TW569238B - Noise-immune memory - Google Patents

Noise-immune memory Download PDF

Info

Publication number
TW569238B
TW569238B TW91120107A TW91120107A TW569238B TW 569238 B TW569238 B TW 569238B TW 91120107 A TW91120107 A TW 91120107A TW 91120107 A TW91120107 A TW 91120107A TW 569238 B TW569238 B TW 569238B
Authority
TW
Taiwan
Prior art keywords
memory
data
signal
unit
preset
Prior art date
Application number
TW91120107A
Other languages
Chinese (zh)
Inventor
Chuen-An Tang
Jau-Chi Yang
Original Assignee
Elan Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Priority to TW91120107A priority Critical patent/TW569238B/en
Application granted granted Critical
Publication of TW569238B publication Critical patent/TW569238B/en

Links

Landscapes

  • Read Only Memory (AREA)

Abstract

The present invention provides an noise-immune memory, which recognizes the accuracy of data content and the timing for an external system to capture the data by inspecting whether the predetermined signal preset in the memory is correct when the data in the memory is being read. The present invention comprises: a word line decoder, a bit line decoder, a memory cell array, a sensing amplifier unit and a control unit, which is characterized in further comprising a preset signal unit for providing a set of 2<m> preset signals for being transmitted to the control unit via the sensing amplifier unit. The control unit determines the accuracy of the data outputted from the sensing amplifier unit by detecting the preset signal and generates an output signal to notify the external system of such, wherein the parameter m is a positive integer larger than 0 and represents the bit number of the memory cells in the memory cell array.

Description

569238 五、發明說明(1) 發明領域: 本發明係關於一種記憶體讀取裝置μ尤其是關於一 種可利用預設信號的正確與否來確保資料正確性的抗雜 訊記憶體。 發明背景: 在數位系統中,資料的正確性一直扮演一個很重要 的角色,然而在目前的環境下,雜訊的干擾是無法避免 的,因此系統如何更有效率的即早發現因受干擾而導致 錯誤的資訊並進而提升系統的效能是所有研發人員一直 努力的目標。 就一般傳統在讀取記憶體資料時,常因雜訊的.干擾 或其他因素導致系統不正常運作,因此傳統為解決資料 不正確的問題,於電路中設計同位位元(parity bit)並 附加於資料的尾端是最常見的做法,此種錯誤偵測技術 稱為同位位元檢查,這種做法乃是將一具有同位位元的 資料内之「1」的數目定為奇數或是偶數,一般而言, 當資料内的「1」的數目定為奇數時稱之為奇同位,當 資料内的「1」的數目定為偶數時稱為偶同位,然而, 使用同位位元檢查僅能偵測資料内「1」的數目為奇數 或是為偶數,因此當資料内同時有偶數個位元發生錯誤 時,會造成錯誤的資料被誤判為正確的資料,另外在使 用同位位元檢查時,每筆資料均需加入一同位位元,因569238 V. Description of the invention (1) Field of the invention: The present invention relates to a memory reading device μ, especially to an anti-noise memory that can use the correctness of a preset signal to ensure the correctness of data. Background of the Invention: In digital systems, the correctness of data has always played a very important role. However, in the current environment, noise interference is unavoidable, so how can the system more efficiently detect the interference due to interference early? It is the goal of all R & D personnel to cause the wrong information and improve the performance of the system. In general, when reading memory data, the system often operates abnormally due to noise, interference, or other factors. Therefore, in order to solve the problem of incorrect data, the parity bit is designed in the circuit and added. At the end of the data is the most common method. This error detection technique is called parity checking. This method is to set the number of "1" in a piece of data with parity as odd or even. In general, when the number of "1" in the data is determined to be odd, it is called odd parity, and when the number of "1" in the data is set to even, it is called even parity. However, using parity check only Can detect whether the number of "1" in the data is odd or even, so when an even number of bits in the data are wrong at the same time, the wrong data will be misjudged as correct data. In addition, parity check is used. At the time, each piece of data must be added with the same bit, because

第4頁 569238 五、發明說明(2) —--- 此 後傳送具有同位位元的資;-二::c位元,然 成本。而要化上系統許多時間,也須較高的ΐ: 因此本發明裎祉_日日 當處理大量資料時,於每筆加 傳送具有同位位元的資料最 =位位元,然 料作拾本.A # 琢1 t I對具有同仿A二 成本-…•〜呵叼電路 因此本發明裎供_ 錯能 與否來確保資料正確性:::用預設信號的正確 力,並進而提雜“憶體’來提升系“ 發明目的 本發 由預設信 來說,本 確與否, 憶體資料 本發 同位位元 本發 預設信號 發明概述 本發 號的正確 線解碼器 元線通行 :2主要目的係提供-種抗雜訊記恃體T 號的正確性,w&gt; μ A ^體,可藉 路啼注以達到抗雜訊的目的,雯推止 發明所提供之抗雜 更進一步 可藉預設作;體,其輸出的資料正 的功能“于知’並進而達到正確的讀取記 明之另一 的係提供一種抗雜訊記愔#Page 4 569238 V. Description of the invention (2) ----- Later transfer of assets with the same bit;-2: c bit, but cost. And it takes a lot of time to put the system into operation: Therefore, the benefits of the present invention are: When processing a large amount of data, the data with the same bit is sent to each bit.本 .A # 11 t I pair has the same cost as the A two -...-~~ circuit. Therefore, the present invention provides _ false energy or not to ensure the correctness of the data: :: using the correct force of the preset signal, and further "Miscellaneous" to improve the system "Purpose of the invention The present invention is described by the preset letter, whether it is true or not, the memory data is issued by the parity of the device. Line access: 2 The main purpose is to provide the correctness of the anti-noise recorder T number, w &gt; μ A ^ body, which can be borrowed to achieve the purpose of anti-noise, Wen Wen stopped the resistance provided by the invention Miscellaneous can be further pre-defined; the output of the data is positive function "understand" and then achieve the correct reading of the record another provides a kind of anti-noise record 愔 #

