TW469262B - Method of cutting glass substrate and apparatus for doing the same - Google Patents

Method of cutting glass substrate and apparatus for doing the same Download PDF

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Publication number
TW469262B
TW469262B TW089105870A TW89105870A TW469262B TW 469262 B TW469262 B TW 469262B TW 089105870 A TW089105870 A TW 089105870A TW 89105870 A TW89105870 A TW 89105870A TW 469262 B TW469262 B TW 469262B
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TW
Taiwan
Prior art keywords
glass substrate
line
cutting
heater
patent application
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TW089105870A
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Chinese (zh)
Inventor
Miki Fukushima
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Nippon Electric Co
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/09Severing cooled glass by thermal shock

Abstract

There is provided a apparatus for cutting a glass substrate by heating or cooling the glass substrate to thereby produce thermal stress in the glass substrate and have the glass substrate cracked, including (a) a heater which heats the glass substrate along a line along which the glass substrate is to be cut, (b) a sensor which detects a head of a crack developing in the glass, (c) a cooler which partially cools the glass substrate in the vicinity of the head of a crack, (d) a first unit which transfers the sensor along the line, and (e) a second unit which transfers the cooler along the line. The apparatus makes it possible to cut a glass substrate without generation of glass chip, even if the glass substrate is thick.

Description

46 92 6 2 五、發明說明(1) ~ ' — 【發明背景】 【發明領域】 本發明係關於一種玻璃基板之切割方法,該玻璃基板 2作為顯示器例如液晶顯示器裝置或電漿顯示器裝置中之 、螢幕,亦關於一種玻璃基板之切割設備。本發明尤其關 於一種玻璃基板切割方法與設備,其藉由加熱或冷卻玻璃 基板俾使熱應力產生於玻璃基板中且使玻璃基板破裂。 【相關技藝之說明】 切割易碎材料例如玻璃之習知的方法包含:使用較硬 材料例如鑽石刮擦易碎材料,藉以成功地形成一裂痕或一 溝,於忒易碎材料之一表面上,以及沿著該裂痕或溝槽施 力:衝力或負載至該易碎材料上。舉例而言,製造液晶顯示 器裝置或電漿顯示器裝置之方法通常包括前述切割玻璃基 板之步驟。 然而’前述切割易碎材料之習知方法伴隨著—問題: 當切割易碎材料時會產生碎片。 在液晶顯示器裝置與電漿顯示器裝置之製造中,一電 路圖案以南雄度形成於一玻璃基板上。因此,當藉由前述 習知的方法切割玻璃基板時,切割玻璃基板所產生的碎片 殘留於或黏附於電路圖案上,導致電路圖案中之缺陷,例 如因碎片而產生短路。 據此’液晶顯示器裝置或電漿顯示器裝置之製造方法 必須在玻璃基板被切割後,額外包括一洗去碎片之步驟。46 92 6 2 V. Description of the invention (1) ~ '— [Background of the invention] [Field of the invention] The present invention relates to a method for cutting a glass substrate. The glass substrate 2 is used as a display device such as a liquid crystal display device or a plasma display device. , Screen, and also about a glass substrate cutting equipment. In particular, the present invention relates to a method and a device for cutting a glass substrate, which heats or cools the glass substrate to generate thermal stress in the glass substrate and break the glass substrate. [Explanation of Related Techniques] The conventional method of cutting fragile materials such as glass includes: scraping the fragile materials with a harder material such as diamond to successfully form a crack or groove on one of the surfaces of the fragile material And applying force along the crack or groove: impulse or load on the fragile material. For example, a method of manufacturing a liquid crystal display device or a plasma display device usually includes the aforementioned step of cutting a glass substrate. However, the aforementioned conventional method of cutting fragile materials is accompanied by a problem: when cutting fragile materials, fragments are generated. In the manufacture of liquid crystal display devices and plasma display devices, a circuit pattern is formed on a glass substrate with a southerly degree. Therefore, when the glass substrate is cut by the aforementioned conventional method, fragments generated by cutting the glass substrate remain on or adhere to the circuit pattern, causing defects in the circuit pattern, such as a short circuit due to the fragment. Accordingly, the manufacturing method of the liquid crystal display device or the plasma display device must include a step of washing away the debris after the glass substrate is cut.

469262 五、發明說明(2) 因此,在液晶顯示器裝置或電漿顯示器裝置之 中,需要一種不產生碎片的玻璃基板切割方法。為回應此 需求,已建議一種玻璃基板之切割方法,其藉由加熱或冷 卻玻璃基板俾造成熱應力於該玻璃基板中。 …/ v469262 V. Description of the invention (2) Therefore, in a liquid crystal display device or a plasma display device, a glass substrate cutting method that does not generate debris is needed. In response to this demand, a cutting method of a glass substrate has been proposed which causes heat stress in the glass substrate by heating or cooling the glass substrate. ... / v

舉例而言,此等方法中之一業已建議於曰本未審查 利公報第5-221 6 73號中。下文中將參照圖】與2 ,說明日 未審查專利公報第5-221 673號所建議之方法。W ,圖1係顯示將由所建議的方法加以切割的易碎 透視圖,且圖2係該易碎平板之平面圓。 參照圖1,易碎平板丨將被沿著一目標線2切割。一 土器3正好位於目標線2之下方。加熱器3包括加▲配口 虽電功率從一電源(未圖示)供應至加熱配線時,加執 於目標線2處加熱易碎平板1。 易碎平板1之末端表面4處形成一垂直溝槽5 , π地访Α」I 千板舉例而言,垂直溝槽5係由一 m 石玻璃切割器所形成。 鑽 售描7易碎平板1之上表面6沿著目標線2形成一小溝槽7。 能:之形成使得沿著目標線2精確切割易碎平板】成為可小 標線2:主動要於的易加:平器板 係:-操作員操作。雖未熱1單元8 加熱器,其區域性加熱易碎平板Γ。要的加熱…8包括 易碎平板1之切割如下。 46 92 6 2 五、發明說明(3) 首先’藉由加熱器3沿著目標線2加熱易碎平板1之下 表面。藉由&加熱器3加熱易碎平板1,熱應力產生於目標線 2處。具體言之,如圖2所示,張力A產生於目標線2之相對 侧張力A對易碎平板1從目標線2向外拉《如圖1所示,張 力A易產生於易碎平板i之末端表面4。 | 然^ ’主要的加熱器單元8從垂直溝槽5沿著目標線2 1 @ :藉-由主要的加熱器單元8使熱應力場區域性產生, &,/熱應力沿著易碎平板1之一部份放射狀地產 L =係易碎平板1被主要的加熱器單元8加熱之處。 超過“平加熱^元8力口熱易碎平板1所產生之張力 目標線2破裂…界拉張強度日夺’易碎平板1開始沿著 的加碎平使板易端表面4沿著目標線2移動主要 平板丨被沿著:標:2易:^ ^ 度與加:面ί:: J1 的破裂之破裂速率係依據加熱器3之溫 合而決定。 要的加熱單元8之溫度與加熱面積之組 〇 县碰’前述藉由加熱或冷卻易碎平軛彼-生士搞豳七私 易碎平板中之習知的易丨=2十板俾造成熱應力於 在前述的習知方味由板刀割方法伴隨著下列問題。 沿著目標線2形成小溝槽/在切割易碎平板1前絕對必須 平板i。 …廣槽7,以沿著目標線2精確切割易碎 尤其’當易碎平板1厚時,必須形成深的溝槽7,以於For example, one of these methods has been proposed in Japanese Unexamined Proclamation No. 5-221 6 73. The method proposed in Japanese Unexamined Patent Publication No. 5-221 673 will be described below with reference to the drawings] and 2. W, FIG. 1 shows a fragile perspective view to be cut by the proposed method, and FIG. 2 shows a plane circle of the fragile plate. Referring to FIG. 1, the fragile plate 丨 will be cut along a target line 2. An earthenware 3 is located just below the target line 2. The heater 3 includes a heating port. Although the electric power is supplied from a power source (not shown) to the heating wiring, the heating unit 3 is heated at the target line 2 to heat the fragile plate 1. A vertical groove 5 is formed at the end surface 4 of the fragile plate 1, and π visits A ″ I. For example, the vertical groove 5 is formed by a m stone glass cutter. The upper surface 6 of the fragile plate 1 is drilled and drilled to form a small groove 7 along the target line 2. Capability: The formation makes it possible to accurately cut the fragile flat plate along the target line 2] becomes a small markable line 2: easy to add: the flat plate is required: -Operator operation. Although the 1-unit and 8-unit heaters are not heated, the fragile plate Γ is locally heated. The required heating ... 8 includes cutting of the fragile plate 1 as follows. 46 92 6 2 V. Description of the invention (3) First, the lower surface of the fragile plate 1 is heated by the heater 3 along the target line 2. The fragile plate 1 is heated by the & heater 3, and thermal stress is generated at the target line 2. Specifically, as shown in FIG. 2, the tension A is generated on the opposite side of the target line 2 and the tension A is pulled outward from the target line 2 from the target line 2. As shown in FIG. 1, the tension A is easily generated on the fragile plate i. Of the end surface 4.然 ^ 'The main heater unit 8 is along the target line 2 1 from the vertical groove 5 @: Borrow-the main heater unit 8 is used to locally generate the thermal stress field, & A part of the flat plate 1 is a radial real estate L = where the fragile plate 1 is heated by the main heater unit 8. Exceeding the "flat heating ^ yuan 8 force mouth heat fragile flat plate 1 tension target line 2 rupture ... the world tensile strength is increasing, the fragile flat plate 1 starts to break along the flattening surface 4 along the target The main plate moving along line 2 is followed by: standard: 2 easy: ^ ^ degrees and plus: surface ί :: J1 The rupture rate is determined by the temperature of the heater 3. The temperature of the required heating unit 8 and The group of heating area 〇 county touches the foregoing by heating or cooling the fragile flat yoke-Shengshi engages in the custom of the seven private fragile plates = 2 ten plates cause thermal stress in the previously known The square-flavored cutting method is accompanied by the following problems. Small grooves are formed along the target line 2 / A flat plate i must be absolutely cut before cutting the fragile plate 1.… wide groove 7 to accurately cut the fragile along the target line 2 When the fragile plate 1 is thick, a deep groove 7 must be formed so that

