TW538248B - Method and device to dynamically increase the DC measurement precision, and readable medium of processor to store program - Google Patents

Abstract

A method and device to dynamically increase the DC measurement precision, and readable medium of processor to store program are disclosed. Firstly, set an integration period and a measurement precision and a constant detection period. Then set the memory space of the memory according to the integration period. Proceed capturing plural data to control a hardware interface according to the integration period, and store the data in the memory. Judge if the said captured data is the first capture, if so, proceed a Fourier signal spectrum analysis to the said stored data to obtain plural sets of frequencies and amplitude values, and obtain plural standard amplitude values from the amplitude values after a standardization process, wherein the amplitude value comprises a DC amplitude value to divide the amplitude value for obtaining the standard amplitude value in the standardization computation. Analyzing the said standard amplitude value, find the frequencies corresponding to the standard amplitude value over the measurement precision for forming a frequency set. Find the maximum common factor frequency of the said frequency set after computation. Then update the said integration period as the reciprocal of the maximum common factor frequency and re-execute the said all steps. When the capture of the said data is judged to be not the first capture, the summation of the said stored data is divided by the said updated integration period to obtain an accurate DC measurement result. Finally, when the time of constant detection period is up, re-execute the said all steps.

Description

538248 Case No. 90131928 Depreciation 4 · Revised Date Month Date Revised 5. Description of the Invention (1) The present invention relates to a method and device for dynamically improving precise direct current accurate measurement, especially a method and device that can Automatically perform automatic frequency analysis on the DC measurement signal carrying the unknown frequency, and then dynamically adjust the integration method to separate the DC component from the measured result value to improve the precision of the DC measurement. At present, precision DC measurement technology is widely used in industry, such as electronic component characteristic curve tracer and precision component DC characteristic analyzer, voltmeter, ammeter, etc. in integrated circuit industry. In the past, there were many different DC Measurement methods have been proposed. Each method has its specific focus and characteristics. The following are several commonly used designs. Fig. 1 is a block diagram showing a conventional device using a conventional low-pass filter circuit structure as a direct flow measurement device. As shown in the figure, the low-pass filter and waver circuit 10 are used to filter the DC measurement signal 14 and then the analog digital conversion circuit 12 is used to perform the conversion to obtain the measurement result 16. The filter circuit has a poor effect on low-frequency filtering, which will cause a slow measurement speed, and the design and analysis of a high-order filter circuit is difficult. In addition, the electronic components are easily affected by factors such as environmental changes and cause poor stability. Both are disadvantages of this structure. Fig. 2 is a block diagram showing a conventional digital low-pass filter circuit structure as a DC measurement device. As shown in the figure, the digital low-pass filter circuit 20 is the design of a low-pass filter circuit using a digital operation processor. The DC measurement signal 24 is first converted by the analog digital conversion circuit 22, and then the digital The low-pass filter circuit 20 processes the measurement result 26. It has better stability, which is the biggest advantage of this structure.

Page 5 538248 Case No. 90131928 Amendment Round 4. Year, month, year, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month, month and month to month! The fixed delay of each measurement speed is a disadvantage of this structure. Fig. 3 is a block diagram showing a conventional device using an analog integrator circuit structure as a DC measurement device. When the fixed integration period T is reached, the analog integral integrator circuit 30 is used to complete the integration average of the fixed integration period T to filter out the DC measurement signal 3 4 with a specific noise frequency f. The conversion circuit 3 2 obtains a measurement result 3 6. The disadvantage of this structure is that the fixed integration period T can only filter out components containing a specific noise frequency f. Other noise that is sufficient to reduce the DC measurement accuracy but whose frequency is not a specific frequency f cannot be filtered. As far as the conventional precision DC measurement is concerned, as mentioned above, there are still many shortcomings. In view of this, it is extremely necessary to propose a device that is anti-noise, fast in measurement speed, simple in circuit structure, and high in accuracy of DC measurement. The purpose of the present invention is to provide a method and a device for dynamically improving precision DC accuracy measurement, which can meet the requirements of high stability, fast measurement speed, simple circuit structure, and high DC measurement accuracy. The invention can automatically perform an automatic frequency analysis on a DC measurement signal carrying an unknown frequency, and then dynamically adjust the integration mode 'separate the DC component from the measured result value, thereby improving the accuracy of the DC measurement, and its Digital DC measurement is used to greatly reduce the influence of noise caused by environmental changes and the stability of electronic components, and dynamic adjustment and integration methods are used for filtering operations to improve measurement accuracy and measurement speed. To achieve the above object, the present invention provides a method for dynamically improving DC accuracy.

