TW450866B - Carrier head with an flexible membrane and an edge load ring - Google Patents

Carrier head with an flexible membrane and an edge load ring Download PDF

Info

Publication number
TW450866B
TW450866B TW89113625A TW89113625A TW450866B TW 450866 B TW450866 B TW 450866B TW 89113625 A TW89113625 A TW 89113625A TW 89113625 A TW89113625 A TW 89113625A TW 450866 B TW450866 B TW 450866B
Authority
TW
Taiwan
Prior art keywords
substrate
ring
edge load
pressure
edge
Prior art date
Application number
TW89113625A
Other languages
Chinese (zh)
Inventor
Steven M Zuniga
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of TW450866B publication Critical patent/TW450866B/en

Links

Abstract

A carrier head for chemical mechanical polishing includes a base and a flexible membrane. A lower surface of the flexible membrane provides a substrate receiving surface of a substrate. The lower surface includes a first surface to apply a first pressure to a first portion of the substrate. A second surface surrounding the first surface applies a second pressure on a second portion of the substrate. An edge load ring surrounds the second surface. A lower surface of the edge load ring provides a third surface to apply a third pressure to a third portion of the substrate surrounding the second portion.

Description

4508 66 經濟部智慧財產局貝Η消費合作社印製 A7 B7 五、發明說明() 發明领域: 本發明大體上係關於基材的化學機械研磨,及更特定 地,係關於一具有用於化學機械研磨之彈性薄膜的研磨 頭。 發明背景: 積體電路典型地係藉由導體,半導體,及絕緣層之依 序的沉積而被形成於基材,特別是矽晶圓,上。在每一層 被沉積之後,其被蝕刻以產生電路特徵(feature)。在一系 列的層被依序沉積及蝕刻之後,該基材之最外或最上端的 表面,即該基材之裸露的表面,會變為非平面。此不平坦 的表面對於積體電路製造處理中之微影成像步驟會形成 問題。因此,週期性地對基材表面進行平坦化是有需要 的。 化學機械研磨(CMP)為可被接受之平坦化方法之一 β 此平坦化方法典型地需要該基材被安裝在一載具或研磨 上。該基材之裸露的表面被設置成抵住一轉動的研磨整。 該研磨墊可以是一"標準的"或一固定黏附的墊子。一標準 的研磨墊具有一耐久的粗糙表面,而一固定黏附墊則具有 黏著粒子被固定於一包容媒介中《該研磨頭提供一可控制 的負載’即壓力,至該基材上用以將其整抵該研磨整。某 些研磨頭包括一彈性薄膜其提供一安裝表面給該基材,及 一維持環用以將該基材保持在該安裝表面底下。在該彈性 薄膜背後的一室的加壓或柚空控制著該基材上的負載。— 第2Τ 本紙張尺度適用t國Β家標準(CNS)A4规格(210 * 297公釐) ' ---— (請先閲讀背面之注意事項再填寫本頁) 訂---------線· 450866 A7 B7 五、發明說明() 包括至少一化學反應劑之研磨泥漿及研磨顆粒(如果一標 準研磨墊被使用的話)被供應至該研磨墊的表面。 該CMP處理的有效性可由其研磨率,及由該基材表面 上所得到的緻密度(沒有小尺寸的粗糙度)及平坦度(沒有 大尺寸的地形(topography))來加以判斷。研磨率,缴密度 及平坦度是由墊及泥漿的組合,基材與墊之間的相對速 度,及將該基材壓抵該墊的力量等所決定的。 在CMP中所遭遇到的問題為俗稱的”邊緣效應",即在 基材邊緣處的研磨率不同於在基材中心處的研磨率。該邊 緣效應通常會導致在基材的周邊(如一 200公釐的晶園之 最外圍的5至10公釐處)被過度研磨(即過多的基材物質被 去除掉)。 發明目的及概诚: 在一態樣中,本發明係關於一化學機械研磨的由磨 頭。該研磨頭具有一基座’一彈性薄膜延伸於該基座底下 以界定一可加壓的室,一邊緣負載環及一維持環。該彈性 薄膜提供一基材的基材接受表面並包括·一第一表面以施 加一第一壓力至該基材的一第一部分。一第二表面圏圍該 第一表面用以施加一第二壓力至該基材的一第二部分,且 該邊緣負載環圏園該第二表面。該邊緣負載環的一下表面 提供一第三表面用以施加一第三壓力至該基材之圈固該 第二部分的第三部分上。該維持環圈圍該邊緣負載環用以 將該基材保持在該第一,第二及第三表面底下。 第3頁 本紙張尺度適用中a國家標準(CNS)A4規格(210 X 297公釐) <請先M讀背面之注意事項再填寫本頁)4508 66 Printed by Ai B7, B7 Consumer Cooperative, Intellectual Property Bureau of the Ministry of Economic Affairs 5. Field of the Invention: The present invention relates generally to chemical mechanical polishing of substrates, and more specifically, to a method for chemical mechanical polishing. Grinding head for ground elastic film. BACKGROUND OF THE INVENTION Integrated circuits are typically formed on a substrate, particularly a silicon wafer, by sequential deposition of conductors, semiconductors, and insulating layers. After each layer is deposited, it is etched to create a circuit feature. After a series of layers are sequentially deposited and etched, the outermost or uppermost surface of the substrate, that is, the exposed surface of the substrate, becomes non-planar. This uneven surface can cause problems for lithography imaging steps in integrated circuit manufacturing processes. Therefore, it is necessary to periodically planarize the surface of the substrate. Chemical mechanical polishing (CMP) is one of the accepted planarization methods. Β This planarization method typically requires the substrate to be mounted on a carrier or polishing. The exposed surface of the substrate is configured to resist a rotating abrasive finish. The polishing pad may be a " standard " or a fixedly adhered pad. A standard abrasive pad has a durable rough surface, while a fixed adhesive pad has adhesive particles fixed in an accommodating medium. The abrasive head provides a controlled load, i.e. pressure, onto the substrate to apply It is correct for this grinding. Some abrasive heads include an elastic film that provides a mounting surface to the substrate, and a retaining ring to hold the substrate under the mounting surface. The pressure or emptiness of a chamber behind the elastic film controls the load on the substrate. — 2T This paper size is applicable to country B standard (CNS) A4 specifications (210 * 297 mm) '----- (Please read the precautions on the back before filling out this page) Order ----- -Line · 450866 A7 B7 V. Description of the invention () Grinding slurry and abrasive particles (if a standard polishing pad is used) including at least one chemical reactant are supplied to the surface of the polishing pad. The effectiveness of the CMP process can be judged by its polishing rate and the density (no roughness of small size) and flatness (no topography of large size) obtained on the surface of the substrate. The polishing rate, density, and flatness are determined by the combination of pad and mud, the relative speed between the substrate and the pad, and the force with which the substrate is pressed against the pad. The problem encountered in CMP is commonly known as "edge effect", that is, the grinding rate at the edge of the substrate is different from the grinding rate at the center of the substrate. This edge effect usually results in the periphery of the substrate (such as a The 200 mm crystal garden's outermost 5 to 10 mm) is excessively ground (that is, excessive substrate material is removed). Purpose and sincerity of the invention: In one aspect, the present invention relates to a chemical Grinding head for mechanical grinding. The grinding head has a base, an elastic film extending under the base to define a pressurizable chamber, an edge load ring and a retaining ring. The elastic film provides a substrate The substrate receiving surface includes a first surface to apply a first pressure to a first portion of the substrate. A second surface surrounds the first surface to apply a second pressure to a first portion of the substrate. The second surface of the edge load ring. The lower surface of the edge load ring provides a third surface for applying a third pressure to the third part of the second ring for securing the substrate. The maintenance ring is negative around the edge The ring is used to keep the substrate under the first, second, and third surfaces. Page 3 This paper size applies to a national standard (CNS) A4 specification (210 X 297 mm) < Please read M first (Notes on the back then fill out this page)

-~^l.x I I I l· I I I I 經濟部智慧財產局貝工消费合作杜印製 450866-~ ^ l.x I I I l · I I I I Printed by Shellfish Consumer Cooperation, Intellectual Property Bureau, Ministry of Economy 450866

