)2224422244
3本發明係關於一種通訊晶片之測試方法及其裝置，特別 關於種通訊日曰片之眼圖（Eye Diagram)特性之測試方 法及其裝置。 爱Jg背景 針對4多通訊曰曰片或系統單晶片而言（例如D E匚τ基頻晶 片）在出廠如須針對傳送端（Transmitter)的高斯低通濾波 态（Guassian Low Pass F41ter ; GLPF )之輸出信號進行眼圖特 丨的貝"、j忒，以消除不良品。在研發或工程驗證階段，通 系工％師係藉由不波器或射頻分析儀（例如型號ΗΜίπίΑ)， 、人工的方式‘旦遠通訊晶片之眼圖特性是否符合規格。然 而在測試階段，若仍使用人工的方式，勢必將降低產品的產 出量且增加測試成本。 一種習知之測試裝置，如圖丨所示，包含一測試主機 (mamframe) H、一射頻分析儀15、一待測晶片“及一機械 手臂12，且孩待測晶片14置於該機械手臂12之測試盤13上。 首先，該主機11發出一預設條件（prec〇nditi〇n)至該待測晶 片1 4，並驅使該待測晶片丨4輸出高斯低通濾波信號至該射頻 分析儀15。該射頻分析儀丨5將該高斯低通濾波信號轉換成為 眼圖，而由工作人員經由該射頻分析儀15之螢幕檢查該待測 晶片1 4是否符合規格。 然而上述方法並無法自動化，導致一個晶片之測試週期需 花費許多的時間，而降低產出量。其次，該射頻分析儀丨5很 貴，致使整個測試成本被提高。第三，以人眼檢查該待測晶 〇:\n\7腦麗 -4 - 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公董)-"~- 5222443 The present invention relates to a test method and device for a communication chip, and more particularly to a test method and device for an eye diagram characteristic of a communication chip. Love Jg background is for more than 4 communication chips or system single chip (such as DE 匚 τ fundamental frequency chip) at the factory, if it is required to target the transmission side (Transmitter) Gaussian Low Pass filter state (Guassian Low Pass F41ter; GLPF) The output signal is subjected to eye diagrams and j 忒 to eliminate defective products. During the R & D or engineering verification phase, the general engineer ’s department uses a wave filter or RF analyzer (such as the model ΗΜίπίΑ) to manually determine whether the eye diagram characteristics of the chip in the Yuanyuan communication meet the specifications. However, in the testing phase, if manual methods are still used, it will inevitably reduce the product output and increase the testing cost. A conventional test device, as shown in FIG. 丨, includes a test host (mamframe) H, a radio frequency analyzer 15, a chip to be tested ", and a robot arm 12, and the chip 14 to be tested is placed on the robot arm 12 On the test disk 13. First, the host 11 sends a preset condition to the chip under test 14 and drives the chip under test 4 to output a Gaussian low-pass filtered signal to the RF analyzer. 15. The RF analyzer 5 converts the Gaussian low-pass filtered signal into an eye diagram, and a worker checks whether the chip under test 14 meets the specifications through the screen of the RF analyzer 15. However, the above method cannot be automated. As a result, the test cycle of a wafer takes a lot of time, which reduces the output. Secondly, the RF analyzer 5 is very expensive, which causes the entire test cost to be increased. Third, check the test crystal with the human eye. 0: \ n \ 7 脑 丽 -4-This paper size applies to China National Standard (CNS) A4 (210 X 297 public directors)-" ~-522244
、子a規格’往往因為人為的疏忽和無法精確比對， 導致錯或。此外’習知之測試裝置另須以專人進行系統整 合，亦非常耗時。 鑒於自知技藝存在的問題，本發明提出一新穎的眼圖特性 測試方法及其裝置，以克服上述缺點。 簡要說明 、本發明之王要目的係提供一種自動化，且可降低測試成本 之眼圖特性之測試方法及其裝置。 本發月之第一目的係提供一種可快速測試眼圖特性之測試 方法及其裝置。 為了達到上述目的，本發明並不採用習知技藝之射頻分析 儀而係直接由一主機送出預設條件至一待測晶片，且由該 待測晶片讀出GLPF信號。經數位化和規格化該glpf信號 後，可執行存在於該主機内之一眼圖重建程式而重建該眼 圖。接著仍可以軟體分析該眼圖參數和預設規格間的誤差， 且依據該誤差之分析而判斷該待測晶片是否仍在規格所允許 之範圍内。若不在所允許之範圍内，則予以丟棄。 星立^簡軍說明 本發明將依照後附圖式來說明，其中： 圖1係習知之測試裝置； 圖2係本發明之一實施例之測試裝置； 圖3係本發明之測試流程圖； 圖4係本發明之眼圖重建流程圖；及 圖5係一眼圖之示意圖。