JP2002058961A - Exhaust gas treating equipment - Google Patents

Exhaust gas treating equipment

Info

Publication number
JP2002058961A
JP2002058961A JP2000280932A JP2000280932A JP2002058961A JP 2002058961 A JP2002058961 A JP 2002058961A JP 2000280932 A JP2000280932 A JP 2000280932A JP 2000280932 A JP2000280932 A JP 2000280932A JP 2002058961 A JP2002058961 A JP 2002058961A
Authority
JP
Japan
Prior art keywords
gas
cylinder
electromagnetic induction
container
pfc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000280932A
Other languages
Japanese (ja)
Other versions
JP3927359B2 (en
JP2002058961A5 (en
Inventor
Akiji Nishiwaki
秋史 西脇
Takao Fukuda
高雄 福田
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Individual
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Individual
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Application filed by Individual filed Critical Individual
Priority to JP2000280932A priority Critical patent/JP3927359B2/en
Priority to TW090122484A priority patent/TW505991B/en
Publication of JP2002058961A publication Critical patent/JP2002058961A/en
Publication of JP2002058961A5 publication Critical patent/JP2002058961A5/ja
Application granted granted Critical
Publication of JP3927359B2 publication Critical patent/JP3927359B2/en
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Expired - Lifetime legal-status Critical Current

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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

PROBLEM TO BE SOLVED: To provide equipment for significantly treating PFC gas (fluoronitride; NF3) in a semiconductor manufacturing process from an aspect of safety, envi ronment and cost. SOLUTION: The waste gas treating equipment is for decomposing PFC gas, which is used as etching gas in the dry etching process of semiconductor wafer manufacture and for cleaning of plasma chemical vapor deposition(CVD) apparatus, etc., by contacting the PFC gas with heating elements heated at 1,000-1,100 deg.C by an electromagnetic induction heating, and conducting stable thermal decomposition by instant heat supply, then safty and miniaturization are attained. SiO2 powder, SiF4, etc., which are reaction products contained in PFC gas, are removed by passing through a filter and catalyst, and PFC gas is thermally decomposed, then cooled, and the decomposed gas is absorbed into water.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体ウエーハーの
製造処理のドライエッチングプロセスにおいてエッチン
グガスやプラズマCVD装置等のクリーニングに使用さ
れるPFCガス(炭素とフッ素のみで構成されるフロン
ガス,NF)を処理する排ガス処理装置に関する。
BACKGROUND OF THE INVENTION The present invention is PFC gas (carbon and fluorine only Freon gas composed of, NF 3) for use in cleaning, such as etching gas or a plasma CVD apparatus in the dry etching process of manufacturing processes of a semiconductor Ueha the The present invention relates to an exhaust gas processing device for processing.

【0002】[0002]

【従来の技術】半導体ドライエッチングプロセスにおい
てエッチングガスやプラズマCVD装置等のクリーニン
グに使用されるPFCガスやNFは赤外線吸収量が大
きいため地球温暖化係数(GWP)が炭酸ガスの数千倍
と大きく、地球温暖化防止のために直接排気する事が規
制される。PFCガスとしてCF,C,S
,NF,CHF,Cの6種類を規定し、
それらの排出削減と排出削減技術開発が要請されてい
る。
And thousands times of semiconductor dry etching processes global warming potential for PFC gas and NF 3 used for cleaning, such as etching gas or plasma CVD apparatus infrared absorption is large in (GWP) is carbon dioxide It is large and direct exhaust is regulated to prevent global warming. CF 4 , C 2 F 6 , S as PFC gas
Define F 6, NF 3, CHF 3 , 6 types of C 3 F 6,
Emission reduction and development of emission reduction technology are required.

【0003】半導体製造のドライ・エッチング工程、プ
ラズマCVDクリーニング工程ではC,NF
特に使われ、それら使用量が年々増加する傾向にある。
In the dry etching process and the plasma CVD cleaning process of semiconductor manufacturing, C 2 F 6 and NF 3 are particularly used, and their usage tends to increase year by year.

【0004】例えばCガスはドライ・エッチング
装置へ導入され、高周波放電によりプラズマ化され、エ
ッチング種を発生させ、半導体基板シリコン酸化膜等の
エッチングを行なう。その場合反応生成物としてSiF
,COF等ができる。それら反応生成物やC
ガスのプラズマ化度が小さいため分解せずに残った80
%以上の未反応ガスとして残ったCガスはポンプ
により反応室外へ排気され、反応生成物は活性炭やゼオ
ライト等に吸着させて除害を行う、未反応Cガス
は化学的に安定であり吸着されないため、LPG,CH
ガスによる直接燃焼分解、電熱ヒーター加熱による熱
酸化分解、吸着材や触媒の加熱による吸着回収、プラズ
マ分解等を行ってC等のPFCの除害を行ってい
る。
[0004] For example, C 2 F 6 gas is introduced into a dry etching apparatus, is converted into plasma by high frequency discharge, generates etching species, and etches a silicon oxide film on a semiconductor substrate. In that case, SiF is used as a reaction product.
4 , COF 2 and the like. These reaction products and C 2 F 6
80 remaining without decomposition due to the low degree of plasma conversion of gas
% Or more of the C 2 F 6 gas remaining as an unreacted gas is exhausted to the outside of the reaction chamber by a pump, and the reaction product is adsorbed on activated carbon, zeolite, or the like to perform harm. The unreacted C 2 F 6 gas is chemically removed. LPG, CH
PFC such as C 2 F 6 is harmed by performing direct combustion decomposition with four gases, thermal oxidative decomposition by heating with an electric heater, adsorption and recovery by heating an adsorbent or a catalyst, and plasma decomposition.

