TW424146B - Automatic test system with general-purpose instrument control interface - Google Patents

Automatic test system with general-purpose instrument control interface Download PDF

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TW424146B
TW424146B TW88106925A TW88106925A TW424146B TW 424146 B TW424146 B TW 424146B TW 88106925 A TW88106925 A TW 88106925A TW 88106925 A TW88106925 A TW 88106925A TW 424146 B TW424146 B TW 424146B
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instrument
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interface
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TW88106925A
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Wu-Sung Ye
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Inst Information Industry
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Abstract

This invention is about the automatic test system with general-purpose instrument control interface, in which one of the purposes is to simplify the real instrument operation for the operator and multi integrated functions of real instrument are added. The automatic test system of this invention includes the followings: a executing module; a virtual resource tool, which is processed by the executing module such that at least one application program interface is used to control one test instrument. The application program interface includes the function parameter of complex number that can be used to drive the corresponding function of complex number.

Description

424146 ^ 五、發明說明(1) 本發明係有關於一種儀器控制介面 種用於自動測試系統中通用控制儀器之抢疋有關於一 一般測試儀器通常為針對某種测試=2° 定測試功·,因此目前常見之測試儀器:=具有某些特 設計’或是具備-些常用量測功能如電、、^為特定待測物 率 '或是溫度感測等基本功能。然而,:二電壓頻 不便之處。首先,待測物所被測量之規格厂方法有其 測物會產生許多互異欲待測功能之組合。’?:同待 儀器所提供之測試功能有限’面對 母一測試 時使用多個測試機台同時對單—肖j複雜之相物需同 上之困·。此外,不同廠商所提供之測ΐ‘ί 可能’甚至同一廠商所提供不同之測試儀 儀::Π。當使用者欲同時操作不同測量 儀為進订量測時,需同時以不同的驅動程式(Drivers) 相對應之儀器’此類操作性不相容使得測試儀器間無 法相互溝通,彼此之功能無法互為利用而降低測量儀器之 可利用性。 因此,本發明的目的之一即是提供一種儀器控制介 面,在自動測試系統中獨立地控制測量儀器之功能。 d利用本發明所提供之介面,可於廠商所提供之測量儀 器之驅動程式與一虛擬資源工具(Virtual Resource Tool )間提供轉換。透過—轉換資料庫與編譯(c〇mpi Ur )程序’在虛擬資源工具中所執行之一或多個應用程式介 面會與廠商所提供一測量儀器之驅動程式相對應。此外,424146 ^ V. Description of the invention (1) The present invention relates to an instrument control interface for grabbing general-purpose control instruments in automatic test systems. A general test instrument is usually designed for a certain test = 2 °. · Therefore, currently common testing instruments: = have some special design 'or have-some commonly used measurement functions such as electricity, ^ for a specific rate of the object to be tested' or basic functions such as temperature sensing. However, the two voltages are inconvenient. First of all, the factory method of the object to be measured has its own test object, which will produce many combinations of different functions. ‘? : Same treatment The test function provided by the instrument is limited. When facing a single test, it is necessary to use multiple test machines to simultaneously test single-Xiao j complex phases. In addition, the testing provided by different manufacturers ‘ί may’ or even different testing instruments provided by the same manufacturer :: Π. When the user wants to operate different measuring instruments at the same time for ordering measurement, the instruments corresponding to different drivers must be used at the same time. 'This kind of incompatible operation makes the testing instruments unable to communicate with each other and their functions cannot be Use each other to reduce the availability of measuring instruments. Therefore, one of the objects of the present invention is to provide an instrument control interface for independently controlling the function of a measuring instrument in an automatic test system. d Using the interface provided by the present invention, conversion can be provided between the driver of the measuring instrument provided by the manufacturer and a Virtual Resource Tool. The one-or-multiple application program interface executed in the virtual resource tool by the "transformation database and compiling (commpi Ur) program" will correspond to the driver of a measuring instrument provided by the manufacturer. In addition,

