TW553761B - Treatment of process gas effluent - Google Patents

Treatment of process gas effluent Download PDF

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Publication number
TW553761B
TW553761B TW89122496A TW89122496A TW553761B TW 553761 B TW553761 B TW 553761B TW 89122496 A TW89122496 A TW 89122496A TW 89122496 A TW89122496 A TW 89122496A TW 553761 B TW553761 B TW 553761B
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Taiwan
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exhaust gas
reactor
scope
patent application
item
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TW89122496A
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Chinese (zh)
Inventor
Tony S Kaushal
Mehran Moalem
Shamouil Shamouilian
Harshad Borgaonkar
Wong Kwok Manus
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Applied Materials Inc
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Priority claimed from US09/607,918 external-priority patent/US6468490B1/en
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Publication of TW553761B publication Critical patent/TW553761B/en

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Abstract

A system for reducing hazardous gases exhausted from a process chamber 25 includes a catalytic reactor 250 containing catalytic material that can catalyze destruction of the hazardous gases. The system may also include a heater 240, a scrubber 270, and a prescrubber 230. The system may reduce the amount of hazardous gases, particularly perfluorocompounds and/or F2, exhausted into the environment.

Description

553761 A7 五、發明說明( 發明領域 本發明係關於一種如*磁 71、 叹備及万法,其係可降低由製程室 所排出之有毒製程氣體的含量。 發明背景: 積體電路製造過程φ, % S,吊於製程室中使:用氟化碳、氟 氯化碳、碳氫化物及並仙人友 及其他含齓的氣體。這些氣體不僅會 毒害人體’同時也會点堂 L曰危害%境。此外,因這類氣體對紅 外線有很強的吸收力 A队刀,因此也是造成全球溫度上升最主 要的物質。纟中特別難處理的是氣化物或過氣化物 (PFCs),這兩類化合物的化性都非常安定,因此可存在 數千年足久也不會被分解。這類pFCs化合物的例子包括 四氟化碳(CF4)、六氟乙烷(cjo、全氟丙烷(cjj、三氟 甲煶(CHF3)、7T氟化硫(SF6)、三氟化氮(nf3)、羰基氟(c〇F2) 等等。舉例來說,環境中四氟化碳(Cf4)的生命期可長達 五萬年之久,對全球溫室效應的影響則可長達六百五十 萬年以上。因此,虽需一種可有效降低製程室所排出之 有毒製程氣體含量,特別是PFCs含量,的方法及設備。 過氟化物被用於許多半導體製程中。舉例來說,過氟 化物常被用來蝕刻半導體基材上諸如氧化物層、金屬層 及介電層這類的薄膜。此外,過氟化物也常用於化學氣 相沉積製程中。它也可以被用來清潔製程加工室中的蚀 刻殘餘物或沉積殘餘物。這些有毒的化合物氣體如果不 是被特意引入製程加工室,就是在製造過程中所產生的 第2頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) _ -1---I--訂·!I--— ΙΛ 經濟部智慧財產局員工消費合作社印製 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 副產品’因此會存在於由製程室所排出的廢氣中。 另一種有毒氣體是氟分子,F2。長期曝露在即使僅有 1 ppm濃度的F2下’也會對人體造成相當的毒害。而且, F2非常難分解或轉變成毒性較低的形式。以前,是藉由 將含F2的廢氣經過非常高的廢氣煙!υ排放,使得釋出至 空氣中的F2濃度可低於法定的排放濃度。:但是,從環境 的觀點來看,這種技術實在過於簡陋,也不是製造業界 所欲求的’因為產生F2之製程氣體的體積將受限於廢氣 排放煙圍的高度。在許多基材製造過程及其他過程中都 會產生含氟的廢氣。舉例來說,含F2的製程氣體,或製 程中會產生F2副產物之製程,可被用來姑刻半導體基材 上諸如氧化物層、金屬層及介電層這類的薄膜;用於化 學氣相沉積製程中;及用來清潔製程加工室中的蝕刻殘 餘物或沉積殘餘物。而這些有毒的化合物會從廢氣流中 被排出製程室外。因此,巫需一種可有效降低製程室所 排出之有毒製程氣體含量,特別是F2含量,的方法及設 備。 一種減少F2含量的傳統方法,是使用氫氣燃燒箱來 減低F2含量。但是,這套系統有數種缺點。舉例來說, 需非常高的溫度(一般在850°C以上),才能在H2存在下, 將F2轉變成HF。而高溫的HF,腐蚀性非常強,且劇毒, 因此處理成本不僅昂貴且非常危險。此外,製造廠中供 應Η:的管線亦有起火的可能,更增加這套系統的操作成 本及危險性。 第3頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)553761 A7 V. Description of the Invention (Field of the Invention The present invention relates to a magnetic field such as * Magnet 71, Shuangbi and Wanfa, which can reduce the content of toxic process gases discharged from the process chamber. Background of the invention: Integrated circuit manufacturing process φ ,% S, hanging in the process room: using CFCs, CFCs, hydrocarbons, and immortals and other radon-containing gases. These gases will not only poison the human body, but also cause harm. In addition, because these gases have a strong absorption of infrared rays, they are also the most important substances that cause global temperature rise. Among the most difficult to handle are gaseous substances or over-gases (PFCs). Both compounds are very stable, so they can survive for thousands of years without being decomposed. Examples of such pFCs include carbon tetrafluoride (CF4), hexafluoroethane (cjo, perfluoropropane (cjj , Trifluoromethane (CHF3), 7T sulfur fluoride (SF6), nitrogen trifluoride (nf3), carbonyl fluoride (coF2), etc. For example, the life of carbon tetrafluoride (Cf4) in the environment The period can be as long as 50,000 years, and its impact on the global greenhouse effect It can be as long as more than 6.5 million years. Therefore, although a method and equipment that can effectively reduce the content of toxic process gases, especially PFCs, discharged from the process chamber are needed, perfluoride is used in many semiconductor processes For example, perfluoride is often used to etch thin films such as oxide layers, metal layers and dielectric layers on semiconductor substrates. In addition, perfluoride is also commonly used in chemical vapor deposition processes. It is also used in Can be used to clean etching residues or deposition residues in the process processing room. If these toxic compound gases are not intentionally introduced into the process processing room, they are generated during the manufacturing process. Page 2 This paper applies Chinese national standards. (CNS) A4 specification (210 X 297 mm) (Please read the precautions on the back before filling out this page) _ -1 --- I--Order ·! I --— ΙΛ Employee Consumer Cooperatives, Intellectual Property Bureau, Ministry of Economic Affairs Printed 553761 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention () By-products' will therefore exist in the exhaust gas discharged from the process room. Another toxic gas Fluorine molecule, F2. Long-term exposure to F2 even at a concentration of only 1 ppm will cause considerable harm to the human body. Moreover, F2 is very difficult to decompose or convert to a less toxic form. Previously, it was made by containing F2 The exhaust gas passes through a very high exhaust smoke! Υ emissions, so that the F2 concentration released into the air can be lower than the legal emission concentration .: However, from an environmental point of view, this technology is too crude and it is not a manufacturing industry Desired 'because the volume of the process gas that produces F2 will be limited by the height of the smoke exhaust flue gas. In many substrate manufacturing processes and other processes, fluorine-containing exhaust gases are generated. For example, process gases containing F2, Or processes that produce F2 by-products can be used to etch thin films such as oxide layers, metal layers and dielectric layers on semiconductor substrates; used in chemical vapor deposition processes; and used to clean Etching or deposition residues in a process chamber. These toxic compounds are expelled from the exhaust stream outside the process. Therefore, the witch needs a method and equipment that can effectively reduce the toxic process gas content, especially the F2 content, discharged from the process room. A traditional method of reducing F2 content is to use a hydrogen combustion box to reduce F2 content. However, this system has several disadvantages. For example, very high temperatures (generally above 850 ° C) are required to convert F2 to HF in the presence of H2. And high-temperature HF is very corrosive and highly toxic, so the processing cost is not only expensive and very dangerous. In addition, the pipelines of the supply line in the manufacturing plant may also catch fire, which increases the operating cost and danger of this system. Page 3 This paper size applies to Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page)

553761 A7 B7553761 A7 B7

經濟部智慧財產局員工消費合作社印製 五、發明說明() 為了環境之故,必須儘量減低釋出至空氣中有毒氣體 及其副產品的量。同時,亦需要一種能以低成本來有效 減低排放廢氣中有母氣體及其副產品的量。對廣泛使用 PFCS化合物的工業界而言(儘管對全球總消耗或總釋出 之PFCs量而言,工業界的用量已經算相當少了),更需 要將PFC及其他有毒氣體的量儘量減至最低。 發明概述: 本發明以一種簡單、有效的方式來降低諸如pFCs這 類有毒氣體的含:T °本發明對降低因處理基材(例如半導 體晶圓及其他電子元件)所產生的廢氣中有毒氣體含量非 常有用。這裡所指的有毒氣體是指任何有毒、具傷害力 或不欲求的氣體,例如但不僅限於PFCs、CFCs、碳氮化 物、其他含氟氣體、及其他不欲求的氣體。 本發明目的之一為一種設備,其係能降低製程室排出 氣體中有毒氣體含量’此設備包含一個能於激能狀態中 處理一基材因而產生排出氣流的加工室,及一個能接受 此排出氣流的催化性反應器(catalytic reactor)。 本發明另一目的為一種氣體處理設備,其係能降低製 程室排出氣體中有毒氣體含量,此設備包含一個能於激 能狀態中處理一基材因而產生排出氣流的加工室,及一 個適於接受並潔淨此排出氣流的潔淨室(scrubber)。 本發明另一目的為一種處理排出氣流的方法,其係能 降低製程室排出氣體中有毒氣體含量,此方法包含在排 第4頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 χ 297公釐) --I I------裝·------丨訂· 丨丨II丨丨 (請先閱讀背面之注意事項再填寫本頁) 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 出氣體中引入一種反應劑(reactant),並將排出氣流及反 應劑引入催化性反應器中,因而減低排出氣體中有毒氣 體的含量。 本發明另一目的為一種處理排出氣流的方法,其係能 降低製程室排出氣體中過氟化物氣體含量,此方法包含 在排出氣體中引入一種反應劑(reactant),將排出氣流 及反應劑引入催化性反應器中。 本發明另一目的為一種處理排出氣流的方法,其係包 含在步驟(a)潔淨該排出氣體之前或之後,催化排出氣流 進行一種反應。 本發明另一目的為一種氣體處理設備,其係能降低製 私室排出氣體中有毒氣體含量,此設備包含一個能於激 能狀態中處理一基材因而產生排出氣流的加工室,及一 個適於減低排出氣體中有毒氣體含量之緩減系統 (abatement system),及一適於控制此減緩系統之操作的 控制器(controller)。 本發明另一目的為一種方法,其係能降低製程室排出 氣體中有毒氣體含量,此方法包含在激能氣體下處理一 基材,並因而產生排出氣體,降低該排出氣體中有毒氣 體含量,並藉由監控該排出氣體來控制其所降低之有毒 氣體含量。 本發明另一目的為一種設備,其係能處理由製程室所 排出的氣體,此設備包含一個能於激能氣體下處理一基 材因而產生排出氣流的加工室’及一個能夠自排出氣流 第5頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------------^裝--------訂--------- (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of Invention () For environmental reasons, the amount of toxic gases and their by-products released into the air must be minimized. At the same time, there is also a need to effectively reduce the amount of mother gas and its by-products in the exhaust gas at a low cost. For the industry that uses PFCS compounds extensively (although the amount used by the industry is already relatively small in terms of the total global consumption or the amount of PFCs released), it is even more necessary to reduce the amount of PFC and other toxic gases to the extent possible lowest. Summary of the invention: The present invention uses a simple and effective way to reduce the content of toxic gases, such as pFCs: The content is very useful. The toxic gas referred to here refers to any toxic, harmful or unwanted gas, such as but not limited to PFCs, CFCs, carbonitrides, other fluorine-containing gases, and other unwanted gases. One of the objects of the present invention is a device capable of reducing the content of toxic gases in the exhaust gas from the process chamber. The device includes a processing chamber capable of processing a substrate in an excited state to generate an exhaust gas stream, and a processing chamber capable of receiving the exhaust gas. Catalytic reactor for gas flow. Another object of the present invention is a gas processing equipment capable of reducing the toxic gas content in the exhaust gas from the process chamber. The equipment includes a processing chamber capable of processing a substrate in an excited state and thereby generating an exhaust gas stream, and a processing chamber suitable for Receive and clean this scrubber. Another object of the present invention is a method for treating exhaust gas stream, which can reduce the content of toxic gas in the exhaust gas from the process chamber. This method includes the fourth page of this paper. (Mm) --I I ------ Installation -------- 丨 Ordering 丨 丨 II 丨 丨 (Please read the precautions on the back before filling out this page) 553761 Employees ’Intellectual Property Bureau of the Ministry of Economic Affairs Cooperative printed A7 B7 V. Description of the invention () A reactant is introduced into the exhaust gas, and the exhaust gas stream and the reactant are introduced into the catalytic reactor, thereby reducing the content of toxic gases in the exhaust gas. Another object of the present invention is a method for treating exhaust gas, which can reduce the content of perfluoride gas in the exhaust gas of the process chamber. The method includes introducing a reactant into the exhaust gas, and introducing the exhaust gas and the reactant into the exhaust gas. Catalytic reactor. Another object of the present invention is a method for treating an exhaust gas stream, which comprises catalyzing the exhaust gas stream to perform a reaction before or after step (a) cleaning the exhaust gas. Another object of the present invention is a gas processing equipment capable of reducing the content of toxic gas in the exhaust gas of the private room. The equipment includes a processing chamber capable of processing a substrate in an excited state to generate an exhaust gas stream, and a suitable processing chamber. Abatement system for reducing toxic gas content in exhaust gas, and a controller suitable for controlling the operation of the abatement system. Another object of the present invention is a method capable of reducing the content of toxic gas in the exhaust gas of the process chamber. The method includes treating a substrate under an excited gas, and thereby generating an exhaust gas to reduce the content of the toxic gas in the exhaust gas. The toxic gas content reduced by monitoring the exhaust gas is controlled. Another object of the present invention is a device capable of processing the gas discharged from a process chamber. The device includes a processing chamber capable of processing a substrate under a stimulated gas and thereby generating an exhaust gas stream, and a self-exhaust gas stream. 5 pages of this paper size are applicable to China National Standard (CNS) A4 specification (210 X 297 mm) ------------ ^ Installation -------- Order ------ --- (Please read the notes on the back before filling this page) 553761 A7 B7

經濟部智慧財產局員工消費合作社印製 五、發明說明() 中移除矽成分及氟成分的第一反應器,以及一個能移除 排出氣流中第二成分的第二反應器。 本發明另一目的為一種設備,其係能處理由製程室所 排出的氣體’此設備包含一個能夠自排出氣流中移除其 中一成分的反應器(reactor),該反應器包含一個入口及 一個出口,及一個位於該出口下游處的加熱器(heater)。 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個能夠接受排出氣流流的反 應器,一個能將潔淨氣流以和排出氣流流相反的方向分 散於該反應器内的噴嘴(nozzle),及一個夠自排出氣流中 移除其反應產物的濾器(filter)。 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個接受排出氣流流的反應器, 及一個適於將潔淨氣流注入反應器内的喉型喷嘴口 (venturi nozzle) 〇 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個内含四個潔淨室的反應器。 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個接受排出氣流流及潔淨氣 流的反應器,一個濾器,及一個可將潔淨氣流由反應器 中汲出並通過該濾器的幫浦(pump)。 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個第一潔淨室,其内至少包 含能接受排出氣流之第一反應器;一個第二潔淨室,其 第6頁 本紙張尺度適用中國國家標準(CNS〉A4規格(210 X 297公釐) ------------- — — ml— ^ ·11111111 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 553761 A7 B7 五、發明說明() 内至少包含能接受排出氣流之第二反應器;及一個可將 潔淨氣流由第一反應器中汲至第二反應器之幫浦。 本發明另一目的為一種設備,其係能潔淨由製程室所 排出的氣體,此設備包含一個能接受排出氣流並將潔淨 氣流引至排出氣流中的反應器,及一個能偵測該潔淨氣 流或反應器情況的偵測器(detector)。 ·, 本發明另一目的為一種設備,其係能處理由製程室所 排出的氣體,此設備包含一個能接受排出氣流之第一反 應器,一個能接受排出氣流之第二反應器,及一個能補 償該第一反應器及該第二反應器間壓力差的壓力補償器 (pressure compensator) ° 本發明另一目的為一種方法,其係能處理製程室排出 氣體,此方法包含在一製程室中處理一基材,並因而產 生排出氣體,從第一反應器中的排出氣體中移除矽成分 及氟成份,並自第二反應器中的排出氣體中移除第二成 分。 本發明另一目的為一種方法,其係能處理製程室排出 氣體,此方法包含在反應器中將排出氣體中的一個成分 移除,並於反應器下游處加熱該排出氣體。 本發明另一目的為一種方法,其係能潔淨由製程室所 排出的氣體,此方法包含將排出氣流流引入反應器中, 將潔淨氣流以和排出氣流流相反的方向分散於該反應器 内,及過濾該排出氣流流。 本發明另一目的為一種方法,其係能潔淨由製程室所 第7頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -------------裝--------訂--- (請先閱讀背面之注意事項再填寫本頁) 1 553761 A7Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the Invention (1) A first reactor for removing silicon and fluorine components, and a second reactor for removing the second component in the exhaust gas stream. Another object of the present invention is an apparatus capable of processing the gas discharged from the process chamber. The apparatus includes a reactor capable of removing one of the components from the exhaust gas stream. The reactor includes an inlet and a An outlet, and a heater located downstream of the outlet. Another object of the present invention is a device capable of cleaning the gas discharged from the process chamber. The device includes a reactor capable of receiving the exhaust gas flow, and a device capable of dispersing the clean gas in the direction opposite to the exhaust gas flow. A nozzle in the reactor and a filter sufficient to remove its reaction products from the exhaust gas stream. Another object of the present invention is an apparatus capable of cleaning the gas exhausted from the process chamber. The apparatus includes a reactor for receiving the exhaust gas stream, and a throat nozzle port adapted to inject the clean gas stream into the reactor ( venturi nozzle) 〇 Another object of the present invention is a device that can clean the gas discharged from the process chamber. The device includes a reactor containing four clean rooms. Another object of the present invention is a device capable of cleaning the gas discharged from a process chamber. The device includes a reactor that receives an exhaust gas stream and a clean gas stream, a filter, and a device capable of drawing clean gas from the reactor. And pass through the filter's pump. Another object of the present invention is a device that can clean the gas discharged from the process chamber. The device includes a first clean room, which contains at least a first reactor capable of receiving the exhaust gas stream; a second clean room, The paper size on page 6 applies to the Chinese national standard (CNS> A4 size (210 X 297 mm) ------------- — — ml — ^ · 11111111 (Please read the note on the back first) Please fill in this page again) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 B7 V. The description of the invention () contains at least a second reactor that can accept the exhaust gas stream; and a clean gas stream can be passed from the first reactor The pump is pumped to the second reactor. Another object of the present invention is a device capable of cleaning the gas discharged from the process chamber. The device includes a reaction capable of receiving the exhaust gas and directing the clean gas into the exhaust gas. And a detector capable of detecting the condition of the clean air stream or the reactor. Another object of the present invention is a device capable of processing gas discharged from a process chamber. The device includes A first reactor capable of receiving an exhaust gas stream, a second reactor capable of receiving an exhaust gas stream, and a pressure compensator capable of compensating a pressure difference between the first reactor and the second reactor Another object of the invention is a method capable of processing exhaust gas from a process chamber, the method comprising processing a substrate in a process chamber, thereby generating exhaust gas, and removing silicon components from the exhaust gas in a first reactor And the fluorine component, and remove the second component from the exhaust gas in the second reactor. Another object of the present invention is a method capable of processing the exhaust gas from the process chamber, the method comprising the process of including the exhaust gas in the reactor. One of the components is removed, and the exhaust gas is heated downstream of the reactor. Another object of the present invention is a method which can clean the exhaust gas from the process chamber, which method comprises introducing an exhaust gas stream into the reactor, Dispersing the clean air stream in the reactor in a direction opposite to the exhaust air stream, and filtering the exhaust air stream. Another object of the present invention is a method, It can be cleaned by the process room on page 7. This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) ------------- Installation ------- -Order --- (Please read the notes on the back before filling this page) 1 553761 A7

經濟部智慧財產局員工消費合作社印製 五、發明說明() 排出的氣體,此方法包含將排出氣流流引入反應器中 並經由一噴嘴口將一潔淨氣流注入反應器内。 本發明另一目的為一種方法,其係能潔淨由製程室所 排出的氣體,此方法包含將排出氣流流引入反應器中, 將潔淨氣流分散於反應器内,及經由過濾器將潔淨氣流 由反應器中汲出。 : 本發明另一目的為一種方法,其係能潔淨由製程室所 排出的氣體,此方法包含將排出氣流流引入第一反應器 中,將排出氣流流引入第二反應器中,並讓潔淨氣流由 第一反應器流向第二反應器。 本發明另一目的為一種方法,其係能潔淨由製程室所 排出的氣體,此方法包含將排出氣流流引入反應器中’ 將潔淨氣流引入反應器内,及偵測該潔淨氣流或該反應 器之情況。 本發明另一目的為一種方法,其係能潔淨由製程室所 排出的氣體,此方法包含將排出氣流流引入第一反應器 中,於第二反應器内處理該排出氣流流,及補償第一反 應器與第二反應器間的壓力差。 本發明另一目的為一種排出氣流之加熱設備’其係包 含一排出氣流入口、一排出氣流出口、一緊鄰著一氣體 流通道之壁、及一可加熱該壁之加熱器,其中該排出氣 流係經由排出氣流入口引入之排出氣流,係在沿著氣體 流通道往排出氣流出口流動時被加熱。 本發明另一目的為一種基材處理設備,其係包含一可 第8頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公爱) ------------裝--------訂— (請先閱讀背面之注意事項再填寫本頁) A7Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention () Exhaust gas, this method includes introducing the exhaust gas stream into the reactor and injecting a clean gas stream into the reactor through a nozzle opening. Another object of the present invention is a method capable of cleaning the gas discharged from the process chamber. The method includes introducing an exhaust gas stream into a reactor, dispersing the clean gas stream in the reactor, and passing the clean gas stream through a filter. Withdrawn from the reactor. : Another object of the present invention is a method capable of cleaning the gas exhausted from the process chamber. The method includes introducing an exhaust gas stream into a first reactor, introducing the exhaust gas stream into a second reactor, and allowing cleanliness. The gas stream flows from the first reactor to the second reactor. Another object of the present invention is a method capable of cleaning the gas discharged from the process chamber. The method includes introducing the exhaust gas stream into the reactor, and introducing the clean gas stream into the reactor, and detecting the clean gas stream or the reaction. Condition of the device. Another object of the present invention is a method capable of cleaning the gas discharged from a process chamber. The method includes introducing an exhaust gas stream into a first reactor, processing the exhaust gas stream in a second reactor, and compensating the first gas stream. The pressure difference between one reactor and the second reactor. Another object of the present invention is a heating device for exhaust gas, which includes an exhaust gas inlet, an exhaust gas outlet, a wall adjacent to a gas flow channel, and a heater capable of heating the wall, wherein the exhaust gas The exhaust airflow introduced through the exhaust airflow inlet is heated while flowing along the gas flow channel toward the exhaust airflow outlet. Another object of the present invention is a substrate processing equipment, which includes a paper size that can be applied to the Chinese National Standard (CNS) A4 specification (21〇X 297 public love) on page 8 ---------- --Install -------- Order— (Please read the precautions on the back before filling this page) A7

553761 五、發明說明() 於激能氣體下處理一基材並因而產生排出氣流之加工 室,及-溶爐,該炫爐係包含了一排出氣流入口、一排 出氣流出口、一緊鄰著一氣體流通道之壁、及一可加熱 該壁之加熱器,其中該排出氣流係經由排出氣流入口引 入之排出氣流,係在沿著氣體流通道往排出氣流出口流 動時被加熱器所加熱。 . 本發明另一目的為一種處理基材及排出氣流的方法, 其係包含於處理區處理該基材,因而產生排出氣流,讓 此排出氣流通過一氣體流通道,並於排出氣流流第一次 通過氣體流通道時,將此排出氣流加熱到一預設的溫度。 本發明另一目的為一種設備,其係能處理由製程室所 排放的氣體,該設備至少包含一催化性反應器,該催化 性反應器係具有排出氣流入口、排出氣流出口、及一適 於含有該催化性物質之内部空間、及一可通往催化性反 應器之開口’該開口係適於用來移除或傳送一催化性物 質。 本發明另一目的為一種方法,其係能由一可接受由製 程室所排放之氣體的催化性反應器中移除該催化性物 質,該方法至少包含提供一個通往反應器的開口,及經 由該開口移除至少部分之該催化性物質。 本發明另一目的為一種設備,其係能處理由製程室所 排放的氣體,該設備至少包含一催化性反應器,該催化 性反應器係具有排出氣流入口、排出氣流出口、及一適 於該催化性反應器之可釋出内容物之反應器容器(reactor 第9頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 x 297公爱) (請先閱讀背面之注意事項再填寫本頁) ----I! — 訂! 經濟部智慧財產局員工消費合作社印製 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() container) 〇 本發明另一目的為一種方法,其係可從能處理由一製 程室所排放之氣體的系統中移除一催化劑,該方法至少 包含讓催化劑於容器中接觸,並從容器中移除該催化劑。 本發明另一目的為一種設備,其係能處理由一製程室 所排放之氣體,該設備至少包含一可於激:能氣體下處理 一基材並因而產生排出氣流之加工室,及一催化性反應 器,該催化性反應器係具有排出氣流入口、排出氣流出 口、及存在於其内部空間之催化性物質,其中該催化性 物質係可由設備中移除。 本發明另一目的為一種設備,其係能處理由一製程室 所排放之氣體,該設備至少包含一可於激能氣體下處理 一基材並因而產生排出氣流之加工室,及一催化性反應 器,該催化性反應器係具有排出氣流入口、排出氣流出 口、及適於容納該催化性物質之内部空間,及在該催化 性反應器之間傳送或移除該催化性物質的手段(means)。 本發明另一目的為一種方法,其係能處理製程室的排 出氣體,此方法包含在激能氣體下處理一基材,並因而 產生排出氣體,催化排出氣體中的一個反應,藉以於催 化區處理該排出氣體,並將催化性物質由催化性區中移 除。 本發明另一目的為一種方法’其係能形成並處理製程 室的排出氣體,此方法包含在製程室處理一基材之前、 之間、或之後,將製程氣體引入製程室並使其形成一内 第10頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) π裝·---!|1 訂—1111! 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 含f2氣體之排出氣體,並讓此排出氣體通過一催化劑上 方藉此降低該排出氣體中F2氣體之含量。 本發明另一目的為一種方法,其係能形成並處理製程 室的排出氣體,此方法包含在製程室處理一基材之前、 之間、或之後,將製程氣體引入製程室並使其形成一内 含F2氣體之排出氣體’並引入一添加物於此:排出氣體中, 該添加物係至少包含一含氫的物質及一含氧的物質,藉 此可降低該排出氣體中f2氣體之含量。 本發明另一目的為一種方法,其係能形成並處理製程 室的排出氣體,此方法包含在製程室處理一基材之前、 之間、或之後,將製程氣體引入製程室並使其形成一内 含F2氣體之排出氣體,加熱此排出氣體,並讓此排出氣 體通過一催化劑上方藉此降低該排出氣體中匕氣體之含 量。 本發明另一目的為一種方法,其係能清潔製程室,該 方法至少包含引入一清潔氣體至製程室中,並形成一内 含氣體之排出氣體’讓此排出氣體通過一催化劑上方 藉此降低該排出氣體中F2氣體之含量。 本發明另一目的為一種方法,其係能形成並處理製程 室的排出氣體’此方法包含引入一氣體至製程室中以處 理一基材或清潔該製程室,形成一内含F2氣體之排出氣 體,引入一添加物於此排出氣體中,該添加物係至少包 含一含風的物質及一含氧的物質,讓此排出氣體通過一 催化劑上方藉以形成HF,然後引入水至排出氣體中以將 第11頁 本^張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)553761 V. Description of the invention () Processing chamber for processing a substrate under excited gas and thereby generating exhaust gas flow, and-melting furnace, the dazzling furnace system includes an exhaust gas inlet, an exhaust gas outlet, The wall of the gas flow channel and a heater capable of heating the wall, wherein the exhaust airflow is an exhaust airflow introduced through the exhaust airflow inlet and is heated by the heater when flowing along the gasflow channel toward the exhaust airflow outlet. Another object of the present invention is a method for processing a substrate and an exhaust airflow, which includes processing the substrate in a processing area, thereby generating an exhaust airflow, allowing the exhaust airflow to pass through a gas flow channel, and firstly When passing through the gas flow channel twice, the exhaust gas flow is heated to a preset temperature. Another object of the present invention is a device capable of processing gas discharged from a process chamber. The device includes at least a catalytic reactor, the catalytic reactor having an exhaust gas inlet, an exhaust gas outlet, and a suitable The internal space containing the catalytic substance and an opening that leads to the catalytic reactor are suitable for removing or transporting a catalytic substance. Another object of the present invention is a method capable of removing the catalytic substance from a catalytic reactor that can accept gas emitted from a process chamber, the method comprising at least providing an opening to the reactor, and At least a portion of the catalytic substance is removed through the opening. Another object of the present invention is a device capable of processing gas discharged from a process chamber. The device includes at least a catalytic reactor, the catalytic reactor having an exhaust gas inlet, an exhaust gas outlet, and a suitable Releasable content container of the catalytic reactor (reactor page 9 This paper size applies to Chinese National Standard (CNS) A4 specifications (21 × 297 public love) (Please read the precautions on the back before filling (This page) ---- I! — Order! Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention () container) 〇 Another purpose of the present invention is A method for removing a catalyst from a system capable of processing a gas discharged from a process chamber, the method including at least contacting the catalyst in a container and removing the catalyst from the container. Another object of the present invention is a device capable of processing the gas discharged from a process chamber. The device includes at least a processing chamber capable of processing a substrate under an excited gas and thereby generating an exhaust gas stream, and a catalyst. The catalytic reactor has an exhaust gas inlet, an exhaust gas outlet, and a catalytic substance existing in its internal space, wherein the catalytic substance can be removed from the equipment. Another object of the present invention is a device capable of processing the gas discharged from a process chamber. The device includes at least a processing chamber capable of processing a substrate under an excited gas and thereby generating an exhaust gas stream, and a catalytic property. A reactor having an exhaust gas inlet, an exhaust gas outlet, an internal space suitable for containing the catalytic substance, and means for transferring or removing the catalytic substance between the catalytic reactors ( means). Another object of the present invention is a method capable of processing the exhaust gas from a process chamber. The method includes treating a substrate under an excited gas, and thereby generating the exhaust gas, catalyzing a reaction in the exhaust gas, thereby catalyzing a reaction. The exhaust gas is processed and the catalytic material is removed from the catalytic zone. Another object of the present invention is a method 'which is capable of forming and processing exhaust gas from a process chamber. The method includes introducing a process gas into the process chamber and forming it into a process chamber before, during, or after processing a substrate in the process chamber. The 10th page of this paper applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) (Please read the precautions on the back before filling this page) | 1 Order—1111! 553761 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the Invention () Exhaust gas containing f2 gas and passing this exhaust gas over a catalyst to reduce the F2 gas in the exhaust gas Of content. Another object of the present invention is a method capable of forming and processing an exhaust gas from a process chamber. The method includes introducing a process gas into the process chamber and forming a process gas before, during, or after processing a substrate in the process chamber. The exhaust gas' containing F2 gas is introduced here: in the exhaust gas, the additive contains at least a hydrogen-containing substance and an oxygen-containing substance, thereby reducing the f2 gas content in the exhaust gas . Another object of the present invention is a method capable of forming and processing an exhaust gas from a process chamber. The method includes introducing a process gas into the process chamber and forming a process gas before, during, or after processing a substrate in the process chamber. The exhaust gas containing the F2 gas is heated, and the exhaust gas is passed over a catalyst to reduce the content of the exhaust gas in the exhaust gas. Another object of the present invention is a method capable of cleaning the process chamber. The method at least includes introducing a clean gas into the process chamber and forming an exhaust gas containing the gas. The content of F2 gas in the exhaust gas. Another object of the present invention is a method capable of forming and processing an exhaust gas from a process chamber. The method includes introducing a gas into the process chamber to process a substrate or cleaning the process chamber to form an exhaust gas containing F2 gas. A gas is introduced into the exhaust gas. The additive contains at least a substance containing wind and an substance containing oxygen, and the exhaust gas is passed through a catalyst to form HF, and then water is introduced into the exhaust gas to Apply the Chinese standard (CNS) A4 specifications (210 X 297 mm) on page 11 of this standard (please read the precautions on the back before filling this page)

553761 A7553761 A7

經濟部智慧財產局員工消費合作社印製 五、發明說明() HF溶解。 本發明另一目的為一種基材處理設備,該設備係至少 包含一製程氣體源;一製程室,其係可執行以該製程氣 體所進行之處理並因而形成一内含h氣體之排出氣體; 及一催化性反應H ’其係、可處理該排出氣體以降低I氣 體含量。 . 本發明另一目的為一種基材處理設 々、凡扯 王”又備,孩設備係至少 包含一製程室,其係可執行以該製程氣赠 、 虱體所進行之處理 並因而形成一内含F2氣體之排出氣體.;义 缸,及一添加物源, 其係可將添加物引入至排出氣體内,以隊你冰 以降低排出氣體中 的F2氣體含量,該添加物係至少包今—〆 ° 含氲的物質及一 含氧的物質。 圖式簡軍說明= 本發明之特點、目的及優點可藉由表去π , 與麥考下列說明、申 請專利範圍及用來闡述實施例之附圖而搵5|ϊ ; 阳知到更深入的了 解,其中 第1圖為一例示性之半導體製程設備的部分示竟圖, 該設備係可處理一基材並因而產生内含产 每氧體之排出 氣體。 第2圖為一例示性之催化性反應器的的部八一 3刀不' 意圖, 其係可與一催化性緩減系統合併使用。 第3圖示出在各種溫度範圍下,3種斤 氣體被破壞 的百分比。 第12頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------ (請先閱讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention () HF dissolves. Another object of the present invention is a substrate processing equipment, the equipment includes at least a process gas source; a process chamber, which can perform processing with the process gas and thereby form an exhaust gas containing h gas; And a catalytic reaction H ′, which can treat the exhaust gas to reduce the content of I gas. Another object of the present invention is to provide a substrate processing equipment, where all the kings are "equipped". The equipment includes at least a process chamber, which can perform the treatment by the process gas and lice and thus form a Exhaust gas containing F2 gas; a cylinder and an additive source, which can introduce additives into the exhaust gas to reduce the F2 gas content in the exhaust gas. The additive system includes at least Today—〆 ° Substances containing tritium and a substance containing oxygen. Brief description of the drawing = The characteristics, purposes, and advantages of the present invention can be represented by π, and the following descriptions of McCaw, the scope of patent applications, and the explanation of implementation附图 5 | ϊ; Yang Zhi got a deeper understanding. Among them, Fig. 1 is a partial diagram of an exemplary semiconductor process equipment, which can process a substrate and thus produce embedded products. Exhaust gas per oxygen body. Figure 2 is an example of an exemplary catalytic reactor, which can be used in combination with a catalytic mitigation system. Figure 3 shows various In the temperature range, 3 kinds of gas are destroyed. Points ratio. Page 12 of this paper scale applicable to Chinese National Standard (CNS) A4 size (210 X 297 mm) ------ (Please read the notes and then fill in the back of this page)