【0005】ガスによる直接燃焼分解は、水素ガスやプ
ロパンガスを燃焼させCを850度〜1000℃
に加熱し C+11O+2C→10CO
+12HF+12HOに分解する。電熱ヒーターに
よる熱酸化分解等の除害手段はCを900℃〜1
100℃に加熱し C+2O→2CO+3F
に分解し両者それぞれHF,Fを発生させる。
[0005] In direct combustion decomposition by gas, hydrogen gas or propane gas is burned to convert C 2 F 6 to 850 ° C to 1000 ° C.
And heated to C 2 F 6 + 11O 2 + 2C 3 H 8 → 10CO
It decomposes to 2 + 12HF + 12H 2 O. Abatement means of the thermal oxidation decomposition by the electric heater 900 ° C. The C 2 F 6 to 1
Heat to 100 ° C and C 2 F 6 + 2O 2 → 2CO 2 + 3F
Both decomposed into 2 each HF, to generate F 2.

【0006】主にHFに分解された高温ガスは冷却さ
れ、後段の水スクラバーでガスを水に吸収させて、NF
3をTLV値以下に下げガスを排気させている。弗酸水
は集中水処理漕で中和処理する。
The high-temperature gas mainly decomposed into HF is cooled, and the gas is absorbed into water by a water scrubber at the subsequent stage, so that NF is removed.
3 is lowered below the TLV value to exhaust the gas. Hydrofluoric acid water is neutralized in a centralized water treatment tank.

【0007】しかしながら、ドライ・エッチング装置で
半導体基板シリコン酸化膜等のプラズマエッチングやプ
ラズマCVD、減圧CVDのチャンバークリーニング工
程でプラズマクリーニングを行なうと、反応生成物とし
てSiF,COF等ができる。特にSiFはドラ
イ・エッチング装置、プラズマCVDから除害装置を結
ぶ配管、ポンプ等をSiOとなって詰まらせる。Si
粉、未粉化のSiFは、除害装置のPFCの加熱
バーナーや電熱ヒーター部に燃焼されてシリカとなって
堆積し、燃焼、加熱効率を不安定にする。そのため加熱
部分、ヒーター部のメンテナンスが必要となっている。
[0007] However, when plasma etching is performed in a chamber etching step of plasma etching of a semiconductor substrate silicon oxide film or the like by a dry etching apparatus, plasma CVD, or low pressure CVD, SiF 4 , COF 2, and the like are generated as reaction products. In particular, SiF 4 becomes clogged with SiO 2 in pipes and pumps connecting the dry etching apparatus, the plasma CVD apparatus and the abatement apparatus. Si
The O 2 powder and unpulverized SiF 4 are burned by the PFC heating burner or the electric heater portion of the abatement apparatus to be deposited as silica, thereby making combustion and heating efficiency unstable. Therefore, maintenance of a heating part and a heater part is required.

【0008】水素ガスやプロパンガスによる直接燃焼分
解方式は燃焼ガスを用いるため、ガス漏れや着火不良等
の安全上厳重な設備、機能等、爆発防止の対策が必要で
ある。燃料ガス等のランニングコストがかかる。燃料ガ
ス燃焼に伴うCOの発生があるので地球温暖化防止の
ためCO発生量も少ないものが良い。電熱ヒーターに
よる熱酸化分解方式もヒーター加熱効率が悪いため加熱
準備時間が数時間かかる等の欠点を有している。
Since the direct combustion decomposition method using hydrogen gas or propane gas uses combustion gas, it is necessary to take measures to prevent explosion, such as safety and strict facilities and functions such as gas leakage and ignition failure. A running cost such as fuel gas is required. Since CO 2 is generated due to fuel gas combustion, it is preferable that the amount of CO 2 generated is small to prevent global warming. The thermal oxidative decomposition method using an electric heater also has a drawback that heating preparation time is several hours due to poor heater heating efficiency.

【0009】吸着剤加熱による吸着回収方式は、常温に
て、PCFは吸着材に吸着しにくいので吸着材を400
℃〜600℃に熱して活性化させてPFCを吸着させ
る。吸着材のランニングコストがかかるのと、吸着後の
吸着材の産業廃棄物処理費用がかかるという欠点を持
つ。
In the adsorption recovery method by heating the adsorbent, the PCF is hardly adsorbed by the adsorbent at room temperature, so
Activate by heating to ℃ to 600 ℃ to adsorb PFC. There is a disadvantage that the running cost of the adsorbent is high and the cost of treating the adsorbent after the adsorption is industrial waste.

