項所述之批次測試系統 波暗室係為立方體形(cubical)。 1 3 ·如申請專利範圍第1項所述之批次測試系統 發單元為一天線或天線陣列。 1 4 ·如申睛專利範圍第1項所述之批次測試系統 無線通訊裝置係置於該電波暗室之一靜音區(Quiet zone)内 〇 1 5 ·如申請專利範圍第丨項所述之批次測試系統,其中該訊 號產生裝置為一向量訊號產生器(vector signal generator) 〇 1 6 ·如申請專利範圍第1項所述之批次測試系統,其中該訊Ϊ227079 VI. The scope of patent application is used to carry the batches which are not included in the batch and which are controlled by the batch, where the batch D where the electricity is in the electricity where the electricity is in the batch container (batch container line) Communication device. Ry • Batch test system as described in item 6 of the scope of patent application-a trough container is a square container. • Batch test system as described in item 6 of the scope of the patent application-a circular container The device is connected to a control unit to control its rotation range. 9 · As in the batch test system described in item 6 of the scope of patent application, Otani is placed in the anechoic chamber with a window mechanism. 1 〇 · If applied The secondary container of the batch test system described in item 6 of the patent scope is inserted into the electric wave anechoic chamber by a drawer cracking mechanism 1 1 · The anechoic chamber of the batch test system described in item 1 of the patent scope is a pyramid (pyraIDidal ). 1 2 · The batch test system described in item 1 of the scope of patent application is cubical. 1 3 · The batch test system in item 1 of the scope of patent application The unit is an antenna or antenna array. 1 4 · The batch test system wireless communication device as described in item 1 of Shenjing's patent scope is placed in a quiet zone (Quiet zone) of the anechoic chamber. 1 5 · If applied The batch test system described in item 丨 of the patent scope, wherein the signal generating device is a vector signal generator 〇 1 6 · The batch test system described in item 1 of the patent scope, wherein the Information 第20頁 1227079 六、申請專利範圍 ' f產,生裝置為該些無線通訊裝置之一精選樣本(Golden Sample) 〇 1 7·如申請專利範圍第丨項所述之批次測試系統,其中該訊 號監測裝置包含一向量訊號分析儀(vector Signai analyzer)及一功率計。 1 8·如申請專利範圍第丨項所述之批次測試系統,其中該訊 號監測裝置包含一頻譜分析儀(spectruin ana〇zer)。 1 9 ·如申請專利範圍第1項所述之批次測試系統,其中該訊 號監測裝置為該些無線通訊裝置之一精選樣本。 2 〇 · —種用於無線通訊裝置之批次測試方法,至少包含: 將複數個無線通訊裝置置於一電波暗室中; 產生一第一測試訊號; 使一收發單元發射該第一測試訊號; 使該些無線通訊裝置接收該第一測試訊號; 分析該些無線通訊裝置所接收之該第一測試訊 號; 使該些無線通訊裝置發射複數個第二測試訊號; 使該收發單元接收該些第二測試訊號;以及 監測該收發單元所接收之该些第二測試訊號。 21 ·如申請專利範圍第20項所述之批次測試方法,其中該 電波暗室係為角錐形。 2 2 ·如申請專利範圍第2 0項所述之批次測試方法,其中該 些無線通訊裝置係置於該電波暗室之一靜音區内。 23·如申請專利範圍第20項所述之批次測試方法,其中該Page 20 1227079 VI. The scope of application for patents' f. The production device is one of these wireless communication devices. (Golden Sample) 〇 1 7 · The batch test system described in item 丨 of the scope of patent applications, where The signal monitoring device includes a vector signai analyzer and a power meter. 1 8. The batch test system as described in item 丨 of the patent application scope, wherein the signal monitoring device includes a spectrum analyzer (spectruin analyzer). 19 • The batch test system as described in item 1 of the scope of patent application, wherein the signal monitoring device is a selected sample of the wireless communication devices. 2 〇—A batch test method for wireless communication devices, including at least: placing a plurality of wireless communication devices in an anechoic chamber; generating a first test signal; causing a transceiver unit to transmit the first test signal; Cause the wireless communication devices to receive the first test signal; analyze the first test signal received by the wireless communication devices; cause the wireless communication devices to transmit a plurality of second test signals; enable the transceiver unit to receive the first test signals Two test signals; and monitoring the second test signals received by the transceiver unit. 21 The batch test method as described in item 20 of the patent application scope, wherein the anechoic chamber is a pyramid. 