TW444363B - Manufacturing method for ball grid array packaging structure - Google Patents

Manufacturing method for ball grid array packaging structure Download PDF

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Publication number
TW444363B
TW444363B TW89105411A TW89105411A TW444363B TW 444363 B TW444363 B TW 444363B TW 89105411 A TW89105411 A TW 89105411A TW 89105411 A TW89105411 A TW 89105411A TW 444363 B TW444363 B TW 444363B
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Taiwan
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film
substrate
cavity
grid array
mold
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TW89105411A
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Chinese (zh)
Inventor
Shyh-Ing Wu
Shin-Hua Chao
Yao-Shin Fang
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Advanced Semiconductor Eng
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Publication of TW444363B publication Critical patent/TW444363B/en

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Abstract

A manufacturing method for ball grid array packaging structure which includes the following steps: (a) providing a thin film with an opening; (b) locating the thin film on a substrate; (c) fixing a semiconductor chip on the upper surface of the substrate so that the semiconductor chip is located in the opening of the thin film; (d) electrically connecting the semiconductor chip to the substrate; (e) providing a mold comprising a runner, a gate and a cavity in which the runner is connected to the cavity through the gate; (f) clamping the mold to make the semiconductor chip located in the cavity where the thin film is located outside the cavity, and the runner and the edge of the gate are completely attached on the thin film; (g) injecting the encapsulation plastic material into the cavity; (h) curing the encapsulation plastic material; (i) opening the mold; and, (j) degating the runner and removing the thin film. The thin film in accordance with the present invention has larger adhering force with the encapsulation plastic material than the adhering force between the thin film and the substrate. Therefore, in the step (j), because the thin film will be apt to attach on the excess encapsulation plastic material, it will simultaneously remove the thin film during removing the excess encapsulation plastic material so as to automate the encapsulation process.

Description

mi: Ττ " _ (以上各攔由本局 u' 卜 ejrr 發明專利說明書 444363 一 中文 製造球格陣列封裝構造之方法 % 、 發明名稱 英文 姓名 (中文) 1. 吳世英 2. 趙興華 3. 馮耀信 發明人 姓名 (英文) 1. Wu Shyh-Ing 2. CHAO Shin Hua 3. Fang Yao Shin ' 國籍 1·中華民困2.中華民明3.中華民困 住、居所 1· ί ft#冬祛!5f神展村自由路216珑9樓 2. 高雄市左營甚和先街56巷63弄6猇 3. 花蓮市中和街119號 姓名 (名稱) (中文5 1.日月光半導《製造股份有限公司 * 姓名 (名稱) (英文) 1. Advanced Semiconductor Engineering, Inc. 中 國藉 1.中華民國 住、居所 (事務所) 1.高雄市楠梓加工出口區經三路26號 代表人 姓名 (中文) 1.張虔生 代表人 姓名 (英文) 1. τmi: Ττ " _ (The above are all blocked by this bureau u 'ejrr invention patent specification 444363 a method of manufacturing ball grid array package structure in Chinese%, invention name English name (Chinese) 1. Wu Shiying 2. Zhao Xinghua 3. Feng Yaoxin Inventor's Name (English) 1. Wu Shyh-Ing 2. CHAO Shin Hua 3. Fang Yao Shin 'Nationality 1. Chinese People's Sleep 2. Chinese People's Ming 3. Chinese People's Sleep, Residence 1. ft # 冬 消! 5f 9th Floor, 216 Longjiu Road, Shenzhan Village 2. Kao Hsiung City, Lane 63, Lane 56, Hehexian Street, Kaohsiung City 3. No. 119, Zhonghe Street, Hualien City Company * Name (Name) (English) 1. Advanced Semiconductor Engineering, Inc. China Borrowed 1. Residence, Domicile (Office) of the Republic of China 1. Representative Name (Chinese), No. 26 Jingsan Road, Nanzi Processing and Export Zone, Kaohsiung City 1. Name of Zhang Qiansheng's Representative (English) 1. τ