【0010】PFCのプラズマ分解はポンプの手前に設
置して処理できる利点はある。現時点では処理量が少な
いので全体的に見て効率は良くない。又ポンプ前段での
粉体発生がありポンプに噛み込み、電気コストが大きい
等の問題がある。常圧コロナ放電プラズマはポンプ後段
に置き、低エネルギー、低温処理が出来るので省エネル
ギー除害装置なのだが、CVD装置で使用するクリーニ
ングガス量に対応できない欠点がある。
[0010] The plasma decomposition of PFC has the advantage that it can be installed and processed before the pump. At present, the amount of processing is small, so that overall efficiency is not good. In addition, there is a problem that powder is generated at the front stage of the pump, and the powder is caught in the pump, resulting in high electric cost. Atmospheric pressure corona discharge plasma is placed in the latter stage of the pump and can be treated with low energy and low temperature, so it is an energy saving and abatement device. However, it has a disadvantage that it cannot cope with the amount of cleaning gas used in the CVD device.

【0011】[0011]

【発明が解決しようとする課題】PFCガスは極めて安
定な元素であるために、簡単に吸着、分解が出来ない。
そのため大気中にPFCをそのまま放出されると、地球
温暖化という地球環境に大きな影響を与える。PFCガ
スを大気中に直接に放出しないようにする除害処理装置
が必要となる。通常処理効率の面からPFCガスを燃焼
させ、炭酸ガスと水とハロゲン化物に分解させる燃焼方
式が使われているが、PFCガスが安定なため800℃
〜1000℃の高温分解熱を必要とする。そのために燃
焼ガスを用いるために安全性に非常に問題があり、工場
内での管理が極めて神経質に行われているのが現状であ
る。
Since PFC gas is an extremely stable element, it cannot be easily adsorbed and decomposed.
Therefore, if PFC is released into the atmosphere as it is, it has a significant effect on the global environment called global warming. There is a need for a detoxification apparatus that does not directly release PFC gas into the atmosphere. Usually, a combustion method is used in which PFC gas is burned from the viewpoint of processing efficiency and decomposed into carbon dioxide gas, water and a halide, but 800 ° C. because the PFC gas is stable.
Requires high temperature decomposition heat of ~ 1000 ° C. For this reason, the use of combustion gas poses a serious safety problem, and management in factories is currently performed extremely nervously.

【0012】本発明の目的は、半導体製造工程で安全面
と環境面とコスト面から見てPFCガスを処理する有意
な処理方法及び処理装置を提供することにある。
An object of the present invention is to provide a significant processing method and apparatus for processing PFC gas in the semiconductor manufacturing process from the viewpoints of safety, environment and cost.

【0013】[0013]

【課題を解決するための手段】以上の目的を達成するた
めに提案される本発明に係る排ガス処理装置の特徴は次
の通りである。
The features of the exhaust gas treatment apparatus according to the present invention proposed to achieve the above object are as follows.

【0014】すなわち、本発明に係る排ガス処理装置
は、半導体ウエーハー成膜プロセスにおいて排出される
PFCガスを容器内に流入させ、通過する通路内に耐熱
高温耐酸化性に優れた金属で電磁誘導用コイルを形成
し、電磁誘導用コイル自身の自己発熱分で通過するガス
の予備加熱を行い、電磁誘導用コイルの内側にガス排出
筒を兼ねた円筒を設け、円筒内をガスが通過可能な様に
設けられた高周波誘導加熱体をガス分解温度に加熱昇温
させ、高温加熱体に予備加熱されたPFCガスを当てて
熱分解し、排出された分解高温ガスを急速に80℃以下
に冷却し、水に分解ガスを吸収させて除害処理を行なう
ように構成したことを特徴とする。
That is, in the exhaust gas treatment apparatus according to the present invention, a PFC gas discharged in a semiconductor wafer film forming process is introduced into a container, and a metal excellent in heat resistance, high temperature and oxidation resistance is used in a passage for electromagnetic induction. A coil is formed, preheating of the gas that passes by the self-heating of the electromagnetic induction coil itself is performed, and a cylinder serving as a gas discharge cylinder is provided inside the electromagnetic induction coil so that the gas can pass through the cylinder. The high-frequency induction heating body provided in the above is heated to a gas decomposition temperature and heated to a high-temperature heating body, and the preheated PFC gas is applied to thermally decompose. The discharged high-temperature gas is rapidly cooled to 80 ° C or less. In addition, it is characterized in that the detoxification processing is performed by absorbing the decomposition gas into water.

