535 2TWF.DOC/002 A7 B7 五、發明說明（/) 本發明是有關於一種測試系統，且特別是有關於—種 週邊兀件連接（Peripheral Component Interconnect ;以下簡 稱PCI)卡測試系統，具有可替換式之pCI插槽子卡，且無 須打開電腦機殻即可進行PCI卡測試，並可同時測試四片 或更多片PCI待測卡，大量節省測試時間。 在現今科技資訊發達的社會中，由於電腦工業的快速 發展’使其可被廣泛地應用在多媒體、網路、儲存資料、 訊息傳遞…等多用途上，因此電腦幾乎已成爲各行各業所 不可或缺的基本工具之一，甚至已快達到家家戶戶都至少 擁有一部電腦的地步。 隨著電腦功能的日趨完善，各種功能的介面卡也隨之 產生且日趨複雜及多樣化，也因此，市售的介面卡品質不 一。假如消費者購買到有瑕疵的介面卡，此時很有可能因 爲此瑕疵介面卡而破壞到電腦主機或其週邊設備的結構， 影響所及’輕則造成電腦當機而使用壽命縮短，重則造成 電腦主機整個燒毀。 再者’對於介面卡的製造廠商而言，在介面卡組設完 成後測試時，必須利用一台電腦主機及其週邊設備來測 試’如此才能控制其品質。然而，在測試時，極有可能造 成測試主機的損壞，而且在測試期間，係直接將待測介面 卡插在電腦主機板上的介面擴充槽內，然後再開啓電腦主 機執行開機程式後，才可進行測試。 此外’目前週邊元件連接(PCI)卡廠商一般是採用主機 板所提供的PCI匯流排(Bus)插槽(PCI Bus 0)來進行PCI卡 本紙張尺度適用中國國家標準（CNS)A4規格（21〇 X 297公楚） n n n n n 1 n l_i I n n n · ϋ ϋ _1 n n I n n I J Γ + (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製535 2TWF.DOC / 002 A7 B7 V. Description of the invention (/) The invention relates to a test system, and in particular to a kind of peripheral component interconnect (Peripheral Component Interconnect; hereinafter referred to as PCI) card test system. The replacement pCI slot daughter card can be used for PCI card testing without opening the computer case, and can test four or more PCI cards under test at the same time, greatly saving test time. In today's society with advanced scientific and technological information, due to the rapid development of the computer industry, it can be widely used in multimedia, networking, storage of data, information transmission, etc., so computers have become almost impossible for all walks of life. One of the basic tools that is missing is even reaching the point where every household has at least one computer. With the improvement of computer functions, interface cards with various functions have been produced and become more complex and diversified. Therefore, the quality of commercially available interface cards varies. If a consumer purchases a defective interface card, it is very likely that the defective interface card will damage the structure of the computer host or its peripheral equipment at this time, which will affect the impact of the computer, which will cause the computer to crash and shorten the service life. The entire computer was burned. Furthermore, 'for the manufacturer of the interface card, when the interface card set is completed for testing, a computer host and its peripheral equipment must be used for testing' so as to control its quality. However, during the test, it is very likely to cause damage to the test host. During the test, the interface card to be tested is directly inserted into the interface expansion slot on the computer motherboard, and then the computer host is turned on to run the boot program. Can be tested. In addition, at present, peripheral component connection (PCI) card manufacturers generally use the PCI bus (Bus) slot (PCI Bus 0) provided by the motherboard to carry out the PCI card. The paper size applies to the Chinese National Standard (CNS) A4 specification (21 〇X 297 public chu) nnnnn 1 n l_i I nnn