第4頁 五、發明說明(2) 該轉換資料庫亦可為知门成成 供測量儀器之驅動:式:應::式介面提供互異廠商所提 用,避免以相同的應用程式介面加以驅動使 用互異驅動程式間不相容的問題發生。 之互異驅動i j:之另一目的是將互異測量儀器分別附屬 人之一式夕伽庇τ〇01)中。使用者可透過經定義整 :測量儀;所阳:程式介面對互異測量儀器進行量測,不 屬之驅動程式為何,使用者可以單—應用 :式ί面驅動互異廠商所提供具相同功能但互不相容之驅 2程式,達到儀器間功能相互整合與利用之㈣,並可同 版運用多種儀器所附屬之多種特定功能,無須為量測待測 =不同規格而於特定量測儀器間作反覆切換,並簡化使 用者之操作流程。 在本發明之虛擬資源工具中,應用程式介面扮演量測 儀器者與互異儀器之驅動程式間之參數與指令之轉換角 色。一虛擬資源工具中可用有數個應用程式介面遂行自動 儀器量測之功能,其中應用程式介面可驅動一個或多個實 體儀器針對多類儀器功能進行測試。 為讓本發明之上述和其他目的、特徵、和優點能更明 顯易僅,下文特舉一較佳實施例’並配合所附圖式,作詳 細說明如下。 圖示之簡單說明: 第1圖係顯示為根據本發明之一第一類型介面應用之 第5頁 4 24 M6 五、發明說明(3) ~ ' --- 系統架構概要圖; 第2圖係顯示為根據本發明之三個虛擬資源工具之實 例; 、只 第3圖係顯示為根據本發明之一第二類型介面應用之 系統架構概要圖; 第4圖係顯示為根據本發明中虛擬資源工具與執行模 組進行編輯與編譯之關係架構圖。; 第5A與5B圖係顯示對應第1圖所示之系統架構之—實 施例及其流程圖;以及 第6A與6B圖係顯示對應第3圖所示之系統架構之一實 施例及其流程圖。 符號說明: 10〜執行模組;12、30、20-24〜虛擬資源工具; 14、32、34〜驅動程式;16、36、38〜實際儀器;ι8〜待 測物;DB1、DB2〜資料庫;TPSE〜編輯器;TPSC〜編譯 器;S50-S59、S600_S660〜實施例流程步驟。 實施例: 如第1圖所示為根據本發明之一第一類型介面應用之 系統架構概要圖。執行模組1 〇可為測試平台或操作系統 (Operation System);虛擬資源工具12中包含各類獨立 輸出之應用程式介面(Application Program Interface, API) ’此類應用程式介面可利用對應實際儀器之驅動程 式操控實際儀器16之一或多個功能,此動作將於下文詳 述。此值得注意的是’實際上虛擬資源工具乃透過應用程5. Description of the invention on page 4 (2) The conversion database can also be used as a driver for the measurement instrument: type: should :: The type interface is provided by different manufacturers to avoid using the same application program interface. Incompatibility issues between drivers using different drivers have occurred. Another purpose of the mutual drive i j: is to separate the mutual measurement instruments into one of the attached persons (Yakahi τ〇01). The user can use the defined whole: measuring instrument; soyang: program interface to measure the different measurement instruments, what is the driver that does not belong, the user can single-application: the type of surface driver provided by the different manufacturers with the same Functional but incompatible driver 2 program, to achieve the integration and use of functions between instruments, and can use the same version of a variety of specific functions attached to a variety of instruments, no need to measure for testing = different specifications for specific measurements Repeatedly switch between instruments and simplify the user's operation process. In the virtual resource tool of the present invention, the application program interface plays the role of conversion of parameters and instructions between the measuring instrument user and the driver of the different instrument. A virtual resource tool can have several application program interfaces for automatic instrument measurement. The application program interface can drive one or more physical instruments to test multiple types of instrument functions. In order to make the above and other objects, features, and advantages of the present invention more apparent, a detailed description is given below with reference to a preferred embodiment 'and the accompanying drawings. Brief description of the figure: Figure 1 shows page 5 of the first type of interface application according to the present invention. 4 24 M6 5. Description of the invention (3) ~ '--- System architecture outline; Figure 2 shows Shown as an example of three virtual resource tools according to the present invention; Figure 3 only shows a schematic diagram of a system architecture of a second type of interface application according to the present invention; Figure 4 shows a virtual resource according to the present invention Diagram of the relationship between tools and execution modules for editing and compilation. Figures 5A and 5B show an embodiment corresponding to the system architecture shown in Figure 1 and its flowchart; and Figures 6A and 6B show an embodiment corresponding to the system architecture shown in Figure 3 and its process Illustration. Explanation of symbols: 10 ~ executing module; 12,30,20-24 ~ virtual resource tools; 14,32,34 ~ driver; 16,36,38 ~ actual instrument; ι8 ~ under test; DB1, DB2 ~ data Library; TPSE ~ Editor; TPSC ~ Compiler; S50-S59, S600_S660 ~ embodiment process steps. Embodiment: Fig. 1 is a schematic diagram showing a system architecture of a first type of interface application according to the present invention. The execution module 10 can be a test platform or an operating system; the virtual resource tool 12 includes various independent output application program interfaces (APIs). 'This application program interface can use the corresponding The driver controls one or more functions of the actual instrument 16, and this action will be described in detail below. It ’s worth noting that ‘virtual resource tools are actually

