TW512405B - Dryer - Google Patents
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- TW512405B TW512405B TW90105816A TW90105816A TW512405B TW 512405 B TW512405 B TW 512405B TW 90105816 A TW90105816 A TW 90105816A TW 90105816 A TW90105816 A TW 90105816A TW 512405 B TW512405 B TW 512405B
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Abstract
Description
512405 五、發明說明(1) 【發明領域】 本發明係有關於一種乾燥裝置(d Γ y e ^ ),特別是有 關於一種改良的濕式處理機台(w e t b e n c h )之乾燥裝 置,可以避免靜電電荷的累積。 【習知技術】512405 V. Description of the invention (1) [Field of the invention] The present invention relates to a drying device (d Γ ye ^), and in particular to an improved wet bench drying device, which can avoid electrostatic charges. Accumulation. [Learning technology]
晶圓的清洗在IC製造過程中是相當普遍的製程。濕式 化學清洗為其主要的技術。在I c製造過程中,預擴散清洗 (pre-diffusion clean)是不可或缺的步驟。而在每一 次清洗步驟完後’都需要乾燥機來將晶圓乾燥,以利於下 一步驟的進行。然而,由於濕式處理機台的乾燥裝置容易 累積靜電電荷,在進行晶圓乾燥的步驟時,所累積的電荷 會攻擊矽晶圓表面,發生矽缺陷(siHc〇n pitting)。 【發明之目的及概要】 有鑑於此,本發明的目的在於提供一種可以避免電荷 累積之濕式處理機台的乾燥裝置。 此外,本發明並提供一種包括乾燥裝置的濕式處理機 台’可以消除靜電電荷。 因此,本發明之目的係 良,本發明提供一種乾燥裝 室的上方,其包括:反應室 管。其中隔板位於反應室遮 反應室遮蓋物分隔為上部和 材質所組成,其位於反應室 悲,而導管係用以導入高揮 針對於上述習知技術而提出改 置’此乾燥裝置位於濕式反應 遮蓋物、隔板、阻障板和導 蓋物内,且具有許多孔洞,將 下部;阻障板由可傳導電荷的 遮盘物之下部,且處於接地狀 發性氣體至反應室遮蓋物上Wafer cleaning is a fairly common process in IC manufacturing processes. Wet chemical cleaning is its main technology. Pre-diffusion clean is an indispensable step in the IC manufacturing process. After each cleaning step ', a dryer is needed to dry the wafer to facilitate the next step. However, since the drying device of the wet processing machine is prone to accumulate electrostatic charges, during the wafer drying step, the accumulated charges will attack the surface of the silicon wafer and cause silicon defects (siHcon pitting). [Objective and Summary of the Invention] In view of this, an object of the present invention is to provide a drying device for a wet processing machine that can avoid charge accumulation. In addition, the present invention also provides a wet processing machine 'including a drying device, which can eliminate electrostatic charges. Therefore, the object of the present invention is good. The present invention provides an upper part of a drying chamber, which includes a reaction chamber tube. The partition is located in the reaction chamber, covering the reaction chamber. The cover is divided into an upper part and a material, and it is located in the reaction chamber. The duct is used to introduce a high-volume method for the above-mentioned conventional techniques. This drying device is located in the wet type. There are many holes in the reaction cover, baffle, baffle and guide, and the lower part; the baffle consists of the lower part of the shield that can conduct charge and is in the form of ground-like hair gas to the cover of the reaction chamber.