4 BQSBS 5352TWF.DOC7002 A7 B7 五、發明說明) 功能檢測。因爲PCI匯流排規格不支援熱拔插，所以每次 更換待測卡時均需關閉電腦主機的電源。然而，假若待測 卡設計不當，此時將會對主機板造成損壞。雖然目前市面 上的PCI延伸保護卡可以解決上述問題，但仍有以下使用 上的不便之處： (1) 仍需打開電腦機殼才能進行PCI卡檢測。· (2) 採單片檢測設計，若要一次檢測多片PCI +，則 需購買多片延伸保護卡，且PCI匯流排插槽不敷使用。4 BQSBS 5352TWF.DOC7002 A7 B7 V. Description of the invention) Function test. Because the PCI bus specifications do not support hot-swap, the power of the host computer must be turned off every time the card under test is replaced. However, if the card under test is not designed properly, it will cause damage to the motherboard at this time. Although the current PCI extended protection card on the market can solve the above problems, there are still the following inconveniences in use: (1) It is still necessary to open the computer case to perform the PCI card detection. · (2) The single-chip detection design is adopted. If you want to detect multiple pieces of PCI + at one time, you need to purchase multiple pieces of extended protection cards, and the PCI bus slot is insufficient.
(3) 標準PCI匯流排插槽間距過小，不便於經常性PCI 卡拔插。 (4) 標準PCI匯流排插槽在經過數十次的拔插使用後 會有接觸不良的問題。 (5) 電腦機殻容易擋到待卡的對外信號接頭。 有鑒於此，本發明提出一種PCI卡測試系統，包括一(3) The pitch of standard PCI bus slots is too small, which is not convenient for frequent PCI card insertion and removal. (4) The standard PCI bus slot will have poor contact after being used for dozens of times. (5) The computer case can easily block the external signal connector to be stuck. In view of this, the present invention provides a PCI card test system, including a
主介面、一目標介面、一可替換式之PCI插槽子卡與一保護 電路=上述主介面配置於電腦主機內部，且在主介面上配 置有第一 PCI-PCI橋接晶片。目標介面配置於電腦主機外 部，用以做爲數片PCI待測卡之測試模組平台，在目標介面 上配置有第二PCI-PCI橋接晶片與PCI擴充槽，第二PCI-PCI '橋接晶片透過第一 PCI匯流排連接至第一 PCI-PCI橋接晶 片，而PCI擴充槽透過第二PCI匯流排連接至第二PCI-PCI 橋接晶片，且PCI擴充槽具有數個第一PCI卡插槽。可替換 式之PCI插槽子卡可插入於PCI擴充槽上，PCI插槽子卡具 有對應於？CI擴充槽之第一PCI卡插槽數量之數個第二PCI 4 1本紙張尺度適用中國國家標準（CNS)A4規格（210 x 297公釐） : ----I ---------裝---------訂 ---------^線 .. ί (請先閲讀背面·之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作杜印製 經濟部智慧財產局員工消費合作社印製 4 β 0 6 99 5352TWF.DOC/002 pj B7 五、發明說明（多） 卡插槽，藉以使PCI待測卡插入PCI插槽子卡之第二PCI卡 插槽中來進行PCI卡測試過程’當PCI插槽子卡有接觸不良 的問題時，可立即以一新的PCI插槽子卡來取代此PCI插槽 子卡，有效防止測試錯誤的產生。保護電路具有短路及過 電流保護的功能’其亦配置於目標介面上’並連接介於第 二PCI-PCI橋接晶片與PCI擴充槽之間，用以當具有錯誤之 PCI待測卡插入PCI插槽子卡時，阻斷電腦主機與PCI待測 卡間之所有電壓及信號，以保護PCI卡測試系統避免遭受到 損害。 本發明提出之PCI卡測試系統，因拔插PCI待測卡之目 標介面係配置於電腦主機外部，故無須打開電腦機殼即可 進行PCI卡測試。此外，由於目標介面（測試模組平台）內含 可替換式之PCI插槽子卡，故可以最經濟的方法解決PCI插 槽接觸不良的問題，且其係採外露設計，故有利於PCI待 測卡測試與除錯。而且，本發明之PCI卡測試系統可一次 測試四片或更多片PCI待測卡，視所使用之橋接晶片而 定’而僅佔用電腦主機一個PCI插槽。舉例來說，當第一 與第二PCI-PCI橋接晶片係使用編號爲21152之卩(：1-?(：1橋 接晶片時，則配置於目標介面上之PCI擴充槽具有4個PCI 卡插槽’藉以使PCI卡測試系統可一次測試4片PCI待測卡； 當第一與第二PCI-PCI橋接晶片係使用編號爲21150之PCI_ PCI橋接晶片時，則配置於目標介面上之PCI擴充槽具有9 個PCI卡插槽，藉以使PCI卡測試系統可—次測試9片PCI待 測卡。更且，本發明可達到抽換PCI待測卡時無須關閉電 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐） (請先閲讀背面t注意事項再填寫本頁)The main interface, a target interface, a replaceable PCI slot daughter card, and a protection circuit = the main interface described above is arranged inside the host computer, and a first PCI-PCI bridge chip is arranged on the main interface. The target interface is configured outside the host computer as a test module platform for several PCI cards under test. A second PCI-PCI bridge chip and a PCI expansion slot, and a second PCI-PCI 'bridge chip are configured on the target interface. The first PCI bus is connected to the first PCI-PCI bridge chip, the PCI expansion slot is connected to the second PCI-PCI bridge chip through the second PCI bus, and the PCI expansion slot has several first PCI card slots. The replaceable