TWI222699B - Method for manufacturing micro pipe device - Google Patents
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- TWI222699B TWI222699B TW92107196A TW92107196A TWI222699B TW I222699 B TWI222699 B TW I222699B TW 92107196 A TW92107196 A TW 92107196A TW 92107196 A TW92107196 A TW 92107196A TW I222699 B TWI222699 B TW I222699B
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1222699 —〜—.1222699 — ~ —.
五、發明說明(U 發明所屬之技術領域: 本土明係有關於一種微管(M i crο P i pe )元件之製造方法, 特別 a a 有關於一種利用紫外光(U11 r a - v i ο 1 e t ; U V )照射光 阻層來製作微管元件之方法。 先前技術:V. Description of the invention (Technical field to which the U invention belongs: There is a method for manufacturing a micro tube (M i crο P i pe) element, especially aa related to a method using ultraviolet light (U11 ra-vi ο 1 et; UV) method for manufacturing a microtubule element by irradiating a photoresist layer.
近年來’由於積體電路(1C)製程技術的日新月異,促使微 機電系統(Micro-electromechanical System ; MEMS)的蓬 勃發展’並加速了微機電元件的微小化腳步。由於,微機 電系統具有高度的擴充性、微縮化、以及批次量產能力等 優勢’除此之外,微機電系統是用的範圍相當的廣,不僅 可以使用於光電科技的領域更能適用於生物科技的範疇。 目前相當受到注目的微管元件,即為微機電系統中一重要 的元件。微管元件適用於微機電系統中流體的傳導,或是 運用於將液體藥物傳送入細胞内的任務。In recent years, “the rapid development of integrated circuit (1C) process technology has promoted the vigorous development of micro-electromechanical system (MEMS)” and has accelerated the miniaturization of micro-electromechanical components. Because MEMS have the advantages of high scalability, miniaturization, and batch production capacity, etc. In addition, MEMS are widely used, which can be used not only in the field of optoelectronic technology, but also more applicable. In the field of biotechnology. At present, microtubule components, which have attracted considerable attention, are an important component in microelectromechanical systems. Microtubule elements are suitable for conducting fluids in microelectromechanical systems, or for the task of delivering liquid drugs into cells.
請參見第1圖,第1圖係繪示習知在半導體基底上製造微管 元件的方法。在基底100上先形成溝槽102,溝槽102可以為 V型、ϋ型或是所需的形狀。接著,一極薄的玻璃板1〇4黏著 並覆蓋於基底100之上而完成所需要的微管元件。習知的微 管元件的製造方法有下列的缺點··第一、玻璃板1 〇 4覆蓋上 基底1 0 0之後,後續的半導體製程無法繼續實施於玻璃板 1 04之上,所以,此方法所製造的微管元件不適用於複雜的Please refer to FIG. 1. FIG. 1 illustrates a conventional method for manufacturing a microtubule element on a semiconductor substrate. A trench 102 is first formed on the substrate 100. The trench 102 may be V-shaped, V-shaped, or a desired shape. Next, an extremely thin glass plate 104 is adhered and covered on the substrate 100 to complete the required microtubule components. The conventional manufacturing method of the microtube element has the following disadvantages. First, after the glass plate 104 is covered with the substrate 100, subsequent semiconductor processes cannot be implemented on the glass plate 104. Therefore, this method The manufactured microtubule components are not suitable for complex
第4頁 1222699 五、發明說明(2) 微機電系統;第二、微管元件一般係用於傳輸流體,黏著 玻璃板104和基底1〇〇的黏著層可能因流體的腐蝕性或是使 用一段時間後而鬆動造成流體的逸漏。因此,習知的微管 元件並不適用於半導體製程之上。 了個新的微管元件的製造方法在美國專利第6, 228, 744號中 被提出’美商萬國商業機器公司在該號專利中揭露了利用 半導體製程在基底上製造微管元件。請參照第2圖,第2圖 係繪示習知利用半導體製程所製造之微管元件剖面示意 圖。提供一基底(未繪示於圖上),在基底上形成一材質 層200 ’在材質層200内形成溝渠2〇2,以一化學氣相沉積製 程沉積一材質層204於基底200之上,控制化學氣相沉積的 條件及溝渠202的南寬比(aspect ratio),材質層204具 有懸垂(Overhang ) 206而在溝渠2 02内形成空洞 (Via)208,最後在沉積另一材質層21〇於材質層2〇4之上而 完成微管元件的製程。 ~ 美商萬國商業機器公司所揭露的微管元件的製造方法雖然 解決習知微管兀件製程的缺點,可以將微管元件的製程併 入一般半導體製程之内,但仍然存在非常多的限制。溝渠 2 0 2的咼度必須大於寬度’在實施例中揭露溝渠2 q 2高产^ 寬度的比等於2,由於材質層200形成的厚度受到限^ ^因 此,微管元件的尺寸大小受到限制。另外,即使材質層2〇〇 形成的厚度夠厚’钮刻如此後的材質以形成夠寬的溝^以 能形成所需尺寸大小的微管元件會是一件相當辛苦、^難 且高成本的工作。 、Page 412222699 V. Description of the invention (2) Micro-electro-mechanical system; Second, the micro-tube components are generally used to transmit fluid. The adhesive layer that adheres the glass plate 104 and the substrate 100 may be corrosive to the fluid or use a section. Looseness after time causes fluid leakage. Therefore, the conventional microtubule components are not suitable for semiconductor processes. A new method for manufacturing microtubule components is proposed in U.S. Patent No. 6,228,744. 'American Business Machines Corporation discloses in this patent that a microtubule component is manufactured on a substrate using a semiconductor process. Please refer to FIG. 2. FIG. 2 is a schematic cross-sectional view of a microtubular element manufactured by a conventional semiconductor process. Provide a substrate (not shown in the figure), form a material layer 200 on the substrate, and form a trench 202 in the material layer 200, and deposit a material layer 204 on the substrate 200 by a chemical vapor deposition process. The conditions of chemical vapor deposition and the aspect ratio of the trench 202 are controlled. The material layer 204 has an overhang 206 to form a cavity 208 in the trench 202. Finally, another material layer 21 is deposited. The manufacturing process of the microtubule element is completed on the material layer 204. ~ Although the manufacturing method of microtubule components disclosed by American International Business Machines Co., Ltd. solves the shortcomings of the conventional microtubule component manufacturing process, the process of microtubule components can be incorporated into the general semiconductor manufacturing process, but there are still many restrictions. . The width of the trench 2 0 2 must be greater than the width. In the embodiment, it is revealed that the trench 2 q 2 has a high yield ^ The width ratio is equal to 2, because the thickness of the material layer 200 is limited ^ Therefore, the size of the microtube element is limited. In addition, even if the thickness of the material layer 2000 is thick enough, the material after such a button is engraved to form a wide groove ^ to form a micro-tube element of a desired size can be a laborious, difficult and costly process. work. ,
五、發明說明(3) ----- 有鑑於此,簡易、快速且不受 管元件製造方法是業界—致的需^適用於半導體製程的微 發明内容: 鑒·於上述習知製造微管元件的 製程,或為所使用的方法受制於為*剌於半導體 求來製造所需尺寸大小的微管4有5程技術,無法隨需 微管元件的製造方法,1 # ’因此’本發明提供- 可依需求製造所需尺寸大小之微管::體…上’而且 =方ί發目的之一就是在提供-種微管元件之 佳及無法與半導體製程;=題因此可以避免密合度不 本發明之另一目的科、θ m &丄^ 係對基底上之光阻層; = =管=時’其V. Description of the Invention (3) ----- In view of this, the simple, fast and unregulated component manufacturing method is the industry's need. ^ Micro-invention suitable for semiconductor process The manufacturing process of the tube element, or the method used is subject to the manufacture of microtubes of the required size for semiconductors. There are 5 process technologies, and the method of manufacturing microtube elements cannot be used on demand. The invention provides-microtubules of the required size can be manufactured according to demand: and the body is one of the purposes of the Fangfa is to provide-a kind of microtubule components that are not good and cannot be manufactured with semiconductors; The degree of combination is not another object of the present invention. Θ m & 丄 ^ is a photoresist layer on the substrate; == 管 = 时 '其
;牛:使光阻層梹起,:形製步 紅步驟,且易於施行。 閲亿I 再一目的就是在提供-種微管元件的製造方法, 所需:微管步驟處理光阻層’可依 渠的高寬比。寸來製不必受限於基底上溝 上所述之㈣,本發明更提供了一種微管元件之製 :上形成括下列之步驟:先提供一基底,,在此基 一 ^成至 > 一溝渠。再形成一能感層,例如光阻層,覆 1222699 五、發明說明(4) 蓋在上述之基底之 層的厚度會大於基 之光阻層進行一後 一能量激發步驟, 阻層會與基底之表 管元件。 此外,更可在此基 成一溝渠。再形成 基底之上以及溝渠 底表面上能感層的 處理,後處理可以 例如’紫外光處理 分離而拱起形成一 因此,微管元件結 層’例如光阻層, 然’凹陷結構可以 中。 基底的材質除了半 材質均試用本發明 此’本發明之微管 便。 上以及溝渠之内 底表面上能感層 處理,後處理可 例如 ’其中,溝 的厚度。接 以為一輻射 束外光處理,藉以 面分離而拱起形成一弧形結 底上先形成一材 一能感層,例如 之内,溝渠内的 厚度。接著,對 為一輻射處理步 ,藉以使溝渠内 弧形結構而形成 構係為基底上之 所具有的一凸起 位於基底内或是 導體材質之外, 所提供的方法在 元件應用性相當 質層,再於 光阻層,覆 能感層的厚 上述之光阻 驟或一能量 光阻層會與 微官元件。 一凹陷結構 結構的結合 基底上其他 所有的絕緣 其上形成微 廣,使用上 渠内的能感 著,對上述 處理步驟或 使溝渠内光 構而形成微 材質層中形 盡在上述之 度會大於基 層進行一後 激發步驟, 基底之表面 以及能感 所定義。當 材質層之 材質及導體 管元件。因 也較為方 鬱 實施方式: 五、發明說明(5) 本發明揭露一種彳轉总-丄 一溝渠,在开彡点二二兀牛之製造方法,係先於基底上形成 底上之光阻層3 = ”底之上。