CN109581416B - A device for big dipper equipment tests in batches - Google Patents
A device for big dipper equipment tests in batches Download PDFInfo
- Publication number
- CN109581416B CN109581416B CN201811522145.2A CN201811522145A CN109581416B CN 109581416 B CN109581416 B CN 109581416B CN 201811522145 A CN201811522145 A CN 201811522145A CN 109581416 B CN109581416 B CN 109581416B
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- China
- Prior art keywords
- beidou
- equipment
- card
- antenna
- big dipper
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
- G01S19/03—Cooperating elements; Interaction or communication between different cooperating elements or between cooperating elements and receivers
- G01S19/08—Cooperating elements; Interaction or communication between different cooperating elements or between cooperating elements and receivers providing integrity information, e.g. health of satellites or quality of ephemeris data
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S19/00—Satellite radio beacon positioning systems; Determining position, velocity or attitude using signals transmitted by such systems
- G01S19/01—Satellite radio beacon positioning systems transmitting time-stamped messages, e.g. GPS [Global Positioning System], GLONASS [Global Orbiting Navigation Satellite System] or GALILEO
- G01S19/13—Receivers
- G01S19/23—Testing, monitoring, correcting or calibrating of receiver elements
Abstract
The invention discloses a device for batch testing of Beidou equipment, and relates to the field of testing of Beidou satellite equipment. The invention aims to solve the problem that the batch test efficiency of Beidou equipment is low. According to the invention, the antenna control matrix is designed, and the large-batch Beidou equipment only needs to be provided with fewer Beidou antennas in the test process. Design big dipper IC-card virtual machine, the information of many big dipper IC-cards of storage and management can set up the corresponding relation of big dipper IC-card and big dipper equipment (many big dipper IC-cards cooperate a big dipper equipment or a big dipper IC-card cooperation many big dipper equipment) under test computer's control, shortens big dipper equipment's RDSS location application or short message communication's time interval, promotes efficiency of software testing, has avoided the installation to dismantle big dipper IC-card in the test procedure simultaneously. The test computer combines a plurality of Beidou antennas to realize batch test of the Beidou equipment through the universal network equipment setting and control antenna control matrix and the Beidou IC card virtual machine.
Description
Technical Field
The invention relates to the field of Beidou satellite navigation product testing, in particular to a Beidou device batch testing device.
Background
According to the conventional testing device for the Beidou equipment, one tested device needs to use one Beidou antenna and one Beidou IC card. When the number of the tested devices is large, the Beidou antennas with the same number occupy a large space, and the accurate coordinates of each antenna need to be determined, so that the testing workload is multiplied; simultaneously, the Beidou IC card needs to be continuously disassembled and assembled in the test process. The problem above causes low test efficiency of the batch Beidou equipment.
Disclosure of Invention
The invention aims to solve the problem that the batch test efficiency of Beidou equipment is low. In order to solve the problems, the antenna control matrix is designed, and the fact that a large amount of Beidou equipment only needs to be provided with fewer Beidou antennas in the testing process is achieved. The Beidou IC card virtual machine is designed to store and manage information of a plurality of Beidou IC cards, and the corresponding relation between the Beidou IC cards and Beidou equipment is set under the control of the test computer. The test computer combines a plurality of Beidou antennas to realize batch test of the Beidou equipment through the universal network equipment setting and control antenna control matrix and the Beidou IC card virtual machine.
The invention is realized by the following technical scheme:
a device for batch testing of Beidou equipment comprises a plurality of Beidou antennas, an antenna control matrix, a Beidou IC card virtual machine, universal network equipment and a testing computer;
the antenna control matrix is used for transmitting satellite signals received by any one Beidou antenna to any one or more Beidou devices; the Beidou antenna is also used for finding a radio frequency path with the minimum loss through calculation of any Beidou signal transmitted by the Beidou equipment and determining one Beidou antenna to transmit the Beidou signal; the Beidou antenna system is also used for identifying and automatically eliminating the faulty Beidou antenna and reporting the working state to a testing computer through general network equipment;
the Beidou IC card virtual machine is used for storing and managing information of a plurality of Beidou IC cards and carrying out information interaction with a plurality of Beidou devices according to the Beidou IC card operation specification; the Beidou IC cards are used for setting the corresponding relation between the Beidou IC cards and the Beidou equipment under the control of the test computer, namely a plurality of Beidou IC cards are matched with one Beidou equipment or one Beidou IC card is matched with a plurality of Beidou equipment; the device is also used for reporting the current state of the test computer and the information of the Beidou IC card through the universal network equipment;
the test computer is used for receiving test data reported by the Beidou equipment, the working state of the antenna control matrix, the working state of the Beidou IC card virtual machine and information of the Beidou IC card; the Beidou equipment is also used for controlling the Beidou equipment to test according to the network address of the Beidou equipment, configuring working parameters of an antenna control matrix and setting the corresponding relation between a Beidou IC card and the Beidou equipment in the Beidou IC card virtual machine; the Beidou equipment management system is also used for recording the test data of the Beidou equipment in batches through the number binding relationship between the network address and the Beidou equipment, and evaluating the test data reported by the Beidou equipment in real time to obtain an evaluation result.
The antenna control matrix adopts a radio frequency switch control matrix to transmit satellite signals received by any one Beidou antenna to any one or more Beidou devices; and a radio frequency switch control matrix is adopted to search the Beidou signal transmitted by any Beidou equipment through calculation to find a radio frequency path with the minimum loss, and one Beidou antenna is determined to be transmitted.
Compared with the background technology, the invention has the advantages that:
1. the invention supports the simultaneous online test of a plurality of Beidou devices.
2. According to the invention, the Beidou RDSS inbound frequency can be intelligently controlled according to the size of the tested Beidou equipment batch, and the Beidou RDSS functional performance test is reasonably arranged.
