TWD191424S - Part of the bracket for the electronic component test device - Google Patents
Part of the bracket for the electronic component test deviceInfo
- Publication number
- TWD191424S TWD191424S TW106305530F TW106305530F TWD191424S TW D191424 S TWD191424 S TW D191424S TW 106305530 F TW106305530 F TW 106305530F TW 106305530 F TW106305530 F TW 106305530F TW D191424 S TWD191424 S TW D191424S
- Authority
- TW
- Taiwan
- Prior art keywords
- bracket
- design
- electronic components
- electronic component
- pallet
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title abstract description 6
- 239000004065 semiconductor Substances 0.000 abstract description 4
- 239000011159 matrix material Substances 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 abstract 1
Abstract
【物品用途】;本設計之物品為承載半導體集成電路等電子元件的支架。支架安裝於測試半導體集成電路等電子元件電性的電子元件測試裝置中用以搬運的托盤上。支架的左側及右側分別設有凸部及凹部。複數個支架以矩陣方式安裝於托盤上,且相鄰的支架之凸部及凹部互相嵌合,以提高托盤上支架的密度。於測試電子元件時,將支架所承載之電子元件從上方壓在插座上。此時,形成於支架之凸部上的圓形通孔從上方將電子元件壓在插座上時,用以作為導孔。;【設計說明】;圖式所揭露之虛線部分,為本案不主張設計之部分。圖式所揭露之一點鏈線,為本案主張設計之部分與不主張設計之部分的邊界線。
Description
本設計之物品為承載半導體集成電路等電子元件的支架。支架安裝於測試半導體集成電路等電子元件電性的電子元件測試裝置中用以搬運的托盤上。支架的左側及右側分別設有凸部及凹部。複數個支架以矩陣方式安裝於托盤上,且相鄰的支架之凸部及凹部互相嵌合,以提高托盤上支架的密度。於測試電子元件時,將支架所承載之電子元件從上方壓在插座上。此時,形成於支架之凸部上的圓形通孔從上方將電子元件壓在插座上時,用以作為導孔。
圖式所揭露之虛線部分,為本案不主張設計之部分。圖式所揭露之一點鏈線,為本案主張設計之部分與不主張設計之部分的邊界線。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106305530F TWD191424S (zh) | 2017-09-19 | 2017-09-19 | Part of the bracket for the electronic component test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106305530F TWD191424S (zh) | 2017-09-19 | 2017-09-19 | Part of the bracket for the electronic component test device |
Publications (1)
Publication Number | Publication Date |
---|---|
TWD191424S true TWD191424S (zh) | 2018-07-01 |
Family
ID=89072062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106305530F TWD191424S (zh) | 2017-09-19 | 2017-09-19 | Part of the bracket for the electronic component test device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWD191424S (zh) |
-
2017
- 2017-09-19 TW TW106305530F patent/TWD191424S/zh unknown
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