PCI slot daughter card can be inserted into the PCI expansion slot. Does the PCI slot daughter card correspond to? CI expansion slot, the number of the first PCI card slot, the number of the second PCI 4 1 This paper size applies to the Chinese National Standard (CNS) A4 specification (210 x 297 mm): ---- I ------ --- Equipment --------- Order --------- ^ line .. ί (Please read the precautions on the back and fill in this page first) Employees ’Intellectual Property Bureau, Ministry of Economic Affairs, Consumer Cooperation Du printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, printed by the Consumer Cooperatives 4 β 0 6 99 5352TWF.DOC / 002 pj B7 V. Description of the invention (multiple) card slots, so that the PCI test card can be inserted into the first slot of the PCI slot daughter card Two PCI card slots to perform the PCI card test process' When a PCI slot daughter card has a poor contact problem, a new PCI slot daughter card can immediately replace this PCI slot daughter card, effectively preventing test errors The generation. The protection circuit has the function of short-circuit and over-current protection. 'It is also configured on the target interface' and is connected between the second PCI-PCI bridge chip and the PCI expansion slot. It is used to insert a wrong PCI test card into the PCI socket. When the slot card is inserted, all voltages and signals between the host computer and the PCI card to be tested are blocked to protect the PCI card test system from damage. The PCI card test system provided by the present invention, because the target interface for plugging and unplugging the PCI card to be tested is configured outside the host computer, the PCI card test can be performed without opening the computer case. In addition, because the target interface (test module platform) contains a replaceable PCI slot daughter card, it can solve the problem of poor contact of the PCI slot in the most economical way, and it uses an exposed design, which is conducive to PCI standby. Test card testing and debugging. Moreover, the PCI card test system of the present invention can test four or more PCI cards under test at a time, depending on the bridge chip used, and occupies only one PCI slot of the host computer. For example, when the first and second PCI-PCI bridge chips use the 152 (: 1-? (: 1 bridge chip with the number 21152), the PCI expansion slot configured on the target interface has four PCI card slots. Slot 'to allow the PCI card test system to test 4 PCI cards under test at a time; when the first and second PCI-PCI bridge chips use the PCI_PCI bridge chip with the number of 21150, the PCI expansion on the target interface is configured The slot has 9 PCI card slots, so that the PCI card test system can test 9 PCI test cards at one time. Moreover, the invention can achieve that the PCI test card does not need to be turned off when replacing the PCI test card. The paper size is applicable to Chinese national standards (CNS) A4 size (210 X 297 mm) (Please read the precautions on the back before filling this page)