明二匕亦無需額外的運算及儲存空;。,“,、須 明之再_ g , J 的正確性,以n 一種抗雜訊記憶體,藉由 以通知系統作適當處理。 訊;;憶體,可藉由判斷預設.信 、一廷到抗雜讯的目的,該裝置包括一字元 間陣列几”二器、憶體細胞陣列 '-位 感測放大益單兀、一控制單元,其 569238 五、發明說明(3) 中該字元線解碼器係 生之一位址參數,經 一字元線解碼位址; 並依據外部系統所輸 解碼位址;其中該記 (c e 1 1 )所組成,用以 第一記憶資料;其中 第一記憶資料與該位 資料;其中該感測放 該第二記憶資料,並 單元,與感測放大器 產生該讀取信號,本 號單元用以提供一組 送至控制單元,該控 測放大器單元輸出資 外部系統,外部系統 正確性,如果預設信 變,本發明將可以藉 能有受到雜訊干擾, 讓外部系統做適當的 用以解碼’主 過該字元線解 其中該位元線 入之一位址參 憶體細胞陣列 接收該字元線 該位元線通行 元線解碼位址 大器單元,係 要依據外部系統所產 碼器解碼進一步產生 解碼器係用以解碼, 數進而產生一位元線 ,其主要由記憶單元 解碼位址, 閘陣列,用 用以接收讀 產生一第三記憶資料;其 單元連接,用 發明其主要特 預設信號經 制單元藉由偵 料的正確性並 可藉由測試該 號受外界雜訊 由檢測該預設 進而通知外部 應變。 並產生一 以接收該 並產生一第二記憶 取信號與 中該控制 以接收一讀取參數與 徵在於包括一預設信 由感測放大 測該預設信 產生一輸出 預設信號判 干擾導致預 信號後得知 系統資料不 器單元傳 號判斷感 信號通知 斷資料的 設信號改 該資料可 正確,以 詳細說明與較佳實施例: 有關本發明為達成上述之目的,所採用之技術、手 段及具體結構特徵,茲舉一較佳可行之實施例,並藉由Ming Erji also does not require additional calculations and storage space; ",, the correctness of Xu Ming, g, J, with n a kind of anti-noise memory, by the notification system for proper processing. Correspondence; memory, can be preset by judgment. Letter, Yiting For the purpose of anti-noise, the device includes an array of characters, two devices, a memory cell array'-position sensing amplifier, a control unit, which is 569238. The word in the description of the invention (3) A meta-line decoder generates an address parameter, which decodes the address through a character line; and according to the decoded address input by the external system; where the record (ce 1 1) is used to store the data first; The first memory data and the bit data; wherein the sensing puts the second memory data, and the unit generates a reading signal with a sense amplifier. The unit number is used to provide a group to the control unit, the control amplifier. The unit outputs data to the external system, and the correctness of the external system. If a preset signal change is made, the present invention can take advantage of noise interference, and allow the external system to properly decode the main bit through the word line to decode the bit. Somatic cell The column receives the word line, the bit line, and the pass line decoding unit, which is based on the decoder produced by the external system to further generate a decoder for decoding. The number is then used to generate a bit line. The memory unit decodes the address, and the gate array is used to receive and read to generate a third memory data; its unit is connected, and its main special preset signal is used to control the correctness of the unit by detecting the material and by testing the number The external noise is detected by detecting the preset to notify the external strain. And generating a receiving signal and generating a second memory fetching signal and controlling the receiving a reading parameter and sign including a preset signal by sensing and amplifying the preset signal to generate an output preset signal to judge interference After pre-signaling, it is learned that the system data is not a unit, the signal is sent, the signal is sensed, and the signal is set to change the data. The data can be correct. Detailed descriptions and preferred embodiments are provided. Regarding the present invention, the technology, Means and specific structural features, here is a preferred and feasible embodiment, and by

