TW538112B - Method for treating an exhausted glycol-based slurry - Google Patents

Method for treating an exhausted glycol-based slurry Download PDF

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Publication number
TW538112B
TW538112B TW90113718A TW90113718A TW538112B TW 538112 B TW538112 B TW 538112B TW 90113718 A TW90113718 A TW 90113718A TW 90113718 A TW90113718 A TW 90113718A TW 538112 B TW538112 B TW 538112B
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Taiwan
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fraction
particles
solid
abrasive particles
silicon
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TW90113718A
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Chinese (zh)
Inventor
Zavattari Carlo
Fragiacomo Guido
Portaluppi Elio
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Memc Electronic Materials Spa
Garbo Servizi S R L
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Abstract

A method of separating, recovering and reusing components of an exhausted slurry used in slicing silicon wafers from a silicon ingot. In the method, the solid particles and lubricating fluid of the exhausted slurry are separated without decreasing the viscosity of the exhausted slurry. The separated lubricating fluid may be collected and reused in the preparation of a fresh slurry. Additionally, the silicon particulate and metal slicing wire particulate are dissolved and separated from the abrasive grains. The abrasive grains are separated into spent abrasive grains and unspent abrasive grains. The separated unspent abrasive grains are suitable for reuse in the preparation of a fresh slurry.

Description

538112 五、發明說明(l) 發明背景 本發明係全面關於再生用於製備矽晶圓之研磨漿料之方 法。本發明更特別關於分離用於自單晶或多晶矽錠切片石夕 晶圓之耗盡漿料組分之方法,使得可以再利用所需研磨顆、 粒和潤滑或冷卻流體。 為自單晶或多晶矽錠獲得矽晶圓,首先以垂直於其軸方 向將矽錠切片。切片操作一般由金屬線鋸完成,其中使石夕 錠與往復金屬線接觸,同時將含研磨顆粒之漿料供到旋和 金屬線間之接觸面。習知線鋸漿料一般包括澗滑或冷卻流 體[例如礦物油或一些水溶性液體(如聚乙二醇或” P E G ”] 及研磨顆粒(如碳化石夕)。 切片操作期間,由錠形成的矽微粒和自切片線和金屬管 形成的金屬微粒(基本為鐵)進入漿料内。由於漿料内石夕和 金屬微粒濃度增加,切片操作效率降低。最終,漿料變得 無效或”耗盡”,必須廢棄。通常由焚燒處理耗盡漿料,或 f利用廢水處理設備處理。然而,燃燒該漿料產生二氧化 石反’而將此聚料送到廢水處理設備一般導玫生成必須 地處理之衆料。因此,從環境視點看,兩種方法盔兴 。戶二最好消除或有意義減少該廢物產生量。 二5 ί耗盡聚料有關的負面環境後果和代價外,由於 之,漿料内研亦使石夕晶圓製造成本增加。更確切言 不能有效切^ f ^粒由切片操作"消耗,,(即,磨耗到小得 粒污染之逑盘大小)之速率一般要比聚料受石夕和金屬微 、…小得多。另外,一般潤滑或冷卻流體之使用538112 V. Description of the invention (l) Background of the invention The present invention is a comprehensive method for regenerating a polishing slurry used to prepare silicon wafers. The present invention is more particularly related to a method for separating depleted slurry components for slicing stone wafers from single or polycrystalline silicon ingots, so that the required grinding particles, grains, and lubrication or cooling fluids can be reused. To obtain a silicon wafer from a single or polycrystalline silicon ingot, the silicon ingot is first sliced in a direction perpendicular to its axis. The slicing operation is generally performed by a metal wire saw, in which the stone ingot is brought into contact with the reciprocating metal wire, while a slurry containing abrasive particles is supplied to the contact surface between the spiral wire and the metal wire. Conventional wire saw slurries generally include slip or cooling fluids [such as mineral oil or some water-soluble liquids (such as polyethylene glycol or "PEG"]) and abrasive particles (such as carbonized stone). During the slicing operation, formed from ingots Silicon particles and metal particles (basically iron) formed from the slicing line and metal tube enter the slurry. Due to the increase in the concentration of stone particles and metal particles in the slurry, the efficiency of the slicing operation is reduced. Eventually, the slurry becomes invalid or " "Depleted", must be discarded. Usually, the slurry is consumed by incineration, or treated with waste water treatment equipment. However, burning the slurry to produce dioxide will instead send this aggregate to the waste water treatment equipment. Therefore, from the environmental point of view, the two methods are safe. Households are best to eliminate or meaningfully reduce the amount of waste generated. 2 5 In addition to the negative environmental consequences and costs associated with depleting the polymer, In other words, the slurry internal research also increases the manufacturing cost of Shixi wafers. To be more precise, it cannot be effectively cut ^ f ^ particles are consumed by the slicing operation ", (that is, worn to the size of the pan contaminated by small particles) The polymerization rate is generally better than expected by the stone and metal microstructures Xi, ... smaller. In addition, the lubricating or cooling fluid of the general

第5頁 538112 五、發明說明(2) 壽命幾乎完全受矽和/或金屬微粒 料中矽和金屬微粒濃度不增加, 系決疋,即,如果漿 使用相當長時間。因此,通常—曰=或冷卻溶液可能會被 粒含量太高,就要廢棄該漿料,^ J中f和/或金屬微 滑流體仍能使用。 1更有很多研磨顆粒和潤 鑒於前述,需要有一種方法能夠 屬線微粒,並因而能夠再利用研;自漿料仝離矽和金 方法將減少與矽錠切片有關的製,和潤滑流體。此種 排入環境的廢產物和/或廢副產成本。此外該方法減少 發明概要 里。 我們可注意本發明數個目標和 切片的漿料組分壽命之方法·拇=徵,&供延長用於矽錠 盡t料分離而再生此等组分之^其中由使此等組分自耗 潤滑流體自固體分離而有效再生潤滑f =二二=使f料中 微粒分離而再生未消耗研磨2:::粒、矽微粒和金屬 潤滑流體和所再生研磨顆叙&方去,提供其中將所生 供其中再利用分離: = ::;:;夕晶圓製程之方法;提 中再利用所分離經消耗研磨顆=(如^之方法;提供其 或水泥);提供JL中所_ ^ 方法(例如,製造砂輪 的廢物量之方法;以及減少或消除必須廢棄 法。 及k供其中減少矽晶圓製造成本之方 538112 五、發明說明(3) 石夕晶圓之耗盡漿料 _ . ^ 消耗研磨顆粒、經消紅j ώ = f盡漿料包括潤滑流體、未 盡漿料係分離成第1、夜 ^楚矽微粒和金屬微粒。耗 級分包括獨滑流體,ί體:二f第-固體級分,第-液體 經消耗研磨顆·、矽以粒:::包括未消耗研磨顆粒、 微粒和金屬微粒組種 和液分離成第-液體級分 料之潤巧二=第一固體級分包括未研磨顆粒、經消耗研 磨顆粒、矽微粒和金屬微粒。第一固體級分與水混合,生 成包含未ΐ ί:ΐ顆粒、經消耗研磨顆粒、矽微粒和金屬 微粒之水彳液。該水性懸浮液分離成再循環級分和廢 物级分’ 壞級分包括未消耗研磨顆粒、矽微粒、金屬 微粒和水,廢物級分包括經消耗研磨顆粒、矽微粒、金屬 微 與第一腐#: : Α生成其中溶解石夕微粒或金屬微粒的第 一固體/腐#刎\混口物。將該第一固體/腐蝕劑混合物分離 成第二液體、及分V第二固體級分,第二液體級分包括第一 腐蝕劑和所溶解矽微粒或所溶解金屬微粒,第二固體級分 包栝不溶於第一腐蝕劑的未消耗研磨顆粒和矽微粒或金屬 微料。第二固體級$與第二腐蝕劑混合,生成其中溶解矽 微粒或金屬微粒的第二固體/腐蝕劑混合物。將第二固體/ 腐蝕劑混合物分離成第三液體級分和第三固體級分,第三 粒和Hit再f環級分分離,隨後將該再循環級分 楚/腐蝕劑混合’生成f 士 WAk二、X β.......Page 5 538112 V. Description of the invention (2) The service life is almost completely affected by the concentration of silicon and metal particles in the silicon and / or metal particles is not increased, that is, if the pulp is used for a long time. Therefore, usually-the cooling solution may be too high in particle content, the slurry should be discarded, and f and / or metal micro-sliding fluid in J can still be used. 1 There are more abrasive particles and lubricants. In view of the foregoing, there is a need for a method that can be linear particles, and thus can be reused; the self-slurry, ionization, and gold methods will reduce the production and lubrication fluids associated with silicon ingot slicing. The cost of such waste products and / or waste by-products discharged into the environment. In addition, the method is reduced in the summary of the invention. We can pay attention to the method of the slurry component life of several targets and slices of the present invention. Thumbs are used to extend the regeneration of these components for silicon ingot separation. The self-consumptive lubricating fluid is separated from the solid to effectively regenerate the lubrication f = 22 = to separate the particles in the f material and regenerate the unconsumed grinding 2 ::: grains, silicon particles and metal lubrication fluids and the regenerated grinding particles. Provide the method of separating and regenerating the generated materials: = ::;: ;; method for the production of wafers; extracting and reusing the separated and consumed abrasive particles = (such as the method of ^; provide it or cement); provide JL in _ ^ Methods (for example, methods for manufacturing the amount of waste from the grinding wheel; and methods for reducing or eliminating the need to discard them. And methods to reduce the cost of manufacturing silicon wafers 538112 V. Description of the invention (3) Shi Xi wafer exhaustion Slurry _. ^ Consumption of abrasive particles, reddish j = = f exhaust slurry includes lubricating fluid, unfinished slurry is separated into first and second particles of silicon and metal particles. Consumption fraction includes single slip fluid, Body: two f-th solid fractions, th-liquid after grinding particles, Granules ::: Including unconsumed abrasive particles, particles and metal particles, and liquid separation into the first-liquid fraction of Runqiao II = the first solid fraction includes unabrasive particles, consumable abrasive particles, silicon particles and Metal particles. The first solid fraction is mixed with water to produce an aqueous liquid solution containing non-fluoridated particles, depleted abrasive particles, silicon particles, and metal particles. The aqueous suspension is separated into a recycle fraction and a waste fraction 'The bad fraction includes unconsumed abrasive particles, silicon particles, metal particles, and water, and the waste fraction includes depleted abrasive particles, silicon particles, metal particles, and first rot #:: A First solid / rot # 刎 \ mix. The first solid / corrosive mixture is separated into a second liquid and a second solid fraction, and the second liquid fraction includes the first etchant and the dissolved silicon particles or Dissolved metal particles, the second solid fraction contains unconsumed abrasive particles and silicon particles or metal particles that are insoluble in the first etchant. The second solid level is mixed with the second etchant to generate dissolved silicon particles. Or a second solid / corrosive mixture of metal particles. The second solid / corrosive mixture is separated into a third liquid fraction and a third solid fraction, the third particle and the Hit and f-ring fractions are separated, and then the recycle stage is Divide / corrosive mixture 'to produce f WAk II, X β ...

