TW382805B - Method and apparatus for synchronous memory access with separate memory banks and with memory banks divided into column independent sections - Google Patents
Method and apparatus for synchronous memory access with separate memory banks and with memory banks divided into column independent sections Download PDFInfo
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- TW382805B TW382805B TW084105794A TW84105794A TW382805B TW 382805 B TW382805 B TW 382805B TW 084105794 A TW084105794 A TW 084105794A TW 84105794 A TW84105794 A TW 84105794A TW 382805 B TW382805 B TW 382805B
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/04—Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
Abstract
Description
經濟部中央標準局貝工消費合作社印聚 Α7 Β7 五、發明説明(1 ) 相關申諸當之相互參照Printed by the Central Standards Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperative Α7 Β7 V. Description of Invention (1) Cross-references to relevant applications
本案係關於下列全部均讓渡·予Texas Instruments — Incorporated,並經參考併入本案之待決申請案:1994年 1 月 日提出,名稱爲"A CLOCK CONTROL CIRCUIT ARRANGEMENT"之美國專利申請案___________號,律師案號 TI-18272 ; 1994年 1 月日提出,名稱爲"METHOD AND APPARATUS FOR WRITING DATA IN A SYNCHRONOUS MEMORY" HAVING COLUMN INDEPENDENT SECTIONS AND A METHOD AND APPARATUS FOR PERFORMING WRITE MASH OPERATIONS" 之美國專利申請案__________號,律師案號TI-18278 ; 1994年 1 月提出,名稱爲"METHOD AND APPARATUS FOR RECONFIGURING A SYNCHRONOUS MEMORY DEVICE AS AN ASYNCHRONOUS MEMORY DEVICE"之美國專利申請案 __________號,律師案號TI-18276 ; 1994年1月提出, 名稱爲"METHOD AND APPARATU FOR PRODUCTION TESTING OF SELF-REFRESH OPERATIONS AND A PARTICULAR APPLICATION TO SYNCHRONOUS MEMORY DEVICES"之美國專 利申請案__________號,律師案號TI-18277 ; 1994年1月This case is a pending application for which all of the following have been assigned to Texas Instruments — Incorporated and incorporated by reference into this case: US Patent Application filed on January 1994, named " A CLOCK CONTROL CIRCUIT ARRANGEMENT " _ __________, attorney's case number TI-18272; filed on January 1994, named " METHOD AND APPARATUS FOR WRITING DATA IN A SYNCHRONOUS MEMORY " HAVING COLUMN INDEPENDENT SECTIONS AND A METHOD AND APPARATUS FOR PERFORMING WRITE MASH OPERATIONS " Patent Application No. __________, Lawyer's Case No. TI-18278; Filed in January 1994, the name is " METHOD AND APPARATUS FOR RECONFIGURING A SYNCHRONOUS MEMORY DEVICE AS AN ASYNCHRONOUS MEMORY DEVICE " Lawyer case number TI-18276; filed in January 1994, named "METHOD AND APPARATU FOR PRODUCTION TESTING OF SELF-REFRESH OPERATIONS AND A PARTICULAR APPLICATION TO SYNCHRONOUS MEMORY DEVICES", US patent application number __________, lawyer case number TI-18277; January 1994
日提出,名稱爲”METHOD AND APPARATUS FOR PREVENTING INVALID OPERATING MODES AND AN APPLICATION TO SYNCHRONOUS MEMORY DEVICES"之美國專利申請案_________ 號,律師案號ΤΙ-18291。 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210Χ 297公釐) --------丄/衣------訂------{ 丨 (請先閱讀背面之注意事項再填寫本頁) A7 _ B7 — _ 五、發明説明(2 ) 發明之技術镅迠 本發明係概括關於電子元件,之領域,尤指一種供同步記 憶體存取之方法及裝置。 發明之背景 現今大多數資料處理系統之基本結構包括一數位處理機 及隨機存取記憶體。爲經濟理由,隨機存取記憶體(random access memory,簡稱"RAM")常爲動態隨機存取記憶體:-(dynamic random access memory,.簡稱"DRAM")。 異步DRAM之一般操作頻率爲在33 MHz之範園。對於系統 時鐘脈衝速率高於此範圍,DRAM變成強制處理機及其他組 件等待記憶體存取之瓶琿〇較昂貴之記憶體,諸如靜態隨 機存取記憶體(Static random access memory,簡稱 •'SRAM1'),電可擦除可程式唯讀記憶艟(electrically erasable programmable read-only memory > 簡稱 "EEPROtT),其他可程式唯讀記憶體(programmable readonly memory, 簡稱 "PROM1·) 及唯讀記憶體 (read-only memory,簡稱"ROM"),也存在相同問題〇 取近,曾有人建議同步動態隨機存取記憶體(synchronous 經濟部中央標準局員工消費合作.社印製 ---------< 策-- (請先閱讀背面之注意事項再填寫本頁) dynamic random access memory,簡稱("SDRAM"),以較 佳利用固有之DRAM帶寬。利用同步DRAM,資料以較高速率定時 進出記憶體單元。例如,使用流水線結構之同步DRAM能以 100 MHz之速度操作。然而,流水線法存在有可能阻止在 速度高於100 MHz操作之重大限制。利用流水線法,内部 存取路徑分成若干階段’每一階段在每一時鐘脈衝邊緣以 (CNS ) Λ4規格(210x 297公漦) A7The Japanese Patent Application No. _________ and Lawyer's Case No. Γ-18291, entitled "METHOD AND APPARATUS FOR PREVENTING INVALID OPERATING MODES AND AN APPLICATION TO SYNCHRONOUS MEMORY DEVICES", are proposed on this paper. The size of this paper applies the Chinese National Standard (CNS) Λ4 specification (210 × 297 mm) -------- 丄 / 衣 -------- Order ------ {丨 (Please read the notes on the back before filling this page) A7 _ B7 — _ V. Description of the invention (2) Technology of the invention 镅 迠 The invention summarizes the field of electronic components, especially a method and device for synchronous memory access. BACKGROUND OF THE INVENTION The basic structure of most data processing systems today includes A digital processor and random access memory. For economic reasons, random access memory (referred to as " RAM ") is often dynamic random access memory:-(dynamic random access memory, referred to as "; DRAM "). The general operating frequency of asynchronous DRAM is in the range of 33 MHz. For system clock pulse rates higher than this range, DRAM becomes a forced processor and other components waiting for memory Take the bottle 珲 〇 more expensive memory, such as static random access memory (Static random access memory (referred to as "SRAM1 '), electrically erasable programmable read-only memory" (electrically erasable programmable read-only memory & gt (Referred to as "EEPROtT"), other programmable read only memory (referred to as "PROM1 ·") and read-only memory (referred to as "ROM"), there are also similar problems. It has been suggested that synchronous dynamic random access memory (synchronous consumer cooperation with the Central Bureau of Standards of the Ministry of Economic Affairs. Printed by the agency --------- < policy-(Please read the precautions on the back before filling out this (Page) dynamic random access memory, (" SDRAM ") for better use of inherent DRAM bandwidth. With synchronous DRAM, data is clocked in and out of memory cells at a higher rate. For example, a synchronous DRAM using a pipeline structure MHz speed operation. However, the pipeline method has significant limitations that may prevent operation at speeds above 100 MHz. Using the pipeline method, the internal access path is divided into several stages. ’Each stage is (CNS) Λ4 (210x 297 cm) A7 at the edge of each clock pulse.
新資料予以更新〇—經存取首一資料位元(或位元組), 母―時鐘脈衝循環便可存取其餘諸位元。然而,每次讀取受 到感測及輸出資料所費之時間所限制。目前,此項操作约 需毫微秒,流水線法囡此而無法以速度大於100 MHz操 作。 .而且’因爲各種组件,諸如感測放大器之複雜定時需求 及固有之操作速度限制,高速内部操作在任何同步設計常-困難而昂貴。New data is updated. 0- After accessing the first data bit (or byte), the mother-clock pulse cycle can access the remaining bits. However, each reading is limited by the time it takes to sense and output the data. Currently, this operation takes about nanoseconds, and the pipeline method cannot do so at a speed greater than 100 MHz. Also, because of the complex timing requirements of various components, such as sense amplifiers, and inherent operating speed limitations, high-speed internal operation is often difficult and expensive in any synchronous design.