Page Docket No. 6,538,248 90,131,928 ^ 4: date of '^ amended charge correction five times, measuring metrics invention is described first side, is provided between cycles. space. Extraction of the root and acquisition of the data to obtain the complex amplitude value (3) method, used to perform a fixed integration period. Then, according to the above integration period, the lean material is stored as the first pair. The array frequency is obtained by summing the data of the largest publicly available data including the direct current vibration amplitude and the DC vibration amplitude value divided by the standard amplitude value. The most frequent steps are the frequency of the response, the maximum factor frequency, and the above steps. It is clearly stated that the storage rate and the number of vibrations are used to calculate the value of the value. The inversion of the common factor rate has been changed. The update has been fixed at one place and the integration period has been controlled at the above-mentioned time. The numerically normalized vibration is more than a frequency from the above to the above. The number is equal to the first post-integration measurement in the time processor, which includes the following steps to measure accuracy. In the fixed detection period, a hardware-based memory is set in the cycle. If the above is performed a pair of pairs and passes through an amplitude, the measurement group is normalized and normalized, and then the last operation is updated and executed at the end. The cycle is to obtain the cycle. Arrival and proceed to one of the memory side of a memory. Then the data is normalized in the above-mentioned calculations, and the amplitude will be used. Accuracy After the calculation of all the above, the above will be repeated to a precise, repeat the number of judgments, judge to operate as the number of the spectrum operation from the amplitude of the above-mentioned vibration, and then, the standard to find the integration cycle step. The above-mentioned first analysis of the storage DC-DC is performed. The first analysis, the above-mentioned value, the number of packets, the analysis of the above-mentioned period, the above-mentioned period of measurement, and the above-mentioned processor-readable medium are used to store the following instructions: receiving an integration period and an amount Measurement accuracy and a fixed detection time period setting; according to the above-mentioned integration period, a memory space; according to the above integration period, control the acquisition of a few pieces of data and store the data in the above record, and provide a program, the above program includes the period setting memory Hardware interface

Page 7 538248 Case No. 90131928 Round 4 · Amendment

Amendment V. Description of the invention Recalling the data in the body; Extraction of data; Trial signal Standardization analysis of the maximum common factor of the frequency group of the above-mentioned standard amplitude value The amplitude number will be the above-mentioned vibration value. Other saved information Results. The most all steps cooperate with the present invention (4) to judge that the above-mentioned data is extracted for the first time, and then the spectrum value of the complex value is obtained from the standardization of the corresponding vibration-the maximum analysis to obtain the amplitude amplitude The frequency forms a frequency common factor to find the reciprocal value of the super frequency, including the value of the direct current amplitude. In addition to the above-mentioned data, in addition to the above fixed detection, the present invention produces a high-speed analog digital signal, a digital control signal, and a high-speed analog-to-digital converter. Find out the dynamic and dynamic conversion of the electrical work; material memory conversion of electrical data and data, the above-mentioned noise frequency; and re-amplify the value of the DC vibration to capture the integral measurement time to improve the precision of the DC circuit, use and integration. There are multiple bit transport frequencies in the execution memory, is it the first pair of the above-mentioned storage group frequency and a plurality of the above-mentioned rate group; and the above is performed by updating and updating, so as to obtain the second acquisition at the amplitude; when the above is stored The normalized measurement of the amplitude number accurately calculates the above-mentioned product, the above-mentioned index, and the above-mentioned standard, but when the period is reached to obtain a precise period, the heavy material is subjected to a pairwise value pair and subjected to an amplitude value and the standardization of division. Find the above sub-period as the order. Among them, the normalized amplitude in the upper normalization operation newly performs the above-mentioned dense DC precision measurement to perform the precise measurement of the dense DC current to perform the complex digital operation. The above-mentioned analogy is used to store several noise calculation processors and perform accurate measurement A measuring device, a plurality of analog processors, and a method for calculating and eliminating a frequency composition after converting signals using DC measurement. The method includes: DC measurement has a plurality of plural pens for controlling the number of signals on the signal. The digital information