Claims (1)

4443 634443 63 五、發明說明(1) 於製造球格陣列封裝構造 發明領域: 之封 於製 ’其特別有關於用 本發明係有關於一種用於製s 0 if ^(encapsulating method ) 造凹穴式(cavi ty down)球格陣列封裝構造之封膠方法。. 先前技術: 習知的凹穴式(cavity down )球格陣列封裝構造一般係 包含一晶片設於一基板之凹穴。該晶月表面之晶片輝整係 以連接線(bonding wires)連接至設於該基板上表面凹穴 遇邊的晶片連接墊(chip bonding pad)。該基板之上表面 設有複數個錫球銲墊位於該複數個晶片連接墊之週邊。該 複數個錫球銲墊係分別電性連接至相對應之晶片連接墊。 該每一錫球銲墊係設有一錫球用以與外界電性溝通。該晶 片、連接線以及該基板之凹穴係為一封膠體包復(包括該 基板上表面之一部分)。該封膠體一般係以傳遞模塑法 (transfer molding)形成 β 第一圈所示係為用於製造凹穴式(cavity down)球格陣 列封裝構造之習用鑄模裝置100,其主要包含一模具,其 具有一洗道110、一洗道口 120以及一棋穴130。該澆道110 係延伸自一罐(pot)(未示於圖中),並且該洗道110係經 由澆道口120與棋穴130相連接· 將封膠塑料置於該罐内,並且將該棋具密合夾住後, 一壓注頭(未示於圖中)會開始移動向下壓縮封膠塑料。 該棋具以及封膠塑料係先經過預熱使得當該壓注頭向下壓 縮封膠塑料時,該封膠塑料會液化並且經由該澆道110以V. Description of the invention (1) Field of invention for manufacturing a ball grid array package structure: Sealed in manufacturing system, which is particularly related to the use of the present invention, is related to a method for manufacturing s 0 if ^ (encapsulating method) ty down) Sealing method of ball grid array package structure. Prior art: The conventional cavity down ball grid array package structure generally includes a cavity in which a chip is disposed on a substrate. The wafer glaze on the surface of the lunar moon is connected to the chip bonding pads on the edge of the upper surface of the substrate by bonding wires. A plurality of solder ball pads are disposed on the upper surface of the substrate and are located around the plurality of chip connection pads. The plurality of solder ball pads are electrically connected to corresponding wafer connection pads, respectively. Each solder ball pad is provided with a solder ball for electrical communication with the outside world. The wafer, the connecting line and the cavity of the substrate are covered with a colloid (including a part of the upper surface of the substrate). The sealing compound is generally formed by transfer molding. The first circle is shown as a conventional mold device 100 for manufacturing a cavity down ball grid array package structure, which mainly includes a mold. It has a washing channel 110, a washing channel opening 120, and a chess hole 130. The runner 110 extends from a pot (not shown in the figure), and the washing channel 110 is connected to the chess hole 130 through the runner 120. The plastic sealant is placed in the tank and the After the chess set is tightly clamped, a pressure injection head (not shown) will start to move downward to compress the plastic sealant. The chess set and the sealing plastic are preheated first so that when the injection head compresses the sealing plastic downward, the sealing plastic will liquefy and pass through the runner 110 to 第5買 4443 6 3 五、發明說明(2) --- ^ 及澆道口120而充滿祺穴130以包覆該半導體晶月。當封膝· 塑料充滿模穴210後,壓注頭保持靜止且持續一預定時間· 直至封膠塑料硬化。然後,壓注頭上升且將模具打開/取、 出模製產品。