TWD169175S - 熱重量測定裝置之部分 - Google Patents

熱重量測定裝置之部分

Info

Publication number
TWD169175S
TWD169175S TW103303365F TW103303365F TWD169175S TW D169175 S TWD169175 S TW D169175S TW 103303365 F TW103303365 F TW 103303365F TW 103303365 F TW103303365 F TW 103303365F TW D169175 S TWD169175 S TW D169175S
Authority
TW
Taiwan
Prior art keywords
sample
furnace tube
heated
furnace
designed
Prior art date
Application number
TW103303365F
Other languages
English (en)
Inventor
Hirohito Fujiwara
Original Assignee
日立高新技術科學股份有限&#x5
Hitachi High Tech Science Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日立高新技術科學股份有限&#x5, Hitachi High Tech Science Corp filed Critical 日立高新技術科學股份有限&#x5
Publication of TWD169175S publication Critical patent/TWD169175S/zh

Links

Abstract

【物品用途】;本設計的物品是熱重量測定裝置，為一種測定對象試料進行加熱時的重量變化之熱重量測定裝置(熱分析裝置)。;【設計說明】;使用時，將正面右前方的部分整個往前方滑動的話，由玻璃等製成的透明爐管及其周圍的加熱爐會成一體地前進，位於爐管內的天秤臂與安裝在其前端的試料夾具會在原本的位置露出來。將試料載置在已露出的試料夾具，使爐管與加熱爐後退，將天秤臂與試料夾具收容在爐管內，加熱爐管，並且測定試料的重量變化。加熱爐的上面中央部是形成圓形開口，在測定之際，從開口透過透明的爐管，來觀察加熱中的試料。;圖中以實線所示為「主張設計」之部分，虛線所示為「不主張設計」之部分；具體而言，以實線所表現的部分，是相當於正面右前方的部分的上面的圓形開口的外緣，開口周圍的網孔構件並未包含在主張部分設計之範圍內。
TW103303365F 2014-02-28 2014-06-05 熱重量測定裝置之部分 TWD169175S (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014004229 2014-02-28

Publications (1)

Publication Number Publication Date
TWD169175S true TWD169175S (zh) 2015-07-21

Family

ID=56083490

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103303365F TWD169175S (zh) 2014-02-28 2014-06-05 熱重量測定裝置之部分

Country Status (2)

Country Link
US (1) USD758221S1 (zh)
TW (1) TWD169175S (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1574851S (zh) * 2016-08-29 2017-04-24
USD878227S1 (en) * 2017-12-13 2020-03-17 Malvern Instruments Limited Particle characterization device
USD991062S1 (en) * 2021-03-19 2023-07-04 Yokogawa Electric Corporation Data logger

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD283107S (en) * 1983-07-29 1986-03-25 Miles Laboratories, Inc. Reflectance photometer
USD292979S (en) * 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US5322360A (en) * 1993-03-05 1994-06-21 Leco Corporation Isothermal calorimeter
USD381756S (en) * 1994-09-21 1997-07-29 Hitachi, Ltd. Immunity analyzer
US6846455B1 (en) * 2001-01-26 2005-01-25 Ta Instruments-Waters, Llc Automatic sampling device
US6760679B1 (en) * 2001-01-26 2004-07-06 Ta Instruments-Waters, Llc Method and apparatus for positional calibration of a thermal analysis instrument
USD556914S1 (en) * 2005-10-21 2007-12-04 Sanyo Electric Co., Ltd. Gene amplification apparatus
USD638545S1 (en) * 2010-03-31 2011-05-24 Fujifilm Corporation Medical immunoassay device
USD689387S1 (en) * 2012-05-09 2013-09-10 Shimadzu Corporation Mass analyzer

Also Published As

Publication number Publication date
USD758221S1 (en) 2016-06-07

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