第7頁 469262 五、發明說明(4) 易碎平板1被切割處獲得平坦的切割表 所以,在前述的習知方法中,° .。 量的碎片,以便精確切割易碎平 可避免會產生一特定 處獲得平坦的切割表面。所產生的於易碎平板1被切割 易碎平板1上的電路之缺陷。 、 潛在地造成形成於 在前述的習知方法中,易碎平 用以加熱易碎平板1之條件所控制。缺:刀f :速率僅由 增加速率。換言之,一旦易 制該速率,尤其不可能 的習知方法不能增加速率,因此不可二破裂時’前述 速率。 j能在控制下精確增加 此外,在前述的習知方法中,當择 Ϊ1 裂之广破發裂生發生時,會移動主要的加熱器單元8 :、因此碎: 加於易碎平板1中之速率不同於依據預定的用以 =易碎平祀之條件所預期的速率,則操作員必須=其 隨易碎平板i中裂痕之發展,此對於操作員而言相 【發明概述】 ^有鑑於先前技藝之前述問題,本發明之一目的在於, 提供一種不產生玻璃碎片之精確切割玻璃基板之方法與設 備’即使對於厚的玻璃基板亦然。 、本發明之另一目的在於,提供一種玻璃基板之切割方 法及設備’該方法及設備能增加玻璃基板被切割之逮率, 469262 五、發明說明(5) 更能控制該速率。 本發明之又一目的在於’提供一種玻璃基板之切割方 法及設備,該方法及設備不再需要操作員跟隨玻璃基板中 裂痕之發展,確保生產力因而製造率之增強。 在本發明之一態樣中,提供一種玻璃基板之切割方 法,藉由加熱或冷卻該玻璃基板,俾造成熱應力於該玻璃 基板中且使該玻璃基板破裂,包含下列步驟a) 在該玻 璃基板中之一裂痕發展之前,加熱一線,該玻璃基板將沿 著該線被切割、以及(b)部分冷卻該玻璃基板中該被發展 的裂痕之頭部附近。 步驟(a)得進行於步驟(b)之前,或與步驟(b)同時進 行。 依據此方法,既然一玻璃基板在一裂痕發展於該玻璃 基板中之前即於目標線處被預熱,故可以較高的精確度切 割該玻璃基板。尤其,倘若玻璃基板被切割處之目標線係 —直線’則可更直地切割玻璃基板。 此外,既然一玻璃基板中之一發展的裂痕之頭部附近 被部分冷卻,故可適當地控制該玻璃基板中之裂痕之頭部 附近之溫度梯度。 所以’如今可精確地切割一玻璃基板,而不產生玻璃 碎片,即使對於厚的玻璃基板亦同。再者,可增強玻璃基 板被切割之速率。 本發明更提供一種破璃基板之切割方法,藉由加熱或 冷卻該玻璃基板,俾造成熱應力於該玻璃基板中且使該玻Page 7 469262 V. Description of the invention (4) A flat cutting table is obtained at the place where the fragile flat plate 1 is cut. Therefore, in the aforementioned conventional method, °. A large amount of debris for precise cutting of fragile flats can avoid a flat spot where a flat cutting surface is produced. The resulting defect in the circuit on the frangible plate 1 is cut. Potentially formed in the aforementioned conventional method, the fragile flat is controlled by conditions for heating the fragile flat plate 1. Missing: Knife f: The rate is only increased by the rate. In other words, once the rate is easily controlled, the conventionally impossible method cannot increase the rate, and therefore the rate at the time of rupture. j can be accurately increased under control. In addition, in the conventional method described above, when the rupture of the stalk 1 occurs, the main heater unit 8 is moved: and therefore broken: added to the fragile plate 1. The rate is different from the expected rate according to the predetermined conditions for fragile flattening, then the operator must = it follows the development of cracks in the fragile plate i, which is similar to the operator. [Summary of the Invention] In view of the foregoing problems of the prior art, one object of the present invention is to provide a method and apparatus for accurately cutting a glass substrate without generating glass fragments, even for a thick glass substrate. 2. Another object of the present invention is to provide a method and a device for cutting a glass substrate. The method and the device can increase the rate at which the glass substrate is cut. 469262 V. Description of the invention (5) The rate can be controlled more. Another object of the present invention is to provide a method and equipment for cutting a glass substrate, which no longer requires an operator to follow the development of cracks in the glass substrate, thereby ensuring productivity and thus enhancing the manufacturing rate. In one aspect of the present invention, a method for cutting a glass substrate is provided. By heating or cooling the glass substrate, thermal stress is caused in the glass substrate and the glass substrate is broken, including the following steps: a) in the glass Before a crack in the substrate develops, a line is heated, the glass substrate will be cut along the line, and (b) partly cools the vicinity of the head of the developed crack in the glass substrate. Step (a) may be performed before step (b), or simultaneously with step (b). According to this method, since a glass substrate is preheated at a target line before a crack develops in the glass substrate, the glass substrate can be cut with high accuracy. In particular, if the target line of the glass substrate to be cut is a straight line, the glass substrate can be cut more straightly. In addition, since the vicinity of the head of a crack developed in one of the glass substrates is partially cooled, the temperature gradient near the head of the crack in the glass substrate can be appropriately controlled. So 'now it is possible to cut a glass substrate accurately without generating glass fragments, even for thick glass substrates. Furthermore, the rate at which the glass substrate is cut can be enhanced. The invention further provides a cutting method of a glass-breaking substrate. By heating or cooling the glass substrate, thermal stress is caused in the glass substrate and the glass is cut.

469262 五、發明說明(6) 璃基板破裂,包含下列步驟:(a)在該玻璃基板中之一裂 痕發展之前,加熱一線,該破璃基板將沿著該線被切割, 其中,由一加熱器於接觸該線時加熱該玻璃基板、以及 (b )藉由一設計成可沿著該線移動的冷卻器,部分冷卻該 玻璃基板中一被發展的裂痕之頭部附近。 依據此方法’既然藉由加熱器,使一玻璃基板在一裂 痕發展於邊玻璃基板中之前即於目標線處被預熱,故可以 較高的精確度切割該玻璃基板。尤其,倘若玻璃基板被切 割處之目標線係一直線,則可更直地切割玻璃基板。 此外’既然該加熱器接觸該玻璃基板,故該加熱器可 用高熱傳導性加熱玻璃基板。 此外’既然藉由可沿著該線移動的冷卻器,使一破璃 基板中之一發展的裂痕之頭部附近被部分冷卻,故可有效 地沿著該線冷卻該玻璃基板,且可適當地控制玻璃基板中 之一裂痕之頭部附近之溫度梯度。 所以,如今可精破地切割一玻璃基板,而不產生玻璃 碎片’即使對於厚的玻璃基板亦同。再者,可增強玻璃基 板被切割之速率。 本發明又提供一種玻璃基板之切割方法,藉由一加熱 器或一冷卻器區域性加熱或冷卻該破璃基板,俾造成熱應 力於該玻璃基板中且使該玻璃基板破裂,包含下列步驟: (a )藉由一感測器,感測產生於該玻璃基板中的一裂痕之 頭部之位置、以及(b )依據一從該感測器送出之訊號,控 制該冷卻器之位置。469262 V. Description of the invention (6) The glass substrate is broken, including the following steps: (a) Before a crack in the glass substrate develops, a line is heated, and the broken glass substrate will be cut along the line. The heater heats the glass substrate when contacting the line, and (b) partially cools the vicinity of the head of a developed crack in the glass substrate by a cooler designed to move along the line. According to this method ', since a glass substrate is preheated at a target line before a crack develops in an edge glass substrate by a heater, the glass substrate can be cut with higher accuracy. In particular, if the target line where the glass substrate is cut is straight, the glass substrate can be cut more straightly. In addition, since the heater contacts the glass substrate, the heater can heat the glass substrate with high thermal conductivity. In addition, since the vicinity of the head of a crack that develops in a broken glass substrate is partially cooled by a cooler that can be moved along the line, the glass substrate can be effectively cooled along the line, and the glass substrate can be appropriately cooled. Control the temperature gradient near the head of a crack in the glass substrate. Therefore, it is now possible to cut a glass substrate finely without generating glass fragments' even for thick glass substrates. Furthermore, the rate at which the glass substrate is cut can be enhanced. The present invention also provides a method for cutting a glass substrate. A heater or a cooler is used to locally heat or cool the broken glass substrate, which causes thermal stress in the glass substrate and breaks the glass substrate. The method includes the following steps: (a) the position of the head of a crack generated in the glass substrate is sensed by a sensor, and (b) the position of the cooler is controlled according to a signal sent from the sensor.

