1225172 五、發明說明（1) 本案係為一種缺陷修補方法與結構，尤指應用於一薄 膜電晶體液晶顯不器之缺陷修補方法與結構。 隨著製造技術之日益進展，液晶顯示器（L i gu i d C r y s t a 1 D i s p 1 a y，L C D )已經是一種被廣泛應用的顯示元 件，而其工作原理主要利用電場來改變液晶·之排列狀態， 使得通過液晶之光線產生路線改變之現象，進而達成明暗 變化之顯示效果。 請參見第一圖，其係一薄膜電晶體液晶顯示器 (TFTLCD)之一單元電路方塊示意圖，其中薄膜電晶體1 1係 受掃描線電壓V s之控制而於導通狀態及關閉狀態間切換， 而資料線電壓Vd則於薄膜電晶體1 1處於導通狀態時被加諸 於該液晶1 2兩側之像素電極1 3 1、共同電極1 3 2之間，用以 改變該液晶1 2之排列狀態，進而控制該液晶1 2之透光程 度，使得背面光源1 4所發出之光線到達觀看者眼中之強度 產生變化，用以達成明暗變化之顯示效果，而儲存電容1 5 則用以加強元件之特性。 而一薄膜電晶體液晶顯示器（TFTLCD)係為在一顯示面 板上大量製作上述單元所構成之陣列（array)。但是在製 作過程中，很可能因為發生某些錯誤或疏失而導致上述資 料線或掃描線產生斷線等缺陷，而為能除去此類缺失，在 現今薄膜電晶體液晶顯示器之結構布局中，通常係於其陣 列（a r r a y )周圍設有複數條環狀修補線（r e p a i r 1 i n e s )結 構來解決上述問題。 請參見第二圖，其係為習用設於薄膜電晶體液晶顯示1225172 V. Description of the invention (1) This case is a defect repairing method and structure, especially a defect repairing method and structure applied to a thin film transistor liquid crystal display. With the increasing progress of manufacturing technology, liquid crystal displays (LCD) have been widely used as display elements, and their working principle mainly uses electric fields to change the alignment of liquid crystals. The phenomenon that the light path of the liquid crystal changes is changed, and the display effect of light and dark changes is achieved. Please refer to the first figure, which is a block schematic diagram of a unit circuit of a thin film transistor liquid crystal display (TFTLCD). The thin film transistor 11 is switched between an on state and an off state under the control of the scanning line voltage V s, and The data line voltage Vd is applied between the pixel electrode 1 3 1 and the common electrode 1 3 2 on both sides of the liquid crystal 12 when the thin film transistor 1 1 is in an on state to change the arrangement state of the liquid crystal 12. And further control the light transmittance of the liquid crystal 12 to make the intensity of the light emitted from the back light source 14 reach the viewer's eyes to change the display effect of light and dark, and the storage capacitor 15 is used to strengthen the component. characteristic. A thin film transistor liquid crystal display (TFTLCD) is an array composed of a large number of the above units on a display panel. However, during the production process, some errors or omissions may cause defects such as disconnection of the above-mentioned data lines or scanning lines. In order to remove such defects, in the current structural layout of thin-film transistor liquid crystal displays, A plurality of ring repair lines (repair 1 ines) structures are arranged around the array to solve the above problems. Please refer to the second figure, which is a conventionally used thin film transistor liquid crystal display.