553761 A7 B7 —__ 五、發明說明() 第4圖是催化性緩減系統一實施例之示意圖。 (請先閱讀背面之注意事項再填寫本頁) 第5a及5b圖是可與催化性緩減系統一起使用之加熱 器的示意圖。 第6圖是催化性緩減系統另一實施例之示意圖。 第7圖是可與催化性緩減系統一起使用之前潔淨室 (prescrubber)實施例之示意圖。 - 第8圖是催化性緩減系統另一實施例之示意圖。 第9圖是可與催化性緩減系統一起使用之熱交換器的 示意圖。 第1 0圖是可與催化性緩減系統一起使用之多室導管 (multichamber conduit)的示意圖。 第11圖是可與催化性緩減系統一起使用之控制系統 一實施例之示意圖。 第1 2圖是可用來控制催化性緩減系統之控制程式的 一個例示圖。 第13圖是可與催化性緩減系統一起使用之前潔淨室 另一個實施例的部分示意圖。 第14圖是可與前潔淨室一起使用之喉管及喉型噴嘴 實施例的部分示意圖。 經濟部智慧財產局員工消費合作社印製 第15圖是前潔淨室另一實施例之示意圖。 第1 6圖是前潔淨室與一潔淨液循環系統實施例之部 分示意圖。 第1 7圖是前潔淨室與一潔淨液循環系統實施例之部 分示意圖’圖中示出潔淨液可流入潔淨室及冷卻系統中。 第13頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱)_ ---- 經濟部智慧財產局員工消費合作社印製 553761 A7 ----- B7 五、發明說明() 第1 8圖是可與催化性緩減系统一起使用之加熱器另 一個實施例的部分示意圖。 第19a-l9d圖是可與催化性緩滅系統一起使用之加熱 器實施例的部分側面示意圖。 第2 0圖疋可與催化性緩減系統一起使用之催化性反 應器另一實施例的示意圖。 * 第21圖是可與一催化劑收集器及一催化劑源一起使 用之第20圖中的催化性反應器另〜實施例的側面示意 圖。 第22圖是可與催化性緩減系统〜起使用之一催化劑 反應器及一反應器容器另一實施例的部分上視圖。 第23圖是與反應器容器分開之第22圖催化性反應器 的'意圖。 第24以可與催化性緩減系統—起使用之一催化劑 反應器及一反應器容器另一實施例的部分上視圖。 第25圖是與反應器容器分開之第“圖催化性反應器 的示意圖。 第26圖是會產生内含有毒排出氣流之基材處理設備 另一實施例之示意圖。 第2 7圖疋潔淨液再循環系統與前潔淨室之另一種組 合方式的示意圖。 圖號對照說明: 25 製程室 第Η頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁) I裝---- 訂---------· 553761 A7 B7 五、發明說明( 經濟部智慧財產局員工消費合作社印製 30 半導體基材 35 電漿區 40 支架 45 機械式或靜電式叉柱 50 靜電件 52 介電層 : 53 表面 54 溝渠 55 電極 60 電位供應源 66 氣體通〇道 67 熱交換氣體供應源 68 出口 70 氣體供應源 72 氣體喷嘴/製程氣體分散器 75 側壁 80 排氣系統 82 節氣閥 85 排氣管 100 排出氣體 101 緩減氣體流 125 幫浦 200 催化性緩減系統 210 導管 第15頁 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 五、發明說明() 215 220 222 223 224 230 231 232 233 234 235 236 237 240 241 242 243 244 250 251 流量調控系統 添加物氣體供應室 添加物氣體供應源 通道 閥 前潔淨室 入口 出口 喷嘴 前潔淨室反應器 過濾系統 閥 儲存槽 加熱器 入口 出CT 橫向往内延伸的線圈 縱向往内延伸的線圈 催化性反應器 入口 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 252 出口 255 高表面區域件 257 催化性表面 260 冷卻系統 第16頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 丨丨丨丨丨丨丨—丨丨丨-丨!-訂 - — I ! - — (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 五、發明說明() 265 、 275 270 280 3 10 3 12 3 15 320 322 327 、 347 328 、 348 329 、 330 332 、 333 335 340 342 345 350 355 357 359 360 361 362 365 收集儲存槽 後潔淨室 排氣裝置 水解管柱 潮濕的環境 潔淨氣體供應源 第一潔淨通道 喷嘴 可增加表面積之物質 平台 通道 喉型噴嘴 第二潔淨管柱 第二噴嘴 來源 儲存槽 除霧器 出C7 濾器 熱交換器 入口 出Π 通道 第17頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 五、發明說明() 經濟部智慧財產局員工消費合作社印製 370 溢 流 道 371 已 緩 減 之 排 出 氣 流 入口 372 已 緩 減 之 排 出 氣 流 出π 375 已 緩 減 之 排 出 氣 流 通道 376 過 濾 單 元 378 隔 熱 物 質 1 400 控 制 器 401 影 像 界 面 端 子 402 再 循 環 系 統 405 氣 體 分析探 針 405 406 幫 浦 410 氣 體 分析 器 420 壓 力 監 測 器 421 顆 粒 濾 器 430 溫 度 監 測 器 43卜 432、433、 管 路 434 440 組 件 控 制 系 統 441 潔 淨 液 體 源 450 閥 控 制 器 451、 455 下 水 道 460 監 視 器 461、 471 管 路 第18頁 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 五、發明說明( 經濟部智慧財產局員工消費合作社印製 475 排序程式編碼 製程選擇程式編 480 分散閥 製程室管理程式 481 P-型阱 482 幫浦 485 排出氣體緩減程 490 緩減閥 500 控制系統 510 控制器 520 pH儀 530 流量控制器 540、 540、540,, 暖爐/加熱器 592、 5929 541、 541” 入口 542 > 5425 出订 545、 545’ 旋繞的氣體通道 550 外部的加熱元件 595、 595” 551 中空内部 555 > 5559 外通道 556、 557 密閉端 560 > 565 内管 561、 566 入口端 第19頁 (請先閱讀背面之注意事項再填寫本頁)553761 A7 B7 —__ 5. Description of the invention () Figure 4 is a schematic diagram of an embodiment of a catalytic mitigation system. (Please read the precautions on the back before filling out this page) Figures 5a and 5b are schematic diagrams of heaters that can be used with catalytic mitigation systems. FIG. 6 is a schematic diagram of another embodiment of a catalytic mitigation system. Figure 7 is a schematic diagram of a previous clean room embodiment that can be used with a catalytic mitigation system. -Figure 8 is a schematic diagram of another embodiment of a catalytic mitigation system. Figure 9 is a schematic diagram of a heat exchanger that can be used with a catalytic mitigation system. Figure 10 is a schematic diagram of a multichamber conduit that can be used with a catalytic mitigation system. Figure 11 is a schematic diagram of an embodiment of a control system that can be used with a catalytic mitigation system. Figure 12 is an example of a control program that can be used to control a catalytic mitigation system. Figure 13 is a partial schematic view of another embodiment of a clean room prior to use with a catalytic mitigation system. Figure 14 is a partial schematic view of a throat and throat nozzle embodiment that can be used with a front clean room. Printed by the Employees' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Figure 15 is a schematic diagram of another embodiment of the former clean room. Fig. 16 is a partial schematic view of an embodiment of a front clean room and a clean liquid circulation system. Fig. 17 is a partial schematic view of an embodiment of a front clean room and a clean liquid circulation system. The figure shows that clean liquid can flow into the clean room and the cooling system. Page 13 This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 public love) _ ---- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 ----- B7 V. Description of the invention ( Figure 18 is a partial schematic view of another embodiment of a heater that can be used with a catalytic mitigation system. Figures 19a-19d are schematic side views of portions of a heater embodiment that can be used with a catalytic mitigation system. Figure 20 is a schematic diagram of another embodiment of a catalytic reactor that can be used with a catalytic mitigation system. * Fig. 21 is a schematic side view of another embodiment of the catalytic reactor of Fig. 20 which can be used with a catalyst collector and a catalyst source. Fig. 22 is a partial top view of another embodiment of a catalyst reactor and a reactor vessel that can be used with the catalytic mitigation system. Figure 23 is the 'intent' of the catalytic reactor of Figure 22 separate from the reactor vessel. Section 24 is a partial top view of another embodiment of a catalytic reactor and a reactor vessel using a catalytic mitigation system. Fig. 25 is a schematic diagram of a catalytic reactor shown in Fig. 25 separated from a reactor vessel. Fig. 26 is a schematic diagram of another embodiment of a substrate processing apparatus that generates a toxic exhaust gas stream. Fig. 27 Fig. 疋 Cleaning liquid Schematic diagram of another combination of the recirculation system and the front clean room. Comparative illustration of the drawing numbers: The first page of the 25 process room This paper size applies to China National Standard (CNS) A4 (210 X 297 public love) (Please read the back first Please pay attention to this page before filling in this page) I Pack ---- Order --------- · 553761 A7 B7 V. Description of Invention (Printed by the Intellectual Property Bureau Employee Consumer Cooperative of the Ministry of Economic Affairs 30 Semiconductor substrate 35 Plasma Zone 40 Bracket 45 Mechanical or electrostatic fork post 50 Electrostatic element 52 Dielectric layer: 53 surface 54 trench 55 electrode 60 potential supply 66 gas passageway 67 heat exchange gas supply 68 outlet 70 gas supply source 72 gas nozzle / Process gas diffuser 75 Side wall 80 Exhaust system 82 Throttle valve 85 Exhaust pipe 100 Exhaust gas 101 Slow gas flow 125 Pump 200 Catalytic slow system 210 Conduit Page 15 (Please read first Read the notes on the back and fill in this page again.) This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 553761 A7 B7 V. Description of the invention () 215 220 222 223 224 230 231 232 233 234 235 236 237 240 241 242 243 244 250 251 Flow control system Additive gas supply room Additive gas supply source channel Front clean room inlet outlet nozzle Front clean room reactor filter system Valve storage tank heater inlet Out CT Horizontally inwardly extending coil Coil catalytic reactor inlet extending longitudinally inward (please read the notes on the back before filling this page) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 252 Exit 255 High surface area piece 257 Catalytic surface 260 Cooling system No. 16 The paper size of this page applies to Chinese National Standard (CNS) A4 (210 X 297 mm) 553761 A7 B7 丨 丨 丨 丨 丨 丨 丨 丨 丨 丨-丨! -Order- — I!-— (Please read the back first Please fill out this page before printing) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs V. Invention Description () 265, 275 270 280 3 10 3 12 3 15 3 20 322 327, 347 328, 348 329, 330 332, 333 335 340 342 345 350 355 357 359 359 360 361 362 365 After collecting the storage tank, the clean room exhaust device hydrolyzes the pipe string, the humid environment, the clean gas supply source, the first clean channel nozzle Substance platform channel throat nozzle that can increase surface area Second clean pipe string Second nozzle source Storage tank demister outlet C7 filter heat exchanger inlet outlet Π channel page 17 This paper size applies to China National Standard (CNS) A4 specifications ( (210 X 297 mm) 553761 A7 B7 V. Description of the invention () Printed by the Intellectual Property Bureau Employee Consumer Cooperative of the Ministry of Economic Affairs 370 Overflow channel 371 Reduced exhaust air inlet 372 Reduced exhaust air outlet π 375 Reduced Exhaust air flow channel 376 Filter unit 378 Insulation material 1 400 Controller 401 Image interface terminal 402 Recirculation system 405 Gas analysis probe 405 406 Pump 410 Gas analyzer 420 Pressure monitor 421 Particle filter 430 Temperature monitor 43, 432, 433, piping 434 440 Component control system 441 Clean liquid source 450 Valve controller 451, 455 Sewer 460 Monitor 461, 471 Piping page 18 (Please read the precautions on the back before filling in this Page) This paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 mm) 553761 A7 B7 V. Description of invention (Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 475 Sorting program coding Process selection program 480 Dispersing valve Process room management program 481 P-trap 482 Pump 485 Exhaust gas slow-down 490 Slow-down valve 500 Control system 510 Controller 520 pH meter 530 Flow controller 540, 540, 540, heater / heater 592, 5929 541, 541 ”inlet 542 > 5425 order 545, 545 'spiral gas channel 550 external heating element 595, 595” 551 hollow interior 555 > 5559 outer channel 556, 557 closed end 560 > 565 inner tube 561, 566 Entrance Page 19 (Please read first (Notes on the back then fill out this page)

本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 _B7 五、發明說明() 經濟部智慧財產局員工消費合作社印製 562、 563 出口端 567 空洞 570 間隙 580、 590 阻礙物 581 > 591 開口 593 > 5939 氣體流動通道 594、 5945 壁 610 > 620 通道 614、 624 凸緣 630 > 635 通道蓋 632 絕緣部分 640 真空管 650 真空產生器 655、 640 管線 660 催化劑收集器 661 入口 662 出口 665 濾器 668 廢氣 670 催化劑源 710、 720 安定板 750 > 850 反應器容器 760 ^ 860 反應器容器壁 764 > 864 凸緣 第20頁 (請先閱讀背面之注意事項再填寫本頁) . I I n ϋ n n n 一el,I I n I a^i n I I I » 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 五、發明說明() 經濟部智慧財產局員工消費合作社印製 765 > 865 空間 770 > 780 溝槽 790 蓋子 875 邊 880 細溝 885 細溝開口 890 0-型密封環 895 薄板 925 基材處理設備 935 製程室 940 氣體分散器 942 噴頭或歧管 944 壁 946 地板 950 處理區 952 供應管路 954 製程氣體供應源 956 氣流閥 958 製程控制器 960 支架 962 > 964 電極 970 電源 972 網路 976 加熱機制 第21頁 丨 — — — — — — —---裝·-----丨丨訂·丨丨!丨 i (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 553761 A7 _B7 V. Description of the invention () Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 562, 563 Exit end 567 Hollow 570 Gap 580, 590 Obstacle 581 > 591 opening 593 > 5939 Gas flow channel 594, 5945 wall 610 > 620 channel 614, 624 flange 630 > 635 channel cover 632 insulation part 640 vacuum tube 650 vacuum generator 655, 640 line 660 catalyst collection Reactor 661 inlet 662 outlet 665 filter 668 exhaust gas 670 catalyst source 710, 720 stabilizer plate 750 > 850 reactor vessel 760 ^ 860 reactor vessel wall 764 > 864 flange page 20 (Please read the precautions on the back before filling (This page). II n ϋ nnn el, II n I a ^ in III »This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) 553761 A7 B7 V. Description of invention () Wisdom of the Ministry of Economic Affairs Property Bureau employee consumer cooperative print 765 > 865 space 770 > 780 groove 790 lid 875 side 880 fine groove 8 85 Fine groove opening 890 0-type sealing ring 895 Thin plate 925 Substrate processing equipment 935 Process chamber 940 Gas diffuser 942 Nozzle or manifold 944 Wall 946 Floor 950 Processing area 952 Supply line 954 Process gas supply source 956 Air valve 958 Process Controller 960 bracket 962 > 964 electrode 970 power supply 972 network 976 heating mechanism page 21 丨 — — — — — — ——— install · ----- 丨 丨 Order · 丨 丨!丨 i (Please read the precautions on the back before filling out this page) This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 553761 A7 B7

五、發明說明() 980 982 990 994 996 排出氣流 排氣系統 製程室清潔氣體供應源 節氣閥 經濟部智慧財產局員工消費合作社印製 發明詳述 : 本發明係關於一種可與基材處理當—如 王至 起使用的氣體處 理設備,及一種可降低製程室排出氣體中有毒氣體含量 的方法。前述說明及附圖僅代表本發明之例示性說明, 本發明範«並不因此受到限制。因此,雖然這些說明及 圖示可闡述本發明特性’但需瞭解每—項特性均可單獨 用於本發明,而不僅限於特定圖示中,η 士杜α “人 τ 且本發明係包含 這些特色之任一組合。 第1圖為一例示性之半導體製程設備的部分示意圖, 其係包含諸如美商應材公司(Santa Clara,Claif〇rnia)所販 賣的MxP +氧化蚀刻室之類的室25,此室之一般性描述 參見Chen等人所提之美國專利第4,842,683及5,215,619 號;及May dan等人所提之美國專利第4,668,338號;其 内容以參考文獻方式併入本文中。這類製程室可用於多 室積體製程系統中,例如Maydan等人所提之美國專利第 4,9 5 1,601號中之系統,其内容以參考文獻方式併入本文 中。室25之特定實施例示於此,其係適於用來處理半導 體基材3 0。實施例僅為闡述本發明之用,本發明範脅並 第22頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ’裝------ (請先閲讀背面之注意事項再填寫本頁) tr---------禮 丨553761 A7 五、發明說明() 不因此受到限制。 製程中,室25係被抽真空使室壓低於約5〇〇亳托耳, 基材30則由真空的負載轉移室(未示出)被轉移至室25 之電漿區35。基材30被置於支架4〇上,該支架可選擇 性地包含一機械式或靜電式叉柱45。典型的靜電式叉柱 45係包含一由介電層52所組成的靜電件:5〇,該介電層 52之表面53係適於接受基材3〇。該介電層52係可覆蓋 一電極55 -其可為單一導體或為數個導體—典可被充 電级握拣住該1材30。在基材30被置於又柱45上後, 電極55即被充電,視基材30的負電程度由電位供應源 60提供電極55足夠的靜電來握持^基材3Q。靜電式叉 柱45下方的底部65可支持該叉柱,並可選擇性地以一 RF偏壓電位使其帶電。表面53上可含有溝渠54,好讓 諸如氦氣之類的熱交換氣體可維持基材3〇上的溫度。該 熱交換氣體係由具一或多個出口 68之氣體通道66所提 供,其係可傳送氣體至叉柱45之表面53上,並延伸通 過一或多個電極55及介電層52。一熱交換氣體供應源67 藉由氣體供應管道提供熱交換氣體至氣體通道66。介電 層52之表面53上的溝渠54,其大小係恰可保持並分散 該熱交換氣體以加熱或冷卻整個基材3 0之背面,這此溝 渠54係如橫越介電層52上彼此交錯的溝渠54。較好是, 至少一個氣體通道66係終止於該溝渠54之一;且更好 是’該氣體通道66係終止於一或多個彼此交錯的溝渠 54。氣體通道66、氣體供應管道、及溝渠54係藉由傳 第23頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) • I丨—丨i丨丨—丨ί 装·! S丨I訂·丨S丨i丨人 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 553761 Α7 ______Β7 五、發明說明() 統技術所形成的,例如鑽鑿、鑽探或磨製。典型地,熱 交換JL體坚包含或氣’其係以約5托耳至約3 0托耳的 壓力來供應,但亦可使用諸如CF4之類的其他氣體。 製程氣體係經由室25中包含第一氣體供應源70及一 或多個氣體噴嘴72在内所組成的氣體供應管道而被引入 室25中。室25中的氣體一般係維持在一:低壓下。在製 程氣體上施加一電磁能可於電漿區35形成一氣體電漿。 在室25中,該電漿係藉由施加一 rf電位於電極55(當 作陰極)上並將室25中的側壁75接地形成另一電極55(陽 極)而產生的。或者,可將一 RF電流施加於一導電電圈 上(未示出)來謗導耦合能量進入室25中,以於電漿區35 形成一氣體電漿。施加於電極55上或導電電圈上之rf 電流的頻率一般介於約50 KHz至約60 MHz間,更好是 約丨3 ·56 MHz。亦可於磁性增強反應器中以電子共振 (electron cyclotron resonance)方式來提高電漿強度,其 係以可提供一磁場之諸如永久性磁鐵或電磁線圈之類的 磁場生成器77來提高電漿區35中的電漿強度及其均勻 度。較好是,該磁場係包含一轉動磁場,且其磁場轉動 軸係與基材30之平面平行,如美國專利第4,842,683號 中所述。 排出氣體100包含製程氣體及製程副產品,係經由能 被降壓至約1 〇·3毫托耳之排氣系統80而被排出室25外。 該排氣系統80包含一排氣管一 85,其係可通至一或多個 可將室25内氣體排空之幫浦例如高真空繁浦或一 第24頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)V. Description of the invention () 980 982 990 994 996 Exhaust gas exhaust system process room Clean gas supply source Throttle valve Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economics Detailed description of the invention: This invention relates to a kind of Gas treatment equipment used by Wang Zhiqi, and a method that can reduce the toxic gas content in the exhaust gas from the process chamber. The foregoing description and drawings represent only an exemplary description of the present invention, and the scope of the present invention is not limited thereto. Therefore, although these descriptions and illustrations can explain the characteristics of the present invention, it is necessary to understand that each of the characteristics can be used independently in the present invention, and not limited to the specific illustration. Η Shidu α "human τ" and the present invention includes these Any combination of features. Figure 1 is a partial schematic view of an exemplary semiconductor process equipment, which includes a chamber such as the MxP + oxidation etching chamber sold by Santa Clara, Claifornia. 25. For a general description of this room, see US Patent Nos. 4,842,683 and 5,215,619 by Chen et al .; and US Patent No. 4,668,338 by May dan et al .; the contents of which are incorporated herein by reference. Such process chambers can be used in multi-chamber integrated process systems, such as the system in U.S. Patent No. 4,9 5 1,601 by Maydan et al., The contents of which are incorporated herein by reference. Examples are shown here, which are suitable for processing semiconductor substrates 30. The examples are only for the purpose of illustrating the present invention, and the present invention is not limited to page 22. The paper dimensions are applicable to the Chinese National Standard (CNS) A4 specification (210X 297 mm) 'loading ------ (Please read the precautions on the back before filling out this page) tr --------- ceremony 丨 553761 A7 V. Description of the invention () Not limited by this During the manufacturing process, the chamber 25 is evacuated to make the chamber pressure lower than about 500 Torr, and the substrate 30 is transferred from the vacuum load transfer chamber (not shown) to the plasma region 35 of the chamber 25. The substrate 30 is placed on a bracket 40, which can optionally include a mechanical or electrostatic fork 45. A typical electrostatic fork 45 comprises an electrostatic member composed of a dielectric layer 52: 50, The surface 53 of the dielectric layer 52 is suitable for receiving a substrate 30. The dielectric layer 52 may cover an electrode 55-it may be a single conductor or several conductors-it can be picked up by a charge-level grip 30. After the substrate 30 is placed on the pillar 45, the electrode 55 is charged, depending on the degree of negative electricity of the substrate 30, the potential supply source 60 provides the electrode 55 with sufficient static electricity to hold the substrate 3Q. The electrostatic fork The fork 65 is supported by a bottom 65 below the column 45 and can be selectively electrified at an RF bias potential. The surface 53 may contain a trench 54 such as helium The heat exchange gas can maintain the temperature on the substrate 30. The heat exchange gas system is provided by a gas channel 66 having one or more outlets 68, which can transfer gas to the surface 53 of the fork 45 and extend through One or more electrodes 55 and the dielectric layer 52. A heat exchange gas supply source 67 supplies heat exchange gas to the gas passage 66 through a gas supply pipe. The trench 54 on the surface 53 of the dielectric layer 52 is just the right size The heat exchange gas is held and dispersed to heat or cool the entire back surface of the substrate 30. The trenches 54 are like the trenches 54 crossing each other on the dielectric layer 52. Preferably, at least one gas channel 66 terminates in one of the trenches 54; and more preferably, the gas channel 66 terminates in one or more trenches 54 that are staggered with each other. The gas channel 66, gas supply pipe, and ditch 54 are based on page 23. The paper size applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) • I 丨 — 丨 i 丨 丨 — 丨 installed !! Ordered by S 丨 I 丨 S 丨 i 丨 (Please read the notes on the back before filling out this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 Α7 ______ Β7 V. Description of the invention () Drilling, drilling or grinding. Typically, the heat exchange JL body contains or gas' which is supplied at a pressure of about 5 Torr to about 30 Torr, but other gases such as CF4 can also be used. The process gas system is introduced into the chamber 25 via a gas supply pipe including a first gas supply source 70 and one or more gas nozzles 72 in the chamber 25. The gas in the chamber 25 is generally maintained at a low pressure. Applying an electromagnetic energy to the process gas can form a gas plasma in the plasma region 35. In the chamber 25, the plasma is generated by applying an rf electric current to the electrode 55 (as a cathode) and grounding the side wall 75 in the chamber 25 to form another electrode 55 (anode). Alternatively, an RF current may be applied to a conductive coil (not shown) to conduct the coupling energy into the chamber 25 to form a gas plasma in the plasma region 35. The frequency of the rf current applied to the electrode 55 or the conductive coil is generally between about 50 KHz to about 60 MHz, and more preferably about 3.56 MHz. Electron cyclotron resonance can also be used to increase the strength of the plasma in a magnetically enhanced reactor, which uses a magnetic field generator 77 such as a permanent magnet or an electromagnetic coil to provide a magnetic field to increase the plasma area. Plasma strength and uniformity in 35. Preferably, the magnetic field system includes a rotating magnetic field, and the axis of rotation of the magnetic field is parallel to the plane of the substrate 30, as described in U.S. Patent No. 4,842,683. The exhaust gas 100 contains process gas and process by-products, and is discharged out of the chamber 25 via an exhaust system 80 which can be depressurized to approximately 1.0 mTorr. The exhaust system 80 includes an exhaust pipe 85, which is connected to one or more pumps capable of evacuating the gas in the chamber 25, such as a high vacuum pump or a page 24. This paper applies Chinese national standards. (CNS) A4 specification (21〇X 297mm) (Please read the precautions on the back before filling this page)

553761 A7553761 A7

經濟部考慧財產眉員工消費合作社印製 般的粗幫浦。排氣管85中有一可控制室25中氣體壓力 的節氣閥82❹此外,通常以光學終點偵察技術藉由測量 室25中各氣體放射光強度高低,或由基材30上之層所 反射回來的光強度,來決定蝕刻製程是否已完成。 在一典型半導體製程之室25操作中,一半導體基材 係被置於製程室25中的支架40上,一由諸:如cf、C F 、 4 2 6 Λ c3f8、chf3、sf6、nf3、cof2、ch3f、c4f8、CH2F2、c4f 等等之含氟氣體所組成的製程氣體會經由製程氣體分散 器72而被引入處理區35中。該製程氣體係經由室25中 的氣ϋ充激能器ά〇而被.激發,例如在電磁激能之電装氣 體或微波激能之電漿氣體中來處理基材30。或者,亦可 在另一不相連的室中將氣體激發。處理中或處理後,由 已使用過之製程氣體及氣體副產物所形成的排出氣體访 100係被排出室25外並進入催化性緩減系統200之導管 210中。含氟氣體亦可被用於製程室25之清潔程序中。 為降低排出氣體100中諸如PFCs氣體之類的有毒氣體 及不欲求氣體之含量,可於排出氣體中添加一種添加物 氣體。舉例來說,一種内含氫及氧的氣體,例如h2〇 , 可被加至内含CF4之排出氣體1〇〇中,以將cf4轉變成Printed by the Consumer Cooperative of the Ministry of Economic Affairs, Kao Hui Property and Employee Cooperatives. The exhaust pipe 85 has a throttle valve 82 which can control the gas pressure in the chamber 25. In addition, the optical endpoint detection technology is usually used to measure the intensity of the light emitted by each gas in the chamber 25, or reflected by the layer on the substrate 30 Light intensity to determine whether the etching process is complete. In the operation of a typical semiconductor process chamber 25, a semiconductor substrate is placed on a support 40 in the process chamber 25, such as cf, CF, 4 2 6 Λ c3f8, chf3, sf6, nf3, cof2 Process gas composed of fluorine-containing gas such as ch3f, c4f8, CH2F2, c4f, etc. will be introduced into the processing area 35 through the process gas disperser 72. The process gas system is excited by a gas-filled exciter in the chamber 25, for example, the substrate 30 is treated in an electromagnetically charged gas or a microwave-induced plasma gas. Alternatively, the gas can be excited in another unconnected chamber. During or after the treatment, the exhaust gas formed by the used process gas and gas by-products is discharged out of the chamber 25 and enters the conduit 210 of the catalytic mitigation system 200. The fluorine-containing gas may also be used in the cleaning process of the process chamber 25. To reduce the content of toxic gases such as PFCs gas and undesired gases in the exhaust gas 100, an additive gas may be added to the exhaust gas. For example, a gas containing hydrogen and oxygen, such as h2O, can be added to the exhaust gas 100 containing CF4 to convert cf4 to

HF。一般認為其反應係經由如下之反應式來進行: CF4 + 2 H20 — C02 + 4 HF CO,可以直接被排出,而HF則可藉由將其溶於水中後再 進行排放。但是,它仍屬於高度腐蝕性及劇毒的物質。 經微幅調整後,氫和氧亦可用來分解其他的PFCs化合 第25頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)' ------ --------------------^--------- 2请先閱讀背面之注意事項再填寫本頁,> 553761 A7 B7 五、發明說明() 物。舉例來說,一般認為CJ6係可經由如下之反應式來 與h20及氧氣作用: (請先閱讀背面之注意事項再填寫本頁)HF. It is generally believed that the reaction proceeds through the following reaction formula: CF4 + 2 H20 — C02 + 4 HF CO can be directly discharged, and HF can be discharged by dissolving it in water. However, it is still highly corrosive and highly toxic. After minor adjustments, hydrogen and oxygen can also be used to decompose other PFCs. Page 25 The paper size applies Chinese National Standard (CNS) A4 (210 X 297 mm) '------ ---- ---------------- ^ --------- 2 Please read the notes on the back before filling in this page, > 553761 A7 B7 V. Description of the invention () Thing. For example, it is generally believed that CJ6 can interact with h20 and oxygen through the following reaction formula: (Please read the precautions on the back before filling this page)

2 C2F6 + 6 H20 + 02 —4 C02 + 12 HF 因此,可添加諸如H2〇和/或氧氣或其他反應性氣體至排 出氣體100中,以降低排出氣體中有毒氣體的含量。 已知催化劑可幫助這些例示性的緩減反應進行。因此, 在本發明一版麥中,係將一排出氣體100通過一催化劑 上方。催化劑可如第2圖所示,與排出氣體100及添加 物氣體流一同被置於催化性反應器250中。以一真空幫 浦將排出氣體100抽離催化性反應器250,並可選擇性 地以諸如節氣閥之類的流量控制器來調節流過催化性反 應器250之排出氣體流。此外,排出氣體1〇〇亦可於上 游處與諸如添加物氣體或液體之類的反應物一起混合, 之後該氣體混合物再經由入口 25 1通過催化性反應器 250,再由出口 252離開,以提供一可被排放至大氣中或 很容易處理後即可丢棄的〃键鱗氣/體流1 0 1。 經濟部智慧財產局員工消費合作社印製 催化性反應器250包含一催化性表面257,其係可催 化一種反應以降低排出氣體中有毒氣體的含量。一真空 幫浦或流量控制裝置係位於該催化性反應器250相對立 的兩面上,以使排出氣體1 〇 〇能流經催化性反應器2 5 0。 排出氣體100可於上游處與諸如添加物氣體或液體之類 的反應物一起混合,且此排出氣體流與添加物氣體一起 經由入口 251進入,通過催化性反應器250 ’再由出口 252 離開。催化性表面257可以是一種結構形式,例如由催 第26頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) A7 B72 C2F6 + 6 H20 + 02 — 4 C02 + 12 HF Therefore, you can add H2O and / or oxygen or other reactive gases to the exhaust gas 100 to reduce the content of toxic gases in the exhaust gas. Catalysts are known to help these exemplary mitigation reactions proceed. Therefore, in the first version of the wheat of the present invention, an exhaust gas 100 is passed over a catalyst. The catalyst may be placed in a catalytic reactor 250 together with the exhaust gas 100 and the additive gas stream as shown in FIG. The exhaust gas 100 is evacuated from the catalytic reactor 250 by a vacuum pump, and the flow of the exhaust gas flowing through the catalytic reactor 250 is optionally adjusted by a flow controller such as a throttle valve. In addition, the exhaust gas 100 can also be mixed upstream with reactants such as additive gas or liquid, and then the gas mixture passes through the inlet 25 1 through the catalytic reactor 250 and exits through the outlet 252 to Provide a keystone scale / fluid that can be discharged into the atmosphere or can be easily discarded after disposal. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economics. The catalytic reactor 250 contains a catalytic surface 257 that catalyzes a reaction to reduce the amount of toxic gases in the exhaust gas. A vacuum pump or flow control device is located on two opposite sides of the catalytic reactor 250 so that the exhaust gas 1000 can flow through the catalytic reactor 250. The exhaust gas 100 may be mixed upstream with a reactant such as an additive gas or a liquid, and this exhaust gas stream enters with the additive gas through an inlet 251, passes through a catalytic reactor 250 ', and exits through an outlet 252. The catalytic surface 257 can be a structured form, for example, from page 26. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) A7 B7