512405512405
隔板之孔洞 發明一較佳 部,並經由 依據本 的材質所組 傳導電荷的 壁及反應槽 傳導電荷的 膠等。為了 台上方放置 本發明 包括:濕式 及大致位於 括:反應室 的隔板、位 高揮發性氣 成外,其他 材質所組成 等均可由可 材質例如為 進一步將靜 靜電消除器 並提供一種 反應室、位 乾燥裝置上 遮蓋物、位 於反應室遮 體至反應室 而往下部流動。 實施例,除了阻障 例如反應室遮蓋物 ’甚至濕式處理機 傳導電荷的材質來 不銹鋼、石英、特 電電荷予以中和, 可消除靜電電荷之 於濕式反應室上方 方的靜電消除器。 於反應室遮蓋物内 蓋物下部的阻障板 遮蓋物上部的導管 板由可傳導電荷 或是隔板亦由可 台的濕式反應室 取代。上述之可 殊玻璃、特殊塑 還可以在乾燥機 濕式處理機台, 的乾燥裝置、以 其中乾燥裝置包 且具有許多孔洞 、以及用以導入The hole of the partition is invented as a better part, and the charge-conducting wall and the reaction tank are used to conduct charge via the material set according to this material. In order to place the present invention above the stage, the present invention includes: a wet type and generally located including: a baffle of a reaction chamber, a highly volatile gas, other materials, etc., may be made of materials such as a static electricity eliminator and a reaction The cover on the chamber and the drying device flows from the cover of the reaction chamber to the reaction chamber and flows downward. In the embodiment, in addition to the obstacles such as the cover of the reaction chamber, and even the wet processor, the material that conducts the charge is neutralized by stainless steel, quartz, and special electric charges, which can eliminate the electrostatic charge on the static eliminator above the wet reaction chamber. In the cover of the reaction chamber, the barrier plate at the lower part of the cover is replaced by the conductive plate or the partition plate by the wet-type reaction chamber that can conduct the charge. The above-mentioned special glass and special plastics can also be used in dryers, wet processing machines, drying devices, in which the drying device package has many holes, and for introducing
依據本發明一較佳實施例,其中濕式反應室更包括反 應室壁和位於反應室壁内的反應槽,而反應室壁、反應 槽、和乾燥裝置之反應室遮蓋物、隔板和阻障板係由^傳 $笔街的材質所組成’並將其設計成處於接地狀態,上述 之叮傳導電何的材質包括不錄鋼、石英、特殊玻璃、特 塑膠等。 'According to a preferred embodiment of the present invention, the wet reaction chamber further includes a reaction chamber wall and a reaction tank located in the reaction chamber wall, and the reaction chamber wall, the reaction tank, and a reaction chamber cover, a partition and a blocking device of the drying device. The baffle is composed of the material of "Bai Chuan Street" and is designed to be grounded. The materials of the above-mentioned conductive materials include non-recorded steel, quartz, special glass, and special plastic. '
為讓本發明之上述目的、特徵及優點能更明顯易懂, 下文特舉一較佳實施例,並配合所附圖式,作詳細說明如 下: 【圖式簡單說明】In order to make the above-mentioned objects, features, and advantages of the present invention more comprehensible, a preferred embodiment is given below in conjunction with the accompanying drawings to make a detailed description as follows: [Simplified description of the drawings]
〇503-5831TWF-ptd 第8頁 五、發明說明(3) 第1圖為根據本發明一 之濕式處理機台的剖面圖。佳貫施例之一種含乾燥裝置 第2圖係繪示第i圖之 第3圖係絡干筮]θ 乾燥骏置的上視圖。 日不第1圖之乾擗# 【符號說明】 L展裝置的側視圖。 反應槽:2 2 反應室壁:2 4 曰9曰片座:30 晶片:32 靜電消降器丄4 0一 金屬片:50 乾燥裝置:1 〇 反應室遮蓋物:i 2 水平隔板:1 4 垂直阻障板:j 6 導管:18 排氣管:19 濕式反應室:2 〇 【貫施例】 第1圖為本發明之一人% 剖面圖,第2圖係為第i圖之3 \燥裝置的濕式處理機台之 水平隔板14部:分5括:反應室遮蓋物12、 平隔板14具有許多孔洞丨5,導官1 8和排氣管1 9,其中水 將反應室遮蓋物12分隔為上邱:己置於反應室遮蓋物12内’ 反應室遮蓋物12之下部此^下部;垂直阻障板“位於 材質所組成,且處於接地狀^直板16由可傳導電荷的 々Α擇地狀恕,而導管j 8 一 發性氣體至反應室逨芸物卜卹、, 糸用以¥入南揮 、、同15而技部,並經由水平隔板“之孔 /门15而彺下.[^動,藉以帶走晶片座3〇上〇 503-5831TWF-ptd Page 8 V. Description of the invention (3) Figure 1 is a sectional view of a wet processing machine according to the first aspect of the present invention. A Drying Device Included in Jiaguan Example. Figure 2 is a top view of the drying device set in Figure 3 and Figure 3).日 不 第 1 图 的 乾 擗 # [Symbol Description] A side view of the L exhibition device. Reaction tank: 2 2 Reaction chamber wall: 2 4 9-sheet holder: 30 Wafers: 32 Static reducer 丄 4 1 Metal sheet: 50 Drying device: 1 〇 Cover of reaction chamber: i 2 Horizontal partition: 1 4 Vertical baffle: j 6 Duct: 18 Exhaust pipe: 19 Wet reaction chamber: 2 〇 [Example] Figure 1 is a cross-sectional view of a person of the present invention, and Figure 2 is the third of Figure i \ The horizontal partition 14 of the wet processing machine of the drying device: divided into 5: the reaction chamber cover 12, the flat partition 14 has many holes, 5, the guide 18, and the exhaust pipe 19, where the water will The reaction chamber cover 12 is divided into upper ridges: it has been placed inside the reaction chamber cover 12 'below and below the reaction chamber cover 12; the vertical barrier plate "is located in the material and is grounded. The straight plate 16 is made of The conductive charge is selectively grounded, and the duct j 8 emits a burst of gas to the reaction chamber. It is used to enter the south, and is the same as the technical department, and passes through the horizontal partition. Hole / door 15 and down. [^ Moves to take away the wafer holder 30
512405 五 '發明說明(4) (isopropyl aichol ; IPA )。此乾燥裝置10係位於濕式 反應室20上方,為可動式,以讓晶片座3〇方便自反應槽22 中進出。 除了垂直阻障板1 6由可傳導電荷的材質所組成外,此 乾燥裝置10之其餘部份(反應室遮蓋物12和水平隔板14 ) 之材質亦可改為可傳導電荷的材質,且同樣處於接地狀 悲’以將靜電電荷中和,免於靜電電荷對晶片造成傷害。 上述之可傳導電荷的材質例如是不銹鋼、石英 '特殊玻 璃、特殊塑膠或其他類似此性質者。512405 Five 'Explanation (4) (isopropyl aichol; IPA). The drying device 10 is located above the wet-type reaction chamber 20 and is movable to allow the wafer holder 30 to enter and exit the reaction tank 22 conveniently. In addition to the vertical barrier plate 16 composed of a material that can conduct charge, the material of the rest of the drying device 10 (the reaction chamber cover 12 and the horizontal partition 14) can be changed to a material that can conduct charge, and It is also in a ground-like state to neutralize the electrostatic charge and prevent the electrostatic charge from causing damage to the wafer. The above-mentioned materials that can conduct charge are, for example, stainless steel, quartz, special glass, special plastic, or other similar materials.
此乾燥裝置1 0上方更加裝一靜電消除器4 〇,用以進一 步消除所產生的電荷。 應槽2 2、濕式反應室壁2 4等 述之可傳導電荷的材質,並 靜電電荷去除。此外,亦使 另外,濕式反應室2 0的反 其他構件之材質,亦可改為上 使其王接地狀悲’以將多餘的 晶片3 2處於接地狀態。 在上述之接地處理中, 的材質接觸,另一端則接地 質接觸時,通常會在此接觸 5 0,以加強傳導電荷的能力 。而將導線與可傳導電荷鲈 點之構件的内側加裝一金屬 值得注葸的足A static eliminator 40 is further installed above the drying device 10 to further eliminate the generated electric charge. The materials that can conduct the electric charge, such as the tank 2 2, the wall of the wet reaction chamber 24, etc., and remove the electrostatic charge. In addition, the material of the anti-other components of the wet reaction chamber 20 can also be changed to make the king grounded and sad, to place the excess wafer 32 in the grounded state. In the above-mentioned grounding process, the material of is in contact, while the other end is in contact with the grounding substance, it will usually contact 50 here to enhance the ability to conduct charge. A metal is added to the inner side of the wire and the component that can conduct the electric charge.
电消除器40具有消险輕+ . 的功用,因此,本發明亦可w ^ ^ π ,自除静電i ^ 以僅於乾燥裝置1 0上太4 , 電消除器40,來達到消除靜電電荷的目 方加肩 【發明之特徵與效果】 綜上所述,本發明至少I古π Μ Μ ^昇有下列優點··The electric eliminator 40 has the function of lightening +. Therefore, the present invention can also remove the static electricity i ^^ from the drying device 10 to 4, and the electric eliminator 40 to eliminate static electricity. Charge and shoulders [Characteristics and effects of the invention] In summary, the present invention has at least one ancient π Μ Μ ^ liter has the following advantages ··
0503-5831TWF-?id 第10頁 5124050503-5831TWF-? Id Page 10 512405
五、發明說明(5) 1 ·本發明之濕式反應室上方的乾燥裝置,大部份構 件係採用可傳導電荷的材質’用以將靜電電荷中和,因而 可以避免靜電電荷對晶片造成傷害。 2·為了更進一步將濕式反應室上方的乾燥裝置所產 生的靜電電荷予以中和’本發明除了將乾燥裝置<大部份之 構件採用可傳導電荷的材質外,並加裝一靜電消除二二 3·除了將濕式反應室上方的乾燥裝置設計為#接^也。 外,濕式反應室之反應室壁、反應槽以及其他構件,V. Description of the invention (5) 1 · Most of the components of the drying device above the wet reaction chamber of the present invention are made of a material that can conduct charge, which is used to neutralize the electrostatic charge, so that the electrostatic charge can avoid damage to the wafer. . 2. In order to further neutralize the electrostatic charge generated by the drying device above the wet-type reaction chamber, in addition to using a material capable of conducting charge in the drying device < most of the components of the invention, a static elimination is added 22 · 3. In addition to designing the drying device above the wet reaction chamber as # 接 ^ 也. In addition, the reaction chamber walls, reaction tanks and other components of the wet reaction chamber,
設計為接地狀態,藉以將靜電電荷中和,使晶片 受到靜電電荷的攻擊。若再加裝靜電消除器,則二 步確保晶片可免於受到靜電電荷的傷害。 4 ·本發明可僅於濕式反應室上方 靜電消除器,而將靜電電荷予以中和, 荷的攻擊。 的乾燥裝置裝設一 以避免晶片受到電 雖然本發明已以較佳實施例揭 限制本發明,任何孰 上然其亚非用以 神和範圍内,當可傲爭說/技&者,在不脫離本發明之精 當事後附之申^ ^ 動一潤飾,因此本發明之保護範圍 爭俊附之申明專利範圍所界定者為準。It is designed to be grounded to neutralize electrostatic charges and expose the wafer to electrostatic charges. If a static eliminator is installed, the second step ensures that the wafer is protected from electrostatic charges. 4 · The present invention can neutralize electrostatic charges and charge attacks only on the static eliminator above the wet reaction chamber. A drying device is provided to prevent the wafer from receiving electricity. Although the present invention has been limited to the present invention by a preferred embodiment, any Asian or African use is within the scope and scope of the present invention. The application attached after the event does not deviate from the essence of the present invention. Therefore, the scope of protection of the present invention shall be determined by the scope of the stated patent.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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TW90105816A TW512405B (en) | 2001-03-13 | 2001-03-13 | Dryer |
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TW90105816A TW512405B (en) | 2001-03-13 | 2001-03-13 | Dryer |
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TW512405B true TW512405B (en) | 2002-12-01 |
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