利用紫外光照射基 免習知製;2:易;實施可與半導體製程結合,也可避 備,可表昭πτ幻& 為了使本發明之敘述更加詳盡與完 請參照第3圖至第ί ^合第3圖至第5圖之圖示。 微管元件之势程叫^顧其係繪示本發明之一較佳實施例之 在美底3ηη μ' σ圖。本發明之微管元件的製作首先係 其以例如沉積的方式覆蓋輔助材質層302,A中 基f〇G之材質可以為半導體材質,例如扣i)和πηΙ 緣J才質’例如玻璃及導體材質等等,而辅助材質 :任音:人二選自於介電材質、金屬材質、金屬氧化物及 金i::: :族群’且辅助材質層302之材質較佳為 如微影以及巍幻=材質層302也不限於一層。接著,利用例 材質;302之式定義辅助材質層302 ’藉以去除辅助 部分而形成溝渠,暴露出基底_之表面, 第3圖所不’其中’溝渠3〇4的深度約介於丨微米至2〇微 产'可J 微米至削微米,#,溝謂4的深度與寬 度了依而求而疋,並不以此為限。 = 304形成後’以例如旋塗(_ CQating)的方式形成能 感層、’例如光阻層306覆蓋在溝渠3〇4所暴露之基底3〇〇表 面、以及辅助材質層3〇2上。其中,光阻層3〇6之材質可例 如含有乳酸乙酯(Ethyl Lactate)或醋酸正丁 Acetate) ’如第4圖所示。 yi 1222699 五、發明說明(6) 後’利用例如紫外光照射對光阻層 處理步驟,光阻層3〇6會分解產生氣 点產生工間310,進而在基底3〇〇上 :成,結構如第5圖所示…,紫外光之波長介籌:。奈所 ς η:至350奈米之間,且紫外光之強度介於5〇〜⑸毫焦 理^驟之平ϋ分(㈣2)。此外’光阻層3〇6之紫外光照射處 ^驟之&度較佳是控制在介於15〇它至25〇它之間,且 夕3射處理步驟之進行時間較佳是控制在介於Μ分鐘至 cJ U分鍾之間。 可實施於基底之上,直接在基底上形成溝渠 f續別述的製程形成微管元件,根據本發明所提供的製造 法/斤/成的微管元件電子顯微鏡照相圖如第6圖所示。在 第6圖中可見到基底400、溝渠憎、光阻層綱、狐形結 乂6及空間408,#中,空間4〇8即為微管元件中的通道部 分二,此,經由上述之製程可以得到一微管元件結構,此 一微管元件結構係由基底4〇〇上之一凹陷結構,例如一 402與位於基底4〇〇上之能感層,例如一光阻層4〇4之一凸起 結構,例如弧形結構406所結合定義而成。溝渠4〇2與弧形 結構406形成微管元件結構的管壁,而溝渠4〇2與弧形結構 406所圍成的空間4〇8即為微管元件中的通道部分。 本發明亦可實施於已具有元件結構之半導體基底或銦錫氧 化玻璃基底之上,依前述之製程來形成微管元件。本發明; Bull: make the photoresist layer lift up: form step red step, and easy to implement. A further purpose of reading Yiyi is to provide a method for manufacturing a microtubule element, which is required: the microtubule step processing of the photoresist layer 'can depend on the aspect ratio of the channel. The system is not limited to the above-mentioned grooves on the substrate. The present invention further provides a system of microtubular elements: forming the substrate includes the following steps: first providing a substrate, and then forming the substrate into > ditch. Then form a photosensitive layer, such as a photoresist layer, covering 1222699. 5. Description of the invention (4) The thickness of the layer covered on the above substrate will be greater than the thickness of the photoresist layer on the substrate. Table tube components. In addition, a trench can be formed here. The formation of the sensitive layer on the substrate and the bottom surface of the trench is further formed, and the post-processing can be separated and arched by, for example, 'ultraviolet light treatment'. Therefore, the micro-tube element junction layer, such as a photoresist layer, can be formed. The material of the substrate was tested except the semi-materials of the present invention. The upper layer and the inner surface of the trench can be treated with a sensing layer, and the post-processing can be, for example, 'the thickness of the trench. Then, a radiation beam is used for external light treatment, and the surface is separated to be arched to form an arc-shaped junction. A material and a sensitive layer are formed on the bottom, for example, the thickness in the trench. Next, the method is a radiation treatment step, so that the arc structure in the trench is formed to form a structure on the substrate. A protrusion on the substrate is located in the substrate or outside the conductor material. The provided method is quite applicable in component application. Layer, and then the photoresist layer. The thickness of the photoresist step or an energy photoresist layer covered with the energy-sensing layer will interact with the micro-organic element. A recessed structure is combined with all the other insulations on the substrate to form a micro-wide, using the feeling in the upper channel, the above processing steps or the photo-structuring in the channel to form a micro-material layer in the above-mentioned degree will be done in the above degree. Larger than the base layer, a post-excitation step is performed, as defined by the surface of the substrate and the energy sensation. When the material of the material layer and the conductor tube element. The implementation method is also relatively elegant: V. Description of the invention (5) The present invention discloses a manufacturing method of a two-headed cow at the opening and closing point, which is a photoresist on the substrate. Layer 3 = "above the bottom. Utilizing ultraviolet light to irradiate the free-standing system; 2: easy; implementation can be combined with semiconductor processes, or can be avoided, can be shown πτ magic & In order to make the description of the present invention more detailed and Please refer to Figs. 3 to 5 and Fig. 3 to Fig. 5. The potential course of the microtubule element is called ^ Gu Qi, which shows a preferred embodiment of the present invention at the bottom 3ηη μ ' σ diagram. The production of the microtubule element of the present invention firstly covers the auxiliary material layer 302 by, for example, a deposition method, and the material of the base f0G in A may be a semiconductor material, such as a button i) and a πηΙ edge. Glass and conductor materials, etc., and auxiliary materials: Ren Yin: The second person is selected from the group consisting of dielectric materials, metal materials, metal oxides, and gold. Shadow and miracle = material layer 302 is not limited to one layer. Next, use the example material; Auxiliary material layer 302 'Trenches are formed by removing auxiliary parts, exposing the surface of the substrate, which is not shown in Fig. 3', where 'the depth of the trench 30 is between 丨 micrometer and 20 micro-production', and can be J micrometer to chipping The depth and width of the micrometer, #, and the groove 4 are determined according to the requirements, and are not limited to this. = 304 After the formation, 'the photosensitive layer is formed by, for example, spin coating (_CQating),' such as the photoresist layer 306 covers the surface of the substrate 300 exposed by the trench 300 and the auxiliary material layer 300. The material of the photoresist layer 300 may include, for example, Ethyl Lactate or Acetate ) 'As shown in Figure 4. yi 1222699 V. After the description of the invention (6)' The photoresist layer is treated by, for example, ultraviolet light irradiation, and the photoresist layer 3 06 will be decomposed to generate a gas point to generate the workshop 310, and then On the substrate 300: Yes, the structure is shown in Figure 5 ..., the wavelength of the ultraviolet light is interposed:... Η: to 350 nm, and the intensity of the ultraviolet light is 50 to ⑸mJ. The ^ step is divided into two points () 2). In addition, the photoresist layer 306 is exposed to ultraviolet light. It is between 15 and 25, and the duration of the three-shot process step is preferably controlled between M minutes and cJ U minutes. It can be implemented on the substrate and formed directly on the substrate The trench f continues to form a microtubule element by a process described later, and an electron microscope photograph of the microtubule element according to the manufacturing method provided in the present invention is shown in FIG. 6. In FIG. 6, the substrate 400 and the trench can be seen. The photoresist layer, the photoresist layer, the fox-shaped structure 6 and the space 408, #, the space 408 is the second part of the channel in the microtubule element. Therefore, a microtubule element structure can be obtained through the above process. The microtubule element structure is a concave structure on the substrate 400, such as a 402 and a sensing layer on the substrate 400, such as a convex structure on the photoresist layer 400, such as an arc structure 406. Combined. The trench 40 and the arc-shaped structure 406 form a tube wall of the microtubule element structure, and the space 408 surrounded by the trench 40 and the arc-shaped structure 406 is a channel portion in the microtubule element. The present invention can also be implemented on a semiconductor substrate or an indium tin oxide glass substrate that already has a device structure, and a microtubular device is formed according to the aforementioned process. this invention
1222699 五、發明說明(7) 更可以用於製 件之後,弧形 後,可以再依 管元件。然, 以調整,並不 因此,本發明 紫外光照射處 程。因此,可 本發明之另一 需額外製程, 常微小之微管 元件。 造複層 光阻層 前述製 本發明 限於上 之一優 理,即 大幅減 優點就 製程簡 元件, 微管元件, 已硬化,在 程繼續製造 之相關製程 述限制。 點就是因為 可使光阻層 少製程步驟 是因為本發 早易施行。 更可依需求 在依前述方法形成微管_ 沉積上另外一層材質層2 微官元件而形成複層之 參數可依實際製程需求; 本發明僅需對光阻層進行 拱成弧形,並不需額外製 ’達到簡化製程的目的。 明在製作微管元件時,不 因此,不僅可獲得尺寸非 製造所需尺寸大小之微管 如熟悉此技術之人員所瞭解的,以上所述僅為本發明之較 佳實施例而已,並非用以限定本發明之申請專利範圍;凡 其它未脫離本發明所揭示之精神下所完成之等效改變或修 飾,均應包含在下述之申請專利範圍内。1222699 V. Description of the invention (7) It can be used after the part, and after the arc, it can be controlled by the part. However, to adjust, it is not because of the ultraviolet irradiation process of the present invention. Therefore, another process of the present invention may require an extra-manufactured, very small microtubule element. The above-mentioned manufacturing method of the present invention is limited to one of the above advantages, that is, the advantages are greatly reduced, the manufacturing process is simplified, and the microtubule components have been hardened. The manufacturing process continues to limit the related manufacturing process. The point is that the photoresist layer can be made less process steps because the present invention is easy to implement early. According to the requirements, the micro-tubes can be formed according to the aforementioned method. Deposition of another layer of material layer 2 micro-organic elements to form a multi-layer layer can be performed according to actual process requirements. The present invention only needs to arch the photoresist layer into an arc shape. Additional system is needed to achieve the purpose of simplifying the process. It is clear that when manufacturing microtubule components, not only can microtubules with dimensions other than the required dimensions be obtained. As will be understood by those skilled in the art, the above description is only a preferred embodiment of the present invention and is not intended to be used. To limit the scope of patent application of the present invention; all other equivalent changes or modifications made without departing from the spirit disclosed by the present invention should be included in the scope of patent application described below.
第10頁 1222699 圖式簡單說明 本發明的較佳實施例已於前述之說明文字中輔以下列圖形 做更詳細的闡述,其中: 第1圖係繪示習知在半導體基底上製造微管元件的方法; 第2圖係繪示習知利用半導體製程所製造之微管元件剖面示 意圖;以及 第3圖至第5圖,其係繪示本發明之一較佳實施例之微管元 件之製程剖面圖。 第6圖係為本發明所提供的製造方法所完成的微管元件電子 顯微鏡照相圖。 圖式標記說明: 100、2 0 0、3 0 0 :基底 102:溝槽 10 4:玻璃板 2 0 2、3 0 4 :溝渠 2 0 4、2 1 0 :材質層 2 0 6 :懸突 2 0 8 :空洞 3 0 2 :輔助材質層 306、306a、306b:光阻層 3 0 8 :弧形結構 3 1 0 :空間Page 10 1222699 Schematic illustration of the preferred embodiment of the present invention has been described in more detail in the preceding description with the following figures, where: Figure 1 shows the conventional manufacturing of microtubule components on a semiconductor substrate FIG. 2 is a schematic cross-sectional view of a microtubular element manufactured by a conventional semiconductor process; and FIGS. 3 to 5 are schematic views illustrating a microtubule element manufacturing process according to a preferred embodiment of the present invention. Sectional view. Fig. 6 is an electron micrograph of a microtubule element completed by the manufacturing method provided by the present invention. Description of graphical symbols: 100, 2 0 0, 3 0 0: base 102: groove 10 4: glass plate 2 0 2, 3 0 4: trench 2 0 4, 2 1 0: material layer 2 0 6: overhang 2 0 8: cavity 3 0 2: auxiliary material layers 306, 306a, 306b: photoresist layer 3 0 8: arc structure 3 1 0: space
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