460699 5 3 52TWF.DOC/002 經濟部智慧財產局員工消費合作杜印製 A7 B7 五、發明說明（（p ) 腦主機電源的目的，有效節省測試時間。 爲讓本發明之上述和其他目的、特徵、和優點能更明 顯易懂，下文特舉較佳實施例，並配合所附圖式，作詳細 說明如下： 圖式之簡單說明： 第1圖繪示的是依照本發明一較佳實施例的一種PCI 卡測試系統的方塊圖；以及 第2圖繪示的是依照本發明另一較佳實施例的—種 PCI卡測試系統的方塊圖。 圖式之標號說明： 10 : PCI卡測試系統 .12 :主介面 14 :目標介面 16、24、40、42 : PCI 匯流排 18、20 : PCI-PCI 橋接晶片 22 : PCI擴充槽 26 : PCI插槽子卡 28 :保護電路 30a〜30d : PCI卡插槽 實施例 爲了因應目前PCI卡設計與測試生產的需要，本案言兌 明書提出一種PCI卡測試系統（PCI PARSER)簡稱ρχ_π， 以有效解決現今pci卡測試時所面臨的問題，並將詳細描 述於下。 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公釐） =0 45 (請先閲讀背面之注意事項再填寫本頁)460699 5 3 52TWF.DOC / 002 The consumer cooperation of the Intellectual Property Bureau of the Ministry of Economic Affairs Du printed A7 B7 V. Description of the invention ((p) The purpose of the brain host power supply, effectively saving test time. In order to allow the above and other purposes of the present invention, The features, advantages, and advantages can be more clearly understood. The preferred embodiments are described below in detail with the accompanying drawings as follows: Brief description of the drawings: Figure 1 shows a preferred implementation according to the present invention. Example is a block diagram of a PCI card test system; and FIG. 2 shows a block diagram of a PCI card test system according to another preferred embodiment of the present invention. Reference numerals of the drawings: 10: PCI card test System. 12: Main interface 14: Target interface 16, 24, 40, 42: PCI bus 18, 20: PCI-PCI bridge chip 22: PCI expansion slot 26: PCI slot daughter card 28: Protection circuit 30a ~ 30d: In order to respond to the requirements of current PCI card design and test production, the present proposal proposes a PCI card test system (PCI PARSER) for short ρχ_π to effectively solve the problems faced by current PCI card testing, and Will be described in detail The paper size is applicable to Chinese National Standard (CNS) A4 (210 X 297 mm) = 45 (Please read the precautions on the back before filling this page)
經濟部智慧財產局員工消費合作社印製 4 6 0 699 5352TWF.DOC/002 pj B7 五、發明說明（$) 請參照第1圖，其繪示的是依照本發明一較佳實施例 的一種PCI卡測試系統的方塊圖。 本發明之PCI卡測試系統10包括一主介面（Host Interface)12 與一目標介面（Target Interface)14，其中主介 面12係配置於一電腦主機（未繪示出）內部，而目標介面14 係做爲測試模組平台，配置於此電腦主機（未繪示出）外 部，且主介面I2透過一PCI匯流排16連接至目標介面14。 在主介面12與目標介面14上分別配置有一 PCI-PCI 橋接晶片18與20，兩者並透過PCI匯流排16相互連接， 藉以透過此PCI匯流排16相互傳遞資料訊息，其中， PCI-PCI橋接晶片18與20係爲同型式之橋接晶片。舉例 來說，本發明之PCI卡測試系統10係採用符合PCI規格 2.2的橋接晶片，例如是編號爲21152(可支援4片PCI卡) 或編號爲21150(可支援9片PCI卡）的PCI-PCI橋接晶片。 換句話說，若PCI-PCI橋接晶片18與20係使用編號爲 21152的PCI-PCI橋接晶片時，則配置於目標介面14上之 PCI擴充槽22具有4個PCI卡插槽如圖中標號30a〜30d所 示，藉以使PCI卡測試系統10可一次測試4片PCI待測卡； 若PCI-PCI橋接晶片18與20係使用編號爲21150的PCI-PCI橋接晶片時，則配置於目標介面14上之PCI擴充槽22 具有9個PCI卡插槽，藉以使PCI卡測試系統10可一次測 試9片PCI待測卡；其中，PCI擴充槽22透過一 PCI匯流 排24連接至PCI-PCI橋接晶片20。此外，本發明之PCI 卡插槽係設計爲加大間隙之結構，以方便於PCI卡拔插。 本紙張尺度適用中國國家標準（CNS〉A4規格（210 X 297公釐） -----I--------裝---------訂---------線 (請先閱讀背面t注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 460699 53 52TWF.DOC/002 幻 B7 五、發明說明（t7 ) 値得注Μ的是’在PCI擴充槽22上可插入有一可替 換式之PCI插槽子卡26，其具有對應於PCI擴充槽22之 PCI卡插槽數量之複數個PCI卡插槽(舉例來說，若PCI擴 充槽22具有4個PCI卡插槽30a〜30d，則PCI插槽子卡26 也具有對應PCI卡插槽30a〜30d之四個PCI卡插槽（未繪示 出）），藉以使這些PCI待測卡插入PCI插槽子卡之PCI卡 插槽中來進行PCI卡測試過程。因此，一般是將PCI待測 卡插入此PCI插槽子卡26中來進行測試，如此當PCI插槽 子卡26經過多次的PCI待測卡拔插過程而發生PCI插槽子 卡26接觸不良的問題時，可立即以一新的PCI插槽子卡 來取代該PCI插槽子卡26，有效防止測試錯誤的產生。 此外，更明白來說，PCI卡測試系統1〇還包括一保護 電路28，配置於目標介面14上，並分別透過PCI匯流排 40與42連接至PCI-PCI橋接晶片20與PCI擴充槽22’此 時，PCI卡測試系統10之連接架構如第2圖所示。保護電 路28具有短路及過電流保護的功能’用以當具有錯誤(Bug) 之PCI待測卡插入PCI插槽子卡26時’保護PCI卡測5式 系統10避免遭受到損害。