第6頁 424146 五、發明說明(4) 式介面與儀器供應商所提供各類實際儀器驅動程式14進行 功旎性地對應轉換,使儀器操作者僅需設定相同之應用程 式介面,即可驅動不同儀器供應商生產具目的功能之儀 器,達到儀控介面之目的。在此值得注意的是實際儀器之 驅動程式亦可為操作者依各類型使用目的而自行加以開 發,例如直接由應用程式介面以較低階程式語言直接呼叫 操控實際儀器功能。因此,雖然伴隨互異儀器之互異驅動 程式存在電腦语言、參數定義、或是其他相容性問題,但 位於測試輸入端之測試儀器操作者僅會面對相同應用程式 介面’並對經轉換之對應操作參數作調整即可對各類儀器 之欲測試項目進行測試與監控。 第2圖所示即為本發明中三個虛擬資源工具2〇、22、 以及2 4之實例’分別可驅動交流電源供應、調整交流電源 電麼、以及交/直流電源供應之功能。在虛擬資源工具2〇 中包括二種應用程式介面’重置RESEt ()、供應交流電 源信號apply_ac_signal ()、以及設定交流電源信號 SETUP_AC_SIGNAL ()。上述三種應用程式介面之型態與 函式相類似’其中可依實際測試需求與第1圖所示之實際 儀器驅動程式之不同而加入欲操控之功能參數。例如在設 定交流電源信號SETUP一AC_SIGNAL ()中可加入包括交流 電壓之頻率、振幅、以及相位等資訊。因此,雖然不同儀 器臭有不同的驅動程式與設定參數,但操作者在使用端可 利用相同之應用程式介面進行測試的工作。 此外不同虛擬資源工具亦可有相同之應用程式介Page 6 424146 V. Description of the invention (4) The type interface is converted correspondingly with various actual instrument driver programs 14 provided by the instrument supplier, so that the instrument operator only needs to set the same application program interface to drive Different instrument suppliers produce instruments with purposeful functions to achieve the purpose of instrument control interface. It is worth noting here that the driver of the actual instrument can also be developed by the operator for each type of use purpose. For example, the application program interface can directly call and operate the actual instrument function in a lower-level programming language. Therefore, although there are computer languages, parameter definitions, or other compatibility issues with the disparate drivers that accompany disparate instruments, test instrument operators located at the test inputs will only face the same application program interface 'and convert The corresponding operating parameters can be adjusted to test and monitor the various items to be tested. Figure 2 shows examples of three virtual resource tools 20, 22, and 24 in the present invention, which can drive AC power supply, adjust AC power supply, and AC / DC power supply. The virtual resource tool 20 includes two kinds of application program interfaces ‘reset RESEt (), supply AC power signal apply_ac_signal (), and set AC power signal SETUP_AC_SIGNAL (). The types of the above three application program interfaces are similar to functions. Among them, the function parameters to be controlled can be added according to the actual test requirements and the actual instrument driver shown in Figure 1. For example, information such as the frequency, amplitude, and phase of the AC voltage can be added to the set AC power signal SETUP_AC_SIGNAL (). Therefore, although there are different drivers and setting parameters for different instrument odors, the operator can use the same application program interface for testing at the user end. In addition, different virtual resource tools can have the same application program introduction.

424 M6 峭 五、發明說明(5) " " 面為達不同測試目的,各類應用程式介面可依實際需求 組合於虛擬資源工具中。如第2圖所示之虛擬資源工具2〇 與24為例’虛擬資源工具24中之應用程式介面群除包括與 虛擬資源工具20相同之重置RESET ()、供應交流電源信 號APPLY — AC —SIGNAL ()、以及設定直流電源信號 SETUP—AC —SIGNAL ()以外,尚有供應交流電源信號 APPLY_DC一SIGNAL ()以及設定直流電源信號 SETUP—DC—SIGNAL ()。因此,本發明之虛擬資源工具中 應用程式介面群可加以擴充。依第2圖所舉之實例而言, 若實際儀器可提供對交流與直流信號之量測功能,則可針 對信號種類與特性之需求形成各類虚擬資源工具達成驅動 實際儀器之目的。 第3圖所示為根據本發明之一第二類型介面應用之系 統架構概要圖。此系統可利用一虛擬資源工具對複數不同 實際儀器進行驅動,圖示則以對兩不同實際儀器進行測試 操控為例。如圖所示,此系統包括一執行模組1 0、虛擬資 源工具30、實際儀器之驅動程式32與34、以及對應上述驅 動程式之實際儀器36與38。習知自動測試系統僅能對單一 實際儀器進行驅動與操控,但利用本發明之虛擬資源工具 中各類應用程式介面之組合,可針對不同目的驅動複數實 際儀器以達成測試之目的。例如,實際儀器36可被驅動產 生直流信號,而實際儀器38可被驅動產生交流信號。利用 第2圖所示之虛擬資源工具24,亦即同時對應第3圖中驅動 程式32與34,其所内含之複數應用程式介面可分別驅動重424 M6. 5. Description of the invention (5) For different testing purposes, various application program interfaces can be combined into virtual resource tools according to actual needs. The virtual resource tools 20 and 24 shown in FIG. 2 are examples. The application program interface group in the virtual resource tool 24 includes the same reset RESET () as the virtual resource tool 20, and the AC power supply signal APPLY — AC — In addition to SIGNAL () and the set DC power signal SETUP—AC — SIGNAL (), there are also AC power signals APPLY_DC_SIGNAL () and the set DC power signal SETUP — DC — SIGNAL (). Therefore, the application program interface group in the virtual resource tool of the present invention can be expanded. According to the example shown in Figure 2, if the actual instrument can provide measurement functions for AC and DC signals, various types of virtual resource tools can be formed according to the needs of signal types and characteristics to achieve the purpose of driving the actual instrument. FIG. 3 is a schematic diagram showing a system architecture of a second type of interface application according to the present invention. This system can use a virtual resource tool to drive a plurality of different actual instruments. The figure shows the test operation of two different actual instruments as an example. As shown in the figure, this system includes an execution module 10, a virtual resource tool 30, driver programs 32 and 34 of the actual instrument, and actual instruments 36 and 38 corresponding to the above driver program. The conventional automatic test system can only drive and control a single actual instrument, but using a combination of various application program interfaces in the virtual resource tool of the present invention can drive multiple real instruments for different purposes to achieve the purpose of testing. For example, the actual instrument 36 may be driven to generate a DC signal, and the actual instrument 38 may be driven to generate an AC signal. Using the virtual resource tool 24 shown in FIG. 2, that is, corresponding to the driver programs 32 and 34 in FIG. 3 at the same time, the multiple application program interfaces included in it can drive the heavy load respectively.

424t46 iii 五、發明說明(6) 置以及提供與設定交/直流電源等功能。但第3圖所示之系 統架構中對應互異實際儀器之應用程式介面,與第1圖所 示者並不相同。由於欲驅動之應用程式介面所對應之實際 儀器並不相同,各類應用程式介面會對應不同功能驅動不 同實際儀器之驅動程式。但對操作者而言,在測試過程 中,操作者無須直接面對實際儀器之驅動程式32與34、或 實際儀器36與38,而是面對經功能整合之虛擬資源工具 3 〇 ’此對自動量測時獨立儀器操控將有很大之助益。 第4囷所示為本發明中所舉實施例中對虛擬資源工具 與執行模組1 0進行編輯與編譯之關係架構圖。執行模組1 〇 在進行編輯時’執行模組編輯器TPSE會由資料庫DB1與DB2 中分別取得執行模組之資料與虛擬資源工具之定義與功能 之資料’其中執行模組資料庫DB1中包括操作者欲進行之 量測目的,且虛擬資源工具定義與功能資料庫DB2中包括 各類可遂行不同測試功能之虛擬資源工具,該類虛擬資源 工具中包括已與各儀器驅動程式(各實際儀器)相對應轉 換之一或多個應用程式介面。執行模組編輯器TPSE依照此 目的可向資料庫DB2搜尋功能與定義相吻合之需虛擬資源 工具。接著經由執行模組編譯器TPSC編譯後執行後續測試 事項。在本發明所列舉之實施例中,執行模組丨〇係以資料 庫之型式對虛擬資源工具編輯’任何熟悉此技藝之相關人 士亦可利用其他方式編輯/編譯執行模組,例如可利用現 行之電腦語言等非資料庫編輯形式之方法取代執行模組資 料庫DB1、編輯器TPSE、或是編譯器TPSC。424t46 iii V. Description of the invention (6) Functions such as setting and providing and setting AC / DC power. However, the application program interface corresponding to different actual instruments in the system architecture shown in Fig. 3 is not the same as that shown in Fig. 1. Because the actual instrument corresponding to the application program interface to be driven is not the same, various application program interfaces will correspond to different functions to drive different actual instrument drivers. However, for the operator, during the test, the operator does not need to directly face the actual instrument driver 32 and 34, or the actual instrument 36 and 38, but instead faces the virtual resource tool with functional integration. Independent instrument operation will be of great help in automatic measurement. Figure 4 shows a diagram of the relationship between editing and compiling the virtual resource tool and the execution module 10 in the embodiment of the present invention. Execution module 1 〇 When editing, 'Execution module editor TPSE will obtain the execution module data and virtual resource tool definition and function data from the databases DB1 and DB2 respectively', among which the execution module database DB1 Including the measurement purpose that the operator wants to perform, and the virtual resource tool definition and function database DB2 includes various types of virtual resource tools that can perform different test functions. This type of virtual resource tool includes the various instrument driver programs (each actual Instrument) corresponding to one or more application programming interfaces. According to this purpose, the execution module editor TPSE can search the database DB2 for the required virtual resource tools that match the definition. Then compile by the execution module compiler TPSC to execute subsequent test items. In the embodiments listed in the present invention, the execution module is edited to the virtual resource tool in the form of a database. Anyone who is familiar with this technology can also edit / compile the execution module in other ways. The computer database and other non-database editing methods replace the execution module database DB1, the editor TPSE, or the compiler TPSC.