【0015】排ガスが上部側面から流入する容器内に、
上底を有した金属円筒外周壁に絶縁碍子を介して金属線
を巻き付け電磁誘導用コイルを形成し、コイル付き円筒
形成体を容器上蓋中心より固定棒を介して宙吊り状に固
定し、容器内側と電磁誘導コイルの中側に設けられた金
属筒外壁との間を通過した排ガスは容器下蓋とコイル付
き円筒形成体との隙間からコイル付き円筒形成体に流入
し、コイル付き円筒形成体内側に設けた金属筒に排ガス
を通過させて、容器より排出させた事を特徴とする。
In a container into which exhaust gas flows from the upper side,
A metal wire is wound around an outer peripheral wall of a metal cylinder having an upper bottom through an insulator to form an electromagnetic induction coil, and the cylindrical body with the coil is fixed in a suspended manner from a center of the container upper lid via a fixing rod, and the inside of the container is fixed. Exhaust gas that has passed between the outer wall of the metal cylinder provided on the inner side of the electromagnetic induction coil flows into the cylindrical body with the coil through the gap between the container lower lid and the cylindrical body with the coil, and the inside of the cylindrical body with the coil. The exhaust gas is passed through the metal cylinder provided in the above and discharged from the container.

【0016】PFCガス量に応じて、PFCガスが確実
に1000℃以上の発熱体で作られた熱酸化分解高温ゾ
ーンを通過出来るように、また、燃焼ガスであるLPG
(C)やCHを燃焼させずに急速に且つ安定し
た高温分解雰囲気を作れる様に電磁誘導加熱を用いてい
る。
In accordance with the amount of the PFC gas, the PFC gas can be surely passed through a high-temperature zone of thermal oxidative decomposition formed of a heating element at a temperature of 1000 ° C. or higher.
Electromagnetic induction heating is used to create a rapid and stable high-temperature decomposition atmosphere without burning (C 3 H 8 ) or CH 4 .

【0017】電磁誘導用コイル自身の熱によりガスを予
備加熱し、次のガス通路に当たる所に、ガスとより広く
接触を行い得る様に金属板成形体を設けて、電磁誘導加
熱により、PFCガスが分解する温度800〜1100
℃まで昇温させる。
The gas is preheated by the heat of the electromagnetic induction coil itself, and a metal plate molded body is provided at a position corresponding to the next gas passage so as to be able to make more extensive contact with the gas. Decomposes at a temperature of 800 to 1100
Heat up to ° C.

【0018】排ガスが下部側面から流入する容器内で、
容器の下蓋金属に穴を開けて金属円筒を貫通させて円筒
外周を全周溶接させてあり、円筒高さは容器の高さより
低い位置に有り、その円筒に絶縁碍子を介して金属線を
巻いて電磁誘導コイルを形成し、円筒内部にガスが流通
排気出来るように電磁誘導加熱体を配置した事を特徴と
する。
In a container into which exhaust gas flows from the lower side,
A hole is made in the lower lid metal of the container, a metal cylinder is penetrated, and the outer circumference of the cylinder is welded all around.The height of the cylinder is lower than the height of the container, and a metal wire is inserted through the insulator through the insulator. It is characterized in that an electromagnetic induction coil is formed by winding, and an electromagnetic induction heating body is arranged so that gas can flow and exhaust inside the cylinder.

【0019】この手段では、電磁誘導コイル内側の円筒
内部に電磁誘導加熱体となり得る金属材料あるいは炭素
・セラミックス複合材料で形成したガス加熱体をPFC
ガスが分解する温度800〜1100℃まで昇温させ
る。
According to this means, a gas heater made of a metal material or a carbon / ceramic composite material which can be an electromagnetic induction heater is provided inside a cylinder inside the electromagnetic induction coil by a PFC.
The temperature is raised to a temperature at which the gas decomposes to 800 to 1100 ° C.

【0020】前記の手段では、電磁誘導コイルはニッケ
ル系インコネル合金、コバルト系ハステロイ合金等の耐
熱高温耐酸化性に優れた金属で構成し、電磁誘導用コイ
ルの内側のガス排出筒を兼ねた円筒は耐熱衝撃性、機械
強度を備えた炭化珪素等のセラミック等でも良く、金属
コイルとの間に碍子を介するなら耐熱高温耐酸化性に優
れた金属でも良い。
In the above means, the electromagnetic induction coil is made of a metal having excellent heat resistance, high temperature and oxidation resistance, such as a nickel-based Inconel alloy or a cobalt-based Hastelloy alloy, and has a cylindrical shape serving also as a gas discharge tube inside the electromagnetic induction coil. May be a ceramic having thermal shock resistance and mechanical strength, such as silicon carbide, or a metal having excellent heat and high temperature oxidation resistance if an insulator is interposed between the coil and the metal coil.

【0021】半導体ウエーハーのプラズマエッチングや
プラズマCVD装置等のプラズマクリーニング処理工程
で排出する未反応PFCガス,反応生成ガスSiF
流通配管内で生成したSiO粉等をフィルターと吸着
材を通過させ粉体とSiFを除去させた後にPFCを
流入する事を特徴とした。
Unreacted PFC gas, reaction product gas SiF 4 , discharged in a plasma cleaning process such as plasma etching of a semiconductor wafer or a plasma CVD device,
It is characterized in that PFC flows in after SiO 2 powder and the like generated in the flow pipe are passed through a filter and an adsorbent to remove powder and SiF 4 .