Page 8 538248 Case number 90131928

Sister 4 · -1 amendment year, month and month 4 A amendment V. Invention description (5) Stream component signal. In addition, the digital operation processor also includes a Fourier frequency analysis device for performing frequency analysis on the digital data to find the noise frequency and a dynamic integration device for non-DC components of the noise frequency composition. The signals are dynamically integrated to eliminate the non-DC component signals mentioned above. In order to make the above and other objects, features, and advantages of the present invention more comprehensible, a preferred embodiment is given below in conjunction with the accompanying drawings to make a detailed description as follows: Brief description of the drawings: Figure 1 shows A block diagram of a conventional device using a conventional low-pass filter circuit structure as a DC measurement device. Fig. 2 is a block diagram showing a conventional digital low-pass filter circuit structure as a DC measurement device. . Fig. 3 is a block diagram showing a conventional device using an analog integrator circuit structure as a DC measurement device. . Fig. 4 shows a flowchart of a method for dynamically improving the accuracy of DC measurement in an embodiment of the present invention. Fig. 5 shows a flowchart of controlling the interface of the high-speed analog-to-digital conversion circuit to perform data acquisition and store the data in the memory according to the integration period in the embodiment of the present invention. FIG. 6 is a schematic diagram showing the architecture of a dynamic accurate DC measurement and measurement device according to an embodiment of the present invention. Explanation of symbols: I ~ DC measurement signal;

Page 9 538248 Case No. 90131928 Year

Amendment V. Description of the invention (6) 〇 ~ Measurement results; 1 0 ~ low-pass filter circuit; 1 2, 2 2, 3 2 ~ analog digital conversion circuit; 20 ~ digital low-pass filter; 3 0 ~ analog Integrating circuit; T ~ fixed integration period; f ~ specific noise frequency;

Tr ~ fixed detection time period; t ~ timer; Ti ~ integration period; M ~ measurement accuracy; 40 ~ high-speed analog digital conversion circuit; 4 ~ digital operation processor;

Sc ~ control signal; 4 4 ~ data memory; 4 6 ~ Fourier frequency analysis device; 4 8 ~ dynamic integration device; 5 1 ~ S p ~ non-DC component signal; A 1 ~ A η ~ DC measurement signal; D1 ~ Dn ~ digital data; fi 1 ~ fip ~ noise frequency; f〇l ~ fop, f 1 ~ fn ~ frequency group;

M1 ~ Mη ~ normalized amplitude value; A 1 ~ An ~ amplitude;

Page 10 538248 Case number 90131928

Modification 5. Description of the invention (7) A d ~ DC amplitude value, fg ~ Maximum common factor frequency. Examples The method for dynamically improving the DC precision measurement of the present invention is implemented in a processor. In the following description, the present invention is mainly used in a digital operation processor as an example, but for those skilled in the art, In terms of this, it can also be applied to other types of processors. In addition, the execution steps described below can be completed by a program executed in the arithmetic processor. Fig. 4 shows a flowchart of a method for dynamically improving the accuracy of DC measurement in an embodiment of the present invention. As shown in the figure, first, the user can set the integration period T i, the measurement accuracy M, and the fixed detection time period T r (step S 1). Then, the program uses the integration period T i designated by the user to set the memory space of the memory (step S2). Then, the program will control the high-speed analog-to-digital conversion circuit interface to retrieve a plurality of data according to the integration period and store the data in the above-mentioned memory (step S3). The program will generate standard unit time. The standard unit time is used to control and retrieve signals from the interface of the high-speed analog digital conversion circuit at intervals, and send a single piece of data to the above-mentioned memory for storage within the standard unit time. Continue until the sum of the plurality of standard unit times is the above integration period. Next, the program will determine whether the data acquisition in step S 3 is the first acquisition (step S 4). If the above data acquisition is the first acquisition, the program will perform the data storage in step S 3 Perform Fourier signal spectrum analysis to obtain complex array frequency and amplitude value pairs (f 1, A 1), (f 1, A 2), ...,

Page 11 538248 Case No. 90131928 92. 4. Year Month _ Year Amendment Fifth, Description of Invention (8) (f η, A η) [f 1 ~ f η is frequency, A 1 ~ A η is amplitude, η Is a positive integer], and a plurality of normalized amplitude values M 1 to M η are obtained from the above-mentioned amplitude values through a normalization operation (where η is a positive integer) (step S 5), and the above-mentioned amplitude value includes a DC amplitude value Ad, and the above-mentioned normalization operation That is, the above-mentioned plurality of amplitude values A 1 to A η are divided by the DC amplitude value Ad to obtain a plurality of standardized amplitude values ΜΜΜη, that is, Al / Ad2 M1, A2 / Ad = M2 ··· 'An / Ad = Mno Then, the program analyzes the normalized amplitude value ΜΜΜη to find the frequency corresponding to the normalized amplitude value exceeding the measurement accuracy M to form a frequency group (f0l ~ fop) [0 < p < n, ρ is a positive integer ] (Step S6), and then calculate to find the greatest common factor frequency fg of the frequency group (f 〇1 ~ f ο P) (step S 7). Finally, the integration period is updated to the inverse of the maximum common factor frequency f g and the above steps S1 to S4 are performed again (step S8). In addition, according to the judgment of step S4, when the above-mentioned data is not retrieved for the first time, the total of the stored data is divided by the integration period to obtain a precise DC measurement result (step S9). After dividing the total of the stored data by the above integration period to obtain a precise DC measurement result (step S 9), the timer t starts counting, and when the timer t exceeds the above-mentioned fixed detection time period Tr. (I.e., t > Tr ), The program will re-execute all the above steps (step S 1 0). Fig. 5 shows a flowchart of controlling the interface of the high-speed analog-to-digital conversion circuit to perform data acquisition and store the data in the memory according to the integration period in the embodiment of the present invention. As shown in the figure, the high-speed analog digital conversion circuit interface is controlled according to the integration period. The process of data acquisition and storage in the memory (refer to Figure 4, step S3) includes the following sub-steps: first,

Page 12 538248 Case No. 90131928 Month: i said correction and correction_year μ Supplementary V. Description of Invention (9)-The program will generate standard unit time (step S31). The standard unit will be controlled and excavated at intervals from the above. Signals of high speed analog digital conversion circuit interface. Then, a single piece of data is transmitted to the memory for storage within the standard time unit (step S32). Finally, the steps S31 and S3 are repeated until the sum of the plurality of standard unit times reaches the above integration period (S33). FIG. 6 shows an embodiment of the present invention to improve the DC accuracy dynamically. In order to cooperate with the method for dynamically improving the accuracy of the direct measurement of heart accuracy in the embodiments of the present invention, an embodiment of the present invention proposes a flow accurate measurement device, as shown in the figure; j; the measurement measurement device includes: high-speed analog digital conversion :: Tool 42. The high-speed analog digital conversion circuit 40 is used to perform the digital conversion of the measurement signal Ab An (n is a positive integer). The master 42 has a control signal Sc and a data memory. The control: = c is used for Control the above-mentioned analog-to-digital conversion circuit 40 to perform analogy: bu—digital conversion work, the above-mentioned data memory is “used: after the plural digital data M ~ Dn (n is positive = meaning material W ~ Dn, there are multiple non- The DC component signal sp] The component signal W ~ Sp is divided into a plurality of noise frequencies fU ~ f ^ / non-f ling W ~ Dn. The above-mentioned digital operation processor 42 is used to perform the non-DC component of the digital data: output T: frequency Π11 ~ Fip 'and add operation' to eliminate the Fourier frequency t ^ S1 ~ SP. In addition, the digital operation processor 42 includes an analysis device analysis device 46 and a dynamic integration device 48. The Fourier frequency 46 is used to frequency the digital data D1 to Dn. Analyze to find out +

