TW388069B - Titanium target for use in sputtering and manufacture thereof - Google Patents

Titanium target for use in sputtering and manufacture thereof Download PDF

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Publication number
TW388069B
TW388069B TW85102980A TW85102980A TW388069B TW 388069 B TW388069 B TW 388069B TW 85102980 A TW85102980 A TW 85102980A TW 85102980 A TW85102980 A TW 85102980A TW 388069 B TW388069 B TW 388069B
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Taiwan
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sputtering
processing
titanium target
target
titanium
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TW85102980A
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Chinese (zh)
Inventor
Takashi Ohnishi
Setsuo Okamoto
Yasunori Yoshimura
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Sumitomo Sitix Corp
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Priority claimed from JP8032829A external-priority patent/JP2984783B2/en
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Publication of TW388069B publication Critical patent/TW388069B/en

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Abstract

The pesent invention is to provide a titanium target for use in sputtering which has a high efficiency in forming film inside the contact hole. The crystal on the target surface is so oriented that the X line diffraction strength of (10-10) and/or (11/20) vertical to the densest loading surfacee becomes 1.1 times of the random orientation, and the X line diffraction strength of (0002) parallel to the densest loading surface becomes less than one time. The direction of sputering particles jetted out of the target surface is controled to be vertical to said target surface.