, Sub-a specifications ’are often wrong or because of human negligence and inability to compare accurately. In addition, the conventional test device must be integrated by a person, which is also very time-consuming. In view of the problems existing in self-knowledge technology, the present invention proposes a novel eye pattern characteristic test method and device to overcome the above disadvantages. Briefly stated, the main purpose of the king of the present invention is to provide an automatic eye diagram characteristic test method and device that can reduce test cost. The first objective of this month is to provide a test method and device that can quickly test the characteristics of the eye pattern. In order to achieve the above object, the present invention does not use a conventional RF analyzer, but directly sends a preset condition from a host to a chip to be tested, and the GLPF signal is read from the chip to be tested. After the glpf signal is digitized and normalized, an eye diagram reconstruction program existing in the host computer can be executed to reconstruct the eye diagram. Then, software can still analyze the error between the eye parameter and the preset specifications, and determine whether the chip under test is still within the range allowed by the specifications based on the analysis of the error. If it is not within the allowed range, it is discarded. Xing Li ^ Jian Jun explained that the present invention will be described in accordance with the following drawings, wherein: FIG. 1 is a conventional test device; FIG. 2 is a test device according to an embodiment of the present invention; FIG. 3 is a test flowchart of the present invention; FIG. 4 is a flowchart of eye diagram reconstruction according to the present invention; and FIG. 5 is a schematic diagram of an eye diagram.
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522244 A7 B7 五、發明説明（3 ) 號說明 11 主機 12 機械手臂 13 測試盤 14 待測晶片 15 射頻分析儀 2 1 主機 22 機械手臂 23 測試盤 24 待測晶片 25 擷取器 26 眼圖重建裝置 27 誤差比較裝置 5 1 零交叉點 52 擷取信號 較倖實施例說明 圖2係本發明之一實施例之測試裝置，包含一測試主機 21、一待測晶片24及一機械手臂22，且該待測晶片24置於該 機械手臂22之測試盤23上。本發明之特徵在於該主機21為一 自動化測試設備（Automatic Testing Equipment ; A T E )，因此 其内部包含一計算硬體（例如一工作站），可由使用者輸入 參數和執行軟體程式。大體而言，該主機21包含三項工作模 組’分別為一擷取器（digitizer) 25、一眼圖重建裝置26和一 誤差比較裝置27。該擷取器25用於擷取該待測晶片24之 GLPF輸出信號，且數位化和規格化（n〇rmalize)該儿”輸 出#號。該眼圖重建裝置26用於將所擷取之信號重疊至同一 眼圖週期内，而形成眼圖。該誤差比較裝置27用於計算眼圖 之各參數之誤差是否仍在規格所允許之範圍内；若不符合規 格，則予以丟棄。 圖3係本發明之測試流程圖。在步驟3 1，本發明啟始。在步 O:\71\71Sfti.D〇c _ ^ _ 本紙張尺度適用巾a a家標準(CNS) μ規格(21G><297讀） 522244 A7 ___ —_B7 五、發明説明（4 ) 騾32，該主機2 1送出預設條件至該待測晶片24，且由該待測 晶片24讀出GLPF信號。一般而言，可依據測試時間，而擷取 大約數千個測試週期之信號。在步驟3 3，數位化和規格化該 GLPF#號。在步驟34，依圖4所述之步騾重建眼圖。在步騾 35，計算眼圖的參數（例如眼的寬度、高度、交叉百分比、 RMS抖動等），並分析和規格間的誤差，該規格和一可接受 心誤差度可由測試者輸入。若該通訊晶片之誤差超過可接受 <範圍’則予以丟棄。在步驟36，本發明結束。 圖4係本發明之眼圖重建流程圖，且圖5係一眼圖之示意 圖。在步騾4 1，本發明啟始。在步騾42，計算所擷取信號52 的平均值（mean )，例如可將所擷取之信號相加，再予以平 均。在步騾43，依據該平均值而計算零交叉點（zer…cr〇ssing point)的位置（如圖5所示之位置5 i )，以作為一基準點。在 步騾44，利用已知信號傳輸速率（Date Rate)來作一個定定 重疊的時間T，而重疊回一個τ的時間間格為& (即為擷取器 之取‘頻率的倒數），如此一來可以完整正確的將一申的資 料重疊回一個週期内，而產生眼圖。在步騾45，本發明結 束。 本發明之技術内容及技術特點巳揭示如上，然而熟悉本項 技術之人士仍可能基於本發明之教示及揭示而作種種不背離 本發明精神之替換及修飾。因此，本發明之保護範圍應不限 於實施例所揭示者，而應包括各種不背離本發明之替換及修 姊’並為以下之申請專利範圍所涵蓋。 本紙張尺度通财國國家標準(CNS) Α4規格(21G χ 297公董)522244 A7 B7 V. Description of the invention (3) No. 11 Host 12 Robot arm 13 Test disc 14 Chip under test 15 RF analyzer 2 1 Host 22 Robot arm 23 Test disc 24 Chip under test 25 Extractor 26 Eye pattern reconstruction device 27 Error comparison device 5 1 Zero-crossing point 52 Signal acquisition Fortunately, the embodiment is illustrated. FIG. 2 is a test device according to an embodiment of the present invention, which includes a test host 21, a chip to be tested 24, and a robot arm 22. The wafer to be tested 24 is placed on the test plate 23 of the robot arm 22. The present invention is characterized in that the host 21 is an automatic testing equipment (Automatic Testing Equipment; ATEE), so it contains a computing hardware (such as a workstation), which can be used by users to input parameters and execute software programs. Generally speaking, the host 21 includes three working modules ′, which are a digitizer 25, an eye reconstruction device 26, and an error comparison device 27, respectively. The fetcher 25 is used to capture the GLPF output signal of the chip 24 to be tested, and digitized and normalized (normalize) the "output #" number. The eye pattern reconstruction device 26 is used to capture the captured The signals overlap into the same eye diagram period to form an eye diagram. The error comparison device 27 is used to calculate whether the error of each parameter of the eye diagram is still within the range allowed by the specifications; if it does not meet the specifications, it is discarded. Figure 3 It is the test flow chart of the present invention. In step 31, the present invention starts. In step O: \ 71 \ 71Sfti.D〇c _ ^ _ This paper size is applicable to the standard aa home standard (CNS) μ specification (21G > & lt (297 reads) 522244 A7 ___ —_B7 V. Description of the invention (4) 骡 32, the host 21 sends a preset condition to the chip 24 to be tested, and the chip 24 to read the GLPF signal. Generally speaking, Signals of about several thousand test cycles can be acquired according to the test time. In step 33, the GLPF # is digitized and normalized. In step 34, the eye diagram is reconstructed according to the steps described in FIG. 4. In step骡 35, calculate the parameters of the eye diagram (such as eye width, height, crossover percentage, RMS jitter, etc.), and The error between the analysis and the specification, the specification and an acceptable degree of error can be input by the tester. If the error of the communication chip exceeds the acceptable range, it is discarded. At step 36, the present invention ends. The invention is an eye diagram reconstruction flowchart, and FIG. 5 is a schematic diagram of an eye diagram. At step 41, the invention starts. At step 42, the mean of the captured signal 52 is calculated. The acquired signals are added and then averaged. At step 43, the position of the zero crossing point (zer ... cr0ssing point) (position 5 i as shown in FIG. 5) is calculated based on the average value as one The reference point. In step ， 44, a known signal transmission rate (Date Rate) is used to make a fixed overlap time T, and the time interval of the overlap back to a τ is & (that is, the fetcher's frequency In this way, the data of an application can be completely and correctly superimposed back into a cycle to generate an eye diagram. At step 45, the present invention ends. The technical content and technical features of the present invention are disclosed above, but familiar People with this technology may still be based on this The teachings and disclosure of the invention make various substitutions and modifications that do not depart from the spirit of the invention. Therefore, the scope of protection of the invention should not be limited to those disclosed in the embodiments, but should include various substitutions and repairs that do not depart from the invention. The scope of the following patent applications is covered. This paper is a national standard (CNS) A4 specification (21G x 297).