然而該封膠塑料不僅填滿該模穴130而且也_ 會填滿該澆道口 120、洗道110以及罐。該多餘之封膠塑料 一般必須在由模製產品去除因此,該缚棋裝置1〇〇另包 含一金屬隔板140用以分隔該多餘之封膠塑料以及基板, 藉此避免基板在「去鑄澆道」製程(亦即移除該多餘的封 膠塑料)被扭曲或破壞。該洗道口 120之截面積一般係小 於該澆道110用以幫助該「去鑄澆道」製程。 第二圖所示係為用於製造凹穴式(cavity down)球格陣 列封裝構造之習用鑄模裝置200 β該鑄棋裝置2〇〇之特徵在γ 於包含一固定塊150用以分隔該多餘之封膠塑料以及基 板。 然而’前述先前技術之缺點在於無法自動化作業。因 為當模具打開後’該金屬隔板140或固定塊150無法在進行 「去鑄洗道」製程時一併移除。而在多餘的封膠塑料移除 後’該金屬隔板140或固定塊150會妨礙内建於模具内之頂 針(pins)將棋製品自動頂出。因此,一般必須先利用人工 將金屬隔板140或固定塊丨5〇移除以避免其妨礙模製產品之 頂出。 此外’由於該金屬隔板14〇或固定塊150易囡重複使用〆 而變形’因此容易產生溢膠(flash)而影響錫球銲墊之銲 錄連接可靠性(solder joint reliability)。Buy 5th 4443 6 3 V. Description of the invention (2) --- ^ and gate 120 filled with Qi hole 130 to cover the semiconductor crystal moon. After the knee-sealing plastic fills the cavity 210, the injection head remains stationary for a predetermined time. Then, the injection head is raised and the mold is opened / taken out of the molded product. However, the sealing plastic not only fills the cavity 130 but also fills the gate 120, the washing channel 110, and the tank. The excess sealing plastic must generally be removed by the molded product. Therefore, the binding device 100 further includes a metal partition 140 to separate the excess sealing plastic and the substrate, thereby preventing the substrate from being "decasted" The "runner" process (that is, removing the excess sealant) was distorted or damaged. The cross-sectional area of the gate 120 is generally smaller than that of the runner 110 to help the "decast runner" process. The second picture shows a conventional casting device 200 for manufacturing a cavity down ball grid array package structure. The characteristics of the casting device 200 are as follows: γ includes a fixed block 150 to separate the excess. Sealing plastic and substrate. However, a disadvantage of the aforementioned prior art is that it cannot be automated. Because when the mold is opened, the metal partition 140 or the fixing block 150 cannot be removed together during the "decasting and washing lane" process. After the excess sealing plastic is removed, the metal partition 140 or the fixing block 150 will prevent the pins built in the mold from automatically ejecting the chess pieces. Therefore, it is generally necessary to manually remove the metal partition 140 or the fixing block 50 in order to prevent it from hindering the ejection of the molded product. In addition, 'the metal spacer 14 or the fixing block 150 is easily deformed due to repeated use', so flash flash is likely to occur and affect solder joint reliability of the solder ball pad. 4 443 6 34 443 6 3 發明概要: 本發明之主要目的傜裎 造方法,其在封膠製程中利用一薄 陣列封裝構造之製 以及基板,其中該薄媒可在:行㈣ 移除,藉此使封膠製程可自動化作業,澆道」冑程時-併 造方本法發m一朦目切的係提供一種球格陣列封裝構造之製 Λ太Λ Λ Λ中利用一薄膜來防止溢膠的產生。 根據本發明之製造球格陣列封裝構造之方法,其包含 下列步称- (a)提供一薄膜具有一開口; (b)放^該薄 膜於一基板;(c)固定一半導體晶片於該基板之上表面使 得該半導體晶片係位於該薄膜之開口内:(d)電性連接該 半導艘晶片至該基板;(e)提供一模具,其具有一洗道、 一洗道口以及一模穴,其中該澆道係由澆道口連接至該模 穴;(f)密合夾緊該棋具使得該半導馥晶片係位於該模穴 内,其t該薄媒係位於該模穴外,並且該澆道以及洗道口 之邊緣係完全密接在該薄膜之上;(g)將封縢塑料注入該 模穴中;(h)硬化該封膠塑料;(i)打開該模具;及(J) 去轉澆道(degating)並且同時移除該薄膜。根據本發明之 薄膜,其與封膠塑料間的附著力係大於其與基板間的附著 力。因此在步驊(j)中’由於該薄膜傾向於附著在多餘的 封應·塑料上,因此移除該多餘的封移塑料時可同時带,該 薄琪,藉此使封膠製程可自動化作業*此外,由於該薄f 可用後即棄,因此不會因重複使用而變形,藉此可防土展 生溢膠(f lash)。Summary of the Invention: The main purpose of the present invention is a fabrication method, which utilizes a thin array package structure and a substrate in a sealing process, wherein the thin medium can be removed in a row, thereby automating the sealing process. In the process of "operation, runner"-and the method of this method is to provide a ball grid array package structure Λ Tai Λ Λ Λ using a film to prevent the occurrence of glue overflow. The method for manufacturing a ball grid array package structure according to the present invention comprises the following steps-(a) providing a film with an opening; (b) placing the film on a substrate; (c) fixing a semiconductor wafer to the substrate The upper surface is such that the semiconductor wafer is located in the opening of the film: (d) electrically connecting the semiconductor wafer to the substrate; (e) providing a mold having a washing channel, a washing channel opening, and a cavity Where the runner is connected to the cavity by the runner; (f) the chess set is tightly clamped so that the semiconducting wafer system is located inside the cavity, the thin media system is outside the cavity, and the The edges of the runner and the washer are completely tightly attached to the film; (g) the sealing plastic is injected into the cavity; (h) the sealing plastic is hardened; (i) the mold is opened; and (J) the The degating and simultaneous removal of the film. According to the film of the present invention, the adhesion between the film and the sealant is greater than the adhesion between the film and the substrate. Therefore, in step (j), 'Since the film tends to adhere to the excess sealing plastic, it can be taken at the same time when removing the excess sealing plastic, so that the thin seal can be automated. Operation * In addition, since the thin f is disposable after being used, it will not be deformed due to repeated use, thereby preventing soil scum. 第7 I 4443 63 五、發明說明(4) ----- ®示說明: 為了讓本發明之上述和其他目的、特徵、和優點能更 明顯特徵,下文特舉本發明較佳實施例, 示,作詳細說明如下β 1 ρ α 第1 ® ·· -習用鑄模裝置之剖面圈,其係用於製造一 凹穴式(cavity down)球格陣列封裝構造; 第2圈:另一習用鑄棋裝置之剖面圖;及 謇A3 圓:其係用以說明一種根據本發明較佳 實施利之製造球格陣列封裝構造之方法β 圖號說明: 120 150 220 230 澆道口 固定塊 基板 金線 100 鑄模裝置 130 模穴 20 0 鑄模裝置 222 凹穴 300 薄骐 11 〇 澆道 140 金屬隔板 210 半導體晶片 224 錫球銲墊 發明說明: 4 d第&三》4圖至第七圖揭示一種根據本發明較佳實施利之製 造球格陣列封裝構造之方法· 第三圓揭示一基板片(strip)包含複數個基板(只有兩 個基板2 2 0示於第三圈中)以及一薄膜3〇〇具有一開口。在 I產時’ 一般係將複數個基板2 20整合成一片使得封裝製 程可以自動化。該基板220上表面具有一凹穴222。該基板 220上表面投有複數個晶片連接墊(未示於圓中)於該凹 穴2 22之遇邊,以及複數個錫球銲墊224位於該晶片連接墊 4443 63 五、發明說明(5) - 之週邊,其t該複數個錫球銲墊224係分別電性連接至相 對應之晶片連接墊。 : 該薄膜300較佳係以耐熱之材質製成,並且不會在封膠 製程十變形臀翹(warp),換言之,其必須可耐封膠製程之· 工作溫度(約1 75 °C )。此外,該薄膜3 0 0與封膠塑料間的 附著力必須大於薄膜與基板220間的附著力。較佳地,該 薄膜與封膠塑料間的附著力係約為薄膜與基板間附著力的 十倍。適合之薄臈材質為鐵氟龍(Teflon (polytetrafluroethylene, PTFE))或乙烯四氣乙烯 (ethylene tetrafluroethylene, ETFE) 〇 請參照第四圖,首先將該薄膜300係放置於該基板220 之上表面使得該複數個晶片連接墊(未示於囷中)係位於 該薄膜3 00之開口内。然後將一半導體晶片210藉由一導電 膠例如銀膠(来示於圖中)固著於該基板2 20之凹穴222。 該半導體晶片210具有複數個晶片銲墊(未示於圓中)設 在其上表面’用以連接其内部電路》該複數條連接線例如 金線230係利用習知的線辞(wire bonding)技術分別連接 該半導醴晶片210之複數個晶片銲墊至該基板2 2〇上表面之 複數個晶片連接墊(未示於圖中)。 