第6頁 569238 五、發明說明(4) 圖示說明而更進一步揭示明瞭,詳如下述。 請參考圖一之架構示意^圖,本發明提供一種抗雜訊 記憶體,可藉由預設信號的正確性,以達到抗雜訊的目 的,該裝置包括一字元線解碼器1 1、一位元線解碼器1 2 、一記憶體細胞陣列1 3、一位元線通行閘陣列1 4、一感 測放大器單元1 5、一控制單元1 6,其中該字元線解碼器 1 1係用以解碼,當外部系統所產生之一位址參數1 0,經 過該字元線解碼器1 1解碼並進一步的產生一字元線解碼 位址1 1 1 ;其中該位元線解碼器1 2係用以解碼,並依據 外部系統所輸入之一位址參數1 0進而產生一位元線解碼 位址1 2 1 ;其中該記憶體細胞陣列1 3,其主要由記憶單 元(m e m 〇 r y c e 1 1 )所組成,用以接收該字元線解碼位址 1 1 1,並產生一第一記憶資料1 3 1 ;其中該位元線通行閘 陣列1 4,用以接收該第一記憶資料1 3 1與該位元線解碼 位址1 2 1,並產生一第二記憶資料1 4 1 ;其中該感測放大 器單元1 5,係用以接收讀取信號1 6 1與該第二記憶資料 1 4 1,並產生一第三記憶資料1 5 1 ;其中該控制單元1 6與 感測放大器單元1 5連接,用以接收一讀取參數1 6 4與產 生該讀取信號1 6 1,其中一預設信號單元1 8用以提供一 狀態為「1」及另一狀態為「0」的預設信號,其中預設 信號1 7受干擾而變為其他狀態時,表示第三記憶資料 1 5 1可能發生錯誤,該預設信號1 7經由感測放大器單元 1 5傳送至控制單元1 6,該控制單元1 6藉由偵測該預設信 號1 7判斷是否受到雜訊干擾並產生一輸出信號1 6 2通知Page 6 569238 V. Description of the invention (4) The illustration is further revealed and illustrated, as detailed below. Please refer to the schematic diagram of the structure of FIG. 1. The present invention provides an anti-noise memory, which can achieve the purpose of anti-noise by presetting the correctness of the signal. The device includes a word line decoder 1 1. A bit line decoder 1 2, a memory cell array 1 3, a bit line access gate array 1 4, a sense amplifier unit 15, a control unit 16, wherein the word line decoder 1 1 It is used for decoding. When an address parameter 10 generated by an external system is decoded by the word line decoder 11 and a word line decoding address 1 1 1 is further generated, wherein the bit line decoder 12 is used for decoding, and a bit line decoding address 1 2 1 is generated according to an address parameter 1 0 input from an external system; wherein the memory cell array 13 is mainly composed of a memory unit (mem 〇 ryce 1 1) is used to receive the word line decoding address 1 1 1 and generate a first memory data 1 3 1; wherein the bit line pass gate array 14 is used to receive the first memory Data 1 3 1 and the bit line decode address 1 2 1 and generate a second memory data 1 4 1; The sense amplifier unit 15 is configured to receive the read signal 16 1 and the second memory data 1 4 1 and generate a third memory data 1 5 1; wherein the control unit 16 and the sense amplifier unit 1 5 connection for receiving a reading parameter 1 6 4 and generating the reading signal 1 6 1 of which a preset signal unit 18 is used to provide a state of "1" and another state of "0" The preset signal, where the preset signal 17 is disturbed and changed to other states, indicates that the third memory data 1 5 1 may have an error. The preset signal 17 is transmitted to the control unit 16 through the sense amplifier unit 15 The control unit 16 determines whether it is disturbed by noise by detecting the preset signal 17 and generates an output signal 1 6 2 notification

第7頁 569238 五、發明說明(5) 外部系統,因此外部系統可藉由預設信號1 7的結果判斷 資料的正確性,如果預設信號受外界雜訊干擾導致預設 信號改變’本發明將可以藉由檢測該預設信號後得知該 資料可能有受到雜訊干擾’進而通知外部系統資料不正 痛,以讓外部系統做適當的應變,例如重新讀取該筆資 料。 另外本發明之控制單元可進一步包含一資料抓取信 號1 6 3,當第三記憶資料1 5 1準備好供外部系統使用時, 控制系統可產生一資料抓取信號1 6 3通知外部系統,外 部系統可藉接收該資料抓取信號1 6 3,讀取本發明之第 三記憶資料1 5 1 ’藉此提升資料讀取速度,改進了傳統 外部系統以停留一特定時間後讀取資料的特性。 換句活說’當外部系統需讀取本發明資料時,外部 系統係可傳送一讀取參數1 6 4至控制單元1 6,且外部系 統傳送一位=參數1 〇至字元線解碼器丨丨及位元線解碼器 i 2,藉此選定所須之讀取資料,當控制單元丨6接收到讀 取參數164後即送出讀取信號161通知感測放大器單元15 ,感測,大器單元15即可將預設信號傳送給控制單元16 取二二線解竭器11及位元線解碼器12,所選定之讀 “資:的正2控制單元16藉由接收預設信號7 Ϊ ί 63通知外部^性,本發明可進一步包含資料抓取枱唬 的記憶資料’、統來讀取所選定的記憶體細胞陳列1 3内 ^ 圖二本發明之另一較佳實施例,本發明提供Page 7 569238 V. Description of the invention (5) The external system, so the external system can judge the correctness of the data by the result of the preset signal 17. If the preset signal is disturbed by external noise, the preset signal is changed. By detecting the preset signal, it can be known that the data may be disturbed by noise, and then notify the external system that the data is not correct and painful, so that the external system can respond appropriately, such as re-reading the data. In addition, the control unit of the present invention may further include a data capture signal 1 6 3, and when the third memory data 1 5 1 is ready for use by an external system, the control system may generate a data capture signal 1 6 3 to notify the external system, The external system can receive the data capture signal 1 6 3 to read the third memory data 1 5 1 ′ of the present invention, thereby improving the data reading speed and improving the traditional external system to read the data after staying for a specific time. characteristic. In other words, when the external system needs to read the data of the present invention, the external system can send a reading parameter 16 to the control unit 16 and the external system sends a bit = parameter 1 to the word line decoder.丨 丨 and bit line decoder i 2 to select the required reading data. When the control unit 丨 6 receives the reading parameter 164, it sends out a reading signal 161 to notify the sense amplifier unit 15. The controller unit 15 can transmit the preset signal to the control unit 16 to obtain the second and second line exhaustion device 11 and the bit line decoder 12, and the selected reading unit 2 controls the unit 16 by receiving the preset signal 7 63 63 notification externalities, the present invention may further include the memory data of the data capture platform, to read the selected memory cell display 1 3 ^ Figure 2 Another preferred embodiment of the present invention, This invention provides

569238 五、發明說明(6) 一種抗雜訊記憶體,可藉由預設信號的正確性,以達到 抗雜訊的目的”該裝置包括一字元線解碼器2卜一位元 線解碼器2 2、一記憶體細胞陣列2 3、一位元線通行閘陣 列2 4、一感測放大器單元2 5、一控制單元2 6,其中該字 元線解碼器2 1係用以解碼,當外部系統所產生之一位址 參數2 0,經過該字元線解碼器2 1解碼並進一步的產生一 字元線解碼位址2 1 1 ;其中該位元線解碼器2 2係用以解 碼,並依據外部系統所輸入之一位址參數2 0進而產生一 位元線解碼位址2 2 1 ;其中該記憶體細胞陣列2 3,其主 要由記憶單元(m e m 〇 r y c e 1 1 )所組成,用以接收該字元 線解碼位址2 1 1,並產生一第一記憶資料2 3 1 ;其中該位 元線通行閘陣列2 4,用以接收該第一記憶資料2 3 1與該 位元線解碼位址2 2 1,並產生一第二記憶資料2 4 1 其中 該感測放大器單元2 5,係用以接收讀取信號2 6 1與該第 二記憶資料2 4 1,並產生一第三記憶資料2 5 1 ;其中該控 制單元2 6與感測放大器單元2 5連接,用以接收一讀取參 數2 6 4與產生該讀取信號2 6 1,在本實施例中,一預設信 號單元2 8用以提供預設信號2 7,包含「0 0」、「0 1」、 「0 1」、「1 1」狀態,該預設信號2 7經由感測放大器單 元2 5單元傳送至控制單元2 6,該控制單元2 6藉由偵測該 預設信號2 7狀態的正確性判斷是否受到雜訊干擾,並產 生一輸出信號2 6 2通知外部系統。,如果預設信號受外 界雜訊干擾導致預設信預設信號改變表示該資料也可能 有受到雜訊干擾,因此進而通知外部系統該資料不正確569238 5. Description of the invention (6) An anti-noise memory, which can achieve the purpose of anti-noise by presetting the correctness of the signal. The device includes a word line decoder and a bit line decoder. 2 2. A memory cell array 2 3. A bit line pass gate array 2 4. A sense amplifier unit 2 5. A control unit 26. The word line decoder 21 is used for decoding. An address parameter 20 generated by an external system is decoded by the word line decoder 21 and a word line decoding address 2 1 1 is further generated; wherein the bit line decoder 2 2 is used for decoding According to an address parameter 20 inputted from an external system, a one-bit line decoding address 2 2 1 is generated; wherein the memory cell array 23 is mainly composed of a memory unit (mem 0ryce 1 1) To receive the word line decoded address 2 1 1 and generate a first memory data 2 3 1; wherein the bit line pass gate array 24 is used to receive the first memory data 2 3 1 and the The bit line decodes the address 2 2 1 and generates a second memory data 2 4 1. 2 5 is used to receive the read signal 2 6 1 and the second memory data 2 4 1 and generate a third memory data 2 5 1; wherein the control unit 26 is connected to the sense amplifier unit 25, and In order to receive a reading parameter 2 6 4 and generate the reading signal 2 6 1, in this embodiment, a preset signal unit 2 8 is used to provide a preset signal 2 7, which includes “0 0” and “0 1 "," 0 1 "," 1 1 "status, the preset signal 2 7 is transmitted to the control unit 2 6 through the sense amplifier unit 2 5 unit, and the control unit 2 6 detects the status of the preset signal 2 7 It determines whether the noise is disturbed by noise and generates an output signal 2 6 2 to notify the external system. If the preset signal is disturbed by external noise, the preset signal of the preset signal changes, indicating that the data may also be interfered by noise, so the external system is notified that the data is incorrect.

第9頁 569238 五、發明說明(7) ,以讓外部系統做適當的應變。 另外本發明之控制單元可進一步包含一資料抓取信 號2 6 3,當第三記憶資料2 5 1準備好供外部系統使用時, 控制系統係可產生一資料抓取信號2 6 3通知外部系統, 外部系統可藉接收該資料抓取信號2 6 3,讀取本發明之 第三記憶資料2 5 1,藉此提升資料讀取速度,改進了傳 統外部系統以停留一特定時間後讀取資料的特性。 換句話說,當外部系統需讀取本發明資料時,外部 系統係可傳送一讀取參數2 6 4至控制單元2 6,且外部系 統傳送一位址參數2 0至字元線解碼器2 1及位元線解碼器 2 2,藉此選定所須之讀取資料,當控制單元2 6接收到讀 取參數2 6 4後即送出讀取信號2 6 1通知感測放大器單元2 5 ,感測放大器單元2 5即可將預設信號傳送給控制單元2 6 ,並將字元線解碼器2 1及位元線解碼器2 2,所選定之讀 取資料輸出,其中控制單元26藉由接收預設信號27檢測 輸出資料的正確性,本發明可進一步包含資料抓取信號 2 6 3通知外部系統來讀取所選定的記憶體細胞陣列2 3内 的記憶資料。Page 9 569238 V. Description of Invention (7) to allow external systems to respond appropriately. In addition, the control unit of the present invention may further include a data capture signal 2 6 3. When the third memory data 2 5 1 is ready for use by an external system, the control system may generate a data capture signal 2 6 3 to notify the external system. The external system can read the third memory data 2 51 of the present invention by receiving the data capture signal 2 6 3, thereby improving the data reading speed and improving the traditional external system to read the data after staying for a specific time. Characteristics. In other words, when the external system needs to read the data of the present invention, the external system can transmit a read parameter 2 64 to the control unit 26, and the external system transmits a bit address parameter 20 to the word line decoder 2 1 and bit line decoder 2 2 to select the required reading data, and when the control unit 2 6 receives the reading parameter 2 6 4, it sends out a reading signal 2 6 1 to notify the sense amplifier unit 2 5, The sense amplifier unit 25 can then transmit the preset signal to the control unit 2 6 and output the selected read data from the word line decoder 21 and the bit line decoder 2 2, of which the control unit 26 borrows The correctness of the output data is detected by receiving the preset signal 27. The present invention may further include a data capture signal 2 6 3 to notify an external system to read the memory data in the selected memory cell array 23.

本發明之預設信號單元的組成單位可以有不同的實 施態樣,只要能夠提供預設信號皆可適用,使用記憶胞 是最直接且方便的作法,而圖三更提供另一種能夠模擬 ό己憶元件於預设彳5 5虎早元中提供預設信號的實施例。 如圖三所示,此結構中包含一電晶體(τ丨)3 3、一第 一電阻(Rl)3 1及一第一電阻(R2)3 2所構成之分壓電路3〇The composition unit of the preset signal unit of the present invention can have different implementations, as long as it can provide a preset signal, it is applicable. The use of a memory cell is the most direct and convenient method, and FIG. An embodiment in which the memory element provides a preset signal in a preset 彳 55 tiger early element. As shown in FIG. 3, this structure includes a voltage dividing circuit 3 composed of a transistor (τ 丨) 3 3, a first resistor (Rl) 3 1 and a first resistor (R2) 3 2.

第10頁 569238 五、發明說明(8) ,該分壓電路係耦接至電壓源(VCC)及接地端(GND),其 中該分壓電路3 0具有一中間節點&gt; (N 1 ) 3 4,其係耦接至電 晶體,其中該中間節點分壓為: K乙 本發明中可藉由控制該中間節點分壓控制記憶體細 胞導通特性,因此本發明可藉由控制記憶體細胞導通特 性並控制電晶體内的相關參數,如:長寬比(W/L rat io ),進一步的控制所產生的預設信號1 7的邏輯準位、電 流大小及抗雜訊敏感度。 1、 本發明中之預設信號單元至少有下列幾種實施態樣 。預設信號單元中包括複數組記憶單元,一組記憶單元 中包括至少一個記憶單元,例如記憶胞,較佳者係組成 一記憶胞陣列。每一組記憶單元與每一字元線相對應。 2、 預設信號單元包括一組記憶單元,一組記憶單元中 包括至少一個記憶單元,例如記憶胞或者圖三所示之結 構。 由以上得之,本發明之預設信號單元可產生組 設信號經由感測放大器單元傳送至控制單元,該控制單 元藉由偵測該預設信號判斷感測放大器單元輸出資料的 正確性並產生一輸出信號通知外部系統,其中該參數m 為大於0之正整數且為該記憶體細胞陣列内該記憶單元 (memory cell)所表示的位元個數。 其中本發明之預設信號單元1 8、2 8,係可藉由記憶Page 10 569238 5. Description of the invention (8), the voltage dividing circuit is coupled to a voltage source (VCC) and a ground terminal (GND), wherein the voltage dividing circuit 30 has an intermediate node &gt; (N 1 ) 34, which is coupled to the transistor, wherein the partial voltage of the intermediate node is: K. In the present invention, the conduction characteristics of the memory cells can be controlled by controlling the partial voltage of the intermediate node, so the present invention can control the memory by Cell conduction characteristics and control of related parameters in the transistor, such as: aspect ratio (W / L rat io), further control the logic level, current level and anti-noise sensitivity of the preset signal 17 generated. 1. The preset signal unit in the present invention has at least the following implementations. The preset signal unit includes a complex array memory unit, and a group of memory units includes at least one memory unit, for example, a memory cell. Preferably, the memory cell array forms a memory cell array. Each group of memory cells corresponds to each character line. 2. The preset signal unit includes a group of memory units, and the group of memory units includes at least one memory unit, such as a memory cell or the structure shown in FIG. From the above, the preset signal unit of the present invention can generate a set signal to be transmitted to the control unit via the sense amplifier unit, and the control unit judges the correctness of the output data of the sense amplifier unit by detecting the preset signal and generates An output signal informs the external system, where the parameter m is a positive integer greater than 0 and is the number of bits represented by the memory cell in the memory cell array. The preset signal units 1 8 and 2 8 of the present invention can be stored by memory

569238 五、發明說明(9) 單元儲存資料,且該 列1 3、2 3 ;其中預設 電阻以模擬儲存一資 少一電晶體及至少一 為進一步提升本 單元係應位於該記憶 位置或該記憶體細胞 因此,本發明提 預設信號的正確性, 說,本發明所提供之 確性可以藉由預設信 少不必要之電路,進 因此本發明可以 信號,並且不因傳輸 了電路複雜度,輸出 的時間内捉取資料。 的數位電路所完成, Level Design F1ow c 誤訊號的特性,因此 ,直接利用預設信號 統的設計中,其可利 ,本發明「抗雜訊記 具備優良之實用性, 具新穎性,且可以完 預設信號單元亦可為記憶體細胞陣 信號嘷元係可藉由一電晶體耦接一 料且亦可由至少一電晶體電路或至 電阻所組成。 發明之對雜訊的靈敏度,預設信號 體細胞陣列内容易受到雜訊干擾的 陣列内雜訊較大的位置。 供一種抗雜訊記憶體,可藉由判斷 以達到抗雜訊的目的,更進一步來 抗雜訊記憶體,其輸出的資料的正 號而得知,無須藉助同位位元以減 而達到提升效能的功效。 依據系統的需求而產生一組2^預設 資料的變化而改變預設信號,減少 還可藉由判斷輸出捉取信號在最短 本發明電路可以完全由邏輯閘階層 也適用於以HDL作設計的High-除此之外,由於本發明可偵測錯 非常適合應用於記憶體讀取裝置中 判斷資料的正確性。所以在數位系 用的範圍將非常的廣闊。.綜上所述 憶體」為一合理完善之發明,不僅 而且在設計上屬前所未有的創新, 全由邏輯閘階層的數位電路所完成569238 V. Description of the invention (9) The unit stores data, and the column 1 3, 2 3; among them, the preset resistance is used to simulate the storage of a small transistor and at least one for further improvement. The unit should be located in the memory position or the Memory cells Therefore, the present invention improves the correctness of the preset signal. It is said that the accuracy provided by the present invention can be reduced by unnecessary circuits. Therefore, the present invention can signal and does not transmit circuit complexity. Capture data within the output time. The digital circuit completed by Level Design F1ow c has the characteristics of false signals. Therefore, in the design of directly using the preset signal system, it is beneficial. The present invention "anti-noise record has excellent practicality, novelty, and can be The preset signal unit can also be a memory cell array signal. The unit can be coupled to a material by a transistor and can also be composed of at least a transistor circuit or a resistor. The sensitivity to noise of the invention is preset Signal somatic cell array is easy to be disturbed by noise in the array. Provides an anti-noise memory, which can be used to achieve the purpose of anti-noise by judging, and further anti-noise memory. The positive sign of the output data shows that it is not necessary to use the parity bit to reduce the effect of improving performance. According to the needs of the system, a set of 2 ^ preset data is changed to change the preset signal. The reduction can also be reduced by Judging that the output capture signal is the shortest. The circuit of the present invention can be completely composed of logic gates and is also suitable for High-designed with HDL. Besides, the present invention can detect errors and is very suitable for application. The memory read device judges the correctness of the data. Therefore, the range of use in the digital system will be very broad. In summary, the memory "is a reasonable and perfect invention, not only an unprecedented innovation in design, but also Completed by digital circuits of logic gate level

第12頁 569238 五、發明說明(ίο) 進而達到抗雜訊的功能,亦屬突破習知技術窠臼的高度 發明,並非易於思及之單純應用,具進步性,因此,本 案業已符合發明專利之各項申請要件,懇請鈞局於以 詳查,並賜予應得之發明專利,實為感禱。 雖然本發明已以較佳實施例揭露如上,然其並非用 以限定本發明,任何熟悉本技藝之人士,在不脫離本發 明之精神和範圍内,當可做些許之更動與潤飾,因此本 發明之保護範圍當視後附之申請專利範圍所界定者為準Page 12 569238 V. Description of invention (ίο) Further achieving the anti-noise function is also a high invention that breaks through the conventional technology. It is not a simple application that can be easily considered and is progressive. Therefore, this case has already met the invention patent. It is my sincere prayer that the bureau should scrutinize the various application requirements and grant the patents it deserves. Although the present invention has been disclosed in the preferred embodiment as above, it is not intended to limit the present invention. Anyone familiar with the art can make some modifications and retouching without departing from the spirit and scope of the present invention. The scope of protection of the invention shall be determined by the scope of the attached patent application

第13頁 569238 圖式簡單說明 圖式說明: 圖一係為本發明之一實施例的抗雜訊記憶體架構示意圖 圖二係為本發明之另一實施例的抗雜訊記憶體架構示意 圖;以及 圖三舉例說明根據本發明之預設信號單元的組成。 主要元件符號說明: -η、 - 17、 -12、 -161 -13^ -3 21 27 22 261 23 字元線解碼器----- 預設信號--------- 位元線解碼器----- 讀取信號--------- 記憶體細胞陣列-- -記憶單元(c e 1 1 ) 位 元 線 通 行閘陣列-- ---14' 24 電 晶 體 (Τ1)------- —— 33 感 測 放 大 器單元---- ---15^ 25 第 一 電 阻 (R1)----- ---31 控 制 單 元 ---16' 26 第 二 電 阻 (R2)----- ---32 位 址 參 數 - — 10、 20 分 壓 電 路 —— 30 字 元 線 解 碼位址 —— 111, •21 中 間 即 點 (Ν1)----- ---34 ♦Page 13 569238 Brief description of the drawings: Figure 1 is a schematic diagram of an anti-noise memory architecture according to an embodiment of the present invention; Figure 2 is a schematic diagram of an anti-noise memory architecture according to another embodiment of the present invention; And FIG. 3 illustrates the composition of the preset signal unit according to the present invention. Explanation of main component symbols: -η,-17, -12, -161 -13 ^ -3 21 27 22 261 23 word line decoder ----- preset signal --------- bit Line Decoder ----- Read Signal --------- Memory Cell Array--Memory Cell (ce 1 1) Bit Line Gate Array--14 '24 Transistor (Τ1) ------- ---- 33 sense amplifier unit ---- --- 15 ^ 25 first resistor (R1) ----- --- 31 control unit --- 16 '26 Second resistor (R2) ----- --- 32 address parameter--10, 20 voltage divider circuit-30 word line decoding address-111, • 21 Middle point (N1)- --- --- 34 ♦

第14頁 569238 圖式簡單說明 位 元 線 解 碼 位址—— ----121 &gt; 221 第 一 記 憶 資 才斗----- ----13卜 231 第 二 記 憶 資 #----- ----14卜 241 第 三 記 憶 資 料----- ----15卜 251 讀 取 參 數 ----164、 264 資 料 捉 取 信 號----- ----163、 263 輸 出 信 號 ----162、 262 預 設 信 號 單 元 ----18、 28Page 14 569238 The diagram briefly explains the bit line decoding address ---- 121 &gt; 221 First memory resource bucket ----- ---- 13 Bu 231 Second memory resource # --- ----- 14 Bu 241 Third memory data ------ ---- 15 Bu 251 Read parameters ---- 164, 264 Data capture signal ------ 163, 263 output signal ---- 162, 262 preset signal unit ---- 18, 28

第15頁Page 15

Claims (1)

569238 六、申請專利範圍 1 · 一種 一字 位址 一位 解碼 一記 組成 憶資 資料 一感 資料 一控 取參 其特 信號 元, 放大 2. 依據 設信 3. 依據 信號 為「 4. 依據 信號 記憶體 元線解 贅 元線解 位址; 憶體細 ,用以 料;一 與該位 測放大 ,並產 制單元 數與產 徵在於 ,該預 該控制 器單元 申請專 號包括 申請專 係由兩 1」。 申請專 係由四 ,包括: 碼器—依據 胞陣列, 接收該字 位元線通 元線解碼 器單元, 生一第三 ,與感測 生該讀取 其中更包 設信號經 單元根據 輸出資料 利範圍第 2m筆資料 利範圍第 狀態所構 位址參數產生一字元線解碼 碼器,依據一位址參數產生產生一位元線 其由記憶單元(m e m 〇 r y c e 1 1)所 元線解碼位址,並產生一第一記 行閘陣列,用以接收該第一記憶 位址,並產生一第二記憶資料; 用以接收讀取信號與該第二記憶 記憶資料;以及 放大器單元連接,用以接收一讀 信號; 括一預設信號單元用以提供預設 由感測放大器單元傳送至控制單 該預設信號是否正確以判斷感測 的正確性。 1項所述之記憶體,其中該組預 ,m為大於等於0的正整數。 1項所述之記憶體,其中該預設 成,一狀態為「.0」,另一狀態 利範圍第1項所述之記憶體,其中該預設 種狀態「00」、「01」、「10」、「11」569238 6. Scope of patent application1. One word address, one decode, one record, memory data, one sense data, one control, and other special signal elements, zoom in 2. According to the letter 3. The signal is "4. The signal Memory element line deduplication element line decomposition address; memory body is detailed for data; one is enlarged with the position measurement, and the number of production units and production characteristics is that the special application number of the controller unit includes the application department. Two 1 ". The application department consists of four, including: encoder—according to the cell array, receiving the word bit line through the element line decoder unit, generating a third, and sensing the reading which includes a set signal through the unit according to the output data The 2m data of the range of interest is used to generate a word line decoder for the address parameter constructed by the state of the range of interest. The bit line is generated according to the address parameter and is decoded by the memory line (mem 0ryce 1 1). Address and generate a first gate array for receiving the first memory address and generate a second memory data; for receiving a read signal and the second memory memory data; and connecting the amplifier unit, It is used for receiving a read signal. A preset signal unit is used to provide whether the preset signal transmitted from the sense amplifier unit to the control unit is correct to determine the correctness of the sensing. The memory of item 1, wherein the set of pre, m is a positive integer greater than or equal to zero. The memory described in item 1, wherein the preset state is "0" in one state, and the memory described in item 1 in the other state, wherein the preset states "00", "01", "10", "11" 第16頁 569238 圍 範 利 專 請 申 六 項N 1 A 第C 圍閘 範及 利一 專少 。請至 成申由 組據係 所依體 5 所 D 憶以 記、 該} R 中ο 其C ,閘 體或 憶一 記少 之至 述、 制 控 該 中 其 體 意 。記 成之 組述 所所 &gt;項 τ 1 ο N第 C圍 閘範 反專 一 請 少申 至據 及依 6 設 預 該 中 其 體 憶 〇 己 t 言 - 之 言 取Η 抓戶 Η項 料1 資第 一圍 生範 產利 步專 一 請 進申 元據 單依 成 組 所 路 電 體 晶 電 一第 少圍單 至範成 由利 係專 元請 單申 號據 信依 8 體 憶 己 古〇 之 述 所 項 設 預 該 中 其 組 的 元 單 # 信 括 包 位 1 及 體 晶 電 組 所 路 壓 分 設 預 該 中 其 體 憶 記 之 述 所 項 第 圍 範 利 專 請 。據 成依 9 設 預 該 中 。其 置, 位 的 擾 干 訊 雜 到 受 易 容 於 位 係 元 單 號 信 體 It 記 之 述 所 項 ΊΧ 第 圍 專 請 Ψ, 據 依 大 較 訊 雜 於 位 係 元 單 Web f 信 項 &lt; 第 圍 範 rnj 矛 專 請 中 據 依 的 碼 解 由 係 Jtub 信 設 。預 置之 位述 的所 細 體 It 己 *νδ 的 到 應 對 式 方 第 圍 範 利 專 請 申 據 依 單 &amp;|° 信 設 預 該 由 係 信 設生 預產 該所 中胞 其細 ,體 體憶 憶記 ο 記 生之定 產述固 所所中 胞項元 1 3 .依據申請專利範圍第1項所述之記憶體,其中該預設 信號單元係藉由記憶單元(m e m 〇 r y c e 1 1)儲存資料 ο1 4 .依據申請專利範圍第7項所述之記憶體,其中該預設Page 16 569238 Fan Fan Li Special Application Please apply for 6 N 1 A Fan C Fan Li Li and one special. Please go to Cheng Shenyou's system to rely on the 5 institutions D to remember the record, the} R in the ο, C, the gate body or the memory as little as the description, control and control its meaning. Items written by the group description &gt; item τ 1 ο Nth gate of the C gate, please refrain from applying for evidence and presume its body memory according to the 6th assumption 己-words to get 之 grab households Η items 1 The first perimeter student Fan Lili stepped in to apply for the Shenyuan bill, according to the group's electric circuit, Jingdian, the first shouwei sheet to Fancheng Youli, the special order, and the application number is believed to be based on the 8th body. The item in the description of 〇 is set to the Yuandan # of the group, which includes package position 1 and the voltage distribution of the body crystal group is set to be set in the paragraph of the body. According to Cheng Yi, this is expected. The location and interference of the bit are so complicated that it is easy to be included in the bit number of the system. It is specifically described in the description of it. According to the report, it is mixed with the bit of the system f. Di Wei Fan rnj Spear specially requested the code according to the code solution set by Jtub letter. The detailed description of the preset It It * νδ to the coping style Fan Li special request the application according to the order &amp; | ° letter set should be set by the letter set to pre-produce the cells of the institute, Body memory memory ο 生 之 之 定 定 项 中 中 元 元 元 元 元 元 元 元 元 元 元 元 3 3 3 3 3 3 3 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 依据 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 所述 in the first paragraph of the scope of the patent application, wherein the preset signal unit is through the memory unit (mem 〇ryce 1 1) Stored data ο 1 4. According to the memory described in item 7 of the scope of patent application, wherein the preset 第17頁 569238 六、申請專利範圍 信號單元之組成為一記憶體細胞陣列。 1 5.依據申請專利範圍第1項所述之記憶體…其中該預設 信號單元係藉由一電晶體耦接一分壓電路以模擬儲存 一資料。Page 17 569238 6. Scope of patent application The composition of the signal unit is a memory cell array. 1 5. According to the memory described in item 1 of the scope of the patent application ... wherein the preset signal unit is coupled to a voltage divider circuit by a transistor to simulate storing a data.
TW91120107A 2002-09-03 2002-09-03 Noise-immune memory TW569238B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW91120107A TW569238B (en) 2002-09-03 2002-09-03 Noise-immune memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW91120107A TW569238B (en) 2002-09-03 2002-09-03 Noise-immune memory