第10頁 46926? 五、發明說明(7) 依據此方法,一裂痕之頭部之位置由該感測器所偵 測’且依據該感測器之偵測結果控制該冷卻器之位置或移 動速率。因此’可適當地控制玻璃基板中之一裂痕之頭部 附近之溫度梯度。據此’可精確地切割一玻璃基板,而不 產生玻璃碎片’即使對於厚的玻璃基板亦同。此外,可增 強玻璃基板被切割之速率,而不需操作員觀察一發展中的 裂痕。 本發明再提供一種玻璃基板之切割方法,藉由一加熱 器或一冷卻器區域性加熱或冷卻該玻璃基板,俾造成熱應 力於該玻璃基板中且使該玻璃基板破裂,包含—步驟:施 加一力至該玻璃基板中之該線之末端,該力促使該玻璃基 板容易被切割。 一般而言’用以沿著該線裂開一玻璃基板之熱應力係 於該玻璃基板中之該線之終止末端減低。依據此方法,用 以裂開一玻璃基板之一外力施加至該玻璃基板中之該線之 終止末端’確保玻璃基板被切割之速率之增強。 此方法最好更包含一步驟:加熱該線之末端,使該末 端處溫度之增加小於該線之其他部分處溫度之增加。 依據此方法,可減少該玻璃基板之末端表面處之溫度 梯度’該位置較接近該線之終止末端。據此,即使一小裂| 痕產生於§亥玻璃基板之該末端表面,亦可防止一裂痕從該 線之終止末端處發展。 在本發明之另一態樣中’提供一種玻璃基板之切割設 備’藉由加熱或冷卻該玻璃基板,俾造成熱應力於該玻璃Page 10 46926? 5. Description of the invention (7) According to this method, the position of a cracked head is detected by the sensor 'and the position or movement of the cooler is controlled according to the detection result of the sensor rate. Therefore, the temperature gradient near the head of a crack in the glass substrate can be appropriately controlled. Accordingly, 'a glass substrate can be accurately cut without generating glass fragments' even for a thick glass substrate. In addition, the rate at which the glass substrate is cut can be enhanced without the need for an operator to observe a developing crack. The present invention further provides a cutting method of a glass substrate. The glass substrate is locally heated or cooled by a heater or a cooler, thereby causing thermal stress in the glass substrate and rupturing the glass substrate. The method includes: applying: A force reaches the end of the line in the glass substrate, and the force promotes the glass substrate to be easily cut. Generally, the thermal stress used to split a glass substrate along the line is reduced at the terminating end of the line in the glass substrate. According to this method, an external force applied to a glass substrate to break the termination end of the line in the glass substrate is used to ensure an enhanced rate at which the glass substrate is cut. This method preferably further comprises a step of heating the end of the wire so that the increase in temperature at the end is less than the increase in temperature at other parts of the line. According to this method, the temperature gradient at the end surface of the glass substrate can be reduced, and the position is closer to the end of the line. According to this, even if a small crack | mark is generated on the end surface of the glass substrate, it is possible to prevent a crack from developing from the termination end of the line. In another aspect of the present invention, ‘provide a cutting device for a glass substrate’ by heating or cooling the glass substrate, thereby causing thermal stress on the glass.

469262 五、發明說明(8) 基板中且使該玻璃基板破裂,包含一加熱器,用以 沿著一線加熱該玻璃基板,該玻璃基板將沿著該線被切 割、(b) —感測器’用以偵測在該玻璃基板中發展的一裂 痕之頭部、(c) 一冷卻器,用以部分冷卻該玻璃基板中該 裂痕之該頭部附近、(d) —第一單元,用以沿著該線移轉 該感測器、以及(e ) —第二單元,用以沿著該線移轉該冷 卻器。 ~ 依據此設備,既然一玻璃基板在一裂痕發展於該玻璃 基板中之前即於目標線處被預熱,故可以較高的精確度切 割該玻璃基板《尤其,倘若玻璃基板被切割處之目標線係 一直線’則可更直地切割玻璃基板。此外,既然一玻璃基 板中之一發屐的裂痕之頭部附近被部分冷卻,故可適當地 控制玻璃基板中之一裂痕之頭部附近之溫度梯度。 所以’如今可精確地切割一玻璃基板,而不產生玻璃 碎片’即使對於厚的玻璃基板亦同。再者,可增強玻璃基 板被切割之速率。 舉例而言,該第一單元得設計成其動作亦如同該第二 單元,藉以沿著該線移轉該感測器與該冷卻器。 舉例而言,該感測器得包含:(b 1) —光束源,用以 放射一束至該玻璃基板,且其位於該玻璃基板下方、以及 (b2) —光偵測器,用以接收該束,該光偵測器被設置於 接收已穿過該玻璃基板且已於該玻璃基板之一表面反射之 一束。 具有前述結構的感測器可精確偵測一裂痕如何發展於469262 V. Description of the invention (8) The substrate and the glass substrate are broken, including a heater for heating the glass substrate along a line, the glass substrate will be cut along the line, (b)-sensor 'The head for detecting a crack developed in the glass substrate, (c) a cooler for partially cooling the vicinity of the head of the crack in the glass substrate, (d)-the first unit, To move the sensor along the line, and (e) a second unit to move the cooler along the line. ~ According to this equipment, since a glass substrate is preheated at the target line before a crack develops in the glass substrate, the glass substrate can be cut with higher accuracy. "Especially, if the target of the glass substrate is cut, If the line is straight, the glass substrate can be cut more straight. In addition, since the vicinity of the head of a crack in a bun in a glass substrate is partially cooled, the temperature gradient near the head of a crack in a glass substrate can be appropriately controlled. Therefore, 'a glass substrate can be cut accurately today without generating glass fragments' even for thick glass substrates. Furthermore, the rate at which the glass substrate is cut can be enhanced. For example, the first unit may be designed to act like the second unit, thereby moving the sensor and the cooler along the line. For example, the sensor may include: (b 1)-a beam source for radiating a beam to the glass substrate, which is located below the glass substrate, and (b2)-a light detector for receiving In the beam, the light detector is arranged to receive a beam that has passed through the glass substrate and has been reflected on a surface of the glass substrate. The sensor with the aforementioned structure can accurately detect how a crack develops in

第12頁 五、發明說明(9) 一玻璃基板中。此外,既然該光偵測器係設計成接收已於 一玻璃基板之一表面反射之束,故可使該光束源與該光偵 測器位於關於該破璃基板之同一侧。因此,用以移轉該光 束源與該光偵測器支一單元可適當地移動於該玻璃基板下 方0 或者’該感測器得包含:(b 1 ) —光束源,用以放射 一束至該玻璃基板,且其位於該玻璃基板下方、(b2)— 第一光偵測’用以接收該束,該光偵測器被設置於接收已 穿過該玻璃基板且已於該玻璃基板之上表面反射之—束、 以及(b3 ) —第二光偵測’用以接收該束,該光偵測器被 設置於接收已於該玻璃基板之下表面反射之一束,在此例 子中,該裂痕之該頭部之偵測係基於該第一與第二光偵測 器之輸出間之比。 藉由使用二個光偵測器,可精確地偵測一裂痕如何發 展於一玻璃基板中。 該冷卻器最好包含:(c 1) 一空氣源,用以供應壓縮 空氣、(c2) —第一空氣喷嘴,該壓縮空氣係經由該第一 空氣喷嘴吹至該玻璃基板、以及(c3) 一第二空氣喷嘴, 该壓縮空氣係經由該第二空氣喷嘴吹至該玻璃基板,該第 二空氣噴嘴之位置係該第一空氣喷嘴之關於該線的相對 側。 藉由使用二個空氣喷嘴’可藉由幾乎關於一線而對稱 的玻璃基板之溫度概貌’冷卻該玻璃基板,該玻璃基板係 於該線處被切割。因此,可以較高的精確度切割該玻璃基Page 12 5. Description of the invention (9) In a glass substrate. In addition, since the light detector is designed to receive a beam that has been reflected on a surface of a glass substrate, the light source and the light detector can be positioned on the same side as the broken glass substrate. Therefore, a unit for transferring the beam source and the photodetector support can be appropriately moved below the glass substrate. 0 or 'The sensor must include: (b 1) — a beam source for emitting a beam To the glass substrate, and it is located below the glass substrate, (b2)-the first light detection is used to receive the beam, the light detector is arranged to receive the light that has passed through the glass substrate and has been on the glass substrate The beam reflected on the upper surface, and (b3)-the second light detection 'receives the beam, and the light detector is arranged to receive a beam which has been reflected on the lower surface of the glass substrate, in this example The detection of the head of the crack is based on the ratio between the outputs of the first and second light detectors. By using two light detectors, it is possible to accurately detect how a crack develops in a glass substrate. The cooler preferably includes: (c 1) an air source for supplying compressed air, (c2) a first air nozzle, the compressed air is blown to the glass substrate via the first air nozzle, and (c3) A second air nozzle, the compressed air is blown to the glass substrate via the second air nozzle, and the position of the second air nozzle is the opposite side of the first air nozzle with respect to the line. By using two air nozzles', the glass substrate can be cooled by the temperature profile of the glass substrate which is almost symmetrical about a line, and the glass substrate is cut at the line. Therefore, the glass substrate can be cut with high accuracy

第13頁 469262 五、發明說明(ίο) 板。 該第二空氣嘴嘴之位置最好對稱於該第一空氣噴嘴。 該加熱器最好係於該線處線接觸於該玻璃基板之加熱 器。 既然該加熱器線接觸於該玻璃基板,該加熱器可用高 熱傳導性加熱該破璃基板,確保玻璃基板可被有效切割。 該加熱器最好恰位於該玻璃基板之下方,使得加熱器 加熱該玻璃基板之下表面。對於此末端,該設備最好包括 一加熱器移動單元’用以朝上且朝下移動該玻璃基板下方 的該加熱器。 該加熱器移動單元確保該加熱器接觸於該玻璃基板, 繼而確保該加熱器對於該玻璃基板之熱傳導性。 該設備最好更包括一彈性體,該加熱器經由該彈性體 而連接於該加熱器移動單元。舉例而言,該彈性體得包含 一板片彈簧。 該彈性體破保該加熱器可緊密接觸該玻璃基板,即使 該玻璃基板具有一不平坦的表面。因此,該加熱器可用高 熱傳導性加熱該玻璃基板,確保該玻璃基板可被有效地切 割。 該設備最好更包括一外力施加裝置,用以施加—外力 至該玻璃基板中該線之終止末端處,朝向該線之頭部。 舉例而言,該外力施加裴置得包含一墊部,用以吸住 該玻璃基板’俾固持該玻璃基板、以及一滾子,用以施加 該外力至該玻璃基板。Page 13 469262 V. Description of Invention (ίο) Board. The position of the second air nozzle is preferably symmetrical to the first air nozzle. The heater is preferably a heater which is in line contact with the glass substrate at the line. Since the heater wire is in contact with the glass substrate, the heater can heat the broken glass substrate with high thermal conductivity to ensure that the glass substrate can be effectively cut. The heater is preferably located just below the glass substrate so that the heater heats the lower surface of the glass substrate. For this end, the apparatus preferably includes a heater moving unit 'for moving the heater below the glass substrate upward and downward. The heater moving unit ensures that the heater is in contact with the glass substrate, and then ensures the thermal conductivity of the heater to the glass substrate. The apparatus preferably further includes an elastic body, and the heater is connected to the heater moving unit via the elastic body. For example, the elastomer must include a leaf spring. The elastomer guarantees that the heater can closely contact the glass substrate, even if the glass substrate has an uneven surface. Therefore, the heater can heat the glass substrate with high thermal conductivity to ensure that the glass substrate can be effectively cut. Preferably, the apparatus further includes an external force applying device for applying an external force to a termination end of the line in the glass substrate toward the head of the line. For example, the external force applying device includes a pad portion for holding the glass substrate 'and holding the glass substrate, and a roller for applying the external force to the glass substrate.