538248 Case No. 90131928 V. Description of the invention (10) The signal frequency f i 1 ~ f i p, the dynamic integration device 48 is operated by a non-DC component signal Sb Sp composed of / f i p unless the DC component signal Sb Sp. In summary, the method and device for dynamically improving measurement according to the embodiment of the present invention can automatically perform automatic frequency analysis on the last-known signal, and then dynamically adjust the measured result value to separate the DC component to improve the degree. In addition, the digital DC measurement is used to greatly reduce the noise impact caused by the stability of the sub-components. The filtering operation is also adopted to improve the measurement accuracy and quantity. Invention, anyone who is familiar with this skill can make some modifications and retouching within the scope. Because the scope is defined by the scope of the appended patents, it is to modify the integral operation of the noise frequency fi 1 state. Accurate straight-frequency integration of the direct-current DC measurement speed due to environmental dynamics, bran JL / ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, accuracy 〇 Not for the protection of the spirit

Page 14 538248 Case number 90131928

Correction

Claims (1)

538248 Case No. 90131928 Sixth, the patent application scope processing time material m correction year and month correction Thai correction 1. A method to dynamically improve the precision measurement of DC, which is implemented in a device, which includes the following steps: (a). Set An integration period, a measurement accuracy, and a fixed detection period; (b). According to (c). According to the capture and (d) · judge (e). The rate of amplitude standardization based on the above data Re-evaluate the amplitude (f). Standard (g). And (h). Execute 2 · If the method and the value are analyzed; After analyzing the vibration, update the above application and take more measurements to obtain a precise straight quantity. Test 3. According to the application method, set a memory space of a memory according to the above integration period; the above integration period controls a hardware interface to perform a plurality of pens and the data is stored in the above memory; whether the above data is retrieved first The acquisition is the first acquisition, and the above-mentioned stored Fourier signal spectrum analysis is performed to obtain a complex array frequency and a normalized operation to obtain a plurality of marks from the amplitude values. Normalize the amplitude value, find out the frequency corresponding to the above-mentioned measured accurate amplitude value to form a frequency group; operate to find a maximum common factor frequency of the frequency group, and the integration period is the inverse of the maximum common factor frequency and step (a ) ~ (D). The dynamic improvement of DC accuracy described in the first item of the patent scope includes a processing step, when the above-mentioned data is retrieved other than the line of the above-mentioned stored data and divided by the above-mentioned integration period to measure the flow. The dynamic improvement of DC accuracy described in item 2 of the patent scope includes a timing step. After the above processing steps are completed, Page 16 538248 Case No. 90131928 S2. 4. Amendment t every year 丨 Amendment VI. Patent application scope 1 Re-execute the start of the timer 4. If the measurement method is applied, the above-mentioned standardization is carried out by the above-mentioned standardized vibration 5. If applied Measurement method and its interface. 6. If you apply for a measurement method, the sub-steps of extracting several pieces of data: (a) · Generate the above hardware interface (b). Store in it; and (c). The repeated sum is the above-mentioned accumulated time. This timing exceeds all the steps described above for the fixed detection time week. The above-mentioned amplitude value includes the DC amplitude value, which is used to increase the DC accuracy dynamically according to item 1 of the patent scope, and is used to divide the above amplitude value by the DC amplitude value to obtain the amplitude value in the calculation. The above-mentioned hardware interface in the dynamic improvement of DC accuracy described in item 1 of the patent scope is a high-speed analog digital conversion circuit. In the method of dynamically improved DC accuracy described in item 1 of the patent scope, a hardware interface is controlled according to the above integration period. Take and store the data in the above memory, including the next standard unit time, to control and retrieve the signal from time to time; Send a piece of data to the above memory in the standard time unit. Steps (a) to (b) above ) Until a plurality of standard unit time periods. 