【0022】PFCガス量に応じて、PFCガスが確実
に1000℃以上の発熱体で作られた熱酸化分解高温ゾ
ーンを通過出来るように、また、燃焼ガスであるLPG
(C)やCHを燃焼させずに急速に高温分解雰
囲気を作るために電磁誘導加熱を用いる。
In accordance with the amount of the PFC gas, the PFC gas can be surely passed through a high-temperature zone of thermal oxidative decomposition formed by a heating element of 1000 ° C. or higher, and LPG as a combustion gas is used.
Electromagnetic induction heating is used to quickly create a high-temperature decomposition atmosphere without burning (C 3 H 8 ) or CH 4 .

【0023】本発明の係る排気ガスの処理装置は、PF
CガスとSiF4の混合ガスと除害装置へのイン側配管
で発生する堆積物SiOの混合物から、SiOとS
iF4をフィルターや吸着材で分離する装置と、PFC
ガスの電磁誘導加熱分解処理室と、分解高熱ガス冷却部
と、分解ガス捕捉剤の供給部と、分解ガス捕捉部を有す
るものである。
[0023] The exhaust gas treatment apparatus according to the present invention comprises a PF
From the mixture of the mixed gas of C gas and SiF4 and the deposit SiO 2 generated in the in-side piping to the abatement system, SiO 2 and S
A device that separates iF4 with a filter or adsorbent, and a PFC
It has an electromagnetic induction thermal decomposition processing chamber for gas, a decomposition high-temperature gas cooling section, a supply section for a decomposition gas trapping agent, and a decomposition gas trap section.

【0024】このような構成を有する本発明の排ガス処
理装置は、ガス検知部信号制御、分解ガス捕捉剤の供給
部制御、高速応答性放射温度計によるインバーター電磁
誘導加熱部の温度制御、バルブの開閉制御、水位等の位
置制御、ペーハー電位による制御等はコンピュータによ
り一元的に行われる。
The exhaust gas treatment apparatus of the present invention having the above-described structure is capable of controlling the signal of the gas detection section, controlling the supply section of the decomposition gas trapping agent, controlling the temperature of the inverter electromagnetic induction heating section by using a high-speed radiation thermometer, and controlling the valve. Opening / closing control, position control such as water level, control based on pH, and the like are integrally performed by a computer.

【0025】[0025]

【作用】本発明は、PFCガスの排気ガス処理におい
て、電磁誘導加熱により発熱体を加熱しクリーニングガ
スやエッチングガスとして反応せずに送り込まれたPF
Cガスを速やかに熱分解し、分解ガスは反応生成物を形
成するために導入した物質と反応させ反応生成物を捕捉
する作用を有している。
According to the present invention, in the exhaust gas treatment of PFC gas, the heating element is heated by electromagnetic induction heating and is fed as a cleaning gas or an etching gas without reacting.
The C gas is quickly thermally decomposed, and the decomposed gas has a function of reacting with a substance introduced to form a reaction product and capturing the reaction product.

【0026】[0026]

【発明の実施の形態】半導体ウエーハーの製造処理のド
ライエッチングプロセスから排出する未反応エッチング
ガスやプラズマエッチング反応生成物、プラズマCVD
装置から排出する未反応クリーニングガスやプラズマク
リーニング反応生成物であるPFCガスとSiF4ガス
とSiO粉の混合体からSiO粉とSiF4を分離
する装置を設ける。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Unreacted etching gas and plasma etching reaction products discharged from a dry etching process in a semiconductor wafer manufacturing process, plasma CVD
Apparatus providing a device for separating the SiO 2 powder and SiF4 of a mixture of PFC gas and SiF4 gas and SiO 2 powder is unreacted cleaning gas and plasma cleaning reaction products discharged from.

【0027】前段で濾過されたPFCガスを電磁誘導加
熱分解処理室に上部側面より下部へ通過させる。PFC
ガス分解室は電磁誘導加熱の発熱体を入れるステンレス
で形成された最外周壁を形成する筒部11とステンレス
製のPFCガス導入口9が筒部11上部に有り、上蓋部
12と筒部11の上フランジが連結されている。上蓋部
12の中心位置に上蓋部12との間に絶縁材を挟んで金
属円筒16を宙吊り状で取り付ける。電磁誘導加熱用コ
イル14の上端部を上蓋部12のコイル入力端子10と
接合し、円筒16外周に碍子を介在させてコイルを巻い
て、上蓋部12のコイル入力端子13と接合する。
The PFC gas filtered in the preceding stage is passed from the upper side to the lower part through the electromagnetic induction thermal decomposition treatment chamber. PFC
The gas decomposition chamber has a cylindrical portion 11 formed of stainless steel for containing a heating element of electromagnetic induction heating and a stainless steel PFC gas inlet 9 at the upper portion of the cylindrical portion 11, and an upper lid portion 12 and a cylindrical portion 11. Upper flanges are connected. A metal cylinder 16 is attached to the center position of the upper lid 12 in a suspended manner with an insulating material interposed between the upper lid 12 and the metal cylinder 16. The upper end of the electromagnetic induction heating coil 14 is joined to the coil input terminal 10 of the upper lid 12, the coil is wound around the outer periphery of the cylinder 16 with an insulator interposed, and joined to the coil input terminal 13 of the upper lid 12.