較佳地,該基板220上靠近凹穴222之内排錫球銲墊224 係全部為該薄膜300所後蓋,藉此防止產生溢膠(flash)而 確保錫球銲墊2 24之銲錫連接可靠性(s〇ider j〇int reliability) ° 請參照第五圈’將棋具密合夾緊使得該半導通晶片230Chapter 7 I 4443 63 V. Description of the Invention (4) ----- ® shows: In order to make the above and other objects, features, and advantages of the present invention more obvious, the following describes the preferred embodiments of the present invention, As shown in the following, the detailed description is as follows: β 1 ρ α Section 1 of the conventional mold device, which is used to manufacture a cavity down ball grid array package structure; second circle: another conventional mold Sectional view of a chess device; and 謇 A3 circle: it is used to explain a method for manufacturing a ball grid array package structure according to a preferred embodiment of the present invention. Β Drawing number description: 120 150 220 230 Device 130 Mold cavity 20 0 Mold device 222 Cavity 300 Thin 骐 11 〇Gate 140 Metal spacer 210 Semiconductor wafer 224 Solder ball pad Description of the invention: A method for manufacturing a ball grid array package structure according to a preferred embodiment of the present invention. The third circle reveals that a substrate strip includes a plurality of substrates (only two substrates 220 are shown in the third circle) and a thin film 300 has One Opening. At the time of production, a plurality of substrates 2 to 20 are generally integrated into one package so that the packaging process can be automated. The upper surface of the substrate 220 has a cavity 222. A plurality of wafer connection pads (not shown in a circle) are projected on the upper surface of the substrate 220 at the edges of the recesses 2 and 22, and a plurality of solder ball pads 224 are located on the wafer connection pads 4443 63 5. Description of the invention (5 )-, The plurality of solder ball pads 224 are electrically connected to corresponding wafer connection pads, respectively. : The film 300 is preferably made of a heat-resistant material and does not deform warp during the sealing process. In other words, it must be resistant to the operating temperature of the sealing process (about 1 75 ° C). In addition, the adhesion between the film 300 and the sealing plastic must be greater than the adhesion between the film and the substrate 220. Preferably, the adhesion between the film and the sealing plastic is about ten times the adhesion between the film and the substrate. A suitable thin material is Teflon (polytetrafluroethylene (PTFE)) or ethylene tetrafluroethylene (ETFE). Please refer to the fourth figure. First place the film 300 on the top surface of the substrate 220 so that The plurality of wafer connection pads (not shown in the figure) are located in the opening of the film 300. A semiconductor wafer 210 is then fixed to the cavity 222 of the substrate 2 20 by a conductive adhesive such as silver adhesive (shown in the figure). The semiconductor wafer 210 has a plurality of wafer pads (not shown in the circle) provided on the upper surface thereof to connect its internal circuits. The plurality of connection wires, such as gold wires 230, use conventional wire bonding. The technology connects a plurality of wafer bonding pads of the semiconductor wafer 210 to a plurality of wafer connection pads (not shown in the figure) on the upper surface of the substrate 220. Preferably, the inner row of the solder ball pads 224 on the substrate 220 near the cavity 222 are all the back cover of the film 300, thereby preventing the occurrence of flash and ensuring the solder connection of the solder ball pads 24. Reliability (s〇ider j〇int reliability) ° Please refer to the fifth circle 'closely clamp the chess set so that the semi-conducting chip 230 4443 63 五、發明說明(6) 係位於模穴130中,該薄膜300係位於該模穴130外,並且 該洗道110以及澆道口 120之邊緣係完全密接在該薄膜300 之上。接著,將封膠塑料注入該模穴130中。此時,該薄 膜300提供良好之密封效果而防止溢膠產生在該基板之上, 表面’從而避免錫球銲墊224受溢膠之污染。然後,在該 封膠塑料硬化後,打開該模具。 最後’進行去鑄洗道(degating)製程一亦即將模製品 上多餘之封膠材料去除。由於該薄膜3〇〇傾向於附著在多 餘的封膠塑料上,因此移除該多餘的封膠塑料時可同時帶 走該薄膜(參見第七圊)》此時,内建於模具内之頂針 (jins)即可自動將模製品頂出,而製得如第六闽所示之凹 穴式(cavity down)球格陣列封裝構造。可以理解的是, 根據本發明之製造球格陣列封裝構造之方法,其可另包含 將錫球裝設於該錫球銲墊224之步騍》 根據本發明之製造球格陣列封裝構造之方法,其移除 該多餘的封膠塑料時可ϋ帶走該薄膜,藉此使封膠製程 可自動化作業《此外’ ΐ於該薄膜係用後即棄,因此不會 因重複使用而變形,藉此可防止產生溢膠(flash)。 雖然本發明已以前述較佳實施例揭示,然其並非用以 限定本發明,任何熟習此技藝者’在不脫離本發明之精神 和範圍内,當可作各種之更動與修改,因此本發明之保護 範園當視後附之申請專利範圍所界定者為準。4443 63 V. Description of the invention (6) The system is located in the cavity 130, the film 300 is located outside the cavity 130, and the edges of the washing channel 110 and the sprue opening 120 are completely in contact with the film 300. Then, a sealing compound is injected into the cavity 130. At this time, the thin film 300 provides a good sealing effect to prevent the overflow of glue from occurring on the substrate, and the surface ', thereby preventing the solder ball pad 224 from being contaminated by the overflow of glue. Then, after the sealant has hardened, the mold is opened. Finally, a degating process is performed, that is, the excess sealing material is removed from the molded product. Since the film 300 tends to adhere to the excess sealing plastic, the film can be taken away at the same time when removing the excess sealing plastic (see Section 7). At this time, the ejector pin built into the mold (jins) can automatically eject the molded product, and obtain a cavity down (cavity down) ball grid array packaging structure as shown in the sixth Fujian. It can be understood that the method for manufacturing a ball grid array package structure according to the present invention may further include a step of mounting a solder ball on the solder ball pad 224. The method for manufacturing a ball grid array package structure according to the present invention When removing the excess sealing plastic, the film can be taken away, so that the sealing process can be automated. In addition, the film is discarded after being used, so it will not be deformed due to repeated use. This prevents the occurrence of flash. Although the present invention has been disclosed in the foregoing preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. The protection of Fan Yuan shall be determined by the scope of the attached patent application. 案號 89105411 a 修正 圖式簡單說明 m 請 委 貝 明 示 ) 本 案 秦 JE 後 否 吏 原 實 質 内 客 93.1. 18 Φΐ^zsCase No. 89105411 a Brief description of the revised diagram m Please indicate clearly to the commissioner) After the QE of this case, the original authentic guest 93.1. 18 Φΐ ^ zs P00-023,ptc 第11買P00-023, ptc Buy 11
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003044850A1 (en) * 2001-10-05 2003-05-30 Advanced Systems Automation Ltd Apparatus for molding a semiconductor wafer and process therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003044850A1 (en) * 2001-10-05 2003-05-30 Advanced Systems Automation Ltd Apparatus for molding a semiconductor wafer and process therefor

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