TW364197B - Trimming circuit - Google Patents

Trimming circuit

Info

Publication number
TW364197B
TW364197B TW086113546A TW86113546A TW364197B TW 364197 B TW364197 B TW 364197B TW 086113546 A TW086113546 A TW 086113546A TW 86113546 A TW86113546 A TW 86113546A TW 364197 B TW364197 B TW 364197B
Authority
TW
Taiwan
Prior art keywords
blown
trimming circuit
antifuses
circuit includes
protection circuit
Prior art date
Application number
TW086113546A
Other languages
Chinese (zh)
Inventor
Richard J Goldman
Raymond A Filippi
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Application granted granted Critical
Publication of TW364197B publication Critical patent/TW364197B/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18Auxiliary circuits, e.g. for writing into memory
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/525Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections
    • H01L23/5252Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections comprising anti-fuses, i.e. connections having their state changed from non-conductive to conductive

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A trimming circuit includes a number of antifuses which can be blown to alter the parameters of an external circuit. In order to overcome the problem that further may inadvertently be blown after the desired trim has been determined, a protection circuit is provided. The protection circuit includes an additional antifuse which, when it is blown following determination of the desired trim, prevents other antifuses from being blown.
TW086113546A 1997-08-27 1997-09-18 Trimming circuit TW364197B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9718146A GB2329289A (en) 1997-08-27 1997-08-27 Antifuse-controlled analogue circuit trimming with security locking antifuse

Publications (1)

Publication Number Publication Date
TW364197B true TW364197B (en) 1999-07-11

Family

ID=10818101

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086113546A TW364197B (en) 1997-08-27 1997-09-18 Trimming circuit

Country Status (4)

Country Link
AU (1) AU9263398A (en)
GB (1) GB2329289A (en)
TW (1) TW364197B (en)
WO (1) WO1999010931A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202010008913U1 (en) 2009-11-10 2011-05-12 Chen, Chia-Wen Device for warnings on an expiration date

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6292422B1 (en) 1999-12-22 2001-09-18 Texas Instruments Incorporated Read/write protected electrical fuse
US6342807B1 (en) * 2000-06-26 2002-01-29 Microchip Technology Incorporated Digital trimming of analog components using non-volatile memory

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4887239A (en) * 1985-03-04 1989-12-12 Lattice Semiconductor Corporation One-time programmable data security system for programmable logic device
US5079516A (en) * 1990-08-21 1992-01-07 National Semiconductor Corporation User-proof post-assembly offset voltage trim
US5396130A (en) * 1993-06-29 1995-03-07 International Business Machines Corporation Method and apparatus for adaptive chip trim adjustment
US5361001A (en) * 1993-12-03 1994-11-01 Motorola, Inc. Circuit and method of previewing analog trimming
US5517455A (en) * 1994-03-31 1996-05-14 Sgs-Thomson Microelectronics, Inc. Integrated circuit with fuse circuitry simulating fuse blowing
KR0146203B1 (en) * 1995-06-26 1998-12-01 김광호 Circuit element controlled circuit of semiconductor ic
US5731760A (en) * 1996-05-31 1998-03-24 Advanced Micro Devices Inc. Apparatus for preventing accidental or intentional fuse blowing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202010008913U1 (en) 2009-11-10 2011-05-12 Chen, Chia-Wen Device for warnings on an expiration date
EP2322999A2 (en) 2009-11-10 2011-05-18 Chia-Wen Chen Apparatus for Warning of an Expiration Date

Also Published As

Publication number Publication date
GB9718146D0 (en) 1997-10-29
AU9263398A (en) 1999-03-16
WO1999010931A1 (en) 1999-03-04
GB2329289A (en) 1999-03-17

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