經濟部智慧財產局員工消费合作杜印ιί 玉、發明說明() 本明的實施可包含以下的—或多項特徵一環形壁 部可圏園並連接該彈性薄膜的第_表面。該壁部可具有一 下表面及上表面,該下表面界定該第二表面^ 一隔離環 可具有一下表面及一上表面。該隔離環的上表面被安排成 接受一負載以回應該室的加壓,及該隔離環的下表面可鄰 接該壁部的上表面’藉以將該隔離環的上表面所承接到的 負載傳遞該壁部。該隔離環可被設置於該邊緣負載環與該 壁部(間,或設置在該壁部上與該邊緣負載環的一頂部大 致水平地對齊。該隔離環的上表面的—表面積可大於或大 致等於該隔離環的下表面的表面積。該邊緣負載環包括一 頂部其延伸於該壁件的上表面之上並界定該邊緣負載環 的一上表面’且該上表面可被設計成接受一負載的形狀用 以回應該室的加壓並施加該第二壓力至該基材的第二部 分上及施加第三壓力至該基材的第三部分上。該邊緣負載 環的上表面的一表面積可大於或小於該邊緣負載環的下 表面的表面積。 在另一態樣中,本發明係關於化學機械研磨的一研磨 頭。該研磨頭具有一基座,一彈性薄膜延伸於該基座底下 以界定一可加壓的室,一邊緣負載環及一維持環β該彈性 薄膜的一下表面提供一第一表面以施加一第一壓力至該 基材的一第一部分。該邊緣負載環圈圍該第一表面並具有 一上表面及一下表面。該邊緣負載環圏圍的下表面提供一 第二表面以施加一第二壓力至該基材的一第二部分上β該 邊緣負載環圏困的上表面的表面積至少是該邊緣負載環 第4頁 本紙張尺度適用中a國家標準(CNS)A4規格(210 X 297公漦) ------^----:--------r---訂---------線------ <諳先閲讀背面之注意事項再填寫本頁) 4 5 0866 A7 B7 經濟部智慧財產局員工消费合作社印製 五、發明說明( 圏圍的下表面的表面積的50%。該維持環圈圍該邊緣負載 環圈圍用以將該基材保持在該第一及第二表面底下。 本發明的實施可包含以下的一或多項待徵。該彈性薄 膜包括一環形壁部提供一第三表面以施加—第三壓力至 該基材之位於該第一部分與該第二部分之間的—第三部 分上。一隔離環被置於該壁部的上表面之上且與該邊緣負 載環合作以提供該第三壓力至該基材的第三部分上。 在另一態樣中’本發明係關於化學機械研磨的一研磨 頭。該研磨頭具有一基座,一彈性薄膜延伸於該基座底下 以界定一可加壓的室,一邊緣負載環及一維持環。該彈性 薄膜的一下表面提供一基材的基材接受表面,該下表面包 括_第一表面用以施加一第一壓力至該基材的一第一部 分及一第二表面用以施加一第二壓力至該基材之圈圍該 第一部分的一第二部分上。該逢緣負載環圏圍該第二表 面,及該邊緣負載環的一接觸表面提供一第三表面以施加 一第三負載至該基材之圈困該第二部分的第三部分上。該 維持環圏圍該邊緣負載環用以將該基材保持在該第一,第 二及第三表面底下。 在另一態樣中,本發明係關於一種研磨一基材的方 法。在該方法中’ 一基材被設置成於一研磨表面接觸,一 第一壓力藉由一彈性薄膜的一第—部分而被施加至該基 材的一第一部分上,_第二壓力藉由該彈性薄膜的一第二 部分而被施加至該基材的一第二部分上,及一第三壓力藉 由一邊緣負載環而被施加至該基材的一第三部分上。Employees ’cooperation with the Intellectual Property Bureau of the Ministry of Economic Affairs, Du Yin, Jade, Invention Description (1) The implementation of the present invention may include the following—or a number of features—an annular wall may be gardened and connected to the first surface of the elastic film. The wall portion may have a lower surface and an upper surface, and the lower surface defines the second surface. An isolation ring may have a lower surface and an upper surface. The upper surface of the spacer ring is arranged to receive a load in response to the pressure of the chamber, and the lower surface of the spacer ring can abut the upper surface of the wall portion, thereby transferring the load received by the upper surface of the spacer ring. The wall section. The isolation ring may be disposed between the edge load ring and the wall (or disposed on the wall portion and aligned substantially horizontally with a top of the edge load ring. The surface area of the upper surface of the isolation ring may be greater than or Approximately equal to the surface area of the lower surface of the spacer ring. The edge load ring includes a top that extends above the upper surface of the wall member and defines an upper surface of the edge load ring ', and the upper surface can be designed to accept a The shape of the load is used to respond to the pressure of the chamber and apply the second pressure to the second portion of the substrate and a third pressure to the third portion of the substrate. A portion of the upper surface of the edge load ring The surface area may be larger or smaller than the surface area of the lower surface of the edge load ring. In another aspect, the present invention relates to a grinding head for chemical mechanical grinding. The grinding head has a base, and an elastic film extends from the base. The bottom defines a pressurizable chamber, an edge load ring and a retaining ring β. The lower surface of the elastic film provides a first surface to apply a first pressure to a first portion of the substrate. The edge The edge load ring surrounds the first surface and has an upper surface and a lower surface. The lower surface of the edge load ring provides a second surface to apply a second pressure to a second portion of the substrate. The surface area of the trapped upper surface of the edge load ring is at least the edge load ring. Page 4 This paper is applicable to a national standard (CNS) A4 specification (210 X 297 cm) ------ ^ ---- : -------- r --- Order --------- line ------ < 谙 Read the notes on the back before filling this page) 4 5 0866 A7 B7 Economy Printed by the Ministry of Intellectual Property Bureau's Consumer Cooperatives V. Invention Description (50% of the surface area of the lower surface of the enclosure. The retaining loop surrounds the edge load loop to maintain the substrate at the first and second Under the surface. The implementation of the present invention may include one or more of the following features. The elastic film includes an annular wall portion to provide a third surface to apply-a third pressure to the substrate between the first portion and the second portion Between-the third part. An isolation ring is placed over the upper surface of the wall and cooperates with the edge load ring to provide the Three pressures on the third part of the substrate. In another aspect, the invention is a grinding head for chemical mechanical grinding. The grinding head has a base, and an elastic film extends under the base to define A pressurizable chamber, an edge load ring and a retaining ring. The lower surface of the elastic film provides a substrate receiving surface of a substrate, and the lower surface includes a first surface for applying a first pressure to the substrate. A first portion and a second surface of the material are used to apply a second pressure to a second portion of the substrate surrounding the first portion. The edge load surrounds the second surface, and the edge load A contact surface of the ring provides a third surface to apply a third load to the third portion of the second portion trapped by the substrate. The retaining ring surrounds the edge load ring to hold the substrate at The first, second and third surfaces are underneath. In another aspect, the invention relates to a method for grinding a substrate. In the method, a substrate is disposed in contact with an abrasive surface, a first pressure is applied to a first portion of the substrate through a first-part of an elastic film, and a second pressure is applied by A second portion of the elastic film is applied to a second portion of the substrate, and a third pressure is applied to a third portion of the substrate through an edge load ring.

第S7T 本紙張尺度適用中國困家標準(CNS)A4規格(210 * 297公H ) —----- ---------^----OX---------- 訂---------線 t (請先闓讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消#合作社印製 _ 450866 A7 B7 五、發明說明() 本發明的實施可包含以下的一或多項優點。在一基材 的周邊處之過度研磨及研磨不足可藉由在該基材之經過 選擇的區域施加不同的麼力而被降低。 本發明之一或多個實施例的細節被示於附圈中及於 下文中被說明。本發明之其它的優點及特徵由以下包括圓 式及申請專利範圍在内的說明中將會變的很明顯。 圖式筋m說明: 第1圖為一化學機械研磨設備的分解立體圖。 第2圖顯示一基材的周邊在化學機械研磨方法下不一致的 研磨率β 第3圖顯示第2明中之不一致的研磨率可藉由沿著該基材 的徑向施加不同的麼力而被補償。 第4圖為一根據本發明之研磨賴的示意剖面圖办 第5圖為第4圖中之研磨頭的放大圖其賴示一邊緣負載 環- 第6蹰為第5圈中之研磨頭的弹性薄膜的剖面圖a 第7A圈為第5圈中之由磨頭的隔離環的剖面圓。 第7B-7D圖為第7A圖中之隔離環之不同實施例的剖面围》 第8圖為第5圖中之研磨頭的邊蟓負載環的剖面圖。 第9圖為根據本發明的一實施例之由磨頭的示意剖面圖。 第10圖為根據本發明的另一實施例之由磨頭的示意剖面 圖。 第6肓 本紙張尺度適用+ B國家標準(CNS)A4規格(210 X 297公釐) ----—.1 I 1Ί ---· 1 ---=----訂· I! I — ! *線 (請先閱讀背面之注寺¥項再填寫本頁) 4 5 08 6 6 A7 B7 經濟部智慧財產局員工消费合作社印製 五、發明說明() 圖號對照說明: 10 基材 20 化學機械研磨設 25 研磨站 27 輸送站 30 旋轉台 32 研磨整 40 研磨墊調整設備 50 泥漿 52 泥漿/沖洗臂 60 多頭旋轉塔 62 中心柱 64 旋轉塔軸 70 研磨頭系統 100 研磨頭 72 槽 74 驅動軸 76 研磨頭轉動馬達 68 旋轉塔蓋 102 外殼 104 基座 106 萬向機構 108 負載室 1 10 維持環 112 基材支撐組件 107 旋轉柏 130 垂直孔 1 32,1 34 通道 138 0形環 140 彈性薄膜 142 夹環 144 囊袋 146 通道 148 夾緊件 159 閥 150 萬向桿 152 撓性環 154 通道 160 滾動式薄膜 162 内夾環 164 外夾環 128 螺栓 124 底面 126 内表面 114 支撐結構 1 16 隔離環 118 彈性薄膜 第71Γ {請先閱讀背面之注意事項再填寫本頁) {3^----------訂---------線 _ 本紙張尺度適用中國國家標準<CNS)A4规格(210 * 297公釐)Article S7T This paper size is applicable to China Standard for Household Standards (CNS) A4 (210 * 297 male H) —----- --------- ^ ---- OX ------- --- Order --------- line t (please read the notes on the back before filling out this page) Staff Consumers Bureau of Intellectual Property, Ministry of Economic Affairs # Cooperative Society Printing_ 450866 A7 B7 V. Description of Invention () Implementations of the invention may include one or more of the following advantages. Excessive grinding and insufficient grinding at the periphery of a substrate can be reduced by applying different forces to selected areas of the substrate. Details of one or more embodiments of the invention are shown in the appendix and are explained below. Other advantages and features of the present invention will become apparent from the following description including the circular form and the scope of patent application. Description of the drawing rib m: FIG. 1 is an exploded perspective view of a chemical mechanical polishing equipment. Figure 2 shows the inconsistent polishing rate of the periphery of a substrate under the CMP method. Figure 3 shows the inconsistent polishing rate in the second example by applying different forces along the radial direction of the substrate. Be compensated. Figure 4 is a schematic cross-sectional view of a grinding head according to the present invention. Figure 5 is an enlarged view of the grinding head in Figure 4. It shows an edge load ring-No. 6 is for the grinding head in the fifth circle. Sectional view of the elastic film a The 7A circle is the circle of the 5th circle of the spacer ring by the grinding head. 7B-7D are cross-sectional views of different embodiments of the spacer ring in FIG. 7A. FIG. 8 is a cross-sectional view of the edge load ring of the grinding head in FIG. 5. Fig. 9 is a schematic cross-sectional view of a grinding head according to an embodiment of the present invention. Fig. 10 is a schematic sectional view of a grinding head according to another embodiment of the present invention. Article 6: This paper size applies + B National Standard (CNS) A4 specification (210 X 297 mm) ----—. 1 I 1Ί --- · 1 --- = ---- Order · I! I —! * Line (please read the note on the back ¥ item before filling out this page) 4 5 08 6 6 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention () Drawing number comparison description: 10 Substrate 20 Chemistry Mechanical polishing equipment 25 Grinding station 27 Conveying station 30 Rotary table 32 Grinding and finishing 40 Grinding pad adjustment equipment 50 Mud 52 Mud / washing arm 60 Multi-head rotating tower 62 Center column 64 Rotating tower shaft 70 Grinding head system 100 Grinding head 72 Slot 74 Drive shaft 76 Grinding head rotation motor 68 Rotating tower cover 102 Housing 104 Base 106 Gimbal mechanism 108 Load chamber 1 10 Maintenance ring 112 Substrate support assembly 107 Rotary cypress 130 Vertical hole 1 32, 1 34 Channel 138 0-ring 140 Elastic film 142 Clamp ring 144 Pouch 146 Channel 148 Clamp 159 Valve 150 Gimbal 152 Flexible ring 154 Channel 160 Rolling film 162 Inner clamp ring 164 Outer clamp ring 128 Bolt 124 Bottom surface 126 Inner surface 114 Support structure 1 16 Isolation ring 118 Elastic film 71Γ {Please read the precautions on the back before filling in this page) {3 ^ ---------- Order --------- line_ This paper applies Chinese national standards < CNS) A4 size (210 * 297 mm)