2 2 · The batch test method as described in item 20 of the scope of patent application, wherein the wireless communication devices are placed in a quiet zone of the anechoic chamber. 23. The batch test method described in item 20 of the scope of patent application, wherein the 第21頁 1227079 六、申請專利範圍 第一測試訊號係由該些無線通訊裝置之一精選樣本 產生。 、,汴 24·如申請專利範圍第2〇項所述之批次測試方法,其中該 第一測試訊號係由一向量訊號產生器所產生。八 ^ 2 5·如申請專利範圍第2〇項所述之批次測試方法,其中談 些無線通訊裝置係於一預定頻道接收該第一測&吼μ 號。 ' 26·如申 析該 中, 之最 2 7 ·如申 測該 裝置 2 8 ·如申 測該 析儀 2 9 ·如申 射該 線通 號。 30·如申 測該 線通 請專利範圍第25 些無線通訊裝置 係包含分析每一 小輸入功 请專利範 率及封 圍第20 些第二測試訊號 之一精選樣本進 請專利範圍第2 0 些第二測試訊號 計進行 圍第20 及一功率 睛專利範 些第一測試訊號 訊裝置於一預定 項所述 所接收 該些無 包錯誤 項所述 的步驟 行監測 項所述 的步驟 監測。 項所述 的少驟 頻道依 之批次測 之該第一 線通訊裝 率(PER) 之批次測 中,係利 〇 之批次測 中,係利 之批次測 中,係包 序發射該 測試訊 置於該 0 試方法 用該些 試方法 用一向 試方法 含由每 些第二 ’其中分 號的步驟 預定頻道 ,其中監 無線通訊 ,其中監 量訊號分 ’其中發 一該此益 測試訊 請專利範圍第29項所述之批次測試方法,其中監 些第二測試訊號的夕驟中,包含分析每一該些無 訊裝置於該預定頻道之最大輸出功率及誤差Page 21 1227079 VI. Scope of patent application The first test signal was generated from a selected sample of one of these wireless communication devices. 24. The batch test method as described in item 20 of the patent application scope, wherein the first test signal is generated by a vector signal generator. 8 ^ 25. The batch test method described in item 20 of the scope of patent application, wherein some wireless communication devices receive the first test & '26. If the analysis is the best, 27. If the device is tested, 28. If the analyzer is measured, 29. If the line is called, apply. 30 · If you apply for the test, the 25th wireless communication device includes analysis of the patent scope of each small input function and enclosing one of the 20th second test signals. Selected samples are included in the patent range. 20 These second test signal meters perform the step monitoring described in the first test signal signaling device of the 20th and the first patented signal device in a predetermined item and the step of the monitoring item described in the received non-packet error items. The batch test of the first-line communication load rate (PER) measured by the batches described in the above item is the batch test of the profit 0, and the batch test of the profit. The test message is placed in the 0 test method. The test method and the one-way test method are used to reserve a channel by each of the second steps, in which the wireless communication is monitored, and the monitoring signal is sent. The batch test method described in item 29 of the patent scope is requested. The step of monitoring the second test signals includes analyzing the maximum output power and error of each of the non-sense devices on the predetermined channel. 1227079 六、申請專利範圍 大小(EVM)。 Q 1 J: Φ Φ ^ ^ #少枇次測試方法,其 d 1 ·/、T如申岣專利範圍第2 0項所述之 ^ 诚料、』、 中龄:目丨丨# 4 α _ yf系利用一頻心为析儀 T皿/則该些第二測試訊號的梦騍係W ^ 進行。1227079 Six, the scope of patent application (EVM). Q 1 J: Φ Φ ^ ^ #Small test method, where d 1 · /, T are as described in Item 20 of the patent application scope ^ Sincerely expected, ", middle-aged: heading 丨 丨 # 4 α _ The yf system is performed by using a frequency center as the analyzer T / the nightmare system W ^ of the second test signals. 3 2 ·如申請專利範圍第2 〇項所述之批次測0式方法其中發 射該些第二測試訊號的步驟包含: ^ ^ y ^ %姑营,以在複數個彼此 &取複數個該些無線通机裝I 。 不相重疊之預定頻道發射該些第二測试成说。 