因此,需要一種能以高系統速度,例高達及大於100MHz 操作之同步記憶體。 根據本發明之旨意,提供一種具個别記憶庫且記億庫分 成區段之同步記憶體存取方法及裝置,其實際消除或減少 與先前同步記憶體關連之種種缺點及問題。 經濟部中央標準局t貝工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 、-=* 本發明特别提供一種供儲存資料之記憶體,其中定時及 控制電路可操作接收位址及控制輸入,控%輸入之一爲以 系統頻率操作之系統時鐘脈衝。該同步記憶元件包括分成 許多記憶區段之記憶庫,諸記憶區段各包括一排列成數行 及數列之1己憶單元陣列。一列解碼器耗合至定時及控制電 路,並可操作使每一記憶區段中之諸列啓動。一行解碼器 可操作使每一記憶區段中之諸行實際同時同步啓動。一輸 出缓衝器耦合至記憶庫,並實際同時自每一記憶區段接收 資料,及與系統頻率同步自每一記憶區段交替輸出資料。 本發明也揭示一種用以儲存資料之同步記憶元件,其包 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨0X 297公釐) A7 B7 " ~ —— ------ 五、發明説明(4 ) 括二記憶庫。此記憶元件包括一定時及控制電路,用以接 收位址及控制輸入,控制輸入之一爲以系統頻率操作之系 統時鐘脈衝。二記憶庫分成許多記憶區段,諸記憶區段各 包括一排列成數行及數列之記憶單元陣列。本發明也提供 二列解碼器,一解瑪器與一個别記憶庫相關連,用以使每 一關連記憶區段中之諸列啓動。同樣,-本發明提供二行解 碼器,一解瑪器與一個别記憶庫相關連,用以實際同時使-每一記憶區段中之諸行同步啓動。再者,本發明提供一輸 出缓衝器,以實際同時自每一記憶區段接收資料,並與系 統頻率同步自每一記憶區段交替輸出資料。 上述之輸出缓衝器包括一耦合至諸記憶區段之第一鎖存 級’及一耗合至第一鎖存鈒並能操作自記憶元件輸出資料 之第二鎖存級。諸鎖存級各可操作鎖春每次存取由所有記 憶區段所輸出之若干位元之資料〇本發明提供一種資料電 路,以控制第二鎖存級,以便來自每一記憶區段之資料自 記憶元件交替輸出。 · 經濟部中央榡準局員工消費合作社印製 ---------1 衣-- (請先閱讀背面之注意事項再填转本頁) 本發明也提供一種對記憶元件存取之方法,其中接收位 址及控制輪入,諸控制輸入之一係一以系統顏率操作之系 統時鐘脈衝。響應位址及控制輸入,預定之諸列.在許多記 憶區段中啓動。再者,響應位址及控制輸入,預定之諸行 實際同時在許多記憶區段之每一區段同步啓動。然後實際 同時自諸記憶區段之每一區段接收資料,並且自記憶元件與 系統頻率同步交替輸出。 本發明之一項重要技術優點,爲記憶元件之記憶單元陣 -6 - ' 本紙張尺度相中®國家標率 .(〇叫八4規格(210/ 297公釐) ' -- 經濟部中央標準局員工消费合作社印製 A7 B7 五、發明説明(5 ) 列分成行無關記憶區段。實際同時對每一記憶區段存取’ 便產生一種預取操作,並能以系統頻率輸出資料,同時货 於η記憶區段在内部以1/n系統頻率操作。 將記憶體陣列分成行無關區段之一項重要技術優點,爲 行存取時間被所有記億區段之同時存取所隱藏。 本發明之另一重要技術優點,爲可將記憶體陣列分成二 獨立之庫。將記憶體陣列分成獨立之庫,諸庫各進而分成-行無關記憶區段’可藉以在諸庫之間交替進行存取,囡而 隱藏每一記憶庫之位元線預先充電時間。 附圖之簡要說明 爲更完全瞭解本發明及其諸多優點,現請參照下列説明 ,配合附圖考慮,其中相同參考數字指示相同部件,在附 圖中: 。 圖1例不一種包括數位處理機及同步DRAM之數位處理系 統之方塊圖; 圖2例不一種根據本發明旨意之同步DRAM之方塊圖; 圖3例不供根據本發明旨意之同步⑽⑽之"ο電路; 圖4例示-根據本發明旨意之特定記憶單元及1/〇電路 之方塊圖; 圖5例不—根據本發明旨意之同步DRAM,其特定記憶區 段之方塊圖; 作根據本發明旨意之同步醜,其讀出脈衝串操 圖7爲供根據本發明旨意之同步DRAM,其寫X脈衝串操 (請先閱讀背面之注意事項再填寫本頁) -0Therefore, there is a need for a synchronous memory capable of operating at high system speeds, such as up to and above 100 MHz. According to the purpose of the present invention, a synchronous memory access method and device having an individual memory bank and a memory bank divided into sections are provided, which actually eliminate or reduce various disadvantages and problems associated with the previous synchronous memory. Printed by the Central Standards Bureau of the Ministry of Economic Affairs, T Bayong Consumer Cooperative (please read the notes on the back before filling out this page),-= * The present invention provides a memory for storing data, in which the timing and control circuit can operate the receiving bit Address and control input, one of the control input is a system clock pulse operating at the system frequency. The synchronous memory element includes a memory bank divided into a plurality of memory sections, each of which includes a memory cell array arranged in rows and columns. A row of decoders is consumed by the timing and control circuits and is operable to activate the rows in each memory segment. The one-line decoder is operable to cause the lines in each memory segment to be started simultaneously and virtually simultaneously. An output buffer is coupled to the memory bank, and actually receives data from each memory segment at the same time, and outputs data alternately from each memory segment in synchronization with the system frequency. The invention also discloses a synchronous memory element for storing data. The paper size of the package is applicable to the Chinese National Standard (CNS) A4 specification (2 丨 0X 297 mm) A7 B7 " ~ ---- ------ 5 2. Description of the invention (4) Including two memory banks. This memory element includes a timing and control circuit for receiving addresses and control inputs. One of the control inputs is a system clock pulse operating at a system frequency. The two memory banks are divided into a plurality of memory sections, each of which includes an array of memory cells arranged in rows and columns. The present invention also provides a two-column decoder, a demamarizer associated with a separate memory bank for activating the columns in each associated memory segment. Similarly, the present invention provides a two-line decoder, and a decoder is associated with a different memory bank to actually simultaneously start the rows in each memory section simultaneously. Furthermore, the present invention provides an output buffer to receive data from each memory segment at the same time, and output data from each memory segment alternately in synchronization with the system frequency. The above-mentioned output buffer includes a first latch stage 'coupled to the memory sections and a second latch stage which is consumed to the first latch and is operable to output data from the memory element. Each of the latch stages is operable to access several bits of data output by all memory sectors at a time. The present invention provides a data circuit to control the second latch stage so that data from each memory sector The data is output alternately from the memory element. · Printed by the Consumer Cooperatives of the Central Procurement Bureau of the Ministry of Economic Affairs --------- 1 clothing-(Please read the precautions on the back before filling this page) The present invention also provides a method for accessing memory elements. Method, in which the address is received and the control is turned on, one of the control inputs is a system clock pulse operating at the system rate. Responsive to address and control inputs, predetermined columns are activated in many memory sections. Furthermore, in response to the address and control input, the scheduled actions are actually started simultaneously in each of the many memory sectors simultaneously. Then, the data is actually received from each of the memory sections at the same time, and the self-memory elements are alternately output in synchronization with the system frequency. An important technical advantage of the present invention is the memory cell array of the memory element-6-'National Standards of this Paper Standard Phase. (0 called 8-4 specification (210/297 mm)'-Central Standard of the Ministry of Economic Affairs Printed by the Consumer Cooperative of the Bureau A7 B7 V. Description of the invention (5) The columns are divided into row-independent memory sections. Actually accessing each memory section at the same time generates a prefetch operation and can output data at the system frequency. At the same time The η memory sector operates internally at a 1 / n system frequency. An important technical advantage of dividing the memory array into row-independent sectors is that the row access time is hidden by the simultaneous access of all the hundred million sectors. Another important technical advantage of the present invention is that the memory array can be divided into two independent banks. The memory array can be divided into independent banks, each of which is further divided into a row-independent memory section, which can be used to alternate between banks. To access and hide the pre-charging time of the bit line of each memory bank. Brief description of the drawings In order to fully understand the present invention and its many advantages, please refer to the following description and consider the accompanying drawings, in which the same parameters The numbers indicate the same components, in the drawings: Figure 1 illustrates a block diagram of a digital processing system including a digital processor and synchronous DRAM; Figure 2 illustrates a block diagram of a synchronous DRAM according to the purpose of the present invention; Figure 3 illustrates Figure 4 illustrates a block diagram of a specific memory cell and 1/0 circuit according to the spirit of the present invention; Figure 5 illustrates not-a synchronous DRAM according to the spirit of the present invention, which Block diagram of a specific memory segment; for synchronizing according to the purpose of the present invention, its read burst operation Figure 7 is for a synchronous DRAM according to the purpose of the present invention, which writes X burst operation (please read the precautions on the back before (Fill in this page) -0
• I- I .. - I I I i I -- -I Λ4規格(• I- I ..--I I I i I--I Λ4 specifications (
1、發明説明(6) 作之定時圖; 圖8爲供根據本發明旨意、 衝串操作之定時圖; '又同步DRAM,其寫入/讀出脈 圖9爲供根據本發明旨意、 之讀出/寫入操作之定時_<同步DRAM,其具有自動撤銷 圖10爲供根據本發明旨意、 出操作之定時圖; 同步DRAM,其2庫行交又讀 圖11爲供根據本發明旨意、 之2庫列交叉讀出操作之定=步_,其具有自動撤銷 圖12爲供根據本發明旨音、 ^ X \s./u 、<同步dram,其自一庫讀出操 作及對另一庫寫入操作之定時圖;以及 圖13爲供根據本發明旨意泛 , Λ葸〈问步卯AM,其具有自動撤銷 (對一庫寫人及自—庫讀出操作之定_; 發明之詳細説明 本發明將配合-種使用咖單元之記憶元件加以討論。 不過,本案所4論之概念也適用於SRAM,EEpR〇M, pR〇M, ROM,及其他記憶元件。 1 圖1例示一資料處理系統1〇之方塊圖。資料處理系統10 包括一通過位址匯流排16,資料匯流排18及控制匯流排20 連接至同步DRAM之數位處理機12。系統時鐘22通過引線24 連接至數位處理機12及同步DRAM 14 〇輸入/輸出("I/O") 元件26也通過匯流排16,18及20連接至數位處理機12。ί/〇 元件26也通過引線24連接至系統時鐘22。I/O元件26可例 如包含一周邊裝置,諸如一碟片控制器,或一允許與此周 ---------* 'i衣------訂------广 (請先閱讀背面之注意事項再填寫本頁) 經濟部中夬標率局貝工消費合作社印製 本紙張尺度適用中國國家標準((:!^)六4規格(210'/297公#> 經濟部中央標準局員工消费合作社印製 28所接收之輸入列示於下列表1,並將配合圖2及其餘諸 圖加以討論。1. Description of the invention (6) Timing chart made; Figure 8 is a timing chart for the burst operation according to the purpose of the present invention; 'Synchronous DRAM, its write / read pulses Figure 9 is for the purpose of the present invention, Timing of read / write operation_ < Synchronous DRAM with automatic revocation Fig. 10 is a timing diagram for the operation of the purpose of the present invention, and out; Synchronous DRAM, whose two banks are crossed and read, Fig. 11 is for the present invention The purpose is to determine the 2 bank column cross read operation = step_, which has automatic undo. Figure 12 is for the purpose of the present invention, ^ X \ s./u, < synchronous dram, which reads from a bank. And a timing diagram of a write operation to another bank; and FIG. 13 is a diagram for the purpose of the present invention, Λ 葸 <问 步 卯 AM, which has automatic undo (determining the operation of a bank writer and self-bank read operation) _; Detailed description of the invention The present invention will be discussed in conjunction with a memory element using a coffee unit. However, the concepts discussed in this case are also applicable to SRAM, EEPROM, pROM, ROM, and other memory elements. 1 Figure 1 illustrates a block diagram of a data processing system 10. The data processing system 10 includes an address sink The bus 16, the data bus 18 and the control bus 20 are connected to the digital processor 12 of the synchronous DRAM. The system clock 22 is connected to the digital processor 12 and the synchronous DRAM 14 through a lead 24. Input / output (" I / O " The component 26 is also connected to the digital processor 12 via buses 16, 18 and 20. The component 26 is also connected to the system clock 22 via the lead 24. The I / O component 26 may, for example, include a peripheral device such as a disc Controller, or one allowed with this week --------- * 'i clothing ------ order ------ wide (Please read the precautions on the back before filling this page) Economy The paper standard printed by the Ministry of Standards and Technology Bureau Shellfish Consumer Cooperative Co., Ltd. This paper is printed in accordance with Chinese national standards ((:! ^) 6 4 specifications (210 '/ 297) # > 28 printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs The inputs are listed in Table 1 below and will be discussed in conjunction with Figure 2 and the remaining figures.
A7 __;_____B7 五、發明説明(7 ) 邊裝置連通之裝置。 自同步DRAM 14讀出或對其寫入之資料傳輸穿越資料匯 流排18。資料之讀出及寫入通過穿越控制匯流排20所傳輸 之控制信號及穿越位址匯流排16所傳輪之位址位置加以控 制。位址一般包括一行位址及一列位址。位址及控制信號 可由數位處理機12或由記憶體控制器產生。系統時鐘22對 數位處理機12以及同步DRAM 14之操作定時。穿越匯流排〜 16 ’ 18 ’及20分别所傳輸之位址’資料’及控制信號予以 定時輸入同步DRAM 14,並自同步DRAM. 14定時輸出資料。 因此’同步DRAM 14之操作係與系統時鐘22同步,並因而 與數位處理機12同步。請予瞭解,用以纣同步DRAM 14定 時之時鐘“號可由系統時鐘22獲得。例如,數位處理機I〗 可輸出一由系統時鐘22所獲得,並可用以對同步dram 14 之操作定時之時鐘信號。 圖1之方塊圖例示一數位處理機及一同步.⑽腹之—種可 能構形。利用此種構形,可在使用標準異_卯倾之系統, 在記憶體存取上獲致顯著之速度增加。 圖2爲根據本發明旨意所構成之同步DRAM 14之方塊圖 。定時及控制電路28接收若干輸入,並產生若干用以控制 同步DRAM之電路並對其定時之内部信號。定時及控制電路 -I I. - - - - - m !1 -1-m I 1: 1 n — 一 、T f請先閱讀背面之注意事項再填轉本頁j Λ7 Β7 五、發明説明(8 ) 表1 輸入 説 明 Α0-Α10 位址輪入 All 庫選擇 W 寫入啓動 CAS 行位址選通 RAS 列位址選通 CS 晶片選擇 DQM 資料/輸出啓動 CLK 系统時鐘. CKE 時鐘啓動 D0-D7 資料輸乂/輸出 (請先閱讀背面之注意事項再填寫本頁} 裝_ 、1Τ 經濟部中央標準局貝工消費合作社印装 輸入信號CLK爲以系統頻率操作之系统時鐘脈衝。系統 頻率爲CLK信號之循環速率。請予瞭解,上表中所列示之 特定輸入信號僅係例證’可使用其他信號而不偏離本發明 之預定範園。例如,圖示12位址輸入,其允許接收時間多 工行及列位址。不過,可使用不同數之位址線,以允許一 起接收行及列位址。也可配合一種具有較多或較少空間之 記憶元件,或配合不同排列之記憶體陣列,使用較多或較 少之位址線。同樣,雖然圖示8資料線,但可使用較多或 較少之資料線,而不偏離本發明之預定範圍。 同步DRAM 14可有利以脈衝串方式操作。在脈衝串方式 -10 - 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210Χ 297公楚) A7 B7 經濟部中央標準局負工消费合作社印裝 五、發明説明(9 ’資料以特定長度之脈衝串予以寫入或讀出。在每一脈衝 内,每-時鐘循環存取資料,因而提供高速同步操作。在 -種特定實施例’每-脈衝串序列之長度可爲工2 4 或8次存取’不過也可使用較長之脈衝串,而不偏離本發 明。因此’例如利用一種一次輪入或輪出δ位元(一次一 位元组)之元件,可在脈衝串讀出或寫入L 2, 4,或8位 元组。在此種脈衝串,每一位元组跟隨上一位元组^,在其_ 間無時鐘延遲。 ~ 在脈衝串操作㈣,可順序或交替讀出或寫入資料。順 序或交替指所存取邏輯位it位置之次序。脈衝串長度及脈 衝串型式(亦即爲順序或交替)爲使用者可程式,及儲存 於定時及控制電路28内之方式暫存器29。在特定實施例, 可在進入程式規劃方式後,經過位址線接收脈衝串長度及 脈衝串型式資料。 同步DRAM内之記憶單元陣列如圖2中所示分成二庫,庫 A及庫B。再者,每一記憶庫分成n個記择區段。如圖2 中所示,庫Α分成區段30至32 ◊同樣,庫β分成區段34至 36。本發明將配合一種每一記憶庫分成二區段之實施例加 以討論,但請予瞭解,每一記憶庫可分成多很多之區段。 在庫A内,區段30之諸行係與區段32之諸行無關〇因此 ,可對每一區段分開存取。故區段30及32被説成"行無關" 。例如在特定實施例,每一區段包含4,096.列及1,〇24行, 每一區段中之二列由一,列位址予以定址’並且每一區段中 之四行由一行位址予以定址。故在此特定實例,就一行及 -11 - 本紙狀度適用中_家縣(CNS ) Α4規格(2丨GX297公楚) ------- - ί 裝------訂 (請先閱讀背面之注意事項再填转本頁) A 7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明(10.) 一列位址自每一區段存取8位元。在此實施例’十二位址 位元用於列位址,此十二位元之一選擇記憶庫,其他十二 位元在每一區段選擇二列。再者,九位址位元用於行位址 ,此九位元之一選擇記憶區段,其他八位元在一區段選擇 四行〇 將記億庫分成η行無關區段,便可在内部以i/n外部系 統頻率操作同步DRAM 14,故提供一項重大優點,因爲較-高速度内部操作較複雜而昂貴。例如,將庫A分成區段30 及32’能以二分之一外部類率自每一區段讀出資料,而以 外部系統時鐘之速率自同步DRAM 14輸出資料。此爲自一 區段對一記憶位置存取,並同時自另一區段對次一位置存 取所達成。故例如就外部系統頻率1〇〇 MHz而言,在使用 二區段時,必須以50 MHz操作每一區段。 要對同步DRAM 14存取,不論其爲讀出或寫入,在位址 輸入A0-A11接收列位址,並在正確方式在瓦沾信號及CL1U言 號之上升邊緣啓動時鎖存於列位址缓衝器押。列位址缓衝 器38之輸出爲内部.列位址。如以上所討論,行及列位址可 予時間多工處理,並且在特定實例,首先接收列位址。可 對應於列位址輸入All之庫選擇(BANK SELECT)信號,用以 通過列解碼器40及42之啓動而選擇記憶庫。列解碼器40將 庫A之列位址解碼,而列解碼器42將庫B之列位址解碼。 BANK SELECT信號係由定時及控制電路28所產生。在一特 定實施例,BANK SELECT信號係響應MB輸入信號及列位址 輸入All所產生。 (請先閲讀背面之注意事項再填寫本頁) 袈 、?τ 本紙張尺度適用中國國家標準(CNS)A4規格( 21()x 297公t) 經濟、;中央標準局員Η消費合作衽印製 A7 _________B7 五、發明説明(11. ) ~~~~~ 列解碼器40將庫A之區段30及區段32之列位址解碼,因 此使每一記憶區段中之諸列啓動。同樣,列.解碼器42將庫 B之區段34及36之.列位址解瑪。在特定實施例,一特定庫 之每一區段爲邏輯完全相同,並且每一區段之相同諸列予 以同時解碼。請予瞭解,個别諸解碼器可用於特定庫之每 一區段,而不偏離本發明之預定範園。- 以下討論控制特定記憶庫之每一行無關區段之行操作之_ 電路。此行解碼器電路可操作實際同時同步啓動每一記憶 區段中之諸行。一行位址缓衝器44鎖存在正確方式在CAS 信號及CLK信號之上升邊緣啓動時,在位址輸入所接收之 行位址。行位址缓衝器44之輸出爲内部行位址。内部行位 址位元將稱作CAO-CAn。就圖示之每一記憶庫分成二區段 之特定實施例而言,行位址位元CA0用以選擇庫A之區段 30及32以及庫B之區段34及36。在使用很多區段之實施例 ,則將需要更多之行位址輸入,以在諸區段間選擇。例如 ,在具有四區段之實施例’二行位址位元CA0及CA1將用以A7 __; _____ B7 V. Description of the Invention (7) Device for connecting side devices. Data transfers read from or written to the synchronous DRAM 14 pass through the data bus 18. The reading and writing of data is controlled by the control signal transmitted through the control bus 20 and the address position of the wheel passed through the address bus 16. The address generally includes a row of addresses and a row of addresses. The address and control signals may be generated by the digital processor 12 or by a memory controller. The system clock 22 times the operation of the digital processor 12 and the synchronous DRAM 14. Crossing the bus ~ 16 ′ 18 ′ and 20 respectively transmit the address ‘data’ and control signals to the timing synchronous input DRAM 14 and output the data from the timing synchronous DRAM 14 regularly. Therefore, the operation of the 'synchronous DRAM 14 is synchronized with the system clock 22 and thus with the digital processor 12. Please understand that the clock number used to synchronize the timing of the DRAM 14 can be obtained from the system clock 22. For example, the digital processor I can output a clock obtained from the system clock 22 and can be used to clock the operation of the synchronous dram 14. Signal. The block diagram of Figure 1 illustrates a digital processor and a synchronous. Abdominal belly-a possible configuration. With this configuration, a significant difference in memory access can be achieved in a system using a standard isochronous tilt. The speed increases. Figure 2 is a block diagram of a synchronous DRAM 14 constructed in accordance with the purpose of the present invention. The timing and control circuit 28 receives several inputs and generates a number of internal signals for controlling and timing the synchronous DRAM circuit. Timing and Control circuit-I I.-----m! 1 -1-m I 1: 1 n — 1. T f Please read the notes on the back before filling in this page j Λ7 Β7 V. Description of the invention (8) Table 1 Input descriptions Α0-Α10 address rotation All library selection W write enable CAS row address strobe RAS column address strobe CS chip selection DQM data / output enable CLK system clock. CKE clock enable D0-D7 data input乂 / output (please first Read the notes on the back and fill out this page again.} _ _ _ 1T The Central Standards Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperative, printed that the input signal CLK is a system clock that operates at the system frequency. The system frequency is the cycle rate of the CLK signal. Please understand The specific input signals listed in the table above are just examples. Other signals can be used without departing from the predetermined range of the present invention. For example, the 12-address input shown in the figure allows time-multiplexed row and column addresses to be received. You can use different numbers of address lines to allow row and column addresses to be received together. You can also use a memory element with more or less space, or use a different array of memory arrays to use more or less Also, although the 8 data lines are shown, more or less data lines can be used without departing from the predetermined scope of the present invention. The synchronous DRAM 14 can be advantageously operated in a burst mode. In the burst mode -10-This paper size is in accordance with Chinese National Standard (CNS) Λ4 specification (210 × 297 Gongchu) A7 B7 Printed by the Consumers ’Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs Data is written or read in bursts of a specific length. Within each pulse, the data is cyclically accessed every clock, thus providing high-speed synchronous operation. In a particular embodiment, the length of each burst sequence can be 2 4 or 8 accesses ', however, longer bursts can be used without departing from the invention. Therefore,' for example, using a component that rotates in or out of δ bits (one byte at a time) can Read or write L 2, 4, or 8 bytes in a burst. In this burst, each byte follows the previous byte ^ without a clock delay between them. ~ In burst operation, data can be read or written sequentially or alternately. Sequential or alternating refers to the order of the logical bit it locations accessed. The burst length and burst type (that is, sequential or alternating) are user-programmable and stored in a mode register 29 in the timing and control circuit 28. In a specific embodiment, after entering the programming mode, the burst length and burst type data can be received through the address line. The memory cell array in the synchronous DRAM is divided into two banks, bank A and bank B as shown in FIG. Furthermore, each memory bank is divided into n select sections. As shown in FIG. 2, bank A is divided into sections 30 to 32. Similarly, bank β is divided into sections 34 to 36. The present invention will be discussed in conjunction with an embodiment in which each memory bank is divided into two sections, but please understand that each memory bank can be divided into many more sections. In bank A, the rows of section 30 are not related to the rows of section 32. Therefore, each section can be accessed separately. So sections 30 and 32 are said to be "line-independent". For example, in a specific embodiment, each section contains 4,096 columns and 1,024 rows, two columns in each section are addressed by one, and the column address is addressed ', and four rows in each section are addressed by one row. Address. Therefore, in this specific example, only one line and -11-this paper is applicable _Jiaxian (CNS) Α4 specifications (2 丨 GX297) Chu --------ί -------- order ( Please read the precautions on the back before filling in this page) A 7 B7 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of Invention (10.) A row of addresses accesses 8 bits from each sector. In this embodiment, the twelve address bits are used for column addresses. One of the twelve bits selects the memory bank, and the other twelve bits select two columns in each sector. Furthermore, the nine address bits are used for the row address. One of the nine bits selects the memory section, and the other eight bits select four rows in one section. Operating synchronous DRAM 14 internally at an i / n external system frequency provides a significant advantage because higher-speed internal operations are more complex and expensive. For example, dividing bank A into sectors 30 and 32 'can read data from each sector at a half external rate, and output data from synchronous DRAM 14 at the rate of an external system clock. This is achieved by accessing a memory location from one sector and simultaneously accessing a next location from another sector. So, for example, in the case of an external system frequency of 100 MHz, when using the second sector, each sector must be operated at 50 MHz. To access the synchronous DRAM 14, regardless of whether it is read or write, enter the address A0-A11 at the address to receive the column address and latch it in the column when the rising edge of the tile signal and CL1U signal is activated in the correct way The address buffer is secured. The output of the column address buffer 38 is an internal column address. As discussed above, row and column addresses can be time multiplexed, and in certain instances, the column addresses are received first. The bank select (BANK SELECT) signal corresponding to the column address input All can be used to select the memory bank by activating the column decoders 40 and 42. The column decoder 40 decodes the column address of bank A, and the column decoder 42 decodes the column address of bank B. The BANK SELECT signal is generated by the timing and control circuit 28. In a specific embodiment, the BANK SELECT signal is generated in response to the MB input signal and the column address input All. (Please read the notes on the back before filling out this page) 袈,? Τ This paper size is applicable to China National Standard (CNS) A4 (21 () x 297g t) Economical; Printed by members of the Central Standards Bureau, Consumer Cooperation A7 _________B7 V. Description of the Invention (11.) ~~~~~ The column decoder 40 decodes the column addresses of the sector 30 and the sector 32 of the bank A, so the columns in each memory sector are activated. Similarly, the row decoder 42 decodes the row addresses of sectors 34 and 36 of bank B. In a particular embodiment, each sector of a particular bank is logically identical, and the same columns of each sector are decoded simultaneously. Please understand that individual decoders can be used for each sector of a particular bank without departing from the intended scope of the invention. -The following discusses the circuit that controls the operation of each row of a particular bank's unrelated sections. This row of decoder circuits is operable to actually start the rows in each memory segment simultaneously and simultaneously. The row address buffer 44 latches the row address received at the address input when the rising edge of the CAS signal and the CLK signal is activated in the correct manner. The output of the row address buffer 44 is an internal row address. The internal row address bits will be called CAO-CAn. For the specific embodiment in which each memory bank is divided into two sections as shown, the row address bit CA0 is used to select sections 30 and 32 of bank A and sections 34 and 36 of bank B. In embodiments where many sectors are used, more row address inputs will be required to select between sectors. For example, in the embodiment with four sectors, two rows of address bits CA0 and CA1 will be used
I 選擇每一區段。 低階行位址位元CA1及CA2予以輸入一加法器46。依行位 址位元CA0而定’加法器46將1或〇加至此等低階位元。 如CA0=1,則加法器46加1,如CA0=0,則加法器46加0。加 法器46之輸出予以耦合至計數器48及50之输入。計數器48 與庫A之區段30相連,而計數器50與庫B之區段相連。低 階列位址位元CA1及CA2也直接耦合至計數器52及54。計數 器52與庫a之區段32相連,而計數器54與庫B之區段36相 本紙張尺度適用中國國家標準(<:〜5)八4規格(210>< 297公麓) I —.1— 1-- - -«-1 -- - - ....... 4 - I I I— I I . (請先閱讀背面之注意事項再填筠本頁) A7 A7 經濟部中央榡準局員工消費合作、社印製 B7 五、發明説明(12.) 連。在所討論之特定實施例’直接或通過加法器46輸入至 脈衝器48,50,52,及54之低階行位址位元爲行位址位元 CA1及CA2。此二位元,連同行位址位元CA0,允許多至8之 計數。利用配合表2 — 4所討論之腺衝串長度序列,便無 來自加法器46之進位或溢流位元。 計數器48-54在LOAD (載入)信號啓動時同步載入初始 行位址資料。LOAD信號由定時及控制電路28輸出。其後~ 依輸入至每一計數器,以儲存於模式暫存器29之脈衝串型 式狀態爲基礎之MODE (模式)信號之狀態而定,計數器48 -54以順序或交替方式計數。計數係由以儲存於模式暫存 器29之脈衝串資料爲基礎之C0UNt (計數)信號予以同步 控制。在工作時,COUNT信號以l/n外部系統類率操作。 較高階行位址位元CA3-CA8輸入至鎖‘存器56,並在LOAD 信號啓動時予以鎖存。鎖存器56予以耦合至行解碼器58及 ⑼。行解碼器58與庫A之區段32相連,而行解碼器60與庫 B之區段36相連。行解碼器58予以耗合至产庫a之區段3〇 相連之解碼器62。同樣,行解碼器60予以耦合至與庫B之 區段34相連之行解碼器64。每一行解碼器58_64予以耦合 至一ENABLE (啓動)信號。 1解碼器58耦合至計數器52之輸出。同樣,列解碼器6〇 耦合至計數器54之輸出。行解碼器62耦合至計數器48之輸 出。同樣,行解碼器64耦合至計數器50之輸出❶ 所6寸論之特定實施例操作時,BANK SEECT信號啓動—特 定庫。下列討論係配合庫A之啓動,請予瞭解,庫B以相 -14 - 張尺度 (CNS ) A4規格{ 21〇><297公釐) n I 1 - - ----丄 策—— I - II -訂 (請先閱讀背面之注意事項再填寫本頁) A7 B7 經濟部中央標準局員工消費合作.社印製 五、發明説明(B. 似方式操作。.列解碼器40將區段30及32中之諸冽解碼。在 CAS及CLK信號之上升邊緣啓動時,行位址缓衝器44鎮存列 位址。此行位址爲起始位址,並將用以產生完成一次脈衝 串操作所需之所有其他行位址。要達成高速操作,本發明 自起始位址所對應之記億區段存取起始位址,並同時自另 一區段存取脈衝串之次一位址。此過程重複,直到脈衝串 完成。 對一個以上區段進行同時存取,會平行而非串聯的經歷與 行位址解碼關連之延遲’並因此隱藏同時存取之行存取時 間。此等存取一般長約30毫微秒。再者,有二記憶庫,在 二庫間交替存取,便避免與使位元線預先充電具有關連之 延遲,因爲一庫可在存取另一庫時予以預先充電。 行位址位元CA1及CA2予以載入計數器52。由加法器46增 量0或1之此二位元予以載入計數器48。行解碼器58響應 通過計數器48及52以及鎖存器56所收到之位址,而將適當 之列解碼。要減少冗餘電路,行解碼器58产自鎖存器56所 接收之高階位址位元解碼,並產生解碼之高階因數供其本 身及供行解碼器62。此等高階因數自解碼器58傳輸至解碼 器62〇 因此,計數器52載入初始位址位元,而計數器48載入由 加法器46增量0或1之相同位元。如果起始行位址爲在區 段30 (亦即CA0=0 ) ’加法器46將加〇,因爲次—位置(亦 即CA0=1 )爲在區段32,並且CA1及CA2不變。如果起妒行 位址爲在區段32 (亦即CA0=1) ’則加法器46將加1,因爲 -15 - 本紙張尺度適闱中國國家標準(CNS ) A4规格(210X 297公釐) 1 I- -ili i (m f ^ ^^^1 1 - - —^n mu —^ϋ HH、一 (請先閲讀背面之注意事項再填寫本頁} 經濟部中央榡準局員工消費合作社印製 A7 _____B7 五、發明説明(w. ) ~~~ 次一位置(亦即CA0=1 )爲在區段32,並且CA1及CA2不變 。如果起始行位址爲在區段32·(亦即CA0=1),則加法囍 將加1 ,因爲次一位置(亦即CAO=〇)爲在區段3〇,並且 CA1及CA2增量1。此等初始位址位元在load信號啓動時載 入計數器52及48,然後連同鎖存器56所輸出之位元被解碼 器58及62解碼〇鎖存器56在LOAD信號啓動時將位元CA3- CA8鎖存。一脈衝串之首二位址以此方式予以存取。 在次一内部循環,啓動COUNT (計數)信號,並且計數 器48及52根據MODE (模式)信號之狀態計數,因而與内部 時鐘頻率同#輸出增量之行位址,允許對脈衝串之其次二 位址存取。依MODE信號而定,計數器48及52將以順序或交 替方式計數。計數與内部時鐘頻率同步繼續,直到脈衝串 操作完成。ENABLE (啓動)信號將在•或寫操作時啓動每 一行解碼器58及62 »脈衝串操作一經完成,將會使諸行解 碼器及列解瑪器中止,允許記憶區段預先充電供次一操作 〇 區段30及32之邏輯記憶空間予以安排爲,使連績記憶位 置在區段30與32之間交錯。爲要順序存取,記憶位置根據 此邏輯安排予以定序。要交替存取,記憶位置仍交替定序 爲自區段30至區段32,並再轉回,但根據一種交替常式。 下列表2〜4例示由加法器46以及計數器48及52所產生, 供脈衝串長度2,4,及8對記憶位置存取之内部行位址。 請予瞭解’記憶區段30及32係予同時存取,因此第一及第 二仨置係予同時存取,第三及第四,第五及第六,以及第 --------A 麥------訂 (請先閱讀背面之注意事項再填窍本頁) 本紙張尺度適用中國國家標隼(CNS ) ( 210^297^7 A7 __B7 五、發明説明(丨5.) 七及第八位置也是如此。 表2 脈衝串長度2之序列 内部行位址CA0 起始 第2 順序 0 -1 1 0 交替 0 1 1 0 表3 脈衝串長度4之序列 經濟部中央標準局員工消費合作社印製 内部行位址CA1,CA0 起始 第2 第3 第4 00 01 10 11 順序 01 10 11 · 00 10 11 00 1 01 11 00 01 10 00 01 10 11 交替 01 00 11 10 10 11 00 01 11 10 01 00 -17 - ---------I 裝-------訂 (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(2丨0X 297公釐) A7 _____B7 '發明説明(l6.) 4 脈衝串長度8之序列 五 經濟部中央標準局員工消費合作社印製 内部行位址CA2, CA1, CA0 起始 第2 第3 第4 第5 第6 第7 第8 000 001 010 011 100 101 110 111 001 010 011 100 101 110 111 000 010 011 100 101 110- 111 000 001 順序 011 100 101 110 111 000 001 010: 100 101 110 111 000 001 010 011 101 110 111 000 001 010 011 100 110 111 000 001 010 011 100 101 111 000 001 010 011 100 101 110 000 001 010 011 100 101 110 111 001 000 011 010 101 100 111 110 010 011 000 001 110 111 100 101 交替 011 010 001 000 111 110 101 100 100 101 110 111 000 001 * 010 011 101 100 111 110 001 000 011 010 110 111 100 101 010 011 000 001 111 110 101 100 011 010 001 000 由此諸表可看出,資料在記憶區段30與32之間予以交替 定序,而不拘脈衝串型式。諸表中所示之内部行位址位元 CA1及CA2由加法器46以及計數器48及52加以控制。在任何 脈衝串期間所存取之首二位址,係由起始位址及加法器46 本紙張尺度適用中國國家榇率(CNS ) Μ規格(2IOX 297公逄} A7 B7 五 、發明説明(Π. 所確定。所有其他位址由計數器48及52所確定。内部行位 址位元CAO用以確定那一記憶區段包含一脈衝串操作之首 先存取位置。計數器48-54及加法器46確定隨後之諸記憶 位置,並且二區段予以同時存取。因此,CAO不變,直到 開始另一脈衝串操作。爲求明晰,上列表2〜4指示CAO 改變,僅爲例示每一存取位置之邏輯次序。 在一種特定實施例,每一行位址存取8位元,並且每一 内部時鐘循環自每一區段輸出8位元。因此,.每一内部時 鐘循環輸出總共16位元至輸出缓衝器,其將在下文加以討 論0 所討論之特定實施例包特供每一記憶庫之二區段。不過 ,也可用多很多之區段。對於具有η區段之實施例,將包 括η-1加法器,第η記憶區段無加法器'。諸加法器將會在 0與1之間加至適當之位址位元,然後將結果載入關連之 計數器。η區段各將會直接自適當之行位址線或通過關連 之加法器館給其自己之計數器。起始位址,確定每一加法 器所加之量〇例如,就記憶區段χ中之起始位址,對於 l<x〈ri而言’與記憶區段X至n-丨關連之諸加法器則將會知 經濟部中央標準局員工消費合作衽印製 零’而與記憶區段1至x-1關連之諸加法器將會加一。與 包含起始位址之記憶區段關連之加法器始終加零,就^ 憶區段而言,將會在初始載人,然後在每—隨後計 取-脈衝串之π位址。圖2例衫諸區段間使用,,.,= 號之η記憶區段。 · * 符 圖3例示根據本發明旨意所構成之同步應,其輪入/ -19 - 經濟部中央標隼局負工消費合作社印製 A7 B7 五、發明説明(丨8.) 輪出電路之方塊圖。記憶庫所分成之η區段各包括m個緩 衝器。因此,提供緩衝器70-72接收輸出資料,並將輸入 資料傳輸至庫A及B之區段1。缓衝器70傳輸内部資料位 元D0,而缓衝器72傳輸資料位元Dm-Ι,均爲供區段1。關 於圖2 ’緩衝器70及72將分别對庫A及B之區段30及34傳 輸資料及自其接收資料◊同樣,缓衝器74及76傳輸資料位 元D0及Dm-Ι至庫A及b之區段n。在配合圖2所討論之特-定實施例’缓衝器74及76傳輸資料至庫A及B之區段32及 36,並自其接收資料。對於每庫使用超過二區段之實施例 ,每區段將提供一組緩衝器。缓衝器70-76利用BANK SELECT (庫選擇)信號在庫之間選擇。 將列自同步DRAM 14讀出之資料通過輸出缓衝器78予以 輸出。輸出缓衝器78可操作實際同時自一庫之諸記憶區段 接收資料,並與系統頻率同步自諸記憶區段交替輸出資料 。輸出缓衝器78爲一種二級缓衝器,其允許以外部時鐘頻 率讀出資料。來自每一缓衝器7〇-76之資竹予以鎖存至輸 出缓衝器78之第一鎖存器級。此第一鎖存器級包括一供每 -緩衝器70-76之鎖存器。因此,對於m位元及分成n區段 之記憶庫,在輸出缓衝器78之第一級有111><11個鎖存器。在 所討論之每記憶庫有8位元及二區段之特定實施例.,輸出 缓衝器78之第一級包括16個鎖存器’鎖存器8〇 86。明確 而T,鎖存器80接收來自緩衝器7〇之資料,而鎖存器犯接 收來自緩衡器74之資料。鎖存器84接收來自缓衝器72之資 料’而鎖存器86接收來自緩衝器76之資料。 -20 - 中而CNS ) Λ4現格( (請先閱讀背面之注意事項再填寫本頁)I Select each section. The lower-order row address bits CA1 and CA2 are input to an adder 46. Depending on the row address bit CA0 ', the adder 46 adds 1 or 0 to these lower order bits. If CA0 = 1, the adder 46 adds 1; if CA0 = 0, the adder 46 adds 0. The output of adder 46 is coupled to the inputs of counters 48 and 50. The counter 48 is connected to the sector 30 of bank A, and the counter 50 is connected to the sector of bank B. The lower order column address bits CA1 and CA2 are also directly coupled to the counters 52 and 54. Counter 52 is connected to section 32 of bank a, and counter 54 and section 36 of bank B are based on the Chinese paper standard (<: ~ 5), 8 specifications (210 > < 297 feet) I —. 1— 1----«-1---....... 4-III— II. (Please read the notes on the back before filling out this page) A7 A7 Employees of the Central Bureau of Standards, Ministry of Economic Affairs Consumption cooperation, printed by the society B7 V. Invention description (12.) Company. In the particular embodiment in question, the lower-order row address bits input to the pulsers 48, 50, 52, and 54 directly or through the adder 46 are the row address bits CA1 and CA2. These two bits, together with the row address bit CA0, allow counting up to eight. Using the gland burst length sequence discussed in Tables 2 to 4, there is no carry or overflow bit from adder 46. Counters 48-54 load the initial row address data synchronously when the LOAD signal is activated. The LOAD signal is output by the timing and control circuit 28. After that ~ it depends on the state of the MODE signal input to each counter based on the pulse train type state stored in the mode register 29, and the counters 48-54 count in a sequential or alternating manner. Counting is controlled synchronously by a C0UNt (count) signal based on the burst data stored in the mode register 29. In operation, the COUNT signal operates at 1 / n external system class rate. The higher-order row address bits CA3-CA8 are input to the lock 'register 56 and latched when the LOAD signal is activated. The latch 56 is coupled to the row decoder 58 and ⑼. The row decoder 58 is connected to the sector 32 of bank A, and the row decoder 60 is connected to the sector 36 of bank B. The row decoder 58 is combined to the decoder 62 connected to the sector 30 of the production bank a. Similarly, the row decoder 60 is coupled to a row decoder 64 connected to the sector 34 of bank B. Each line of decoder 58_64 is coupled to an ENABLE signal. A decoder 58 is coupled to the output of the counter 52. Similarly, the column decoder 60 is coupled to the output of the counter 54. The row decoder 62 is coupled to the output of the counter 48. Similarly, when the row decoder 64 is coupled to the output of the counter 50, the BANK SEECT signal is activated when a particular embodiment of the 6-inch theory operates—a specific library. The following discussion is in conjunction with the launch of library A. Please understand that library B uses the -14-sheet scale (CNS) A4 specification {21〇 > < 297 mm) n I 1------ policy- — I-II-Order (please read the notes on the back before filling this page) A7 B7 Consumption cooperation between employees of the Central Standards Bureau of the Ministry of Economic Affairs. Printed by the company V. Invention description (B. Operation in a similar manner. The column decoder 40 will Decoding of fields in segments 30 and 32. When the rising edges of the CAS and CLK signals are activated, the row address buffer 44 stores the column address. This row address is the starting address and will be used to generate All other row addresses required to complete a burst operation. To achieve high-speed operation, the present invention accesses the start address from the hundreds of millions of sectors corresponding to the start address and simultaneously accesses the pulse from another sector The sequence is followed by a single address. This process is repeated until the burst is completed. Simultaneous access to more than one sector will experience the delay associated with row address decoding in parallel rather than in series, and thus hide the simultaneous access row Access time. These accesses are generally about 30 nanoseconds long. Furthermore, there are two banks, which alternate between the two banks. Take, avoid the delay associated with precharging the bit line, because one bank can be precharged when accessing another bank. Row address bits CA1 and CA2 are loaded into counter 52. Incremented by adder 46 The two bits of quantity 0 or 1 are loaded into counter 48. Row decoder 58 decodes the appropriate column in response to the addresses received through counters 48 and 52 and latch 56. To reduce redundant circuits, The row decoder 58 is produced by decoding the higher-order address bits received by the latch 56 and generates decoded higher-order factors for itself and for the row decoder 62. These higher-order factors are transmitted from the decoder 58 to the decoder 62. Therefore, the counter 52 is loaded with the initial address bit, and the counter 48 is loaded with the same bit incremented by 0 or 1 by the adder 46. If the starting row address is in sector 30 (ie, CA0 = 0) ' The adder 46 will add 0 because the sub-position (ie, CA0 = 1) is in section 32, and CA1 and CA2 are unchanged. If the address of the envy row is in section 32 (ie, CA0 = 1) ' The adder 46 will be increased by 1, because -15-this paper size is suitable for China National Standard (CNS) A4 size (210X 297 mm 1 I- -ili i (mf ^ ^^^ 1 1--— ^ n mu — ^ ϋ HH 、 一 (Please read the precautions on the back before filling out this page) A7 _____B7 V. Description of the Invention (w.) ~~~ The next position (that is, CA0 = 1) is in section 32, and CA1 and CA2 are unchanged. If the starting row address is in section 32 · (also That is, CA0 = 1), the addition 囍 will increase by 1 because the next position (that is, CAO = 〇) is in section 30, and CA1 and CA2 are incremented by 1. These initial address bits are loaded into the counters 52 and 48 when the load signal is activated, and then decoded by the decoders 58 and 62 together with the bits output by the latch 56. The latch 56 sets the bits when the LOAD signal is activated CA3- CA8 are latched. The first two addresses of a burst are accessed in this way. In the next internal loop, the COUNT signal is started, and the counters 48 and 52 count according to the state of the MODE signal. Therefore, it is the same as the internal clock frequency. Address access. Depending on the MODE signal, counters 48 and 52 will count sequentially or alternately. Counting continues in synchronization with the internal clock frequency until the burst operation is complete. The ENABLE signal will activate each row of decoders 58 and 62 during a • or write operation. »Once the burst operation is completed, the rows of decoders and column decoders will be aborted, allowing the memory section to be recharged for the next time. The logical memory space of operation 0 segments 30 and 32 is arranged so that consecutive memory locations are staggered between segments 30 and 32. For sequential access, memory locations are sequenced according to this logical arrangement. For alternate access, the memory locations are still alternately sequenced from sector 30 to sector 32 and back again, but according to an alternation routine. The following lists 2 to 4 illustrate the internal row addresses generated by the adder 46 and the counters 48 and 52 for accessing the memory locations of burst lengths 2, 4, and 8. Please understand that the memory sections 30 and 32 are accessed simultaneously, so the first and second settings are accessed simultaneously, the third and fourth, the fifth and sixth, and the first --- --A 麦 ------ Order (Please read the notes on the back before filling out this page) This paper size applies to China National Standards (CNS) (210 ^ 297 ^ 7 A7 __B7 V. Description of the invention (丨5.) The same is true for the seventh and eighth positions. Table 2 Internal row address CA0 of the sequence of burst length 2 Start 2nd order 0 -1 1 0 Alternating 0 1 1 0 Table 3 Sequence of burst length 4 central Standard Bureau employee consumer cooperative prints internal bank address CA1, CA0 starting 2nd 3rd 4 00 01 10 11 sequence 01 10 11 · 00 10 11 00 1 01 11 00 01 10 00 01 10 11 alternating 01 00 11 10 10 11 00 01 11 10 01 00 -17---------- I Packing ------- Order (Please read the precautions on the back before filling this page) This paper size applies to Chinese national standards (CNS) A4 specification (2 丨 0X 297 mm) A7 _____B7 'Explanation of the invention (l6.) 4 Sequence of burst length 8 5 The Ministry of Economic Affairs Central Standard Bureau employee consumer cooperative prints the internal bank Addresses CA2, CA1, CA0 Start 2nd 3rd 4th 5th 6th 7th 8 000 001 010 011 100 101 110 111 001 010 011 100 101 110 111 000 010 011 100 101 110- 111 000 001 Sequence 011 100 101 110 111 000 001 010: 100 101 110 111 000 001 010 011 101 110 111 000 001 010 011 100 110 111 000 001 010 011 100 101 111 000 001 010 011 100 101 110 000 001 010 011 100 101 110 111 001 000 011 010 101 100 111 110 010 011 000 001 110 111 100 101 Alternate 011 010 001 000 111 110 101 100 100 101 110 111 000 001 * 010 011 101 100 111 110 001 000 011 010 110 111 100 101 010 011 000 001 111 110 101 100 011 010 001 000 As can be seen from the tables, the data is sequenced alternately between the memory sections 30 and 32, regardless of the burst type. The internal row address bits CA1 and CA2 shown in the tables are controlled by an adder 46 and counters 48 and 52. The first two addresses accessed during any burst period are the start address and the adder. 46 This paper size is applicable to the Chinese National Standard (CNS) M specification (2IOX 297 cm) A7 B7 V. Description of the invention ( Π. Determined. All other addresses are determined by counters 48 and 52. The internal row address bits CAO are used to determine which memory segment contains the first access location for a burst operation. Counters 48-54 and adders 46 determines the subsequent memory locations, and the two sectors are accessed simultaneously. Therefore, the CAO does not change until another burst operation is started. For clarity, the above list 2 ~ 4 indicates that the CAO is changed, and it is only an example for each memory. Take the logical order of the positions. In a specific embodiment, each row of addresses accesses 8 bits, and each internal clock cycle outputs 8 bits from each sector. Therefore, each internal clock cycle outputs a total of 16 bits The element-to-output buffer, which will be discussed below. The specific embodiment discussed includes two sections of each bank. However, many more sections are available. For embodiments with n sections Will include η-1 adder There is no adder in the nth memory segment '. The adders will add the appropriate address bits between 0 and 1, and then load the result into the associated counter. Each of the n segments will go directly from the appropriate row The address line gives its own counter through the associated adder library. The starting address determines the amount added by each adder. For example, for the starting address in memory segment χ, for l < x <ri In terms of 'adders related to memory sections X to n- 丨, the consumption cooperation of the Central Standards Bureau of the Ministry of Economic Affairs will be printed and printed zero', while adders related to memory sections 1 to x-1 will It will add 1. The adder associated with the memory segment containing the starting address always adds zero. As far as the ^ memory segment is concerned, it will be initially loaded with people, and then the π bit of the -burst Figure 2 illustrates the use of η ,,,, = between the sections of the shirt. · The symbol * illustrates the synchronous response formed according to the purpose of the present invention. Its rotation / -19-Central Standard of the Ministry of Economic Affairs A7 B7 printed by the Bureau of Work and Consumer Cooperatives V. Description of the invention (丨 8.) Block diagram of the circuit of rotation. The memory area is divided into η areas Each includes m buffers. Therefore, buffers 70-72 are provided to receive output data and transfer the input data to sector 1 of banks A and B. Buffer 70 transmits internal data bit D0, and buffer 72 The transmitted data bits Dm-1 are all for sector 1. Regarding Figure 2 'buffers 70 and 72 will transmit and receive data to and from sectors 30 and 34 of banks A and B, respectively. Similarly, the buffers 74 and 76 transmit data bits D0 and Dm-1 to section n of bank A and b. In conjunction with the specific embodiment discussed in FIG. 2 'buffer 74 and 76 transmit data to regions of bank A and B Segments 32 and 36, and receive data from them. For embodiments using more than two segments per bank, each segment will provide a set of buffers. Buffers 70-76 use the BANK SELECT signal to select between banks. The data read from the synchronous DRAM 14 is output through an output buffer 78. The output buffer 78 can operate to receive data from the memory sections of a bank at the same time, and output data from the memory sections alternately in synchronization with the system frequency. The output buffer 78 is a secondary buffer that allows data to be read at an external clock frequency. The assets from each of the buffers 70-76 are latched to the first latch stage of the output buffer 78. The first latch stage includes a latch for each of the buffers 70-76. Therefore, for the m-bit and n-divided banks, there are 111 > < 11 latches in the first stage of the output buffer 78. In the particular embodiment in which each bank has 8 bits and two sectors, the first stage of the output buffer 78 includes 16 latches ' Specifically, T, the latch 80 receives data from the buffer 70, and the latch receives data from the buffer 74. Latch 84 receives data ' from buffer 72 and latch 86 receives data from buffer 76 '. -20-CNS) Λ4 is now ((Please read the precautions on the back before filling this page)
、1T 經濟部中央標準局員工消费合作社印製 A7 - ——_______________Β7 五、發明説明(19. ) ~~~~ —~ -- 將要讀出之資料依據_Α_號鎖存在鎖存器㈣6。 DL0AD1信號由讀出鎖存控制電路88所產生。讀出鎖存控制 電路88依據定時及控制電路28所產生之ακ〇ϋτ信號定時輸 出資料。CUOUT信號之頻率等於外部系統時鐘頻率。對於 每記憶庫有二區段之實施例,DL〇AD1信號在作用時,以 1/2外部系統時鐘頻率DL〇AD1信號也依據作爲代碼 儲存於方式暫存器29之CAS等待時間資料而產生。^等待〜 時間爲使用者可程式,並確定要求^信號與有效輸出信 號間發生之時鐘循環數。讀出鎖存器電路88也產生DL〇AD2 k號,其將資料自輸出缓衝器78之第一鎖存器級鎖存至第 一鎖存器鈒。輸出缓衝器78之第二鎖存器級包括鎖存器9〇 -96。第二鎖存器級包括第—鎖存器級中之每鎖存器一鎖 存器。 一資料切換電路98選擇將資料輸出至輸出資料線之次序 。對於每一記憶庫分成二區段之特定實施例,資料切換電 路98在與二區段每一區段關連之鎖存器之間交替選擇。因 此,資料切換電路98依據CLKOUT信號及一'單一輸入,行位 址之位元CA0,輸出其切換信號。CA0選擇將自庫A之二區 段30及32以及庫B之區段34及36輸出資料之次序。資料切 換電路98將會導致與每一記憶區段關連之第二鎖存器級中 之資料交替輸出。所有資料一旦均已輸出,將要求DL0AD2信號 之第一鎖存器級載入新資料。在每一記憶庫分成超過二區 段之實施例,資料切換電路98則將接收足夠在每一區段選 擇之輸入信號,以供輸出資料。因此,輸出緩衝器78實際 本紙張尺度適用中國國家標準(CNS ) Λ4規格(210 X 297公釐) f請先閲讀背面之注意事唄再填{sf本頁」 'ST. Λ7 Λ7 五、 B7 發明説明(2〇t ) 同時自一記憶庫之每一記憶區段接收資料,並與系統頻率 同步自每一此等記憶區段交替輸出資料ο - 將列輸入至同步DRAM 14之資料通過輸入缓衝器100予以 輪入。輪入缓衝器100包括鎖存器102-108。輸入缓衝器 100中之鎖存器數與輸出緩衝器78任一級中之鎖存器數相 同。寫入鎖存器電路110以系統頻率及.行位址位元CA〇接 收時鐘信號1以選擇鎖存器102-108之何者在特定時間接-收在資料匯流排所接收之資料。 在輪出級也可包括一多工器112,以順序方式一次將資 料定時輪入或輸出一位元,以供適當之應用,諸如視頻應 用。 圖4例示一種代表性記憶單元及其至圖3中所示輸入/ 輸出電路之連接之方塊圖。如圖4中所示,一記憶單元包 含—電晶體120及一用以儲存電荷之電容器122。電晶體 12〇之閘極接至字線124。很多其他記憶單元也將接至字線 I24。電晶體120在字線124之控制下在電容器122與位元線 126之間傳遞電荷。很多其他記憶單元也g不同字線所控 制之諸不同電晶體接至位元線。 字線124 —經啓動,感測放大器128便感測並放大位元線 126與參考位元線13〇間之電荷差。行解碼器一經選擇位元 線126 ’便啓動γ選擇信號,並接通旁路閘電晶體132及 134,從而在讀出操作時允許輸出資料至輸出缓衝器138。 ,出缓衝器138對應於圖3之緩衝器70-76及78。對於寫入 操作,將資料自資料匯流排接收至與圖3之缓衝器7〇 76 本紙狀度適财_ — m In ti - I n - - - --χ·取1--- ---· Ϊ-— —----- - ---1 ! -I :--- I- - I 1^1 HI 〆 {請先閱讀背面之注意事項蒋填寫本fo 經濟部中央標準局員工消費合作社印聚 22 - 經濟部中央標準局員工消費合作社印裝 A7 ______ B7 五、發明説明(2L ) 一~~~~~~ 及100對應之輸入緩衝器140,然後自輸入缓衝器140傳輪 至驅動器放大器136。驅動器放大器136然後通過旁路閉-電 晶體134驅動位元線126,將適當資料寫入記憶單元。驅動 器放大器136爲一種雙路驅動器,依要求寫入或讀出操作 而驅動位元線或驅動輸出缓衝器。 圖5例示同步DRAM 14之一記憶庫之一區段之一種特定 實施例。所討論之特定區段爲區段30。如圖5中所示,區-段30分成塊150及152 β每一塊包括整個區段30二分之一列 數,並可視爲重複位址空間。因此,在一種特例,每一塊 包括2048列。行解碼器62將每一塊之諸適當行解碼,並允 許通過感測及驅動電路154及156讀出或寫入。每一感測及 驅動電路154及156對應於圖4之感測放大器128及驅動器 放大器136。自塊150及152輸出或輸入至其之資料通過輸 入及輸出缓衝器138及140。就一種m位元元件而言,自塊 150讀出或對其寫入m/2位元,並自塊152讀出或對其寫入 m/2位元。, 1T Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7-----_______________ B7 V. Description of the Invention (19.) ~~~~ — ~-The data to be read out is latched in latch ㈣6 according to _Α_. The DL0AD1 signal is generated by the read latch control circuit 88. The readout latch control circuit 88 outputs data at a timing based on the timing and the ακ〇ϋτ signal generated by the control circuit 28. The frequency of the CUOUT signal is equal to the external system clock frequency. For the embodiment where there are two sections per memory bank, when the DLOAD1 signal is active, the DLOAD1 signal is generated at 1/2 of the external system clock frequency based on the CAS latency data stored as a code in the mode register 29. . ^ Wait ~ Time is user programmable and determines the number of clock cycles that occur between the request ^ signal and the effective output signal. The readout latch circuit 88 also generates DLOAD2k, which latches data from the first latch stage of the output buffer 78 to the first latch 鈒. The second latch stage of the output buffer 78 includes latches 90-96. The second latch stage includes one latch per latch in the first latch stage. A data switching circuit 98 selects the order in which data is output to the output data lines. For the particular embodiment where each bank is divided into two sectors, the data switching circuit 98 alternates between latches associated with each sector of the two sectors. Therefore, the data switching circuit 98 outputs its switching signal based on the CLKOUT signal and a single input, bit CA0 of the row address. CA0 selects the order in which data will be output from the two sections 30 and 32 of bank A and the sections 34 and 36 of bank B. The data switching circuit 98 will cause the data in the second latch stage associated with each memory sector to be output alternately. Once all data has been output, the first latch stage of the DL0AD2 signal is required to load new data. In the embodiment where each memory bank is divided into more than two sections, the data switching circuit 98 will receive enough input signals selected in each section for outputting data. Therefore, the actual paper size of the output buffer 78 applies to the Chinese National Standard (CNS) Λ4 specification (210 X 297 mm) f Please read the notes on the back 呗 then fill in {sf page ”'ST. Λ7 Λ7 V, B7 Description of the invention (20t) Simultaneously receive data from each memory section of a memory bank, and output data alternately from each of these memory sections in synchronization with the system frequency ο-Input the data to the synchronous DRAM 14 through the input The buffer 100 is rotated. The round-in buffer 100 includes latches 102-108. The number of latches in the input buffer 100 is the same as the number of latches in any stage of the output buffer 78. The write latch circuit 110 receives the clock signal 1 at the system frequency and the row address bit CA0 to select which of the latches 102-108 is to receive-receive the data received at the data bus at a specific time. A multiplexer 112 may also be included in the turn-out stage to periodically rotate data in or out one bit at a time in a sequential manner for appropriate applications, such as video applications. FIG. 4 illustrates a block diagram of a representative memory unit and its connection to the input / output circuit shown in FIG. 3. As shown in FIG. 4, a memory cell includes a transistor 120 and a capacitor 122 for storing electric charge. The gate of transistor 120 is connected to word line 124. Many other memory cells will also be connected to word line I24. The transistor 120 transfers charge between the capacitor 122 and the bit line 126 under the control of the word line 124. Many other memory cells are also connected to the bit lines by different transistors controlled by different word lines. Word line 124-When activated, the sense amplifier 128 senses and amplifies the charge difference between the bit line 126 and the reference bit line 130. Once the row decoder selects the bit line 126 ', it activates the gamma selection signal and turns on the bypass gate transistors 132 and 134, thereby allowing data to be output to the output buffer 138 during a read operation. The output buffer 138 corresponds to the buffers 70-76 and 78 of FIG. For the write operation, the data is received from the data bus to the buffer 7070 in the paper as shown in Figure 3. _ — m In ti-I n----χ · Take 1 ---- -· Ϊ-— —--------- 1! -I: --- I--I 1 ^ 1 HI 〆 {Please read the notes on the back first to fill in this fo staff of the Central Standards Bureau of the Ministry of Economic Affairs Consumption Cooperative Print 22-Printed by the Consumer Standards Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 ______ B7 V. Description of the Invention (2L) A ~~~~~~ and 100 corresponding input buffers 140, and then pass from the input buffer 140 Turn to drive amplifier 136. The driver amplifier 136 then drives the bit line 126 by bypassing the close-transistor 134 to write appropriate data into the memory cell. The driver amplifier 136 is a dual driver that drives a bit line or an output buffer according to a required write or read operation. FIG. 5 illustrates a specific embodiment of a bank and a sector of the synchronous DRAM 14. As shown in FIG. The particular section in question is section 30. As shown in FIG. 5, the zone-segment 30 is divided into blocks 150 and 152 β. Each block includes one-half the number of columns of the entire section 30 and can be regarded as a duplicate address space. Therefore, in a special case, each block includes 2048 columns. The row decoder 62 decodes the appropriate rows of each block and allows reading or writing by the sensing and driving circuits 154 and 156. Each of the sense and drive circuits 154 and 156 corresponds to the sense amplifier 128 and the driver amplifier 136 of FIG. 4. The data output from or input to blocks 150 and 152 passes through input and output buffers 138 and 140. For an m-bit element, m / 2 bits are read from or written to block 150, and m / 2 bits are read from or written to block 152.
I 在同步DRAM 14 —次輸入及輸出8位元資料之一種特定 實施例,列解碼器40將會在塊150及152各將一列解碼。行 解碼器62將會在每一塊150及152將4行解碼。因此,自每 一塊150及152存取4位元,在一記憶庫之一特定區段存取 總共8位元。請予瞭解,一特定區段分成二重複之塊僅係 例證,可使用特定記憶區段之其他安排,而不偏離本發明 之預定範圍。例如,一記憶區段無需分成單獨之塊,或可 分成多於圖5中所示之塊數。 -23 - 本紙張尺度制巾關家料(CNS ) Λ4規格(2丨 (請先閲讀背面之注意事項再填寫本頁)I In a particular embodiment of the synchronous DRAM 14 input and output 8-bit data, the column decoder 40 will decode one column at each of blocks 150 and 152. The line decoder 62 will decode 4 lines at each block 150 and 152. Therefore, 4 bits are accessed from each of 150 and 152, and a total of 8 bits are accessed in a specific section of a bank. Please understand that the division of a specific section into two repeated blocks is merely an example, and other arrangements of the specific memory section can be used without departing from the intended scope of the present invention. For example, a memory section need not be divided into separate blocks or may be divided into more than the number shown in FIG. -23-This paper scale towel making materials (CNS) Λ4 specification (2 丨 (Please read the precautions on the back before filling this page)
、1T 1、 經濟部中央標準局負工消费合作社印製 A7 . B7 五、發明説明(22 ) 圖6-10爲同步DRAM 14各種操作之定時圖。此等定時圖 示同步DRAM 14操作之輸入位鉦,資料,與控制信號間乏 關係。該等定時圖例示信號在時鐘信號之上升邊緣定時之 實施例。 圖6例示同步DRA1 14之讀出脈衝串之定時圓。圖示之 特定讀出脈衝串爲脈衝串長度4及讀出等待時間3。因此 ,將在要求Τϊέ信號後輸出資料三時鐘循環,並將輸出四- 組資料。就一種8位元元件而言’每组資料將包含8位元 〇 如圖6中所示,行位址係在位址輸入Α0-Α10接收,並在 要求!!§信號時鎖存於時鐘信號之上升邊緣。在一種特定 實施例爲BANR SELECT信號之位址信號All,在要求ΙΙδ時 爲高,藉以選擇庫Α。在位址輸入Α0-Α9提供列位址,要 求^信號,而不要求f信號時,提供讀出命令。因爲讀 出等待時間爲3,故在三時鐘循環後輸出資料。如DQ資料 所示,四組資料a,b,c及d以時鐘頻率突,然發生。資料在 二區段間交替輸出。要準備次一操作,如所要求之IKf言 號,W信號,All,及ΰ!信號所示,庫依撤消命令予以預 先充電。 圖7爲寫入脈衝串操作,脈衝串長度8之定時圖。如圖 7中所示,在位址輸入接收列位址,並在啓動 信號時 予以鎖存。在要求^信號及f信號時接收寫入信號。將 列寫入同步DRAM 14之資料可與寫入信號同時接收。此因 配合圖3所討論之輸入缓衝器100而爲可能,在此種缓衝 -24 - (請先閲讀背面之注意事項再填寫本頁) -δ 本)Λ4規格(21GX297公釐) _ A7 B7 經濟部中央榡準局員工消費合作社印製 五、發明説明(η 器,可將供每一區段之資料鎖存至單獨之鎖存器。如圖7 中所示’接收所有八组資料,並在收到資料後,以撤銷命 令撤銷其所予以寫入之庫。 圖8爲寫入讀出脈衝串,讀出等待時間3及脈衝串長度 2之定時圖〇如圖8中所示,接收列位址,並在要求 信號時予鎖存。在啓動信號及f信號時收到寫入命令 。因爲方式暫存器已經以脈衝串長度2設定程式,故將輸〜 入二组資料a及b,並寫入至同步DRAM 14。其次要求01^ 4s號並在位址輸入提供行位址,而發出讀出命令。在三循 環之讀出等待時間後,如資料c及d所示,輸出一二组資 料c及d之脈衝串。然後可發出撤銷信號使啓動之庫預先 充電 圖8例示啓動信號,All爲低時,啓動之庫爲庫 B之情形。 圖9爲讀出寫入脈衝串’具有重動撤銷,以及讀出等待 時間3及脈衝串長度8之定時圖β圖9例示庫a之操作。 讀出操作爲如配合圖6之討論所完成,繼$爲與配合圖7 所討論者相似之寫入命令。但對於寫入命令,低位址已予 以鎖存並且未改變。由於在收到寫入命令時A10爲高,故 發生自動撤銷。圖2之定時及控制電路28因此在完成寫入 操作時使諸行解碼器中止。 圖10爲一種二庫行交替讀出操作,讀出等待時間3及脈 衝串長度2之定時圖。如圖10中所示,首先啓動庫b,並 對其提供一列位址。此情形發生在要求並且All爲低時 。隨後,啓動®信號並且All爲高,而啓動庫B。在位址 -25 - 本紙適用中國國家標準(CNS ) Λ4規 ..... —II ! I I. - ----I I— —i L·- - - - - - - 丁 . - . . . m n m n • J"T 口·" (請先閲讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(24.) 信號All爲低時要求01§信號,而完成自記憶庫B之讀出操 作。就讀出等待時間3及脈衝串長度2而言,將列自庫名 輸出之二組資料a及b,將在要求CAS後輸出三循環。其次 ,要求並且位址輸入信號All高,藉以提供讀出命令供 庫A。因此,在此項要求01^信號後三循環將會自庫a突 然發出二組資料c及d 。其次,提供寫入命令供記憶庫B 。只要需要資料,便繼績庫B與庫A間之此種交替。在每_ 二時鐘循環提供讀出命令至同步DRAM 14時,庫至庫交替 便提供資料之無間隙輸出。通常,對於長度η及固定 等待時間之不中斷脈衝串,除了無間隙輸出外,每一庫應 接收讀出命令η循環。 圖11例示一種二庫行交替讀出操作,具有自動撤銷以及 讀出等待時間3及脈衝串長度8之定‘圖。圖Π中所示之 操作,除了因爲脈衝串長爲8而有足夠時間提供新列位址 至每一庫供每次讀出外,與圖1〇中所示者相似。因此,代 替如配合圖10所述自一特定記憶庫之同一列讀出,在圖Π ,在自每一庫每次讀出前,對該庫提供一新列。由要求 CAS信號所示之讀出命令,相隔八循環發生,因爲脈衝串 長度爲8。在每次讀出操作,使Α10升高,藉以提供自動撤 邱。這導致圖2之定時及控制電路28將適當之列解碼器撤 銷’以允許在對該庫之次一讀出操作前預先克電。 圖12爲自庫Β之讀出操作及至庫a之寫入操作,讀出等 待時間3及脈衝串長度4之定時圖。如圖12中所示,執行 自庫A之讀出操作,係與以上配合圖6所討論者相似◊在 ~ 26 - ---------iv-------訂------^ I (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Λ4規格(2丨〇 X 297公幻 經濟部中央標準局員工消費合作.社印製 A7 ____B7 ~ ~ ~ 五、發明説明(25·) 已發出讀出命令後,要求RAS信號,而位址輸入All高,藉 以啓動庫A。其次,要求信號及f信號,藉以撤銷庫 B。其次’發出供庫A之寫入命令,並將脈衝串4寫入同 步 DRAM 14。 圖13爲一至庫A之寫入脈衝串及一自庫b之讀出脈衝串 ,具有自動撤銷以及讀出等待時間3及脈衝串長度4之定 時圖。如圏13中所示’首先載入供記憶庫a及B之列位址~ ’繼之爲供記憶庫A之寫入命令。·就脈衝串而言,在 寫入命令開始將四組資料a-d寫入記憶庫a。發出寫入命 令信號至庫A時位址信號A10爲高,囡此定時及控制電路 28將會在完成寫入操作時自動將庫a撤銷。然後發出具有 自動撤銷之讀出命令至庫B,並且由於讀出等待時間3 , 而在讀出命令後三循環讀出長度4之▲衝串。因爲發出讀 出命令時位址信號A10爲高,故圖2之定時及控制電路28 將會在完成讀出操作時將庫B撤銷。 本發明業經配合單獨接收行及列位址加以討論。請予瞭 I, 解’可使用較多位址線’以便同時接收行及列位址。 · 雖然本發明業經詳細説明,但請予瞭解,可作成各種變 化,替代及更改,而不偏離如後附申請專利範園所闡釋之 本發明之精神及範圍。 -27 - 本紙張尺纽财酬丨料( (請先閱讀背面之注意事項再填寫本頁) 訂1T 1. Printed by the Consumers' Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs A7. B7 V. Description of the Invention (22) Figure 6-10 is a timing chart of various operations of the synchronous DRAM 14. These timing diagrams show that there is no relationship between the input bits, data, and control signals of the synchronous DRAM 14 operation. The timing diagrams illustrate embodiments where the signals are timing at the rising edge of the clock signal. FIG. 6 illustrates the timing circle of the read burst of the synchronous DRA1 14. The specific read burst shown in the figure is the burst length 4 and the read wait time 3. Therefore, three clock cycles of data will be output after the signal is requested, and four-group data will be output. As far as an 8-bit component is concerned, each set of data will contain 8 bits. As shown in Fig. 6, the row address is received at the address inputs Α0-Α10, and is requested! ! § The signal is latched on the rising edge of the clock signal. In a specific embodiment, the address signal All of the BANR SELECT signal is high when the 11δ is required, so that the bank A is selected. Provide the column address at the address input A0-A9. When the ^ signal is required, but the f signal is not required, a read command is provided. Because the read wait time is 3, data is output after three clock cycles. As shown in the DQ data, the four sets of data a, b, c, and d occur suddenly at the clock frequency. The data is output alternately between the two sections. To prepare for the next operation, as shown by the required IKf signal, W signal, All, and ΰ! Signal, the library will pre-charge according to the undo command. FIG. 7 is a timing diagram of a burst operation with a burst length of 8. As shown in Figure 7, the receive column address is received at the address input and latched when the signal is activated. When a ^ signal and an f signal are required, a write signal is received. The data written in the column to the synchronous DRAM 14 can be received simultaneously with the write signal. This is possible with the input buffer 100 discussed in Figure 3. In this buffer-24-(Please read the precautions on the back before filling out this page)-δ version) Λ4 size (21GX297 mm) _ A7 B7 Printed by the Consumers 'Cooperative of the Central Government Bureau of the Ministry of Economic Affairs V. Invention Description (η device, which can latch the data for each sector to a separate latch. As shown in Figure 7' receive all eight groups Data, and after receiving the data, it cancels the library it has written with the undo command. Figure 8 is the timing diagram of the read-out burst, the read-out wait time 3 and the burst length 2 as shown in Figure 8. It displays the column address and latches it when the signal is requested. The write command is received at the start signal and the f signal. Because the mode register has set the program with the burst length 2, it will input ~ into two groups The data a and b are written to the synchronous DRAM 14. Secondly, the number 01 ^ 4s is required and a row address is provided in the address input, and a read command is issued. After the read waiting time of three cycles, such as data c and d As shown in the figure, a burst of one or two sets of data c and d is output. Then a cancel signal can be sent to start it. Precharging Figure 8 illustrates the start signal. When All is low, the bank to be started is Bank B. Figure 9 is the timing of the read-write burst 'with revocation cancellation, and the read wait time 3 and burst length 8 Figure β Figure 9 illustrates the operation of bank a. The read operation is completed as described in conjunction with the discussion of Figure 6, followed by a write command similar to that discussed in conjunction with Figure 7. However, for the write command, the lower address has been locked It is stored and has not changed. Because A10 is high when receiving the write command, automatic cancellation occurs. The timing and control circuit 28 in Fig. 2 therefore stops the rows of decoders when the write operation is completed. Fig. 10 is a second library Row alternate readout operation, timing diagram of readout wait time 3 and burst length 2. As shown in Figure 10, bank b is first started and provided with a column of addresses. This situation occurs when the request and All are low . Subsequently, the ® signal is activated and All is high, and bank B is activated. At address -25-This paper applies the Chinese National Standard (CNS) Λ4 Regulations ..... —II! I I.----- II— --I L ·--------D.-... Mnmn • J " T 口 · " (Please read first Read the notes on the back and fill in this page again.) Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs, A7, B7. 5. Description of the invention (24.) When the signal All is low, 01§ signal is required, and the read operation from the memory bank B is completed. In terms of readout waiting time 3 and burst length 2, the two sets of data a and b listed from the library name will be output for three cycles after the CAS is requested. Second, the address input signal All is required and provided to provide Read out the command for bank A. Therefore, after this request 01 ^ signal three cycles will suddenly send out two sets of data c and d from bank a. Second, a write command is provided for bank B. As long as the information is needed, this alternation between bank B and bank A is followed. When a read command is provided to the synchronous DRAM 14 every two clock cycles, the bank-to-bank alternate provides gap-free output of data. In general, for uninterrupted bursts of length η and fixed waiting time, each bank should receive the read command η cycle, except for the gapless output. Fig. 11 illustrates an example of a two-bank alternate read operation with automatic cancellation and a fixed 'read latency 3 and burst length 8. The operation shown in Figure II is similar to that shown in Figure 10, except that there is enough time to provide a new column address to each bank for each readout because the burst length is 8. Therefore, instead of reading from the same column of a particular memory bank as described in conjunction with FIG. 10, in FIG. Π, a new column is provided for each bank before each read from each bank. The read command shown by the request CAS signal occurs eight cycles apart because the burst length is eight. At each read operation, raise A10 to provide automatic withdrawal. This causes the timing and control circuit 28 of Fig. 2 to deactivate the appropriate list of decoders' to allow the power to be deactivated before the next read operation on the bank. Fig. 12 is a timing chart of a read operation from bank B and a write operation to bank a, a read wait time 3 and a burst length 4; As shown in FIG. 12, the read operation from library A is similar to that discussed in conjunction with FIG. 6 above. ~ ~---------- iv ------- order- ----- ^ I (Please read the notes on the back before filling out this page) This paper size applies to the Chinese National Standard (CNS) Λ4 specification (2 丨 〇X 297 Employees of the Central Standards Bureau of the Ministry of Economic Affairs, Consumer Co-operation. Print A7 ____B7 ~ ~ ~ 5. Description of the Invention (25 ·) After the read command has been issued, the RAS signal is required, and the address input All is high to start bank A. Second, the signal and f signal are required to cancel bank B . Secondly, issue a write command for bank A and write burst 4 to synchronous DRAM 14. Figure 13 shows a write burst to bank A and a read burst from bank b, with automatic cancellation and read The timing chart of waiting time 3 and burst length 4 is shown. As shown in 圏 13, 'First load the column addresses for banks a and B ~' followed by the write command for bank A. · For pulse In terms of strings, the four sets of data ad are written into the memory bank a at the beginning of the write command. When the write command signal is sent to bank A, the address signal A10 is high. The control circuit 28 will automatically cancel bank a when the write operation is completed. Then it sends out a read command with automatic undo to bank B, and because of the read wait time 3, three cycles of read length 4 after the read command ▲ Crush string. Because the address signal A10 is high when the read command is issued, the timing and control circuit 28 of FIG. 2 will cancel bank B when the read operation is completed. The present invention cooperates to receive rows and columns separately. Addresses are discussed. Please give me the answer, "You can use more address lines" to receive row and column addresses at the same time. Although the present invention has been described in detail, please understand that various changes, substitutions and changes can be made. Without deviating from the spirit and scope of the present invention as explained in the attached patent application park. -27-This paper rule New wealth 丨 materials ((Please read the precautions on the back before filling this page) Order
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US18934594A | 1994-01-31 | 1994-01-31 |
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