4 5 08 6 G Α7 Β7 經濟部智慧財產局負工消费合作社印製 五、發明說明() 120 邊緣負載環 121 基材支撐组件 210 中心部分 122 安裝表面 2 12 周邊部分 222 厚壁部分 218 薄壁部分 184 外表面 1 19b 下表面 196 上表面 198 外表面 204 内表面 226 級階部分 214 邊緣部分 190 可加壓室 220 弩曲部分 222a 上表面 222b 下表面 170 板片部分 172 5L 174 &緣部 176 唇部 180 邊緣 182 凸耳 119a 上表面 119c 基底 230 凸緣部 232 基部 234 平的下表面 236 上表面 238 下表面 240 可擠壓材質層 100, 研磨頭 200 支撐結構 12Γ 負載組件 118' 彈性薄膜 120' 邊緣負載環 222' 壁部 202 環形邊緣 1 16' 隔離環 226' 級階部分 230' 凸緣部分 236' 上表面 148' 唇部 190' 室 210' 中心部分 1 00" 研磨頭 300 支撐結構 第B頁 本紙張尺度適用令國國家標準(CNS)A4規格(210 * 297公釐) ------—;---------Γ—訂---------線 (請先閱讀背面之注意事項再填寫本頁) 4508 66 經濟部智慧財產局員工消費合作社印製 五、發明說明() 12 1” 負載組件 302 支撐薄膜 304 底板 306 側壁 308 支撐結構邊緣 145 囊袋 110" 維持環 3 10 邊緣 312 下表面 3 14 另一部分 3 16 内表面 3 18 外表面 320 中心部分 322 第一表面 2 3 4" 下表面 324 第二表面 A7 B7 發明#細說明\ 參照第1圖,一或多個基材將用一化學機械研磨(CMP) 設備20加以研磨。一類似的CMP設備的說明可在美國專利 第5,73 8,574號中被找到,該專利的整個揭示藉由此參照而 被併於本文中。 CMP設備20包括一系列的研磨站25及一輸送站27用 來裝卸基材。每一研磨站25都包括_旋轉台30,一研磨墊 32即被置於該旋轉台30上。如果該基材為一 8英吋(200公 釐)或12英吋(3 00公釐)直徑的圓盤的話,該旋轉台30及研 磨墊32的直徑將分別為20或30英吋》旋轉台30及研磨墊32 的直徑亦可以為20英吋,如果該基材10為一直徑6英吋 (150公釐)的圓盤的話。對於大多數的研磨處理而言,一旋 轉台屈動馬達(未示出)以3 000至200rpm的轉送來轉動該旋 轉台30’雖然較低或較高的轉送亦可被使用。每一研磨站 都可進一步包含一相關連的墊調整設備40以保持該研磨 第9ΤΓ 本紙張尺度適用中國國家摞準(CNS)A4規格(210 X 297公釐) 11 i IJ----1J l*rw^----l· I 丨—訂—-------線 1/K* (請先閱讀背面之注意事項再填寫本頁) 4 5 08 6 6 經濟部智慧財產局員工消f合作社印製 A7 ______B7______ 五、發明說明() 墊的研磨狀況。 一包含了 一流體(如用於氧化研磨中的去離子水)及一 pH值調整劑(如用於氧化研磨中的氫氧化鉀)的泥漿50經 由一泥漿/沖洗臂52而被供應至該研磨墊32的表面。如果研 磨墊32為一標準研磨墊的話,泥漿50還可包含研磨顆粒 (如用於氧化物研磨中的二氧化矽)。典型地,充足的泥聚 被提供以覆蓋及弄濕整個研磨墊32。泥漿/沖洗臂52包括數 個喷灑喷嘴(未示出)其在每一研磨及調整循環终了時提供 一高壓的研磨墊32沖洗液。 一可轉動的多頭轉塔60被一中心柱62所支撐並被一 轉塔馬達組件(未示出)繞著一轉塔軸64旋轉於該中心柱 上。多頭轉塔60包括四個以等角度間隔繞著該轉塔軸64安 裝在一轉塔安裝板66上的研磨頭系統70。其中的三個研磨 頭系統70將基材置於研磨站上。另一研磨頭系統則從該輸 送站接受一基材並將該基材送至該輸送站。該轉塔馬達可 讓該等研磨頭系統70及置於其上的基材繞著轉塔軸64沿 軌道移動於該等研磨站與該輸送站之間。 每一由磨頭系統70都包括一研磨頭〖〇〇。每一由磨頭 100都繞著自己的軸獨立地旋轉,且獨立地橫向震盪於形 成在轉塔支撐板66上的徑向槽72中。一研磨頭驅動軸74延 伸穿過該槽72以將一研磨頭轉動馬達76(藉由移走一轉塔 蓋68的四分之一來顯示)連結至該研磨頭丨〇〇。每一研磨頭 有一驅動軸及馬達。每一馬達及驅動軸可被支撐於一滑塊 (未示出)上,其可沿著該槽被一徑向驅動馬達驅動以橫向 第 107Γ 本紙張尺度適用中國0家標準(CNS)A4規格(210 * 297公釐) {請先閱讀背面之泫意事項再填寫本頁) -- 1---r--1 訂----it·線“ -J . 4508 6 6 A7 B7 五、發明說明() 地霡造該研磨頭'> 在實際的研磨期間,三個研磨頭被置於三個研磨站之 上。每一研磨頭100都將一基材降低至與一研磨墊32接觸 的位置。通常,研磨頭1 00將該基材保持在抵住該研磨替 32的位置上並在基材的整個背面上分佈一力量。該研磨頭 亦由驅動軸傳遞扭矩至該基材。 參照第2圖,一在CMP中所遭遇到的問題為在基材邊 緣處的研磨率不同於在基材中心處的研磨率。在一基材的 最外園部分(如,200公釐直徑的最外圍3公釐處),會有過 度研磨的結果(太多的物質由基材上被去除掉在緊鄰該 最外圍部分的内園之中間周邊部分(如距最外緣3至8公釐 處)則研磨不足。在緊鄰該中間周邊部分的内圍之内周邊 部分(如距最外緣8至20公釐處)則又為過度研磨。 參照第3圖,在研磨率上的這些差異可藉由在基材1〇 的邊緣上掩加不同的壓:力而獲得補償,即,在研磨不足的 區域施加較大的壓力及在過度研磨的區域施加較小的壓 力。 參照第4-5圖,由磨頭100包括一外殼1〇2,—基座 104,一萬向機構106,一負載室1〇8,一維持環ho,及一 基材支撐組件! 12。一類似的研磨頭的說明可在1996年十 一月8日由Zuniga等人提申’名稱為a CARRIER HEAD WITH A FLEXIBLE MEMBRANE FOR a CHEMICAL MECHANICAL POLISHING SYSTEM之美國專利申請案第 08/745,670號中找到’該案之所有揭示藉由此次參照而被 第ιΐΤ 本紙張尺度適用中®國家標準(CNS)A4规格(210 * 297公釐) (請先M讀背面之注意^項再填寫本頁) ---------訂-----I---線· 經濟部智慧財產局員Η消费合作杜印製 4 5 08 66 經濟部智慧財產局員工消f合作杜印製 A7 B7 五、發明說明() 併於本文中。 外殼102可連結至®動抽74用以在研磨期間繞著一轉 動袖107與联動袖一起轉動,該轉動轴在研磨期間與該研 磨整•的表面大致垂直。外殼的形狀大致上是圓形以對 應於將被研磨之基材之圊形的形狀。一垂直孔13〇可被形 成穿過該外殼102用以氣動地控制該研磨頭。〇形環138可 用來在穿過該外殼的路徑與穿過該驅動軸的路徑間形成 一不透流禮的密封。 基座104為位在該外殼102底下之堅硬的環形或碟形 的本體。一彈性及撓性薄膜140可藉由一夾環142被附著於 該基座104的底面上以界定一囊袋144。一通道146可延伸 穿過該夹環及基座,及兩個夾緊件148(只有固定在外殼 102上的夾緊件被示出)可提供固定點以連接一撓性管於 外殼1 02與基座1 04之間用以將通道1 34流體地連接至該袋 144。一第一幫浦(未示出)可連接至該囊袋144用以將一流 體,如一氣體,像是空氣,引入或引出該囊袋。此外,一 可作動的閥159可被置於該通道146中且被用來感應一基 材的存在*如Govzman等人於1997年五月23曰提申,名稱 為 A CARRIER HEAD WITH A SUBSTRATE DETECTION SYSTEM FOR A CHEMICAL MECHANICAL POLISHING SYSTEM之美國專利申請案第〇8/862,350號中所述的,該 申請案的全部内容藉由此參照而被併於本文中。 可被視為該基座104的一部分之萬向機構106讓該基 座能夠相對於該外殼102樞轉使得該基座可保持大致平行 第12頁 本紙張尺度適用t國_家標準(CNS)A4規格(210 X 297公爱) -------------1 1 I I 訂 I — —--— II 《請先閱讀背面之注意事項再填寫本頁) 45〇866 A7 B7 經 濟 部 智 慈 財 產 局 員 工 消 費 合 作 社 印 製 五、發明說明( 於該研磨墊的表面。萬向機構106包括一萬向桿150其嵌入 垂直孔130中及一彈性環152其被固定於該基座104上。萬 向桿150可垂直地滑動於位在該孔130中的一襯套136中用 以提供基座104的垂直運動,但其可防止基座104相對於外 殼102之任何的橫向運動〃萬向桿150亦包括一通道154其 延伸該萬向桿的整個長度用以氣動地控制該研磨頭。 一大致環形的滾動式薄膜(diaphragm) 160的内緣可藉 由一内夾環162而被夹至該外殼102上,及一外夾環164可 將該滾動式薄膜160的外緣夾至基座104上》因此,滾動式 薄膜160將介於外殼1〇2與基座104之間的空間加以封閉用 以界定一負載室108。一第二幫浦(為示出)可藉由通道132 而流體地連接至該負載室108用以控制在該負載室内的壓 力及施加至基座104上的壓力。基座1〇4相對於該研磨墊32 之垂直位置亦由負載室1〇8來控制β 維持環U0為一大致環形的環其藉由螵栓128而被固 定於基座104的外緣上。當流體被抽泵至該負載室1〇8中且 基座104被向下推時,維持環110大致上是乎的,或其具有 多個管道用以方便泥漿從維持環的外部輪送至該基材。該 維持環110的一内表面126與基材接觸以防止其由研磨頭 的底下脫離》 基材支撐組件112包括一支撐結構114, 一彈性件或薄 膜丨18,一隔離環116及—邊緣負載環12〇 ^基材支撐組件 U2分別提供一第一壓力,一第二壓力及—第三壓力至該 基材的第一部分(中心部分),第二部分(内周邊部分),及 第13貰 lull.--- Ί I I i I I l· I I I ^ i— — — — —! (請先閱讀背面之注意事項再填寫本頁> 45〇8 66 經濟邨智慧財產局員工消费合作杜印製 A7 B7 五、發明說明() 第三部分(中間周邊部分),其稍後將詳細說明。 參照第4及6圖,彈性薄膜118為一大致囫形的板片其 由撓性及彈性材質,如氯丁二烯,乙烯丙烯橡膠或矽,所 製成的。該彈性薄膜118的中心部分210延伸於支撐結構 Π4底下用以提供一安裝表面122與該基材嚙合《該彈性薄 膜的一周邊部分212延伸於該支撐結構114,邊緣負載環 12 0及隔離環11 6之間的一螺旋形路徑中,然後橫跨該邊緣 環120而被固定於該研磨頭,如固定至基座1〇4或維持環 110。周邊部分212包括在中心部分210的邊緣的一厚壁部 分222,一薄壁部分218其向上延伸在該支撐結構114的外 表面周圍,向内介於該隔離環116的一下表面11 9b輿支撐 結構114的一上表面196之間,向上介於該隔離環166的一 内表面204與支撐結構Π4的外表面198之間。該周逄部分 212亦包括一級晻部226其沿著邊緣負載環120的上表面 202向外延伸。該彈性薄膜118終止於一邊緣部214其被夾 在基座104與維持環11〇之間以形成一不透流體的密封。該 彈性薄膜之一弩曲的"無間距(free span)”部分220延伸於 邊緣部214與該級階部226之間。該彈性薄膜可被預先模製 成一螺旋形狀^ 被密封於彈性薄膜118與基座104之間的空間界定一 加壓室190。一第三幫浦(未示出)可精由通道154而流體地 連接至該室1 90用以控制在該室1 90中的壓力及由該安裝 表面加至該基材上的向下力量》該室190的壓力施加一均 勻的壓力於該級隋部226及實曲部220上。邊緣負載環1204 5 08 6 G Α7 Β7 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (120) Edge load ring 121 Substrate support assembly 210 Center portion 122 Mounting surface 2 12 Peripheral portion 222 Thick-walled portion 218 Thin-walled Part 184 outer surface 1 19b lower surface 196 upper surface 198 outer surface 204 inner surface 226 step portion 214 edge portion 190 pressurizable chamber 220 crossbow portion 222a upper surface 222b lower surface 170 plate portion 172 5L 174 & edge portion 176 Lip 180 Edge 182 Lug 119a Upper surface 119c Base 230 Flange 232 Base 234 Flat lower surface 236 Upper surface 238 Lower surface 240 Squeezable material layer 100, grinding head 200 Support structure 12Γ Load assembly 118 'Elastic film 120 'edge load ring 222' wall 202 ring edge 1 16 'spacer ring 226' step section 230 'flange section 236' upper surface 148 'lip 190' chamber 210 'center section 1 0 " grinding head 300 support structure Page B The paper size is applicable to the national standard (CNS) A4 specification (210 * 297 mm) --------; --------- Γ-order ------ --- line (Please read the precautions on the back before filling this page) 4508 66 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention () 12 1 ”Load module 302 Support film 304 Base plate 306 Side wall 308 Support structure Edge 145 Pouch 110 " Maintenance ring 3 10 Edge 312 Lower surface 3 14 Another part 3 16 Inner surface 3 18 Outer surface 320 Central portion 322 First surface 2 3 4 " Lower surface 324 Second surface A7 B7 Invention # 细 说明 \ Referring to Figure 1, one or more substrates will be ground using a chemical mechanical polishing (CMP) apparatus 20. A description of a similar CMP apparatus can be found in U.S. Patent No. 5,73 8,574, which patent The entire disclosure is incorporated herein by reference. CMP equipment 20 includes a series of polishing stations 25 and a transfer station 27 for loading and unloading substrates. Each polishing station 25 includes a rotary table 30, a polishing pad 32 is placed on the rotary table 30. If the substrate is an 8-inch (200 mm) or 12-inch (300 mm) diameter disk, the rotary table 30 and the polishing pad 32 Diameter will be 20 or 30 respectively Inch "diameter of the rotary table 30 and the polishing pad 32 that is also 20 inches, if the substrate 10 is a diameter of 6 inches (150 mm) disk words. For most grinding processes, a rotary table flexion motor (not shown) rotates the rotary table 30 'at a speed of 3 to 200 rpm, although lower or higher transfers can also be used. Each grinding station may further include an associated pad adjustment device 40 to maintain the grinding 9th Γ This paper size is applicable to China National Standard (CNS) A4 (210 X 297 mm) 11 i IJ ---- 1J l * rw ^ ---- l · I 丨 —Order —------- Line 1 / K * (Please read the notes on the back before filling out this page) 4 5 08 6 6 Intellectual Property Bureau, Ministry of Economic Affairs A7 printed by the employee's cooperative. ______B7______ 5. Description of the invention () Grinding condition of the pad. A slurry 50 containing a fluid (such as deionized water used in oxidative milling) and a pH adjuster (such as potassium hydroxide used in oxidative milling) is supplied to the via a slurry / rinsing arm 52. The surface of the polishing pad 32. If the polishing pad 32 is a standard polishing pad, the slurry 50 may further include abrasive particles (such as silicon dioxide used in oxide polishing). Typically, sufficient sludge is provided to cover and wet the entire abrasive pad 32. The mud / rinsing arm 52 includes several spray nozzles (not shown) which provide a high-pressure abrasive pad 32 washing fluid at the end of each grinding and adjustment cycle. A rotatable multi-headed turret 60 is supported by a center post 62 and is rotated about the turret axis 64 by a turret motor assembly (not shown). The multi-head turret 60 includes four grinding head systems 70 mounted on a turret mounting plate 66 around the turret shaft 64 at equal angular intervals. Three of these grinding head systems 70 place the substrate on a grinding station. Another grinding head system receives a substrate from the transfer station and sends the substrate to the transfer station. The turret motor allows the grinding head systems 70 and the substrate placed thereon to orbitally move around the turret axis 64 between the grinding stations and the transfer station. Each of the grinding head systems 70 includes a grinding head. Each of the grinding heads 100 independently rotates around its own axis, and independently oscillates laterally in a