第9頁 4 146 i| 五、發明說明(7) 第5A與5B圖係顯示對應第1圖所示之系統架構之_實 施例。虛擬資源工具PS_AC_1 (及第1圖所示之虛擬資源工 具12) t包含一應用程式介面SETUP_AC一 SIGNAL (),實 際儀器16則採用ELGAR編號SW5250A之電源供應器,其中應 用程式介面SETUP_AC_SIGNAL ()已與ELGAR所提供實際儀 器之驅動程式14完成對應轉換。該應用程式介面 SETUP__AC_SIGNAL ()提供電源信號功能參數包括脈衝 BURST、電流值範圍CURRENT_LIM、直流偏移dc_〇FFSET、 頻率FREQ、相位PHASE—ANGLE、功率值範圍POWER-LIM、以 及電壓值VOLT AGE。此值得注意的是應用程式介面中各類 參數可依實際應用而加以設定,參數名稱與規格可加以規 格化’雖然實際儀器16可能更替’且其驅動程式14會隨之 改變,但操作者仍可依此規格化之參數所代表之功能加以 設定,增加操控之便利性。 第5B圖係顯示第5 A圖中系統架構之操作流程,執行模 組10將送出一連串標準控制程式介面(Standard Control Program Interface )指令。首先,將一交流電源信號耦 接至該實際儀器上(S51)。接著設定該信號之波形(S52 )’如餘弦波形或是方波波形等。調整交流電源信號頻率 (S53)後設定其電壓值(S54)。由於在固定電壓值下電 流會隨實際儀器之阻抗而變化,為確認實際儀器工作於安 全狀況下’必須規範所產生之電流值範圍(s55 )防止如 短路的情況發生。此外,該電源信號之相位會影響量測待 測物之結果,因此相位偏移量亦必須在應用程式介面中加Page 9 4 146 i | V. Description of the invention (7) Figures 5A and 5B show the _ embodiment corresponding to the system architecture shown in Figure 1. The virtual resource tool PS_AC_1 (and the virtual resource tool 12 shown in Figure 1) t includes an application program interface SETUP_AC_SIGNAL (), and the actual instrument 16 uses a power supply of ELgar number SW5250A, of which the application program interface SETUP_AC_SIGNAL () has been Complete the corresponding conversion with the driver 14 of the actual instrument provided by ELGAR. The application program interface SETUP__AC_SIGNAL () provides power signal function parameters including pulse BURST, current value range CURRENT_LIM, DC offset dc_〇FFSET, frequency FREQ, phase PHASE_ANGLE, power value range POWER-LIM, and voltage value VOLT AGE. It is worth noting that the various parameters in the application program interface can be set according to the actual application. The parameter names and specifications can be standardized 'although the actual instrument 16 may be replaced' and its driver 14 will be changed, but the operator still It can be set according to the function represented by this standardized parameter to increase the convenience of control. Fig. 5B shows the operation flow of the system architecture in Fig. 5A. The execution module 10 will send a series of Standard Control Program Interface commands. First, an AC power signal is coupled to the actual instrument (S51). Then set the waveform (S52) 'of the signal, such as a cosine waveform or a square waveform. Adjust the AC power signal frequency (S53) and set its voltage value (S54). Since the current will change with the impedance of the actual instrument at a fixed voltage value, in order to confirm that the actual instrument is operating in a safe state, the current value range (s55) generated must be regulated to prevent situations such as short circuits. In addition, the phase of the power signal will affect the result of measuring the DUT, so the phase offset must also be added in the application program interface.