1225172 五、發明說明（2) 器陣列（array)周圍之複數條環狀修補線（repaii_ Unes) J ?上視示意圖，在習用技術中，陣列21周圍通常設有五 =哀，修補線 2〇1、202、2 0 3、2〇4、2〇5,而 或 ==斷線等缺陷(如圖所示為一資料線以於陣列21 時，吾人便利用雷射光對區域 ι2 動作=動Λ將區域2013與區域…4進行切斷 k c u t )動作，進而達成修補之作用。 而在上述利用環狀修補線之 點··（ 1)修補後之訊號傳輸線之何，、八有下列、 之信號延遲（RC tlme delay)HW’極易產生嚴重 面板進行移動而造成生產效率 > 補動作需將大面積之 llnes)結構佔據面積，降低了破璃美^3)修補線（repair 改善上述缺失，係為發展：：基板之使用，。而如何 本案係為一種缺陷修補方、去 S目的。 ，造上，該液晶顯示器包含有二，，用於一液晶顯示器之 貝料線交錯構成之矩形像素陣由複數條掃描線與複數條 於該矩形像素陣列之一邊外側也而該修補方法包含：僅 ^之資料線與該修補線段之一二^修補線段；將一具缺 :料線鄰近之正常資料線與；二：處以及該具缺陷之 以一第一雷射光進行一焊接^補線敫之一第二交會處， 2補線段上之一第—切斷點盥—2達成電連接；以及將該 2光進行一切斷動作而達成斷第二切斷點，以一第二雷 該第一交會處與該第二交會声=，而該等切斷點分別位於 根據上述構想，缺陷^ ς方構成線段之兩側。 去中該第一雷射光與該第 1225172 、發明說明（3) 二雷射光之波長係 (nm) 〇 本案之另一方 晶顯示器之製造上 線與複數條資料線 法包含：僅於該矩 段；將—具缺陷之 及5亥具缺陷之掃描 第一父會處，以雷 及將該修補線段上 五 分別為1 0 6 4奈米（n m )以及5 3 2奈米 面係為>^種缺 ，該液 交錯構 形像素 掃描線 線鄰近之正常 陷修補方 器包含有 形像素陣 晶顯不 成之矩 陣列之一邊外側 與該修補線段之 掃描線與 射光進行一焊接動作而 切斷 法，應用於一液 一由複數條掃插 列’而該修補方 提供一修補線 一第一交會處以 該修補線段之_ 達成電連接；以 第二雷射光進行一 別位於該第一交會 根據上述構想 二雷射光之波長係 (nm)〇 本案之第三方 液晶顯示器之製造 描線與複數條資料 線結構僅包含：_ 外側，用以與一具 與具缺陷之資料線 對該等交會處提供 連接，以及對該修 點提供一第二雷射 之一第 切斷動 處與該 ，缺陷 分別為 作而達 第二交 修補方 1 0 64奈 點與一第二切斷點，以 成斷路 會處所構 法中該第 米（nm)以 而該等切斷點分 成線段之兩側。 一雷射光與該第 及5 3 2奈米 面係為一種缺陷修補 上，該液晶顯示器包 線交錯構成之矩形像 修補線段，設於該矩 缺陷之資料線產生一 鄰近之正常資料線產 —第一雷射光進行一 線結構 應用 複數 而該 列之 第一交會處以 交會 而達 第二 含有一由 素陣列， 形像素陣 生一第二 焊接動作 補線段上之一第一切斷點與一 光進行一切斷動作而達成斷路 1225172 五、發明說明（4) 切斷點分別位 之兩側。 本案之第 液晶顯不之 描線與複數條 線結構僅包含 外側，用以與 與具缺陷之掃 對該等交會處 連接，以及對 點提供一第二 切斷點分別位 之兩側。 本案之第 液晶顯不裔之 描線與複數條 線結構僅包含 邊外側，用以 該與具缺陷之 處，對該等交 成電連接，以 切斷點提供一 該等切斷點分 線段之兩側； 於該第一交會處 四方面係為一種 製造上 弟二交會處所構成線段 缺陷修補線結構，應用於一 顯示器包含有一由複數條掃 之矩形像 該液晶 資料線交錯構成 :一修補線段， 一具缺陷之掃描線產生一第一交會處 素陣列，而該修補 設於該矩形像素陣列之一邊 以及該 會處， 提供一第一雷射光進行一焊接動作而達成電 該修補線段上之一第一切斷點與一第二切斷 而該等 成線段 描線鄰近之正常資料線產生一第 雷射光進行一切斷動作而 於該第一交會處與該第二 五方面係為一種 製造上，該液晶 資料線交錯構成 :第一修補線段 與一具缺陷之資 近之正 資料線鄰 會處提供 及對該修補線段上之一 第二雷射光進行一切斷 別位於該第一交 以及第 達成斷路， 交會處所構 缺陷修補線結構，應用於一 顯示器包含有一由 之矩形像素陣列， ，設於該矩形像素 料線產 常資料 生一第一交 線產生一第 第一雷射光進行一焊接 第一切斷點 會處與 修補線段，設 動作而達成 該第二交會 於該矩形像 複數條掃 而該修補 陣列之一 會處以及 二交會 動作而達 與一第二 斷路，而 處所構成 素陣列之1225172 V. Description of the invention (2) A plurality of loop repair lines (repaii_ Unes) around the array J. A schematic diagram of the top view. In the conventional technology, five = repair lines around the array 21 are usually provided. 1, 202, 2 0 3, 2 04, 2 05, or == disconnection and other defects (as shown in the figure is a data line for the array 21, we conveniently use laser light to the area ι2 = motion Λ performs a cut kcut operation on the area 2013 and the area 4 to achieve the effect of repair. At the point of using the loop repair line mentioned above (1) What is the signal transmission line after repair? The signal delay (RC tlme delay) HW 'is very easy to cause serious panel movement and cause production efficiency > The repair action needs to occupy a large area of llnes) structure, reducing the broken glass ^ 3) repair line (repair to improve the above defects, is for development :: the use of substrates, and how this case is a defect repair method, Go to the purpose of S. The LCD display includes two, a rectangular pixel array composed of staggered material lines for a liquid crystal display. A plurality of scanning lines and a plurality of pixels are arranged outside one side of the rectangular pixel array. The repairing method includes: only the data line of ^ and one of the repairing line segments; two of the repairing line segments; and a normal data line adjacent to the material line and the defect; two: processing and the defective one with a first laser light. Welding one of the second intersections of the supplementary line, one of the second supplementary line segments—the first cut-off point and the second cut-off point—are connected electrically; and the two lights are subjected to a cut-off action to reach the second cut-off point. Second reggae The intersection of the first intersection and the second intersection =, and the cut-off points are respectively located on both sides of the line segment according to the above conception. The first laser light and the 1225172, invention description (3) The wavelength of the two laser beams (nm) 〇 The manufacturing method of the other cubic display and the multiple data line methods in this case include: only in the moment; In order to solve the above problem, the above five patch lines are 1064 nanometers (nm) and 5 3 2 nanometers, and the normal patching method is adjacent to the pixel scanning line line of the liquid staggered configuration. The device includes a side of one of the matrix arrays with visible pixel array crystals, and the scanning line of the repairing line segment and the light beam are cut by a welding