radial groove 72 formed in the turret support plate 66. A grinding head drive shaft 74 extends through the slot 72 to connect a grinding head rotation motor 76 (shown by removing a quarter of a turret cover 68) to the grinding head. Each grinding head has a drive shaft and a motor. Each motor and drive shaft can be supported on a slider (not shown), which can be driven by a radial drive motor along the groove to transverse 107Γ This paper size applies to China's 0 standard (CNS) A4 specifications (210 * 297 mm) {Please read the notice on the back before filling this page)-1 --- r--1 Order ---- it · line "-J. 4508 6 6 A7 B7 V. Description of the invention () The grinding head is fabricated in a manner '> During the actual grinding, three grinding heads are placed on three grinding stations. Each grinding head 100 lowers a substrate to a grinding pad 32 Contact position. Generally, the grinding head 100 holds the substrate at a position against the grinding pad 32 and distributes a force across the entire back surface of the substrate. The grinding head also transmits torque to the substrate through a drive shaft. Referring to Figure 2, a problem encountered in CMP is that the polishing rate at the edge of the substrate is different from the polishing rate at the center of the substrate. The outermost portion of a substrate (eg, a diameter of 200 mm) 3 mm at the outermost periphery), there will be the result of excessive grinding (too much material is removed from the substrate in the immediate vicinity of the outermost periphery The inner peripheral part of the inner garden (such as 3 to 8 mm from the outermost edge) is insufficiently ground. The inner peripheral part (such as 8 to 20 mm from the outermost edge) of the inner circumference immediately adjacent to the middle peripheral part ) Is over grinding. Referring to Figure 3, these differences in grinding rate can be compensated by masking different pressures and forces on the edge of the substrate 10, that is, applying the Large pressure and small pressure applied in the area of excessive grinding. Referring to Figure 4-5, the grinding head 100 includes a housing 102, a base 104, a universal mechanism 106, and a load chamber 108. , A maintenance ring ho, and a substrate support assembly! 12. A description of a similar grinding head can be filed on November 8, 1996 by Zuniga et al. 'The name is a CARRIER HEAD WITH A FLEXIBLE MEMBRANE FOR a CHEMICAL US Patent Application No. 08 / 745,670 of MECHANICAL POLISHING SYSTEM was found 'All disclosures in this case were used by this reference to be ιΐΤ The national standard (CNS) A4 specification of this paper standard is applicable (210 * 297 mm) (Please read the note on the back ^ before filling in this page) ------ --- Order ----- I --- line · Member of Intellectual Property Bureau of the Ministry of Economic Affairs and Consumer Cooperation Du printed 4 5 08 66 Employees of the Intellectual Property Bureau of the Ministry of Economic Cooperation Du printed A7 B7 5. Description of the invention () The housing 102 can be connected to the dynamic pump 74 for rotation with a linkage sleeve around a rotating sleeve 107 during grinding, and the rotating shaft is substantially perpendicular to the ground surface during grinding. The shape of the casing is substantially circular to correspond to the shape of the base of the substrate to be ground. A vertical hole 130 may be formed through the housing 102 to pneumatically control the grinding head. The o-ring 138 can be used to form an impervious seal between the path through the housing and the path through the drive shaft. The base 104 is a rigid ring-shaped or dish-shaped body located under the casing 102. An elastic and flexible film 140 may be attached to the bottom surface of the base 104 by a clip ring 142 to define a pouch 144. A channel 146 can extend through the clamp ring and base, and two clamping members 148 (only the clamping members fixed to the housing 102 are shown) can provide a fixing point to connect a flexible tube to the housing 102 It is used to fluidly connect the channel 1 34 to the bag 144 with the base 104. A first pump (not shown) may be connected to the bladder 144 for introducing a body, such as a gas, such as air, into or out of the bladder. In addition, an actuable valve 159 can be placed in the channel 146 and used to sense the presence of a substrate. * As suggested by Govzman et al. May 23, 1997, named A CARRIER HEAD WITH A SUBSTRATE DETECTION SYSTEM FOR A CHEMICAL MECHANICAL POLISHING SYSTEM is described in US Patent Application No. 08 / 862,350, the entire contents of which are incorporated herein by reference. The gimbal mechanism 106, which can be considered as part of the base 104, enables the base to pivot relative to the housing 102 so that the base can remain approximately parallel. Page 12 This paper size applies to the National Standard (CNS) A4 specifications (210 X 297 public love) ------------- 1 1 II Order I — ———— II "Please read the precautions on the back before filling this page) 45〇866 A7 B7 Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (on the surface of the polishing pad. The universal mechanism 106 includes a universal rod 150 which is embedded in the vertical hole 130 and an elastic ring 152 which is fixed to the The base 104. The universal rod 150 can be slid vertically in a bush 136 located in the hole 130 to provide vertical movement of the base 104, but it can prevent any movement of the base 104 relative to the housing 102. Lateral motion: The universal joint 150 also includes a channel 154 that extends the entire length of the universal joint to pneumatically control the grinding head. A generally annular rolling diaphragm (diaphragm) 160 has an inner edge that can be clamped by an inner clamp Ring 162 is clamped to the housing 102, and an outer clamp ring 164 can be used to roll the thin The outer edge of 160 is clamped to the base 104. Therefore, the rolling film 160 closes the space between the housing 102 and the base 104 to define a load chamber 108. A second pump (shown as (Out) can be fluidly connected to the load chamber 108 through the channel 132 to control the pressure in the load chamber and the pressure applied to the base 104. The vertical position of the base 104 relative to the polishing pad 32 is also The β maintenance ring U0 is controlled by the load chamber 108, which is a generally annular ring, which is fixed to the outer edge of the base 104 by the yoke 128. When the fluid is pumped into the load chamber 108, and When the base 104 is pushed down, the maintenance ring 110 is substantially concerned, or it has a plurality of pipes to facilitate the mud from the outside of the maintenance ring to the substrate. An inner surface 126 of the maintenance ring 110 and The substrate is in contact to prevent it from detaching from under the abrasive head. The substrate support assembly 112 includes a support structure 114, an elastic member or film, 18, an isolation ring 116, and an edge load ring 12. The substrate support assembly U2, respectively Providing a first pressure, a second pressure, and a third pressure to the first of the substrate (Central part), the second part (inner peripheral part), and the 13th lull. --- Ί II i II l · III ^ i — — — — —! (Please read the notes on the back before filling in this Page > 45〇8 66 Economic Village Intellectual Property Bureau Employee Consumption Cooperation Du printed A7 B7 V. Description of the invention () Part III (middle peripheral part), which will be explained in detail later. Refer to Figures 4 and 6, flexibility The film 118 is a generally sloping plate made of a flexible and elastic material, such as chloroprene, ethylene propylene rubber, or silicon. A central portion 210 of the elastic film 118 extends under the support structure Π4 to provide a mounting surface 122 to engage the substrate. A peripheral portion 212 of the elastic film extends to the support structure 114, an edge load ring 120, and a spacer ring. In a spiral path between 116, it is then fixed to the grinding head across the edge ring 120, such as to the base 104 or the retaining ring 110. The peripheral portion 212 includes a thick-walled portion 222 at the edge of the central portion 210, a thin-walled portion 218 extending upwardly around the outer surface of the support structure 114, and inwardly interposed between the lower surface 11 and 9b of the spacer ring 116. An upper surface 196 of the structure 114 is upwardly interposed between an inner surface 204 of the isolation ring 166 and an outer surface 198 of the supporting structure Π4. The peripheral portion 212 also includes a first-level dark portion 226 that extends outward along the upper surface 202 of the edge load ring 120. The elastic film 118 terminates at an edge portion 214 which is sandwiched between the base 104 and the retaining ring 110 to form a fluid-tight seal. A cross-shaped " free span " portion 220 of one of the elastic films extends between the edge portion 214 and the step portion 226. The elastic film can be pre-molded into a spiral shape ^ sealed in elasticity The space between the membrane 118 and the base 104 defines a pressurized chamber 190. A third pump (not shown) can be fluidly connected to the chamber 1 90 through the channel 154 for control in the chamber 1 90 The pressure of the mounting surface and the downward force exerted on the substrate by the mounting surface. The pressure of the chamber 190 applies a uniform pressure to the stage 226 and the solid curved portion 220. The edge load ring 120