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第7頁 538112 五、 液 粒 磨 級 固 、 少 滑 劑 洗 矽 合 括 消 級 固 第 酸 顆 乾 濃 體 發明說明(4) 體級^包括第二腐蝕劑和所溶解矽微粒或所溶解金屬微 顆^ ^固體級分包括適用直接併入新鮮於漿的未消耗研 ί i;:ί ϊ實施例中,經耗盡聚料係分離成第-液體 :L; ϊ ΐ分,第一液體級分包括潤滑流體,第- 人®刀匕未,肖耗研磨顆粒、經消耗研磨顆粒、石夕微极 第一 m #妨八+ ”體。第固體級为用溶劑清洗,以減 流體之产哜二t潤滑流體之濃度,並生成包含溶劑和潤 液體級二加敍。將該清洗液加入第一液體級分,並將第 巧約5『c至約10(rc範圍溫度以蒸發溶 第一固i ί二Ϊ體級分適合直接併人新鮮漿料中。經清 微粒的if/氫氧化Λ!容液遇合,生成其中溶解 物分離忐繁_ ^腐蝕劑混口物°將第一固體/腐蝕劑混 水性氫童务二液體級分和第二固體級分,第二液體分包 耗研;液所溶解石夕微粒;第二固體級分包括未 分鱼走Μ扮 !消耗研磨顆粒及金屬微粒。將第二固體 體/腐你*Γ酸溶液混合,生成其中溶解金屬微粒的第二 三液腐贿έ劑^混合物。將該第二固體/腐蝕劑混合物分離成 i液^ 和第三固體級分,第三液體級分包括水性硫 粒和f解金屬微粒,第三固體級分包栝未消耗研磨 燥,吉4耗研磨顆粒。該第三固體級分用水清洗,然後 产#、到水含量小於約1 0 0 0 ppm,如果經消耗研磨顆粒 ς又=第三固體級分重量計小於約7%,則經乾燥第三固 、’ 77適合直接併入新鮮漿料中。 538112 五、發明說明(5) 在一個較 體級分和第 一固體級分 粒、金屬微 以減小第一 和潤 第一 溶劑 清洗 解矽 劑混 級分 分包 第二 粒的 物分 括水 消耗 合, 懸浮 再循 耗研 和所 ,直 滑流體 液體級 ,直到 第一固 微粒的 合物分 包括水 括未消 固體級 第二固 離成第 性硫酸 研磨顆 以生成 液。將 環級分 磨顆粒 分離未 到水含 佳具體實施例中,將經耗盡漿料分離成第一液 固體級分,第—液體級分包括潤滑流體,第 包括未消耗研磨顆粒、經消耗研磨顆粒、矽微 粒及潤a k體。將第一固體級分用溶劑清洗, 固體級分中潤滑流體之濃度,並生成包含溶劑 之凊洗液。將該清洗液加入第一液體級分,將 分加熱至約5 0 t至約丨〇 〇。(:範圍溫度,以蒸發 第液體級分適合直接併入新鮮漿料中。將經 體級分與水性氩氧化鈉溶液混合,生成其中溶 第一固體/腐蝕劑混合物。將該第一固體/腐蝕 離成第二液體級分和第二固體級分,第二液體 性氫氧化鈉溶液和所溶解矽微粒;第二固體級 耗研磨顆粒、經消耗研磨顆粒和金屬微粒。將 为與水性硫酸溶液混合,生成其中溶解金屬微 /腐姓劑混合物。將該第二固體/腐蝕劑混合 三液體級分和第三固體級分,第三液體級分包 溶液和所溶解金屬微粒,第三固體級分包括未 粒和經消耗研磨顆粒。將第三固體級分與水混 包含未消耗研磨顆粒和經消耗研磨顆粒之水性 該水性懸浮液分離成再循環級分和廢物級分, 包括未消耗研磨顆粒和水,廢物級分包括經消 和水。將再循環級分分離成可再利用懸浮液體 消耗研磨顆粒。將所分離未消耗研磨顆粒乾燥 量小於約1 0 0 0 p p m,經乾燥分離的未消耗研磨Page 7 538112 V. Liquid particle mill-grade solid and low-lubricant washing silicon combined with decontaminated solid acid particles dry concentrated body Description of the invention (4) Body grade ^ Including second etchant and dissolved silicon particles or dissolved metal particles The ^^ solid fraction includes unconsumed research suitable for direct incorporation into fresh pulp. In the examples, the depleted polymer system is separated into the first-liquid: L; ΐ ΐ, the first liquid stage It includes lubricating fluid, No.-Man® knife and knife, Xiao consumption abrasive particles, consumed abrasive particles, Shi Xiwei extremely first ## 八八 + ”body. The solid level is cleaning with solvent to reduce the production of fluid The concentration of the lubricating fluid is t2, and a solvent-containing and wet liquid grade II is added. The cleaning liquid is added to the first liquid fraction, and the temperature is about 5 ° c to about 10 ° C (the temperature in the range of rc to evaporate the solvent).一 固 i The di-carcass fraction is suitable for direct blending into fresh slurries. After the particles are mixed with the if / hydroxide Λ! Solution, the dissolved matter is separated and propagated. ^ Etchant mixture ° will be the first solid / Etchant mixed water hydrogen child service two liquid fractions and a second solid fraction, the second liquid subcontracting research; The second solid fraction includes undivided fishes! Consumption of abrasive particles and metal particles. The second solid body / corrosive acid solution is mixed to generate the second and third particles in which the metal particles are dissolved. Liquid corrosion agent ^ mixture. This second solid / corrosive agent mixture is separated into a liquid i and a third solid fraction, the third liquid fraction includes aqueous sulfur particles and f metalloid particles, and the third solid fraction includes Grinding is not consumed, and the abrasive particles are consumed. The third solid fraction is washed with water, and then the water content is less than about 100 ppm. If the consumed abrasive particles are equal to the weight of the third solid fraction, Less than about 7%, after drying, the third solid, '77 is suitable to be directly incorporated into the fresh slurry. 538112 V. Description of the invention (5) In a more solid fraction and the first solid fraction, the metal and the metal are reduced to reduce The first and first solvent cleaning and dissolving silica mixed fractions include the second particle, including water consumption, suspension and recirculation, and the fluid and liquid level are smoothed until the composition of the first solid particles Including water-containing second solid Into the first sulfuric acid grinding particles to produce a liquid. In the specific embodiment of the ring fraction, the ground particles are not separated into the water-containing embodiment. The depleted slurry is separated into a first liquid solid fraction, and the first liquid fraction includes a lubricating fluid. The first includes unconsumed abrasive particles, depleted abrasive particles, silicon particles, and moisturizing bodies. The first solid fraction is washed with a solvent, the concentration of the lubricating fluid in the solid fraction, and a cleaning solution containing the solvent is generated. The cleaning liquid is added to the first liquid fraction, and the fraction is heated to about 50 t to about 〇. (: Range temperature, in order to evaporate the second liquid fraction is suitable to be directly incorporated into the fresh slurry. The warp body fraction and water The argon sodium oxide solution was mixed to produce a first solid / etching agent mixture therein. The first solid / corrosion is separated into a second liquid fraction and a second solid fraction, a second liquid sodium hydroxide solution, and dissolved silicon particles; the second solid level is abrasive particles, depleted abrasive particles, and metal particles. . The mixture is mixed with an aqueous sulfuric acid solution to produce a dissolved metal micro / humid agent mixture. The second solid / corrosive agent is mixed into a three-liquid fraction and a third solid fraction, the third liquid fraction includes a solution and dissolved metal particles, and the third solid fraction includes ungranulated and consumed abrasive particles. A third solid fraction is mixed with water. The aqueous suspension containing unconsumed abrasive particles and depleted abrasive particles is separated into a recycle fraction and a waste fraction, including unconsumed abrasive particles and water. And water. Separating the recycled fraction into reusable suspended liquid consumes abrasive particles. The separated unconsumed abrasive particles are dried in an amount less than about 1 0 0 0 p p m.