7. — A processor-readable medium for storing a program, the program includes the following instructions: (a). Receives an integration period, a measurement accuracy, and a fixed detection time period setting; (b). According to The above integration period sets a memory space of a memory; Page 17 538248 Case No. 90131928 92. 4, j: f ^ year / month / new year amendment 6. Patent application scope (c). Control a hardware interface to retrieve multiple pieces of data according to the above integration period and collect the data Stored in the above memory; (d). Judging whether the retrieval of the above data is the first retrieval; (e). When the retrieval of the above data is the first retrieval, the stored data is subjected to a Fourier signal frequency spectrum analysis to obtain a complex array of frequency and amplitude value pairs and obtain a plurality of standardized amplitude values from the above-mentioned amplitude values through a normalization operation; (f). Analyze the above-mentioned standardized amplitude values to find a standardized amplitude that exceeds the above-mentioned measurement accuracy The frequency corresponding to the value forms a frequency group; (g). After operation, find a maximum common factor frequency of the frequency group; and (h). Update the integration period to the inverse of the maximum common factor frequency and re-execute the above. Instructions (a) to (d). 8. The processor-readable medium as described in item 7 of the scope of the patent application, wherein the program further includes a processing instruction. When the above-mentioned data is not retrieved for the first time, the above-mentioned stored data is Divide by the above integration period to get a precise DC measurement result. 9. The processor-readable medium according to item 8 of the scope of patent application, wherein the program further includes a timing instruction. After the processing instruction ends, a timer starts counting. When the timer exceeds the fixed detection time, The cycle re-executes all of the above instructions. 10. The processor-readable medium according to item 7 of the scope of patent application, wherein the amplitude value includes a DC amplitude value, and is used to divide the amplitude value by the DC amplitude value in the normalization operation to obtain the normalization. Page 18 538248 Sixth, the scope of patent application Amplitude value. U. The processor-readable medium as described in item 7 of the scope of the patent application, and the above hardware interface is a high-speed analog digital conversion circuit interface. Rep. 12: According to the processor-readable media described in item 7 of the scope of patent application, the instructions in ^ control a hardware interface to perform multiple transactions according to the above integration cycle: capture and store the data in the above memory , Including the following sub-fingers: (a) generating a standard unit time for the signal from the hardware interface; 〃 (b) transmitting and storing within the standard time unit; Data to the above memory c • Repeat the above-mentioned sub-commands (a) to (b) until the sum of a plurality of standard units is equal to the above integration period. 13. An accurate measurement device for two direct currents, comprising: a one-speed analog digital conversion circuit for performing digital conversion of a plurality of analog direct current measured signals; and a digital operation processor, It has a control signal and a data memory, wherein the control signal is used to control the digital conversion of the high-speed analog digital conversion signal ΔΓ / 一, and the analog DC measurement signal, the above data. The thinking body is used to store the converted plural digital data. The digital data includes multiple non-DC component signals composed of multiple noise frequencies. The above-mentioned parallel operation processor is used to analyze the digital data and find out The above-mentioned noise frequency 'is calculated to eliminate the above-mentioned non-DC component signals. Page 19, 538248, Case No. 90131928 92. 4. Month and month ___I to do the right], MM ·· Amendment VI, Patent Application Scope 1 4. Dynamically Improve DC Precision Measurement Device as described in Item 13 of Patent Application Scope The digital operation processor further includes a Fourier frequency analysis device for performing frequency analysis on the digital data to find the noise frequency. 15. The dynamic DC precision measurement device as described in item 13 of the scope of patent application, wherein the digital operation processor further includes a dynamic integration device for non-DC component signals composed of the above-mentioned noise frequencies. Perform dynamic integration operation to eliminate the above non-DC component signals. Page 20