第10頁 五、發明說明(8) 以設定(S56 )。當所有設定完成後’令利用上述參數驅 動實際儀器所產生之一新交流電源信號輸出並饋入待測物 (S57 ),等待測物傳回測試成功代碼後結束測試(S58 第6A與6B所示為係顯示對應第3圖所示之系統架構之 一實施例。在第6A圖中,虛擬資源工具3271 _8902 (即第3 圖所示之虚擬資源工具3 0 )之功用為對某一待測信號量測 其於某頻域間之靈敏度。實際儀器36與38分別採用RACAL 所生產編號3271之信號產生器用以產生欲量測之信號,以 及HP所生產編號8902A之量測接收器對所上述產生之信號 量測其靈敏度。操作者可對一整合式之應用程式介面 ME AS〜FM —SENSITIVITY ()中各類參數加以設定,其中設 疋參數種類包括頻域範圍range、回送值rea(jing、載波頻 率car_freq、載波功率car —p〇wer、以及頻率模式 mod_freq 。 在此實施例中值得注意的是,應用程式介面可依實 1量需求呼叫其他應用程式介面或是實際儀器之驅動程 ^ :達成量測之目的’操作者不必面對上述其他應用程 二:?動程式°實際上,操作者僅需設定應用程式介面 層應用程式介面以一各類實測目的與應用程式介 捶柞式疋成对應轉換。如第6B圖所示之操控流程, 兮庵田订應用程式介面MEAS—FM_SENSITIVITY ()時’ 介面將依序哞叫應用程式介面 FM—SIGNAI r 、 〔)以及驅動程式Measure_SINAD ()Page 10 V. Description of the invention (8) To set (S56). When all the settings are completed, 'use the above parameters to drive a new AC power signal generated by the actual instrument to output and feed it into the test object (S57), wait for the test object to return the test success code and end the test (S58, 6A and 6B) Shown is an embodiment corresponding to the system architecture shown in Figure 3. In Figure 6A, the function of the virtual resource tools 3271_8902 (that is, the virtual resource tool 3 0 shown in Figure 3) is to The measurement signal measures its sensitivity in a certain frequency domain. The actual instruments 36 and 38 use the signal generator produced by RACAL number 3271 to generate the signal to be measured, and the measurement receiver number 8902A produced by HP is used to measure the signal. The signals generated above are measured for their sensitivity. The operator can set various parameters in an integrated application programming interface ME AS ~ FM —SENSITIVITY (), where the parameter types include frequency range range and return value rea ( jing, carrier frequency car_freq, carrier power car — power, and frequency mode mod_freq. In this embodiment, it is worth noting that the application program interface can call other applications according to the actual demand. Program interface or the driver of the actual instrument ^: To achieve the purpose of measurement 'Operator does not have to face the other application programs mentioned above:? Moving program ° In fact, the operator only needs to set the application program interface layer application program interface to each The actual measurement purpose corresponds to the conversion of the application program interface. As shown in Figure 6B, the control interface will sequentially call the application program interface FM when ordering the application program interface MEAS—FM_SENSITIVITY (). —SIGNAI r, 〔) and driver Measure_SINAD ()

424146 五、發明說明(9) 了 ^ 測(S610 與S620 )。應用程式介面AppLY—FM—signal 依照操作者對應用程式介面meas_fm_sensiti νιτγ )所设定之參數對應驅動信號產生器產生一信號,包括 載波頻率、載波振幅、以及頻率模式等。接著,驅動程式 ㈠驅動量測接收器對該信號進行信號/噪 y失真度之量測。假若此信號/噪音/失真度之量測值在 預期靈敏度範園内,則傳回成功代碼(S64〇);反之,則 調整應用程式介面APPLY—FM—SIGNAL ()中之參數如載波 振幅等,產生另一信號並再次進行信號/噪音失真度之量 /貝J直到所產生之信號符合預期之靈敏度。 由上述根據本發明之兩實施例可看出,在自動測試系 統中,雖然接受測試與操控之各儀器擁有各種類型之驅動 程式,但利用本發明所提供之虛擬資源工具以及其所包含 應用程式介面,操作者無須直接面對繁雜且互不相容之驅 動程式,而是以應實際需要所設定之應用程式介面加以驅 f。本發明中各類虛擬資源工具可依各種不同實測目的組 Q各類型應用程式介面,該等應用程式介面將驅動可遂行 操作者欲測試或操控之目的。虛擬資源工具中單一應用程 式介面可相對應單一驅動程式/實際儀器,亦可呼叫多個 應用程式介面或是其他較低階電腦語言所撰寫之驅動程 式’於同一虛擬資源工具中操控多個實際儀器。 此外,應用程式介面之參數可依照操作者之實際需求 加以更名、增減、與修改。換言之,當實際儀器被更替抽 換時’應用程式介面中各類驅動參數之名稱與所代表之功424146 V. Description of the invention (9) ^ Test (S610 and S620). The application program interface AppLY_FM_signal generates a signal corresponding to the driving signal generator according to the parameters set by the operator to the application program interface meas_fm_sensitivity νγτγ, including the carrier frequency, carrier amplitude, and frequency mode. Next, the driver ㈠ drives the measurement receiver to measure the signal / noise and distortion of the signal. If the measured value of the signal / noise / distortion is within the expected sensitivity range, the success code is returned (S64); otherwise, adjust the parameters in the application interface APPLY_FM_SIGNAL () such as carrier amplitude, etc. Generate another signal and repeat the signal / noise distortion amount / beijing until the generated signal meets the expected sensitivity. It can be seen from the above two embodiments according to the present invention that, in the automatic test system, although each instrument under test and control has various types of driver programs, the virtual resource tools provided by the present invention and the application programs included therein are used. Interface, the operator does not need to directly face complicated and incompatible driver programs, but drives the application program interface set according to actual needs. The various types of virtual resource tools in the present invention can be used in accordance with various actual measurement purposes. Each type of application program interface will drive the purpose for which the operator may test or manipulate. A single application program interface in the virtual resource tool can correspond to a single driver / actual instrument, and can also call multiple application program interfaces or drivers written in other lower-level computer languages to control multiple actual applications in the same virtual resource tool. instrument. In addition, the parameters of the application program interface can be renamed, increased, decreased, and modified according to the actual needs of the operator. In other words, when the actual instrument is replaced, the names and functions of various driving parameters in the application program interface

4 2 4 1 4 6 J4 2 4 1 4 6 J

五、發明說明(ίο) 能不必改變,僅需對更換過之實際儀器之驅動程式對應該 應用程式介面進行新的轉換’以達實際驅動之目的。如〆 此’操作者在對待測物進行自動量測時僅需依測量目的選 取符合功能需求之虛擬資源工具即可,再透過對應用程式 介面中各類功能參數之設定驅動實際儀器,完全不必面對 各實際儀器之驅動程式即可驅動一個或多個實際儀器進行 測量工作,增加自動測試系統之操控效能。 雖然本發明已以較佳實施 限定本發明,任何熟習此技藝 和範圍内,當可作更動與潤飾 視後附之申請專利範圍所界定 例揭露如上,然其並非用以 者’在不脫離本發明之精神 ’因此本發明之保護範圍當 者為準。V. Description of the invention (ίο) It is not necessary to change, only the driver program of the replaced actual instrument should be newly converted to the application program interface 'to achieve the purpose of actual driving. If this is the case, the operator only needs to select a virtual resource tool that meets the functional requirements according to the measurement purpose when performing automatic measurement of the object to be measured, and then drive the actual instrument through the setting of various functional parameters in the application program interface. In the face of each actual instrument driver program, one or more actual instruments can be driven to perform measurement tasks, increasing the control performance of the automatic test system. Although the present invention has been limited to the present invention by a preferred implementation, anyone familiar with this skill and scope can make changes and retouch the examples defined in the scope of the patent application attached below as disclosed above, but it is not intended to be used without departing from the present invention. The spirit of the invention 'is therefore the protection scope of the present invention.

第13頁Page 13

Claims (1)