【0028】コイル下端を円筒16に接合させて、円筒
16の上部にコイル入力端子13が取り付けられていて
も良く。
The lower end of the coil may be joined to the cylinder 16, and the coil input terminal 13 may be attached to the upper part of the cylinder 16.

【0029】金属筒部11の下蓋部の中心部貫通穴に金
属円筒17を挿入して全周溶接固定されている。
A metal cylinder 17 is inserted into a through hole at the center of the lower cover of the metal cylinder 11 and is fixed by welding all around.

【0030】電磁誘導加熱用コイル14は発熱体でもあ
る。耐高温酸化性に優れたニッケル系、コバルト系の合
金で形成する。イから入ったPFCガスはロを通るとき
にコイル14の自己加熱分により予備加熱される
The electromagnetic induction heating coil 14 is also a heating element. It is formed of a nickel-based or cobalt-based alloy having excellent high-temperature oxidation resistance. The PFC gas entered from b is preheated by the self-heating of the coil 14 when passing through b.

【0031】コイル14の誘導加熱により円筒17金属
表面温度を900〜1100℃に加熱し、PFCガスを
ハ、ニ、ホの順に通過させて熱分解させる。
The metal surface temperature of the cylinder 17 is heated to 900 to 1100 ° C. by induction heating of the coil 14, and PFC gas is passed therethrough in the order of c, d, and e to be thermally decomposed.

【0032】ハ、ニの部分に分解効率を上げるために、
通過する排ガスが電磁誘導可能な加熱体に広く接触する
ようにおいても良い。耐熱耐酸化性に優れた金属や、カ
ーボンセラミックで成形した球体18や、多穴を開けた
円柱加熱体19をリング状の加熱体スペーサー20を介
して穴を通過したガスが、多穴を開けた円柱加熱体の発
熱体19の穴をずらした面に当たるように配置してなる
複数セットを金属筒から落下する事なく入れる。
In order to increase the decomposition efficiency of the parts c and d,
The passing exhaust gas may come into wide contact with the electromagnetically inducible heating body. Gas that has passed through a hole through a sphere 18 formed of a metal or carbon ceramic excellent in heat resistance and oxidation resistance or a cylindrical heater 19 having a plurality of holes through a ring-shaped heating element spacer 20 opens the hole. A plurality of sets, which are arranged so as to hit the shifted surfaces of the heating elements 19 of the cylindrical heating element, are inserted without falling from the metal cylinder.

【0033】流入PFCガスは高温発熱体に触れて、以
下のように分解され 2C+3O+2HO→4CO+4F+4
HF となる。
The inflowing PFC gas touches the high-temperature heating element and is decomposed as follows: 2C 2 F 6 + 3O 2 + 2H 2 O → 4CO 2 + 4F 2 +4
HF.

【0034】HFに分解されたガスは80℃以下に冷却
する冷却ゾーン23に吸引される。高温ガスの冷却用に
ブロワー24から送風された空気を混合させ、PVC、
FRP樹脂等の熱劣化しない温度まで冷却された分解ガ
スは、樹脂製水槽28に送られてバブラー26を通して
水中捕捉されて希弗酸水、炭酸水になり樹脂製ドレイン
配水管5で集中水処理槽に送られ、水酸化カルシウムC
(OH)と反応させてCCO,Cとして
処理される。ガス化してガス排気側に向かうHFはPF
Cガスを除害した排ガスを排気口から排気する。
The gas decomposed into HF is sucked into a cooling zone 23 for cooling the gas to 80 ° C. or lower. The air blown from the blower 24 is mixed for cooling the hot gas, and PVC,
The decomposed gas, such as FRP resin, cooled to a temperature that does not cause thermal deterioration is sent to a resin water tank 28, captured in water through a bubbler 26, becomes dilute hydrofluoric acid water and carbonated water, and is subjected to concentrated water treatment in the resin drain pipe 5. Sent to the tank, calcium hydroxide C
a (OH) 2 and treated as Ca CO 3 , Ca F 2 . HF which is gasified and goes to the gas exhaust side is PF
Exhaust gas from which C gas has been removed is exhausted from an exhaust port.