538112 五、發明說明(6) 顆粒適合直接併入新鮮漿料。 本發明的其它目的和特徵部分顯而易見,部分在後文指 出。 圖示簡箪說明 ' 圖1為一流程圖,說明用於根據本發明分離耗盡漿料所 需組分的部分步驟,有一些視情況選用。確切而言,圖1 ‘ 指導分離和回收潤滑流體。 圖2為一流程圖,說明用於根據本發明分離耗盡漿料所 需組分的部分步驟。有一些視情況選用。確切而言,圖2 指導分離矽和金屬微粒。 圖3為一流程圖,說明用於根據本發明分離耗盡漿料所 ¥ 需組分的部分步驟,有一些視情況選用。確切而言,圖3 指導分離和回收碳化石夕研磨顆粒。 發明詳細說明 為減少由標準矽晶圓製程產生之廢物量以及減少與通常 製造矽晶圓有關之成本,理想再生或再循環用於將矽錠切 片成晶圓之耗盡研磨漿料。更明確言之,理想自剩餘漿料 分離仍適用錠切片之漿料組分(即,潤滑流體和未消耗研 磨顆粒),並用所需經分離組分製備新鮮漿料。不再用於 製備新鮮漿料之耗盡研磨漿料組分(即,經消耗研磨顆粒 、矽微粒和金屬微粒)可在其它應用中使用。 在本文中,π耗盡漿料π指由於(例如)不可接受高含量矽丨11 和/或金屬微粒阻礙切片操作基本上不再適合自矽錠切片 矽晶圓用途之漿料。目前可以相信,矽微粒在以切片漿料538112 V. Description of the invention (6) The granules are suitable for direct incorporation into fresh slurry. Other objects and features of the present invention are partly obvious and partly mentioned later. Brief description of the diagram '' FIG. 1 is a flowchart illustrating some steps for separating the components required for the depleted slurry according to the present invention, and some are selected as appropriate. Specifically, Figure 1 ‘guides the separation and recovery of lubricating fluids. Figure 2 is a flow chart illustrating some of the steps required to separate the components of a depleted slurry according to the present invention. There are some options. Specifically, Figure 2 guides the separation of silicon and metal particles. Figure 3 is a flow chart illustrating some steps for separating the components needed for the depleted slurry according to the present invention, some of which are selected as appropriate. Specifically, Figure 3 guides the separation and recovery of carbide particles. Detailed description of the invention In order to reduce the amount of waste generated by standard silicon wafer processes and reduce the costs associated with the usual manufacturing of silicon wafers, it is ideal to regenerate or recycle the depleted abrasive slurry used to slice the silicon ingots into wafers. More specifically, it is desirable to separate the slurry components (i.e., lubricating fluid and unconsumed grinding particles) that are still suitable for ingot chipping from the remaining slurry, and prepare the fresh slurry with the desired separated components. Depleted abrasive slurry components (ie, consumable abrasive particles, silicon particles, and metal particles) that are no longer used to prepare fresh slurry can be used in other applications. In this context, π depleted slurry refers to a slurry that is no longer suitable for slicing silicon wafer applications due to unacceptably high levels of silicon 11 and / or metal particles preventing the slicing operation. It is currently believed that silicon particles are

第10頁 538112 五、發明說明(7) 中固體物質重量計濃度高於約1 -5重量% 量%)妨礙石夕鍵切片操作。同樣可以相信,#/微"在 為約0. 5至2重«時(較佳高於約(重H^農。 |,經消耗研磨顆粒"指由於切片製程磨耗研磨顆粒直^乍或大 小不再適合自矽錠切片矽晶圓用途之研磨顆粒。目前可以 相信,該研磨顆粒係消耗到小於約}微米大小/未消耗研 磨顆粒”指耗盡漿料中仍適合自石夕.錠切片矽晶圓用 磨顆粒(可以相信,其大小大於約1微米)。目前可以相俨 ,經消耗研磨顆粒在其濃度以全部研磨顆粒計(即,經“ 耗和未消耗研磨顆粒)南=約5-10重量 ^ 阻礙矽錠切片操作。”黏度”指漿料之紅住同於、々以) 上普通方法檢測或測量流動漿料之勘声^又’即由技藝 本發明之方法使廢固體(即,矽微°人 耗研磨顆粒)自可再利用漿料組分(即,、、、屬微粒和經消 研磨顆粒)分離,其藉由(1)使懸浮辦f滑流體和未消耗 (2 )使研磨顆粒(經消耗和未消耗)和 和潤滑流體分開, (3)使經消耗和未消耗研磨顆粒分開吩及金屬微粒分開及 t分間篮和潤湣洁p 汗。 一般性參考根據本發明之圖1方 自潤滑流體分離。可利用任何分 ’使漿料中固體物質 (例如’約5微米、3微米、i微米或:卞直徑固體之方法 :質上沒有固體之潤滑流i之方較佳 ^母升潤滑流體小於約丨克固體,之方法(例如,較 小於約0.3克/升甚至更)。 =於約〇.5克/升, ’月夺耗盡漿料過濾(壓濾更佳) 538112 五、發明說明(8) 為一種用於 般包括由使 級分和固體 用固體的孔 濾裝置為由 (Bergamo, 可使每小時 以约1 1 5碌/ 1 · 5死帕)壓 1 75磅/平方 孔大小的筛 通常,過 粒、經消耗 潤滑流體濃 ,更佳小於 分離產生之 磨顆粒分離 過濾裝置中 固體級分, 之濃度一般 於约1 %。較 之溶劑和潤 中 〇 自潤滑流體分離固體物質之方法實例。壓濾一 耗盡漿料通過至少一個篩將耗盡漿料分成液體 級分,如具有足以在高壓自流體實質上除去所 徑大小或篩孔大小之聚丙烯篩。一種示範性壓 代芬巴齊(Diefenbach)[意大利,伯蓋姆 Italy)]製造的de800/59pp型。為進行壓遽, 约3 0 0至約7 0 0升耗盡衆料(較佳約5 〇 〇升/小時) 平方英寸(約0 · 8兆帕)至約2 2 0碎/平方英寸(約 力[較佳約1 4 5磅/平方英寸(約1 · 〇兆帕)至約 英寸(約1 · 2兆帕)]通過小於約5微米孔徑或筛 子(較佳小於約3微米,更佳小於約1微米)。 濾產生固體級分π餅”、其包括矽微粒、金屬微 研磨顆粒、未消耗研磨顆粒及潤滑流體(餅中 度一般以餅重量計小於約25%,較佳小於約2〇y 約15%,小於約10%甚至更佳)。進一步處理自 固體級分,以自矽微粒、金屬微粒和經消耗研 未消耗研磨顆粒。但較佳在分離固體之 同用溶劑(如’水或甲帛’較佳為水)清洗 以減小潤滑流體濃度。清洗後,餅 以餅重量計小於約5%,較佳小於 ,^進一步處理液體級分之前,將自固體級分 /月、"U·體("清洗液")加入先前經分離的液體級分 並可直接再循 自分離產生之液體級分實質上不含固體Page 10 538112 V. Description of the invention (7) The solid substance concentration by weight is higher than about 1 to 5% by weight), which hinders the slicing operation of Shi Xijian. It is also believed that, when # / 微 " is about 0.5 to 2 weight «(preferably higher than about (weight H ^ agricultural. |, Consumption of abrasive particles) means that the abrasive particles are worn due to the slicing process. Or the size of the abrasive particles is no longer suitable for slicing silicon wafers from silicon ingots. It is currently believed that the abrasive particles are consumed to less than about} micron size / unconsumed abrasive particles "means that the depleted slurry is still suitable for self-use. Grinding particles for ingot slicing of silicon wafers (believe that their size is greater than about 1 micron). At present, it is possible to compare the consumption of the abrasive particles at their concentration to the total abrasive particles (ie, the "consumed and unconsumed abrasive particles) = Approximately 5-10 weight ^ Obstructs the operation of silicon ingot slicing. "Viscosity" means the redness of the slurry is the same as the above, and the common method for detecting or measuring the flowing slurry is the same as the method of the present invention. Separate the waste solids (ie, silicon micro-man-abrasive particles) from the reusable slurry components (ie, ,,, and particles and de-abrasive particles), by (1) making the suspension fluid slip And unconsumed (2) make the abrasive particles (consumed and unconsumed) and Separate from the lubricating fluid, (3) Separate the consumed and unconsumed abrasive particles, phen and metal particles, and t-segment baskets and moisturizers. General reference is made to the self-lubricating fluid separation according to Figure 1 of the present invention. Available Any method to make solid matter in the slurry (for example, about 5 micrometers, 3 micrometers, i micrometers or: 卞 diameter solid method: the lubricating stream i without solids is better. Solids, the method (for example, less than about 0.3 g / l or even more). = At about 0.5 g / l, the filtration of depleted slurry (better pressure filtration) 538112 V. Description of the invention (8 ) Is a type of pore filter device which normally consists of solids for fractions and solids (Bergamo, which can press 1 75 pounds per square pore size per hour at about 1 1 5/1 5 dead pa). Sieves are usually granulated and concentrated after the consumption of lubricating fluid, and are preferably smaller than the solid fraction in the abrasive particle separation and filtration device produced by the separation. The concentration is generally about 1%. Compared with solvents and lubricants, the solid matter is separated from the lubricating fluid. Example method. Press filter-depleted slurry passes at least Each sieve divides the depleted slurry into a liquid fraction, such as a polypropylene sieve having a size sufficient to substantially remove the diameter or mesh size from the fluid at high pressure. An exemplary Diefenbach [Italy, Berger Italy)] model de800 / 59pp. About 300 liters to about 700 liters are exhausted for pressing (preferably about 5000 liters / hour) square inches (about 0.8 MPa) ) To about 220 psi (approximately about 145 pounds per square inch (about 1.0 MPa) to about inches (about 1.2 MPa)) through less than about 5 microns Or sieve (preferably less than about 3 microns, more preferably less than about 1 micron). Filtration produces a solid fraction π cake, "which includes silicon particles, metal microabrasive particles, unconsumed abrasive particles, and a lubricating fluid (moderate cake is generally less than about 25% by weight of the cake, preferably less than about 20% and about 15% (Less than about 10% or even better). Further processing from the solid fraction to silicon particles, metal particles and abrasive particles that have not been consumed after consumption. However, it is preferred to use the same solvent (such as 'water or formamidine') for separating solids. 'Preferably water) washing to reduce the concentration of the lubricating fluid. After washing, the cake is less than about 5% by weight of the cake, preferably less than ^ before the liquid fraction is further processed, the solid fraction / month, " U The body (" cleaning solution ") is added to the previously separated liquid fraction and can be directly re-circulated. The liquid fraction generated from the separation is substantially free of solids.

538112 五、發明說明(9) 環進入矽晶圓製程,在不進行額外分離或處理步驟下用作 石夕旋切片聚料之潤滑或卻流體。一般多達約0. 5克/升殘餘 量固體顆粒保留在液化級分中。殘餘固體顆粒一般主要為 矽,其直徑小於約〇 · 3微米。然而,如需要,可視情況選 ·. 用π澄清π步驟,其中使該級分經過額外分離步驟,以減小_ 殘餘固體顆粒濃度。可利用任何分離约0. 1微米或更小固 ' 體之方法,較佳使用上述壓濾方法。澄清後,液體級分之 固體含量一般被減小到低於約1重量P P b。 如上所述,本發明之方法允許在分離或澄清後將液體級 分再循環。然而,如果將清洗液加入液體級分,則較佳用 蒸發或蒸餾使至少部分溶劑自該液體級分分離。較佳由加¥ 熱該級分將溶劑蒸發。在液體級分包含π乙二醇π基潤滑流 體情況下,較佳加熱到約5 0 °C至約1 0 0 °C溫度,更佳約 8 0 °C。為促進蒸發,可減小該級分所經受之壓力,但較佳 使用大氣壓力,以使製程複雜性和成本最低。蒸發使該級 分中潤滑流體濃度增加,並繼續到潤滑流體達到適用製備 新鮮漿料之黏度。例如,在濃縮前,包含"乙二醇”基潤滑 流體和水之級分一般在約7 0 °C至約9 0 °C具有約1厘泊(cps ) 至約2厘泊之黏度,繼續蒸發,直到該級分黏度在約7 0 °C 至約9 0 °C為約1 0厘泊至約1 5厘泊。冷卻至約2 5 °C後,經分 離潤滑流體(即,增黏級分)之黏度較佳為約9 0厘泊至約 1 2 0厘泊,並可用於製備新鮮漿料。 鲁 B.分開研磨顆粒和矽與金屬微粒 , 自耗盡漿料分離的固體級分經進一步處理,使經消耗和538112 V. Description of the invention (9) The ring enters the silicon wafer process and is used as a lubricating or cooling fluid for Shi Xixuan's slicing aggregates without additional separation or processing steps. Generally up to about 0.5 g / l of residual solid particles remain in the liquefied fraction. Residual solid particles are generally predominantly silicon with a diameter of less than about 0.3 microns. However, if necessary, you may choose to clarify the π step with π, where the fraction is subjected to an additional separation step to reduce the concentration of residual solid particles. Any method for separating solids of about 0.1 micron or less may be used, and the above-mentioned filter press method is preferably used. After clarification, the solids content of the liquid fraction is generally reduced to less than about 1 weight P P b. As mentioned above, the method of the present invention allows the liquid fraction to be recycled after separation or clarification. However, if a cleaning solution is added to the liquid fraction, it is preferred to separate at least a portion of the solvent from the liquid fraction by evaporation or distillation. The solvent is preferably evaporated by heating the fraction. In the case where the liquid fraction contains a π glycol π based lubricating fluid, it is preferably heated to a temperature of about 50 ° C to about 100 ° C, and more preferably about 80 ° C. To promote evaporation, the pressure experienced by the fraction can be reduced, but atmospheric pressure is preferably used to minimize process complexity and cost. Evaporation increases the concentration of the lubricating fluid in this fraction and continues until the lubricating fluid reaches a viscosity suitable for preparing fresh slurries. For example, prior to concentration, a fraction containing " ethylene glycol " -based lubricating fluid and water typically has a viscosity of about 1 centipoise (cps) to about 2 centipoise at about 70 ° C to about 90 ° C. Continue to evaporate until the viscosity of the fraction is about 10 centipoise to about 15 centipoise at about 70 ° C to about 90 ° C. After cooling to about 25 ° C, the lubricating fluid is separated (ie, Viscosity fraction) preferably has a viscosity of about 90 centipoise to about 120 centipoise, and can be used to prepare fresh slurry. Lu B. Separate the grinding particles and silicon and metal particles, the solid separated from the depleted slurry The fractions are further processed so that the consumed and

第13頁 538112 五、發明說明(ίο) 未消耗研磨顆粒自矽微粒和金屬微粒分離。為便利分離研 磨顆粒’將自初始分離之固體級分(餅)與至少一種腐蝕劑 混合’以溶解石夕微粒和金屬微粒。例如可將該固體級分可 與能夠溶解矽微粒和金屬微粒二者之腐蝕劑混合。一種此 類腐蝕劑包括氫氟酸(HF)和硝酸(HN〇3),一般為相對高濃 度(例如’ HF和HNO3 —般分別佔溶液重量約1〇至約2〇%,較 ^佔溶液重量15重量%)。然而,高濃度叮―HN〇3腐蝕劑易 發生危險,需要充分安全預防措施。所以,較佳使用有很 小危險的腐蝕劑。一般需要使用溶解矽微粒之腐蝕劑和溶 解金屬微粒之異種腐姓劑。矽和金屬微粒之溶解次序不重 要,但以下討論和圖2之流程圖提供在溶解金屬微粒之前 使石夕微粒溶解。 1...,_分離矽撒_ 厶一般性參考圖2,將自初始分離之固體級分與腐蝕劑混 口 ’生成其中溶解矽微粒之固體/腐蝕劑混合物。該腐蝕 劑較佳為包含鹼金屬氫氧化物(如,Na〇}I和K〇H)和/或鹼土 氫氧化物[如,Ca(0H)2]之水性溶液。該腐蝕劑更佳 士包^約6重量%至約20重量%(更佳約8重量%至約15重量0/〇) ^ ^氫~氧化銷之水性溶液。一般每千克固體級分加入至少 約6升氫氧化鈉溶液,較佳至少約7升,更佳約8升。加至 固體物質之腐蝕劑用量最佳僅足夠溶解基本上所有的矽微 粒0 由驗性腐餘劑溶解矽導致生成可溶性鹼/鹼土金屬鹽(例 如,N^SiO3)和氫氣。可收集氫氣,並用於其它應用。Page 13 538112 V. Description of the invention (ίο) Unconsumed abrasive particles are separated from silicon particles and metal particles. To facilitate the separation of the abrasive particles, 'the solid fraction (cake) from the initial separation is mixed with at least one corrosive agent' to dissolve the particles and metal particles. For example, the solid fraction may be mixed with an etchant capable of dissolving both silicon particles and metal particles. One such corrosive includes hydrofluoric acid (HF) and nitric acid (HNO3), which are generally relatively high concentrations (eg, 'HF and HNO3', generally accounting for about 10 to about 20% by weight of the solution, respectively) 15% by weight). However, high-concentration Ding-HNO3 corrosives are susceptible to danger and require adequate safety precautions. Therefore, it is preferable to use a corrosive agent with little danger. Generally, a corrosive agent that dissolves silicon particles and a heterogeneous humus agent that dissolves metal particles is required. The order in which silicon and metal particles dissolve is not important, but the following discussion and the flow chart of Figure 2 provide for dissolving the stone particles before dissolving the metal particles. 1 ..., _ Separation Silica_ 厶 Generally referring to Figure 2, the solid fraction from the initial separation is mixed with the etchant to generate a solid / corrosive mixture in which the silicon particles are dissolved. The etchant is preferably an aqueous solution containing an alkali metal hydroxide (e.g., NaO} I and KOH) and / or an alkaline earth hydroxide [e.g., Ca (0H) 2]. The etchant is more preferably from about 6% to about 20% by weight (more preferably from about 8% to about 15% by weight 0/0) and ^ an aqueous solution of hydrogen ~ oxidation pin. Generally at least about 6 liters of sodium hydroxide solution is added per kilogram of solid fraction, preferably at least about 7 liters, and more preferably about 8 liters. The amount of caustic agent added to the solid matter is optimally sufficient to dissolve substantially all of the silicon microparticles. 0 Dissolution of silicon by the experimental residues results in the generation of soluble alkaline / alkaline earth metal salts (e.g., N ^ SiO3) and hydrogen. Hydrogen can be collected and used for other applications.

第14頁 538112 五、發明說明(II) 1·自腐鍅部丨分離固一體 矽微粒溶解後,使剩餘固體物質自包含可溶越 解石夕微粒之腐敍劑分離。較佳使該固體/腐蝕劑^ 溶 過先前用於自潤滑^體分離固體級分之壓濾器,σ通 與該再生方法有關的設備投資。所: 之減少 研磨顆粒、未消耗研磨顆粒、金眉物、,括經消耗 若需要’可由用水稀釋餅及再過量:蝕劑。 中腐姓劑之量。稀釋和過遽後,;1ί:減:餅 於約0 · 1重量%。 丁满做A之/辰度一般小 k分離金屬禅粒 合石夕=離。Ϊ固體級…^ 耗研磨顆粒自今ί =固體級分’使未消耗研磨顆粒和經消 粍研磨顆粒自金屬微粒分離。該腐蝕 74 酸溶液、水性硝酸溶液及其混合物組成之' 2性硫 J性硫酸溶液更佳。腐蝕射 :自腐姓劑為 重量%,更佳自約G.4重量%至削^重佳自重量% 克固體級分加入至少約6升硫酸溶 ° 千 佳? Φ幼s^ ^ 平乂佳至少約7升,更 解芙體物f之腐#劑之量最佳只足夠溶 鮮暴本上所有金屬微粒。 用酸=容解之金屬生成可溶鹽化合物,如硫酸鐵(例 p e2(b〇4)3和FeS〇4)、硫酸銅和硫酸鋅,且此等趟用上 述方法自固體級分分離β剩餘固體級分包括未消耗&磨顆 粒和經消耗研磨顆粒。殘餘酸性腐蝕劑可藉由用水稀釋餅 538112 五、發明說明(12) 消未消耗研磨顆来立 廢二士对I il切片漿料一般由金屬或矽微粒比由經消耗研 fl :更速率耗盡’…不必像分開金屬和石夕微粒 :ΐ i 經消耗和未消耗研磨顆粒。$常,當經消耗 研磨顆粒丨展度以全部研磨顆粒重量計大於約5_1〇重量%時 (車又佳約7重董%) ’將經消耗和未消耗研磨顆粒分離,這 應於研磨顆粒之顆粒大小分布改變約1至2微米。 f本發明方法中,可在分開固體級分(包括經消耗和未 ^耗研磨顆粒以及矽和金屬微粒)和液體級分(包括潤滑流 體)任意點將經消耗和未消耗研磨顆粒分離。例如,分 離經消耗和未消耗研磨顆粒可在溶解矽微粒和金屬微粒刀之 前1溶解矽微粒或金屬微粒之後或在溶解矽微粒和金屬微 粒二者之後。較佳在溶解矽微粒和金屬微粒之 和未消耗研磨顆粒分離。 行,·,自耗 可由任何為技蟄上所常見的能夠根據重量或大小分離 粒之裝置進行分離,例如液旋(hydro-cyclone)分離器、 沈降離心機、過濾離心機或過濾器(連同必要選擇的具、商 宜孔徑大小之濾布)。較佳藉由液旋分離器分離,因為$ 具有相對低成本和耐用性(例如,德國A κ W公司r w K 8 1 0 ’、 型)。 全面參考圖3,將剩餘固體級分(即,經消耗和未消耗 磨顆粒)與液體(如水、酸腐蝕劑或鹼腐蝕劑)混合,生 水性懸浮液(因而’可使參和/或金屬微粒溶解與未消 經消耗研磨顆粒分離相結合)。較佳將水與固體級分混入Page 14 538112 V. Description of the invention (II) 1. Self-corrosion unit 丨 Separation and solidification After the silicon particles are dissolved, the remaining solid materials are separated from the corrosive agent containing soluble particles of calcite. It is preferable to dissolve the solid / corrosive agent through a pressure filter previously used to separate the solid fraction from the self-lubricating body, and σ through investment in equipment related to the regeneration method. So: the reduction of abrasive particles, unconsumed abrasive particles, gold eyebrows, and consumption. If needed ’, you can dilute the cake with water and excess: etchant. The amount of middle rot surname agent. After dilution and mashing, 1ί: minus: cake to about 0.1% by weight. Ding Man doing A / Chen degree is generally small k to separate the metal Zen grain He Shixi = Li. ΪSolid grade ... ^ Consumable abrasive particles from now = Solid fraction 'separate unconsumed abrasive particles and consumed abrasive particles from metal particles. The corrosive 74 acid solution, aqueous nitric acid solution, and mixtures thereof are more suitable for the '2 sulfur sulfur J sulfuric acid solution. Corrosion shot: The self-corrosive agent is wt%, more preferably from about G.4 wt% to shaved weight and better from wt%. The solid fraction is added by dissolving at least about 6 liters of sulfuric acid. Φ Young s ^ ^ Ping Jiajia is at least about 7 liters, and the best amount of solution is only enough to dissolve all metal particles on the fresh storm. Soluble salt compounds such as ferric sulfate (e.g. p2 (b04) 3 and FeS04), copper sulfate, and zinc sulfate are formed with the acid = digested metal, and these steps are separated from the solid fraction by the method described above The beta remaining solids fraction includes unconsumed & abrasive particles and depleted abrasive particles. Residual acidic corrosive agent can be used to dilute the cake with water 538112 V. Description of the invention (12) Eliminate the unused abrasive particles to eliminate waste. The I il slice slurry is generally depleted by metal or silicon particles more than by consumption: '... doesn't have to be like separating metal and stone particles: ΐ i Consumed and unconsumed abrasive particles. Normally, when the consumed abrasive particles have a spread greater than about 5-10% by weight based on the weight of the entire abrasive particles (car is better about 7 weight percent) 'Separate the consumed and unconsumed abrasive particles, which should be the abrasive particles The particle size distribution changes by about 1 to 2 microns. f In the method of the present invention, the consumable and unconsumed abrasive particles can be separated at any point in separating the solid fraction (including the consumable and unconsumed abrasive particles and silicon and metal particles) and the liquid fraction (including the lubricating fluid). For example, the separated consumable and unconsumed abrasive particles can be dissolved before dissolving the silicon particles and the metal particles 1 after dissolving the silicon particles or the metal particles or after dissolving both the silicon particles and the metal particles. Separation of unconsumed abrasive particles by the sum of dissolved silicon particles and metal particles is preferred. OK, ·, self-consumption can be separated by any device commonly used in technology that can separate particles according to weight or size, such as a hydro-cyclone separator, a sedimentation centrifuge, a filtration centrifuge, or a filter (together with Necessary selection of filter cloth with suitable pore size). Separation by a hydrocyclone is preferred because $ has a relatively low cost and durability (for example, German A κ W company r w K 8 1 0 ′, type). With full reference to Figure 3, the remaining solid fraction (ie, the consumed and unconsumed abrasive particles) is mixed with a liquid (such as water, an acid etchant or an alkali etchant) to produce an aqueous suspension (thus' which can dissolve the parameters and / or metal particles Combined with the separation of unconsumed abrasive particles). Water and solid fractions are preferably mixed in

第16頁 538112 五、發明說明(13) ' ,固體顆粒濃度為約5克/升至100克/升,較佳約15克/升 至約60克/升,更佳約25克/升至約30克/升。概括而言, 在液旋分離器中,比重小於預定量的水和固體顆粒自上部 出口排出,而等於或重於預定重量的液體和顆粒自下部出 口排出。在本發明中,預定重量應於允許未經消耗研磨 粒自經消耗顆粒分離之顆粒大小。因此,在液旋分離後, 留下兩種懸浮液-包含未消耗研磨顆粒和水之再循環級八’ 以及包含經消耗研磨顆粒和水之廢物級分。 、刀 如果在分 研磨顆粒, 部分碎和金 有未消耗研 劑用量,由 乾燥夫1 離矽 則除屬微 磨顆 之減 惠研 π /乳I屬儆祖之前分離經消耗和未消耗 經消耗研磨顆粒外,廢物級分亦包括相各 粒。這將有意義減少分離再循環級分(具" 粒)内保留的矽和/或金屬微粒所需之腐、少原材料成本。 觸蚀 磨顆粒 自再循環 於晶圓製程 循環級分分 濾器或壓濾 磨顆粒後, 將液體(如, 見之方法使 箱。較佳在 磨顆粒傾向 應注意到 級分 〇 可 離, 器除 可將 水) 未消 乾燥 生成 ,在 除去液體,以分離未消耗研磨顆粒, 由技,上常見方法使未消耗研磨顆粒自 如過濾或離心。較佳用緩衝(b e 去過量液體。自第一懸浮液分離未消耗ς 再用於本發日月。但較佳=蔽且可 耗研磨顆粒乾燥,如將所過濾固二^常 期間定期翻動所收集顆粒,因 太共 相對大塊固化材料。 為妷化矽研 加熱乾燥未消耗研磨顆粒時,較佳使用盡 ΦPage 16 538112 V. Description of the invention (13) ', the solid particle concentration is about 5 g / l to 100 g / l, preferably about 15 g / l to about 60 g / l, more preferably about 25 g / l to About 30 grams / liter. In summary, in a hydrocyclone, water and solid particles having a specific gravity smaller than a predetermined amount are discharged from an upper outlet, while liquids and particles equal to or heavier than a predetermined weight are discharged from a lower outlet. In the present invention, the predetermined weight should be a particle size that allows the unconsumed abrasive particles to be separated from the consumable particles. Therefore, after the hydrocyclone separation, two suspensions are left-a recycling grade containing unconsumed abrasive particles and water, and a waste fraction containing consumable abrasive particles and water. If the knife is divided into abrasive particles, partly crushed and gold, there is an amount of unconsumed grinding agent, and the dry powder is separated from the silicon, except for the reduction of the fine grinding particles. In addition to the consumption of abrasive particles, the waste fraction also includes phases. This will significantly reduce the rot and less raw material costs required to separate the silicon and / or metal particles retained in the recycled fraction (with " particles). The erosion abrasive particles are recirculated in the wafer process after circulating the fraction filter or the pressure filter abrasive particles, and the liquid (for example, see the method to make the box. It is better to notice that the fraction detachable when the abrasive particles are inclined. In addition to water, it can be produced without drying. The liquid is removed to separate the unconsumed abrasive particles. The unconsumed abrasive particles are filtered or centrifuged by common methods. It is better to use a buffer (be used to measure the amount of liquid. It is separated from the first suspension and is not consumed. It is used for the current day and month. However, it is better to shield and dry the abrasive particles, such as regularly filtering the filter. The collected particles are relatively large solidified material because of Taikoo. When the abrasive particles are not consumed by heating and drying the silicon powder, it is better to use Φ.

第17頁 538112 五、發明說明(14) 可能快和有效使固體乾燥之溫度。因此,較佳將該研磨顆 粒在約7 5 °C和約2 0 0 °C間之溫度乾燥,更佳在約1 0 0 °C和約 1 5 0 °C之間。雖然乾燥時間可以變化,例如,依賴欲除去 液體和乾燥方法而變化,但一般乾燥到只剩下微量或很少 液體。例如,如果用水形成固體/液體混合物,則由技藝 上普通方法測定(如卡爾·費歇法測定),一般將研磨固體 乾燥到水含量小於約5 0 0 0 ppm (百萬分比),較佳小於約 1 0 0 0 p p m,最佳小於約5 0 0 p p m。 低水含量較為理想,因為存在水促使其中使用所回收研 磨顆粒之漿料黏度降低。而且,漿料中存在水可能導致研 磨顆粒(如碳化矽)一起黏結,生成在切片製程中危害晶圓 表面的較大研磨顆粒。 可將廢物級分(即,含經消耗研磨顆粒之懸浮液)廢棄。 但較佳將廢物級分濃縮,收集液體(如水),並再用於本發 明之方法,以減少廢物產生量。亦可視需要收集和乾燥懸 浮經消耗研磨顆粒。 鑒於上述,可看到取得本發明若干目的,並達到其它有 益結果。我們希望將以上說明所包含的所有情況作為說明 性理解,且沒有限制意義。Page 17 538112 V. Description of the invention (14) Temperature at which solids can be dried quickly and effectively. Therefore, the abrasive particles are preferably dried at a temperature between about 75 ° C and about 200 ° C, more preferably between about 100 ° C and about 150 ° C. Although the drying time may vary, for example, depending on the liquid to be removed and the drying method, it is generally dried to a trace or little liquid. For example, if a solid / liquid mixture is formed with water, it is determined by ordinary technical methods (such as Karl Fischer's method), and the ground solid is generally dried to a water content of less than about 5000 ppm (parts per million). It is preferably less than about 100 ppm, and most preferably less than about 500 ppm. A low water content is desirable because the presence of water causes a reduction in the viscosity of the slurry in which the recovered grinding particles are used. In addition, the presence of water in the slurry may cause abrasive particles (such as silicon carbide) to stick together, resulting in larger abrasive particles that are harmful to the wafer surface during the slicing process. The waste fraction (ie, a suspension containing depleted abrasive particles) can be discarded. However, it is preferred to concentrate the waste fraction, collect a liquid such as water, and reuse it in the method of the present invention to reduce the amount of waste generated. If necessary, collect and dry suspended abrasive particles. In view of the above, it can be seen that several objects of the present invention have been achieved, and other beneficial results have been achieved. We hope that all the situations contained in the above description are interpreted as illustrative and not restrictive.

第18頁Page 18

Claims (1)

538112 _案號90113718_年月曰 修正_^ 六、申請專利範圍 溫度,以使溶劑自該清洗液/液體級分混合物蒸發。 8 .根據申請專利範圍第1項之方法,其中該第一腐蝕劑 將矽微粒和金屬微粒溶解,該方法進一步包括: (c) 將第一固體/腐蝕劑混合物分離成第二液體級分和_ 第二固體級分,該第二液體級分包括第一腐蝕劑和所溶解’ 矽微粒或所溶解金屬微粒,該第二固體級分包括未消耗研--磨顆粒和經消耗研磨顆粒; (d) 將第二固體級分與水混合,以生成包含未消耗研 磨顆粒和經消耗研磨顆粒之水性懸浮液; (e) 將水性懸浮液分離成再循環級分和廢物級分,該 再循環級分包括未消耗研磨顆粒和水,該廢物級分包括經¥ 消耗研磨顆粒和水;及 (f) 將再循環級分分離成包含水和經分離未消耗研磨 顆粒之液體級分。 9 .根據申請專利範圍第8項之方法,其中水性懸浮液係 用液旋(c y c 1 ο n e )分離器分離成再循環級分和廢物級分。 1 0 .根據申請專利範圍第8項之方法,其進一步包括將所 分離未消耗研磨顆粒乾燥,直到殘餘水含量小於1 0 0 〇 ppm 〇 1 1 .根據申請專利範圍第8項之方法,其中第一腐蝕劑包 括氫氟酸和确酸之混合物。 1 2.根據申請專利範圍第1 1項之方法,其中第一腐蝕劑<· 中氫氟酸之濃度和硝酸之濃度均係自1 0重量%至2 0重量%。 1 3.根據申請專利範圍第1 1項之方法,其中第一腐蝕劑538112 _Case No. 90113718 _ Modified _ ^ VI. Patent application temperature Temperature to evaporate the solvent from the cleaning liquid / liquid fraction mixture. 8. The method according to item 1 of the scope of patent application, wherein the first etchant dissolves silicon particles and metal particles, the method further comprising: (c) separating the first solid / corrosive mixture into a second liquid fraction and Two solid fractions, the second liquid fraction comprising a first etchant and dissolved 'silicon particles or dissolved metal particles, the second solid fraction comprising unconsumed abrasive particles and consumable abrasive particles; (d) Mixing the second solid fraction with water to produce an aqueous suspension containing unconsumed abrasive particles and depleted abrasive particles; (e) separating the aqueous suspension into a recycle fraction and a waste fraction, the recycle fraction Including unconsumed abrasive particles and water, the waste fraction includes depleted abrasive particles and water; and (f) separating the recycled fraction into a liquid fraction containing water and the separated unconsumed abrasive particles. 9. The method according to item 8 of the scope of patent application, wherein the aqueous suspension is separated into a recycle fraction and a waste fraction by a hydrocyclone (c y c 1 ο n e) separator. 10. The method according to item 8 of the scope of patent application, further comprising drying the separated unconsumed abrasive particles until the residual water content is less than 100 ppm. 001. The method according to item 8 of the scope of patent application, wherein The first etchant includes a mixture of hydrofluoric acid and acid. 12. The method according to item 11 of the scope of the patent application, wherein the concentration of the first corrosive agent < · in the concentration of hydrofluoric acid and the concentration of nitric acid are from 10% by weight to 20% by weight. 13 3. The method according to item 11 of the scope of patent application, wherein the first etchant O:\71\71287-911122.ptc 第21頁 538112 _案號90113Ή8_年月曰 修正_ 六、申請專利範圍 中氫氟酸之濃度和硝酸之濃度均為1 5重量%。 1 4.根據申請專利範圍第1 2項之方法,其中每千克第一 固體級分混合至少6升第一腐蝕劑。 1 5.根據申請專利範圍第1項之方法,其中第一腐蝕劑溶-γ 解該第一固體/腐蝕劑混合物中的矽微粒或金屬微粒,該 方法進一步包括: ~ - (c) 將第一固體/腐蝕劑混合物分離成第二液體級分和 第二固體級分,第二液體級分包括第一腐蝕劑和所溶解矽 微粒或所溶解金屬微粒,第二固體級分包括不溶於第一腐 蝕劑的未消耗研磨顆粒、經消耗研磨顆粒和矽微粒或金屬 微粒; ⑩ (d) 將第二固體級分與第二腐蝕劑混合,以生成第二 固體/腐蝕劑混合物,其中溶解不溶於第一固體/腐蝕劑混 合物之矽微粒或金屬微粒;及 (e) 將第二固體/腐蝕劑混合物分離成第三液體級分和 第三固體級分,第三液體級分包括第二腐蝕劑和所溶解矽 微粒或所溶解金屬微粒,第三固體級分包括未消耗研磨顆 粒和經消耗研磨顆粒; (f )將第三固體級分與水混合,以生成包含未消耗研 磨顆粒和經消耗研磨顆粒之水性懸浮液; (g) 將水性懸浮液分離成再循環級分和廢物級分,再 循環級分包括未消耗研磨顆粒和水,廢物級分包括經消耗@ 研磨顆粒和水;及 (h) 將再循環級分分離成包含水和經分離未消耗研磨O: \ 71 \ 71287-911122.ptc Page 21 538112 _Case No. 90113Ή8_ Year Month Amendment_ VI. Scope of patent application Both the concentration of hydrofluoric acid and the concentration of nitric acid are 15% by weight. 14. The method according to item 12 of the scope of patent application, wherein at least 6 liters of the first etchant are mixed per kilogram of the first solid fraction. 15. The method according to item 1 of the scope of patent application, wherein the first etchant dissolves-γ to dissolve the silicon particles or metal particles in the first solid / corrosive mixture, and the method further includes: ~-(c) dissolving the first solid / Etchant mixture is separated into a second liquid fraction and a second solid fraction, the second liquid fraction includes the first etchant and dissolved silicon particles or dissolved metal particles, and the second solid fraction includes undissolved Depleted abrasive particles, depleted abrasive particles, and silicon or metal particles; ⑩ (d) mixing a second solid fraction with a second etchant to form a second solid / etchant mixture in which the first solid / etchant mixture is dissolved and dissolved Silicon particles or metal particles; and (e) separating the second solid / corrosive mixture into a third liquid fraction and a third solid fraction, the third liquid fraction including the second etchant and the dissolved silicon particles or the dissolved metal Microparticles, the third solid fraction including unconsumed abrasive particles and depleted abrasive particles; (f) mixing the third solid fraction with water to produce unconsumed abrasive particles Aqueous suspension of granules and depleted abrasive particles; (g) Separation of the aqueous suspension into recirculated fractions and waste fractions. Recycled fractions include unconsumed abrasive particles and water, and waste fractions include depleted @ 磨粒And water; and (h) separation of the recycle fraction into water and separated unconsumed mill O:\71\71287-911122.ptc 第22頁 538112 _案號90113718_年月曰 修正__ 六、申請專利範圍 顆粒之懸浮級分。 1 6 .根據申請專利範圍第1 5項之方法,其中水性懸浮液 係用液旋分離器分離成再循環級分和廢物級分。 1 7.根據申請專利範圍第1 5項之方法,其進一步包括將 經分離未消耗研磨顆粒乾燥,直到殘餘水含量小於1 0 0 0 ppm 〇 1 8 .根據申請專利範圍第1 5項之方法,其中第一腐蝕劑 溶解第一固體/腐蝕劑混合物中的矽微粒,第一腐蝕劑包 括水和選自由驗金屬氫氧化物和驗土金屬氫氧化物組成之 群之鹼,且第二液體級分包括第一腐蝕劑和所溶解矽微 粒。 1 9.根據申請專利範圍第1 8項之方法,其中鹼為氫氧化 納。 2 0.根據申請專利範圍第1 9項之方法,其中第一腐蝕劑 中氫氧化納之濃度係自6至20重量%。 2 1 .根據申請專利範圍第1 9項之方法,其中第一腐蝕劑 中氫氧化鈉之濃度係自8至1 5重量%。 2 2.根據申請專利範圍第2 0項之方法,其中每千克第一 固體級分混合至少6升該第一腐蝕劑。 2 3 .根據申請專利範圍第1 8項之方法,其進一步包括在 矽微粒溶解於第一固體/腐蝕劑混合物期間收集放出的氫 氣。 2 4.根據申請專利範圍第1 5項之方法,其中第二腐蝕劑 溶解不溶於第一固體/腐蝕劑混合物之金屬微粒,第二腐O: \ 71 \ 71287-911122.ptc Page 22 538112 _Case No. 90113718_ Modification __ VI. Patent Application Scope Particle suspension fraction. 16. The method according to item 15 of the scope of patent application, wherein the aqueous suspension is separated into a recycle fraction and a waste fraction by a hydrocyclone. 1 7. The method according to item 15 of the scope of patent application, which further comprises drying the separated unconsumed abrasive particles until the residual water content is less than 1000 ppm. 〇 1 8. The method according to item 15 of the scope of patent application Wherein the first corrosive agent dissolves the silicon particles in the first solid / corrosive mixture, the first corrosive agent includes water and a base selected from the group consisting of metal hydroxide and earth metal hydroxide, and the second liquid fraction includes The first etchant and the dissolved silicon particles. 19. The method according to item 18 of the scope of patent application, wherein the base is sodium hydroxide. 20. The method according to item 19 of the scope of patent application, wherein the concentration of sodium hydroxide in the first etchant is from 6 to 20% by weight. 2 1. The method according to item 19 of the scope of patent application, wherein the concentration of sodium hydroxide in the first etchant is from 8 to 15% by weight. 2 2. The method according to item 20 of the scope of patent application, wherein at least 6 liters of the first etchant are mixed per kilogram of the first solid fraction. 2 3. The method according to item 18 of the patent application scope, further comprising collecting the evolved hydrogen gas during the dissolution of the silicon particles in the first solid / etching agent mixture. 2 4. The method according to item 15 of the scope of the patent application, wherein the second etchant dissolves the metal particles insoluble in the first solid / corrosive mixture, and the second etchant O:\71W1287-911122.ptc 第23頁 538112 _案號90113718_年月日__ 六、申請專利範圍 钱劑包括水和選自由硝酸和硫酸組成之群之酸,第二液體 級分包括第一腐蝕劑和所溶解金屬微粒。 2 5.根據申請專利範圍第24項之方法,其中酸為硫酸。 2 6.根據申請專利範圍第2 5項之方法,其中第一腐蝕劑. 中硫酸之濃度係自0. 3至1重量%。 2 7.根據申請專利範圍第25項之方法,其中第一腐蝕劑-, 中硫酸之濃度係自0. 4至0 . 8重量%。 28. —種處理用於自碎旋切片碎晶圓之耗盡漿料之方 法,耗盡漿料包括潤滑流體、未消耗研磨顆粒、經消耗研 磨顆粒、矽微粒和金屬微粒,該方法包括: (a) 將耗盡漿料分離成第一液體級分和第一固體級 # 分,第一液體級分包括適用潤滑流體,第一固體級分包括 未消耗研磨顆粒、經消耗研磨顆粒、矽微粒及金屬微粒; (b) 將第一固體級分與水混合,以生成包含未消耗研 磨顆粒、經消耗研磨顆粒、矽微粒和金屬微粒之水性懸浮 液; (c) 將水性懸浮液分離成再循環級分和廢物級分,再 循環級分包括未消耗研磨顆粒、矽微粒、金屬微粒,該廢 物級分包括經消耗研磨顆粒、矽微粒、金屬微粒及水; (d) 將再循環級分與第一腐蝕劑混合,以生成其申溶 解矽微粒或金屬微粒之第一固體/腐蝕劑混合物; (e) 將第一固體/腐蝕劑混合物分離成第二液體級分和⑩ 第二固體級分,第二液體級分包括第一腐蝕劑和所溶解矽 微粒或所溶解金屬微粒,第二固體級分包括不溶於第一腐O: \ 71W1287-911122.ptc Page 23 538112 _Case No. 90113718_Year_Month__ Sixth, the scope of the patent application includes water and an acid selected from the group consisting of nitric acid and sulfuric acid, and the second liquid fraction includes the first An etchant and dissolved metal particles. 25. The method according to item 24 of the patent application, wherein the acid is sulfuric acid. 2 6. The method according to item 25 of the scope of patent application, wherein the concentration of the first corrosive agent. Sulfuric acid is from 0.3 to 1% by weight. 2 7. The method according to item 25 of the scope of patent application, wherein the concentration of the first corrosive agent-, sulfuric acid is from 0.4 to 0.8% by weight. 28. A method of processing a depleted slurry for spin-slicing wafers. The depleted slurry includes a lubricating fluid, unconsumed abrasive particles, consumable abrasive particles, silicon particles, and metal particles. The method includes: (a) The depleted slurry is separated into a first liquid fraction and a first solid fraction. The first liquid fraction includes a suitable lubricating fluid. The first solid fraction includes unconsumed abrasive particles, depleted abrasive particles, and silicon. Particles and metal particles; (b) mixing the first solid fraction with water to form an aqueous suspension containing unconsumed abrasive particles, depleted abrasive particles, silicon particles and metal particles; (c) separating the aqueous suspension into Recycling fraction and waste fraction. The recycling fraction includes unconsumed abrasive particles, silicon particles, metal particles, and the waste fraction includes depleted abrasive particles, silicon particles, metal particles, and water; (d) the recycling grade With the first etchant to produce a first solid / corrosive mixture that dissolves the silicon particles or metal particles; (e) separating the first solid / corrosive mixture into a second liquid fraction and The second solid fraction, the second liquid fraction includes the first etchant and the dissolved silicon particles or the dissolved metal particles, and the second solid fraction includes the insoluble first corrosion O:\71\71287-911122.ptc 第24頁 538112 _案號90113718_年月曰 修正_ 六、申請專利範圍 蝕劑的未消耗研磨顆粒和矽微粒或金屬微料; (f )將第二固體級分與第二腐蝕劑混合,以生成第二 固體/腐蝕劑混合物,其中溶解不溶於該第一固體/腐蝕劑 混合物之矽微粒或金屬微粒;及 . (g)將第二固體/腐蝕劑混合物分離成第三液體級分和> 第三固體級分,第三液體級分包括第二腐蝕劑和所溶解矽-. 微粒或所溶解金屬微粒,第三固體級分包括未消耗研磨顆 粒。 2 9. —種處理用於自矽錠切片矽晶圓之耗盡漿料之方 法,耗盡漿料包括潤滑流體、未消耗研磨顆粒、經消耗研 磨顆粒、矽微粒和金屬微粒,該方法包括: f (a) 將耗盡漿料分離成第一液體級分和第一固體級 分,第一液體級分包括潤滑流體,第一固體級分包括未消 耗研磨顆粒、經消耗研磨顆粒、矽微粒、金屬微粒和潤滑 流體; (b) 用溶劑清洗第一固體級分,以減少第一固體級分 中潤滑流體之濃度,並生成包含溶劑和潤滑流體之清洗 液; (c) 將清洗液加入第一液體級分,以生成清洗液/液體 級分混合物,且將清洗液/液體級分混合物加熱到自5 0 °C 至1 0 0 °C之溫度,以使溶劑自清洗液/液體級分混合物蒸 發; · (d) 將經清洗第一固體級分與水性氫氧化鈉溶液混 合,以生成其中溶解矽微粒之第一固體/腐蝕劑混合物;O: \ 71 \ 71287-911122.ptc Page 24 538112 _Case No. 90113718_ Revised Year of the Year _ 6. Unconsumed abrasive particles and silicon particles or metal micro-materials for the scope of the patent application; (f) the second The solid fraction is mixed with a second etchant to produce a second solid / corrosive mixture in which silicon particles or metal particles insoluble in the first solid / corrosive mixture are dissolved; and (g) the second solid / corrosive mixture is separated into The third liquid fraction and > the third solid fraction, the third liquid fraction includes a second etchant and dissolved silicon-. Particles or dissolved metal particles, and the third solid fraction includes unconsumed abrasive particles. 2 9. A method for processing a depleted slurry for slicing a silicon wafer from a silicon ingot. The depleted slurry includes a lubricating fluid, unconsumed abrasive particles, consumable abrasive particles, silicon particles, and metal particles. The method includes : F (a) separating the depleted slurry into a first liquid fraction and a first solid fraction, the first liquid fraction including a lubricating fluid, and the first solid fraction including unconsumed abrasive particles, depleted abrasive particles, silicon Particles, metal particles, and lubricating fluid; (b) washing the first solid fraction with a solvent to reduce the concentration of the lubricating fluid in the first solid fraction, and generating a washing liquid containing the solvent and the lubricating fluid; (c) washing the liquid The first liquid fraction is added to generate a cleaning liquid / liquid fraction mixture, and the cleaning liquid / liquid fraction mixture is heated to a temperature from 50 ° C to 100 ° C to make the solvent self-cleaning liquid / liquid The fraction mixture is evaporated; (d) mixing the washed first solid fraction with an aqueous sodium hydroxide solution to produce a first solid / corrosive mixture in which the silicon particles are dissolved; O:\71\71287-911122.ptc 第25頁 538112 案號 90113718 曰 修正 六、申請專利範圍 (e)將第一固體/腐蝕劑混合物分離成第二液體級分和 第二固體級分,第二液體級分包括水性氫氧化鈉溶液和所 溶解矽微粒;第二固體級分包括未消耗研磨顆粒、經消耗 研磨顆粒和金屬微粒; (f )將第二固體級分與水性硫酸溶液混合,以生成其 中溶解金屬微粒之第二固體/腐蝕劑混合物; (g)將第二固體/腐蝕劑混合物分離成第三液體級分和 第二固體級分’弟二液體級分包括水性硫酸溶液和所浴解 金屬微粒,第三固體級分包括未消耗研磨顆粒和經消耗研 磨顆粒;O: \ 71 \ 71287-911122.ptc Page 25 538112 Case No. 90113718 Amendment VI. Patent Application Scope (e) Separating the first solid / corrosive mixture into a second liquid fraction and a second solid fraction, the second The liquid fraction includes an aqueous sodium hydroxide solution and dissolved silicon particles; the second solid fraction includes unconsumed abrasive particles, depleted abrasive particles, and metal particles; (f) mixing the second solid fraction with an aqueous sulfuric acid solution to Generating a second solid / corrosive mixture in which metal particles are dissolved; (g) separating the second solid / corrosive mixture into a third liquid fraction and a second solid fraction; the second liquid fraction includes an aqueous sulfuric acid solution and a hydrolyzed solution; Metal particles, the third solid fraction includes unconsumed abrasive particles and depleted abrasive particles; (h) 用水清洗第三固體級分;及 (i) 使第三固體級分乾燥,直至殘餘水含量小於1 〇 〇 〇 ppm 〇 3 0 .根據申請專利範圍第2 9項之方法,其中第三固體級 分包含小於7重量%之經消耗研磨顆粒。 3 1 . —種處理用於自矽錠切片矽晶圓之耗盡漿料之方 法,耗盡漿料包括潤滑流體、未消耗研磨顆粒、經消耗研 磨顆粒、矽微粒和金屬微粒,該方法包括: (a)將耗盡漿料分離成第一液體級分和第一固體級 分,第一液體級分包括潤滑流體,第一固體級分包括未消 耗研磨顆粒、經消耗研磨顆粒、矽微粒、金屬微粒和潤滑 流體; (b)用溶劑清洗第一固體級分,以減小第一固體級分 中潤滑流體之濃度,並生成包含溶劑和潤滑流體之清洗(h) washing the third solid fraction with water; and (i) drying the third solid fraction until the residual water content is less than 1000 ppm 〇3 0. The method according to item 29 of the scope of patent application, wherein The three solid fraction contains less than 7% by weight of spent abrasive particles. 3 1. A method for processing a depleted slurry for slicing a silicon wafer from a silicon ingot. The depleted slurry includes a lubricating fluid, unconsumed abrasive particles, consumable abrasive particles, silicon particles, and metal particles. The method includes (A) Separating the depleted slurry into a first liquid fraction and a first solid fraction. The first liquid fraction includes a lubricating fluid, and the first solid fraction includes unconsumed abrasive particles, depleted abrasive particles, and silicon particles. , Metal particles and lubricating fluid; (b) washing the first solid fraction with a solvent to reduce the concentration of the lubricating fluid in the first solid fraction, and generating a cleaning comprising the solvent and the lubricating fluid O:\71\71287-911122.ptc 第26頁 538112 _案號90113Ή8_年月曰 修正_ 六、申請專利範圍 液; (C )將清洗液加至第一液體級分,以生成清洗液/液體 級分混合物,且將清洗液/液體級分混合物加熱到自5 0 °C 至1 0 0 °C之溫度,以使溶劑自該清洗液/液體級分混合物蒸-發; (d) 將經清洗的第一固體級分與水性氩氧化鈉溶液混 合,以生成其中溶解矽微粒之第一固體/腐蝕劑混合物; (e) 將該第一固體/腐蝕劑混合物分離成第二液體級分 和第二固體級分,第二液體級分包括水性氳氧化鈉溶液和 所溶解矽微粒;第二固體級分包括未消耗研磨顆粒、經消 耗研磨顆粒和金屬微粒; (f) 將第二固體級分與水性硫酸溶液混合,以生成其 中溶解金屬微粒之第二固體/腐蝕劑混合物; (g) 將第二固體/腐蝕劑混合物分離成第三液體級分和 第三固體級分,第三液體級分包括水性硫酸溶液和所溶解 金屬微粒,第三固體級分包括未消耗研磨顆粒和經消耗研 磨顆粒; (h) 將第三固體級分與水混合,以生成包含未消耗研 磨顆粒和經消耗研磨顆粒之水性懸浮液; (i )將水性懸浮液分離成再循環級分和廢物級分,再 循環級分包括未消耗研磨顆粒和水,廢物級分包括經消耗 研磨顆粒和水;和 (j)將再循環級分分離成包含水和所分離未消耗研磨 顆粒之懸浮液體級分;及O: \ 71 \ 71287-911122.ptc Page 26 538112 _Case No. 90113Ή8_ Year, month, and year of amendment_ VI. Patent application scope fluid; (C) Add the cleaning fluid to the first liquid fraction to generate the cleaning fluid / A liquid fraction mixture, and the cleaning liquid / liquid fraction mixture is heated to a temperature from 50 ° C to 100 ° C to evaporate the solvent from the cleaning liquid / liquid fraction mixture; (d) The washed first solid fraction is mixed with an aqueous sodium argon oxide solution to produce a first solid / corrosive mixture in which silicon particles are dissolved; (e) separating the first solid / corrosive mixture into a second liquid fraction and a first Two solid fractions, the second liquid fraction includes aqueous sodium hydroxide solution and dissolved silicon particles; the second solid fraction includes unconsumed abrasive particles, depleted abrasive particles, and metal particles; (f) the second solid fraction Mixed with an aqueous sulfuric acid solution to produce a second solid / corrosive mixture in which metal particles are dissolved; (g) separating the second solid / corrosive mixture into a third liquid fraction and a third solid fraction, the third liquid fraction comprising Aqueous sulfuric acid solution and Dissolved metal particles, the third solid fraction includes unconsumed abrasive particles and depleted abrasive particles; (h) mixing the third solid fraction with water to produce an aqueous suspension containing unconsumed abrasive particles and depleted abrasive particles (I) separating the aqueous suspension into a recycle fraction and a waste fraction, the recycle fraction including unconsumed abrasive particles and water, and the waste fraction including consumable abrasive particles and water; and (j) separating the recycle stage Fractionation into a suspension liquid fraction comprising water and separated unconsumed abrasive particles; and O:\71\71287-911122.ptc 第27頁 538112O: \ 71 \ 71287-911122.ptc Page 27 538112 O:\71\71287-911122.ptc 第28頁O: \ 71 \ 71287-911122.ptc Page 28
TW90113718A 2001-06-06 2001-06-06 Method for treating an exhausted glycol-based slurry TW538112B (en)

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