3. The invention has evaluation capability and can verify whether the test process is normal or not and whether the information of entering and exiting stations is correct or not.
Drawings
FIG. 1 is a schematic diagram of the test method of the present invention;
fig. 2 is a radio frequency switch control matrix in the antenna control matrix of the present invention.
Detailed Description
The invention is described in further detail below with reference to the figures and specific examples.
As shown in fig. 1, the device for the batch test of the Beidou equipment in the embodiment comprises 8 Beidou antennas, an antenna control matrix, a Beidou IC card virtual machine, general network equipment and a test computer; batch testing of not less than 128 pieces of BeiDou equipment is realized;
the antenna control matrix is used for transmitting satellite signals received by any one Beidou antenna to any one or more Beidou devices by adopting the radio frequency switch control matrix; the Beidou antenna is also used for finding a radio frequency path with the minimum loss through calculation by adopting a radio frequency switch control matrix to carry out Beidou signal transmitted by any Beidou equipment, and determining one Beidou antenna to transmit; the Beidou antenna system is also used for identifying and automatically eliminating the faulty Beidou antenna and reporting the working state to a testing computer through general network equipment; the radio frequency switch control matrix is shown in fig. 2, and realizes interconnection and intercommunication between 8 antennas and 128 pieces of north dipper equipment;
the Beidou equipment receives and transmits data under the control of the test computer and reports the test data to the test computer through the general network equipment;
the Beidou IC card virtual machine is used for storing and managing information of a plurality of Beidou IC cards and carrying out information interaction with a plurality of Beidou devices according to the Beidou IC card operation specification; the Beidou IC cards are used for setting the corresponding relation between the Beidou IC cards and the Beidou equipment under the control of the test computer, namely a plurality of Beidou IC cards are matched with one Beidou equipment or one Beidou IC card is matched with a plurality of Beidou equipment; the device is also used for reporting the current state of the test computer and the information of the Beidou IC card through the universal network equipment;
the test computer is used for receiving test data reported by the Beidou equipment, the working state of the antenna control matrix, the working state of the Beidou IC card virtual machine and information of the Beidou IC card; the Beidou equipment is also used for controlling the Beidou equipment to test according to the network address of the Beidou equipment, configuring working parameters of an antenna control matrix according to the reported information and setting the corresponding relation between a Beidou IC card and the Beidou equipment in the Beidou IC card virtual machine; the Beidou equipment management system is also used for recording the test data of the Beidou equipment in batches through the number binding relationship between the network address and the Beidou equipment, and evaluating the test data reported by the Beidou equipment in real time to obtain an evaluation result.
The design principle of the invention is as follows:
according to the invention, the antenna control matrix is designed, and the large-batch Beidou equipment only needs to be provided with fewer Beidou antennas in the test process. Design big dipper IC-card virtual machine, the information of many big dipper IC-cards of storage and management sets up the corresponding relation of big dipper IC-card and big dipper equipment (many big dipper IC-cards cooperate a big dipper equipment or a big dipper IC-card cooperation many big dipper equipment) under test computer's control, shortens big dipper equipment's RDSS location application or short message communication's time interval, promotes efficiency of software testing, has avoided dismouting big dipper IC-card constantly in test process simultaneously. The test computer combines a plurality of Beidou antennas to realize batch test of the Beidou equipment through the universal network equipment setting and control antenna control matrix and the Beidou IC card virtual machine.
Claims (2)
1. A device for batch testing of Beidou equipment is characterized by comprising a plurality of Beidou antennas, an antenna control matrix, a Beidou IC card virtual machine, universal network equipment and a testing computer;
the antenna control matrix is used for transmitting satellite signals received by any one Beidou antenna to any one or more Beidou devices; the Beidou antenna is also used for finding a radio frequency path with the minimum loss through calculation of any Beidou signal transmitted by the Beidou equipment and determining one Beidou antenna to transmit the Beidou signal; the Beidou antenna system is also used for identifying and automatically eliminating the faulty Beidou antenna and reporting the working state to a testing computer through general network equipment;
the Beidou IC card virtual machine is used for storing and managing information of a plurality of Beidou IC cards and carrying out information interaction with a plurality of Beidou devices according to the Beidou IC card operation specification; the Beidou IC cards are used for setting the corresponding relation between the Beidou IC cards and the Beidou equipment under the control of the test computer, namely a plurality of Beidou IC cards are matched with one Beidou equipment or one Beidou IC card is matched with a plurality of Beidou equipment; the device is also used for reporting the current state of the test computer and the information of the Beidou IC card through the universal network equipment;
the test computer is used for receiving test data reported by the Beidou equipment, the working state of the antenna control matrix, the working state of the Beidou IC card virtual machine and information of the Beidou IC card; the Beidou equipment is also used for controlling the Beidou equipment to test according to the network address of the Beidou equipment, configuring working parameters of an antenna control matrix and setting the corresponding relation between a Beidou IC card and the Beidou equipment in the Beidou IC card virtual machine; the Beidou equipment management system is also used for recording the test data of the Beidou equipment in batches through the number binding relationship between the network address and the Beidou equipment, and evaluating the test data reported by the Beidou equipment in real time to obtain an evaluation result.
2. The device for the batch test of the Beidou equipment according to claim 1, wherein the antenna control matrix adopts a radio frequency switch control matrix to transmit satellite signals received by any one Beidou antenna to any one or more Beidou equipment; and a radio frequency switch control matrix is adopted to search the Beidou signal transmitted by any Beidou equipment through calculation to find a radio frequency path with the minimum loss, and one Beidou antenna is determined to be transmitted.
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CN109581416B true CN109581416B (en) | 2021-06-22 |
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