第U 本紙張尺度適用令國a家標準(CNS)A4規格(210 X 297公釐) ^ ---------r------------<5^· (請先閲讀背面之注意事項再填寫本頁) ! 45〇866The U-th paper size is applicable to the national standard (CNS) A4 (210 X 297 mm) ^ --------- r ------------ < 5 ^ · (Please read the precautions on the back before filling this page)! 45〇866

五、發明說明() 使用該至190之均勻的壓力來施加兩個不同的壓力於基材 1〇的周邊上,其將於下文中詳細說明。此外,室190可被 柚空用以向上拉扯該彈性薄膜π 8並藉以將該基材真空夹 持於該研磨頭上β 與該中心部分21〇接合的壁部疲供一第二表面用以與 該基材的内周邊部分嚙合。壁部222包括一上表面222&以 接受一負載及一下表面222b 一將該負載施加至該基材的 内周邊部分上。假設由該隔離環116傳遞至該上表面222& 的向下力量為定值的話’則被施加至該内周邊部分的壓力 與該壁部222的下表面2221)的表面積成反比。詳言之,被 一固定的力(F)所施加的壓力(P)隨著壓力(p)施加於其上 的表面積(A)而改變,即卜F/A。被施加於內周邊部分上的 塵力可藉由將該壁部222設計成具有一適當的下表面積而 加以控制。亦即,如果壁部222的寬度(W1)增加,則施加 至該基材的内周邊部上的壓力則減小。或者,如果寬度(W1) 減小’則施加至該基材的内周邊部上的壓力則增大。 支撐結構114是位在室190之内用以提供基材在基材 夾持期間一堅實的支撐,並在示190被抽空時限制基材及 彈性薄膜之向上運動,及保持該彈性薄膜118之所想要的 形狀》詳言之,支撐結構11 4可以是一大致堅硬的元件其 具有一圓盤形狀的板部170帶有多個孔172穿透該結構,及 一大致環形的凸緣部174其從該板部172向上延伸。此外, 板部170在其外緣處具有一向下突伸出的唇部176。支撐結 構1 1 4是"無懸浮的”,即沒有固定於該研磨頭的其餘部分 第 157Γ 本紙張尺度適用+困國家標準(CNS)A4規格(21〇 χ 297公龙) 1 I I 1 I Ί t I HI — —^rcw^ - i I I l· 11 I - — — 111 — — uiv-(請先間讀背面之注意事項再填寫本頁)5. Description of the invention () The uniform pressure of 190 is used to apply two different pressures on the periphery of the substrate 10, which will be described in detail below. In addition, the chamber 190 can be emptied to pull the elastic film π 8 upwards and thereby vacuum-hold the substrate on the grinding head. The wall of the joint of β and the central portion 21 is provided with a second surface for contact with The inner peripheral portion of the base material is engaged. The wall portion 222 includes an upper surface 222 & to receive a load and a lower surface 222b to apply the load to an inner peripheral portion of the substrate. Assuming that the downward force transmitted from the spacer ring 116 to the upper surface 222 & is constant, the pressure applied to the inner peripheral portion is inversely proportional to the surface area of the lower surface 2221) of the wall portion 222. In detail, the pressure (P) applied by a fixed force (F) changes with the surface area (A) to which the pressure (p) is applied, that is, F / A. The dust force applied to the inner peripheral portion can be controlled by designing the wall portion 222 to have an appropriate lower surface area. That is, if the width (W1) of the wall portion 222 increases, the pressure applied to the inner peripheral portion of the base material decreases. Alternatively, if the width (W1) decreases, the pressure applied to the inner peripheral portion of the substrate increases. The support structure 114 is located in the chamber 190 to provide a solid support for the substrate during substrate clamping, and to limit the upward movement of the substrate and the elastic film when the substrate 190 is evacuated, and to maintain the elastic film 118. In detail, the supporting structure 114 may be a substantially rigid element having a disc-shaped plate portion 170 with a plurality of holes 172 penetrating the structure, and a generally annular flange portion. 174 It extends upward from the plate portion 172. In addition, the plate portion 170 has a lip portion 176 protruding downward at its outer edge. The supporting structure 1 1 4 is " non-suspended ", that is, it is not fixed to the rest of the grinding head. 157Γ This paper size applies + National Standard (CNS) A4 specification (21〇χ 297 male dragon) 1 II 1 I Ί t I HI — — ^ rcw ^-i II l · 11 I-— — 111 — — uiv- (Please read the precautions on the back before filling this page)

經濟部智慧財產局3工消费合作社印製 45〇866 經濟部智慧財產局貝工消費合作社印製 A7 B7 五、發明說明() 上,且可藉由彈性薄膜而被固持於定位上。 支撐結構的凸緣部174包括_邊緣180其延伸橫跨形 成在基座104上的一凸耳182»當研磨完成且負載室108被 抽空以將基座104舉離該研磨墊,且該室190被加壓或抽空 時,該邊緣180的下表面與凸耳182嚙合以作為硬性擒止 件,其限制支撐結構1 14的向下運動並防止彈性薄膜的故 動伸展。 參照第4及7A圖,隔離環1〖6為一環形件,其設置在彈 性薄膜118與邊緣負載環120之間之壁部分222的上表面 222a上。該隔離環116的一上表面119a及一下表面11 9b分 別被設計成接受來自於室190的負載並將該負載傳遞至壁 部。被該隔離環116由該室190接受來的負載與隔離環的上 表面的表面積成正比該上表面119a的寬度(W2)可被改變 用以控制藉由該隔離環116從該室190接受來的負載相同 地,下表面丨19b的宽度(W3)可被改變用以控制施加至壁部 222的壓力*參照第7B-7D圖,該隔離環116的一基部119c 可被作成能夠控制負載被施家至該壁部的位置及控制施 加至壁部222之選定的區域的壓力大小的形狀。 參照第4及8圖,邊緣負載環120為位在維持環11〇與壁 部222之間的一大致環形本體。邊緣負載環120包括一基部 232,一凸緣部230其由該基部232向上延伸至該隔離環Π6 之上用以承接透過該彈性薄膜118來自於室190的負載,及 一大致平的下表面234用以施加壓力至基材1〇的周邊部 分。凸緣部230包括一上表面236其與該彈性薄膜118接觸 第16貰 ______ 本紙張尺度適用中國國家標準(CNS>A4規格(210 X 297公釐) I 1-----Ϊ I - 111 l· I I I ^ « — — — — — — I— (請先閱讀背面之注意事項再填寫本頁) 4508 6 6 A7 B7 經濟部智慧財產局貝工消費合作社印製 五、發明說明() 及一下表面238其與隔離環1丨6接觸a 邊緣負載環120承接來自於該彈性薄膜的級階部226 及鸞曲部220的負載。弩曲部220亦施加一負載於該維持環 110上。邊緣負載環120所承受的總負載與其和級階部226 接觸的上表面236的表面積成正比該上表面236的表面積 至少是該邊緣負載環的下表面238的表面積的5〇%。上表面 236的表面積可藉由調整凸緣部230的寬度(W4)來改變用 以控制從該邊緣負載環120所承接的負載D寬度(W4)應相 當的宽用以由該室190承受足夠的負載使得第二壓力及第 三壓力可分別施加至該基材的内周邊部分及中間周邊部 分》 邊緣負載環120藉由將承受自該室190的總負载的一 部分傳遞至該隔離環116而施加第二整力至該内周造部 分9被傳遞至該隔離環116的負載與隔離環116之與該邊緣 負載環接觸的上表面11 9a的表面積成正比。如果隔離環 116的上表面積增加的話’則從邊緣負載環ι20被傳遞至該 隔離環116的總負載的比例即會提高》相反地,如果隔離 環116的上表面積減小的話,則從邊緣負載環12〇被傳遞至 該隔離環116的總負載的比例即會降低, 在該邊緣負載環120上的剩餘負載,即沒有被傳遞至 該隔離環116的部分,則被傳遞至下表面234用以施加第三 壓力至該基材的中間周邊部分上。被施加至該中間周邊部 分上的壓力可藉由適當地選擇邊緣附載環的下表面234的 寬度(W5)而被控制。 第17貰 本紙張尺度適用中國國家標準(CNS)A4規格(210 * 297公釐) f ^ i-----I l· I - I ^ ------I--n·'· (請先閱讀背面之注意事項再填寫本頁) 4508 66 Α7 Β7 五、發明說明() <請先閱婧背面之注意事項再填寫本頁) 因此,研磨頭100可藉由使用在室丨90中之一致的壓力 而施加三種不同的壓力至該基材上。中心部分210施加第 一®力於基材的中心部分上。負載總成121施加分別施加 第二壓力及第三壓力至内周邊部分及中間周邊部分上。第 二及第三壓力可藉由選擇適當比例的邊緣負載環的上表 面積’邊緣負載環的下表面積,隔離環的上表面積,及壁 部的下表面積來加以控制。 邊緣負載環120是由一與該彈性薄膜比起來相對剛硬 的材質,如不銹鋼,陶瓷,场極化的鋁,或塑膠,如聚乙 烯硫(PPS),所製成。一可壓擠的材料層240可被黏附於基 部232的下表面234上以提供一基材的安裝表面。 在一實施例中,彈性薄膜118的壁部222的寬度(W1) 是在0 15至0.3英吋的範園之内,隔離環116具有约6.2英吋 的内徑(ID 1),隔離環116的上表面119a的寬度(W2)及下表 面Π 9b的宽度(W3)是在0.05至(M英吋的範圍之内),邊緣 負載環120具有約6.35英吋的内徑(ID2),邊緣負載環120的 凸緣部230的寬度(W4)在0.5至0.6英吋之的範圍之間,及邊 緣負載環120的下表面234的寬度(W5)在0,4至0.5英吋的範 圍之間。 經濟部智慧財產局貝工消f合作社印製 參照第9圖,一研磨頭1〇〇’包括一支撐結構200及一負 載組件12Γ,其包括一具有一内部120'G及一壁部222,的彈 性薄膜1 18',一隔離環1 16'及一邊緣負載環120,。支撐結構 200包括一大致環形的邊緣202其突伸於邊緣負載環120'與 囊袋144之間》 第1β頁 本紙張尺度適用中國國家標準(CNS)A4规格(210 X 297公釐〉 4^〇86 6 A7 B7 經濟部智慧財產局員工消费合作社印製 五、發明說明() 隔離環116'被設置於壁部222'之上且與該彈性薄膜 118,接觸。該邊緣負載環120'的_ a緣部23CT被設計成與該 隔離環116'平行使得該邊緣負載環丨2〇·的上表面236'與該 隔離環116’的一上表面l〗9a共平面。該邊緣負載環12(^的 一唇部148’稍短於邊緣負載環120的一唇部148。 在操作時,一室190_的壓力施加負載於該彈性薄膜 1 18'的中心部210',該隔離環1 16'及邊緣負載環12(Τ上。接 著,中心部210'施加一第一壓力至該基材的中心部上,隔 離環11 6'經由彈性薄膜的壁部222'施加一第二壓力至該基 材的内周邊部上,及邊緣負載環12(Τ施加一第三壓力至該 基材的中間周邊部上。 參照第10圖,一研磨頭1〇〇"包括一支撐結構300及一 負載组件121",其包括一兼具撓性薄膜116及萍性薄膜118 的功能之支撐薄膜302,及一邊緣負載環120"。支撐結構 3 00為一堅硬的碗形件其包括一圓盤狀的底盤3 04,一圓筒 形的側壁306,及一大致環形的邊緣308。邊緣308突伸於 該邊緣負載環120"之上並被置於該囊袋145底下。 支撐薄膜3 02為一大致圓形的板片其具有一被夾在維 持環110"與基座104之間的外緣310用以將該支撐薄膜302 固定於該研磨頭上。支撐薄膜302的一部分311由外緣310 向内延伸用以被夾在邊緣負載環120·•的上表面與支撐結 構邊緣308的下表面312之問。支撐薄膜3 02的另一部分314 延伸於邊緣負載環120"的内表面3 1 6與支撐結構侧壁3 06 的上表面318之間。該支撐薄膜的一中心部分32〇延伸於支 第 19ΤΓ 本紙張尺度適用+國國家標iMCNS)A4規格(210 X 297公;» > " I I I — IJ---1 丨 I I I i l· I I I * I--I — I — I Li-. (請先閲讀背面之注意事項再填寫本頁) 668 ο 54 A7B7一 五、發明說明() 撐結構底盤304底下用以提供一第一表面322與該基材的 中心部分禮合。 邊緣負載環1 20"被置於支撐結構3 00與維持環丨丨〇”之 間*該邊緣負載環120"的一下表面234”可被—可擦壓材質 所覆蓋。邊緣負載環1 20"提供一第二表面以與基材的周邊 部分嚙合》 在操作時’該室190"的壓力迫使支撐薄膜3〇2及邊緣 負載環120 "向下以施加一負載至基材的中心部分及周邊 部分。 本發明已根據數個實施例加以描述《然而,本發明並 不侷現於所舉例及描述的實施例。本發明的範圍是由以下 的中請專利範圍來加以界定。 (請先閱讀背面之注意事項再填寫本頁) -Λ(κPrinted by the Intellectual Property Bureau of the Ministry of Economic Affairs, 3 Industrial Consumer Cooperatives 45 0866 Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperatives A7 B7 V. Description of the invention (), and can be held in place by elastic film. The flange portion 174 of the support structure includes an edge 180 that extends across a lug 182 formed on the base 104 »When grinding is complete and the load chamber 108 is evacuated to lift the base 104 away from the polishing pad, and the chamber When 190 is pressurized or evacuated, the lower surface of the edge 180 engages with the lug 182 as a rigid catch, which restricts the downward movement of the support structure 114 and prevents the elastic film from stretching. Referring to Figures 4 and 7A, the spacer ring 1 is a ring-shaped member, which is disposed on the upper surface 222a of the wall portion 222 between the elastic film 118 and the edge load ring 120. An upper surface 119a and a lower surface 119b of the spacer ring 116 are respectively designed to receive a load from the chamber 190 and transfer the load to the wall portion. The load received by the isolator ring 116 from the chamber 190 is proportional to the surface area of the upper surface of the isolator ring. The width (W2) of the upper surface 119a can be changed to control the acceptance by the isolator ring 116 from the chamber 190. Similarly, the width (W3) of the lower surface 19b can be changed to control the pressure applied to the wall portion 222. * Referring to Figures 7B-7D, a base 119c of the spacer ring 116 can be made to control the load. The shape of the position of the wall part and the control of the pressure applied to the selected area of the wall part 222. Referring to Figures 4 and 8, the edge load ring 120 is a generally annular body between the retaining ring 110 and the wall portion 222. The edge load ring 120 includes a base portion 232, a flange portion 230 extending upwardly from the base portion 232 to the isolation ring Π6 for receiving a load from the chamber 190 through the elastic film 118, and a generally flat lower surface 234 is used to apply pressure to the peripheral portion of the substrate 10. The flange portion 230 includes an upper surface 236 which is in contact with the elastic film 118. 16th ______ This paper size applies to the Chinese National Standard (CNS > A4 specification (210 X 297 mm) I 1 ----- Ϊ I- 111 l · III ^ «— — — — — — I— (Please read the notes on the back before filling out this page) 4508 6 6 A7 B7 Printed by the Shellfish Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention () and The lower surface 238 is in contact with the isolation ring 1 and 6a. The edge load ring 120 receives the load from the stepped portion 226 and the bent portion 220 of the elastic film. The crossbow portion 220 also applies a load to the retaining ring 110. The total load to which the edge load ring 120 is subjected is proportional to the surface area of the upper surface 236 in contact with the step 226. The surface area of the upper surface 236 is at least 50% of the surface area of the lower surface 238 of the edge load ring. The upper surface 236 The surface area can be changed by adjusting the width (W4) of the flange portion 230 to control the load D received from the edge load ring 120. The width (W4) should be sufficiently wide to allow the chamber 190 to bear a sufficient load such that The second pressure and the third pressure can be applied separately To the inner peripheral portion and the middle peripheral portion