第14頁 469262Page 14 469262

第15頁 五、 發明說明 ;11) 一 般 言 之 ί 用 以 沿 著 該 線 裂開 — 玻 璃 基板 之 熱應 力於 該 玻 璃 基 板 t 之 該 線 之 終 止 末 端減 低 〇 該 外力 施 加裝 置可 使 用 以 裂 開 一 玻 璃 基 板 之 一 外 力施 加 至 該 玻璃 基 板中 之該 線 之 終 止 末 端 確 保 玻 璃 基 板 被切 割 之 速 率之 增 強。 該 設 備 最 好 包 括 一 單 元 用以 起 初 先 破裂 該 玻璃 基板 之 末 端 表 面 9 該 線 係 從 該 末 端 表面 開 始 〇 舉 例 而 言 該 單 元 得 包 含 一輪 形 切 割 器。 該 單 元 可 於 ,— 玻 璃 基 板 之 一預 定 的 末 端表 面 處切 割該 玻 璃 基板 〇 該 設 備 最 好 更 包 括 - 第 二 冷卻 器 用 以冷 卻 該玻 璃基 板 中 之 該 線 之 終 止 末 端 處 或 其 附近 0 舉例 而 該 第 二 冷卻 器 得包 含 — 空 氣源 用以 供應 壓 縮 空 氣 ; 以 及 ,_ 位 於 該 玻 璃 基板 上 方 之 空氣 喷 嘴, 使從 該 空 氣 源 供 應 的 壓 縮 空 氣 經 由 該空 氣 噴 嘴 吹至 該 玻璃 基 板 〇 該 第 --- 冷卻 器 減 低 該 玻 璃 基板 之 末 端 表面 處 之溫 度梯 度 其 位 置 較接 近 該 線 之 終 止 末端 〇 據 此 ,即 使 一小 裂痕 產 生 於 該 玻 璃 基 板 之 該 末 端 表 面, 仍 可 防 止一 裂 痕從 該線 之 終 止 末 端 處 發 展 〇 [ 較 佳 實 施 例 之 詳 細 說 明 ] 回 園 3係顯示依據本發明之較佳實施例 用以切割玻璃 基 板 之 設 備 之 前 視 圖 Ϊ 且 圖 4係該設備之平面圖t >雖然為 方 便 說 明 之 故 在 圖 4中玻璃基板11由虛線所表示,但並 469262 五、發明說明(12) 非表示玻璃基板1 1與設備間之位置關係。 如圖3與4所示,玻璃基板之切割設備包含一加熱器 1 4 ’沿著一線1 3均勻加熱一玻璃基板1 1之下表面,玻璃基 板11將沿著該線(下文中稱為"目標線1 3")而切割、一感測 器1 7,偵測裂痕40之頭部(參照圖7 ),該裂痕40係沿著目 標線13從玻璃基板1 1開始破裂之第—末端表面15發展至玻 璃基板11終止破裂之第二末端表面16、一對冷卻器18,其 中每一個部分冷卻位於裂痕4 〇之頭部附近之玻璃基板11、 以及一對移動單元19 ’其中每一個被設計成可平行於目標 線1 3而移動,且其中每一個沿著目標線丨3移轉感測器丨7與 冷卻器1 8。 雖未圖示,待切割的玻璃基板丨丨之上表面2〇上形成有 一電路圖案。當玻璃基板11被切割時,玻璃基板丨丨係排列 成表面20朝上,如圖3所示。 加熱器1 4被設計成於目標線1 3處線接觸玻璃基板丨j。 在實施例中之加熱器1 4係一棒狀套輔(s h e a t h)加熱器,包 含一熱電阻管與一加熱配線,例如容納於該管中之一鎳鉻 合金。加熱器14正好位於目標線13之下方且與之平行: 如圖3所示,一加熱器移動單元21正好位於加熱器“ 之下方。加熱器移動單元21經由—板片彈簧22支持加熱器 14。 、、、' 在實施例中,雖然使用板片彈簧22作為一彈性體, 得使用其他的彈性回復部分,例如橡膠或—線圈 代板片彈簧2 2。 π督5. Description of the invention on page 15; 11) In general, ί is used to split along the line—the thermal stress of the glass substrate is reduced at the end of the line of the glass substrate t. The external force applying device can be used to split An external force applied to a glass substrate to the terminating end of the line in the glass substrate ensures an enhanced rate at which the glass substrate is cut. The device preferably includes a unit for initially breaking the end surface of the glass substrate. 9 The line starts from the end surface. For example, the unit may include a round cutter. The unit can cut the glass substrate at a predetermined end surface of one of the glass substrates. The device preferably further includes a second cooler for cooling at or near the termination end of the line in the glass substrate. The second cooler must include an air source for supplying compressed air; and an air nozzle located above the glass substrate, so that the compressed air supplied from the air source is blown to the glass substrate through the air nozzle. -The cooler reduces the temperature gradient at the end surface of the glass substrate and its position is closer to the end of the line. According to this, even if a small crack is generated on the end surface of the glass substrate, a crack can still be prevented from the line Development at the end of the termination. [Detailed description of the preferred embodiment] Back to the garden 3 shows the comparison according to the present invention. The front view of the device for cutting the glass substrate of the preferred embodiment is shown in FIG. 4 is a plan view of the device. T > Although the glass substrate 11 is shown by a dotted line in FIG. 4 for the sake of convenience, 12) Non-represents the positional relationship between the glass substrate 11 and the equipment. As shown in Figs. 3 and 4, the glass substrate cutting equipment includes a heater 14 'to uniformly heat the lower surface of a glass substrate 11 along a line 13, and the glass substrate 11 will be along this line (hereinafter referred to as & quot Target line 1 3 ") and a sensor 17 is cut to detect the head of the crack 40 (refer to FIG. 7), the crack 40 is the first to the end of the glass substrate 11 that breaks along the target line 13 The surface 15 develops to the second end surface 16 where the glass substrate 11 is terminated, a pair of coolers 18, each of which partially cools the glass substrate 11 located near the head of the crack 40, and a pair of moving units 19 'each It is designed to be movable parallel to the target line 13 and each of them moves the sensor 17 and the cooler 18 along the target line 丨 3. Although not shown, a circuit pattern is formed on the upper surface 20 of the glass substrate to be cut. When the glass substrate 11 is cut, the glass substrates are arranged so that the surface 20 faces upward, as shown in FIG. 3. The heater 14 is designed to be in line contact with the glass substrate at the target line 13. In the embodiment, the heater 14 is a rod-shaped sleeve heater, which includes a thermal resistance tube and a heating wire, such as a nickel-chromium alloy contained in the tube. The heater 14 is located directly below and parallel to the target line 13: As shown in FIG. 3, a heater moving unit 21 is located just below the heater ". The heater moving unit 21 supports the heater 14 via a leaf spring 22 In the embodiment, although the leaf spring 22 is used as an elastic body, it is necessary to use other elastic restoring parts, such as rubber or a coil instead of the leaf spring 22. π Supervisor

第16頁 46 92 62 五、發明說明(13) 加熱器移動單元2 1設有一加熱器支持件2 3。因此,雖 然加熱器14因板片彈簧22而向上偏,但加熱器14鄰接於加 熱器支持件23 ’故使加熱器14保持於加熱器移動單元21 中 〇 加熱器移動單元21被支持於一基部24上,使得加熱器 移動單元21可在由箭號A所指示之方向,相對於基部24朝 上且朝下移動。據此,加熱器14亦.可相對於基部24朝上且 朝下移動。 如圖3所示’感測器1 7包含一光束源2 5,位於玻璃基 板11下方且傾斜放射一束至目標線1 3、以及一光偵測器 26 ’用以接收已從光束源25傳送出、穿過玻璃基板11、且 在玻璃基板11之上表面20反射之束。光束源25與光偵測器 2 6之位置係關於加熱器1 4而相互對稱。 當玻璃基板1 1未於目標線13處破裂時,光偵測器26接 收已在玻璃基板11之上表面20反射之束。倘若裂痕40產生 於束通過之路徑中,則束會於裂痕40處完全反射,據此其 反射方向不同於當裂痕40未產生於玻璃基板11中時束之反 射方向。所以,光偵測器2 6不會接收反射束,或僅接收反 射束的一小強度。據此,依據光偵測器2 6所接收之束的強 度,可偵測是否裂痕40產生於目標線1 3中。 雖然感測器1 7被設計成僅包括一光偵測器2 6,但光偵 測器之數目不僅限於一。感測器1 7得被設計成包括二個光 偵測器,在此例子中,一個光偵測器被設置以接收已穿過 玻璃基板11與已在玻璃基板11之上表面20反射之束,且另Page 16 46 92 62 V. Description of the invention (13) The heater moving unit 21 is provided with a heater support member 23. Therefore, although the heater 14 is biased upward by the leaf spring 22, the heater 14 is adjacent to the heater support 23 'so that the heater 14 is held in the heater moving unit 21. The heater moving unit 21 is supported by a On the base 24, the heater moving unit 21 can be moved upward and downward relative to the base 24 in the direction indicated by the arrow A. Accordingly, the heater 14 can also move upward and downward with respect to the base 24. As shown in FIG. 3 'the sensor 17 includes a beam source 25, which is located below the glass substrate 11 and emits a beam obliquely to the target line 1 3, and a light detector 26' for receiving the light beam source 25 The beam transmitted through the glass substrate 11 and reflected on the upper surface 20 of the glass substrate 11 is transmitted. The positions of the beam source 25 and the photodetector 26 are symmetrical with respect to the heater 14. When the glass substrate 11 is not broken at the target line 13, the light detector 26 receives the beam which has been reflected on the upper surface 20 of the glass substrate 11. If the crack 40 is generated in the path through which the beam passes, the beam will be completely reflected at the crack 40, and accordingly, its reflection direction is different from that of the beam when the crack 40 is not generated in the glass substrate 11. Therefore, the photodetector 26 does not receive the reflected beam or receives only a small intensity of the reflected beam. Accordingly, according to the intensity of the beam received by the light detector 26, it can be detected whether the crack 40 is generated in the target line 13 or not. Although the sensor 17 is designed to include only one light detector 26, the number of light detectors is not limited to one. The sensor 17 must be designed to include two light detectors. In this example, one light detector is arranged to receive the beam that has passed through the glass substrate 11 and that has been reflected on the surface 20 above the glass substrate 11 , And another

第17頁 4 6 9 2Έ 2_____ 五、發明說明(14) 一個光彳貞測器被設置以.接收已在玻璃基板11之下表面12反 射之束。基於此等光偵測器之輸出間之比’可偵測裂痕4 0 是否產生於目標線1 3處。藉由使用二個光债測器’可更精 確地彳貞測裂痕4 〇係如何發展於玻璃基板11中。 如圖3所示,冷卻器1 8包含一供應壓縮空氣之空氣源 (未圖示),以及二個空氣喷嘴27 ’壓縮空氣經由該二個空 氣喷嘴27傾斜地吹至位於目標線1 3附近之玻璃基板1 1之下 表面12。此二個空氣噴嘴27之位置係關於目標線13而相互 對稱。 冷卻器1 8之空氣喷嘴27使壓縮空氣沿著目標線1 3吹至 由加熱器14所加熱的玻璃基板11,藉以增加玻璃基板11之 溫度梯度。此4保玻璃基板11被切割之速率增強。 此外,既然空氣喷嘴2 7之位置係關於加熱器1 4而相互 對稱,故可藉由關於目標線1 3而對稱的玻璃基板11之溫度 概貌冷卻玻璃基板11,確保玻璃基板丨丨被切割之精確度。 如圊3與4所示,感測器17與冷卻器18固定於移動單元 19上。感測器17位於每一個移動單元19之頭部,且冷卻器 1 8位於每一個移動單元1 9之背部。 如圖3與4所示,移動單元1 9之位置係關於基部24而相 互對稱]移動單元19被設計成可沿著軌條28滑動,執條28 •^位置係關於基部24而相互對稱,且平行於基部24。移動 單元1 9係由一控制器控制其操作(未圖示)。 如圖4所示,一單元3〇係位於玻璃基板丨丨之第一末端 表面15前方,目標線丨3從第一末端表面15處開始。單元30Page 17 4 6 9 2Έ 2_____ V. Description of the invention (14) A light sensor is set to receive the beam which has been reflected on the lower surface 12 of the glass substrate 11. Based on the ratio between the output of these light detectors', it can be detected whether the crack 40 is generated at the target line 13 or not. By using two optical debt detectors', it is possible to more accurately measure how the crack 40 is developed in the glass substrate 11. As shown in FIG. 3, the cooler 18 includes an air source (not shown) for supplying compressed air, and two air nozzles 27 ′. The compressed air is blown obliquely to the vicinity of the target line 13 through the two air nozzles 27. Lower surface 12 of glass substrate 1 1. The positions of the two air nozzles 27 are symmetrical with respect to the target line 13. The air nozzle 27 of the cooler 18 causes the compressed air to be blown along the target line 13 to the glass substrate 11 heated by the heater 14, thereby increasing the temperature gradient of the glass substrate 11. The rate at which the four glass-retaining substrates 11 are cut is enhanced. In addition, since the positions of the air nozzles 27 and 7 are symmetrical to each other with respect to the heater 14, the glass substrate 11 can be cooled by the temperature profile of the glass substrate 11 that is symmetrical with respect to the target line 13 to ensure that the glass substrate 丨 丨 is cut. Accuracy. As shown in Figures 3 and 4, the sensor 17 and the cooler 18 are fixed to the mobile unit 19. The sensor 17 is located on the head of each mobile unit 19, and the cooler 18 is located on the back of each mobile unit 19. As shown in Figures 3 and 4, the positions of the mobile units 19 are symmetrical to each other with respect to the base 24] The mobile units 19 are designed to slide along the rails 28, and the positions of the bars 28 are symmetrical to each other with respect to the base 24, And parallel to the base 24. The mobile unit 19 is controlled by a controller (not shown). As shown in FIG. 4, a unit 30 is located in front of the first end surface 15 of the glass substrate 丨, and the target line 3 starts from the first end surface 15. Unit 30

第18頁 469262Page 18 469262

且其包含一輪 起初先破裂玻璃基板π之第一末端表面15 形切割器2 9。 圖5係顯示單元3 0之侧視圖 元3 0之結構。 下文中將參照圖5說明單 29,用以施加一初期裂痕至 —驅動轴3 1,用以驅動輪形 切割器2 9移向玻璃基板11、 體32與驅動軸31。 單元30包含一輪形切割器 玻璃基板之第一末端表面15、 切割器29、一柱體32,使輪形 以及一驅動部3 3,用以驅動柱 驅動部33於箭頭B所指示之方向使輪形切割器29、驅 動軸3、、以及柱體32 一起向上且向下㈣。如下文中所詳 述,在藉由加熱器14加熱玻璃基板丨丨前,藉由輪形切割器 29先破裂或刮擦玻璃基板丨丨之第一末端表面“,確保裂痕 4 0沿著目標線1 3平順地發展。 如圖4所示’ 一外力施加裝置34位於玻璃基板η之第 一末端表面16之前方,裂痕4〇終止於該第二末端表.面16。 外力施加裝置34施加一外力至玻璃基板丨〗之第二末端表面 1 6之該目標線1 3之終止末端處’朝向該目標線1 3之頭部。 圖6係外力施加裝置34之侧視圖。下文中將參照圖4與 6說明外力施加裝置34。 外力施加裝置包含一墊部3 5,用以吸住玻璃基板11藉 以固持破璃基板11、一第一滾子36,用以施加一外力至玻 璃基板11之第二末端表面16之目標線13的終止末端處,該 外力之施加方向係相反於裂痕40沿著目標線丨3發展之方 向、以及一第二滾子37,用以於目標線13之終止末端處朝And it includes a round 15-shaped cutter 29 that first breaks the first end surface of the glass substrate π. Fig. 5 is a side view showing the structure of the unit 30. Hereinafter, a description will be given with reference to FIG. 5 to 29 to apply an initial crack to the drive shaft 31 to drive the wheel cutter 29 to the glass substrate 11, the body 32, and the drive shaft 31. The unit 30 includes a first end surface 15 of a wheel-shaped cutter glass substrate, a cutter 29, and a cylinder 32 to make the wheel shape and a driving portion 33 to drive the column driving portion 33 to make the wheel shape in the direction indicated by arrow B. The cutter 29, the drive shaft 3, and the post 32 are swelled upward and downward together. As detailed below, before the glass substrate is heated by the heater 14, the first end surface of the glass substrate is broken or scraped by the wheel cutter 29 to ensure that the crack 40 is along the target line 1. 3 develops smoothly. As shown in FIG. 4, an external force applying device 34 is located in front of the first end surface 16 of the glass substrate η, and the crack 40 ends at the second end surface 16. The external force applying device 34 applies an external force. The terminating end of the target line 13 to the second end surface 16 of the glass substrate 丨 is toward the head of the target line 13. Fig. 6 is a side view of the external force applying device 34. Refer to Fig. 4 below The external force applying device 34 is described with 6. The external force applying device includes a pad portion 35 for holding the glass substrate 11 to hold the broken glass substrate 11 and a first roller 36 for applying an external force to the first portion of the glass substrate 11. At the terminating end of the target line 13 of the two end surface 16, the direction of application of the external force is opposite to the direction in which the crack 40 develops along the target line 3, and a second roller 37 is used to terminate the target line 13 At

第19頁 469262 五、發明說明(16) 下壓玻璃基板11 ° 塾部3 5與第一滾子3 7皆由一含納於外力施加裝置3 4之 驅動部(未圖示)所驅動,藉以相對於玻璃基板11而朝上且 朝下移動,如清號C所指示。第一滾子3 6亦由驅動部所驅 動,藉以相對於玻璃基板而水平移動,如箭號D所指示。 如圖4所示’外力施加裝置34係設計成包括一第二冷 卻器38 ’用以冷卻玻璃基板中之目標線1 3之終止末端處或 其附近。第二冷卻器3 8包含一空氣源(未圖示),用以供應 壓縮空氣、以及一位於玻璃基板11上方之空氣喷嘴39,使 得從空氣源供應出之壓縮空氣傾斜地吹至玻璃基板丨i。 下文中將說明前述玻璃基板1丨之切割設備之操作。 首先’移轉玻璃基板11至圖3與4所示之一位置,亦 即’使目標線1 3正好位於加熱器1 4上方,且使玻璃基板11 不鄰接於空氣喷嘴27之位置。 ' 然後’降低墊部35至玻璃基板11上,其吸住玻璃基板 11,藉以水平地固定玻璃基板11於前述位置。 然後’如圖5所示,藉由單元3 〇之輪形切劃器2 9,起 初先破裂玻璃基板11之第一末端表面15。詳言之,轉動中 之輪形切割器29被壓至第一末端表面15中之目標線13與第 一末端表面15之交叉處,隨而,輪形切割器29向下移動, 藉以線性刮擦玻璃基板1 1之第一末端表面1 5。藉由起初先 破裂或到擦第一末端表面15,可平順且精確地發展裂痕 4〇,即使第一末端表面丨5具有微小的裂縫亦然。 然後,如圖6所示,外力施加裝置34施加一力至破蹲Page 19 469262 V. Description of the invention (16) The glass substrate 11 is pressed down 11 °, and the first part 35 and the first roller 37 are driven by a driving part (not shown) included in the external force applying device 34. As a result, it moves upward and downward relative to the glass substrate 11 as indicated by the clear number C. The first roller 36 is also driven by the driving unit to move horizontally relative to the glass substrate, as indicated by arrow D. As shown in Fig. 4, the 'external force applying device 34 is designed to include a second cooler 38' for cooling at or near the termination end of the target line 13 in the glass substrate. The second cooler 38 includes an air source (not shown) for supplying compressed air, and an air nozzle 39 located above the glass substrate 11 so that the compressed air supplied from the air source is blown obliquely to the glass substrate 丨 i . The operation of the cutting apparatus for the aforementioned glass substrate 1 will be described below. First, 'the glass substrate 11 is moved to one of the positions shown in Figs. 3 and 4, that is,' the target line 13 is positioned just above the heater 14 and the glass substrate 11 is not adjacent to the position of the air nozzle 27. 'Then' lower the pad portion 35 onto the glass substrate 11 and hold the glass substrate 11 to thereby horizontally fix the glass substrate 11 at the aforementioned position. Then, as shown in Fig. 5, the first end surface 15 of the glass substrate 11 is initially broken by the wheel cutter 29 of the unit 30. In detail, the rotating cutter 29 is pressed to the intersection of the target line 13 and the first end surface 15 in the first end surface 15. Then, the wheel cutter 29 moves downward to scrape the glass linearly. The first end surface 15 of the substrate 1 1. By breaking or rubbing the first end surface 15 at first, the crack 40 can be developed smoothly and accurately, even if the first end surface 5 has a minute crack. Then, as shown in FIG. 6, the external force applying device 34 applies a force to the squat

46 92 62 五、發明說明(17) 基板11之第·一末端表面16中目標線13之終止末端處。詳古 之,第一滚子36被壓至固定的玻璃基板11之第二末端表面 16 ’且第二滾子37被壓至玻璃基板11之上表面2〇上。 藉由第一滾子36施加一力至目標線13之終止末端處之 原因為:當裂痕40發展至目標線13之終止末端時,發展裂 痕4 0用之熱應力降低,因此,必需施加一力至目標線丨3之 終止末端’以玻璃基板11之裂開表面裂得更開。 藉由第二滾子37施加一力至玻璃基板Η之上表面2〇之 原因係為防止玻璃基板丨丨於第二末端表面16附近向上弯 曲’該玻璃基板11上形成有—電路圖案。倘若玻璃基板^ 於第二末端表面1 6處向上彎曲,則加熱器丨4無法均勻加熱 玻璃基板11。 然後,藉由加熱器1 4加熱目標線1 3,且同時,藉由第 一冷卻器3 8冷卻目標線1 3之終止末端,使得目標線丨3之終 止末端不被加熱。詳言之,加熱器移動單元21向上移動',、 隨後,加熱器1 4接觸目標線1 3 ,且同時,壓縮空氣經由空 氣喷嘴39向下吹至玻璃基板。既然加熱器14總是由板片^ 簧22向上推,故加熱器14可緊密接觸玻璃基板u之下表面 1 2,即使下表面丨2不平坦。因此,加熱器丨4可有效地 加熱玻璃基板1 1。 藉由使用加熱器14以前 力產生於目標線13處β所產 相對側上產生向外的張力C, 裂痕或刮擦形成於第一末端 述方法加熱目標線13,使熱應 生的熱應力接者於目標線13之 如圖7所示。所以,既然初始 表面15處,所產生的張力^使46 92 62 V. Description of the invention (17) The terminating end of the target line 13 in the first end surface 16 of the substrate 11. In detail, the first roller 36 is pressed to the second end surface 16 'of the fixed glass substrate 11 and the second roller 37 is pressed to the upper surface 20 of the glass substrate 11. The reason why a force is applied to the termination end of the target line 13 by the first roller 36 is that when the crack 40 develops to the termination end of the target line 13, the thermal stress for developing the crack 40 is reduced, so it is necessary to apply a The end of the force reaching the target line 3 is further cracked by the cracked surface of the glass substrate 11. The reason for applying a force to the upper surface 20 of the glass substrate 藉 by the second roller 37 is to prevent the glass substrate 丨 from bending upward near the second end surface 16 ′. A circuit pattern is formed on the glass substrate 11. If the glass substrate ^ is bent upward at the second end surface 16, the heater 4 cannot uniformly heat the glass substrate 11. Then, the target line 13 is heated by the heater 14 and at the same time, the end end of the target line 13 is cooled by the first cooler 3 8 so that the end end of the target line 3 is not heated. In detail, the heater moving unit 21 moves upward ', and subsequently, the heater 14 contacts the target line 1 3, and at the same time, the compressed air is blown down to the glass substrate through the air nozzle 39. Since the heater 14 is always pushed upward by the plate spring 22, the heater 14 can closely contact the lower surface 12 of the glass substrate u, even if the lower surface 2 is uneven. Therefore, the heater 4 can effectively heat the glass substrate 1 1. By using the heater 14 to generate an external tension C on the opposite side of the target line 13 produced by β, cracks or scratches are formed on the first end to heat the target line 13 to cause thermal stress. The receiver is connected to the target line 13 as shown in FIG. 7. So, since the initial surface is 15

469262 五、發明說明(18) 玻璃基板11中之裂痕40沿著目標線13發展。 此外’既然藉由第二冷卻器3 8冷卻目標線1 3之終止末 端附近’裂痕40絕不會從目標線丨3之終止末端處發展,亦 即較接近玻璃基板11之第二末端表面16之末端,即使微小 的裂痕產生於玻璃基板11之第二末端表面16亦然。 然後’感測器1 7偵測沿著目標線〗3發展的裂痕4〇之頭 部。依據感/則器1 7所完成之偵測結果,冷卻器1 §部分冷卻 玻璃基板11。舉例而言,移動單元丨9與感測器丨7最初被定 位成:使從感測器1 7之光束源25射出之束在遠離玻璃基板 U之第一末端表面15約l〇min之位置處反射。當加熱器14 首次接觸玻璃基板11時,光束源2 5開始發射束,且繼續發 射束直到玻璃基板n被完全切割。 、’’麄而’當裂痕4 〇以前述方法開始沿著目標線1 3發展於 玻璃基板11中—時’位於初始位置的感測器2 7摘測裂痕之 ϊϋι圖7顯示感測器17偵測裂痕4G之頭部。當感測器Π 2^ 之頭部時,冷卻器18使壓縮空氣經由空氣喷嘴 τ ^ f由使用冷卻器18部分冷卻玻璃基板11之面積D處, 附近之玻璃基糾之溫度梯度,促:J痕 然後為了與裂痕40之發展一致地移轉點d,狡如话 tg19移向筮-古,山* 又符,移動單 弟一末如表面1 6。詳言之,當感測器1 7彳i π π 40之頭部暗,弒 〜叫益i Μ貞測裂痕 ^ λ „ ’ 移動單元1 9向前移動至感測器1 7不i hb丨5,ι 痕40之頭郁,Bg(不再偵測裂 頌P且停止於該位置。然後,當感測器1?再次偵469262 V. Description of the invention (18) The crack 40 in the glass substrate 11 develops along the target line 13. In addition, 'since the vicinity of the termination end of the target line 1 3 is cooled by the second cooler 38, the crack 40 will never develop from the termination end of the target line 3, that is, closer to the second end surface 16 of the glass substrate 11. Even if a minute crack is generated on the second end surface 16 of the glass substrate 11. The 'sensor 17 then detects the head of the crack 40 which develops along the target line [3]. According to the detection results completed by the sensor 17, the cooler 1 § partially cools the glass substrate 11. For example, the mobile unit 9 and the sensor 7 are initially positioned so that the beam emitted from the beam source 25 of the sensor 17 is at a position about 10 minutes away from the first end surface 15 of the glass substrate U. Everywhere reflection. When the heater 14 contacts the glass substrate 11 for the first time, the beam source 25 starts to emit a beam, and continues to emit the beam until the glass substrate n is completely cut. When the crack 4 starts to develop in the glass substrate 11 along the target line 1 3 as described above, when the sensor 2 is located at the initial position, the sensor 2 is located in the initial position. FIG. 7 shows the sensor 17 Detect cracked 4G head. When the head of the sensor Π 2 ^, the cooler 18 allows compressed air to pass through the air nozzle τ ^ f to partially cool the area D of the glass substrate 11 using the cooler 18, and the temperature gradient of the nearby glass substrate corrects: J mark is then moved to point d in accordance with the development of crack 40, so cg tg19 is moved to 筮 -gu, mountain * is also a symbol, and the single brother is as surface 16 as it is. In detail, when the head of the sensor 1 7 彳 i π π 40 is dark, 弑 ~ is called the i Μ 贞 裂 测 ^ λ „'The mobile unit 1 9 moves forward to the sensor 1 7 not i hb 丨5, ι Mark 40, Yu, Bg (No more detection of Psalm P and stop at this position. Then, when sensor 1? Detects again

第22頁 469262Page 22 469262

淠=展t的裂痕40之頭部時,移動單元19再次向前移動。 如則所述’移動單元丨9依隨裂痕4〇之發展而重複地停止及 運轉。據此,與感測器1γ 一起移動的冷卻器18總是冷卻玻 璃基板11中之正在發展的裂痕4 〇之頭部附近,可促進裂·痕 40之發展。 依據玻璃基板11之厚度與玻璃基板11被加熱器1 4加熱 之程度’裂痕40之發展速率得不同於所期望的速率,或有 時得分止一特定的時間週期,舉例而言如1 〇秒。在此一例 子中’從冷卻器18射出的壓縮空氣之量依據裂痕4〇之發展 而調整。 當感測器1 7偵測出裂痕40發展至目標線1 3之終止末端 時,感測器1 7停止其感測操作,且冷卻器1 8亦停止其冷卻 操作。移動單元1 9回復至其初始位置。因此,切割玻璃基 板11之細作結束。 在前述實施例中,當目標線1 3被加熱器1 4加熱時,第 二冷卻器3 8冷卻目標線1 3之終止末端,俾不增加目標線1 3 之終止末端處之溫度。或者,加熱器1 4得設計成加熱目標 線1 3之終止末端至小於目標線1 3之其他部分之程度,在此 例子中’不再需要預備第二冷卻器38。When 淠 = head of the crack 40, the moving unit 19 moves forward again. As described above, the 'moving unit 9' is repeatedly stopped and operated as the crack 40 develops. Accordingly, the cooler 18 moving with the sensor 1γ always cools the vicinity of the head of the developing crack 40 in the glass substrate 11 to promote the development of the crack 40. According to the thickness of the glass substrate 11 and the degree to which the glass substrate 11 is heated by the heater 14, the development rate of the crack 40 is different from the desired rate, or sometimes it is scored for a specific time period, such as 10 seconds . In this example, the amount of the compressed air ejected from the cooler 18 is adjusted according to the development of the crack 40. When the sensor 17 detects that the crack 40 has developed to the termination end of the target line 13, the sensor 17 stops its sensing operation, and the cooler 18 also stops its cooling operation. The mobile unit 19 returns to its initial position. Therefore, the fine work of cutting the glass substrate 11 is finished. In the foregoing embodiment, when the target line 13 is heated by the heater 14, the second cooler 38 cools the termination end of the target line 13 and does not increase the temperature at the termination end of the target line 13. Alternatively, the heater 14 may be designed to heat the terminating end of the target line 13 to the extent that it is smaller than other portions of the target line 13 and in this example, 'the second cooler 38 is no longer needed.

第23頁 4 6 9 2 6 2 圖式簡單說明 圖1係顯示將由習知方法所切割的易碎平板之透視 圖。 圖2係圖1所示的易碎平板之平面圖。 圖3係顯示依據本發明之一實施例,玻璃基板之切割 設備之前視圖。 圖4係圖3所示的設備之平面圖。 圖5係顯示一單元之側視圖,該單元起初先破裂玻璃 基板之末端表面。 圖6係顯示外力施加裝置之側視圖。 圖7係顯示藉由圖3與4所示的設備破裂玻璃基板之平 面 圖。 C 符號說明〕 1 易碎平板 2 目標線 3 加熱器 4 末端表面 5 垂直溝槽 6 上表面 7 溝槽 8 早兀 11 玻璃基板 12 下表面 13 目標線Page 23 4 6 9 2 6 2 Brief Description of Drawings Figure 1 shows a perspective view of a fragile plate to be cut by conventional methods. FIG. 2 is a plan view of the fragile flat plate shown in FIG. 1. FIG. Fig. 3 is a front view of a cutting device for a glass substrate according to an embodiment of the present invention. FIG. 4 is a plan view of the apparatus shown in FIG. 3. Fig. 5 shows a side view of a unit which initially fractured the end surface of a glass substrate. Fig. 6 is a side view showing an external force applying device. Fig. 7 is a plan view showing a glass substrate broken by the apparatus shown in Figs. C Symbol description] 1 Fragile plate 2 Target line 3 Heater 4 End surface 5 Vertical groove 6 Upper surface 7 Groove 8 Early 11 Glass substrate 12 Lower surface 13 Target line

第24頁 46 92 62 圖式簡單說明 14 加熱器 15 第一末端表面 16 第一末端表面 17 感測器 18 冷卻器 19 移動單元 20 上表面 21 加熱器移動單元 22 板片彈簧 23 加熱器支持件 24 基部 25 光束源 26 光偵測器 27 空氣噴嘴 28 軌條 29 輪形切割器 30 初期裂痕導入單元 31 驅動軸 32 柱體 33 驅動部 34 外力施加裝置 35 墊部 36 第一滾子 37 第二滚子Page 24 46 92 62 Brief description of drawings 14 Heater 15 First end surface 16 First end surface 17 Sensor 18 Cooler 19 Moving unit 20 Upper surface 21 Heater moving unit 22 Leaf spring 23 Heater support 24 base 25 beam source 26 light detector 27 air nozzle 28 rail 29 wheel cutter 30 initial crack introduction unit 31 drive shaft 32 cylinder 33 drive unit 34 external force applying device 35 pad 36 first roller 37 second roller child

第25頁Page 25

469262 圖式簡單說明 38 第二冷卻器 39 空氣喷嘴 40 裂痕469262 Simple illustration 38 Second cooler 39 Air nozzle 40 Crack

(III 第26頁(III p. 26

Claims (1)

469262__ 六、申請專利範圍 1· 一種玻璃基板之切割方法,藉由加熱或冷卻該玻璃基 板’俾於該玻璃基板中造成熱應力且使該玻璃基板破裂, 包含下列步驟: (a) 在該玻璃基板中之一裂痕發展之前,加熱一線, 該玻璃基板將沿著該線被切割;以及 (b) 部分冷卻該破螭基板中已發展的裂痕之頭部附 近。 2 _如申㈣專利範圍第1項之玻璃基板之切割方法,、其中該 步驟(a)與(b)係同時進行。 3.如申請專利範圍第丨項之玻璃基板之切割.方法,更包含 下列步驟: (C)感測裂痕之該頭部之位置;以及 .(d )依據々步驟(a )之結果,控制該玻璃基板被部分 4. 如申請專利If is @ 1 , 圍第1至3項中任一項之玻璃基板之切割 方法,更包含一歩驟,、 . ..^ 鄉(e):施加一力至該玻璃基板中之該 線之末端,該力促推# ^ _ 進該玻璃基板谷易被切割。 5. 如申請專利範圚银t . L ^ 固第1至3項中任一項之玻璃基板之切割 方法’其中§亥在步跡r * β Λ Λ w上 乂弥(过)中該線之末端被加熱,使該末端 處溫度之增加小於兮& N „ 、4線之其他部分處溫度之增加。469262__ VI. Patent application scope 1. A method for cutting a glass substrate, by heating or cooling the glass substrate to cause thermal stress in the glass substrate and cause the glass substrate to crack, including the following steps: (a) in the glass Before one of the cracks in the substrate develops, a line is heated and the glass substrate will be cut along the line; and (b) partly cools near the head of the crack that has developed in the broken substrate. 2 _ The method for cutting glass substrates in item 1 of the patent application, wherein steps (a) and (b) are performed simultaneously. 3. The method of cutting glass substrates according to item 丨 of the patent application, further comprising the following steps: (C) sensing the position of the head of the crack; and (d) controlling according to the result of step (a) The glass substrate is partially 4. If the application for a patent If is @ 1, the cutting method of the glass substrate according to any one of items 1 to 3, further includes a step,... ^ Township (e): Apply a force To the end of the line in the glass substrate, the force pushes # ^ _ into the glass substrate valley to be easily cut. 5. For example, the patent application for the method of cutting glass substrates in any of items 1 to 3 of t. L ^ solid ', where § 在 is on the line r * β Λ Λ w on the line (pass) in the line The end is heated so that the increase in temperature at the end is less than the increase in temperature at the other parts of line 4. 27頁 419262 ------------------- 六、申請專利範圍 6· 一種玻璃基板之切割方法,藉由加熱或冷卻該玻璃基 板’俾造成熱應力於該玻璃基板中且使該玻璃基板破裂, 包含下列步驟: (a ) 在該玻璃基板中之一裂痕發展之前,加熱一線, 該玻璃基板將沿著該線被切割,其中藉由一加熱器於接觸 該線時加熱該玻璃基板,以及 (b)藉由一設計成可沿著該線移動的冷卻器,部分冷 卻該玻璃基板中已發展的裂痕之頭部附近。 7. 如申請專利範圍第6項之玻璃基板之切割方法,其中該 步驟(a)與(b)係同時進行。 8. 如申請專利範圍第6項之玻璃基板之切割方法,更包含 下列步驟: (c )藉由一感測器,感測該裂痕之該頭部之位置;以 及 (d)依據一從該感測器送出之訊號,控制該冷卻器之 移動速度。 9. 如申請專利範圍第6至8項中任一項之玻璃基板之切割 方法’更包含一步驟(e):施加一力至該破璃基板中之該 線之末端,該力促使該玻璃基板容易被切割。Page 27, 419262 ------------------- 6. Scope of patent application 6. A method for cutting a glass substrate, by heating or cooling the glass substrate, causing thermal stress to The step of breaking the glass substrate in the glass substrate includes the following steps: (a) before a crack in the glass substrate develops, heating a line, the glass substrate will be cut along the line, and a heater is used to Heating the glass substrate when contacting the line, and (b) partially cooling the vicinity of the head of the developed crack in the glass substrate by a cooler designed to move along the line. 7. The cutting method of the glass substrate according to item 6 of the application, wherein steps (a) and (b) are performed simultaneously. 8. The cutting method of the glass substrate according to item 6 of the patent application scope, further comprising the following steps: (c) sensing the position of the head of the crack by a sensor; and (d) The signal sent by the sensor controls the moving speed of the cooler. 9. The method for cutting a glass substrate according to any one of claims 6 to 8 of the patent application scope further includes a step (e): applying a force to the end of the line in the broken glass substrate, the force urging the glass The substrate is easily cut. 第28頁 46 9 2 6 2 六、申請專利範圍 10. 如申請專利範圍第6至8項中任一項之玻璃基板之切割 方法’其中在該步驟(a)中,該線之末端被加熱,使該末 端處溫度之增加小於該線之其他部分處溫度之增加。 11. 一種玻璃基板之切割方法,藉由一加熱器或一冷卻器 區域性加熱或冷卻該玻璃基板,俾於該玻璃基板中造成熱 應力且使該玻璃基板破裂,包含下列步驟: (a) 藉由一感測器,感測產生於該玻璃基板中的一裂 痕之頭部之位置;以及 (b) 依據一從該感測器送出之訊號,控制該冷卻器之 位置。 1 2 _如申請專利範圍第1 1項之玻璃基板之切割方法,更包 含一步驟:加熱一線之末端,該玻璃基板將沿著該線被切 割,使該末端處溫度之增加小於該線之其他部分處溫度之 增加。 13_——種玻璃基板之切割方法,藉由一加熱器或一冷卻器 區域性加熱或冷卻該玻璃基板,俾於該玻璃基板中造成熱 應力且使該玻璃基板破裂,包含一步驟:施加一力至該玻 璃基板中之§亥線之末端’该力促使該玻璃基板容易被切 割。 14.如申請專利範圍第1 3項之玻璃基板之切割方法,更包Page 28 46 9 2 6 2 6. Application for patent scope 10. The method for cutting a glass substrate as described in any one of items 6 to 8 of the scope of patent application 'wherein in step (a), the end of the wire is heated So that the increase in temperature at the end is less than the increase in temperature at other parts of the line. 11. A method for cutting a glass substrate, which heats or cools the glass substrate locally by a heater or a cooler, causes thermal stress in the glass substrate and breaks the glass substrate, and includes the following steps: (a) The position of the head of a crack generated in the glass substrate is sensed by a sensor; and (b) the position of the cooler is controlled based on a signal sent from the sensor. 1 2 _If the method for cutting a glass substrate according to item 11 of the scope of patent application, it further includes a step: heating the end of a line, the glass substrate will be cut along the line, so that the temperature increase at the end is less than that of the line Increase in temperature at other parts. 13 _—— A method for cutting a glass substrate. The glass substrate is heated or cooled locally by a heater or a cooler, which causes thermal stress in the glass substrate and breaks the glass substrate. It includes a step: applying a A force to the end of the § helical line in the glass substrate 'This force causes the glass substrate to be easily cut. 14. If the glass substrate cutting method of item 13 of the scope of patent application, more package 第29頁 4 i i 2 6 2 六、申請專利範圍 含一步驟:加熱該線之末端,使該末端處溫度之增加小於 該線之其他部分處溫度之增加。 15. 一種玻璃基板之切割設備,藉由加熱或冷卻該玻璃基 板,俾造成熱應力於該玻璃基板中且使該玻璃基板破裂, 包含: (a)—加熱器,用以沿著一線加熱該玻璃基板’該坡 璃基板將沿著該線被切割; (b ) —感測器,用以偵測在該玻璃基板中一發展的裂 痕之頭部; (c) 一冷卻器,用以部分冷卻該玻璃基板中該裂痕之 該頭部附近; (d) —第一單元,用以沿著該線移轉該感測器;以及 (e) —第二單元,用以沿著該線移轉該冷卻器。 16. 如申請專利範圍第1 5項之玻璃基板之切割設備’其中 該第一單元之動作亦如同該第二單元,藉以沿著該線移轉 該感測器與該冷卻器。 17·如申請專利範圍第1 5項之玻璃基板之切割設備,其中 該感測器包含: (bl) —光束源,用以放射一朿至該玻璃基板’且其 位於該玻璃基板下方;以及 (b2) —光偵測器,用以接收該束,該光偵測器係被Page 29 4 i i 2 6 2 6. Scope of patent application Contains a step: heating the end of the line so that the temperature increase at the end is less than the temperature increase at other parts of the line. 15. A cutting device for a glass substrate, by heating or cooling the glass substrate, causing thermal stress in the glass substrate and breaking the glass substrate, comprising: (a) a heater for heating the glass along a line; Glass substrate 'The sloped glass substrate will be cut along the line; (b) — a sensor to detect the head of a developing crack in the glass substrate; (c) a cooler to partially Cooling near the head of the crack in the glass substrate; (d) — a first unit to move the sensor along the line; and (e) — a second unit to move along the line Turn the cooler. 16. For example, the cutting device for glass substrate of item 15 of the application scope, wherein the operation of the first unit is also the same as that of the second unit, so that the sensor and the cooler are moved along the line. 17. The cutting device for a glass substrate according to item 15 of the scope of patent application, wherein the sensor includes: (bl)-a light source for emitting a beam to the glass substrate 'and located below the glass substrate; and (b2) — light detector for receiving the beam, the light detector is 469262 六、申請專利範圍 設置於接收已穿過該玻璃基板且已於該玻璃基板之一表面 反射之一束。 18. 如申請專利範圍第1 5項之玻璃基板之切割設備,其中 該感測器包含: (bl) —光束源,用以放射一束至該玻璃基板’且其 位於該玻璃基板下方; (b2) —第一光偵測,用以接收該束’該光偵測器係 被設置於接收已穿過該玻璃基板且已於該玻璃基板之上表 面反射之一束;以及 (b3) —第二光偵測,用以接收該束,該光偵測器係 被設置於接收已於該玻璃基板之下表面反射之一束; 該裂痕之該頭部之偵測係基於該第一與第二光彳貞?則胃 之輸出間之比。 19. 如申請專利範圍第1 5項之玻璃基板之切割設備’其中 該冷卻器包含: (c 1 ) 一空氣源,用以供應壓縮空氣; (c2) —第一空氣喷嘴’該壓縮空氣係經由該第一空 氣喷嘴吹至該玻璃基板;以及 (c3) —第二空氣噴嘴,該壓縮空氣係經由該第二空 氣喷嘴吹至該玻璃基板,該第二空氣喷嘴之位置係該第一 空氣喷嘴之關於該線的相對側。469262 6. Scope of patent application Set to receive a beam that has passed through the glass substrate and has been reflected on one surface of the glass substrate. 18. The cutting device for a glass substrate according to item 15 of the scope of patent application, wherein the sensor comprises: (bl) — a beam source for radiating a beam to the glass substrate 'and it is located below the glass substrate; ( b2)-the first light detection for receiving the beam; the light detector is arranged to receive a beam that has passed through the glass substrate and has been reflected on the upper surface of the glass substrate; and (b3)- A second light detector is used to receive the beam. The light detector is configured to receive a beam that has been reflected on the lower surface of the glass substrate; the head of the crack is detected based on the first and Second light zhenzhen? The ratio between the output of the stomach. 19. The cutting device for glass substrates such as item 15 of the scope of application for patent, wherein the cooler includes: (c 1) an air source for supplying compressed air; (c2)-the first air nozzle; the compressed air system Blown to the glass substrate through the first air nozzle; and (c3) a second air nozzle, the compressed air is blown to the glass substrate through the second air nozzle, and the position of the second air nozzle is the first air The opposite side of the nozzle with respect to the line. 469262 ^申請專利範" 20. 如申請專利範圍第1 9項之玻璃基板之切割設備,其中 該第二空氣噴嘴之位置係對稱於該第一空氣喷嘴。 21. 如申請專利範圍第15至20項中任一項之玻璃基板之切 割設備’其中該加熱器係於該線處線接觸於該玻璃基板之 加熱器。 22. 如申請專利範圍第15至20項中任一項之玻璃基板之切 割設備’其中該加熱器正好位於該玻璃基板下方,使該加 熱器加熱該玻璃基板之下表面。 23. 如申請專利範圍第22項之玻璃基板之切割設備,更包 含一加熱器移動單元’用以朝上且朝下移動該玻璃基板下 方的該加熱器。 2 4.如申請專利範園第2 2項之玻璃基板之切割設備,更包 含一彈性體,該加熱器經由該彈性體而連接於該加熱器移 動單元。 2 5.如申請專利範圍第24項之玻璃基板之切割設備,其中 該彈性體係一板片彈簧。 26.如申請專利範圍第15至20項中任一項之玻璃基板之切 割設備,更包含一外力施加裝置’用以施加一外力至該玻469262 ^ Application for patents 20. If the glass substrate cutting equipment of item 19 of the patent application scope, wherein the position of the second air nozzle is symmetrical to the first air nozzle. 21. The cutting device for a glass substrate according to any one of claims 15 to 20, wherein the heater is a heater which is in line contact with the glass substrate at the line. 22. The cutting device for a glass substrate according to any of claims 15 to 20, wherein the heater is located just below the glass substrate, so that the heater heats the lower surface of the glass substrate. 23. The cutting device for a glass substrate, such as the item 22 of the scope of patent application, further comprises a heater moving unit 'for moving the heater below and below the glass substrate. 2 4. The cutting equipment for glass substrates according to item 22 of the patent application park further comprises an elastomer, and the heater is connected to the heater moving unit via the elastomer. 25. The cutting device for a glass substrate as claimed in claim 24, wherein the elastic system is a leaf spring. 26. The cutting device for a glass substrate according to any one of claims 15 to 20, further comprising an external force applying device 'for applying an external force to the glass 469262 六、申請專利範圍 璃基板中該線之終止末端處,朝向該線之頭部。 2 7.如申請專利範圍第2 6項之玻璃基板之切割設備,其中 該外力施加裝置包含: 一塾部,用以吸住該玻璃基板,俾固持該玻璃基板; 以及 滾子’用以施加該外力至該玻璃基板。 28.如申請專利範圍第15至20項中任一項之玻璃基板之切 割3又備’更包含一單元’用以在初期先破裂該玻璃基板之 一末端表面,該線係從該末端表面開始。 2 9.如申請專利範圍第28碩之玻璃基板之切割設備,其中 該單元包含一輪形切割器。 3 0·如申句專利範圍第1 5至2 0項中任一項之玻璃基板之切 割設備’更包含一第二冷卻器,用以冷卻該玻璃基板中之 該線之終止末端處或其附近。 31.如申清專利範圍第3〇項之玻璃基板之切割設備,其中 該第二冷部器包含:—空氣源,用以供應壓縮空氣;以及 一位於該玻璃基板上方之空氣噴嘴,使從該空氣源供應的 壓縮空氣經由該空氣噴嘴吹至該玻璃基板。469262 VI. Scope of patent application At the termination end of the line in the glass substrate, it faces the head of the line. 2 7. The cutting device for a glass substrate according to item 26 of the patent application scope, wherein the external force applying device includes: a crotch for holding the glass substrate and holding the glass substrate; and a roller 'for applying The external force is applied to the glass substrate. 28. If the glass substrate is cut in any one of the 15th to 20th of the scope of the patent application, 3 is also prepared to further include a unit for breaking an end surface of the glass substrate at an early stage, and the line is from the end surface Start. 2 9. The cutting device for a glass substrate according to claim 28, wherein the unit includes a wheel cutter. 30. The cutting device of the glass substrate according to any of the items 15 to 20 in the scope of the patent claim further includes a second cooler for cooling the end of the line in the glass substrate or the nearby. 31. The cutting device for a glass substrate according to claim 30, wherein the second cold part includes:-an air source for supplying compressed air; and an air nozzle located above the glass substrate, so that The compressed air supplied from the air source is blown to the glass substrate through the air nozzle. 第33頁Page 33
TW089105870A 1999-03-31 2000-03-28 Method of cutting glass substrate and apparatus for doing the same TW469262B (en)

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