Publications (1)

Publication Number Publication Date
TW569238B true TW569238B (en) 2004-01-01

Family

ID=32590448

Family Applications (1)

Application Number Title Priority Date Filing Date
TW91120107A TW569238B (en) 2002-09-03 2002-09-03 Noise-immune memory

Country Status (1)

Country Link
TW (1) TW569238B (en)

Similar Documents

Publication Publication Date Title
TWI567748B (en) Method and system for error management in a memory device
TW302520B (en)
JP2022508694A (en) Memory system with error correction and data scrubbing circuitry
TWI271736B (en) Refresh mechanism in dynamic memories
US9471422B2 (en) Adaptive error correction in a memory system
KR20180135662A (en) Memory device, memory system and operating method of memory device
JP2015049918A (en) Write pulse width setting method, data write method, and semiconductor device
US8122320B2 (en) Integrated circuit including an ECC error counter
WO2016209586A1 (en) Adaptive error correction in memory devices
KR890004332A (en) Semiconductor memory
TW508581B (en) Integrated memory
TWI613666B (en) Memory device
TW569238B (en) Noise-immune memory
US10437666B2 (en) Integrated circuit device and method for reading data from an SRAM memory
TWI514385B (en) Half bit line high level voltage generator, memory device and driving method
US20190378564A1 (en) Memory device and operating method thereof
JPH0329193A (en) Substituted address deciding circuit
KR102638789B1 (en) Test method and semiconductor system using the same
EP3249654A2 (en) Systems and methods for non-volatile flip flops
US11769567B2 (en) Devices and methods for preventing errors and detecting faults within a memory device
TW556190B (en) Semiconductor memory device
JP7299374B1 (en) Semiconductor memory device and control method for semiconductor memory device
US11630600B2 (en) Device and method for checking register data
JPH04119434A (en) Parity error detector
JPS5860846A (en) Detector for error in channel combination

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MK4A Expiration of patent term of an invention patent