553761 五、發明說明() 化性物質所製成的陶瓷或金屬結構或可支持細顆粒催化 劑、顆粒泡沫、或催化性反應器250之組成或其壁上塗 覆物之結構。舉例來說,催化性表面257可包含支持辞 構之表面,該支持結構至少包含已包埋了催化劑之蜂巢 式組件,以形成一高表面區域件255,當排出氣體1〇〇 從入口 251進入時,會通過此高表面區域彳牛255上方, 然後才由出口 2 5 2離開。此催化性表面2 5 7亦可以是一 種已包含了諸如cordierite、Al2〇3、矽酸鋁、mullite、 矽化碳、矽化氮、zeolite等等之陶瓷物質的結構;或可 包含一種諸如Zr02、Al2〇3、Ti02或其組合或其他具催化 性質之氧化物等等的塗覆物。此催化性表面257亦可以 被包埋入諸如 Pt、Pd、Rh、Cu、Ni、Co、Ag、Mo、W、 V、La或其組合或其他已知義/提高催化活性之物質等。 離開催化性反應器之緩減氣體流1 0 1已經非常安全可被 直接排放,或經簡易處理後即可丟棄。 讓排出氣體100通過催化性表面257上方,顯示此緩 減反應之活化能已被降低,因此可提高反應速率。舉例 來說,藉通過適當之催化劑表面,可將分解CF4所需的 活化能降低約135 Kj/mol。在另一實施例中,C2F6的活 化能則可降低約98 Kj/m〇l ^容許減少PFC含量之最低活 化能亦可存在於低壓下’藉此降低能量消耗,並改善反 應效率。第3圖示出在各種溫度範圍下,3種PFC氣體 與溫度間的關係,此三種分別為C F 4、C 2 F 6及C 3 F 8的氣 體是排出氣體100及添加物通過催化性表面257上方所 第27頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) F « ΛΜ9 ϋ mmmmmm n n n-^δ,,fl oh· .Mmi I a···· 窗 經濟部智慧財產局員工消費合作社印製 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 產生的。在溫度低於700°C下可將PFC幾乎完全緩減。 較好是將這些包括PFC在内的有毒氣體約80%至約100% 完全破壞,更好是約90%至約100%被完全破壞,最好則 是約95%至約100%被完全破壞,以獲得一充分被緩減之 排出氣體。所有3種PFC氣體都是在低於l〇〇〇°C下的溫 度進行緩減。在800°C下的溫度即可展現出:明顯的緩減效 果。從約400°C至約800°C,這三種PFC氣體的緩減效應 也開始增加。從約550°C到約700°C的溫度間,CF4就已 表現出被大幅破壞的情形,到了約600°C時,破壞比例已 超過95°/。。在更高溫度或是約低於700°C之反應溫度下, 特別是約700°C時’ CF4、C2F6及C3F8氣體被破壞的比例 高達約95%。在較低溫度下可提供較高的效率且降低能 源耗損率。第3圖亦示出催化劑之有效周期。此三氣體 之每一曲線分別顯示在處理了 1000、22,000、及53,000 個基材後,其分別所進行的測試。三條曲線彼此間的相 似度顯示催化性表面257在一段長時間内的連續性效 用。預計催化tilH理了 1 〇0,&〇〇個基#後奶龍維持 如此高…的效率一。.因此催化劑及其催化性表面的效期至少 可長達6個月。 在一態樣下,催化性反應器250乃是一大型催化性緩 減系統200的一部分。此催化性緩減系統之一實施例如 第4圖所示。一導管210被緊密地接合在室25之排氣系 統80上,使包含諸如PFCs類之有毒氣體在内的排出氣 體100可從室25流進導管210内。此導管210可傳送排 第28頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ϋ i^fl 1 I 1 i·— —Hi ϋ · MMmmf a·— 1-.1 1 I —.1 一i n ϋ n n 1·— an n I fl (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 五、發明說明() 出氣體1 00,讓它通過此催化性緩減系統200。催化性缓 減系統一般可包含一流量調控系統2 1 5、一添加物氣體 供應室220、一加熱器240、一催化性反應器250、一冷 卻系統260及一後潔淨室(p〇stscrubber)270。 流量調控系統2 1 5包含一位於入口管道2 1 8之閥2 1 7, 該入口管道218係與導管210相通,以容:許空氣或其他 非反應性氣體被引入排出氣體流1 0 0中’此外還可調節 導管210中的壓力。此外,可能還需要提供排出氣體流 1 00的壓力控制,以提供足夠的氣流通過此催化性緩減 系統200。 經濟部智慧財產局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 也可藉由流量調控系統215、添加物氣體供應室220 和/或後潔淨室230這三種中任一種,將適當的添加物氣 體流,例如H20及02,引入排出氣體流1〇〇中。舉例來 說,適當的添加物氣體供應源220包含一通道223,其 係藉由一閥224之控制而與添加物氣體或流體供應源222 相通。並加入可和排出氣體流100中的有毒氣體反應, 以達到緩減目的之適當添加物。舉例來說,在一實施例 中,藉由在排出氣體流100添加約0.1%至約10%的水, 更好是添加約3%的水,可將PFCs加以分解。也可加入 其他的添加物氣體,例如氧氣、或空氣、或其他可釋出 含氧物質或含氧化合物至有毒氣體中的添加物氣體。或 者,亦可添加氮氣。為減低諸如CO之類不欲求產物的 量’較好是添加諸如02和/或空氣之類的氣體。在另一 實施例中,添加了包含氧氣和/或氫氣之類的添加物到排 第29頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 x 297公釐) 553761 A7 五、發明說明( 出氣體流100中,以產生諸如HF、c〇F2之類的產物; 同樣的,C〇F2亦是可溶於水的。亦可使用能與有毒氣體 反應以達成緩減目的之其他添加物。 下游的加熱系統,例如一加熱器240,可將通道210 中的排出氣體10 0及添加物,加熱至可促進其於催化性 反應器250中進行催化反應以緩減有毒氰體含量的溫 度。此已加熱的氣流100通過催化性反應器25〇後,可 降低氣流中的有毒氣體含量。在一態樣下,排出氣體1〇〇 係被加熱至約700°C的溫度以破壞PFC氣體。如第5a及 5b圖所示’加熱器240具有一入口 241及一出口 242, 並可包含從橫向往内延伸的線圈243或縱向往内延伸的 線圈244。排出氣體可直接通過線圈243、244的上方。 熱則經由對流方式從線圈2 4 3、2 4 4傳遞到排出氣體1 〇 〇, 再經由傳導來加熱排出氣體1 〇 〇。線圈溫度維持在約8 〇 〇 C至約870°C間。如此可使排出氣體從入口 24 1到出口 242 間的溫度差約介於200°C至25(TC間。為使催化性緩減系 統2 00中的PFC氣體的緩減效應達到最佳,最好的溫度 約為70 0°C。可使用一系列、延著通道210上排列的數個 加熱器240,將排出氣體1〇〇的溫度提高到約700°C ;或 是將這數個延著通道210上排列的加熱器240串連成一 個迴路,並讓排出氣體1〇〇在其中循環數次來提高其溫 度到約700°C。 通過催化性反應器250中的催化性表面257後,可將 已經緩減的排出氣體1 0 1在其被潔淨排放前,先行冷卻 第30頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 裝---- 訂--------- 經濟部智慧財產局員工消費合作社印製 經濟部智慧財產局員工消費合作社印製 553761 A7 ________________ B7 五、發明說明() 降溫。在一實施例中,冷卻系統260包含一流體冷卻系 統,例如冷水悴熄系統,其係藉由噴灑在水來降低已經 緩減的排出氣體1 0 1的溫度。或者亦可使用其他諸如冷 凍系統之類的冷卻系統。 可將已經緩減的排出氣體1 0 1引入一後潔淨室270中, 後潔淨室270具有一可將已經緩減的排出氧體1〇1溶於 一溶劑内的反應器。可用於此後潔淨室之溶劑,一般視 已缓減氣體中的副產品型態而定。舉例來說,可將諸如 HF或HC1這類的酸性副產物,溶於水中形成較易處理的 酸性溶液後再丟棄。 需知諸如HF類的酸性副產物可能會在催化性緩減系 統2 00形成。存在於排出氣體1〇〇、1〇1中的HF因有劇 毒且處理困難,因此會操作員應儘量避免接觸。此外,HF 的腐蝕性相當高,特別是在高溫及水蒸氣或氧氣存在下。 已知以鎳為底製作而成的合金,例如西維吉尼亞州,杭 丁 頓市,Inco 公司販賣的 Inconel 600TM 或 Inconel 625 TM 就可提供催化性緩減系統200極佳的抗腐蝕性,且其很 容易被密封,因以可防止HF由系統逸散至環境中。在此 實施例中,可將加熱器氣體入口 240焊接在催化性反應 器250上,或以其他永久固定方式將其固定,以防止諸 如HF這類的有毒氣體逸散至環境中。 第6圖示出此催化性緩減系統200之另一實施例。第 6圖的實施例包含一通道2 1 0、空氣系統2 1 5、添加物氣 體供應室220、加熱器240、催化性反應器250、冷卻單 第31頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -I I I 1 I------·1111111 ^« — — — — — 1 — I . (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 五、發明說明() 元260及一潔淨室270。此外’第6圖的實施例還使用 了一個能在該排出氣體於催化性反應器250中接受處理 前來處理該排出氣體的一個前潔淨室23①。此前潔淨室, 如第7圖所示,包含一個可接受來自通道之排出氣體100 的入口 231,及出口 232,以提供此前潔淨室之排出氣體 1 0 0至此催化性缓減系統2 0 0的其他部分:去。一或多個 水噴嘴233延伸進入前潔淨室反應器234中,並喷水於 排出氣體1 00上。該前潔淨室包含一個過濾系統23 5及 一個閥236,以維持内含水及反應產物之儲存槽237内 的壓力。 經濟部智慧財產局員工消費合作社印製 前潔淨室230的目的,是為了能將添加物加至添加物 氣體供應室中。該前潔淨室230亦可被用來在排出氣體 100被引入催化性反應器250之前來處理該排出氣體 100,並將其中可能會傷害催化性反應器250或降低其效 用的氣體或特定物質加以移除。舉例來說,當排出氣體 100中存在有SiF4時,此SiF4可能會將催化劑去活或因 水份而被分解並於催化劑上形成矽沉積物^ SiF4蒸氣通 常會在室25之氧化蝕刻過程中形成。此前潔淨室230與 S1F *及一諸如水之類的潔淨氣流反應後,可降低其在排 出氣體100中的含量'。一般認為水和SiF4蒸氣的反應係 經由如下的反應式進行:553761 V. Description of the invention () Ceramic or metal structures made of chemical substances or structures that can support fine particle catalysts, granular foam, or catalytic reactor 250 or the coatings on their walls. For example, the catalytic surface 257 may include a surface that supports a morphology. The support structure includes at least a honeycomb component with catalyst embedded therein to form a high surface area member 255. When the exhaust gas 100 enters from the inlet 251 When passing through this high surface area, the yak 255 passes above and then exits through the exit 2 5 2. The catalytic surface 2 5 7 may also be a structure that already contains a ceramic substance such as cordierite, Al203, aluminum silicate, mullite, silicided carbon, nitrogen silicide, zeolite, etc .; or may include a structure such as Zr02, Al2 〇3, Ti02 or a combination thereof or other coatings with catalytic properties and the like. This catalytic surface 257 may also be embedded in materials such as Pt, Pd, Rh, Cu, Ni, Co, Ag, Mo, W, V, La, or a combination thereof or other known substances that enhance catalytic activity. The reduced gas stream 1 0 1 leaving the catalytic reactor is already very safe and can be discharged directly or discarded after simple processing. Passing the exhaust gas 100 over the catalytic surface 257 shows that the activation energy of this slowdown reaction has been reduced, so the reaction rate can be increased. For example, by using a suitable catalyst surface, the activation energy required to decompose CF4 can be reduced by about 135 Kj / mol. In another embodiment, the activation energy of C2F6 can be reduced by about 98 Kj / mol. The minimum activation energy that allows the reduction of PFC content can also exist at low pressure ', thereby reducing energy consumption and improving reaction efficiency. Figure 3 shows the relationship between the three types of PFC gas and temperature in various temperature ranges. These three gases are CF 4, C 2 F 6 and C 3 F 8 are the exhaust gas 100 and the additives pass through the catalytic surface. The paper size on page 27 above 257 applies to Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page) F «ΛΜ9 ϋ mmmmmm nn n- ^ δ ,, fl oh · .Mmi I a ···· Printed by the Consumers' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 Printed by the Consumers ’Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention (). PFC can be reduced almost completely at temperatures below 700 ° C. Preferably, about 80% to about 100% of these toxic gases including PFC are completely destroyed, more preferably about 90% to about 100% are completely destroyed, and most preferably, about 95% to about 100% are completely destroyed To obtain a sufficiently reduced exhaust gas. All three PFC gases are attenuated at temperatures below 1000 ° C. At a temperature of 800 ° C, a clear mitigation effect is demonstrated. From about 400 ° C to about 800 ° C, the mitigation effects of these three PFC gases also began to increase. From a temperature of about 550 ° C to about 700 ° C, CF4 has been significantly damaged, and at about 600 ° C, the damage ratio has exceeded 95 ° /. . At higher temperatures or reaction temperatures below about 700 ° C, especially at about 700 ° C, the proportion of 'CF4, C2F6, and C3F8 gas is destroyed up to about 95%. Provides higher efficiency and lower energy consumption at lower temperatures. Figure 3 also shows the effective period of the catalyst. Each of these three gases shows the tests performed after processing 1,000, 22,000, and 53,000 substrates, respectively. The similarity of the three curves to each other shows the continuity effect of the catalytic surface 257 over a long period of time. It is expected that after the catalytic tilH has been treated for 100, 000 bases, the milk dragon maintains such a high efficiency ... Therefore, the catalyst and its catalytic surface can be used for at least 6 months. In one aspect, the catalytic reactor 250 is part of a large catalytic mitigation system 200. An example of this catalytic mitigation system is shown in FIG. A duct 210 is tightly coupled to the exhaust system 80 of the chamber 25 so that the exhaust gas 100 containing toxic gases such as PFCs can flow from the chamber 25 into the duct 210. This tube 210 can be transported on page 28. The paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) ϋ i ^ fl 1 I 1 i · ——Hi ϋ · MMmmf a · — 1-.1 1 I —.1 one in ϋ nn 1 · — an n I fl (please read the precautions on the back before filling this page) 553761 A7 B7 V. Description of the invention () Out of gas 100, let it pass through this catalytic retardation Less system 200. The catalytic mitigation system may generally include a flow control system 2 1 5, an additive gas supply chamber 220, a heater 240, a catalytic reactor 250, a cooling system 260, and a rear clean room. 270. The flow control system 2 1 5 includes a valve 2 1 7 located in an inlet pipe 2 1 8. The inlet pipe 218 is in communication with the pipe 210 to allow air or other non-reactive gas to be introduced into the exhaust gas stream 1 0 0 'In addition, the pressure in the catheter 210 can be adjusted. In addition, it may be necessary to provide pressure control of the exhaust gas stream 100 to provide sufficient gas flow through the catalytic mitigation system 200. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs (please read the precautions on the back before filling this page). You can also use the flow control system 215, the additive gas supply room 220 and / or the rear clean room 230. Introduce appropriate additive gas streams, such as H20 and 02, into the exhaust gas stream 100. For example, a suitable additive gas supply source 220 includes a channel 223, which is controlled by a valve 224 to communicate with the additive gas or fluid supply source 222. Appropriate additives are added which can react with toxic gases in the exhaust gas stream 100 to achieve the purpose of mitigation. For example, in one embodiment, PFCs can be decomposed by adding about 0.1% to about 10% water, more preferably about 3% water, to the exhaust gas stream 100. Other additive gases can also be added, such as oxygen, or air, or other additive gases that can release oxygen-containing substances or oxygen-containing compounds into toxic gases. Alternatively, nitrogen may be added. To reduce the amount of undesired products such as CO ', it is preferred to add a gas such as 02 and / or air. In another embodiment, an additive containing oxygen and / or hydrogen is added to the page. The paper size is applicable to Chinese National Standard (CNS) A4 specification (21 × 297 mm) 553761 A7 V. Invention Explanation (In the gas stream 100, to produce products such as HF, coF2; Similarly, COF2 is also soluble in water. Others that can react with toxic gases to achieve the purpose of mitigation Additives A downstream heating system, such as a heater 240, can heat the exhaust gas 100 and additives in the channel 210 to promote the catalytic reaction in the catalytic reactor 250 to reduce the content of toxic cyanide The temperature of the heated gas stream 100 after passing through the catalytic reactor 25 can reduce the toxic gas content in the gas stream. In one aspect, the exhaust gas 100 is heated to a temperature of about 700 ° C to destroy PFC gas. As shown in Figures 5a and 5b, the heater 240 has an inlet 241 and an outlet 242, and may include a coil 243 extending laterally inward or a coil 244 extending longitudinally inward. The exhaust gas may pass directly through the coil 243, 244 up The heat is transferred from the coils 2 4 3, 2 4 4 to the exhaust gas 100 by convection, and the exhaust gas is heated by conduction. The coil temperature is maintained between about 800 ° C and about 870 ° C. In this way, the temperature difference of the exhaust gas from the inlet 24 1 to the outlet 242 is about 200 ° C to 25 ° C. In order to achieve the best mitigation effect of the PFC gas in the catalytic mitigation system 2000, The best temperature is about 70 ° C. A series of heaters 240 arranged along the channel 210 can be used to increase the temperature of the exhaust gas 100 to about 700 ° C; or these several The heaters 240 arranged along the channel 210 are connected in series into a loop, and the exhaust gas 100 is circulated several times to raise its temperature to about 700 ° C. Through the catalytic surface 257 in the catalytic reactor 250 After that, the exhaust gas that has been reduced can be cooled down before it is cleanly discharged. Page 30 This paper applies Chinese National Standard (CNS) A4 (210 X 297 mm). (Please read the back (Please fill in this page for matters needing attention) Packing ---- Order --------- Member of Intellectual Property Bureau, Ministry of Economic Affairs Printed by the Consumer Cooperatives Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economy 553761 A7 ________________ B7 V. Description of the invention () Cooling down. In one embodiment, the cooling system 260 includes a fluid cooling system, such as a cold water quenching system, which is borrowed Spray the water to reduce the temperature of the exhaust gas 1 0 1 that has been reduced. Or you can use other cooling systems such as a refrigeration system. The exhaust gas 1 0 1 that has been reduced can be introduced into a rear clean room 270 The rear clean room 270 has a reactor capable of dissolving the exhausted oxygen gas 101 which has been reduced, in a solvent. Solvents that can be used in subsequent clean rooms generally depend on the type of by-products that have been mitigated. For example, acidic by-products such as HF or HC1 can be dissolved in water to form an easier-to-handle acidic solution and discarded. It should be noted that acidic by-products such as HF may be formed in the catalytic mitigation system 2000. The HF present in the exhaust gases 100 and 101 is highly toxic and difficult to handle, so operators should try to avoid contact. In addition, HF is quite corrosive, especially at high temperatures and in the presence of water vapor or oxygen. Known alloys made of nickel, such as Inconel 600TM or Inconel 625 TM sold by Inco Corporation, Huntington, West Virginia, provide excellent corrosion resistance for catalytic reduction systems 200 And it can be easily sealed because it can prevent HF from escaping from the system to the environment. In this embodiment, the heater gas inlet 240 may be welded to the catalytic reactor 250, or it may be fixed by other permanent fixing methods to prevent toxic gases such as HF from escaping into the environment. FIG. 6 illustrates another embodiment of the catalytic mitigation system 200. The embodiment in FIG. 6 includes a channel 2 10, an air system 2 1 5, an additive gas supply chamber 220, a heater 240, a catalytic reactor 250, and a cooling sheet. Page 31 This paper applies Chinese national standards (CNS) ) A4 specification (210 X 297 mm) -III 1 I ------ · 1111111 ^ «— — — — — 1 — I. (Please read the precautions on the back before filling this page) 553761 A7 B7 5 Description of the invention () Yuan 260 and a clean room 270. In addition, the embodiment of Fig. 6 uses a front clean room 23① capable of processing the exhaust gas before the exhaust gas is processed in the catalytic reactor 250. The previous clean room, as shown in FIG. 7, includes an inlet 231 and an outlet 232 that can accept the exhaust gas 100 from the channel to provide the exhaust gas from the previous clean room 100 to the catalytic mitigation system 2 0 0 Other parts: go. One or more water nozzles 233 extend into the front clean room reactor 234 and spray water on the exhaust gas 100. The front clean room contains a filtration system 23 5 and a valve 236 to maintain the pressure in a storage tank 237 containing water and reaction products. The purpose of printing the former clean room 230 by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs is to enable the addition of additives to the additive gas supply room. The front clean room 230 may also be used to treat the exhaust gas 100 before the exhaust gas 100 is introduced into the catalytic reactor 250, and to apply a gas or specific substance therein that may harm the catalytic reactor 250 or reduce its effectiveness. Removed. For example, when SiF4 is present in the exhaust gas 100, this SiF4 may deactivate the catalyst or be decomposed due to moisture and form silicon deposits on the catalyst ^ SiF4 vapor is usually in the oxidation etching process of chamber 25 form. Previously, after the clean room 230 had reacted with S1F * and a clean air stream such as water, its content in the exhaust gas 100 could be reduced '. It is generally believed that the reaction system of water and SiF4 vapor proceeds through the following reaction formula:

< H20 + SiF4 — Si02 + 4 HF 所得的Si〇2及HF產物可輕易地由排出氣體loo中被移 除 HF可各於水,而Si02則可經由過濾移除《除掉y 第32頁 經濟部智慧財產局員工消費合作社印製 553761 A7 ___Β7___ 五、發明說明() 可延長催化性及器25JL中的催化劑有蛛期。前潔淨室 230亦可容許H20或其他添加物氣體以足夠的量被添加 至排出氣體1〇〇中以降低催化性反應器250中有毒氣體 的含量。 如上述,去除SiF4對延長催化性反應器250中的催化 劑有效期相當重要。P此,在一實施例中:,該前潔淨室 230的體積大小及狀況需足夠將排出氣體中所有的SiF4 都完全去除。最好是能將至少9 0%的SiF4去除。當約99% 以上,更好是約99· 9%以上的SiF4被去除時,催化劑的 壽命可延至最長。 第8圖示出該催化性緩減系統的另一實施例。在此實 施例中,系統2 0 0包含一交錯流動的熱交換器3 6 0,其 係包含一排出氣體入口 361、一排出氣體出口 362、一已 缓減之排出氣流入口 3 7 1、及一已緩減之排出氣流出口 372。冷卻、新鮮的与> 出氣體1 00及已加熱、緩減之排出 氣體101流過彼此並進行熱交換。此可提高冷卻、新鮮 的排出氣體1 〇〇之溫度,並降低已加熱、緩減之排出氣 體101的溫度。第9圖示出此種可容許氣流交錯流動之 熱交換器360。排出氣體100由入口 361進入熱交換器360 中並被分散至多個氣體通道365。已緩減之排出氣流101 由入口 371進入熱交換器360中並被分散至多個氣體通 道3 75中,這些氣體通道375係緊鄰著氣體通道365且 能將熱能傳送至氣體通道365。已緩減之排出氣流101 將熱能傳給排出氣體通道365,讓排出氣體100之溫度 第33頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -----------------\ 553761 A7 ----- B7 五、發明說明() 與已緩減之排出氣流1 〇丨之溫度相近。熱交換器3 60外 可圍繞著隔熱物質378,以防止熱能散失至大氣中,並 提高熱交換器360的效率。熱交換器360較好是由諸如 Inconel之類可抵抗HF、且很容易被密封的鎳合金製成。 熱交換器可改善催化性緩減系統200的效率並降低能 源消耗率。熱交換器360的效率高達70%。:熱交換器360 可降低達到欲求溫度及降低裝置能源耗損率所需用之加 熱器240(通過加熱器240之次數)的數目。 催化性緩減系統200亦可如第1 〇圖所示,接受來自室 25a至25d數個室所排出之氣流。數室25a-25d可一起操 作或個別分開操作。室25a-25d可處理排出氣流100a-10 0d,其係被分別引入和通道210相通的通道210a-210d, 以便於催化性緩減系統2 0 0中進行處理。空氣入口系統 2 1 5可用來確保有足夠的壓力及氣流流入催化性緩減系 統200中。 如第11圖所示,所有的組件及其溫度都需適當的控 制,以確保包括PFCs在内之有毒氣體可獲得最佳緩減效 果,且適當地發揮了催化性緩減系統200的功能。在通 過催化性緩減系統200後,有毒氣體含量已幾乎被完全 缓減的排出氣體,才能被排放至環境中,而且不會造成 安全上的憂慮。在第Π圖實施例中,該催化性缓減系統 2 0 0包含一個内含控制器4 0 0在内的控制及監測系統。 此外,壓力偵測盏P,及溫度計τ,亦可如第11圖所示 被置於催化性緩減系統200中。此外,可將氣體分析探 第34頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁) ί裝 ---訂--------- 經濟部智慧財產局員工消費合作社印製 553761 A7< H20 + SiF4 — Si02 + 4 HF The SiO2 and HF products can be easily removed from the exhaust gas loo. HF can be separated from water, and Si02 can be removed by filtration. Printed by the Employees' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 ___ Β7 ___ V. Description of the invention () The catalyst in the 25JL catalyst can be prolonged to have a spider period. The front clean room 230 may also allow H20 or other additive gases to be added to the exhaust gas 100 in a sufficient amount to reduce the content of toxic gases in the catalytic reactor 250. As described above, the removal of SiF4 is important to extend the life of the catalyst in the catalytic reactor 250. In this embodiment, the size and condition of the front clean room 230 need to be sufficient to completely remove all SiF4 in the exhaust gas. It is best to remove at least 90% of SiF4. When about 99% or more of SiF4 is removed, more preferably about 99.9% or more, the catalyst life can be extended to the longest. FIG. 8 shows another embodiment of the catalytic mitigation system. In this embodiment, the system 200 includes a staggered heat exchanger 36, which includes an exhaust gas inlet 361, an exhaust gas outlet 362, a reduced exhaust gas inlet 3 71, and A reduced exhaust air outlet 372. The cooled, fresh and > outgoing gas 100 and the heated, slowed exhaust gas 101 flow through each other and exchange heat. This can increase the temperature of the cooled, fresh exhaust gas by 1000, and reduce the temperature of the heated, slowed exhaust gas 101. Fig. 9 shows such a heat exchanger 360 which allows airflow to stagger. The exhaust gas 100 enters the heat exchanger 360 from the inlet 361 and is dispersed into a plurality of gas channels 365. The reduced exhaust gas flow 101 enters the heat exchanger 360 through the inlet 371 and is dispersed into a plurality of gas channels 3 75. These gas channels 375 are adjacent to the gas channel 365 and can transfer heat energy to the gas channel 365. The reduced exhaust airflow 101 transmits heat energy to the exhaust gas channel 365, and allows the temperature of the exhaust gas 100. Page 33 This paper applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) (Please read the back Please fill in this page again for attention) ----------------- \ 553761 A7 ----- B7 V. Description of the invention () and the reduced exhaust airflow 1 〇 丨 of The temperature is similar. The heat exchanger 3 60 may be surrounded by a heat insulating material 378 to prevent heat energy from being dissipated into the atmosphere and improve the efficiency of the heat exchanger 360. The heat exchanger 360 is preferably made of a nickel alloy such as Inconel which is resistant to HF and is easily sealed. The heat exchanger can improve the efficiency of the catalytic mitigation system 200 and reduce the energy consumption rate. The efficiency of the heat exchanger 360 is as high as 70%. : The heat exchanger 360 can reduce the number of heaters 240 (the number of times that the heater 240 passes) required to reach the desired temperature and reduce the energy consumption rate of the device. The catalytic mitigation system 200 may also receive airflows from several chambers 25a to 25d as shown in FIG. The counting rooms 25a-25d can be operated together or separately. The chambers 25a-25d can process the exhaust gas flow 100a-10d, which are respectively introduced into the channels 210a-210d communicating with the channel 210 to facilitate the processing in the catalytic mitigation system 2000. The air inlet system 2 1 5 can be used to ensure that sufficient pressure and airflow flows into the catalytic mitigation system 200. As shown in Figure 11, all components and their temperatures need to be properly controlled to ensure that toxic gases, including PFCs, have the best mitigation effect and that the catalytic mitigation system 200 functions properly. After passing the catalytic mitigation system 200, the exhaust gas whose toxic gas content has been almost completely reduced can be discharged into the environment without causing safety concerns. In the embodiment of FIG. 2, the catalytic mitigation system 2000 includes a control and monitoring system including a controller 400. In addition, the pressure detection lamp P and the thermometer τ can also be placed in the catalytic mitigation system 200 as shown in FIG. 11. In addition, the gas analysis probe on page 34 can be applied to the Chinese National Standard (CNS) A4 specification (210 X 297 public love) (Please read the precautions on the back before filling this page) ------- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7

五、發明說明() 針405置於已緩減的排出氣流中,較好是在潔淨室 之後’以分析已緩減的排出氣流1〇1之氣體含量。氣體 分析探針405係與氣體分析器4 1 〇相通。氣體分析器4 i 〇 可提供氣體分4斥數據給控制器400。另一额外的氣體分 析探針405—則可置於排出氣流中,較好是位於前潔淨室 230之前,以-決定排出氣流1〇〇中是否含有以匕。氣體 分析器4 1 0包含任何市面上販賣的氣體分析器,例如, 加州太陽谷史^丹佛研究中心(Standf〇rd Researcli Systems,V. Description of the invention () The needle 405 is placed in the reduced exhaust gas stream, preferably after the clean room 'to analyze the gas content of the reduced exhaust gas stream 101. The gas analysis probe 405 is in communication with the gas analyzer 41. The gas analyzer 4 i 〇 can provide gas separation data to the controller 400. Another additional gas analysis probe 405 may be placed in the exhaust gas stream, preferably in front of the front clean room 230, to determine whether the exhaust gas stream 100 contains daggers. The gas analyzer 410 includes any commercially available gas analyzer, such as the Sun Valley History of California, Denver Research Center (Standford Researcli Systems,

Sunnyvale,California)所製造販賣的 rGA 300 系統。一 壓力監測器4:20及一溫度監測器43〇則係分別與壓力偵 測器及溫度〜計相連。該壓力監測器420及溫度監測器43〇 可提供關於催池性緩減系統200之壓力及溫度的數據給 控制器400。增制器400可依據所監控的數據來控制並 調整催化性緩嘴系統200之操條件及室25中的製程。 操作時,«:禮分析器4 1 0可連續監控由催化性緩減系 統200釋出之排出氣體内有毒氣體含量,並提供一連續 的輸出訊號,:或是當排出氣體内有毒氣體含量已達安全 排放值時,即。清啟動一安全量輸出訊號。控制器4〇〇包 含一電腦可讀I取的媒體,其係具有電腦可讀取的程式碼 包埋在其中,c並可監控來自氣體分析器的輸出訊號及執 行至少一個下列步驟:調整已加熱之排出氣流的溫 度’例如藉由一組件控制系統44〇來調整加熱器^4(>; (ii) 藉由操作一閥控制系統450來趟整添加物氣體ϋ或組 成分;(iii)調整室25之操作條件;(iv)終本室25中的 第35頁 本紙張尺度朝中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁)Sunnyvale, California). A pressure monitor 4:20 and a temperature monitor 43 are connected to the pressure detector and the temperature gauge respectively. The pressure monitor 420 and the temperature monitor 43 may provide the controller 400 with data about the pressure and temperature of the catalyzing mitigation system 200. The controller 400 can control and adjust the operating conditions of the catalytic mouthpiece system 200 and the process in the chamber 25 based on the monitored data. During operation, «: Ri Analyzer 4 1 0 can continuously monitor the toxic gas content in the exhaust gas released by the catalytic mitigation system 200 and provide a continuous output signal, or when the toxic gas content in the exhaust gas has been When the safe emission value is reached, that is. Clear start a safe quantity output signal. The controller 400 includes a computer-readable medium, which has a computer-readable code embedded therein, and can monitor the output signal from the gas analyzer and perform at least one of the following steps: The temperature of the heated exhaust gas stream ', for example, adjusts the heater by a component control system 440 (>; (ii) adjusts the additive gas ϋ or composition by operating a valve control system 450; (iii) ) Adjust the operating conditions of the chamber 25; (iv) page 35 of the final chamber 25. The paper size is facing the Chinese National Standard (CNS) A4 specification (210 X 297 public love). page)

經濟部智慧財產局員工消費合作社印製 553761 A7Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7

