TW580604B - Optical exposure systems and processes for alignment of liquid crystals - Google Patents

Optical exposure systems and processes for alignment of liquid crystals Download PDF

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Publication number
TW580604B
TW580604B TW87118266A TW87118266A TW580604B TW 580604 B TW580604 B TW 580604B TW 87118266 A TW87118266 A TW 87118266A TW 87118266 A TW87118266 A TW 87118266A TW 580604 B TW580604 B TW 580604B
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light
hole
optical
polarization
substrate
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TW87118266A
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Chinese (zh)
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Wayne M Gibbons
Brian P Mcginnis
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Elsicon Inc
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Priority claimed from US09/069,606 external-priority patent/US6307609B1/en
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Abstract

This invention relates to an optical exposure system that is useful for exposing optical alignment layers with light in order to align liquid crystal. The exposure system comprises at least one source of optical radiation, means for partially collimating the optical radiation, means for partially polarizing the optical radiation, means for adjusting the degree of polarization, and means for transporting a substrate and radiation relative to one another. Other embodiments include means for partially filtering the optical radiation and means for some portion of said optical radiation to be incident at an oblique angle relative to the substrate. Another embodiment is a novel optical module and processes for aligning liquid crystals using the optical exposure systems.

Description

玖、發明說明: 【發明所屬之技術領域】 本發明關於光學曝光系統及以光排列光排列層及液晶之 方法。 本發明係在ARPA之贊助下由政府以No. MDA972-93-2- 0014號協議資助冤成。政府對本發明具有某種程度之權利。 【先前技術】 液晶化合物應用於人類和機器可判讀之顯示器中,可在 儀器控制件上應用,例如在機動車輛,航電設備,醫療裝 置’手錶,手提式電腦及桌上型電腦顯示器中。以上每— 產品之共通點在於其為一液晶層介於一對基板間,該基板 上塗有一聚合物排列層。該聚合物排列層控制該液晶介質 在/又有一電場時之排列方向。通常該液晶介質之排列方向 在一機械摩擦程序中建立,其中該聚合物層被以一衣料或 其他纖維度材料摩擦處理。接觸該經摩擦表面之液晶介質 通常為與該機械摩擦之方向平行排列。另一種方法是,一 包括異向性吸收分子之排列層可受偏振光曝光以排列液晶 介質,如Gibbons及其同伴在美國專利案Ν〇· 5,〇32,〇〇9和 4,974,941 ^ ^Process of Aligning and Realigning Liquid Crystal Media” 中所揭示。 包含顯示器在内之多數液晶裝置具有-有限之預傾斜角 度,舉例來說,被所選聚合物排列層之機械摩擦所控制。 接觸此一層 < 液晶分子排列為與該摩擦方向平行,然其並 非絕對與該基板平行。該液晶分子略對該基板傾斜例如約2 O:\55\557II-920905 DOC -5- 至1 5度。在多數顯示的應用中,為達到最佳性能,該液晶 需要具有一有限且一致之預傾斜角。 近來一種利用偏振光作具預傾斜之光排列之方法揭示於 Gibbons及其同伴在一九九六年三月二十九日提出之美國 專利申請案No· 08/624,942中。在該方法中,一材料吸收 一經過偏振之輻射源。數種不同光排列層之實施例揭示於 該申請案中。這些層隨後以一相對於偏振方向之特定角度 排列且居間傳達一與該排列層接觸之液晶排列。液晶之預 傾斜可由控制紫外線輻射之入射角達成之。此為經由多重 曝光步驟最常達成者。 另一種利用偏振光使一排列材料曝光以讓液晶以預傾斜 定位之方法揭示於Kobayashi及其同伴在歐洲專利申請案 EP 0742471中。Kobayashi及其同伴考慮到以兩步驟讓一基 板爻線性偏振光曝光,第二步驟之偏振光容有垂直於第一 曝光步驟之組件。此方法亦提出使用未偏振光作為此方法 之一部份。最後,Kobayashi及其同伴論及利用橢圓偏振光 作為一種更加通用之線性偏振光種類的可能性。在此方法 之所有說明中,光之入射角並未考慮到光之發散,且隨後 僅處理準直光之案例。就其本身而言,任何用以依該方法 曝光之光學系統必須在全曝光區域產生高準直及高偏振 光。 垅一光學曝光系統而言有一能對大面積傳遞偏振光之需 求。對-光學系統和方法而言亦有在一單次曝光步驟中誘 發一液晶介質預傾斜之需求。為了實現這些目#,發明 O:\55\55711 -920905. DOC -6 - 發現偏振及準直之程度為—光學曝光系統中之可調整參 數,且其在曝光方法中扮演相當重要之角色。迄今用於排 列材料之光學曝光系統已被設計以達到高偏振及高準直輕 射。現在有可能控制這些需求至適當程度且達到改良之: 能及新的曝光幾何。 一種利用組件部份偏振及部份準直之光學曝光系統揭示 於本又中,其有明顯超越全偏振及全準直系統之優點。該 光學系統有助於成為生產級的光學曝光系統。 【發明内容】 本發明足一目的為提供一種能以部份偏振及部份準直紫 外線照射大面積基板之有效率的光學曝光系統。本發明之 另一目的為一種利用部份準直及部份偏振光以光學方式排 列光排列層及隨後放置為與該光排列層接觸之液晶之方 法。本發明之另一觀點為一種僅以一單次曝光步驟誘發液 晶預傾斜排列之方法。本發明之另一目的為驗證大基板面 積可用多重較小組件曝光之,該組件之合成在一較大面積 上達到與該較小組件相同之功能。 本發明之一實施例為一種包括至少一光輻射源以部份偏 振及部份準直光排列一基板之光學曝光系統,部份準直該 光輪射之裝置,部份偏振該光輻射之裝置,調整偏振角度 之裝置及使該基板和輻射互相對於對方移動之裝置。其他 實施例進一步包括部份過濾該光輻射之裝置及使該光輻射 之某些部分以一傾斜角對該基板入射之裝置。其他實施例 包含一種準直及偏振光之新型光學組件,及利用該光學曝2. Description of the invention: [Technical field to which the invention belongs] The present invention relates to an optical exposure system and a method for arranging a light alignment layer and a liquid crystal with light. The present invention was funded by the government under the auspices of ARPA under the agreement No. MDA972-93-2- 0014. The government has certain rights in the invention. [Prior art] Liquid crystal compounds are used in human and machine-readable displays, and can be used in instrument control parts, such as in motor vehicles, avionics, medical devices' watches, portable computers and desktop computer displays. The common feature of each of the above products is that a liquid crystal layer is interposed between a pair of substrates, and the substrate is coated with a polymer alignment layer. The polymer alignment layer controls the alignment direction of the liquid crystal medium when / with an electric field. The alignment direction of the liquid crystal medium is usually established in a mechanical rubbing process, in which the polymer layer is rubbed with a cloth or other fibrous material. The liquid crystal medium contacting the rubbed surface is usually aligned parallel to the direction of the mechanical rubbing. Another method is that an alignment layer including anisotropic absorption molecules can be exposed to polarized light to align liquid crystal media, such as Gibbons and their companions in U.S. Pat. of Aligning and Realigning Liquid Crystal Media ". Most liquid crystal devices, including displays, have a limited pre-tilt angle, for example, controlled by the mechanical friction of the selected polymer alignment layer. Contact this layer < The liquid crystal molecules are aligned parallel to the rubbing direction, but they are not absolutely parallel to the substrate. The liquid crystal molecules are slightly inclined to the substrate, for example, about 2 O: \ 55 \ 557II-920905 DOC -5- to 15 degrees. In most displays In the application, in order to achieve the best performance, the liquid crystal needs to have a limited and consistent pre-tilt angle. Recently, a method of using polarized light to arrange the light with pre-tilt was disclosed in Gibbons and their companions In U.S. Patent Application No. 08 / 624,942, filed on March 29. In this method, a material absorbs a polarized radiation source. Examples of several different light alignment layers Disclosed in the application. These layers are then arranged at a specific angle with respect to the direction of polarization and intermediary convey a liquid crystal array in contact with the alignment layer. The pre-tilt of the liquid crystal can be achieved by controlling the incident angle of ultraviolet radiation. The multiple exposure step is most often achieved. Another method that uses polarized light to expose an alignment material to pre-tilt the liquid crystal is disclosed in Kobayashi and his companion in European patent application EP 0742471. Kobayashi and his companion consider The step exposes a substrate to linearly polarized light, and the polarized light in the second step contains components that are perpendicular to the first exposure step. This method also proposes to use unpolarized light as part of this method. Finally, Kobayashi and his companion theory And the possibility of using elliptically polarized light as a more versatile type of linearly polarized light. In all the descriptions of this method, the incident angle of light does not take into account the divergence of light, and then only deals with the case of collimated light. By itself, any optical system used to expose in this way must produce high collimation and high There is a need for optical exposure systems that can transmit polarized light over a large area. For optical systems and methods there is also a need to induce a pre-tilt of a liquid crystal medium in a single exposure step.目 # , 发明 O: \ 55 \ 55711 -920905. DOC -6-It is found that the degree of polarization and collimation is-an adjustable parameter in the optical exposure system, and it plays a very important role in the exposure method. So far it is used for ranking The material's optical exposure system has been designed to achieve high polarization and high collimated light. It is now possible to control these needs to an appropriate level and achieve improvements: energy and new exposure geometry. An optical exposure system using part of the polarization and partial collimation of the module is disclosed in this book, which has obvious advantages over the full polarization and full collimation systems. This optical system helps to become a production-grade optical exposure system. [Summary of the Invention] One object of the present invention is to provide an efficient optical exposure system capable of irradiating a large-area substrate with partial polarization and partial collimated ultraviolet rays. Another object of the present invention is a method for optically arranging a light alignment layer using a part of collimation and a part of polarized light and then placing a liquid crystal in contact with the light alignment layer. Another aspect of the present invention is a method for inducing a liquid crystal pre-tilt arrangement with only a single exposure step. Another object of the present invention is to verify that a large substrate area can be exposed by multiple smaller components. The composition of the components achieves the same function as the smaller components over a larger area. An embodiment of the present invention is an optical exposure system including at least one optical radiation source aligning a substrate with partially polarized and partially collimated light, a device that partially collimates the light wheel, and a device that partially polarizes the light radiation A device for adjusting the polarization angle and a device for moving the substrate and the radiation to each other. Other embodiments further include a device that partially filters the optical radiation and a device that makes certain portions of the optical radiation incident on the substrate at an oblique angle. Other embodiments include a novel optical component that collimates and polarizes light, and uses the optical exposure