operation. The method is applied to a liquid one by a plurality of scanning and inserting lines, and the repairing side provides a The repair line 1 uses the _ of the repair line segment to reach the electrical connection; the second laser light is used to perform a second laser light at the first trade fair according to the above conception. The wavelength of the second laser light (nm). The trace line and multiple data line structures only include: _ outside, which is used to provide a connection with a defective data line to these intersections, and to provide a second laser to the repair point With this, the defects are made to reach the second crossing repairing side of 1.064 nanometers and a second cut-off point to form the first meter (nm) in the construction method of the circuit breaker club, and the cut-off points are divided into line segments. A laser light and the 5th and 2nd nanometer planes are used for defect repair, and the rectangular image repairing line segment formed by the LCD monitor envelope is interlaced, and the data line set at the moment defect generates an adjacent normal data line. Production—the first laser light performs a one-line structure application plural and the first intersection of the column is intersected to reach the second containing a prime array, a shaped pixel array, a first welding point on a second welding action line segment and A light performs a cutting action to achieve a break 1225172 V. Description of the invention (4) The cutting points are on both sides of the bit. The liquid crystal display trace and plural line structures in this case only include the outer side, which is used to connect to the intersections with defective sweeps, and to provide a second cut-off point on both sides of the point. The liquid crystal display line and plural line structures in this case only include the outer sides of the edges, which are used for the connection with the defects, and are electrically connected to the intersections, and the cutting points are provided with a line segment of the cutting points. On both sides; on the four sides of the first intersection is a manufacturing line segment repair line structure composed of the upper brother second intersection premises, applied to a display containing a rectangular image composed of a plurality of sweeps, and the liquid crystal data lines are staggered: a repaired line segment A defective scanning line generates a first intersection element array, and the repair is provided on one side of the rectangular pixel array and the meeting place, and a first laser light is provided to perform a welding operation to achieve electricity on the repair line segment. A first cut-off point and a second cut-off, and the normal data lines adjacent to the line-forming segments generate a first laser light to perform a cut-off action at the first intersection and the second-fifth aspect. The liquid crystal data line is staggered: the first repair line segment and a defective data line near the positive data line are provided next to and a second laser light on the repair line segment is provided. A cutting line is located at the first intersection and the first breaking line, and the defect repair line structure constructed at the intersection is applied to a display including a rectangular pixel array, and a first intersection line is generated on the rectangular pixel material production data. A first laser light is generated, a welding is performed at the first cut-off point and the repairing line segment, and the action is set to achieve the second intersection in the rectangular image, and one of the repairing array and the second intersection are reached. Disconnected from a second, and the premises constitute a
第7頁 1225172 五、發明說明（5) 一邊外側，用以與一具缺陷之掃描線產生一第三交會處以 及該與具缺陷之掃描線鄰近之正常資料線產生一第四交會 處，對該等交會處提供一第一雷射光進行一焊接動作而達 成電連接，以及對該修補線段上之一第三切斷點與一第四 切斷點提供一第二雷射光進行一切斷動作而‘達成斷路，而 該等切斷點分別位於該第一交會處與該第二交會處所構成 線段之兩側。Page 7 1225172 V. Description of the invention (5) One side is used to create a third intersection with a defective scanning line and a fourth intersection with the normal data line adjacent to the defective scanning line. The intersections provide a first laser light to perform a welding operation to achieve an electrical connection, and a third laser cutting point and a fourth cutting point to a second laser light to perform a cutting operation on the repaired line segment. 'A break was reached, and the cut-off points were located on both sides of the line segment forming the first intersection and the second intersection.
根據上述構想，缺陷修補線結構中所使用之該第一雷 射光與該第二雷射光之波長係分別為1 0 6 4奈米（nm )以及 5 3 2奈米（n m)。 本案得藉由下列圖式及詳細說明，俾得一更深入之了 解： 第一圖：其係一薄膜電晶體液晶顯示器（TFTLCD)之一單元 電路方塊示意圖。 第二圖：其係習用環狀修補線之結構示意圖。 第三圖（a):其係本案較佳實施例之走線構造示意圖。 第三圖（b):其係本案較佳實施例之部分走線與資料線之 細部構造不意圖。 本案圖式中所包含之各元件列示如下：According to the above conception, the wavelengths of the first laser light and the second laser light used in the defect repair line structure are 1064 nanometers (nm) and 532 nanometers (n m), respectively. In this case, a more in-depth understanding can be obtained through the following drawings and detailed descriptions: Figure 1: It is a block circuit diagram of a unit of a thin film transistor liquid crystal display (TFTLCD). The second picture: it is a schematic diagram of the structure of a conventional ring repair line. The third figure (a) is a schematic diagram of the wiring structure of the preferred embodiment of the present case. The third figure (b): it is the detailed structure of part of the routing and data lines of the preferred embodiment of the present case is not intended. The components included in the scheme of this case are listed as follows:
薄膜電晶體1 1 液晶1 2 像素電極1 3 1 共同電極1 3 2 背面光源1 4 儲存電容1 5 環狀修補線2 0 1、2 0 2、2 0 3、2 0 4、2 0 5 陣列2 1Thin film transistor 1 1 Liquid crystal 1 2 Pixel electrode 1 3 1 Common electrode 1 3 2 Back light source 1 4 Storage capacitor 1 5 Ring repair line 2 0 1, 2 0 2, 2 0 3, 2 0 4, 2 0 5 Array twenty one
第8頁 1225172 五、發明說明（6) 資料線2 2 區域2013、區域 修補線段3 1 1、 缺陷資料線3 2 第二交會處342 第二切斷點344 請參見第三 示意圖，其中液 描線與複數條資 列3 0之外側，該 段 3 1 1、3 1 2，如 而在薄膜電 掃描線早於第一 生缺陷之機率較 資料線通常是在 成，因此產生缺 故以下就資 三圖（b )，其係i 示意圖，此時吾 3 2交會之第一交 常資料線3 3與該 一雷射光進行一 段上之第一切斷 .2014 312Page 8 1225172 V. Description of the invention (6) Data line 2 2 Area 2013, Area repair line segment 3 1 1. Defect data line 3 2 Second intersection 342 Second cut-off point 344 Please refer to the third schematic diagram, where the liquid trace line With a plurality of items listed outside 30, the section 3 1 1, 3 1 2 is more likely than the data line in the thin film electrical scanning line to be earlier than the first-generation defect. The third figure (b) is a schematic diagram of i. At this time, the first intersection data line 3 3 at the intersection of 3 and 2 and the first laser beam is cut for the first time. 2014 312
區域20U、區域2012 矩形像素陣列3 0 正常資料線3 3 第一交會處341 第一切斷點343 圖（a )，其係本案較佳實施例之走線構造 晶顯示器之矩形像素陣列3 0係由複數條掃 料線，如圖所示，本案係於該矩形像素陣 等掃描線與資料線之尾端各提供一修補線 此即可完成其修補結構。 晶體液晶顯示器之製造過程中，通常由於 道光罩微影姓刻製程中已然完成，因此產 低且可立即進行重新製作（re-work)，但 第三道或第四道光罩微影蝕刻製程中才完 陷之機率較高。 疋 料線缺陷之修補方法進行描述，請參見第 卜人所發現一具缺陷資料線3 2之局部構造 人係對於該修補線段3 1 2與具缺陷資料線 會處3 4 1以及該具缺陷資料線3 2鄰近之正 修補線段31 2之一第二交會處342，以〜第 焊接動作而達成電連接，並再將該修補線 點3 4 3與第二切斷點344，以一第二雷射、光 1225172 五、發明說明（7) |進行一切斷動作而读 |點分別位於該第—六f ί路，由圖可清處看出，該等切斷 I側。如此一來，正^二二與該第二交會處所構成線段之兩 342、第一交會處線33之訊號便可通過第二交會處 一雷射光之波長係可為f f缺陷貧料線32修復。至於第 一帝射光之波|係 示米（ηίΠ )，而需.能量較高之第 一田射光f波長係可為之5 32奈米（nm)〇 關於邱近正常資料線3 3之選擇， I之傳送方式，以—般三原色（二且頁㈣糸統 |示，選擇同一原^日式 ，吾人便可如第三圖（b)所 二&擇2原色且同為偶數（或奇數）之鄰近正 :再ί; 缺陷之修補方法與上述並無太多不同，故 綜上所述，本案技術所修補完成之 :移動：ί之本案之修補線段可供多個斷線進行修補且毋 ，移動過長之距離，且修補線段結構並不佔據 毋 央，、…“ Γ 徹底改善上述習用缺 获之ί = ϊ案之主要㈣。故本案發明得由熟習此技 *之人士任施匠思而為諸般修飾， 议 I範圍所欲保護者。 …、白不脫如附申請專利Area 20U, area 2012 rectangular pixel array 3 0 Normal data line 3 3 First intersection 341 First cut-off point 343 Figure (a), which is a rectangular pixel array of a line structure crystal display 3 of the preferred embodiment of the present case 3 0 A plurality of scanning lines are provided. As shown in the figure, the repair line is provided by providing a repairing line at each end of the scanning line and the data line of the rectangular pixel array. In the manufacturing process of crystalline liquid crystal displays, the mask lithography is usually completed in the lithography process, so the yield is low and re-work can be performed immediately, but the third or fourth mask lithography process is in progress. The chances of getting trapped are high. For the description of the repair method of the material line defect, please refer to the local structural person of a defective data line 3 2 discovered by Dibu. For the repair line segment 3 1 2 and the defective data line 3 3 1 and the defective The data line 3 2 is adjacent to one of the second repair line segments 31 2 at the second intersection 342, and is electrically connected by the ~ th welding operation, and the repair line point 3 4 3 and the second cut-off point 344 are connected by a first Two lasers, light 1225172 V. Description of the invention (7) | Perform a cutting action and read | The points are located on the first-sixth f ί roads respectively, as can be seen from the figure, the cuts are on the I side. In this way, the signals of the two lines 342 and the first intersection line 33 that form the second and second intersections can pass through the second intersection at a laser light wavelength that can be repaired for the FF defect lean material line 32 . As for the wave of the first emperor's light | is Shemi (ηίΠ), it is necessary. The f-wavelength of the first field light with a higher energy can be 5 32 nanometers (nm). About the choice of Qiu Jin normal data line 3 3 The transmission method of I is in the same three primary colors (two and the same page) | choose the same original ^ Japanese style, we can choose two primary colors and the same even number (or (Odd number) is adjacent: then ί; the repair method of the defect is not much different from the above, so in summary, the repair completed by the technology of this case: moving: the repair line segment of this case can be repaired by multiple broken lines Moreover, the distance is too long, and the repair of the line segment structure does not occupy Wuyang, ... "Γ completely improves the above-mentioned conventional lack of = = the main problem of the case. Therefore, the invention of this case may be left to those who are familiar with this technique * The craftsman thinks about all kinds of modifications, and I want to protect those who want to protect the scope.
第10頁 1225172 圖式簡單說明 第一圖：其係一薄膜電晶體液晶顯示器（TFTLCD)之一單元 電路方塊示意圖。 第二圖：其係習用環狀修補線之結構示意圖。 第三圖（a):其係本案較佳實施例之走線構造示意圖。 第三圖（b):其係本案較佳實施例之部分走線與資料線之 細部構造示意圖。Page 10 1225172 Schematic description of the first picture: It is a block circuit diagram of a unit of a thin film transistor liquid crystal display (TFTLCD). The second picture: it is a schematic diagram of the structure of a conventional ring repair line. The third figure (a) is a schematic diagram of the wiring structure of the preferred embodiment of the present case. The third figure (b): it is a detailed structure diagram of part of the routing and data lines in the preferred embodiment of the present case.