經濟部智慧財產局員工消費合作社印製 五、發明說明() 一項製程;(W藉由閥控制系統45〇打開分散閥48〇並 關閉緩減"0,可將纟25之排出氣流導離催化性緩減 系統200 ;及(vi)當排出氣流中的有毒氣體含量過高或 是催化性緩減系統200操作不良時,可透過監視器46〇 或另一獨立的警報器提供一警告訊號給操作員。當離開 則潔淨室2 3 0之排出氣流1 〇 〇中含有不欲,求產物時,也 可採取上述類似的步驟。上述步驟(v)具有一些優點,因 為它容許催化性緩減系統200可在無需關掉室25之基材 處理製程的情況下或是當其無法操作時,可被週期性地 更換。 此外,控制器400係被設計成可連續監控催化性緩減 系統200内的壓力及其所產生的排虫氣流。當特定的壓 力讀值超過或低於一可接受值時,即可藉由閥控制系統 450或組件控制系統440來打_開或關閉閥,以改變排氣 蓼置(exhaust blower)28〇來調基塵力。此排氣裝置280 可以是一個w氣幫浦或是一個喉型裝置(venturi device),或是其類似物。控制器400可連績監控催化性 緩減系統200内的H以—維持排出氣流i 00、1〇1的溫度 在最佳狀況下。控制器400亦可調整加熱器240的溫度, 或是冷卻系統中所需用來悴熄溫度之冷水量。 控制器400可操作室25及催化性緩減系統200,並可 包含一可控制一電腦的電腦程式碼產物,其係包含一或 多個連接至一記憶體系統及周邊控制組件的中央處理器 (CPUs),例如一個由加州,聖塔拉市,英特爾公司製造 第36頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------------裝--------訂---I----- (請先閱讀背面之注意事項再填寫本頁) 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 販賣的奔騰(Pentium)微處理器。控制器400的CPUs也 可包含ASIC(特定應用積體電路,application specific integrated circuits),其係可操作室25或該催化性緩減系 統2 00之特定組件。位於操作員及控制器400間的界面 401,可以是一個CRT監視器及筆尖處具有光感應器的 一種光筆。當要選擇一個特定螢幕或功能:時,操作員可 碰觸該CRT螢幕上的一個指定區域並以筆來按下一個按 钮。被碰觸的區域顏色會改變,或者會顯示出一個新的 選單或是螢幕會顯示一些訊息來確認由光筆及CRT監视 器所傳遞的訊息。但亦可以諸如鍵盤、滑鼠或通訊指示 裝置(pointing communication device)來與控制器 4〇〇 溝 通0 電腦程式編碼可操作該CPUs,且可以諸如組合語言、 C、C + +或pascal這類傳統電腦程式語言來書寫並命令其 他電腦裝置。以傳統文件編輯器將適當的程式編碼放到 單一檔案中,或多個檔案中,並將其儲存或包埋於電腦 可使用的媒體内,例如電腦記憶體系統β如果所載入的 程式碼是屬於高階語言’這些程式碼就會由編譯程式碼 (complier code)進行編譯,這些編譯程式原就與已編譯好 的視窗資料及例行之標的程式相連。在執行這些相連的 標的程式時,系統使用者需先叫出這虺 —加的程式,讓電 腦將這些程式載入記憶體中,以執行欲求 J工作或程式。 電腦程式碼包含一或多組電腦指令,其 升你可顯示時間、 製程氣體組成分、製程室壓及溫度、製〜 衣租至中的電磁能 第37頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -----------裝--------訂—1------ {請先閱讀背面之注意事項再填寫本頁} 553761 經濟部智慧財產局員工消費合作社印製 A7 B7__ 五、發明說明() 源咼低、接受器位置及製程室25中的其它參數。電腦程 式指令組亦可控制催化性緩減系統2〇〇的操作、被引入 系統中添加物氣體之組成分及流量、及催化性緩減系統 200的警告訊號及其他安全操作模式或是控制被一預設 之有毒氣體濃度所啟動之製程室25、或控制排出氣體中 微量的毒性氣體含量。 . 較佳的電腦程式碼係如第1 2圖所示,其係包含數組程 式碼指令,例如製程選擇器及製程程式碼475,其係可 供操作員進入並壤擇一項製程配單,之後於所選定的製 私至25中來操作並執行該項製程配單;製程室管理程式 碼480則是可操作並管理製程室25中之犁隹獻件的優先 順^序;排出氣體緩減程式碼485則是可操作催化性緩減 系統200。雖然在描述上似乎是一組不同的工作是由個 別的程式來控制,但需知可將這些程式集合起來,或是 將一組程式碼所控制的工作與另一組程式碼組合起來, 來達到欲求效果。因此,控制器4〇〇及此所述之程式碼 不應僅限於實施例中所提到的,可執行相同動作達到相 同功能的其他組程式碼或電腦指令,亦屬本發明之範轉。 操作時’使用者以影像界面端子4〇丨輸入一組製程設 定及製程室號碼到製程選擇程式碼475中。製程設定係 由可執行室25中特定製程之製程組參數所組成,且是由 已設定好的設定數目來代表。製程選擇程式碼475會鑑 別出一欲求的製程室,及可操作該室以進行欲求製程之 欲求的製程組參數。製程組參數包括製程條件、例如製 第38頁 本紙張尺度適用中國國家標準(CNS)A4規^297公爱)---— ϋ n imm n ϋ I i 一一 ϋ n -ϋ an ϋ ϋ 1 I (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 五、發明說明( 程組氣體組成份及流诘, 次泥逮,製程室溫度及壓力,諸如微或 RF偏壓電力及磁場電力等之電漿參數,冷卻氣體壓力, 及製程室壁溫度。 項 # 製程選擇程式碼475可藉由將特定製程設定參數傳遞 給負責控制多個不同製程室25a_25d内製程操作之製程 至g理程式碼480來執行此製程設定。舉.例來說,製程 室管理程式碼彻包含了可於室25中㈣基材或於基材 上,儿積金屬 < 程式碼。製程室管理程式碼48〇控制各製 程室中組件程式碼指令設定之執行,以控制製程室中各 組件的操作。製程室組件控制程式碼的例子包含可設定 基材30位置《指令設定’其係可控制負貴將基材3〇裝 載上支架40或由支架4〇上卸下的機械手臂。製程氣體 控制之指令設定係可控制供應至室25之製程氣體的組成 刀及成速壓力控制之指令設定則是可設定節氣閥應 打開的大小’電漿控制之指令設定則控制電聚啟動器6〇 之電力高低。操作時’製程室管理程式碼48()會依所欲 執m特疋製程’來選擇性地叫出製程室中的組件程式 碼指令設^,將各組件程式碼指令設定排序,監控各組 :程式碼指令設定之操作,依照欲執行之製程參數來決 定應執行哪一個組件,並依所監控及決定之步驟的反應 來執行一組件程式碼指令設定。 | 排出氣體緩減程式碼485包含程式碼指令設定,其係 可監控排出氣流中預設之有毒氣體濃度,並因應排出氣 流中有毒氣體含量/組成分來操作製程室或氣體處理組 第39頁 本紙張尺度^中國國家標準⑽x 297"i¥ 553761 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明() 件。排出氣體緩減程式碼485之一較佳的結構係包本 氣體分析程式碼49〇,其係可接受來自氣體分析探針。*二 所輸出之關於有毒氣體含量/組成分(或安全排放訊幻的 訊號,並將此輸出訊號儲存於以其他程式碼指令設定做 定期監控所製成的排出氣流組成分表格中;⑴)壓:控制 程式碼491係可操作閥控制系統45。和/或:組件控制:統 440,以因應輸出訊號來控制催化性緩減系統的壓力及流 速;(iii)添加物氣體程式碼492可控制閥控制系統; (iv)/ja度控制程式碼493可控制排出氣流及I"之溫 度,(V)安全操作程式碼494可監控排出氣流中有毒氣體 之排量,並調整室25和/或催化性緩減系統2〇〇之操作 以降低或幾乎完全去除所排放之有毒氣體。 氣體分析程式碼490可監控氣體分析器41〇所測出之 激能氣體中有毒氣體含量或組成分,並可接收來自氣體 分析探針405關於有毒氣體含量或組成分的輸出訊號(或 安全排放訊號)。氣體分析程式碼49〇會將此輸出訊號儲 存於以其他程式碼指令設定做定期監控所製成的排出氣 流組成分表格中。或是,當排出氣體中有毒氣體含量超 過預設之操作安全值時,氣體分析程式碼49〇會將一安 全排放訊號輸至其他程式碼指令設定中。氣體分析程式 碼490也可以被集成於氣體分析器41〇上,而非控制器 400上。氣體分析程式碼490可如上述,藉由調整閥控 制系統4 5 0和/或組件控制系統4 4 〇來進行調整。 壓力控制程式碼49 1係包括可因應壓力偵測器及壓力 私紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 裝--------訂--------- (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( 監視器420之輸出訊號,來調整催化性緩減系統壓力的 程式碼指令設定。當壓力降至或升高超過一預設值時, 壓力控制程式碼即可藉由閥控制系統45〇來操控闕或藉 由組件控制系統440來操作排氣裝置280,以製造出必 須的壓r力調整。 添加物氣體程式碼492包括藉由閥控制:系統45〇來操 控氣體、空氣和或水分供給以控制排出氣體組成分之程 式碼指令設定。一般來說,添加物氣體程式碼492可因 應控制器400所傳遞來的訊號而調整一或多個添加物氣 體閥之開口大小。當偵測到有毒氣體含量上升時,添加 物氣體程式碼492會增加進入催化性緩減系統200之反 應氣體流速以進一步降低該排出氣體中有毒氣體的含 量 ° 溫度控制程式碼493包括可因應溫.度讀值以維持排出 氣流100及1〇1之溫度在一可破壞有毒氣體的最佳溫度 範圍内,其係藉由組件控制系統440來控制加熱器240 或冷卻系統260之溫度來達成。 安全操作程式碼494係與其他程式碼指令設定一起操 作’以調整與排出氣流中有毒氣體含量相關之製程室組 件或氣體處理設備之操作,來降低或排除所排放之有毒 氣體含量。舉例來說,可將安全操作程式碼494設定成 在一偵測出排出氣流中有毒氣體含量超過預設值,或是 排出氣流中存在有極微量之毒性氣體時,即可關掉製程 室25。典型情況是,當以毒性氣體來處理基材時,一般 第頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ------------·裝------ (請先閱讀背面之注意事項再填寫本頁) 訂--------- 553761 A7 五、發明說明( 傳統組態中,氣體分散器72上之每一氣體供應管線都會 有數個可元全關閉的安全氣閥。當排出氣流中有毒氣蹲 含量超過預設值時,安全操作程式碼494即可提供一個 啟動訊號給製程室管理程式碼480中的製程氣體控制指 令設定,以關閉安全氣閥。或者,安全操作程式碼494 可將排出氣流導至如上述之排氣口或另一:氣體緩減系統 中。相反的,當安全操作程式碼494從氣體分析器41〇 上收到一個零或低於安全排放值的輸出訊號時,程式會 送出一個控訊號,指示製程室管理程式碼48〇以現行模 式繼續執行製程室25之操作,同時並指示排出氣體緩減 程式碼485以其現行模式繼績執行催化性緩減系統2〇〇 之操作。 操作時,安全操作程式碼494會重複讀取最近排出氣 流組成分表格中的最新資料,並與可控制製程室25内流 量高低之流量控制器所送出的訊號相比,之後視需求送 出指令來調節製程氣體流量,以減低或完全去除排出氣 流中的有毒氣體。或者,當安全操作程式碼494收到一 個安全輸出值訊號時,亦可來執行這些操作。典型的是, 程式係被設定成當排出氣流中的有毒氣體含量超過一預 值時(例如,當有毒氣體濃度介於約〇 1 %至約丨〇 。之間 時),即會被啟動進行操作。 在另一實施例中,安全操作程式碼494亦可啟動一警 鈐或一指示器,例如一種LED光,以顯示排出氣流中有 毒氣體含量已到達一危險值;或提供一種計量顯示,例 (請先閲讀背面之注意事項再填寫本頁) ^--------^---------. 經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 553761 五、發明說明() 如一種可隨著排出氣流中 (請先閱讀背面之注意事項再填寫本頁) 1每軋體《即時含量而顯示的 :時影像圖形,以供操作員進行監控。此安全操作模式 讓操作員可監控並預防有毒氣體被意外逸散至環境中。 同樣的訊號也可用來維持製程設備25處於一種未運作模 式中’或是當偵測到異常情況時啟動安全氣闕。在這種 模式下,安全操作程式碼494可操作製程:室及氣體處理 設備,以提供一種不會危害環境的安全設備。 前潔淨室 前潔淨室230的另一實施例示於第13圖中。前潔淨室 230包括一個可接受排出氣流1〇〇及並讓此排出氣流ι〇〇 與潔淨液一起反應的反應器23丨。一個水解管柱 (hydrolyzer column)310或通道310可接受來自通道21〇 經濟部智慧財產局員工消費合作社印製 之排出氣流100。該排出氣流丨〇〇已事先與一添加物互 相混合。該水解管柱3 10為排出氣流1 〇〇提供了 一含水 的或潮濕的環境3 1 2。哪開始曝露在水氣或其他潔淨液 下’會使排出氣流1 00中的欲求組成分(例如,SiF4)開始 分解。水解管柱310讓這些大顆粒物質在阻塞或沉積於 前潔淨室230中後續處理管柱内前即有機會被去除。一 開始的水分曝露,加上後續直立式的處理管柱及往下流 動的排出氣流10 0,讓這些大顆粒物質可完全播去除。 一位於潔淨液分散器或其他潔淨液來源下游之水解管柱 或通道並無法有效地將諸如SiF4這類物質完全去除。可 於入口 317處或靠近該入口 317處來設立一潔淨氣體供 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 B7 五、發明說明( 經濟部智慧財產局員工消費合作社印製 應源3 1 5,以便引入諸如空 、 虱軋或虱軋之類的潔淨 …來>“絮系統和或防止上游的物質水解。該入口可 以是一喉型入口。 之後排出氣流1 〇 〇通過第一潔漆 、币 深羊通道或通道32(^一 嘴嘴3 22可將來自供應源325之諸 <请如水 < 類的潔淨液分 散至排出氣流100中。如所示的m分㈣μ 氣流相反方向噴漢出來的水。,,和氣流相反方向,,意 ^疋扣至ν部为氣流之流動方向,係與該氣體整體流 動方向相反。這種安排可藉助重力來幫助水流動,並有 助於諸如二氧化矽及HF這類反應產物被傳送至儲存槽 350中。管柱3 20亦可選擇性地提供一種可增加表面積 《物質327,例如體積大小不同之塑膠或陶製小粒,如ρν〇 球’以增加管柱中水/氣體的接觸表面積,並進而幫助Sih 的分解反應。亦可設立一個可讓排出氣體1〇〇及反應產 物輕易通過,但可增加表面積之物質327不易通過的平 台328,來容納這些可增加表面積之物質327於第一管 柱320中。 之後排出氣體100會流過通道329到一管柱或通道330 。一喉管(venturi tube)3 3 2可將來自供應源335之諸如 水之類的流體分散至管柱330中。一喷嘴333係位於該 直立式管332末端,以便將水注入管柱中。,,喉型,,一詞 係指一個具有一定體積、喉喻形狀的通道,其係可增加 流過其中之流體的流速並降低其壓力。”注入”一詞係指 潔淨液被從喉管分散出去。本發明之喉管式喷嘴332、333 内 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) ·!1 訂·! # 553761 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( 提供了一個可將水分散成極細小顆粒的開口。如所示的 一種情況,對直徑約1.5英吋的管332而言,該喉管式 喷嘴的開口約介於0.1英吋至丨.4英吋間,較好是約介於 0.25英忖至1.25英忖間,更好是約介於〇·5英忖至丨英 忖間。如所示的一種情況,水流動的方向是與排出氣體 100的流動方向相同。喉型管柱33〇的功能如下:0藉 由產生顆粒提南水/氣體接觸面積來進一步清潔排出氣 體’(ii)藉由來自喉型喷嘴3 33之水的高速撞擊,進一 步將反應產物傳送至儲存槽350中,'«Η)如上述,提供 水之添加物,於催化性反應器中來破壞PFC,及(iy,)產 生負壓藉以有效地提供正聲給排出氣體1〇〇,以補償在 則潔淨A中的壓力耗損。經過前潔淨室後所得之淨壓力 下降值約為0。有時’甚至會得到一個淨壓力增加值。 第14圖為喉管332及喉形喷嘴之一例示性的實施例。舉 例來說’可改良該喉管及開口之相對體積及角度,以達 到欲求之目的。 第二個潔淨管柱或通道340則可接受來自喉形管柱33〇 之排出氣流。弟二個潔淨管柱可包括一個可分散潔淨液 之第二喷嘴342,例如,可將來源345所供應的水,反 方向喷麗入排出氣流100中。第二個潔淨管柱可進 一步包含可增加表面積之物質347及平台348 ,其係與 第一潔淨管拄中可增加表面積之物質327及平台328類 似。第二個潔淨管柱340亦可提供排出氣流1〇〇另一層 次的潔淨效果’且進而將反應產物傳送至儲存槽35〇中。 第45頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) --------^--------1 (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( 除霧器355可位於靠近出口⑴處,以去除排出氣流⑽ 中的水滴。對催化性處理而言,排出氣流1〇〇中的水分 含量最好約纟3%;水滴是不欲求的,因為水滴會攜帶刷 下來的產物顆粒而污染催化性反應器25〇内的催化劑。 除霧器355可去除水滴,並讓欲求的水氣通過。除霧器 3 5 5可包含諸如線網之類的封裝物或網子。· 每一個管柱或通道310、32〇、33〇、34〇係被設計成可 破壞約80〇/〇至約90%的%。因此,如果有兩根管柱卜 且讓排出氣流100通過這兩根管柱,則可除去約696吟至 約99%的SiF4。如果通過3根管柱,則還可將去除比例 提高至約99.2%至約99.9%間。如果通過4根管柱,則去 除比例可被提高至約99.8°/。至約99·99〇/〇間。以EPA第5 方法「從靜態來源測定特定排出物顆粒」來進行定量測 試,這項技術顯示其去除Sib的效率約為99·97%或更好。 顆粒測試結果顯示已處理過的排出氣流丨〇〇中,約8〇% 的顆粒大小均介於約i μπι至2 5μπι。因此,可藉由濾 器359來進一步去除顆粒,例如一種靠近出口 357的hep a ;慮器。hepa遽器359可將未被傳送至错存槽350的反應 產物顆粒幾乎完全除去。hepa濾器對於過濾體積在 13 以上的顆粒特別有效,因此最適合用來去除這些 反應產物。需知前潔淨室23〇内可含任何欲求數目之管 柱。再者’需知「管柱」並不一定需被直立放置,而是 可直互、水平或任何恰當的方向來置放。此外,管柱也 毋需一定得彼此平行。相鄰的管柱可以任何從零度(亦 第46頁 本紙張尺汉週用甲關冢棵準(CNS)A4規格⑽χ撕公董) ------------·裝--------訂i (請先閱讀背面之注意事項再填寫本頁) ^3761Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention () A process; (The valve control system 45 ° opens the dispersion valve 48 ° and closes the mitigation " 0, which can guide the exhaust airflow of 纟 25. Off the catalytic mitigation system 200; and (vi) when the toxic gas content in the exhaust gas flow is too high or the catalytic mitigation system 200 is not operating well, a warning can be provided through the monitor 46 or another independent alarm Signal to the operator. When leaving, the exhaust air stream 100 in the clean room 230 contains undesired products, and similar steps can be taken. The step (v) above has some advantages because it allows for catalytic The mitigation system 200 can be periodically replaced without shutting down the substrate processing process of the chamber 25 or when it is inoperable. In addition, the controller 400 is designed to continuously monitor catalytic mitigation The pressure in the system 200 and the air flow it generates. When the specific pressure reading exceeds or falls below an acceptable value, the valve control system 450 or the component control system 440 can be used to open or close the valve. To change An exhaust blower 28 is used to adjust the base dust force. The exhaust device 280 can be a w gas pump or a venturi device, or the like. The controller 400 can be connected to Performance monitoring in the catalytic mitigation system 200 to maintain the temperature of the exhaust air flow i 00, 010 under the best conditions. The controller 400 can also adjust the temperature of the heater 240, or the cooling system needs The amount of cold water to extinguish the temperature. The controller 400 can operate the room 25 and the catalytic reduction system 200, and can include a computer code product that can control a computer, which includes one or more connected to a memory system And CPUs of peripheral control components, for example, one manufactured by Intel Corporation of Santa Clara, California. Page 36 This paper standard is applicable to China National Standard (CNS) A4 (210 X 297 mm) --- --------- Installation -------- Order --- I ----- (Please read the precautions on the back before filling out this page) 553761 Employee Consumer Cooperatives, Intellectual Property Bureau, Ministry of Economic Affairs Printed A7 B7 5. Description of the invention () Pentium microprocessor sold. CP of controller 400 Us may also include ASIC (application specific integrated circuits), which is a specific component of the operating room 25 or the catalytic mitigation system 2000. The interface 401 between the operator and the controller 400 may be It is a CRT monitor and a light pen with a light sensor at the pen tip. When a specific screen or function is to be selected, the operator can touch a designated area on the CRT screen and press a button with the pen. The color of the touched area will change, or a new menu will be displayed or the screen will display some messages to confirm the message transmitted by the light pen and CRT monitor. But it can also communicate with the controller 400 such as a keyboard, mouse or pointing communication device. The computer program code can operate the CPUs, and can be traditional such as combination language, C, C ++ or pascal. Computer programming language to write and order other computer devices. Use a traditional document editor to place the appropriate program code into a single file or multiple files, and store or embed it in a computer-usable medium, such as a computer memory system. If the code is loaded It belongs to a high-level language. These codes will be compiled by the compiler code. These compilers are originally connected to the compiled window data and routine target programs. When executing these connected target programs, the system user needs to call the added programs first, and let the computer load these programs into the memory to perform the desired J task or program. The computer code contains one or more sets of computer instructions, which can display time, process gas composition points, process chamber pressure and temperature, and the electromagnetic energy in the manufacturing process. Page 37 This paper applies Chinese national standards (CNS) ) A4 specification (210 X 297 mm) ----------- install -------- order—1 ------ {Please read the notes on the back before filling in this Page} 553761 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7__ 5. Description of the invention () Low source, receiver position and other parameters in the process room 25. The computer program instruction set can also control the operation of the catalytic mitigation system 2000, the composition and flow of the additive gas introduced into the system, and the warning signal of the catalytic mitigation system 200 and other safe operating modes or control A preset toxic gas concentration starts the process chamber 25 or controls the trace toxic gas content in the exhaust gas. The better computer code is shown in Figure 12 and it contains array code instructions, such as process selector and process code 475, which can be entered by the operator and select a process order. After that, the selected process order is operated and executed in the selected manufacturing process 25; the process room management code 480 is the priority sequence for operating and managing the ploughshare contribution in the process room 25; exhaust gas is delayed Subtraction code 485 is the operable catalytic mitigation system 200. Although it seems that a set of different tasks is controlled by separate programs, it needs to be understood that these programs can be grouped together, or the tasks controlled by one set of codes can be combined with another set of codes. Achieve the desired effect. Therefore, the controller 400 and the code described herein should not be limited to those mentioned in the embodiment, and other sets of codes or computer instructions that can perform the same action to achieve the same function are also the norm of the present invention. During the operation, the user inputs a set of process settings and process room numbers into the process selection code 475 through the video interface terminal 40. The process setting is composed of the process group parameters of the specific process in the executable room 25, and is represented by the set number of settings. The process selection code 475 will identify a desired process room and the desired process group parameters that can be operated to perform the desired process. The parameters of the process group include the process conditions, for example, page 38. The paper size applies the Chinese National Standard (CNS) A4 rule ^ 297 public love) ----ϋ n imm n ϋ I i 一 ϋ n-ϋ an ϋ ϋ 1 I (Please read the precautions on the back before filling this page) 553761 A7 B7 V. Description of the invention (Process gas composition and flow, secondary mud trap, process chamber temperature and pressure, such as micro or RF bias power and magnetic field Electricity parameters such as plasma parameters, cooling gas pressure, and process chamber wall temperature. Item # Process selection code 475 can pass specific process setting parameters to the process responsible for controlling process operations in multiple different process chambers 25a-25d. Code 480 is used to perform this process setting. For example, the process room management code contains the substrate which can be used in the chamber 25 or on the substrate, and the metallurgy < code. The process room management code 48〇 Control the execution of component code instruction settings in each process room to control the operation of each component in the process room. Examples of component control code in the process room include setting the 30 position of the substrate. will The material arm 30 is loaded on the bracket 40 or the robot arm is removed from the bracket 40. The process gas control command setting can control the composition knife of the process gas supplied to the chamber 25 and the speed setting pressure control command setting. The size of the throttle valve to be opened 'The command setting of the plasma control controls the power level of the electric starter 60. During operation, the' process room management code 48 () will selectively execute the special process according to the desire 'to selectively Call the component code instruction settings in the process room ^, sort the component code instruction settings, and monitor each group: the operation of the code instruction settings, determine which component should be executed according to the process parameters to be executed, and Monitor and determine the response of the steps to execute a component code command setting. | Exhaust gas mitigation code 485 contains a code command setting that monitors the preset toxic gas concentration in the exhaust gas stream and responds to the toxic gas in the exhaust gas stream. The gas content / composition is used to operate the process room or gas processing group. Page 39 This paper size ^ Chinese National Standard x 297 " i ¥ 553761 Member of Intellectual Property Bureau, Ministry of Economic Affairs A7 was printed by the Industrial and Commercial Cooperatives. V. Invention Description (One). One of the better structures of the exhaust gas mitigation code 485 is the packaged gas analysis code 49, which is acceptable from the gas analysis probe. * II Institute The output signal of toxic gas content / composition (or safety emission illusion) is stored in the exhaust gas composition composition table made by other code instructions and set for regular monitoring; ⑴) pressure: control Code 491 can operate the valve control system 45. and / or: component control: system 440 to control the pressure and flow rate of the catalytic reduction system in response to the output signal; (iii) additive gas code 492 can control the valve control System; (iv) / ja degree control code 493 can control exhaust gas flow and I " temperature, (V) safety operation code 494 can monitor the volume of toxic gas in exhaust gas flow, and adjust chamber 25 and / or catalytic performance The operation of the system 200 was moderated to reduce or almost completely remove the toxic gases emitted. The gas analysis code 490 can monitor the toxic gas content or composition in the excited gas measured by the gas analyzer 41, and can receive the output signal (or safety discharge) of the toxic gas content or composition from the gas analysis probe 405 Signal). The gas analysis code 49 ° will store this output signal in the exhaust gas flow composition sub-table made by other code command settings for periodic monitoring. Or, when the content of toxic gas in the exhaust gas exceeds the preset operating safety value, the gas analysis code 49 will output a safe emission signal to other code command settings. The gas analysis code 490 may also be integrated on the gas analyzer 410 instead of the controller 400. The gas analysis code 490 can be adjusted as described above by adjusting the valve control system 450 and / or the component control system 440. Pressure control code 49 1 series includes pressure detectors and pressure paper standards applicable to China National Standard (CNS) A4 specifications (210 X 297 public love). -------- Order ----- ---- (Please read the precautions on the back before filling this page) 553761 A7 B7 Printed by the Consumers' Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs V. Description of invention (output signal of monitor 420 to adjust the catalytic mitigation system pressure When the pressure drops or rises above a preset value, the pressure control code can be controlled by the valve control system 45 or by the component control system 440 to operate the exhaust device 280, In order to produce the necessary pressure adjustment, the additive gas code 492 includes a code command setting for controlling the gas, air, or moisture supply through a valve control: system 45 to control the composition of the exhaust gas. Generally speaking, The additive gas code 492 can adjust the opening size of one or more additive gas valves according to the signal transmitted by the controller 400. When the content of toxic gas is detected to increase, the additive gas code 492 will increase the entry Catalytic slowing of the reaction gas flow rate of the system 200 to further reduce the content of toxic gases in the exhaust gas ° The temperature control code 493 includes a temperature response code that can be read to maintain the temperature of the exhaust gas flow 100 and 101 at a level that can be destroyed Within the optimal temperature range of the toxic gas, it is achieved by controlling the temperature of the heater 240 or the cooling system 260 by the component control system 440. The safe operation code 494 is operated together with other code command settings to adjust and discharge Operation of process chamber components or gas processing equipment related to the toxic gas content in the air stream to reduce or eliminate the toxic gas content. For example, the safety operation code 494 can be set to detect a toxic gas in the exhaust air stream When the gas content exceeds the preset value, or there is a trace amount of toxic gas in the exhaust gas stream, the process chamber 25 can be closed. Typically, when the substrate is treated with a toxic gas, generally the paper size on page 1 applies China National Standard (CNS) A4 Specification (210 X 297 mm) ------------ · Installation ------ (Please read the precautions on the back before filling Write this page) Order --------- 553761 A7 V. Description of the invention (In the traditional configuration, each gas supply line on the gas disperser 72 will have several safety gas valves that can be fully closed. When When the content of toxic gas in the exhaust air flow exceeds a preset value, the safety operation code 494 can provide an activation signal to the process gas control command setting in the process room management code 480 to close the safety gas valve. Or, the safety operation program Code 494 can direct the exhaust airflow to the exhaust port as described above or another: gas mitigation system. Conversely, when safety operation code 494 receives a zero or lower safety emission value from the gas analyzer 41 When the output signal is output, the program will send a control signal to instruct the process room management code 48 to continue the operation of the process room 25 in the current mode, and at the same time instruct the exhaust gas mitigation code 485 to perform catalytic performance in its current mode. Mitigation of system 2000 operation. During operation, the safety operation code 494 will repeatedly read the latest data in the composition table of the recently discharged airflow, and compare it with the signal sent by the flow controller that can control the flow level in the process chamber 25, and then send instructions as required. Adjust the process gas flow to reduce or completely remove toxic gases from the exhaust gas stream. Alternatively, when the safety operation code 494 receives a safety output value signal, these operations can also be performed. Typically, the program is set to start when the toxic gas content in the exhaust gas stream exceeds a predetermined value (for example, when the toxic gas concentration is between about 0.001% to about 丨 0). operating. In another embodiment, the safety operation code 494 can also activate an alarm or an indicator, such as an LED light, to indicate that the toxic gas content in the exhaust gas stream has reached a dangerous value; or provide a metering display, such as ( Please read the notes on the back before filling this page) ^ -------- ^ ---------. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 V. Description of the invention () One can follow the exhaust airflow (please read the precautions on the back before filling out this page) 1 The real-time content of each rolling body is displayed as a graphic image for monitoring by the operator. This safe operating mode allows the operator to monitor and prevent the accidental escape of toxic gases into the environment. The same signal can also be used to maintain the process equipment 25 in an inoperative mode 'or to activate safety discouragement when an abnormal condition is detected. In this mode, the safety operation code 494 can operate the process: room and gas processing equipment to provide a safety device that does not harm the environment. Front Clean Room Another embodiment of the front clean room 230 is shown in FIG. The front clean room 230 includes a reactor 23 that accepts the exhaust gas stream 100 and allows the exhaust gas stream 00 to react with the cleaning liquid. A hydrolyzer column 310 or channel 310 can accept an exhaust gas stream 100 from channel 21 which is printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. This exhaust gas stream has been mixed with an additive in advance. The hydrolysis column 3 10 provides an aqueous or humid environment 3 1 2 for the exhaust gas flow 100. Which one begins to be exposed to water or other clean liquids' will cause the desired components (e.g., SiF4) in the exhaust gas stream 100 to begin to decompose. Hydrolysis tubing string 310 allows these large particulate matter to be removed before it becomes blocked or deposited in the post-processing tube string in front clean room 230. The initial moisture exposure, coupled with subsequent upright processing columns and a downward exhaust air stream of 100, allowed these large particles to be completely removed. A hydrolysis column or channel located downstream of the cleansing liquid disperser or other cleansing liquid source is not effective in removing substances such as SiF4 completely. A clean gas can be set up at or near the entrance 317 for this paper. Applicable to China National Standard (CNS) A4 (210 X 297 mm) 553761 A7 B7 V. Description of Invention (Employee of Intellectual Property Bureau, Ministry of Economic Affairs Consumer cooperatives should print sources 3 1 5 in order to introduce cleanliness such as air, lice or lice ... to " "float systems and or to prevent hydrolysis of upstream materials. The inlet can be a throat inlet. Later discharge The air stream 100 can disperse the "please like water" clean liquid from the supply source 325 into the exhaust air stream 100 through the first lacquer, the coin deep sheep channel or the channel 32 (^ 一 嘴嘴 3 22). The m is shown in the opposite direction of the airflow. The water is sprayed out in the opposite direction of the airflow. The opposite direction of the airflow means that the flow direction of the airflow is from ν to ν, which is opposite to the overall flow direction of the gas. This arrangement can be aided by Gravity helps water flow and helps transfer reaction products such as silicon dioxide and HF to the storage tank 350. The columns 3 to 20 can also optionally provide a surface area that can increase At the same time, plastic or ceramic pellets, such as ρν〇spheres, can increase the contact surface area of water / gas in the column, and then help Sih's decomposition reaction. One can also set up an exhaust gas 100 and the reaction products to pass easily, but The surface increasing substance 327 is difficult to pass through the platform 328 to accommodate the surface increasing substance 327 in the first column 320. The exhaust gas 100 will then flow through the channel 329 to a column or channel 330. A throat ( venturi tube) 3 3 2 can disperse fluid such as water from the supply source 335 into the pipe string 330. A nozzle 333 is located at the end of the upright pipe 332 to inject water into the pipe string. , The term refers to a channel with a certain volume and throat shape, which can increase the flow rate of the fluid flowing through it and reduce its pressure. The term "injection" means that the cleaning liquid is dispersed from the throat. This Invented throat nozzles 332, 333 The paper size in this paper applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) (Please read the precautions on the back before filling this page) ·! 1 Order ·! # 553761 A7 B7 Printed by the Employees' Cooperative of the Ministry of Intellectual Property Bureau of the People's Republic of China. 5. Description of the Invention (Provides an opening to disperse water into very fine particles. As shown in one case, for a pipe 332 with a diameter of about 1.5 inches, the throat The opening of the tube nozzle is between about 0.1 inches and .4 inches, preferably between about 0.25 inches and 1.25 inches, and more preferably between about 0.5 inches and 丨 inches. As shown in one case, the direction of water flow is the same as the flow direction of the exhaust gas 100. The function of the throat string 33o is as follows: 0 Further cleaning of the exhaust gas by generating particulate water to the south / gas contact area ' (Ii) By the high-speed impact of the water from the throat nozzle 3 33, the reaction product is further transferred to the storage tank 350. '«Η) As described above, the water is added to destroy the PFC in the catalytic reactor. , And (iy,) generates a negative pressure to effectively provide a positive sound to the exhaust gas 100 to compensate for the pressure loss in the clean A. The net pressure drop after passing through the front clean room is approximately zero. Sometimes ’even gets a net pressure increase. FIG. 14 is an exemplary embodiment of the throat pipe 332 and the throat nozzle. For example, the relative volume and angle of the throat and the opening can be improved to achieve the desired purpose. A second clean tubing string or channel 340 can accept the exhaust airflow from the throat string 33o. The two clean tubing strings may include a second nozzle 342 for dispersing the cleaning liquid. For example, the water supplied from the source 345 may be sprayed into the exhaust gas flow 100 in the opposite direction. The second clean tubing string may further contain a surface increasing substance 347 and a platform 348, which are similar to the first clean tubing having a surface increasing substance 327 and a platform 328. The second clean tubing string 340 can also provide another level of cleansing effect of the exhaust gas stream 100 and further transfer the reaction product to the storage tank 350. Page 45 This paper size applies to China National Standard (CNS) A4 (210 X 297 public love) -------- ^ -------- 1 (Please read the precautions on the back before filling This page) 553761 A7 B7 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention (The demister 355 can be located near the exit ⑴ to remove water droplets from the exhaust air stream. For catalytic treatment, the exhaust air stream The moisture content in 100 is preferably about% 3%; water droplets are not desirable, because the water droplets will carry the product particles brushed down and pollute the catalyst in the catalytic reactor 25. The demister 355 can remove the water droplets, and Pass the desired moisture. The mist eliminator 3 5 5 may contain enclosures or nets such as wire netting. · Each pipe or channel 310, 32, 33, 34 is designed to be destructible From about 80% to about 90 %%. Therefore, if there are two pipe strings and the exhaust gas flow 100 is passed through the two pipe strings, about 696 to about 99% of SiF4 can be removed. If three pipes are passed Column, you can also increase the removal ratio to about 99.2% to about 99.9%. If you pass 4 columns, remove Examples can be increased to about 99.8 ° /. To about 99.99 //. Quantitative test using the EPA method 5 "Determination of specific effluent particles from a static source", this technology shows that the efficiency of Sib removal is about It is 99.77% or better. The particle test results show that about 80% of the treated exhaust gas stream has a particle size of about i μm to 25 μm. Therefore, the filter 359 can be used to further Removal of particles, such as a hep a near the outlet 357; filter. Hepa filter 359 can remove reaction product particles that have not been sent to the staggered tank 350 almost completely. Hepa filters are particularly effective for filtering particles with a volume of 13 or more, Therefore, it is most suitable for removing these reaction products. It should be noted that the required number of columns can be contained in the front clean room 230. Furthermore, 'the column' need not be placed upright, but can be directly and horizontally Or in any appropriate direction. In addition, the columns need not necessarily be parallel to each other. Adjacent columns can be any degree from zero (also on page 46 of this paper rule. Specifications ⑽χ Tearing Public Director) --- --------- · Install -------- Order i (Please read the notes on the back before filling this page) ^ 3761

