TWD191423S - Part of the pusher for the electronic component test device - Google Patents
Part of the pusher for the electronic component test deviceInfo
- Publication number
- TWD191423S TWD191423S TW106305528F TW106305528F TWD191423S TW D191423 S TWD191423 S TW D191423S TW 106305528 F TW106305528 F TW 106305528F TW 106305528 F TW106305528 F TW 106305528F TW D191423 S TWD191423 S TW D191423S
- Authority
- TW
- Taiwan
- Prior art keywords
- electronic component
- parts
- design
- push
- socket
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title abstract description 11
- 239000011159 matrix material Substances 0.000 abstract description 2
- 239000004065 semiconductor Substances 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 abstract 1
Abstract
【物品用途】;本設計之物品為對半導體集成電路等電子元件進行測試的電子元件測試裝置中所使用的推送件。推送件藉由平板安裝於電子元件測試裝置而被使用。推送件的左側及右側分別設有凸部及凹部。複數個推送件以矩陣方式安裝於平板上,且相鄰的推送件之凸部及凹部互相嵌合,以提高平板上推送件的密度。於測試電子元件時,推送件從上方接觸電子元件,並將電子元件壓在插座上,以使電子元件的端子與電子元件測試裝置之插座的端子電性接觸。由推送件往下方突出的接腳於電子元件壓在插座上時,用以作為導腳。;【設計說明】;圖式所揭露之虛線部分,為本案不主張設計之部分。圖式所揭露之一點鏈線,為本案主張設計之部分與不主張設計之部分的邊界線。
Description
本設計之物品為對半導體集成電路等電子元件進行測試的電子元件測試裝置中所使用的推送件。推送件藉由平板安裝於電子元件測試裝置而被使用。推送件的左側及右側分別設有凸部及凹部。複數個推送件以矩陣方式安裝於平板上,且相鄰的推送件之凸部及凹部互相嵌合,以提高平板上推送件的密度。於測試電子元件時,推送件從上方接觸電子元件,並將電子元件壓在插座上,以使電子元件的端子與電子元件測試裝置之插座的端子電性接觸。由推送件往下方突出的接腳於電子元件壓在插座上時,用以作為導腳。
圖式所揭露之虛線部分,為本案不主張設計之部分。圖式所揭露之一點鏈線,為本案主張設計之部分與不主張設計之部分的邊界線。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106305528F TWD191423S (zh) | 2017-09-19 | 2017-09-19 | Part of the pusher for the electronic component test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW106305528F TWD191423S (zh) | 2017-09-19 | 2017-09-19 | Part of the pusher for the electronic component test device |
Publications (1)
Publication Number | Publication Date |
---|---|
TWD191423S true TWD191423S (zh) | 2018-07-01 |
Family
ID=89071977
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106305528F TWD191423S (zh) | 2017-09-19 | 2017-09-19 | Part of the pusher for the electronic component test device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWD191423S (zh) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM456491U (zh) | 2012-11-09 | 2013-07-01 | Tek Crown Technology Co | 測試分類設備之接合板組與測試連接器之易拆組構造 |
TW201543638A (zh) | 2014-02-21 | 2015-11-16 | Sensata Tech Massachusetts Inc | 堆疊式封裝熱力裝置 |
-
2017
- 2017-09-19 TW TW106305528F patent/TWD191423S/zh unknown
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWM456491U (zh) | 2012-11-09 | 2013-07-01 | Tek Crown Technology Co | 測試分類設備之接合板組與測試連接器之易拆組構造 |
TW201543638A (zh) | 2014-02-21 | 2015-11-16 | Sensata Tech Massachusetts Inc | 堆疊式封裝熱力裝置 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MY155882A (en) | Electrically conductive pins for microcircuit tester | |
MY192337A (en) | Test socket assembly | |
MX2019008904A (es) | Probador funcional para tarjetas de circuito impreso y metodos y sistemas asociados. | |
WO2012033802A3 (en) | Electrically conductive pins for microcircuit tester | |
TW200702667A (en) | Test probe and manufacturing method for test probe | |
MX2016009741A (es) | Circuito integrado, componente de motor y dispostivo de aplicacion teniendo el componente de motor. | |
CN204154753U (zh) | 一种新型封装芯片测试治具 | |
US20140210504A1 (en) | Testing device for electronic device testing | |
MY134764A (en) | Electronic device testing apparatus | |
MY166488A (en) | Test socket with hook-like pin contact edge | |
MY193082A (en) | Test socket unit | |
MY192643A (en) | Alignment fixtures for integrated circuit packages | |
SG195107A1 (en) | An electrical interconnect assembly | |
JP2016095141A (ja) | 半導体デバイスの検査ユニット | |
PH12019500156A1 (en) | Connector pin apparatus for semiconductor chip testing, and method for manufacturing same | |
TW200729373A (en) | Test module for wafer | |
KR20120016717A (ko) | Led 패키지용 테스트 소켓 | |
ES2663896T3 (es) | Caja de enchufe empotrada con receptáculo de caja de enchufe | |
MY188012A (en) | Compressible layer with integrated bridge in ic testing apparatus | |
TWD191423S (zh) | Part of the pusher for the electronic component test device | |
TWD191460S (zh) | Part of the pusher for the electronic component test device | |
KR20160113492A (ko) | 플랙시블 컨택복합체 및 이를 이용한 테스트용 소켓 | |
MY183259A (en) | Integrated circuit chip tester with an anti-rotation link | |
KR101544499B1 (ko) | 검사장치 | |
TW200942833A (en) | Inspection jig |