of the substrate "The edge load ring 120 transmits a part of the total load received from the chamber 190 to the spacer ring 116 to apply a second overall force to the inner peripheral portion 9 and is transmitted. The load to the spacer ring 116 is directly proportional to the surface area of the upper surface 119a of the spacer ring 116 that is in contact with the edge load ring. If the upper surface area of the spacer ring 116 is increased, 'is transferred from the edge load ring 20 to the spacer ring The proportion of the total load of 116 will increase. ”Conversely, if the upper surface area of the isolation ring 116 is reduced, the proportion of the total load transferred from the edge load ring 120 to the isolation ring 116 will be reduced. The remaining load on the load ring 120, that is, the portion that is not transferred to the isolation ring 116, is transferred to the lower surface 234 to apply a third pressure to the middle peripheral portion of the substrate. It is applied to the middle peripheral portion The upper pressure can be controlled by appropriately selecting the width (W5) of the lower surface 234 of the edge-loading ring. Article 17: This paper size applies the Chinese National Standard (CNS) A4 specification (210 * 297) Mm) f ^ i ----- I l · I-I ^ ------ I--n · '· (Please read the notes on the back before filling this page) 4508 66 Α7 Β7 V. Description of the Invention () < Please read the notes on the back of Jing before filling this page) Therefore, the grinding head 100 can apply three different pressures to the substrate by using the same pressure in the chamber 90. The central portion 210 applies a first force to the central portion of the substrate. The load assembly 121 applies a second pressure and a third pressure to the inner peripheral portion and the middle peripheral portion, respectively. The second and third pressures can be controlled by selecting an appropriate ratio of the upper surface area of the edge load ring 'to the lower surface area of the edge load ring, the upper surface area of the spacer ring, and the lower surface area of the wall portion. The edge load ring 120 is made of a material that is relatively rigid compared to the elastic film, such as stainless steel, ceramic, field-polarized aluminum, or plastic, such as polyethylene sulfur (PPS). A layer of compressible material 240 may be adhered to the lower surface 234 of the base 232 to provide a mounting surface for the substrate. In one embodiment, the width (W1) of the wall portion 222 of the elastic film 118 is within the range of 15 to 0.3 inches, and the spacer ring 116 has an inner diameter (ID 1) of approximately 6.2 inches. The spacer ring The width (W2) of the upper surface 119a of the 116 and the width (W3) of the lower surface Π 9b are in the range of 0.05 to (M inches). The edge load ring 120 has an inner diameter (ID2) of about 6.35 inches The width (W4) of the flange portion 230 of the edge load ring 120 is in the range of 0.5 to 0.6 inches, and the width (W5) of the lower surface 234 of the edge load ring 120 is in the range of 0,4 to 0.5 inches. between. Printed with reference to Figure 9 by the Intellectual Property Bureau of the Ministry of Economic Affairs, a grinding head 100 ′, a grinding head 100 ′ includes a support structure 200 and a load assembly 12Γ, which includes an inner 120′G and a wall portion 222, Elastic film 1 18 ', a spacer ring 1 16' and an edge load ring 120 ,. The support structure 200 includes a generally annular edge 202 that protrudes between the edge load ring 120 'and the pouch 144. "Page 1β This paper size applies to the Chinese National Standard (CNS) A4 specification (210 X 297 mm> 4 ^ 〇86 6 A7 B7 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. 5. Description of the invention () The isolation ring 116 'is placed on the wall 222' and is in contact with the elastic film 118. The edge load ring 120 ' _a The edge portion 23CT is designed to be parallel to the spacer ring 116 'such that the upper surface 236' of the edge load ring 丨 2 · is coplanar with an upper surface 1a of the spacer ring 116 '. The edge load ring 12 A lip 148 'is slightly shorter than a lip 148 of the edge load ring 120. In operation, a pressure of 190 mm is applied to the center portion 210' of the elastic film 1 18 ', and the isolation ring 1 16 'and the edge load ring 12 (T. Then, the center portion 210' applies a first pressure to the center portion of the substrate, and the spacer ring 116 'applies a second pressure to the wall portion 222' of the elastic film to The inner peripheral portion of the substrate and the edge load ring 12 (T apply a third pressure to the middle of the substrate With reference to FIG. 10, a grinding head 100 includes a supporting structure 300 and a load module 121, which includes a supporting film 302 having the functions of a flexible film 116 and a flexible film 118. And an edge load ring 120. The support structure 300 is a rigid bowl-shaped piece, which includes a disc-shaped chassis 304, a cylindrical side wall 306, and a generally annular edge 308. The edge 308 protrudes from The edge load ring 120 is above and is placed under the pouch 145. The supporting film 302 is a generally circular plate having an outer edge 310 sandwiched between the retaining ring 110 and the base 104. The support film 302 is fixed on the polishing head. A part 311 of the support film 302 extends inward from the outer edge 310 and is sandwiched between the upper surface of the edge load ring 120 · • and the lower surface 312 of the edge 308 of the support structure. Q. Another portion 314 of the support film 3 02 extends between the inner surface 3 1 6 of the edge load ring 120 " and the upper surface 318 of the support structure side wall 3 06. A central portion 32 of the support film extends from the support 19ΤΓ This paper is suitable for + country House standard iMCNS) A4 specification (210 X 297 male; »> " III — IJ --- 1 丨 III il · III * I--I — I — I Li-. (Please read the precautions on the back before (Fill in this page) 668 ο 54 A7B7 V. Description of the invention () The supporting structure underneath the base plate 304 is used to provide a first surface 322 and the central part of the substrate. The edge load ring 1 20 " is placed between the support structure 3 00 and the maintenance ring 丨 丨 0 "* The lower surface 234" of the edge load ring 120 " can be covered by an erasable material. The edge load ring 1 20 " provides a second surface to engage with the peripheral portion of the substrate " during operation, the pressure of the chamber 190 " forces the support film 302 and the edge load ring 120 " down to apply a load to The central part and peripheral parts of the substrate. The invention has been described on the basis of several embodiments. However, the invention is not limited to the illustrated and described embodiments. The scope of the present invention is defined by the following patent claims. (Please read the notes on the back before filling out this page) -Λ (κ

l· I I I 訂--— — — III 經濟部智慧財產局員工消费合作社印製 第20貰 本紙張尺度適用t國國家標準(CNS)A4規格(210 X 297公釐)l · I I I Order --- — — III Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 20th 贳 This paper size is applicable to the national standard (CNS) A4 specification (210 X 297 mm)

Claims (1)

888¾ ABCD 45〇8 66 六 經濟部智慧財產局員工消費合作杜印製 申請專利範圍 h一種用於化學機械研磨的研磨頭,其至少包含: —基座; (請先閱讀背面之沒意事項再填寫本頁) ~彈性薄膜’其延伸於該基座底下以界定一可加整 的室,該彈性薄膜提供一基材的基材接受表,該下表面 包括一第一表面以施加一第一壓力至該基材的一第一 部分; —第二表面,其圈圍該第一表面用以施加一第二壓 力至該基材的一第二部分; —邊緣負載環,其圈圍該第二表面,該邊緣負載環 的一下表面提供一第三表面用以施加一第三壓力至該 基材之圈圍該第二部分的第三部分上:及 一維持環,其圈圍該邊緣負載環用以將該基材保持 在該第一,第二及第三表面底下。 2. 如申請專利範圍第1項所述之研磨頭,其進一步包含一環 形壁部其可圈園並連接該彈性薄膜的第一表面’該壁部 可具有一下表面及一上表面,該下表面界定該第—表 面4 , 3. 如申請專利範圍第2項所述之研磨頭,其進一步包含隔 離環其具有一下表面及〆上表面,該隔離環的上表面被 安排成接受一負載以回應該室的加壓,及該隔離環的下 表面可鄰接該壁部的上表面,藉以將該隔離環的上表面 所承接到的負載傳遞該璧部° 第21貫 Λ 5 〇SS 6 C8 D8 六、申請專利範圍 4 ·如申請專利範圍第3項所述之研磨頭,其中該隔離環係設 置在該邊緣負載環與該璧部之間° 5. 如申請專利範困第3項所述之研磨頭’其中該隔離環可被 設置於該壁部上與該邊緣負載環的一頂部大致水平地 對资。 6. 如申請專利範圍第3項所述之研磨頭,其中該隔離環的上 表面的一表面積大於該睬離環的下表面的表面積。 7. 如申請專利範圍第3項所述之研磨頭’其中該隔離環的上 表面的一表面積大致等於該隔離環的下表面的表面 積, 8. 如申請專利範圍第2項所述之研磨頭,其中該邊緣負載環 包括一頂部其延伸於該壁件的上表面之上並界定該邊 緣負載環的一上表面,見該上表面可被設計成接受一負 載的形狀用以回應該室的加壓並施加該第二壓力至該 基材的第二部分上及施加第三壓力至該基材的第三部 分上 9. 如申請專利範圍第8項所述之研磨頭,其中該邊緣負載環 的上表面的一表面積大於該邊緣負載環的下表面的表 面積。 第22頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) Q,--------訂---------線Γ- 經濟部智慧財產局員工消費合作社印製 6e A8 B8 C8 D8 六、 經濟部智慧財產局員工消費合作社印製 申請專利範圍 10.如申請專利範圍第8項所述之研磨頭,其中該邊緣負菜 環的上表面的一表面積小於該邊緣負載環的下表面的 表面積9 種用於化學機械研磨的研磨頭,其至少包含: 一基座; 一彈性薄膜’其延伸於該基座底下以界定一可加壓 的室,該彈性薄膜提供一第一表面以施加一第一壓力至 該基材的一第一部分; 一邊緣負載環,其圏圍該第一表面並具有一上表面 及一下表面,該邊緣負載環圈固的上表面的表面積至少 是該邊緣負載環圏圍的下表面的表面積的50%,該邊緣 負載環圈圍的下表面提供一第二表面以施加一第二恩 力至該基材的一第二部分上;及 一維持環,其圈圍該邊緣負載環圏圍用以將該基材 保持在該第一及第二表面底下。 12.如申請專利範圍第1丨項所述之研磨頭,其中該彈性薄膜 進一歩包括一環形壁部提供一第三表面以施加一第三 壓力至該基材之位於該第一部分與該^二部分之間的 一第三部分上U 1 3 ·如申請專利範圍第1 1項所述之研磨頭,其進一步包括一 隔離環其被置於該壁部的上表面之上昱與該邊緣負載 第23頁 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公« ) (請先閱讀背面之注意事項再填寫本頁> I I i I 訂-II 丨 — |丨| 1 45〇86g 六、申請專利範圍 環合作以提供該第三壓力至該基材的第三部分上。 14. 一種用於化學機械研磨的研磨頭,其至少包含: 一基座; 一彈性薄膜,其延伸於該基座底下以界定—可加壓 的室,該彈性薄膜的一下表面提供—基材的基材接受表 面,該下表面包括一第一表面以施加—第一壓力至該基 材的一第一部分及一第二表面用以施加一第二壓力至 該基材之圈圍該第一部分的一第二部分上; 一邊緣負載環,該邊緣負載環圏固該第二表面,及 該邊緣負載環的一接觸表面提供一第三表面以施加— 第三負載至該基材之圏圍該第二部分的第三部分上;及 一維持環’其圏圍該邊緣負載環用以將該基材保持 在該第一,第二及第三表面底下a 15. —種研磨一基材的方法’該方法至少包含: 將一基材設置成於一研磨表面接觸; 以一彈性薄膜的一第一部分將一第一壓力施加至該 基材的一第一部分上; 以該彈性薄膜的一第二部分將一第二壓力施加至該 基材的一第二部分上;及 以一邊緣負載環將一第三壓力施加至該基材的一第 三部分上。 本紙張尺度適用中國困家標準(CNS)A4規格(210 * 297公釐) f锖先閱讀背面之注意事項再填寫本頁> I I I I I II · I I ! 經濟部智慧財產局員工消費合作社印製888¾ ABCD 45〇8 66 The consumer cooperation of the Intellectual Property Bureau of the Ministry of Economic Affairs Du printed the scope of patent application h A grinding head for chemical mechanical grinding, which at least contains:-base; (please read the unintentional matter on the back before (Fill in this page) ~ An elastic film 'extends under the base to define an integral chamber. The elastic film provides a substrate acceptance table for the substrate, and the lower surface includes a first surface to apply a first Pressure to a first portion of the substrate;-a second surface, which surrounds the first surface to apply a second pressure to a second portion of the substrate;-an edge load ring, which surrounds the second Surface, a lower surface of the edge load ring provides a third surface for applying a third pressure to the third portion of the substrate surrounding the second portion of the substrate: and a retaining ring surrounding the edge load ring The substrate is held under the first, second and third surfaces. 2. The polishing head according to item 1 of the scope of patent application, further comprising an annular wall portion which can be circled and connected to the first surface of the elastic film. The wall portion may have a lower surface and an upper surface. The surface defines the first surface 4, 3. The polishing head as described in item 2 of the scope of patent application, further comprising a spacer ring having a lower surface and an upper surface, the upper surface of the spacer ring is arranged to receive a load to In response to the pressure of the chamber, and the lower surface of the spacer ring can be adjacent to the upper surface of the wall portion, the load received by the upper surface of the spacer ring can be transmitted to the crotch ° 21st Λ 5 〇SS 6 C8 D8 6. Scope of patent application 4 · The grinding head described in item 3 of the scope of patent application, wherein the isolation ring is arranged between the edge load ring and the crotch ° 5. As in the case of patent application 3 The grinding head described above, wherein the spacer ring may be disposed on the wall portion to face the top of the edge load ring approximately horizontally. 6. The polishing head according to item 3 of the scope of patent application, wherein a surface area of an upper surface of the spacer ring is larger than a surface area of a lower surface of the separation ring. 7. The grinding head described in item 3 of the patent application scope, wherein a surface area of the upper surface of the spacer ring is substantially equal to the surface area of the lower surface of the separation ring, 8. The grinding head described in item 2 of the patent application scope Wherein, the edge load ring includes a top portion which extends above the upper surface of the wall piece and defines an upper surface of the edge load ring. It can be seen that the upper surface can be designed to receive a load to respond to the chamber's Press and apply the second pressure to the second part of the substrate and apply a third pressure to the third part of the substrate 9. The polishing head according to item 8 of the scope of patent application, wherein the edge is loaded A surface area of an upper surface of the ring is larger than a surface area of a lower surface of the edge load ring. Page 22 This paper size applies to China National Standard (CNS) A4 (210 X 297 mm) (Please read the precautions on the back before filling this page) Q, -------- Order ---- ----- Line Γ- Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 6e A8 B8 C8 D8 6. Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs for the scope of patent application 10. As described in item 8 of the scope of patent application Grinding head, wherein a surface area of an upper surface of the edge negative ring is smaller than a surface area of a lower surface of the edge load ring. Nine types of grinding heads for chemical mechanical polishing include at least: a base; Under the base to define a pressurizable chamber, the elastic film provides a first surface to apply a first pressure to a first portion of the substrate; an edge load ring that surrounds the first surface and It has an upper surface and a lower surface. The surface area of the upper surface of the edge load ring is at least 50% of the surface area of the lower surface of the edge load ring. The lower surface of the edge load ring provides a second surface. To impose a second Energize to a second portion of the substrate; and a retaining ring surrounding the edge load ring to hold the substrate under the first and second surfaces. 12. The grinding head according to item 1 of the patent application scope, wherein the elastic film further includes an annular wall portion to provide a third surface to apply a third pressure to the substrate located on the first portion and the ^ U 1 3 on a third part between the two parts The grinding head as described in item 11 of the patent application scope, further comprising a spacer ring placed on the upper surface of the wall and the edge Load page 23 This paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 male «) (Please read the precautions on the back before filling out this page > II i I Order-II 丨 — | 丨 | 1 45 〇86g 6. The scope of the patent application is to cooperate to provide the third pressure to the third part of the substrate. 14. A grinding head for chemical mechanical polishing, which at least comprises: a base; an elastic film, which Extending under the base to define a pressurizable chamber, the lower surface of the elastic film provides a substrate receiving surface of a substrate, the lower surface includes a first surface to apply a first pressure to the substrate. For a first part and a second surface Applying a second pressure to a second portion of the substrate surrounding the first portion; an edge load ring, the edge load ring holding the second surface, and a contact surface of the edge load ring providing a A third surface to apply-a third load to the third portion of the substrate surrounding the second portion; and a retaining ring which surrounds the edge load ring to hold the substrate at the first, Under the second and third surfaces a 15. A method of grinding a substrate 'The method includes at least: placing a substrate in contact with a grinding surface; applying a first pressure with a first portion of an elastic film To a first portion of the substrate; applying a second pressure to a second portion of the substrate with a second portion of the elastic film; and applying a third pressure to the second portion with an edge load ring On the third part of the base material. This paper size is in accordance with China Standard for Household Standards (CNS) A4 (210 * 297 mm). F 锖 Read the precautions on the back before filling in this page> IIIII II · II! Ministry of Economic Affairs Intellectual Property Bureau employee consumption Printed cooperatives
TW89113625A 1999-07-09 2000-08-15 Carrier head with an flexible membrane and an edge load ring TW450866B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14319099P 1999-07-09 1999-07-09

Publications (1)

Publication Number Publication Date
TW450866B true TW450866B (en) 2001-08-21

Family

ID=22502987

Family Applications (1)

Application Number Title Priority Date Filing Date
TW89113625A TW450866B (en) 1999-07-09 2000-08-15 Carrier head with an flexible membrane and an edge load ring

Country Status (1)

Country Link
TW (1) TW450866B (en)

Similar Documents

Publication Publication Date Title
TW434107B (en) A carrier head with a flexible membrane for chemical mechanical polishing
TW415872B (en) A carrier head including a flexible membrane and a compliant backing member for a chemical mechanical polishing apparatus
TW436370B (en) A carrier head for chemical mechanical polishing a substrate
US6776694B2 (en) Methods for carrier head with multi-part flexible membrane
TWI243085B (en) Apparatus for polishing a semiconductor wafer and method therefor
EP1133380B1 (en) A carrier head with edge control for chemical mechanical polishing
US6705932B1 (en) Carrier head for chemical mechanical polishing
TW436381B (en) Improved CMP platen with patterned surface background of the invention
TWI243084B (en) Apparatus and method for chemical-mechanical polishing (CMP) head having direct pneumatic wafer polishing pressure
US6979250B2 (en) Carrier head with flexible membrane to provide controllable pressure and loading area
US6431968B1 (en) Carrier head with a compressible film
TW510842B (en) Workpiece carrier and polishing apparatus having workpiece carrier
US6361419B1 (en) Carrier head with controllable edge pressure
US6494774B1 (en) Carrier head with pressure transfer mechanism
US6244942B1 (en) Carrier head with a flexible membrane and adjustable edge pressure
US6358121B1 (en) Carrier head with a flexible membrane and an edge load ring
US6755726B2 (en) Polishing head with a floating knife-edge
JP2000354960A (en) Carrier head for chemical mechanical polishing of substrate
JP2001054854A (en) Carrier head having pressable bag type part
US7063604B2 (en) Independent edge control for CMP carriers
US6569771B2 (en) Carrier head for chemical mechanical polishing
US6855043B1 (en) Carrier head with a modified flexible membrane
TW520319B (en) Polishing head of chemical mechanical polishing apparatus and polishing method using the same
US6739958B2 (en) Carrier head with a vibration reduction feature for a chemical mechanical polishing system
TW450866B (en) Carrier head with an flexible membrane and an edge load ring

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees