TW494397B - Method for making a glass substrate for magnetic recording media - Google Patents
Method for making a glass substrate for magnetic recording media Download PDFInfo
- Publication number
- TW494397B TW494397B TW089107721A TW89107721A TW494397B TW 494397 B TW494397 B TW 494397B TW 089107721 A TW089107721 A TW 089107721A TW 89107721 A TW89107721 A TW 89107721A TW 494397 B TW494397 B TW 494397B
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- Taiwan
- Prior art keywords
- glass substrate
- polishing
- patent application
- weight
- magnetic recording
- Prior art date
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- 239000000758 substrate Substances 0.000 title claims abstract description 91
- 239000011521 glass Substances 0.000 title claims abstract description 61
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000005498 polishing Methods 0.000 claims abstract description 79
- 239000004744 fabric Substances 0.000 claims abstract description 35
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 claims abstract description 20
- 238000004519 manufacturing process Methods 0.000 claims abstract description 20
- 239000002245 particle Substances 0.000 claims abstract description 20
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 claims abstract description 8
- 239000003082 abrasive agent Substances 0.000 claims description 29
- 239000007788 liquid Substances 0.000 claims description 16
- 239000000654 additive Substances 0.000 claims description 11
- 235000014113 dietary fatty acids Nutrition 0.000 claims description 8
- 239000000194 fatty acid Substances 0.000 claims description 8
- 229930195729 fatty acid Natural products 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 8
- 239000006104 solid solution Substances 0.000 claims description 8
- 230000002079 cooperative effect Effects 0.000 claims description 7
- 230000000996 additive effect Effects 0.000 claims description 6
- 229930013930 alkaloid Natural products 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- 239000000243 solution Substances 0.000 claims description 5
- -1 fatty acid alkaloid Chemical class 0.000 claims description 4
- 229910000449 hafnium oxide Inorganic materials 0.000 claims description 4
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 claims description 4
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- 239000012530 fluid Substances 0.000 claims 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
- 230000003746 surface roughness Effects 0.000 abstract description 34
- 238000007517 polishing process Methods 0.000 abstract description 3
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 abstract description 2
- 239000005345 chemically strengthened glass Substances 0.000 description 17
- 230000000052 comparative effect Effects 0.000 description 8
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 230000007547 defect Effects 0.000 description 6
- 150000004665 fatty acids Chemical class 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 5
- 229920002635 polyurethane Polymers 0.000 description 5
- 239000004814 polyurethane Substances 0.000 description 5
- 235000014593 oils and fats Nutrition 0.000 description 3
- 239000004094 surface-active agent Substances 0.000 description 3
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- 239000004264 Petrolatum Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 235000012489 doughnuts Nutrition 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 230000001050 lubricating effect Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229940066842 petrolatum Drugs 0.000 description 2
- 235000019271 petrolatum Nutrition 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 2
- VWDWKYIASSYTQR-UHFFFAOYSA-N sodium nitrate Chemical compound [Na+].[O-][N+]([O-])=O VWDWKYIASSYTQR-UHFFFAOYSA-N 0.000 description 2
- DBGSRZSKGVSXRK-UHFFFAOYSA-N 1-[2-[5-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]-1,3,4-oxadiazol-2-yl]acetyl]-3,6-dihydro-2H-pyridine-4-carboxylic acid Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C1=NN=C(O1)CC(=O)N1CCC(=CC1)C(=O)O DBGSRZSKGVSXRK-UHFFFAOYSA-N 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910018104 Ni-P Inorganic materials 0.000 description 1
- 229910018536 Ni—P Inorganic materials 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 235000013339 cereals Nutrition 0.000 description 1
- 238000003426 chemical strengthening reaction Methods 0.000 description 1
- 230000001609 comparable effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000035622 drinking Effects 0.000 description 1
- 239000003925 fat Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- PAZHGORSDKKUPI-UHFFFAOYSA-N lithium metasilicate Chemical compound [Li+].[Li+].[O-][Si]([O-])=O PAZHGORSDKKUPI-UHFFFAOYSA-N 0.000 description 1
- 229910052912 lithium silicate Inorganic materials 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- UZLYXNNZYFBAQO-UHFFFAOYSA-N oxygen(2-);ytterbium(3+) Chemical compound [O-2].[O-2].[O-2].[Yb+3].[Yb+3] UZLYXNNZYFBAQO-UHFFFAOYSA-N 0.000 description 1
- 235000010333 potassium nitrate Nutrition 0.000 description 1
- 239000004323 potassium nitrate Substances 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000010344 sodium nitrate Nutrition 0.000 description 1
- 239000004317 sodium nitrate Substances 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 239000006058 strengthened glass Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910003454 ytterbium oxide Inorganic materials 0.000 description 1
- 229940075624 ytterbium oxide Drugs 0.000 description 1
Landscapes
- Manufacturing Of Magnetic Record Carriers (AREA)
- Surface Treatment Of Glass (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Magnetic Record Carriers (AREA)
Abstract
Description
494397 A7494397 A7
五、發明說明(1 ) [技術領域] 本發明係關於一種磁性記錄媒體用玻璃基板之製造方 法,更詳言之,係關於一種可生產其表面均質且表面缺陷 (請先閱讀背面之注咅?事項再填寫本頁) 少,並具有表面粗度極低之平滑表面的磁性記錄媒體用玻 璃基板之製造方法。(本文中所稱之磁性記媒體為如磁帶、 磁碟等可用以將電訊號形式儲存電腦用或其他資料之物 品) [背景技術] 隨著磁碟記錄裝置之大容量化,為了提高記錄密度而 需要一種可謀求磁頭浮起量之減低,且為了該減低而需要 表面平滑性優,而且表面缺陷少的磁性記錄媒體用基板。 表面平滑性優的磁性記錄媒體用基板,以往主要係使 用對鋁合金施予Ni-P電鍍,且將該電鍍主表面進行多階段 研磨所得的基板。 經濟部智慧財產局員工消費合作社印製 但是,近年來,筆記型電腦等可攜帶之個人電腦中也 開始採用磁碟記錄裝置,且開始需要可承受隨著攜帶之衝 擊的磁性記錄媒體用基板,而為了提高磁碟記錄裝置之響 應速度而從使磁性記錄媒體用基板高速旋轉l0000rpniU 上之需求開始而需要高強度的磁性記錄媒體用基板,且為 了要滿足該等必要性而開始採用玻璃基板。 此種磁性記錄媒體用玻璃基板,主要係採用藉由將藉 表面化學強化而提高強度的強化玻璃基板、及熔融成形所 得的玻璃基板長時間保持於600至800°C之高溫中以使結 晶相局部析出的結晶化玻璃基板。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 1 311400 494397 A7V. Description of the Invention (1) [Technical Field] The present invention relates to a method for manufacturing a glass substrate for magnetic recording media. More specifically, it relates to a method that can produce a surface with homogeneity and surface defects (please read the note on the back first) ? Please fill in this page again.) A method for manufacturing a glass substrate for magnetic recording media with a smooth surface with extremely low surface roughness. (The magnetic recording media referred to herein are items such as magnetic tapes, magnetic disks, etc. that can be used to store computer or other data in the form of electrical signals.] [Background Art] With the increase in the capacity of magnetic disk recording devices, in order to increase the recording density There is a need for a magnetic recording medium substrate that can reduce the amount of floating of the magnetic head, and that has a good surface smoothness and few surface defects. In the past, a substrate for a magnetic recording medium having excellent surface smoothness has mainly been a substrate obtained by applying Ni-P plating to an aluminum alloy and subjecting the main surface of the plating to multi-stage polishing. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. However, in recent years, magnetic disk recording devices have also been used in portable personal computers such as laptops, and substrates for magnetic recording media that can withstand the impact of carrying them have begun. In order to improve the response speed of the magnetic disk recording device, high-strength magnetic recording medium substrates are required starting from the need to rotate the magnetic recording medium substrates at a high speed of 10,000 rpniU, and glass substrates have been used to meet these needs. Such a glass substrate for a magnetic recording medium mainly uses a strengthened glass substrate whose surface strength is enhanced by chemical strengthening of the surface, and a glass substrate obtained by melt molding is maintained at a high temperature of 600 to 800 ° C for a long time to make the crystal phase Partially precipitated crystallized glass substrate. This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) 1 311400 494397 A7
五、發明說明(2 J (請先閱讀背面之注咅?事項再填寫本頁) 表面化學強化破璃基板,例如係在研削、研磨加工熔 融成形所得的表面化學強化性玻璃基板之後,藉由浸潰在 硝酸鈉、硝酸鉀等熔融鹽中以在表面形成壓縮應力層而提 高破壞強度的玻璃基板,而結晶化玻璃基板,例如係藉由 將熔融成开> 所得的非晶狀玻璃長時間保持於6〇〇至8〇〇它 之高溫中而藉由形成40至80%之結晶相與2〇至6〇%之非 晶相共存的混合相所得的玻璃基板。 然而’在此種的結晶化玻璃基板或表面化學強化性玻 璃基板之研削、研磨加工製程、尤其是精拋光製程中,當 使用習知技術’即使用羔皮型(suede type)之軟質研磨布與 含有數質量%程度之平均粒徑為〇 5 // m以下之Ce02系研 磨材料的研磨液予以研磨時,就會發生起因於研磨布之刷 毛眼狀之線狀凹凸,而只能獲得不均勻的表面。又,所達 成的表面粗度在表面化學強化性玻璃基板上有3 5 A左右 的限度’在結晶化玻璃基板上有4.5 A左右的限度,而欲 求得磁性記錄媒體用玻璃基板中所要求的3 A以下之表面 粗度係極為困難的。 經濟部智慧財產局員工消費合作社印制衣 [發明之揭示] 本發明之課題係在於提供一種可效率佳地生產被研磨 之表面為均質,表面缺陷少且具有表面粗度極低之平滑表 面的磁性記錄媒體用玻璃基板之製造方法。 本發明人等,就上述課題潛心研究的結果,發現在按 照以往習知之方法將磁性記錄媒體用玻璃基板研磨加工成 預定的板厚,並按照需要進行拋光(polishing)加工之後的 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297公釐) 2 311400 494397 A7 五、發明說明(3 ; (請先閱讀背面之注咅?事項再填寫本頁) 精拋光製程中,當使用研磨布,較佳者係使用發泡聚胺甲 酸酯(polyurethane)製之硬質研磨布,並使用以極低濃度含 有極細微的Ce〇2系研磨材料的研磨液進行研磨時,出乎 預料可容易地生產在沒有刷毛眼狀之線狀凹凸的均質表面 上很少表面缺陷且表面粗度為3 A以下的玻璃基板,進而 完成本發明。 亦即,本發明之磁性記錄媒體用玻璃基板之製造方 法,其特徵係在於:在磁性記錄媒體用玻璃基板之精拋光 製程中’使用含有1重量%以下之平均粒徑D5〇為〇.5/zm 以下之Ce〇2系研磨材料的研磨液及研磨布予以研磨者。 [發明所實施之最佳形態] 以下,係就本發明加以詳細說明。 經濟部智慧財產局員工消費合作社印製 依本發明之製造方法而製造磁性記錄媒體用玻璃基板 用的被加工玻璃基板,雖然只要其係具有磁性記錄媒體用 基板所需要之強度或是藉表面化學強化處理可提供磁性記 錄媒體用基板所需要的強度者則無論是哪種的玻璃基板皆 可’但是以現在的技術而言較佳者係採用結晶化玻璃基板 及表面化學強化性玻璃基板。 在本發明之製造方法中精拋光所使用的研磨材料係其 平均粒徑D5。為〇.5em以下,較佳者為〇3vm以下,更 佳者為0.2 // m以下之Ce02系微粒子。當使用含有平均粒 徑大於0.5em之研磨材料的研磨液來研磨玻璃基板時表 面粗度就會變大’且無法生產如本發明之目的其表面缺陷 少且具有表面粗度極低之平滑表面的玻璃基板。 311400 494397 A7 五、發明說明(4 ) 本發明之製造方法中可用於精拋光的Ce〇2系研磨材 料,可列舉高純度之Ce〇2、Ce〇2與稀土類元素氧化物之 混合物、Ce〇2與%之混合物、由如美國專利第yam 號說明書中所揭示之氧化鈽與氧化石夕所組成的固溶體等。 此種的固溶體由於可以所期望之極細微粒子的市售品方式 取付,且置入水中的分散性佳所以特別適於在本發明中使 用。此種的固溶體較佳者係由氧化鈽丨〇〇重量份與氧化矽 〇·1至10重量份所組成的固溶體。 本發明之製造方法中用於精拋光的研磨液,係含有1 重里%以下之上述ceo2系研磨材料,較佳者係含有0 5重 量%以下之Ce〇2系研磨材料。當使用Ce〇2f、研磨材料之 濃度超過1重量%的研磨液來研磨玻璃基板時,表面粗度 就會變大,且無法生產如本發明之目的其表面缺陷少且具 有表面粗度極低之平滑表面的玻璃基板。有關藉由使用 Ce〇2系研磨材料之濃度極低的研磨液來研磨而使玻璃基 板表面之表面粗度變得極低的理由,在現時點上雖未^明 白解釋,但是大概可考慮實際上有效作用於研磨加工所需 要的研磨材料之濃度非常低,而且研磨液中當存在有過剩 量的研磨材料時就會使表面粗度變差所致。 本發明之製造方法中,雖然會因研磨液中之研磨材料 的濃度低而使研磨中的研磨阻抗、加工阻抗變大,但是為 了降低該等的阻抗,而可與以往技術同樣地使研磨液含有 高分子添加劑或界面活性劑。此種的高分子添加劑係可使 用纖維、甘油等,而界面活性劑可使用陰離子系、陽離子 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) A7 -----— B7_____ 五、發明說明(5 ) 系非離子系之界面活性劑,較佳者係使用脂肪酸系界面 活性劑。此情況,並非只是降低研磨阻抗、加工阻抗,亦 更今易生產具有表面粗度極低之平滑表面的玻璃基板。 (請先閱讀背面之注意事項再填寫本頁) 本發明之製造方法中的精拋光,係使用公知之兩面研 磨機,並使用公知之研磨布來研磨玻璃基板。所使用之研 磨布雖非被特別限定,但為了提高研磨時機械化學作用中 的機械作用,較佳者係使用較硬的研磨布,此種較硬的研 磨布,較佳者係使用以往在粗研磨(一次抛光)製程中所使 用之發泡聚胺甲酸酯製之硬質研磨布。有關此發泡聚胺甲 酸酯製之硬質研磨布的硬度係有數階段的表示,雖然在哪 一個階段之硬度皆可良好地使用,但是從防止玻璃基板之 端面斜度(corner slope)的觀點來看,較佳者係採用硬度更 尚者。又,以使研磨液容易流動之目的而言較佳者係事先 在發泡聚胺甲酸酯製之硬質研磨布的研磨側表面上以3〇 至5 0mm間隔設置imm寬imm深的溝。更且,有關研磨 布之厚度較佳者係為0.5至1.5mm左右。 經濟部智慧財產局員工消費合作社印製 如前述般,當使用羔皮型之軟質研磨布與含有數%左 右之平均粒徑為〇·5至2/zm左右之Ce02系研磨材料的研 磨液來研磨時,雖然會發生起因於研磨布之具有刷毛眼狀 之方向性的線狀凹凸,而只獲得不均勻的表面,但是藉由 使用含有1重量%以下之平均粒徑D5G為0.5/zm以下之 Ce〇2系研磨材料的研磨液即可抑制起因於研磨布之刷毛 眼狀之線狀凹凸的發生,更且藉由合併使用此種的研磨液 與如上述之發泡聚胺甲酸酯製之硬質研磨布即可防止起因 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 5 imm A7 五、發明說明(6 ) (請先閱讀背面之注意事項再填寫本頁) 於研磨布之刷毛眼狀之線狀凹凸的發生。起因於此種研磨 布之刷毛眼狀的線狀凹凸,雖然係在玻璃基板之普通的外 觀目視檢查中無法辨識的微小高低差,但是,當將磁性膜 予以製膜時就可清楚的目視到。另外,起因於研磨布之刷 毛眼狀的線狀凹凸雖然藉由合併使用硬質的研磨布與含有 平均粒徑為G.5至2"m左右之普通之Ce〇2系研磨材料的 研磨液即可減少,但是此情況仍會發生微小的表面缺陷。 經濟部智慧財產局員工消費合作社印製 本發明之製造方法中,有關上述以外之研磨條件,例 如研磨壓力、旋轉數、研磨時間,只要可進行一般的研磨 加工即無特別限制。然而,當研磨壓力過高時由於會發生 嚷吃喝攻音,或發生玻璃基板破損之情形,所以較佳者係 在未滿100g/cm2,更佳者係在8〇g/cm2以下實施。有關旋 轉數當過慢時由於有時會發生嘎吱嘎吱音,而當過快時有 時加工阻抗會變得過大的情形,所以較佳者係15至6〇rpm 左右。又,有關研磨時間,雖然係與旋轉數相關,但是當 過短時由於會有表面粗度之改善不充分的傾向,且即使時 間變長亦無法獲得與此相稱的效果,所以較佳者係使研磨 時間(分)X旋轉數(rpm)在150至1000左右。 以下,係依實施例及比較例更加具體說明本發明。 實施例1 按照平常之磁性記錄媒體用玻璃基板的製作順序,將 經矽酸鹽(lithium-silicate)結晶化玻璃板(小原股份有限公 司製.TS-10SX,石英•白石夕石(crystobalite)為70至80%, 其餘為非晶質)進行内外徑加工,研磨加工,以製作外徑 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 6 ΤΓΤΪ0ΪΓ 494397 A7 五、發明說明(7 ) 65mm、内徑20mm、板厚〇.68mm之複數個甜甜圈狀基板。 (請先閱讀背面之注咅?事項再填寫本頁) 其次’將100片之上述甜甜圈基板設定在濱井股份有 限公司製之16B兩面研磨機上,使用三井金屬礦業股份有 限公司製之米雷庫80l(CeO2系研磨材料,平均粒徑 D50 = 1.5 // m)以作為研磨材料,並使用羅德魯尼達製之 MHC15 A(發泡胺甲酸乙酯)以作為研磨布來研磨使單面厚 度削減1 5 // m,以製作本發明中所要研磨處理的結晶化玻 璃基板。 將上述所得之1 〇〇片結晶化玻璃基板設定在濱井股份 有限公司製之16B兩面研磨機上,使用三井金屬礦業股份 有限公司製之CEP(氧化鈽100重量份與氧化矽i重量份所 組成的固溶體,平均粒徑0=0.2 //m),使用含有〇·5重量 %之研磨材料的研磨液,並使用羅德魯尼達製之MHC15A (發泡胺甲酸乙酯)以作為研磨布,在研磨壓力6〇g/cm2、旋 轉數30rpm、研磨時間20分鐘的研磨條件下研磨結晶化玻 璃基板之兩面。利用 A.F.M.(Atomic Force Microscope)在 2 //mx 2/zm之面積上觀察研磨後之結晶化玻璃基板表面的 經濟部智慧財產局員工消費合作社印製 表面粗度(Ra及Rmax)。將該結果顯示於第i表中。 比較例1 除了使用三井金屬礦業股份有限公司製之米雷庫 SO(平均粒徑D5()=1.0/Z m ; Ce〇27〇%)以替代在實施例i 中所使用的CEP研磨材料以外,其餘施予與實施例1同樣 的處理’且與實施例1同樣觀察研磨後之結晶化玻璃基板 表面的表面粗度。將該結果顯示於第1表中。 ‘紙張尺度適用中關家標準(CNS)A4規格(210 X 297公羞Γ -31140011 494397 A7 B7 五、發明說明(8 ) 第1表V. Description of the invention (2 J (Please read the note on the back? Matters before filling out this page) Surface chemically strengthened glass-breaking substrate, for example, after grinding, grinding, processing, and melt-forming a surface chemically strengthened glass substrate, A glass substrate immersed in a molten salt such as sodium nitrate or potassium nitrate to form a compressive stress layer on the surface to increase the breaking strength. The crystallized glass substrate, for example, is obtained by melting an amorphous glass obtained by melting it into a glass substrate. A glass substrate obtained by maintaining the temperature at a temperature of 6,000 to 800% by forming a mixed phase in which 40 to 80% of a crystalline phase and 20 to 60% of an amorphous phase coexist. However, 'in this case In the process of grinding and polishing of crystallized glass substrates or surface chemically strengthened glass substrates, especially in the process of fine polishing, when using conventional techniques, that is, using a suede type soft polishing cloth and a content of several mass% When the polishing liquid of Ce02 based abrasive material with an average particle size of 0 / m / m or less is ground, linear unevenness due to the bristles and eyelike shapes of the abrasive cloth occurs, and only unevenness can be obtained. The surface roughness achieved has a limit of about 3 5 A on the surface chemically strengthened glass substrate, and a limit of about 4.5 A on the crystallized glass substrate. Therefore, a glass substrate for magnetic recording media is desired. The required surface roughness of 3 A or less is extremely difficult. Clothing printed by employees of the Intellectual Property Bureau, Ministry of Economic Affairs, Consumer Cooperatives [Disclosure of Invention] The subject of the present invention is to provide an efficient and homogeneous production of polished surfaces, A method for manufacturing a glass substrate for a magnetic recording medium with few surface defects and a smooth surface with extremely low surface roughness. As a result of intensive studies on the above-mentioned subject, the present inventors have found that a glass for a magnetic recording medium is conventionally used in accordance with a conventional method. After the substrate is ground to a predetermined thickness, and polished as required, the paper size is subject to Chinese National Standard (CNS) A4 (21 × 297 mm) 2 311400 494397 A7 V. Description of the invention (3 ; (Please read the note on the back? Matters before filling out this page) In the polishing process, when using abrasive cloth, it is better to use Unexpectedly, when a hard abrasive cloth made of foamed polyurethane is polished using a polishing solution containing extremely fine Ce02-based abrasives at a very low concentration, it can be easily produced without bristles. The linear substrate with a linear line-shaped unevenness has a glass substrate with few surface defects and a surface roughness of 3 A or less, thereby completing the present invention. That is, the method for manufacturing a glass substrate for a magnetic recording medium of the present invention is characterized in that : In a polishing process of a glass substrate for a magnetic recording medium, a polishing liquid and a polishing cloth containing a Ce02-based polishing material having an average particle diameter D50 of 0.5% or less and 0.5 / zm or less are used for polishing. [Best Mode for Carrying Out the Invention] Hereinafter, the present invention will be described in detail. The Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs prints a processed glass substrate for manufacturing a magnetic recording medium glass substrate in accordance with the manufacturing method of the present invention, although as long as it has the strength required for a magnetic recording medium substrate or uses surface chemistry Any type of glass substrate that can provide the required strength for the substrate for magnetic recording media can be used for the strengthening treatment. However, in the current technology, it is better to use a crystallized glass substrate and a surface chemically strengthened glass substrate. The abrasive used in the polishing method of the present invention has an average particle diameter D5. Ce02-based fine particles having a size of 0.5em or less, preferably 0.35vm or less, and more preferably 0.2 // m or less. When using a polishing liquid containing an abrasive material with an average particle size greater than 0.5em to grind a glass substrate, the surface roughness becomes large, and a smooth surface with few surface defects and extremely low surface roughness cannot be produced as the object of the present invention Glass substrate. 311400 494397 A7 V. Description of the invention (4) The Ce02-based abrasive material that can be used for fine polishing in the manufacturing method of the present invention includes high-purity Ce02, a mixture of Ce02 and rare earth element oxides, and Ce A mixture of 〇2 and%, a solid solution composed of hafnium oxide and oxidized stone as disclosed in the specification of US Patent No. yam, and the like. Such a solid solution is particularly suitable for use in the present invention because it can be taken out as a commercially available product with extremely fine particles desired, and has good dispersibility in water. Such a solid solution is preferably a solid solution consisting of ytterbium oxide and oxidized silica in an amount of 0.1 to 10 parts by weight. The polishing liquid used for fine polishing in the manufacturing method of the present invention contains the above-mentioned ceo2-based abrasive material at 1% by weight or less, and more preferably Ce02-based abrasive material at 0.05% by weight or less. When the glass substrate is polished using a polishing solution containing CeO2f and a concentration of abrasive material in excess of 1% by weight, the surface roughness becomes large, and it is not possible to produce the surface roughness as low as the object of the present invention and the surface roughness is extremely low. The smooth surface of the glass substrate. Regarding the reason why the surface roughness of the glass substrate surface is extremely low by using a polishing liquid with a very low concentration of Ce02-based polishing material, although the explanation is not clearly understood at this point, it may be considered practical The concentration of the abrasive material required to effectively work in the grinding process is very low, and when there is an excessive amount of abrasive material in the polishing liquid, the surface roughness will be deteriorated. In the manufacturing method of the present invention, although the concentration of the polishing material in the polishing liquid is low, the polishing resistance and the processing resistance during polishing become large, but in order to reduce such resistance, the polishing liquid can be made in the same manner as in the conventional technology. Contains polymer additives or surfactants. Such polymer additives can use fibers, glycerin, etc., and surfactants can use anions and cations. The paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) A7 ------ B7_____ V. Description of the invention (5) Non-ionic surfactant, preferably fatty acid surfactant. In this case, it is not only to reduce the grinding resistance and processing resistance, but also to easily produce a glass substrate having a smooth surface with extremely low surface roughness. (Please read the precautions on the back before filling this page.) The fine polishing in the manufacturing method of the present invention uses a well-known two-side grinder and a well-known abrasive cloth to polish the glass substrate. Although the abrasive cloth used is not particularly limited, in order to improve the mechanical action in the mechanochemical action during grinding, a harder abrasive cloth is preferably used, and a harder abrasive cloth is preferably used in the past. Hard abrasive cloth made of foamed polyurethane used in the rough grinding (primary polishing) process. The hardness of this rigid polyurethane abrasive cloth is shown in several stages. Although the hardness can be used in any stage, it is from the viewpoint of preventing the corner slope of the glass substrate. It seems that the better is the one with the better hardness. Further, for the purpose of making the polishing liquid easy to flow, grooves having a width of 1 mm and a depth of 1 mm are provided in advance on the polishing side surface of the rigid polishing cloth made of foamed polyurethane at intervals of 30 to 50 mm. The thickness of the polishing cloth is preferably about 0.5 to 1.5 mm. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs as mentioned above, when using lambskin-type soft abrasive cloth and abrasive liquid containing Ce02-based abrasive material with an average particle size of about 0.5 to 2 / zm At this time, although linear unevenness due to the direction of the bristles of the abrasive cloth occurs, only an uneven surface is obtained, but by using an average particle diameter D5G of 0.5 / zm or less containing 1% by weight or less, The polishing liquid of the Ce〇2 type polishing material can suppress the occurrence of linear unevenness caused by the bristles of the polishing cloth. Furthermore, by using such a polishing liquid in combination with the above-mentioned foamed polyurethane, Hard abrasive cloth can prevent the cause The paper size is applicable to China National Standard (CNS) A4 specification (210 X 297 mm) 5 imm A7 5. Invention description (6) (Please read the precautions on the back before filling this page) Occurrence of linear unevenness in the bristles of the abrasive cloth. Due to the line-shaped unevenness of the bristles of this abrasive cloth, although it is a small height difference that cannot be discerned in the ordinary visual inspection of the glass substrate, it can be clearly seen when the magnetic film is formed. . In addition, the linear irregularities caused by the bristles of the abrasive cloth are formed by a combination of a hard abrasive cloth and a polishing solution containing a common Ce02-based abrasive material having an average particle size of about G.5 to 2 " m. It can be reduced, but in this case minor surface defects still occur. Printed by the Consumers' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs In the manufacturing method of the present invention, the grinding conditions other than the above, such as grinding pressure, rotation number, and grinding time, are not particularly limited as long as ordinary grinding processing can be performed. However, when the grinding pressure is too high, it may cause choking, eating or drinking, or damage to the glass substrate. Therefore, it is preferably performed at less than 100 g / cm2, and more preferably performed at 80 g / cm2 or less. When the number of rotations is too slow, squeaking sounds sometimes occur, and when the speed is too fast, the processing impedance sometimes becomes too large. Therefore, it is preferably about 15 to 60 rpm. In addition, although the polishing time is related to the number of rotations, when the time is too short, the improvement of the surface roughness tends to be insufficient, and even if the time becomes longer, a comparable effect cannot be obtained, so the better one is The grinding time (minutes) X number of revolutions (rpm) is set to about 150 to 1,000. Hereinafter, the present invention will be described more specifically with reference to examples and comparative examples. Example 1 In accordance with the usual manufacturing procedure of a glass substrate for a magnetic recording medium, a glass-crystallized glass plate (manufactured by Ohara Co., Ltd. TS-10SX, quartz-crystobalite) was 70 to 80%, the rest is amorphous) internal and external diameter processing, grinding processing to make the external diameter This paper size applies Chinese National Standard (CNS) A4 specifications (210 X 297 public love) 6 ΤΓΤΪ0ΪΓ 494397 A7 V. Description of the invention (7) A plurality of donut-shaped substrates of 65 mm, an inner diameter of 20 mm, and a plate thickness of 0.68 mm. (Please read the note on the back? Matters before filling out this page) Next, 'Set 100 pieces of the doughnut substrate above on a 16B double-side grinder manufactured by Hamai Co., Ltd. and use rice made by Mitsui Metals Mining Co., Ltd. Raco 80l (CeO2 based abrasive material, average particle diameter D50 = 1.5 // m) as abrasive material, and MHC15 A (foamed urethane) manufactured by Rodunida as abrasive cloth The surface thickness is reduced by 15 / m to produce a crystallized glass substrate to be polished in the present invention. The 100 crystallized glass substrates obtained above were set on a 16B double-side grinder manufactured by Hamai Co., Ltd., and were made of CEP (100 parts by weight of hafnium oxide and 1 part by weight of silicon oxide i) manufactured by Mitsui Metals Mining Co., Ltd. Solid solution, with an average particle size of 0 = 0.2 // m), using a polishing solution containing 0.5% by weight of abrasive material, and using MHC15A (foamed urethane) manufactured by Rodunida for grinding The cloth was polished on both sides of the crystallized glass substrate under polishing conditions of a polishing pressure of 60 g / cm2, a rotation number of 30 rpm, and a polishing time of 20 minutes. Using A.F.M. (Atomic Force Microscope) to observe the surface of the polished crystallized glass substrate on the area of 2 // mx 2 / zm. The surface roughness (Ra and Rmax) printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. The results are shown in Table i. Comparative Example 1 Except that Mireku SO (average particle diameter D5 () = 1.0 / Z m; Ce0270%) manufactured by Mitsui Metals Mining Co., Ltd. was used instead of the CEP abrasive material used in Example i The rest was subjected to the same treatment as in Example 1 and the surface roughness of the surface of the crystallized glass substrate after polishing was observed in the same manner as in Example 1. The results are shown in Table 1. ‘The paper size is applicable to the Zhongguanjia Standard (CNS) A4 specification (210 X 297 male shame Γ-31140011 494397 A7 B7 V. Description of the invention (8) Table 1
研磨材料之種類 平均粒徑 Ra Rmax 實施例1 比較例1 CEP 米雷庫SO 0.2//m 1.0/zm 2.0 A 4.5 A 52 A 110 A (請先閱讀背面之注咅?事項再填寫本頁) 從第1表之數據中亦可明白,藉由以低濃度(1重量% 以下)使用小於以往普通使用之平均粒徑1.0 a m(D50為0.5 “ m以下)的Ce02系研磨材料來研磨即可充分地降低結晶 化玻璃基板表面之表面粗度。 實施例2至9 除了將實施例1中所使用的研磨條件(研磨時間、研磨 壓力、旋轉數)變更成第2表所示以外,其餘施予與實施例 1同樣的處理,且與實施例1同樣地觀察研磨後之結晶化 玻璃基板表面的表面粗度。將該結果顯示於第2表中。 第2表Type of abrasive material Average particle size Ra Rmax Example 1 Comparative example 1 CEP Mireco SO 0.2 // m 1.0 / zm 2.0 A 4.5 A 52 A 110 A (Please read the note on the back first? Matters before filling out this page) It can also be understood from the data in Table 1 that the Ce02-based abrasive can be polished at a low concentration (less than 1% by weight) using an average particle size of 1.0 am (D50 is 0.5 "m or less), which has been conventionally used. The surface roughness of the surface of the crystallized glass substrate was sufficiently reduced. Examples 2 to 9 Except that the polishing conditions (polishing time, polishing pressure, and number of rotations) used in Example 1 were changed to those shown in Table 2, the rest were applied. The same treatment as in Example 1 was performed, and the surface roughness of the surface of the crystallized glass substrate after polishing was observed in the same manner as in Example 1. The results are shown in Table 2. Table 2
研磨時間 研磨壓力 旋轉數 Ra Rmax 實施例2 20分 75g/cm3 30rpm 1.8 A 50 A 實施例3 20分 30g/cm3 30rpm 2.0 A 52 A 實施例4 20分 30g/cm3 50rpm 2.1 A 54 A 實施例5 15分 60g/cm3 40rpm 1.7 A 32 A 實施例6 15分 60g/cm3 30rpm 2,2 A 54 A 實施例7 15分 60g/cm3 20rpm 2.1 A 55 A 實施例8 10分 60g/cm3 20rpm 2.4 A 56 A 實施例9 5分 60g/cm3 30rpm 3.0 A 80 A 經濟部智慧財產局員工消費合作社印製 實施例10至15及比鮫例2 除了將實施例1中所使用的CEP研磨材料之濃度變更 成第3表所示,且以第3表所示之濃度添加(亦有無添加之 7ΙΙ4ϋϋ 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 494397 A7 B7 五、發明說明(9 ) (請先閱讀背面之注咅?事項再填寫本頁} 情況)脂肪酸石鹼(協同油脂製;MKP-98)以作為添加劑以 外,其餘施予與實施例1同樣的處理,且與實施例1同樣 地觀察研磨後之結晶化玻璃基板表面的表面粗度。將該結 果與實施例1之數據同時顯示於第3表中。 第3表Grinding time Grinding pressure rotation number Ra Rmax Example 2 20 minutes 75g / cm3 30rpm 1.8 A 50 A Example 3 20 minutes 30g / cm3 30rpm 2.0 A 52 A Example 4 20 minutes 30g / cm3 50rpm 2.1 A 54 A Example 5 15 minutes 60g / cm3 40rpm 1.7 A 32 A Example 6 15 minutes 60g / cm3 30rpm 2, 2 A 54 A Example 7 15 minutes 60g / cm3 20rpm 2.1 A 55 A Example 8 10 minutes 60g / cm3 20rpm 2.4 A 56 A Example 9 5 minutes 60g / cm3 30rpm 3.0 A 80 A Examples 10 to 15 and Comparative Example 2 were printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, except that the concentration of the CEP abrasive material used in Example 1 was changed to As shown in Table 3, and added at the concentration shown in Table 3 (with or without adding 7ΙΙ4ϋϋ) This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 494397 A7 B7 V. Description of the invention (9 ) (Please read the note on the back? Matters before filling out this page} Situation) Fatty acid alkaloids (produced by Synergic Oils and Fats; MKP-98) are treated in the same manner as in Example 1 except that they are used as additives, and are the same as in Example 1. 1 Similarly, observe the surface roughness of the surface of the crystallized glass substrate after polishing. This result is shown in Table 3 together with the data of Example 1. Table 3
研磨材料濃度 石鹼濃度 Ra Rmax 比較例2 2.0重量% 〇重量% 4.8 A 120 A 實施例1 0.5重量% 〇重量% 2.0 A 58 A 實施例10 0.1重量% 1重量% 1.6 A 33 A 實施例11 0.1重量% 0.5重量% 1.5 A 30 A 實施例12 0.1重量% 0重量% 1.8 A 52 A 實施例13 0.01重量% 1重量% 1.5 A 32 A 實施例14 0.01重量% 0.5重量% 1.6 A 34 A 實施例15 0.005重量% 1重量% 1.5 A 29 A 從第3表之數據中亦可明白,在研磨液中之研磨材料 的濃度高於1重量%時,研磨後之結晶化玻璃基板表面的 表面粗度會很差,而濃度極低時則可降低研磨後之結晶化 玻璃基板表面的表面粗度,而且當施加脂肪酸石鹼以作為 添加劑時更可利用其潤滑作用而降低表面粗度。 實施例16至18 經濟部智慧財產局員工消費合作社印製 除了將實施例1中所使用之CEP研磨材料的濃度設為 0.005重量%,而以1重量%之濃度添加脂肪酸石鹼(協同油 脂製;MKP-98)以作為添加劑,並將研磨布變更成第4表 所示者(MHC14E及Suba係羅德魯尼達製,N0038係鐘紡 (股)製之羔皮型)以外,其餘施予與實施例1同樣的處理, 且與實施例1同樣地觀察研磨後之結晶化玻璃基板表面的 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ¥ 311400 494397 A7 五、發明說明(10 ) 表面粗度。將該結果與實施例15之數據同時顯示於第4 表中。 第4表Abrasive material concentration NaOH concentration Ra Rmax Comparative example 2 2.0% by weight 0% by weight 4.8 A 120 A Example 1 0.5% by weight 0% by weight 2.0 A 58 A Example 10 0.1% by weight 1% by weight 1.6 A 33 A Example 11 0.1% by weight 0.5% by weight 1.5 A 30 A Example 12 0.1% by weight 0% by weight 1.8 A 52 A Example 13 0.01% by weight 1% by weight 1.5 A 32 A Example 14 0.01% by weight 0.5% by weight 1.6 A 34 A Implementation Example 15 0.005% by weight 1% by weight 1.5 A 29 A As can be understood from the data in Table 3, when the concentration of the abrasive in the polishing liquid is higher than 1% by weight, the surface of the surface of the crystallized glass substrate after polishing is rough When the concentration is very low, the surface roughness of the surface of the crystallized glass substrate after grinding can be reduced, and when the fatty acid petrolatum is applied as an additive, its lubricating effect can be used to reduce the surface roughness. Examples 16 to 18 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. In addition to setting the concentration of the CEP abrasive material used in Example 1 to 0.005% by weight, fatty acid alkaloids (manufactured by Synergy Fats and Oils) were added at a concentration of 1% by weight. ; MKP-98) is used as an additive, and the polishing cloth is changed to the one shown in Table 4 (MHC14E and Suba are made by Rodunida, N0038 are made of bellspun (stock) lambskin type), the rest are given and implemented The same treatment as in Example 1, and the surface of the crystallized glass substrate after grinding was observed in the same manner as in Example 1. The paper size of this paper applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) ¥ 311400 494397 A7 V. Description of the invention (10) Surface roughness. The results are shown in Table 4 together with the data of Example 15. Table 4
研磨布 Ra Rmax 實施例15 MHC15A 1.5 A 30 A 實施例16 MHC14E 1.8 A 62 A 實施例17 Suba 2,4 A 84 A 實施例18 N0038 2.2 A 80 A ("先閱讀背面之注意事項再填寫本頁) 從第4表之數據中亦可明白,以使用較硬的研磨布來 研磨較能降低結晶化玻璃基板之表面粗度。 實施例19 按照平常之磁性記錄媒體用玻璃基板的製作順序,將 可表面化學強化之鐘石夕酸鹽(lithium-silicate)玻璃基板(旭 科技玻璃股份有限公司製:AH-1)進行内外徑加工,研磨 加工’以製作外徑65mm、内徑20mm、板厚0.68mm之複 數個甜甜圈狀基板。 經濟部智慧財產局員工消費合作社印製 其次,將100片之上述甜甜圈基板設定在濱井股份有 限公司製之16B兩面研磨機上,使用三井金屬礦業股份有 限公司製之米雷庫801 (Ce02系研磨材料,平均粒徑 D50=1.5// m)以作為研磨材料,並使用羅德魯尼達製之 MHC15A(發泡胺甲酸乙酯)以作為研磨布來研磨使單面厚 度削減1 5 μ m,以製作本發明中所研磨處理的表面化學強 化性玻璃基板。 將上述所得之1〇〇片表面化學強化性玻璃基板設定在 濱井股份有限公司製之16B兩面研磨機上,使用三井金屬 本紙張I没迥用τ國國家標準(CNS)A4規格(21〇 χ 297公釐)-ΠΓ-mm— 494397 A7 B7 五、發明說明(11 ) 礦業股份有限公司製之CEP(氧化鈽100重量份與氧化矽J 重里份所組成的固溶體’平均粒徑D5〇=0.2 // m),使用含 有0.5重量%之研磨材料的研磨液,並使用羅德魯尼達製 之MHC14E(發泡胺甲酸乙酯)以作為研磨布,在研磨壓力 60g/cm2、旋轉數30rpm、研磨時間20分鐘的研磨條件下 研磨表面化學強化性玻璃基板之兩面。利用A.F.M. (Atomic Force Microscope)在 2# mx 2//m 之面積上觀察研 磨後之表面化學強化性玻璃基板表面的表面粗度(Ra及 Rmax)。將該結果顯示於第5表中。另外,在其表面完全 無法看到刷毛眼狀之線狀凹凸。 比較例3 除了使用三井金屬礦業股份有限公司製之米雷庫 SO(平均粒徑D5G = 1_0 “ m ; CeO270%)以替代在實施例19 中所使用的CEP研磨材料,並使用鐘紡(股)製之羔皮型 N0038以替代MHC14E(發泡胺甲酸乙酯)以外,其餘係施 予與實施例19同樣的處理,且與實施例1 9同樣觀察研磨 後之表面化學強化性玻璃基板表面的表面粗度。將該結果 顯示於第5表中。另外’在其表面可看到刷毛眼狀之線狀 凹凸。 第5表Abrasive cloth Ra Rmax Example 15 MHC15A 1.5 A 30 A Example 16 MHC14E 1.8 A 62 A Example 17 Suba 2,4 A 84 A Example 18 N0038 2.2 A 80 A (" Read the precautions on the back before filling in this (Page) It can also be understood from the data in Table 4 that polishing with a harder abrasive cloth can reduce the surface roughness of the crystallized glass substrate. Example 19 In accordance with the usual manufacturing procedure of a glass substrate for a magnetic recording medium, a surface-chemically strengthened lithium-silicate glass substrate (Asahi Glass Co., Ltd .: AH-1) was subjected to inner and outer diameters. Machining, grinding process' to produce a plurality of donut-shaped substrates with an outer diameter of 65mm, an inner diameter of 20mm, and a plate thickness of 0.68mm. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. 100 tablets of the above doughnut substrates were set on a 16B double-sided grinder manufactured by Hamai Co., Ltd. and Mireku 801 (Ce02 manufactured by Mitsui Metals Mining Co., Ltd. was used. Is a polishing material, with an average particle diameter of D50 = 1.5 // m) as the polishing material, and using MHC15A (foamed urethane) manufactured by Rodunida as a polishing cloth to reduce the thickness of one side by 15 μ m to produce a surface chemically strengthened glass substrate which has been subjected to the polishing treatment in the present invention. The 100 pieces of surface chemically strengthened glass substrates obtained above were set on a 16B double-side grinder manufactured by Hamai Co., Ltd., and Mitsui metal paper I was not used in accordance with τ National Standard (CNS) A4 specification (21〇χ). 297 mm) -ΠΓ-mm— 494397 A7 B7 V. Description of the invention (11) CEP (Solid solution consisting of 100 parts by weight of hafnium oxide and 100 parts by weight of silicon oxide) produced by Mining Co., Ltd. The average particle diameter is D5. = 0.2 // m), using a polishing liquid containing 0.5% by weight of abrasive material, and using MHC14E (foamed urethane) manufactured by Rodunida as a polishing cloth, at a polishing pressure of 60 g / cm2, and the number of rotations Both surfaces of the surface chemically strengthened glass substrate were polished under polishing conditions of 30 rpm and a polishing time of 20 minutes. A.F.M. (Atomic Force Microscope) was used to observe the surface roughness (Ra and Rmax) of the surface of the chemically strengthened glass substrate after grinding on an area of 2 # mx 2 // m. The results are shown in Table 5. In addition, the line-like unevenness of the bristles was not visible on the surface at all. Comparative Example 3 Instead of using the CEP abrasive material used in Example 19, Mireku SO (average particle diameter D5G = 1_0 "m; CeO270%) manufactured by Mitsui Metals Mining Co., Ltd. was used, and bell spinning was used. The lambskin type N0038 was produced in place of MHC14E (foamed urethane), and the rest was treated in the same manner as in Example 19, and the surface of the surface of the chemically strengthened glass substrate after polishing was observed in the same manner as in Example 19 Roughness. The results are shown in Table 5. In addition, the bristles-like linear irregularities are visible on the surface. Table 5
研磨材料之種類、平均粒獲 研磨布之材質 Ra Rmax 實施例19 比較例1 米雷庫SO、 1.0//m 發泡胺甲酸乙酯 羔皮型 1.5 A 5.6 A 50 A 120 A 從第5表之數據中亦可明白,藉由以低濃度(1重量% (請先閱讀背面之注咅?事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製Type of abrasive material, average grain Ra Ramax material of abrasive cloth Example 19 Comparative Example 1 Mirecu SO, 1.0 // m Foam urethane lambskin type 1.5 A 5.6 A 50 A 120 A From Table 5 It can also be understood from the data that by using a low concentration (1% by weight (please read the note on the back? Matters before filling out this page), printed by the Employees ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs
本紙張尺度適用中國國豕標準(CNS)A4規格(21〇 X 297公爱) 3114UU 494397 Α7 Β7 五、發明說明(12 ) 以下)使用小於以往普通使用之平均粒徑1.0//m(D50為0.5 //m以下)的Ce〇2系研磨材料來研磨即可充分地降低表面 化學強化性玻璃基板表面之表面粗度。 (請先閱讀背面之注意事項再填寫本頁) 實施例2 0至2 7 除了將實施例19中所使用的研磨條件(研磨時間、研 磨壓力、旋轉數)變更成第6表所示以外,其餘施予與 實施例19同樣的處理,且與實施例19同樣地觀察研磨後 之表面化學強化性玻璃基板表面的表面粗度。將該結果顯 示於第6表中。 第6表This paper size is applicable to China National Standard (CNS) A4 specification (21〇X 297 public love) 3114UU 494397 Α7 Β7 V. Description of the invention (below 12) Use an average particle size smaller than 1.0 // m used in the past (D50 is 0.5 // m or less) Ce02-based abrasives can sufficiently reduce the surface roughness of the surface of the surface chemically strengthened glass substrate. (Please read the precautions on the back before filling out this page.) Example 2 0 to 2 7 Except that the polishing conditions (polishing time, polishing pressure, and number of rotations) used in Example 19 were changed to those shown in Table 6, The rest was subjected to the same treatment as in Example 19, and the surface roughness of the surface of the surface chemically strengthened glass substrate after polishing was observed in the same manner as in Example 19. The results are shown in Table 6. Table 6
研磨時間 研磨壓力 旋轉數 Ra Rmax 實施例20 20分 75g/cm3 30rpm 1.4 A 48 A 實施例21 20分 30g/cm3 30rpm 1.6 A 54 A 實施例22 20分 30g/cm3 50rpm 1.6 A 52 A 實施例23 15分 60g/cm3 40rpm 1.4 A 46 A 實施例24 15分 60g/cm3 30rpm 1.7 A 54 A 實施例25 15分 60g/cm3 20rpm 1.8 A 57 A 實施例26 10分 60g/cm3 20rpm 2.1 A 58 A 實施例27 5分 60g/cm3 30rpm 2.4 A 61 A 實施例28至33及比鮫例4 經濟部智慧財產局員工消費合作社印製 除了將實施例19中所使用的CEP研磨材料之濃度變 吏成第7表所示,且以第7表所示之濃度添加(亦有無添加 道情況)脂肪酸石鹼(協同油脂製;MKP-98)以作為添加劑以 4,其餘施予與實施例19同樣的處理,且與實施例19同 摄地觀察研磨後之表面化學強化性玻璃基板表面的表面粗 度。將該結果與實施例19之數據同時顯示於第7表中。 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 12 --ΤΓΠΠϋ- 494397 經濟部智慧財產局員工消費合作社印製 A7 B7 i、發明說明(13 ) 第7表Grinding time Grinding pressure rotation number Ra Rmax Example 20 20 minutes 75g / cm3 30rpm 1.4 A 48 A Example 21 20 minutes 30g / cm3 30rpm 1.6 A 54 A Example 22 20 minutes 30g / cm3 50rpm 1.6 A 52 A Example 23 15 minutes 60g / cm3 40rpm 1.4 A 46 A Example 24 15 minutes 60g / cm3 30rpm 1.7 A 54 A Example 25 15 minutes 60g / cm3 20rpm 1.8 A 57 A Example 26 10 minutes 60g / cm3 20rpm 2.1 A 58 A Implementation Example 27 5 minutes 60 g / cm3 30 rpm 2.4 A 61 A Examples 28 to 33 and comparison Example 4 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs In addition to changing the concentration of the CEP abrasive material used in Example 19 to As shown in Table 7, fatty acid alkaloids (manufactured by Synergy Oils and Fats; MKP-98) were added (with or without addition) at the concentrations shown in Table 7 as additives, and the rest were treated in the same manner as in Example 19. The surface roughness of the surface of the chemically strengthened glass substrate after polishing was observed in the same manner as in Example 19. The results are shown in Table 7 together with the data of Example 19. This paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 mm) 12 --ΤΓΠΠϋ- 494397 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 B7 i. Description of the invention (13) Table 7
研磨材料濃度 石鹼濃度 Ra Rmax 比較例4 2.0重量% 0重量% 4.9 A 124 A 實施例19 0.5重量% 0重量% 1.6 A 54 A 實施例28 0.1重量% 1重量% 1.4 A 51 A 實施例29 0.1重量% 0.5重量% 1.4 A 49 A 實施例30 0.1重量% 〇重量% 1.5 A 52 A 實施例31 0.01重量% 1重量% 1.3 A 53 A 實施例32 0.01重量% 0.5重量% 1.4 A 50 A 實施例33 0.005重量% 1重量% 1.4 A 52 A 從第7表之數據中亦可明白,在研磨液中之研磨材料 的濃度高於1重量%時,研磨後之表面化學強化性玻璃基 板表面的表面粗度會很差,而濃度極低時則可降低研磨後 之表面化學強化性玻璃基板表面的表面粗度,而且當施加 脂肪酸石鹼以作為添加劑時更可利用其潤滑作用而降低表 面粗度。 實施例34 $ 36 除了將實施例19中所使用之CEP研磨材料的濃度設 為0.005重量%,而以1重量%之濃度添加脂肪酸石鹼(協 同油脂製;MKP-98)以作為添加劑,並將研磨布變更成第8 表所示者(MHC14E及Suba係羅德魯尼達製,N0038係鐘 纺(股)製之羔皮型)以外,其餘施予與實施例19同樣的處 理,且與實施例19同樣地觀察研磨後之表面化學強化性玻 璃基板表面的表面粗度。將該結果與實施例33之數據同時 顯示於第8表中。 -----------------^----^--------- (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 χ 297公釐) 13Abrasive material concentration NaOH concentration Ra Rmax Comparative Example 4 2.0% by weight 0% by weight 4.9 A 124 A Example 19 0.5% by weight 0% by weight 1.6 A 54 A Example 28 0.1% by weight 1% by weight 1.4 A 51 A Example 29 0.1% by weight 0.5% by weight 1.4 A 49 A Example 30 0.1% by weight 〇% by weight 1.5 A 52 A Example 31 0.01% by weight 1% by weight 1.3 A 53 A Example 32 0.01% by weight 0.5% by weight 1.4 A 50 A Implementation Example 33 0.005% by weight 1% by weight 1.4 A 52 A As can be understood from the data in Table 7, when the concentration of the abrasive in the polishing liquid is higher than 1% by weight, the surface of the surface of the chemically strengthened glass substrate after polishing is The surface roughness will be poor, and when the concentration is very low, the surface roughness of the surface of the chemically strengthened glass substrate after polishing can be reduced, and when fatty acid petrolatum is applied as an additive, its lubricating effect can be used to reduce the surface roughness. degree. Example 34 $ 36 In addition to setting the concentration of the CEP abrasive material used in Example 19 to 0.005% by weight, fatty acid alkaloid (produced by Synergy Oils and Fats; MKP-98) was added at a concentration of 1% by weight as an additive, and Except that the polishing cloth was changed to the one shown in Table 8 (MHC14E and Suba are made by Rodunida and N0038 are made of bellspun (strand) made of lambskin), the rest were given the same treatment as in Example 19 and implemented as In Example 19, the surface roughness of the surface of the surface chemically strengthened glass substrate after polishing was similarly observed. The results are shown in Table 8 together with the data of Example 33. ----------------- ^ ---- ^ --------- (Please read the notes on the back before filling this page) This paper size is applicable to China National Standard (CNS) A4 Specification (21 × 297 mm) 13
J114UU 494397 A7 B7 五、發明說明(14) 第8表J114UU 494397 A7 B7 V. Description of the invention (14) Table 8
研磨布 Ra Rmax 實施例33 MHC15A 1.3 A 48 A 實施例34 MHC14E 1.4 A 52 A 實施例35 Suba 2.3 A 63 A 實施例36 N0038 2.7 A 68 A 從第8表之數據中亦可明白,以使用硬的研磨布來研 磨較能降低表面化學強化性玻璃基板之表面粗度。 [產業上之可利用性] 如以上所述,藉由按照本發明之製造方法以研磨結晶 化玻璃基板或表面化學強化性玻璃基板,即可容易獲得具 有表面粗度極低之平滑表面的磁性記錄媒體用結晶化玻璃 基板。 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印制衣 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 14 311400Abrasive cloth Ra Rmax Example 33 MHC15A 1.3 A 48 A Example 34 MHC14E 1.4 A 52 A Example 35 Suba 2.3 A 63 A Example 36 N0038 2.7 A 68 A It can also be understood from the data in Table 8 to use hard The surface roughness of the surface chemically strengthened glass substrate can be reduced by polishing with a polishing cloth. [Industrial Applicability] As described above, by polishing a crystallized glass substrate or a surface chemically strengthened glass substrate according to the manufacturing method of the present invention, it is easy to obtain magnetic properties with a smooth surface with extremely low surface roughness. A crystallized glass substrate for a recording medium. (Please read the precautions on the back before filling out this page.) Clothing printed by the Employees ’Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs This paper applies the Chinese National Standard (CNS) A4 (210 X 297 mm) 14 311400
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JP33588998A JP3531906B2 (en) | 1998-11-26 | 1998-11-26 | Method for producing crystallized glass substrate for magnetic recording medium |
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CN1175401C (en) * | 2000-04-28 | 2004-11-10 | 三井金属矿业株式会社 | Method for producing glass base plate for magnetic recording carrier |
JP4562274B2 (en) * | 2000-11-09 | 2010-10-13 | Hoya株式会社 | Manufacturing method of glass substrate for information recording medium and manufacturing method of information recording medium |
US7037352B2 (en) | 2000-12-12 | 2006-05-02 | Showa Denko Kabushiki Kaisha | Polishing particle and method for producing polishing particle |
JP4885352B2 (en) * | 2000-12-12 | 2012-02-29 | 昭和電工株式会社 | Abrasive slurry and fine abrasive |
TWI292780B (en) * | 2000-12-12 | 2008-01-21 | Showa Denko Kk | |
JP4785406B2 (en) * | 2004-08-30 | 2011-10-05 | 昭和電工株式会社 | Polishing slurry, method for producing glass substrate for information recording medium, and method for producing information recording medium |
JP2006066851A (en) * | 2004-08-30 | 2006-03-09 | Matsumura Sekiyu Kenkyusho:Kk | Chemical machine polishing composition |
CN101827686B (en) | 2008-07-03 | 2013-07-17 | 旭硝子株式会社 | Method of polishing glass substrate and process for producing glass substrate, and method for manufacturing glass substrate for magnetic disc |
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