Description

經濟部中央揉率局負工消费合作社印裝 A7 B7___五、發明説明(,) 【産業上之利用領域] 本發明俱η於在LSI和ULSI等半導龌元件之教进中, 用以形成作為配線材料等薄膜之議射用钛靶及其製法。 [習知之技術] 近年來由於LSI之密集度急速增大,所以使用在LSI 或ULSI之《極材料,逐渐換成以低霣粗离典度•离鏹黏 金羼材料代替習知技術所使用之聚矽,藉以解決因霣極 配鎳之鏞線化所迪成之信號延遵問思。LSI和ULSI所使 用之离鎳度·离融鼬材料為《、鎢或逭些矽化物,其中 以具有優良之比強度(重董:強度)、加工性和劂触性之 鈦被雄為最佳》 在利用鈦形成半導讎用霣極時,通常使用黷射法。然 而,該級射法所使用之高純度钛範通常以下述方式製迪 〇 利用EB(霣子束射)溶解等真空溶解法使藉由碘化物熱 分解法或霣解法等所精製之离銪度鈦材料溶解,再經由 鑄迪,緞迪,壓延,熱處理等處理,形成板狀靶•最近 ,轚利用礦化物分解法真接裂迪鈦之析出法曾經有遇 研究,但被資用者乃是上述之溶》法。 然而,使用此種鈦《之饑射法,據説因«Β之结晶粒之 结暴方位而其》射效率有所不同,才會産生«射膜厚之 不均一。因此,一般是使鈦《之结晶粒徽軀化,藉以使 其结曩方位平均化。乃用溶製法進行壓延及熱處理· 但是,随着最近之更髙密集化,其配鎳宽度變成非常 (請先聞讀背面之注$項再填寫本頁) 0' 裝· 訂 本紙張尺度適用中國Η家揉準(CNS ) A4规格(210X297公釐) A7 B7 經濟部中央標隼局員工消費合作社印裝 五、發明説明(>) 狹窄,所以在結晶方位被平均化之鈦靼中,如圖1(4)所 示,來自該«之濺射粒子並無方向性,因而朝向被稱為 接觸孔洞之溝的濺射,》以成膜即變成非常困難。 其對策之一如圖1(B)所示,採用在基板和靶之間®®V . 平行光管之方法。但是,在此種方法中,來自該範之朦 射粒子有很多會附箸在平行光管,因而,到逹基板之18 射粒子數會大幅度的減少,所以有濺射效率顯箸降低的 問題。於是,最近被考案者有如圏1(c)所示之將來自該 靼之濺射粒子方向加以排齊之技術,則在日本專利案特 開平5 - 2 1 4 5 2 1號公報中所掲示之一種结晶構造之钦班, 係由濺射粒子容易飛散到結晶之最密充瑱方向之觀&’ 考案了以和其最密充填面平行之(〇〇〇2)為中心之優先方 位。 [發明欲解決之問題] 圖2表示鈦在室溫時之結晶構造。作為對於最密充该 面之平行面為(〇 〇 〇 2 > ,對於最密充镇面之垂直面為(1 0-10)和(11-20)等。在日本專利案待閭平5-214521號公報 所掲示之钛靶中,可認為僳结晶被強力定向在(〇〇〇2)* 由於採用一般之溶製法所製造之鈦靶亦以比較低溫予以 加工,所以具有同樣的定向性》 但是,習知之使结晶粒徑撖细化之溶製《經由本發明 人等調査後發現,比起未控制結晶粒徑其濺射粒子之飛 行方向較齊雖為事實,但在朝向被稱為接成孔洞之溝濺 射時,其成膜效率卻較諸未被壓延者為低。這是因為濺 (請先閱讀背面之注意事項再填寫本頁) -装· -β ,ίψ 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) 經濟部中央樣準局貝工消費合作社印製 A7 _B7__ 五、發明説明()) 射粒子之飛敗方向不被控制為對於《表面成垂直方向所 致。 亦即,在朝向被稱為接觸孔洞之溝的濺射時,必須控 制«射粒子之飛散方向為對於欲使成膜之基體成垂直, 因而在該靼上,要求著鼴控制其濺射粒子之飛散方向對 於靶表面成垂直,但在習知一般受過B延之溶製《中, 其8射粒子之飛出方向不被控制為此一被要求之方向, 因被控制為舆所要求之不同方向,所以到達接觸孔洞底 面之«射粒子數會顯蓍地減少。 , 本發明之目的在於提供濺射用之鈦《及其裂法,其傈 將自靶表面飛出之醆射粒子方向控制為對於其«表面成 垂直β [解決問題之手段】 為達成上述之目的,本發明人等調査靶表面之结晶方 位和從其表面飛出之》射粒子方向之两傜》其结果發現 ,對於最密充缜面平行之》射粒子較易飛败,靶表面之 结晶構造若被強力定向為輿最密充瑱面垂直之(10-10) 和(11-20)者,》射粒子之飛散效率邸變离,而且飛敗 方向被控制為對於靶表面成垂直》 本發明之鈦靶你以對於利用覦射成膜之基板形成靶面 之结晶構造,對於最密充《面成垂直之(1 〇 - 1 〇 )及/或 (11-20)之X線繞射強度為随機定向時之1.1倍以上, 最好是對最密充嫫面平行之(〇〇〇2>之X線繞射強度為》 機定向時之1倍以下者。 本紙張尺度適用中國國家揉準(CNS ) Α4規格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 装. 訂 A7 B7 經濟部中央橾準局員工消费合作杜印製 五、發明説明 ( ) • 1 在 本 發 明 之 鈦 靶 中 9 其 结 晶 之 定 向 性 僳 依 (10- 10) X 1 (1 1- 20) 和 ( 0 0 0 2 )之 各 X 線 繞 射 強 度 加 以 規 定 〇 在 此 以 I Μ 檐 定 向 時 為 1 之 比 率 (以下稱為繞射強度比) 表 示 各 X 請 1 1 線 纗 射 強 度 播 機 定 向 之 情 況 葆 指 以 X 線 繞 射 儀 在 所 使 先 1 1 用 之 試 料 保 持 器 内 充 填 m 细 結 晶 粉 末 而 拥 定 之 情 況 諝 之 背 1 1 之 1 • 注 拿 1 I 灞 射 粒 子 如 _ 3 所 示 > 典 最 密 充 缜 面 垂 直 之 (1 0- 10 ) 1 項, 再Γ 1 1 和 (1 1- 20) 為 祀 表 面 之 情 況 時 t 對 於 靶 表 面 之 垂 直 方 向 § 寫 装 1 I 較 易 飛 散 欲 將 m 射 粒 子 之 飛 敗 方 向 控 制 為 對 於 靼 面 成 本 頁 垂 直 者 則 (1 0- 1 0 ) 和 (11- 20) 之 至 少 一 方 之 m 射 強 度 bb 1 1 須 為 1 . 1 倍 以 上 * 最 好 更 使 (0002) 之 繞 射 強 度 比 為 未 m 1 1 1 而 将 對 於 最 密 充 埔 面 垂 直 之 面 強 力 定 向 為 要 〇 1 訂 前 者 之 最 佳 繞 射 強 度 比 為 2 . 0 以 上 〇 後 者 之 最 佳 m 射 1 強 度 比 為 0 . 5 以 下 此 外 f 最 好 輿 其 (1 0- 10)和( 11 -20) - 1 1 之 任 一 方 不 如 兩 方 之 繞 射 強 度 比 俱 為 1 . 1 以 上 9 尤 其 是 1 I 兩 方 俱 為 2 . 0 以 上 者 最 為 理 想 〇 : 1 | 習 知 一 般 受 過 S 延 之 溶 製 m 邸 未 能 滿 足 此 一 條 件 〇 要 X 1 供 足 此 — 條 件 者 « 霈 要 講 究 變 化 材 料 之 切 出 方 向 参 或 使 1 1 壓 延 霣 度 比 習 知 為 离 » 或 使 B 延 軋 率 變 大 等 對 策 〇 1 【發明之實施形皤I 1 下 面 以 本 發 明 之 實 施 形 態 擬 說 明 其 製 造 方 法 0 1 本 發 明 之 第 1 鈦 靶 裂 造 方 法 你 於 最 終 加 X 以 變 態 點 以 1 1 下 之 瀣 度 強 力 加 工 • 其 加 工 度 為 50X 以 上 » 又 為 使 沿 着 1 I 加 工 方 向 之 面 能 成 為 靶 面 般 -β 採 取 鈦 靼 9 主 要 僳 在 採 取 上 1 1 1 1 1 1 本纸張尺度逍用中國國家揉準(CNS ) A4規格(210X297公釐) A7 B7 五、發明説明(f ) 做為講究》 在習知之溶製鈦《之製迪中•其最终加工是以變筋點 以下之粗度進行加工·例如,鍛造畤所採取的《是使其 輿鍛造方向垂直之面•亦即,將緞造材料之表面作為靶 面。但是,在以變態黏以下之组度進行加工時,(0002) 即被定向在加工方向,因此•習知之溶裂《乃是使(0002) 被定向在筘面者。 相對地,在本發明之第1鈦«之製造方法中,首先以 變態»以下之粗度強力加工。因而,如蘭4(A)所示,將 (0002)強力定向為對於加工方向之垂直面》然後,使其 沿箸加工方向之面(最好是與加工方向平行之面)能成為 «面般採取鈦所以,可獲得在《面上其(1卜1Q)及 /或(11-20)提升之鈦《。以變筋點以下之粗度進行加 工時,將( 0 0 0 2 )定向在加工方向之理由如下。 鈦在變態點以下之《領域為最密六方晶構迪(h.c.p) ,其可塑性變形檐構有»動變形和雙晶變形二植❶通常 ,對於金羼材料之可塑性變形而言,滑動變形之貢獻比 雙晶變形有壓倒性的大,鈍鈦時其可塑性變形之大部份 亦由»動變形負擔。鈦之變形以(1〇-1〇)<11_2〇>之柱面 »動為主朦,因為#動方向為<11-20〉而位於底面内, 所以C _方向之變形未能由此一潸動条统之活動獲得· 從而,舆C轎垂直之(0002)面之定向在加工方向(施加 力量之方向)會變成強有力。 在本發明之第1鈦靶之製法中,其加工粗度越低越好 本紙張尺度逍用中國國家揉準(CNS ) A4规格(210X297公釐) 請先閲讀背面之注意ί項再填寫本頁 .i. 訂 經濟部中央橾準局員工消费合作社印製 經濟部中央揉率局属工消费合作社印装 A7 B7 五、發明説明U ) ,具醱上鼉好為600 eC以下,室溫EP可》得最大效果。 就加工度而言,為能提高定向起見,越大越好,待別是 70X以上最好,以採取钛靶而言,加工法最好是採用緞 造或初軋壓延,藉以確保加工後亦仍於加工方向具有較 大厚度β 本發明第2钛《之製造方法•即以最终加工在變態黏 以上之領域,進行加工度為50Χ以上之強力加工,所 採取之靶乃以和加工方向交叉之面作為靶面。 此種方法乃是向來就以高租進行最終加工。此時,如 國4(B)所示,(0002)被随機定向,其结果有一部份之 (10-10)及/或(11-20)被定向在加工方向。從而,由 於將舆加工方向交叉之面(最好為與加工方向垂直之面) 作為《面,自可提高靶面上之U0-10)及/或(1卜20) 之定向度。若以變態點以上之离溫進行加工時(〇〇〇2)被 «機定向之理由如下。 由於變態點以上之彡領域為鑊心立方晶構造(b.c.c.) ,在办領域加工時使其结晶定向在體心立方晶構进之1 方向·但是,因為該材料结會以某種形狀被冷卻,所以 ,在之變態黠上,從釀心立方晶構造(b.c.c.)向 最密六方晶構造(h.c.p.)顒從夾胼(Burgers)HI偽而變 態。此時,因6值(101) b變態成( 0 0 0 1 )h ,所以( 0 0 0 2 ) 即被》機的定向。 本發明之第2钛靶製造方法之加工上,由於若以極度 .离粗進行者會有剌烈的《化,所以,1000*0以下之狙度 _ 8 - 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 装· 經濟部中央揉準局属工消費合作社印製 Α7 Β7 五、發明説明(7) 為宜。加工度即為了《機化而越大越好β持別是70X以 上為最佳。 本發明之第3鈦靶之製造方法,即以最终加工邊通通 變態酤而進行加工度為50Χ以上之強力加工,使 得舆加工方向交叉之面能成為《面般採取鈦靼。 此種方法之待撖在於當通過♦«變態點時進行加工 。此時,如画4(C)所示,(10-10)及/或(11-20)被強 力定向在加工方向》從而,箱使得輿加工方向交叉之面 (最好舆加工方向之垂直面 >能成為靶面般採取钛靼,即 可獲得(10-10)及/或(11-20)對於淝面被強力定向之 鈦》β進行疸種加工時,在加工方向該(10-10)及/或 (11-20)被強力定向之理由如下; 與第2方法之情況同樣,在變態黏以上之/6領域進行 加工者,其结晶即被定向在體心立方晶構造之1方向, 如果加工中産生彡-變態時,據説6 fe(101)b内只有 1值(10 1 )b才會變態成(0 00 1) he此時之優先方位因為 ( 0 0 0 2 )被定向為對於加工方向垂直,所以輿(0002)之垂 直之(10-10)及(11-20)乃被定向在加工方向。 本發明之第3鈦靶製迪方法之加工上.為要提离定向 性,其加工終了溫度越低越好,具豔上最好僳以70(TC 以下完成加工。又為了防止《化,加工两始溫度最好為 1000·〇以下。躭加工度而言,為了提高定向性,故越大 越好,最好為70Χ以下。 本發明之任何一種钛靼裂造方法,都使用交叉壓延加 本紙張尺度適用中國國家揉準(CNS ) Α4洗格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 訂 經濟部中央揉率扃貝工消费合作社印装 A7 B7 五、發明説明(S ) 工,《能使濺射時之膜厚分布均一化。其结果,到達接 觸孔润底面之粒子數也會增多。 交叉壓延乃是指使其材料移動至®延方向之交叉方向 (最好為各«移45·之8值方向)而進行壓延之技術諝之 β假如其他之壓延條件相同者,在一方向被壓延遇之材 料的X線繞射強度和交叉壓延過之材料的X線撓射強度 會大致相同》但是,若以毎值结晶來看時,以一方向所 Κ延之材料之毎值结晶會受到Κ延方向左右而朝向一定 之方向。其结果,使用為濺射用«時,粒子之飛散方向 遇於整齊,因而,其膜厚變成不均一 •藉由交叉壓延使 鏹別结晶之方向«檐,邸可缓和®延方向之影響,並可 謀求膜厚的均一化。 在本發明之任何一種鈦《製造方法中,最终加工後為 使結晶粒微细化而進行熱處理,對於提离«射粒子之方 向控制非常有效。具醴上最好其粒徑為500#·以下,1〇〇 以下更好,要是50#·以下邸特別好》 [實施例] 下面擬說明本發明之實施例,《與比較例之對照,顧 示本發明之效果》 當使用市販之离純度鈦》迪材料製作濺射用靶時,為 控制靶之结晶定向性而採用了表1之加工條件·表2表 示所製作之鈦«表面上之结晶定向性•所表示之定向性 供以X線鐃射法拥定各方位之X線鐃射強度,並以鈦粉 之各方位之X線纗射強度為1的比率表示者。 -10- 本纸張尺度逋用中國國家標準(CNS ) A4規格(210X297公釐) --------^------装-- (請先閲讀背面之注$項^^寫本瓦) 訂Printed by the Central Government Bureau of the Ministry of Economic Affairs and Consumer Cooperatives A7 B7___ V. Invention Description (,) [Industrial Use Field] The present invention is used in the teaching of semiconductor devices such as LSI and ULSI for the purpose of A titanium target for radiation, which is a thin film such as a wiring material, and a method for manufacturing the same. [Knowledgeable technology] In recent years, due to the rapid increase in the density of LSIs, the "polar materials" used in LSI or ULSI have gradually been replaced with low-roughness coarse-grained materials. The polysilicon is used to solve the signal delay caused by the linearization of the nickel and nickel. The materials used in LSI and ULSI are nickel, ion and ferrite materials such as "tungsten" or "tungsten" or "silicon". Among them, titanium, which has excellent specific strength (heavy director: strength), processability, and contact resistance, is the best. When using titanium to form a semiconducting dysprosium electrode, the epitaxial method is usually used. However, the high-purity titanium used in this stage shot method is usually produced in the following manner. The vacuum-dissolved method such as EB (radion beam emission) dissolution is used to dissociate the refined by iodide thermal decomposition method or decomposition method. The titanium material is dissolved, and then processed by casting, satin, calendering, heat treatment, etc. to form a plate-shaped target. Recently, 轚 has used the mineralization method to really crack the titanium titanium precipitation method. However, it has been studied by funders. It is the above-mentioned "dissolving" method. However, the use of this titanium "Hunger Shooting Method" is said to produce "uneven film thickness variations" due to the different shooting efficiencies of «B's crystal grains". Therefore, the crystal grains of titanium are generally made into the body, so that the orientation of the scabs is averaged. The calendering and heat treatment are performed by the melting method. However, with the recent increase in density, the width of nickel with it has become very large (please read the note on the back before filling in this page). China National Standards (CNS) A4 (210X297 mm) A7 B7 Printed by the Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs of the People's Republic of China 5. Inventory (>) is narrow, so in the titanium alloy whose crystal orientation is averaged As shown in Fig. 1 (4), the sputtered particles from this «have no directivity, and therefore the sputtering toward the trench called a contact hole» becomes very difficult to form a film. One of the countermeasures is shown in Figure 1 (B), which uses a ® V. collimator between the substrate and the target. However, in this method, many haze particles from this range will be attached to the collimator. Therefore, the number of 18 particles to the hafnium substrate will be greatly reduced, so there is a problem that the sputtering efficiency is significantly reduced. . Therefore, the examinee recently has the technique of aligning the direction of the sputtered particles from the as shown in 圏 1 (c), which is shown in Japanese Patent Application Laid-Open No. 5-2 1 4 5 2 1 A kind of crystalline structure is based on the view that the sputtered particles are easy to scatter to the most dense filling direction of the crystal & 'The case is considered to be a preferential orientation centered on (002) that is parallel to its closest filling surface. . [Problems to be Solved by the Invention] FIG. 2 shows the crystal structure of titanium at room temperature. As the parallel plane for the densest filling surface is (002) > and the vertical plane for the densest filling surface is (10-10) and (11-20), etc. In the Japanese patent case to be leveled Among the titanium targets disclosed in 5-214521, it is believed that the ytterbium crystals are strongly oriented at (0022) * Since titanium targets manufactured by general dissolution methods are also processed at relatively low temperatures, they have the same orientation However, the conventional method of making the crystal grain size thinner "After investigation by the present inventors, it is found that compared with the uncontrolled crystal grain size, the flying direction of the sputtered particles is more uniform, but it is When it is called ditch sputtering with holes, its film formation efficiency is lower than those without rolling. This is because of sputtering (please read the precautions on the back before filling this page) Paper size applies Chinese National Standard (CNS) A4 (210X297 mm) Printed by the Central Bureau of Standards, Ministry of Economic Affairs, Shellfish Consumer Cooperative, A7 _B7__ V. Description of the invention ()) The direction of the jet ’s flying failure is not controlled for Caused by the vertical direction. That is, when sputtering toward a trench called a contact hole, it is necessary to control the scattering direction of the ejection particles so as to be perpendicular to the substrate to be formed. Therefore, it is required to control the sputtered particles on the beam. The scattering direction is perpendicular to the surface of the target, but in the conventional "B" extension, the flying direction of its 8-shot particles is not controlled as this required direction, because it is controlled as required by the public. Different directions, so the number of shot particles reaching the bottom of the contact hole will decrease significantly. The object of the present invention is to provide titanium for sputtering and its cracking method, which controls the direction of the ejection particles flying out of the target surface to be perpendicular to the surface of the target [Method for solving the problem] For the purpose, the inventors investigated the crystalline orientation of the target surface and the "two shots of the direction of the shooting particle" flying out from the surface, and found that the shot particles that are parallel to the most densely filled plane are more likely to fly away, If the crystal structure is strongly oriented as (10-10) and (11-20) perpendicular to the closest filling plane, the scattering efficiency of the projectile particles will deviate, and the direction of the flying failure will be controlled to be perpendicular to the target surface. 》 For the titanium target of the present invention, you use the crystal structure of the target surface formed by the substrate formed by the epitaxial film, and the X-rays of the most densely filled "surfaces that are vertical (1 0-1 0) and / or (11-20) Diffraction intensity is 1.1 times or more when randomly oriented, it is best to have X-ray diffraction intensity parallel to the closest filling plane (200 × 2) or less than 1 time when machine oriented. Applicable to China National Standard (CNS) Α4 (210X297mm) (Please read the back first Note: Please fill in this page again.) Pack. Order A7 B7 Printed by the Central Consumers' Bureau of the Ministry of Economic Affairs of the People's Republic of China. 5. Description of the invention () • 1 In the titanium target of the present invention 9 its crystal orientation conversion (10- 10) The X-ray diffraction intensity of each of X 1 (1 1-20) and (0 0 0 2) is specified. Here, the ratio of 1 when the eaves are oriented at 1 μM (hereinafter referred to as the diffraction intensity ratio) indicates each X Please direct the 1 1 line radio intensity of the driller's orientation. This refers to the situation where the X-ray diffractometer is used to fill the sample holder used by the 1 1 with m fine crystal powder. The back is 1 1 1 • Note that the 1 I projectile particles are shown as _ 3 > When the most dense filling surface is perpendicular to the (1 0-10) 1 term, and Γ 1 1 and (1 1-20) are the target surface, t The vertical direction of the target surface § Write 1 I It is easier to fly away. I want to control the direction of the failure of the m-ray particles. If the front face of the cost page is vertical, the m-ray intensity bb 1 1 of at least one of (1 0- 1 0) and (11-20) must be 1.1 times or more * It is better to make the diffraction intensity ratio of (0002) more For m 1 1 1, the strongest direction of the plane perpendicular to the closest filling surface is to be 0. The optimal diffraction intensity ratio of the former is 2.0 or more. The optimal intensity ratio of the latter 1 is 0. 5 and the following f is better if one of (1 0-10) and (11 -20)-1 1 is inferior to the diffraction intensity ratio of both parties to be 1.1 to 9 and especially 1 to both parties. 0 is the most ideal. 0: 1 | The general knowledge has been subjected to the solution of S Yan. The house fails to meet this condition. 0 X 1 is sufficient to meet this condition. Those who are qualified 霈 霈 pay attention to the direction of the change of the material. 1 1 Measures to reduce the rolling ratio than conventionally known »or to increase the rolling ratio of B, etc. 〇 [Implementation Mode of the Invention I 1 The manufacturing method of the present invention is described below according to the embodiment of the present invention. 0 1 The first titanium target cracking method of the present invention. You add X to the final transformation point to make a strong processing at a degree below 1 1 • The processing degree is 50X or more » In order to make the surface along the 1 I processing direction become a target surface-β adopts titanium 靼 9 mainly 僳 adopts 1 1 1 1 1 1 This paper is used in China National Standard (CNS) A4 size (210X297 (Mm) A7 B7 V. Description of the invention (f) as the "refined" In the conventional molten titanium "Zhi Di" • its final processing is processed to a thickness of less than the point of the ribs. For example, the "It is the surface that makes its forging direction vertical. That is, the surface of the satin material is used as the target surface. However, when processing with the following set of abnormal viscosity, (0002) is oriented in the processing direction. Therefore, the "knowledge of dissolution" is to make (0002) oriented to the face. On the other hand, in the method for producing the first titanium «of the present invention, first, the rough machining is carried out with a roughness equal to or less than that of the metamorphosis». Therefore, as shown in Blue 4 (A), (0002) is strongly oriented as a vertical plane with respect to the processing direction. Then, the surface along the processing direction (preferably the surface parallel to the processing direction) can be made into a «plane. By taking titanium, you can get "Titanium which is lifted on the surface (1 卜 1Q) and / or (11-20)". The reason for orienting (0 0 0 2) in the machining direction when processing with a thickness below the stiffening point is as follows. The field of titanium below the metamorphic point is the densest hexagonal crystal structure (hcp), and its plastic deformation eaves structure has two types: dynamic deformation and double crystal deformation. Generally, for the plastic deformation of the metal, the sliding deformation is The contribution is more overwhelming than the deformation of the twin crystals. A large part of the plastic deformation of blunt titanium is also borne by the »dynamic deformation. The deformation of titanium is dominated by the cylindrical surface of (1〇-1〇) < 11_2〇 > because the #moving direction is < 11-20 > and is located in the bottom surface, so the deformation in the C_ direction cannot be achieved. As a result of the systematic activities, the orientation of the vertical (0002) plane of the C-car is strong in the machining direction (the direction in which the force is applied). In the first titanium target manufacturing method of the present invention, the lower the processing thickness, the better. The paper size is in accordance with China National Standard (CNS) A4 (210X297 mm). Please read the note on the back and fill out this Page.i. Order printed by the Consumer Cooperatives of the Central Economic and Technical Bureau of the Ministry of Economic Affairs. Printed by the Central Government Bureau of the Ministry of Economic Affairs. Printed on the Industrial and Consumer Cooperatives. A7 B7. 5. Description of the invention. Can "for maximum effect. In terms of processability, in order to improve the orientation, the larger the better, it is better to be above 70X. For the titanium target, the processing method is best to use satin fabric or preliminary rolling to ensure that It still has a large thickness in the processing direction β. The manufacturing method of the second titanium of the present invention is to use the final processing in the area above the metamorphic viscosity to perform a strong processing with a processing degree of 50 × or more. The surface is used as the target surface. This method has always been the final processing at high rents. At this time, as shown in country 4 (B), (0002) is randomly oriented, and part of the result (10-10) and / or (11-20) is oriented in the processing direction. Therefore, since the plane that intersects the machining direction (preferably the plane perpendicular to the machining direction) is used as the "plane, the orientation of U0-10 on target surface and / or (1-20) can be improved. If processing is performed at a temperature above the abnormal point (2002), the reason for being oriented by the machine is as follows. Since the field above the abnormal point is a center-centered cubic crystal structure (bcc), the crystal is oriented in the direction of the body-centered cubic crystal structure during processing in the field. However, because the material junction is cooled in a certain shape Therefore, in its metamorphosis, from the core-cube structure (bcc) to the densest hexagonal structure (hcp), it is pseudo-perverted from the Burgers HI. At this time, the 6 value (101) b is transformed into (0 0 0 1) h, so (0 0 0 2) is oriented by the machine. In the processing of the second titanium target manufacturing method of the present invention, if it is carried out with extreme extremes, it will be severely changed, so the degree below 1000 * 0 _ 8-This paper size applies Chinese national standards ( CNS) A4 size (210X297 mm) (Please read the precautions on the back before filling out this page) Equipment · Printed by the Central Government Bureau of the Ministry of Economic Affairs and printed by the Industrial and Consumer Cooperatives Α7 Β7 5. The invention description (7) is appropriate. The degree of processing is "the larger the better for mechanization, the better the beta is 70X or more." In the third titanium target manufacturing method of the present invention, the final processing is performed with abnormal deformation and the powerful processing with a processing degree of 50 × or more is performed, so that the surface where the processing directions intersect can be made of titanium. What this method has to do is to process it when it passes the abnormal point. At this time, as shown in Figure 4 (C), (10-10) and / or (11-20) are strongly oriented in the processing direction. Therefore, the box makes the surface where the processing direction intersects (preferably the processing direction is perpendicular) Surface > Titanium rhenium can be used as a target surface, and (10-10) and / or (11-20) can be obtained for titanium with the 淝 face strongly oriented. The reason for -10) and / or (11-20) being strongly oriented is as follows; as in the case of the second method, when processing in the / 6 area above the metamorphic viscosity, the crystal is oriented in the body-centered cubic structure. In the 1 direction, if 彡 -metamorphism occurs during processing, it is said that only 1 value (10 1) b in 6 fe (101) b will be transformed into (0 00 1). The priority position at this time is (0 0 0 2 ) Is oriented perpendicular to the processing direction, so the vertical (10-10) and (11-20) of (0002) are oriented in the processing direction. The third titanium target manufacturing method of the present invention is processed. To improve the orientation, the lower the temperature at the end of the process, the better. It is best to finish the process at 70 ° C or lower. In order to prevent the "chemical, the temperature at the beginning of the process is preferably 1000. In terms of processability, in order to improve the directivity, the larger the better, the best is 70 × or less. Any of the titanium hafnium cracking methods of the present invention uses cross-calendering and the paper size is applicable to Chinese national standards (CNS) ) Α4 wash grid (210X297 mm) (Please read the notes on the back before filling in this page) Order the Central Ministry of Economic Affairs 扃 Paperwork Consumer Cooperative Co., Ltd. Printing A7 B7 V. Invention Description (S) Uniform film thickness distribution during shooting. As a result, the number of particles reaching the bottom surface of the contact hole will also increase. Cross rolling refers to moving the material to the cross direction of the ® extension direction (preferably each «moving 45 · 8 of 8" Value direction) and the technology of calendering. If the other calendering conditions are the same, the X-ray diffraction intensity of the material being rolled in one direction and the X-ray flicker intensity of the material cross-rolled will be approximately the same. "But If you look at the 毎 -value crystal, the 毎 -value crystal of a material extended in one direction will be affected by the direction of the KE extension to a certain direction. As a result, when used for sputtering «, the scattering direction of the particles will meet to Neat, so that its film thickness becomes non-uniform. • Cross-rolling makes the direction of the crystals «Eaves, Di can alleviate the effect of the direction of the ® direction, and can achieve uniform film thickness. In any of the titanium of the present invention" In the manufacturing method, heat treatment is performed to refine the crystal grains after the final processing, which is very effective for controlling the direction of the ejected particles. It is preferable that the particle diameter is 500 # or less, and more preferably 100 or less. If 50 # · The following residence is particularly good "[Example] The following is to explain the embodiment of the present invention," comparison with the comparative example, showing the effect of the present invention "When using the commercially available titanium ion purity" Di material for sputtering In the case of targets, the processing conditions in Table 1 were used to control the crystal orientation of the target. Table 2 shows the produced titanium «crystal orientation on the surface. The X-ray projection intensity is expressed by the ratio of the X-ray projection intensity of each position of the titanium powder to 1. -10- This paper size adopts Chinese National Standard (CNS) A4 specification (210X297 mm) -------- ^ ------ install-(Please read the note on the back first ^ ^ Write this tile) Order

X A7 B7 五、發明説明(9 ) 並且,使用所製作之鈦靶進行濺射。在基板之表面設 置宽度1.0#·χ深度2.0#·之接觸孔洞。利用濺射所獲 得之薄鍥之平均膜厚大約為500Α(10Θ釐米)β 表3表示了澍定接觴孔润以外部份之成膜速度和膜厚 分布及接觸孔洞之级距覆蓋範圍之結果》以(平均膜厚 /濺射時間)表示成膜速度,以(最大膜厚一最小膜 厚)/ (平均膜厚Χ2) X100U)表示膜厚分布。另外, 以(孔润底面之平均膜厚/孔润以外之平均膜厚)Χ100 (X)表示接觸孔洞之级距覆蓋範圍》 (請先閱讀背面之注意Ϋ項再填寫本頁) 1Τ 經濟部中央標準局貝工消费合作社印«. -11- 本紙張尺度逍用中國國家橾準(CNS ) Α4規格(210X297公釐) 五、發明説明(—) A7 B7 經濟部中央橾準局貝工消费合作社印裝 〔表1〕 No 靶 材料加 工條件 1 (薄造材)-^ 900 ·〇锻造-♦ 500*0壓延(壓下率:7〇χ) -♦切出(A) 2 (»造材>-*500*0級造(加工率:50ί)->切出(a) 3 (β迪材)—500*(3锻造(加工率:50X)-»切出(B) 4 (»造材)—50(TC級造(加工率:50X) —切出(C) 5 (» 造材)-»90ITC 鍛造-+950-08 延(S 下率:70X) •♦切出(A) 6 (鑄造材)-*90(TC換造->900°0壓延(K下率:70X) —切出(A) 7 (»造材)-900*0鍛造 -♦ 950°CK延(交叉,壓下率:70X) -*切出(A> 8 (β造材>—900*0»造-*95 0*0壓延(壓下率:70X) -♦ 800*C 熟 «理-♦切出(A) 9 (鑄造材)-»900*C緞造-»950*C壓延(壓下率:70X) -* 7 0 0 *C熱處理切出(A ) 10 (鑄造材)-» 900eC緞造-» 950°〇®延(K下率:70幻 -► 60 0*C 热* 理切出(Α> 切出(A) 切出(B) 切出(C> 面 靶 0 0為 面面面 leIB之 為為· 面面45 之之為 直行成 垂平向 向向方 方方工-Η Η 加12 加加於_ 輿與對 成成成 切切切 本纸張尺度適用中國國家標準(CNS ) A4洗格(2丨0X297公釐) ^^1- ^^1 m I Γ— i —--- - - I I (請先閲讀背面之注意事項f寫本頁) 訂 A7 B7 五、發明説明(") 〔表2〕X A7 B7 5. Description of the Invention (9) Furthermore, sputtering was performed using the produced titanium target. A contact hole having a width of 1.0 # · χdepth of 2.0 # · is set on the surface of the substrate. The average film thickness of the thin film obtained by sputtering is about 500 A (10 Θ cm) β. Table 3 shows the film formation speed, film thickness distribution, and step coverage of the contact holes in the parts other than the pores. The results are expressed in terms of (average film thickness / sputtering time) and (maximum film thickness-minimum film thickness) / (average film thickness X2) X100U). In addition, (average film thickness on the bottom of pore-run / average film thickness on the outside of pore-run) X100 (X) represents the step coverage of contact holes "(please read the note on the back before filling this page) 1Τ Ministry of Economy Printed by the Central Bureau of Standards for Shellfish Consumer Cooperatives «. -11- This paper is scaled to the Chinese National Standard (CNS) Α4 size (210X297 mm) 5. Description of the invention (—) A7 B7 Cooperative printing [Table 1] No Target material processing conditions 1 (thin material)-^ 900 · 〇 forging-♦ 500 * 0 rolling (reduction rate: 7〇χ)-♦ cut out (A) 2 (»making Material >-* 500 * 0 grade manufacturing (processing rate: 50ί)-> cut out (a) 3 (β discus) —500 * (3 forging (processing rate: 50X)-»cut out (B) 4 (»Materials) — 50 (TC grade (Processing rate: 50X) — Cut out (C) 5 (» Materials)-»90ITC Forging-+ 950-08 extension (S down rate: 70X) • ♦ Cut out (A) 6 (casting material)-* 90 (TC remodeling-> 900 ° 0 calendering (K down rate: 70X) —cut out (A) 7 (»making material) -900 * 0 forging- ♦ 950 ° CK extension (cross, reduction rate: 70X)-* cut out (A > 8 (βbuilding material > —900 * 0 »made -* 95 0 * 0 rolling (reduction rate: 70X)-♦ 800 * C cooked «cutting-♦ cut out (A) 9 (casting material)-» 900 * C satin made-»950 * C rolling (reduction Rate: 70X)-* 7 0 0 * C heat treatment cut out (A) 10 (casting material)-»900eC satin-made-» 950 ° 〇® extension (K down rate: 70 magic-► 60 0 * C heat * treatment Cut-out (Α > Cut-out (A) Cut-out (B) Cut-out (C > Area target 0 0 is the area surface area leIB is the area area of the surface area 45 is the straight line in the vertical direction to the square -Η Η Plus 12 plus plus _ Yu and the pairing into the cut cut paper standard applicable Chinese National Standard (CNS) A4 wash grid (2 丨 0X297 mm) ^^ 1- ^^ 1 m I Γ— i —-----II (Please read the notes on the back f to write this page) Order A7 B7 V. Description of the invention (Table 2)

No. (100)* (002)* (101)* (102)* (110)* (103)* (112)* (201)* 1 0.7 2.5 0.8 0.6 0.4 1.5 0.7 0.5 2 1.1 1.5 1.1 0.7 0.5 1.0 1.1 0.4 3 1.0 0.6 0.9 0.9 1.2 0.9 0.8 0.7 4 0.9 0.8 1.2 0.8 1.0 0.7 1.0 0.8 5 0.8 0.6 1.4 0.7 2.4 0.6 0.9 0.8 6 2.5 0.5 1.0 0.4 2.0 0.6 0.8 0.7 7 0.9 0.7 1.1 0.7 2.1 0.5 0.8 0.8 8 0.8 0.5 1.2 0.6 2.0 0.6 0.9 0.9 9 0.8 0.6 1.4 0.7 2.2 0.8 0.8 0.7 10 0.7 0.5 1.3 0.7 2.1 0.7 0.8 0.9 (請先閱讀背面之注意事項再填寫本頁) 装. 訂 經濟部中央橾準局貝工消费合作社印製 (*) (100) = (10-10), (002) = (0002) (101) = (10-11), (102) = (10-12) (110) = (11-20), (103) = (10-13) (112) = (11-22), (201) = (20-21) -13- 本紙張尺度適用中國固家揉準(CNS > A4規格(210X297公釐) A7 B7 五、發明説明(—) 經濟部中央搮率局貝工消费合作社印製 〔表3〕 No. 成膜速度 (ηι/s) 膜厚分布 (X) 接腾孔洞之级距 覆綦範園(X) 1 1.5 17 28 2 1.4 18 32 3 1.8 14 45 4 1.7 15 38 5 2.0 12 4 7 6 2.4 10 55 7 2.2 12 57 8 2 . 1 9 5 1 9 2.2 7 62 1 0 2.2 6 6 5 "14- (請先閲讀背面之注意事項再填寫本頁) f *vs 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨0X297公釐) A7 B7__ 五、發明说明(β)No. (100) * (002) * (101) * (102) * (110) * (103) * (112) * (201) * 1 0.7 2.5 0.8 0.6 0.4 1.5 0.7 0.5 2 1.1 1.5 1.1 0.7 0.5 1.0 1.1 0.4 3 1.0 0.6 0.9 0.9 1.2 0.9 0.8 0.7 4 0.9 0.8 1.2 0.8 1.0 0.7 1.0 0.8 5 0.8 0.6 1.4 0.7 2.4 0.6 0.9 0.8 6 2.5 0.5 1.0 0.4 2.0 0.6 0.8 0.7 7 0.9 0.7 1.1 0.7 2.1 0.5 0.8 0.8 8 0.8 0.5 1.2 0.6 2.0 0.6 0.9 0.9 9 0.8 0.6 1.4 0.7 2.2 0.8 0.8 0.7 10 0.7 0.5 1.3 0.7 2.1 0.7 0.8 0.9 (Please read the notes on the back before filling out this page) Printing (*) (100) = (10-10), (002) = (0002) (101) = (10-11), (102) = (10-12) (110) = (11-20) , (103) = (10-13) (112) = (11-22), (201) = (20-21) -13- This paper size applies to China Gujia standard (CNS > A4 size (210X297) (%) A7 B7 V. Description of the invention (—) Printed by the Central Government Bureau of the Ministry of Economic Affairs, printed by the Shellfish Consumer Cooperative [Table 3] No. Film-forming speed (η / s) Film thickness distribution (X) Step distance coverage of the holes Ye Fanyuan (X) 1 1.5 17 28 2 1.4 18 32 3 1.8 14 45 4 1.7 15 38 5 2.0 12 4 7 6 2.4 10 55 7 2.2 12 57 8 2. 1 9 5 1 9 2.2 7 62 1 0 2.2 6 6 5 " 14- (Please read the notes on the back before filling out this page) f * vs This paper size applies Chinese national standards ( CNS) A4 specifications (2 丨 0X297 mm) A7 B7__ 5. Description of the invention (β)

No. 1是利用通常之處理所裂造之溶製祀。亦即,以變 態點以下之500 *C進行壓延,進行通常之切出以與加工 方向垂直之面(K延面)作為»面❶因為*ί面之结晶被強 力的定向在(0002),所以成膜速度,膜厚均一性和接觸 孔洞之级距覆蓋範圍較低》No. 1 is a melting sacrifice made by ordinary processing. That is, rolling is performed at 500 * C below the abnormal point, and normal cutting is performed with the plane (K-extended plane) perpendicular to the processing direction as the »plane❶ because the crystal of * ί plane is strongly oriented at (0002), Therefore, the film formation speed, film thickness uniformity, and the step coverage of the contact holes are low.

Do.2〜4傈以最終加工在變態點以下之進行緞造 •以與加工方向垂直之面作為»面而進行通過常切出之 Ho.2,因為No.l同樣將( 0 0 0 2 )強力的定向在靶面,所以 其成膜速度•膜厚均一性和级距覆蓋範圍都較低。 相對地,Ho.3所進行之切出傈與加工方向平行之面能 成為《面,所以(11-20)比較強力的定向在《面,躭其 (10-10)也見有被定向之趨向,因而,其成膜速度,膜 厚均一性和级钜覆蓋範園均被提高*對加工方向形成45· 傾斜而進行切出之No.4,亦較諸U0.2其成膜速度、膜厚 均一性和级距覆蓋範園均被提高》 經濟部中央橾準局貝工消費合作社印裝 (請先閱讀背面之注意事項再填寫本頁)Do.2 ~ 4 傈 Satin is made with the final processing below the abnormal point. • The surface perpendicular to the processing direction is used as the »surface and Ho.2 is often cut out. Because No.l also (0 0 0 2 ) The strong orientation is on the target surface, so its film formation speed, film thickness uniformity and step coverage are low. In contrast, the surface cut out by Ho.3 parallel to the processing direction can become a "face, so (11-20) is more strongly oriented on the" face, and (10-10) has also been oriented. " Trend, therefore, its film-forming speed, film thickness uniformity, and grade coverage are all increased. No. 4, which cuts out 45 · in the processing direction, is also faster than U0.2 in film-forming speed, Film thickness uniformity and step coverage Fan Yuan have been improved. "Printed by the Shellfish Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs (please read the precautions on the back before filling this page)

No. 5是在變態黏以上之>8領域進行強壓延,再做通常 之切出者。利用通常之切出將(11 — 20)強力的定向靶面 ,«I以顯著地提离了成膜速度、膜厚均—性和级距覆蓋 範圍》No. 5 is a strong rolling in the > 8 area above the metamorphic viscosity, and then the usual cut out. Using the usual cutout to (11-20) a strong directional target surface, «I significantly improved the film formation speed, film thickness uniformity and step coverage >>

No.6是自變態點以上之>5領域之90(TC到變態點以下 之80(TC進行強壓延者β利用通常之切出將(10-10)和 (1 1 - 2 (〇強力的定向在耙面,其成膜速度,膜厚均一性 和级距覆蓋範園乃更加提高》No. 6 is from the point of metamorphosis> 90 in the 5 field (TC to 80 below the point of metamorphosis. TC is used for strong rolling. Β is usually cut out by (10-10) and (1 1-2 (〇 Strong The orientation is on the rake surface, and its film formation speed, film thickness uniformity and step coverage are even more improved.

No.7是在變態黏以上之彡領域進行強壓延後之No.5中 -15- 本纸張尺度逍用中國固家揉率(CNS ) A4规格(210X297公釐) 經濟部中央揉率局員工消费合作社印«. 388069 a7 _B7_ 五、發明説明(4 ) ,使用交叉壓延者。在《面上之定向性雖反而降低,但 是膜厚均一性和级距覆蓋範園即提高了。 Νο·8〜10是在No.5之最终加工後為了结晶粒撤细化而 Y 進行熱處理者。結晶粒徑在No.8為5 0 0卢·, No.9為100 >u·, No. 10為50#·。《著结晶粒徑變小而提高膜厚均 一性和级距覆蓋範困。 另外,在 No.3、5 、6 中,(10-10)和(11-20)雯方 之繞射強度比會成為2.0以上,而且(0002)之繞射強度 比會成為0.5以下的Ho.6之特性尤為良好。 此外,上述實施例雖是溶製《,但是也可逋用於上述 之析出靶。No.7 is No.5 after 15 days of strong rolling in the area of metamorphosis above -15- This paper size is not used in China's solid kneading rate (CNS) A4 size (210X297 mm) Printed by the employee consumer cooperative «. 388069 a7 _B7_ V. Description of the invention (4), using cross-rollers. Although the directivity on the surface is reduced, the uniformity of film thickness and the range coverage range are improved. No. 8 to 10 are those in which Y is heat-treated in order to withdraw and refine the crystal grains after the final processing of No. 5. The crystal grain size was 500 Lu ·, No. 9 was 100 > u ·, and No. 10 was 50 # ·. "The size of the crystal grains is reduced to improve the uniformity of the film thickness and the range coverage. In addition, in Nos. 3, 5, and 6, the diffraction intensity ratio of (10-10) and (11-20) Wenfang will be 2.0 or more, and the diffraction intensity ratio of (0002) will be Ho less than 0.5. The characteristics of .6 are particularly good. In addition, although the above-mentioned embodiments are melted, they can also be used for the above-mentioned precipitation targets.

[發明之效果I 如上所述,本發明之猶射用钛«由於在舆最密充嫫面 垂直之(1 0 - 1 0 )和(1 1 - 2 0>之方位具有被強力定向之表 面结晶構造,所以從»飛出之《射粒子之方向被控制在 與«面垂直之方向,對於狭而深之接觸孔洞亦可以進行 级距覆羞範園良好之成膜。因此,有益於半導釀装置之 高密集化。此外,按本發明之製造方法邸可W易Κ造此 一濺射用之鈦靶。 [附Η之簡單説明] 圏1是模式圓,用來表示對接觸孔洞之成Θ。 圔2是棋式國,用來表示鈦之结晶構造。 圔3是楔式園,用來表示》射粒子之飛败方向· 臞4是棋式臛,用來表示加工條件和定向性之 -1 6 * 本紙張尺度適用中國國家揉準(CNS ) Α4規格(210X297公釐) HI ϋ ϋ —J —J n— 士冬 I — Γ (請先M讀背面之注意事項再填寫本頁) *1T'[Effect of the Invention I As mentioned above, the titanium for still shooting according to the present invention «because of the orientation of (1 0-1 0) and (1 1-2 0 >] perpendicular to the most dense filling surface of the present invention has a strongly oriented surface The crystalline structure, so the direction of the "flying particles" flying out of the »is controlled in the direction perpendicular to the« plane, and it can also perform fine film formation on the step-by-step coverage of narrow and deep contact holes. Therefore, it is beneficial for half The density of the brewing device is high. In addition, the titanium target for sputtering can be easily fabricated according to the manufacturing method of the present invention. [A brief description attached] Η1 is a pattern circle used to indicate contact holes. It becomes Θ. 圔 2 is a chess-type country, which is used to indicate the crystal structure of titanium. 圔 3 is a wedge-shaped garden, which is used to indicate the direction of the flying particles. 飞 4 is a chess-type 臛, which is used to indicate the processing conditions and Orientation-1 6 * This paper size applies to China National Standard (CNS) Α4 size (210X297 mm) HI ϋ ϋ —J —J n— Shidong I — Γ (Please read the notes on the back before filling (This page) * 1T '

Claims (1)

第85102980號「濺射用之鈦靶及其製法」專利案 (88年12月9修正) A申請專利範圍: ^--.--^—— * (請先聞讀背面之注意Ϋ項再填<^頁 1. 一種濺射用之鈦靶,使用於在基板表面形成薄膜之濺 射,其特徵爲,作爲相對向於上述基板表面之靶面之 結晶構造,其與最密充塡面垂直之(10-1〇)及/或 (11-20)之X線繞射強度爲隨機定向時之1.1倍以 上者》 2. 如申請專利範圍第1項之濺射用之鈦靶,其中與最密 充塡面平行之(〇〇〇2)之X線繞射強度爲隨機定向時之 未滿1倍者。 3. —種濺射用之鈦靶之製造方法,用來製造如申請專利 範圍第1或2項之濺射用之鈦靶,其特徵爲,以最 疼n在_變態irm下之ϋ:貧11行加n爲to%以上 之強加工,務使沿著加工方向之面能成爲靶面般採取 鈦靶者。 線- 經濟部智慧財產局員工消費合作社印製 4. 一種濺射用之鈦靶之製造方法,用來製造申請専利範 圍第1或2項之濺射用之鈦粑,其特徵爲,以最終 加工在變態點以上之溫度進行加工度爲50%以上之 強加工,而務使與加工方向交叉之面能成爲靶面般採 取鈦靶者。 5. —種濺射用之鈦靶之製造方法,用來製造申請專利範 圍第1或2項之濺射用之鈦靶,其特徵爲,以最終 加工邊通過yS—a變態點而進行加工度爲50%以上之 本紙張尺度適用中國國家梂準(CNS ) A4规格(210X297公釐)Patent No. 85102980 "Titanium Target for Sputtering and Its Manufacturing Method" (Amended on December 9, 88) A. Application scope of patent: ^ --.-- ^ —— * (Please read the note on the back before reading ≪ ^ page 1. A titanium target for sputtering, which is used for sputtering for forming a thin film on a substrate surface, and is characterized in that as a crystalline structure facing a target surface facing the substrate surface, it is most closely packed with (10-10) and / or (11-20) whose X-ray diffraction intensity is 1.1 times or more when randomly oriented "2. If the titanium target for sputtering in item 1 of the patent application scope, Among them, the diffraction intensity of X-rays parallel to the closest filling surface is (200) less than 1 time when randomly oriented. 3.-A manufacturing method of a titanium target for sputtering, which is used to make The titanium target for sputtering used in the scope of patent application No. 1 or 2 is characterized by the most painful n in the _ metamorphic irm: 11 lean lines plus n strong processing to more than to%, so that along the processing The surface of the direction can become the target surface and adopt the titanium target. Line-Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 4. A manufacturing method of titanium target for sputtering, used to make The application of titanium rhenium for sputtering in the profit range of item 1 or 2 is characterized in that the final processing is performed at a temperature above the abnormal point for a strong processing with a processing degree of 50% or more, and the surface energy that crosses the processing direction can be Take the titanium target as the target surface. 5.-A method for manufacturing a titanium target for sputtering, which is used to manufacture the titanium target for sputtering applied for in the scope of patent application No. 1 or 2, which is characterized by the final processing edge The paper size processed through yS-a abnormal point is more than 50%. The Chinese paper standard (CNS) A4 (210X297 mm) is applicable. 第85102980號「濺射用之鈦靶及其製法」專利案 (88年12月9修正) A申請專利範圍: ^--.--^—— * (請先聞讀背面之注意Ϋ項再填<^頁 1. 一種濺射用之鈦靶,使用於在基板表面形成薄膜之濺 射,其特徵爲,作爲相對向於上述基板表面之靶面之 結晶構造,其與最密充塡面垂直之(10-1〇)及/或 (11-20)之X線繞射強度爲隨機定向時之1.1倍以 上者》 2. 如申請專利範圍第1項之濺射用之鈦靶,其中與最密 充塡面平行之(〇〇〇2)之X線繞射強度爲隨機定向時之 未滿1倍者。 3. —種濺射用之鈦靶之製造方法,用來製造如申請專利 範圍第1或2項之濺射用之鈦靶,其特徵爲,以最 疼n在_變態irm下之ϋ:貧11行加n爲to%以上 之強加工,務使沿著加工方向之面能成爲靶面般採取 鈦靶者。 線- 經濟部智慧財產局員工消費合作社印製 4. 一種濺射用之鈦靶之製造方法,用來製造申請専利範 圍第1或2項之濺射用之鈦粑,其特徵爲,以最終 加工在變態點以上之溫度進行加工度爲50%以上之 強加工,而務使與加工方向交叉之面能成爲靶面般採 取鈦靶者。 5. —種濺射用之鈦靶之製造方法,用來製造申請專利範 圍第1或2項之濺射用之鈦靶,其特徵爲,以最終 加工邊通過yS—a變態點而進行加工度爲50%以上之 本紙張尺度適用中國國家梂準(CNS ) A4规格(210X297公釐)Patent No. 85102980 "Titanium Target for Sputtering and Its Manufacturing Method" (Amended on December 9, 88) A. Application scope of patent: ^ --.-- ^ —— * (Please read the note on the back before reading ≪ ^ page 1. A titanium target for sputtering, which is used for sputtering for forming a thin film on a substrate surface, and is characterized in that as a crystalline structure facing a target surface facing the substrate surface, it is most closely packed with (10-10) and / or (11-20) whose X-ray diffraction intensity is 1.1 times or more when randomly oriented "2. If the titanium target for sputtering in item 1 of the patent application scope, Among them, the diffraction intensity of X-rays parallel to the closest filling surface is (200) less than 1 time when randomly oriented. 3.-A manufacturing method of a titanium target for sputtering, which is used to make The titanium target for sputtering used in the scope of patent application No. 1 or 2 is characterized by the most painful n in the _ metamorphic irm: 11 lean lines plus n strong processing to more than to%, so that along the processing The surface of the direction can become the target surface and adopt the titanium target. Line-Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 4. A manufacturing method of titanium target for sputtering, used to make The application of titanium rhenium for sputtering in the profit range of item 1 or 2 is characterized in that the final processing is performed at a temperature above the abnormal point for a strong processing with a processing degree of 50% or more, and the surface energy that crosses the processing direction can be Take the titanium target as the target surface. 5.-A method for manufacturing a titanium target for sputtering, which is used to manufacture the titanium target for sputtering applied for in the scope of patent application No. 1 or 2, which is characterized by the final processing edge The paper size processed through yS-a abnormal point is more than 50%. The Chinese paper standard (CNS) A4 (210X297 mm) is applicable. 77、申請專利範圍 強加工,使其與加工方向交叉之面能成爲靶面般採取 鈦靶者。 6.如申請專利範圍第3至5項中任一項之製造方法,其 中該強加工爲交叉壓延者。 7 ·如申請專利範圍第3至5項中任一項之製造方法,其 中在最終加工之後爲使結晶粒微細化而施加熱處理 者。 8.如申請專利範圍第6項之製造方法,其中在最終加工 之後爲使結晶粒微細化而施加熱處理者。 ------..-I.--^ —— (請先閲讀背面之注意事項再填頁) 訂 I I 線 經濟部智慧財產局員工消費合作社印製 本紙張尺度逋用中國國家揉率(CNS ) A4規格(210X297公釐)77. Scope of patent application Strong processing, so that the surface that intersects with the processing direction can become a titanium target. 6. The manufacturing method according to any one of claims 3 to 5, wherein the strong processing is a cross-roller. 7. The manufacturing method according to any one of claims 3 to 5, wherein a heat treatment is applied to miniaturize crystal grains after final processing. 8. The manufacturing method according to item 6 of the patent application, wherein a heat treatment is applied to miniaturize the crystal grains after the final processing. ------..- I .-- ^ —— (Please read the precautions on the back before filling in the page) Order II Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs Employee Consumer Cooperatives Paper size of this paper Use the national rubbing rate of China (CNS) A4 specification (210X297 mm)
TW85102980A 1996-01-25 1996-03-12 Titanium target for use in sputtering and manufacture thereof TW388069B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111108231A (en) * 2017-09-21 2020-05-05 Jx金属株式会社 Titanium target for sputtering, method for producing same, and method for producing titanium-containing thin film

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111108231A (en) * 2017-09-21 2020-05-05 Jx金属株式会社 Titanium target for sputtering, method for producing same, and method for producing titanium-containing thin film

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