TW479446B - Method and apparatus of dry-etching resin film - Google Patents

Method and apparatus of dry-etching resin film Download PDF

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Publication number
TW479446B
TW479446B TW89126199A TW89126199A TW479446B TW 479446 B TW479446 B TW 479446B TW 89126199 A TW89126199 A TW 89126199A TW 89126199 A TW89126199 A TW 89126199A TW 479446 B TW479446 B TW 479446B
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TW
Taiwan
Prior art keywords
gas
etching
resin film
resin
film
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TW89126199A
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Chinese (zh)
Inventor
Ryomyo Hamanaka
Shinsuke Fukumoto
Yoshimasa Nakano
Tatsuya Takeuchi
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Toray Eng Co Ltd
Shinko Seiki
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Publication of TW479446B publication Critical patent/TW479446B/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/0041Etching of the substrate by chemical or physical means by plasma etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C59/00Surface shaping of articles, e.g. embossing; Apparatus therefor
    • B29C59/14Surface shaping of articles, e.g. embossing; Apparatus therefor by plasma treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31127Etching organic layers
    • H01L21/31133Etching organic layers by chemical means
    • H01L21/31138Etching organic layers by chemical means by dry-etching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/08Treatments involving gases
    • H05K2203/085Using vacuum or low pressure
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1105Heating or thermal processing not related to soldering, firing, curing or laminating, e.g. for shaping the substrate or during finish plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/15Position of the PCB during processing
    • H05K2203/1545Continuous processing, i.e. involving rolls moving a band-like or solid carrier along a continuous production path

Abstract

This invention provides the method and apparatus of dry-etching resin film. Either one of laminate materials formed by laminating metal foils on a resin film element material and a resin film is used as an untreated material (F), a heating table (3) is brought into close contact with one-side surface and an etching opening pattern-formed mask (4) is brought into close contact with the opposite-side surface so as to sandwich the untreated material (F), and the untreated material is gas-etched from the mask (4) side under a vacuum atmosphere with the close contact conditions maintained.

Description

479446 、發明說明(1) 之技術領3 +本發明係關於樹脂薄膜之乾式蝕刻方法及其裝置,更詳 。之,.係關於FPC(可撓性印刷電路板,Flexible 二ϋ I)基Ϊ等所使用之樹脂薄膜之表面予以氣體蝕刻之 不忐及裝置者。 〜如眾所周知,隨著情報通訊機器之小型輕量化,正 仃IC晶片基板之其厚度薄而多層化,由於該厚度 ,的關係’尤其是FPC用基板材料係使用樹脂薄膜。咳其 板材料所使用之樹脂薄膜當中,尤其是聚亞胺、μ 土 (PQlyimide)薄膜係因其化學特性(耐藥品性),熱 塑性,财熱性),電特性(電容率’絕緣電阻率)(特' ^吸水率,尺寸穩定性,熱膨服係數),及勿抗 :強度’财折強度)優超的關係,廣泛地使用。最寺T 有使用較水性及❹彡潤性 硫化物(PPS)等之樹脂薄膜。 I-人本暴 該等FPC基板用之樹脂薄膜係以樹脱薄膜單體之狀 用以及對?脂:金屬箱之積層材而使用之兩種;吏 形。在兩種情;中,均對該樹脂薄膜有穿設加工ΐ穿 機械性,物理性或化學性的多數穿孔方法 :广義 之雙方“旦無法迅速且高精以:成工;非貫穿孔 類之樹脂薄膜穿孔等之限制,有 5 &對特定種 有缺乏泛用性的缺點。479446, Technical Note 3 of Invention Description (1) + The present invention relates to a dry etching method of a resin film and a device thereof, more details. It means that the surface of the resin film used in FPC (Flexible Printed Circuit Board, Flexible II) substrates etc. is not affected by the device by gas etching. As we all know, with the miniaturization and weight reduction of information and communication equipment, the thickness of IC chip substrates is thinner and multi-layered. Due to the relationship between the thickness and the thickness, especially the resin film is used as the substrate material for FPC. Among the resin films used in the board material, especially the polyimide and μQ soil film are due to its chemical properties (chemical resistance), thermoplasticity, financial and thermal properties), electrical properties (permittivity, insulation resistance) (Special ^ water absorption, dimensional stability, thermal expansion coefficient), and Do not resist: strength 'financial strength' excellent relationship, widely used. Most temples T use resin films that are relatively water-based and wettable sulfide (PPS). I-Human violence The resin films used for these FPC substrates are used in the form of tree-removing film monomers, and what? Grease: two kinds of laminated materials used in metal boxes; In both cases; most of the perforating methods of this resin film are mechanical processing, physical or chemical perforation: both sides in the broad sense "cannot be quickly and highly precise: finished work; non-through holes Restrictions on perforation of resin films, etc., have the disadvantage of lacking versatility for specific species.

五、發明說明(2) 制:難使::ί蝕刻穿孔方法時,停止穿孔作業之停止控 度的問題存在I正2 =控制的關係,柳^ 之反應性活性氣體種Λ= έ士人ΑΑ μ〆 裡、原于圈)因裝置本身之觸媒作用而再 、、,口 a的關係,有降低穿孔速度之缺點。 發明之揣示 册ί = 3之第\目㈤,在於提供一種無論所要穿設之孔為 二二&5、否,以及不問樹脂薄膜之種類,能夠迅速且高精 二地穿孔之泛用性高之樹脂薄膜之乾式敍刻方法及裝置请 ^明之第2目㈤,在於提供一種可容易且正確地控制 了牙孔之樹脂薄膜之乾式蝕刻方法及裝置者。 廊柹t ί第3目的’在於提供一種可防止钱刻氣體之反 i之體種之再結合所致之穿孔速度之降低之樹脂薄 膜之乾式蝕刻裝置者。 守 f,明為達成上述第i目的,提供下述之3種樹 乾式蝕刻方法。 第1方法為,將樹脂薄膜單體材及樹脂薄膜積層金屬箔 t積層材中之任何一方作為被處理材,以該被處理材夾 間之,恶,一側之表面密接加熱平台之同時,在相反側 t表面^接形成有蝕刻用開口圖案之遮蔽,保持該密接狀 悲之Γ時’在真空周圍環境下從該遮蔽側使用氣體蝕刻為 其特徵者。 第2方法為,以樹脂薄膜單體材作為被處理材,將發生V. Description of the invention (2) System: Difficult to make :: ί The problem of stopping the control of the piercing operation when etching the perforation method has the relationship of I positive 2 = control, the reactive reactive gas species of Liu ^ = Zhishiren ΑΑ μ〆 里 (originally in the circle), due to the catalyst action of the device itself, there is a disadvantage of reducing the perforation speed. The book of invention 揣 = 3 of the 3rd chapter is to provide a universal application that can be perforated quickly and precisely regardless of the type of the hole to be worn, and no matter the type of the resin film. The dry engraving method and device of high-resistance resin film, please refer to item 2 of the specification, in order to provide a dry etching method and device of resin film which can easily and accurately control the perforations. The third object is to provide a dry etching device for a resin film which can prevent the reduction of the perforation speed caused by the recombination of the money type gas and the i type. Shou f, in order to achieve the i-th objective, the following three types of dry etching methods are provided. The first method is to use any one of the resin film monomer material and the resin film laminated metal foil t laminated material as the material to be treated, and sandwich the surface between the treated material and the evil side while closely contacting the heating platform. A mask with an opening pattern for etching is formed on the surface t on the opposite side, and when the tight contact is maintained, it is characterized by using gas etching from the shielding side in a vacuum surrounding environment. The second method is to use a single resin film material as the material to be processed.

第5頁 \\326\2d-\90-03\89126199.ptd 479446 五、發明說明(3) 與該被處理材異種之氣體之異種樹脂薄膜重疊於該 1之狀f,對該異種樹脂薄膜側之表面密接加埶‘ △: 述被^里材側之表^ ’密接形嶽刻、二圖 =蔽,保持該密接狀態之同日夺,在真空周圍環境下: 。亥遮蔽側使用氣體餘刻為其特徵者。 ^方法為’將形成有兹刻用開口圖案之金屬羯積層於 :ii曰it:面之積層材作為被處理材,在該被處理材之 = 密接加熱平台,保持該密接狀態之 徵者。〃工周圍衣兄下從該遮蔽側使用氣體I虫刻為其特 又,本發明係為達成第1 乾燥蝕刻裝置。 徒i、下述3種树舳溥膜之 苐1裝置為,由可使内部么亩办 & ^ ^ ^ , 災μ 口丨為真空之處理室,設置在該處 氙ΐ之蝕刻乳體供給部,以覆蓋該蝕刻氣體供給部之 心女凌之形成有蝕刻用開口圖案之遮 1.地設置在前述處理室内部之加熱平台所構 士亥加熱平台係密接於以樹脂薄膜為主材之被處理材之 一面之同時,前述遮綏穷垃 H敝么接於刖述被處理材之相反側之, 树知溥膜之乾式蝕刻裝置為其特徵者。 =置為’由可使内部為真空之處理室,設置在該處 氧二:之蝕刻軋體供給部,以覆蓋該蝕刻氣體供给部之 =體、肌出口之狀態安裝《,形成有钱刻用開口圖案之遮 1:i:動自如地設置在前述處理室内部之加熱平台所構 成’別述加熱平台係密接於被處理材之樹脂薄膜單體材,Page 5 \\ 326 \ 2d- \ 90-03 \ 89126199.ptd 479446 V. Description of the invention (3) A heterogeneous resin film of a gas different from the material to be treated overlaps with the shape of "1", and the heterogeneous resin film The surface on the side is tightly attached 埶: △: Said by the table on the side of ^ lining material ^ 'The close-connected shape of Yue Yue, two pictures = masking, the same day to maintain the tight state, in a vacuum surrounding environment:. The sheltered side uses gas as its characteristic. ^ The method is to use a metal layer formed with an opening pattern for engraving on the: ii, it: surface layer as the material to be treated, and the material to be treated must be in close contact with the heating platform to maintain the tight state. It is special to use gas I worm carving from the shielding side underneath the workers, and the present invention is to achieve the first dry etching device. The i. 1 device of the following three kinds of tree shrew membranes is to make the internal acres & ^ ^ ^, μμ 丨 a vacuum processing chamber, set the etched emulsion of xenon krypton there The supply part covers the heart of the etching gas supply part. The cover with an opening pattern for etching is formed. 1. The heating platform constructed by the heating platform installed inside the processing chamber is closely connected to the resin film as the main material. At the same time as one side of the material to be processed, the above-mentioned cover material is connected to the opposite side of the material to be processed, and the dry etching device of the tree film is a feature thereof. = Set to 'from the processing chamber where the inside can be a vacuum, set there. Oxygen II: The etched rolling body supply section is installed to cover the etch gas supply section, and the body and muscle exit are installed. Covered with an opening pattern 1: i: a heating platform that is installed in the interior of the processing chamber freely. 'The heating platform is a resin film monomer material that is in close contact with the material to be processed.

第6頁 五、發明說明(4) 及將發生與該樹脂薄膜單體 予以重疊之兩材料之同時,吁二=氣體之異種樹脂薄膜 材之樹脂薄膜之乾式蝕刻梦:,遮蔽係密接於前述被處理 第3裝置為,由可使二广/直為,特徵者。 理室内部之钮刻氣體供給1部%之處理室,設置在該處 理室内部之加熱平台所構 '動自如地設置在前述處 金屬箔積層於樹脂薄膜之一而將形成有蝕刻用開口圖案之 該被處理材之前述樹脂 作為被處理材,在 脂式蝕刻裝置“特彳:i、“之氣體流出口之樹 真空下3 置係:將被處理材之樹脂薄膜在 加熱平台密接於::::;:::1 之及二2方”裝置中’把 密接於祐虛裡w 之、、、σ果’使相反側之遮蔽 積層材之樹脂薄膜二:Λ =之金屬箱的積層材,在該 二復:士―側予以拉緊而實行氣體触刻者。 緊張之狀態下種樹脂薄膜予以加熱及 ^ ^^':此夠局精度且迅速地穿孔。又,無論是 =孔或否或樹脂薄膜之種類,能夠實行高精度且迅速之 口關2第’在第1方法及裝置中,從遮蔽之蝕刻用開 ’ 方法及裝置中則從金屬箔之蝕刻用開口, 第7頁 \\326\2d-\90-03\89126199.ptd 4/^446 五、發明說明(5) — i Ϊ出1反應生成氣體之發生量予以檢測,當該於出旦 時反庙時停ί氣體1虫刻。換言之’當完成被處理材:穿^ 時期…'生成氣體之發生量會激減的關係,檢測出該激減之 裝置♦則可在正確的時間點停止蝕刻操作。在第2方法及 "I,檢測出從遮蔽用開口所放出之反方生成氣μ之么 薄膜體."η皮處理用%"; ::體之組成會激變的關係,檢測出 = 確地停止氣體蝕刻操作。 ·^月則可正 ::第3目的’在第!及第2裝置中 之崎體之反應性活性氣體種非觸媒子:二 穿孔速度之降低。 轧體種之再結合所致之 佳實施开 之明!,關於實行氣體餘刻之被處理材之樹脂薄膜 树脂薄膜單體材,或對樹脂薄膜積層 之 積層材,但使用該金屬箱設有峨之開才:圖上 通ΐί:用:層=所積層之金屬落之材料並無特別限定:、 : :: ; 5 夕甘^ 基板用之树脂薄膜係以聚亞胺薄膜居 二丄:、他,液晶聚酿㈣’聚次笨基硫化物薄膜等也可使 本’X明之第1及第2方法巾’把加熱平台密接於被處理材Page 6 V. Description of the invention (4) Simultaneously with the two materials that will overlap with the resin film monomer, Yu Er = gas dry resin film of the different resin film material dry etching dream: the masking system is closely attached to the foregoing The third device to be processed is a person who can make Erguang / Straight as a feature. The inside of the processing chamber is supplied with 1% of the processing chamber, and the heating platform installed inside the processing chamber is provided at the aforementioned place. The metal foil is laminated on one of the resin films to form an opening pattern for etching. The aforementioned resin of the material to be treated is treated as a material to be treated under the tree vacuum of the gas outlet of the grease-type etching device "specially: i,": the resin film of the material to be treated is closely adhered to the heating platform: ::: ;; ::: 1 and 2 and 2 ”in the device 'closed to Yoshiri W, 、, σ 果' so that the opposite side of the resin film shielding the laminated material 2: Λ = laminated metal box In the second complex: the person-side is tightened and the gas is engraved. The resin film is heated in a tense state and ^ ^^ ': This is enough to accurately and quickly perforate. Also, whether = hole Whether or not, the type of resin film can realize high-precision and rapid mouth closing. 2) 'In the first method and device, opening from masking etching' Method and device: opening from metal foil etching, No. 7 Page \\ 326 \ 2d- \ 90-03 \ 89126199.ptd 4 / ^ 446 5. Explanation (5) — i The amount of gas generated by the reaction of i 1 is detected, and when it is time to go against the temple, stop the gas 1 worm engraving. In other words, 'When the material to be treated is completed: the period of time ...' The relationship between the occurrence and the decrease of the amount of the device can be detected at the correct time point. In the second method and "I", is it possible to detect the gas generated from the opposite side of the opening for shielding? Thin film body. &Quot; η skin treatment% " :: body composition is subject to radical change, detection = gas stop operation is stopped exactly. ^ Month can be corrected :: the third purpose is in the first! And the first 2 Reactive active gas species non-catalyst of the saki body in the device: the reduction of the second perforation speed. The best implementation of the combination of the rolling body species is open! About the resin of the material to be treated with the gas remaining Monolithic material of thin film resin film, or laminated material laminated with resin film, but using this metal box is provided with Ezhicai: on the map: use: layer = the material of the deposited metal layer is not particularly limited :, : : ; ; 5 Xigan ^ The resin film for the substrate is made of polyimide Shang film Habitat II: He, liquid polyethylene stuffed iv 'polymethine stupid sulfide film or the like can also be present' X out of the first and second method towels' close contact with the heating stage to the processed material

479446479446

之—側,把具有蝕刻用開口圖案之遮蔽密 ^薄膜,氣體姓刻該遮蔽側。將加熱平台密接於被處= 側之理由是欲使相反側之遮蔽與樹脂薄膜維持成良: 松接狀悲,以及加熱樹脂薄膜的關係。維持遮蔽盥樹 :間之良好密接狀態之結果,使蝕刻散二 =開;】匕:;高穿孔精度…加熱樹。= 、,、°果,可緹冋蝕刻速度,以便能夠迅速地穿孔。 =發明之第3方法為,將加熱平台密接於積層材之樹脂 :?侧,&體蝕刻設有蝕刻用開口圖案之金屬箱側。如上 j把加熱平台密接於積層材之樹脂薄膜側的原目,係用加 ί平S = !薄膜的關係、。以該加熱而可提高崎 安从„〆,, 隹至屬、泊有形成蝕刻用開口圖 :的關係,未使用遮蔽之狀態下可實行高精度之蝕刻。換 二m:成蝕刻用開口圖案之積層材作為被處理 材之結果,m屬箱具有如同遮蔽之功㊣ 使用遮蔽者。 U 1 π 關於加熱平台之加熱溫度,雖然按樹脂薄膜之種類而 異,然而,以攝氏150度〜35〇度之範圍為宜。以上述之加 熱溫度,可以高速蝕刻而不致於使樹脂薄膜熔融或變形。 關於氣體钱刻之停Α批法丨1,口 |早纟人:日,丨,丨、 一 了止4工制/、要疋核測出被處理用樹脂 溥膜在氣體蝕刻操作中所發生的反應生成氣體之量,即利 用邊發生量之變化而可正確地實行控制。換言之,在本發 明之第1及第3方法中,用氣體蝕刻樹脂薄膜的期間内,大 量地發生反應生成氣體,但完成穿孔時則會激減,因此在On the other side, a masking film having an opening pattern for etching is used, and the masking side is engraved with the gas surname. The reason why the heating platform is in close contact with the place = side is to keep the shielding on the opposite side and the resin film in good shape: the loose connection and the relationship between the heating resin film. The result of maintaining the sheltered washing tree: the good close contact between the two, makes the etching scattered two = open;] Dagger :; high perforation accuracy ... heating the tree. = ,,, ° Fruit, can etch speed so that you can quickly perforate. = The third method of the invention is to closely contact the heating platform to the resin side of the laminated material, and the side of the metal box provided with an opening pattern for etching. As described above, the original head of the resin film side of the laminated material closely contacting the heating platform is based on the relationship of adding S =! Film. With this heating, it is possible to improve the formation of the openings for etching from 蚀刻 ,, 隹 to the genus, and the formation of etching openings: relationship, high-precision etching can be performed without masking. Change two m: forming opening patterns for etching As a result of the laminated material as the material to be treated, m is a box that has the same function as shielding. U 1 π Although the heating temperature of the heating platform varies depending on the type of resin film, it ranges from 150 ° C to 35 ° C. The range of 0 degrees is suitable. With the heating temperature mentioned above, high-speed etching can be performed without melting or deforming the resin film. About the stop of gas-cutting A batch method 丨 1, mouth | As early as people: day, 丨, 丨, Once the system is completed, the amount of gas generated by the reaction of the resin film to be processed during the gas etching operation must be measured, that is, the control can be accurately performed by using the change in the amount of edge generation. In other words, the In the first and third methods of the present invention, during the etching of the resin film with a gas, a large amount of reaction occurs to generate a gas, but it decreases sharply when the perforation is completed.

第9頁 479446 五、發明說明(7) 该發生量激減時停止氣體蝕刻的結果,可完成高精度的穿 子L 。 在本發明之第2方法中,對被處理用之樹脂薄膜單體· 材’重疊以異種樹脂薄膜而予以氣體蝕刻,而該異種樹脂 薄膜在氣體蝕刻時所發生的氣體是異於被處理用之樹脂薄 膜單體材所發生的氣體者。如上述,重疊異種樹脂薄膜而 予以氣體蝕刻時,當完成被處理用樹脂薄膜之穿孔之後, $始穿孔下一個異種樹脂薄膜時會發生異種氣體的關係, 才双測出该反應發生氣體之組成有激變則可正確地知道被處 理用樹^薄膜之穿孔完成之時間點。又,以該檢測出的結 果,可貫行氣體蝕刻之停止控制以實行高精度之穿孔者。 *關於該異種樹脂薄膜,只要其會發生與被處理用樹脂薄 膜組成不同的反應成形氣體者並無特別限定。例如,被處 :用樹脂薄膜為聚亞胺薄膜日寺,可使用含有氯之聚氯化乙 稀叉及含有硫磺的聚乙二硫酸鹽(pEs)等。 氣體钱刻之方法並益转則π中,心 ^ > …特別限疋,但以使用等離子體蝕刻 法來貫仃為宜。至於等離子體蝕刻法時之等離 ,體係以,,活性氧氣或含有活性氫氧基為宜。例如,以 用氣體,例如可舉三=;(二其他之等離子體形成 性氣氣為例。 甲WCHF3)或石夕烧(叫)等之活 氣體I虫刻係必需要在直处3τ 1 ,.13lp;:^33〇p::I4r 力高於133〇Pa時,遮蔽盘二。真空周圍環境麗 了 .、敝興树脂薄膜之密接部分之氣體密封Page 9 479446 V. Description of the invention (7) As a result of stopping the gas etching when the amount of occurrence is drastically reduced, a high-accuracy penetrating L can be completed. In the second method of the present invention, the resin film monomers and materials to be processed are gas-etched by overlapping different resin films, and the gas generated during the gas etching of the different resin films is different from the gas used for processing. The gas generated by the resin film monomer. As described above, when a heterogeneous resin film is overlapped and gas etched, after the perforation of the resin film to be processed is completed, the relationship of the heterogeneous gas will occur when the next heterogeneous resin film is perforated, and then the composition of the reaction gas will be double measured. When there is a radical change, it is possible to know exactly when the perforation of the tree film to be processed is completed. In addition, based on the detected results, it is possible to perform stop control of gas etching to perform high-precision punching. * The heterogeneous resin film is not particularly limited as long as it generates a reaction forming gas having a composition different from that of the resin film to be processed. For example, where the resin film is a polyimide film, Nichiji, a polyethylene chloride containing chlorine and a polyethylene sulfate (pEs) containing sulfur can be used. The method of engraving gas money is π >… is particularly limited, but it is advisable to use plasma etching. As for the plasma etching in the plasma etching method, the system is preferably active oxygen or containing active hydroxyl groups. For example, using a gas, for example, three =; (two other plasma-forming gas, as an example. A WCHF3) or Shi Xiyao (called) live gas I insect engraving system must be in the direct 3τ 1 .13lp;: ^ 33〇p :: When the I4r force is higher than 1330Pa, the second plate is shielded. The environment around the vacuum is beautiful. The gas seal of the sealing part of Xingxing resin film

發明說明(8) 不足,蝕刻氣體容易進入該密八 孔精度之原因。 4妾σ["刀的關係、’成為降低穿加熱平台係其表面形狀 、 , ,. y成為二5人元曲面為宜。 °形成為將圓柱在以包含中心軸之面分 具體而 之分割體之曲面為宜。加埶 σ成為二時 之έ士里 …、十σ之表面形成為二次开也二 以不發生皺紋及間隙之狀態 ςς:: 表面。又’至少其表面用磁鐵構成之同;= 磁性之金屬材料製成遮蔽為官。φ —从θ 乂 m Ν日守,用強 去磁性的溫度)較高之人右^ 更且的疋,用居里點(失 磁鐵)構成加熱平台心面:$ t基之磁鐵(永久磁鐵或電 平△之=、! 羯構成為宜。由於該構成,可用加孰 為完全。 住^蔽而可使被處理材料之密接性程度更 五 遮蔽 所成之 刻用微 角形, 用金 蝕刻氣 鋁,不 之金屬 有觸媒 之材料 關於 係一般而 開口圖案 細孔之形 溝形等。 屬材料構 體侵飯之 銹鋼等為 材料為對 作用時, 應選擇非 非觸媒性 5蚵溽 而構成 狀並無 成遮蔽 材料則 例。然 餘刻氣 會有降 觸媒性 之材料 金屬板形成由多數之蝕刻用微細 ’但其素材不一定是要用金屬。 特別限定,例如,可形成為圓形 日ΐ 關於其金屬材料’只要不會 了而並無特別限定。例如,可舉 而,用等離子體I虫刻時,如果遮 體之反應性活性氣體種(自由基) 低穿孔速度之作用。因此,遮蔽 之材料為宜。 ~ ,可舉紹Α1及氧化矽Si〇2為例。丨Description of the invention (8) The reason why the etching gas is easy to enter the dense eight holes is insufficient. 4 妾 σ [" Relationship between knives, 'is to reduce the surface shape of the penetrating heating platform, and, y is preferably a two-five-man curved surface. ° It is desirable to form the cylinder on a curved surface that is concretely divided into surfaces including a central axis. Plus 埶 σ becomes two o'clock, and the surface of ten σ is formed two times, so that wrinkles and gaps do not occur ςς :: surface. And at least its surface is made of magnets; = magnetic metal material is used as a shield. φ —From θ 乂 m Ν Rishou, the person with a higher demagnetization temperature) the higher the right ^, and 疋, the Curie point (loss of magnet) constitutes the heating surface of the heating platform: $ t-based magnets (permanent magnets) Or the level △ = ,! 羯 is suitable. Because of this structure, 可用 can be used to complete it. The ^ masking can make the degree of tightness of the material to be treated more five. The masking is made of micro-angles and etched with gold. Gas aluminum, not metals with catalyst materials are generally grooves with open pattern pores, etc. When the rust steel, which belongs to the material structure invades rice, acts as a material, it should be non-catalytic. 5 For example, the structure does not form a shielding material. However, the metal plate is formed of a material that has a reduced catalytic activity in the aftermath. Most of it is fine for etching, but the material is not necessarily a metal. It is particularly limited, for example, It can be formed into a circular sundial. The metal material is not particularly limited as long as it is not lost. For example, when plasma worms are used, if the reactive species (radicals) of the cover are low, The effect of perforation speed. The material is appropriate. ~, And silicon oxide can be cited Shao Α1 Si〇2 Example. Shu

479446 五 發明說明(9) 而,豸等鋁及氧化矽係因機械強戶 ^ 係數大等之問,,因此該 :可日寺之熱膨脹 而非當作主材。例如,以_〇4包覆村使用 合金鋼等之金屬材’石英破璃,鹼玻璃等之::銹鋼,鎳 材等為主材,用鋁或氧化矽包覆其表面。” 2或陶瓷 用塗敷,電鑛,蒸錄,或賤射法等之方法每=去為,使 遮蔽以外之蝕刻氣體接觸&構成構件係二m。 鋁係以反應性活性氣體種之氧自由基,在立_構成為宜。 性穩定,且細緻的氧化鋁之包膜的關係。兮^:形成化學 分解氫氣所得到之氫自由基,分解矽烷Si/乳^包膜係對 基也是在預定之溫度以下*穩定的關係,^耐^鼠自由 間。但氧化矽Si〇2時,以不銹鋼為主材而包费日^長的時 由基則被侵钱的關係而不宜。 1守 對鼠自 本發明之餘刻處理係不限定於對樹脂薄膜徐〜& 時,也可適用於粗面加工等之表面加工者。、κ仃牙孔加工 玆參考圖示之實施形態,將本發明具體說明如 圖1(A)、(Β)顯示實行本發明之第1方法之妒 。 中,(Α)係顯示蝕刻處理開始前之狀離 ^罝,其 理中之狀態。 〜、係顯示蝕刻處479446 V. Description of the invention (9) In addition, aluminum and silicon oxide, such as hafnium, are due to strong mechanical strength, and the coefficient is large. Therefore, the thermal expansion of Keri Temple is not used as the main material. For example, _〇4 is used to cover metal materials such as alloy steel such as quartz glass and alkali glass: rust steel, nickel material, etc., and the surface is covered with aluminum or silicon oxide. ”2 or ceramic coating, electric ore, steaming, or low-injection methods, etc. each = to make contact with the etching gas other than the shielding & component system 2 m. Aluminum is based on reactive reactive gas Oxygen radicals are more suitable for stable and stable aluminum oxide coatings. Xi ^: Hydrogen radicals obtained by chemically decomposing hydrogen to decompose silane Si / emulsion ^ It is also a stable relationship below the predetermined temperature, which is resistant to rat freedom. However, in the case of silicon oxide Si02, stainless steel is the main material and the cost is long. The relationship between the base and the money is not appropriate. The treatment process of the pair of rats from the rest of the present invention is not limited to the case where the resin film is applied to & it can also be applied to surface finishers such as rough surface processing. The present invention will be described in detail as shown in Figs. 1 (A) and (B). The jealousy of implementing the first method of the present invention is shown. (A) shows the state before the etching process is started. ~, Department of Etching

處理室1 7係由未圖示之開閉門扉可密封 — 路19而連接真空泵18,又藉由閥2〇而有連結空$邋藉由〃管 該處理室17之内部係關閉閥20,關閉開閉;:虱導入管。 1 8排出内部空氣時,可變成真空周圍環境之狀能用真空泵 在該處理室1 7之内側上部,設有蝕刻氣體供ς 其The processing chamber 17 is opened and closed by a door (not shown), which can be sealed—the path 19 is connected to a vacuum pump 18, and is connected by a valve 20, which is closed by closing the valve 20 inside the processing chamber 17 and closed. Opening and closing ;: Lice introduction tube. When the internal air is discharged, it can become a vacuum surrounding environment. A vacuum pump can be used. An etching gas is provided at the upper part of the inner side of the processing chamber.

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T部設有加熱平台3。在蝕刻氣體供給部5内設有等離子體 2生室11,在該等離子體發生室11係以微波透過板14隔^ 成上下’在其下部側之室内有連接原料氣體導入管丨2,又 j ^側之至内有連接導波管丨3。該原料氣體導入管1 2之另 —端有連接原料氣體之供給源,(未圖示),導波管丨3之另 —端有連接微波振盪器丨β。 將處理室1 7之内部成為 境,從原料氣體導入管i 2 離子體發生室11之同時, 起被分解之等離子體形成 種(自由基)。該反應性活 装在等離子體發生室11之 方流出,供為被處理材之 反應性活性氣體種流出 安裝遮蔽4。該遮蔽4為如 用微細孔4a所成之開口圖 左右兩端藉由用拉緊螺旋 在遮蔽框架10成為輕度緊 框架1 0係裝卸自如地安裝The T section is provided with a heating platform 3. A plasma generation chamber 11 is provided in the etching gas supply unit 5, and the plasma generation chamber 11 is separated by a microwave transmission plate 14 up and down, and a raw material gas introduction pipe 2 is connected to the lower side of the chamber. There are connected waveguides 3 to j ^. The other end of the raw material gas introduction pipe 12 has a supply source connected to the raw material gas (not shown), and the other end of the waveguide 丨 3 has a microwave oscillator 丨 β connected thereto. With the inside of the processing chamber 17 as the environment, the plasma generated by the decomposition of the raw material gas into the pipe i 2 ion generating chamber 11 (free radicals). The reactive package flows out of the plasma generating chamber 11 and is used for the reactive active gas species to be processed materials flowing out and the shielding 4 is installed. The shielding 4 is an opening formed by using a fine hole 4a. The left and right ends are lightly tightened in the shielding frame 10 by using a tightening screw. The frame 10 is detachably installed.

例如1 3 3 P a程度之真空周圍環 提供等離子體形成用氣體G給等 從微波振盪器1 6傳送微波時,厲 用氣體G而發生反應性活性氣體 性氣體種係從保持一定間隔而4 下部之複數個氣體擴散板1 5向1 樹脂薄膜單體材F之蝕刻用。 之姓刻供給部5之氣體流出口有 圖2所示’形成有由多數之蝕刻 案。該遮蔽4係如圖3所示,將肩 狀彈簧等所成之拉緊器9而安裝 張或適當之鬆弛狀態。又,遮蔽 在名虫刻氣體供給部5之氣體流出 加熱平台3係以相對於餘刻 遮蔽4之狀態而設置之。該加 以該加熱器8加熱的構成。又 理材之樹脂薄膜單體材F之表 氣體供給部5之氣體流出口之 熱平台3係有埋設加熱器8, ’力口熱平台3係其壓接於被處 面3 a形成為圓弧狀之二次元For example, a vacuum surrounding ring of 1 3 3 P a provides a gas G for plasma formation, etc. When microwaves are transmitted from the microwave oscillator 16, reactive gas is generated when the gas G is used. The plurality of lower gas diffusion plates 15 to 1 are used for etching the resin thin film material F. The gas outflow port of the engraved supply unit 5 has a plurality of etching patterns as shown in Fig. 2 '. This shield 4 is shown in Fig. 3, and a tensioner 9 made of a shoulder spring or the like is installed in a tensioned or appropriately relaxed state. The heating outflow platform 3 that shields the gas flowing out of the famous insect gas supply unit 5 is provided in a state of being shielded 4 from the remaining time. This configuration is heated by the heater 8. The heat platform 3 of the gas outlet of the surface of the gas supply section 5 of the resin film monomer material F of the physical material has an embedded heater 8, and the 'Likou heat platform 3' is crimped to the surface 3a to form a circle. Arc-shaped quadratic element

479446 五、發明說明αυ " 曲面 。該加熱平台3之至少表面部分3&係以磁鐵構成之。 一加熱平台3係以下部平台軸23支持固定,用致動器(未圖 不)上下移動該平台軸23而使加熱平台3昇降之構成。又, 在加熱平台3之側部安裝有外裙部2 1,沿著固定在處理室 17側之滑動部22上下移動之構成。滑動部22之下端設有間 隙3 〇 ’處理室丨7内之空氣及反應生成氣體藉由開口 3丨從該 間隙30排出於管路19之構成。 在钱刻氣體供給部5與加熱平台3為上下相對之中間位 置’於其一方之端部(左側),設置捲繞有樹脂薄膜單體材 F(未,理之被處理材)之撒出用捲軸1以及搬送滾筒6及張 1滾筒7 ’另一方之端部(右側)設置捲取蝕刻處理後之樹 脂薄膜單材體F用之捲取用捲軸2以及搬送滾筒6與張力滾 筒7 〇 撒出用捲軸1及捲取用捲軸2係分別裝卸自如地嵌裝於驅 動軸’以便把樹脂薄膜單體材F之未處理部分設在加熱平 台3之上面。然後,進行間歇移動以便加熱平台3上之樹脂 薄片單體材F完成蝕刻處理之後,將該完成蝕刻之部分送 出捲軸2之同時,從捲軸丨拉出新的未處理部分於加埶平台 3之上面之構成。 ”° 在上述之蝕刻裝置中,被處理材則樹脂薄膜單體材F係船 以下述之方法蝕刻處理之。 首先,用真空泵1 8把處理室1 7之内部成為真空狀態。然 後,如圖1 (A )所示,把樹脂薄膜單體材F設在撒出用捲軸1 及捲取用捲軸2間後,如圖1(B)所示,加熱平台3上昇,把479446 5. Invention Description αυ " Surface. At least the surface portion 3 of the heating platform 3 is constituted by a magnet. A heating platform 3 is configured to support and fix the lower platform shaft 23, and the platform shaft 23 is moved up and down by an actuator (not shown) to raise and lower the heating platform 3. An outer skirt 21 is attached to a side portion of the heating platform 3, and is moved up and down along a sliding portion 22 fixed to the processing chamber 17 side. The lower end of the sliding portion 22 is provided with a gap 30 ′ in the processing chamber 17 and air and reaction generated gas are discharged from the gap 30 to the pipeline 19 through the opening 3 丨. At the middle position where the gas-cut gas supply unit 5 and the heating platform 3 face up and down, 'on one of its ends (left side), a resin film monomer F (not treated material) is wound. The reel 1 and the conveying roller 6 and the sheet 1 roller 7 are provided on the other end (right side) with a reel 2 for rewinding the etched resin film single body F, and the conveying roller 6 and the tension roller 7. The reeling roller 1 and the reeling roller 2 are respectively detachably embedded in the driving shaft ′ so that the untreated portion of the resin film monomer material F is provided on the heating platform 3. Then, intermittent movement is performed to heat the resin sheet monomer material F on the platform 3 to complete the etching process, and while sending the etched portion out of the reel 2, a new untreated portion is pulled out from the reel 丨 on the platform 3 The above composition. ”° In the above-mentioned etching device, the material to be processed is the resin film monomer material F, which is etched by the following method. First, the inside of the processing chamber 17 is vacuumed by a vacuum pump 18. Then, as shown in FIG. 1 As shown in (A), after the resin film monomer F is placed between the reel 1 for reeling out and the reel 2 for reeling, as shown in FIG. 1 (B), the heating platform 3 is raised, and the

了 /Up /

樹脂薄膜單體材F之上面密桩於 狀態,但如上述當加熱4;二持成輕度的”或鬆他 脂薄膜單體材F之下面,# =餐/、表面3a狁接於樹 於遮蔽4之下面。 亥树月曰薄臈單體材F之上面密接 更詳言之,則如圖2所示,加熱平A > 面3a藉由樹脂薄臈單體材F /^ 二 一人 之肩 e m :: 材壓接於遮蔽4,使樹脂薄膜單 遮蔽4發生張力卜該遮蔽4為使樹脂 4膜早體材F作用對加熱平台3之表面3a垂直方向之壓力 P。因此,樹脂薄膜單體材F呈緊張狀態,不發生敵纹 紋等,使遮蔽4,樹脂薄膜單體射及加熱平台3 戈 之間未形成空隙之密接狀態。 1 、在該密接狀態下,從原料氣體導人管⑴共給等離子體带 成用^體G,有微波振盪器丨6之微波作用於該等離子體形v 成用氣體G ’ Μ發生反應性活性氣體種。樹脂薄膜單體材f 係由加熱平台3加熱之同時,,從遮蔽4之蝕刻用微細孔“進 =之反應性活性氣體種所蝕刻。該時,遮蔽4,樹脂薄膜 $體材及加熱平台3三者相互之間呈未形成空隙之密接狀 怨的關係,蝕刻氣體不會進入該相互之間隙内。因此,只The top of the resin film monomer material F is densely piled up, but as above, when heated 4; the second is held lightly "or below the resin film F of monomer material F, # = meal /, the surface 3a is connected to the tree It is under the shadow 4. The upper surface of the thin cylindrical monolithic material F is tightly sealed in more detail. As shown in FIG. 2, the heating plane A > Surface 3a is made of resin thin cylindrical monolithic material F / ^ 2 One person's shoulder em :: material is crimped to the mask 4 to make the resin film single mask 4 tension. The mask 4 is to make the resin 4 film early body F act on the pressure P in the vertical direction of the surface 3a of the heating platform 3. Therefore, The resin film monomer material F is in a tense state, and there is no occurrence of host lines, etc., so that there is no gap between the shielding 4, the resin film monomer and the heating platform 3, and no gap is formed. 1. In this tight state, from The raw material gas guide pipe altogether supplies the plasma band forming body G, and the microwave of the microwave oscillator 6 acts on the plasma forming gas G'M to generate reactive gas species. Resin film monomer material f Reactive activity from the micropores for the etching of the mask 4 while heating by the heating platform 3 Progentiors etched. At this time, the shielding 4, the resin film, the heating material, and the heating platform 3 are in close contact with each other without forming a gap, and the etching gas does not enter the mutual gap. So only

蝕刻设在遮蔽4之蝕刻用微細孔“之開口圖案之樹脂薄膜 單體材F的部分。 、 々完成蝕刻處理之後,停止從原料氣體導入管丨2所供給之 等離子體形成用氣體G之同時,停止微波振盪器丨6之動 作。又,加熱平台3下降至圖1(A)所示之中間位置,成為The etching is provided in the portion of the resin film monomer material F of the opening pattern of the "micro holes for etching 4". After the etching process is completed, the plasma-forming gas G supplied from the source gas introduction tube 2 is stopped at the same time. , Stop the operation of the microwave oscillator 丨 6. Also, the heating platform 3 is lowered to the middle position shown in FIG. 1 (A), and becomes

479446 五、發明說明(13) 荨待下一次蚀刻的狀態。如此當加熱平a 夂士 蔽4與樹脂薄膜單體材F之界面係僅僅密:下 '日守’因遮 係容易地分離樹脂薄膜單體材F。因此'的關:分’遮蔽4 縮短蝕刻之循環。 J儿丨刀離而可 接著’撒出用捲軸1及捲取用捲軸2旋 2捲取經敍刻處理之預定長度之樹脂薄膜單體材ρ車由 用捲軸1拉出下一未處理之樹脂薄膜單湖^ 欠政出 台^…,複上述… 虽捲取用捲軸2上之全部之樹脂薄膜單 理之後,加熱平台3則下降至圖i⑴所::=二刻處 之取下位置而等待。在該狀態下’以捲繞有下—個未細方 理之新樹脂薄膜單體材F之捲軸丨更換空的捲軸,以* =地 :換J繞有蝕刻完之樹脂薄膜單體材F之捲取用捲‘捲铁 後’重複上述之過程。 ^如上述,在本發明中,在減壓之真空周圍環境内 薄膜單體材F夾在遮蔽4與加熱平台3之間成密接狀離,\曰 之蝕刻用微細孔44之部分’因此不受樹脂;專 膜早^材之種類或穿設孔係貫穿孔或否等之諸條件,可 速且高精度地蝕刻。因此,可擴大加工上之自由 提高泛用性。 又 J更 圖4係顯不實施第1方法之其他實施形態所成之裝置。 刻裝置係將圖1之蝕刻裝置中之單片式遮蔽,換為 連縯帶狀式之遮蔽4者。該連續帶狀式之遮蔽4係夾在加熱 平台3與蝕刻氣體供給部5之狀態下,間歇地從左側之撒出479446 V. Description of the invention (13) The state of waiting for the next etching. In this way, the interface between the mask 4 and the resin film monomer F is only dense: the next "Nisshou" can easily separate the resin film monomer F because of the shielding system. Therefore 'off: minute' masking 4 shortens the cycle of etching. Jer 丨 The knife can be separated, and then the "reel 1 for reeling and the reel 2 for reeling can be rotated 2 times to roll up the resin film monomer material with a predetermined length after the engraving process. The next untreated resin is pulled out by the reel 1" The film single lake ^ owe the government to introduce ^ ..., repeat the above ... Although all the resin films on the reel 2 are rolled, the heating platform 3 is lowered to the position shown in Figure i: == 2 minutes and waited . In this state, 'the reel with the next unrefined new resin film monomer material F is replaced with an empty reel, with * = ground: J is wound around the resin film monomer material F which has been etched Repeat the above process with the coil after coiling iron. ^ As mentioned above, in the present invention, the thin film monomer F is sandwiched between the shielding 4 and the heating platform 3 in a vacuum-reduced vacuum surrounding environment, and the portion of the fine holes 44 for etching is therefore not It can be etched quickly and accurately by the conditions of the type of the resin, the special film, the through hole, or the through hole. Therefore, the freedom of processing can be expanded and the versatility can be improved. Further J Fig. 4 shows a device made in another embodiment that does not implement the first method. The engraving device is a masking type in the etching device shown in FIG. The continuous strip-shaped masking 4 is intermittently ejected from the left side while being sandwiched between the heating platform 3 and the etching gas supply unit 5.

\\326\2d-\90-03\89126199.ptd 第16頁 479446 五、發明說明(14) 用捲軸2 6移送至右側之捲取用捲軸2 7之構成。 曰加熱平台3係固定在一定高度,不像圖丨之蝕刻裝置那樣 昇降自如。但是左右之跳動滾筒28,28為上下移動自如7, 將連續帶狀之遮蔽4及樹脂薄膜單體材壓接於加熱平台3之 —次το曲面之表面3a成彎曲狀,使遮蔽4,樹脂薄膜單體 材F ’加熱平台表面3a之三者互相予以密接之構成。立 接著,如同圖1之裝置,向遮蔽4之表面側流通蝕刻氣體 如箭號所示,對樹脂薄膜單體材F之表面可施行沿著遮蔽: 之颠刻用微細孔4 a之開口圖案之|虫刻。 “、 固定成一定高度之加熱平台3係藉由外裙部29而安裝在 處:室17之内部。在該外裙部29之下端形成有間隙3〇,處 理室内部之空氣及氣體為經開口 3〗而從該間隙3 〇 路19之構成。 f出於吕 關係密接手段,代替上述之跳動滾筒28之設置,如同圖 1之裝置,使加熱平台3昇降也可以。 圖5(A)、>(Β)係實施第1方法之裝置之再其他實施形態, 其中,(Α)係顯示蝕刻處理開始前之狀態,(Β)係顯示蝕刻 處理中之狀態。 該蝕刻裝置為,未將加熱平台3之表面3a構成為二次元 曲面,而形成為平面狀。加熱平台3係固定在一定高度, 將樹脂薄膜單體材F藉由張力滾筒7,7而密接於其表面仏 =構f。將遮蔽框架丨〇上下移動之而把遮蔽4密接於該加 熱=台3 ^表面3a,使遮蔽4,樹脂薄膜單體材材F與加熱 平台3之三者互相成為密接狀態。保持該密接狀態之同\\ 326 \ 2d- \ 90-03 \ 89126199.ptd page 16 479446 V. Description of the invention (14) The structure of the reel 2 7 used for reeling to the right with the reel 26. The heating platform 3 is fixed at a certain height, unlike the etching device in Figure 丨, which can be raised and lowered freely. However, the left and right beating rollers 28 and 28 move up and down freely. The continuous strip-shaped mask 4 and the resin film monomer are crimped to the heating platform 3—the surface 3a of the το curved surface. The mask 4 is made of resin. The thin film single material F 'is a structure in which three of the heating platform surfaces 3a are in close contact with each other. Next, as in the device of FIG. 1, an etching gas is flowed to the surface side of the mask 4 as shown by an arrow. The surface of the resin film monomer F can be masked along the opening pattern of the fine holes 4 a along the mask: Of | worm carving. "The heating platform 3 fixed to a certain height is installed at the place by the outer skirt 29: inside the chamber 17. A gap 30 is formed at the lower end of the outer skirt 29. The air and gas inside the processing chamber are The opening 3 is formed from the gap 30 and the path 19. The f is closely connected by means of Lv, instead of the above-mentioned installation of the beating roller 28, as in the device of FIG. 1, the heating platform 3 can also be raised and lowered. Figure 5 (A) (B) is still another embodiment of the apparatus for implementing the first method, wherein (A) shows a state before the etching process is started, and (B) shows a state during the etching process. The etching apparatus is not The surface 3a of the heating platform 3 is formed into a two-dimensional curved surface and formed into a flat shape. The heating platform 3 is fixed at a certain height, and the resin film monomer material F is closely adhered to the surface by the tension rollers 7, 7 f. Move the shielding frame up and down, and close the shielding 4 to the heating platform 3 ^ surface 3a, so that the shielding 4, the resin film monomer material F and the heating platform 3 three are in close contact with each other. Keep this Close contact

第17頁 \\326\2d-\90-03\89126199.ptd 479446 五、發明說明(15) ^夺,如同則及圖4之裝置,對遮蔽4之表面側供給银刻氣 體,沿著蝕刻用微細孔4a之開口圖案來蝕刻樹脂薄膜單體 材F者。 上述之圖4及圖5之實施形態時也是在不受樹脂薄膜之種 類及穿設孔是否貫穿孔或否等之諸條件之影響夠 且高精度地蝕刻。 上上述主之各/施形態中’均為就被處理材為樹脂薄膜單 之ί月形來例示,但也可以適用於對樹脂薄 屬、冶之積層材之姓刻處理。該積層枋時,將加轨平台资接 寺,把遮蔽密接於樹脂薄膜侧,從該遮蔽 處理…上述之各實施形態中,被處理材之 m::捲ί至捲軸之捲軸捲取方式之情形為例來顯 ’、而並非限定於此,單片式也可以。 系顯示實施第丨方法之裴置之再其他實施形熊。 止態Γ對圖1所示之崎置,再設有钮刻停 源41及分光用之二2方:7二之外側設置紅外線光 咖7’再者,控制裝置 係轴44為支點而左右迴轉,相應該迴轉L, :;=4?!光之紅外線中分光特定波長之單 單【先:=53向處理室17内投光之。所投光之 、 、形成在遮蔽4之上面區域之發光層46,通 第18頁 \\326\2d-\90-03\89l26199.ptd 五、發明說明(16) 過相反之窗口 45b而由受光器43受光之。 光;4 i ^扣(C )係顯不因氣體姓刻所發生之發光層4 6。發 材2料护4以蝕刻氣體之反應性活性氣體種R蝕刻被處理 時所發生之反應生成氣體之雲狀層而 係'=單^ AX i:] ^ m 、荨。攸等離子體發生室1 1所流出之 出上二/之反應性活性氣體種R為氧氣自由基時,反應生 此,在進行姓刻處理中時:合氣體所成。因 在遮蔽4之上面區域中自m反λ生成氣齡為,由於 *屉4Α。兮恭止二出有波長之光之數"1"1厚度之發 先層46该發先層46之顏色係 光區域之紫外光區域之朵,力可、目上Α风向吳係可視 桃紫色的光。 先在可視先中通常是發出紫色或 發光層46之混合氣體為,分別只吸收特 光,其濃度(發生量)愈高吸收命多 m f長又 A? ^ Cl ^ M时A 收苽夕之先置。因此,把稜鏡 42予以左右㈣’將波長^同的分光 時,則由受光器43所受弁之詈而可从、B,,町叙无層46 路吐旦$為可檢測出反應生成氣體之 發生里。虽蝕刻處理成為圖7(c)所示之 於圖7(A)之初期狀態及圖7(B)之中』^心、夺,相較 體之發生量有激減的關係,用受光器=反應生成氣 該反應生成氣體發生量之激= ===測出 π又尤為4 3所檢測出之訊 第19頁 89126199.ptd 479446 五、發明說明(17) 號係輸入於控制裝置47,從該控制裝 — 管12之開閉閥之驅動部及微波振盪器丨,原料氣體導入 而停止蝕刻。 驅動部輪出訊號 如上述,蝕刻停止裝置40係用紅外線八 出反應生成氣體之發生量之激減 :刀析法來檢測 易且正確地控制穿孔之停止。又,二=關係,可容 反應生成氣體之發生量之激變檢測而停止本所謂根據 並非限定於檢測出激減之同時停止蝕刻,^ A係意味著 出後經過一定時間之時間點停止蝕刻 ^ 3在激減檢 通常是意味著數十秒間。 明一定時間, 在前述之圖1,圖4,圖5之各裝置中,因纟設有 亡手段40的關係,無法自動檢測出反應生成氣體 里之激減。然而,在處理室17之側壁設窺視用窗口(未^ 示),則用肉眼目視而能夠確認反應生成氣體Gx之發生量 之激減的關係,用目視確認來停止姓刻則可。 圖8係例示實施本發明之第2方法之裝置。 该貫施形態為,在圖1之裝置,對被處理材之樹脂薄膜 單體材F重疊能夠發生異於該樹脂薄膜單體材ρ之氣體之異 種樹脂薄膜F X而予以氣體姓刻。因此,在有設置捲繞未處 理之樹脂薄膜單體材F之撒出用捲軸1之一側,設置有捲繞1 異種樹脂薄膜Fx之撒出用捲軸47,在有設置捲取處理後樹 脂薄膜單體材F之捲取用捲軸2之一側,設置捲取處理後之 異種樹脂薄膜Fx之捲取用捲軸48之構成。 撒出用捲軸47與捲取用捲軸48係分別與撒出用捲軸1及Page 17 \\ 326 \ 2d- \ 90-03 \ 89126199.ptd 479446 V. Description of the invention (15) ^, as in the case and the device of Fig. 4, supply the silver engraved gas to the surface side of the shield 4 and follow the etching The resin thin film material F is etched by the opening pattern of the fine holes 4a. In the embodiments of Fig. 4 and Fig. 5 described above, the etching is performed with high accuracy without being affected by various conditions such as the type of the resin film and whether the penetrating hole is a through hole or not. In each of the above-mentioned main / applied forms, ′ is exemplified as a moon shape in which the material to be treated is a resin film, but it can also be applied to the engraving treatment of resin thin metal and laminated materials. When the stack is stacked, the railing platform is connected to the temple, and the shielding is closely attached to the resin film side. From the shielding processing ... In each of the above embodiments, the material to be processed is from m :: roll to the reel winding method. The situation is shown as an example, but is not limited to this, and a single piece may be used. It shows that Pei Zhizhi and other other implementations of the implementation of the method 丨 bear. The stop state Γ is set to the saki as shown in FIG. 1, and is further provided with a button-cut stop source 41 and a two-way beam splitter: 7 2 is provided with an infrared light coffee 7 ′ outside, and the control device shaft 44 is a fulcrum. Rotation, corresponding to the rotation L,:; = 4 ?! A single wavelength of a specific wavelength in the infrared of the light [first: = 53 throws light into the processing chamber 17. The light-emitting layer 46 formed on the upper area of the shield 4 is projected on page 18 \\ 326 \ 2d- \ 90-03 \ 89l26199.ptd V. Description of the invention (16) Pass the opposite window 45b and The light receiver 43 receives light. Light; 4 i ^ 扣 (C) is a light-emitting layer 4 6 that does not occur due to the inscription of gas. The hair material 2 and the material 4 are etched with a reactive reactive gas species R, and the reaction that occurs when the etching is processed generates a cloud-like layer of gas. The system is equal to == ^ AX i:] ^ m, net. When the reactive active gas species R out of the plasma generating chamber 11 is the oxygen radical, the reaction takes place, and the process of engraving: the combination of gases. Because in the upper region of the mask 4, the age from m inverse λ is generated, because * drawer 4A. Xi Gongzhi has two wavelengths of light " 1 " 1 thickness of the hair layer 46, the color of the hair layer 46 is a light in the ultraviolet region of the light region, the force can be seen, the wind direction is visible peach Purple light. The first visible light is usually the mixed gas that emits purple or light-emitting layer 46. It only absorbs special light. The higher the concentration (occurrence), the longer the absorption life, mf, and A? ^ Cl ^ M. First. Therefore, when 稜鏡 42 is left and right, when the wavelengths are split at the same wavelength, it can be detected by the receiver 43, and can be detected from the reaction path of the 46th, B ,, and 66th floor. The occurrence of gas. Although the etching process shows the initial state shown in FIG. 7 (c) as shown in FIG. 7 (A) and FIG. 7 (B), there is a relationship between the amount of occurrence and the decrease. Compared with the photoreceptor = Reaction generated gas The amount of reaction generated by the reaction gas = === π and especially 4 were detected. Page 19 89126199.ptd 479446 V. Description of the invention (17) is input to the control device 47, from The control device—the driving part of the opening and closing valve of the tube 12 and the microwave oscillator 丨, introduces the source gas and stops the etching. Signal from the drive unit wheel As described above, the etching stop device 40 uses an infrared octave reaction to generate a drastic reduction in the amount of gas generated: knife analysis to detect the stop of perforation easily and accurately. In addition, two = relationships, which can stop the sudden detection of the amount of gas generated by the reaction and stop the so-called basis. It is not limited to stop the etching while detecting the droop, ^ A means stop the etching at a certain time after the time out ^ 3 The reduction test usually means tens of seconds. At a certain time, in each of the aforementioned devices of FIG. 1, FIG. 4, and FIG. 5, due to the relationship between the dead means 40, the sharp decrease in the reaction generated gas cannot be detected automatically. However, if a peeping window (not shown) is provided on the side wall of the processing chamber 17, the relationship between the decrease in the amount of the reaction gas Gx generated can be confirmed with the naked eye, and the last name can be stopped by visual confirmation. Fig. 8 illustrates an apparatus for carrying out the second method of the present invention. In the embodiment, in the apparatus shown in FIG. 1, a resin film F X of a material to be processed is superimposed, and a different resin film F X capable of generating a gas different from the resin film monomer ρ can be engraved with a gas name. Therefore, one side of the reel 1 for discharging the unprocessed resin film monomer F is provided with a reel 47 for winding the dissimilar resin film Fx, and the resin is provided after the winding process. On one side of the reel 2 for winding the film single material F, a reel 48 for winding the dissimilar resin film Fx after the winding process is provided. The reel 47 and the reel 48 are respectively separated from the reel 1 and

89126199.ptd 第20頁89126199.ptd Page 20

捲取用捲軸2同步而間歇地驅動, 於被處理材之樹脂薄膜單體材F之 平台3上,且搬送之構成。 把異種樹脂薄膜Fx重疊 下側之狀悲裝設在加熱 该裝置之,體银刻也是在真空周園環境中實行。換言 互相参垃夕业地+ Π 材與異種樹脂薄膜Fx係以 微細孔4a氣體㈣遮蔽4之—側:、h3之間’错由银刻用 樹脂薄膜之種類及穿設孔或否側耸之由f欠上述之處理,不受 速且高精度地實行心戍否…條件之影卜能夠迅 圖9係例示實施本發明之第2 態。 方法用裝置之其他實施形The winding reel 2 is driven synchronously and intermittently, and is configured to be conveyed on the platform 3 of the resin film single material F of the material to be processed. The bottom of the dissimilar resin film Fx is installed in the heating device, and the body silver engraving is also performed in a vacuum environment. In other words, each other can participate in the business field + Π material and the heterogeneous resin film Fx are shielded by the micro holes 4a gas ㈣ side-between: h3 'misaligned by the type of resin film for silver engraving and the hole or not Because of the lack of the above-mentioned processing, it is possible to execute the palpitations without speed and accuracy ... The shadow of the condition can be illustrated in FIG. 9 as an example to implement the second state of the present invention. Other embodiments of the method device

該實施形態係對圖8之裝置 手段40者。在該圖9之裝置中 被處理材之樹脂薄膜F的關係 1〇(Α)、(B)、(C)之方法為之 始蝕刻之初期狀態,(β)係顯 始蝕刻異種樹脂薄膜F χ之狀㈣ ’設有與圖6同樣的蝕刻停止 ’把異種樹脂薄膜Fx重疊於 ’其氣體蝕刻處理係按照圖 。換言之,圖10(A)係顯示開 示其末期狀態,(C)係顯示開 異種樹脂缚膜F X儀伸用台匕玄a文义止田 摇留μ , i 夠發生異於被處理材之樹脂 旲w t 成之反應生成氣體之樹脂薄膜。例如,如This embodiment is for the device means 40 of FIG. In the apparatus of FIG. 9, the relationship between the resin film F of the material to be processed 10 (A), (B), and (C) is the initial state of the initial etching, and (β) indicates that the different resin film F is initially etched. The state of χ is “provided with the same etching stopper as in FIG. 6”, and a heterogeneous resin film Fx is superimposed on the gas etching process according to the drawing. In other words, Fig. 10 (A) shows the final state, and (C) shows the opening of a heterogeneous resin binding film FX instrument for extension. A Wenyi Zhitian Shake μ, i is enough to produce a resin different from the material being processed. A thin film of resin that reacts to form a gas. For example, like

J被=材之樹脂薄膜單體材F為聚J is the resin film monomer material F is poly

時’則使用含有氯之聚氯化亞乙烯基, I ==剛作為異種樹脂薄膜Fx。在银刻處理之竭 初期狀態及圖1〇(B)之末期狀態中,因蝕 樹脂溥膜单體F的關係,蚀刻停止手段4G之受光器⑷檢浪In the case of '', a polyvinylidene chloride containing chlorine is used, and I == just as the heterogeneous resin film Fx. In the initial state of exhaustion of the silver engraving process and the final state of FIG. 10 (B), due to the relationship between the etched resin and the film unit F, the receiver inspection wave of the 4G etching stop means

479446 五、發明說明(19) 出反應生成氣體G】,G2之特定波長;^,又2之出現。然而, 到開始圖1 0 (C)之異種樹脂薄膜以之蝕刻之時間點時,如 虛線所示,反應生成氣體(;3之特定波長八急激地出現, 所出現之特定波長;L!,入2急減之。 、479446 V. Description of the invention (19) The reaction generates a gas G], a specific wavelength of G2; ^, and 2 appears again. However, at the time point when the heterogeneous resin film of FIG. 10 (C) was etched, as shown by the dotted line, the specific wavelength of the reaction gas (; 3 appeared eight, the specific wavelength appeared; L !, Enter 2 sharply reduced.

未重疊異種樹脂薄膜FX,單獨蝕刻樹脂薄膜單體材F 時,薄膜剖面係變化為如圖7(Α),(β),(c)所示。因此, 在圖7(A)之初期狀態及(B)之中期狀態中,如圖12之圖夺 中用實線所示,出現從樹脂薄膜單體材F發生之反 : ,,之特定波長\,Λ2,接[在7圖⑹之末期成狀 斤示,只有前述特定波長λι,又”急減, 而波長λ 3不會出現。 忒特疋波長;13之出現係根據異種樹脂薄膜&, 樹脂薄膜單體材F發生之反應生成氣 、 x ” 應生成氣體G3的關係,因此,去蝕丨疒1 2不同、、且成之反 ,n 3 m u凡 田蚀刻停此手段4 f)夕為止- 43檢測出上述之情形時,藉由控又先為 導入管之開閉間,停止微波”料氣體 操作。根據檢測出反應生成氣體Gx之組而如止蝕刻 刻操作的時間點為,與檢測出激變π J之激變而停止蝕 間後之時間點均可…胃一定時間:過, 在未設有姓刻停止手段4 〇之圖8 9 移而§。 檢測出反應生成氣體Gx之組成之激變,秋、置是無法自動 長λ3出現時,發光層4 6之顏色會變 /田,心之特定波 停止蝕刻。 ’用肉眼看其而可 上述之圖8及圖9之裝置為,代替 八儿萌面型之加熱平 Ϊ 第22頁 89126199.ptdWhen the heterogeneous resin film FX is not overlapped, and when the resin film monomer F is etched separately, the film cross-section system changes as shown in FIGS. 7 (A), (β), and (c). Therefore, in the initial state of FIG. 7 (A) and the intermediate state of (B), as shown by the solid line in FIG. 12, the inverse occurs from the resin film monomer F:,, a specific wavelength \, Λ2, followed by [shown at the end of Fig. 7 只有, only the aforementioned specific wavelength λι, 'and "decreased sharply," and the wavelength λ3 will not appear. 忒 Special wavelength; 13 appears based on heterogeneous resin film & The reaction of the resin film monomer material F to generate gas, x ”should generate the relationship of gas G3, therefore, etch 蚀 2 12 is different, and vice versa, n 3 mu Fantian etching stops this means 4 f) Evening-43 When the above situation is detected, by controlling the opening and closing of the introduction tube first, stop the microwave material gas operation. According to the detection of the reaction gas Gx group, the time point for stopping the etching operation is, Any time after detecting the shock of the sudden change π J and stopping the eclipse… Stomach for a certain period of time: after, the figure 8 9 of the stop means 4 〇 is not set to §. The reaction generated gas Gx is detected. The composition of the light-emitting layer 4 6 when the autumn and autumn cannot automatically grow λ3. Become / Tian, heart stopping etching a specific wavelength. 'See with the naked eye and which may be of the above-described apparatus of FIG. 8 and FIG. 9 is the place of the heating surface type flat eight children of germination Ϊ page 22 89126199.ptd

:、、、平台8也可以。關於 連績帶狀型之遮蔽4代 使用單片式以代替捲条 用之遮蔽4係與被處理 媒作用之影響。換言 鉻Cr等具有觸媒作用之 性/舌性氣體種(氧自由 基等)再結合之結果, 關係有降低穿孔速度之 氣體種非觸媒性之紹A ] ,可防止穿孔速度之降: ,,, Platform 8 is also available. About the 4th generation of continuous belt-type masking The use of a single chip instead of a coil is used to mask the effects of the 4 series and the processed media. In other words, chromium Cr and other catalysts / tongue gas species (oxygen free radicals, etc.) are combined, which has a relationship with reducing the perforation speed of the gas species, which is non-catalyst A], which can prevent the reduction of perforation speed.

Γ片,:之置:,圖5所示之平面型之加 替也可以? :4也是以如圖4所示之 至二捲㈡:::送方式也是 ΐ實行氣體麵料,;:明所使 Ξ !=態:因',最i易受: 入匾外 ^蔽為以如鎳Ni,鐵Fe, 二屬”構成日夺,蝕刻氣體之反應 “ 2由基’氟自由基,氯自由 二% ί舌性氣體種之濃度激減的 存在。然❿’以對反應性活性 或乳化石夕Si〇2f之材料構成之結果 低0 古=而’鋁等係不僅是在常溫,例如在攝氏2〇〇度以上之 咼溫了其強,會降低且熱膨脹大的關係,直接做為構造枓 使用疋有問題。因此,主材是使用強度及熱膨脹性較優之 金屬材’玻璃材或陶瓷材等,而使用鋁A丨及氧化矽§丨 為對該主材表面之包覆材為宜。 又’關於遮蔽以外之加熱平台等之裝置構成構件,以|呂 構成比使用含有鎳Ni,鐵Fe,鉻Cr等之不銹鋼sus等為 宜。因為紹係由於氧自由基而在其表面會形成其化學性穩 疋’且細敏的氧化鋁A 12 03之被膜的關係。該氧化鋁之被 膜係在預定之溫度以下時,對氫自由基或氟自由基是穩定 的,因此具有長期的耐性。Γ piece :: Placement :, is it possible to replace the plane type shown in Figure 5? : 4 is also shown in the second to the second volume as shown in Figure 4 ::: The delivery method is also to implement the gas fabric; : Make use of Ξ! = State: Because of ', the most susceptible: to enter the plaque Such as nickel Ni, iron Fe, two genus "constitutes the day, the reaction of the etching gas" 2 by the existence of radicals, fluorine free radicals, chlorine free two% of the concentration of tongue gas species. However, the result of the composition of materials with reactive activity or emulsified SiO2f is low. 0 = = 'Aluminum and other systems are not only at normal temperature, such as at temperatures above 200 degrees Celsius. The relationship between reduction and large thermal expansion is directly problematic as the structure is used. Therefore, the main material is a metal material 'glass material or ceramic material which is superior in strength and thermal expansion, and aluminum A 丨 and silicon oxide § 丨 are preferably used as coating materials on the surface of the main material. Also, regarding the components constituting the device such as a heating platform other than the shield, it is preferable to use a stainless steel sus containing nickel Ni, iron Fe, chromium Cr, etc. at a ratio of 吕. This is because the Shao system forms a chemically stable and fine-grained alumina A 12 03 film on its surface due to oxygen radicals. When the coating of the alumina is below a predetermined temperature, it is stable to hydrogen radicals or fluorine radicals, and therefore has long-term resistance.

玉、發明說明(21) 圖1 3係顯示實施本發明之第、 該實施形態中’使用對樹 法之裝置之〆例。 箔係形成有蝕刻用開口圖案之膦積層金屬箔,且該金屬 將形成有蝕刻用開口圖案^麗f材Fa者。該積層材Fa係 部5,使相反側之樹脂薄骐側户泊側相對於蝕刻氣體供給 下,在真空周圍環境内氣雄力接於加熱平台8。以該狀態 成。 -姓刻積層材Fa之金屬箔側之構 徵。如上述屬功能,而未設有遮蔽為其特 圖案,藉由該姓=而::金屬箱具有蚀刻用開口 同前述之各種形離之缺¥茱而蝕刻樹脂薄膜的關係,如 為貫穿孔或否等:諸條件之:=樹”種類f穿設孔 餘刻者。 、 〜θ ’可貫行迅速且高精度之 的材料:如:::厲ί屬箱係非常容易由氧自由基所氧化 且未具有觸:;=:ΐ:Γ亍不會被氧自由基浸银, 圖14係題-! 或金蒸鍍等為宜。 態。〜頁不貫施本發明第3方法之裝置之其他實施形 者該系對圖13之裝置設有議止裝置4〇之構造 量之激減^ <圖6之裝置’⑯測出反應生成氣體之發生 止控制者。化之結果,可容易且正確地實行蝕刻操作之停 圖13之, i 圖1之梦署置中,未設有蝕刻停止裝置40,但如同前述之 、 ’用目視來檢測反應生成氣體Gx之發生量之激Jade, description of the invention (21) Fig. 13 shows an example of a device using the pair-tree method in the first embodiment of the present invention. The foil is a phosphine-laminated metal foil having an opening pattern for etching, and the metal is formed with an opening pattern for etching. This laminated material Fa system portion 5 is connected to the heating platform 8 in a vacuum surrounding environment by supplying the resin thin shovel side and the moor side on the opposite side with respect to the etching gas. Completed in this state. -Features of the metal foil side of the engraved laminated material Fa. As mentioned above, it is a function without a special pattern for shielding. By the name = and :: the metal box has the relationship between the opening for etching and the above-mentioned various defects, such as the resin film, such as a through hole Or not, etc .: of the conditions: = tree "type f penetrating hole for the moment., ~ Θ 'can run quickly and with high precision materials: such as :: Li is a box system that is very easy to get oxygen free radicals The oxidized without contact:; =: ΐ: Γ 亍 will not be immersed in silver by oxygen radicals, Figure 14 is a question-! Or gold evaporation, etc. is suitable. ~ Page inconsistent application of the third method of the present invention Other embodiments of the device are those in which the structure of the device shown in FIG. 13 is provided with a stop device 40 and the amount of structure is reduced ^ < The device of FIG. 6 detects the occurrence of the reaction generated gas and controls the device. The stop of the etching operation can be easily and accurately performed. Fig. 13 and Fig. 1 show that the dream stop device is not provided with the etch stop device 40. However, as described above, "the visual inspection is used to detect the occurrence of the reaction gas Gx.

479446 五、發明說明(22) 減之結果可停止蝕刻。 如同前述之裝置,圖13及圖14之裝置也是代替二次元曲 面型之加熱平台8,可使用如圖5所示之平面型之加熱平台 8 ’又’把被處理材之移送方式改成單片式以取代捲軸至 捲軸之捲取方式也可。 又’在圖13及圖14之裝置中 用捲軸47及捲取用捲軸48,對 種樹脂薄膜F X而姓刻也可以。 膜Fx所發生之反應生成氣體以 -口0 ,如圖8之裝置,設置撒出 被處理材之積層材F a重疊異 該時,檢測出從異種樹脂薄 之組成來停止氣體蝕刻則 如上述,根據本發 ?丨盔|空:?丨★ π雄 . 日碍膜之種類或所欲|虫刻 之孔為貝穿孔或否等之諸條件之影響 j 度之蝕刻,因此可實行泛用性高之蝕刻者速且…精 又,在蝕刻之際,檢測出反應生& 發生量激變至預定值以上時停 ,體之毛生I,當該 且正確地控制穿孔之停止。又,則述氣體蝕刻時,可容易 氣體種,由非觸媒性之材料出對蝕刻氣體之反應性活性 時,可防止蝕刻氣體之反應性遮^等之裝置構成構件 穿孔速度之降低者。 ''性氣體種之再結合所致之 (實施例1 ) 使用圖1之蝕刻裝置,以下 基,對其厚度50以m之聚亞胺薄^之,理條件,用氧自由 限公司製品"優比列克斯")實行$單體材(宇部興產股份有 處理後之聚亞胺薄膜單體 離子體蝕刻。 __ 為,對於遮蔽之蝕刻用開口 479446 五、發明說明(23) 之直徑為5 0 // m,可得到其上面之平徑直徑為6 0 // m,其徑 向下面側縮小之平均錐形角度為1 7度之多數錐形貫穿孔。 又,在薄膜上面之直徑之不均勻係在目標直徑之加減1 0 % 以下之同時,孔壁傾斜角度也是在目標之1 5度〜4 5度之範 圍内,適合於實用者。又,所穿孔之全部貫穿孔完全看不 到殘渣物。 [處理條件] 金屬遮蔽:厚度50//m之不銹鋼SUS304板 蝕刻用開口直徑 5 0 // m 安裝張力 1.5kg φ 加熱平台:表面之曲率半徑 800 mm 加熱溫度 攝氏2 0 0度 處理時間(孔貫穿為止之時間)1 0分鐘 微波輸出:1. 8 k w 等離子體形成用氣體:供給氧1 0 0 0ml /分鐘及水蒸氣 100cc/分鐘 真空周圍環境之真空度:133Pa (實施例2〜6 ) 除了使用蝕刻用開口之直徑分別為7 5 // m,1 0 0 // m,1 5 0 /zm,200 //m,250 //m之5種金屬遮蔽以外,其餘為與實施❿ 例1相同之條件,對相同的聚亞胺薄膜單體材實行蝕刻(實 施例2〜6 )。 實施例2〜6中之任何一種之聚亞胺薄膜上面之直徑的不 均勻情形均在目標直徑之加減1 〇%以下之同時,孔壁傾斜479446 V. Description of the invention (22) The result of the subtraction can stop etching. As with the aforementioned device, the devices of FIGS. 13 and 14 are also used instead of the two-dimensional curved surface heating platform 8. The planar heating platform 8 shown in FIG. 5 can be used to change the processing method of the material to be processed into a single unit. The sheet type can also be used instead of the reel-to-reel winding method. Further, in the apparatus of Figs. 13 and 14, a reel 47 and a reel 48 for winding may be used, and the resin film F X may be engraved. The gas generated by the reaction of the membrane Fx is -port 0, as shown in the device of Fig. 8. When the laminated material F a that scatters the material to be treated overlaps, it is detected that the composition of the thin resin is different to stop the gas etching, as described above. According to this issue? 丨 helmet | empty :? 丨 ★ πmale. The type or desired of the solar barrier film | The worm-etched hole is shell perforation or not, etc., which affects the degree of etching, so it can be used universally. The high-etching person is quick and precise. During the etching, the reaction is detected to stop when the amount of radicals exceeds the predetermined value, and the body hair is I, and the stop of the perforation should be controlled properly and correctly. In the case of gas etching, the type of gas can be easily reduced, and when the reactive activity of the non-catalytic material to the etching gas is prevented, the reduction in the perforation speed of the device constituting the device such as the reactive shielding of the etching gas can be prevented. '' Recombination of sex gas species (Example 1) Using the etching device of FIG. 1, the following is based on a polyimide with a thickness of 50 m. The physical conditions are to use oxygen free limited company products & quot Ubilex ") Implementation of $ monomer material (Ube Kosan has processed polyimide film monomer ion etching after treatment. __ is the opening for masking etching 479446 V. Description of the invention (23) The diameter is 5 0 // m, and the diameter of the upper diameter is 6 0 // m, and most of the tapered through-holes with an average taper angle reduced by 17 degrees on the lower side in the radial direction are obtained. The unevenness of the above diameter is less than 10% of the target diameter plus or minus. At the same time, the inclination angle of the hole wall is also within the range of 15 to 45 degrees of the target, which is suitable for practical people. Moreover, all the perforations penetrate No residue can be seen at the holes. [Treatment conditions] Metal shielding: 50 // m thick stainless steel SUS304 plate etching opening diameter 5 0 // m Installation tension 1.5kg φ Heating platform: curvature radius of surface 800 mm Heating temperature Celsius 2 0 0 degree processing time (time until the hole penetrates) 10 minutes Microwave output: 1. 8 kw Gas for plasma formation: Supply 100 ml / min of oxygen and 100cc / min of water vapor. Vacuum degree of surrounding environment: 133Pa (Examples 2 to 6) Except for the diameter of the opening for etching It is 7 5 // m, 1 0 0 // m, 1 5 0 / zm, 200 // m, 250 // m except for the five kinds of metal shielding, the rest are the same conditions as in the implementation of Example 1 for the same The polyimide film monomer material is etched (Examples 2 to 6). The unevenness of the diameter on the polyimide film of any of Examples 2 to 6 is at the same time when the target diameter is increased or decreased by 10% or less , The wall of the hole is inclined

\\326\2d-\90-03\89126199.ptd 第26頁 479446\\ 326 \ 2d- \ 90-03 \ 89126199.ptd page 26 479446

五、發明說明(24) 角度也是在目標之15度〜45度之範圍内,適合實用者 (實施例7〜1 7 ) 在圖1之蝕刻裝置中,分別用下述之材料形成各構成構 件,以下述之處理條件,用氧自由基,對其厚度5〇从❿之 聚亞胺薄膜單體材(宇部興產股份有限公司製品”優比 斯實行等離子體蝕刻至形成貫穿孔。 在該蝕刻處理中,將遮蔽與遮蔽框架與加熱平台與氣體 擴散板之組合,從其使用材質之面,如圖丨5所記^ 了枱曰召 u)〜u)種變化(實施例7〜17),調查該蝕刻 斗、、 依賴性。其測定結果為如圖15所示。 X之材枓V. Description of the invention (24) The angle is also within the range of 15 degrees to 45 degrees of the target, which is suitable for practical users (Examples 7 to 17). In the etching device of FIG. 1, each constituent member is formed by the following materials, respectively. Using the following processing conditions, oxygen radicals were used to plasma-etch the polyimide film monomer material (product of Ube Industries Co., Ltd.) Ubis from a thickness of 50 to form through-holes. Here In the etching process, the combination of the shielding and shielding frame, the heating platform, and the gas diffusion plate is changed from the side of the material used, as shown in Figure 5 (^ 台 台 召 召 u) ~ u) various changes (Examples 7-17) ) To investigate the dependence of the etching bucket. The measurement results are shown in Figure 15. X 之 材 X

又,上述(a )〜(k )係顯示以丨龍之間距 二之蚀刻用開…以下述材質所成之遮:者直=為ι( 於触刻速度’以(a)之遮蔽為 [裝置之久構成構件] 午术表不之。 微波透過板1 4 :石英破璃材 原料氣體導入管1 2 : |呂材 蝕刻氣體供給部5 :鋁材 遮蔽框架1 0 ·•鋁材 氣體擴散板1 5 : (1) 不銹鋼SUS304 (2) 鋁材 礓齡 加熱平台3 : (1 )不銹鋼SUS304 (2 )链材In addition, the above (a) ~ (k) show that the etching with the distance between the two dragons is used to form the mask made of the following materials: z == ι (at the speed of the engraving, and the mask of (a) is [ Components of the device for a long time] Nothing shows in the afternoon. Microwave transmission plate 1 4: Quartz broken glass material gas introduction pipe 1 2: | Lu Cai etching gas supply unit 5: Aluminum shielding frame 1 0 • Aluminum gas diffusion Plate 1 5: (1) stainless steel SUS304 (2) aluminum heating platform 3: (1) stainless steel SUS304 (2) chain material

479446 五、發明說明(25) 遮蔽4 : (a)厚度為 50/zm 之不銹鋼 SUS 304 ( 1 8%Cr + 8%Ni + 74% F e )材(實施例7) (1))厚度為5〇//111之不銹鋼81]8 430 ( 1 2°/。(^ + 8 8%?6)材 (實施例8) (c) 厚度為50/zm之鎳合金(36%Ni ;64%Fe)材(實施例 9) (d) 對上述(1 )之材喷鍍〇· 1 // m之Si〇2之材(實施例 10) (e) 對上述(a)之材喷鍍〇· 1 // m之鋁之材(實施例1 1 ) (f )對上述(b)材喷鍍〇· 1 //m之Si02之材(實施例12) (g)對上述(b)之材喷鍍〇· 1 //m之鋁材(實施例13) (h )對上述(c )之材喷鍍〇 · 1 # m之s i 〇2之材(實施例 14) (i)對上述(c)之材噴鍍0· 1 // m之鋁之材(實施例1 5) (j )厚度為1 2 0 # m之石英玻璃材(實施例1 6 ) (k) 厚度為120 //m之驗玻璃材(實施例17) [處理條件] 真空周圍環境之真空度:199.5Pa 等離子形成用氣體流量:1 〇 〇 〇 m 1 /分鐘 加熱溫度 原料氣體 微波輸出 攝氏250度 氧氣及水蒸氣 2kw(最大 5kw) 從圖15所示之結果可明白,未含有Ni iSUS43〇材之蝕刻479446 V. Description of the invention (25) Shield 4: (a) Stainless steel SUS 304 (18% Cr + 8% Ni + 74% F e) material (Example 7) (1)) with a thickness of 50 / zm is 5〇 // 111 stainless steel 81] 8 430 (12 ° /. (^ + 8 8%? 6) material (Example 8) (c) Nickel alloy (36% Ni; 64%) with a thickness of 50 / zm Fe) material (Example 9) (d) The material of the above (1) is spray-plated to a material of SiO 2 of 1 / m (Example 10) (e) The material of the above (a) is spray-plated. · 1 // m of aluminum (Example 1 1) (f) Spray coating of the above (b) material 0 1 // m of Si02 (Example 12) (g) of (b) Material is sprayed to an aluminum material of 0.1 m (Example 13) (h) to the material of (c) above is sprayed to a material of 0.1 m to si (Example 14) (i) to the material described above (C) The material is sprayed with 0.1 · m // aluminum material (Example 1 5) (j) quartz glass material with a thickness of 1 2 0 # m (Example 1 6) (k) The thickness is 120 / / m of glass inspection material (Example 17) [Processing conditions] Vacuum degree of vacuum environment: 199.5Pa Gas flow for plasma formation: 1000 m 1 / min Heating temperature Raw material microwave output 250 ° C oxygen and water Steam 2kw ( Large 5kw) clear from the results shown in FIG. 15, the material does not contain Ni etching iSUS43〇

89126199.ptd 第28頁 479446 五、發明說明(26) 速度係2倍於對含有Ni8%之SUS304材。此乃SUS3 04材及 SUS430材係均形成有細緻的Cr2〇3包膜,阻止氧自由基對 遮蔽材内部之氧化而阻止氧自由基之消耗,但SUS304材之 包膜中包含具有觸媒作用之Ni的關係,[〇] + [〇] —〇2之再 、结合反應’在遮蔽附近及遮蔽孔内部,減少有效的氧自由 基的關係。 相較於不銹鋼SUS3 04材,含有約5倍之Ni之鎳合金鋼材 之=刻速度係約在1 / 3以下。此乃因氧自由基在蝕刻基材 之前使其再結合之觸媒作用之Ni含有量較多之外,未具有 阻止内部氧化之進行之細緻的Cr2 03之不動態膜形成的關 係。 用喷鑛法,對不銹鋼SUS304材,SUS430材,鎳合金鋼材 之兩、面包覆叙時,該等為,可得到比非包覆之W材約 上之蝕刻速度。此乃認為,因用未具有觸媒作用之 、、匕覆的結果,可阻止氧自由基之再結合的關係者。 =喷鍍法將不銹鋼SUS3〇4材,SUS43〇材,鎳合金鋼材之 ::s1〇予以包覆時,可得到比非包覆之咖3 倍左右之蝕刻速度。 〜^ =乃:為’ gj用未具有觸媒作用之氧化矽 於上述之钮晅妙二冉、、口。的關係,其效果係稍為大 材比非金屬材之石英玻璃材爾 質的關為其原因乃因喷制係極薄的膜而多孔 可撓性之石英玻璃材或鹼玻璃材為 可得到約1 〇倍於包89126199.ptd Page 28 479446 V. Description of the invention (26) The speed is 2 times that of SUS304 material containing 8% Ni. This is the SUS3 04 material and the SUS430 material system are formed with a fine Cr203 coating, which prevents the oxidation of oxygen free radicals inside the shielding material and prevents the consumption of oxygen free radicals, but the film of SUS304 contains a catalyst The relationship between Ni is [〇] + [〇] —〇2, and the binding reaction is near the shielding and inside the shielding hole, reducing the relationship of effective oxygen radicals. Compared with stainless steel SUS3 04 material, the nickel alloy steel content containing about 5 times Ni is equal to or less than about 1/3. This is because the oxygen radical has a large amount of Ni content as a catalyst for recombination before the substrate is etched, so it does not have a fine Cr2 03 immobile film formation that prevents the internal oxidation from proceeding. When blasting the stainless steel SUS304, SUS430, and nickel alloy steel, the two surfaces are covered. These can achieve an etching speed about the same as that of the uncoated W material. This is because, as a result of using a catalyst that has no catalyst effect, it can prevent the recombination of oxygen radicals. = When spray coating is used to coat stainless steel SUS304, SUS43〇, and nickel alloy steel :: s1〇, the etching speed can be about 3 times higher than that of uncoated coffee. ~ ^ = 是 : For ‘gj, use silicon oxide without catalyst effect on the above button. The reason is that the effect is slightly larger than that of non-metallic quartz glass materials. The reason is that the quartz glass materials or alkali glass materials that are flexible and porous due to the spraying of extremely thin films are available. 10 times the package

47^440 五、發明說明(27) 覆材之SUS304材之蝕刻速度。 & ^ Wί玻璃材或鹼玻璃材構成之遮蔽之同時用鋁材構 t f 八他各部時,可得到最大的蝕刻速度,但將氣體 ^ ^ ^ ^ ^更為SUS304材時,蝕刻速度為減半。此乃 ^ ^在專離子體室11所生成之氧自由基為因SUS304製氣 體分散板之觸媒作用而盅姓人m ^ ^ 濃度減低的關係。#-5’因而供於蝕刻之氧自由基 當』ΐϊίίΐ時此:::丄在:刻之末期狀態中, 氧自由基的關係,氧自由“:η:台係未直接接觸 刻,ρ由;^4自^ f f為有效地作用而以高速實行名虫 』者 接觸,sus3〇4材發生觸媒作用的關 (實施例1 8,1 9 ) 理:ϊ:=之裝置卸下遮蔽4之圖13之裝置,以下述之處 施例19)之。 江之被處理材⑴(實施例⑻及⑵(實 其結果,被處理材(1)為5分鐘 為12分鐘則貫穿之。又,“H: f 被處理材⑺ 為與實施例1相同,直徑 、月又i,、、’實知例1 8,1 9均1 以下之同日夺,孔壁傾钭角Λ均勾度在目標直徑之加減_ 内適合實用Ϊ斜角度係在目標之16〜45度之範圍 [被處理材] 第30頁 89l26l99.ptd47 ^ 440 V. Description of the invention (27) Etching speed of SUS304 material. & ^ Wί The maximum etching rate can be obtained when the aluminum or teflon glass is used for the shielding of the glass material or the alkali glass material, but when the gas ^ ^ ^ ^ ^ is changed to a SUS304 material, the etching speed is reduced. half. This is the relationship between the reduction in the concentration of oxygen free radicals generated in the special ion chamber 11 due to the catalyst action of the gas dispersion plate made of SUS304. # -5'So the oxygen free radicals for the etching when "ΐϊίίΐ" this ::: 丄 In the final state of the engraving, the relationship of oxygen free radicals, oxygen free ": η: the Taiwan system is not directly in contact with the engraving, ρ by ^ 4 from ^ ff for effective action and high-speed implementation of famous insects contact, sus3 catalyzed by the susceptible material (Examples 18, 19). Management: ϊ: = the device to remove the shielding 4 The device in Fig. 13 is as follows in Example 19). Jiang Zhi's material to be treated (Examples ⑻ and ⑵) (as a result, the material to be treated (1) is 5 minutes and 12 minutes, and runs through.) "H: f The material to be treated is the same as in Example 1, and the diameter, month, and diameter are equal to or less than 1 on the same day. The inclination angle Λ of the hole wall is equal to The addition and subtraction of the target diameter _ The practical oblique angle is within the range of 16 to 45 degrees of the target [processed material] Page 30 89l26l99.ptd

III 479446 五、發明說明(28) 被處理材(1):在預定之板面設有其直徑為1 0 0 // m之貫 穿孔之厚度之鋁箔,及其厚度5〇 // m之聚亞胺薄膜(宇部興產股份有限公 司製品π優比列克斯π )之積層材 被處理材(2 ):在預定之板面設有其直徑為1 0 0 // m之貫 穿孔之厚度20//m之SUS304箔,及其厚 度5 0 //m之聚亞胺薄膜(宇部興產股份 有限公司製品H優比列克斯π )之積層材 [處理條件] 加熱平台:表面之曲率半徑80 0min 加熱溫度:攝氏2〇〇度 〇 微波輸出:1. 8kw 等離子體形成用氣體··供給氧100Occ/分鐘及水蒸氣 1 0 0 c c /分鐘 真空周圍環境之真空度:133Pa 產.業上之利用可 θ疋種有效的樹脂薄膜之乾式蝕刻方法及其裝置。尤其 疋’對可挽性印刷電路(Flexible Printed Circuit)基板 所,用之樹脂薄膜之表面予以氣體蝕刻時頗有用者。 元·迕麵農主 1 撒出用捲軸 2 捲取用捲軸 3 加熱平台 加熱平台之表面III 479446 V. Description of the invention (28) Material to be processed (1): Aluminum foil with a thickness of 1 0 0 // m through-holes on a predetermined plate surface, and a thickness of 50 // m Laminated material (2) of imine film (product of Ube Industrial Co., Ltd. π Youbilex π): the thickness of the through hole with a diameter of 1 0 0 // m is provided on the predetermined plate surface 20 // m SUS304 foil, and a laminated material with a thickness of 50 / m of polyimide film (product of Ube Industrial Co., Ltd. H Youbilex π) [treatment conditions] Heating platform: surface curvature Radius 80 0min Heating temperature: 200 degrees Celsius Microwave output: 1.8kw Gas for plasma formation · Supply 100Occ / min of oxygen and water vapor 10 0 cc / min Vacuum degree of vacuum surrounding environment: 133Pa Industry The above-mentioned dry etching method and device using a variety of effective resin films are available. In particular, it is useful when the surface of a resin film used for a flexible printed circuit board is subjected to gas etching. Yuan · Noodle Farmer Owner 1 Spreading Reel 2 Reeling Reel 3 Heating Platform Heating Platform Surface

479446 五、發明說明(29) 4 遮 蔽 4a 名虫 刻 用 微 細 孔 5 Μ 刻 氣 體 供 給 部 6 搬 送 滾 筒 7 張 力 滚 筒 8 加 熱 器 10 遮 蔽 框 架 11 等 離 子 體 發 生 室 12 原 料 氣 體 導 入 管 16 微 波 振 盪 器 17 處 理 室 18 真 空 泵 19 管 路 21 外 裙 部 22 滑 動 部 23 平 台 轴 26 撒 出 用 捲 軸 27 捲 取 用 捲 軸 28 跳 動 滚 筒 29 外 裙 部 30 間 隙 31 開 V 40 ik 刻 停 止 裝 置 41 紅 外 線 光 源479446 V. Description of the invention (29) 4 Shield 4a Fine holes for insect engraving 5 MH engraving gas supply unit 6 Transport roller 7 Tension roller 8 Heater 10 Shielding frame 11 Plasma generation chamber 12 Raw material gas introduction tube 16 Microwave oscillator 17 Processing chamber 18 Vacuum pump 19 Tubing 21 Outer skirt 22 Slider 23 Platform shaft 26 Spreading reel 27 Winding reel 28 Jumping roller 29 Outer skirt 30 Gap 31 Open V 40 ik Engraving stop device 41 Infrared light source

\\326\2d-\90-03\89126199.ptd 第32頁 479446 五、發明說明(30) 42 稜鏡 43 受光 44 軸 45a 5 45b 窗口 46 發光 47 撒出 48 捲取 F 樹脂 Fa 積層 Fx 異種 G 等離 Gi,G2,G3, Gx R 反應 T 張力 P 壓力 器 層 用捲軸 用捲軸 薄膜單體材 材 樹脂薄膜 子體形成用氣體 反應生成氣體 性活性氣體種\\ 326 \ 2d- \ 90-03 \ 89126199.ptd Page 32 479446 V. Description of the invention (30) 42 稜鏡 43 Light receiving 44 Shaft 45a 5 45b Window 46 Luminous 47 Spread 48 Rolling F Resin Fa Laminated Fx Heterogeneous G Plasma Gi, G2, G3, Gx R Reaction T Tension P Reel film for pressure device layer Reel film Monomer material Resin film body formation Gas reacts to generate gaseous reactive gas species

\\326\2d-\90-03\89126199.ptd 第33頁 479446 圖式簡單說明 圖1 (A )、( B )係顯示實行本發明之第j方法之 里 中,U)係蝕刻處理開始前之狀態之縱 處理中之狀態之縱剖視圖。 口 係蝕刻 圖2係顯示顯示圖丨之裝置中要部之放大縱 =:置中之遮蔽之安裝樣態之俯:圖。 裝置之縱剖視圖 之第1方法之其他貫施形態所成之 系顯示實施本發明之第1方法之再其他實施 =心所成之装置之要部,其中⑴係钱刻處 態之縱剖視圖,(B)係姓刻處理中之狀態之縱剖視圖。 圖6係顯示實施本發明之第丨方法之再其他實施形態所成 之裝置之縱剖視圖。 圖7係顯示以本發明之方法來實行氣體蝕刻之部位,其 中’(A)係触刻開始後之初其狀態,(B )係中期狀態,(c) 係末其狀態之縱剖視圖。 圖8係顯示實施本發明之第2方法之裝置之縱剖視圖。 圖9係顯示實施本發明之第2方法之其他實施形態之縱剖 視圖。 圖1 0係顯不實施本發明之第2方法之裝置中之實行氣體 蚀刻之部位’其中,(A)係蝕刻開始後之初其狀態之縱剖 視圖’(B)係末期狀態之縱剖視圖,(c )係顯示與被處理材 異種之樹脂薄膜之蝕刻狀態之縱剖視圖。 圖11係顯示實施本發明之第2方法之裝置中之反應生成 氣體之峰值形成樣態之說明圖。\\ 326 \ 2d- \ 90-03 \ 89126199.ptd Page 33 479446 Brief description of drawings Figures 1 (A) and (B) show that in the implementation of the jth method of the present invention, U) means the etching process is started A longitudinal cross-sectional view of a state in a previous state. Mouth is etched. Figure 2 is a magnified vertical view of the main part of the device shown in Figure 丨. Longitudinal section view of the device The other method of the first method of implementation is to show the implementation of the first method of the present invention is still another implementation = the main part of the device of the heart, where is the longitudinal section view of the money carved state, (B) is a longitudinal sectional view of the state in which the surname is being engraved. Fig. 6 is a longitudinal cross-sectional view showing an apparatus formed by carrying out still another embodiment of the method of the present invention. Fig. 7 is a longitudinal sectional view showing a portion where gas etching is performed by the method of the present invention, wherein '(A) is a state at the beginning after the initiation of engraving, (B) is an intermediate state, and (c) is a state at the end of the state. Fig. 8 is a longitudinal sectional view showing an apparatus for carrying out the second method of the present invention. Fig. 9 is a longitudinal sectional view showing another embodiment for carrying out the second method of the present invention. Fig. 10 shows a portion where gas etching is performed in a device that does not implement the second method of the present invention, where "(A) is a longitudinal sectional view of the state after the beginning of etching" and (B) is a longitudinal sectional view of the final state. (C) A longitudinal sectional view showing an etched state of a resin film different from the material to be processed. Fig. 11 is an explanatory diagram showing a peak formation state of a reaction-generating gas in an apparatus for carrying out the second method of the present invention.

第34頁 479446 圖式簡單說明 圖1 2係顯示實施本發明之第1方法之裝置中之反應生成 氣體之峰值形成樣態之說明圖。 圖1 3係顯示實施本發明之第3方法之裝置之縱剖視圖。 圖1 4係顯示實施本發明之第3方法之裝置之其他實施形 態之縱剖視圖。 圖1 5係顯示有關本發明之蝕刻裝置之遮蔽,加熱平台及 氣體擴散板之材料予以改變時之蝕刻速度之圖表。P.34 479446 Brief description of the diagrams Fig. 12 is an explanatory diagram showing a peak formation state of a reaction generated gas in an apparatus for carrying out the first method of the present invention. Fig. 13 is a longitudinal sectional view showing an apparatus for carrying out the third method of the present invention. Fig. 14 is a longitudinal sectional view showing another embodiment of the apparatus for carrying out the third method of the present invention. Fig. 15 is a graph showing the etching speed when the materials of the masking, heating platform and gas diffusion plate of the etching apparatus of the present invention are changed.

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Claims (1)

六、申請專利範圍 1 · 一種樹脂薄膜之乾式蝕刻 ^ ^ A 膜單體材及對樹脂薄膜積層金 ::二:.將樹脂薄 作為被處理材,以該被處 =積層材中之任何一方 面密接加熱平台之同時,在及之狀態’-侧之表 用開口圖案之遮蔽二在接形成有飯刻 空周圍環境下從該遮蔽側對辻^妾狀恶之同時,在真 者。 w對則述被處理材予以氣體蝕刻 2. 如申請專利範圍第丨項之樹脂 其中使前述加熱平台構成為、乾式蝕刻方法, 固定在一定位置,將#動另一方面,把前述遮蔽 咳被處理材懕垃认逃加熱平台向前述被處理材移動而 材及加熱平台互相予以密接述遮蔽,被處理 3. 如申請專利範圍第!或2項之樹脂 法’其中在氣體钮刻中從前 ;: = 定值以上時停當該發生量有激變至預 膜4單體式里其包含有:將樹脂薄 薄膜側之表之:r對該異種樹脂 表面密接形成有餘刻用、開:^ :别述被處理材側之 之同時,在真空周圍p ^囷案之遮蔽,保持該密接狀態 以氣體㈣者。u下從㈣相對前述被處理材予 5.如申請專利範圍第4項之樹脂薄膜之乾式敍刻方法, 89126199.ptd 第36頁 六、申請專利範圍 固:::=::=平:=為可動之另-方面’把前述遮蔽 動而把前述被處理材2接3=;前;異種樹脂薄膜移 者。被處理材及異種樹脂薄膜及加熱平台互相予以密接 法6:=專:範圍第4或5項之樹脂薄膜 之^中在耽體餘刻中對從前述遮蔽之姓刻用Μ刻方 變in!體之組成予以檢測,當該組成之ί:所放出 楚化時停止刖述氣體蝕刻者。 種頬有發生 7· 一種樹脂薄膜之乾式蝕 2刻用開口圖案之金屬箱積層於樹脂薄二::面將形成有 :加熱平台密接於該被處理材之=積層材 4 Μ側之表面,保持該密接狀態之別述樹脂 8·如申絢專利乾圍第7項之樹虫刻者。 其中,在氣體蝕刻中對從前述金屬之蝕刻方法, 之反應生成氣體之發生量予以檢测,合嗲二所放出 預定值以上時停止前述氣體蝕刻者曰μ 量有激變至 9·如申請專利範圍第!、2、 脂薄膜之乾式银刻方法,其中 I 7及%員中你一項之樹 面形成為凸狀之二次元曲面者。达加熱平口之按屋用之表 1 0 ·如申請專利範圍第Ϊ、2、4 樹脂薄膜之乾式蝕刻方法,、5、7及8項中住一 體摩者。]方法,其中前述氣體银刻法係等項離之子 Μ 89126199.ptd 第37頁 1 / 六、申請專利範圍 如申請專利範圍第卜2、4、5、7及8項中任 二薄其:者構成前述被… 1 2 · —種樹脂薄膜之乾式蝕刻裝置,其包含· 可使内部為真空之處理室(〗7 ) ; S 設置在該處理室内部之蝕刻氣體供給部(5) · 以覆蓋該#刻氣體供給部之氣體流ώ 能 形成有蝕刻用開口圖案之遮蔽(4);及 心女哀之, 可動自如地設置在前述處理室内 該加熱平台(3)係密接於以樹脂 平台(3), 相反側者。 ;在接於前述被處理材之 1 3 · 士申明專利範圍第】2項之樹脂 置,其中具備有: 寻膜之乾式蝕刻裝 在氣體蝕刻中,從前述遮蔽 反應生成氣體之發生量予以檢測出之^用開口所放出之 根據该檢測裝置之檢測訊號#,置(40),及 停止裝置者。 j迷氣體蝕刻之蝕刻 14. -種樹脂薄膜之乾式蝕 可使内部為真空之處理室(17). 其包含有·· 設置在該處理室内部夕紅产’ ( U 蝕刻氣體供給部· 以覆盍忒蝕刻虱體供給部之 .K5), 形成有#刻用開口圖案之遮蔽(4 ) 口之狀態安裝之, 可動自如地設置在前述處理室(⑺ 一之加熱平台 89126199.ptd 第38頁 六、申請專利範圍 (3), 二,加熱平台係密接於被處理材之樹脂薄膜 以‘,與該樹脂薄膜單體材異種之氣體之 ;= 以重®之兩材料之同時, 、種树知溥膜予 别述遮蔽(4)係密接於前述被處理材者。 置範圍第14項之樹㈣膜之乾式㈣裝 反= :組= ΐ(二之^ 及 乂 <义化于以才双測出之檢測裝置(4 〇 ), 停止ί ΐ ί測咸置之檢測訊號而停止前述氣體蝕刻之蝕刻 乾式餘刻申裝二利:中圍在苐二至二項/任-項之樹脂薄膜^ 子體發生室(11)者了 刻氣體供給部(5)設有等离 1 7 ·如申請專利節[fl楚1 β s 置,其中用對從前述等離子體之:脂一薄膜广乾式 反應性活性氣體種非觸 a Λ至所流出之蝕刻氣體6. Scope of patent application 1 · Dry etching of a resin film ^ ^ A film monomer material and laminated gold on resin film: 2: Second: Use resin thin as the material to be treated, and the treatment = any one of the laminated material The side is closely connected to the heating platform, while in the state of the '-side', the surface is masked with an opening pattern. At the same time, the surrounding environment is formed with a rice carving, and the 恶 ^ 妾 -like evil is confronted from the side, while the real person. w Treat the material to be gas-etched. 2. If the resin in the scope of the patent application is applied, the above-mentioned heating platform is configured as a dry etching method, fixed in a certain position, and the other side will be moved to cover the cough. The processing material is rejected and the heating platform is moved to the material to be processed, and the material and the heating platform are closely shielded from each other and processed. 3. If the scope of patent application is the first! Or the resin method of 2 items, where the former in the gas button engraving ;: = stop when the value is greater than the predetermined value, the occurrence of a radical change to the pre-film 4 monomer type, which includes: the resin thin film side of the table: r pairs The surface of the heterogeneous resin is tightly formed with a seal for opening and closing: ^: At the same time as the side of the material to be treated, it is shielded around the vacuum p ^, and the sealed state is maintained by gas. The following applies to the material to be treated. 5. If the dry film engraving method of the resin film in item 4 of the scope of patent application, 89126199.ptd page 36 6. The scope of patent application is solid: :: = :: = flat: = In order to move the other-aspect ', the aforementioned shielding material is moved and the aforementioned processed material 2 is connected to 3 =; before; the heterogeneous resin film is moved. The material to be treated, the heterogeneous resin film, and the heating platform are closely adhered to each other. 6: = Special: The resin film in the range of item 4 or 5 is used to engrav the name from the aforementioned masked name in the remaining body. The composition of the body is detected, and when the composition is released, the gas etcher is stopped. There are 7 cases of dry etching of a resin film, and a metal box with an opening pattern for engraving is laminated on the resin thin layer 2: the surface will be formed with: a heating platform is in close contact with the surface of the material to be treated on the 4M side of the laminated material, Resin that maintains the tight contact state 8. The tree engraved by Rushen Xuan Patent No.7. Among them, in the gas etching, the amount of gas generated from the reaction method of the foregoing metal is detected, and the gas etching is stopped when the above-mentioned predetermined value is released by the 2nd company. The amount of μ will change to 9. The range cap! The dry silver engraving method of grease film, in which the tree surface of your item among I 7 and% members is formed into a convex two-dimensional curved surface. Up to heating flat mouth according to the table for house use 10 · For example, the dry etching method of resin film in the scope of patent application Nos. Ϊ, 2, and 4; ] Method, in which the aforementioned son of gas silver engraving method M 89126199.ptd p. 37 1/6. The scope of patent application is as thin as any of the items 2, 4, 5, 7 and 8 of the scope of patent application: This constitutes a dry etching device for a resin film, which includes: a processing chamber capable of making a vacuum inside (7); S an etching gas supply unit (5) provided inside the processing chamber. The gas flow covering the # 刻 气 supplying part can form a mask (4) with an opening pattern for etching; and the sad girl can be movably installed in the processing chamber. The heating platform (3) is closely connected to the resin platform. (3), the opposite. ; In the resin set connected to the above-mentioned treated material, item No. 1 of the patent claim] item 2, which includes: dry etching of the film-seeking film is installed in gas etching, and the amount of gas generated from the aforementioned shielding reaction is detected According to the detection signal # of the detection device, the device released by the opening is set to (40), and the device is stopped. J. Etching of gas etching 14.-A dry etching of a resin film can make the inside of a vacuum processing chamber (17). It contains ... "The interior of the processing chamber is provided by Yuhong" (U etching gas supply unit · to Cover the etch body supply part (K5), and install it in a state where the #etching opening pattern is used to shield (4) the mouth, and it can be installed in the aforementioned processing room (⑺ 一 的 Heating Platform 89126199.ptd 38th) Page 6 、 Scope of patent application (3). Second, the heating platform is closely connected to the resin film of the material to be treated, and the gas is different from the resin film's single material; The tree mask is different from the masking (4), which is in close contact with the material to be treated. The dry installation of the tree mask in the range of item 14 is reversed =: group = ΐ (二 之 ^ and 乂 < With the detection device (40) measured by Caishuang, stop ΐ ί 测 咸 咸 咸 ί ί 咸 ί ί ί ί ί 咸 detection signal and stop the aforementioned gas etching etch dry type for the remainder of the installation of the second benefit: Zhongwei in the second to second / Ren-item The resin film ^ The daughter body generating chamber (11) is provided with a carved gas supply unit (5). From 17 · The patent Section [FL Chu 1 β s home, where the use of the plasma from: etching a thin film lipid wide dry non-reactive species reactive gas to contact a Λ of the effluent gas 18.如申請專利範圍第17之材料構成前述遮蔽(4)者1 置,其中,前述非觸ΛΛ之,樹脂薄膜之乾式1虫刻裝 瓷材之任何一種,用鋁L $材料係對金屬材、玻璃材及 19· 一種樹脂薄膜之聋或/^化妙予以表面包覆者。 可使内部為| +乾式蝕刻裝置,其包含有·· J使冲為真空之處理室 設置在該處理室内部 , Ρ之餘刻氣體供給部(5 );及18. If the material in the 17th scope of the application for patents constitutes one of the aforementioned shielding (4), in which any of the foregoing non-contact ΛΛ, resin film dry type 1 engraved porcelain materials, aluminum L $ material is used for metal Materials, glass materials and 19. A resin film that is deaf or / or chemically coated. The interior can be made into a dry etching device, which includes a processing chamber for making a vacuum inside the processing chamber, and a gas supply section (5) at the time of P; and 21 ·如申請專利範圍第1 9或20項之樹脂薄膜之乾式触刻 裝置’其中在前述蝕刻氣體供給部(5 )設有等離子體發生 室(11 )者。 殷發生21 · A dry-type etching device for a resin film according to item 19 or 20 of the scope of the patent application, wherein a plasma generating chamber (11) is provided in the aforementioned etching gas supply section (5). Yin happened
TW89126199A 1999-11-15 2000-12-08 Method and apparatus of dry-etching resin film TW479446B (en)

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JP4783524B2 (en) * 2001-08-06 2011-09-28 株式会社アルバック Winding type dry etching method and apparatus

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US4529860A (en) * 1982-08-02 1985-07-16 Motorola, Inc. Plasma etching of organic materials
JPS59214240A (en) * 1983-05-09 1984-12-04 Fujitsu Ltd Manufacture of semiconductor device
JPS59214210A (en) * 1983-05-20 1984-12-04 ティーディーケイ株式会社 Dielectric porcelain material
JPH05326457A (en) * 1992-05-19 1993-12-10 Hitachi Ltd Terminal detector for plasma etching equipment due to detection of components of exhaust gas
JPH08134666A (en) * 1994-11-10 1996-05-28 Mitsui Toatsu Chem Inc Dry etching method

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