TW368687B - Method for improving water-resistant property of silicon nitride thin film doped with fluorine - Google Patents
Method for improving water-resistant property of silicon nitride thin film doped with fluorineInfo
- Publication number
- TW368687B TW368687B TW086115583A TW86115583A TW368687B TW 368687 B TW368687 B TW 368687B TW 086115583 A TW086115583 A TW 086115583A TW 86115583 A TW86115583 A TW 86115583A TW 368687 B TW368687 B TW 368687B
- Authority
- TW
- Taiwan
- Prior art keywords
- thin film
- fluorine
- silicon nitride
- film doped
- resistant property
- Prior art date
Links
Landscapes
- Formation Of Insulating Films (AREA)
Abstract
A kind of method for improving the water-resistant property of silicon nitride thin film doped with fluorine which is to apply the NH3 plasma post-treatment on the silicon oxide deposition thin film doped with fluorine under the circumstances enough for the nitrogenizing on the surface of thin film but generally sustaining the original structure so as to isolate the moisture and let the thin film sustain low dielectric constant for a long time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086115583A TW368687B (en) | 1997-10-22 | 1997-10-22 | Method for improving water-resistant property of silicon nitride thin film doped with fluorine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086115583A TW368687B (en) | 1997-10-22 | 1997-10-22 | Method for improving water-resistant property of silicon nitride thin film doped with fluorine |
Publications (1)
Publication Number | Publication Date |
---|---|
TW368687B true TW368687B (en) | 1999-09-01 |
Family
ID=57941340
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086115583A TW368687B (en) | 1997-10-22 | 1997-10-22 | Method for improving water-resistant property of silicon nitride thin film doped with fluorine |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW368687B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6727173B2 (en) | 1998-09-03 | 2004-04-27 | Micron Technology, Inc. | Semiconductor processing methods of forming an utilizing antireflective material layers, and methods of forming transistor gate stacks |
US6828683B2 (en) | 1998-12-23 | 2004-12-07 | Micron Technology, Inc. | Semiconductor devices, and semiconductor processing methods |
-
1997
- 1997-10-22 TW TW086115583A patent/TW368687B/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6727173B2 (en) | 1998-09-03 | 2004-04-27 | Micron Technology, Inc. | Semiconductor processing methods of forming an utilizing antireflective material layers, and methods of forming transistor gate stacks |
US6828683B2 (en) | 1998-12-23 | 2004-12-07 | Micron Technology, Inc. | Semiconductor devices, and semiconductor processing methods |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |