TW400523B - Non-volatile multi-value memory device - Google Patents
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附件annex
矛' 部 屮 A il 而 1\ .T 消 f,· ASpear 'part 屮 A il and 1 \ .T eliminate f, · A
方 體 全 之 置 裝 生 再 音 錄 轚 之 成 構 〇 之 圈明 路發 丨霣本 9 之用 ί 成應 >L'«5 ]1體圔5貞 、之 五 圔 塊 及 式 横 鎖 閂 之 群 路 霣 寫 讀 之 例 腌 實 之 明 發 本 示 表 6 國 時 式 棋 出 讀 之 群 路 霉 寫 讀 之 。 例 _ 施 序實 時之 之明 作發 動本 之 示 時表 式 7 棋 入 寫 動 之 式 模 入 寫 之 路 霣 寫 讀 之 例0 實 之 明 。 發 _ 本 序示 時表 之 〇〇 作H 動 之 動 之 式 模 出0 之 路 電 寫 諝 之 例 施 實 之 明 發 本 。 示 表 序 9 時H 之 作 類 之 料 資 位 數 入 _ 之 例0 資 之 明 發 本 於 應 對 。 示 画表 序10 時圈 之 作 之 件 條 壓0 之 體 單 憶 記 之 中 例 豳 實 之 。 明 發 之本 係示 U表 之11 壓圏 電 比The whole body of the square body is re-recorded, and the structure of the circle is issued by the circle of the road. The use of the 9th version is 成 成 应> L '«5] 1 body, 5 zhen, five blocks, and horizontal latches. Examples of writing and reading by Qun Luzheng This is a table showing the reading and writing of Qun Qin by reading 6 national time chess. Example _ Shi Zhishi's Ming at the time of the start of the display of the timetable formula 7 Chess into the writing mode of the model to write the way 霣 Example of writing 0 reading the truth. _ _ This sequence shows the timetable of the 〇 〇 movement of the model of the model 0 way to write the example of the implementation of the implementation of the clear version. Table 9 shows the example of the number of materials and materials entered in the case of _. Example 0 of the assets issued by the corresponding response. The example of the drawing in the 10th circle of the drawing table is the example of the memoir of the type 0, which is true. Mingfa's version is shown in Table 11
H 圓 之 性 特 人 寫 之 體 單 憤 記 之 例 施 實 之 明 發 本 示 表 2 1 画 符賊夕篛里銳明 1 ' 8 第1AD換流器 2 ADPCMI8 碼器 3 讀寫控制霣路 4 第2DA換潦器 5 第2AD換流器 6 EEPR0M 7 ADPCM解碼器 8 第1DA換流器 g 微霣腦 10 位址產生霣路 20 資科暫存器 21 電阻分朦電路 本紙张尺度述州十阄國家標牟(CNS ) Λ4規格(210X297公釐) 9 (修正頁) 3 8 3 6 2 (誚先閱讀背面之注意事項再填艿本頁) ii 經濟部中央標準局貝工消费合作社印裝 A7 __B7_. _ 五、發明説明(3 ) ? y g BH 々坊 fg IS Μ 本發明為有酗於,使用可記憶之多值情報之EEPROM( Electrically Erasable Progra^Bable ROM)之不揮發性 多值記憶装置。 Μ沣坊術 在於具儎浮動Μ篚(floating gate)之EEPR0M等不揮 發性記憶裝置中,經由控制注入於浮動W極之電荷量而變 更其臨限位準(thres hold level),在記憶單體上(menory cell)記憶類比量或多值情報之方法* Μ往已豳行。 例如,在日本之特表平4-500576號公報(W0 90/00801 ,P C T / U S 8 9 / 0 2 9 2 2 )中•所_人之類比信號由類比抽樣保 持電路(analog sample hold circuit)施行抽樣保持之一 方面,以對於不揮發性記憶單《供給高電懕寫人衝而對 於其浮動閘極注入電荷,注入後,讀出對應於注入電荷之 類比董而和抽樣保持之類比信號作比較,一直到兩類比量 一致為止反覆胞行寫入齦衝之供給,由此將對應於輪入類 f 比電歷之類比量記錄於記憶單體之方式構成。並且’寫入 脈衝係使用播著時間之經過電壓值級慢上升之階梯狀脈衝 Ο 再者,前所述類比抽樣保持電路為,在記憶行列( aemory array)之各列分別設置一對’一方之多數之類比 抽樣保持霉路依序取入_入類比信號之期間内*保持於另 一方之多數之抽樣保持霣路類比信»同時記憶於記憶單髖 fr ?!I ( a e π 〇 r y cell array) 0 unlu —^L I、?T! I I ^ --- (請先聞讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家棣準(CNS ) Λ4规格(210X297公釐) 3 38362 A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明( 4 ) * '1 並 且 » 多 值 記 憶 器 為 > 記 憶 雑 散 之 類 比 量 之 記 憶 器 I 寫 入 及 讀 出 的 使 用 是 和 刖 述 公 報 之 大 約 同 樣 之 構 成 0 I 前 述 之 Μ 往 例 中 9 由 於 所 輸 入 之 類 比 信 號 直 接 使 用 類 請 1 比 之 油 樣 保 持 電 路 而 使 資 料 保 持 之 可 靠 性 有 問 題 0 再 者 先 閲 1 1 • 在 類 比 之 抽 樣 保 持 電 路 中 之 資 料 之 保 持 時 間 不 可 Μ 延 長 背 Sr 1 1 太 久 因 此 將 輸 入 之 類 比 信 號 依 序 保 持 於 多 數 之 抽 樣 保 持 注 意 事 1 1 電 路 之 後 將 保 持 於 多 數 之 抽 樣 保 持 電 路 之 類 比 量 同 時 地 項 再 填 1 寫 入 於 多 數 之 記 憶 單 體 之 際 可 Η 同 時 施 行 寫 入 之 記 憶 單 寫 本 頁 裝 體 數 則 變 少 〇 1 I 另 一 方 面 關於讀 出 的 處 理 由 於 係 為 由 記 憶 單 體 謓 1 1 I 出 之 類 比 信 號 作 直 .接 單 純 輪 出 之 構 成 因 此 欲 將 類 比 信 號 Ί 向 外 部 轉 送 時 開 始 讀 出 均 無 任 何 問 題 但 在 由 1 個 記 憶 訂 單 體 謓 出 時 間 是 較 向 外 部 之 資 料 轉 送 率 更 長 之 情 況 下 則 1 1 讀 出 無 法 來 得 及 0 1 1 在 此 即 使 在 轉 送 前 開 始 謓 出 可 能 將 不 必 要 讀 出 之 1 情 報 預 先 讀 出 而 形 成 浪 費 之 動 作 因 此,亦存在何 時 開 始 讀 1 I 出 是 最 為 遘 宜 之 問 題 0 1 1 1 再 者 由 於 在 前 述 之 以 往 例 » 係 將 對 應 於 所 輪 入 之 類 1 1 比 信 號 之 類 比 量 寫 入 於 唯 一 之 記 憶 單 體 因 此 必 須 將 對 浮 1 1 動 m 極 之 電 荷 之 注 入 量 细 微 控 制 * 由 於 此 必 須 準 備 特 性 1 1 穩 定 之 記 憶 單 體 及 複 雑 之 寫 入 電 路 0 1 | 再 者 做為其他之以往例 例 如 在 特 公 平 4- 5 729 4 號 1 I 公 報 係 為 所 輪 入 之 數 位 資 料 由 貴 料 閂 鎖 電 路 閂 鎖 之 同 時 1 1 | ί 且 設 置 贖 出 記 憶 單 體 之 多 值 記 憶 狀 態 而 輸 入 對 應 於 記 憶 1 1 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) 4 38362 經濟部中央標準局負工消費合作社印製 A7 B7 五、發明説明(5 ) :, 狀態之數位值之感測放大器(sence amplifier) »且該感 測放大器之輪出與資料閂鎖電路之保持資料由比較器施行 比較* 一直繼績施行對於記憶體之多值情報之寫人動作直 至兩内容一致為止之不揮發性多值記憶裝置。 但是,在此構成中*由於經由資料閂鎖電路以數位( digital)方式保持資枓因此其可靠性高,但必須設置讀出 多值之記憶狀態而產生數位輪出之特殊之感测放大器*由 此使電路構成複雑化。而且•比較器由於施行數位資料之 比較,電路規模勢必變得較大。 發昍辖龌涣夕B3顴 本發明為,其目的在於提供,在高度維持須寫入於不 揮發性多值記憶器之資枓保持之可靠性中*簡化電路構成 成為電路規模小之記憶裝置。 為達成此目的,本發明之不揮發性多值記憶器裝置· 或使用類比量記憶可能之記憶單體(memory cell)之類比 信號記錄裝置為,具有Μ下所述特徵' 本發明為具備· 所輸入之類比信號由預定之遇期抽樣而變換為η位元 (bit)之數位資枓之AD變換器, 以及分別記憶類比量之多數之前述記憶單體所構成之 個(m:整數)之記憶單體行列(fflemory array), 以及由前述.AD變換器輸出之η位元(n:n>m之整数)之 數位資料中輪·入依每一 n/m位元分割之資料,該分割資料 變換為相對應之類比量而分別寫入於前述m個記憶單體行 ^ L1τ·ν *^ (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) 5 3 8 362 A7 B7 經濟部中央樣準局貝工消费合作社印製 五、發明説明( 6 ) > . '1 列 之 B個之寫入電路 » I 等 為 特 徽 者 〇 I 依 據 本 發 明 時 由 於 抽 樣 之 類 比 信 虢 依 每 — η/ m 位 請 1 元 分 割 而 記 憶 於 多 數 之 記 憶 軍 饅 之 方 式 構 成 因 此 可 K 簡 先 閲 諸 1 1 化 寫 入 電 路 之 同 時 使 記 憶 單 體 之 零 之 影 響 減 少 0 背 面 1 1 再 者 由 於 使 其 成 為 即 使 將 類 比 信 號 直 接 記 錄 於 記 憶 注 意 事 1 1 單 體 所 犏 人 之 類 比 信 號 先 變 換 為 數 位 信 號 而 由 資 料 暫 存 項 再 填 1 器 (d at a r e g i s t e r ) Μ 數 位 方 式 保 持 之 方 式 因 此 資 料 保 寫 本 頁 裝 持 之 可 靠 性 提 升 0 1 I 再 者 本 發 明 以 具 備 1 1 I 由 寫 入 可 能 多 值 之 類 比 量 之 多 數 之 前 述 不 揮 發 性 之 記 1 憶 單 艏 所 構 成 之 η個記憶單體行列 訂 Μ 及 分 別 對 應 於 該 i個記憶單體行列而設置之i 個 資 枓 1 1 暫 存 器 群 1 1 以 及 讀 出 寫 入 於 刖 逑 i 個 記 憶 單 賸 行 列 之 類 比 量 而 將 ! 1 I 對 m 於 該 類 比 量 之 數 位 資 枓 分別設定於前述i 個 數 位 暫 存 器 群 之 i個謓出電路群 1 I 1 1 >λ 及 將 保 持 於 刖 述 1 個 資 科 暫 存 器 群 之 數 位 資 料 向 外 1 1 部 轉 送 之 η個轉送霣路群 1 1 Μ 及 使 第 j個(j = 1 2 … j)前述轉送電路動作 而 將 保 1 1 持 於 第 j 號 之 前 述 資 料 暫 存 器 群 之 資 料 依 序 向 外 部 轉 送 t 1 1 轉 送 終 了 後 使 第 (J + 1 ) 號 之 前 述 轉 送 電 路 動 作 而 將 保 持 1 | 於 第 (J + 1 ) 號 之 刖 述 資 料 暫 存 器 群 之 資 料 依 序 向 外 部 轉 送 1 I 之 同 時 在 轉 送 第 J 號 之 前 述 資 料 暫 存 器 群 之 資 料 之 期 間 1 1 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) 6 38362 A7 B7 經濟部中央樣準局負工消費合作社印製 五、發明説明( 7 ) 1 丨 內 t 使 第 (J + 1)號之前述讀出電路動作而欲施行由第< J 4 1) 1 號 之 前 述 記 憶 單 體 行 列 之 多 數 之 記 憶 單 體 同 時 讀 出 之 方 式 I 控 制 之 控 制 電 路 t 請 1 等 為 特 擻 者 0 先 閱 1 1 再 者 本 發 明 為 具 備 背 Λ 1 1 多 值 之 類 比 量 寫 入 可 能 之 多 數 之 刖 述 不 揮 發 性 之 記 憶 注 意 事 項 再 填 1 | 單 體 構 成 之 1個記憶單體行列 1 Μ 及 由 保 持 數 位 資 料 之 多 數 之 資 料 暫 存 器 姐 成 i 個 資 寫 本 頁 裝 1 枓 暫 存 器 群 1 I 以 及 對 應 於 保 持 於 該 多 數 之 資 料 暫 存 器 群 之 資 料 之 類 1 1 I 比 置 分 別 寫 入 於 刖 述 多 數 之 記 憶 單 體 行 列 之 多 數 之 寫 入 1 電 路 所 構 成 之 i 個 寫 入 電 路 群 Μ 及 由 預 定 之 週 期 依 序 輪 訂 入 之 數 位 資 枓 對 於 第 j個(j = 1 2 … j)前述資枓暫存器群 1 1 依 序 設 定 設 定 终 了 後 由 預 定 之 遇 期 依 序 輸 入 之 數 位 資 1 1 料 將 第 (J =1) 號 之 前 述 資 料 暫 存 器 群 之 各 資 料 暫 存 器 依 序 ! 私卜 1 I 設 定 之 同 時 在 第 (j + 1 ) 站 之 刖 述資料,暫存器群 之 資 料 設 定 週 期 使第j號之前述寫入電路群動作而對於第m 彌 之 前 述 1 1 I 記 憶 體 行 列 之 多 數 之 記 憶 單 體 同 時 施 行 寫 入 動 作 之 方 式 控 1 1 1 制 之 控 制 電 路 1 等 為 特 徵 者 0 1 1 依 據 本 發 明 時 可 Μ 在 保 持 資 料 之 可 靠 度 中 同 時 施 1 1 行 寫 入 之記憶單體 之 数 量 大 幅 度 的 擴 大 〇 再 者 即 使 在 由 1 | 記 憶 體 之 多 值 資 訊 之 讀 出 時 間 比 較 讀 出 之 多 值 資 訊 之 轉 送 1 I 率 為 長 時 不 設 置 空 隙 時 間 而 可 以 轉 送 所 讀 出 之 多 值 資 訊 1 1 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 7 38362 A7 B7 經濟部中央樣準局貝工消費合作社印裝 五、發明説明( 8 ) / . ' 1 9 而 且 可 極 力 節 省 浪 費 之 謓 出 動 作 0 I 再 者 » 本 發 明 為 具 備 1 保 持 所 輪 入 之 數 位 資 料 之 資 料 暫 存 器 諸 1 以 及 输 出 多 數 之 類 比 電 壓 之 電 壓 產 生 電 路 先 閲 背 ir 之 注 意 事 1 1 Η 及 將 Λ.Λ. 刖 述 資 料 暫 存 器 之 内 容 解 碼 而 對 應 於 該 内 容 而 1 1 將 前 述 多 數 之 類 比 電 壓 任 意 選 擇 性 輪 出 之 解 碼 器 1 1 及 多 值 之 類 比 量 寫 入 可 能 之 不 揮 發 性 記 憶 單 體 9 項 再 填 1 Κ 及 將 對 應 於 由 記 憶 單 體 讀 出 之 類 比 量 之 電 壓 與 前 述 寫 本 頁 裝 解 碼 器 之 輪 出 電 壓 施 行 比 較 之 比 較 器 1 1 Μ 及 對 應 於 該 比 較 器 的 比 較 结 果 而 施 行 對 刖 述 記 憶 單 I 1 1 體 之 類 比 量 之 寫 入 之 寫 入 電 路 1 等 為 特 徵 者 〇 訂 依 據 本 發 明 時 維 持 資 料 保 持 之 可 靠 性 中 » 簡 化 電 路 1 1 構 成 而 可 Μ 使 電 路 規 模 小 型 化 0 尤 其 » 書入模式時之DA變 1 1 換 處 理 與 謓 出 模 式 時 之 AD變換處琿可以使用 同 一 電 路 構 成 I 來 達 成 因 此 可 進 一 層 企 求 電 路 之 簡, 化 〇 1 1 而 簡 單 說 明 1 I 圖 1 本 發 明 之 實 豳 例 之 謓 寫 電 路 (r e a d v r i g h t 1 1 c i Γ C u it)之電路圖 0 1 1 圖 2 表 示 本 發 明 之 實 施 例 中 之 左 右 —*' 對 之 記 憶 體 行 列 1 1 及 其 周 邊 電 路 之 方 塊 圖 Ο 1 1 圖 3 奏示本發明 之 實 施 例 之 左 側 記 憶 體 行 列 及 其 周 邊 J I 電 路 之 方 塊 圖 0 1 1 I 園 4 表 示 本 發 明 之 實 胞 例 之 次 解 碼 器 (s u b d e c 〇 d e r ) 1 1 本紙張肅用中國國家標準(cns ) Μ規格(21〇χ29織) 3 8 3 62 附件H An example of a single anger written by a person with a round personality. Shi Zhiming issued this display. 2 1 Drawing a thief Xi Rui Li Ming 1 '8 first AD converter 2 ADPCMI8 encoder 3 read-write control path 4 No. 2DA converter 5 No. 2 AD converter 6 EEPR0M 7 ADPCM decoder 8 No. 1DA converter g Micro-brainer 10 Address generation circuit 20 Asset register 21 Resistor circuit This paper is described in this paper阄 National Standards (CNS) Λ4 specification (210X297 mm) 9 (Revised page) 3 8 3 6 2 (诮 Read the precautions on the back before filling in this page) ii Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 __B7_. _ V. Description of the invention (3)? Yg BH 々 坊 fg IS Μ This invention is a non-volatile multi-value memory of EEPROM (Electrically Erasable Progra ^ Bable ROM), which is intoxicated and uses memorable multi-value information. Device. Μ 沣 坊 术 is a non-volatile memory device such as EEPR0M with a floating gate. By controlling the amount of charge injected into the floating W pole, the threshold level is changed. The method of memorizing analog or multi-valued information in the body cell (menor cell). For example, in Japanese Patent Publication No. Hei 4-500576 (W0 90/00801, PCT / US 8 9/0 2 9 2 2), the analog signal of all persons is analyzed by an analog sample hold circuit. One aspect of implementing sample-and-hold is to inject charge into the floating gate of the non-volatile memory sheet "Supply high-power transcriber, and after injection, read the analog signal corresponding to the injected charge and the analog signal of sample-and-hold. For comparison, until the two analog quantities are consistent, the supply of gingival rush is repeatedly written, so that the analog quantity corresponding to the turn-in analogy f-calendar is recorded in the memory cell. And the 'write pulse is a step-like pulse that slowly rises in voltage level over the time of transmission. Furthermore, the analog sample-and-hold circuit described above is a pair of one in each column of the aemory array. The majority of the analog samples are kept in order to get the mold in order _into the period of the analog signal * maintained in the other party ’s sample hold the analogy of the letter »at the same time memorized in the memory single hip fr?! I (ae π 〇ry cell array) 0 unlu — ^ LI,? T! II ^ --- (Please read the precautions on the back before filling out this page) This paper size is applicable to China National Standard (CNS) Λ4 specification (210X297 mm) 3 38362 A7 B7 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the invention (4) * '1 and »The multi-valued memory is > The memory of the analogous amount of memory I The use of writing and reading is and The same structure as described in the Bulletin 0 I The aforementioned M In the previous example 9 Because the analog signal input is directly used, please compare it to the oil sample 1 There is a problem with the reliability of the data retention by the circuit. 0 Please read 1 1 first. • The retention time of the data in the analog sample and hold circuit cannot be extended. Sr 1 1 is too long, so the input analog signal is kept in order. Note on sampling and holding 1 1 After the circuit, the analog quantity of the sample holding circuit that is held by the majority will be filled again at the same time. When writing to the majority of the memory cells, the written memory sheet can be written at the same time. The number becomes less. 01 I On the other hand, the processing of reading is performed directly by the analog signal from the memory unit 謓 1 1I. It is connected to the simple rotation, so it starts when the analog signal Ί is transmitted to the outside. There is no problem in reading, but if the time taken by 1 memory order body is longer than the data transfer rate to the outside, then 1 1 cannot be read. Get to 0 1 1 Here, even if you start to read out before the transfer, you may read out the unnecessary 1 information in advance to form a wasteful action. Therefore, there is also a question of when to start reading 1 I is the most appropriate question 0 1 1 1 Moreover, in the previous conventional examples above, the analog quantity corresponding to the 1 1 ratio signal of the rotation is written in the only memory cell, so the injection amount of the m-pole charge to the floating 1 1 must be small. Control * Because of this, it is necessary to prepare the characteristic 1 1 stable memory cell and complex write circuit 0 1 | Also as other conventional examples, such as in the fair 4-5 729 4 1 I The digital data is latched by the precious material latch circuit at the same time 1 1 | ί and the multi-value memory state of the redemption memory unit is set and the input corresponds to the memory 1 1 This paper size applies to the Chinese national standard (CNS ) A4 specification (210X 297 mm) 4 38362 Printed by the Central Standards Bureau of the Ministry of Economic Affairs and Consumer Cooperatives printed A7 B7 V. Description of the invention (5): a state amplifier for the digital value of the state »and the sensing The rotation of the amplifier and the data held by the data latch circuit are compared by the comparator. * The nonvolatile multi-value memory device has been implemented following the writing of the multi-value information of the memory until the two contents are consistent. However, in this configuration * because the data is held digitally through the data latch circuit, its reliability is high, but a special sense amplifier that reads out multiple-valued memory states and generates digital turns out must be set up * As a result, the circuit configuration is complicated. Moreover, the comparator is bound to become larger due to the comparison of digital data. The present invention aims to provide a high-maintenance reliability that must be written in the nonvolatile multi-value memory to maintain the reliability. * Simplify the circuit configuration to become a memory device with a small circuit scale. . In order to achieve this object, the nonvolatile multi-value memory device of the present invention or an analog signal recording device using a memory cell capable of analog quantity memory has the characteristics described below. The present invention is provided with the following features: The input analog signal is converted by a predetermined sampling period into an digit-numbered AD converter, and each of the aforementioned memory cells (m: integer) which respectively stores the majority of the analog quantity. The fflemory array of memory and the digits of n-bits (integers of n: n > m) output by the aforementioned .AD converter are round-entered data divided by each n / m-bit, The segmented data is converted into corresponding analog quantities and written in the aforementioned m memory single lines respectively ^ L1τ · ν * ^ (Please read the precautions on the back before filling out this page) This paper size applies Chinese national standards (CNS ) Α4 specification (210X297 mm) 5 3 8 362 A7 B7 Printed by the Central Bureau of Standards, Ministry of Economic Affairs, Shellfish Consumer Cooperative, V. Description of the invention (6) >. 'B writing circuits in column 1 »I, etc. are Special emblem 〇I According to the present invention, because the sampling analogy is converted by 1-n / m digits and divided into the memory of the majority, it can be briefly read at the same time as the circuit is written. Reduce the effect of zero of the memory cell 0 Back 1 1 Furthermore, it is temporarily stored by the data because it becomes the analog signal directly recorded in the memory even if the analog signal is converted into a digital signal Refill 1 device (d at aregister). M Digital mode retention method. Therefore, the reliability of data retention and page retention is improved. 0 1 I. Furthermore, the present invention has a 1 1 I by writing a large number of analogous quantities. The foregoing non-volatile notes 1 The order of n memory monomers formed by Yi Dan 艏 and corresponding to the i memory monomers I number of resources 1 1 register group 1 1 and read and write the analog quantity of the remaining ranks of i memory sheets and set! 1 I to m of digital resources of the analog quantity are respectively set in the aforementioned i I output circuit groups of 1 digital register group 1 I 1 1 > λ and η transfer circuit groups that will transfer the digital data held in the 1 information register register group outward 1 1 1 1 Μ and the j-th (j = 1 2… j) the aforementioned transfer circuit is operated to sequentially transfer the data of the aforementioned data register group holding 1 1 to j to the outside t 1 1 after the transfer is completed Operate the aforementioned transfer circuit of (J + 1) and keep 1 | transfer the data of the temporary data register group of (J + 1) to the outside in sequence while transferring I to J Period of data of the aforementioned data register group 1 1 This paper size applies Chinese national standards CNS) A4 specification (210X 297 mm) 6 38362 A7 B7 Printed by the Central Consumer Procurement Bureau of the Ministry of Economic Affairs and Consumer Cooperatives. V. Description of the invention (7) 1 丨 内 内 Makes the aforementioned readout circuit No. (J + 1) If you want to implement the method of reading the majority of the memory cells in the rank of the aforementioned memory cells No. < J 4 1) at the same time, I control the control circuit t please 1 is a special person 0 read 1 1 then The present invention is to write the most non-volatile memory notes with the possibility of writing a large number of analogous quantities of back Λ 1 1 multi-values. Please fill in 1 | 1 memory cell composed of monomers 1 M and hold digital data The majority of the data registers are written on this page. 1 枓 The register group 1 I and the data corresponding to the data register group held in the majority 1 1 I ratio are written in Narrated majority Recalling the majority of the single write circuits of the i write circuit group M and the digital assets ordered by a predetermined cycle in turn. For the jth (j = 1 2… j) the aforementioned assets Register group 1 1 Sets sequentially the digital data input by the scheduled encounter period after the end of the setting. 1 1 It is expected that each data register of the aforementioned data register group (J = 1) will be in order! Privately, while setting the I I, the descriptive data at the (j + 1) station, the data setting period of the register group makes the aforementioned write circuit group of the jth action and the aforementioned 1 1 I memory of the mth The way most of the memory cells perform the writing operation at the same time is to control the 1 1 1 control circuit 1 and so on. 0 1 1 According to the present invention, it is possible to simultaneously perform 1 1 line writing while maintaining the reliability of the data. The number of incoming memory cells has been greatly expanded. It is possible to transfer the read-out multi-valued information even when the read-out time of the multi-valued information in the memory 1 is compared with the read-out value of the multi-valued information. 1 I can transfer the read-out multi-valued information without setting the gap time. 1 1 paper size Applicable to China National Standard (CNS) A4 specification (210X297mm) 7 38362 A7 B7 Printed by the Shell Consumer Cooperative of the Central Samples Bureau of the Ministry of Economic Affairs 5. Description of the invention (8) /. '1 9 Action 0 I Furthermore »The present invention is a voltage generating circuit having a data register 1 which holds the digital data held in 1 and a voltage analog output voltage which reads most of the first attention 1 1 Η and will be Λ.Λ Describe the content of the data register and decode it to correspond to the content. 1 1 Write the optional analogue voltage of the majority of the analog voltages 1 1 and multi-valued analog values. The nonvolatile memory cell 9 is filled with 1K and the comparator 1 1 Μ is used to compare the voltage corresponding to the analog quantity read by the memory cell with the output voltage of the decoder installed on the previous page and corresponding to It is characterized by the comparison result of the comparator and the writing circuit 1 which writes the analog quantity of the memory sheet I 1 1 and the like. Order to maintain the reliability of data retention in accordance with the present invention »Simplify the circuit 1 1 The structure can reduce the size of the circuit. In particular, the DA in the book-entry mode is changed to 1 and the AD conversion process in the book-out mode can be achieved by using the same circuit configuration I to achieve a simpler circuit.化 〇1 1 Brief description 1 I FIG. 1 Circuit diagram of a write circuit (readvright 1 1 ci Γ C u it) of a practical example of the present invention 0 1 1 FIG. 2 shows the left and right in the embodiment of the present invention— * 'pair of memory ranks 1 1 and a block diagram of its peripheral circuits 〇 1 1 FIG. 3 shows the left side of the memory ranks and its surroundings in the embodiment of the present invention Block diagram of the JI circuit 0 1 1 I 4 The sub decoder (subdec 〇der) of the real cell example of the present invention 1 1 This paper uses the Chinese National Standard (cns) M specifications (21〇χ29) 3 8 3 62 Accessories
矛' 部 屮 A il 而 1\ .T 消 f,· ASpear 'part 屮 A il and 1 \ .T eliminate f, · A
方 體 全 之 置 裝 生 再 音 錄 轚 之 成 構 〇 之 圈明 路發 丨霣本 9 之用 ί 成應 >L'«5 ]1體圔5貞 、之 五 圔 塊 及 式 横 鎖 閂 之 群 路 霣 寫 讀 之 例 腌 實 之 明 發 本 示 表 6 國 時 式 棋 出 讀 之 群 路 霉 寫 讀 之 。 例 _ 施 序實 時之 之明 作發 動本 之 示 時表 式 7 棋 入 寫 動 之 式 模 入 寫 之 路 霣 寫 讀 之 例0 實 之 明 。 發 _ 本 序示 時表 之 〇〇 作H 動 之 動 之 式 模 出0 之 路 電 寫 諝 之 例 施 實 之 明 發 本 。 示 表 序 9 時H 之 作 類 之 料 資 位 數 入 _ 之 例0 資 之 明 發 本 於 應 對 。 示 画表 序10 時圈 之 作 之 件 條 壓0 之 體 單 憶 記 之 中 例 豳 實 之 。 明 發 之本 係示 U表 之11 壓圏 電 比The whole body of the square body is re-recorded, and the structure of the circle is issued by the circle of the road. The use of the 9th version is 成 成 应> L '«5] 1 body, 5 zhen, five blocks, and horizontal latches. Examples of writing and reading by Qun Luzheng This is a table showing the reading and writing of Qun Qin by reading 6 national time chess. Example _ Shi Zhishi's Ming at the time of the start of the display of the timetable formula 7 Chess into the writing mode of the model to write the way 霣 Example of writing 0 reading the truth. _ _ This sequence shows the timetable of the 〇 〇 movement of the model of the model 0 way to write the example of the implementation of the implementation of the clear version. Table 9 shows the example of the number of materials and materials entered in the case of _. Example 0 of the assets issued by the corresponding response. The example of the drawing in the 10th circle of the drawing table is the example of the memoir of the type 0, which is true. Mingfa's version is shown in Table 11
H 圓 之 性 特 人 寫 之 體 單 憤 記 之 例 施 實 之 明 發 本 示 表 2 1 画 符賊夕篛里銳明 1 ' 8 第1AD換流器 2 ADPCMI8 碼器 3 讀寫控制霣路 4 第2DA換潦器 5 第2AD換流器 6 EEPR0M 7 ADPCM解碼器 8 第1DA換流器 g 微霣腦 10 位址產生霣路 20 資科暫存器 21 電阻分朦電路 本紙张尺度述州十阄國家標牟(CNS ) Λ4規格(210X297公釐) 9 (修正頁) 3 8 3 6 2 (誚先閱讀背面之注意事項再填艿本頁) ii ^沪部中A"41-^m η消论合作卬 A7 B7 五、發明説明(9_1) 22 解碼器 23 比較器 24 閂鎖電路 25 _出缓 銜 器 26 ' 27 、28、 36、 37 M0S霣晶 β 29 類比開翮 30 輸入出 線 31 ' 32 ' 33 > 42 > 44 ANDM 極 34 反相器 35 講寫僑 壓 霣路 38 ' 39 ' 40 ' 41 HAND閘極 45 _入嬢 60 記憧簞體 100 X位址解碣器 200、250 Y位址解碼器 300 讀寫霣 路 400 第2傾壓電路 500 第1編壓霣路 600 方塊薄擇器 700 次解碣 器 701、702 HAO 閘極 703 AND閛極 800 控制霣路 80 1 下降計 數 器 6R ' 6L 記憶《行列 1 00RU ' 100RL > 100LU ' 100LL X位址解碣器群 300 RU ' 300RL ' 300LU > 300LL 讀寫電 路群 600 RU ' 600RL ' 600LU ' 600LL 方塊選 揮器群 700RU ' 700 RL ' 7 00LU > 7 00LL 次解碼 器群 奮嫵俐 圏! 5表示,遘用本發明之聲音 錄音再 生装置之概要方 塊画。 本裝置中*首先在錄音模式中*所輸入之類比聲音信 虢,經由第1AD換流器(converter)lM預定之抽樣遇期變 換成12位元之數位轚音資枓•經由次段之AD PC Μ坂碼器( encoder)2編碼成4位元之數位®縮資料•而傅送至讀寫控H An example of a single anger written by a person with a round personality. Shi Zhiming issued this display. 2 1 Drawing a thief Xi Rui Li Ming 1 '8 first AD converter 2 ADPCMI8 encoder 3 read-write control path 4 No. 2DA converter 5 No. 2 AD converter 6 EEPR0M 7 ADPCM decoder 8 No. 1DA converter g Micro-brainer 10 Address generation circuit 20 Asset register 21 Resistor circuit This paper is described in this paper阄 National Standards (CNS) Λ4 specification (210X297 mm) 9 (correction page) 3 8 3 6 2 (诮 Read the precautions on the back before filling in this page) ii ^ A " 41- ^ m η Elimination of cooperation 卬 A7 B7 V. Description of the invention (9_1) 22 Decoder 23 Comparator 24 Latching circuit 25 _ Output buffer 26 '27 , 28, 36, 37 M0S 霣 Crystal β 29 Analog switch 30 Input and output 31 '32' 33 > 42 > 44 ANDM pole 34 Inverter 35 Lecture and write overseas circuit 38 '39' 40 '41 HAND gate 45 _into 60 memory 100 X address decoder 200, 250 Y address decoder 300 Read and write circuit 400 Second dump circuit 500 First edit circuit 600 Block selector 700 times 701, 702 HAO Gate 703 AND Pole 800 Control Path 80 1 Down Counter 6R '6L Memory << Rank 1 00RU' 100RL > 100LU '100LL X Address Decoder Group 300 RU' 300RL '300LU > 300LL Read Write circuit group 600 RU '600RL' 600LU '600LL block selector device group 700RU' 700 RL '7 00LU > 7 00LL sub-decoder group work hard! 5 shows the outline of using the sound recording and reproduction device of the present invention Square painting. In this device * the analog audio signal input first * in the recording mode * is converted into 12-bit digital audio data through the sampling period predetermined by the 1AD converter 1M converter • through the AD of the next stage PC Maka code 2 (encoder) encodes 4 digits of digitized data • and the data is sent to the reader
It - —i*—— m :·1 ϋ n Ί— in .K Hi. I- - II 丁 * *τ (請先閱讀背面之注意事項再填寫本頁) 本紙张尺度诚力】屮阀國家標皁(CNS )八4规格(2丨οχ297公釐) 9-1(修正頁) 38362 經濟部中央標準局貝工消費合作社印製 A7 B7 五、發明説明(10) ; 制霣路3。在讀寫控制電路3· 4位元之數位壓縮資料是在 内部之第2DA換流器變換為類比信號,且該類比信號是寫 入於 EEPR0M6。 另一方面·在再生模式中,經由讀寫控制電路3 ,由 EEPR0M6謓出類比信號,Μ在内部之第2AD換流器5變換為 4位元之數位壓縮資料。該4位元之數位壓縮資料係經由 ADPCM解碼器7解碼成12位元之數位轚音資料,再者,該12 位元之數位聲音資料由次段之第1DA換流器8變換為類比信 號,由圖中無表示之揚轚器等Μ轚音放出。 再者,對於EEPR0M6之寫入及讀出用之20位元之位址 為*依據由微電腦9輸人之命令(conmand)等由位址產生電 路10產生,而供給至EEPR0M6及讀寫控制電路3。 其次,含於謓寫控制電路3之謓寫電路300之具體構成 表示於圖1。 圖1中,資料暫存器20為由D正反電路(Flip-Flop)構 成,亦即為取入自ADPCM煸碼器2所输出,之4位元之數位壓 縮資料中上位或下位之2位元而保持之2位元之資料暫存器 •電阻分壓電路21為基準電壓Vref分壓為VI〜V4(V1< V2 <V3<V4)之4個電壓之電阻分壓電路,解碼器22為將資料 暫存器20之内容解碼而對應於其內容將VI〜V4之任一電壓 Μ選擇性输出。比較器23為由解碼器22輸出之類比電壓 Vdec向非反轉端子+輸入,由EEPR0M6之記憶體60讀出之電 歷Vm向反轉端子一輪人而比較兩電壓。閂鎖電路24為時序 時脈RWCK4成為Η位準之期間直接輪出比較器23之輸出,在 本紙張尺度適用中國國家標準(CNS ) Α4说格(210Χ297公釐) 10 38362 I----------------ir------知 - I (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局貝工消費合作社印装 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 38362 A7 _B7_^_ 五、發明説明(n) } L位準之下降時將比較器之輪出閂鎖而在L位準之期間送出 閂銷之_出。再者,輪出級衡器25為輸出資科暫存器20内 容所需之缓衡器*亦即將保持於資料暫存器20之數位資料 向外部轉送之轉送霄路,再者•經由電阻分壓電路21與解 碼器22構成園5所示第2DA換液器4。 EEPR0M6之各記憶單體60係為·具備浮動閛極( floating gate)FG之分割 Μ 極(split gate)型之單通( cell) *經由向浮動閛極FG注入電荷而施行寫入,經由抽 出注人於浮動Μ極FG之電荷施行消除者。各記憶單體60為 ,其吸極(<^3丨1»)0接線於位元線81^1,812,一,源極( source)S接線於電源線SL1,SL2,…,控制閘極CG接線於 字組線WL1,WL2,…。各位元線BL1,BL2,…為,經由將 上位4位元之X位址ADRX [8:5]解碣之X位址解碼器100,選 擇任1線而接線於比較器23之反轉端子。字组線WL1,WL2 ,…及電源線SL1,SL2 ,…為,分別接線於將11位元之 Y位址[10:0]解碼之Y位址解碼器200及250,此等解碼器 200,250為由第2餳壓產生電路400供給種種之鴒壓電懕》 此等镉壓電壓為,含有寫入用之高電壓僑壓Vn vl及消除用 之高電懕鴒壓Vhv2。 並且,在位址解碼器100,200· 250 ,做為時序信號 而输人RWCK3,RWCK4 *WBE等。再者,在此之吸極*涯極 之稱呼方法係以讀出時之動作狀態做為基準。 向位元線BL1,BL2,…供給之3種類之镉壓¾壓VBH· VBLH· VBLL(VBH>VBLH>VBLL)為,由第1偏壓產生霄路 11 .裝 I ^ 訂_ ^ (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 A7 __B7__^____ 五、發明説明(12) /It-—i * —— m: · 1 ϋ n Ί— in .K Hi. I--II Ding * * τ (Please read the precautions on the back before filling this page) Sincerity of this paper】 屮 Valve country Standard soap (CNS) 8 4 specifications (2 丨 χ 297 mm) 9-1 (revised page) 38362 Printed by the Shellfish Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 5. Description of the invention (10); The digitally compressed data of 3.4 bits in the read-write control circuit is internally converted to an analog signal by the second DA converter, and the analog signal is written in EEPR0M6. On the other hand, in the reproduction mode, the analog signal is generated by the EEPR0M6 via the read-write control circuit 3, and the second AD converter 5 in the M is converted into 4-bit digital compression data. The 4-bit digital compressed data is decoded into 12-bit digital audio data by the ADPCM decoder 7, and further, the 12-bit digital audio data is converted into an analog signal by the first DA converter 8 in the next stage. It is released by the M 轚 sounds such as the horns not shown in the figure. In addition, the 20-bit address for writing and reading of EEPR0M6 is generated by the address generation circuit 10 according to a command such as input from the microcomputer 9 and supplied to the EEPR0M6 and the read-write control circuit. 3. Next, a specific configuration of the transcription circuit 300 included in the transcription control circuit 3 is shown in FIG. In FIG. 1, the data register 20 is composed of a D flip-flop circuit, that is, it is taken from the output of the ADPCM codec 2, and the upper or lower 2 of the 4-bit digital compression data 2-bit data register that is held by bits • Resistor divider circuit 21 is a reference voltage Vref divided by VI to V4 (V1 < V2 < V3 < V4). In order to decode the content of the data register 20, the decoder 22 selectively outputs any voltage M from VI to V4 corresponding to its content. The comparator 23 compares the two voltages with the analog voltage Vdec output by the decoder 22 to the non-inverting terminal +, and the calendar Vm read by the memory 60 of EEPR0M6 to the inverting terminal for one round. The latch circuit 24 directly outputs the output of the comparator 23 during the time when the timing clock RWCK4 becomes the Η level. In this paper scale, the Chinese National Standard (CNS) Α4 grid (210 × 297 mm) 10 38362 I ---- ------------ ir ------ Knowing-I (Please read the notes on the back before filling out this page) Central Standards Bureau, Ministry of Economic Affairs Chinese National Standard (CNS) A4 specification (210X297 mm) 38362 A7 _B7 _ ^ _ V. Description of the invention (n)} When the L level drops, the comparator wheel will be out of the latch and the latch will be sent out during the L level Of_out. In addition, the turn-out scale 25 is a slow-weighing device required to output the contents of the asset register 20, and the digital data that is held in the data register 20 will be transferred to the outside, and furthermore, it will be divided by a resistor. The circuit 21 and the decoder 22 constitute a second DA liquid changer 4 shown in FIG. Each of the memory cells 60 of EEPR0M6 is a split gate type split cell with a floating gate FG. * Write is performed by injecting charge into the floating gate FG, and by drawing Attention is paid to the elimination of the charge of the floating M-pole FG. Each memory cell 60 is such that its suction (< ^ 3 丨 1 ») 0 is connected to the bit line 81 ^ 1,812, one, and the source S is connected to the power supply lines SL1, SL2, ..., control The gate CG is connected to the block lines WL1, WL2, .... Each of the element lines BL1, BL2,... Is an X address decoder 100 that resolves the upper 4-bit X address ADRX [8: 5], selects any 1 line, and connects it to the reverse terminal of the comparator 23 . The word line WL1, WL2, ... and the power lines SL1, SL2, ... are respectively connected to Y address decoders 200 and 250 which decode the 11-bit Y address [10: 0], and these decoders 200 250 is a variety of piezoelectric voltages supplied by the second sugar voltage generating circuit 400. These cadmium voltages include the high-voltage voltage Vn vl for writing and the high-voltage Vhv2 for erasure. In addition, the address decoders 100, 200, 250 are input as RWCK3, RWCK4 * WBE, etc. as timing signals. In addition, the term "sucking pole * end pole" here refers to the operating state at the time of reading. Three kinds of cadmium pressures VBH, VBLH, and VBLL (VBH > VBLH > VBLL) are supplied to the bit lines BL1, BL2, ... so that the road 11 is generated by the first bias voltage. I I ^ _ _ ^ (Please (Please read the notes on the back before filling out this page) Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 __B7 __ ^ ____ V. Description of Invention (12) /
500輪出,這些偏壓電壓之供給線上,分別插入P頻道M〇S 電晶體26,Η頻道M0S霣晶體27,N頻道M0S電晶賭28M作為 回闢使用。並且,此等霣晶體之輪出側為’僅在寫入時接 線於0Ν之類比開瞄29,該類比開闢29之输出接線於χ位址 解碣器100之轆入出線3〇。Ρ頻道M0S電晶體26之關極為’ 腌加著一鑰入蟠_入閂鎖電路24之輪出C0MP之AND關極31 之輪出,對於Η頻道M0S霣晶髖27及28之Μ極’分別施加 AND閘極32及33之输出。對於AND閛極32及33 · —输人端共 同轆入ANDW棰31之_出,對於ANDM極32之另一輪入端, 输入向寅料暫存器2 0供給之資料上位位元D1由反相器( inverter)34反轉之信號’在AND閛極33之另一输人端’直 接输入向資料暫存器20供給之賁料之上位位元 再者,為將寫入於各記憶體60之類比量做為電歷謓出 ,設置電阻分壓電路所構成之讀入僱壓產生電路35 °該分 壓點P經由僅在比較器23之比較時0H之Η頻道MOS^晶暖36 ,而接線於X位址解碼器100之輪入出缉30。在該输人出線 30與接地間,插入由於記憶體之資料消除時向位元線BL1 ,BL2,…供給接地電位而設置,經由控制信號VBE0N而使 位元BL1,BL2,…成為接地電位之Η頻道M0S電晶體37。 在此,圖1所示讀寫霣路30 0為,在X位址方向將8個記 憶單髖Ueiory cell)做為1方塊(block)管理,各方塊配 置選擇自己之方塊之情況檢測用之方塊選擇路600 °在圖 1所示方塊N0. 0之方塊,方塊選擇器6000為,由下位6位 元之X位址ADRX [5 : 0]全部成為[0]之情況檢测之AHD閛極 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 12 38362 I- n ϋ n n I i^i n u ϋ n X / 、了 (請先閲讀背面之注意事項再填寫本頁) 經濟部中央揉準局貝工消費合作社印製 A7 B7 五、發明説明(i 3) :, ;/.. 構成。 再者,薩1中,HAND閛極38為分別输入抽樣時脈RWCK2 與閂鎖可能信號(latch enable signal)LATEH與方塊選擇 器600之轆出BSED, NAHD閛極39為分別输人時間時脈RWCK3 與縯出可能信號(read enable signal)REAEN 2及輪出C0MP ,HAND閘極40為,分別_人方塊選擇器600之輸出BSEL與 謓出可能信虢2REAEH2。NAHDM極42為,分別_人時間時 鼯 RWCK3與寫人可能信號(wrightenable signal)WRIEH2。 0RW極43為分別输人讀出可能信號REAN2與寫人可能信號 WRIEH2, AND閛極44為分別鑰人時間時脈RVCK4與0R閛極 43之输出。再者,NAND閘極41之輸出IS加於構成資料暫存 器20之D正反電路(Flip-Flop)之時跚灌子CK, HAND閘極 40之輸出做為輸出媛衡器25之0H-0PF控制信施加,AND閛極 42之輪出做為類比開關29之0H-0FF控制信號施加,AND閘 極44之輸出向Η頻埴M0S霣晶體36之閘極施加。 Κ下,參照圓8及國9之時序圃,鞞明鱭寫電路300之 寫入勘作及謓出動作。記憶體60之各動作狀態之偏壓條件 如圆11所示。 首先,在寫入動作前,先進入對於資料暫存器20將資 料閂鎖所需之閂鎖模式(latch ·〇(1β)。在於該模式,2 ·位 元之數位資料Dl, D0向输入線45送出之同時,需寫入資料 EEPR0M6之位址ADRX, ADRY由圖5之位址產生電路1〇送出 ,而且,表示閂鎖棋式之信號LATEN成為Η位準。所輸出之 X位址中,下位6位元ADRX[5:0]與自己之方塊H0 —致時, ' 裝 ^ 丨訂_.^. (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 13 3 8362 經濟部中央標準局員工消费合作社印製 A7 _ B7_____ 五、發明説明(14) ; 方塊選擇器600之输出成為Η位準。例如在圖1中,方塊選 擇器600使方塊Ν0 0成為一致,亦即ADRX[5:0]全部以〇输 出Η位準。由於此,在抽樣脈衡RWCK2之上升點HAND間極 38之輸出成為L位準,HAND閛極41之输出亦成為Η位準。由 於此,構成實科暫存器20之D正反«路之時脈端子CK施加 時鐘(clock),输入資料Dl, D0則取入於資料暫存器20。 當取人終了時信號WBE成為Η位準,N頻道M0S罨晶傾 37 0Ν, _入出線30則成為接地電位。在X位址解碼器 100由於由X位址ADRX[8:5]所選擇之位元線接線於输入出 線30,該位元镍BL成為0V。另一方面,經由Y位址解瑪器 250,所選擇之字元線WL施加消除用之高電壓偏壓Vhv2, 霉源SL由Y位址解碼器200腌加〇V,因此所選擇之記憶糖 成為消除狀態。亦即,對於記憶埋60之浮動閘極FG之電荷 成為抽出狀態。 此種消除後,進入實皞之寫入棋式。 在寫入横式,如圔8(c)所示信號WJUEH2成為Η位準, 由於此,時脈RWCK3如圖8(d)所示成為Η位準之期間為, AHD閘棰42之轆出成為Η位準,再者,由於閂鎖電路24初期 設定於Η位準因此AND閘棰31之输出亦成為Η位準。由於此 ,類比開« 29 0Ν之同時,Ρ頻道M0S電晶艚26成為〇FF° 在此,輸入資料之上位位元D1為「0」時,由於and阐 極32之输出成為Η位準,因此N頻道M0S電晶體27 0H,如 圖8(f)所示偏B?IKVblh,經由類比開Μ29,輸人出線30 ,X位址解碣器100向所選擇之位元線BL供給。反之•输 I ------,1T------^ - _ (請先閏讀背面之注意事項再填寫本頁) 本纸張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) 14 3 836 2 經濟部中央揉準局員工消费合作社印製 A7 _ ._B7_____ 五、發明説明(1 5 ) ' 入賁料之上位位元D1為[1]時•由於AHD閛極33之輸出成為 Η位準,因此N頻道MOS電晶28成為ON,偏懕電壓Vbll經由 類比開鬭29,输入出線30, X位址解磚器向所選擇之位 元線BL供給。 時脈RWCK3成為Η位準之期間為,對於由¥位址解爾器 200所邐擇之電源線SL供給高電壓Vhvl (圈8(h)),經由Υ位 址解碣器250向所選擇之字元嬝WL供給VB2(圓8(g)),由此 滿足圏11所示寫入偏壓條件,施行對於記憶通60之寫入。 亦即,開始對於記憶臞60之浮動閘槿FG之電荷之注入。 其次,當時脈RWCK3上升,使時脈RVCK4成為_3(e)所 示Η位準時,由於AND I«極42之输出成為L位準,AND閛極 44之输出成為Η位準,因此使類比開闞29 OFF, Η頻道M0S 霣晶體36 ON,使謓出偏壓產生霣路35之分壓點Ρ接線於犏 入出線30。分壓點P之電位為,Η頻道M0S電晶體36為OFF 時設定於略高於V4之電壓Vrefh。再者,此種狀態為,經 由Y位址解碼器250,對於所選擇之字铒線'WL施加VB1,對 於霣源線SL則由Y位址解碼器200豳加0V,因此所選擇之記 憶體60成為讀出狀態。由於此,對應於注入於所選擇之記 憶暖之浮動閘極?6之霣荷之電壓Vie由输人出線30獲得,該 霣壓Vb在比較器23對於解碼器22之输出電壓Vdec施行比較 Ο 解碼器22為,對應於閂鎖於資枓暫存器20之資料,選 擇罨阻分壓電路21送出之4個霣壓VI〜V4中之任一類比電 膻,所選擇之類比轚壓向比較器23之非反轉端子輪出。在 本紙張尺度適用中國國家揉準(CNS ) A4規格(210 X 297公釐) „ Λ 15 38362 ---------------IT------^ ~· ~ (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局貝工消費合作社印裝 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) 3 8 362 A7 B7 五、發明説明(16) ;, 此,資料Dl, DO與分壓值VI〜V4之闞係表示於圖10。 比較结果,設如為VdeC>Va,比較器23之输出維持Η 位準,在此反覆施行依據前述時脈RWCK3之寫入動作與依 據時鐘RWCK4之讀出及比較動作。經由寫入動作之反覆對 於浮動閘極FG之電荷注入量增加之謓出電壓Vm則Κ圖8(f) 所示上升。並且Vdec認Vm時,如圖8U)所示,比較器23之 输出反轉而成為L位準,閂鎖罨路24之輪出C0MP亦成為L 位準。由於,AND閘極31之输出由Η位準反轉為L位準,P 頻道M0S電晶體26成為0Ν,再者,AND閘極3 2, 3 3之輪出成 為L位準,2個H頻道M0S電晶體27, 2δ成為OFF。由於此 ,其次使時脈RWCK3成為Η位準時,偏壓電壓VBH經由類比 開闞29向記憶體之位元線BL供給(參照圖8(f))。亦即,圖 11所示寫入偏壓條件破壤,寫入動作停止。 如前所述,在寫入模式中,在於所選擇之記憶體60, 記憶對應於2位元之輸入数位資料之4值之類比量。 在此,圖12為表示前述寫入動作時,之寫入脈衝數η與 記憶體電流Ir之闢係之圖,曲線a表示向吸極施加偏壓電 壓Vblh之情況,曲線b表示向吸極施加偏壓電壓Vbll之情 況。 當寫入脈衡數η增多時,對於浮動閘極之電荷注入量 增加,使記憶體之臨限罨壓Vt增大,由此記憶體電流Ir降 低。但是,由於每1脈衝之浮動閘極之電荷注入置則媛慢 減少,因此記憶體電流之降低率亦媛慢減少。 在此,做為施加於吸極之僱壓電壓採用比較高之H BL Η 16 —^、1τ------'^ . - (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 A7 _B7 __ 五、發明説明(17) :, ;/.. 之情況下,如曲線a所示,·施加大約15振衝時對應於資料 「0,1」 之記憶艚電流值成為8〇μΑ,讀出時大約可K獲得 V2之讀出電壓Vb,但為獲得對應於資料[1,0]之記憶體電 流6〇μΑ(對應於讀出電壓V3之電流值),必須施加60脈衝以 上之寫入脈衝。 但是,在圖1所示電路構成,資料之上位位元D1為[ 1]時,由於對於吸極之偏壓電壓由Vblh切換為更低之電壓After 500 rounds, these bias voltage supply lines are respectively inserted with P channel M0S transistor 26, Η channel M0S and crystal 27, and N channel M0S transistor 28M for recovery. In addition, the output side of the wheel of these pseudo crystals is' only connected to ON at the time of writing to the analog opening 29, and the output of the analog opening 29 is connected to the input / output line 30 of the χ address decoder 100. The key of the P channel M0S transistor 26 is a key with the key __ into the latch circuit 24 and the C0MP and the gate 31 with the key out. For the channel M0S with the M and 27 poles of the hips 28 and 28 ' The outputs of the AND gates 32 and 33 are applied, respectively. For AND poles 32 and 33 · —The input side enters into and out of ANDW 棰 31, and for the other round of the ANDM pole 32, input the upper bit D1 of the data supplied to the data register 2 0 from the negative The inverter 34 reverses the signal 'at the other input terminal of the AND pole 33' and directly inputs the upper bit of the material supplied to the data register 20, and writes it into each memory. The analog quantity of 60 is used as the ephemeris, and the read-out voltage generating circuit composed of a resistance voltage dividing circuit is set to 35 °. The voltage dividing point P is passed through the channel MOS of 0H only when the comparator 23 is compared. 36, and wired to X address decoder 100 in and out 30. Between the input line 30 and the ground, it is set to supply the ground potentials to the bit lines BL1, BL2, ... when the data of the memory is erased, and the bits BL1, BL2, ... become ground potentials via the control signal VBE0N. Zhiyao channel M0S transistor 37. Here, the read / write path 300 shown in FIG. 1 is to manage 8 memory single hip Ueiory cells in the X address direction as a block management, and each block configuration is used to detect the situation of its own block. The block selection path 600 ° is the block of the block N0. 0 shown in FIG. 1, and the block selector 6000 is the AHD detected by the case where the lower 6-bit X address ADRX [5: 0] is all [0]. The size of the ultra-thin paper is applicable to the Chinese National Standard (CNS) A4 specification (210X297 mm) 12 38362 I- n ϋ nn I i ^ inu ϋ n X /, (Please read the precautions on the back before filling this page) Ministry of Economic Affairs Printed by the Central Bureau of quasi-government Shellfish Consumer Cooperative A7 B7 V. Description of Invention (i 3):,; ... Composition. Furthermore, in Sa 1, HAND pole 38 is the input clock RWCK2 and latch enable signal LATEH and BSED from block selector 600 respectively, and NAHD pole 39 is the time clock RWCK3 and the read enable signal REAEN 2 and the rotation of the C0MP, HAND gate 40 are, respectively, the output BSEL of the human block selector 600 and the output possible signal 2REAEH2. NAHDM pole 42 is _ CKCK3 and wrightenable signal WRIEH2 respectively at the time of person. 0RW pole 43 is the input of human readout signal REAN2 and writer possible signal WRIEH2, AND 閛 pole 44 is the output of key time clock RVCK4 and 0R 閛 pole 43 respectively. In addition, when the output IS of the NAND gate 41 is added to the D flip-flop circuit constituting the data register 20, the output of the sinker CK, and the output of the HAND gate 40 is used as the 0H- of the output scale 25. The 0PF control signal is applied, and the output of the AND gate 42 is applied as the 0H-0FF control signal of the analog switch 29. The output of the AND gate 44 is applied to the gate of the high-frequency (M0S) crystal 36. Below K, referring to the sequence garden of circle 8 and country 9, the writing survey and the writing operation of the writing circuit 300 are explained. The bias conditions for each operating state of the memory 60 are shown in circle 11. First, before writing, enter the latch mode (latch · 0 (1 β) required for the data register 20 to latch the data. In this mode, 2-bit digital data D1, D0 are inputted. At the same time as the line 45 is sent out, the address ADRX, ADRY of the data EEPR0M6 needs to be written. It is sent out by the address generation circuit 10 of FIG. 5, and the signal LATEN indicating the latch-style chess becomes the level. The outputted X address The middle and lower 6-bit ADRX [5: 0] and its own block H0 are the same, when 'install ^ 丨 order _. ^. (Please read the precautions on the back before filling this page) This paper size applies to Chinese national standards (CNS) A4 size (210X297 mm) 13 3 8362 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 _ B7_____ V. Description of the invention (14); The output of the block selector 600 becomes a level. For example, in Figure 1 The block selector 600 makes the blocks N0 0 consistent, that is, ADRX [5: 0] all output 0 level. Because of this, the output of the pole 38 at the rising point HAND of the sampling pulse balance RWCK2 becomes the L level, The output of the HAND pole 41 has also become the level. Because of this, the positive and negative D of the actual register 20 is formed. «A clock is applied to the clock terminal CK of the road, and the input data D1, D0 are taken into the data register 20. When the access is finished, the signal WBE becomes the level, the N channel M0S, the crystal tilt 37 0N, _ The input and output lines 30 become the ground potential. At the X address decoder 100, the bit line selected by the X address ADRX [8: 5] is connected to the input and output line 30, and the bit nickel BL becomes 0V. On the other hand The high-voltage bias Vhv2 for erasure is applied to the selected word line WL via the Y address demaser 250, and the mold source SL is marinated by the Y address decoder 200 with 0V, so the selected memory sugar becomes eliminated. That is, the charge of the floating gate FG of the memory 60 is drawn. After this elimination, the actual writing chess mode is entered. In the writing horizontal mode, the signal WJUEH2 is shown in 圔 8 (c). Because of this, the period during which the clock RWCK3 becomes the level as shown in FIG. 8 (d) is that the release of the AHD gate 42 becomes the level. Furthermore, since the latch circuit 24 is initially set at Because of this, the output of the AND gate 31 also becomes the level. Because of this, the analogy of opening «29 0Ν, the P channel M0S transistor 26 becomes 0FF °. When the upper bit D1 of the input data is "0", since the output of the and transistor 32 becomes the Η level, the N-channel M0S transistor 27 0H is biased by B? IKVblh as shown in Fig. 8 (f). Μ29, input line 30, X address resolver 100 is supplied to the selected bit line BL. Otherwise, input I ------, 1T ------ ^-_ (Please first Read the notes on the reverse side and fill out this page) This paper size applies the Chinese National Standard (CNS) A4 specification (210X297 mm) 14 3 836 2 Printed by A7 _ ._B7 _____ of the Consumer Cooperatives of the Central Government Bureau of the Ministry of Economic Affairs Explanation (1 5) 'When the upper bit D1 of the input data is [1] • Since the output of the AHD pole 33 becomes the high level, the N-channel MOS transistor 28 is turned ON, and the bias voltage Vbll is opened by analogy. 29, input and output line 30, the X address deblocker supplies to the selected bit line BL. While the clock RWCK3 is at the threshold level, the high voltage Vhvl (circle 8 (h)) is supplied to the power line SL selected by the ¥ address resolver 200, and is selected by the address resolver 250. The zigzag character 袅 WL is supplied to VB2 (circle 8 (g)), thereby satisfying the write bias condition shown in 圏 11, and writing to the memory pass 60 is performed. That is, the injection of the electric charge to the floating gate FG of the memory 臞 60 is started. Secondly, the clock RWCK3 rises, so that the clock RVCK4 becomes the level shown in _3 (e). Since the output of the AND I «pole 42 becomes the L level and the output of the AND pole 44 becomes the level, the analogy is made. Open 29 OFF, channel M0S, and crystal 36 ON, so that the output bias voltage generating point 35 of the circuit 35 is connected to the input and output line 30. The potential of the voltage dividing point P is set to a voltage Vrefh slightly higher than V4 when the channel M0S transistor 36 is OFF. Furthermore, in this state, VB1 is applied to the selected word line "WL" via the Y address decoder 250, and 0V is added to the source line SL by the Y address decoder 200. Therefore, the selected memory The body 60 is in a read state. Because of this, corresponds to the floating gate injected into the selected memory? The voltage Vie of the load 6 is obtained from the input line 30. The voltage Vb is compared with the output voltage Vdec of the decoder 22 at the comparator 23. The decoder 22 corresponds to the latch on the asset register 20 According to the data, any one of the four analog voltages VI to V4 sent from the resistor divider circuit 21 is selected, and the selected analog voltage is output to the non-inverting terminal of the comparator 23. Applicable to China Paper Standard (CNS) A4 (210 X 297 mm) on this paper scale „Λ 15 38362 --------------- IT ------ ^ ~ · ~ (Please read the notes on the back before filling out this page) The paper size printed by the Central Standards Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperative Co., Ltd. The paper size applies to the Chinese National Standard (CNS) Α4 specification (210X297 mm) 3 8 362 A7 B7 V. Invention Explanation (16) ;, Therefore, the relationship between the data D1, DO and the divided voltage values VI ~ V4 is shown in Fig. 10. The comparison result is set as VdeC > Va, and the output of the comparator 23 maintains the Η level, which is repeated here. The write operation according to the aforementioned clock RWCK3 and the read and comparison operation according to the clock RWCK4 are performed. The repeated output voltage Vm for the increase in the charge injection amount of the floating gate FG through the repetition of the write operation is shown in FIG. 8 (f). When Vdec recognizes Vm, as shown in Figure 8U), the output of the comparator 23 reverses to become the L level, and the output of the circuit C0MP of the latch circuit 24 also becomes the L level. Because the AND gate 31 The output is reversed from the L level to the L level, and the P channel M0S transistor 26 becomes 0N. Furthermore, the output of the AND gate 3 2, 3 3 turns to the L level, and the 2 H channels M0S Transistors 27, 2δ are turned off. As a result, when the clock RWCK3 is brought to the Η level, the bias voltage VBH is supplied to the bit line BL of the memory via the analog switch 29 (see FIG. 8 (f)). That is, As shown in Figure 11, the write bias condition is broken, and the write operation is stopped. As mentioned earlier, in the write mode, the selected memory 60 is used to memorize 4 values corresponding to 2-bit input digital data. Here, FIG. 12 is a graph showing the relationship between the number of write pulses η and the memory current Ir during the aforementioned write operation, and the curve a shows the application of the bias voltage Vblh to the sink electrode, and the curve b This shows the case where the bias voltage Vbll is applied to the sink electrode. When the write pulse number η increases, the amount of charge injection to the floating gate increases, so that the threshold voltage Vt of the memory increases, and thus the memory current Ir However, since the charge injection of the floating gate is reduced slowly per pulse, the reduction rate of the memory current is also slowly reduced. Here, a higher voltage is used as the employment voltage applied to the sink. H BL Η 16 — ^, 1τ ------ '^.-(Please read the notes on the back first (Fill in this page again.) Printed by A7 _B7 __ of the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs. 5. Description of the invention (17):,; / .. In the case of curve a, · approximately 15 vibrations correspond to The memory current value of the data "0,1" becomes 80μA, and the readout voltage Vb of V2 can be obtained by approximately K during reading, but in order to obtain the memory current 60μA (corresponding to the data [1,0]) At the current value of the read voltage V3), a write pulse of 60 pulses or more must be applied. However, in the circuit configuration shown in FIG. 1, when the upper bit D1 of the data is [1], the bias voltage for the sink electrode is switched from Vblh to a lower voltage.
Vblh,因此1脈衝相當之對於浮動閘棰之電荷注入董增加 ,如曲線b所示,由大約4脈衝可Μ獲得對應於資料[1,0 ]之記憶體電流6〇μΑ,對應於資料[1,1]之記憶體電流4〇μΑ (對應於讀出電壓V4之電流值)亦大約由11脈衝獲得。 亦即,經由對應於寫入資料切換向吸極供給之偏壓電 壓值,可Κ在短時間內施行寫入動作。 其次,對於謓出模式之動作,參照圖9說明。 在讀出模式,首先,由於信號XSET(圖9(c))成為Η位 準,對於資料暫存器20設定初期值全部,[1](圖9(e)),由 解碼器22如圖9(f)所示,輪出對應於全部[1]之類比電壓 V4。在此,時脈RWCK4如圖9(g)所示成為Η位準時,由於對 於記憶體60之偏壓條件成為寫入模式時之讀出動作時之完 全相同條件,因此對應於注入於所選擇之記憶體之浮動閘 極之電荷之電壓Vm在比較器23之反轉端子獲得,由此將該 霉壓Vm對於解碼器22之電壓V4施行比較。比較结果,設如 為Vm>V4時比較器23及閂鎖電路24之輪出C0MP成為L位準 ,因此NAHD閘極39之輪出成為Η位準,此時由於HAND閘極 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)’ 17 38362 ---------k------:111,------4 (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印裝 A7 B7 五、發明説明(18) :, 38之_出固定於Η位準,NAND閘極41之输出成為L位準,Μ 後不施行閂鎖動作而資料暫存器20成為維持全部「lj 之 狀態。 另一方面,比較结果成為VmSV4時,由於比較器23及 閂鎖電路24之輸出C0MP成為Η位準,因此如圖9(a)所示時 鐘RWCK3成為Η位準時,HAND閘極39之輪出成為L位準,由 於此,由NAHD閘極41向資料暫存器20输出時脈信號,向資 料輸入線45供給之資料由資料暫存器20閂鎖。此種資料輸 入線45為,在讀出模式時由圖2所示下降計數器(down c〇unter)801每在時脈RWCK4下降時依序輪出「10j , 「01 j , 「00」之資料,「Dl, DO」,因此在資料「11」之次 一點以資料「10」Μ圖9(e)所示狀閂鎖於資料暫存器20。 如此,解碼器22之輪出Vdec為以圖9(f)所示下降至電壓V3 ,時脈RWCK4再度成為Η位準時,豳行對應於記憶體所讀出 之類比量之電壓Vb與電壓V3之比較。並且,Vm>V3時,比 較器23及閂鎖電路24之輪出C0MP反轉AL位準,以後不施 行閂鎖動作而在資料暫存器2 0保持[1 0 ]。比較之结果V m S V3時,比較器23及閂鎖電路24之輸出COMP維持Η位準,因 此次一資料[01]閂鎖於資料暫存器20,由比較器23比較電 壓V2與Vm。此種比較结果,Vm>V2時資料暫存器20之內容 .固定於[0 1 ], V m S V 2時最後之資料[0 0 ]由資料閂鎖器2 0閂 鎖,由此比較電壓Vm與VI。電壓VI由大約設定於0V,最後 之比較中成為Vm> VI而使資料暫存器10之内容固定於[00] ---------^ K-----i.^------i (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4规格(210X297公釐) 18 3 8 362 A7 B7 經濟部中央樣準局員工消費合作社印製 五、發明説明( 19 ) 1 1 如 前 所 述 , 對 應 於 由 記 憶 體 讀出 之 類 比 量 之 電 壓 Vn 為 | 經 由 資 料 暫 存 器 20 $ 電 阻 分 壓 電路 21 • 解 碼器22^ 比 較 I 器 23 , NAND閘極 39 9 NAND關掻41施行AD變換 9 經 過 輸 出 緩 請 1 衝器25向 外 部 轉 送 0 亦 即 f 經 由 此等 電 路 構 成 圖 5 所 示 第 先 閲 1 2AD換流器5 〇 背 之 注 意 事 1 1 在 此 » 如 前 所 述 在 讀 寫 電 路 300 , 2位元 之 數 位 資 科 變 1 1 換 為 4值之類比量由此寫入於1記憶體 9 但 是 由 ADPCM 編 碼 項 再 填 1 器 2 输 出 之 實 際 之數位資料為 4 位元 0 寫 本 頁 裝 在 此 • 本 例 中 t 如 圖 2 所 示 ,輪 入 之 4 位 元 之 數 位 資 \^ 1 I 料 中 上 位 2 位 元 記 憶 於 右 側 之 記 憶體 行 列 6R t 下 位 2 位 元 1 1 I 記 憶 於 左 側 之 記 憶 體 行 列 6L 0 當 然. 對 .於 兩 行 列 之 記 憶 為 1 9 經 由 刖 述 圖 1之謓寫電路300施 行, 2 位 元 之 數 位 資 料 分 訂 變 換 為 各 4 值 之 類 比 量 後 > 在 各 記憶 體 多 值 記 憶 〇 1 1 賓2 中 9 80 0為接線於微電腦(a) > ADPCM 編 碼 器 2 及 1 1 ADPCM解碼器7 之控制電路, 該控制電路8 00為 » 含 有 輪 出 1 謓 出 時 之 AD變換用 之 下 降 計 數 值 之下睬計數器801 及 位 址 1 I 產 生 電 路 10 , 分 別 送 出 9 位 元 之 X位址ADRX , 11位元之Y位 1 1 I 址 ADR Y , 4 位 元 之 資 料 之 同 時 輸出 圖 1 所 示 各 種 時 脈 信 1 1 號 及 控 制 信 號 , 再 者 t 暫 時 取 入 對應 於 由 記 憶 體 行 列 讀 出 1 1 之 類 比 量 之 數 位 資 料 » 期 求 向 ADPCM解碼器7送 出 之 作 用 0 1 1 再 者 » 在 右 側 之 記 憶 體 行 列 6R , 在 其 上 側 分 別 配 置 方 1 1 塊 選擇群6 00 R U , 讀寫電路群300 Ru , X 位 址 解碼器群100 1 I Ru 次 解 碼 器 7 00 R υ 等 * 其 構 成 成為 對 稱 狀 在 記 憶 體 行 列 1 1 6R之下側 1 分 別配置方塊選擇群600RL, 讀寫電路群3 00 RL 1 1 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) 19 38362 經濟部中央揉準局員工消费合作社印袈 A7 __B7__ 五、發明説明(20) :' / ,X位址解碣器群i〇ORL,次解碼器7001^等。關於左側之 記憶《行列6L與右俩記憤»行列,同樣在其上下分別60置 方塊選擇群600Lu,讀寫電路群3 00 Lu,X位址解瑪器群100 Lu,次解碼器7〇〇Lu·及方堍選擇群6〇〇LL,讀寫電路群30LL ,X位址解碼器群100LL,次解瑪'器700LL等。 並且,對於右側記憶體單髓行列6R與左側記憶體單體 行列6L之前述電路構成完全相同,而且•所輸入之位址信 號亦相同,因此此等記憶體腌行完全相同之動作。並且, Y位址解碼器200, 250為,同於圈1所示構成。並且,圖 2中雖無表示,與圃1同樣在讀寫電路群’设置第2傾壓 霣路400,由此向解碼器200,250供給偏壓電歷Vhvl,Vhv2 等。在此,圔3表示左側記憶單體行列6L及周邊電路之詳 细。 3中,記憶單體行列6L上下分別Μ 32方塊分割管理 ,此等各方丢,分別配置方塊選擇器BS,謓寫電路R/W,X位 址解碼器X-ADEC等。由於此,方塊選蜾群600LU,6001^分 別由32個之方塊遘擇器BS所構成,讀寫電路群300Lu, 3 00LL分別由32涸讀寫電路R/W所構成,X位址解碼器群100 Lu, 100LL分別由32個X位址解碼器X-ADEC所構成。圖3所 示各方塊之讀寫電路R/W為與圆1所示讀寫電路300之完全 相同構成,X位址解碼器X-ADEC亦與圖1所示X位址解碼 器100之完全相同構成。但是,方塊選擇器BS由於須檢測 已堪擇自己之方塊,僅在輸入表示自己之方塊H0.之X位址 ADRX[5:0]時輪出Η位準之方式,每一方塊輸入不同位址之 本紙張尺度適用中國國家榡準(CNS ) Α4规格(210Χ 297公釐) 一 20 38362 X 裝 一丨訂 | .V (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 A7 __B7__ 五、發明説明(21 ) : / 携成。 K下,參照圖6說明資枓寫入模式時之動作。 首先,由圖2之位址產生電路10送出之位址依序更新 ,因此下位6位元之X位址ADRX[5:0]由圖6(b)所示變化, 在上側之方塊選擇器群6 0 0 L u ,隨著該X位址A D R X [ 5 : 0 ]之 變化,由方丢H0, 0向N0. 31依序使各方塊選擇器B S0〜 BS 31之各選擇器轆出BSEL成為Η位準。該期間為•如圖 6(c), (d)所示向上側之讀寫電路群300Lu供給之閂鎖可能 信號LATEN及寫人可能信號VRIEN2,分別成為Η位準及L位 準,因此對於由方塊Ν0. 0向Ν0. 31之相對應之各讀寫電 路R/W内之資料暫存器20,依序將抽樣之資料閂鎖。再者 ,如III· 6 ( b )所示,X位址A D R X [ 5 : 0 ]更新時,本次在下側方 塊選擇器群600LL,贖著X位址ADRX[5:0]之變化,由方塊 H0. 32向N0. 63依序使各方塊選_器BS32〜BS63之選擇 输出成為Η位準,該期間為如圖6(e)所示使閂鎖可能信號 LATEN成為Η位準,因此下側之讀寫電癸群300LL為,對於 方塊Ν0. 32至Ν0. 63之相對應之各謓寫電路ϋ/W内之資料 暫存器20,依序將抽樣之資料閂鎖。再者,該期間為,同 時使對於上側之讀寫電路群300Lu之讀寫可能信號VRITEN2 ,以圖6(d)所示成為Η位準,因此各方塊K0. 0〜N0. 31為 同時腌行寫入動作。但是,各方塊為,X位址解碼器X-ADEC 依據向該X位址解碼器X-ADEC供給之上位8位元之X位址 ADRX[8:5]選擇任何1條位元線BL, Y位址解碼器200, 250 選擇任何1條電源媒SL及字組線WL,结果對於上側之選擇 本紙張尺度逋用中國國家標準(CNS ) A4規格(210X297公釐) 21 38362 ^-- (請先閎讀背面之注意事項再填寫本頁) 訂Vblh, so 1 pulse is equivalent to the increase of charge injection to the floating gate, as shown in curve b. From about 4 pulses, the memory current 60 μA corresponding to the data [1,0] can be obtained, corresponding to the data [ 1,1] memory current 40μA (current value corresponding to the readout voltage V4) is also obtained by about 11 pulses. That is, by switching the value of the bias voltage supplied to the sink electrode in accordance with the writing data, the writing operation can be performed in a short time. Next, the operation in the scoop-out mode will be described with reference to FIG. 9. In the readout mode, first, since the signal XSET (Fig. 9 (c)) becomes the Η level, all initial values are set for the data register 20, [1] (Fig. 9 (e)). As shown in 9 (f), the wheel-out corresponds to all analog voltages V4 of [1]. Here, when the clock RWCK4 becomes the Η level as shown in FIG. 9 (g), the bias condition for the memory 60 becomes the same condition as the read operation when the write mode is used, so it corresponds to the injection into the selected The voltage Vm of the charge of the floating gate of the memory is obtained at the inverting terminal of the comparator 23, and the mold voltage Vm is compared with the voltage V4 of the decoder 22. As a result of comparison, if Vm> V4, the output of the comparator 23 and the latch circuit 24 of the latch circuit 24 becomes the L level, so the output of the NAHD gate 39 becomes the high level. At this time, because the HAND gate paper size is applicable China National Standard (CNS) A4 specification (210X 297 mm) '17 38362 --------- k ------: 111, ------ 4 (Please read the note on the back first Please fill in this page again) A7 B7 printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs 5. Description of the invention (18): The output of 38 is fixed at the Η level, and the output of the NAND gate 41 becomes the L level. The data register 20 is maintained in a state of "lj" without performing a latching operation. On the other hand, when the comparison result is VmSV4, the output COMP of the comparator 23 and the latch circuit 24 becomes a high level, as shown in Fig. 9 (a) When the clock RWCK3 becomes the Η level, the rotation of the HAND gate 39 becomes the L level. Because of this, the NAHD gate 41 outputs a clock signal to the data register 20 and supplies it to the data input line 45. The data is latched by the data register 20. Such a data input line 45 is a down counter 801 shown in FIG. 2 in the read mode. Every time the clock RWCK4 drops, the data of "10j," 01j, "00", "Dl, DO" are sequentially rotated. Therefore, the data "10" is next to the data "11". Figure 9 (e) The latch shown in the figure is latched to the data register 20. In this way, the output Vdec of the decoder 22 is reduced to the voltage V3 as shown in FIG. 9 (f), and when the clock RWCK4 becomes the level again, the voltage Vb and the voltage V3 corresponding to the analog amount read by the memory are moved. Comparison. In addition, when Vm> V3, the output of the comparator 23 and the latch circuit 24 is reversed, and the COMP level is reversed to the AL level. Thereafter, the latch is held in the data register 20 without performing a latch operation [1 0]. When the comparison result V m S V3, the output COMP of the comparator 23 and the latch circuit 24 maintains a high level, so the next data [01] is latched in the data register 20, and the voltage V2 and Vm are compared by the comparator 23 . As a result of this comparison, the content of the data register 20 at Vm > V2. Fixed at [0 1], the last data [0 0] at V m SV 2 is latched by the data latch 2 0, thereby comparing the voltages Vm and VI. The voltage VI is set to about 0V, and in the last comparison, it becomes Vm > VI so that the content of the data register 10 is fixed at [00] --------- ^ K ----- i. ^- ----- i (Please read the precautions on the back before filling out this page) This paper size applies to Chinese National Standard (CNS) A4 (210X297 mm) 18 3 8 362 A7 B7 Staff Consumption of Central Bureau of Standards, Ministry of Economic Affairs Printed by the cooperative V. Description of the invention (19) 1 1 As mentioned before, the voltage Vn corresponding to the analog quantity read from the memory is | Via the data register 20 $ Resistor divider circuit 21 • Decoder 22 ^ Comparing I converter 23, NAND gate 39 9 NAND gate 41 performs AD conversion 9 After the output is slowed down, 1 punch 25 is transferred to the outside 0, that is, f is constituted by such circuits. First read 1 2 AD converter 5 〇Notes on the back 1 1 Here »As mentioned above, in the read-write circuit 300, the 2-digit digital asset section is changed to 1 1 and the analog value of 4 is written in 1 memory 9 but by ADPCM Code item refill 1 device 2 The actual digital data output is 4 digits. 0 This page is installed here. • In this example, t is shown in Figure 2. The 4 digits of digital data in rotation \ ^ 1 I The upper 2 digits in the data are stored on the right. The memory rank 6R t lower 2 bits 1 1 I is stored in the left memory rank 6L 0 Of course. Yes. The memory in the two ranks is 1 9 implemented by the transcription circuit 300 described in FIG. Digital data ordering and conversion into analog values of 4 values > Multi-value memory in each memory 0 1 1 2 9 80 0 Wired to microcomputer (a) > ADPCM encoder 2 and 1 1 ADPCM decoder 7 control circuit, the control circuit 8 00 is »Contains the down counting value for AD conversion during the round-out 1 and the counter 801 and the address 1 I generating circuit 10, which respectively sends out 9-bit X addresses ADRX, 11-bit Y-bit 1 1 I address ADR Y, 4-bit data at the same time, output various clock signals 1 1 and The control signal, or t temporarily fetches digital data corresponding to an analog quantity of 1 1 read from the memory ranks »Periodically, the effect sent to the ADPCM decoder 7 is 0 1 1 Furthermore» The memory rank 6R on the right side, On the upper side, there are 1 1 block selection group 6 00 RU, read and write circuit group 300 Ru, X address decoder group 100 1 I Ru sub-decoder 7 00 R υ, etc. * The structure becomes symmetrical in the memory ranks 1 1 Under the 6R, configure the block selection group 600RL, and the read-write circuit group 3 00 RL 1 1 This paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X 297 mm) 19 38362 Employees of the Central Government Bureau of the Ministry of Economic Affairs Consumption cooperative seal A7 __B7__ 5. Description of the invention (20): '/, X-address decoder group iORL, secondary decoder 7001 ^ and so on. Regarding the memory on the left, "Ranking 6L and the Right Two", likewise, 60 blocks are set on the upper and lower sides to select the group 600Lu, the read-write circuit group 3 00 Lu, the X address resolver group 100 Lu, and the decoder 7. 〇Lu · and Fang Xun select group 600LL, read-write circuit group 30LL, X-address decoder group 100LL, sub-resolution processor 700LL, and so on. In addition, the circuit configuration of the right memory single row matrix 6R and the left memory single row matrix 6L are exactly the same, and the input address signals are also the same, so these memory pickle rows behave exactly the same. The Y address decoders 200 and 250 have the same configuration as shown in the circle 1. In addition, although not shown in FIG. 2, the second dump circuit 400 is provided in the read / write circuit group 'as in the garden 1, thereby supplying the decoders 200, 250 with bias voltage calendars Vhvl, Vhv2, and the like. Here, 圔 3 indicates the details of the left memory cell rank 6L and the peripheral circuits. In 3, the memory cell rank 6L is divided and managed by 32 blocks at the top and bottom respectively. These parties are lost, and the block selector BS, the transcription circuit R / W, the X-address decoder X-ADEC, etc. are configured respectively. Because of this, the block selection group 600LU and 6001 ^ are respectively composed of 32 block selectors BS, the read and write circuit groups 300Lu and 300L are each composed of 32 涸 read and write circuits R / W, and the X address decoder Groups 100 Lu and 100LL are each composed of 32 X-address decoders X-ADEC. The read / write circuit R / W of each block shown in FIG. 3 is exactly the same as the read / write circuit 300 shown in circle 1. The X-address decoder X-ADEC is also completely the same as the X-address decoder 100 shown in FIG. 1. The same composition. However, since the block selector BS has to detect that it has chosen its own block, only when the X address ADRX [5: 0] representing its own block H0. The paper size of this site is applicable to China National Standards (CNS) A4 specifications (210 × 297 mm)-20 38362 X Packing | Ordering | .V (Please read the notes on the back before filling this page) Central Bureau of Standards, Ministry of Economic Affairs Printed by the employee consumer cooperative A7 __B7__ V. Description of the invention (21): / Bingcheng. Below K, the operation in the data write mode will be described with reference to FIG. 6. First, the addresses sent by the address generation circuit 10 in FIG. 2 are sequentially updated, so the lower 6-bit X address ADRX [5: 0] is changed as shown in FIG. 6 (b), and the block selector on the upper side Group 6 0 0 Lu, with the change of the X address ADRX [5: 0], from square to H0, 0 to N. 31, the selectors of the block selectors B S0 to BS 31 are sequentially displayed BSEL becomes the level. During this period, as shown in Fig. 6 (c), (d), the latch possible signal LATEN and the writer potential signal VRIEN2 supplied to the read-write circuit group 300Lu on the upper side become the Η level and the L level, respectively. The data register 20 in each of the read / write circuits R / W corresponding to the blocks N0. 0 to N0. 31 sequentially latches the sampled data. Furthermore, as shown in III · 6 (b), when the X address ADRX [5: 0] is updated, this time in the lower block selector group 600LL, the change of the X address ADRX [5: 0] is redeemed by Blocks H0. 32 to N. 63 sequentially make the selection outputs of the block selectors BS32 to BS63 become the Η level. During this period, as shown in FIG. 6 (e), the latch possible signal LATEN becomes the Η level, so The read-write group 300LL on the lower side is the data register 20 in each of the writing circuits ϋ / W corresponding to the blocks No. 32 to No. 63, and sequentially latches the sampled data. Moreover, during this period, at the same time, the read-write possible signal VRITEN2 for the read-write circuit group 300Lu on the upper side is set to a level as shown in FIG. 6 (d), so each block K0. 0 ~ N0. 31 is simultaneously pickled Row write operation. However, each block is that the X address decoder X-ADEC selects any one bit line BL according to the X address ADRX [8: 5] which supplies the upper 8 bits to the X address decoder X-ADEC, Y address decoder 200, 250 selects any one power medium SL and block line WL. As a result, for the selection on the upper side, the Chinese national standard (CNS) A4 specification (210X297 mm) 21 38362 ^-( (Please read the notes on the back before filling out this page)
• ft m HI 經濟部中央揉準局貝工消費合作社印製 A7 ___B7__ 五、發明説明(22 ) y 之3 2僱記植牖同時MS行寫入。 寫入後,位址ADRX[5:0]為,再度回至[〇]而依序將位 址更新,因此次一點輪入之32個抽樣資料為對於上側謓寫 霣路群300LU之各方塊之資料暫存器20依序閂鎖。施行此 種閂鎖動作之期間内,在下衡謓寫鼋路群300LL,由於講寫 可能信號VRITEN2成為Η位準,因此在下側之全方塊H0.32 〜Ν0.63中對於所選擇之記憶單體同時施行寫入動作。 如此,在上ft謓寫電路群300LU與下側讀寫電路群 300LL,交替施行資料之閂鎖動作與寫入動作•由此即使寫 入動作長於1個抽樣時間,可Μ在不具有空隙時間之狀態 下有效率腌行寫入動作。 其次,參照圖7說明讀出模式時之動作。 首先,次解碼器(sub-decoder)700LU為,如圄4之實 媒所示,由输入X位址ADRX[5:2]之NAHD阐棰701, K及耱 入位址ADRX[5]與NAND閘極701之輸出之NAND閘極702,Μ 及输入讀出模式中常時成為Η位準之信皞REAEH與HAND閘極 702之綸出而做為输出圖1所示謓出可能信號REAEH2之AND 閜極703等所構成。再者,做為次解碼器700LL,如虛線所 示替代位址ADRX[5]輸入其反轉信號之一點不同於次解碼 器700LU,其他部分則為完全相同構成。• ft m HI Printed by Shellfish Consumer Cooperative, Central Bureau of the Ministry of Economic Affairs A7 ___B7__ V. Description of Invention (22) y No. 3 2 The employment record is written at the same time as the MS line. After writing, the address ADRX [5: 0] is, and it returns to [0] again to sequentially update the address. Therefore, the 32 samples of the next round of sampling data are for each block of the upper-side transcription group 300LU. The data registers 20 are sequentially latched. During the execution of such a latching action, in the Hengheng writing group 300LL, the writing possible signal VRITEN2 becomes the level, so the selected memory list is in the full block H0.32 ~ N0.63 on the lower side. The body performs a write operation at the same time. In this way, the latching operation and the writing operation of data are alternately performed in the upper ft writing circuit group 300LU and the lower reading and writing circuit group 300LL. Therefore, even if the writing operation is longer than one sampling time, there can be no gap time. In this state, the write operation is efficiently performed. Next, an operation in the read mode will be described with reference to FIG. 7. First, the sub-decoder 700LU is, as shown in the real media of 圄 4, NAHD 棰 701, K and the input address ADRX [5] from the input X address ADRX [5: 2] and The output of NAND gate 701, NAND gate 702, M, and input read mode always become the level of the signal. The output of REAEH and HAND gate 702 is used to output the possible signal REAEH2 shown in Figure 1. AND 閜 pole 703 and so on. In addition, as the secondary decoder 700LL, the alternate address ADRX [5] as shown by the dotted line is different from the secondary decoder 700LU in that one point of the inverted signal is different, and the other parts have the same configuration.
在此,謓出横式時,如H7(b)所示更新位址ADRX[5: 0],位址成為[60]時ADRX[5:2]之各位元輪出全部成為Η位 準,因此次解碼器700LU為,NAND閘極701之输出成為L位 準,由於此.HAND閛極702之輸出成為Η位準*由於此AND n. I 丨「'I— I I I -...... I- n - ........ I _ ' U3--β < - (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Α4規格(210X297公釐) 22 38 362 經濟部中央標準局®:工消費合作社印製 A7 B7 五、發明説明(23) ' , 閘極703之输出REAEN2,如圓7(c)所示成為Η位準。由於此 ,上俩之讀寫電路群7 00 LU,由Ν0.0〜Ν0.31之32個記憶單 體同時開始讀出動作。該讀出動作為長於1個抽樣期間(位 址僅更新1個之期間),此種情況下大約需要3個抽樣期間 ,在位址回至[0]前终了。 在此,NAND閘極701為Η位準之期間內,位址繼缜[60] 至[63],位址回至[0]時該輪出成為L位準。但是,位址在 [0]至[31]之期間内ADRX[5]常時成為L位準,因此HAND閘 極702之鑰出成為Η位準,次解碼器7 00LU之輸出REAEN2為 ,如圖7(c)所示繼續維持Η位準。位址ADRX[5:0]由[0]變 化為[31]時,由於方塊N0.0至N0.31之方塊選擇器BS依序 犏出Η位準,因此在相對應之謓寫電路R/W使轉送電路之輸 出缓衝器25(參照圖1)啟開,依序輪出資料暫存器20之内 容。 另一方面,在次解碼器700LL,位址ADRX[5:0]成為[ 28]時,由於位址ADRX[5]之反轉輪出灵ADRX[4:2]之各位 元输出全部成為Η位準,因此HAND閘棰701之輸出成為Η位 準。由於此,NAHD閘極7 02之輸出成為Η位準,由於此AHD 閘極703之輸出REAN2成為圖7(d)所示Η位準。由於此,在 下側之讀寫電路群300LLM 32個記憶單體同時開始讚出動 作。並且,NAND閘極701之輪出為一直到位址成為[31]前 維持Η位準,成為[32]時成為L位準,但由於位址由[32]至 [63]之期間内ADRX[5]之反轉輪出常時成為L位準,該期間 内,下側之讀寫電路群300LL之输出REAEH2為,如圖7(d) n n n n m n m -- -- —I I 1 I [ *^τ* (請先聞讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4规格(210X297公釐) 23 38 36 2 A7 __B7_'_ 五、發明説明(24) :, ;/.- 所示繼缅維持Η位準。並且,位址由[32]變化為[63]之期 間為,由於方塊Η0.32至Η0.63之方塊選擇器BS依序輪出 Η位準,因此在相對應之各讀寫電路R/W使做為轉送電路之 鑰出媛衝器25(參照圖1)啟開,由此依序輸出資科暫存器 20之内容。 如前所說明,前述次解碼器700LU及700LL為,與控制 電路800等共同形成謓出記憶體行列6L之上側及下俩之資 料而控制之控制電路之一部份,次解碼器700L為,構成經 由設置在謓寫電路群300LU内之輪出緩衝器所形成之轉送 電路群在轉送謓寫電路群300LU内所設置之輪出媛衝器所 形成之轉送電路群轉送記憶單體行列6L之上側之資料之期 間内,檢測已指定上側之讀寫電路群300LU中之持定之資 料暫存器(方塊Η0.28)之檢测電路。再者,次解碼器700LU 為,構成經由設置於謓寫電路群300LL内之輸出媛衝器所 形成之轉送電路群在轉送讀寫電路群300LL内所設置之輸 出缓衝器所形成之轉送電路群轉送記憶,單體行列6L之下側 之資料之期間內檢測已指定下側之謓寫電路群300LL中之 (請先閲讀背面之注意事項再填寫本頁) 裝· *11 經濟部中央標準局貝工消費合作社印製 塊 方 路 電 測 檢 之 νϊ/ ο 6 讀 之 出 輸 測 檢 之 U L ο ο 7 器 碼 解 次 由 為 做 器於 存應 暫對 料 , 資且 之並 定 特 號 信 能 可 出 圖 照 參 ./IV 出 謓 E C A ( 之 側 上 之 L 6 列 行 體 憶 記 於 對 始 開 升 上 之 為 做 於 應 對 上 之 2 N E A E R 號 信 能 可 出 纊 之 出 輸 \—/ \7 d /V 7 圖 照 參 /IV 出 讀 之 側 下 之 測 6 檢列 之行 L 體 OL憶 70記 器於 碼對 解始 次開 由升 前 間 期 樣 抽 4 由 間 時 之 出 輪 之 料 資 始 開 須 由 經 此 如 3 8 362 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) A7 B7 五、發明説明(25 ) :,;/.· .經由預先讚出資料暫存器20之内容,防止讀出模式時存 列 行 體 憶 記 側 右 間圖 , 時據明 隙依說 空 ,所 之 上 前. 用以如 無 但 在 , 說 3 列 行 體 單 憶 記 之 左 明 作動 動之 闞同 相相L 全 9\J完 行 施 亦 作 (請先閲讀背面之注意事項再填寫本頁) 裝. 訂 丨 4 經濟部中央標準局貝工消費合作社印製 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 25 3 836 2Here, when the horizontal mode is displayed, the address ADRX [5: 0] is updated as shown in H7 (b). When the address becomes [60], the rotation of each element of ADRX [5: 2] becomes the horizontal level. Therefore, the output of the secondary decoder 700LU is that the output of the NAND gate 701 becomes the L level, because of this. The output of the HAND 閛 pole 702 becomes the * level * because of this AND n. I 丨 "'I— III -..... . I- n-........ I _ 'U3--β <-(Please read the notes on the back before filling out this page) This paper size applies to China National Standard (CNS) Α4 specification (210X297 22 38 362 Central Standards Bureau®, Ministry of Economic Affairs®: Printed by the Industrial and Consumer Cooperatives A7 B7 V. Description of the Invention (23) ', the output REAEN2 of the gate 703 becomes the level as shown in circle 7 (c). Therefore, the read-write circuit group of the above two, 7 00 LU, starts reading from 32 memory cells of N0.0 ~ N0.31 at the same time. The read operation is longer than 1 sampling period (the address is updated by only 1) Period), in this case it takes about 3 sampling periods, which ends before the address returns to [0]. Here, during the period when the NAND gate 701 is at the level, the address continues from [60] to [ 63], when the address returns to [0], the rotation becomes L level. But In the period from [0] to [31], ADRX [5] always becomes the L level, so the key output of HAND gate 702 becomes the Η level, and the output REEN2 of the sub decoder 7 00LU is as shown in Figure 7. (c) Continue to maintain the nibble level. When the address ADRX [5: 0] is changed from [0] to [31], the nibble bits are sequentially selected by the block selector BS of the blocks N0.0 to N0.31. Therefore, the output buffer 25 (refer to FIG. 1) of the transfer circuit is opened in the corresponding transcription circuit R / W, and the contents of the data register 20 are sequentially rotated. On the other hand, in the secondary decoder 700LL, when the address ADRX [5: 0] becomes [28], since the output of each bit of ADRX [4: 2] in the reverse rotation of address ADRX [5] becomes the level, HAND gate 701 The output becomes the level. Because of this, the output of the NAHD gate 702 becomes the level, because the output REAN2 of the AHD gate 703 becomes the level shown in Figure 7 (d). Because of this, the reading on the lower side The write circuit group 300LLM 32 memory cells started to praise at the same time. Moreover, the rotation of the NAND gate 701 is maintained until the address reaches [31], and the level is maintained at L, but it becomes the L level when it reaches [32]. ADR from address [32] to [63] The reversing wheel of X [5] always becomes the L level. During this period, the output REAEH2 of the lower read-write circuit group 300LL is as shown in Figure 7 (d) nnnnmnm----II 1 I [* ^ τ * (Please read the precautions on the back before filling out this page) The paper size applies to the Chinese National Standard (CNS) A4 specification (210X297 mm) 23 38 36 2 A7 __B7 _'_ V. Description of the invention (24) :, ; /.- as shown, following Myanmar to maintain the level of Η. In addition, the period during which the address is changed from [32] to [63] is that, since the block selectors BS of the blocks Η0.32 to Η0.63 are sequentially rotated out of the Η level, the corresponding read / write circuits R / W activates the key generator 25 (refer to FIG. 1), which is a transfer circuit, and sequentially outputs the contents of the asset register 20. As described above, the aforementioned sub-decoders 700LU and 700LL are part of a control circuit that is controlled by forming together with the control circuit 800 and other data on the upper and lower sides of the memory rank 6L. The sub-decoder 700L is, The transfer circuit group formed by the round-out buffer provided in the transfer circuit group 300LU constitutes the transfer memory group 6L of the transfer memory group formed by the round-out element punch provided in the transfer-write circuit group 300LU. During the period of data on the upper side, the detection circuit of the fixed data register (box Η0.28) in the read-write circuit group 300LU on the upper side has been designated. In addition, the secondary decoder 700LU is a transfer circuit formed by an output buffer provided in the transfer read-write circuit group 300LL by a transfer circuit group formed by an output element punch provided in the transcription circuit group 300LL. Group transfer memory, during the period of the data on the lower side of the single row 6L, has been specified in the written circuit group 300LL on the lower side (please read the precautions on the back before filling this page). * 11 Central Standards of the Ministry of Economic Affairs贝 ϊ / ο 6 read and output UL test of block road electrical testing and inspection 7 of the code reading and writing of the code, which is used as a tool to temporarily store the materials in the storage. The letter can be printed according to the reference. / IV The ECA (L 6 column on the side of the line is remembered to the beginning of the rise as a response to the 2 NEAER letter can be output \ — / \ 7 d / V 7 Figure according to the reference / IV reading side test 6 check the line L body OL memory 70 register at the start of the code pair solution from the first time to the sample from the period before the sample 4 The materials of the current round must be started by this Such as 3 8 362 This paper size applies Chinese National Standards (CNS) A4 specifications (210X297 mm) A7 B7 V. Description of the invention (25):,; In the readout mode, there is a row and a row of memories on the right side of the memory. According to the gap, it is said to be empty, so it is used to say. If there is no but in, say that the three rows of the row memory are remembered by Zuo Ming. The same phase and phase L all 9 \ J finished the line is also made (please read the precautions on the back before filling out this page) Binding. Order 丨 4 The paper printed by the Central Standards Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperatives, is printed on paper that applies Chinese national standards (CNS ) A4 size (210X297 mm) 25 3 836 2
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JP22438595A JPH0973799A (en) | 1995-08-31 | 1995-08-31 | Analog signal recording device |
JP22438495A JPH0969296A (en) | 1995-08-31 | 1995-08-31 | Non-volatile multi-value memory device |
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