發明說明 A7 B7 即’幾乎斗行且排出氣流1 〇〇以相反方向流動,如第i3 圖所示)到180度(亦即,平行且排出氣流100叹相同方 向流動)的角度放置。在一種排列方式中,管柱間的角度 差低於90度以下。溢流道370及過濾單元376对可維持 倚存槽容量在一欲求範圍内。 第15圖顯示前潔淨室230之一種含有四^室、且往内延 伸的實施例。此種往内延伸的設計可減少前潔淨室23〇 所佔據的空間。第15圖所示的前潔淨室截面積約為j平 方英尺或1平方英尺以下。這種設計讓物質傳送變得更 容易’且較容易組裝,而且可在不阻礙室25操作下與製 考呈室25 —起被密切使用。 本發明之另一實施例示於第16圖中。在此實施例中, 有一個再彼環系統402可將諸如水和反應產物之類的潔 淨液體再經前潔淨室23〇重新循環。儲存槽35〇首先由 過漉單元375將其充填至一欲求容量,該過滤單元375 係被連接到一諸如水_的潔淨液體源上。此欲求容量係 與溢流道370的高度相關。打開幫浦4〇6。幫浦可 自儲存槽350中抽取液體。在所示實施例中,儲存槽内 的液體為水及諸如二氧化# HFit類潔淨反應產物:混 合物。在幫浦406所產生的負壓影響下通過出口々η之 流體,繼績穿過可去除所有反應產物顆粒的顆粒濾器 421。顆粒濾器421可包含能去除直徑大小介於至 1 mm之顆粒的濾器。在一情況下,顆粒濾器42丨可去除 大小约在70μιη以上的顆粒。之後濾液便由管路mi,再 私紙張尺度適用中國國家標準(CNS)A4規格(21〇 χ 297公釐) - -----------i I I I I--β--------I (請先閱讀背面之注意事項再填寫本頁)Description of the invention A7 B7 is placed at an angle that is' almost doubling and the exhaust airflow 100 flows in the opposite direction, as shown in Figure i3) to 180 degrees (that is, parallel and the exhaust airflow flows in the same direction). In one arrangement, the angle difference between the strings is below 90 degrees. The overflow channel 370 and the filtering unit 376 can maintain the capacity of the storage tank within a desired range. Fig. 15 shows an embodiment of the front clean room 230 including four chambers and extending inward. This inwardly extending design reduces the space occupied by the front clean room 23o. The cross-sectional area of the front clean room shown in Figure 15 is approximately j square feet or less. This design makes the material transfer easier and easier to assemble, and it can be used closely with the production and presentation room 25 without hindering the operation of the room 25. Another embodiment of the present invention is shown in FIG. In this embodiment, there is a recirculation system 402 to recirculate cleaning liquids such as water and reaction products through the front clean room 23. The storage tank 35 is first filled to a desired capacity by a transfer unit 375, which is connected to a clean liquid source such as water. This desired capacity is related to the height of the overflow channel 370. Open pump 4 06. The pump can draw liquid from the storage tank 350. In the illustrated embodiment, the liquid in the storage tank is water and a clean reaction product such as a dioxide #HFit: mixture. The fluid passing through the outlet 々η under the influence of the negative pressure generated by the pump 406 passes through the particle filter 421 which can remove all reaction product particles. The particle filter 421 may include a filter capable of removing particles having a diameter between 1 mm and 1 mm. In one case, the particle filter 42 can remove particles having a size of about 70 m or more. After that, the filtrate will pass through the pipeline mi, and the paper size will be in accordance with Chinese National Standard (CNS) A4 (21〇χ 297 mm)------------ i III I--β --- ----- I (Please read the notes on the back before filling this page)

經濟部智慧財產局員工消費合作社印製 553761 A7 --------— B7_ - 五、發明說明() 刀別經管路432、434、433被抽至液體噴嘴322、342及 喉形管332中。幫浦406亦可以一預設的速率自潔淨液 體源441(即,水源)抽取新鮮的潔淨液,在所示的例子中 係為水。新添加的水會造成儲存槽35〇溢流至溢流道 3 7 0 ’其係可將溢流物傳送至一酸性下水道中。新添加的 水可用來維持或碉整儲存槽3 5 0中的p Η值在一預設值範 圍内。在一例子中,新鮮水係以每分鐘約〇·25加侖至〇.5 加命的速率被引入,或以以可維持pH值約在2至3範圍 内的速率被引入。或者,可安裝一 pH測量儀及一控制器, 依所測出的pH值來調整所引入的水量。 如第1 7圖所示,可擴充再循環系統4 〇 2來提供潔淨液 至冷卻單元260及後潔淨室270兩者,或其中之一。冷 卻系統260可以是一種附有喷嘴261的水淬熄式系統, 該喷嘴261係可將水喷灑至已加熱及缓減的排出氣體ι〇1 内’以冷卻該排出氣體101。後潔淨室270可以是一種 能提供諸如水之類的潔淨液至反應器272,以將排出氣 體1 01中的一種組成物去除之潔淨室。在一例子中,潔 淨液是由噴嘴271喷灑至已緩減的排出氣體1〇1中以便 將HF溶解的水。 幫浦406可以如第16圖所示的方式,抽取諸如水之類 的潔淨液及反應產物。水係由管路43 1被抽取至管路 432、433、434,以便將水分別傳送至喷嘴322、332、 及3 42中。此外,管路431亦可提供水至管路435、436, 其再分別通往後潔淨室喷嘴271及前潔淨室噴嘴261中。 第48頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 ------------ B7_-V. Description of the invention 332 in. Pump 406 can also draw fresh cleansing liquid from cleansing liquid source 441 (i.e., water) at a preset rate, which is water in the example shown. The newly added water will cause the storage tank 35 to overflow to the overflow channel 3 700 ', which can transfer the overflow to an acidic sewer. The newly added water can be used to maintain or trim the pΗ value in the storage tank 3 50 within a preset value range. In one example, fresh water is introduced at a rate of about 0.25 gallons to about 0.5 gallons per minute, or at a rate that can maintain a pH in the range of about 2 to 3. Alternatively, a pH meter and a controller can be installed to adjust the amount of water introduced according to the measured pH value. As shown in FIG. 17, the recirculation system 4 02 can be expanded to provide clean liquid to both the cooling unit 260 and the rear clean room 270, or one of them. The cooling system 260 may be a water quenching system with a nozzle 261, which sprays water into the heated and slowed exhaust gas ιo 'to cool the exhaust gas 101. The rear clean room 270 may be a clean room capable of supplying a cleaning liquid such as water to the reactor 272 to remove a composition in the exhaust gas 101. In one example, the cleaning liquid is water sprayed from the nozzle 271 into the exhaust gas 101 which has been reduced to dissolve the HF. Pump 406 can extract clean liquid such as water and reaction products in the manner shown in FIG. The water system is pumped from the pipeline 431 to the pipelines 432, 433, and 434 to transfer water to the nozzles 322, 332, and 3 42 respectively. In addition, the pipeline 431 can also provide water to the pipelines 435 and 436, which respectively lead to the rear clean room nozzle 271 and the front clean room nozzle 261. Page 48 This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page)

-裝—--訂 ---I I I I I 經濟部智慧財產局員工消費合作社印製 553761 A7 經濟部智慧財產局員工消費合作社印製 B7 五、發明說明() 冷卻系統260有一個與收集儲存槽265互通的下水道 4 55。同樣的,後潔淨室270也有一個與收集儲存槽275 互通的下水道451。管路451、455係與管路461相接後, 再經管路471與後潔淨室儲存槽350相通。為調節後潔 淨室230與前潔淨室270及冷卻系統260間的壓力差, 裝設了一個壓力補償單元479。壓力補償單元479可包 含一重力式下水道及一 P-型阱481,讓下水道内的水柱 可因應裝置内的壓力差而自動調整其高度。或者,可以 一幫浦482來補償該壓力差。亦可使用其他類似的壓力 補償器。 可添加一恒定、預設量之新潔淨液(例如,水),同時 一相當量的潔淨液亦可自溢流道370中流掉。或者,可 提供一控制系統500。該控制系統500係包含一傳統式 的卫Η儀,其係可偵測儲存槽350中潔淨液及反應產物的 pH值。一控制器510,其可以是一種中央處理器(CPU), 可接受並分析來自pH儀520之數值並依所測出之pH值 提供一輸出訊號給流量控制器5 3 0。如此,可調整新添 加之潔淨液量以便維持儲存槽350的pH值在一預設範 内。例如,當儲存槽3 50的pH值低於2以下,控制器51〇 會送訊號給流控制器530,讓其調高進入系統内的水量。 而當儲存槽350的pH值高於3時,控制器510就會停止 進入系統内的水量。控制系統500可提供一控制良好的 潔淨程序並使用水量減至最低。 控制器500包含一電腦可讀的介質,其係具有一内建 ------I I ^--------- (請先閱讀背面之注意事項再填寫本頁) 76 3 5 5 A7 經濟部智慧財產局員工消費合作社印製 B7 &、發明說明() 的電腦程式碼以監控來自pH儀520之數值。該控制系統 5 0 〇可被併入系統控制器中,例如上述之系統控制器。 控制器500亦可包含一可控制電腦之電腦程式碼產物, 包含一或多個連接了記憶體系統及周邊控制組件之中央 處理器(CPUs),例如加州聖塔拉英特爾公司出售的奔騰 极處理器。控制器500之CPUs亦可包含:可控制一系統 内特定組件之 ASIC (ppncati〇n specific integrated circuits,專一應用積體電路)。介於操作員及控制器5 〇〇 間的界面可以疋一個CRT勞幕及一種在筆尖具有感光器 的光筆。在選擇一特定螢幕或功能時,操作員可碰觸CRT 螢幕上一指定區域或壓下筆上的一個按紐。所碰觸螢幕 上之區域會改變顏色,或是在螢幕上出現另一新選單以 確認來自光筆或前一個C RT勞幕之指示。亦可使用諸如 键盤、滑m*或溝通指示裝置(pointing communication device)之類的其他裝置來與控制器500溝通。藉此,操 作員可輸入一範圍的pH值或潔淨液流速至系統中。 pH儀可位於任一儲存槽265、275中,或任一管路中, 例如管路43 1内;或者可使用數個PH儀來進一步監控流 體之pH值。或者,亦可監控諸如壓力、溫度、流速等其 他潔淨液狀況來監控系統402之操作。擴充的再循環系 統402可將潔淨液引至前潔淨室230、冷卻系統260及 後潔淨室270中《需知系統402可適用於一或兩種裝置。 此外,系統402亦可被擴充進一步提供潔淨液給其他^ 置。前潔淨室230的另一種排列方式示於第17囷中,但 第50頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)-Installation --- Order --- IIIII Printed by the Consumers 'Cooperative of the Intellectual Property Bureau of the Ministry of Economy 553761 A7 Printed by the Consumers' Cooperative of the Intellectual Property Bureau of the Ministry of Economy B7 V. Description of the invention Sewer 4 55. Similarly, the rear clean room 270 also has a sewer 451 communicating with the collection storage tank 275. The pipelines 451 and 455 are connected to the pipeline 461, and then communicate with the rear clean room storage tank 350 through the pipeline 471. In order to adjust the pressure difference between the rear clean room 230 and the front clean room 270 and the cooling system 260, a pressure compensation unit 479 is installed. The pressure compensation unit 479 may include a gravity type sewer and a P-type trap 481, so that the water column in the sewer can automatically adjust its height according to the pressure difference in the device. Alternatively, a pump 482 can be used to compensate for this pressure difference. Other similar pressure compensators can also be used. A constant, preset amount of new cleaning liquid (e.g., water) can be added, and a considerable amount of cleaning liquid can also flow out of the overflow channel 370. Alternatively, a control system 500 may be provided. The control system 500 includes a conventional sanitary instrument, which can detect the pH values of the cleaning solution and the reaction products in the storage tank 350. A controller 510, which can be a central processing unit (CPU), can receive and analyze the value from the pH meter 520 and provide an output signal to the flow controller 530 according to the measured pH value. In this way, the amount of the newly added cleaning liquid can be adjusted so as to maintain the pH value of the storage tank 350 within a preset range. For example, when the pH value of the storage tank 3 50 is lower than 2, the controller 51 will send a signal to the flow controller 530 to increase the amount of water entering the system. When the pH of the storage tank 350 is higher than 3, the controller 510 stops the amount of water entering the system. The control system 500 can provide a well-controlled cleaning procedure and minimize the amount of water used. The controller 500 contains a computer-readable medium, which has a built-in ------ II ^ --------- (Please read the precautions on the back before filling this page) 76 3 5 5 A7 The consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs printed the computer code of B7 & Invention Description () to monitor the value from pH meter 520. The control system 500 can be incorporated into a system controller, such as the system controller described above. The controller 500 may also include a computer code product capable of controlling a computer, including one or more central processing units (CPUs) connected to a memory system and peripheral control components, such as a Pentium processor sold by Intel Corporation of Santa Clara, California. Device. The CPUs of the controller 500 may also include: an ASIC (ppncation specific integrated circuits) that can control specific components in a system. The interface between the operator and the controller 5000 can be a CRT curtain and a light pen with a light sensor at the pen tip. When selecting a specific screen or function, the operator can touch a designated area on the CRT screen or press a button on the pen. The area on the screen you touch changes color, or another new menu appears on the screen to confirm instructions from the light pen or the previous CRT screen. The controller 500 may also be communicated using other devices such as a keyboard, a slider, or a pointing communication device. This allows the operator to enter a range of pH or cleaning solution flow rates into the system. The pH meter can be located in any of the storage tanks 265, 275, or in any pipeline, such as in pipeline 431; or several pH meters can be used to further monitor the pH of the fluid. Alternatively, other cleaning liquid conditions such as pressure, temperature, flow rate, etc. may be monitored to monitor the operation of the system 402. The extended recirculation system 402 can direct the cleaning liquid into the front clean room 230, the cooling system 260, and the rear clean room 270. The need-to-know system 402 can be applied to one or two devices. In addition, the system 402 can also be expanded to further provide cleaning fluid to other locations. Another arrangement of the front clean room 230 is shown in page 17 囷, but the paper size on page 50 applies the Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling in this page)

553761 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( 、二使用如上述〈多管枉式潔淨室。相反的,帛1 7圖中 的則絮淨至2 3 0亦可被簡化成只用一個嘴嘴。 加熱器 取代加熱器240或是除了加熱器240夕卜,尚可和催化 性緩減系,统200合用之加熱器或暖爐54()·.之另—實施例 示=第u圖。暖爐540可⑴降低排出氣體1〇〇通過其中 的久數,(u)迅速有效地加熱排出氣體至高溫;及g⑴在 不需直接接觸排出氣體⑽及加熱元件下來加熱排出氣 體 100。 ^第18圖所示的例子中,暖爐54〇有一個可接受排出 氣m的入口 541,及可讓排出氣體通過的出口 542,和界 疋出旋繞的氣體通道545的壁或數面壁。在此旋繞的 氣把通道545外面為一外部的加熱元件55〇,其係可包 含一個紅外線陶器加熱元件。該加熱元件55〇可以是圓 柱形或任何具中空内部551或類似空間或孔洞且至少部 刀可被加熱元件覆蓋之形狀(亦即,加熱元件可以是中央 留空之相對立的平板,而非一連續性的環狀)。在此中空 内部551中有一個外通道555,而在此外通道555中則 有兩條内管560、565。外通道555及兩條内管560、565 一起组成一面與旋繞的氣體通道545相鄰的壁,可提高 排出氣流1〇〇在暖爐54〇中停留的時間,並增加與加熱 表面接觸的機會。在第18圖中的組合内,排出氣流1〇〇 進入内管560之一入口端,流經整個内管56〇之長度, 第51頁 f ·丨·丨— -丨丨訂·丨—丨丨—丨丨I (請先閱讀背面之注意事項再填寫本頁) 553761 A7 ____B7 五、發明說明() 並由一出口端流出,進入外通道5 5 5。排出氣流丨〇〇係 受到一個諸如外通道5 5 5之密閉端5 5 6這類的阻礙物, 而被迫穿過介於内管560、565之間的空洞567往反方向 流動,直到排出氣流1 〇〇抵達外通道555之另一密閉端 557之後,才繼續流入第二内管565之入口端566,然後 由第二内管565之出口端563流出暖爐54Q之出口 542。 在所示的例子中,外通道5 5 5比加熱元件5 5 0之内部5 5 1 還小,因此可提供一個介於外通道555及加熱元件550 間的間隙570。一般相信熱主要係以輻射能的方弍由加 轉元件550傳送到外通道,.ϋ,之後·本藉由對流i僳導 方式傳送到内管560、505上。一般相信排出氣流1〇〇至 要是藉由管555、560、565表面的熱對流而被加熱。管 555、560、565 —起形成一個内連通道或彼此重疊交錯 的部分,以界定出一面緊鄰著氣流通道545的壁。 下列說明僅為提供第1 8圖實施例之例示性說明,本發 明之範疇並不僅限於此。暖爐540之長度(L)約可為24 英吋,截面積直徑約為8.25英吋。外通道555之直徑約 為3英忖,而内管560、565之直徑則約介於1英对至約 1.25英吋間。間隙570約大於2亳米,且較好是從約5 毫米至約3 0毫米間。在另一例子中,則並不存在此間隙。 加熱元件550可以是一種傳統圓筒狀加熱器,例如由加 州聖荷西市熱動力公司(Thermal Dynamics Corporation, San Jose,California)所販賣之加熱器。亦可使用任何適 當形狀的加熱器。在一例子中,加熱元件550係可於5 第52頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閲讀背面之注意事項再填寫本頁) -襄! I 訂·! ----553761 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention (), (2) Use the above-mentioned <multi-pipe 枉 clean room. Conversely, the picture in 帛 17 can be cleaned to 2 3 0. Simplified to use only one mouth. The heater replaces the heater 240 or in addition to the heater 240, it can still be used with the catalytic mitigation system, the heater 200 or the heater 54 () · .Other-implementation Example = Figure u. The heater 540 can reduce the length of time that the exhaust gas passes through 100, (u) quickly and effectively heat the exhaust gas to a high temperature; and g) heating without directly contacting the exhaust gas and heating elements Exhaust gas 100. ^ In the example shown in Figure 18, the heater 54 has an inlet 541 that accepts the exhaust gas m, an outlet 542 through which the exhaust gas can pass, and a wall of the spiral gas channel 545 Or several walls. The spiral airbar channel 545 is an external heating element 55o, which can include an infrared ceramic heating element. The heating element 55o can be cylindrical or any hollow interior 551 or similar space. Or holes and to The shape in which the knife can be covered by the heating element (that is, the heating element can be an opposed flat plate with a central hollow, rather than a continuous ring). In this hollow interior 551 there is an outer channel 555, and in the In addition, there are two inner tubes 560, 565 in the channel 555. The outer channel 555 and the two inner tubes 560, 565 together form a wall adjacent to the swirling gas channel 545, which can improve the exhaust airflow 100 in the furnace 54 〇 in the combination of Figure 18, and the opportunity to contact the heating surface. In the combination of Figure 18, the exhaust gas flow 100 into one of the inlet end of the inner tube 560, flowing through the entire length of the inner tube 56 Page f · 丨 · 丨 —-丨 丨 Order · 丨 — 丨 丨 — 丨 丨 I (Please read the precautions on the back before filling out this page) 553761 A7 ____B7 5. Description of the invention () and flow out from an exit end, enter Outer channel 5 5 5. The exhaust air flow is subject to an obstruction such as the closed end 5 5 6 of the outer channel 5 5 5 and is forced to pass through a cavity 567 between the inner tubes 560 and 565. Flow in the opposite direction until the exhaust airflow 100 reaches the other side of the outer channel 555 After the closed end 557, it continues to flow into the inlet end 566 of the second inner tube 565, and then flows out from the outlet end 563 of the second inner tube 565 to the outlet 542 of the heater 54Q. In the example shown, the outer channel 5 5 5 is smaller than The inner 5 5 1 of the heating element 5 5 0 is still small, so it can provide a gap 570 between the outer channel 555 and the heating element 550. It is generally believed that heat is mainly transmitted by the transfer element 550 to the outside in the form of radiant energy. The channel is then transmitted to the inner tubes 560, 505 by convection i. It is generally believed that the exhaust air flow is 100 to be heated by thermal convection on the surfaces of the tubes 555, 560, 565. The tubes 555, 560, 565 together form an interconnecting channel or a portion overlapping each other to define a wall adjacent to the airflow channel 545. The following description is only provided as an illustrative description of the embodiment in FIG. 18, and the scope of the present invention is not limited thereto. The length (L) of the heater 540 can be approximately 24 inches, and the cross-sectional area diameter is approximately 8.25 inches. The diameter of the outer channel 555 is about 3 inches, and the diameter of the inner tubes 560, 565 is about 1 inch to about 1.25 inches. The gap 570 is greater than about 2 mm, and preferably from about 5 mm to about 30 mm. In another example, this gap does not exist. The heating element 550 may be a conventional cylindrical heater, such as a heater sold by Thermal Dynamics Corporation of San Jose, California. Any suitably shaped heater can also be used. In an example, the heating element 550 can be used on page 5 of this page. The paper size applies to the Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling out this page)-Xiang! I order! ----

經濟部智慧財產局員工消費合作社印製 經濟部智慧財產局員工消費合作衽印製 553761 A7 --——_B7____ 五、發明說明() 什瓦的電力下操作。管555、560、565可由InconelTM或 31 6L不鏠麵材質所製造,或鍍有這類材質。至少這些管 子内部係由不會被排出氣流丨〇〇所腐蝕或破壞的材質製 造而成的’例如InconelTM β在一例子中,暖爐540係佔 據了約2,000立方英吋的體積,且其體積較好是約L3 00 立方英对。在第18圖實施例中,氣體每次:通過時,其可 將排出氣流100加熱至至少40〇°C ;在一例子中,係由室 溫(約23。〇加熱至約57(TC ;在另一例子中,則係由室溫 加熱至約400t至約70(TC間。第18圖中所示的排列組 合僅為例示性,本發明並不僅限於此種組合。圖中僅使 用了一個内管,但事實上可使用二或二個以上的内管, 外通道則可被第三内管所取代,或是縮短内管長度。在 一例子中’整個旋繞的氣體通道545係位於加熱元件550 内部。加熱元件550可以位於氣體通道545之外,也可 完全或部分覆蓋氣體通道54 5。因此,在一例子中,加 熱疋件550可以是直接位於至少一部分旋繞的氣體通道 545之上方、下方、或旁邊的一塊加熱板。 本發明的暖爐可藉由一或多個旋繞的氣體通道有效地 將排出乳流100加熱至高溫,並增加排出氣流1〇〇在暖 爐中滞留的時間,提高暖爐中的加熱面積,提供足夠能 量的加熱元件,及足夠長的氣體通道。「旋繞的氣體通道」 d係指位於一裝置内的任何流體通遒,例如一暖爐内, 其中氣體流通的距離要遠超過該裝置的長度,例如, 第18圖中所示彆弩曲曲的氣流通道。在第18圖所示的 第53頁 本紙張尺度適用中國®家標準(CNS)A4規格(210 X 297公釐) ----------------- (請先閱讀背面之注意事項再填寫本頁) 553761 A7 B7 五、發明說明() 例子中,氣體流通過的距離約為3 L。名並仙μ ^ 隹头他例子中,此 (請先閱讀背面之注意事項再填寫本頁) 距離可遠大於15L或遠大於2L。「增加滯留的時間」一 詞係指氣流停留於一裝置(例如,暖爐)内的時間,遠超 過該氣流在不受阻礙下流過長度L所需的時間。在_例 子中,排出氣流100的滯留時間係约低於3秒·在另 例子令,滯留時間則約低於2秒。「提高加:熱面積」一詞 係指在一平滑管道内’所提高的任何傳熱面積,例如對 &gt;虎表面。 當與熱交換器合併使用時’例如第9圖所示的熱交換 器360,暖爐540會變得特別有效率,可以較少的時間 且消耗較少的能源來加熱排出氣流1 〇〇。已知熱交換器 3 60的效率高達85%。在一例子中,藉由在溫度約9〇(rc 至約100(TC下操作加熱元件550,可迅速地將排出氣流 100加熱至約700°c。已加熱的排出氣流1〇〇之後可流入 催化性反應器250内,來有效地降低有毒氣體(例如,過 氟化物)的濃度。 經濟部智慧財產局員工消費合作社印製 第19a及19b圖示出暖爐540’、540”的其他實施例, 其係具有内連的氣體通道及彼此重疊交錯的部分,並可 用於催化性緩減系統200中。在第19a圖所示之實施例 中,暖爐5 40’提供了位於外通道555’中諸如層板或其他 阻礙物5 8 0之類的障礙,以強迫排出氣流100採取一個 自入口 54Γ起至出口 542’止彎弩曲曲的通道,以提高滯 留時間及加熱表面積,並藉以界定出一面與旋繞的氣體 通道545’相鄰的壁。亦可提供任何數目的層板或其他阻 第54頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 553761 A7 B7 五、發明說明() 礙物。此外’開口 581容許氣體通過並繞過這些層板或 其他阻礙物5 8 0,這些層板或其他阻礙物可排列成能讓 排出氣流以旋渦式通過暖爐540,。在第19b圖所示之暖 爐540”也與暖爐540’類似,只不過其中層板係以一定角 度來排列,以於暖爐540”中創造出更具漩渦式的氣流。 亦可使用任何數目的層板或其他阻礙物5%及任何適當 方向的開口 5 9 1。 第19c及19d圖示出暖爐592、592,的不同實施例,其 中加熱元件595、595,的壁594、5 94,形成排出氣流1〇〇 可流通的通道。氣流流動通道593、593,可以由界定出且 與一旋繞的氣體通道相鄰之壁所形成,例如第1 9c圖所 示彎彎曲曲的通道,或是由例如第19d圖所示非旋繞的 氣體通道之壁所形成。或者,第19c圖所示之彎彎曲曲 的通道可具有比所示更多處的轉彎,或其彎曲角度可比 所示角度來得更大或更小。壁594、5 94,之表面可由不會 :播挺出氣流1 00所腐蝕之材質來製造,或鍍有這類材質, 例如以如上討論之鎳合金製造,或在其内部鍍上鎳合金。 亦可視暖爐的操作情況,鍍上不同材質的物質。加熱元 件的長度需足夠長和/或有力,或氣體流動通道需夠長或 旋繞次數需足夠,使排出氣流1 00只需通過一次即得以 從室溫被加熱至至少約40(TC。暖爐可將排出氣流1〇〇加 熱至至少約 500°C或至少約600°C。加熱元件595、595’ 的周圍亦可圍上絕熱物質以集中熱能往内並防止熱能逸 散。 第55頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. The tubes 555, 560, 565 can be made of InconelTM or 31 6L non-face material, or plated with such materials. At least the interior of these tubes is made of a material that will not be corroded or destroyed by the exhaust air stream. For example, InconelTM β. In one example, the heater 540 occupies a volume of about 2,000 cubic inches, and its volume It is preferably about L3 00 cubic British pairs. In the embodiment of FIG. 18, each time the gas passes, it can heat the exhaust gas stream 100 to at least 40 ° C; in one example, it is heated from room temperature (about 23.0 to about 57 (TC; In another example, it is heated from room temperature to about 400t to about 70 ° C. The arrangement and combination shown in FIG. 18 is only exemplary, and the present invention is not limited to this combination. One inner tube, but in fact two or more inner tubes can be used, the outer channel can be replaced by a third inner tube, or the length of the inner tube can be shortened. In one example, 'the entire spiral gas channel 545 is located Inside the heating element 550. The heating element 550 may be located outside the gas passage 545, or may completely or partially cover the gas passage 545. Therefore, in an example, the heating element 550 may be located directly at least in part of the spiral gas passage 545 A heating plate above, below, or beside. The heating furnace of the present invention can effectively heat the discharged milk flow 100 to a high temperature through one or more swirling gas channels, and increase the exhaust gas flow 100 to stay in the heating furnace. Time to raise the Heating area, heating elements that provide sufficient energy, and gas channels that are long enough. "Spiral gas channels" d refers to any fluid channel in a device, such as a heating furnace, where the distance of gas flow is far beyond The length of the device is, for example, the curved airflow path shown in Figure 18. On page 53 shown in Figure 18, this paper size applies the China® Standard (CNS) A4 (210 X 297 mm) ) ----------------- (Please read the notes on the back before filling out this page) 553761 A7 B7 V. Description of the invention () In the example, the distance of the gas flow is about 3 L. Name and immortal μ ^ In his example, this (please read the precautions on the back before filling out this page) The distance can be much greater than 15L or much greater than 2L. The term "increasing retention time" refers to airflow retention The time in a device (for example, a heater) far exceeds the time required for the airflow to flow through the length L without hindrance. In the example, the residence time of the exhaust airflow 100 is less than about 3 seconds. As an example, the residence time is less than about 2 seconds. Refers to any heat transfer area 'increased within a smooth pipe, for example, to the tiger surface. When combined with a heat exchanger', such as heat exchanger 360 shown in Figure 9, the heater 540 will become Particularly efficient, it can heat the exhaust gas stream 100 with less time and consume less energy. It is known that the efficiency of the heat exchanger 3 60 is as high as 85%. In one example, by using a temperature of about 90 (rc Operating the heating element 550 at about 100 ° C. can quickly heat the exhaust gas flow 100 to about 700 ° C. The heated exhaust gas flow 100 can flow into the catalytic reactor 250 to effectively reduce the toxic gas ( (For example, perfluoride). Printed in Figures 19a and 19b of the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, other embodiments of heaters 540 ', 540 ", which have interconnected gas channels and overlapping and intersecting parts, and can be used for catalytic relief Subtract system 200. In the embodiment shown in Figure 19a, the heater 5 40 'provides an obstacle such as a laminate or other obstruction 5 8 0 located in the outer channel 555' to force the exhaust air flow 100 to take A curving passage from inlet 54Γ to outlet 542 'to increase residence time and heating surface area, thereby defining a wall adjacent to the swirling gas channel 545'. Any number of laminates are also available Or other obstacles on page 54 This paper size applies Chinese National Standard (CNS) A4 specifications (210 X 297 public love) 553761 A7 B7 5. Description of the invention () Obstructions. In addition, 'opening 581 allows gas to pass through and bypass these laminates Or other obstructions 5 8 0. These laminates or other obstructions can be arranged to allow the exhaust airflow to swirl through the heater 540. The heater 540 "shown in Figure 19b is similar to the heater 540 ', only The middle layers are arranged at an angle to create a more vortex-like airflow in the heater 540 ". Any number of layers or other obstructions 5% and openings in any suitable direction 5 9 1 can be used. 19c and 19d show different embodiments of the heating furnaces 592, 592, in which the walls 594, 5 94 of the heating elements 595, 595, form a passage through which the exhaust airflow 100 can flow. The airflow flow channels 593, 593, can Formed by a wall that is defined and adjacent to a swirling gas channel, such as the tortuous channel shown in Figure 19c, or a wall of a non-spiral gas channel, such as shown in Figure 19d. Or The curved channel shown in Figure 19c may have more turns than shown, or its bending angle may be larger or smaller than the angle shown. The surface of walls 594, 5 94, may not: It is made by corroding the material eroded by the airflow 100, or it is plated with such materials, such as nickel alloy as discussed above, or it is plated with nickel alloy. It can also be coated with different materials depending on the operation of the heater. The length of the heating element needs to be long enough / Or strong, or the gas flow channel needs to be long enough or the number of turns needs to be sufficient, so that the exhaust gas flow 100 can be heated from room temperature to at least about 40 (TC) in only one pass. The furnace can heat the exhaust gas flow 100 To at least about 500 ° C or at least about 600 ° C. The heating element 595, 595 'can also be surrounded by heat-insulating substances to concentrate the heat energy inward and prevent the heat energy from escaping. Page 55 This paper applies the Chinese National Standard (CNS) ) A4 size (210 X 297 mm) (Please read the notes on the back before filling this page)

n ϋ n I n^aJ· n ϋ I ϋ I I I 經濟部智慧財產局員工消費合作社印製 553761 A7 B7 五、發明說明() 可被置換之催化劑 (請先閱讀背面之注意事項再填寫本頁) 為確保催化劑255(包括催化性表面257)可提供足夠的 氣體緩減效果,應在其有效期間過了後即加以更~換。如 上述,在催化性反應器250内的催化性物質255之有效 期在六個月以上或可進行處理100,000次:。在第8圖所 示的催化性緩減系統200之實施例中,該催化性反應器 係被燒熔或永久嚴密地固定在内線氣體加熱器240及交 錯流動之熱交換器360上,以防止排出氣體内諸如HF之 類的有毒氣體逸散。在接觸HF蒸氣後,會對人體肺部及 其他身體組織造成嚴重傷害。由於此安全設計,因此在 更換催化性物質255時,需將整個催化性反應器250、 加熱器240及熱交換器360 —起換掉。 第20-25圖顯示催化性反應器250之例示性實施例, 其係將更換催化劑的過程簡化。置換催化性緩減系統中 的催化劑時,這些實施例代表在更換催化劑期間可大幅 節省時間及物質,並縮短基材處理系統間置的時間,同 時又能維持一個對操作員而言相當安全的操作環境。 經濟部智慧財產局員工消费合作社印製 第20圖顯示一内含催化性物質255(該催化性物質係指 催化性表面和/或高表面積結構)之催化性反應器25〇的實 施例。示於第20圖之催化性反應器250的壁253係為圓 柱體形,但其可為任何適當的形狀。第20圖之催化性反 應器250包含兩個通道610、612,其係可供置換已用過 的催化劑255。每一通道在其遠端均包含一凸緣614、 第56頁 &gt;紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) -- 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 624。在催化性反應器250操作時’以兩個通道蓋630、 635將通道610、612密封。通道蓋63〇、63 5係以適當 的連接機制連接在通道6 1 0、6 1 2上。例如,可用螺釘穿 過凸緣614、624再連到通道蓋63 0、635上。或者,可 以夾子或黏膠將通道蓋630、635固定在凸緣614、624 上,或在通道蓋630、635及凸緣614、624間做一螺紋 或以磨擦固定方式加以固定。通道蓋630、635可包含一 由諸如氧化鋁之類的機械性陶瓷製造成的連接部分631, 及一種由諸如氧化鋁纖維之類的陶瓷所製造成的絕緣部 分632,以降低操作時由催化性反應器250所散失的熱 能。 通道62 0可用來在更換催化劑時,藉真空將催化性_物 質25 5…吸出,如第21圖所示。除去蓋635,然後以任何 適合連接真空管的方式將由諸如聚乙烯或聚丙烯物質製 成之真空管64 0插入通道620中或緊鄰著通道620。一 真空產生器650會產生一個足夠將催化性物質255移出 催化性反應器250的真空或壓力差。真空產生器650可 使催化性物質255自催化性反應器250被傳送通過管線 640和/或655到達催化劑收集器660中。該催化劑收集 器660包含一入口 661及出口 6 62。催化性物質255係 被放置於催化劑收集器660中。從催化性反應器250中 移出催化性物質255後,入口 661及出口 662即被密封, 且含有已用完之催化性物質255的催化劑收集器660, .即可做進一步處理或丢棄。可在出口 662處加裝一個濾 第57頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -----------------I--訂---丨丨丨丨丨 (請先閱讀背面之注意事項再填寫本頁) 553761 A7n ϋ n I n ^ aJ · n ϋ I ϋ III Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 B7 V. Description of the invention () Catalysts that can be replaced (Please read the precautions on the back before filling this page) In order to ensure that the catalyst 255 (including the catalytic surface 257) can provide sufficient gas mitigation effect, it should be replaced after its effective period has passed. As described above, the catalytic substance 255 in the catalytic reactor 250 is valid for more than six months or can be treated 100,000 times :. In the embodiment of the catalytic mitigation system 200 shown in FIG. 8, the catalytic reactor is melted or permanently fixed to the internal gas heater 240 and the staggered heat exchanger 360 to prevent Toxic gases such as HF escape from the exhaust gas. Exposure to HF vapor can cause severe damage to human lungs and other body tissues. Due to this safety design, when the catalytic substance 255 is replaced, the entire catalytic reactor 250, the heater 240 and the heat exchanger 360 need to be replaced together. Figures 20-25 show an exemplary embodiment of a catalytic reactor 250, which simplifies the process of catalyst replacement. When replacing the catalyst in a catalytic mitigation system, these embodiments represent a significant time and material savings during catalyst replacement, and reduce the time between substrate processing systems, while maintaining a fairly safe for the operator Operating environment. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Figure 20 shows an embodiment of a catalytic reactor 25 containing a catalytic substance 255 (the catalytic substance refers to a catalytic surface and / or a high surface area structure). The wall 253 of the catalytic reactor 250 shown in Fig. 20 is cylindrical, but it may be of any suitable shape. The catalytic reactor 250 of FIG. 20 includes two channels 610, 612, which can be used to replace the used catalyst 255. Each channel includes a flange 614 on its far end, page 56 &gt; Paper size applies Chinese National Standard (CNS) A4 (210 X 297 public love)-553761 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention () 624. When the catalytic reactor 250 is in operation, the channels 610, 612 are sealed with two channel covers 630, 635. The channel covers 63 and 63 are connected to the channels 6 10 and 6 1 2 with an appropriate connection mechanism. For example, screws may be passed through the flanges 614, 624 and then connected to the channel covers 63 0, 635. Alternatively, the channel covers 630, 635 may be fixed to the flanges 614, 624 with clips or glue, or a thread may be formed between the channel covers 630, 635 and the flanges 614, 624 or fixed by friction. The channel cover 630, 635 may include a connecting portion 631 made of a mechanical ceramic such as alumina, and an insulating portion 632 made of a ceramic such as alumina fiber, to reduce catalysis during operation. Thermal energy lost by the sexual reactor 250. The channel 62 0 can be used to suck out the catalytic material 25 5... By vacuum when the catalyst is replaced, as shown in FIG. 21. The cover 635 is removed, and then a vacuum tube 640 made of a material such as polyethylene or polypropylene is inserted into or adjacent to the channel 620 in any manner suitable for connecting the vacuum tube. A vacuum generator 650 generates a vacuum or pressure differential sufficient to remove the catalytic substance 255 out of the catalytic reactor 250. The vacuum generator 650 may cause the catalytic substance 255 to be transferred from the catalytic reactor 250 through the lines 640 and / or 655 to the catalyst collector 660. The catalyst collector 660 includes an inlet 661 and an outlet 624. The catalytic substance 255 is placed in a catalyst collector 660. After the catalytic substance 255 is removed from the catalytic reactor 250, the inlet 661 and the outlet 662 are sealed, and the catalyst collector 660 containing the used catalytic substance 255 can be further processed or discarded. A filter can be installed at the outlet 662. The paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) ----------------- I- -Order --- 丨 丨 丨 丨 丨 (Please read the notes on the back before filling this page) 553761 A7

經濟部智慧財產局員工消費合作社印製 五、發明說明() 器665’以確保廢氣668中所含的催化性物質255或其 他物質之含量已達最低。之後,將來自催化劑源之新鮮 的催化性物質255加到催化性反應器250中。再將蓋635 蓋回通道620上,並除去通道610之蓋63 0。將來自催 化劑源之一真空管675插入通道610中,並以類似但與 移除催化性物質2 5 5相反的方式添加一新:的催化性物質 255。 或者’以通道620做為入口通道,且以通道610做為 出口通道。可如所示分別執行該移除及傳送程序,或是 同時執行’亦即將通道蓋630、635同時打開,且將真空 管640、675同時連接到通道610、620中。或者,也可 以一個通道同時做為出口及入口通道,或同時提供多個 入口通道和/或出口通道。在一例子中(未示出),可將一 或多個通道610、620置於催化性反應器250之外。例如, 將通道610置於加熱器24〇及催化性反應器25〇入口 251 所形成的直線間,並將通道62〇置於加熱器36〇及催化 性反應器250出口 252所形成的直線間。如此一來,已 用掉的催化性物質255可由出口 252移除並穿過通道 620’之後再由通道610穿過入口 251來添加新鮮的催化 性物質2 5 5。同樣的,可由通道61 0來移除催化性物質 2 55,並由通道620來傳送催化性物質255 ,或是用催化 性反應器外的一個通道來移除並傳送該催化性物質2 5 5。 在重新填入催化性物質2 5 5之前、之間或之後,可將 一 '根附有攝-影機放―細身伸入催化性反應器2 5 0中,檢查 第58頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -1------I--^---— II--^illn--- (請先閱讀背面之注意事項再填寫本頁) # 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 並確保已用過的催化性物質2 5 5已完全被移除,戒是新 的催化性物質255已完成充填,和/或以該攝影機來檢查 反應器是否有任何腐蝕或損害。為使排出氣流速率一致 且均勻’最好是將所有已用過的催化劑完全移除 亦可 以定期移除一小部分的催化劑。 或者,該細棒上亦可包含一超音波喇叭或類似的装置, 以便將任何殘存在反應器25〇或通道612、62 0中的催化 性物質255加以破壞。該超音波喇叭可放射超音波頻率。 亦可使用其他可機械性攪拌器將結塊的催化劑加以破 壞。 第22圖顯示該催化性反應器25〇另一實施例之部分上 視圖,其係可輕易地由反應器容器750中被釋放出來。 該反應器容器750可被焊接或以其他方式緊緊地固定在 加熱器240及熱交換器360之端部。反應器容器750包 含數個壁760,這些壁並界定出一個空間76 5。該空間765 係可由其頂端打開或操作,以便將該催化性反應器250 置入其中或將催化性反應器250移出。反應器容器750 包含一個可連接到催化性反應器250凸緣254之凸緣 764。該凸緣可以是諸如傳統KF形式的夾子,或以任何 適當的連接方式加以固定。反應器容器壁760可包含數 個能於催化性反應器250上接受安定板(stabilizers)710、 720之溝槽770、780。如第23圖所示,該安定板可以是 連接於催化性反應器250之壁253上的平行板710、720, 以便藉由滑動接合分別與溝槽770、780相接。催化性反 第59頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention () 665 ’to ensure that the content of the catalytic substance 255 or other substances in the exhaust gas 668 has reached a minimum. Thereafter, fresh catalytic material 255 from the catalyst source is added to the catalytic reactor 250. Replace the cover 635 on the channel 620, and remove the cover 630 of the channel 610. A vacuum tube 675 from one of the catalyst sources was inserted into the channel 610 and a new one: a catalytic substance 255 was added in a similar manner but in the opposite manner to removing the catalytic substance 2 5 5. Or 'use channel 620 as the entrance channel and channel 610 as the exit channel. The removal and transfer procedures may be performed separately as shown, or they may be performed simultaneously, that is, the channel covers 630, 635 are opened simultaneously, and the vacuum tubes 640, 675 are connected to the channels 610, 620 at the same time. Alternatively, one channel can be used as both the outlet and inlet channels, or multiple inlet channels and / or outlet channels can be provided at the same time. In one example (not shown), one or more channels 610, 620 may be placed outside the catalytic reactor 250. For example, the channel 610 is placed between a straight line formed by the heater 24o and the catalytic reactor 25o inlet 251, and the channel 62o is placed between the heater 36o and the catalytic reactor 250 outlet 252. . In this way, the used catalytic material 255 can be removed by the outlet 252 and passed through the channel 620 ', and then passed through the channel 610 through the inlet 251 to add fresh catalytic material 2 5 5. Similarly, the catalytic substance 2 55 can be removed by the channel 61 0 and the catalytic substance 255 can be transported by the channel 620, or the catalytic substance can be removed and transported by a channel outside the catalytic reactor 2 5 5 . Before, during, or after refilling the catalytic substance 2 5 5, you can put a 'camera-camera attached' into the catalytic reactor 2 50, and check that the paper size on page 58 is applicable. China National Standard (CNS) A4 Specification (210 X 297 mm) -1 ------ I-^ ---- II-^ illn --- (Please read the precautions on the back before filling in this Page) # 553761 Printed by A7 B7, Consumer Cooperative of Intellectual Property Bureau of the Ministry of Economic Affairs 5. Inventory () and ensure that the used catalytic substances 2 5 5 have been completely removed, or that new catalytic substances 255 have been completed Fill, and / or use the camera to inspect the reactor for any corrosion or damage. In order to make the exhaust gas flow rate uniform and uniform ', it is better to completely remove all used catalysts, and also to periodically remove a small part of the catalysts. Alternatively, the thin rod may include an ultrasonic horn or the like to destroy any catalytic substance 255 remaining in the reactor 25 or the channels 612 and 62. The ultrasonic horn can emit ultrasonic frequencies. Other mechanical stirrers can also be used to destroy the agglomerated catalyst. Fig. 22 shows a partial top view of another embodiment of the catalytic reactor 25, which can be easily released from the reactor vessel 750. The reactor vessel 750 may be welded or otherwise tightly secured to the ends of the heater 240 and the heat exchanger 360. The reactor vessel 750 contains several walls 760 which define a space 76 5. This space 765 can be opened or operated from its top in order to place or remove the catalytic reactor 250 therein. The reactor vessel 750 contains a flange 764 that can be connected to the flange 254 of the catalytic reactor 250. The flange may be a clip such as a conventional KF, or secured in any suitable manner. The reactor vessel wall 760 may include a plurality of grooves 770, 780 that can receive stabilizers 710, 720 on the catalytic reactor 250. As shown in FIG. 23, the stabilizer plate may be parallel plates 710 and 720 connected to the wall 253 of the catalytic reactor 250 so as to be connected to the grooves 770 and 780 by sliding joints, respectively. Catalytic reaction page 59 This paper size applies to Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page)

· ϋ ϋ I _1 ϋ n 1^ffJ« n ·1 l I n n n I 553761 A7 B7 五、發明說明() 應器250中可具有一或數個這類的安定板及相對應的溝 槽’或者,亦可以不含任何安定板及溝槽。 當催化性反應器250中的催化性物質255需被重新充 填時,可以N2將催化性緩減系統冷卻。之後,操作員可 鬆開夾子將催化性反應器250由反應器容器750移出, 以蓋子790將端部251、252固定,如此即·,可將催化性反 應益250安全地固定住。在一例子中,蓋子790的設計 類似通道蓋630、635。之後,再將重新添裝了新催化性 物質255之催化性反應器250放回反應器容器750中, 此時,催化性緩減系統200即已準備好,可進行將製程 排出氣流1 00加以緩減的程序。 或者,可將具有用過的催化性物質2 5 5之催化性反應 器2 50自反應器容器750中移出,然後以抽真空方式將 催化性物質255自催化性反應器250中移出。加入新催 化性物質255後,再將催化性反應器250放回反應器容 器750中。 第24及25圖為第22、23圖所示實施例的其他變化, 在此例子中,催化性反應器250及反應器容器850的橫 斷面均為長方形。反應器容器850包括可界定出一空間 865之數個壁860,該空間係可接受催化性反應器250及 凸緣864,以將其連接至催化性反應器250之凸緣254 上。反應器容器850包括一個由催化性反應器250項部 延伸出來的邊875。催化性反應器250亦包含了位於端 部251、252之細溝880。如第25圖所示(注意··在這裡 第60頁 (請先閱讀背面之注意事項再填寫本頁) ·1111111 — — — — — — — — I. 經濟部智慧財產局員工消費合作社印製 士 wife I? 田由圃Η定摄s (CMS)Α4規格(210 X 297公釐) 經濟部智慧財產局員工消費合作社印製 553761 A7 B7 五、發明說明() 為了讓圖形清晰之故,特地省略了凸緣未畫出),細溝8 8 0 延伸穿過催化性反應器250之頂部256,且一薄板895 可插入該細溝開口 885,並穿過細溝88〇以覆蓋並密封 催化性反應器250之端部251、252。並可以一 0-型密封 環8 90圍繞開口 885以便薄板895緊密地固定在細溝880 上並防止任何洩漏。 : 在置換催化性反應器250時,先如上述以氮氣將該催 化性緩減系統200冷卻。將薄板895插入細溝880,然 後自反應器容器850内取出催化性反應器250,並將其 拋棄。將裝有新催化性物質2 5 5之催化性反應器2 5 0放 入反應器容器850内。薄板可連接到頂端256處,例如, 催化性反應器250上以覆蓋開口 885,和/或防止放錯位 置。如第2 2及2 3圖之實施例所示,亦可用新的催化劑 255來取代催化性反應器250中已用過的催化劑255,而 不是將催化性反應器250整個拋棄。 氣體緩減 可處理基材30之基材處理設備925的另一實施例如第 26圖所示。其係包含了一個諸如化學氣相沉積室(CVD) 之類的製程室935,例如SACVD室及HDP CVD室,此 兩者均為加州聖塔拉市的美商應材公司所出售的,並詳 述於下列專利中:核准給Chang等人之美國專利第 5,207,836號、核准給Shang等人之美國專利第5,788,778 號、核准給shrotriya等人之美國專利第5,843,239號、 第61頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁)· Ϋ ϋ I _1 ϋ n 1 ^ ffJ «n · 1 l I nnn I 553761 A7 B7 V. Description of the invention () The reactor 250 may have one or several such stabilizer plates and corresponding grooves' or , Also without any stabilizer and groove. When the catalytic substance 255 in the catalytic reactor 250 needs to be refilled, the catalytic mitigation system can be cooled by N2. Thereafter, the operator can release the clip to remove the catalytic reactor 250 from the reactor vessel 750, and fix the ends 251, 252 with the cover 790. In this way, the catalytic reaction benefit 250 can be securely fixed. In one example, the cover 790 is similar in design to the access covers 630,635. After that, the catalytic reactor 250 refilled with the new catalytic substance 255 is put back into the reactor container 750. At this time, the catalytic reduction system 200 is ready, and the process can be discharged from the gas stream 100. Mitigation procedures. Alternatively, the catalytic reactor 2 50 having the used catalytic substance 2 5 5 may be removed from the reactor vessel 750 and the catalytic substance 255 may be removed from the catalytic reactor 250 in a vacuum manner. After adding the new catalytic substance 255, the catalytic reactor 250 is returned to the reactor vessel 750. Figures 24 and 25 show other variations of the embodiment shown in Figures 22 and 23. In this example, the cross sections of the catalytic reactor 250 and the reactor vessel 850 are rectangular. The reactor vessel 850 includes a number of walls 860 that define a space 865 that can accept the catalytic reactor 250 and the flange 864 to connect it to the flange 254 of the catalytic reactor 250. The reactor vessel 850 includes a side 875 extending from the 250 reactor section of the catalytic reactor. The catalytic reactor 250 also includes fine grooves 880 at the ends 251,252. As shown in Figure 25 (Attention ... • Page 60 here (please read the notes on the back before filling out this page) · 1111111 — — — — — — — — I. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Wife I? Photo by Tian Youpu (CMS) A4 (210 X 297 mm) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 B7 V. Description of the invention () In order to make the graphics clear, it has been omitted The flange is not shown), the fine groove 8 8 0 extends through the top 256 of the catalytic reactor 250, and a thin plate 895 can be inserted into the fine groove opening 885 and penetrate the fine groove 88 ° to cover and seal the catalytic reactor. 250 的 端 部 251、252。 250 end 251,252. A 0-shaped sealing ring 8 90 can be used to surround the opening 885 so that the thin plate 895 is tightly fixed on the narrow groove 880 and prevents any leakage. : When replacing the catalytic reactor 250, first cool the catalytic reduction system 200 with nitrogen as described above. The thin plate 895 is inserted into the narrow groove 880, and then the catalytic reactor 250 is taken out of the reactor vessel 850 and discarded. A catalytic reactor 250 containing the new catalytic substance 255 is placed in a reactor vessel 850. The sheet may be attached to the top 256, for example, the catalytic reactor 250 to cover the opening 885, and / or prevent misplacement. As shown in the embodiments of Figs. 22 and 23, a new catalyst 255 can also be used to replace the used catalyst 255 in the catalytic reactor 250, instead of discarding the entire catalytic reactor 250. Gas Reduction Another embodiment of the substrate processing apparatus 925 capable of processing the substrate 30 is shown in FIG. It includes a process chamber 935 such as a chemical vapor deposition chamber (CVD), such as the SACVD chamber and the HDP CVD chamber, both of which are sold by American Applied Materials, Inc. of Santa Clara, California, and Details are described in the following patents: U.S. Patent No. 5,207,836 to Chang et al., U.S. Patent No. 5,788,778 to Shang et al., U.S. Patent No. 5,843,239 to Shrotriya et al., P. 61 China National Standard (CNS) A4 Specification (210 X 297 Public Love) (Please read the precautions on the back before filling this page)

經濟部智慧財產局員工消費合作社印製 553761 五、發明說明() 核准給Robles等人之美國袁免丨哲 ^ 國專利弟6,009,827號、及核准Printed by the Consumers' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 V. Description of the invention () US Yuan Xuan, approved by Robles et al.

Mlaad等人之美國專刺筮 】弟6,〇1 3,584號中,以上這些 專利内容均以參考文獻方式 馱万式併入本文中。這類製程室可 用於多製室積體處理系統中,你 ^ τ 例如核准給Maydan等人之 美國專利第4,951,601號中,装如—.^ Τ 其内容以參考又獻方式併入 本文中。在此所示製程室935 ' 、 &lt;例子,係:適合用來處理 諸如半導體晶圓之基材30,例如梦或坤化鎵晶圓或玻璃 或陶资基材。所示僅功說明本發明之用,本發明範轉並 不僅限於此。 製程室935可設計成能於基材上沉積含梦層,例㈣ 聚合物、氮切、氧化梦或金屬梦;或是能於基材上沉 積-金屬層或内含金屬的薄層或任何形式的薄層。如第 26圖所示,CVD系統包商一沉積室935。在沉積室935 中有個可將製程軋體引入系統中的氣體分散器94 在所示帛26圖之另-例子中,㈣分散$ 94〇可以是一 種歧管或喷頭942。或者,可將氣禮入口從製程室935 之壁944或地板964延伸出去。氣體分散器94〇可將製 程氣體分散至基材30附近的處理區9 5〇中。當製程控制 器958,例如電腦控制系統,打開氣流閥時,製程 氣體就會經由供應管路952由製程氣體供應源954被傳 送至製程室93 5中。 製程室935中的支架960可支持基材3(^在該支架96〇 上還可提供一個支持電極962。該電極962可與基材30 上方的一個電極964互成電容搞合,以激發處理區950 第62頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) --— II---I I--裝------ - 訂---I I I ! (請先閱讀背面之注意事項再填寫本頁) 553761 A7 --- B7 五、發明說明() (請先閱讀背面之注意事項再填寫本頁) 中的t程氣體為電漿。在第26圖所示的例子中,電極964 乃是製程室935的天花板。電源970可藉由一供電網路 972來提供電力給電極964,且支持電極962係被接地; 或可將上述安排反過來做。典型的情況是以RF電源來供 電給電極962、964。支架960可包含一個加熱機制976, 其係包含一個電阻加熱器或可於基材3〇附:近循環之可傳 熱的氣體。支架960亦可選擇性地包含一個機械性裝置 或靜電夾(未示出),這些裝置或靜電夾之表面係可與基 材30接合。這些表面也可含有可保留熱傳送氣體(例如, 乱氣)之溝槽,以控制並維持基材3 〇之溫度。 經濟部智慧財產局員工消費合作社印製 操作時,將製程室935抽真空至低壓,然後將一基材 30由一真空載入室(未示出)中移到製程室93 5之處理區 950。將製程氣體經由製程氣體供應源954及氣體分散器 9 40引入製程室935中。製程室935中的氣體一般係維 持在低壓。位於處理區95 0之製程氣體會形成一電1。 製程室935中的電漿係由供給至電極964之RF電位以電 容方式所產生的。或者,可將一 RF電流施於一謗導線圈 (未示出)上,來謗導所耦合的電能進入製程室935中並 於電聚區950處形成電装。施加在電極964或謗導線圈(未 示出)上之RF電流頻率一般係介於約50kHz至約60MHz 間,吏好是約13.56 MHz。在另一例子中,亦可在磁增 強反應器中藉由電子迴旋,共振來提高此經由電容方式所 產生的電漿,其係以一諸如永久磁鐵或磁線圈的磁場產 生器,來提供一個能增加處理區95 0之電漿密度與均勻 第63頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A7 ------ B7 五、發明說明() 度的磁場。 (請先閱讀背面之注意事項再填寫本頁) 包含製程氣體及製程副產品之排出氣流9 8 〇係經由能 將製程室935中的壓力降至1〇·3托耳之排氣系統982排 出製程室935外。排氣系統982包含可通往一或多個可 抽取製程室氣體之幫浦(例如,高真空幫浦)的排氣管 9 85。排氣管985含有一個節氣閥987 ,其:係可控制製程 室935内的氣壓。同時,亦可選擇性地採用光學終點偵 測技術來決定製程是否已完成,其係藉由測量製程室93 5 内氣體的發射光強度或基材30上進行處理的那層薄膜之 反射光強度來達成。 在一典型基材處理過程中,基材30係被放置在製程室 935内的支架960上,將内含反應性氣體的製程氣體經 氣體分散器940引至處理區950。舉例來說,可用内含 一或多種 SiH4、C02、SiClH2、H2、N20、Si(OC2H5)4、NH3、 經濟部智慧財產局員工消費合作社印製 及N2之製程氣體,在化學氣相沉積(CVD)製程中產生一 種諸如Si〇2或SisN4之類的絕緣或介電材料。此外或或 者,亦可在沉積室内形成一内含金屬元素、金屬化合物 或金屬合金之金屬層。舉例來說,可以内含一或多種 WF0、&amp;、及S1H4之製程氣體來沉積一層含鎢的材料; 以内含MoCU及I或類似物之製程氣體來沉積一層含鉬 的材料;或以混合了 Ar或Η:或此二者之aic13或A1(CH3)3 製程氣體來沉積一層含鋁的材料。可如上述,在製程室 935内激發製程氣體’或於另一室中進行激發,例如在 電漿氣體或微波激發氣體下來處理基材3〇。已激發的反 第64頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 3761 A7 五、發明說明( 應性氣體分解並沉積材料於基材3〇之表面上。製程進行 間或進行後,由已用過的製程氣體及氣態副產品所組成 的排出氣流1 0 0會被排出製程室9 3 5外。 雖然沉積製程係設計成最好是將欲沉積物質沉積在基 材30表面上,但這些物質同樣也會被沉積在製程室935 内。為能同步清潔製程室935,可定期使:用乾式清潔程 序來清潔或餘刻這些不欲求的沉積物。在一例子中,此 清潔程序係藉由在另一遠處的製程室990中啟動或激發 一清潔氣體。如美國專利第5,788,778號中所述的微波產 生器992,可活化一清潔氣體,當控制器958打開節氣 閥996時’此活化的清潔氣體即可經由清潔氣體供應源 9 94被供應並傳送至遠處的製程室99〇。或者,該清潔氣 體亦可被謗導式地或電容式地在製程室935中被激發。 已活化的清潔氣體經由氣體分散器940被引入製程室935 中’以清潔或蝕刻任何殘存在製程室93 5中的沉積物。 可提供一流量限制器以便讓製程室93 5及另一遠處的製 程室990間可形成一壓力差。 在一例子中,清潔氣體可包含流速介於每分鐘約1至 2公升之NF3。一般認為在另一遠處的製程室990(或是製 程室935)中分·解的NF3,可提供能钕刻製程室935内矽 殘留物之氟自由基I但是,約9q〇A或90%以上的氟自由 基會彼此結,舍形£2氣體,而被排出在排出氣流100中。 排出氣流1 00的組成分與排出氣流80相當不同,排出氣 流8 0主要是由已用過的製程氣體及製程副產物所組成。 第65頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) · H 1 I n ϋ an n 訂--------- 553761 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明( 相反的;p2的排出氣流100中含有相當高比例的f2。 舉例來說,視製程情況而定,排出氣流i 〇〇中的F2濃度 可高達約90%。其他的製程或製程情況,可產生含F2比 例在50%以上的排出氣流1〇〇,或是含&amp;比例在1〇%以 上的排出氣流100。或者,當使用内含氟的製程氣體時, 亦會產生 F2,例如 CF4、c2F6、、CHIV、%、、 CH3P、c4:f8 ' ch2:f2、c4;p6等製程氣體。再者,在能處理 其他基材製造程序(例如,蝕刻或後蝕刻程序)的製程室 935中’亦會產生含h的排出氣流。排出氣流可在基材 處理則、處理中、或處理後生成。在一例子中,排出氣 流係在基材處理後,或清潔製程室時產生的。 最好是在將排出氣流1〇〇排出前,先儘量降低排出氣 流100中的F2含量《已知將排出氣流丨〇〇通過一催化劑 上方可減低排出氣流1 〇〇中的F2含量。此催化性緩減步 驟亦可在添加物存在下進行。在一例子中,此添加物包 括含氫及含乳的物質,例如h2o、H202、醇類、含幾基 之氣體、H2及〇2,等等。在催化劑存在下,水及^ _可 轉變成易潔淨之和/或可被排放的HF及氧氣。一般相信 其係羥由下列反應式而達成: _ 4 F2 + 2 H20 + 催化劑4 HF + 02 〇2可被車盡,HF則可輕易地藉由溶於水之後來排放。因 此,已知内含F2的排出氣流1〇〇可用包含氫及氧的添加 物來進行緩減。 在内含F2的排出氣流中添加水之類的添加物後而能緩 第66頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 一裝·! I 訂·!-Mlaad et al., U.S. Patent No. 6,010,3,584, the contents of these patents are incorporated herein by reference. This type of process chamber can be used in a multi-chamber integrated processing system. You, for example, U.S. Patent No. 4,951,601, approved to Maydan et al., Such as —. ^ The content of which is incorporated herein by reference. . The process chamber 935 'shown here is, for example, a system suitable for processing substrates such as semiconductor wafers 30, such as dream or Kunhua gallium wafers or glass or ceramic substrates. The illustrations are merely to illustrate the purpose of the present invention, and the present invention is not limited to this. The process chamber 935 can be designed to deposit a dream-containing layer on a substrate, such as a polymer, nitrogen cut, oxidized dream, or metal dream; or it can deposit a metal layer or a thin layer containing metal on the substrate or any Form of thin layer. As shown in FIG. 26, the CVD system includes a deposition chamber 935. In the deposition chamber 935 there is a gas disperser 94 that can introduce the process roll into the system. In another example of the figure 26 shown, the plutonium dispersion $ 940 can be a manifold or nozzle 942. Alternatively, the salute entrance can be extended from the wall 944 or floor 964 of the process room 935. The gas disperser 940 can disperse the process gas into the processing area 950 near the substrate 30. When the process controller 958, such as a computer control system, opens the air flow valve, the process gas is transferred from the process gas supply source 954 to the process chamber 935 via the supply line 952. The support 960 in the process chamber 935 can support the substrate 3 (a support electrode 962 can also be provided on the support 96. The electrode 962 can be combined with an electrode 964 above the substrate 30 to form a mutual capacitance to stimulate processing. Zone 950, page 62 This paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 mm) --- II --- I I--install -------order --- III! ( Please read the notes on the back before filling this page) 553761 A7 --- B7 V. Description of the invention () (Please read the notes on the back before filling this page) The gas in the t-process is plasma. In Figure 26 In the example shown, the electrode 964 is the ceiling of the process room 935. The power source 970 can provide power to the electrode 964 through a power supply network 972, and the support electrode 962 is grounded; or the above arrangement can be reversed. Typically, the electrodes 962, 964 are powered by an RF power source. The support 960 may include a heating mechanism 976, which includes a resistance heater or a heat-transmitting gas that can be attached to the substrate 30. Near circulation. The 960 can also optionally include a mechanical device or electrostatic clip (not shown). These devices or The surfaces of the electrostatic clips can be bonded to the substrate 30. These surfaces can also contain grooves that can retain heat transfer gases (eg, turbulent gas) to control and maintain the temperature of the substrate 30. Consumption by employees of the Intellectual Property Bureau of the Ministry of Economic Affairs During the cooperative printing operation, the process chamber 935 is evacuated to a low pressure, and then a substrate 30 is moved from a vacuum loading chamber (not shown) to a processing zone 950 of the process chamber 93 5. The process gas is passed through the process gas The supply source 954 and the gas disperser 9 40 are introduced into the process chamber 935. The gas in the process chamber 935 is generally maintained at a low pressure. The process gas located in the processing zone 95 0 will form an electric 1. The plasma in the process chamber 935 is composed of The RF potential supplied to the electrode 964 is generated in a capacitive manner. Alternatively, an RF current may be applied to a conducting coil (not shown) to conduct the coupled electric energy into the process chamber 935 and collect the electricity in the process chamber. An electric device is formed at the region 950. The frequency of the RF current applied to the electrode 964 or the conducting coil (not shown) is generally between about 50 kHz and about 60 MHz, and preferably about 13.56 MHz. In another example, it can also be In a magnetically enhanced reactor Electron cyclotron, resonance to increase the plasma generated by the capacitive method, it uses a magnetic field generator such as a permanent magnet or a magnetic coil to provide a plasma density and uniformity that can increase the processing area 95 0 Paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 553761 A7 ------ B7 V. Description of the invention () Magnetic field (Please read the precautions on the back before filling this page) The exhaust gas stream 98 8 containing the process gas and process by-products is discharged out of the process chamber 935 via an exhaust system 982 that can reduce the pressure in the process chamber 935 to 10.3 Torr. The exhaust system 982 includes an exhaust pipe 9 85 that can lead to one or more pumps (e.g., high vacuum pumps) that can extract process chamber gases. The exhaust pipe 985 contains a throttle valve 987, which can control the air pressure in the process chamber 935. At the same time, it is also possible to selectively use optical endpoint detection technology to determine whether the process has been completed, which is measured by measuring the light emission intensity of the gas in the process chamber 93 5 or the reflected light intensity of the film processed on the substrate 30 To reach. In a typical substrate processing process, the substrate 30 is placed on a support 960 in a process chamber 935, and a process gas containing a reactive gas is introduced to a processing zone 950 via a gas disperser 940. For example, a process gas containing one or more of SiH4, C02, SiClH2, H2, N20, Si (OC2H5) 4, NH3, printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, and N2 can be used in chemical vapor deposition ( A CVD) process produces an insulating or dielectric material such as SiO2 or SisN4. Additionally or alternatively, a metal layer containing a metal element, a metal compound or a metal alloy may be formed in the deposition chamber. For example, a layer of tungsten-containing material can be deposited with one or more of WF0, &, and S1H4 process gases; a process gas containing MoCU and I or the like can be used to deposit a layer of molybdenum-containing material; or mixed Ar or thorium: or aic13 or A1 (CH3) 3 process gas to deposit a layer of aluminum-containing material. As described above, the process gas &apos; may be excited in the process chamber 935 or may be excited in another chamber, for example, the substrate 30 may be treated under a plasma gas or a microwave excitation gas. Excited anti-page 64 This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 3761 A7 V. Description of the invention (Responsible gas decomposes and deposits material on the surface of the substrate 30. Process After or during the process, the exhaust gas stream 100 consisting of the used process gas and gaseous by-products will be discharged out of the process chamber 9 3 5. Although the deposition process system is designed to preferably deposit the substance to be deposited on the substrate Material 30 on the surface, but these materials will also be deposited in the process chamber 935. In order to synchronize the process chamber 935, the dry cleaning process can be used periodically to clean or leave these undesired deposits. An example This cleaning procedure is performed by activating or exciting a cleaning gas in another distant process chamber 990. A microwave generator 992, as described in US Patent No. 5,788,778, can activate a cleaning gas. When the valve 958 opens the throttle valve 996, the activated cleaning gas can be supplied through the cleaning gas supply source 9 94 and transmitted to the remote process chamber 99. Alternatively, the cleaning gas can also be defensively grounded or capacitive. The ground is excited in the process chamber 935. Activated cleaning gas is introduced into the process chamber 935 via a gas disperser 940 to clean or etch any deposits remaining in the process chamber 935. A flow restrictor may be provided to allow A pressure difference may form between the process chamber 935 and another distant process chamber 990. In one example, the cleaning gas may include NF3 at a flow rate of about 1 to 2 liters per minute. It is generally considered that at another distant NF3, which is dissociated and decomposed in process chamber 990 (or process chamber 935), can provide fluorine radicals I capable of engraving silicon residues in process chamber 935. However, about 9qA or 90% or more of fluorine radicals will As a result, the £ 2 gas is discharged into the exhaust gas stream 100. The composition of the exhaust gas stream 100 is quite different from the exhaust gas stream 80, and the exhaust gas stream 80 is mainly composed of the used process gas and process by-products. Page 65 This paper size applies Chinese National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page) · H 1 I n ϋ an n Order ----- ---- 553761 A7 B7 Consumer Cooperatives of Intellectual Property Bureau, Ministry of Economic Affairs Preparation of the invention (opposite; p2 exhaust gas stream 100 contains a relatively high proportion of f2. For example, depending on the process, the concentration of F2 in the exhaust gas stream i 00 can be as high as about 90%. Other processes Or process conditions, an exhaust gas stream with an F2 ratio of 50% or more, or an exhaust gas stream with an &amp; ratio of 10% or more can be produced. Or, when using a process gas containing fluorine, it will also Generate F2, such as process gases such as CF4, c2F6, CHIV,%, CH3P, c4: f8 'ch2: f2, c4; p6. Furthermore, in a process chamber 935 that can handle other substrate manufacturing processes (e.g., etching or post-etching processes), an exhaust gas stream containing h is also generated. The exhaust airflow can be generated during substrate processing, during processing, or after processing. In one example, the exhaust air flow is generated after the substrate is processed, or when the process chamber is cleaned. It is best to reduce the F2 content in the exhaust gas stream 100 before exhausting the exhaust gas stream 100. It is known that passing the exhaust gas stream over a catalyst can reduce the F2 content in the exhaust gas stream 1000. This catalytic mitigation step can also be performed in the presence of additives. In one example, the additives include hydrogen-containing and milk-containing substances, such as h2o, H202, alcohols, gases containing several groups, H2 and O2, and so on. In the presence of a catalyst, water and water can be converted into easily clean and / or HF and oxygen that can be emitted. It is generally believed that its hydroxyl group is achieved by the following reaction formula: _ 4 F2 + 2 H20 + catalyst 4 HF + 02 〇2 can be exhausted, and HF can be easily discharged by dissolving in water. Therefore, it is known that the exhaust gas stream 100 containing F2 can be moderated by additives containing hydrogen and oxygen. After adding additives such as water to the exhaust air stream containing F2, it can be slowed down on page 66. The paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) (Please read the precautions on the back before reading) Fill out this page) One outfit! I order! -

553761 A7 — _______ B7 五、發明說明() 減排出氣流1 0 0的效果卻非預期。一般會極力避免水及 其他内含氧之添加物與内含F2的排出氣流接觸,因為永 會和F2反應形成OF2氣體,一般需將此〇]p2氣體濃度降 至50 ppb以下才能將其釋放至環境中。但是,〇f2氣體 卻沒形成’反而形成了 HF及氧氣◊在一例子中,將催化 劑置於催化性反應器2 5 0中,之後再讓含· {7 2的排出氣流 與添加物氣流通過。 在一例子中,催化性反應器2 5 〇係為催化性缓減系統 2 0 0之一部分。在此例子中,可以一或多個流量調節系 統215、添加物氣體供應室220、和/或前潔淨室230,將 諸如及〇2違類適.當的添加物氣體引到排出氣瀛W 中。例如,在閥224控制下,包含一管道223之適當的 添加物氣體供應室220可讓來自氣體供應源的添加物氣 體或液體流至通道21 0内。添加入能與排出氣流1 〇〇中 的有毒氣體反應之添加物。例如,在一例子中,在排出 氣流100中加入體積比約在0.2%至約20%間的水來分解 F2 ;較好是加入約3.5%至約1〇%間的水;更好是加入約 4°/〇至約5%間的水。其他的添加物氣體,例如氧,亦可 以〇2或空氣或其他可釋出氧之形式或化合物形態,被添 加到排出氣流中。此外,亦可加入諸如氮氣這類不活化 的氣體。 對可緩減F2之催化性緩減系統200特別有用之前潔淨 室230之另一實施例,示於第27圖。在此例子中,一再 循環系統402可將潔淨液(例如水及反應產物)通過前潔 第67頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 1- 1 n 一SOT s emmmg i— f·— 1 emme mmMmm i553761 A7 — _______ B7 V. Description of the Invention () The effect of reducing the emission of air stream 1 0 0 is unexpected. Generally try to prevent water and other oxygen-containing additives from coming into contact with the exhaust gas containing F2, because OF2 will react with F2 to form OF2 gas. Generally, the concentration of this p2 gas must be reduced below 50 ppb to release it. Into the environment. However, the 0f2 gas did not form. Instead, HF and oxygen were formed. In one example, the catalyst was placed in the catalytic reactor 250, and then the exhaust gas stream containing the {7 2 and the additive gas stream were passed through. . In one example, the catalytic reactor 250 is a part of the catalytic reduction system 2000. In this example, one or more of the flow regulating system 215, the additive gas supply chamber 220, and / or the front clean room 230 can be used to direct the appropriate additive gas to the exhaust gas. W in. For example, under the control of a valve 224, a suitable additive gas supply chamber 220 including a pipe 223 may allow additive gas or liquid from a gas supply source to flow into the channel 210. Add additives that react with toxic gases in the exhaust gas stream 1000. For example, in one example, water is added in the exhaust gas stream 100 in a volume ratio of about 0.2% to about 20% to decompose F2; preferably, about 3.5% to about 10% of water is added; more preferably, Water between about 4 ° / 0 and about 5%. Other additive gases, such as oxygen, can also be added to the exhaust gas stream in the form of 02 or air or other forms or compounds that can release oxygen. Alternatively, an inactivated gas such as nitrogen may be added. Another embodiment of a clean room 230 previously useful for a catalytic mitigation system 200 capable of mitigating F2 is shown in FIG. In this example, a recirculation system 402 can pass clean liquids (such as water and reaction products) through Preclean. Page 67 This paper applies Chinese National Standard (CNS) A4 specifications (21 × 297 mm) (Please read first Note on the back, please fill out this page again) 1- 1 n one SOT s emmmg i— f · — 1 emme mmMmm i

經濟部智慧財產局員工消費合作社印製 553761 A7 B7 五、發明說明( 經濟部智慧財產局員工消費合作社印製 々至230再循環。首先以連接到潔淨液體源(例如水源) 之:填單元Μ將儲存槽350充填至一欲求高度。欲求 :益流道370之高度而定。之後,打開嘗浦406。 浦406可自儲存槽35〇中抽取流體。在所示例子中, 儲存槽内的流體為水與諸如二氧化矽及HF這類反應產物 的混合物。在繁浦抽氣的負壓下,這些流體墚過入口 411, 並穿過可去除反應產物顆粒的濾器421。顆粒濾器4门 包含可去除約2μπχ至lmm顆粒的濾器。在—例子中,顆 粒濾器421可去除體積約在7〇μιη以上的顆粒。之後, 濾液由管路431 ,再個別經管路432、434、433被抽至 流體嘴嘴322、342及喉管332。繁浦4〇6亦可以預設 速率,自潔淨液供應源441(例如,水源)抽取新鮮的潔 液,在此例子中是水。新加入的水會導致儲存槽35〇 流到溢流道370中,該溢流道37〇可將溢流部分送到 下水道去。新加入的水可用來維護或調節儲存槽35〇 , 預設之pH值。在一例子中,新加入的水係以每分鐘約〇 25 加侖至約1加侖的速率引入,或是以足夠維持pH值在約 2至約3間的速率被引入。或者,亦可以pH儀或一控制 器來依所量到的pH值來調整所引入水之速率。 也可用内含一程式化控制器510之控制系統5〇〇來控 制幫浦406的操作。控制器5丨〇,可以是一個中央處 器(CPU) ’依預設的程式指令來操作幫浦406,將一定 的水引入排出氣流1 0 0中。舉例來說,當欲緩減之排 氣流10G中含有F2時,可選擇能提供約2%以上,或約 的 淨 溢 酸 中 理 量 出 2% (請先閱讀背面之注意事項再填寫本頁) --------^--------- 第68頁 本紙張尺度適用t國國家標準(CNS)A4規格(210 χ 297公爱) 553761 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 至約20%間,或約4%至約5%間之水量至排出氣流1〇〇 中的幫浦速度。在另一例子中,可在前潔淨室230出口 處設置一個氣體分析器521。控制器510依氣體分析器521 的輸出訊號做出適當反應,並依此輸出訊號來操作繁浦 406及維持水量在一預設值。例如,當水氣或添加物氣 體含量(如氣體分析器52 1所測出的值)降:到預設值以下 時,控制器5 1 0會自動調整幫浦406的抽水速率。或者, 在催化性反應器250下游處加裝一個氣體分析器(未示 出),讓控制器5 1 0可依該氣體分析器所指示的含量高 低進行操作。例如,當F2含量高於預設值時,可增加引 進到排出氣流100中的水量。控制器510包含一電腦可 讀的媒介,其係具有一内建之電腦可讀的程式,可監控 氣體分析器521的輸出訊號。亦可如上述,將控制器51〇 併入到系統控制器中。 催化性缓減系統200也可以是能和各種製程室相容之 自給自足式的積體單元。催化性緩減系統2 0 0可用來降 低許多有毒氣體的含量,包括幾乎所有類型的PFCs及 F2。催化性緩減系統200並不影響製程室之操作,且可 和任何會排放有毒氣體的製程室一起使用。此催化性緩 減系統操作簡單且所佔空間低於40立方英尺。 雖然本發明已藉實施例詳加描述,但其他變化亦屬本 發明之範疇。因此,下列申請專利範圍並不僅限於所述 之實施例。 第69頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) -I I I n — II 一5J— — — — — — I. (請先閱讀背面之注意事項再填寫本頁) 線Printed by the Employees ’Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 A7 B7 V. Description of the Invention (Printed by the Consumers’ Cooperatives of the Intellectual Property Bureau of the Ministry of Economics 々 to 230 for recycling. First, connect to a clean liquid source (such as water): fill the unit Fill the storage tank 350 to a desired height. Desire: depends on the height of the flow channel 370. After that, open the pump 406. The pump 406 can draw fluid from the storage tank 350. In the example shown, the The fluid is a mixture of water and reaction products such as silicon dioxide and HF. Under the negative pressure of the pumping pump, these fluids pass through the inlet 411 and pass through the filter 421 to remove the reaction product particles. The particle filter has 4 doors Contains a filter that can remove about 2μπχ to 1mm particles. In the example, the particle filter 421 can remove particles with a volume of more than about 70μιη. After that, the filtrate is pumped through the pipeline 431 and then individually through the pipelines 432, 434, and 433. To the fluid nozzles 322, 342, and the throat 332. Fanpu 406 can also draw fresh cleansing liquid from the cleaning liquid supply source 441 (for example, water source) at a preset rate, in this example, water. Newly added The water will cause the storage tank 350 to flow into the overflow channel 370, and the overflow channel 37 can send the overflow part to the sewer. The newly added water can be used to maintain or adjust the storage tank 35, the preset pH value In one example, the newly added water system is introduced at a rate of about 025 gallons to about 1 gallon per minute, or at a rate sufficient to maintain the pH between about 2 and about 3. Alternatively, the pH may be Meter or a controller to adjust the rate of the introduced water according to the measured pH value. A control system 500 including a stylized controller 510 can also be used to control the operation of the pump 406. The controller 5 丨 〇 It can be a central processing unit (CPU). The pump 406 is operated according to a preset program instruction, and a certain amount of water is introduced into the exhaust air flow 100. For example, when the exhaust flow 10G to be reduced contains In F2, you can choose to provide more than about 2%, or about 2% of the amount of net overflow acid (please read the precautions on the back before filling this page) -------- ^ ---- ----- Page 68 This paper is applicable to National Standard (CNS) A4 specifications (210 χ 297 Public Love) 553761 Member of Intellectual Property Bureau, Ministry of Economic Affairs Printed by the Industrial and Consumer Cooperatives A7 B7 V. Description of the invention () The amount of water between about 20%, or about 4% to about 5%, to the pumping speed in the exhaust air stream 100. In another example, A gas analyzer 521 is provided at the exit of the front clean room 230. The controller 510 responds appropriately based on the output signal of the gas analyzer 521, and operates the Fanpu 406 and maintains a predetermined amount of water based on the output signal. For example, When the water gas or additive gas content (as measured by the gas analyzer 52 1) drops below the preset value, the controller 5 1 0 will automatically adjust the pumping rate of the pump 406. Alternatively, a gas analyzer (not shown) is installed downstream of the catalytic reactor 250, so that the controller 5 10 can operate according to the level indicated by the gas analyzer. For example, when the F2 content is higher than a preset value, the amount of water introduced into the exhaust gas flow 100 may be increased. The controller 510 includes a computer-readable medium having a built-in computer-readable program that can monitor the output signal of the gas analyzer 521. The controller 51 can also be incorporated into the system controller as described above. The catalytic mitigation system 200 may also be a self-contained integrated unit that is compatible with various process chambers. The catalytic mitigation system 2000 can be used to reduce the content of many toxic gases, including almost all types of PFCs and F2. The catalytic mitigation system 200 does not affect the operation of the process chamber and can be used with any process chamber that emits toxic gases. This catalytic mitigation system is simple to operate and takes up less than 40 cubic feet of space. Although the present invention has been described in detail through the embodiments, other variations are also within the scope of the present invention. Therefore, the scope of the following patent applications is not limited to the embodiments described. Page 69 This paper size applies to Chinese National Standard (CNS) A4 (210 X 297 mm) -III n — II — 5J — — — — — — I. (Please read the precautions on the back before filling this page) line

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553761 Α8 Β8 C8 D8 第89122496號專利案92年5月修正 • 7 i你丁丄移是否.1更原實質小 經濟部智慧財產局員工消費合作社印製 六、申請專利範圍 、; U r,((&gt; I 1 · 一種能處理製程室排出氣流的設備,該設備至少包含 下列: 一個能於激能氣體中處理一基材因而產生排出氣 流的製程加工室; 一個能去除排出氣流中矽成分及氟成分的第一反 應器;及 一個能去除排出氣流中第二種成分的第二反應 器。 2 ·如申請專利範圍第1項所述之設備,其中之第一反應 器係能去除排出氣流中的SiF4。 3 .如申請專利範圍第1項所述之設備,其中之第一反應 器係能去除排出氣流中至少80%的SiF4。 4 ·如申請專利範圍第1項所述之設備,其中之第二反應 器係能去除排出氣流中的過氟化物。 5 .如申請專利範圍第1項所述之設備,其中之第二反應 器至少包含一個能處理該排出氣流的催化性反應器。 6 ·如申請專利範圍第1項所述之設備,其中之第一反應 器包含一個能將潔淨液以和排出氣流相反之方向進行 第71頁 本紙張尺度適用中國國家標準(CNS)A4規格(21〇χ297公釐) (請先閱讀背面之注意事項再填寫本頁) .、可_ 耱· 553761 ABCD 第89122496號專利案92年5月修正 六、申請專利範圍 噴灑的噴嘴。 (請先閱讀背面之注意事項再填寫本頁) 7. 如申請專利範圍第 1項所述之設備,其中之第一反應 器包含一個能將潔淨液噴灑入排出氣流中的喉型喷 嘴。 8. 如申請專利範圍第 7項所述之設備,其中之喉型喷嘴 係能將潔淨液以和排出氣流幾乎相同之方向進行喷 灑。 9 ·如申請專利範圍第 1項所述之設備,其更包含一個能 去除排出氣流中第三種成分的第三反應器。 1 0 ·如申請專利範圍第9項所述之設備,其中之第三反應 器是一個潔淨室。 1 1 . 一種能處理製程室排出氣流的設備,該設備至少包含 下列: 經濟部智慧財產局員工消費合作社印製 一個能去除排出氣流中矽成分及氟成分的第一反 應器,該第一反應器至少包含一個入口及一個出口; 及 一個位於該出口下游處之加熱器。 1 2 ·如申請專利範圍第 11項所述之設備,其中之反應器 第72頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 A8 B8 C8 第89122496號專利案92年5月修正 A、申請專利範園 係能去除排出氣流中之含矽成分。 1 3 · 一種能潔淨製程室排出氣流的設備,該設備至少包含 下列: 一個能接受排出氣流的反應器; 一個能將潔淨液以和排出氣流相反之方向進行噴 灑的噴嘴;及 一個能去除排出氣流中反應產物的濾器。 14.如申請專利範園第13項所述之設備,其更包含一個 能將潔淨液以和排出氣流幾乎相同之方向噴灑入反應 器内的第二噴嘴。 15·如申請專利範圍第14項所述之設備,其中之第一及 第二噴嘴係能以幾乎平行的方向來喷灑潔淨液。 1 6.如申請專利範圍第1 5項所述之設備,其中之第二噴 嘴是一個喉型噴嘴。 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 第 圍 範 利 專 請 中 如 器 應 反 加 增 可 表 的 13積 面 稽 一 含 包 更 其 備 設 之 述 所 質 物 含 包 少 至 備 設 該 備 設 的 流 氣 出 hr 室 程 製 淨 潔 能 種 列 下 頁 3 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公愛) 553761 ABCD 第89122496號專利案92年5月修正 申請專利範圍 一個能接受排出氣流的反應器;及 一個能將潔淨液注入該反應器内的喉型喷嘴。 請 先 閱 讀 背 面 之 注 意 事 項 再 填 1 9.如申請專利範圍第 1 8項所述之設備,其中之反應器 係能接受排出氣流,且該喉型噴嘴係能將潔淨液以和 該排出氣流相同之方向注入該反應器内。 20.如申請專利範圍第 1 8項所述之設備,其中之反應器 更包含數個通道以及能將潔淨液注入該通道内的喉型 噴嘴。 2 1. —種能潔淨製程室排出氣流的設備,該設備至少包含 下列: 一個至少包含四個潔淨液通道的反應器。 2 2. —種能潔淨製程室排出氣流的設備,該設備至少包含 下列: 一個能接受排出氣流及潔淨液的反應器; 一個濾器;及 一個能自反應器内抽取潔淨液並通過該濾器的幫 經濟部智慧財產局員X消費合作社印製 浦。 23.如申請專利範圍第 22項所述之設備,其中之濾器係 能去除直徑約2μιη以上至約1mm的顆粒。 第74頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 ABCD 第89122496號專利案92年5月修正 申請專利範圍 24.如申請專利範圍第 22項所述之設備,其中之幫浦係 能自反應器内抽取潔淨液,通過濾器後,再回到反應 器内。 25 .如申請專利範圍第 24項所述之設備,其更包含一個 潔淨液源,且其中該幫浦係能自該潔淨液源抽取潔淨 液至反應器内。 26 .如申請專利範圍第 25項所述之設備,其更包含一個 控制器,其係能調整從該潔淨液源被抽取至該反應器 内之潔淨液體量。 27.如申請專利範圍第 26項所述之設備,其更包含一個 能偵測反應器内潔淨液狀況的偵測器,且其中之控制 器係能因應該偵測器的訊號而作出適當反應。 28 ·如申請專利範圍第 27項所述之設備,其中之偵測器 為一種pH儀。 經濟部智慧財產局員X消費合作社印製 29. —種能潔淨製程室排出氣流的設備,該設備至少包含 下列= 一個第一潔淨室,其至少包含一個能接受排出氣 流的第一反應器; 一個第二潔淨室,其至少包含一個能接受排出氣 第75頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 A8 B8 C 8 第89122496號專利案92年5月修正 -—----Ef---- 六、申請專利範圍 流的第二反應器;及 (請先閱讀背面之注意事項再填寫本頁) 一個能自第一反應器内抽取潔淨液到第二反應器 内的繁浦。 3 0 ·如申請專利範園第29項所述之設備,其更包含一個 能補償第一及第二反應器間壓力差的壓力補償器。 3 1 ·如申請專利範園第29項所述之設備,其中之幫浦係 能自第一反應内抽取潔淨液並將所抽取潔淨液再送回 到第一反應内。 3 2 ·如申請專利範圍第29項所述之設備,其更包含一個 潔淨液源,且其中該幫浦係能自該潔淨液源抽取潔淨 液至第二反應器内。 3 3 ·如申請專利範圍第29項所述之設備,其更包含一個 控制器,其係能調整從該潔淨液源被抽取至該反應器 内之潔淨液體量。 經濟部智慧財產局員主消費合作社印製 含 包 少 至 備 設 該 備 設 的 流 氣 出 hr 室 程 製 淨 潔 能 Ly.t 種 一 4· 列 下 中 流 氣 出 tE— 入 引 液 淨 潔 將 並 流 氣 出 k« 受 接 能 個 器 應 反 的 器 測 偵 的 況 狀 液 淨 潔 内 器 應 反 測 偵 能 個 頁 76 117 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) ;53761 A8 B8 C8 D8 第89122496號專利案92年5月修正 經 濟 部 智 慧 財 產 局 員 X 消 費 合 作 社 印 製 六、申請專利範圍 35 ·如申請專利範圍第34項所述之設備’更包含一控制 器,其係能因應所偵知之情沉來調整潔淨液性質的控 制器。 3 6 ·如申請專利範圍第3 5項所述之設備’其中之偵測器 包含一種pH儀。 3 7 · ~種能處理製程室排出氣流的設備’該設備至少包含 下列: 一個能接受排出氣流的第一反應器; 一個能接受排出氣流的第二反應器’及 一個能補償該第一及第二反應器間壓力差的壓力 補償器。 3 8 · 一種能處理製程室排出氣流的方法,該方法至少包含 下列: (a) 處理一基材因而產生排出氣流; (b) 去除第一反應器内排出氣流中之含矽及含氟 成份;及 (c) 去除第二反應器内排出氣流中的第二成份。 39·如申請專利範圍第38項所述之方法,其中步驟(〇至 少包含,於步驟(b)之前或之後,催化排出氣流中之一 種反應,以去除排出氣流中之一組成份。 第77頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公楚) ..............費.........、耵.........S (請先閱讀背面之注意事項再填寫本頁} 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 六 ......................訂 (請先閱讀背面之注意事項再填寫本頁:&gt; 命讀專利範圍 4 〇 ·如申清專利範圍第3 8項所述之方法,其中步騾(b)至 少包將潔淨液以和排出氣流相反之方向噴麗入排出氣 流中。 4 1 ·如申请專利範圍第3 8項所述之方法,其中步驟(b)至 少Ci將潔淨液以和排出氣流幾乎相同之方向注入排出 氟流中。 42·〆種能處理製程室排出氣流的方法,該方法至少包含 下列步驟: (a) 去除反應器内排出氣流中之一種組成份;及 (b) 於該反應器下游處加熱該排出氣流。 43·如申請專利範圍第42項所述之方法,其中步驟(a)至 ! 少包含去除排出氣流中含矽物質的步驟^ i 含 包 少 至 法 方 該 法 方 的流 氣 出 «Ε— 室程 製 淨 · · 潔驟 能步 箱 歹 \ 下 經濟部智慧財產局員工消費合作社印製 kr 至散 分 向 方之反 •弓相 内 b 器&gt;jf 應氣 反Μ 。 至杂 流 引 和及氣 流以;出 氣液中排 出淨流該 排潔氣濾 將將出過 V} V) a b c /IV /IV /IV 頁 8 117 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 ABCD 第89122496號專利案92年5月修正 、申請專利範圍 4 5 . —種潔淨製程室排出氣流的方法,該方法至少包含下 列步驟: (請先閱讀背面之注意事項再填寫本頁) (a) 將排出氣流引至反應器内;及 (b) 將潔淨液經喉管注入反應器中。 46 · —種潔淨製程室排出氣流的方法,該方法至少包含下 列步驟: (a) 將排出氣流引至反應器内; (b) 將潔淨液分散至反應器内;及 (c) 自反應器中抽取潔淨液並通過一濾器。 47.如申請專利範圍第 46項所述之方法,其中步驟(c)至 少包含將所抽取之潔淨液再度送回反應器内的步驟。 4 8. —種潔淨製程室排出氣流的方法,該方法至少包含下 列步驟: (a) 將排出氣流引至第一反應器内; (b) 將排出氣流引至第二反應器内;及 經濟部智慧財產局員工消費合作社印製 (c) 讓潔淨液自第一反應器流至第二反應器内。 49.如申請專利範圍第 48項所述之方法,其更包含讓抽 取自第一反應器之潔淨液流回第一反應器的步驟。 5 0. —種潔淨製程室排出氣流的方法,該方法至少包含下 第79頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 經濟部智慧財產局員X消費合作社印製 申請專利範圍 列步驟: U)將排出氣流引至反應器内; (b)將潔淨液引至反應器内;及 (C)偵測該潔淨液或反應器之情況。 51·如申請專利範圍第50項所述之方法,其更包含依照 步驟(c)之反應來調整潔淨液的步騾。 52·如申請專利範圍第50項所述之方法,其中步驟(〇更 包含偵測該潔淨液pH值的步驟。 5 3 · —種處理製程室排出氣流的方法,該方法至少包含下 列步驟: (a) 處理第一反應器内的排出氣流; (b) 處理第二反應器内的排出氣流;及 (Ο補償該第一及第二反應器間之壓力差。 54. —種排出氣流加熱設備,該設備至少包含: 一排出氣流氣體入口; 一排出氣流氣體出口; 一與一氣體流動通道相鄰之壁;及 一可加熱該壁之加熱器; 其中由該排出氣流入口引入之排出氣流,係 在其沿著氣體流動通道流動至該排出氣流出口時 第80頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公愛) .............豐.........、訂.........摹 (請先閱讀背面之注意事項再填寫本頁) 553761 8 8 8 8 ABCD 第89122496號專利案92年5月修正 六、申請專利範圍 經濟部智慧財產局員工消費合作社印製 被加熱。 如令清專利範園第54項所述之設備,其中該氣體流 動通道的長度係足以使該排出氣流被加溫至至少約 4〇〇〇c 〇 5 6 ·如令4專利範®帛54項所述之設備,其中該氣體流 ^通道的長度係足以使該排出氣流只通過該氣體流動 通遒-次即可達到欲求溫度。 5 7 ·如令清專利範圍第5 6項所述之設備,其中該氣體流 動通道的長度係足以使該排出氣流被加溫至約400°C 至約700°C間。 5 8 ·如_請專利範圍第54項所述之設備,其中之加熱器 係足以使該排出氣流被加溫至至少約400,且該排 出氣流的滯留時間係低於3秒鐘。 5 9 ·如_請專利範圍第5 8項所述之設備,其中之加熱器 所佔據的體積少於1,300立方英吋。 60.如_請專利範圍第54項所述之設備,其中之氣體流 動通道為旋繞式的。 第81頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) .............嚷.........、可.........S (請先閱讀背面之注意事項再填寫本頁) 553761 ABCD 第89122496號專利案92年5月修正 經濟部智慧財產局員X消費合作社印製 申讀專利範圍 1 ·如申請專利範圍第 54箱祕、+、、、;w此 ^ . 岡V D4項所述 &lt; 設備,其中之氣體流 動通道係位於數個内部互相連接之通道内。 62 ·如申請專利範圍第 54瑁挤、+,、VW其 朴丄 項所述I設備,其中之氣體流 動通道係由通道中互相交叉的部分來界定。 63·如申請專利範圍帛54項所述之設備,其中之壁至少 包含一個可抵抗排出氣流破壞之内表面。 64.如申請專利範圍第54項所述之設備,其中之壁與加 熱器至少相隔約2 mm。 65 · —種基材處理設備,其至少包含下列: 一個能於激能氣體中處理一基材因而產生排出氣 流的製程加工室; ' 一個暖爐,其至少包含一排出氣流入口、一 排出氣流出口、一與氣體流動通遒相鄰之壁、及 一可加熱該壁之加熱器; 其中由該排出氣流入口供應之排出氣流,係在其 沿著氣體流動通道流動至該排出氣流出口時被加熱器 所加熱。 66·如申請專利範圍第65項所述之設備,其中之暖爐有 一長度L,且該氣體流動通遒具有一由入口起至出口 第82頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公楚) --------- ......................訂.........籲 (請先閱讀背面之注意事項再填寫本頁} 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 六、申請專利範圍 止至少约1.5L的長度。 07 ·如申請專利範圍第65項所述之設備,其中之氣體流 動通道為旋繞式的。 68.如申請專利範圍第65項所述之設備,其更包含一個 能接受已經過暖爐加熱之排出氣流的催化性反應器。 69 ·如申請專利範圍第65項所述之設備,其更包含一個 可接受該排出氣流之熱交換器。 70· —種處理基材及排出氣流的方法,其至少包含下列步 驟: (a) 於處理區中處理一基材,並因而產生排出氣 流, (b) 讓排出氣流通過一氣體流動通道;及 (c) 在排出氣流只通過該氣體流動通道一次的時間 内,將排出氣流加熱至預設之溫度。 經濟部智慧財產局員.工消費合作社印製 7 1 ·如申請專利範圍第 70項所述之方法,其至少包含讓 排出氣流通過該氣體流動通道,使得該排出氣流在該 氣體流動通道内的滯留時間約低於3秒鐘。 72 ·如申請專利範圍第 70項所述之方法,其至少包含讓 第83頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公袭·) 553761 ABCD 第89122496號專利案92年5月修正 六、申請專利範圍 排出氣流通過該旋繞式的氣體流動通道。 73· 一種能處理製程室排出氣流的設備,該設備至少包含 下列: 一個催化性反應器,其至少包含一排出氣流入口、 一排出氣流出口、及一可容納該催化性物質的内部; 及 一個能通到催化性反應器之開口,該開口係可用 來去除或傳送該催化性物質。 74·如申請專利範圍第73項所述之設備,其更包含一個 能覆蓋該開口的蓋子。 7 5 ·如申請專利範圍第73項所述之設備,其更包含一個 能通到催化性反應器之第二開口,該第二開口係可用 來去除或傳送該催化性物質。 76·如申請專利範圍第73項所述之設備,其更包含一個 與該開口相通之真空系統。 77·如申請專利範圍第73項所述之設備,其更包含一個 與該開口相通之催化性物質來源。 78·如申請專利範圍第73項所述之設備,其中之開口係 第84頁 」 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) •............·$.........、訂.........籲 (請先閱讀背面之注意事項再塡寫本頁) 經濟部智慧財產局員,工消費合作社印製553761 Α8 Β8 C8 D8 Patent No. 89122496 Amended in May 1992 • 7 i whether you move. 1 more original printed by the Consumers' Cooperative of the Intellectual Property Bureau of the Ministry of Small and Medium Economy 6. Application scope of patents; U r, ( (&gt; I 1 · An equipment capable of processing the exhaust gas flow of a process chamber, the equipment includes at least the following: a process processing chamber capable of processing a substrate in a stimulated gas and thereby generating an exhaust gas flow; and a silicon component in the exhaust gas flow can be removed And a fluorine-containing first reactor; and a second reactor capable of removing the second component in the exhaust gas stream. 2 · The device according to item 1 of the patent application scope, wherein the first reactor is capable of removing the exhaust SiF4 in the gas stream. 3. The equipment as described in the first scope of the patent application, wherein the first reactor is capable of removing at least 80% of the SiF4 in the exhaust gas stream. 4 · The equipment as described in the first scope of the patent application. Among them, the second reactor is capable of removing perfluoride in the exhaust gas stream. 5. The device according to item 1 of the scope of the patent application, wherein the second reactor includes at least one capable of processing the exhaust gas stream. 6) The equipment as described in item 1 of the scope of the patent application, wherein the first reactor contains a cleaning liquid that can be carried in the opposite direction to the exhaust air flow. Page 71 This paper applies Chinese national standards ( CNS) A4 specification (21 × 297 mm) (Please read the precautions on the back before filling out this page). May _ 耱 · 553761 ABCD Patent No. 89122496 Amendment May 1992 6. Spraying nozzles for patent application (Please read the notes on the back before filling this page) 7. The equipment described in item 1 of the scope of patent application, where the first reactor contains a throat nozzle that can spray the cleaning liquid into the exhaust gas stream. 8. The equipment described in item 7 of the scope of the patent application, wherein the throat nozzle is capable of spraying the cleaning liquid in the direction almost the same as the exhaust air flow. 9 · The equipment described in the scope of the patent application, item 1, It further includes a third reactor capable of removing the third component in the exhaust gas stream. 1 0 · The device described in item 9 of the scope of the patent application, wherein the third reactor is a clean room. 1 1. A device capable of processing the exhaust gas flow from a process chamber, the device includes at least the following: The consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs has printed a first reactor capable of removing silicon and fluorine components in the exhaust gas flow. The first reactor includes An inlet and an outlet; and a heater located downstream of the outlet. 1 2 · The equipment described in item 11 of the scope of the patent application, in which the reactor is on page 72. This paper applies the Chinese National Standard (CNS) A4 Specifications (210X297 mm) 553761 A8 B8 C8 Patent No. 89122496 May 1992 Amendment A. Patent application domain can remove silicon-containing components in the exhaust air stream. 1 3 · A device capable of cleaning the exhaust air of a process chamber, the device includes at least the following: a reactor capable of receiving the exhaust air; a nozzle capable of spraying the cleaning liquid in the opposite direction to the exhaust air; and a nozzle capable of removing the exhaust Filters for reaction products in a gas stream. 14. The device according to item 13 of the patent application park, further comprising a second nozzle capable of spraying the cleaning liquid into the reactor in the same direction as the exhaust gas stream. 15. The device according to item 14 of the scope of patent application, wherein the first and second nozzles are capable of spraying the cleaning liquid in almost parallel directions. 16. The device according to item 15 of the scope of patent application, wherein the second nozzle is a throat nozzle. (Please read the notes on the back before filling out this page) Printed by Fan Li from the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, please ask Zhongruqi to add 13 tables that can be included in the table and update their settings. The content of the description includes as little as possible to provide the equipment, the outgas hr, room cleaning system clean energy types listed on the next page 3 This paper size applies to China National Standard (CNS) A4 specifications (210X297 public love) 553761 ABCD No. 89122496 The patent case in May 1992 revised the scope of the patent application for a reactor capable of receiving exhaust gas flow; and a throat nozzle capable of injecting clean liquid into the reactor. Please read the precautions on the back before filling 1 9. The equipment as described in item 18 of the scope of patent application, where the reactor can accept the exhaust gas stream, and the throat nozzle can clean the liquid with the exhaust gas stream Injected into the reactor in the same direction. 20. The device according to item 18 of the scope of the patent application, wherein the reactor further comprises a plurality of channels and a throat nozzle capable of injecting a clean liquid into the channels. 2 1. —A device capable of cleaning the exhaust air from the process chamber. The device contains at least the following: A reactor containing at least four clean liquid channels. 2 2. —A kind of equipment capable of cleaning the exhaust air of the process chamber, the equipment includes at least the following: a reactor capable of receiving the exhaust air and the cleaning liquid; a filter; and a device capable of extracting the cleaning liquid from the reactor and passing through the filter Printed Pu for the Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumer Cooperative. 23. The device according to item 22 of the scope of patent application, wherein the filter is capable of removing particles having a diameter of about 2 μm or more and about 1 mm. Page 74 This paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 ABCD Patent No. 89122496 May 1992 revision of the scope of patent application 24. The equipment described in item 22 of the scope of patent application, of which The pump system can extract clean liquid from the reactor, pass through the filter, and then return to the reactor. 25. The device according to item 24 of the scope of patent application, further comprising a clean liquid source, and wherein the pump system can extract clean liquid from the clean liquid source into the reactor. 26. The device according to item 25 of the scope of patent application, further comprising a controller capable of adjusting the amount of clean liquid to be drawn from the clean liquid source into the reactor. 27. The device as described in item 26 of the scope of patent application, further comprising a detector capable of detecting the condition of the cleaning liquid in the reactor, and the controller therein can respond appropriately to the signal of the detector . 28. The device according to item 27 of the patent application, wherein the detector is a pH meter. Printed by the member of the Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumer Cooperative, 29.-A device that can clean the exhaust air from the process room, which contains at least the following = a first clean room, which contains at least one first reactor that can receive the exhaust air; The second clean room contains at least one that can accept exhaust gas. Page 75 The paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 A8 B8 C 8 Patent No. 89122496 Amendment May 1992 --- ---- Ef ---- 6. The second reactor with a patent application flow; and (please read the precautions on the back before filling this page). A clean liquid can be drawn from the first reactor to the second reaction. Fan Pu in the device. 30. The device according to item 29 of the patent application park, further comprising a pressure compensator capable of compensating the pressure difference between the first and second reactors. 3 1 · The device described in item 29 of the patent application park, wherein the pump system can extract the cleaning solution from the first reaction and return the extracted cleaning solution to the first reaction. 32. The device according to item 29 of the scope of patent application, further comprising a clean liquid source, and wherein the pump system can extract the clean liquid from the clean liquid source into the second reactor. 3 3 · The device according to item 29 of the scope of patent application, further comprising a controller capable of adjusting the amount of clean liquid drawn from the clean liquid source into the reactor. Member of the Intellectual Property Bureau of the Ministry of Economic Affairs, the main consumer co-operative society printed a package containing as little as the equipment, the outflow hr, the room cleaning system, the clean energy, Ly.t, a kind of 4. · The middle flow gas out of the column. Flow out of the air «Received energy should be detected by the device and the condition of the liquid cleaner and clean the internal device should be detected by the energy detection page 76 117 This paper size applies to China National Standard (CNS) A4 specifications (210X297 mm); 53761 A8 B8 C8 D8 Patent No. 89122496 Amended in May 1992. Member of the Intellectual Property Bureau of the Ministry of Economic Affairs X Printed by Consumer Cooperatives 6. Application for a patent scope 35 · The device described in item 34 of the scope of patent application 'includes a controller, It is a controller that can adjust the properties of the cleaning liquid according to the detected feelings. 36. The device according to item 35 of the scope of patent application, wherein the detector includes a pH meter. 3 7 · ~ A kind of equipment capable of processing the exhaust gas flow from the process chamber 'The equipment includes at least the following: a first reactor capable of receiving exhaust gas; a second reactor capable of receiving exhaust gas' and a device capable of compensating the first and Pressure compensator for the pressure difference between the second reactors. 3 8 · A method capable of processing the exhaust gas flow from a process chamber, the method includes at least the following: (a) processing a substrate to generate an exhaust gas flow; (b) removing silicon and fluorine-containing components from the exhaust gas flow in the first reactor ; And (c) removing the second component from the exhaust gas stream in the second reactor. 39. The method according to item 38 of the scope of patent application, wherein step (0 includes at least, before or after step (b), catalyzing a reaction in the exhaust gas stream to remove a component of the exhaust gas stream. Article 77 The paper size of this page applies to the Chinese National Standard (CNS) A4 specification (210X297) .............. Fees ......... 、 耵 ...... ... S (Please read the notes on the back before filling out this page) 553761 A8 B8 C8 D8 Patent No. 89122496 Patent Amendment May 1992 ...... ..... Order (Please read the notes on the back before filling in this page: &gt; Read the patent scope 4 〇 · The method described in item 38 of the patent scope, where step (b) includes at least The clean liquid is sprayed into the discharge air in the opposite direction to the discharge air. 4 1 · The method described in item 38 of the patent application scope, wherein step (b) at least Ci Inject into the exhaust fluorine stream. 42. A method capable of treating the exhaust gas stream from the process chamber, the method includes at least the following steps: (a) removing one of the exhaust gas streams in the reactor Components; and (b) heating the exhaust gas stream downstream of the reactor. 43. The method according to item 42 of the scope of patent application, wherein steps (a) to! Include at least a step of removing silicon-containing substances in the exhaust gas stream; ^ i Contains as little as the French side. The French side's outflow «E— Room process netting · · Jie Suo energy step box 歹 \ Under the Ministry of Economic Affairs, the Intellectual Property Bureau employee consumer cooperative printed kr to scattered points to the opposite side • In the bow phase, the device &gt; jf should be reversed to M. To the miscellaneous flow and the air flow; the net flow will be discharged from the outlet gas. The clean air filter will pass V} V) abc / IV / IV / IV Page 8 117 This paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 ABCD 89122496 patent case May 1992 amendments, patent application scope 4 5. A method for exhausting airflow in a clean process chamber, the method at least It includes the following steps: (Please read the precautions on the back before filling out this page) (a) Direct the exhaust air flow into the reactor; and (b) Inject the cleaning solution into the reactor through the throat. 46 · —A clean process Chamber exhaust method, the The method includes at least the following steps: (a) directing the exhaust gas stream into the reactor; (b) dispersing the cleaning liquid into the reactor; and (c) extracting the cleaning liquid from the reactor and passing it through a filter. 47. If applied The method according to item 46 of the patent, wherein step (c) includes at least the step of returning the extracted clean liquid to the reactor again. 4 8. A method for exhausting a gas stream from a clean process chamber, the method comprising at least the following steps: (a) introducing the exhaust gas stream into the first reactor; (b) introducing the exhaust gas stream into the second reactor; and economically Printed by the Consumer Cooperatives of the Ministry of Intellectual Property Bureau (c) Let the cleaning liquid flow from the first reactor to the second reactor. 49. The method according to item 48 of the scope of patent application, further comprising the step of returning the clean liquid extracted from the first reactor back to the first reactor. 5 0. — A method for exhausting air from a clean process chamber. The method includes at least the following page 79. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 A8 B8 C8 D8 Patent No. 89122496 92 In May, amendments were made by the Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumer Cooperative to print the scope of patent applications: U) Direct the exhaust gas flow into the reactor; (b) Direct the clean liquid into the reactor; and (C) Detect the clean Liquid or reactor. 51. The method according to item 50 of the scope of patent application, further comprising the step of adjusting the cleaning liquid according to the reaction of step (c). 52. The method according to item 50 of the scope of patent application, wherein step (0) further includes a step of detecting the pH value of the cleaning liquid. 5 3-A method for processing the exhaust gas from the process chamber, the method includes at least the following steps: (a) processing the exhaust gas flow in the first reactor; (b) processing the exhaust gas flow in the second reactor; and (0) compensating the pressure difference between the first and second reactors. 54. A kind of exhaust gas heating An apparatus comprising at least: an exhaust gas inlet; an exhaust gas outlet; a wall adjacent to a gas flow channel; and a heater capable of heating the wall; wherein an exhaust gas introduced by the exhaust gas inlet , When it flows along the gas flow channel to the exit of the exhaust airflow, page 80 This paper is sized to the Chinese National Standard (CNS) A4 (210X297 public love) ............. Feng ......... 、 Order ......... (Please read the notes on the back before filling this page) 553761 8 8 8 8 ABCD Patent No. 89122496 Amended May 1992 Scope of patent application Employees' cooperation in intellectual property bureau of the Ministry of Economic Affairs The printing is heated. The device as described in item 54 of the Lingqing Patent Fanyuan, wherein the length of the gas flow channel is sufficient to warm the exhaust gas stream to at least about 4,000c 〇5 6 The device described in Patent Model 帛 54, wherein the length of the gas flow channel is sufficient to make the exhaust gas flow reach the desired temperature only through the gas flow passage for 5 times. The device according to item 6, wherein the length of the gas flow channel is sufficient to heat the exhaust gas flow to a temperature between about 400 ° C and about 700 ° C. 5 8 · Please refer to the device according to item 54 of the patent scope The heater is sufficient to heat the exhaust airflow to at least about 400, and the residence time of the exhaust airflow is less than 3 seconds. 5 9 · As described in the patent scope of item 58, The heater occupies less than 1,300 cubic inches of volume. 60. The device described in item 54 of the patent scope, where the gas flow channel is spiral. Page 81 This paper applies to China National Standard (CNS) A4 specification (210X297 mm) ......... 嚷........., OK ......... S (Please read the notes on the back before filling out this page) 553761 ABCD Patent No. 89122496 May 1992 Revises Intellectual Property of the Ministry of Economic Affairs Member X Consumer Cooperative Co., Ltd. printed and applied for the patent scope 1 · As described in the 54th case of the scope of the patent application, + ,,,, ;; this ^. The equipment described in Gang D D4, where the gas flow channel is located in several internal Within interconnected channels. 62. According to the scope of the patent application No. 54 (Extrusion, + ,, VW, I), the gas flow channel is defined by the intersecting portions of the channel. 63. The device according to item 54 of the patent application, wherein the wall includes at least one inner surface that is resistant to damage from the exhaust airflow. 64. The device according to item 54 of the patent application, wherein the wall and the heater are separated by at least about 2 mm. 65 · A substrate processing equipment, which includes at least the following: a process processing room capable of processing a substrate in an excited gas and thereby generating an exhaust gas stream; 'a heating furnace, which includes at least an exhaust gas inlet, an exhaust gas stream An outlet, a wall adjacent to the gas flow channel, and a heater capable of heating the wall; wherein the exhaust air supplied from the exhaust air inlet is flowed along the gas flow channel to the exhaust air outlet Heated by a heater. 66. The equipment described in item 65 of the scope of patent application, in which the heating furnace has a length L, and the gas flow passage has an inlet to an outlet. Page 82 This paper applies the Chinese National Standard (CNS) A4 specification. (210 X 297 Gongchu) ---------............ Order ......... ( Please read the notes on the back before filling out this page} 553761 A8 B8 C8 D8 Patent No. 89122496 Amended May 1992 Sixth, the length of the patent application scope is at least about 1.5L. 07 · As for the 65th patent application scope The device described above, wherein the gas flow channel is a spiral type. 68. The device described in the scope of the patent application No. 65, further comprises a catalytic reactor capable of receiving the exhaust gas stream heated by the furnace. 69 · The device according to item 65 of the scope of patent application, further comprising a heat exchanger capable of accepting the exhaust gas stream. 70 · —A method for treating a substrate and an exhaust gas stream, which includes at least the following steps: (a) in processing Processing a substrate in the zone, and thereby generating an exhaust gas stream, (b) passing the exhaust gas stream through a gas flow channel; and ( c) The exhaust gas is heated to a preset temperature within the time when the exhaust gas flows through the gas flow channel only once. Member of the Intellectual Property Bureau of the Ministry of Economic Affairs. Printed by the Industrial and Consumer Cooperatives. A method comprising at least passing an exhaust gas flow through the gas flow channel so that the residence time of the exhaust gas flow in the gas flow channel is less than about 3 seconds. 72-The method according to item 70 of the scope of patent application, which at least Contains that the paper size on page 83 is applicable to the Chinese National Standard (CNS) A4 specification (210X297 public attack.) 553761 ABCD No. 89122496 Patent Case Amendment May 1992 Sixth, patent application scope Exhaust airflow through the spiral gas flow channel 73. An equipment capable of processing exhaust gas from a process chamber, the equipment comprising at least the following: a catalytic reactor including at least an exhaust gas inlet, an exhaust gas outlet, and an interior capable of containing the catalytic substance; and An opening that opens into the catalytic reactor and is used to remove or transport the catalytic substance. The device according to item 73 of the patent, further includes a cover that can cover the opening. 7 5 · The device according to item 73 of the patent application, further includes a device that can pass to the catalytic reactor. Two openings, the second opening can be used to remove or transport the catalytic substance. 76. The device described in item 73 of the scope of patent application, which further includes a vacuum system communicating with the opening. 77. If the scope of patent application is The device of item 73, further comprising a source of catalytic material in communication with the opening. 78 · The device as described in item 73 of the scope of patent application, where the opening is on page 84 "This paper size applies to the Chinese National Standard (CNS) A4 specification (210X297 mm) • ......... .. · $ ........., order ......... (Please read the notes on the back before writing this page) Member of the Intellectual Property Bureau of the Ministry of Economic Affairs, printed by the Industrial and Consumer Cooperatives 經濟部智慧財產局員工消費合作社印製 第89122496號專利案92年5月修正 申請專利範圍 位於排出氣流入口及排出氣流出口間。 79· 一種能自可接受排出氣流之反應器中移除催化性物質 的方法,該方法至少包含下列步騾: (a) 提供一個可進入反應器之開口;及 (b) 由該開口移除至少一部分之催化性物質。 8 〇·如申請專利範圍第 79項所述之方法,其更包含在執 行步驟(b)之時或之後,過濾至少一部分之反應物及該 催化性物質的步驟。 8 1 ·如申請專利範圍第 79項所述之方法,其更包含在執 行步驟(b)之時或之後,由第二開口過濾至少一部分之 反應物及該催化性物質的步驟。 8 2·如申請專利範圍第79項所述之方法,其中步驟(b)至 少包含以真空方式移除至少一部分該催化性物質的步 驟。 8 3 · —種能處理製程室排出氣流的設備,該設備至少包含 下列: (a) —個催化性反應器,其係具有一個排出氣流 入口及一個排出氣流出口; (b) —個反應器容器,其係能釋放性地容納該催 第85頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂· # 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 六、申請枣利範圍 化性反應器。 (請先閱讀背面之注意事項再填寫本頁) ?4•如申請專利範圍第83項所述之設備,其中之反應器 容器包含一排出氣流入口及一個排出氣流出口。 8 5 ·如申請專利範圍第83項所述之設備,其中之催化性 反應器包含一個位於反應器容器之溝槽内的凸緣。 86·如申請專利範圍第83項所述之設備,其更包含一個 能覆蓋該排出氣流入口或該排出氣流出口之蓋子。 8 7 ·如申請專利範圍第83項所述之設備,其中之催化性 反應器包含一個靠近該排出氣流入口或該排出氣流出 口之槽(slot),及一個位於該槽内能覆蓋該排出氣流 入口或該排出氣流出口之蓋子。 8 8· 一種能自可處理製程室排出氣流之系統中移除催化性 物質的方法,該方法至少包含下列步驟: 經濟部智慧財產局員X消費合作社印製 (a) 將催化劑納入一容器内;及 (b) 由該容器移除催化劑。 89·如_請專利範圍第88項所述之方法,其中步驟(&amp;)至 少包含在容器内納入一催化性反應器,該催化性反應 器内係含有催化劑。 第86頁 本紙張尺度適用t國國家標準(CNS)A4規格(210X297公釐)-- 553761Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperative, Patent No. 89122496 Amended in May 1992. The scope of patent application is located between the exhaust air inlet and the exhaust air outlet. 79. A method for removing catalytic substances from a reactor that can accept an exhaust gas stream, the method comprising at least the following steps: (a) providing an opening into the reactor; and (b) removing through the opening At least part of the catalytic substance. 8 〇 The method according to item 79 of the scope of patent application, further comprising the step of filtering at least a part of the reactants and the catalytic substance at or after the step (b) is performed. 8 1 · The method according to item 79 of the scope of patent application, further comprising the step of filtering at least a part of the reactants and the catalytic substance through the second opening at or after performing step (b). 8 2. The method according to item 79 of the scope of patent application, wherein step (b) includes at least a step of removing at least a part of the catalytic substance in a vacuum manner. 8 3 · —A device capable of processing the exhaust gas flow from the process chamber, the equipment contains at least the following: (a) a catalytic reactor, which has an exhaust gas inlet and an exhaust gas outlet; (b) — a reactor Container, which can hold the reminder on page 85. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) (Please read the precautions on the back before filling this page). Order # 553761 A8 B8 C8 D8 Patent No. 89122496 Amended in May 1992 Sixth, apply for the scope of the Zaoli benefits reactor. (Please read the precautions on the back before filling out this page.) 4 • The device as described in item 83 of the scope of patent application, where the reactor vessel contains an exhaust air inlet and an exhaust air outlet. 8 5 · The device according to item 83 of the patent application, wherein the catalytic reactor comprises a flange located in a groove of the reactor vessel. 86. The device according to item 83 of the scope of patent application, further comprising a cover covering the exhaust air inlet or the exhaust air outlet. 8 7 · The device according to item 83 of the scope of patent application, wherein the catalytic reactor includes a slot near the exhaust gas inlet or the exhaust gas outlet, and a slot located in the groove can cover the exhaust gas The inlet or the cover of the exhaust air outlet. 8 8 · A method for removing catalytic substances from a system capable of processing exhaust air from a process chamber, the method includes at least the following steps: printed by the Intellectual Property Bureau of the Ministry of Economic Affairs X Consumer Cooperative (a) the catalyst is contained in a container; And (b) removing the catalyst from the container. 89. The method of claim 88, wherein step &amp; includes at least the inclusion of a catalytic reactor in a container, the catalytic reactor containing a catalyst. P.86 The paper size applies to National Standard (CNS) A4 (210X297 mm)-553761 第的122496號專利案92年5月修正 六、申請專利範圍 90·如申請專利範圍第88項所述之方法,其中步驟(“至 y包含在催化性反應器内納入一催化劑,且步驟(b) 至少包含由該催化性反應器之開口移除該催化劑。 種也處理製程室排出氣流的設備,該設備至少包本 下列: (a) —個能於激能氣體中處理一基材因而產生排出 氣流的製程加工室;及 〇&gt;)—個催化性反應器’其至少包含—排出氣流入 口、一排出氣流出口及一種催化性物質於其 中, 其中該催化性物質係可自該設備中被移除。 92·如申請專利範圍第91項所述之設備,其更包含一個 能加熱排出氣流的加熱器。 93 ·如申請專利範圍第92項所述之設備,其中之催化性 物質是與該加熱器分開。 94·如申請專利範圍第92項所述之設備,其中之催化性 反應器是與該加熱器分開。 95· —種能處理製程室排出氣流的設備,該設備至少包含 第87頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) &quot;&quot; --- (請先閱讀背面之注意事項再填寫本頁) -訂· 經濟部智慧財產局員工消費合作社印製 553761 ABCD 第89122496號專利案92年5月修正 申請專利範園 列 下 a /V kr 生 產 而 因 材 基 1 S 處., 中室 體工 氣加 能程 激製 於的 能流 個氣 I 出 流性 氣化 出催 排納 一 容 含可 包個 少 一 至及 其口 ,.出 器流 應氣 反出 性排中 化 一 其 催、於 個口質 I 入物 及 間 空 部 内 的 應 反 性 化 催 質手 物的 性器 化應 催反 送性 傳化 或催 除開 移離 能或 種中 _ 器 \—/ C /V (請先閱讀背面之注意事項再塡寫本頁) 經濟部智慧財產局員X消費合作社印製 96·如申請專利範圍第95項所述之設備,其中之移除或 傳送催化性物質的手段至少包含一個位於催化性反應 器之開口。 9 7.如申請專利範圍第95項所述之設備,其中之移除或 傳送催化性物質的手段至少包含一個介於製程室及催 化性反應器之間另一個單獨的連接器。 98. —種處理製程室排出氣流的方法,該方法至少包含下 列步驟: (a) 於激能狀態下處理一基材,並因而產生排出 氣流; (b) 催化排出氣流中的一個反應,以於一催化性 區域中處理該排出氣流;及 (c) 從該催化性區域中移除催化性物質。 第88頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 六 中請專利範圍 99 8 8 8 8 ABCD 第削22496號專利案92年5月修正 如t請專利範圍第98項所述之方法,其更包含 排出氣流的步驟。 加熱 〇〇.如申請專利範圍第98項所述之方法,其更包含傳 送催化性物質至該催化性區域中的步驟。 01· 一種形成及處理製程室排出氣流的方法,該方法 至少包含下列步驟·· 在製程室中處理該基材之前、之時或之後, 將製程氣體引入製程加工室並形成一種内含F 5 2乳 體的排出氣流;及 讓排出氣流通過一催化劑上方,以降低排出 氣流中f2氣體含量。 102·如申請專利範圍第1 〇 1項所述之方法,其至少包 含設定該製程加工室中的製程處理條件,以產生_ p r 2 氣體含量至少約1 〇%之排出氣流。 ..............•裝.........訂 (請先閱讀背面之注意事項再填寫本頁} § 經濟部智慧財產局員工消費合作社印製 1 03·如申請專利範圍第101項所述之方法,其更包含 引入一添加物至排出氣流中的步驟,該添加物至少包 含一種含氫物質及一種含氧物質。 104. —種形成及處理製程室排出氣流的方法,該方 法 第89頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 六、申請專利範圍 至少包含下列步驟: (請先閱讀背面之注意事項再填寫本頁) 在製程室中處理該基材之前、之時或之後, 將製程氣體引入製程加工室並形成一種内含F2氣 體的排出氣流;及 引入一添加物至排出氣流中,該添加物至少 包含一種含氫物質及一種含氧物質,以降低排出 氣流中F2氣體含量。 10 5. 如申請專利範圍第 1 04項所述之方法,其至少包 含設定該製程加工室中的製程處理條件,以產生一 F2 氣體含量至少約10%之排出氣流。 106. 如申請專利範圍第 104項所述之方法,其中排出 氣流内之添加物體積比約高於2%。 107. —種形成及處理製程室排出氣流的方法,該方法 至少包含下列步驟: 經濟部智慧財產局員工消費合作社印製 在製程室中處理該基材之前、之時或之後, 將製程氣體引入製程加工室並形成一種内含?2氣 體的排出氣流; 加熱該排出氣流;及 讓此排出氣流通過一催化劑上方,以降低排 出氣流中F2氣體含量。 第90頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 ABCD 第89122496號專利案92年5月修正 六、申請專利範圍 (請先閲讀背面之注意事項再填寫本頁) 108. 如申請專利範圍第 107項所述之方法,其至少包 含設定該製程加工室中的製程處理條件,以產生一 F2 氣體含量至少約10%之排出氣流。 1 09. 如申請專利範圍第 107項所述之方法,其更包含 引入一添加物至排出氣流中的步驟,該添加物至少包 含一種含氫物質及一種含氧物質。 1 10. 一種形成及處理製程室排出氣流的方法,該方法 至少包含下列步驟: 在製程室中.引入一清潔氣體並形成一種内含 F2氣體的排出氣流;及 讓此排出氣流通過一催化劑上方,以降低排 出氣流中F2氣體含量。 111.如申請專利範圍第 11 0項所述之方法,其中之清 潔氣體至少包含nf3。 經濟部智慧財產局員X消費合作社印製 1 12.如申請專利範圍第 11 0項所述之方法,其更包含 在一遠處的製程室中激發此清潔氣體。 113·如申請專利範圍第 11 0項所述之方法,其更包含 引入一添加物至排出氣流中的步驟,該添加物至少包 含一種含氫物質及一種含氧物質。 第91頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 553761 A8 B8 C8 D8 第89122496號專利案92年5月修正 六、中請專利範圍 (請先閱讀背面之注意事項再塡寫本頁) 1 14. 一種形成及處理製程室排出氣流的方法,該方法 至少包含下列步驟: 在製程室中引入一氣體以處理一基材或清潔 製程加工室; 形成一種内含f2氣體的排出氣流; 引入一添加物至排出氣流中,該添加物至少 包含一種含氫物質及一種含氧物質; 讓此排出氣流通過一催化劑上方,藉此形成 HF ; 在排出氣流引入水,以溶解HF。 115. 如申請專利範圍第 11 4項所述之方法,其中之處 理氣體至少包含一種内含NF3的清潔氣體。 1 16. 如申請專利範圍第 11 4項所述之方法,其更包含 在-遠處的製程室中激發此清潔氣體。 經濟部智慧財產局員·工消費合作社印製 1 17. 一種基材處理設備,該設備至少包含下列: 一種製程氣體源; 一個能以製程氣體來執行此項處理並形成一 種内含F2氣體之排出氣流的製程加工室;及 一個適於處理排出氣流以降低其中F2氣體含 量的催化性反應器。 第92頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) 經濟部智慧財產局員主消費合作社印製 553761 ^ C8 第卯1224%號專利案92年5月修正 六、申請專利範園 1 1 8.如申請專利範圍第11 7項所述之設備,其更包含 一個能將添加物引入至排出氣流中的添加物源,該添 加物至少包含一種含氫物質及一種含氧物質。 1 19. 一種基材處理設備,該設備至少包含下列: 一個能以製程氣體來執行此項處理並形成一 種内含f2氣體之排出氣流的製程加工室;及 一個能將添加物引入至排出氣流中以降低其 中F2氣體含量的添加物源,該添加物至少包含一 種含氫物質及一種含氧物質。 120. 如申請專利範圍第119項所述之設備,其更包含 -個控制器,其係能控制排出氣流中含氫物質及含氧 物質之添加情況。 121. 如申請專利範圍第 120項所述之設備,其中之幹 制器係能維持排出氣流中之添加物體積比例至少約為 2% 〇 第93頁 本紙張尺度適用中國國家標準(CNS)A4規格(210X297公釐) -------------裝tr (請先閱讀背面之注意事項再填寫本頁}Patent case No. 122496 Amended in May 1992 Sixth, the scope of patent application 90. The method described in the 88th scope of the patent application, wherein steps ("to y include a catalyst in a catalytic reactor, and steps ( b) contains at least the catalyst removed through the opening of the catalytic reactor. A device that also processes the exhaust gas flow from the process chamber, the device includes at least the following: (a) a substrate capable of processing a substrate in a stimulated gas and therefore A process processing chamber for generating an exhaust gas stream; and 〇 &gt;)-a catalytic reactor 'which at least includes-an exhaust gas inlet, an exhaust gas outlet, and a catalytic substance therein, wherein the catalytic substance can be obtained from the equipment; 92. The device according to item 91 of the patent application, which further includes a heater capable of heating the exhaust air stream. 93 The device according to item 92 of the patent application, wherein the catalytic substance is It is separated from the heater. 94. The device according to item 92 of the scope of the patent application, wherein the catalytic reactor is separated from the heater. 95 ·-A process chamber row capable of processing Airflow equipment, the equipment contains at least page 87. The paper size is applicable to China National Standard (CNS) A4 specifications (210X297 mm) &quot; &quot; --- (Please read the precautions on the back before filling this page)-Order · The Intellectual Property Bureau employee ministry of the Ministry of Economic Affairs printed 553761 ABCD No. 89122496 patent in May 1992, amending the patent application for a / V kr listed in the patent park. Due to the material base 1S. The energy of the process is controlled by the flow of energy I. Outflow gasification and exhaustion containment can contain a minimum of one to its mouth. I The materials that should be anti-sexualized in the entrance and space parts should be urged to send sexually transmitted materials or to dispel the detachment energy or the species_ 器 \ — / C / V (Please read the note on the back first Matters are reproduced on this page) Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumer Cooperative, 96. The equipment described in item 95 of the scope of patent application, wherein the means for removing or transferring the catalytic substance includes at least one located in the catalytic reactor Opening 9 7. The device according to item 95 of the scope of patent application, wherein the means for removing or transferring the catalytic substance includes at least one separate connector between the process chamber and the catalytic reactor. 98. — A method for processing exhaust gas from a process chamber, the method includes at least the following steps: (a) processing a substrate in an excited state, and thereby generating an exhaust gas; (b) catalyzing a reaction in the exhaust gas to catalyze a reaction Treating the exhaust gas stream in a catalytic area; and (c) removing catalytic substances from the catalytic area. Page 88 This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm). The patent scope of the 6th China Patent 99 8 8 8 8 ABCD No. 22496 patent may be amended in May 1992. If the scope of the patent is 98 The method further includes a step of exhausting the air flow. Heating 〇. The method according to item 98 of the patent application scope, further comprising the step of transferring a catalytic substance to the catalytic region. 01 · A method for forming and processing an exhaust gas flow in a process chamber, the method includes at least the following steps ... Before, during, or after processing the substrate in the process chamber, introduce a process gas into the process processing chamber and form an F 5 containing 2 the exhaust airflow of the milk body; and passing the exhaust airflow over a catalyst to reduce the f2 gas content in the exhaust airflow. 102. The method as described in item 101 of the scope of patent application, which at least includes setting process conditions in the process processing chamber to generate an exhaust gas stream with a gas content of at least about 10%. .............. • Install ......... Order (Please read the notes on the back before filling out this page} § Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 103. The method according to item 101 of the scope of patent application, further comprising the step of introducing an additive into the exhaust gas stream, the additive including at least one hydrogen-containing substance and one oxygen-containing substance. Method for processing the exhaust air from the process chamber, page 89. The paper size is applicable to the Chinese National Standard (CNS) A4 (210 X 297 mm) 553761 A8 B8 C8 D8 Patent No. 89122496 Patent May 1992 Amendment VI. Application The scope of the patent includes at least the following steps: (Please read the notes on the back before filling out this page) Before, during or after processing the substrate in the process chamber, introduce the process gas into the process processing chamber and form a F2 gas-containing Exhaust gas flow; and introducing an additive to the exhaust gas flow, the additive contains at least one hydrogen-containing substance and one oxygen-containing substance to reduce the F2 gas content in the exhaust gas stream. Way, It at least includes setting process conditions in the process processing chamber to generate an exhaust gas stream with an F2 gas content of at least about 10%. 106. The method as described in item 104 of the patent application scope, wherein the volume of the additive in the exhaust gas stream The ratio is higher than about 2%. 107. — A method for forming and processing the exhaust air from the process room, which includes at least the following steps: The consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs prints before and when the substrate is processed in the process room Or after that, the process gas is introduced into the process processing chamber and an exhaust gas stream containing? 2 gas is formed; the exhaust gas stream is heated; and the exhaust gas stream is passed over a catalyst to reduce the F2 gas content in the exhaust gas stream. Page 90 of this Paper size applies Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 ABCD Patent No. 89122496 May 1992 amendment 6. Application scope (please read the precautions on the back before filling this page) 108. If you apply The method described in item 107 of the patent scope includes at least setting process conditions in the process processing room to generate a F2 Exhaust gas flow with a gas content of at least about 10%. 1 09. The method described in item 107 of the patent application scope further includes the step of introducing an additive into the exhaust gas stream, the additive including at least one hydrogen-containing substance and An oxygen-containing substance. 1 10. A method for forming and processing an exhaust gas stream in a process chamber, the method comprising at least the following steps: Introducing a clean gas into the process chamber and forming an exhaust gas stream containing F2 gas; and letting this exhaust The gas stream passes over a catalyst to reduce the F2 gas content in the exhaust gas stream. 111. The method according to item 110 of the scope of patent application, wherein the cleaning gas contains at least nf3. Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumer Cooperative 1 12. The method as described in item 110 of the scope of patent application, which further comprises exciting the clean gas in a remote process room. 113. The method according to item 110 of the scope of patent application, further comprising the step of introducing an additive into the exhaust gas stream, the additive including at least a hydrogen-containing substance and an oxygen-containing substance. Page 91 This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) 553761 A8 B8 C8 D8 Patent No. 89122496 Patent May 1992 Amendment 6. Scope of patents (please read the precautions on the back first) (Written on this page) 1 14. A method for forming and processing exhaust air from a process chamber, the method includes at least the following steps: introducing a gas into the process chamber to treat a substrate or cleaning the process chamber; forming an f2 gas Introducing an additive to the exhaust gas stream, the additive contains at least one hydrogen-containing substance and an oxygen-containing substance; passing the exhaust gas stream over a catalyst to form HF; introducing water into the exhaust gas stream to dissolve HF. 115. The method according to item 114 of the scope of patent application, wherein the treatment gas includes at least one cleaning gas containing NF3. 1 16. The method according to item 114 of the scope of patent application, further comprising exciting the clean gas in a remote processing chamber. Printed by a member of the Intellectual Property Bureau of the Ministry of Economic Affairs · Industrial and Consumer Cooperatives1 17. A substrate processing equipment, which includes at least the following: a process gas source; a process gas can be used to perform this process and form an exhaust containing F2 gas A gas processing chamber; and a catalytic reactor adapted to process the exhaust gas stream to reduce the F2 gas content therein. Page 92 This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 553761 ^ C8 Patent No. 1224% Amendment May 1992 Garden 1 1 8. The device according to item 11 of the scope of patent application, further comprising an additive source capable of introducing additives into the exhaust gas stream, the additives including at least one hydrogen-containing substance and one oxygen-containing substance . 1 19. A substrate processing equipment comprising at least the following: a process processing chamber capable of performing the process with a process gas and forming an exhaust gas stream containing f2 gas; and a processing chamber capable of introducing additives to the exhaust gas stream In order to reduce the F2 gas content of the additive source, the additive contains at least a hydrogen-containing substance and an oxygen-containing substance. 120. The device according to item 119 of the scope of patent application, further comprising a controller capable of controlling the addition of hydrogen-containing substances and oxygen-containing substances in the exhaust gas stream. 121. The equipment described in item 120 of the scope of patent application, wherein the dry device is capable of maintaining at least about 2% of the volume of the additive in the exhaust air stream. ○ page 93 This paper applies Chinese National Standard (CNS) A4 Specifications (210X297mm) ------------- install tr (Please read the precautions on the back before filling this page}
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Publication number Priority date Publication date Assignee Title
US11633695B1 (en) 2021-11-22 2023-04-25 Industrial Technology Research Institute Device and method of simultaneously removing flammable gases and nitrous oxide

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11633695B1 (en) 2021-11-22 2023-04-25 Industrial Technology Research Institute Device and method of simultaneously removing flammable gases and nitrous oxide

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