卜3 2 · The batch test method as described in item 20 of the scope of the patent application, wherein the steps of transmitting the second test signals include: ^ ^ y ^% to camp on each other & These wireless devices are installed I. Non-overlapping predetermined channels transmit the second tests. Bu 33·如申請專利範圍第32項所述之批次測試=法、,其中監 測該些第二測試訊號的步驟,包含分析每一被選取之 該些無線通訊裝置所對應之該些預定頻道的中心頻率 及功率遮罩。 3 4 ·如申請專利範圍第2 〇項所述之批次測試方法’其中接 收該第一測試訊號的步驟,包含依序利用每一戎些無 線通訊裝置於一預定頻道接收該第一測試訊號。 35·如申請專利範圍第34項所述之批次測試方法,其中分 析該第一測試訊號的步驟,包含分析每一該些無線通 訊裝置於該預定頻道之下鏈資料呑吐量(downl ink33. The batch test = method described in item 32 of the scope of patent application, wherein the step of monitoring the second test signals includes analyzing the predetermined channels corresponding to each selected wireless communication device. Center frequency and power mask. 3 4 · The batch test method described in item 20 of the patent application scope, wherein the step of receiving the first test signal includes sequentially using each wireless communication device to receive the first test signal on a predetermined channel . 35. The batch test method described in item 34 of the scope of patent application, wherein the step of analyzing the first test signal includes analyzing the downlink data throughput of each of the wireless communication devices on the predetermined channel (downl ink throughput) ° 36·如申請專利範圍第29項所述之批次測試方法,其中分 析該些第二測試訊號的少鄉’包含分析每一該些無線 通訊裝置於該預定頻道之上鍵身料吞吐量(up 1 ink throughput) ° 3 7. —種用於無線通訊裝置之批次剛試方法,至少包含··throughput) ° 36. The batch test method as described in item 29 of the scope of patent application, wherein the analysis of the second test signals includes the analysis of each of the wireless communication devices on the predetermined channel. Throughput (up 1 ink throughput) ° 3 7. —A batch test method for wireless communication devices, including at least ... 1227079 六、申請專利範圍 將複數個無線通訊裝置置於一電波暗室中; 攸β亥些無線通说裝置中選取一發射組與一接收組 之無線通訊裝置; 使該發射組之無線通訊裝置發射至少一測試訊 號; … 使該接收組之無線通訊裝置接收該測試訊號;以 及 號。 38·如申請專 射該測試 訊裝置同 3 9 ·如申請專 收該測試 訊裝置同 號。 4 0 ·如申請專 分析步驟 料吞吐量 資料吞吐 該接收組之無線通訊裝置所接收之該測試訊 利範圍第3 7項所述之批次測試方法,其中發 訊號的步驟,包含由該發射組之各個無線通 時在不相重疊的預定頻道發射該測試訊號。 利範圍第3 8項所述之批次測試方法,其中接 訊號的步驟,包含由該接收組之各個無線通 時在該些不相重叠的預定頻道接收該測試訊 _ &盛之批次測試方法,复中蟑 利範圍第39項所么 ^ ^ ^ ^ ^ -干該 — 々組之無線通祝裝置的下鏈資 包含分析該接收缈> & ## 貝 ,以及分析該發斯 w上鍵 量 °1227079 VI. The scope of the patent application will place a plurality of wireless communication devices in an anechoic chamber; choose a wireless communication device of a transmitting group and a receiving group among the wireless communication devices; make the wireless communication device of the transmitting group transmit At least one test signal; ... causing the wireless communication device of the receiving group to receive the test signal; and the signal. 38. If applying for the test signal device is the same as 39. · If applying for the test signal device, the same number. 4 0 · The batch test method described in item 37 of the test signal range received by the wireless communication device of the receiving group if the throughput data is transmitted through the application-specific analysis step, wherein the step of transmitting a signal includes transmitting by the transmitter Each radio of the group transmits the test signal on non-overlapping predetermined channels. The batch test method described in item 38 of the scope of interest, wherein the step of receiving a signal includes receiving the test message by each wireless communication of the receiving group on the non-overlapping predetermined channels. The test method is the 39th item in the scope of Fuzhong cockroach. ^ ^ ^ ^ ^ -Don't do this — The downlink information of the wireless communication device of the 々 group includes analyzing the receiving 缈 > &## ,, and analyzing the sending Sw key amount °
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