TWD174717S - Portion of probe - Google Patents

Abstract

[Use of Article]; This invention relates to a part of a probe, especially a part of a probe used for characteristic inspection of semiconductor devices or liquid crystal panels, and for electrical connections between substrates or electronic components. ;[Design Description];This creation provides a part of a probe used for characteristic inspection of semiconductor devices or liquid crystal panels, and for electrical connection between substrates or electronic parts, etc. The parts represented by solid lines in each view Part of it is the part of the design that is intended to be claimed in this case. In addition, the one-point chain line is a line used to define the boundary between the part where design is claimed in this case and other parts. The one-point chain line itself is the part where design is not claimed in this case. The dotted lines in each view are the parts that are not designed for this case. In addition, in order to make the details of the part for which design is claimed in this case more clear, a partially enlarged front view of the part for which design is claimed, a partially enlarged rear view of the part for which design is claimed, and a partially enlarged top view of the part for which design is claimed are provided. Partially enlarged bottom view of the part for which the design is proposed, Partially enlarged right side view of the part for which the design is proposed, Partially enlarged left side view of the part for which the design is proposed, Partially enlarged three-dimensional view of the part for which the design is proposed 1, Partially enlarged view of the part for which the design is proposed 1. Partially enlarged perspective view 2 and other partial enlarged views represent the parts of the proposed design of this case.