舉例來說’當插入PCI插槽子卡 26中之PCI待測卡具有錯誤時’此時有可能造成過電流或 不當雜訊的情形，爲了避免因此具有錯誤的PCI待測卡影 響到電腦主機及其週邊設備，當保護電路28發現來自此 PCI待測卡的訊號有不正常現象時’此時保護電路28會立 即處於斷路狀態，以防止此不正常訊號傳送至電腦主機及 其週邊設備而導致這些設備遭受到損害。 本紙張尺度適用中國國家標準（CNS)A4規格（210 X 297公愛） ---------------^ii-------訂·--------線 - (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 4 60 699 53 52TWF.DOC/002 幻 B7 五、發明說明（q) 再者，如同其他PCI擴充槽，當電腦主機電源處於待 命狀態時，本發明之PCI卡測試系統10可隔離介於電腦主 機與PCI待測卡間之所有電壓及信號。而上述隔離方法， 可使用配置於PCI卡測試系統10上之機械式開關或透過軟 體來控制執行。當然，可一次隔離所有PCI待測卡或僅隔 離部分PCI待測卡，視使用者之需要而定。換言之，在測 試及特徵過程期間，以此種可選擇PCI待測卡的隔離方 法，將可避免重複開啓電腦主機電源及重新執行開機程 序，如此將可節省大量的測試花費時間。 另，本發明所提出之PCI卡測試系統10，可用於任何 32位元PCI相容裝置，且對於PCI卡的測試來說，可在每 一測試週期期間，同時處理多片PCI待測卡。此外，本發 明之PCI卡測試系統支援標準PCI-PCI橋接晶片架構(例 如：21152或21150橋接晶片等），藉以在一測試週期期間， 使用一 PCI擴充槽中即可一次測試4片PCI待測卡(使用 2 1152橋接晶片）或一次可測試9片PCI待測卡(使用21150 橋接晶片）。 綜上所述，本發明具有以下的優點： (1) 因拔插PCI待測卡之目標介面係配置於電腦主機 外部，故無須打開電腦機殼即可進行PCI卡測試。. (2) 可一次測試四片或更多片PCI卡，視所使用之橋 接晶片而定’而僅佔用電腦主機一個PCI插槽。 (3) 因PCI插槽間隙加大，故有利於PCI卡拔插。 (4) 測試模組平台（目標介面）內含可替換式PCI插槽 本紙張尺度適用中國國家標準（CNS)A4規格（210 x 297公釐） ------^--------裝---------訂---------線 (請先閱讀背面之注咅？事項再填寫本頁) 經濟部智慧財產局員工消費合作杜印製 4 60 699 53 52TWF.DOC/002 A7 ____ B7 五、發明說明（汐） 子卡，以最經濟的方法解決PCI插槽接觸不良的問題。 (5) 測試模組平台採外露設計’利於PCI待測卡測試 與除錯。 (6) 抽換PCI待測卡時，無須關閉電腦主機的電源。 (7) 四個PCI插槽四種電壓（5V、3.3V、12V、-12V) 皆採獨立過電流保護設計，以保護PCI待測卡與測試模組 平台。 (8) 於電腦端可監控及切換測試模組平台上各個PCI 插槽上的各種電壓。 雖然本發明已以較佳實施例揭露如上，然其並非用以 限定本發明，任何熟習此技藝者，在不脫離本發明之精神 和範圍內，當可作各種之更動與潤飾’因此本發明之保護 範圍當視後附之申請專利範圍所界定者爲準。 本紙張尺度適用中國國家標準（CNS)A4規格（21〇 X 297公釐） ^£0 (請先閲讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 4 6 0 699 5352TWF.DOC / 002 pj B7 V. Description of the Invention ($) Please refer to FIG. 1, which shows a PCI according to a preferred embodiment of the present invention Block diagram of a card test system. The PCI card test system 10 of the present invention includes a host interface 12 and a target interface 14, wherein the host interface 12 is disposed inside a computer host (not shown), and the target interface 14 is As a test module platform, it is arranged outside the host computer (not shown), and the main interface I2 is connected to the target interface 14 through a PCI bus 16. A PCI-PCI bridge chip 18 and 20 are respectively arranged on the main interface 12 and the target interface 14, and the two are connected to each other through a PCI bus 16 so as to transmit data messages to each other through the PCI bus 16. Among them, the PCI-PCI bridge The wafers 18 and 20 are bridge wafers of the same type. For example, the PCI card test system 10 of the present invention uses a bridge chip that complies with the PCI specification 2.2, such as a PCI-No. 21152 (which can support 4 PCI cards) or a 21150 (which can support 9 PCI cards). PCI bridge chip. In other words, if the PCI-PCI bridge chips 18 and 20 use the PCI-PCI bridge chip numbered 21152, the PCI expansion slot 22 disposed on the target interface 14 has four PCI card slots, as shown by reference numeral 30a in the figure. As shown in ~ 30d, the PCI card test system 10 can test 4 PCI cards under test at one time; if the PCI-PCI bridge chips 18 and 20 are using the PCI-PCI bridge chip numbered 21150, they are arranged on the target interface 14 The above PCI expansion slot 22 has 9 PCI card slots, so that the PCI card test system 10 can test 9 PCI cards under test at one time; among them, the PCI expansion slot 22 is connected to the PCI-PCI bridge chip through a PCI bus 24 20. In addition, the PCI card slot of the present invention is designed with a structure to increase the clearance to facilitate insertion and removal of the PCI card. This paper size applies to Chinese national standards (CNS> A4 size (210 X 297 mm) ----- I -------- installation --------- order -------- --- line (please read the notes on the back before filling this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 460699 53 52TWF.DOC / 002 Magic B7 V. Description of Invention (t7) A replaceable PCI slot daughter card 26 can be inserted into the PCI expansion slot 22, which has a plurality of PCI card slots corresponding to the number of PCI card slots of the PCI expansion slot 22 (for example, if the PCI expansion slot 22 has four PCI card slots 30a ~ 30d, then the PCI slot daughter card 26 also has four PCI card slots (not shown) corresponding to the PCI card slots 30a ~ 30d, so that these PCIs are to be tested The card is inserted into the PCI card slot of the PCI slot daughter card to perform the PCI card test process. Therefore, the PCI card to be tested is generally inserted into the PCI slot daughter card 26 for testing, so when the PCI slot daughter card 26 When the problem of poor contact of the PCI slot daughter card 26 occurs after repeated insertion and removal of the PCI card to be tested, a new PCI slot daughter card 26 can be immediately used to replace the PCI slot daughter card 26 to effectively prevent the test. In addition, to make it clearer, the PCI card test system 10 also includes a protection circuit 28 configured on the target interface 14 and connected to the PCI-PCI bridge chip 20 and the PCI-PCI bridge chip 20 through the PCI buses 40 and 42 respectively. PCI expansion slot 22 'At this time, the connection architecture of the PCI card test system 10 is shown in Figure 2. The protection circuit 28 has the function of short-circuit and over-current protection' to be used when a PCI card under test with a bug is inserted into the PCI Slot daughter card 26 'protects the PCI card test type 5 system 10 from damage. For example,' when the PCI card under test inserted in the PCI slot daughter card 26 has an error 'may cause overcurrent or In the case of improper noise, in order to prevent the wrong PCI test card from affecting the host computer and its peripheral devices, when the protection circuit 28 finds that the signal from the PCI test card is abnormal, the protection circuit 28 will Immediately in a disconnected state to prevent the abnormal signal from being transmitted to the host computer and its peripheral equipment and causing damage to these equipment. This paper size applies to China National Standard (CNS) A4 specification (210 X 297 public love) ---- - ---------- ^ ii ------- Order · -------- Line- (Please read the notes on the back before filling out this page) Employees of the Intellectual Property Bureau of the Ministry of Economic Affairs Printed by the consumer cooperative 4 60 699 53 52TWF.DOC / 002 Magic B7 V. Description of the invention (q) Furthermore, like other PCI expansion slots, the PCI card test system 10 of the present invention can be isolated when the host computer power supply is in a standby state. All voltages and signals between the host computer and the PCI card under test. The above isolation method can be controlled by a mechanical switch configured on the PCI card test system 10 or through software. Of course, you can isolate all PCI cards to be tested at one time or only some PCI cards to be tested, depending on the needs of the user. In other words, during the test and characterization process, this isolation method with optional PCI card to be tested can avoid repeatedly powering on the host computer and re-running the boot process, which will save a lot of test time. In addition, the PCI card test system 10 proposed by the present invention can be used for any 32-bit PCI-compatible device, and for the test of the PCI card, multiple PCI cards to be tested can be processed simultaneously during each test cycle. In addition, the PCI card test system of the present invention supports a standard PCI-PCI bridge chip architecture (for example, 21152 or 21150 bridge chip, etc.), so that during a test cycle, 4 PCI cards can be tested at a time using a PCI expansion slot. Card (using 2 1152 bridge chip) or 9 PCI cards under test (using 21150 bridge chip) at a time. In summary, the present invention has the following advantages: (1) Because the target interface for plugging and unplugging the PCI test card is configured outside the host computer, the PCI card test can be performed without opening the computer case. (2) Four or more PCI cards can be tested at one time, depending on the bridge chip used 'and occupying only one PCI slot of the host computer. (3) Because the PCI slot gap is increased, it is conducive to PCI card insertion and removal. (4) Test module platform (target interface) contains replaceable PCI slots. The paper size is applicable to China National Standard (CNS) A4 (210 x 297 mm) ------ ^ ----- --- Equipped --------- Order --------- line (Please read the note on the back? Matters before filling out this page) Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs for consumer cooperation 4 60 699 53 52TWF.DOC / 002 A7 ____ B7 V. Description of the invention (Xi) daughter card, the most economical method to solve the problem of poor contact of PCI slots. (5) The exposed design of the test module platform is conducive to the testing and debugging of the PCI card under test. (6) It is not necessary to turn off the power of the host computer when replacing the PCI card to be tested. (7) Four PCI slots and four voltages (5V, 3.3V, 12V, -12V) are designed with independent overcurrent protection to protect the PCI card under test and the test module platform. (8) On the computer side, various voltages on each PCI slot on the test module platform can be monitored and switched. Although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various modifications and retouches without departing from the spirit and scope of the present invention. Therefore, the present invention The scope of protection shall be determined by the scope of the attached patent application. This paper size applies to Chinese National Standard (CNS) A4 (21〇 X 297 mm) ^ £ 0 (Please read the precautions on the back before filling this page)