【0035】あるいは冷却した反応生成ガスをペレット
状の水酸化カルシウムを充填したリアクタータンク内に
導入し、C(OH)に反応させCCO,C
として処理し、PFCガスを除害した排ガスを除害装
置から排気する。
[0035] Alternatively cooled reaction product gas was introduced into the reactor tank filled with pellets of calcium hydroxide, C a CO 3 are reacted to C a (OH) 2, C a F
Was treated as 2, for exhausting the exhaust gas detoxified the PFC gas from scrubbers.

【0036】さらに、排ガスの温度降下方法として、水
冷却と乾式の何れを用いてもよく、排気ブロワー耐熱温
度(80℃)以下まで下がれば良い。
Further, as a method of lowering the temperature of the exhaust gas, either a water cooling method or a dry method may be used, and the temperature may be lowered to a temperature lower than the exhaust blower heat resistance temperature (80 ° C.).

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の1実施の形態による排ガス処理装置を
示す全体図である。
FIG. 1 is an overall view showing an exhaust gas treatment apparatus according to one embodiment of the present invention.

【図2】本発明の1実施の形態による排ガス処理装置を
示す全体図である。
FIG. 2 is an overall view showing an exhaust gas treatment apparatus according to one embodiment of the present invention.

【図3】本発明の1実施の形態による排ガス分解塔断面
図である。
FIG. 3 is a sectional view of an exhaust gas decomposition tower according to one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 ガス入口 2 除害ガス排気 3 給水 4 排水 5 ドレイン排水 8 放射温度計窓 9 ガス導入口 10 コイル入力端子 11 筒部 12 上蓋 13 コイル入力端子 14 電磁誘導加熱用コイル 15 碍子 16 金属円筒 17 内部円筒 18 電磁誘導加熱球体 19 電磁誘導加熱発熱体 20 電磁誘導加熱発熱体スペーサー 21 電磁誘導加熱発熱体 23 冷却ゾーン 24 ガス冷却用ブロワー 25 水位レベルセンサー 26 バブリング筒 27 水シャワー DESCRIPTION OF SYMBOLS 1 Gas inlet 2 Exhausted gas exhaust 3 Water supply 4 Drain 5 Drain drain 8 Radiation thermometer window 9 Gas inlet 10 Coil input terminal 11 Cylindrical part 12 Top lid 13 Coil input terminal 14 Electromagnetic induction heating coil 15 Insulator 16 Metal cylinder 17 Inside Cylinder 18 Electromagnetic induction heating sphere 19 Electromagnetic induction heating element 20 Electromagnetic induction heating element spacer 21 Electromagnetic induction heating element 23 Cooling zone 24 Gas cooling blower 25 Water level sensor 26 Bubbling cylinder 27 Water shower

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H05B 6/10 301 H01L 21/302 B Fターム(参考) 3K059 AA08 AB00 AB04 AB12 AB15 AB23 AB28 AC10 AC54 AD10 AD15 AD35 CD44 CD48 CD52 CD74 3K078 BA20 BA26 CA24 4D002 AA22 BA02 BA04 BA12 BA13 BA14 DA35 EA01 EA02 EA05 EA07 GA03 GB09 HA02 5F004 AA16 BC02 BC08 CA04 CA09 DA01 DA02 DA03 DA15 DA16 DA17 5F045 AD13 AD14 AD15 EB06 EG07 EG08 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H05B 6/10 301 H01L 21/302 B F-term (Reference) 3K059 AA08 AB00 AB04 AB12 AB15 AB23 AB28 AC10 AC54 AD10 AD15 AD35 CD44 CD48 CD52 CD74 3K078 BA20 BA26 CA24 4D002 AA22 BA02 BA04 BA12 BA13 BA14 DA35 EA01 EA02 EA05 EA07 GA03 GB09 HA02 5F004 AA16 BC02 BC08 CA04 CA09 DA01 DA02 DA03 DA15 DA16 DA17 5F045 AD13 AD14 AD15 EB06 EG07