修正本 -•324 14 6 . 々索號88106925 六、申請專利範圍 1. 一種自動測試系統,包括: 一執行模組; 一虚擬資源工具,經該執行模組處理以由至少一應用 程式介面操控一測試儀器; 其中,該等該應用程式介面中包括複數功能參數可驅 動該實際儀器之相對應複數功能。 2. 如申請專利範圍第1項所述之系統,其中該執行模 組為一操作系統。 3. 如申請專利範圍第2項所述之系統,其中該操作系 統中包括一編輯器,用以編輯該虛擬資源工具,以及一編 譯器編譯該虛擬資源工具以驅動驅動該測試儀器之相對應 該等功能。 4 ·如申請專利範圍第1項所述之系統,其中該測試儀 器有一相對驅動程式以驅動該等功能,該應用程式介面之 該等功能參數可轉換為該驅動程式有複數驅動參數驅動對 應之該等功能。 5. 如申請專利範圍第1項所述之系統,其中任一該等 應用程式介面可為一低階標準儀器控制介面(L〇w Level Standard Instrument Control Interface ) ° 6. 如申請專利範圍第i項所述之系統,該測量儀器可 作為類比#號激勵(Analog Stimulus)之用。 7. 如申請專利範圍第1項所述之系統,該測量儀器可 具有類比信號量測(Analog Measurement )功能。 8. 如申請專利範圍第1項所述之系統,該測量儀器具 有射頻信號激勵(RF Stimulus )功能。Revised version- • 324 14 6. 々 索 号 88106925 6. Scope of patent application 1. An automatic test system includes: an execution module; a virtual resource tool processed by the execution module to be controlled by at least one application program interface A test instrument; wherein the application program interface includes a plurality of function parameters that can drive the corresponding plurality of functions of the actual instrument. 2. The system described in item 1 of the scope of patent application, wherein the execution module is an operating system. 3. The system according to item 2 of the scope of patent application, wherein the operating system includes an editor for editing the virtual resource tool, and a compiler compiles the virtual resource tool to drive the corresponding drive of the test instrument. And other functions. 4 · The system described in item 1 of the scope of patent application, wherein the test instrument has a relative driver program to drive the functions, and the function parameters of the application program interface can be converted into the driver program with multiple driving parameters to drive the corresponding ones. Such functions. 5. The system described in item 1 of the scope of patent application, in which any of these application programming interfaces may be a Low Level Standard Instrument Control Interface ° 6. If the scope of patent application i In the system described in this item, the measuring instrument can be used as an analog #Analysis (Analog Stimulus). 7. According to the system described in item 1 of the scope of patent application, the measuring instrument may have an analog signal measurement (Analog Measurement) function. 8. The system described in item 1 of the scope of patent application, the measuring instrument has a function of RF signal stimulus (RF Stimulus). 0213-4387TW?1HU 第14頁 2000.10.25.014 2 4 j 4 π ---~-_lS_88106925_A 月 』_ΐΙ^---- 六、申請專利範圍 9 ·如申請專利範圍第1項所述之系統’該實測儀器具 有射頻k號量測(RF Measurement)功能。 1 〇 ·如申請專利範圍第1項所述之系統’該實測儀器具 有數位輸出(Digital Output)功能。 Π .如申請專利範圍第1項所述之系統,該實測儀器可 作為數位輸入(Digital Input )功能。 1 2 * —種自動測試系統,包括: 一執行模組; - —虛擬資源工具,經該執行模組處理以由複數應用程 式介面操控對應複數測試儀器; 其中,該等該應用程式介面其中之一包括複數功能參 數可驅動對應之該實際儀器之相對應複數功能。 13.如申請專利範圍第12項所述之系統,其中該執行 模組為一操作系統。 1 4.如申請專利範圍第丨2項所述之系統’其中該操作 系統中包括一編輯器,用以編輯該虚擬資源工具,以及一 編譯器編譯該虛擬資源工具以驅動驅動該等測試儀器之相 對應該等功能。 1 5.如申請專利範圍第1 2項所述之系統’其中該等測 試儀器其中之一有一相對驅動程式以驅動該等功能,該等 應用程式介面其中之一中該等功能參數可轉換為該驅動程 -式有複數驅動參數驅動對應之該等功能。 1 6.如申請專利範圍第1 2項所述之系統’其中任一該 等應用程式介面可為一低階標準儀器控制介面(Low Level Standard Instrument Control Interface )。0213-4387TW? 1HU Page 14 2000.10.25.014 2 4 j 4 π --- ~ -_lS_88106925_A month "_ΐΙ ^ ---- VI. Application for patent scope 9 The measuring instrument has the function of RF k measurement (RF Measurement). 1 〇 The system described in item 1 of the scope of the patent application, the actual measurement instrument has a digital output function. Π. According to the system described in item 1 of the scope of patent application, the measured instrument can be used as a digital input (Digital Input) function. 1 2 * — An automatic test system, including: an execution module;-— a virtual resource tool that is processed by the execution module to control a corresponding plurality of test instruments by a plurality of application program interfaces; among which, among the application program interfaces, One includes plural function parameters that can drive corresponding plural functions of the corresponding actual instrument. 13. The system according to item 12 of the scope of patent application, wherein the execution module is an operating system. 1 4. The system according to item 2 of the patent application scope, wherein the operating system includes an editor for editing the virtual resource tool, and a compiler compiles the virtual resource tool to drive and drive the test instruments. Corresponding to other functions. 1 5. The system described in item 12 of the scope of patent application, where one of the test instruments has a relative driver to drive the functions, and the function parameters in one of the application program interfaces can be converted into The driver-type has a plurality of driving parameters to drive the corresponding functions. 1 6. Any one of these application program interfaces according to the system described in item 12 of the scope of patent application may be a low level standard instrument control interface (Low Level Standard Instrument Control Interface). 0213-4387Τΐ?1·ρΚ 第15頁 2000.10. 25.015 曰 修正 '申請專利範圍 17.如申請專利範圍第丨2項所述之介面,該實測儀器 可作為類比信號激勵(Analog Stimulus)之用。 1 8.如申請專利範圍第1 2項所述之介面’該實測儀器 可作為類比信號量測(Analog Measurement)之用。 1 9.如申請專利範圍第丨2項所述之介面,該實測儀器 可作為射頻信號激勵(RF Stimulus)之用。 20.如申請專利範圍第丨2項所述之介面,該實測儀器 可作為射頻信號量測(RF Measurement)之用。 2 1 ·如申請專利範圍第丨2項所述之介面’該實測儀器 作為數位輸出(Digital Output)之用。 2 2.如申請專利範圍第丨2項所述之介面,該實測儀器 可作為數位輸入(Digital Input)之用。0213-4387Tΐ? 1 · ρΚ page 15 2000.10. 25.015 said to amend the scope of patent application 17. According to the interface described in item 丨 2 of the scope of patent application, the test instrument can be used for analog signal stimulation (Analog Stimulus). 1 8. The interface described in item 12 of the scope of the patent application, the actual measurement instrument can be used for analog signal measurement (Analog Measurement). 1 9. According to the interface described in item 2 of the scope of patent application, the measured instrument can be used for RF signal stimulation (RF Stimulus). 20. According to the interface described in item 2 of the patent application scope, the actual measuring instrument can be used for radio frequency signal measurement (RF Measurement). 2 1 · The interface described in item 丨 2 of the scope of patent application ‘The measured instrument is used for digital output. 2 2. According to the interface described in item 丨 2 of the scope of patent application, the actual measuring instrument can be used as a digital input. 2000.10. 25.0162000.10. 25.016
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402523B (en) * 2010-09-21 2013-07-21 Chroma Ate Inc Test procedures for distributed testing of test procedures

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402523B (en) * 2010-09-21 2013-07-21 Chroma Ate Inc Test procedures for distributed testing of test procedures

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