O:\55\55711 -920905. DOC 光系統排列液晶之新方法。 【實施方式】 本文所用該辭”光排列層,,意指能具有在對光輻射曝光時 會異向性改變電介質特性之任何層。一些光排列層之實例 揭示於前述Gibbons及其同伴之專利案,Schadt及其同伴 之美國專利案Ν〇·5,567,349,及Chigrinov及其同伴之美國 專利案 Νο·5,389,698 中。 本又所用該辭”基板”意指一光排列層或有一光排列層黏 附於其上之任何材料。 本文所用該辭、、非偏振光〃意指具有對光傳播軸一平均 齊一分布之任意變換瞬間偏振狀態之光輻射。 本文所用該辭、、部份偏振光〃意指沿著兩正交主軸分布 任意變換瞬間偏振狀態之光輻射,使得一軸比其正交軸包 含車乂鬲之平均強度。邵份偏振光之兩正交轴之相對強度範 圍在1:100至100:1,但不包含約1:1之狀況,此狀況為前 述之非偏振光。較佳的部份偏振光之相對強度範圍為約自 2:1 至 30:1 及約 1:2 至 1:3〇。 本文所用該辭、、偏振度〃為一前述部份偏振光兩正交主 軸間之相對強度之量度。偏振度可與光束内一局部態及/ 或整合全光束所得平均態兩者有關。 本文所用該辭、、偏振比,,與、、偏振度"意義相同。 在本發明中所用部份偏振光與Kobayashi及其同伴所討 論者有所不同,本發明中光之偏振狀態未由線性或橢圓偏 振定義之。使用非同調光較線性或橢圓偏振更易於產生部 O:\55\5571I-920905.DOC -8 - 份偏振光。此關係#非同ΐ周光源之隨機本質。#同調光之 來源包含燈具,例如電孤燈或其他用於多數曝光系統中常 用之充氣燈。此種非同調光源難以產生線性或橢圓偏振, 且在曝光面積增加時更為複雜。本發明利用部份偏振光, 在考慮到射線角及此光源覆蓋之尺度,部份偏振光較易於 以非同調光源產生。使用部份偏振光排列一基板會導致產 量之增加且更加有效利用光輻射。 任何產生波長在150至2000毫微米範圍内非偏振光之裝 置都是一種光輻射源。適用光源之實例包含,但不限於, 電弧燈,白熱燈,雷射,及充氣燈。一較佳光源為一高亮 度線性充氣燈。其他較佳光源包含以充氣燈為基礎但由微 波激發之燈具(例如由Fusion UV Systems,Inc, Gaithersburg, MD提供者)。微波激發提供對該燈具光譜特 性之額外控制。一些燈具(電弧型及微波激發型)之實例 為水銀及激態分子燈泡(例如氯化氙和鈷)。 本文所用該辭、、部份準直〃意指光線沿至少一維度具有 一大於約5度之發散。光之準直可能沿不同方向而有所不 同。一較佳光學系統產生之部份準直光沿一維度具有大於 約5度且小於約30度之發散,且沿其正交維度具有一無限 制發散。部份準直可由一種反射鏡,折射光學件(例如透 鏡)及孔之配置達成之,但不僅限於以上方法。較佳部份 準直光輻射之裝置可選自弧形反射器,孔,葉片及折射光 學件之群組中。本發明一較佳準直器由至少一弧形反射鏡 及至少一孔組成。另一較佳準直器由一圓柱形橢圓反射鏡 O:\55\5571I-920905.DOC -9 - 580604 及至少一與該線性燈具尺寸相符之孔。在此實施例中,該 橢圓反射鏡之一部份產生一些有限發散之射線,發散小於 45度,且其進一步受與該圓柱軸正交之一平面内之至少一 孔限制。在平行於圓柱軸之平面内,射線不受影響。 另一較佳準直咨為一葉片結構。一、、葉片結構〃意指部 份準直光線之設備。其作用如同一孔,使光射線以一角度 傳播至該結構之光學軸。其可能在一或二維度内部份準直 3光 個一維度葉片結構之實例為至少兩平坦吸收表面 之一種陣列,該表面經排列使該表面之面相互平行且垂直 於泫光所要之光學軸。與該光學軸成一角度之射線可部份 由該葉片吸收。最大角度由構成該葉片之表面之間隔及長 度决足 個一維度葉片結構之實例為一部份吸收表面之 蜂房結構。平行於該蜂房結構長度傳播之射線得以傳送且 定義光學軸。與該光學軸成一角度之射線會被吸收。最大 角度由該蜂房大小及構成該葉片之蜂房之長度決定。一個 一維度葉片繪於圖5中且在實例八中進一步加以說明。 準直度可能因方向不同而不同。若一光源之準直僅在一 、准度中爻到控制,其在其他維度内可能無限増加。舉例來 說,一線性燈具可能由一圓柱形光學件在一維度内較為良 好地準直。正交的維度則不受影響。然後其長度可能增加 至任何所要曝光的寬度。在與基板之線性掃描結合時,可 使一非常大面積均質曝光。在多重曝光系統中,準直度可 能因一些或所有曝光而有所不同。 本發明使用之部份準直光在過去未曾考慮過。光源之高O: \ 55 \ 55711 -920905. A new method for aligning liquid crystals in DOC light systems. [Embodiment] The term "light aligning layer" as used herein means any layer that can anisotropically change the dielectric properties when exposed to light radiation. Some examples of light aligning layers are disclosed in the aforementioned Gibbons and their patents US Patent No. 5,567,349 by Schadt and his companions, and US Patent No. 5,389,698 by Chigrinov and his companions. The term "substrate" as used herein means a light alignment layer or a light alignment layer adhered to it. Any material on it. As used herein, the term "non-polarized light" means light radiation with any transformation instantaneous polarization state with an even and uniform distribution of the light propagation axis. The term used in this article, partly polarized light means It refers to the distribution of light radiation with arbitrary transformation of instantaneous polarization state along two orthogonal major axes, so that one axis contains the average intensity of the car body than its orthogonal axis. The relative intensity of two orthogonal axes of Shaofen polarized light ranges from 1: 100 to 100: 1, but does not include the condition of about 1: 1, which is the aforementioned non-polarized light. The relative intensity range of the preferred partial polarized light is from about 2: 1 to 30: 1 and about 1: 2 to 1: 3〇. As used herein, the term, polarization, 〃 is a measure of the relative strength between the two orthogonal principal axes of the partially polarized light. The degree of polarization can be related to a local state in the beam and / or an average state obtained by integrating a full beam. The terms, polarization ratio, and polarization degree used have the same meaning. Part of the polarized light used in the present invention is different from that discussed by Kobayashi and his companions, and the polarization state of the light in the present invention is not linear. Or elliptical polarization is defined. Using non-homogeneous light is more likely to generate partial O: \ 55 \ 5571I-920905.DOC -8-part polarized light than linear or elliptical polarization. This relationship # 非同 ΐ 周光光 的 Random Nature. # 同 调The source of light includes lamps, such as electric solitary lamps or other inflatable lamps commonly used in most exposure systems. Such non-homogeneous light sources are difficult to produce linear or elliptical polarization, and are more complicated when the exposure area is increased. The present invention utilizes parts Polarized light. Considering the ray angle and the scale covered by this light source, part of the polarized light is easier to produce with non-homogeneous light sources. Using a part of polarized light to arrange a substrate will increase the yield and more Effective use of optical radiation. Any device that produces unpolarized light in the wavelength range of 150 to 2000 nanometers is a source of optical radiation. Examples of suitable light sources include, but are not limited to, arc lamps, incandescent lamps, lasers, and inflatable lamps A preferred light source is a high-brightness linear inflatable lamp. Other preferred light sources include lamps based on inflatable lamps but excited by microwaves (eg, provided by Fusion UV Systems, Inc, Gaithersburg, MD). Microwave excitation provides Additional control of the spectral characteristics of lamps. Examples of some lamps (arc and microwave excitation) are mercury and excimer light bulbs (such as xenon chloride and cobalt). As used herein, the term, part of the collimation means light along At least one dimension has a divergence greater than about 5 degrees. The collimation of light may vary in different directions. A portion of the collimated light produced by a preferred optical system has a divergence greater than about 5 degrees and less than about 30 degrees in one dimension and an infinite system divergence along its orthogonal dimension. Partial collimation can be achieved by the configuration of a mirror, refractive optics (such as a lens) and holes, but it is not limited to the above method. The preferred part The device for collimating light radiation may be selected from the group of curved reflectors, holes, blades and refracting optics. A preferred collimator of the present invention is composed of at least one curved reflector and at least one hole. Another preferred collimator is a cylindrical elliptical mirror O: \ 55 \ 5571I-920905.DOC -9-580604 and at least one hole corresponding to the size of the linear light fixture. In this embodiment, a part of the elliptical mirror generates some rays with limited divergence, the divergence is less than 45 degrees, and it is further limited by at least one hole in a plane orthogonal to the cylindrical axis. Rays are unaffected in a plane parallel to the cylindrical axis. Another preferred alignment is a blade structure. 1. Blade structure means a device that partially collimates light. It acts like a hole, allowing light rays to propagate to the optical axis of the structure at an angle. An example of a three-dimensional one-dimensional leaf structure that may be collimated internally in one or two dimensions is an array of at least two flat absorption surfaces that are arranged so that the surfaces of the surfaces are parallel to each other and perpendicular to the desired optics axis. Rays at an angle to the optical axis may be partially absorbed by the blade. The maximum angle is determined by the spacing and length of the surface that constitutes the blade. An example of a one-dimensional blade structure is a honeycomb structure with a part of the absorbing surface. Rays propagating parallel to the length of the hive structure are transmitted and define the optical axis. Rays at an angle to the optical axis are absorbed. The maximum angle is determined by the size of the hive and the length of the hive that constitutes the blade. A one-dimensional blade is depicted in Figure 5 and further explained in Example 8. Collimation may vary from direction to direction. If the collimation of a light source is only controlled in one degree and accuracy, it may increase infinitely in other dimensions. For example, a linear luminaire may be better collimated in one dimension by a cylindrical optic. Orthogonal dimensions are not affected. Its length may then be increased to any desired width. When combined with linear scanning of the substrate, a very large area can be exposed uniformly. In multiple exposure systems, collimation may vary for some or all exposures. Part of the collimated light used in the present invention has not been considered in the past. Light source height

O:\55\557ll-920905 DOC •10- 580604 準直度已然被認定為在光排列層中達到良好排列之需求。 本發明展示利用一經部份準直光源之良好均質排列實例。 邵份準直與部份偏振之結合導致一種能夠照射非常大面積 之+光方法。δ文曝光基板在該曝光區域下受掃描時更是 如此。掃描具有沿行進方向使曝光平均且產生非常均質曝 光之進-步好處。利用部份準直光之另—方面係與曝光之 句勻f生有關。在垂直於掃描方向之—維度内的低準直度產 生-沿該維度之較多漫射的照明,而使因光學組件缺陷造 成曝光均句性之不規則度降至最低。此特別關係到由多個 元件陣列構成之組件。舉例來說,若用在準直光時,由沿 邊緣接觸之較小偏振器之—線性陣列構成之__薄膜偏振器 會因邊緣接縫而有非均勾曝光之問題。部份準直光使該接 缝之影像漫射且造成更均勻之照明。 -邵份偏振器將非偏振光轉變為部份偏振光,或將偏振 光轉變為邵份偏振^。部份偏振器之實例包含但不僅限於 薄膜偏振器,偏振分光器,一個或多個處於布儒斯特角 (Brewster’S angle)之光板,異向吸收介質,反射表面及 散射介質。本發明之-較佳部份偏振器為在接近其設計角 度操作之-薄膜偏振器。自一薄膜偏振器反射之射線偏振 強度不如透射之射線偏振強度。以一非設計角度入射之射 線偏振程度小於以設計角度入射之射線偏振程度。自一加 長之部份準直光源而來之射線總和僅在反射或透射中部份 偏振。對-給定薄膜偏振器設計而言,偏振度可藉由變換 平均入射角或變換入射射線之發散度而在一有限範圍内調 O:\55\557ll-920905 DOC -11 - 580604 整。產生部份偏振光輻射之光學元件可能單獨使用或合併 使用以達到所需偏振度。在多重曝光系統中,一些或全部 曝光之偏振度可能不同。 本發明人發現用於本發明方法中之偏振度可實質上影響 光排列材料之性能。因此,本發明之一較佳光學系統包括 一種控制偏振度之裝置。如前文所述,一種控制偏振度之 裝置係調整薄膜偏振器之角度。曝光幾何亦會影響偏振 度。對一處於一斜角之曝光幾何來說,偏振器之方位會決 定平均偏振度。此可總結如下。考慮一種由一長軸和一短 軸足減維度之光束,其中該短軸在斜曝光角之入射平面 内。沿該短軸之光束不同部份與該偏振器會有不同入射 角,導致不同偏振度。㈣長軸之光束發散導致對斜曝光 角沿該短軸之強度變化。如圖6和7中由a部份定義之前 導邊緣較B部份呈現較高強度。對一給定系統之兩不同角 度、印於圖6和7中’其差異將在實例中進_步詳細說明。 隨後,對偏振器角度之一給定角度大小而言,偏振器之方 位會對斜曝光角產生兩不同平均偏振度。 沿光束短軸之偏振度之變化會對該曝光方法產生重要後 果在光排歹J材料内〈光始(ρ1ι〇ί〇ίη^^)反應可能偏 好光排列材料首先進入曝光光束時,先被高偏振度光束昭 射,然後被漸減偏振度之光束照射。所以,偏振度控制對 部份及平均曝光程序兩者而言會是一重要議題。 本發明之另一觀點Α —、、/&amp; 、 古為以在该偏振器入射平面内光學組件 之橫向位置控制偏振度。 有了此檢向偏移光學件而影響許O: \ 55 \ 557ll-920905 DOC • 10- 580604 Collimation has been identified as the need to achieve good alignment in the light alignment layer. The present invention shows an example of a good homogeneous arrangement using a partially collimated light source. The combination of Shao Fen collimation and partial polarization results in a + light method that can illuminate a very large area. This is especially true when the delta exposure substrate is scanned under this exposure area. Scanning has the benefit of advancing steps that average the exposure in the direction of travel and produce a very homogeneous exposure. The other aspect of using some collimated light is related to the uniformity of exposure. Low collimation within the dimension perpendicular to the scanning direction produces more diffuse illumination along that dimension, minimizing irregularities in the uniformity of exposure due to defects in the optical components. This is particularly relevant for assemblies made up of multiple element arrays. For example, if used in collimated light, a thin film polarizer made up of a linear array of smaller polarizers that touch along the edge will have uneven exposure due to edge seams. Partially collimated light diffuses the image of the seam and causes more uniform illumination. -Shao Fen polarizer converts unpolarized light to partially polarized light, or converts polarized light to Shao Fang polarization ^. Examples of some polarizers include, but are not limited to, thin film polarizers, polarizing beam splitters, one or more light plates at a Brewster'S angle, an anisotropic absorption medium, a reflective surface, and a scattering medium. A -preferred part of the polarizer of the present invention is a thin-film polarizer that operates near its design angle. The polarization of rays reflected from a thin film polarizer is not as strong as that of transmitted rays. The degree of polarization of a beam incident at a non-design angle is less than the degree of polarization of a beam incident at a design angle. The sum of rays from an extended partially collimated light source is only partially polarized in reflection or transmission. For a given film polarizer design, the degree of polarization can be adjusted within a limited range by transforming the average incidence angle or the divergence of the incident ray. O: \ 55 \ 557ll-920905 DOC -11-580604 integer. Optical components that generate part of the polarized light radiation may be used alone or in combination to achieve the desired degree of polarization. In multiple exposure systems, some or all of the exposures may have different degrees of polarization. The inventors have found that the degree of polarization used in the method of the present invention can substantially affect the performance of the light alignment material. Therefore, one preferred optical system of the present invention includes a device for controlling the degree of polarization. As mentioned above, a device for controlling the degree of polarization is to adjust the angle of a thin film polarizer. Exposure geometry also affects the degree of polarization. For an exposure geometry at an oblique angle, the orientation of the polarizer determines the average degree of polarization. This can be summarized as follows. Consider a beam whose dimensions are reduced by a major axis and a minor axis, where the minor axis is in the plane of incidence of the oblique exposure angle. Different parts of the beam along the short axis will have different incidence angles with the polarizer, resulting in different degrees of polarization. The divergence of the light beam on the long axis causes the intensity of the oblique exposure angle to change along the short axis. As shown in Figures 6 and 7, the leading edge is more intense than the B part. The differences between two different angles for a given system, printed in Figures 6 and 7, will be explained in more detail in the examples. Subsequently, for a given angular size, one of the polarizer angles, the orientation of the polarizers produces two different average degrees of polarization for oblique exposure angles. Changes in the degree of polarization along the short axis of the beam will have important consequences for this exposure method. In the material of the light beam, the reaction of <Light Beginning (ρ1ι〇ί〇ίη ^^) may prefer that the light alignment material first enters the exposure beam, and is The highly polarized light beam is projected and then irradiated by the light beam with decreasing polarization. Therefore, polarization control will be an important issue for both partial and average exposure procedures. Another aspect of the present invention is to control the degree of polarization by the lateral position of the optical component in the plane of incidence of the polarizer. With this direction-shifting optics,

O:\55\557II-920905DOC -12- 580604 可穿過一光學系統之射線的平均錐形。分布於此錐形内之 , 能量會改變偏振器上之有效入射角,且隨後影響部份及平 „ 均偏振比。因此橫向位置之控制允許進一步對一給定光學 排列控制其偏振度,且可用以使能量產量及偏振度最佳化。 入射到基板上之光輻射可具有被光譜過濾器限制之光譜 内容。過漉器之實例包含但不僅限於二分薄膜電介質反射 器,吸收性玻璃,吸收性染料,棱鏡,光柵及布拉格(Bragg) 反射器。過濾作用可能為原有或包含在光源上作為其一部 _ 份。一較佳過濾器為一在一透明基板上之二分薄膜反射 器。另一較佳過濾器為一吸收性玻璃。再者,光輻射之部 份過遽可由該系統内之其他光學組件執行。舉例來說,偏 振咨及反射或透射光學件通常會反射,透射,及/或吸收 光輻射’視其光譜内容而定。因此,若以上所述其他組件 原本會滤出不需要之波長部份,則可能無須在一光學曝光 系統中加入額外過濾裝置。 本發明之光學系統以對於基板表面垂直方向之一特定角 籲 度傳送光輻射。一實例為以自一薄膜偏振器反射之輻射曝 光一基板,其中該偏振器表面與該基板表面成一斜角。另 一實例為以自一反射鏡反射之輻射曝光一基板,其中該反 射鏡表面與該基板表面成一斜角。一較佳入射角為45度土 10度。 一種相對於光輻射移動基板之裝置可使曝光面積小於基 板尺寸。全掃描會使該基板均勻曝光。一實例為一線性平 移台,其支撐該基板且相對於由一線性燈具構成之光學次 O:\55\557II-920905 DOC -13- 580604 系、先以陸毛速度行進。掃描該基板之觀點與均勾曝光有 關。平仃於掃描方向之不均勻光線照明沿達到均勻曝光之 、准度平均化。由於本發明之一方面許可部份準直及部份偏 振光,並未期待以上特性在基板之全受照射面積上維持一 致。掃描使以上不均勻特性沿掃描方向平均化並達到均勻 曝光。此王題之另一優點在於其可與連續運動裝配線相容。 為產生大面積曝光,需要大面積光源,偏振器,準直光 學件(例如透鏡,弧形反射鏡)及使光線重新定向之光學 件(例如平面反射鏡)。本發明之一觀點在於可將較小組件 組合成一陣列以組成大面積組件。舉例來說,用四個較小3 英叶X4英忖薄膜偏振器製成一 I]英叶χ4英忖大偏振 备。藉此可利用一較小組件偏振器使一丨2英吋基板曝光。 同理可應用於光源,準直光學件,及使光線重新定向之光 學件。舉例來說,可利用一種包括兩個或多個線性燈具沿 長軸並排之光學曝光系統對寬度遠大於單一燈具寬之基板 作光學性排列。沿長軸光之發散會提供較為均句之曝光, 即使在燈具間有間隔亦是如此。反射器,偏振器,及備有 適當長开&gt; 孔之過遽器之線性陣列可依比例排放以配合整個 燈具組合之長度。 發明之一些實施例需要執行兩次或多次曝光以產生排列 及預傾斜。舉例來說,在一單次曝光系統之偏振比有所不 足之案例中有此必要。在此案例中該光學系統係以多重光 學曝光系統構成以產生排列及預傾斜。舉例來說,塗佈光 排列材料之基板首先以部份偏振及部份準直光以近似直角 O:\55\5571l-920905.DOC -14- 580604 入射以產生排列方向。一隨後之曝光以部份準直及部份偏 振光以斜角入射以產生預傾斜。舉例來說,可將兩個或多 個光學曝光系統沿一線性平移機構之路線排列。每一曝光 系統可單獨調整以提供一芫整曝光程序所需之曝光類型。 相似地,多重光學曝光系統可經排列以增加如在一裝配線 之生產量。 光學曝光系統沿長燈軸及沿掃描方向之組合可提供較高 生產里之大基板的光排列所需之比例。 通^有必要使曝光系統之偏振狀態及/或曝光系統之光 學能量有所不同,且/或基板對隨後每次曝光之入射光輻 射旋轉。在此案例中曝光係由重疊不同光學曝光系統之輸 出而平行執行,或由各次曝光依時間及/或空間依序分批 執行。一較佳實施例對所有光學曝光系統利用一共同傳送 機構’使基板在光學曝光系統之多重輸出下平移。 利用種使基板在任何方向内旋轉之能力來改變相對於 基板之偏振方位及^/或光輻射傳播方向。一較佳旋轉方向 係繞著基板平面内之一軸(極向)。另一較佳旋轉方向係繞 著基板之垂直方向(方位角方向)。另一較佳旋轉方向為極 向與万位角方向之—種組合。此方法在需要多重曝光時有 利於產生排列及預傾斜。 一種以部份偏振及部份準直光排列一基板之較佳光學曝 光系先匕括·至少一光輕射來源,具有一長軸;一種部份 準直及邵份偏振該光輻射之裝置包括:備有一長軸之一圓 柱形橢圓反射鏡,其所在與光源之長軸平行且有一距離以 O:\55\557ll.920905 -15- 580604 將光輻射聚焦於一焦點;一第一孔,其有一長軸及朝向和 背離光源之面,約位於該焦點且沿光源長軸配置;一薄膜 偏振器,其有朝向和背離光源之面及一特定設计角度,沿 第一孔背離光源之面配置且成一對應於該特定設計角度之 角度,其中薄膜偏振器產生一反射射線及一透射射線;一 第二孔,其有一長軸及朝向和背離光源之面,沿薄膜偏振 咨背離光源之面配置,沿第一孔之長轴配置’且與弟一孔 平行;一種部份過濾該光輻射之過濾器裝置,其有朝向和 背離光源之面,沿第二孔背離光源之面配置且與之平行; 一種使基板相對於部份準直及部份偏振光傳送之平移台裝 置,其有一表面面對光源,用以支承基板,其沿過濾器背 離光源之面配置且與之平行。此一系統繪於圖1中且在實 例中加以詳述。 另一較佳光學曝光系統包含一反射鏡,其有一反射表面 面向光源,位在第二孔與過濾器之間,其位置可將薄膜偏 振器之透射射線反射至過濾器上,而使透射射線與基板形 成一入射角。此一系統繪於圖3中且在實例中加以詳述。 另一較佳光學曝光系統包括一種光學組件排列,使透射 射線以一角度撞擊到基板上。此角度可調整為約〇至89 度。另一較佳光學曝光系統包括一種光學配置,使偏振器 之角度控制偏振度。 本發明之另一較佳實施例包括選擇一偏振器方位以控制 偏振度。 另一較佳光學曝光系統包括一種配置,使在偏振器入射 O:\55\557II-920905.DOC -16- 580604 平面内之光學元件之橫向位置控制偏振度。另一較佳1 曝光系統包括至少一薄膜偏振器以透射運作,但:振= 光束軸垂直旋轉’如與圖“匕較。此一設 - 器陣列之系統顯示於圖8A # B中,且可用於振 步驟中使基板曝光,與圖丨所示系統相似。 4光 另-較佳光學曝光系統為其中用以產生部份準直及部份 偏振光之裝置包括-偏振器陣列,包括_矩形支撐構架: 一種兩個或多個吸收板平均間隔且垂直裝於支撐構架2且 與支撐構架寬度平行之陣列’ 一種兩個或多個薄膜偏振器 介於吸收板間以一角度自相連吸收板之頂部至底 間的空間之陣列,纟中吸收板間之間隔使所裝薄膜偏振器 約處於設計角度。一偏振器陣列繪於圖8b中。 一最佳光學曝光系統包括一種如圖9A和B所示之光學 模組,同時備有一具有一長軸之光源,及一與該光源之長 軸平行之圓柱形反射鏡。該光學模組提供部份準直及部份 偏振孩光輻射之裝置,部份過濾該光輻射之裝置及調整偏 振度之裝置。該光學模組可為一矩形外殼,包括一頂部可 移動孔板3備有一約在該板中央且與該外殼長度平行之長 形孔,一底邵可移動孔板5備有一約在該板中央且與該外 殼之長度平行之長形孔,一前板17在該板周邊備有一個或 多個橫向孔1 9,一樞軸孔20偏離中央地位在該板一上象限 内及一弧形孔2 1偏離中央地位在由對該樞軸孔樞轉之一線 定義之該板一相反下象限内,一後板1 8備有與該前板相符 之一樞軸孔及一弧形孔。側板(圖中未示)可連結該前板 O:\55\557II-920905.DOC -17- 580604 與後板。位在該矩形外心者為圖祁切出之所裝光學元, 件’包含-樞軸銷24由前板和後板内之樞軸孔支撐,一矩· 形開放架22附加於該樞轴銷,—轉銷^在該樞轴销相 反端連結至該矩形開放架且固定於派形孔内,一個或多個 薄膜偏振器4安裝於該矩形開放架内,一個或多個過滤器 板16大致平行於底部孔板安裝且覆蓋著孔;其中㈣孔之 位置使薄膜偏振器位於頂部孔板之孔之下的正中央且旅形 孔約位於使薄膜偏振器在—特定設計角度之中央,且其中 孤形孔可用以調整薄膜偏振器之角度且橫向孔可用以調整_ 長形外殼相對於-光輻射源之位置。薄膜偏振器之方位可 藉由顛倒前板與後板之方位而加以改變。 光學模組如稍早所述提供_偏振度之裝置:調整偏振 器角度之樞軸及弧形孔及銷;樞軸及弧形孔在前板和後板 上之位置用以調整偏振器士女#· 正爾抛态艾万位,及橫向孔藉由利用該孔 相對於光源附加光學模組以調整光學組件相對於光束之橫 · 向位置。 另一實施例為-種排列一光排列層之方法,包括使一光籲 排列層對部份偏振光曝光,其中部份偏振光由該排列層吸 收且曝光後排列層具有異向電介質特性。較佳之一種方法 中邵份偏振光亦經部份準直。同樣較佳之一種方法中偏振 度可受調整。 -另-實施例為一種用以產生鄰接一光排列層表面之液 晶介質排列之方法,包括使—光㈣層對部份偏振光曝 光’邵份偏振光由該排列層吸收且將液晶介質施加於光排O: \ 55 \ 557II-920905DOC -12- 580604 The average cone of rays that can pass through an optical system. Distributing within this cone, the energy will change the effective angle of incidence on the polarizer, and then affect the partial and plane polarization ratios. Therefore, the control of the lateral position allows further control over the polarization of a given optical arrangement, and Can be used to optimize energy yield and polarization. Optical radiation incident on a substrate can have spectral content limited by a spectral filter. Examples of filters include, but are not limited to, two-layer thin-film dielectric reflectors, absorbing glass, absorption Dyes, prisms, gratings and Bragg reflectors. The filtering effect may be original or included on the light source as part of it. A preferred filter is a two-piece thin-film reflector on a transparent substrate. Another preferred filter is an absorptive glass. In addition, some of the optical radiation can be performed by other optical components in the system. For example, polarizing and reflective or transmissive optics usually reflect, transmit, And / or the absorption of light radiation 'depends on its spectral content. Therefore, if the other components mentioned above would originally filter out unwanted wavelengths, there may be no An additional filtering device is added to an optical exposure system. The optical system of the present invention transmits optical radiation at a specific angle perpendicular to the surface of the substrate. An example is exposing a substrate with radiation reflected from a thin film polarizer, where the The polarizer surface is at an oblique angle to the substrate surface. Another example is exposing a substrate with radiation reflected from a mirror, where the mirror surface is at an oblique angle to the substrate surface. A preferred angle of incidence is 45 degrees 10 A device that moves a substrate relative to light radiation can make the exposure area smaller than the size of the substrate. A full scan makes the substrate uniformly exposed. An example is a linear translation stage that supports the substrate and is relative to the optics formed by a linear lamp O: \ 55 \ 557II-920905 DOC -13- 580604 system, traveling at the speed of land hair first. The viewpoint of scanning the substrate is related to the uniform exposure. The uneven light illuminating along the scanning direction achieves uniform exposure. Accuracy averaging. As one aspect of the present invention allows partial collimation and partially polarized light, the above characteristics are not expected on the entire illuminated surface of the substrate Keep the same on the top. Scanning makes the above non-uniformity characteristics average along the scanning direction and achieves uniform exposure. Another advantage of this title is that it is compatible with continuous motion assembly lines. In order to produce large area exposure, a large area light source, polarizer , Collimating optics (such as lenses, curved mirrors) and optics that redirect light (such as planar mirrors). One aspect of the present invention is that smaller components can be combined into an array to form a large area component. For example For example, four smaller 3 inch X4 inch thin film polarizers are used to make a 1] inch x 4 inch large polarizing device. This can use a smaller component polarizer to expose a 2-inch substrate. The same can be applied to light sources, collimating optics, and optics to redirect light. For example, an optical exposure system that includes two or more linear lamps side-by-side along the long axis can be much wider than a single lamp The wide substrates are arranged optically. The divergence of light along the long axis provides a more even exposure, even if there is a gap between the lamps. Linear arrays of reflectors, polarizers, and filters with appropriate openings> can be arranged in proportion to match the length of the entire luminaire assembly. Some embodiments of the invention require two or more exposures to be performed to produce alignment and pretilt. This is necessary, for example, in a case where the polarization ratio of a single exposure system is insufficient. In this case, the optical system is constructed with a multiple optical exposure system to produce alignment and pretilt. For example, the substrate coated with the light alignment material is first incident with a partially polarized and partially collimated light at approximately a right angle O: \ 55 \ 5571l-920905.DOC -14- 580604 to generate the alignment direction. A subsequent exposure is partially collimated and partially polarized light is incident at an oblique angle to produce a pretilt. For example, two or more optical exposure systems can be arranged along the path of a linear translation mechanism. Each exposure system can be individually adjusted to provide the type of exposure required for a complete exposure process. Similarly, multiple optical exposure systems can be arranged to increase throughput, such as on an assembly line. The combination of the optical exposure system along the long lamp axis and along the scanning direction can provide a higher ratio of light alignment required for large substrates in production. It is necessary to make the polarization state of the exposure system and / or the optical energy of the exposure system different, and / or the substrate to rotate the incident light radiation for each subsequent exposure. In this case, the exposures are performed in parallel by overlapping the outputs of different optical exposure systems, or in batches performed sequentially in time and / or space. A preferred embodiment utilizes a common transport mechanism 'for all optical exposure systems to translate the substrate under the multiple outputs of the optical exposure system. The ability to rotate the substrate in any direction is used to change the polarization orientation and / or light radiation propagation direction relative to the substrate. A preferred direction of rotation is around an axis (polar direction) in the plane of the substrate. Another preferred direction of rotation is around the vertical direction (azimuth direction) of the substrate. Another preferred direction of rotation is a combination of a polar direction and a ten-degree angle direction. This method is beneficial for alignment and pre-tilt when multiple exposures are required. A preferred optical exposure for arranging a substrate with partially polarized and partially collimated light is at least one light source with a long axis; a device for partially collimating and polarizing the light radiation Including: a cylindrical elliptical mirror with a long axis is provided, which is parallel to the long axis of the light source and has a distance of O: \ 55 \ 557ll.920905 -15- 580604 to focus light radiation to a focal point; a first hole , Which has a long axis and a surface facing and away from the light source, is located at the focal point and is arranged along the long axis of the light source; a thin film polarizer, which has a surface facing and away from the light source and a specific design angle, faces away from the light source along the first hole The surface is arranged at an angle corresponding to the specific design angle, in which the thin film polarizer generates a reflected ray and a transmitted ray; a second hole having a long axis and a surface facing and away from the light source, and away from the light source along the film polarization direction It is arranged along the long axis of the first hole and is parallel to the first hole. A filter device that partially filters the light radiation has a side facing and away from the light source, and a side facing away from the light source along the second hole. And The parallel; one kind of the substrate with respect to the transfer of part of the translation stage and partly polarized light collimation means, which has a surface facing the light source, for supporting the substrate, the surface light source from its back and in parallel along the configuration of the filter. This system is depicted in Figure 1 and detailed in the example. Another preferred optical exposure system includes a reflector with a reflective surface facing the light source, located between the second hole and the filter, and its position can reflect the transmitted rays of the thin film polarizer onto the filter, so that the transmitted rays Form an incident angle with the substrate. This system is depicted in Figure 3 and detailed in the example. Another preferred optical exposure system includes an arrangement of optical components such that transmitted rays impinge on the substrate at an angle. This angle can be adjusted to about 0 to 89 degrees. Another preferred optical exposure system includes an optical arrangement such that the angle of the polarizer controls the degree of polarization. Another preferred embodiment of the present invention includes selecting a polarizer orientation to control the degree of polarization. Another preferred optical exposure system includes a configuration such that the lateral position of the optical element in the plane of the polarizer incident O: \ 55 \ 557II-920905.DOC -16- 580604 controls the degree of polarization. Another preferred 1 exposure system includes at least one thin film polarizer for transmission operation, but: vibration = vertical rotation of the beam axis' as shown in the figure. This system of a device array is shown in Figure 8A # B, and It can be used for exposing the substrate during the vibration step, similar to the system shown in Figure 丨 4 light another-The preferred optical exposure system is one in which the device used to generate partially collimated and partially polarized light includes-polarizer array, including Rectangular support frame: An array with two or more absorption plates spaced evenly and mounted perpendicularly to the support frame 2 and parallel to the width of the support frame 'One or two thin film polarizers are interposed between the absorption plates and absorbed at an angle An array of spaces between the top and bottom of the plate, and the spacing between the absorbing plates in the diaphragm makes the installed film polarizer at about the design angle. A polarizer array is depicted in Figure 8b. A best optical exposure system includes The optical module shown in Figures B and B is provided with a light source with a long axis and a cylindrical reflector parallel to the long axis of the light source. The optical module provides part of the collimation and part of the polarized light radiation Outfit Part of the device for filtering the optical radiation and the device for adjusting the degree of polarization. The optical module can be a rectangular shell, including a movable plate 3 at the top. An elongated shape is provided at the center of the plate and parallel to the length of the shell. Holes, a bottom movable plate 5 is provided with an elongated hole about the center of the plate and parallel to the length of the shell, a front plate 17 is provided with one or more transverse holes 19, a pivot on the periphery of the plate Axial hole 20 deviates from the central position in the upper quadrant of the plate and an arc-shaped hole 2 1 deviates from the central position in the opposite lower quadrant of the plate defined by a line pivoting to the pivot hole, a rear plate 1 8 There is a pivot hole and an arc hole corresponding to the front plate. The side plate (not shown) can connect the front plate O: \ 55 \ 557II-920905.DOC -17- 580604 and the rear plate. It is located in the The rectangular outer center is the installed optical element cut out by the figure, including the-pivot pin 24 is supported by the pivot holes in the front plate and the rear plate, and a rectangular open frame 22 is attached to the pivot pin. —The pivot pin ^ is connected to the rectangular open frame at the opposite end of the pivot pin and fixed in the pie-shaped hole, and one or more thin film polarizers 4 are installed In this rectangular open frame, one or more filter plates 16 are installed substantially parallel to the bottom orifice plate and cover the holes; wherein the position of the sacral hole is such that the film polarizer is located in the middle and travel hole of the top orifice plate Located approximately in the center of the film polarizer at a specific design angle, where the solitary hole can be used to adjust the angle of the film polarizer and the lateral hole can be used to adjust the position of the long shell relative to the source of optical radiation. The orientation can be changed by reversing the orientation of the front plate and the rear plate. The optical module provides the device of the degree of polarization as described earlier: the pivot and arc hole and pin for adjusting the angle of the polarizer; the pivot and arc The positions of the holes on the front plate and the rear plate are used to adjust the polarizers. # • 正 尔 Position Aiwan, and the lateral holes adjust the optical components relative to the beam by using the holes to attach an optical module to the light source. Horizontal and vertical position. Another embodiment is a method for arranging a light aligning layer, which comprises exposing a light-emitting aligning layer to a portion of polarized light, wherein a portion of the polarized light is absorbed by the aligning layer and the aligning layer has anisotropic dielectric characteristics after exposure. A better method is to partially collimate the polarized light. Also preferred is a method in which the degree of polarization can be adjusted. -Another embodiment is a method for generating an alignment of a liquid crystal medium adjacent to the surface of a light alignment layer, which includes exposing a light-emitting layer to a portion of polarized light. 'The polarized light is absorbed by the alignment layer and the liquid crystal medium is applied. Yu Guangpai

O:\55\557ll-920905 DOC -18- 580604 列層,其中曝光後排列層謗發液晶排列。-較佳方法中部 份偏振光亦經部份準直。另-較佳方法中部份偏振且部份 準直光具有一已受調整之偏振度。其他較佳實施例包含一 步驟〃巾液曰曰介為一旦接觸光排列層則加熱至超過液晶 介質之等向性點並冷卻至其等向性點以下。另一較佳方法 包含一步驟’其中曝光後排列層在接觸液晶介質前經過加 熱及々卻。其他較佳方法包含_光排列層對部份偏振光之 曝光係為斜入射且曝光後之排列層誘發該液晶介質相對於 光排列層表面之一預傾斜角。其他較佳方法包含使一光排 列層曝光,包括對邵份偏振光之兩次曝光,其中在兩次曝 光間有一對光排列層表面垂直方向之相對旋轉角度大於〇 度但小於360度。以上方法在以下實例中加以舉例說明。 一感光性聚醯亞胺 〇pt〇AlignTM M-2000 ( Elsicon Incorporated,Wilmington,DE 19810)應用於實例中。 實例一 本實例說明本發明之一種光學曝光系統,利用部份偏振 光以一單次曝光光排列具有預傾斜之液晶。 光學曝光系統顯示於圖1中。光輻射之來源為一紫外 光,一種由一微波源激勵之10英吋線性充氣燈丨(Fusion UV Systems,Inc·,Gaithersburg,MD 之產品)。光輻射由一圓柱 形橢圓反射鏡2收集。一 1.5英吋X10英吋之第一孔3位 置接近燈具之焦點。一 4英吋X12英吋之薄膜偏振器4以 其設計角度(68度)位於孔後,該偏振器由四個4英吋X 3英 叶之薄膜偏振器(CVI,Albuquerque,New Mexico)之一線 O:\55\557ll-92O905.DOC -19- 陳陣列構成。自偏振器反射之射線通過一位在偏振器之後 之1.5英才X8英吋第二孔5。圓柱形反射器及兩孔產生之 邵份準直光在沿掃描方向之維度内具有—約ig至15度之 發散度’JL對燈具在垂直於掃描方向之方向内之發散度(約 30至45度)略有影響。一吸收性玻璃板6阻擋波長小於 270毫微米之輻射透射。基板(其上塗佈光排列層)7沿_ 與燈具長軸垂直之軸以一線性平移台13 (八⑽叫O: \ 55 \ 557ll-920905 DOC -18- 580604 column layer, where the alignment layer after exposure exposes the liquid crystal alignment. -Partially polarized light in the preferred method is also partially collimated. Another-the preferred method, part of the polarization and part of the collimated light has an adjusted degree of polarization. Other preferred embodiments include a step in which the liquid is heated to exceed the isotropic point of the liquid crystal medium upon contact with the light alignment layer and cooled below its isotropic point. Another preferred method includes a step 'wherein the post-exposure alignment layer is heated and quenched before contacting the liquid crystal medium. Other preferred methods include: the exposure of the light alignment layer to a portion of the polarized light is oblique incidence and the exposed alignment layer induces a pretilt angle of the liquid crystal medium relative to the surface of the light alignment layer. Other preferred methods include exposing a light array layer, including two exposures to the polarized light of Shao Fen, in which a pair of light alignment layers have a relative relative rotation angle of greater than 0 degrees but less than 360 degrees between the two exposures. The above method is illustrated in the following examples. A photosensitive polyimide, PptAlignTM M-2000 (Elsicon Incorporated, Wilmington, DE 19810) was used in the examples. Example 1 This example illustrates an optical exposure system of the present invention, which uses a portion of polarized light to arrange a liquid crystal with a pretilt in a single exposure light. The optical exposure system is shown in FIG. 1. The source of the light radiation is an ultraviolet light, a 10-inch linear inflatable lamp excited by a microwave source (product of Fusion UV Systems, Inc., Gaithersburg, MD). The light radiation is collected by a cylindrical elliptical mirror 2. A 1.5 inch X10 inch first hole 3 position is close to the focus of the lamp. A 4-inch X12-inch film polarizer 4 is located behind the hole at its design angle (68 degrees). The polarizer consists of four 4-inch X 3-inch film polarizers (CVI, Albuquerque, New Mexico). First line O: \ 55 \ 557ll-92O905.DOC -19- Chen array. The rays reflected from the polarizer pass through a 1.5-inch X8-inch second hole 5 behind the polarizer. The cylindrical collimator and the two holes produce the collimated light in a dimension along the scanning direction, with a divergence of about ig to 15 degrees. 45 degrees) slightly affected. An absorbent glass plate 6 blocks transmission of radiation having a wavelength of less than 270 nm. The substrate (on which the light alignment layer is coated) 7 is a linear translation stage 13 (eight howls) along the axis perpendicular to the long axis of the lamp

Pittsburgh,PA )恆速掃描。通過第二孔之光名義上以料度 角入射基&amp;。平行於掃描方向之偏振光及垂直於掃描方向 之偏振光在對平行於掃描方向之全部孔整合後測得之偏振 比名義上為1:2。 利用上述光學曝光系統,具有一感光性聚醯亞胺之基板 曝光於一約為1〇〇焦耳//平方公分之總能量密度。掃描速 率及燈具功率經過挑選以給出所需能量密度,使基板上之 光排列材料充分曝光且促使與該排列材料接觸之液晶排 列。 在曝光後基板以光學產生排列方向之正交方位組裝成單 元。單元厚度約為4微米。單元然後以毛細作用的方法填 滿向列液晶。一如預期,可觀察到液晶以一具有預傾斜之 扭曲向列方位排列。在將液晶單元加熱超過液晶之等向性 點(95°C加熱30分鐘)後,即可觀察到排列之均勻性會有 所改善。預傾斜可經由鮑爾等人所主張的液晶旋轉方法(一 九七六年三月八日之”物理現象”第56A期)確認之)。 實例二 O:\55\557l 1-920905 DOC -20- 此實例說明一種光學曝光系統利用部份偏振光產生無預 傾斜之光排列。 本貫例之光學曝光系統顯示於圖2中。燈具系統包括一 線性充氣燈1和一實例一之圓柱形橢圓反射鏡2,該燈具系 統與一接近燈具焦點之丨5英吋χ 1〇英吋第一孔3結合。 實例一之薄膜偏振器4處於其設計角度(68度)在該孔之 後。透射通過該偏振器之射線通過位在該偏振器後之一 15 英吋X 8英吋第二孔5。圓柱形反射鏡與兩孔產生之部份準 直光在沿掃描方向之維度内具有一約1〇至15度之發散 度,且對燈具在掃描方向之垂直方向内之發散度略有影響 (約30至45度)。一吸收性玻璃板6阻擋波長小於27〇毫 微米 &lt; 輻射透射。備有感光性聚醯亞胺排列層之基板7用 一線性平移台13沿垂直於燈具長軸之一軸以一定速掃過。 通過第二孔之光線名義上垂直於基板入射。在整體越過平 行於掃描方向之全邵孔之後,平行於掃描方向偏振之光對 垂直於掃描方向偏振之光之偏振比測得約為。 利用上述光學曝光系統,具有—感光性聚醯亞胺之基板 曝光於―肖⑽焦耳/平方公分之總能量密度。掃描速率 及燈具之功率經過挑選達到所要能量密度,以充分對基板 上之光排列材料曝光,且促使與該排列材料接觸之液晶排 列0 在曝光後基板以光學產生排列方向之相互垂直方位組裝 成單元I元厚度約4 4微米。I元然後以毛細作用的方 法填滿向列液晶。_如預期觀察到液晶以一扭曲預傾斜向Pittsburgh, PA) constant speed scanning. The light passing through the second hole nominally enters the base &amp; at a material angle. The polarization ratio measured for the polarized light parallel to the scanning direction and the polarized light perpendicular to the scanning direction after integrating all the holes parallel to the scanning direction is nominally 1: 2. By using the above optical exposure system, a substrate having a photosensitive polyimide is exposed to a total energy density of about 100 Joules / cm 2. The scanning rate and lamp power are selected to give the required energy density, to fully expose the light alignment material on the substrate and to promote the alignment of liquid crystals in contact with the alignment material. After the exposure, the substrate is assembled into a unit in an orthogonal orientation of the optically generated alignment direction. The cell thickness is approximately 4 microns. The cell then fills the nematic liquid crystal by capillary action. As expected, it was observed that the liquid crystals were aligned in a twisted nematic orientation with pretilt. After the liquid crystal cell is heated beyond the isotropic point of the liquid crystal (heated at 95 ° C for 30 minutes), it can be observed that the alignment uniformity is improved. The pretilt can be confirmed by the liquid crystal rotation method advocated by Bauer et al. Example 2 O: \ 55 \ 557l 1-920905 DOC -20- This example illustrates an optical exposure system using partially polarized light to generate a light array without pre-tilt. The optical exposure system of this example is shown in FIG. 2. The lamp system includes a linear inflatable lamp 1 and a cylindrical elliptical mirror 2 of Example 1. The lamp system is combined with a 5-inch x 10-inch first hole 3 near the focal point of the lamp. The thin film polarizer 4 of Example 1 is behind its design angle (68 degrees). The ray transmitted through the polarizer passes through a 15-inch X 8-inch second hole 5 located behind the polarizer. Part of the collimated light generated by the cylindrical reflector and the two holes has a divergence of about 10 to 15 degrees in the dimension along the scanning direction, and has a slight effect on the divergence of the lamp in the vertical direction of the scanning direction ( (About 30 to 45 degrees). An absorptive glass plate 6 blocks transmission of wavelengths less than 270 nm &lt; radiation. The substrate 7 provided with a photosensitive polyimide alignment layer is swept by a linear translation stage 13 at a certain speed along an axis perpendicular to the long axis of the lamp. The light passing through the second hole is incident nominally perpendicular to the substrate. The polarization ratio of the light polarized parallel to the scanning direction to the light polarized perpendicular to the scanning direction was measured after passing the whole Shao hole parallel to the scanning direction as a whole. Using the above-mentioned optical exposure system, a substrate having a photosensitive polyfluorene imine is exposed to a total energy density of Xiao Xiao Joules / cm 2. The scanning rate and the power of the lamp are selected to reach the required energy density to fully expose the light alignment material on the substrate, and to promote the alignment of the liquid crystals in contact with the alignment material. The thickness of the unit element is about 44 microns. The I element then fills the nematic liquid crystal by capillary action. _ As expected, the LCD is observed with a twisted pretilt

O:\55\557II-920905 DOC -21 - 列方位排列。在將液晶單元加熱超過液晶之等向性點(95 °C加熱30分鐘)後,觀察到排列之均勻性有所改善。一如 預期觀祭到液晶以一無預傾斜之扭曲向列方位排列。 實例三 本實例說明一種實例二之光學曝光系統與一種圖3之光 子曝光系統結合以在一斜入射下曝光。此雙重曝光法用以 光排列具有預傾斜之液晶,且說明了 一反射鏡增加偏振比 之偏振效應。 備有感光性聚醯亞胺排列層之基板7首先由實例二中詳 、、’田說明之系統曝光。然後基板對備有一機械平台1 5之基板 平面之垂直方向旋轉90度。然後基板由圖3中之光學曝光 系統第二次曝光。實例一之燈具系統(1和2 )與一位置接 近燈具焦點之1.5英付X 10英忖第一孔3結合。圓柱形反 射鏡與兩孔產生之部份準直光在沿掃描方向之維度内具有 一約10至15度之發散度,且對燈具在掃描方向之垂直方 向内之發散度略有影響(約30至45度)。一實例一之偏振 益4以其設計角度(68度)位於孔後。透射通過偏振器之 射線通過位在該偏振器後之一 1 · 5英忖X §英叶第二孔5。 一種包括一塗佈鋁層之鋁基板之反射鏡8 ( Fusion Systems, Gaithersburg,MD )以一 68度之斜角放置在第二孔後。反 射^亦作用為在此角度使光輕射之偏振比增加至約11:1。 基板7用一線性平移台1 3沿垂直於燈具長軸之一軸以一定 速掃過。自反射鏡8反射之光線名義上以44度入射於該有 塗佈基板。 O:\55\55711-920905 D0C -22- 580604 利用上述光學曝光系統,具有一感光性聚醯亞胺之基板 曝光於一約100焦耳/平方公分之總能量密度。第一次和 第二次曝光間之曝光能量相對比率為4: 1。掃描速率及燈具 之功率經過挑選達到所要能量密度,以充分對基板上之光 排列材料曝光,且促使與該排列材料接觸之液晶排列。 在曝光後基板以光學產生排列方向之相互垂直方位組裝 成單元。單元厚度約為4微米。單元然後以毛細作用的方 法填滿向列液晶。一如預期觀察到液晶以一扭曲預傾斜向 列方位排列。在將液晶單元加熱超過液晶之等向性點(95 °C加熱30分鐘)後,觀察到排列之均勻性有所改善。利用 晶體旋轉法確認該預傾斜。 實例四 本實例說明如何將一實例二之光學曝光系統與一實例三 之光學曝光系統結合以光排列具有預傾斜之液晶。 重複貫例二,但第一次曝光係以圖3之光學曝光系統進行且第 '一次曝光係以圖2之光學曝光系統進行。 第一次和第二次曝光間之曝光能量之相對比率為丨:4。在 曝光後基板以光學產生排列方向之相互垂直方位組裝成單 元。單元厚度約為4微米。單元然後以毛細作用的方法填 滿向列液晶。一如預期觀察到液晶以一扭曲預傾斜向列方 位排列。在將液晶單元加熱超過液晶之等向性點(95。〇加 熱3 0分鐘)後,觀察到排列之均勻性有所改善。利用晶體 旋轉法確認該預傾斜。 實例五 O:\55\5571I-920905.DOC -23- 580604 此貫例說明一種光學系統’其利用兩次斜入射曝光產生 具有預傾斜之光排列。 備有一感光性聚醯亞胺排列層之基板7首先由圖3中說 明 &lt; 系統曝光。然後基板對備有一機械平台15之基板平面 &lt;垂直方向旋轉90度。然後基板以相同系統進行第二次曝 光。總曝光能量密度約為1〇〇焦耳/平方公分。第一次和 第二次曝光間之曝光能量相對比率為4:丨。在曝光後基板以 光學產生排列方向之相互垂直方位組裝成單元。單元厚度 約為4微米。單元然後以毛細作用的方法填滿向列液晶。 一如預期觀察到液晶以一扭曲預傾斜向列方位排列。在將 液晶單元加熱超過液晶之等向性點(95°C加熱30分鐘)後, 觀祭到排列之均勻性有所改善。利用晶體旋轉法確認該預 傾斜。 實例六 此實例說明一種光學系統,其利用兩次斜入射曝光產生 具有預傾斜之光排列。 備有一感光性聚醯亞胺排列層之基板7首先由圖3中說 明之系統曝光。然後基板對備有一機械平台1 5之基板平面 之垂直方向旋轉9 0度。然後基板以相同系統進行第二次曝 光。弟一 ’入和弟·一次曝光間之曝光能量相對比率為1:4。總 雙重曝光能量密度約為100焦耳/平方公分。在曝光後基 板以光學產生排列方向之垂直方位組裝成單元。單元厚度 約為4微米。單元然後以毛細作用的方法填滿向列液晶。 一如預期觀察到液晶以一扭曲預傾斜向列方位排列。在將 O:\55\557ll-920905 DOC -24- 580604 液晶單元加熱超過液晶之等向性點(95°C加熱30分鐘)後, 觀祭到排列之均勻性有所改善。利用晶體旋轉法確認該預 傾斜。 實例七 此貝例說明本發明之光學曝光裝置可用以改變曝光後光 排列層之電介質特性。 本貝例之光學曝光系統繪於圖4中。實例一之燈具系統 (1和2)與一接近燈具焦點之2英吋χ 2英吋第一孔9結 合。緊隨孔9有兩個2英吋X 2英吋平凸熔矽石圓柱形透鏡 10 ( Newport Optics,Irvinc,CA)彼此相互接觸,以產生一 8〇耄微米直線焦距。透鏡之直線焦距與充氣燈之線性軸平 仃。其後跟隨一單一 4英吋X3英吋薄膜偏振器u (c VI, AlbiiquerqUe,NM)處於其68度之設計角度。一丨英吋χ3 英叶孔12置於偏振器之後。孔9,圓柱形透鏡1 〇,及孔12 用以收集光輻射並將光輻射部份準直至在平行於掃描之方 向内之發散度約為10度。 備有一感光性聚醯亞胺排列層之基板7由此系統曝光。 使用一約100焦耳/平方公分之總曝光能量密度。掃描速 率及燈具之功率經過挑選達到所要能量密度,以充分對基 板上之光排列材料曝光,且促使與該排列材料接觸之液晶 排列。 異向電介質特性之光學測量方法係利用一種基於一光彈 性調制器(PEM-90, Huids lnstruments,HiUsboro, 0R)之 標準雙折射測量系統,依據Kemp概述之方法(p〇larized O:\55\557II-920905 D〇c -25 - 580604O: \ 55 \ 557II-920905 DOC -21-column orientation. After heating the liquid crystal cell beyond the isotropic point of the liquid crystal (heating at 95 ° C for 30 minutes), an improvement in the uniformity of the alignment was observed. As expected, the liquid crystals are aligned in a nematic orientation with no pretilt. Example 3 This example illustrates the combination of an optical exposure system of Example 2 with a photon exposure system of FIG. 3 to expose under an oblique incidence. This double exposure method is used to align liquid crystals with pre-tilt, and illustrates the polarization effect of a mirror to increase the polarization ratio. The substrate 7 provided with a photosensitive polyfluorene imine alignment layer is first exposed by a system described in detail in Example 2. Then, the substrate is rotated 90 degrees in the vertical direction with respect to the plane of the substrate provided with a mechanical platform 15. The substrate is then exposed a second time by the optical exposure system shown in FIG. The luminaire system (1 and 2) of Example 1 is combined with a 1.5 inch X 10 inch first hole 3 located close to the focus of the luminaire. Part of the collimated light generated by the cylindrical reflector and the two holes has a divergence of about 10 to 15 degrees in the dimension along the scanning direction, and has a slight effect on the divergence of the lamp in the vertical direction of the scanning direction (about 30 to 45 degrees). The polarization benefit 4 of Example 1 is located behind the hole with its design angle (68 degrees). The rays transmitted through the polarizer pass through one of the polarizers 1 · 5 inches X § Yingye second hole 5. A reflector 8 (Fusion Systems, Gaithersburg, MD) including an aluminum substrate coated with an aluminum layer is placed behind the second hole at an angle of 68 degrees. The reflection ^ also acts to increase the polarization ratio of light light emission to about 11: 1 at this angle. The base plate 7 is swept at a certain speed along an axis perpendicular to the long axis of the lamp by a linear translation stage 1 3. The light reflected from the mirror 8 is nominally incident on the coated substrate at 44 degrees. O: \ 55 \ 55711-920905 D0C -22- 580604 Using the above-mentioned optical exposure system, a substrate having a photosensitive polyimide is exposed to a total energy density of about 100 Joules per square centimeter. The relative exposure energy ratio between the first and second exposures is 4: 1. The scanning rate and the power of the lamp are selected to achieve the desired energy density, to fully expose the light alignment material on the substrate, and to promote the alignment of liquid crystals in contact with the alignment material. After exposure, the substrates are assembled into units in mutually perpendicular orientations in the optically generated alignment directions. The cell thickness is approximately 4 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic orientation as expected. After heating the liquid crystal cell beyond the isotropic point of the liquid crystal (heating at 95 ° C for 30 minutes), an improvement in the uniformity of the alignment was observed. This pretilt was confirmed by the crystal rotation method. Example 4 This example shows how to combine the optical exposure system of Example 2 and the optical exposure system of Example 3 to arrange the liquid crystals with pretilt by light. Example 2 was repeated, but the first exposure was performed using the optical exposure system of FIG. 3 and the first exposure was performed using the optical exposure system of FIG. 2. The relative ratio of the exposure energy between the first and second exposures is 4: 4. After the exposure, the substrates are assembled into units in a mutually perpendicular orientation in the optically generated alignment direction. The cell thickness is approximately 4 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic as expected. After heating the liquid crystal cell beyond the isotropic point of the liquid crystal (95.0 heating for 30 minutes), an improvement in the uniformity of the alignment was observed. This pretilt was confirmed by the crystal rotation method. Example 5 O: \ 55 \ 5571I-920905.DOC -23- 580604 This example illustrates an optical system 'that uses two oblique incident exposures to produce a pre-tilted light arrangement. The substrate 7 provided with a photosensitive polyimide alignment layer is first exposed by a system described in Fig. 3 &lt; The substrate is then rotated by 90 degrees with respect to the substrate plane provided with the mechanical platform 15 in the vertical direction. The substrate is then subjected to a second exposure in the same system. The total exposure energy density is about 100 Joules / cm 2. The relative exposure energy ratio between the first and second exposures is 4: 丨. After the exposure, the substrates are assembled into units in mutually perpendicular orientations in the optically generated alignment directions. The cell thickness is approximately 4 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic orientation as expected. After the liquid crystal cell is heated beyond the isotropic point of the liquid crystal (heated at 95 ° C for 30 minutes), the uniformity of the observation is improved. This pretilt was confirmed by the crystal rotation method. Example 6 This example illustrates an optical system that uses two oblique incidence exposures to produce a pre-tilted light array. The substrate 7 provided with a photosensitive polyimide alignment layer is first exposed by the system described in Fig. 3. Then, the substrate is rotated 90 degrees in a vertical direction with respect to a substrate plane provided with a mechanical platform 15. The substrate is then subjected to a second exposure in the same system. Brother Yi ’The relative ratio of exposure energies between Ruyi and Brother · One exposure is 1: 4. The total double exposure energy density is approximately 100 Joules per square centimeter. After the exposure, the substrate is assembled into a unit in a vertical orientation in which the alignment direction is optically generated. The cell thickness is approximately 4 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic orientation as expected. After heating the O: \ 55 \ 557ll-920905 DOC -24- 580604 liquid crystal cell beyond the isotropic point of the liquid crystal (heating at 95 ° C for 30 minutes), the uniformity of the observation is improved. This pretilt was confirmed by the crystal rotation method. Example 7 This example illustrates that the optical exposure device of the present invention can be used to change the dielectric characteristics of the light alignment layer after exposure. The optical exposure system of this example is shown in FIG. 4. The lamp system (1 and 2) of Example 1 is combined with a 2 inch x 2 inch first hole 9 near the focal point of the lamp. Immediately following the hole 9, there are two 2 inch X 2 inch plano-convex fused silica cylindrical lenses 10 (Newport Optics, Irvenc, CA) in contact with each other to produce a linear focal length of 80 μm. The linear focal length of the lens is parallel to the linear axis of the inflatable lamp. It is followed by a single 4-inch X3-inch film polarizer u (c VI, AlbiiquerqUe, NM) at its design angle of 68 degrees. A inch inch x 3 inch hole 12 is placed behind the polarizer. The hole 9, the cylindrical lens 10, and the hole 12 are used to collect the light radiation and align the light radiation part until the divergence in the direction parallel to the scanning direction is about 10 degrees. The substrate 7 provided with a photosensitive polyimide alignment layer is exposed by this system. A total exposure energy density of about 100 Joules / cm 2 was used. The scanning rate and the power of the lamp are selected to achieve the desired energy density, to fully expose the light alignment material on the substrate, and to promote the alignment of liquid crystals in contact with the alignment material. The optical measurement method for anisotropic dielectric properties uses a standard birefringence measurement system based on a photoelastic modulator (PEM-90, Huids Instruments, HiUsboro, 0R), according to the method outlined by Kemp (p〇larized O: \ 55 \ 557II-920905 D〇c -25-580604

Light and its interaction with Modulating Devices, Hinds International,Inc·,1987 )。測得之光學謗發雙折射度約為l X ΙΟ.2。 實例八 此實例說明一種用以控制一光學系統内部份準直度使一 基板光排列曝光之葉片結構。 本實例之一種光學曝光系統以一前視觀點顯示於圖5 中,其中基板朝該頁外平移。此系統包括圖2之光學曝光 系統及插在圓柱形反射鏡2與第一孔3之間之一葉片。一 由垂直擋板14構成之葉片放置為阻擋與一垂直於掃描方向 且對垂直向大於1 〇度之角度之光線。如此限制垂直於掃描 方向之光線之發散度為20度。 本實例說明一種對樣品平面有一斜方位之光學曝光 統’其產生一較小平均偏振比。Light and its interaction with Modulating Devices, Hinds International, Inc., 1987). The measured optical birefringence is about 1 X 10.2. Example 8 This example illustrates a blade structure for controlling the internal collimation of an optical system to expose a substrate to light. An optical exposure system of the present example is shown in FIG. 5 from a front view, where the substrate is translated toward the outside of the page. This system includes the optical exposure system of FIG. 2 and a blade interposed between the cylindrical reflector 2 and the first hole 3. A blade composed of a vertical baffle 14 is placed to block light with an angle perpendicular to the scanning direction and greater than 10 degrees in the vertical direction. This limits the divergence of light perpendicular to the scanning direction to 20 degrees. This example illustrates an optical exposure system 'having an oblique orientation to the sample plane, which produces a smaller average polarization ratio.

-種曝光系'統如圖6所示建構為相對將受掃描之基板 面成-斜方位(44度)。包括—線性充氣燈實例一 圓柱形橢圓反射鏡之一種燈具系統與實例二之一第一 3,-薄膜偏振器4及一第二孔5結合…透明石英板及 二色溥膜反射器16介於偏振器4和第二孔5間,反射波 約小於275毫微米之射線並透射波長約大於275毫微米 學Λ件之完㈣成建構錢其光學軸約對基板 面成約44度角。 的偏振比並不一致 在跨越一沿掃插方向之方向中光束An exposure system is constructed as shown in Fig. 6 to form an oblique orientation (44 degrees) with respect to the substrate surface to be scanned. Includes—a linear gas-filled lamp example of a cylindrical elliptical reflector, a lamp system combined with a first 3, -thin film polarizer 4 and a second hole 5 of the second example ... a transparent quartz plate and a two-color diaphragm reflector 16 Between the polarizer 4 and the second hole 5, the reflected wave is less than 275 nanometers and transmits a wavelength greater than 275 nanometers. The optical axis is approximately 44 degrees from the substrate surface. The polarization ratio is not uniform.

O:\55\557II-920905.DOC -26- 580604 偏振比係由測得一分鐘内累積之能量決定,測量方式利用 裝備一拒斥比好過1 〇〇: 1之紫外線增強之塑膠片偏振器 (Polaroid HNP’B,Boston,MA )之一能量計(uv ProcessO: \ 55 \ 557II-920905.DOC -26- 580604 The polarization ratio is determined by the energy accumulated within one minute of the measurement. The measurement method uses a UV-enhanced plastic sheet polarizer equipped with a rejection ratio better than 1000: 1. (Polaroid HNP'B, Boston, MA)

Supply Inc·,Chicago, IL)。為了二次曝光間之垂直偏振, 孩塑膠片偏振器旋轉90度以決定光束之偏振比。光束在a 位置之邊緣之偏振比為7.8:1。光束在A位置之能量為600 愛焦耳。光束在B位置之邊緣之偏振比為4.2:1。光束在b 位置之能量為892毫焦耳。對此實例中光學軸及偏振器之 方位而言’低偏振度較高偏振度具有一較高能量。當能量 計通過全光束之寬度掃描時平均偏振度為&amp;2:1。 實例十 此只例說明一種對樣品平面有一斜方位之光學曝光系 統,其產生較高平均偏振比。 一種類似於實例九之曝光系統建構為對將如圖7所示受 掃描之基板之平面成一斜方位(44度)。在此實例中偏振器 足位為一與實例九相反之方位。第一孔3 ,偏振器4,第二 孔5,及二分過濾器丨6之橫向位置向左向下偏移約1/4英 吋以增加平均偏振度。此觀點在實例十一中再進一步說明。 在跨越一沿掃描方向之方向中光束的偏振比並不一致, 且如實例九測量之。光束在A位置之邊緣之偏振比為 16:1。光束在A位置之能量為79〇毫焦耳。光束在b位置 之邊緣之偏振比為12:1。光束在B位置之能量為405毫焦 耳對此貫例中光學軸及偏振器之方位而言,高偏振度較 低偏振度具有一較高能量。當能量計越過全光束寬度掃描 O:\55\55711-920905.DOC -27· 580604 時平均偏振度為14:1。 一光學傳導之分析顯示此實例提供與實例3中相似之曝 光狀況。如先前所述對曝光幾何及偏振器方位之考量提供 對觀察所得實例二和實例三間偏振比增加之一種解釋。 實例十一 此實例說明一種實例九之光學曝光系統,顯示如何利用 橫向排列控制偏振比。 一種類似於實例九之曝光系統建構為相對將如圖6所示 受掃描之基板平面成一斜方位(44度)。第一孔3,薄膜偏 振器4,第二孔5,薄膜二分反射器16沿垂直於燈具長軸 之一軸偏移。 在能T計掃描橫越光束全寬度時,一對右上偏移約〇. 2 5 英吋之偏移量造成5.4:1之偏振比。在能量計掃描橫越光束 全寬度時,一對左下偏移約0.5英吋之偏移量造成7.4:1之 偏振比。 實例十二 此實例說明一種能類似於實例一產生具有預傾斜之光排 列但以透射運作之光學曝光系統。 一種曝光系統建構為對將如圖8A所示受掃描基板之平 面成一斜方位(44度)。一種包括實例一之一線性充氣燈及 一圓柱形橢圓反射鏡之燈具系統與實例二之一第一孔3 , 一 薄膜偏振器陣列28,及一第二孔5結合。一透明石英板及 一二分薄膜反射器16介於偏振器陣列28和第二孔5間, 反射波長小於約275毫微米之射線並透射波長大於約275 O:\55\55711-920905.DOC -28 - 毛微米 &lt; 射線。光學組件之完整總成建構為使其光學軸對 基板平面成約44度角。 、 薄膜偏振器陣列28由如圖8B所示對光束成68度角之個 別薄膜偏振器4之-p車列構成。每一偏振器4對與圖6相 較之光束軸旋轉90度。每一偏振器4由一用以對每一偏振 益阻擋反射光之垂直擋板14隔開。當能量計越過全光束寬 度掃描時平均偏振度為1:2.5。 實例十三 此實例說明一種具有一較低偏振度之光學曝光系統,其 _ 利用兩次斜入射曝光產生具有預傾斜之光排列。 備有一感光性聚醯亞胺排列層之基板7首先由與圖9相 似之系統曝光。然後基板對備有一機械平台15之基板平面 之垂直方向旋轉90度。然後基板以相同光學曝光系統進行 第二次曝光。實例一之燈具系統(1和2 )與一位置接近燈 具焦點之1.5英吋X 1 〇英吋第一孔3結合。圓柱形反射器 與兩孔產生之部份準直光在沿掃描方向之維度内具有約1〇 $ 至15度之發散度,且對燈具在垂直於掃描方向之方向内之 發散度(約30至45度)略有影響。薄膜偏振器4以其設 計角度(68度)位於孔後。透射通過偏振器之射線通過位 在偏振器之後之一 1.5英吋X 8英吋第二孔5。測得偏振比 約為6:1。基板7用一線性平移台13沿垂直許聲具長軸之 一軸以一定速掃過。光線名義上以44度入射於該有塗佈基 板。 利用上述光學曝光系統,具有一感光性聚醯亞胺之基板 O:\55\55711-920905 DOC -29- 580604 曝光於-約為1 00焦耳/平方公分之總能量密度。第—次 和第一次曝光間 &lt; 曝光能量相對比率為4:1。掃描速率及燈 具功率經過挑選以給出所需能量密度,使基板上之光排列 材料充分曝光且促使與該排列材料接觸之液晶排列。 在曝光後基板以光學產生排列方向之相互垂直方位組裝 成單元。單元厚度約4 4微米。單元然後以毛細作用的方 法填滿向列液晶。一如預期觀察到液晶以一扭曲預傾斜向 列方位排列。在將液晶單元加熱超過液晶之等向性點(% °c加熱30分鐘)後,觀察到排列之均勾性有所改善。利用 _ 晶體旋轉法確認該預傾斜。 實例十四 此實例說明一種具有一較高偏振度之光學曝光系統,其 利用兩次斜入射曝光以增進之均勻性產生具有預傾斜之光 排列。 備有一感光性聚醯亞胺排列層之基板首先由與圖7相似 之系統曝光。然後基板對備有一機械平台1 5之基板平面之 垂直方向旋轉90度。然後基板以相同光學曝光系統進行第 * 二次曝光。實例一之燈具系統(1和2 )與一位置接近燈具 焦點之1.5英吋X 10英忖第一孔3結合。圓柱形反射器與 兩孔產生之邵份準直光在沿掃描方向之維度内具有約1 〇至 15度之發散度,且對燈具在垂直於掃描方向之方向内之發 散度(約30至45度)略有影響。實例一之薄膜偏振器4 以其設計角度(6 8度)位於孔後。透射通過偏振器之射線 通過位在偏振器之後之一 1·5英吋X8英吋第二孔$。 O:\55\557l 1-920905 DOC -30- 580604 偏振比約為9·5:1。基板7用一線性平移台13沿垂直於燈 具長軸之一軸以一定速掃過。光線名義上以44度入射於該 有塗佈基板。 利用上述光學曝光系統,具有一感光性聚醯亞胺之基板 曝光於一約為1 00焦耳/平方公分之總能量密度。第一次 和第二次曝光間之曝光能量相對比率為4:丨。掃描速率及燈 具功率經過挑選以給出所需能量密度,使基板上之光排列 材料充分曝光且促使與該排列材料接觸之液晶排列。 在曝光後基板以光學產生排列方向之相互垂直方位組裝 成單7C。單7C厚度約為4微米。單元然後以毛細作用的方 法填滿向列液晶。一如預期觀察到液晶以一扭曲預傾斜向 列方位排列。在將液晶單元加熱超過液晶之等向性點(% °C加熱30分鐘)後,觀察到排列之均勻性有所改善。排列 品質與實例十三相較有所改進。利用晶體旋轉法確認該預 傾斜。 實例十五 此實例說明一種加熱一基板之方法,該基板在曝光後但 在構成一液晶測試單元前之光排列材料製備而成。 備有一感光性聚醯亞胺排列層之基板首先由圖1〇所示 之系統曝光。然後基板對備有一機械平台15之基板平面之 垂直方向旋轉90度。然後基板以相同光學曝光系統進行第 二次曝光。#例一之燈具系、统(i * 2)與一位置接近燈具 焦點之1.5英忖X 10英忖第一孔3結合。圓柱形反射器與 兩孔產生之部份準直光在沿掃描方向之維度内具有約1〇至 O:\55\557 Π-920905.DOC -31 - 580604 15度之發散度,且對燈具在垂直於掃描方向之方向内之發 散度(約30至45度)略有影響。實例一之薄膜偏振器4 以其設計角度(68度)位於孔後。透射通過偏振器之射線 通過位在偏振器之後之一 1.5英吋X8英吋第二孔5。基板 7用一線性平移台1 3沿垂直於燈具長軸之一軸以一定速掃 過。光線名義上以44度入射於該有塗佈基板。 利用上述光學曝光系統,具有一感光性聚醯亞胺之基板 曝光於一約為1 〇〇焦耳/平方公分之總能量密度。第一次 和第一 ’人曝光間之曝光能量相對比率為4:1。掃描速率及燈 具功率經過挑選以給出所需能量密度,使基板上之光排列 材料充分曝光且促使與該排列材料接觸之液晶排列。 在曝光後基板加熱至18(TC維持兩小時然後讓其冷卻至 在加熱及冷卻後基板以光學產生排列方向之相互垂直方 位組裝成單元。單元厚度約為4微米 。單元然後以毛細作Supply Inc., Chicago, IL). For vertical polarization between two exposures, the plastic sheet polarizer is rotated 90 degrees to determine the polarization ratio of the beam. The polarization ratio of the edge of the beam at the a position is 7.8: 1. The energy of the beam at position A is 600 Ajoules. The polarization ratio of the beam at the edge of the B position is 4.2: 1. The energy of the beam at position b is 892 millijoules. For the orientation of the optical axis and the polarizer in this example, 'low polarization degree and higher polarization degree have a higher energy. When the energy meter scans across the full beam width, the average polarization is & 2: 1. Example 10 This example illustrates an optical exposure system with an oblique orientation to the sample plane, which produces a higher average polarization ratio. An exposure system similar to that of Example 9 is constructed to tilt the plane of the substrate scanned as shown in Fig. 7 at an oblique orientation (44 degrees). In this example, the polarizer is in a position opposite to that of Example 9. The lateral positions of the first hole 3, the polarizer 4, the second hole 5, and the dichroic filter 6 are shifted to the left and down by about 1/4 inch to increase the average polarization degree. This view is further illustrated in Example XI. The polarization ratio of the light beam is inconsistent in a direction spanning a scanning direction, and is measured as in Example 9. The polarization ratio of the beam at the edge of the A position is 16: 1. The energy of the beam at the A position is 79 millijoules. The polarization ratio of the beam at the edge of position b is 12: 1. The energy of the light beam at the B position is 405 millijoules. For the orientation of the optical axis and the polarizer in this example, high polarization and low polarization have a higher energy. When the energy meter scans O: \ 55 \ 55711-920905.DOC -27 · 580604 across the full beam width, the average polarization is 14: 1. An optical transmission analysis shows that this example provides similar exposure conditions as in Example 3. Consideration of exposure geometry and polarizer orientation as previously described provides an explanation of the increase in polarization ratios observed between Examples 2 and 3. Example 11 This example illustrates an optical exposure system of Example 9, showing how to control the polarization ratio using a horizontal arrangement. An exposure system similar to that of Example 9 is constructed to tilt the plane of the substrate scanned as shown in Fig. 6 at an oblique orientation (44 degrees). The first hole 3, the thin film polarizer 4, the second hole 5, and the thin film dichroic reflector 16 are offset along one axis perpendicular to the long axis of the lamp. When the T-meter can scan across the full width of the beam, a pair of upper right offsets of about 0.25 inches offsets a polarization ratio of 5.4: 1. When the energy meter scans across the full width of the beam, a pair of offsets of about 0.5 inches at the bottom left cause a polarization ratio of 7.4: 1. Example 12 This example illustrates an optical exposure system similar to Example 1 that can produce a pre-tilted light array but operates in transmission. An exposure system is constructed to tilt the plane of the scanned substrate as shown in Fig. 8A at an oblique orientation (44 degrees). A lamp system including a linear inflatable lamp of Example 1 and a cylindrical elliptical mirror is combined with a first hole 3, a thin film polarizer array 28, and a second hole 5 of Example 2. A transparent quartz plate and a two-layer thin film reflector 16 are interposed between the polarizer array 28 and the second hole 5, and reflect rays with a wavelength less than about 275 nm and transmit wavelengths greater than about 275 O: \ 55 \ 55711-920905.DOC -28-Hair micron &lt; ray. The complete assembly of the optical component is constructed such that its optical axis makes an angle of about 44 degrees with respect to the plane of the substrate. The thin film polarizer array 28 is constituted by a -p train of the individual thin film polarizers 4 which have an angle of 68 degrees to the light beam as shown in Fig. 8B. Each polarizer 4 is rotated by 90 degrees with respect to the beam axis in comparison with FIG. Each polarizer 4 is separated by a vertical baffle 14 for blocking the reflected light for each polarization benefit. When the energy meter is scanned across the full beam width, the average polarization is 1: 2.5. Example 13 This example illustrates an optical exposure system with a lower degree of polarization, which uses two oblique incidence exposures to produce a pre-tilted light array. The substrate 7 provided with a photosensitive polyfluorene imine alignment layer is first exposed by a system similar to that shown in FIG. Then, the substrate is rotated 90 degrees in a vertical direction with respect to a substrate plane provided with a mechanical platform 15. The substrate is then exposed for the second time using the same optical exposure system. The luminaire system (1 and 2) of Example 1 is combined with a 1.5-inch X 100-inch first hole 3 located near the focal point of the luminaire. Part of the collimated light generated by the cylindrical reflector and the two holes has a divergence of about 10 $ to 15 degrees in the dimension along the scanning direction, and the divergence of the lamp in the direction perpendicular to the scanning direction (about 30 Up to 45 degrees). The film polarizer 4 is located behind the hole with its design angle (68 degrees). The rays transmitted through the polarizer pass through the second hole 5 which is one behind the polarizer, 1.5 inches X 8 inches. The measured polarization ratio was approximately 6: 1. The base plate 7 is swept at a certain speed along one axis of the long axis of the vertical acoustic horn by a linear translation stage 13. Light was incident on the coated substrate at nominally 44 degrees. Using the above-mentioned optical exposure system, a substrate having a photosensitive polyimide O: \ 55 \ 55711-920905 DOC -29- 580604 is exposed at a total energy density of -about 100 Joules per square centimeter. The relative ratio of exposure energy between the first and first exposures is 4: 1. The scanning rate and lamp power are selected to give the required energy density, to fully expose the light alignment material on the substrate and to promote the alignment of liquid crystals in contact with the alignment material. After exposure, the substrates are assembled into units in mutually perpendicular orientations in the optically generated alignment directions. The cell thickness is approximately 44 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic orientation as expected. After the liquid crystal cell was heated beyond the isotropic point of the liquid crystal (% ° c for 30 minutes), an improvement in the uniformity of the alignment was observed. Confirm the pre-tilt using the _ crystal rotation method. Example Fourteen This example illustrates an optical exposure system with a higher degree of polarization that uses two oblique incident exposures to enhance uniformity to produce a pre-tilted light array. A substrate provided with a photosensitive polyimide alignment layer is first exposed by a system similar to that shown in FIG. The substrate is then rotated 90 degrees in the vertical direction with respect to the substrate plane provided with a mechanical platform 15. The substrate is then subjected to the second * exposure using the same optical exposure system. The lamp system (1 and 2) of Example 1 is combined with a 1.5 inch X 10 inch first hole 3 located near the focal point of the lamp. The collimated light produced by the cylindrical reflector and the two holes has a divergence of about 10 to 15 degrees in the dimension along the scanning direction, and the divergence of the lamp in the direction perpendicular to the scanning direction (about 30 to 45 degrees) slightly affected. The thin film polarizer 4 of Example 1 is located behind the hole with its design angle (68 degrees). The ray transmitted through the polarizer passes through a second hole of 1.5 inches x 8 inches located behind the polarizer. O: \ 55 \ 557l 1-920905 DOC -30- 580604 The polarization ratio is approximately 9.5: 1. The substrate 7 is swept by a linear translation stage 13 at a certain speed along an axis perpendicular to the long axis of the lamp. Light was incident on the coated substrate at nominally 44 degrees. Using the above-mentioned optical exposure system, a substrate having a photosensitive polyimide is exposed to a total energy density of about 100 Joules / cm 2. The relative exposure energy ratio between the first and second exposures is 4: 丨. The scanning rate and lamp power are selected to give the required energy density, to fully expose the light alignment material on the substrate and to promote the alignment of liquid crystals in contact with the alignment material. After exposure, the substrates were assembled into a single 7C in a mutually perpendicular orientation with the optically generated alignment directions. Single 7C thickness is about 4 microns. The cell then fills the nematic liquid crystal by capillary action. The liquid crystals were observed to be aligned in a twisted pre-tilted nematic orientation as expected. After the liquid crystal cell was heated beyond the isotropic point of the liquid crystal (% ° C for 30 minutes), an improvement in the uniformity of the alignment was observed. The quality of the arrangement is improved compared to Example 13. This pretilt was confirmed by the crystal rotation method. Example 15 This example illustrates a method of heating a substrate made of a light aligning material after exposure but before forming a liquid crystal test cell. A substrate provided with a photosensitive polyimide alignment layer is first exposed by the system shown in FIG. 10. Then, the substrate is rotated 90 degrees in the vertical direction with respect to the substrate plane on which the mechanical platform 15 is provided. The substrate is then subjected to a second exposure using the same optical exposure system. # 例 一 的 灯 系 , 系 (i * 2) is combined with a position 1.5 which is close to the focal point of the lamp, and the first hole 3 is 10 inches. Part of the collimated light produced by the cylindrical reflector and the two holes has a divergence of about 10 to O: \ 55 \ 557 Π-920905.DOC -31-580604 15 degrees in the dimension along the scanning direction, and it is The degree of divergence in the direction perpendicular to the scanning direction (about 30 to 45 degrees) is slightly affected. The thin film polarizer 4 of Example 1 is located behind the hole with its design angle (68 degrees). The ray transmitted through the polarizer passes through a second hole 5 of 1.5 inches X 8 inches located behind the polarizer. The substrate 7 is swept at a certain speed along an axis perpendicular to the long axis of the lamp by a linear translation stage 1 3. Light is incident on the coated substrate at nominally 44 degrees. Using the optical exposure system described above, a substrate having a photosensitive polyimide is exposed to a total energy density of about 1000 Joules / cm 2. The relative exposure energy ratio between the first and first 'person exposure is 4: 1. The scanning rate and lamp power are selected to give the required energy density, to fully expose the light alignment material on the substrate and to promote the alignment of liquid crystals in contact with the alignment material. After exposure, the substrate is heated to 18 ° C for two hours and then allowed to cool. After heating and cooling, the substrate is assembled into a unit in an optically perpendicular direction to the arrangement direction. The unit thickness is about 4 microns. The unit is then made of capillary

經發現排狀μ性與轉維持比率與實例十四中製備 之單元相較時有所改進。 實例十六It was found that the row-like µ property and the rotation maintenance ratio were improved when compared with the unit prepared in Example 14. Example sixteen

9Α和Β中,一支撐結構29 ,— 可調整曝光角之光學曝光系統。 楱組26,一光學外罩27繪於圖 29 ’ 一輪軸30,_定位器銷31, O:\55\5571l-920905 DOC -32 - 580604 燈具模組26容納實例 及一定位器後板3 2,如圖1 〇所示 一之圓柱形燈具1及反射器2。 〜光學外罩容納-種料圖9中之光學模組。光學外罩結 實地附加於燈具模組上。光學模組以螺栓穿過光學模組上 之橫向孔19附加於光學外罩。如此許可光學模組之橫向定 位控制偏振度。光學模組如圖1〇所示定位於右下約ι/4英 叶處以增加偏振度。圖9所示偏振器之方位係用以在圖1〇 所示曝光系統中在斜入射下產生一較高偏振度。 支撐結構29,輪軸30,定位器銷31,及定位器後板32 提供控制曝光角度之裝置。燈具模組以一提供調整高度之 螺釘機構安裝於支撐結構上。支撐結構29對輪軸旋轉, 且定位器銷31與定位器後板32之作用為在不同曝光角度 鎖住支撐結構。 當支撙結構定位為用於垂直人射,光學曝光系統平均橫 越全光束之偏振比約為6:卜在支撐結構定位為用於44度 角斜入射時’光學曝光系統平均橫越全光束之偏振比約為 9.5:1。在支撐結構定位為用於55度角斜入射時,光學曝光 系統平均橫越全光束之偏振比約為12.5:1。 此實例顯示光束内之部份偏振度影響平均偏振度且視曝 ^角度而定;且進-步支持對斜曝光角之平均偏振度有所 貝獻之偏振器之方位。 以上實例及前述說明均屬本發明之說明。應瞭解對習於 此技藝者而言可能想出以上論述之其他選擇。本發明包含 所有在本發明範圍内之此種其他選擇。In 9A and B, a supporting structure 29, an optical exposure system with adjustable exposure angle. Group 26, an optical cover 27 is shown in Fig. 29 'A wheel shaft 30, _positioner pin 31, O: \ 55 \ 5571l-920905 DOC -32-580604 The light module module 26 accommodates an example and a positioner rear plate 3 2 As shown in Fig. 10, a cylindrical lamp 1 and a reflector 2 are provided. ~ Optical housing accommodating-the optical module in Figure 9 The optical housing is firmly attached to the luminaire module. The optical module is attached to the optical housing by bolts passing through the transverse holes 19 in the optical module. This allows the lateral positioning of the optical module to control the degree of polarization. The optical module is positioned at about ι / 4 inches in the lower right as shown in Figure 10 to increase the degree of polarization. The orientation of the polarizer shown in FIG. 9 is used to generate a higher degree of polarization under oblique incidence in the exposure system shown in FIG. 10. The support structure 29, the wheel axle 30, the locator pin 31, and the locator back plate 32 provide means for controlling the exposure angle. The lamp module is mounted on the supporting structure by a screw mechanism that provides height adjustment. The support structure 29 rotates the axle, and the function of the positioner pin 31 and the positioner rear plate 32 is to lock the support structure at different exposure angles. When the support structure is positioned for vertical human shooting, the polarization ratio of the average exposure beam across the full beam is about 6: When the support structure is positioned for 44-degree oblique incidence, the average exposure beam crosses the entire beam. The polarization ratio is approximately 9.5: 1. When the support structure is positioned for a 55-degree oblique incidence, the average polarization ratio of the optical exposure system across the full beam is approximately 12.5: 1. This example shows that part of the degree of polarization in the beam affects the average degree of polarization and depends on the exposure angle; and further supports the orientation of the polarizer that has an average polarization degree of the oblique exposure angle. The above examples and the foregoing descriptions are illustrative of the present invention. It should be understood that other options may be conceived for those skilled in the art. The invention encompasses all such other options within the scope of the invention.

O:\55\557I1-920905 DOC -33- 580604 【圖式簡單說明】 圖1、纟會出一種光學曝光系統’其備有邵份準直及部份偏 ’ 振輕射。 圖2繪出一種光學系統之側視圖,其用於以近似正向入 射使一基板曝光。 圖3繪出一種光學系統之側視圖,其用於以斜入射使— 基板曝光。 圖4繪出一種光學系統之側視圖,其利用折射光學以近 似正向入射使一基板曝光。 _ 圖5繪出一種光學系統之前視圖,其利用一葉片結構控 制部份準直度。 圖6繪出一種光學系統之側視圖,其具有在某一角度之 光學組件,該角度被用於以較低度偏振以斜入射曝光。 圖7繪出一種光學系統之側視圖,其具有在某一角度之 光學組件,該角度被用於以較高度偏振以斜入射曝光。 圖8(A)繪出一種光學系統之側視圖,其具有在某一角度 鲁 之光學組件,該角度被用於以斜入射以一單次曝光,(B)繪 出偏振器之前視圖以清楚顯示其構造。 圖9(A)繪出一種用於本發明一光學組件之加長型外殼外 敗,(B)繪出裝在該光學組件内之光學元件。 圖1〇緣出一種備有變換曝光入射角裝置之光學曝光系 統。 【圖式代表符號說明】O: \ 55 \ 557I1-920905 DOC -33- 580604 [Brief description of the diagram] Figure 1. There will be an optical exposure system, which is equipped with Shaofen collimation and partial deflection. Figure 2 depicts a side view of an optical system for exposing a substrate with approximately forward incidence. Figure 3 depicts a side view of an optical system for exposing a substrate with oblique incidence. Figure 4 depicts a side view of an optical system that uses refractive optics to expose a substrate at approximately forward incidence. _ Figure 5 depicts a front view of an optical system using a blade structure to control partial collimation. Fig. 6 depicts a side view of an optical system having optical components at an angle that is used for oblique incidence exposure with a lower degree of polarization. Fig. 7 depicts a side view of an optical system having optical components at an angle that is used to expose at an oblique incidence with a higher degree of polarization. Figure 8 (A) depicts a side view of an optical system with optical components at an angle that is used for oblique incidence with a single exposure, (B) depicts a front view of the polarizer for clarity Show its structure. Fig. 9 (A) depicts an external case of an elongated housing used in an optical module of the present invention, and (B) depicts an optical element mounted in the optical module. Fig. 10 shows an optical exposure system equipped with a device for changing the exposure angle of incidence. [Schematic representation of symbols]

O:\55\557 Π-920905 DOC -34- 580604 1 10英吋線性氣燈 2 圓形橢圓反射鏡 3 第一孑L 4, 11 薄膜偏振器 5 第二孔 6 吸收性玻璃盤 7 基板 8 反射鏡 9, 12 孔 10 柱形透鏡 13 線性平移台 14 垂直檔板 15 機械平台 16 二分薄膜反射器 17 前板 18 後板 19 橫向孔 20 樞軸孔 21 弧形孔 22 矩形開放架 24 樞軸銷 25 弧形銷 26 燈具模組 27 光學外罩 O:\55\55711-920905.DOC -35- 580604 28 薄膜偏振器陣列 29 支撐結構 30 輪軸 31 定位器銷 32 定位器後板 O:\55\55711-920905 DOC -36-O: \ 55 \ 557 Π-920905 DOC -34- 580604 1 10-inch linear gas lamp 2 Round elliptical reflector 3 First 孑 L 4, 11 Thin film polarizer 5 Second hole 6 Absorptive glass disc 7 Substrate 8 Mirrors 9, 12 holes 10 Cylindrical lens 13 Linear translation stage 14 Vertical baffle plate 15 Mechanical platform 16 Divided thin film reflector 17 Front plate 18 Rear plate 19 Transverse hole 20 Pivot hole 21 Arc hole 22 Rectangular open frame 24 Pivot Pin 25 Arc pin 26 Luminaire module 27 Optical cover O: \ 55 \ 55711-920905.DOC -35- 580604 28 Thin film polarizer array 29 Support structure 30 Axle 31 Positioner pin 32 Positioner rear plate O: \ 55 \ 55711-920905 DOC -36-

Claims (1)

弟〇87118266號專利申請案 中文申請專利範圍再替換本(92年9月) 拾、申請專利範園:Brother No. 087118266 patent application Chinese patent application scope replacement version (September 1992) 括: P y:' 輻射排列一基板之光學曝光系統,包 至少一光輻射源; 用以部份偏振該光輻射之裝置; 用以部份準直該光輻射之裝置; 用以相對於該部份偏振及部份準直光輻射傳送該基板之裝置,其 中, Μ光輻射源具有一長軸或球形幾何,且該用以部份偏振該光輻射 之裝置包括: 一偏振器,具有以一特定設計角朝向及背離光輻射源之面,其中 該偏振器產生一反射射線及一透射射線; 該用以部份準直該光輻射之裝置包括: 一彎曲反射器,位於背離光輻射源之指定距離處; 一第一孔,具有朝向及背離光輻射源之面; 一第二孔,具有朝向及背離光輻射源之面,其係沿偏振器背離光 輻射源面配置; 該用以相對於該部份偏振及部份準直光輻射傳送該基板之裝置具 有一表面面向該光輻射源用以支承基板,其係沿第二孔之背離光輻射 源面配置。 2·如申請專利範圍第1項之光學曝光系統,其進一步包括部份過濾該光 輕射之裝置。 3.如申請專利範圍第1項之光學曝光系統,其進一步包括調整部份偏振 O:\55\55711-920925.DOC b5l 、 ut* ri^ 度 &lt; 裝置。 如申巧專利範圍第2項《光學曝光系統,其進一步包括調整部份偏振 度之裝置。 5·如中請專利範m第2項之光學曝光系統,其中: 、該偏振器為—薄顯減m孔之背離光輻射源面配置且 成一角度與特定設計角對應;Including: P y: 'An optical exposure system that radiates a substrate, including at least one optical radiation source; a device for partially polarizing the optical radiation; a device for partially collimating the optical radiation; A device for transmitting the substrate with partially polarized and partially collimated light radiation, wherein the M light radiation source has a long axis or spherical geometry, and the device for partially polarizing the light radiation includes: a polarizer having A specific design angle faces and faces away from the light radiation source, wherein the polarizer generates a reflected ray and a transmitted ray; the device for partially collimating the light radiation includes: a curved reflector located away from the light radiation source At a specified distance; a first hole having a face facing and away from the light radiation source; a second hole having a face facing and away from the light radiation source, which is arranged along the surface of the polarizer facing away from the light radiation source; The device for transmitting the substrate with respect to the partially polarized and partially collimated optical radiation has a surface facing the optical radiation source for supporting the substrate, and is arranged along the second hole away from the surface of the optical radiation source. 2. The optical exposure system according to item 1 of the scope of patent application, which further includes a device for partially filtering the light. 3. The optical exposure system according to item 1 of the patent application scope, further comprising a device for adjusting a part of the polarization O: \ 55 \ 55711-920925.DOC b5l, ut * ri ^ degree &lt;. For example, Shen Qiao's patent scope No. 2 "optical exposure system, which further includes a device for adjusting the degree of polarization. 5. The optical exposure system according to item 2 of the patent, in which: The polarizer is-the thin m-reduction m-hole is disposed away from the light radiation source surface and forms an angle corresponding to a specific design angle; 該彎曲反射器為-圓柱形擴圓反射鏡,其有一長轴,平行於光輕 射源長軸配置且與光银m有—轉以使光輻射聚焦在一焦點; β第-孔具有-絲’其約位於焦點處且沿光讀源長轴配置; 孩第二孔具有一長軸,沿薄膜偏振器背離光輕射源面配置,沿第 一孔長軸配置且與第一孔平行; 卿份過濾、該光輻射之裝置為—具有朝向及背離絲射源之面之 過滤器,其平行於第二孔飾絲射源之面且沿此面配置。The curved reflector is a cylindrical cylindrical reflector, which has a long axis that is arranged parallel to the long axis of the light light source and has a rotation with the light silver m to focus the light radiation at a focal point; the β-th hole has- The filament is located approximately at the focal point and is arranged along the long axis of the optical reading source; the second hole has a long axis and is arranged along the film polarizer away from the light light source surface, and is arranged along the long axis of the first hole and parallel to the first hole ; Qing Fen filtering, the device for optical radiation is a filter with a side facing and away from the silk source, which is parallel to and arranged along the side of the second hole decoration silk source. 6. -種用以產生具有—偏振度之部份偏振及部份準直絲射之光學模 組,包括一長形外殼,該模組包括: 一可移動頂部孔板,其有一長形孔約在該板中央且與外殼長度平 行, 一可移動底部孔板,其有一長形孔約在該板中央且與外殼長度平 行, 一前板,其有一個或多個橫向孔位於該板周邊,一樞軸孔偏離中 央位於該板之一上部象限内,及一弧形孔偏離中央位於該板之一相反 的下部象限内,由對該樞軸孔旋轉之一線定義, 一後板,其有與前板相符之一樞軸孔及一弧形孔, O:\55\55711-920925.DOC -2 - 一樞軸銷,其由前板和後板内之樞軸孔支撐, 一矩形開放架,其附加於樞軸銷, 一弧形銷,其在與樞軸銷相反之末端附加於矩形開放架且固定於 弧形孔内, 一個或多個薄膜偏振器,其附於矩形開放架内, 一個或多個過濾器板,其與底部孔板大約平行安裝且覆蓋該孔; 其中樞軸孔之位置使薄膜偏振器位於頂部孔板孔下方的正中央, 且篆形孔大約位於為薄膜偏振器有一特定設計角度之中央,且其中旅 形孔可用以調整薄膜器偏振器之角度且橫向孔可用以調整長形外殼 相對於一光輻射源之位置。 一種以部份偏振及部份準直光輻射排列一基板之光學曝光系統,包 括: 至少一光輻射源; 用以部份偏振該光輻射之裝置;6. An optical module for generating a partial polarization and a partial collimation of light with a degree of polarization, including an elongated housing, the module comprising: a movable top orifice plate with an elongated hole About the center of the plate and parallel to the length of the shell, a movable bottom hole plate with an elongated hole about the center of the plate and parallel to the length of the shell, a front plate with one or more transverse holes at the periphery of the plate A pivot hole deviates from the center in one of the upper quadrants of the plate, and an arc hole deviates from the center in one of the lower quadrants of the plate, defined by a line of rotation to the pivot hole, a rear plate, which There is a pivot hole and a curved hole in accordance with the front plate, O: \ 55 \ 55711-920925.DOC -2-a pivot pin, which is supported by the pivot holes in the front plate and the rear plate, a rectangle An open frame attached to a pivot pin, an arc pin attached to a rectangular open frame at the opposite end of the pivot pin and fixed in an arc hole, one or more thin film polarizers attached to a rectangular opening Inside the rack, one or more filter plates are mounted approximately parallel to the bottom orifice plate. And cover the hole; the position of the pivot hole is such that the film polarizer is located exactly below the top hole plate hole, and the 篆 -shaped hole is located approximately at the center of a specific design angle for the film polarizer, and the travel hole can be used to adjust The angle of the thin film polarizer and the transverse hole can be used to adjust the position of the elongated shell relative to a light radiation source. An optical exposure system for arranging a substrate with partially polarized and partially collimated optical radiation, including: at least one optical radiation source; a device for partially polarizing the optical radiation; 用以部份準直該光輻射之裝置; 用以部份過濾該光輻射之裝置; 以調整部份偏振度之裝置;及 用以相對於該部份偏振及部份準直光輻射傳送該基板之裝置,其 中, 該用以部份偏振該光輻射之裝置包含 一種兩個或多個薄膜偏振器之陣列,該等薄膜偏振器介於兩個或 多個吸收板間以一角度自相連吸收板之頂部至底部橫貫板間的空間, 該用以邵份準直該光輻射之裝置包含一種兩個或多個吸收板之陣 O:\55\55711-920925.DOC -3 - 580604 列,該等吸收板平均間隔,且正交及平行安裝於一支撐吸收板之支撐 構架之寬度, 其中吸收板間之間隔使所裝薄膜偏振器約處於設計角度。 8· 一種用以排列一光排列層之方法,包括·· 使一光排列層曝光於部份偏振及部份準直光輻射,其中該部份準 直光輻射沿一維度具有大於5度且小於3〇度之發散,且沿其正交維度 具有-無限制發散’且其中該部份偏振及部份準直光輕射由該排列層 吸收且曝光排列層具有異向性電介質特性。 9· -種用錢鄰接-光排顺表面之液晶介質產生侧之方法,包括: 使-光制層曝光於部份胁麟份準直絲射,神份偏振及 部份準直絲射倾_層吸收,其中該雜準直絲躲—維度且 有大於5度且小於30度之發散,且沿其正交維度具有一無限制發散, 及 對光排列層施加液晶介質,其中曝光後排列層謗發液晶排列。 O:\55\55711-920925.DOC -4-A device for partially collimating the optical radiation; a device for partially filtering the optical radiation; a device for adjusting a degree of polarization; and a device for transmitting the polarization relative to the part of the polarization and the collimated light radiation Substrate device, wherein the device for partially polarizing the optical radiation includes an array of two or more thin film polarizers which are self-connected at an angle between two or more absorption plates The top to the bottom of the absorption plate traverses the space between the plates. The device for collimating the light radiation includes an array of two or more absorption plates. O: \ 55 \ 55711-920925.DOC -3-580604 rows The absorption plates are evenly spaced, and are orthogonal and parallel to the width of a supporting frame supporting the absorption plate, wherein the interval between the absorption plates makes the installed film polarizer approximately at the design angle. 8. A method for arranging a light aligning layer, comprising: exposing a light aligning layer to a portion of polarization and a portion of collimated light radiation, wherein the portion of the collimated light radiation is greater than 5 degrees in one dimension and The divergence is less than 30 degrees, and there is “unlimited divergence” along its orthogonal dimension, and the part of the polarized and part of the collimated light is absorbed by the alignment layer and the exposed alignment layer has anisotropic dielectric characteristics. 9 · A method for adjoining the liquid crystal medium generating side of the light-smoothing surface with money, including: exposing the light-emitting layer to a part of the collimated collimated filament, the polarization of the god, and a part of the collimated filament _ Layer absorption, where the hybrid collimated wire hides-with a divergence greater than 5 degrees and less than 30 degrees, and has an unlimited divergence along its orthogonal dimension, and applies a liquid crystal medium to the light alignment layer, which is aligned after exposure The layers emit liquid crystal alignment. O: \ 55 \ 55711-920925.DOC -4-
TW87118266A 1998-04-29 1998-11-03 Optical exposure systems and processes for alignment of liquid crystals TW580604B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402174B (en) * 2009-09-03 2013-07-21 Univ Nat Cheng Kung Method and equipment for manufacturing mould core of seamless press roller

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402174B (en) * 2009-09-03 2013-07-21 Univ Nat Cheng Kung Method and equipment for manufacturing mould core of seamless press roller

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