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 半導体ウエーハー成膜プロセスにおいて
排出されるPFCガス(炭素とフッ素のみで構成される
フロンガス),NFガスを容器内に流入させ、通過す
る通路内に耐熱高温耐酸化性に優れた金属で電磁誘導用
コイルを形成し、電磁誘導用コイル自身の自己発熱分で
通過するガスの予備加熱を行い、電磁誘導用コイルの内
側にガス排出筒を兼ねた円筒を設け、円筒内をガスが通
過可能な様に設けられた高周波誘導加熱体をガス分解温
度に加熱昇温させ、高温加熱体に予備加熱されたPFC
ガスを当てて熱分解し、排出された分解高温ガスを急速
に80℃以下に冷却し、水に分解ガスを吸収させて除害
処理を行なうように構成したことを特徴とする排ガス処
理装置。
1. A PFC gas (Freon gas composed of only carbon and fluorine) and an NF 3 gas discharged in a semiconductor wafer film forming process are flowed into a container, and have excellent heat and high temperature oxidation resistance in a passage passing therethrough. An electromagnetic induction coil is formed from the metal that has been formed, preheating of the gas that passes by the self-heating of the electromagnetic induction coil itself is performed, and a cylinder also serving as a gas discharge cylinder is provided inside the electromagnetic induction coil, and the inside of the cylinder is formed. A PFC preheated to a high-temperature heating element by heating and heating the high-frequency induction heating element provided to allow gas to pass through to the gas decomposition temperature
An exhaust gas treatment apparatus characterized in that it is configured to thermally decompose by applying a gas, rapidly cool the discharged high-temperature decomposition gas to 80 ° C. or lower, and absorb the decomposition gas in water to perform abatement treatment.
【請求項2】 排ガスが上部側面から流入する容器内
に、上底を有した金属円筒外周壁に絶縁碍子を介して金
属線を巻き付け電磁誘導用コイルを形成し、コイル付き
円筒形成体を容器上蓋中心より固定棒を介して宙吊り状
に固定し、容器内側と電磁誘導コイルの中側に設けられ
た金属筒外壁との間を通過した排ガスは容器下蓋とコイ
ル付き円筒形成体との隙間からコイル付き円筒形成体に
流入し、コイル付き円筒形成体内側に設けた金属筒に排
ガスを通過させて、容器より排出させた請求項1に記載
の処理装置。
2. An electromagnetic induction coil is formed by winding a metal wire around an outer peripheral wall of a metal cylinder having an upper bottom through an insulator in a container into which exhaust gas flows from an upper side surface. Exhaust gas that has been fixed in a suspended manner from the center of the upper lid via a fixing rod and passed between the inner side of the container and the outer wall of the metal cylinder provided on the inside of the electromagnetic induction coil is the gap between the lower lid of the container and the cylindrical formed body with the coil. The processing apparatus according to claim 1, wherein the exhaust gas flows into the cylindrical body with the coil, the exhaust gas passes through a metal cylinder provided inside the cylindrical body with the coil, and is discharged from the container.
【請求項3】 排ガスが下部側面から流入する容器内
で、容器の下蓋金属に穴を開けて金属円筒を貫通させて
円筒外周を全周溶接させてあり、円筒高さは容器の高さ
より低い位置に有り、その円筒に絶縁碍子を介して金属
線を巻いて電磁誘導コイルを形成し、円筒内部にガスが
流通排気出来るように電磁誘導加熱体を配置した請求項
1に記載の処理装置。
3. In a container into which exhaust gas flows from a lower side surface, a hole is made in a lower cover metal of the container, a metal cylinder is penetrated, and the outer periphery of the cylinder is welded all around. The height of the cylinder is higher than the height of the container. 2. The processing apparatus according to claim 1, wherein the electromagnetic induction coil is formed by winding a metal wire around the cylinder via an insulator, and an electromagnetic induction heating body is disposed inside the cylinder so that gas can be circulated and exhausted. .
【請求項4】 半導体ウエーハーのプラズマエッチング
やプラズマCVD装置等のプラズマクリーニング製造処
理工程で排出する未反応PFCガス,反応生成ガスSi
、流通配管内で生成したSiO粉等をフィルター
と吸着材を通過させ粉体とSiFを除去させた後にP
FCを流入する請求項1に記載の処理装置。
4. An unreacted PFC gas and a reaction generated gas Si discharged in a plasma cleaning manufacturing process such as a plasma etching of a semiconductor wafer or a plasma CVD apparatus.
F 4 , after passing the SiO 2 powder and the like generated in the flow pipe through a filter and an adsorbent to remove the powder and SiF 4 ,
The processing apparatus according to claim 1, into which the FC flows.
JP2000280932A 2000-08-12 2000-08-12 Exhaust gas treatment equipment Expired - Lifetime JP3927359B2 (en)

Priority Applications (2)

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TW090122484A TW505991B (en) 2000-08-12 2001-09-11 Exhaust gas treating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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Publications (3)

Publication Number Publication Date
JP2002058961A true JP2002058961A (en) 2002-02-26
JP2002058961A5 JP2002058961A5 (en) 2005-04-07
JP3927359B2 JP3927359B2 (en) 2007-06-06

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US7175681B2 (en) * 2002-12-26 2007-02-13 National University Corporation, Tokyo University of Marine Science and Technology Apparatus for removing fine particles in exhaust gas
JP2006026614A (en) * 2004-07-21 2006-02-02 Akiji Nishiwaki Waste gas treating method and waste gas treating apparatus
KR100654922B1 (en) 2006-01-26 2006-12-06 주식회사 코캣 Cleaning apparatus of exhaust gas produced from semiconductor production process and method thereof
JP2007315854A (en) * 2006-05-24 2007-12-06 Chugoku Electric Power Co Inc:The Strain gauge
KR101011327B1 (en) 2007-09-19 2011-01-28 가부시끼가이샤 퓨처 비전 Substrate heat-treating furnace
JP2015052420A (en) * 2013-09-06 2015-03-19 大陽日酸株式会社 Exhaust gas treatment system
CN112915718A (en) * 2021-01-25 2021-06-08 北京京仪自动化装备技术有限公司 Semiconductor processing waste gas treatment equipment
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